TW293204B - A like-series analog digital converter - Google Patents
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393204 經濟部中央標準局員工消費合作社印^ A7 B7 五、發明説明(/ ) 發明背景 發明範圍 本發明係關於類比數位轉換器及其轉換方法,更明確而言,係指 多級的平行式轉換器,其使用第一個轉換級來決定輸入電壓的粗略範 圍’而後續的轉換級再解出類比輸入訊號至更精確的增量。本發明可 適用於視訊及數位訊號處理的領域。 背景技術說明 類比資料的數位處理和傳輸的應用需要將類比形式轉換成數位的 表示方式。一般習知的類比數位轉換器的種類爲平行比較器式或快閃 式轉換器’其以比較多個參考電壓與輸入電壓的關係,將結果由編碼 邏輯輸出,在每次轉換中,數位碼代表最接近輸入電壓的參考電壓; 而逐漸逼近式比較器的轉換器則利用一個數位類比轉換器以嘗試錯誤 逼近輸入的方法來產生數位輸出碼。圖la爲快閃式轉換器,其輸出碼 通常是二進制碼,由編碼邏輯3G所建立,提供η位元解析度來表示輸 入訊號。這種架構通常需要2'η個參考電壓10以及2、個比較器 20 °當這種形式的比較器解析度愈高時(輸出的位元數目增加),設 計就會變得極爲複雜。 圖lb爲逐漸追近式類比數位轉換器,類比輸入訊號vin輸入至取 樣與保持線路50,而取樣的輸入訊號55爲比較器60的輸入。資料編碼 器70設定輸出字組9Ga ... 9Gd的最大有效位元9Qd爲邏輯1,而其 他的位元9Ga,9Gb,9Gc爲邏輯0。數位類比轉換器80的輸出訊號85, 代表數位類比轉換器80的電壓範圍中間點電壓。如果數位類比轉換器 80的輸出電壓85大於取樣的類比訊號55,則比較器60的輸出變成邏輯 0 ’而時鐘訊號不會被AND閘65所阻隔。資料編碼器70則設定最大有效 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) ----------^— (請先閱讀背面之注意事項再填寫本頁) 訂 錄 ^^3204 經濟部中央榡準局員工消費合作衽中袋 A7 B7 五、發明説明(2 ) 位元90d爲邏輯0,下一個最大有效位元9Gc爲邏輯1。數位類比轉換器 80的輸出85之輸出電壓爲數位類比轉換器80電壓範圍的1/4。比較器 60再比較數位類比轉換器的輸出85與取樣的類比輸入訊號55。如果數 位類比轉換器80的輸出電壓85小於取樣的類比輸入訊號,比較器60將 產生輸出邏輯1。AND閘65將使時鐘訊號無法通過,而下一個最大有效 位元9Gc將維持爲邏輯1,而下一個最小有效位元則設爲邏輯1。 這種嘗試並設定輸出位元90a, ...,90d的過程將進行直到所有的 位元都已經決定,能代表取樣的輸入訊號大小。只有當過程完成時, 輸出位元9Ga,...,9Gd才需要被輸出線路檢查。逐漸逼近式類比數位 轉換器需要不同的取樣與保持線路,而一個複雜的數位類比轉換器, 產生錯誤的可能性提高。 爲了要簡化快閃式類比數位轉換器的設計,已知有兩種技術可以 運用。這兩種多級轉換的技術都可以用來完成類比數位的轉換。在第 一種技術裡,如美國專利No.5302869 (Hosotani等人),美國專利 No.5389929 (Nayebi 等人),美國專利No.5353027 (Vorenkamp 等人),美國專利No.53693G9 ( Bacrania等人),美國專利 No. 5387914 (Mangclsdof)所示,第一級爲快閃式類比數位轉換器 的粗略解析度;而具有數位類比轉換器的第二級則調整電壓比較器的 參考電壓來完成解析度更佳的轉換。這兩種轉換的結果再被編碼成數 位輸出位元組,來代表類比輸入電壓的大小。在第二種技術裡,如美 國專利No.5291198 ( Dingwair等人),美國專利No.5223836 (Komatsu),美國專利Ν〇·5400029 ( Kobayashi),美國專利 No.4733217 (DingWaii),美國專利No.5349354 (Ho等人)所示, 這種使用多個轉換級的技術,是利用決定邏輯根據前一次比較級的結 果,將參考電壓適當的切換到每一級。 以第二種多級轉換的技術爲例,請參考圖二,其爲美國專利 本紙張尺度適用中國國家標準(CNS ) M規格(210X29.7公釐) (請先閲讀背面之注意事項再填寫本頁) .裝. 訂 A7 B7 經濟部中央標準局員工消費合作衽印製 五、發明説明(3 ) No.4903028 (Fukashima)的電路圖,它先產生一組電壓源,由 V—REFBOT (最低値)逐漸增加至V—REFTOP (最高値),以建立電壓 輸入(Vin)的轉換範圍。一組粗略範圍比較器2連接至輸入電壓以及 一組參考電壓在分開的區間所建立的Vin的la,lb粗略範圍。粗略分 域比較器5的輸出爲控制邏輯與開關單元3的輸入,它可以將一組細微 分域比較器4連接至適當的參考電壓的分域範圍1。這組參考電壓ia被 分成更細微的增量’以建立轉換Vin成爲數位輸出{D0,D1,D2 ...,Dn} 的最大解析度。當Vin變化時,輸出碼的値或粗略分域比較器5的輸出 碼也跟著改變,而且控制邏輯與開關單元3也移動細微分域比較器4至 下一個分域範圍(從la至lb)。 由於元件選擇及製程漂移的容忍度不同,粗略分域比較器2的輸 出碼5可能是錯誤的。爲了檢查這個錯誤.,就需要額外的細微分域比 較器4a及4b,它們將視Vin的大小分別擺在分域ia或lb的旁邊。額外 的細微分域比較器4a及4b的輸出碼爲錯誤校正碼7,而這組粗略分域 碼則由輸出編碼邏輯8來決定輸入電壓Vin的數位輸出代表碼 {D0,D1,D2,...Dn}。 類比數位轉換器有一個很重嬖的元件爲電壓比較器,其爲此技術 領域中習知者’它包含一個操作放大器(operational amplifier) ’有一輸入端接到參考電壓源,而另一輸入端接到類比 電壓源’如果類比電壓訊號大於參考電壓源,則輸出可以假定爲第一 邏輯狀態。然而如果類比電壓訊號小於參考電壓源,則輸出將假定爲 第二邏輯狀態。 另外一種形式的比較器可參考與本申請案之申請人相同的另一專 利申請案,其申請案號爲八四一〇六一七二,使用多個比較器來形成 〜個雙分式比較器來比較類比電壓訊號及參考電壓。 (請先閲讀背面之注意事項再填寫本頁) .裝. • IT —^1---Γ XV . *-'β 絲 令紙張尺度適财關家梯準(CNS) A4規格(210^^jy A7 B7 293204 五、發明説明(斗) 發明簡論 本發明的一個目的爲減少實際實施平行式類比數位轉換器的大小 及複雜度;本發明的另一個目的是省去逐漸逼近式類比數位轉換器中 的數位類_涯及峨與撕線路;此外本翻购—翻的爲增 進平行式類比數位轉換器的參考電壓產生器所需要的穩定時間 (settling time) ° 爲了達成這些目的,似串列式類比數位轉換器有一個粗比類比數 位轉換器賴換腿f|職號趣略痛鐘麵,以及第—個 二個細微類_簡_將雛謙識射础更麵贿度的數位 碼;-個_參考軸魅器建錄—肺考鞠雖至_類比數 位轉換器;一個細微參考電壓產生器建立第二組參考電壓,連接至第 一個和第二個類比數位轉換器。 與粗略參考電壓產生器連接的爲粗略參考電壓開關裝置,它可以 選擇运組粗略參考電壓的其中一個電壓連接到第〜及第二個細微類比 數位轉換器。粗略參考電壓所連接的位置視粗略數位碼的値來決定。 一個輸出編碼袈遛,轉換粗略數位碼及第一個和第二個細微數位 碼成爲輸出數位碼,來代表類比輸入電壓的大小^ 細微數位碼在第-個轉換時間產生於第一個細微類比數位轉換 器,而在第二個轉換時間產生於第二個細微類比數位轉換器。第一個 轉換時間及第二個轉換時間是交互進行的,以將連續的類比電壓訊號 轉換成爲連續的數位輸出碼。 本紙張尺度適用中國國家榡準(CNS ) Α4规格(210Χ297公釐) (請先閲讀背面之注意事項再填寫本頁) -燊. 經濟部中央標準局員工消費合作社印製 經濟部中央標準局員工消費合作杜印製 293204 A7 B7 五、發明説明(友) 圖示簡要說明 圖1a爲習知技術中的平行式或快閃式類比數位轉換器的電路圖。 圖lb爲習知技術中的逐漸逼近式類比數位轉換器的電路圖。 圖2 爲習知技術中的兩階式類比數位轉換器的功能方塊圖。 圖3 爲本發明的似串列式類比數位轉換器的功能方塊圖。 圖4 a及4 b爲本發明的電壓比較器的功能方塊圖。 圖5 a—5d爲本發明的電壓比較器的電路圖,顯示類比數位轉換的 進行過程之操作條件。 圖6爲本發明的時序圖,顯示類比數位轉換方法的時間步驟。 圖7爲本發明的細微數位碼的解析度圖。 本發明詳細說明 請參考圖3,類比輸入電壓(Vin) 150加到粗略類比數位轉換器 400及細微類比數位轉換器401和402。Vinl50在第一次時間增量被取 樣並保持在粗略類比數位轉換器400及細微類比數位轉換器401和402 中。取樣的Vin 150在第二次時間增量時,在粗略類比數位轉換器 中,與電阻分壓網路產生的電壓比較。這個分壓網路爲粗略參考電壓 產生器100。電阻分壓網路連接於兩個參考電壓源Vrb 120及Vrt 130 之間。Vin 150與粗略參考電壓產生器的比較結果,形成一個溫 度尺碼(溫度尺碼是一種二進制碼,碼的形成是由連續的數字組成, 當碼增加時,連續1的數目也增加,例如 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閱讀背面之注意事項再填寫本頁) -裝. 訂 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明(6 ) 0000値爲最低的碼 0001 0011 0111 1111値爲最高的碼)。 ’ 這就是粗略數位碼475。 粗略數位碼475傳入開關選擇邏輯300,以選擇粗略參考電壓產 生器1GG的參考電壓接到細微類比數位轉換器401及402。開關 301,302,303及304將啓動以連接適當的粗略參考電壓產生器1〇〇的參 考電壓到細微類比數位轉換器401及402。 