TW293952B - The repaired structure & method of main matrix LD - Google Patents

The repaired structure & method of main matrix LD Download PDF

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Publication number
TW293952B
TW293952B TW82102742A TW82102742A TW293952B TW 293952 B TW293952 B TW 293952B TW 82102742 A TW82102742 A TW 82102742A TW 82102742 A TW82102742 A TW 82102742A TW 293952 B TW293952 B TW 293952B
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Taiwan
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item
line
liquid crystal
repair
crystal display
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TW82102742A
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Chinese (zh)
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Jong-Syh Ueng
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Ind Tech Res Inst
Chi Mei Optoelectronics Corp
Toppoly Optoelectronics Corp
Prime View Int Corp Ltd
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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Abstract

A main matrix LD includes at least 2 sets parallel guiding wire and a conductive repaired device setting on outside of displaying area, the above parallel guiding wire and repaired device is distinguished into 1st & 2nd metal layer and isolated by insulated layer, an"isolated electrode" is connected to end of each parallel guidingwire, this electrode includes 2 overlapped electrodes with isolated layer in between, and the 1st electrode is connected to parallelguiding wire which is composed by 1st metal layer and the 2nd electrode is extended to intersect with repaired device which is composed by 2nd metal layer.

Description

293S52 A6 B6 經濟部中央標準局貞Η消費合作社印製 五、發明説明(] 由於液晶顯示器之顯示面積比1C大很多,所以很容易因塵粒,黃光顯 影不良或絕緣層針孔等原因而有斷線或短路情況發造成線缺陷,除在 製造過程中要求潔淨度外,設計上之修補方式亦很i要。傳統之修補設計 ,基本上如圖1所示,在像素區域(Pixel area) 12’外圍加上修補環(repair ring)14-l, 14-2......等,修補環數愈多,可修補之線缺陷數目(如斷 線、短路)愈多,但相對地,修補環分別與掃瞄線,訊號線之交點亦愈多 。圖中以4條掃瞄線1-1, 1-2, 1-3,1-4等及4條訊號線2-1, 2-2, 2-3, 2-4等代表液晶顯示器中之總線數,每個像素部份(Pixel)包含一個薄膜霄 晶體20 (Thin-Fi lm-Transi stor)及一個儲存電容22(storage capacitor) 。所有儲存電容的下面電極聯至一共同電壓訊號。 基本之傳統修補方法為:若掃瞄線1-1有斷線 18發生,則此線後半段 無法接收其電壓訊號,形成半條線缺陷,可在A, B處做雷射熔接(Laser v/elding) 6-1, 6-2,其中修補環與掃瞄線,訊號線之交點结構10,自下 至上為金靥層1/閘絕緣層/金屬層I,所K在未做雷射熔接前,這些點 理想上應為斷路,金羼層I與金屬層I[不會有電性短路,金屬層I代表 閘極金屬,金屬層ϋ代表訊號之同層拉線金屬,故斷線18可經由A點經 修補環14-1的上半部至B點將電壓訊號傳入掃瞄線1-1後半段,並在A, B 點之下面做雷射切除(Laser Cutting) 8-1, 8-2,則修補環14-1之下半環 仍可用於修補另外一條線缺陷。 至於掃瞄線與訊號線短路亦同理可得,先在短路處16做雷射切除8-3, 8-4,再於C, D兩點做雷射熔接6-3, 6-4,並且於C、D兩點右邊做雷射切 除8-5, 8-6,則兩線之短路即可切除,且訊號線2-2不會造成斷線,可經 由C點、修補環14-2之左邊至D點,使其訊號後半段亦可獲得訊號。所以 對於傳統之修補方式,掃瞄線,訊號線之斷線或短路,皆可修補,但前題 為掃瞄線,訊號線與修補環之交點,對每條掃描線或訊號線而言,至少需 有2點(如A, B; C, D)才能做修補,但當液晶顯示器之線數愈多時,則掃 瞄線,訊號線與修補環之交點則愈多,很容易藉由這些線與修補環的交點 ,造成掃瞄線,訊號線間的短路,增加線缺陷的機會,使良率降低。 (讣先KI讀背面之注意事砺再瑱寫本頁) .笟· ••打. us .線· 本紙張尺度適用中國國家標準(CNS)甲4規格(210x297公釐) A 6 B6 293952 五、發明說明() 而在琨在的LCD製程中,為求簡化大多將閛極金屬與儲存電容之共 同電極線以同一層金靥製造,且兩者圼指狀設計,祕避免彼此短路,如圖 2所示。掃瞄線1-1,1-2, 1-3,1-4,與儲存電容之共同電極線24-1, 24-2, 24-3, 24-4圼指狀分開,但若考慮做線缺'陷之修補,則修補環與 掃瞄線,共同電極線,訊號線之交點多,且很容易短路,造成線缺陷。 若將掃瞄線與共同電極線如圖3所示安排,則掃瞄線與修補環之交點減半 ,且共同電極線與每個修補環之交點降為僅1點(如圖中之共同電極26與修 補環14-1,14-2,各有1個交點),固然此法可使與修補環之交點減少甚多 ,降低藉由這些交叉點所引起之短路,但缺點為若是掃瞄線或共同電極線 出現斷線,則因這些線與修補環之交點不足2點而無法做修補,而造成線 缺陷,無法達到無線缺陷,使顯示板良率同樣降低。 故上述二種方式,前者固然可做修補,但因與修補環之交點甚多,反 而容易造成掃瞄線,共同電極線,與訊號線間的短路,後者,雖然可減少 交點,但掃瞄線與共同電極線之斷線,則無法修補,皆無法使顯示板之良 率提升。 發明之概述: 本發明共有三個目的:一為提供可修補所有主動矩陣液晶顯示器線缺 陷之設計,二為提供可修補所有線缺陷且降低線與修補環交點數目之設計 ,三為提供低成本、高良率之設計。 針對傳統修補方式之缺失,本發明加入”隔離電極”於液晶顯示器中 ,可分別在掃瞄線,共同電極線及訊號線之尾端加上,,隔離電極,,且分別 延伸其尾端與修補環有交點。”隔離電極”之作用,在於降低因掃瞄線 、共同電極線、之尾端與修補環有交點,使彼此間之交點增加,而增加彼 此間短路之機會,亦即多加一道隔離開關。此電極结構為兩重叠電極,中 間夾有絕^層,一電極聯至掃描線、訊號線或共同電極線,另一電極延伸 與修補環交叉(亦隔有絕緣層),如有線缺陷,可在”隔離電極”處做雷 射熔接’且在此二電極分別延伸與修補環交叉之處做雷射熔接,則線缺陷 本紙張尺度適用中國國家標準(CNS)甲4規格(210x297公釐) 請先閱讀背面之注意事項再填寫本页) .装. •訂· 經濟部中央樣準局負工消費合作社印製 Α6 Β6 五、發明説明() 部份便可經由修補環取代。如此一來,掃瞄線與共同電極線之斷線皆可Μ 修補,’且不會因為增加與修補環之交點而增加彼此間短路之機會,除非該 線之”隔離電極”及該線之尾端與修補環交點,兩點同時短路,且有某一 條訊號線或共同電極線或掃瞄線,亦與該條修補環有短路,才會造成彼此 間短路,亦即有三點同時發生短路才有可能造成彳k此間短路,這種機率非 常小。 其基本修補方式與傳統方式差別在於”隔離電極”亦需做雷射熔接。 因為在熔接之點上可做”多點”的熔接,K增加熔接良率及降低其熔接後 之電阻,所以,多一個”隔離電極”的加入,並不會降低雷射修補的良 率。這種”隔離電極”的修補方式已經實際顯示板實驗証明不會有問題。 除掃瞄線,共同電極線外,訊號線亦可用同樣的設計,如此則所有線缺陷 皆可以修補,且掃瞄線與修補環之交點可降為一半,共同電極線與修補環 之交點,亦維持為N點(N為修補環數目,假設共同電極之輸入電極只拉 線一條),訊號線與修補環之交點亦降為一半,所以降低短路機會,但所 有之線缺陷都可Μ修補,將傳統修補方式之缺點消除,優點保留,尤其當 掃瞄線,共同電極線與訊號線分別達至一千多條以上時,更能顯示出使用 本發明之”隔離電極”之優點,使顯示板良率大幅提高。此外,本發明對 於共同電極線之修補亦提出多種方式。 {請先聞讀背面之注意事項再填寫本頁) •装. •訂· 圖示之簡單說明: 圖1.