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Priority to TW83109785ApriorityCriticalpatent/TW270242B/en
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Publication of TW270242BpublicationCriticalpatent/TW270242B/en
An enclosure layer process by removing field emitter device directly comprises: forming gate emitter on substrate, in which there are cathode, one isolation layer, gate layer, silicon tips and silicon enclosure layer; nitrogen high temperature annealing; biasing the above gate and/or the above cathode; etching the above enclosure layer with alkaline solution.
TW83109785A1994-10-191994-10-19Enclosure layer process
TW270242B
(en)