TW202420397A - Ultraviolet irradiation device - Google Patents

Ultraviolet irradiation device Download PDF

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TW202420397A
TW202420397A TW112131061A TW112131061A TW202420397A TW 202420397 A TW202420397 A TW 202420397A TW 112131061 A TW112131061 A TW 112131061A TW 112131061 A TW112131061 A TW 112131061A TW 202420397 A TW202420397 A TW 202420397A
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discharge lamp
light
gas
emitting tube
tube
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TW112131061A
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Chinese (zh)
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田中貴章
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日商東芝照明技術股份有限公司
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Abstract

The utility model provides an ultraviolet irradiation device which can restrain and block reduction of uniformity in the tube axis direction of a discharge lamp. An ultraviolet irradiation device according to an embodiment comprises: a box-shaped housing having one end open; a blocking discharge lamp which is arranged in the frame body and can irradiate ultraviolet rays; and a gas flow forming part which is arranged in the frame body and enables purge gas to flow towards the blocking discharge lamp. The barrier discharge lamp is provided with: a ring-shaped light-emitting tube which extends in one direction and in which a gas is sealed; the internal electrode is arranged in the light-emitting tube; and the external electrode is arranged outside the light-emitting tube. The gas flow forming portion forms a flow of the purge gas flowing in the vicinity of an end portion of the light emitting tube on a side facing the opening of the frame.

Description

紫外線照射裝置UV irradiation device

本發明的實施方式涉及一種紫外線照射裝置。The embodiment of the present invention relates to an ultraviolet irradiation device.

有一種紫外線照射裝置,其包括照射紫外線的屏蔽放電燈。包括屏蔽放電燈的紫外線照射裝置例如被用於附著於對象物表面的有機物的去除(光清洗處理)、表面改性、氧化膜的形成等表面處理。屏蔽放電燈例如具有設在發光管內部的內部電極、以及設在發光管外部的外部電極。當對內部電極與外部電極施加交流電壓時,產生介電質屏蔽放電,從而對應於被封入至發光管內部的氣體的種類而照射具有特定波長的紫外線。There is an ultraviolet irradiation device, which includes a shielded discharge lamp that irradiates ultraviolet rays. The ultraviolet irradiation device including the shielded discharge lamp is used, for example, for surface treatment such as removal of organic matter attached to the surface of an object (photocleaning treatment), surface modification, and formation of an oxide film. The shielded discharge lamp has, for example, an internal electrode provided inside a light-emitting tube and an external electrode provided outside the light-emitting tube. When an alternating voltage is applied to the internal electrode and the external electrode, a dielectric shielding discharge is generated, thereby irradiating ultraviolet rays having a specific wavelength corresponding to the type of gas sealed inside the light-emitting tube.

此處,在進行利用紫外線的處理時,有時會從對象物放出氣體。例如,在對象物的表面包含有機物的情況下,有時通過照射紫外線而使有機物分解,從而放出包含有機物的成分的氣體。而且,在對象物的表面塗布有揮發性的材料的情況下,會放出包含揮發性的材料的成分的氣體。當放出的氣體到達屏蔽放電燈時,氣體中包含的成分會附著於屏蔽放電燈的表面,屏蔽放電燈的管軸方向上的均勻度有時會下降。若均勻度下降,則容易產生處理不均,因此實施了處理的對象物的品質有可能下降。Here, when the treatment using ultraviolet rays is performed, gas may be released from the object. For example, when the surface of the object contains organic matter, the organic matter may be decomposed by irradiation with ultraviolet rays, thereby releasing gas containing components of the organic matter. In addition, when a volatile material is applied to the surface of the object, gas containing components of the volatile material may be released. When the released gas reaches the shield discharge lamp, the components contained in the gas adhere to the surface of the shield discharge lamp, and the uniformity of the shield discharge lamp in the tube axis direction may decrease. If the uniformity decreases, uneven treatment is likely to occur, so the quality of the treated object may decrease.

因此,提出了一種在其中一個端部開口的箱狀的框體的內部設置屏蔽放電燈,利用氮氣對箱狀的框體的內部進行吹掃的技術。若屏蔽放電燈設在以氮氣充滿的空間中,則即便從對象物放出氣體,也能夠抑制放出的氣體到達屏蔽放電燈。Therefore, a technique has been proposed in which a shielding discharge lamp is installed inside a box-shaped frame having one end opened, and the inside of the box-shaped frame is purged with nitrogen gas. If the shielding discharge lamp is installed in a space filled with nitrogen gas, even if gas is released from the object, it is possible to suppress the released gas from reaching the shielding discharge lamp.

但是,在處理時間長或處理數多的情況下,放出的氣體有時會隨時間的推移而到達屏蔽放電燈。而且,在氣體的放出量多的情況下,放出的氣體也有時會到達屏蔽放電燈。因此,即便單純地以氮氣充滿屏蔽放電燈的周邊,屏蔽放電燈的管軸方向上的均勻度也有時會下降。However, when the treatment time is long or the number of treatments is large, the released gas may reach the shield discharge lamp over time. Also, when the amount of gas released is large, the released gas may reach the shield discharge lamp. Therefore, even if the periphery of the shield discharge lamp is simply filled with nitrogen, the uniformity of the shield discharge lamp in the tube axis direction may decrease.

因此,期望開發一種能夠抑制屏蔽放電燈的管軸方向上的均勻度下降的紫外線照射裝置。 [現有技術文獻] [專利文獻] Therefore, it is desirable to develop an ultraviolet irradiation device that can suppress the decrease in uniformity in the tube axis direction of a shielded discharge lamp. [Prior art literature] [Patent literature]

[專利文獻1] 日本專利特開2013-191758號公報[Patent Document 1] Japanese Patent Publication No. 2013-191758

[發明所欲解決之課題][The problem that the invention wants to solve]

本發明所要解決的問題是提供一種能夠抑制屏蔽放電燈的管軸方向上的均勻度下降的紫外線照射裝置。 [解決課題之手段] The problem to be solved by the present invention is to provide an ultraviolet irradiation device capable of suppressing the decrease in uniformity in the tube axis direction of a shielded discharge lamp. [Means for solving the problem]

實施方式的紫外線照射裝置包括:框體,呈箱狀,其中一個端部開口;屏蔽放電燈,設在所述框體的內部,能夠照射紫外線;以及氣流形成部,在所述框體的內部,使吹掃氣體朝向所述屏蔽放電燈流動。所述屏蔽放電燈具有:發光管,沿一方向延伸,呈環狀,在內部封入有氣體;內部電極,設在所述發光管的內部;以及外部電極,設在所述發光管的外部。所述氣流形成部形成在所述發光管中與所述框體的開口相向一側的端部附近流動的所述吹掃氣體的流動。 [發明的效果] The ultraviolet irradiation device of the embodiment includes: a frame body, which is box-shaped and has an opening at one end; a shielded discharge lamp, which is arranged inside the frame body and can irradiate ultraviolet rays; and an airflow forming part, which is inside the frame body and allows the blowing gas to flow toward the shielded discharge lamp. The shielded discharge lamp has: a light-emitting tube, which extends in one direction, is ring-shaped, and has gas sealed inside; an internal electrode, which is arranged inside the light-emitting tube; and an external electrode, which is arranged outside the light-emitting tube. The airflow forming part forms the flow of the blowing gas flowing near the end of the light-emitting tube on the side opposite to the opening of the frame body. [Effect of the invention]

通過本發明的實施方式,可提供一種能夠抑制屏蔽放電燈的管軸方向上的均勻度下降的紫外線照射裝置。According to the embodiment of the present invention, an ultraviolet irradiation device capable of suppressing a decrease in uniformity in the tube axial direction of a shielded discharge lamp can be provided.