為習知修補環之設計方式,及斷線、短路之修補方法之示意圖。 圔2.為習知掃瞄線,共同電極線及訊號線可修補所需之佈局限制。 圖3.為降低與修補環交點之習知的指狀設計之線路圖。 圖4.為掃瞄線,共同電極線加入本發明之”隔離電極”之線路圖。 圖5.為訊號線加入本發明之”隔離電極”之線路圖。 圖6.本發明之”隔離電極”之橫截面圖。 圖7.為掃瞄線斷線,應用本發明之”隔離電極”之修補方法之示意圖 圖8.為訊號線斷線,應用本發明之”隔離電極”之修補方法之示意圖 圃9.為共同電極線斷線,應用本發明之”隔離電極”之4個 熔接點之修補方法之示意圖。 本紙張尺度適用中國國家標準(CNS)甲4規格(210x297公釐) •綠· 經濟部中央標準局S工消費合作社印製 293952 Λ : Α6 Β6 經濟部中央梂準局員工消费合作社印製 五、發明說明(j 圖10.為共同電極線斷線,應用本發明之”隔離電極”之3個 熔接點之修補方法之示意圖。 圖11.為利用本發明之”共同修補線”來修補共同電極線斷線 之2個熔接點修補方法示意圖。 , 圖12.為利用本發明之超過—條K上之”共Λ修補線”來修補共同電 極線斷線之修補方法之示意圖。 發明之詳细說明: 圖4所示為在掃瞄線1-1, 1-2, 1-3, 1-4,及共同電極線24-1, 24-2, 24-3, 24-4之尾端分別加入本發明之”隔離電極” 30之設計,其 作用在於作為隔離開關,因每條線欲做修補時需與修補環有2個交點 ,如此,則每條掃瞄線,共同電極線皆與修補環有2點交點,但因有” 隔離電極”作為隔離開關,所以掃瞄線與修補環之交點仍等效為原來之 一半,而共同電極線與修補環之交點亦維持為Ν點(Ν為修補環數目), 而不會增加彼此間短路之機會。”測試電極” 28 (Testing Pad”)之作用 在於可測量掃瞄線或共同電極線是否斷線,(即從掃瞄線卜1之前端輸 入電極及測試電極28兩端加電壓,再測量其電流,若為斷路,則量不到 電流,其餘類推)。 圖5所示為訊號線加入”隔離電極”之設計。圖6為”隔離電極” 30之 橫截面圖,修補環14-1, 14-2處之橫截面结構如圖,由金屬層I,34 ,與金靥層I,38中間夾著閘極絕緣層36 (如氮化矽(SiNx)等)構成 交叉點,金属層I,38代表修補環,金屬層I,34代表掃瞄線或共同電 極線。”隔離電極” 30结構亦由金屬層I,34/閘極絕緣層36/金羼層 II ’38構成並經接觸窗(contact hole)32連接至修補環下面之金靥層I ,34,而此處”隔離電極” 30如同一個隔離開關。 如圖7所示,若掃瞄線1-2有斷線19,則可分別在A點,B點及C處 之”隔離電極”做雷射熔接,9-1, 9-2, 9-3,並於A點及B點之下方做 雷射切除11-1,1卜2,使之與下半圈修補環分離,使剩下之半圈修補環 可用於修補其他之線缺陷。如此,掃瞄線1-2之電壓訊號便可經由A點 (請先KI讀背面之注意事項再填寫本页) •装_ ‘訂· •線. 本紙張尺度適用中國國家標準(CNS)甲4規格(210x297公釐) 203052 A6 B6 經濟部中央標準局貝工消费合作社印製 五、發明説叼() ,·經上半圈修補環至B點及C點,使掃瞄線1-2之後半段可獲得電壓訊 號,完成掃瞄線斷線修補。 τ 如圖8所示,若訊號線2-2有斷線21發生,則可在A點,B點及C 處之”隔離電極”分別做雷射熔接,17-1,17-2, 17-3,並在A點、B點 之右方做修補環之雷射切除.Μ-〗,19-2,則訊號線2-2便可得由A點 、B點及C點傳至斷線部份,完成修補。 若發現掃瞄線與訊號線,或其共同電極線與訊號線於像素區域 (Pixel area)内有短路發生,則可先將短路點兩端之訊號線切斷,再做 訊號線斷線之修補,其方法如同上述。 對共同電極線斷線之修補共有4種方式,如圖9所示,為4個熔接點 之方法,若共同電極線24-2有斷線23發生,則可在A點、B點、C點及 D點分別做雷射熔接,25-1,25-2, 25-3,25-4,並於B點及C點兩端將 多餘之修補環切斷,27-1, 27-2,則斷線23可經A, B,C, D點連接至 隔壁之共同電極線,完成修補。 如圖10所示,為3個熔接點之方法,若共同電極線24-2有斷線23 發生,則可在A點、B點及C點做雷射熔接,29-1, 29-2, 29-3,並於 B點、C點兩端切除修補環31-1,31-2,如此斷線部份,可經由A點,B 點至C點連接至共同電極,完成修補。 如圖11所示,為使用加入”共同修補線”(2個熔接點)之方法,在 修補環內側,共同電極尾端加上一含有”隔離電極”之”共同修補線” 39(由金靥層I,38構成),則斷線23可經由A點及B點之雷射熔接, 33-1, 33-2,並於”共同修補線”相對應之兩端(亦即A點以下,B點以 上之共同修補線處)做切斷,35,完成修補。 如圖12所示,為在共同電極線之尾端加入一個以上之”共同修補 線”(2個熔接點)之方法,可分成2條線一組,或3條線一組,或N 條線一組之”共同修補線”(repair piece) 40,如斷線23,可經由A 點,B點,”隔離電極”之雷射熔接37-1, 37-2,完成修補,若考慮是否 含有2條共同電極線同時斷,則可採用3條一組,或H條一組等方式。 如此,不需佔用修補環,則修補環可全部用於掃瞄線或訊號線之修補。 {ί/r先聞讀背面之注意事項再填寫本页) .¾. •打. -練. 本纸張尺度適用中國國家標準(CNS)甲4規格(210x297公釐)293S52 A6 B6 Printed by Zhen H Consumer Cooperative, Central Bureau of Standards, Ministry of Economic Affairs 5. Description of invention (] Since the display area of the liquid crystal display is much larger than 1C, it is easily caused by dust particles, poor yellow light development or pinholes in the insulating layer, etc. Wire breakage or short circuit may cause wire defects. In addition to the cleanliness required in the manufacturing process, the design's repair method is also very important. The traditional repair design is basically shown in Figure 1, in the pixel area (Pixel area) ) 12 'periphery with repair ring (repair ring) 14-l, 14-2 ... etc., the more repair rings, the more line defects (such as broken wire, short circuit) that can be repaired, but Relatively, the repair ring and the scanning line respectively, the more the intersection of the signal line. In the figure, there are 4 scanning lines 1-1, 1-2, 1-3, 1-4, etc. and 4 signal lines 2- 1, 2-2, 2-3, 2-4, etc. represent the number of buses in the LCD, each pixel part (Pixel) contains a thin film crystal 20 (Thin-Fi lm-Transistor) and a storage capacitor 22 (storage capacitor). The lower electrodes of all storage capacitors are connected to a common voltage signal. The basic traditional repair method is: if scan line 1-1 If there is a disconnection 18, the second half of the line cannot receive its voltage signal, forming a half-line defect, and laser welding (Laser v / elding) 6-1, 6-2 can be done at A and B, where the repair ring The intersection point structure 10 with the scanning line and the signal line is the gold layer 1 / gate insulation layer / metal layer I from bottom to top. Therefore, before laser welding, these points should ideally be open circuits and gold layer I and the metal layer I [There will be no electrical short circuit, the metal layer I represents the gate metal, and the metal layer ϋ represents the signal wire metal of the same layer, so the broken wire 18 can pass