細微參考電壓產生器20()爲另一個電阻分壓網路。它可以和粗略 參考電壓產生器100中的電阻101並聯。每一個細微參考電壓產生器 200的參考電壓皆連接到細微類比數位轉換器401及402。 在第三及第四個時間增量時,類比輸入訊號150與所選擇的粗略 參考電壓350及細微參考電壓產生器200的電壓差來比較。而比較的結 果形成一個溫度尺碼,就是細微數位碼425和450。 粗略數位碼475和細微數位碼425及450在輸出編碼器500中轉換 成輸出數位碼510。輸出數位碼510爲二進位數字,有一組由粗略數位 碼475決定的最大有效位元,及一組由細微數位碼425或450決定的最 小有效位元。輸出數位碼510在第五和第六個時間增量產生並保持 住。 一個轉換週期包含第一個到第六個時間增量,並且反覆執行以形 成連續的數位輸出碼,來代表Vin 150的取樣大小。在一個轉換週期 中’細微類比數位轉換器4〇1產生細微數位碼425。在另一個轉換週 本紙張尺度適用中國國家棟準(CNS ) A4规格(2ΐ〇χ297公嫠) { ---------^— (請先閱讀背面之注意事項再填寫本頁) 訂 293204 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明(7 ) 期,細微類比數位轉換器402產生細微數位碼450。這種交互使用細微 類比數位轉換器401及402的方式,允許在下一次轉換週期開始取樣 時,前一個轉換週期仍在進行處理。這種作法可以讓取樣的進行以兩 倍於只有一個細微類比數位轉換器時的速度進行。 每一個細微類比數位轉換器401及402是由一組比較器單元410所 組成。圖4 a及4 b各顯示這種比較器單元的電路圖。類比輸入訊號 Vin連接至一個金氧半導體場效應電晶體(MOSFET)開關600的第一個 端點。電壓(Vrl ) 645,爲所選擇的粗略參考電壓(圖3的350 )連 接至MOSFET開關640的第一個端點。電壓(Vr2 ) 655,爲細微參考 電壓產生器(圖3的200 )中的一點,連接至MOSFET開關650的第一 個端點。臨界參考電壓635連接至MOSFET開關630的第一個端點。電 容620連接於MOSFET開關600,640的第二個端點及MOSFET開關630的 第二個端點之間。MOSFET開關670連接於MOSFET開關630的第二個端 點及MOSFET開關650的第二個端點之間。電容660的第一個端點連接 至MOSFET開關650及670的第二個端點。電容660的第二個端點連接至 放大器73G的輸入端。放大器730的輸出端爲比較器電路輸出Vo 715,爲單一個位元,將可以形成細微數位碼(圖3的425及450 )。 放大器730可以視應用上的需要來實施。在圖4 a中,放大器730 的輸入端連接至MOSFET開關685的第一個端點,及放大器680的輸入 端點。MOSFET開關685的第二個端點及放大器680的輸出端點連接至 電容690的第一個端點。電容69G的第二個端點連接至MOSFET開關695 的第一個端點以及放大器7GG的輸入端點。MOSFET開關695的第二 個端點及放大器7GG的輸出端點連接至閂取放大器(latching amplifier)71{)的輸入端。閂取放大器710的輸出端爲放大器730的輸 出0 本紙張尺度適用中國國家樣準(CNS ) A4規格(210X 297公嫠) (請先閱讀背面之注意事項再填寫本頁) .裝. *vs 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明(沄) 圖4a顯示三個反相器68G,7GG及71G。每一級反相器都當成放大 器用,而級數可以依據應用的需要改變。 圖4 b爲放大器730的另一種設計方式。其中放大器730的輸入端 爲MOSFET開關750的第一個端點及操作放大器740的負輸入端點。操 作放大器740的正輸入端點連接至參考電,如此可以 將操作放大器設定成電壓比較器。MOSFET開關750的第二個端點及操 作放大器740的輸出連接在一起,形成放大器730的輸出。 MOSFET開關600,630,640,650,670,685,695及750皆由時序控 制訊號720控制。 圖4中比較器的操作模式顯示於圖5 a- 5 d。圖5 a爲第一個時間 增量時,比較器開始對Vin 605取樣。MOSFET開關600,630,650,685 和695導通,MOSFET開關640及670不導通。跨在電容620的電壓爲 Vin-Vthref。跨在電容660上的電壓爲Vr2_Vth2 (其中Vth2爲放大 器680的自偏壓self-biasing)。放大器700也偏壓在自偏壓上。 圖5 b爲第二個時間增量時!比較器的操作。MOSFET開關600不 導通,使跨在電容62G上的電壓保持常數,也就是維持住Vin 605的 電壓。在進行這項操作動作時,開關630可以在導通或不導通狀態, 因爲它不會影響保存在電容620的有效電壓。 圖5 c爲第三個時間增量時,比較器的操作。MOSFET開關640導 通以連接Vrl 645至電容620的第一個端點A點。出現在B點(電容 620的第二個端點)現在變成Vthref + (Vrl-Vin)。Vrl 645的電壓 値爲所選擇的粗略參考電壓(圖3的350 )。 本纸張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) ----------裝-------—訂------線 (請先閱讀背面之注意事項再填寫本頁) 經濟部中央標準局員工消費合作杜印製 A7 B7 五、發明説明(9) 第四個時間增量時,比較器的操作則顯示於圖5 d。MOSFET開關 640維持導通,而仙3「£1'開關600,630,650,685及695則不導通。導 通的MOSFET開關670連接電容620的第二個端點至電容660的第一個端 點。适個連接會在D點,也就是放大器680的輸入端產生電壓 (Vth2+(Vthref+(Vrl-Vin))-Yr2)393204 Printed by the Staff Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs ^ A7 B7 V. Description of the invention (/) Scope of the invention The present invention relates to an analog-to-digital converter and its conversion method, more specifically, it refers to multi-level parallel conversion The first conversion stage is used to determine the rough range of the input voltage, and the subsequent conversion stage then solves the analog input signal to a more accurate increment. The invention can be applied to the field of video and digital signal processing. Description of the Related Art The application of digital processing and transmission of analog data requires the conversion of the analog form into a digital representation. The types of analog digital converters commonly known are parallel comparator type or flash converter. It compares the relationship between multiple reference voltages and input voltages, and outputs the result from the coding logic. In each conversion, the digital code Represents the reference voltage closest to the input voltage; the converter of the gradually approaching comparator uses a digital analog converter to try to approximate the input by mistake to generate the digital output code. Figure 1a is a flash converter. The output code is usually a binary code, which is created by coding logic 3G and provides n-bit resolution to represent the input signal. This architecture usually requires 2′η reference voltages 10 and 2, and 20 comparators. When the resolution of this type of comparator is higher (the number of output bits increases), the design becomes extremely complicated. FIG. 1b shows a gradually tracking analog-to-digital converter. The analog input signal vin is input to the sampling and holding circuit 50, and the sampled input signal 55 is the input of the comparator 60. The data encoder 70 sets the maximum effective bit 9Qd of the output word group 9Ga ... 