以下,參照附圖來對實施方式進行例示。另外,各附圖中,對於相同的結構部件標註相同的符號並適當省略詳細說明。而且,各附圖中的箭頭X、箭頭Y、箭頭Z表示彼此正交的三方向。例如,將與屏蔽放電燈1(發光管11)的管軸方向正交的方向設為X方向,將屏蔽放電燈1(發光管11)的管軸方向設為Y方向,將紫外線的照射方向設為Z方向。Hereinafter, the embodiment will be illustrated with reference to the accompanying drawings. In addition, in each of the accompanying drawings, the same symbols are attached to the same structural components and detailed descriptions are appropriately omitted. In addition, arrows X, Y, and Z in each of the accompanying drawings represent three directions that are orthogonal to each other. For example, the direction orthogonal to the tube axis direction of the shielded discharge lamp 1 (luminous tube 11) is set as the X direction, the tube axis direction of the shielded discharge lamp 1 (luminous tube 11) is set as the Y direction, and the irradiation direction of ultraviolet rays is set as the Z direction.

圖1是用於例示本實施方式的紫外線照射裝置100的示意剖面圖。另外,在圖1中,例示了設置一個屏蔽放電燈1的情況,但屏蔽放電燈1的數量可根據屏蔽放電燈1的用途、或處理的對象物200的大小等適當變更。即,屏蔽放電燈1只要設置至少一個即可。Fig. 1 is a schematic cross-sectional view of an ultraviolet irradiation device 100 for illustrating the present embodiment. In Fig. 1, a case where one shielding discharge lamp 1 is provided is illustrated, but the number of shielding discharge lamps 1 can be appropriately changed according to the purpose of the shielding discharge lamps 1 or the size of the object 200 to be processed. That is, at least one shielding discharge lamp 1 only needs to be provided.

另外,如圖1所示,紫外線照射裝置100(屏蔽放電燈1)設在對象物200的重力方向上側。此時,對象物200可相對於紫外線照射裝置100(屏蔽放電燈1)移動。例如,對象物200可使用輸送機等搬送裝置201沿規定的方向移動。另外,紫外線照射裝置100(屏蔽放電燈1)也可相對於對象物200移動。例如,可將對象物200載置於載置台等上,並使用單軸機器人等使紫外線照射裝置100(屏蔽放電燈1)沿規定的方向移動。In addition, as shown in FIG. 1 , the ultraviolet irradiation device 100 (shielded discharge lamp 1) is provided on the side in the gravity direction of the object 200. At this time, the object 200 can be moved relative to the ultraviolet irradiation device 100 (shielded discharge lamp 1). For example, the object 200 can be moved in a predetermined direction using a conveyor 201 such as a conveyor. In addition, the ultraviolet irradiation device 100 (shielded discharge lamp 1) can also be moved relative to the object 200. For example, the object 200 can be placed on a stage or the like, and the ultraviolet irradiation device 100 (shielded discharge lamp 1) can be moved in a predetermined direction using a single-axis robot or the like.

即,紫外線照射裝置100(屏蔽放電燈1)與對象物200之間的相對位置只要能夠變化即可。另外,紫外線照射裝置100(屏蔽放電燈1)與對象物200之間的位置也可為恆定。但是,若使紫外線照射裝置100(屏蔽放電燈1)與對象物200之間的相對位置變化,則能夠減小紫外線照射裝置100(屏蔽放電燈1)的照射區域,因此能夠實現紫外線照射裝置100(屏蔽放電燈1)的小型化或節能化。That is, the relative position between the ultraviolet irradiation device 100 (shielded discharge lamp 1) and the object 200 may be changed. In addition, the position between the ultraviolet irradiation device 100 (shielded discharge lamp 1) and the object 200 may be constant. However, if the relative position between the ultraviolet irradiation device 100 (shielded discharge lamp 1) and the object 200 is changed, the irradiation area of the ultraviolet irradiation device 100 (shielded discharge lamp 1) can be reduced, so that the ultraviolet irradiation device 100 (shielded discharge lamp 1) can be miniaturized or energy-saving.

如圖1所示,紫外線照射裝置100例如具有屏蔽放電燈1、冷卻部2、燈座3、罩4、框體5、及吹掃氣體供給部6。 圖2是屏蔽放電燈1、冷卻部2、燈座3、及罩4的示意分解圖。 圖3是用於例示屏蔽放電燈1的示意圖。 圖4是圖3中的屏蔽放電燈1的A-A線方向的示意剖面圖。 另外,在圖4中,也一併描繪出冷卻部2。 如圖3及圖4所示,屏蔽放電燈1例如具有發光管11、內部電極12、反射膜13、支架14、導線15及外部電極16。 As shown in FIG1 , the ultraviolet irradiation device 100 includes, for example, a shielded discharge lamp 1, a cooling unit 2, a lamp holder 3, a cover 4, a frame 5, and a purge gas supply unit 6. FIG2 is a schematic exploded view of the shielded discharge lamp 1, the cooling unit 2, the lamp holder 3, and the cover 4. FIG3 is a schematic diagram for illustrating the shielded discharge lamp 1. FIG4 is a schematic cross-sectional view of the shielded discharge lamp 1 in the A-A line direction in FIG3 . In addition, the cooling unit 2 is also depicted in FIG4 . As shown in FIG3 and FIG4 , the shielded discharge lamp 1 includes, for example, a light-emitting tube 11, an internal electrode 12, a reflective film 13, a bracket 14, a wire 15, and an external electrode 16.

發光管11呈管狀,且具有全長(管軸方向的長度)比管徑長的形態。發光管11沿一方向(Y方向)延伸。發光管11例如可設為圓筒管。在發光管11的管軸方向上的兩側端部分別設有密封部11a。通過設置密封部11a,能夠氣密地密封發光管11的內部空間。密封部11a例如可使用壓封(pinch seal)法或縮封(shrink seal)法而形成。The light-emitting tube 11 is in a tubular shape, and has a shape in which the total length (length in the tube axis direction) is longer than the tube diameter. The light-emitting tube 11 extends in one direction (Y direction). The light-emitting tube 11 can be set as a cylindrical tube, for example. Sealing parts 11a are respectively provided at both end parts in the tube axis direction of the light-emitting tube 11. By providing the sealing parts 11a, the internal space of the light-emitting tube 11 can be hermetically sealed. The sealing parts 11a can be formed, for example, using a pinch seal method or a shrink seal method.

而且,在密封部11a的內部,可設置導電部11b與外引線11c。導電部11b可相對於一個密封部11a而設置一個。導電部11b的平面形狀例如為四邊形。導電部11b呈薄膜狀。導電部11b例如可由鉬箔形成。Furthermore, a conductive portion 11b and an outer lead 11c may be provided inside the sealing portion 11a. One conductive portion 11b may be provided for each sealing portion 11a. The plane shape of the conductive portion 11b is, for example, a quadrangle. The conductive portion 11b is in a thin film shape. The conductive portion 11b may be formed of, for example, molybdenum foil.

外引線11c呈線狀,可至少設在設有導線15的一側的密封部11a。外引線11c的其中一個端部與導電部11b電連接。外引線11c的端部附近可與導電部11b進行雷射熔接或電阻熔接。外引線11c的另一個端部可從密封部11a露出。外引線11c例如包含鉬等。The outer lead 11c is linear and can be provided at least on one side of the sealing portion 11a provided with the lead 15. One end of the outer lead 11c is electrically connected to the conductive portion 11b. The vicinity of the end of the outer lead 11c can be laser welded or resistance welded to the conductive portion 11b. The other end of the outer lead 11c can be exposed from the sealing portion 11a. The outer lead 11c includes, for example, molybdenum.

在發光管11的內部空間封入有氣體。在屏蔽放電燈1中,在內部電極12與外部電極16之間進行屏蔽放電,對所封入的氣體給予高能量電子而生成準分子激發分子。當準分子激發分子還原時,對應於氣體的種類而產生具有特定的峰值波長的光。因此,封入至發光管11的內部空間的氣體可根據屏蔽放電燈1的用途來適當變更。封入至發光管11的內部空間的氣體例如可設為氪、氙、氬、氖等稀有氣體或者使多種稀有氣體混合而成的混合氣體。也可視需要而在氣體中進而包含鹵素氣體等。Gas is sealed in the internal space of the light-emitting tube 11. In the shielded discharge lamp 1, shielded discharge is performed between the internal electrode 12 and the external electrode 16, and high-energy electrons are given to the sealed gas to generate excimer excited molecules. When the excimer excited molecules are reduced, light with a specific peak wavelength is generated corresponding to the type of gas. Therefore, the gas sealed in the internal space of the light-emitting tube 11 can be appropriately changed according to the purpose of the shielded discharge lamp 1. The gas sealed in the internal space of the light-emitting tube 11 can be, for example, a rare gas such as krypton, xenon, argon, neon, or a mixed gas formed by mixing multiple rare gases. Halogen gas or the like can also be further included in the gas as needed.