through the upper half of the repair ring 14-1 through the point A From part B to point B, the voltage signal is transferred to the second half of scan line 1-1, and laser cutting (Laser Cutting) 8-1, 8-2 is done under points A, B, then the lower half of the repair ring 14-1 The ring can still be used to repair the defect of another line. As for the short circuit between the scanning line and the signal line, the same can be obtained by laser cutting at the short circuit 16 8-3, 8-4, and then at the C and D points. Laser welding 6-3, 6-4, and laser cutting 8-5, 8-6 on the right side of C and D, then the short circuit of the two wires can be cut off, and the signal line 2-2 will not cause disconnection , Through point C, the left side of the repair ring 14-2 to point D, so that The signal can also be obtained in the second half of the signal. So for the traditional repair method, the scan line, the broken or short circuit of the signal line can be repaired, but the previous title is the scan line, the intersection of the signal line and the repair ring, for each For scanning lines or signal lines, at least 2 points (such as A, B; C, D) can be repaired, but when the number of lines of the LCD is more, the intersection of the scanning line, the signal line and the repair ring The more, it is easy to cause a short circuit between the scanning line and the signal line through the intersection of these lines and the repair ring, increasing the chance of line defects and reducing the yield. (The obituary KI reads the notes on the back and then writes this page). 笟 · •• dozen. Us .line · The paper size is applicable to China National Standards (CNS) A 4 specifications (210x297 mm) A 6 B6 293952 5 2. Description of the invention () In the LCD manufacturing process of Kunzheng, for the sake of simplicity, the common electrode wires of the metal electrode and the storage capacitor are mostly made of the same layer of gold, and the two fingers are designed to avoid short circuit between each other, such as Figure 2 shows. Scanning lines 1-1, 1-2, 1-3, 1-4, and common electrode lines 24-1, 24-2, 24-3, 24-4 of the storage capacitor are separated by fingers, but if considered For the repair of the line defect, the repair ring and the scanning line, the common electrode line, and the signal line have many intersections, and it is easy to short-circuit and cause line defects. If the scanning line and the common electrode line are arranged as shown in Figure 3, the intersection point of the scanning line and the repair ring is halved, and the intersection point of the common electrode line and each repair ring is reduced to only 1 point (as shown in the figure) The electrode 26 and the repair ring 14-1, 14-2, each have an intersection), although this method can greatly reduce the intersection with the repair ring, reduce the short circuit caused by these intersections, but the shortcoming is When the sight line or the common electrode line is broken, the intersection between these lines and the repair ring is less than 2 points, and it cannot be repaired, which causes line defects and cannot reach wireless defects, which also reduces the yield of the display panel. Therefore, of the above two methods, the former can be repaired, but because there are many points of intersection with the repair ring, it is easy to cause a short circuit between the scanning line, the common electrode line, and the signal line. The latter, although it can reduce the intersection, but scan The broken wire and the common electrode wire cannot be repaired, and neither can improve the yield of the display panel. SUMMARY OF THE INVENTION: The present invention has three objectives: one is to provide a design that can repair all line defects of an active matrix liquid crystal display, the other is to provide a design that can repair all line defects and reduce the number of intersections between the line and the repair ring, and the third is to provide low cost 3. High-yield design. In view of the lack of traditional repair methods, the present invention adds an "isolating electrode" to the liquid crystal display, which can be added at the end of the scanning line, the common electrode line and the signal line, to isolate the electrode, and extend their ends and respectively The repair ring