TW344476U - Microcontroller intergrated circuit with read only memory containing a gener IC program such as a test program and test station - Google Patents

Microcontroller intergrated circuit with read only memory containing a gener IC program such as a test program and test station

Info

Publication number
TW344476U
TW344476U TW085214489U TW85214489U TW344476U TW 344476 U TW344476 U TW 344476U TW 085214489 U TW085214489 U TW 085214489U TW 85214489 U TW85214489 U TW 85214489U TW 344476 U TW344476 U TW 344476U
Authority
TW
Taiwan
Prior art keywords
program
test
gener
microcontroller
read
Prior art date
Application number
TW085214489U
Other languages
English (en)
Inventor
Jean-Pierre Balbinot
Original Assignee
Alcatel Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Nv filed Critical Alcatel Nv
Publication of TW344476U publication Critical patent/TW344476U/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G06F11/2635—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers using a storage for the test inputs, e.g. test ROM, script files
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW085214489U 1993-07-13 1994-07-20 Microcontroller intergrated circuit with read only memory containing a gener IC program such as a test program and test station TW344476U (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9308626A FR2707773B1 (fr) 1993-07-13 1993-07-13 Circuit intégré du type microcontroleur à mémoire morte masquée contenant un programme générique de test, station de test et procédé de fabrication correspondants.

Publications (1)

Publication Number Publication Date
TW344476U true TW344476U (en) 1998-11-01

Family

ID=9449226

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085214489U TW344476U (en) 1993-07-13 1994-07-20 Microcontroller intergrated circuit with read only memory containing a gener IC program such as a test program and test station

Country Status (9)

Country Link
US (1) US5590273A (zh)
EP (1) EP0635789B1 (zh)
JP (1) JPH07151832A (zh)
KR (1) KR100300281B1 (zh)
DE (1) DE69416904T2 (zh)
FR (1) FR2707773B1 (zh)
HK (1) HK1007258A1 (zh)
SG (1) SG46637A1 (zh)
TW (1) TW344476U (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030061545A1 (en) * 1994-09-30 2003-03-27 Chandrashekhar S. Patwardhan Method and apparatus for providing test mode access to an instruction cache and microcode rom
US5903718A (en) * 1996-09-16 1999-05-11 International Business Machines Corporation Remote program monitor method and system using a system-under-test microcontroller for self-debug
FR2773657B1 (fr) * 1998-01-14 2001-12-28 Sgs Thomson Microelectronics Procede de communication avec controle de coherence et dispositif pour sa mise en oeuvre
US6151238A (en) * 1999-02-23 2000-11-21 Microchip Technology, Inc. Calibrating functions of an integrated circuit and storing calibration parameters thereof in a programmable fuse array
US6408412B1 (en) * 1999-09-03 2002-06-18 Advantest Corp. Method and structure for testing embedded analog/mixed-signal cores in system-on-a-chip
US6564229B1 (en) * 2000-06-08 2003-05-13 International Business Machines Corporation System and method for pausing and resuming move/copy operations
US6925554B1 (en) * 2001-10-09 2005-08-02 Cypress Semiconductor Corp. Method of programming USB microcontrollers
CN106199381B (zh) * 2016-07-04 2020-05-22 深圳创维空调科技有限公司 变频空调主板的自动检测方法及装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4435763A (en) * 1981-04-13 1984-03-06 Texas Instruments Incorporated Multiprogrammable input/output circuitry
US4797808A (en) * 1981-06-22 1989-01-10 Texas Instruments Incorporated Microcomputer with self-test of macrocode
US4490783A (en) * 1981-07-02 1984-12-25 Texas Instruments Incorporated Microcomputer with self-test of microcode
US4641308A (en) * 1984-01-03 1987-02-03 Texas Instruments Incorporated Method of internal self-test of microprocessor using microcode
JPS6298437A (ja) * 1985-10-24 1987-05-07 Oki Electric Ind Co Ltd マイクロコンピユ−タ
JP2986104B2 (ja) * 1988-03-15 1999-12-06 株式会社東芝 情報処理装置の自己試験回路
US5157781A (en) * 1990-01-02 1992-10-20 Motorola, Inc. Data processor test architecture

Also Published As

Publication number Publication date
DE69416904D1 (de) 1999-04-15
JPH07151832A (ja) 1995-06-16
US5590273A (en) 1996-12-31
FR2707773B1 (fr) 1995-08-18
EP0635789A1 (fr) 1995-01-25
FR2707773A1 (fr) 1995-01-20
KR960015240A (ko) 1996-05-22
SG46637A1 (en) 1998-02-20
DE69416904T2 (de) 1999-09-09
HK1007258A1 (en) 1999-04-09
KR100300281B1 (ko) 2001-10-22
EP0635789B1 (fr) 1999-03-10

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