發光管11的內部空間的25℃下的氣體壓力(封入壓力)例如可設為80 kPa~200 kPa左右。發光管11的內部空間的25℃下的氣體壓力(封入壓力)可通過氣體的標準狀態(標準環境溫度和壓力(Standard Ambient Temperature and Pressure,SATP):溫度25℃、1 bar)來求出。The gas pressure (sealed pressure) at 25°C in the internal space of the light-emitting tube 11 can be set to, for example, about 80 kPa to 200 kPa. The gas pressure (sealed pressure) at 25°C in the internal space of the light-emitting tube 11 can be obtained from the standard state of the gas (Standard Ambient Temperature and Pressure (SATP): temperature 25°C, 1 bar).

例如,在對平板顯示器用的玻璃板的表面進行光清洗的情況下,較佳將所封入的氣體設為氙。此時,氙的封入壓力例如可設為93 kPa左右。若將所封入的氣體設為氙,則可產生峰值波長為172 nm的紫外線,因此可提高清洗效果。For example, when the surface of a glass plate for a flat panel display is optically cleaned, it is preferred that the sealed gas be xenon. In this case, the sealing pressure of xenon can be set to, for example, about 93 kPa. If the sealed gas is xenon, ultraviolet light with a peak wavelength of 172 nm can be generated, thereby improving the cleaning effect.

發光管11例如是由峰值波長為200 nm以下的紫外線的透射率高的材料形成。例如,發光管11可由合成石英玻璃形成。The light-emitting tube 11 is formed of a material having a high transmittance of ultraviolet light having a peak wavelength of 200 nm or less, for example, or can be formed of synthetic quartz glass.

內部電極12被設在發光管11的內部。內部電極12例如具有線圈12a以及極線12b。線圈12a以及極線12b可一體地形成。線圈12a以及極線12b例如是通過對線材進行塑性加工而形成。線材的線徑(直徑)例如為0.2 mm~1.0 mm左右。線材的材料例如是鎢或在鎢中添加了鉀等而成的摻雜鎢等。The internal electrode 12 is provided inside the light-emitting tube 11. The internal electrode 12 includes, for example, a coil 12a and an electrode 12b. The coil 12a and the electrode 12b may be formed integrally. The coil 12a and the electrode 12b are formed, for example, by plastic working a wire. The wire diameter (diameter) of the wire is, for example, about 0.2 mm to 1.0 mm. The material of the wire is, for example, tungsten or doped tungsten obtained by adding potassium to tungsten.

線圈12a呈螺旋狀,且設在發光管11的內部空間。線圈12a在發光管11的內部空間的中央區域沿著發光管11的管軸而延伸。線圈12a的間距尺寸P例如可設為10 mm~120 mm左右。The coil 12a is spirally shaped and is disposed in the inner space of the light-emitting tube 11. The coil 12a extends along the tube axis of the light-emitting tube 11 in the central region of the inner space of the light-emitting tube 11. The pitch dimension P of the coil 12a can be set to about 10 mm to 120 mm, for example.

極線12b分別設在線圈12a的兩側端部。極線12b呈線狀,且從線圈12a的端部沿著發光管11的管軸延伸。極線12b的端部在密封部11a的內部與導電部11b電連接。極線12b的端部附近可與導電部11b進行雷射熔接或電阻熔接。The poles 12b are respectively arranged at the ends of the coil 12a on both sides. The poles 12b are linear and extend from the ends of the coil 12a along the tube axis of the light-emitting tube 11. The ends of the poles 12b are electrically connected to the conductive part 11b inside the sealing part 11a. The ends of the poles 12b can be laser welded or resistance welded to the conductive part 11b.

反射膜13可設在外部電極16與內部電極12(線圈12a)之間。例如,反射膜13呈膜狀,且設在發光管11的內壁。反射膜13將在發光管11的內部空間產生且未朝向照射方向的紫外線反射向照射方向。若設有反射膜13,則可提高紫外線的導出效率。而且,若設有反射膜13,則可減小發光管11的紫外線直接入射的區域,因此可抑制因紫外線造成的發光管11的化學性的結構變化。The reflective film 13 may be provided between the external electrode 16 and the internal electrode 12 (coil 12a). For example, the reflective film 13 is in the form of a film and is provided on the inner wall of the light-emitting tube 11. The reflective film 13 reflects the ultraviolet rays generated in the inner space of the light-emitting tube 11 and not directed in the irradiation direction toward the irradiation direction. If the reflective film 13 is provided, the extraction efficiency of the ultraviolet rays can be improved. Furthermore, if the reflective film 13 is provided, the area of the light-emitting tube 11 where the ultraviolet rays directly enter can be reduced, thereby suppressing the chemical structural changes of the light-emitting tube 11 caused by the ultraviolet rays.

反射膜13的厚度例如可設為100 μm~300 μm左右。反射膜13例如包含SiO 2。而且,反射膜13也能夠包含使紫外線散射的粒子。使紫外線散射的粒子例如包含氧化鋁等。 The thickness of the reflective film 13 can be set to about 100 μm to 300 μm, for example. The reflective film 13 includes, for example, SiO 2 . Furthermore, the reflective film 13 may include particles that scatter ultraviolet rays. The particles that scatter ultraviolet rays include, for example, aluminum oxide.

另外,反射膜13也可未必需要而予以省去。但若設有反射膜13,則能夠提高紫外線的導出效率,且能夠抑制因紫外線造成的發光管11的化學性的結構變化。The reflective film 13 is not necessarily required and can be omitted. However, if the reflective film 13 is provided, the efficiency of extracting ultraviolet rays can be improved and chemical structural changes of the light-emitting tube 11 caused by ultraviolet rays can be suppressed.

支架14分別設在發光管11的管軸方向上的兩側端部。支架14覆蓋發光管11的端部。支架14例如可由絕緣材料形成。支架14例如可由滑石(steatite)、氧化鋁等形成。支架14既可與外部電極16接觸,也可與外部電極16隔開。The brackets 14 are respectively provided at the ends of both sides of the light-emitting tube 11 in the tube axis direction. The brackets 14 cover the ends of the light-emitting tube 11. The brackets 14 can be formed of, for example, an insulating material. The brackets 14 can be formed of, for example, steatite, alumina, etc. The brackets 14 can be in contact with the external electrode 16 or separated from the external electrode 16.

導線15電連接於從密封部11a露出的外引線11c的端部。導線15經由外引線11c以及導電部11b而與內部電極12電連接。導線15例如與設在紫外線照射裝置100外部的點亮電路電連接。另外,導線15既可如圖3所示那樣僅設在發光管11的其中一個端部側,也可分別設在發光管11的兩側端部。The lead wire 15 is electrically connected to the end of the outer lead wire 11c exposed from the sealing portion 11a. The lead wire 15 is electrically connected to the internal electrode 12 via the outer lead wire 11c and the conductive portion 11b. The lead wire 15 is electrically connected to a lighting circuit provided outside the ultraviolet irradiation device 100, for example. In addition, the lead wire 15 may be provided only at one end side of the light-emitting tube 11 as shown in FIG. 3 , or may be provided at both end sides of the light-emitting tube 11.

如圖2至圖4所示,外部電極16被設在發光管11的外部。外部電極16例如具有電極體16a以及多個安裝部16b。電極體16a以及多個安裝部16b可一體地形成。As shown in Fig. 2 to Fig. 4, the external electrode 16 is provided outside the light-emitting tube 11. The external electrode 16 includes, for example, an electrode body 16a and a plurality of mounting portions 16b. The electrode body 16a and the plurality of mounting portions 16b may be formed integrally.

