TW353801B - Method of forming plug in integrated circuit - Google Patents

Method of forming plug in integrated circuit

Info

Publication number
TW353801B
TW353801B TW086118283A TW86118283A TW353801B TW 353801 B TW353801 B TW 353801B TW 086118283 A TW086118283 A TW 086118283A TW 86118283 A TW86118283 A TW 86118283A TW 353801 B TW353801 B TW 353801B
Authority
TW
Taiwan
Prior art keywords
forming
layer
photolithography
dielectric layer
etching techniques
Prior art date
Application number
TW086118283A
Other languages
Chinese (zh)
Inventor
Jung-Yuan Li
Jung-Peng Hau
Wu-Shiung Chen
Pei-Ying Li
Original Assignee
Nanya Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanya Technology Corp filed Critical Nanya Technology Corp
Priority to TW086118283A priority Critical patent/TW353801B/en
Application granted granted Critical
Publication of TW353801B publication Critical patent/TW353801B/en

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Memories (AREA)

Abstract

A method of forming a plug in an integrated circuit, which comprises the following steps: (a) forming transistors and a field oxide layer on a semiconductor substrate; (b) sequentially forming a first dielectric layer and a second dielectric layer, and forming a plug pad contact hole by using photolithography and etching techniques; (c) sequentially forming a barrier layer and a salicide layer, and etching back the salicide thereby forming a salicide plug pad; (d) forming a third dielectric layer, and producing a bitline contact hole using photolithography and etching techniques; (e) forming a salicide layer, and producing the salicide layer into bitlines using photolithography and etching techniques; (f) sequentially forming a fourth dielectric layer and a silicon nitride layer, and forming a capacitor-buried contact hole using photolithography and etching techniques; (g) forming a fifth dielectric layer, and locating the capacitors^ locations using photolithography and etching techniques; (h) sequentially forming a first silicon film, a capacitor dielectric layer and a second silicon film, and separately producing them into a storage electrode plate of capacitors, a dielectric layer and a memory cell electrode plate; (I) forming a sixth dielectric layer and forming a metallic contact hole using photolithography and etching techniques; (j) forming a tungsten plug; and (k) forming a metallic layer and forming a metallic interconnect using photolithography and etching techniques.
TW086118283A 1997-12-05 1997-12-05 Method of forming plug in integrated circuit TW353801B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW086118283A TW353801B (en) 1997-12-05 1997-12-05 Method of forming plug in integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW086118283A TW353801B (en) 1997-12-05 1997-12-05 Method of forming plug in integrated circuit

Publications (1)

Publication Number Publication Date
TW353801B true TW353801B (en) 1999-03-01

Family

ID=57940172

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086118283A TW353801B (en) 1997-12-05 1997-12-05 Method of forming plug in integrated circuit

Country Status (1)

Country Link
TW (1) TW353801B (en)

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