TW357264B - Probe the invention relates to a probe - Google Patents

Probe the invention relates to a probe

Info

Publication number
TW357264B
TW357264B TW086119173A TW86119173A TW357264B TW 357264 B TW357264 B TW 357264B TW 086119173 A TW086119173 A TW 086119173A TW 86119173 A TW86119173 A TW 86119173A TW 357264 B TW357264 B TW 357264B
Authority
TW
Taiwan
Prior art keywords
probe
relates
probe body
disposed
free
Prior art date
Application number
TW086119173A
Other languages
English (en)
Inventor
Masatoshi Kato
Original Assignee
Ict Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ict Co Ltd filed Critical Ict Co Ltd
Application granted granted Critical
Publication of TW357264B publication Critical patent/TW357264B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
TW086119173A 1996-05-13 1997-12-18 Probe the invention relates to a probe TW357264B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8117845A JPH09304431A (ja) 1996-05-13 1996-05-13 プローブ針
PCT/JP1997/001582 WO1997043652A1 (fr) 1996-05-13 1997-05-12 Aiguille de sonde

Publications (1)

Publication Number Publication Date
TW357264B true TW357264B (en) 1999-05-01

Family

ID=14721702

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086119173A TW357264B (en) 1996-05-13 1997-12-18 Probe the invention relates to a probe

Country Status (3)

Country Link
JP (1) JPH09304431A (zh)
TW (1) TW357264B (zh)
WO (1) WO1997043652A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102289090A (zh) * 2011-08-24 2011-12-21 深圳市华星光电技术有限公司 玻璃基板的检测装置
US8963571B2 (en) 2011-08-24 2015-02-24 Shenzhen China Star Optoelectronics Technology Co., Ltd. Inspection device for glass substrate

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6222377B1 (en) 1998-01-13 2001-04-24 Masatoshi Kato Circuit board probe device
US6551126B1 (en) * 2001-03-13 2003-04-22 3M Innovative Properties Company High bandwidth probe assembly
JP4574222B2 (ja) * 2004-05-06 2010-11-04 日本電産リード株式会社 基板検査用接触子、これを用いた基板検査用治具及び基板検査装置
WO2009011244A1 (ja) * 2007-07-17 2009-01-22 Nhk Spring Co., Ltd. プローブユニット
JP2010019797A (ja) * 2008-07-14 2010-01-28 Fujitsu Ltd 両側プローブピン用ソケット、両側プローブピン、及びプローブユニット

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6130876U (ja) * 1984-07-26 1986-02-24 日本電気株式会社 布線試験機用アダブタ
JPS63181969U (zh) * 1987-05-18 1988-11-24
JPS642181U (zh) * 1987-06-22 1989-01-09

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102289090A (zh) * 2011-08-24 2011-12-21 深圳市华星光电技术有限公司 玻璃基板的检测装置
US8963571B2 (en) 2011-08-24 2015-02-24 Shenzhen China Star Optoelectronics Technology Co., Ltd. Inspection device for glass substrate

Also Published As

Publication number Publication date
JPH09304431A (ja) 1997-11-28
WO1997043652A1 (fr) 1997-11-20

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