has intersections. The role of "isolating electrode" is to reduce the intersection of the scan line, the common electrode line, the tail end and the repair ring, so that the intersection between each other increases, and increase the chance of short circuit between them, that is, add an additional isolation switch. This electrode structure is two overlapping electrodes with an insulating layer in between. One electrode is connected to the scanning line, signal line or common electrode line, and the other electrode extends to cross the repair ring (also separated by an insulating layer). Laser welding is performed at the "isolating electrode" and laser welding is performed at the point where the two electrodes respectively extend and cross the repair ring, then the line defects are in accordance with the Chinese National Standard (CNS) A 4 specifications (210x297 mm) Please read the precautions on the back before filling in this page). Packing. • Ordered • Printed Α6 Β6 by the Consumer Labor Cooperative of the Central Prototype Bureau of the Ministry of Economic Affairs 5. The description of the invention () can be replaced by a repair ring. In this way, the broken lines of the scan line and the common electrode line can be repaired, and the chance of short circuit between them will not be increased by increasing the intersection with the repair ring, unless the "isolated electrode" of the line and the line The intersection of the tail end and the repair ring, two points are short-circuited at the same time, and there is a signal line or common electrode line or scanning line, and there is a short circuit with the repair ring, which will cause a short circuit between each other, that is, there are three short-circuits at the same time It is possible to cause short circuit here, this probability is very small. The basic repair method differs from the traditional method in that the "isolated electrode" also needs to be laser welded. Because "multi-point" welding can be done at the welding point, K increases the welding yield and reduces the resistance after welding. Therefore, the addition of an "isolating electrode" does not reduce the laser repair yield. The repair method of this "isolated electrode" has been proved by the actual display board experiments to be no problem. In addition to the scanning line and the common electrode line, the signal line can also use the same design, so that all line defects can be repaired, and the intersection point of the scanning line and the repair ring can be reduced to half, the intersection point of the common electrode line and the repair ring, Also maintained at N points (N is the number of repair rings, assuming that the input electrode of the common electrode only pulls one wire), the intersection point of the signal line and the repair ring is also reduced to half, so the chance of short circuit is reduced, but all line defects can be repaired. Eliminate the shortcomings of the traditional repair method and retain the advantages, especially when the scanning line, the common electrode line and the signal line reach more than 1,000, respectively, it can show the advantages of using the "isolated electrode" of the present invention, so that The yield of the display board has been greatly improved. In addition, the present invention also proposes various methods for repairing the common electrode wire. {Please read the precautions on the back before filling in this page) • Installation. • Ordering • A brief description of the illustration: Figure 1. Schematic diagram of the conventional repair ring design method, and repair methods for broken wires and short circuits.圔 2. For the conventional scanning line, the common electrode line and the signal line can repair the required layout restrictions. Figure 3. Circuit diagram of the conventional finger design for reducing the intersection with the repair ring. Fig. 4 is a circuit diagram of the scanning line, the common electrode line is added to the "isolated electrode" of the present invention. Fig. 5 is a circuit diagram in which a signal line is added to the "isolated electrode" of the present invention. Figure 6. Cross-sectional view of the "isolated electrode" of the present invention. Figure 7. Schematic diagram of the repairing method using the "isolated electrode" of the present invention for scanning line breaks. Figure 8. Schematic diagram of the repairing method of the "isolating electrode" for the signal line breaks. 9. Common The electrode wire is broken, and a schematic diagram of the repair method of the four welding points of the "isolated electrode" of the present invention is applied. This paper scale is applicable to the Chinese National Standard (CNS) A4 specifications (210x297 mm) • Green · Printed by the Central Standards Bureau of the Ministry of Economic Affairs, S Industry and Consumer Cooperatives 293952 Λ: Α6 Β6 Printed by the Employee Consumer Cooperative of the Central Bureau of Economic Affairs of the Ministry of Economy Description of the invention (j Figure 10. Schematic diagram of the repair method of the three welding points of the "isolated electrode" of the present invention for the disconnection of the common electrode line. FIG. 11. The repair of the common electrode by the "common repair line" of the present invention. Schematic diagram of the repair method of the two welding points of the wire break. Figure 12 is a schematic diagram of the repair method of using the "common Λ repair line" on the K of the present invention to repair the common electrode wire break. The details of the invention Explanation: Figure 4 shows the end of the scanning lines 1-1, 1-2, 1-3, 1-4, and the common electrode lines 24-1, 24-2, 24-3, 24-4 respectively The design of adding the "isolating electrode" 30 of the present invention is used as an isolating switch, because each line needs to have two intersections with the repair ring when it is to be repaired, so that each scanning line and the common electrode line are The repair ring has 2 points of intersection, but because of the "isolating electrode" as an isolating switch, so The intersection of the sight line and the repair ring is still equivalent to one-half of the original, and the intersection of the common electrode line and the repair ring is also maintained at the N point (N is the number of repair rings) without increasing the chance of short circuit between each other. "Test electrode "28 (Testing Pad") is used to measure whether the scan line or common electrode line is broken, (ie, apply voltage from the input electrode of the scan line 1 and the two ends of the test electrode 28, and then measure the current, if In order to open the circuit, the current cannot be measured, and so on.) Figure 5 shows the design of the signal line with "isolated electrode". Figure 6 is the cross-sectional view of the "isolated electrode" 30, repair ring 14-1, 14-2 The cross-sectional structure at the location is shown in the figure, where the metal layer I, 34 and the gold layer I, 38 are sandwiched by the gate insulating layer 36 (such as silicon nitride (SiNx), etc.) to form an intersection, and the metal layer I, 38 represents Repair ring, metal layer I, 34 represents scan line or common electrode line. The structure of "isolated electrode" 30 is also composed of metal layer I, 34 / gate insulating layer 36 / gold layer II'38 and passes through the contact window (contact hole) 32 is connected to the gold layer I, 34 under the repair ring, and here "isolate electrode" 30 is like an isolating switch. As shown in Figure 7, if the scanning line 1-2 has a broken line 19, it can be laser welded at the "isolating electrode" at points A, B and C, 9-1, 9-2, 9-3, and laser ablation 11-1, 1 Bu 2 below points A and B to separate it from the lower half of the repair ring, so that the remaining half of the repair ring can be used for repair Other line defects. In this way, the voltage signal of scanning line 1-2 can be passed through point A (please read the notes on the back of KI before filling in this page) • Install _ 'order · • line. This paper standard is applicable to China Standard (CNS) A4 specification (210x297 mm) 203052 A6 B6 Printed by the Beigong Consumer Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5. The invention says (), · After the upper half of the ring is repaired to points B and C, scan The voltage signal can be obtained in the second half of the sight line 1-2 to complete the repair of the broken wire of the sight line. τ As shown in Figure 8, if the signal line 2-2 has a disconnection 21, it can be laser welded at the "isolated electrodes" at points A, B, and C, 17-1, 17-2, 17 -3, and do the laser excision of the repair ring to the right of points A and B. Μ-〗, 19-2, then the signal line 2-2 can be transmitted from points A, B and C to off Line part, complete the repair. If a short circuit occurs in the scanning line and the signal line, or the common electrode line and the signal line in the pixel area (Pixel area), the signal lines at both ends of the short circuit point can be cut off first, and then the signal line is disconnected The method of repairing is the same as above. There are 4 ways to repair the disconnection of the common electrode line. As shown in Figure 9, there are four welding points. If the common electrode line 24-2 has a disconnection 23, it can be at points A, B, and C. Laser welding is done at points and D respectively, 25-1, 25-2, 25-3, 25-4, and the excess repair ring is cut off at both ends of points B and C, 27-1, 27-2 Then, the broken wire 23 can be connected to the common electrode wire in the next wall via points A, B, C and D to complete the repair. As shown in Fig. 10, it is a method of three welding points. If the common electrode line 24-2 has a broken line 23, laser welding can be done at points A, B, and C. 29-1, 29-2 , 29-3, and cut the repair rings 31-1, 31-2 at both ends of point B and point C, so the broken part can be connected to the common electrode through point A, point B to point C to complete the repair. As shown in Fig. 11, in order to use the method of adding "common repair line" (2 welding points), add a "common repair line" 39 (made of gold) containing the "isolated electrode" inside the repair ring, at the end of the common electrode T layer I, 38), then the broken line 23 can be welded by laser at points A and B, 33-1, 33-2, and at the two ends corresponding to the "common repair line" (that is, below point A) , At the joint repair line above point B), cut off, 35, complete repair. As shown in Figure 12, the method of adding more than one "common repair line" (2 welding points) to the end of the common electrode line can be divided into a group of 2 lines, or a group of 3 lines, or N "Repair piece" 40 of a group of lines, such as broken line 23, can be repaired by laser welding 37-1, 37-2 at points A and B, "isolated electrode", if you consider whether If two common electrode wires are broken at the same time, a group of three or a group of H can be used. In this way, the repair ring does not need to be occupied, the repair ring can be used for scanning line or signal line repair. {ί / r Read the precautions on the back first and then fill out this page). ¾. • Hit. -Practice. This paper scale is applicable to China National Standard (CNS) A 4 specifications (210x297mm)

Claims (1)

293952 A8 B8 C8 D8 申請專利範圍 1 月I 光 '~~— 2. 二矩陣液晶顯示器,包含:至少兩纽平行導線,至少一條壤當 電^接至第—層金屬構成之平行導線,第二ΐ ^ΐίίϊ —層金屬所構成之修補裝置交又。 狎與弟 主動矩陣液晶顯示器,包含:至少兩组平行導線,至少一條導雷 ‘ΐίΐϊίί於ί示區域外圍,上述之平行導線和修補裝置,Si ί 金屬層且以絕緣層隔離,-“隔離電極,,聯i 思ϊ每線ί尾端’此電極包含兩重叠電極’中間夾有絕緣 接ί第"'層金屬構成之平行導線,第二電極延伸與第 了層金屬所構成义修補裝置交又;修補此種平行導線之線缺‘ 為電性短路(shortcircuit) “隔離電極,,處之第一電極與第—雪朽' 3 UK,’1項動矩陣液晶顯示器,其修補方法係以雷射 4· 請專利範圍第1項或第2項所述之主動矩陣液晶顯示器,其連接點 乃扎上述修補裝置與此缺陷線另一端之交叉點。 5· ίϊίίίίϊί4。項収之主祕陣液晶顯示11,其巾之連接點乃 6. Ξΐί^ίίί1項或第2項所述之主動矩陣液晶顯示器,其中之修 7. t申請專利範圍第6項所述之主動矩陣液晶顯示器,其液 修補方法包括將此環未使用之部份切除。 顯器< 8· 所述之主祕陣液晶顯示器,修補環未使用部 9·气申請專利範圍第丨項或第2項所述之主動矩陣液晶顯示器, 形層金屬層由第二層金屬 10·項或第2項所述之主_陣液晶顯示器,其中之缺 專利範圍第1項或第2項所述之主動矩陣液晶顯示器,其中之平 打^線乃指交錯的掃瞄線與像素之儲存電容的共同電極線。、 巧11項所述之主動矩陣液晶顯示器,其中之共同電極 <十仃導線皆在共同一端聯接。 本紙張尺度賴巾®18CNS >八4胁(210χ297公釐) ----------《------、玎------—缝- (請先閲讀背面之注$項再填寫本頁) 經濟部中央標準局員工消费合作社印裝 AS Β8 C8 ---------D8 六、申請專利範圍 13. 如申請專利範圍第12項所述之主動矩陣液晶顯示器,其中之共同電極 線的“隔離電極”乃加在其聯接端的相反端尾端,且對有缺陷共同電 極線之修補方法為在此“隔離電極”處及其延伸與修補裝置之交點處 做電性短路,且在同一修補裝置與鄰近之無缺陷的共同電極線之延伸 部份做電性短路。 14. 如申請專利範圍第13項所述之主動矩陣液晶顯示器,其中所謂在無缺 陷的共同電極線延伸部份做電性短路乃包含,電性短路此一共同^電 極線上之“隔離電極”以及電性短路此“隔離電極,,之延伸^份與同 一修補裝置之交點。 ' 15‘如申請專利範圍第13項所述之主動矩陣液晶顯示器,其中之修補裝置 與無缺陷的共同電極線之電性短路,出現在共同電極線之輸入部份。 如气,專利範圍第12項所述之主動矩陣液晶顯示器其中之共同電極線 的隔離電極”加在其共同電性短路端的相反端尾端,且其中一電極 接至了位於修補裝置内的“共同修補線”,對一有缺陷的共同電極線 之修補方法為電性短路在此有缺陷線上的“隔離電極”以及電性短路 鄰近無缺陷的共同電極線的“隔離電極”。 17. 如申請專利範圍第16項所述之主動矩陣液晶顯示器,其中之共同修補 線為一條或一條以上0 18. 如申請專利範圍第丨項或第2項所述之主動矩陣液晶顯示器,其中加入 —個測試電極(testing pad)聯至每一條平行導線。 、 9·如申請專利範圍第1項或第2項所述之主動矩陣液晶顯示器,其中之垂 直於掃瞄線之平行的訊號線由所述第二層導電金屬構成。、 20.如,請專利範圍第19項所述之主動矩陣液晶顯示器,其中之“隔離電 極”聯接至所述平行訊號線之尾端,每一電極包含2個電極,一個電 f聯接至由第二層金屬構成之平行訊號線,另一電極聯至第一層金 屬’並延伸與所述修補裝置有至少一個交點。 1.如申請專利範圍第20項所述之主動矩陣液晶顯示器,其液晶 修補方式乃以雷射熔接完成。 2·如申請專利範圍第20項所述之主動矩陣液晶顯示器,其中所謂有缺陷 之訊號線乃指電性斷路。 3·如申請專利範圍第2〇項所述之主動矩降液晶類示器,其中之修補裝置 為一個環。 ^ 24. ^申請專利範圍第23項所述之主動矩陣液晶顯示器,其液晶 器之 修補方法包括將未使用修補環之部份切除。 ’ 5·如申請專利範圍第24項所述之主動矩陣液晶顯示器,其中之未使用 的修補環之部份切除乃以雷射完成。 本紙張•逍用中國國家棣率(CNS )八4祕(21〇χ297公釐) --- (請先聞讀背面之注意事項再填寫本頁) 梦. 訂' 趣_部中央%率局員工消費合作社印裝 A8 B8 C8 D8 六、申請專利耙園 26.如申請專利範圍第20項所述之主動矩陣液晶顯示器,其中之缺陷訊號 線指與第一層導電金屬有電性短路者,且切除該電性短路部份以修補 之0 27_如申請專利範圍第26項所述之主動矩陣液晶顯 之修補乃以雷射切除該電性短路部份以修補之。、益’其中<缺陷部份 1^1^1 1^1 In m —I— n 1 (請先閲讀背面之注$項再填寫本頁) 訂 I I I 線( 經濟部中央標準局男工消費合作社印裝 本紙張Xjtii用t ® S表系率(CNS ) A4规格(21 OX297公釐〉〜 _293952 A8 B8 C8 D8 Patent application scope January I Light '~~ — 2. Two-matrix liquid crystal display, including: at least two parallel wires, at least one earth wire ^ connected to the parallel wire composed of the first layer of metal, the second Ι ^ ΐίίϊ—The repairing device composed of layers of metal is interchanged.狎 与 弟 active matrix liquid crystal display, including: at least two sets of parallel wires, at least one lightning guide at the periphery of the display area, the above-mentioned parallel wires and repair device, Si ί metal layer and separated by an insulating layer,-"isolated electrode ,, I think the end of each line is "this electrode consists of two overlapping electrodes" with a parallel wire consisting of an insulating connection and a second layer of metal sandwiched between them, and the second electrode extends with the first layer of metal. Cross and repair; repairing the line defect of this parallel wire 'is an electric short circuit (short circuit) "Isolation electrode, where the first electrode and the first-the snow" 3 UK,' 1 item dynamic matrix liquid crystal display, the repair method is For laser 4. The active matrix liquid crystal display described in item 1 or 2 of the patent scope, the connection point is the intersection of the repair device and the other end of the defect line. 5. ίϊίίίίϊί4. Item received the main secret LCD display 11, the connection point of the towel is 6. Ξΐί ^ ίίί Item 1 or item 2 of the active matrix liquid crystal display, which repairs 7. t apply for the patent scope of item 6 of the initiative For matrix liquid crystal displays, the liquid repair method includes removing the unused part of the ring. Display < 8 · The main secret liquid crystal display mentioned above, the repair ring unused part 9. The active matrix liquid crystal display described in item 丨 or item 2 of the patent application scope, the shape layer metal layer is composed of the second layer metal 10. The main_array LCD described in item 10 or item 2, which lacks the active matrix LCD of item 1 or item 2, wherein the flat line refers to the interlaced scanning lines and pixels The common electrode line of the storage capacitor. Qiao 11 active matrix liquid crystal display, wherein the common electrode < ten thousand wires are connected at a common end. The size of this paper is Laijin®18CNS > 8 4 flank (210 × 297mm) ---------- 《------ 、 玎 ------— Sewing- (Please read the back first Note $ item and then fill in this page) Printed and printed AS Β8 C8 --------- D8 of the Employees ’Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs 6. Application for patent scope 13. As stated in item 12 of the patent application scope Matrix liquid crystal display, in which the "isolated electrode" of the common electrode line is added to the opposite end of the connecting end, and the repair method for the defective common electrode line is at this "isolated electrode" and its extension and repair device Make an electrical short at the intersection, and make an electrical short at the extension of the same repair device and the adjacent common electrode line without defects. 