電極體16a沿著發光管11的外表面而沿發光管11的管軸方向延伸。電極體16a被設在發光管11的外表面與冷卻部2的凹部2a的內壁之間。電極體16a與內部電極12(線圈12a)相向。在設有反射膜13的情況下,電極體16a可設在與反射膜13相向的位置。The electrode 16a extends along the outer surface of the light-emitting tube 11 and in the tube axis direction of the light-emitting tube 11. The electrode 16a is provided between the outer surface of the light-emitting tube 11 and the inner wall of the recess 2a of the cooling unit 2. The electrode 16a faces the inner electrode 12 (coil 12a). When the reflective film 13 is provided, the electrode 16a may be provided at a position facing the reflective film 13.

電極體16a的厚度例如可設為0.1 mm以上且1.0 mm以下。電極體16a可由金屬等導電性材料形成。電極體16a例如由不銹鋼、鋁等形成。而且,當使屏蔽放電燈1點亮時,與紫外線一同產生熱。因此,若電極體16a包含金屬等導熱率高的材料,則也能夠將電極體16a用作散熱部。The thickness of the electrode 16a can be set to, for example, 0.1 mm or more and 1.0 mm or less. The electrode 16a can be formed of a conductive material such as metal. The electrode 16a is formed of, for example, stainless steel, aluminum, etc. Moreover, when the shielding discharge lamp 1 is lit, heat is generated together with ultraviolet rays. Therefore, if the electrode 16a includes a material with high thermal conductivity such as metal, the electrode 16a can also be used as a heat sink.

多個安裝部16b在與發光管11的管軸方向正交的方向上分別設在電極體16a的兩側端部。多個安裝部16b的其中一個端部設在電極體16a的端部。在與發光管11的管軸方向正交的方向上,多個安裝部16b朝遠離發光管11的方向延伸。The plurality of mounting portions 16b are respectively provided at both side ends of the electrode body 16a in a direction perpendicular to the tube axis direction of the light-emitting tube 11. One end of the plurality of mounting portions 16b is provided at the end of the electrode body 16a. In a direction perpendicular to the tube axis direction of the light-emitting tube 11, the plurality of mounting portions 16b extend in a direction away from the light-emitting tube 11.

多個安裝部16b是沿發光管11的管軸方向排列設置。多個安裝部16b被安裝於冷卻部2的開設有凹部2a的面。多個安裝部16b例如使用螺絲等緊固構件而安裝於冷卻部2。多個安裝部16b的厚度及材料可設為與電極體16a相同。The plurality of mounting parts 16b are arranged along the tube axis direction of the light-emitting tube 11. The plurality of mounting parts 16b are mounted on the surface of the cooling part 2 where the recessed part 2a is opened. The plurality of mounting parts 16b are mounted on the cooling part 2 using a fastening member such as a screw. The thickness and material of the plurality of mounting parts 16b can be set to be the same as that of the electrode body 16a.

若將多個安裝部16b安裝於冷卻部2,則可抑制電極體16a因使屏蔽放電燈1點亮時產生的熱發生變形。若可抑制電極體16a的變形,則可抑制內部電極12(線圈12a)與外部電極16(電極體16a)之間的距離發生變化而導致放電狀態發生變化的現象。若可抑制放電狀態的變化,則可提高均勻度。因此,可抑制處理不均的產生。If a plurality of mounting portions 16b are mounted on the cooling portion 2, deformation of the electrode body 16a due to heat generated when the shield discharge lamp 1 is turned on can be suppressed. If deformation of the electrode body 16a can be suppressed, the phenomenon that the discharge state changes due to a change in the distance between the internal electrode 12 (coil 12a) and the external electrode 16 (electrode body 16a) can be suppressed. If the change in the discharge state can be suppressed, uniformity can be improved. Therefore, the occurrence of uneven processing can be suppressed.

而且,可進而設置多個定位構件16c。定位構件16c呈板狀,可設在安裝部16b與冷卻部2的開設有凹部2a的面之間。例如,定位構件16c的數量可設為與安裝部16b的數量相同。Furthermore, a plurality of positioning members 16c may be provided. The positioning member 16c is plate-shaped and may be provided between the mounting portion 16b and the surface of the cooling portion 2 on which the recessed portion 2a is provided. For example, the number of positioning members 16c may be the same as the number of mounting portions 16b.

定位構件16c例如使用螺絲等緊固構件而與安裝部16b一同安裝於冷卻部2。因此,在定位構件16c,可設置貫穿厚度方向的孔。定位構件16c的厚度例如可設為0.3 mm左右。定位構件16c的材料例如可設為不銹鋼等金屬。The positioning member 16c is mounted on the cooling unit 2 together with the mounting portion 16b using a fastening member such as a screw. Therefore, a hole penetrating the thickness direction can be provided in the positioning member 16c. The thickness of the positioning member 16c can be set to about 0.3 mm, for example. The material of the positioning member 16c can be set to a metal such as stainless steel, for example.

在將定位構件16c安裝於冷卻部2時,既可在定位構件16c的其中一個端部與電極體16a之間、以及電極體16a與發光管11的外表面之間的至少任一處設置微小的間隙,也可不設置間隙。這樣,能夠抑制電極體16a以及發光管11因使屏蔽放電燈1點亮時所產生的熱發生變形的現象。因此,能夠抑制內部電極12(線圈12a)與外部電極16(電極體16a)之間的距離發生變化而導致放電狀態發生變化,或者在發光管11與冷卻部2之間產生間隙而導致冷卻狀態發生變化的現象。若可抑制放電狀態以及冷卻狀態的變化,則能夠進一步提高均勻度。因此,能夠進一步抑制處理不均的產生。When the positioning member 16c is mounted on the cooling unit 2, a small gap may be provided at least at any one of the ends of the positioning member 16c and the electrode 16a and between the electrode 16a and the outer surface of the light-emitting tube 11, or no gap may be provided. In this way, the electrode 16a and the light-emitting tube 11 can be prevented from being deformed by the heat generated when the shielded discharge lamp 1 is lit. Therefore, the discharge state may be changed due to the change in the distance between the internal electrode 12 (coil 12a) and the external electrode 16 (electrode 16a), or the cooling state may be changed due to the gap between the light-emitting tube 11 and the cooling unit 2. If the change in the discharge state and the cooling state can be suppressed, the uniformity can be further improved. Therefore, the occurrence of uneven processing can be further suppressed.

如圖2以及圖4所示,冷卻部2夾著外部電極16而與發光管11相向。冷卻部2沿屏蔽放電燈1的管軸方向延伸。冷卻部2的管軸方向的長度例如可設為與外部電極16(電極體16a)的管軸方向的長度相同。冷卻部2可設置至少一個。在設置多個冷卻部2的情況下,如圖2所示,可將多個冷卻部2沿屏蔽放電燈1的管軸方向排列設置。As shown in FIG. 2 and FIG. 4 , the cooling part 2 faces the light-emitting tube 11 with the external electrode 16 interposed therebetween. The cooling part 2 extends along the tube axis direction of the shielded discharge lamp 1. The length of the cooling part 2 in the tube axis direction can be set to be the same as the length of the external electrode 16 (electrode body 16a) in the tube axis direction, for example. At least one cooling part 2 can be provided. When a plurality of cooling parts 2 are provided, as shown in FIG. 2 , the plurality of cooling parts 2 can be arranged in a row along the tube axis direction of the shielded discharge lamp 1.

如圖4所示,可在冷卻部2的其中一個面設置凹部2a。凹部2a沿發光管11的管軸方向延伸。在凹部2a的內部,可設置外部電極16的電極體16a與屏蔽放電燈1的發光管11。凹部2a的內表面的至少一部分可與電極體16a接觸。As shown in FIG4 , a recess 2a may be provided on one surface of the cooling portion 2. The recess 2a extends along the tube axis direction of the light-emitting tube 11. An electrode body 16a of the external electrode 16 and the light-emitting tube 11 of the shielded discharge lamp 1 may be provided inside the recess 2a. At least a portion of the inner surface of the recess 2a may be in contact with the electrode body 16a.

冷卻部2是由導熱率高的材料形成。冷卻部2例如可由鋁或不銹鋼等金屬形成。另外,如圖4所示,在冷卻部2的內部可設置流路2b。例如,經由開閉閥2c向流路2b供給製冷劑。製冷劑例如為水等。在流路2b的內部流動的製冷劑排出至冷卻部2的外部。若使製冷劑在流路2b的內部流動,則能夠效率良好地對在屏蔽放電燈1中產生的熱進行散熱。The cooling part 2 is formed of a material with high thermal conductivity. The cooling part 2 can be formed of a metal such as aluminum or stainless steel, for example. In addition, as shown in FIG. 4 , a flow path 2b can be provided inside the cooling part 2. For example, a refrigerant is supplied to the flow path 2b via an on-off valve 2c. The refrigerant is, for example, water. The refrigerant flowing inside the flow path 2b is discharged to the outside of the cooling part 2. If the refrigerant is made to flow inside the flow path 2b, the heat generated in the shielded discharge lamp 1 can be efficiently dissipated.

燈座3例如電連接於點亮電路等。導線15以及外部電極16能夠拆裝地與燈座3電連接。通過將導線15以及外部電極16電連接於燈座3,從而能夠將內部電極12以及外部電極16電連接於點亮電路等。The lamp holder 3 is electrically connected to, for example, a lighting circuit. The lead wire 15 and the external electrode 16 are electrically connected to the lamp holder 3 in a detachable manner. By electrically connecting the lead wire 15 and the external electrode 16 to the lamp holder 3, the internal electrode 12 and the external electrode 16 can be electrically connected to the lighting circuit.

點亮電路例如具有將來自交流電源的電力轉換為高電壓且高頻(例如頻率為37 kHz的正弦波)的電力的逆變器。例如,點亮電路以2.4 kW左右的燈電力來使屏蔽放電燈1點亮。The lighting circuit includes, for example, an inverter that converts power from an AC power source into power of high voltage and high frequency (for example, a sine wave with a frequency of 37 kHz). For example, the lighting circuit lights the shielding discharge lamp 1 with a lamp power of about 2.4 kW.

罩4呈箱狀,在內部收納屏蔽放電燈1、冷卻部2及燈座3。罩4的其中一個端部開口。若設有罩4,則可使後述的吹掃氣體G滯留在罩4的內部空間中。若吹掃氣體G滯留在罩4的內部空間,則能夠實現屏蔽放電燈1的保護。The cover 4 is box-shaped and contains the shielding discharge lamp 1, the cooling unit 2 and the lamp holder 3. One end of the cover 4 is open. If the cover 4 is provided, the purge gas G described later can be retained in the inner space of the cover 4. If the purge gas G is retained in the inner space of the cover 4, the shielding discharge lamp 1 can be protected.

框體5呈箱狀,在內部收納屏蔽放電燈1、冷卻部2、燈座3及罩4。框體5的其中一個端部開口。供設置框體5的開口部的方向可設為與供設置罩4的開口的方向相同。如圖1所示,從屏蔽放電燈1照射的紫外線經由罩4的開口及框體5的開口照射至對象物200。The frame 5 is box-shaped and contains the shielding discharge lamp 1, the cooling unit 2, the lamp holder 3 and the cover 4. One end of the frame 5 is open. The direction in which the opening of the frame 5 is provided can be set to be the same as the direction in which the opening of the cover 4 is provided. As shown in FIG. 1 , the ultraviolet rays irradiated from the shielding discharge lamp 1 are irradiated to the object 200 through the opening of the cover 4 and the opening of the frame 5.

從吹掃氣體供給部6供給的吹掃氣體G滯留在框體5的內部空間中。若在框體5的內部空間中充滿吹掃氣體G,則能夠抑制從對象物200放出的包含對象物200的成分的氣體200a到達屏蔽放電燈1(發光管11)。The purge gas G supplied from the purge gas supply unit 6 is retained in the internal space of the housing 5. When the internal space of the housing 5 is filled with the purge gas G, the gas 200a including the components of the object 200 emitted from the object 200 can be prevented from reaching the shield discharge lamp 1 (luminous tube 11).

圖5是用於例示比較例的紫外線照射裝置300的示意剖面圖。 如圖5所示,在紫外線照射裝置300具有屏蔽放電燈1、冷卻部2、燈座3、罩4、框體5、及吹掃氣體供給部306。 吹掃氣體供給部306例如經由流量調整閥306a向框體5的內部空間供給吹掃氣體G。供給至框體5的內部空間的吹掃氣體G滯留在框體5的內部空間中,並且一部分從框體5的開口排出至外部。 FIG5 is a schematic cross-sectional view of an ultraviolet irradiation device 300 for illustrating a comparative example. As shown in FIG5 , the ultraviolet irradiation device 300 has a shielded discharge lamp 1, a cooling unit 2, a lamp holder 3, a cover 4, a frame 5, and a purge gas supply unit 306. The purge gas supply unit 306 supplies the purge gas G to the inner space of the frame 5 through a flow regulating valve 306a, for example. The purge gas G supplied to the inner space of the frame 5 is retained in the inner space of the frame 5, and a portion is discharged to the outside from the opening of the frame 5.

若吹掃氣體G滯留在框體5的內部空間中,則如圖5所示,在屏蔽放電燈1(發光管11)與對象物200之間形成吹掃氣體G的層306b。若形成有吹掃氣體G的層306b,則能夠抑制從對象物200放出的氣體200a到達屏蔽放電燈1(發光管11)。因此,能夠抑制對象物200的成分附著於屏蔽放電燈1(發光管11)的表面而導致屏蔽放電燈1的管軸方向上的均勻度下降。If the purge gas G is retained in the internal space of the frame 5, as shown in FIG5, a layer 306b of the purge gas G is formed between the shield discharge lamp 1 (luminous tube 11) and the object 200. If the layer 306b of the purge gas G is formed, it is possible to suppress the gas 200a emitted from the object 200 from reaching the shield discharge lamp 1 (luminous tube 11). Therefore, it is possible to suppress the components of the object 200 from adhering to the surface of the shield discharge lamp 1 (luminous tube 11) and causing the uniformity of the shield discharge lamp 1 in the tube axis direction to decrease.

但是,在處理時間長或處理數多的情況下,氣體200a有時會隨時間的推移而到達屏蔽放電燈1(發光管11)。另外,在氣體200a的放出量多的情況下,氣體200a也有時會到達屏蔽放電燈1(發光管11)。當氣體200a到達屏蔽放電燈1(發光管11)時,有時對象物200的成分附著於屏蔽放電燈1(發光管11)的表面而導致屏蔽放電燈1的管軸方向上的均勻度下降。若均勻度下降,則容易產生處理不均,因此實施了處理的對象物200的品質有可能下降。However, when the processing time is long or the number of processing is large, the gas 200a may reach the shield discharge lamp 1 (luminous tube 11) as time passes. In addition, when the emission amount of the gas 200a is large, the gas 200a may reach the shield discharge lamp 1 (luminous tube 11). When the gas 200a reaches the shield discharge lamp 1 (luminous tube 11), the components of the object 200 may adhere to the surface of the shield discharge lamp 1 (luminous tube 11) and the uniformity of the shield discharge lamp 1 in the tube axis direction may decrease. If the uniformity decreases, uneven processing is likely to occur, so the quality of the object 200 subjected to the processing may be reduced.