9Gd to logic 1, while the other bits 9Ga, 9Gb, 9Gc are logic 0. The output signal 85 of the digital-to-analog converter 80 represents the midpoint voltage of the voltage range of the digital-to-analog converter 80. If the output voltage 85 of the digital-to-analog converter 80 is greater than the sampled analog signal 55, the output of the comparator 60 becomes a logic 0 'and the clock signal is not blocked by the AND gate 65. The data encoder 70 sets the maximum effective size of the paper. The Chinese national standard (CNS) A4 specification (210X297 mm) is applicable ---------- ^ — (please read the precautions on the back before filling this page) Bookmark ^^ 3204 Employee Consumption Cooperation of the Central Bureau of Economics of the Ministry of Economics, A7 B7. V. Description of invention (2) Bit 90d is logic 0, and the next largest valid bit 9Gc is logic 1. The output voltage of the output 85 of the digital analog converter 80 is 1/4 of the voltage range of the digital analog converter 80. The comparator 60 compares the output 85 of the digital-to-analog converter with the sampled analog input signal 55. If the output voltage 85 of the digital-to-analog converter 80 is less than the sampled analog input signal, the comparator 60 will generate an output logic one. AND gate 65 will prevent the clock signal from passing, and the next most significant bit 9Gc will remain at logic 1, and the next least significant bit will be set to logic 1. This process of trying and setting the output bits 90a, ..., 90d will be carried out until all the bits have been determined, which can represent the size of the input signal sampled. Only when the process is completed, the output bits 9Ga, ..., 9Gd need to be checked by the output line. Approaching analog-to-digital converters require different sample-and-hold circuits, while a complex digital-to-analog converter increases the likelihood of errors. To simplify the design of flash analog-to-digital converters, two techniques are known to be used. Both of these multi-level conversion techniques can be used to complete the conversion of analog digits. In the first technique, such as US Patent No. 5302869 (Hosotani et al.), US Patent No. 5389929 (Nayebi et al.), US Patent No. 5353027 (Vorenkamp et al.), US Patent No. 53693G9 (Bacrania et al. ), As shown in US Patent No. 5387914 (Mangclsdof), the first stage is the rough resolution of the flash analog-to-digital converter; the second stage with the digital-to-analog converter adjusts the reference voltage of the voltage comparator to complete the analysis Better conversion. The results of these two conversions are then encoded into digital output bytes to represent the magnitude of the analog input voltage. In the second technology, such as US Patent No. 5291198 (Dingwair et al.), US Patent No. 5223836 (Komatsu), US Patent No. 5400029 (Kobayashi), US Patent No. 4733217 (DingWaii), US Patent No. .5349354 (Ho et al.) Shows that this technique using multiple conversion stages uses decision logic to switch the reference voltage to each stage appropriately based on the result of the previous comparison stage. Take the second multi-level conversion technology as an example, please refer to Figure 2, which is a US patent. The paper size is applicable to the Chinese National Standard (CNS) M specification (210X29.7mm) (please read the notes on the back before filling in This page). Packing. Order A7 B7 Printed by the Consumer Standardization Bureau of the Central Standards Bureau of the Ministry of Economic Affairs V. Invention Instructions (3) No.4903028 (Fukashima) circuit diagram, it first generates a set of voltage sources, which is generated by V-REFBOT (minimum Value) is gradually increased to V-REFTOP (highest value) to establish the conversion range of the voltage input (Vin). A set of coarse range comparators 2 are connected to the rough range of la, lb of Vin established by the input voltage and a set of reference voltages in separate intervals. The output of the coarsely divided domain comparator 