TW202410744A - Plasma-assisted condensation device and plasma-assisted condensation method - Google Patents
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- 238000009833 condensation Methods 0.000 title claims abstract description 74
- 230000005494 condensation Effects 0.000 title claims abstract description 74
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- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 12
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- 229910052786 argon Inorganic materials 0.000 claims description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 6
- 238000006297 dehydration reaction Methods 0.000 claims description 6
- 239000000203 mixture Substances 0.000 claims description 6
- 229910052757 nitrogen Inorganic materials 0.000 claims description 6
- 239000001301 oxygen Substances 0.000 claims description 6
- 229910052760 oxygen Inorganic materials 0.000 claims description 6
- -1 perfluorosiloxane Chemical group 0.000 claims description 6
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 5
- 239000011858 nanopowder Substances 0.000 claims description 5
- 239000002245 particle Substances 0.000 claims description 5
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Abstract
Description
本揭露是有關於一種電漿處理技術,且特別是有關於一種電漿輔助縮合裝置及電漿輔助縮合方法。The present disclosure relates to a plasma processing technology, and more particularly to a plasma-assisted condensation device and a plasma-assisted condensation method.
一種常見的抗汙塗層的製作技術係以濕式常壓噴塗全氟矽化物為主。此技術先將帶矽烷(silane)官能基的全氟化物噴塗至基材表面。隨後,以烘箱烘烤,使矽烷官能基與基材表面的羥基(-OH)進行脫水反應,而產生共價鍵結。這樣的抗汙塗層噴塗技術因具高產能的優點而廣為採用。A common antifouling coating production technology is based on wet atmospheric pressure spraying of perfluorosilicone. This technology first sprays perfluorochemicals with silane functional groups onto the surface of the substrate. Subsequently, it is baked in an oven to cause a dehydration reaction between the silane functional group and the hydroxyl group (-OH) on the surface of the substrate to form a covalent bond. This anti-fouling coating spraying technology is widely adopted due to its high productivity.
噴塗後接續的烘箱烘烤時間須達30分鐘,一般選擇搭配隧道式烤箱與多層爐烤箱。隧道式烤箱需數十米的佔地空間,且為了維持大範圍的均溫性,設備的能耗亦相當可觀。多層爐烤箱需搭配機械手臂作業,而需配置多層爐烘箱、多層冷卻爐、及機械手臂作業的無塵圍籬空間,設備造價高。The oven baking time after spraying must reach 30 minutes. Generally, tunnel ovens and multi-layer ovens are selected. Tunnel ovens require tens of meters of floor space, and in order to maintain temperature uniformity over a wide range, the energy consumption of the equipment is also considerable. The multi-layer furnace oven needs to be operated with a robotic arm, and it needs to be equipped with a multi-layer furnace oven, a multi-layer cooling furnace, and a dust-free fenced-in space for the robotic arm operation. The equipment cost is high.
由於以烘箱加熱,需有足夠的時間使產品升溫至反應溫度,因此不僅耗時,也耗能。此外,為達製程需求,烘箱的設備造價成本高昂。而且,以烘箱加熱時,需將載板升溫至反應溫度,載板治具的選擇受限於其耐溫性與耐用性。另,由於在烘箱中,基材也會升溫至反應溫度,因此基材材質的選擇亦受限於其耐溫性。Since it takes enough time for the product to reach the reaction temperature when using an oven for heating, it is not only time-consuming but also energy-consuming. In addition, the equipment cost of the oven is high to meet the process requirements. Moreover, when using an oven for heating, the substrate needs to be heated to the reaction temperature, and the choice of the substrate fixture is limited by its temperature resistance and durability. In addition, since the substrate will also be heated to the reaction temperature in the oven, the choice of the substrate material is also limited by its temperature resistance.
因此,本揭露之一目的就是在提供一種電漿輔助縮合裝置及電漿輔助縮合方法,其利用電漿中之活性物質直接接觸薄膜材料層,而可將能量傳遞給薄膜材料層,並可進一步地將能量傳導至待處理之物體的表面。藉此,可將能量集中在物體之表面,而可大幅縮減薄膜材料層之官能基與物體之表面上的縮合反應時間,進而可提高鍍膜效能。Therefore, one purpose of the present disclosure is to provide a plasma-assisted condensation device and a plasma-assisted condensation method, which utilize active substances in the plasma to directly contact the thin film material layer to transfer energy to the thin film material layer, and further Conduct energy to the surface of the object to be treated. In this way, energy can be concentrated on the surface of the object, and the condensation reaction time between the functional groups of the thin film material layer and the surface of the object can be greatly reduced, thereby improving the coating efficiency.