14. The active matrix liquid crystal display as described in item 13 of the patent application scope, wherein the so-called electrical short-circuiting on the extension part of the common electrode line without defects includes, electrically short-circuiting the "isolating electrode" on this common electrode line And the intersection of the "isolating electrode", which is electrically short-circuited, and the intersection of the same repair device. "15" An active matrix liquid crystal display as described in item 13 of the patent application range, in which the repair device and the common electrode line without defects The electrical short-circuit appears in the input part of the common electrode line. For example, the active electrode of the active matrix liquid crystal display described in item 12 of the patent scope, where the isolation electrode of the common electrode line is added to the opposite end of the common electrical short-circuit end And one of the electrodes is connected to the "common repair line" in the repair device. The repair method for a defective common electrode line is an electrical short circuit. The "isolation electrode" on this defective line and the electrical short circuit are adjacent "Isolated electrode" of a common electrode line without defects. 17. The active matrix liquid crystal display as described in item 16 of the patent scope, wherein the common repair line is one or more than 0 18. The active matrix liquid crystal display as described in item 丨 or item 2 of the patent scope, wherein Add a test pad to connect each parallel wire. 9. The active matrix liquid crystal display as described in item 1 or 2 of the patent application, wherein the parallel signal line perpendicular to the scanning line is composed of the second layer of conductive metal. 20. For example, please refer to the active matrix liquid crystal display of item 19 of the patent scope, wherein the "isolation electrode" is connected to the tail end of the parallel signal line, each electrode includes 2 electrodes, and an electrical f is connected to the The parallel signal line composed of the second layer of metal, the other electrode is connected to the first layer of metal and extends at least one intersection with the repair device. 1. The active matrix liquid crystal display as described in item 20 of the patent application, the liquid crystal repair method is completed by laser welding. 2. The active matrix liquid crystal display as described in item 20 of the patent application, where the so-called defective signal line refers to an electrical disconnection. 3. The active torque drop liquid crystal display device as described in item 20 of the patent application scope, wherein the repairing device is a ring. ^ 24. ^ The active matrix liquid crystal display described in item 23 of the patent scope, the repair method of the liquid crystal device includes cutting off the part of the unused repair ring. ’5. The active matrix liquid crystal display as described in item 24 of the patent application, in which part of the unused repair ring is removed by laser. This paper • Use the Chinese National Departure Rate (CNS) 8 4 secrets (21〇 × 297 mm) --- (please read the precautions on the back and then fill out this page) Dream. Order 'Fun_Ministry of Central Administration A8 B8 C8 D8 printed by employee consumer cooperatives 6. Patent application 26. Active matrix liquid crystal display as described in item 20 of the patent application, where the defect signal line refers to an electrical short circuit with the first layer of conductive metal, And the electrical short circuit part is cut to repair 0 27_ The repair of the active matrix liquid crystal display as described in item 26 of the patent application scope is to cut the electrical short circuit part by laser to repair. , Yi 'Among them < defective part 1 ^ 1 ^ 1 1 ^ 1 In m —I— n 1 (please read the note $ item on the back and then fill in this page) Order line III (consumption of male workers of the Central Standards Bureau of the Ministry of Economic Affairs Cooperative printing paper Xjtii uses t ® S representation system ratio (CNS) A4 specification (21 OX297 mm)> ~ _
TW82102742A 1993-04-10 1993-04-10 The repaired structure & method of main matrix LD TW293952B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7894011B2 (en) 2006-03-15 2011-02-22 Au Optronics Corp. Display panel having repair lines and signal lines disposed at different substrates

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7894011B2 (en) 2006-03-15 2011-02-22 Au Optronics Corp. Display panel having repair lines and signal lines disposed at different substrates
US8026993B2 (en) 2006-03-15 2011-09-27 Au Optronics Corp. Display panel having repair lines and signal lines disposed at different substrates

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