因此,在本實施方式的紫外線照射裝置100設有吹掃氣體供給部6。如圖1所示,吹掃氣體供給部6例如具有氣體供給源6a、開閉閥6b、流量調整部6c、及氣流形成部6d。氣體供給源6a、開閉閥6b、及流量調整部6c可設在框體5的外部。氣流形成部6d可設在框體5的內部空間中。Therefore, the ultraviolet irradiation device 100 of the present embodiment is provided with a purge gas supply unit 6. As shown in FIG1 , the purge gas supply unit 6 has, for example, a gas supply source 6a, an on-off valve 6b, a flow rate adjustment unit 6c, and an airflow forming unit 6d. The gas supply source 6a, the on-off valve 6b, and the flow rate adjustment unit 6c may be provided outside the frame 5. The airflow forming unit 6d may be provided in the internal space of the frame 5.

氣體供給源6a將吹掃氣體G供給至氣流形成部6d。氣體供給源6a例如可設為收納有吹掃氣體G的高壓儲氣瓶或工廠配管等。The gas supply source 6a supplies the purge gas G to the gas flow forming portion 6d. The gas supply source 6a can be, for example, a high-pressure gas cylinder storing the purge gas G or a factory pipe.

吹掃氣體G只要是不易與對象物200及屏蔽放電燈1的部件進行反應的氣體,則並無特別限定。吹掃氣體G例如可設為氮氣、氬或氦等稀有氣體。此時,若將吹掃氣體G設為比重比空氣小的氣體(例如氦),則容易使吹掃氣體G滯留在框體5的內部空間中。另外,若將吹掃氣體G設為比稀有氣體價格便宜的氮氣,則能夠實現運營成本的降低。The purge gas G is not particularly limited as long as it is a gas that does not easily react with the object 200 and the parts of the shielded discharge lamp 1. The purge gas G can be, for example, a rare gas such as nitrogen, argon or helium. At this time, if the purge gas G is set to a gas with a smaller specific gravity than air (such as helium), it is easy to make the purge gas G stagnate in the internal space of the frame 5. In addition, if the purge gas G is set to nitrogen, which is cheaper than rare gases, it is possible to reduce operating costs.

開閉閥6b可經由配管等連接於氣體供給源6a與氣流形成部6d之間。開閉閥6b對吹掃氣體G的供給與供給的停止進行控制。開閉閥6b例如可設為二通閥。The on-off valve 6b may be connected between the gas supply source 6a and the gas flow forming portion 6d via a pipe or the like. The on-off valve 6b controls the supply and stop of the purge gas G. The on-off valve 6b may be, for example, a two-way valve.

流量調整部6c可經由配管等連接於開閉閥6b與氣流形成部6d之間。流量調整部6c對吹掃氣體G的流量進行調整。流量調整部6c例如可設為流量調整閥或壓力調整閥。而且,流量調整部6c也可還具有開閉閥6b的功能。 氣流形成部6d例如可經由配管等與流量調整部6c連接。 圖6是用於例示氣流形成部6d的示意立體圖。 如圖1以及圖6所示,在與屏蔽放電燈1(發光管11)的管軸方向正交的方向(X方向)上,氣流形成部6d可與屏蔽放電燈1排列設置。氣流形成部6d可以與屏蔽放電燈1(發光管11)成為平行的方式設置。在屏蔽放電燈1(發光管11)的管軸方向(Y方向)上,氣流形成部6d的長度可設為與屏蔽放電燈1的長度為相同程度。 The flow regulating section 6c can be connected between the on-off valve 6b and the airflow forming section 6d via piping or the like. The flow regulating section 6c regulates the flow rate of the purge gas G. The flow regulating section 6c can be, for example, a flow regulating valve or a pressure regulating valve. Moreover, the flow regulating section 6c can also have the function of the on-off valve 6b. The airflow forming section 6d can be connected to the flow regulating section 6c, for example, via piping or the like. FIG. 6 is a schematic three-dimensional diagram for illustrating the airflow forming section 6d. As shown in FIG. 1 and FIG. 6, the airflow forming section 6d can be arranged in parallel with the shielded discharge lamp 1 (luminous tube 11) in a direction (X direction) orthogonal to the tube axis direction of the shielded discharge lamp 1 (luminous tube 11). The airflow forming section 6d can be arranged in parallel with the shielded discharge lamp 1 (luminous tube 11). In the tube axis direction (Y direction) of the shielded discharge lamp 1 (light-emitting tube 11), the length of the airflow forming portion 6d can be set to be the same as the length of the shielded discharge lamp 1.

如圖6所示,在氣流形成部6d可設置吹掃氣體G的吹出口6d1。吹出口6d1例如可設為沿著屏蔽放電燈1(發光管11)的管軸方向(Y方向)延伸的狹縫。另外,也可將沿屏蔽放電燈1(發光管11)的管軸方向(Y方向)排列的多個孔設為吹出口6d1。As shown in FIG6 , the air flow forming portion 6d may be provided with a blow-out port 6d1 for blowing the sweeping gas G. The blow-out port 6d1 may be, for example, a slit extending along the tube axis direction (Y direction) of the shielded discharge lamp 1 (flash tube 11). Alternatively, a plurality of holes arranged along the tube axis direction (Y direction) of the shielded discharge lamp 1 (flash tube 11) may be provided as the blow-out port 6d1.

如圖1以及圖6所示,供給至氣流形成部6d的吹掃氣體G從吹出口6d1吹出。從吹出口6d1吹出的吹掃氣體G供給至發光管11的對象物200側的端部附近。即,氣流形成部6d在框體5的內部使吹掃氣體G朝向屏蔽放電燈1(發光管11)流動。此時,如圖1所示,氣流形成部6d形成在發光管11中與框體5的開口相向一側(與對象物200相向的一側)的端部附近流動的吹掃氣體G的流動。吹掃氣體G沿著框體5的開口從與發光管11延伸的方向正交的方向(X方向)上的、發光管11的其中一側向另一側流動。若可形成此種吹掃氣體G的流動,則可使從對象物200朝向屏蔽放電燈1(發光管11)的氣體200a隨著吹掃氣體G的流動而遠離屏蔽放電燈1(發光管11)。As shown in FIG. 1 and FIG. 6 , the blowing gas G supplied to the airflow forming section 6d is blown out from the blowing port 6d1. The blowing gas G blown out from the blowing port 6d1 is supplied to the vicinity of the end of the light-emitting tube 11 on the object 200 side. That is, the airflow forming section 6d causes the blowing gas G to flow toward the shielded discharge lamp 1 (light-emitting tube 11) inside the frame 5. At this time, as shown in FIG. 1 , the airflow forming section 6d forms a flow of the blowing gas G flowing near the end of the light-emitting tube 11 on the side facing the opening of the frame 5 (the side facing the object 200). The blowing gas G flows along the opening of the frame 5 from one side of the light-emitting tube 11 to the other side in a direction (X direction) orthogonal to the direction in which the light-emitting tube 11 extends. If such a flow of the purge gas G is formed, the gas 200a from the object 200 toward the shield discharge lamp 1 (flash tube 11) can be moved away from the shield discharge lamp 1 (flash tube 11) along with the flow of the purge gas G.

從吹出口6d1吹出的吹掃氣體G的流速或流量只要是氣體200a遠離屏蔽放電燈1(發光管11)的流速或流量,則並無特別限定。此時,若加快吹掃氣體G的流速,或增加吹掃氣體G的流量,則氣體200a難以到達屏蔽放電燈1(發光管11)。另一方面,若加快吹掃氣體G的流速,或增加吹掃氣體G的流量,則運營成本會變高。因此,吹掃氣體G的流速或流量可根據氣體200a的放出量、屏蔽放電燈1(發光管11)與對象物200之間的距離等適當變更。吹掃氣體G的流速或流量可通過進行實驗或模擬等適當決定。The flow rate or flow rate of the purge gas G blown out from the blow outlet 6d1 is not particularly limited as long as it is a flow rate or flow rate at which the gas 200a is far away from the shielding discharge lamp 1 (luminous tube 11). At this time, if the flow rate of the purge gas G is increased or the flow rate of the purge gas G is increased, it is difficult for the gas 200a to reach the shielding discharge lamp 1 (luminous tube 11). On the other hand, if the flow rate of the purge gas G is increased or the flow rate of the purge gas G is increased, the operating cost will increase. Therefore, the flow rate or flow rate of the purge gas G can be appropriately changed according to the emission amount of the gas 200a, the distance between the shielding discharge lamp 1 (luminous tube 11) and the object 200, etc. The flow rate or flow rate of the purge gas G can be appropriately determined by conducting experiments or simulations.