本揭露之另一目的在提供一種電漿輔助縮合裝置及電漿輔助縮合方法,其以電漿來提供能量,可有效減短縮合反應的時間,因此可大幅縮減設備的佔地面積,且有助於減少設備造價。Another object of the present disclosure is to provide a plasma-assisted condensation device and a plasma-assisted condensation method that use plasma to provide energy, which can effectively shorten the time of the condensation reaction, thereby significantly reducing the equipment footprint and having Helps reduce equipment costs.
本揭露之又一目的在提供一種電漿輔助縮合裝置及電漿輔助縮合方法,其縮合過程中物體與載盤維持常溫狀態,因此無須冷卻即可接續後製程。故,應用本揭露不僅可省下冷卻裝置的成本,更可提升鍍膜效率,且物體與載盤的選擇更為多元。Another object of the present disclosure is to provide a plasma-assisted condensation device and a plasma-assisted condensation method, wherein the object and the carrier are kept at room temperature during the condensation process, so that the subsequent process can be continued without cooling. Therefore, the application of the present disclosure can not only save the cost of the cooling device, but also improve the coating efficiency, and the selection of the object and the carrier is more diverse.
根據本揭露之上述目的,提出一種電漿輔助縮合裝置。此電漿輔助縮合裝置包含反應室以及常壓電漿裝置。反應室配置以供待處理之至少一物體在反應室中反應。物體之表面包含數個活性官能基,物體之表面上塗布有薄膜材料層,薄膜材料層包含數個官能基。常壓電漿裝置配置以在反應室中產生電漿來進行常壓電漿處理,藉以將電漿之能量傳遞給薄膜材料層與物體之表面,促進薄膜材料層之官能基與物體之表面上之活性官能基之縮合反應的進行。According to the above-mentioned purpose of the present disclosure, a plasma-assisted condensation device is proposed. The plasma-assisted condensation device includes a reaction chamber and a normal-pressure plasma device. The reaction chamber is configured for at least one object to be processed to react in the reaction chamber. The surface of the object includes a plurality of active functional groups, and a thin film material layer is coated on the surface of the object, and the thin film material layer includes a plurality of functional groups. The normal-pressure plasma device is configured to generate plasma in the reaction chamber to perform normal-pressure plasma treatment, so as to transfer the energy of the plasma to the thin film material layer and the surface of the object, and promote the condensation reaction between the functional groups of the thin film material layer and the active functional groups on the surface of the object.
依據本揭露之一實施例,上述之物體為數個基材,且電漿輔助縮合裝置更包含載盤,載盤配置以承載這些基材。According to one embodiment of the present disclosure, the above-mentioned objects are a plurality of substrates, and the plasma-assisted compaction device further comprises a carrier configured to carry the substrates.
依據本揭露之一實施例,上述之常壓電漿裝置為噴射式電漿(JET)裝置、旋轉式噴射電漿裝置、介電層放電(DBD)電漿裝置、或電暈(Corona)電漿裝置。According to an embodiment of the present disclosure, the atmospheric pressure plasma device is a jet plasma (JET) device, a rotary jet plasma device, a dielectric layer discharge (DBD) plasma device, or a corona plasma device.
依據本揭露之一實施例,上述之電漿輔助縮合裝置更包含移動機構。常壓電漿裝置設於移動機構中,移動機構配置以帶動常壓電漿裝置沿一軸向、二軸向、或三軸向移動。移動機構之移動速度為約300mm/s至約1000mm/s。According to an embodiment of the present disclosure, the plasma-assisted condensation device further comprises a moving mechanism. The atmospheric pressure plasma device is disposed in the moving mechanism, and the moving mechanism is configured to drive the atmospheric pressure plasma device to move along one axis, two axes, or three axes. The moving speed of the moving mechanism is about 300 mm/s to about 1000 mm/s.
依據本揭露之一實施例,上述之電漿輔助縮合裝置更包含移載機構,其中移載機構配置以承載並移動載盤。According to one embodiment of the present disclosure, the plasma-assisted compacting device further comprises a transfer mechanism, wherein the transfer mechanism is configured to carry and move a carrier.
依據本揭露之一實施例,上述之物體為數個粉體,這些粉體為數個奈米粉體及/或數個微米粉體。According to an embodiment of the present disclosure, the above-mentioned objects are several powders, and these powders are several nanopowders and/or several micron powders.
依據本揭露之一實施例,上述之粉體之粒徑等於或小於約50μm。According to one embodiment of the present disclosure, the particle size of the powder is equal to or less than about 50 μm.