5 is the input of the control logic and the switching unit 3, which can connect a set of finely divided domain comparators 4 to the appropriate range 1 of the reference voltage. This set of reference voltages ia is divided into finer increments' to establish the maximum resolution of converting Vin to digital output {D0, D1, D2 ..., Dn}. When Vin changes, the value of the output code or the output code of the coarse sub-domain comparator 5 also changes, and the control logic and the switching unit 3 also move the fine differential domain comparator 4 to the next sub-domain range (from la to lb) . Due to the different tolerances in component selection and process drift, the output code 5 of the coarsely divided domain comparator 2 may be wrong. In order to check this error, additional fine differential domain comparators 4a and 4b are required, which will be placed next to sub-domain ia or lb depending on the size of Vin, respectively. The output codes of the additional fine differential domain comparators 4a and 4b are error correction codes 7, and this set of coarse sub-domain codes is determined by the output coding logic 8 to determine the digital output representative codes of the input voltage Vin {D0, D1, D2, ..Dn}. An analog-to-digital converter has a very important component as a voltage comparator, which is known to those skilled in the art as 'it includes an operational amplifier' with one input terminal connected to a reference voltage source and the other input terminal If the analog voltage signal is greater than the reference voltage source, the output can be assumed to be in the first logic state. However, if the analog voltage signal is less than the reference voltage source, the output will assume the second logic state. For another type of comparator, please refer to another patent application that is the same as the applicant of this application. The application number is 841,061,172. Use multiple comparators to form a double fractional comparison To compare the analog voltage signal and the reference voltage. (Please read the precautions on the back before filling in this page). Install. • IT — ^ 1 --- Γ XV. *-'Β makes the paper size suitable for financial standards and standards (CNS) A4 specifications (210 ^^ jy A7 B7 293204 V. Description of Invention (Bucket) Brief Description of the Invention One purpose of the present invention is to reduce the size and complexity of the actual implementation of a parallel analog-to-digital converter; another object of the present invention is to eliminate the gradual approach of analog-to-digital conversion The digital class in the device _Ya and E-Tear line; in addition, this repurchase-the settling time required to improve the reference voltage generator of the parallel analog digital converter ° To achieve these purposes, it seems like a series The column-type analog-to-digital converter has a rough analog-to-digital converter that changes legs f | The job title is a little bit painful, and the first two sub-classes Code; a _ reference axis charm creation record-lung test Ju to _ analog digital converter; a fine reference voltage generator to establish a second set of reference voltage, connected to the first and second analog digital converter. The rough reference voltage generator is connected roughly Reference voltage switching device, which can select one of the rough reference voltages of the operation group to connect to the second and second fine analog digital converters. The position of the rough reference voltage is determined by the value of the rough digital code. An output code袈 遛, convert the coarse digital code and the first and second fine digital codes into the output digital code to represent the magnitude of the analog input voltage ^ The fine digital code is generated in the first fine analog digital converter at the first-conversion time And the second conversion time is generated by the second subtle analog-to-digital converter. The first conversion time and the second conversion time are carried out interactively to convert the continuous analog voltage signal into a continuous digital output code. This paper scale is applicable to China National Standard (CNS) Α4 specification (210Χ297mm) (please read the precautions