若設有氣流形成部6d,則能夠有效地抑制對象物200的成分附著於屏蔽放電燈1(發光管11)的表面。因此,能夠抑制屏蔽放電燈1的管軸方向上的均勻度下降,進而能夠抑制產生處理不均。If the airflow forming portion 6d is provided, it is possible to effectively prevent the components of the object 200 from adhering to the surface of the shield discharge lamp 1 (luminous tube 11). Therefore, it is possible to prevent the uniformity of the shield discharge lamp 1 in the tube axis direction from decreasing, thereby preventing the occurrence of uneven processing.

圖7是用於例示另一實施方式的氣流形成部6da的示意立體圖。 氣流形成部6da例如可設為送風風機。此時,如圖7所示,可將多個氣流形成部6da沿屏蔽放電燈1(發光管11)的管軸方向(Y方向)排列設置。多個氣流形成部6da的列可設為與屏蔽放電燈1(發光管11)成為平行。另外,氣流形成部6da的數量並不限定於所例示的數量,例如,可根據屏蔽放電燈1(發光管11)的管軸方向上的長度適當變更。另外,氣流形成部6da也可設為橫流風機(線流風機(line flow fan)(注冊商標))。在將氣流形成部6da設為橫流風機的情況下,例如可設置一個沿屏蔽放電燈1(發光管11)的管軸方向(Y方向)延伸的氣流形成部6da。 FIG7 is a schematic three-dimensional diagram of an airflow forming portion 6da for illustrating another embodiment. The airflow forming portion 6da can be, for example, an air supply fan. In this case, as shown in FIG7 , a plurality of airflow forming portions 6da can be arranged along the tube axis direction (Y direction) of the shielded discharge lamp 1 (luminous tube 11). The row of the plurality of airflow forming portions 6da can be arranged to be parallel to the shielded discharge lamp 1 (luminous tube 11). In addition, the number of airflow forming portions 6da is not limited to the number illustrated, and for example, it can be appropriately changed according to the length in the tube axis direction of the shielded discharge lamp 1 (luminous tube 11). In addition, the airflow forming portion 6da can also be a cross-flow fan (line flow fan (registered trademark)). When the airflow forming portion 6da is set as a cross-flow fan, for example, an airflow forming portion 6da extending along the tube axis direction (Y direction) of the shielded discharge lamp 1 (light-emitting tube 11) can be set.

而且,氣流形成部6da將滯留在框體5的內部空間中的吹掃氣體G供給至發光管11的對象物200側的端部附近。因此,所述流量調整部6c與框體5的內部空間連接。流量調整部6c向框體5的內部空間供給吹掃氣體G,以至少在氣流形成部6da的周邊存在吹掃氣體G。Furthermore, the airflow forming portion 6da supplies the blowing gas G retained in the internal space of the frame 5 to the vicinity of the end of the light-emitting tube 11 on the object 200 side. Therefore, the flow adjusting portion 6c is connected to the internal space of the frame 5. The flow adjusting portion 6c supplies the blowing gas G to the internal space of the frame 5 so that the blowing gas G exists at least around the airflow forming portion 6da.

在設置氣流形成部6da的情況下,也可在發光管11的對象物200側的端部附近形成吹掃氣體G的流動。若形成吹掃氣體G的流動,則可使從對象物200朝向屏蔽放電燈1(發光管11)的氣體200a隨著吹掃氣體G的流動而遠離屏蔽放電燈1(發光管11)。即,若設置氣流形成部6da,則能夠享有與所述氣流形成部6d同樣的效果。When the airflow forming portion 6da is provided, a flow of the sweeping gas G can also be formed near the end of the flash tube 11 on the object 200 side. If the flow of the sweeping gas G is formed, the gas 200a from the object 200 toward the shield discharge lamp 1 (flash tube 11) can be moved away from the shield discharge lamp 1 (flash tube 11) along with the flow of the sweeping gas G. That is, if the airflow forming portion 6da is provided, the same effect as that of the airflow forming portion 6d can be achieved.

圖8是用於例示圖5所示的比較例的紫外線照射裝置300的效果的表。另外,圖8是用於例示未設置氣流形成部6d(6da)時的效果的表。 圖9是用於例示設有氣流形成部6d(6da)時的效果的表。另外,圖8以及圖9中的「0 mm」表示屏蔽放電燈1(發光管11)的管軸方向(Y方向)上的中心位置。而且,「300 mm」、「600 mm」、「700 mm」、「-300 mm」、「-600 mm」、「-700 mm」表示距中心位置的距離。 圖10是用於例示均勻度的隨時間的變化的圖表。 FIG8 is a table for illustrating the effect of the ultraviolet irradiation device 300 of the comparative example shown in FIG5. In addition, FIG8 is a table for illustrating the effect when the airflow forming section 6d (6da) is not provided. FIG9 is a table for illustrating the effect when the airflow forming section 6d (6da) is provided. In addition, "0 mm" in FIG8 and FIG9 represents the center position in the tube axis direction (Y direction) of the shielded discharge lamp 1 (light-emitting tube 11). Moreover, "300 mm", "600 mm", "700 mm", "-300 mm", "-600 mm", and "-700 mm" represent the distance from the center position. FIG10 is a graph for illustrating the change of uniformity over time.

從圖8以及圖9可知,若設有氣流形成部6d(6da),則能夠減小屏蔽放電燈1(發光管11)的管軸方向(Y方向)上的照度的偏差。即,能夠實現均勻度的提高。As can be seen from Fig. 8 and Fig. 9, if the airflow forming portion 6d (6da) is provided, the variation in the illuminance in the tube axis direction (Y direction) of the muffled discharge lamp 1 (luminous tube 11) can be reduced. That is, the uniformity can be improved.

而且,從圖10可知,若設有氣流形成部6d(6da),則能夠抑制均勻度隨時間的推移而下降。 而且,由於吹掃氣體G直接供給至屏蔽放電燈1(發光管11)的附近,因此能夠有效果地抑制外部氣體(空氣)與屏蔽放電燈1(發光管11)接觸。例如,當在內部電極12與電極體16a之間產生屏蔽放電時,若在電極體16a與冷卻部2之間的間隙或電極體16a與發光管11之間的間隙中存在環境中的空氣,則有時會產生硝化氫氣體。而且,在電極體16a的表面,環境中的水分有時會結露。若硝化氫氣體溶入至結露的水分中,則會生成硝酸。當硝酸接觸至發光管11的外表面時,紫外線的透射性將下降。若每當使屏蔽放電燈1點亮時反復產生此種化學反應,則紫外線的導出效率有可能會隨時間的推移而下降。 Moreover, as can be seen from FIG. 10 , if the airflow forming section 6d (6da) is provided, the uniformity can be suppressed from decreasing over time. Moreover, since the purge gas G is directly supplied to the vicinity of the shield discharge lamp 1 (luminous tube 11), it is possible to effectively suppress the contact between the external gas (air) and the shield discharge lamp 1 (luminous tube 11). For example, when shield discharge occurs between the internal electrode 12 and the electrode 16a, if air in the environment exists in the gap between the electrode 16a and the cooling section 2 or the gap between the electrode 16a and the luminous tube 11, hydrogen nitrate gas may be generated. Moreover, moisture in the environment may condense on the surface of the electrode 16a. If hydrogen nitrate gas dissolves in condensed water, nitric acid will be generated. When nitric acid contacts the outer surface of the light-emitting tube 11, the transmittance of ultraviolet rays will decrease. If this chemical reaction is repeated every time the shielded discharge lamp 1 is lit, the efficiency of ultraviolet light extraction may decrease over time.