依據本揭露之一實施例,上述之常壓電漿裝置為噴射式電漿裝置或介電層放電電漿裝置。According to an embodiment of the present disclosure, the above-mentioned normal pressure plasma device is a jet plasma device or a dielectric layer discharge plasma device.
依據本揭露之一實施例,上述之介電層放電電漿裝置包含第一電極、第二電極、以及介電腔體。第二電極與第一電極彼此相對。介電腔體介於第一電極與第二電極之間,其中介電腔體界定出反應室。According to an embodiment of the present disclosure, the dielectric layer discharge plasma device comprises a first electrode, a second electrode, and a dielectric cavity. The second electrode and the first electrode are opposite to each other. The dielectric cavity is between the first electrode and the second electrode, wherein the dielectric cavity defines a reaction chamber.
依據本揭露之一實施例,上述之介電腔體之材料為陶瓷或石英。According to an embodiment of the present disclosure, the material of the dielectric cavity is ceramic or quartz.
根據本揭露之上述目的,更提出一種電漿輔助縮合方法。在此方法中,提供至少一物體,其中物體之表面包含數個活性官能基。對物體之表面塗布薄膜材料層,其中薄膜材料層包含數個官能基。進行常壓電漿處理,以產生電漿並將電漿之能量傳遞給薄膜材料層與物體之表面,藉以促進薄膜材料層之官能基與物體之表面上之活性官能基之縮合反應的進行。According to the above object of the present disclosure, a plasma-assisted condensation method is further proposed. In this method, at least one object is provided, wherein the surface of the object contains several reactive functional groups. A thin film material layer is coated on the surface of the object, where the thin film material layer contains several functional groups. Perform normal pressure plasma treatment to generate plasma and transfer the energy of the plasma to the film material layer and the surface of the object, thereby promoting the condensation reaction of the functional groups of the film material layer and the active functional groups on the surface of the object.
依據本揭露之一實施例,上述提供物體更包含對物體進行常壓電漿活化處理,以在物體之表面形成活性官能基。According to one embodiment of the present disclosure, providing the object further includes performing a normal pressure plasma activation treatment on the object to form active functional groups on the surface of the object.
依據本揭露之一實施例,上述對物體之表面塗布薄膜材料層包含利用二流體噴塗方式、單流體噴塗方式、超音波噴塗方式、旋杯噴塗方式、或旋轉塗布方式。According to an embodiment of the present disclosure, the above-mentioned coating of the thin film material layer on the surface of the object includes using a two-fluid spraying method, a single-fluid spraying method, an ultrasonic spraying method, a rotary cup spraying method, or a rotary coating method.
依據本揭露之一實施例,上述薄膜材料層之厚度等於或小於1μm。According to an embodiment of the present disclosure, the thickness of the thin film material layer is equal to or less than 1 μm.
依據本揭露之一實施例,上述之官能基包含矽烷類、矽氧烷、氫氧基、或羧基。According to one embodiment of the present disclosure, the functional group includes silane, siloxane, hydroxyl group, or carboxyl group.
依據本揭露之一實施例,上述之薄膜材料層之材料為全氟矽氧烷。According to an embodiment of the present disclosure, the material of the above-mentioned thin film material layer is perfluorosiloxane.
依據本揭露之一實施例,上述之縮合反應為固化反應、脫水反應、或脫醇反應。According to one embodiment of the present disclosure, the condensation reaction is a curing reaction, a dehydration reaction, or a dealcoholization reaction.
依據本揭露之一實施例,上述之物體為數個基材,這些基材之材料為玻璃、不鏽鋼、鋁合金、或塑膠。According to an embodiment of the present disclosure, the above-mentioned objects are several base materials, and the materials of these base materials are glass, stainless steel, aluminum alloy, or plastic.
依據本揭露之一實施例,上述進行常壓電漿處理包含利用常壓電漿裝置,且此常壓電漿裝置為噴射式電漿裝置、旋轉式噴射電漿裝置、介電層放電電漿裝置、或電暈電漿裝置。According to an embodiment of the present disclosure, the above-mentioned atmospheric pressure plasma treatment includes using an atmospheric pressure plasma device, and the atmospheric pressure plasma device is a jet plasma device, a rotary jet plasma device, a dielectric layer discharge plasma device, or a corona plasma device.
依據本揭露之一實施例,上述噴射式電漿裝置之作業高度為約2mm至約30mm,噴射式電漿裝置之電漿功率為約200W至約1000W,且進行常壓電漿處理之工作氣體為潔淨乾燥空氣(CDA)、氮氣(N 2 、氬氣(Ar)、氧氣(O 2)、或其混合。 According to an embodiment of the present disclosure, the working height of the jet plasma device is about 2 mm to about 30 mm, the plasma power of the jet plasma device is about 200 W to about 1000 W, and the working gas for the atmospheric pressure plasma treatment is clean dry air (CDA), nitrogen (N 2 , argon (Ar), oxygen (O 2 ), or a mixture thereof.
依據本揭露之一實施例,上述介電層放電電漿裝置之作業高度為約2mm至約20mm,介電層放電電漿裝置之處理速度為約0.5m/min至約5m/min,且進行常壓電漿處理之工作氣體為潔淨乾燥空氣、氮氣、氬氣、氧氣、或其混合。According to one embodiment of the present disclosure, the working height of the dielectric layer discharge plasma device is about 2 mm to about 20 mm, the processing speed of the dielectric layer discharge plasma device is about 0.5 m/min to about 5 m/min, and the working gas for atmospheric pressure plasma processing is clean dry air, nitrogen, argon, oxygen, or a mixture thereof.
依據本揭露之一實施例,上述之物體為數個粉體,這些粉體為數個奈米粉體及/或數個微米粉體。According to an embodiment of the present disclosure, the aforementioned objects are a plurality of powders, and these powders are a plurality of nanopowders and/or a plurality of micron powders.
依據本揭露之一實施例,上述之粉體之粒徑為等於或小於約50μm。According to an embodiment of the present disclosure, the particle size of the above-mentioned powder is equal to or less than about 50 μm.
依據本揭露之一實施例,上述進行常壓電漿處理包含利用噴射式電漿裝置或介電層放電電漿裝置。According to an embodiment of the present disclosure, the above-mentioned atmospheric pressure plasma treatment includes using a jet plasma device or a dielectric layer discharge plasma device.
依據本揭露之一實施例,上述之介電層放電電漿裝置包含第一電極、第二電極、以及介電腔體。第二電極與第一電極彼此相對。介電腔體介於第一電極與第二電極之間,其中常壓電漿處理係在介電腔體內進行。According to an embodiment of the present disclosure, the dielectric layer discharge plasma device comprises a first electrode, a second electrode, and a dielectric chamber. The second electrode and the first electrode are opposite to each other. The dielectric chamber is between the first electrode and the second electrode, wherein the atmospheric pressure plasma treatment is performed in the dielectric chamber.
請參照圖1,其係繪示依照本揭露之一實施方式的一種電漿輔助縮合裝置的裝置示意圖。電漿輔助縮合裝置100可產生電漿,而利用電漿來提供能量,以促進縮合反應的進行。在一些實施例中,電漿輔助縮合裝置100主要包含反應室110以及常壓電漿裝置130。反應室110可供常壓電漿處理在其內進行。Please refer to FIG. 1, which is a schematic diagram of a plasma-assisted condensation device according to an embodiment of the present disclosure. The plasma-assisted
在一些示範例子中,電漿輔助縮合裝置100更包含載盤120。載盤120可在反應室110中承載至少一待處理的物體。舉例而言,載盤120所承載之至少一物體可為數個基材140,以利同時在反應室110內對這些基材140進行常壓電漿處理。舉例而言,基材140之材料可為玻璃、不鏽鋼、鋁合金、或塑膠。基材140亦可為上述材料經表面改質處理或表面硬化處理的基材。每個基材140之表面140a包含數個活性官能基。在一些實施例中,透過載盤120將基材140載入反應室110前,可先利用另一常壓電漿裝置(未繪示)對這些基材140之表面140a進行常壓電漿活化處理,藉此在基材140之表面140a上形成許多活性官能基。此常壓電漿活化處理除了可在基材140之表面140a上形成活性官能基外,亦具有清潔基材140之表面140a的功能。In some exemplary examples, the plasma-assisted
於電漿活化處理後,且將基材140載入反應室110前,可先利用塗布裝置(未繪示),在每個基材140之表面140a上塗布薄膜材料層150。舉例而言,塗布裝置可為二流體噴塗裝置、單流體噴塗裝置、超音波噴塗裝置、旋杯噴塗裝置、或旋轉塗布裝置。每個薄膜材料層150包含數個官能基。在一些實施例中,官能基包含矽烷類、矽氧烷、氫氧基、或羧基。舉例而言,薄膜材料層150之材料可為全氟矽氧烷。After the plasma activation treatment and before loading the