on the back before filling this page) -Shen. Employees of the Central Bureau of Standards of the Ministry of Economic Affairs Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economy Consumer Cooperation Du Printed 293204 A7 B7 V. Description of the invention (friends) A brief description of the figure Circuit diagram of a digital or flash analog digital converter. FIG. 1b is a circuit diagram of a gradually approaching analog digital converter in the conventional technology. FIG. 2 is a functional block diagram of a two-step analog digital converter in the conventional technology. Fig. 3 is a functional block diagram of a tandem analog-to-digital converter of the present invention. Figs. 4a and 4b are functional block diagrams of a voltage comparator of the present invention. Fig. 5 a-5d are voltage comparators of the present invention. The circuit diagram shows the operating conditions of the process of analog digital conversion. Figure 6 is a timing diagram of the present invention, showing the time steps of the analog digital conversion method. Figure 7 is the resolution diagram of the fine digital code of the present invention. Referring to FIG. 3, the analog input voltage (Vin) 150 is applied to the coarse analog digital converter 400 and the fine analog digital converters 401 and 402. Vinl50 is sampled at the first time increment and held in the coarse analog digital converter 400 and the fine analog digital converters 401 and 402. The sampled Vin 150 is compared with the voltage generated by the resistor divider network in the rough analog-to-digital converter at the second time increment. This voltage divider network is a rough reference voltage generator 100. The resistor divider network is connected between two reference voltage sources Vrb 120 and Vrt 130. The comparison result between Vin 150 and the rough reference voltage generator forms a temperature scale (temperature scale is a binary code, the code is formed by consecutive numbers, when the code increases, the number of consecutive 1s also increases, such as the paper size Applicable to China National Standard (CNS) A4 specification (210X297mm) (please read the precautions on the back before filling in this page)-Pack. Order A7 B7 printed by Employee Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs 5. Invention Instructions (6) 0000 is the lowest code 0001 0011 0111 1111 is the highest code). This is roughly 475. The coarse digital code 475 is passed to the switch selection logic 300 to select the reference voltage of the coarse reference voltage generator 1GG and is connected to the fine analog digital converters 401 and 402. Switches 301, 302, 303 and 304 will be activated to connect the reference voltage of the appropriate rough reference voltage generator 100 to the fine analog digital converters 401 and 402. The subtle reference voltage generator 20 () is another resistor divider network. It can be connected in parallel with the resistor 101 in the rough reference voltage generator 100. The reference voltage of each subtle reference voltage generator 200 is connected to the subtle analog digital converters 401 and 402. At the third and fourth time increments, the analog input signal 150 is compared with the selected voltage difference between the coarse reference voltage 350 and the fine reference voltage generator 200. The comparison results in a temperature scale, which is the fine digital codes 425 and 450. The coarse digital code 475 and the fine digital codes 425 and 450 are converted into the output digital code 510 in the output encoder 500. The output digital code 510 is a binary number, with a set of maximum significant bits determined by the coarse digital code 475 and a set of minimum effective bits determined by the fine digital code 425 or 450. The output digital code 510 is generated and held during the fifth and sixth time increments. A conversion cycle contains the first to sixth time increments, and is executed repeatedly to form a continuous digital output code to represent the sample size of Vin 150. The fine analog digital converter 401 generates a fine digital code 425 in one conversion cycle. In another conversion week, the paper standard is applicable to China National Standards (CNS) A4 (2〇〇297 public daughter) {--------- ^ — (please read the precautions on the back before filling this page) Order 293204 A7 B7 printed by the Employee Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economy V. Invention description (7) Period, the subtle analog-to-digital converter 402 generates a subtle digital code 450. This interaction uses subtle analog-to-digital converters 401 and 402 to allow processing at the beginning of the next conversion cycle while the previous conversion cycle is still being processed. This approach allows sampling to be performed at twice the speed of a single analog-to-digital converter. Each subtle analog-to-digital converter 401 and 402 is composed of a group of comparator units 410. Figures 4a and 4b each show the circuit diagram of this comparator unit. The analog input signal Vin is connected to the first terminal of a metal oxide semiconductor field effect transistor (MOSFET) switch 600. The voltage (Vrl) 645, which is the selected rough reference voltage (350 in FIG. 3), is connected to the first terminal of the MOSFET switch 640. The voltage (Vr2) 655, which is a point in the fine reference voltage generator (200 in FIG. 3), is connected to the first terminal of the MOSFET switch 650. The critical reference voltage 635 is connected to the first terminal of the MOSFET switch 630. The capacitor 620 is connected between the second terminal of the MOSFET switches 600, 640 and the second terminal of the MOSFET switch 630. The MOSFET switch 670 is connected between the second end of the MOSFET switch 630 and the second end of the MOSFET switch 650. The first terminal of the capacitor 660 is connected to the second terminal of the MOSFET switches 650 and 670. The second terminal of the capacitor 660 is connected to the input terminal of the amplifier 73G. The output end of the amplifier 730 is the comparator circuit output Vo 715, which is a single bit, and can form a fine digital code (425 and 450 in FIG. 3). The amplifier 730 may be implemented according to application needs. In FIG. 4a, the input terminal of the amplifier 730 is connected to the first terminal of the MOSFET switch 685, and the input terminal of the amplifier 680. The second terminal of the MOSFET switch 685 and the output terminal of the amplifier 680 are connected to the first terminal of the capacitor 690. The second terminal of the capacitor 69G is connected to the first terminal of the MOSFET switch 695 and the input terminal of the amplifier 7GG. The second terminal of the MOSFET switch 695 and the output terminal of the amplifier 7GG are connected to the input terminal of a latching amplifier 71 {). The output terminal of the latch amplifier 710 is the output of the amplifier 730. This paper size is applicable to the Chinese National Standard (CNS) A4 specification (210X 297 gong) (please read the precautions on the back and fill in this page). Install. * Vs The A7 B7 is printed by the Employee Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs. V. Description of invention (沄) Figure 4a shows three inverters 68G, 7GG and 71G. Each inverter is used as an amplifier, and the number of stages can be changed according to the needs of the application. FIG. 4b is another design method of the amplifier 730. The input terminal of the amplifier 730 is the first terminal of the MOSFET switch 750 and the negative input terminal of the operational amplifier 740. The positive input terminal of the operational amplifier 740 is connected to the reference power, so that the operational amplifier can be set as a voltage comparator. The second terminal of the MOSFET switch 750 and the output of the operational amplifier 740 are connected together to form the output of the amplifier 730. The MOSFET switches 600, 630, 640, 650, 670, 685, 695 and 750 are all controlled by the timing control signal 720. The mode of operation of the comparator in Figure 4 is shown in Figures 5a-5d. Figure 5a is the first time increment, the comparator starts sampling Vin 605. MOSFET switches 600, 630, 650, 685, and 695 are turned on, and MOSFET switches 640 and 670 are not turned on. The voltage across the capacitor 620 is Vin-Vthref. The voltage across the capacitor 660 is Vr2_Vth2 (where Vth2 is the self-biasing of the amplifier 680). The amplifier 700 is also biased on the self-bias voltage. Figure 5 b is the second time increment! Comparator operation. The MOSFET switch 600 is not turned on, so that the voltage across the capacitor 62G is kept constant, that is, the voltage of Vin 605 is maintained. During this operation, the switch 630 may be in a conducting or non-conducting state because it does not affect the effective voltage stored in the capacitor 620. Figure 5c shows the operation of the comparator at the third time increment. The MOSFET switch 640 is turned on to connect Vrl 645 to the first terminal A of the capacitor 620. It appears at point B (the second end of capacitor 620) and now becomes Vthref + (Vrl-Vin). The voltage of Vrl 645 is the selected rough reference voltage (350 in Fig. 3). This paper scale is applicable to the Chinese National Standard (CNS) A4 specification (210X 297mm) ---------- installed --------- set ------ line (please read first (Notes on the back and then fill in this page) A7 B7 of the Consumer Cooperation Cooperation of the Central Standards Bureau of the Ministry of Economic Affairs. V. Invention description (9) At the fourth time increment, the operation of the comparator is shown in Figure 5d. The MOSFET switch 640 remains on, while the Sin 3 "£ 1 'switches 600, 630, 650, 685, and 695 do not turn on. The turned on MOSFET switch 670 connects the second end of the capacitor 620 to the first end of the capacitor 660. A suitable connection will be at Point D, which is the voltage generated at the input of the amplifier 680 (Vth2 + (Vthref + (Vrl-Vin))-Yr2)
Vr2設定爲等於Vthref+k*LSB (其中k*LSB爲所要比較的細微電 壓),使得上面的方程式變成Vr2 is set equal to Vthref + k * LSB (where k * LSB is the subtle voltage to be compared), so that the above equation becomes
Vth2+(Vrl-Vin-k*LSB)。 因爲放大器680及700的輸入端設定於各自的偏壓位準,只有電壓 差値Vrl-Vin-k*LSB會被放大。如果VinCVrl-k*LSB,問取放大 器710將在V〇4 715輸出邏輯爲1 ;如果Vin>Vrl-k*LSB,輸出邏 輯爲0,。 圖6爲時序圖以說明似串列式類比數位轉換的方式。在時鐘訊號 (2000)的第一個時間增量,粗略類比數位轉換器(2100)對類比輸入 訊號取樣(2110);細微類比數位轉換器(22GG)對類比輸入訊號取樣 (2210)。在時鐘訊號2000的第二個時間增量,粗略類比數位轉換器 2100對取樣的類比輸入訊號與粗略參考電壓比較(2120)。當適當的 粗略參考電壓將選擇來連接第一個細微類比數位轉換器時,取樣的類 比輸入電壓則保持在相同的時間(2200)。在時鐘訊號(2000)的第三 個時間增量,適當的粗略參考電壓連接至第一個細微類比數位轉換器 (2200),如圖5 c所示,將電壓位移。取樣且經過位移的類比輸入訊 號在時鐘訊號(2000)的第四個時間增量進行比較。在時鐘訊號(2000) 的第五個時間增量時,粗略及細微比較的結果(2405)傳送至輸出編碼 邏輯,轉換成輸出數位碼1 (241Q)送至資料輸出(2400)。輸出數 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) ---------—^-- (請先閱讀背面之注意事項再填寫本頁) 訂 .線 五、發明説明(丨0 ) A7 B7 位碼1 (2410)在時鐘訊號(2GGG)的第六個時間增量仍舊維持有 效。第二個比較週期在時鐘訊號(2000)的第三個時間增量開始’由粗 略類比數位轉換器(21GG)對類比輸入訊號取樣(2130) ’而第二個細 微類比數位轉換器(2300)對類比輸入訊號取樣(2310) °第二個細微 類比數位轉換器的第二次粗略比較(2140)及第二次資料保持(2320) 發生於時鐘訊號(2000)的第四個時間增量。第二次的取樣與位移發生 於時鐘訊號(2000)的第五個時間增量。第二次轉換的粗略數位碼及細 微數位碼將轉換成輸出數位碼2 (2420),在第七個時間增量輸出’ 並保持到時鐘訊號(2000)的第八個時間增量。 圖7說明獲得最小有效位元組編碼的方式。粗略參考電壓產生 器(圖3的100)看做是Vrt (3000)到Vrb (3100)以增量Vrl(n) (3010)及Vrl(n-l) (3G3G)各爲一個參考電壓的擴展。細微類比數 位轉換器(圖3的401及402)切割粗略增量爲細微的增量(3040)。Vth2 + (Vrl-Vin-k * LSB). Because the input terminals of the amplifiers 680 and 700 are set at their respective bias levels, only the voltage difference Vrl-Vin-k * LSB will be amplified. If VinCVrl-k * LSB, ask the amplifier 710 to output logic 1 at V〇4 715; if Vin> Vrl-k * LSB, the output logic is 0. FIG. 6 is a timing diagram illustrating a tandem analog-to-digital conversion method. At the first time increment of the clock signal (2000), the coarse analog digital converter (2100) samples the analog input signal (2110); the fine analog digital converter (22GG) samples the analog input signal (2210). At the second time increment of the clock signal 2000, the rough analog-to-digital converter 2100 compares the sampled analog input signal with the rough reference voltage (2120). When the appropriate coarse reference voltage is chosen to connect the first fine analog-to-digital converter, the sampled analog input voltage remains at the same time (2200). At the third time increment of the clock signal (2000), an appropriate rough reference voltage is connected to the first fine analog-to-digital converter (2200), as shown in Figure 5c, to shift the voltage. The sampled and shifted analog input signal is compared at the fourth time increment of the clock signal (2000). At the fifth time increment of the clock signal (2000), the results of the coarse and fine comparison (2405) are