若設有氣流形成部6d(6da),則吹掃氣體G直接供給至屏蔽放電燈1(發光管11)的附近,因此能夠有效果地抑制硝化氫氣體的生成或水分的結露。因此,能夠有效果地抑制紫外線的取出效率隨時間的推移而下降。If the airflow forming section 6d (6da) is provided, the purge gas G is directly supplied to the vicinity of the shield discharge lamp 1 (luminous tube 11), so that the generation of hydrogen nitrate gas or condensation of water can be effectively suppressed. Therefore, the reduction in ultraviolet light extraction efficiency over time can be effectively suppressed.

而且,若設有罩4,則能夠使供給至屏蔽放電燈1(發光管11)的附近的吹掃氣體G滯留,因此,能夠進一步抑制硝化氫氣體的生成或水分的結露。因此,能夠進一步抑制紫外線的取出效率隨時間的推移而下降。Furthermore, if the cover 4 is provided, the purge gas G supplied to the vicinity of the shielded discharge lamp 1 (luminous tube 11) can be retained, thereby further suppressing the generation of hydrogen nitrate gas or condensation of water. Therefore, the reduction in ultraviolet light extraction efficiency over time can be further suppressed.

以上,例示了本發明的若干實施方式,但這些實施方式是作為示例而提示,並不意圖限定發明的範圍。這些新穎的實施方式能夠以其他的各種形態來實施,在不脫離發明主旨的範圍內可進行各種省略、置換、變更等。這些實施方式或其變形例包含在發明的範圍或主旨內,並且包含在權利要求書所記載的發明及其均等的範圍內。而且,前述的各實施方式能夠相互組合而實施。Several embodiments of the present invention are illustrated above, but these embodiments are provided as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, substitutions, changes, etc. can be made without departing from the scope of the invention. These embodiments or their variations are included in the scope or the subject matter of the invention, and are included in the invention described in the claims and the scope of their equivalents. Moreover, the aforementioned embodiments can be implemented in combination with each other.

1:屏蔽放電燈 2:冷卻部 2a:凹部 2b:流路 2c、6b:開閉閥 3:燈座 4:罩 5:框體 6、306:吹掃氣體供給部 6a:氣體供給源 6c:流量調整部 6d、6da:氣流形成部 6d1:吹出口 11:發光管 11a:密封部 11b:導電部 11c:外引線 12:內部電極 12a:線圈 12b:極線 13:反射膜 14:支架 15:導線 16:外部電極 16a:電極體 16b:安裝部 16c:定位構件 100:紫外線照射裝置 200:對象物 200a:氣體 201:搬送裝置 306a:流量調整閥 306b:層 A-A:線 G:吹掃氣體 P:間距尺寸 X、Y、Z:箭頭 1: Shielded discharge lamp 2: Cooling part 2a: Recessed part 2b: Flow path 2c, 6b: On/off valve 3: Lamp holder 4: Cover 5: Frame 6, 306: Blowing gas supply part 6a: Gas supply source 6c: Flow rate adjustment part 6d, 6da: Air flow forming part 6d1: Blowing outlet 11: Light-emitting tube 11a: Sealing part 11b: Conductive part 11c: External lead 12: Internal electrode 12a: Coil 12b: Electrode 13: Reflective film 14: Bracket 15: Wire 16: External electrode 16a: Electrode body 16b: Mounting part 16c: Positioning member 100: UV irradiation device 200: Object 200a: Gas 201: Transport device 306a: Flow control valve 306b: Layer A-A: Line G: Blowing gas P: Pitch size X, Y, Z: Arrows

圖1是用於例示本實施方式的紫外線照射裝置的示意剖面圖。 圖2是屏蔽放電燈、冷卻部、燈座及罩的示意分解圖。 圖3是用於例示屏蔽放電燈的示意圖。 圖4是圖3中的屏蔽放電燈的A-A線方向的示意剖面圖。 圖5是用於例示比較例的紫外線照射裝置的示意剖面圖。 圖6是用於例示氣流形成部的示意立體圖。 圖7是用於例示另一實施方式的氣流形成部的示意立體圖。 圖8是用於例示圖5所示的比較例的紫外線照射裝置的效果的表。 圖9是用於例示設有氣流形成部時的效果的表。 圖10是用於例示均勻度的隨時間的變化的圖表。 FIG. 1 is a schematic cross-sectional view of an ultraviolet irradiation device for illustrating the present embodiment. FIG. 2 is a schematic exploded view of a shielded discharge lamp, a cooling unit, a lamp holder, and a cover. FIG. 3 is a schematic view for illustrating a shielded discharge lamp. FIG. 4 is a schematic cross-sectional view of the shielded discharge lamp in FIG. 3 along the A-A line. FIG. 5 is a schematic cross-sectional view of an ultraviolet irradiation device for illustrating a comparative example. FIG. 6 is a schematic three-dimensional view for illustrating an airflow forming unit. FIG. 7 is a schematic three-dimensional view for illustrating an airflow forming unit of another embodiment. FIG. 8 is a table for illustrating the effect of the ultraviolet irradiation device of the comparative example shown in FIG. 5. FIG. 9 is a table for illustrating the effect when an airflow forming unit is provided. FIG. 10 is a graph for illustrating the change of uniformity over time.

1:屏蔽放電燈 1: Shielding discharge lamp

2:冷卻部 2: Cooling section

2b:流路 2b: Flow path

3:燈座 3: Lamp holder

4:罩 4: Hood

5:框體 5: Frame

2c、6b:開閉閥 2c, 6b: Open/Close valve

6:吹掃氣體供給部 6: Blowing gas supply unit

6a:氣體供給源 6a: Gas supply source

6c:流量調整部 6c: Flow adjustment department

6d:氣流形成部 6d: Airflow formation part

16a:電極體 16a: Electrode

16b:安裝部 16b: Installation Department

16c:定位構件 16c: Positioning components

100:紫外線照射裝置 100: Ultraviolet irradiation device

200:對象物 200: Object

200a:氣體 200a: Gas

201:搬送裝置 201: Transport device

G:吹掃氣體 G: Blowing gas

Claims (3)

一種紫外線照射裝置,其特徵在於包括: 框體,呈箱狀,其中一個端部開口; 屏蔽放電燈,設在所述框體的內部,照射紫外線; 氣流形成部,在所述框體的內部使吹掃氣體朝向所述屏蔽放電燈流動, 所述屏蔽放電燈具有: 發光管,沿一方向延伸,呈管狀,在內部封入有氣體; 內部電極,設在所述發光管的內部;以及 外部電極,設在所述發光管的外部, 所述氣流形成部形成在所述發光管中與所述框體的開口相向一側的端部附近流動的所述吹掃氣體的流動。 A UV irradiation device, characterized in that it includes: a frame, which is box-shaped and has an opening at one end; a shielded discharge lamp, which is arranged inside the frame and irradiates UV rays; an airflow forming part, which makes a blowing gas flow toward the shielded discharge lamp inside the frame, the shielded discharge lamp has: a light-emitting tube, which extends in one direction, is tubular, and has a gas sealed inside; an internal electrode, which is arranged inside the light-emitting tube; and an external electrode, which is arranged outside the light-emitting tube, the airflow forming part forms the flow of the blowing gas flowing near the end of the light-emitting tube on the side opposite to the opening of the frame. 如請求項1所述的紫外線照射裝置,其中所述吹掃氣體滯留在所述框體的內部空間中。An ultraviolet irradiation device as described in claim 1, wherein the purge gas is retained in the internal space of the frame. 如請求項1或請求項2所述的紫外線照射裝置,其中所述吹掃氣體沿著所述框體的開口從與所述發光管延伸的方向正交的方向上的、所述發光管的其中一側向另一側流動。An ultraviolet irradiation device as described in claim 1 or claim 2, wherein the blowing gas flows along the opening of the frame from one side of the light-emitting tube to the other side in a direction orthogonal to the direction in which the light-emitting tube extends.
TW112131061A 2022-11-09 2023-08-18 Ultraviolet irradiation device TW202420397A (en)

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JP2022-179353 2022-11-09
JP2022179353A JP2024068775A (en) 2022-11-09 2022-11-09 Ultraviolet ray irradiation device

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TW202420397A true TW202420397A (en) 2024-05-16

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