如圖1所示,常壓電漿裝置130設於反應室110中,且可例如位於反應室110之上部。將裝載著基材140之載盤120載入反應室110後,常壓電漿裝置130位於這些基材140之上方。常壓電漿裝置130可產生電漿,以利用所產生之電漿來進行常壓電漿處理。常壓電漿裝置130包含電漿噴嘴132。常壓電漿裝置130所產生之電漿可經由電漿噴嘴132噴向基材140。電漿中具有許多活性物質,這些活性物質直接接觸薄膜材料層150,而可將能量傳遞至薄膜材料層150。薄膜材料層150可進一步將能量傳導至基材140之表面140a,而將能量集中在基材140之表面140a。藉此,薄膜材料層150之官能基與基材140之表面140a上之活性官能基可利用此能量快速發生縮合反應而形成鍵結。也就是說,常壓電漿裝置130所產生之電漿可促進薄膜材料層150之官能基與基材140之表面140a上之活性官能基進行縮合反應,而可有效縮減縮合反應時間。As shown in FIG. 1 , the atmospheric
在一些實施例中,常壓電漿裝置130為噴射式電漿裝置、旋轉式噴射電漿裝置、介電層放電電漿裝置、或電暈電漿裝置。在常壓電漿裝置130為旋轉式噴射電漿裝置的例子中,噴嘴132可例如具有旋轉機構,而可以相對於常壓電漿裝置130之中心軸傾斜一角度的方式旋轉,以增加電漿處理面積。In some embodiments, the atmospheric
在一些實施例中,電漿輔助縮合裝置100更包含移動機構160。如圖1所示,移動機構160可移動地設於反應室110之上部。移動機構160至少可沿一個軸向,例如軸X、軸Y、或軸Z移動。在圖1中,軸Y垂直紙面。替代地,移動機構160可沿二個軸向,例如軸X、軸Y、與軸Z之任二軸向移動。或者,移動機構160可沿三個軸向,例如軸X、軸Y、與軸Z移動。軸X、軸Y、與軸Z可例如彼此垂直。常壓電漿裝置130裝設在移動機構160中。藉此,移動機構160的移動可帶動常壓電漿裝置130沿一個軸向、二個軸向、或三個軸向移動,以控制常壓電漿裝置130的處理軌跡。在一些示範例子中,移動機構160之移動速度為約300mm/s至約1000mm/s。In some embodiments, the plasma-assisted
請繼續參照圖1,電漿輔助縮合裝置100可選擇性地包含移載機構170。載盤120可放置在移載機構170上,移載機構170可承載載盤120及其上之基材140與薄膜材料層150,並移動載盤120及其上之基材140與薄膜材料層150。具體而言,移載機構170可從上游製程之塗布裝置將載盤120及其上之基材140與薄膜材料層150載入電漿輔助縮合裝置100,並於縮合反應後,將載盤120及其上之基材140與薄膜材料層150載送至下游之下料站。如圖1所示之實施例,移載機構170可包含數個滾輪172。在另一些實施例中,移載機構可為輸送帶,或可為輸送帶與多個滾輪的組合。Please continue to refer to FIG. 1 , the plasma-assisted
請參照圖2,其係繪示依照本揭露之一實施方式的一種電漿輔助縮合方法的流程圖。在一些實施例中,可利用圖1之電漿輔助縮合裝置100來進行電漿輔助縮合方法。請一併參照圖1,首先可進行步驟200,以提供至少一物體。舉例而言,可提供數個基材140,並將這些基材140放置在載盤120上。如同上述關於電漿輔助縮合裝置100的描述,每個基材140之表面140a上包含數個活性官能基。在一些實施例中,提供基材140時,可先利用另一常壓電漿裝置,對基材140進行常壓電漿活化處理,藉以清潔每個基材140之表面140a,並在每個基材140之表面140a上形成活性官能基。Please refer to FIG. 2 , which is a flow chart of a plasma-assisted condensation method according to an embodiment of the present disclosure. In some embodiments, the plasma-assisted
接下來,可進行步驟210,以對所提供之物體之表面,即每個基材140之表面140a塗布薄膜材料層150。舉例而言,可利用二流體噴塗方式、單流體噴塗方式、超音波噴塗方式、旋杯噴塗方式、或旋轉塗布方式在每個基材140之表面140a塗布薄膜材料層150。在一些示範實施例中,每個薄膜材料層150之厚度TH等於或小於約1μm,以利將薄膜材料層150之表面上的熱快速傳導到基材140之表面140a。薄膜材料層150所可能包含之官能基及其材料已描述於上,於此不再贅述。Next,
接著,可進行步驟220,以利用常壓電漿裝置130進行常壓電漿處理。請一併參照圖3,其係繪示依照本揭露之一實施方式的一種電漿輔助縮合處理的示意圖。常壓電漿裝置130可產生電漿180。電漿180接觸到薄膜材料層150之表面150a時,電漿180中的活性物質會將能量傳遞給薄膜材料層150。而薄膜材料層150可進一步將能量傳導至基材140之表面140a。利用電漿180所給予的能量,可促使薄膜材料層150之官能基與基材140之表面140a上之活性官能基產生縮合反應,並加快此縮合反應的進行。此外,因氣相碰撞產生的電漿180僅於基材140之表面140a作用,因此可大幅提高能源使用效率。在一些實施例中,此縮合反應可為固化反應、脫水反應、或脫醇反應。Next,
在一些實施例中,常壓電漿裝置130為噴射式電漿裝置。進行常壓電漿處理時,噴射式電漿裝置之作業高度可控制在約2mm至約30mm。噴射式電漿裝置之電漿功率可控制在約200W至約1000W。進行常壓電漿處理時所採用之工作氣體可為潔淨乾燥空氣、氮氣、氬氣、氧氣、或其混合。In some embodiments, the atmospheric
在一些實施例中,常壓電漿裝置130為介電層放電電漿裝置。進行常壓電漿處理時,介電層放電電漿裝置之作業高度可控制在約2mm至約20mm。介電層放電電漿裝置之處理速度可控制在約0.5m/min至約5m/min。進行常壓電漿處理所採用之工作氣體可為潔淨乾燥空氣、氮氣、氬氣、氧氣、或其混合。In some embodiments, the atmospheric
本揭露之電漿輔助縮合方法亦可應用於奈米級粉體或微米級粉體的處理上。請參照圖4,其係繪示依照本揭露之一實施方式的另一種電漿輔助縮合處理的裝置示意圖。此實施方式係利用電漿輔助縮合裝置100a對許多粉體300進行電漿輔助縮合處理。因此,對電漿輔助縮合裝置100a所提供之物體為粉體300。在一些實施例中,電漿輔助縮合裝置100a之反應室110a可與粉體原料槽310及粉體收集機320連接。舉例而言,粉體原料槽310與粉體收集機320分別接合在反應室110a的相對二側上。粉體原料槽310將粉體300供應給反應室110a,粉體300在反應室110a中經常壓電漿處理後,由另一側的粉體收集機320加以收集。這些粉體300可為奈米粉體或微米粉體。在一些示範實施例中,這些粉體300之粒徑等於或小於約50μm。The plasma-assisted condensation method disclosed herein can also be applied to the processing of nano-scale powders or micron-scale powders. Please refer to FIG. 4 , which is a schematic diagram of another plasma-assisted condensation processing device according to an embodiment of the present disclosure. This embodiment utilizes a plasma-assisted
在一些實施例中,這些粉體300於導入反應室110a前,可如同圖1之基材140般,而例如經表面改質處理,使得粉體300之表面包含數個活性官能基。舉例而言,可對粉體300之表面進行常壓電漿活化處理,以在粉體300之表面上形成許多活性官能基。此外,於電漿活化處理後,且將粉體300導入反應室110a前,可先利用塗布裝置,在粉體300之表面上塗布薄膜材料層。薄膜材料層之厚度等於或小於約1μm,以利將薄膜材料層之表面上的熱快速傳導到粉體300之表面。薄膜材料層包含數個官能基。在一些實施例中,官能基包含矽烷類、矽氧烷、氫氧基、或羧基。舉例而言,薄膜材料層之材料可為全氟矽氧烷。In some embodiments, before being introduced into the
在本實施方式中,常壓電漿裝置330為噴射式電漿裝置。常壓電漿裝置330可例如穿設於反應室110a之上部中。常壓電漿裝置330可在反應室110a中產生電漿340,以利用所產生之電漿340來對粉體300進行常壓電漿處理。電漿中具有許多活性物質,這些活性物質直接接觸粉體300之表面上所披覆之薄膜材料層,而可將能量傳遞至薄膜材料層。薄膜材料層可進一步將能量傳導至粉體300之表面,而將能量集中在粉體300之表面。藉此,薄膜材料層之官能基與粉體300之表面上之活性官能基可利用此能量快速發生縮合反應而形成鍵結。因此,常壓電漿裝置330所產生之電漿340可促進薄膜材料層之官能基與粉體300之表面上的活性官能基進行縮合反應,而可有效縮減縮合反應時間。在一些實施例中,此縮合反應可為固化反應、脫水反應、或脫醇反應。In this embodiment, the normal
請參照圖5,其係繪示依照本揭露之一實施方式的又一種電漿輔助縮合處理的裝置示意圖。此實施方式與基於圖4所描述之實施方式大致相同,二實施方式均是對粉體300進行電漿輔助縮合處理,二者之間的差異在於本實施方式之電漿輔助縮合裝置100b係利用介電層放電電漿裝置350來提供電漿。Please refer to FIG. 5 , which is a schematic diagram of another plasma-assisted condensation treatment device according to an embodiment of the present disclosure. This embodiment is roughly the same as the embodiment described based on FIG. 4. Both embodiments perform plasma-assisted condensation treatment on the
介電層放電電漿裝置350主要包含第一電極352、第二電極354、以及介電腔體356。第一電極352與第二電極354彼此相對設置。介電腔體356介於第一電極352與第二電極354之間。介電腔體356界定出反應室110b。在一些實施例中,介電腔體356為陶瓷或石英。粉體原料槽310與粉體收集機320分別接合在介電腔體356的相對二側上,且與反應室110b連通。The dielectric layer
常壓電漿裝置350可在介電腔體356內的反應室110b中產生電漿,以在介電腔體356內利用所產生之電漿來對粉體300進行常壓電漿處理。電漿中的活性物質直接接觸粉體300之表面上所披覆之薄膜材料層,而可將能量傳遞至薄膜材料層。薄膜材料層可進一步將能量傳導至粉體300之表面,而將能量集中在粉體300之表面,藉此可促進薄膜材料層之官能基與粉體300之表面上的活性官能基進行縮合反應,例如固化反應、脫水反應、或脫醇反應。The normal
下表1係針對本揭露之實施例採用之噴射式電漿裝置與介電層放電電漿裝置,以及傳統採用多層爐烤箱與隧道式烤箱加熱來進行縮合處理的比較。
表1
由上表1可知,本揭露之實施例所採之噴射式電漿裝置與介電層放電電漿裝置所需之電力遠小於傳統之多層爐烤箱與隧道式烤箱。此外,本揭露之設備的佔地面積也小於傳統之烤箱,特別是隧道式烤箱。本揭露之電漿輔助縮合處理後之基材溫度也小於傳統以烤箱加熱方式的基材溫度。另外,傳統之多層爐烤箱需額外配置冷卻爐,導致設備成本高昂。而隧道式烤箱則需額外含升溫段與冷卻段,導致設備佔地面積大幅增加。As shown in Table 1 above, the power required by the jet plasma device and the dielectric layer discharge plasma device used in the embodiments of the present disclosure is much less than that of the traditional multi-layer furnace oven and the tunnel oven. In addition, the equipment of the present disclosure also occupies less space than the traditional oven, especially the tunnel oven. The temperature of the substrate after the plasma-assisted condensation treatment of the present disclosure is also lower than the temperature of the substrate heated by the traditional oven. In addition, the traditional multi-layer furnace oven needs to be equipped with an additional cooling furnace, resulting in high equipment costs. The tunnel oven needs to include an additional heating section and a cooling section, resulting in a significant increase in the equipment area.
由上述之實施方式可知,本揭露之一優點就是因為本揭露之實施方式利用電漿中之活性物質直接接觸薄膜材料層,而可將能量傳遞給薄膜材料層,並可進一步地將能量傳導至待處理之物體的表面。藉此,可將能量集中在物體之表面,而可大幅縮減薄膜材料層之官能基與物體之表面上的縮合反應時間,進而可提高鍍膜效能。From the above-mentioned implementation method, it can be seen that one advantage of the present disclosure is that the implementation method of the present disclosure utilizes the active substance in the plasma to directly contact the thin film material layer, thereby transferring energy to the thin film material layer, and further transferring energy to the surface of the object to be processed. In this way, the energy can be concentrated on the surface of the object, and the condensation reaction time between the functional groups of the thin film material layer and the surface of the object can be greatly shortened, thereby improving the coating efficiency.
本揭露之另一優點就是因為本揭露之實施方式以電漿來提供能量,可有效減短縮合反應的時間,因此可大幅縮減設備的佔地面積,且有助於減少設備造價。Another advantage of the present disclosure is that the implementation of the present disclosure uses plasma to provide energy, which can effectively shorten the time of the condensation reaction, thereby significantly reducing the equipment footprint and helping to reduce the equipment cost.
本揭露之又一優點就是因為本揭露之實施方式在縮合過程中物體與載盤維持常溫狀態,因此無須冷卻即可接續後製程。故,應用本揭露不僅可省下冷卻裝置的成本,更可提升鍍膜效率,且物體與載盤的選擇更為多元。Another advantage of the present disclosure is that the object and the carrier are kept at room temperature during the condensation process, so the subsequent process can be continued without cooling. Therefore, the application of the present disclosure can not only save the cost of cooling equipment, but also improve the coating efficiency, and the selection of objects and carriers is more diverse.
