TW291535B - Separate testing board for semiconducting component - Google Patents

Separate testing board for semiconducting component

Info

Publication number
TW291535B
TW291535B TW85107207A TW85107207A TW291535B TW 291535 B TW291535 B TW 291535B TW 85107207 A TW85107207 A TW 85107207A TW 85107207 A TW85107207 A TW 85107207A TW 291535 B TW291535 B TW 291535B
Authority
TW
Taiwan
Prior art keywords
board
jumper
plug
pins
separate testing
Prior art date
Application number
TW85107207A
Other languages
Chinese (zh)
Inventor
Wenn-Sy Jong
Woei-Guey Chiou
Original Assignee
Taiwan Semiconductor Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg filed Critical Taiwan Semiconductor Mfg
Priority to TW85107207A priority Critical patent/TW291535B/en
Application granted granted Critical
Publication of TW291535B publication Critical patent/TW291535B/en

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  • Tests Of Electronic Circuits (AREA)

Abstract

A separate testing board for semiconducting component includes an IC plug-in board and a jumper board. The IC plug-in board has a IC plug set and plural number of bus connectors. The jumper board also has plural number of bus connectors and equivalent number of jumper units. Each jumper unit has three pins in which one pin is connected to the positive voltage, the other to the negative voltage, and another one to jumper end. The jumper end can be selectively connected to positive or negative voltage to change the level of the connector pins. The IC plug-in board and the jumper board are connected by the bus wires so that the level of the pins of the IC plug-in board and the IC pins can be adequately biased by changing the jumper setting in the jumper board.
TW85107207A 1996-06-15 1996-06-15 Separate testing board for semiconducting component TW291535B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW85107207A TW291535B (en) 1996-06-15 1996-06-15 Separate testing board for semiconducting component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW85107207A TW291535B (en) 1996-06-15 1996-06-15 Separate testing board for semiconducting component

Publications (1)

Publication Number Publication Date
TW291535B true TW291535B (en) 1996-11-21

Family

ID=51398314

Family Applications (1)

Application Number Title Priority Date Filing Date
TW85107207A TW291535B (en) 1996-06-15 1996-06-15 Separate testing board for semiconducting component

Country Status (1)

Country Link
TW (1) TW291535B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110501633A (en) * 2019-08-29 2019-11-26 上海华力集成电路制造有限公司 Package level apparatus for testing chip and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110501633A (en) * 2019-08-29 2019-11-26 上海华力集成电路制造有限公司 Package level apparatus for testing chip and method

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Legal Events

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MK4A Expiration of patent term of an invention patent