sent to the output coding logic, which is converted into the output digital code 1 (241Q) and sent to the data output (2400). The output paper size is in accordance with the Chinese National Standard (CNS) A4 specification (210X297mm) ----------- ^-(please read the precautions on the back and then fill out this page). DESCRIPTION OF THE INVENTION (丨 0) A7 B7 bit code 1 (2410) remains valid during the sixth time increment of the clock signal (2GGG). The second comparison cycle begins at the third time increment of the clock signal (2000) 'sampling the analog input signal (2130) by the coarse analog digital converter (21GG)' and the second fine analog digital converter (2300) Sampling the analog input signal (2310) ° The second coarse comparison (2140) and the second data hold (2320) of the second fine analog-to-digital converter occur at the fourth time increment of the clock signal (2000). The second sampling and shifting occurs during the fifth time increment of the clock signal (2000). The coarse digital code and fine digital code of the second conversion will be converted into the output digital code 2 (2420), which will be output in the seventh time increment and maintained to the eighth time increment of the clock signal (2000). Figure 7 illustrates the way to obtain the least significant byte encoding. The rough reference voltage generator (100 in Fig. 3) is regarded as an extension of Vrt (3000) to Vrb (3100) in increments of Vrl (n) (3010) and Vrl (n-1) (3G3G). The fine analog-to-digital converter (401 and 402 in Fig. 3) cuts the coarse increment into a fine increment (3040).
I I 訂 部 中 準 局 員I I am a member of the Central Accreditation Bureau
如果類比輸入訊號(Vin) (3G2G)落在Vrl(n)(3()10)及Vrl(n-l) (3030)之間,粗略類比數位轉換器(圖3.的400)將在以Vrl(n)爲參 考電位的比較器產生狀態”0” ;而在以Vrl(n-l)爲參考電位的比較器 產生狀態”1”。開關選擇邏輯(圖3的30G)將連接Vrl(n)至細微類 比數位轉換器(圖3的40]及402 )。細微類比數位轉換器(圖3的 401及402)將獲得電壓差Vrl(n) Vin (3G5G),並且位移這個電壓 至細微比較器的比較範圍(3150) ’。電壓的大小3170由Vthref (3160) 開始算起。參考電壓Vr2(k) (3190)由細微參考電壓產生器(圖3 的200 )獲得。輸出編碼器(圖3的500 )將得到輸出碼(3180)。 本發明特別使用實施例以做淸楚描述至可據以實施中,但是熟知 此領域者應當了解,在不會背離本發明的精神與申請專利範圍時,形 式或詳細內容上可做不同的變化。If the analog input signal (Vin) (3G2G) falls between Vrl (n) (3 () 10) and Vrl (nl) (3030), the rough analog-to-digital converter (400 in Figure 3.) will use Vrl ( n) The comparator with reference potential generates the state "0"; and the comparator with Vrl (nl) as the reference potential generates state "1". The switch selection logic (30G in Fig. 3) will connect Vrl (n) to the subtle analog-to-digital converters (40 in Fig. 3) and 402). The fine analog-to-digital converter (401 and 402 in Figure 3) will obtain the voltage difference Vrl (n) Vin (3G5G) and shift this voltage to the comparison range (3150) of the fine comparator. The magnitude of the voltage 3170 starts from Vthref (3160). The reference voltage Vr2 (k) (3190) is obtained by a fine reference voltage generator (200 in FIG. 3). The output encoder (500 in Figure 3) will get the output code (3180). The present invention uses embodiments in particular to make a descriptive description until it can be implemented, but those skilled in the art should understand that different forms or details can be changed without departing from the spirit of the present invention and applying for patent .
絲A 本紙張尺度適用中國國家橾準(CNS〉A4規格(210X 297公釐)Silk A This paper scale is applicable to China National Standard (CNS> A4 specification (210X 297mm)
II
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US08/611,589 US5682163A (en) | 1996-03-06 | 1996-03-06 | Semi-pipelined analog-to-digital converter |
TW85103572A TW293204B (en) | 1996-03-22 | 1996-03-22 | A like-series analog digital converter |
JP8238144A JPH09261056A (en) | 1996-03-06 | 1996-09-09 | Analog/digital converter of half pipeline type |
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TW85103572A TW293204B (en) | 1996-03-22 | 1996-03-22 | A like-series analog digital converter |
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TW293204B true TW293204B (en) | 1996-12-11 |
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TW85103572A TW293204B (en) | 1996-03-06 | 1996-03-22 | A like-series analog digital converter |
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1996
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