雖然本揭露已以實施例揭示如上,然其並非用以限定本揭露,任何在此技術領域中具有通常知識者,在不脫離本揭露之精神和範圍內,當可作各種之更動與潤飾,因此本揭露之保護範圍當視後附之申請專利範圍所界定者為準。Although the present disclosure has been disclosed through embodiments, they are not intended to limit the present disclosure. Anyone with ordinary knowledge in this technical field can make various changes and modifications without departing from the spirit and scope of the present disclosure. Therefore, the scope of protection of the present disclosure shall be subject to the scope of the appended patent application.
100:電漿輔助縮合裝置
100a:電漿輔助縮合裝置
100b:電漿輔助縮合裝置
110:反應室
110a:反應室
110b:反應室
120:載盤
130:常壓電漿裝置
132:電漿噴嘴
140:基材
140a:表面
150:薄膜材料層
160:移動機構
170:移載機構
172:滾輪
180:電漿
200:步驟
210:步驟
220:步驟
300:粉體
310:粉體原料槽
320:粉體收集機
330:常壓電漿裝置
340:電漿
350:介電層放電電漿裝置
352:第一電極
354:第二電極
356:介電腔體
X:軸
Y:軸
Z:軸
100: plasma-assisted
為讓本揭露之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下: [圖1]係繪示依照本揭露之一實施方式的一種電漿輔助縮合裝置的裝置示意圖; [圖2]係繪示依照本揭露之一實施方式的一種電漿輔助縮合方法的流程圖; [圖3]係繪示依照本揭露之一實施方式的一種電漿輔助縮合處理的示意圖; [圖4]係繪示依照本揭露之一實施方式的另一種電漿輔助縮合處理的裝置示意圖;以及 [圖5]係繪示依照本揭露之一實施方式的又一種電漿輔助縮合處理的裝置示意圖。 In order to make the above and other purposes, features, advantages and embodiments of the present disclosure more clearly understandable, the attached drawings are described as follows: [Figure 1] is a schematic diagram of a plasma-assisted condensation device according to an embodiment of the present disclosure; [Figure 2] is a flow chart of a plasma-assisted condensation method according to an embodiment of the present disclosure; [Figure 3] is a schematic diagram of a plasma-assisted condensation process according to an embodiment of the present disclosure; [Figure 4] is a schematic diagram of another plasma-assisted condensation process according to an embodiment of the present disclosure; and [Figure 5] is a schematic diagram of another plasma-assisted condensation process according to an embodiment of the present disclosure.
國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic storage information (please note in the order of storage institution, date, and number) None Foreign storage information (please note in the order of storage country, institution, date, and number) None
100:電漿輔助縮合裝置 100: Plasma assisted condensation device
110:反應室 110:Reaction room
120:載盤 120: Load disk
130:常壓電漿裝置 130: Normal pressure plasma device
132:電漿噴嘴 132:Plasma nozzle
140:基材 140: Base material
140a:表面 140a: Surface
150:薄膜材料層 150:Thin film material layer
160:移動機構 160:Mobile mechanism
170:移載機構 170:Transfer mechanism
172:滾輪 172: Roller
X:軸 X: axis
Y:軸 Y: axis
Z:軸 Z: axis
Claims (25)
Priority Applications (2)
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TW111130697A TWI827197B (en) | 2022-08-16 | 2022-08-16 | Plasma-assisted condensation device and plasma-assisted condensation method |
CN202310543094.6A CN117583216A (en) | 2022-08-16 | 2023-05-15 | Plasma-assisted condensing apparatus and plasma-assisted condensing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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TW111130697A TWI827197B (en) | 2022-08-16 | 2022-08-16 | Plasma-assisted condensation device and plasma-assisted condensation method |
Publications (2)
Publication Number | Publication Date |
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TWI827197B TWI827197B (en) | 2023-12-21 |
TW202410744A true TW202410744A (en) | 2024-03-01 |
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CN (1) | CN117583216A (en) |
TW (1) | TWI827197B (en) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2012064649A1 (en) * | 2010-11-10 | 2012-05-18 | 3M Innovative Properties Company | Optical device surface treatment process and smudge-resistant article produced thereby |
TWM446031U (en) * | 2012-10-17 | 2013-02-01 | Creating Nano Technologies Inc | Coating apparatus of anti-smudge film |
TWI573170B (en) * | 2015-06-10 | 2017-03-01 | 馗鼎奈米科技股份有限公司 | Coating module, coating system and fabricating method of anti-smudge film |
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- 2022-08-16 TW TW111130697A patent/TWI827197B/en active
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- 2023-05-15 CN CN202310543094.6A patent/CN117583216A/en active Pending
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