TW364060B - Contact probe for liquid crystal display test and liquid crystal display test device having the same - Google Patents
Contact probe for liquid crystal display test and liquid crystal display test device having the sameInfo
- Publication number
- TW364060B TW364060B TW086108124A TW86108124A TW364060B TW 364060 B TW364060 B TW 364060B TW 086108124 A TW086108124 A TW 086108124A TW 86108124 A TW86108124 A TW 86108124A TW 364060 B TW364060 B TW 364060B
- Authority
- TW
- Taiwan
- Prior art keywords
- liquid crystal
- crystal display
- display test
- contact probe
- same
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16970196A JPH1019932A (ja) | 1996-06-28 | 1996-06-28 | 液晶表示体テスト用コンタクトプローブ |
JP17242596A JPH1019933A (ja) | 1996-07-02 | 1996-07-02 | 液晶表示体テスト用コンタクトプローブ |
JP08211283A JP3132394B2 (ja) | 1996-08-09 | 1996-08-09 | 液晶表示体テスト装置 |
JP4442697A JPH10239352A (ja) | 1997-02-27 | 1997-02-27 | プローブ装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW364060B true TW364060B (en) | 1999-07-11 |
Family
ID=27461525
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086108124A TW364060B (en) | 1996-06-28 | 1997-06-12 | Contact probe for liquid crystal display test and liquid crystal display test device having the same |
Country Status (3)
Country | Link |
---|---|
US (1) | US20010040451A1 (zh) |
KR (1) | KR980003729A (zh) |
TW (1) | TW364060B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102014428B1 (ko) | 2012-08-29 | 2019-08-27 | 삼성디스플레이 주식회사 | 표시 장치용 검사 장치 및 그 제조 방법 |
JP7292921B2 (ja) * | 2019-03-29 | 2023-06-19 | 株式会社日本マイクロニクス | 多ピン構造プローブ体及びプローブカード |
-
1997
- 1997-06-12 TW TW086108124A patent/TW364060B/zh not_active IP Right Cessation
- 1997-06-23 US US08/880,524 patent/US20010040451A1/en not_active Abandoned
- 1997-06-27 KR KR1019970028335A patent/KR980003729A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR980003729A (ko) | 1998-03-30 |
US20010040451A1 (en) | 2001-11-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |