TW202316369A - Storage and representation method of machine vision image and system thereof wherein the method includes displaying a non-region of interest image in black - Google Patents
Storage and representation method of machine vision image and system thereof wherein the method includes displaying a non-region of interest image in black Download PDFInfo
- Publication number
- TW202316369A TW202316369A TW110136978A TW110136978A TW202316369A TW 202316369 A TW202316369 A TW 202316369A TW 110136978 A TW110136978 A TW 110136978A TW 110136978 A TW110136978 A TW 110136978A TW 202316369 A TW202316369 A TW 202316369A
- Authority
- TW
- Taiwan
- Prior art keywords
- image
- interest
- region
- roi
- machine vision
- Prior art date
Links
Images
Landscapes
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Abstract
Description
本發明係關於人工智慧的技術領域,尤指一種單獨儲存興趣區域影像的機器視覺影像的儲存與表示方法及系統。The invention relates to the technical field of artificial intelligence, in particular to a method and system for storing and representing machine vision images that separately store images of regions of interest.
機器視覺檢測技術是建立在影像處理演算法的基礎上,通過數字影象處理與模式識別的方法來實現,與傳統的人工檢測技術相比,提高了缺陷檢測的效率和準確度。機器視覺可涵蓋所有工業與非工業應用,結合硬體與軟體,在操作上引導裝置來執行圖像擷取和處理功能。機器視覺系統仰賴工業相機內保護的數位感測器,利用專業光學件配置擷取圖像,以供電腦硬體與軟體處理、分析以及測量各種不同的特徵來進行決策。工業應用例如印刷電路板組裝應用領域,於組裝過程中,必須檢測印刷電路板的元件編號、尺寸及元件位置是否正確。錫膏印刷不良或元件位置錯誤,都會影響印刷電路板的性能與使用壽命。PCB缺陷檢測包括兩部分:焊點缺陷檢測和元器件檢測,傳統的檢測採用人工檢測方法,容易漏檢、檢測速度慢、檢測時間長、成本高,已經逐漸不能夠滿足生產需要。因此,設計一種高效精準搭載工業相機以取代人眼的機器視覺PCB檢測系統,具有非常重要的現實意義。Machine vision inspection technology is based on image processing algorithm and realized by digital image processing and pattern recognition. Compared with traditional manual inspection technology, it improves the efficiency and accuracy of defect detection. Machine vision can cover all industrial and non-industrial applications, combining hardware and software to operationally guide devices to perform image capture and processing functions. Machine vision systems rely on digital sensors protected in industrial cameras, and use professional optical components to capture images for computer hardware and software to process, analyze, and measure various features to make decisions. Industrial applications such as printed circuit board assembly applications, in the assembly process, it is necessary to check whether the component number, size and component position of the printed circuit board are correct. Poor solder paste printing or wrong component placement will affect the performance and service life of printed circuit boards. PCB defect detection includes two parts: solder joint defect detection and component detection. Traditional detection adopts manual detection method, which is easy to miss detection, slow detection speed, long detection time and high cost, which has gradually failed to meet production needs. Therefore, it is of great practical significance to design an efficient and accurate machine vision PCB inspection system equipped with industrial cameras to replace human eyes.
為有助於印刷電路板的製造廠商在生產工藝實施的早期階段能夠發現所產生的缺陷,目前越來越多的印刷電路板製造廠商在他們所製造的印刷裝置中結合線上機器視覺技術。操作者可及時藉由機器協助,發現瑕疵,及時返修返回生產線。In order to help printed circuit board manufacturers to detect defects in the early stages of production process implementation, more and more printed circuit board manufacturers are currently integrating online machine vision technology in the printing devices they manufacture. The operator can find defects with the assistance of the machine in time, and return to the production line for repair in time.
在人工智慧的技術領域中,機器視覺、圖像處理中,從被處理的圖像以方框、圓、橢圓、不規則多邊形等方式勾勒出需要處理的區域,稱為感興趣區域(region of interested,ROI)。在圖像處理領域,感興趣區域是從圖像中選擇的一個圖像區域,這個區域是你的圖像分析所關注的重點。操作者可藉由機器協助,輔助快速找到印刷電路板中感興趣區域,輔助觀測該感興趣區域中之缺陷影像。圈定該區域以便進行進一步處理。使用感興趣區域圈定你想讀的目標,可以減少處理時間,增加精度。針對感興趣區域的表示方式,傳統上有兩種:In the technical field of artificial intelligence, in machine vision and image processing, the area to be processed is outlined from the processed image in the form of a box, circle, ellipse, irregular polygon, etc., which is called the region of interest (region of interest). interested, ROI). In the field of image processing, a region of interest is an image region selected from an image that is the focus of your image analysis. With the help of the machine, the operator can quickly find the region of interest in the printed circuit board and assist in observing the defect image in the region of interest. Circle the area for further processing. Using a region of interest to delineate the target you want to read can reduce processing time and increase accuracy. There are traditionally two ways to represent the region of interest:
(1)直接在原圖上框出感興趣區域位置:如圖1所示,圖1為待測物影像100之示意圖。藉由機器擷取待測物影像100,並協助找出感興趣區域影像102,以及不包含感興趣區域之非感興趣區域影像104。系統將感興趣區域102之影像,以及感興趣區域102以外的非感興趣區域104的影像,同時儲存,因此,其所佔系統之儲存空間最大。(1) Frame the position of the region of interest directly on the original image: as shown in FIG. 1 , which is a schematic diagram of an
(2) 如圖2所示,圖2為另一之示意圖。待測物影像200包含:感興趣區影像202,非感興趣區影像204以及黑底影像206。機器擷取感興趣區域影像202,接著,將感興趣區影像202貼在一張與待測物影像200相同尺寸的黑底影像206。方法(2)之儲存空間,雖然相較方法(1)要來得小, 但,方法(2)還需儲存黑底影像的像素資料之儲存空間。傳統之兩種表示方法,所占系統之儲存空間尚無法大幅減少。(2) As shown in Figure 2, Figure 2 is another schematic diagram. The
有鑑於此,本發明係提供一種機器視覺影像的儲存與表示方法及其系統,以解決先前技術的缺失。In view of this, the present invention provides a method and system for storing and representing machine vision images to solve the deficiencies of the prior art.
本發明之第一目的係提供一種機器視覺影像的儲存與表示方法,係包括:擷取待測物之待測物影像;偵測該待測物影像之感興趣區域以及非感興趣區域;擷取該感興趣區域之感興趣區域影像;顯示該感興趣區域影像,以及將該非感興趣區域以黑色顯示。The first object of the present invention is to provide a method for storing and representing machine vision images, which includes: capturing the image of the object under test; detecting the region of interest and the region of non-interest in the image of the object under test; capturing Get the ROI image of the ROI; display the ROI image, and display the non-ROI image in black.
本發明之第二目的係根據上述機器視覺影像的儲存與表示方法,其中,在顯示該感興趣區域影像,以及將該非感興趣區域以黑色顯示之步驟,包含:儲存該感興趣區域影像;讀取該感興趣區域影像,並顯示該感興趣區域影像;以及,將該非感興趣區域以黑色顯示。The second object of the present invention is based on the storage and representation method of the above-mentioned machine vision image, wherein the steps of displaying the image of the region of interest and displaying the region of non-interest in black include: storing the image of the region of interest; reading acquiring the ROI image and displaying the ROI image; and displaying the non-ROI image in black.
本發明之第三目的係根據上述機器視覺影像的儲存與表示方法,其中,在顯示該感興趣區域影像,以及將該非感興趣區域以黑色顯示之步驟,包含:儲存該感興趣區域影像;將該非感興趣區域以黑色顯示;以及,讀取該感興趣區域影像,並顯示該感興趣區域影像。The third object of the present invention is based on the storage and representation method of the above-mentioned machine vision image, wherein the steps of displaying the image of the region of interest and displaying the region of non-interest in black include: storing the image of the region of interest; The non-interest region is displayed in black; and, the image of the region of interest is read and the image of the region of interest is displayed.
本發明之第四目的係根據上述機器視覺影像的儲存與表示方法,其中,該待測物影像包含可交換圖檔格式資訊。The fourth object of the present invention is based on the above-mentioned method for storing and representing machine vision images, wherein the image of the object under test includes exchangeable graphic file format information.
本發明之第五目的係根據上述機器視覺影像的儲存與表示方法,其中,該可交換圖檔格式資訊包含影像資訊以及製造商註釋。The fifth object of the present invention is based on the above-mentioned method for storing and representing machine vision images, wherein the exchangeable image file format information includes image information and manufacturer's notes.
本發明之第六目的係根據上述機器視覺影像的儲存與表示方法,其中,該製造商註釋包含影像尺寸資訊以及影像座標資訊。The sixth object of the present invention is based on the above-mentioned method for storing and representing machine vision images, wherein the manufacturer's note includes image size information and image coordinate information.
為達上述目的或其他目的,本發明係提供一種機器視覺影像的儲存與表示系統,用以提供一使用者檢測待測物,包含:影像擷取單元,用以擷取該待測物之待測物影像;處理單元,連接該影像擷取單元,用以偵測該待測物影像中之感興趣區域與非感興趣區域,並擷取該感興趣區域之感興趣區域影像;以及,儲存單元,連接該處理單元,用以儲存該感興趣區域影像;以及,觀測單元,連接該處理單元,用以檢視該待測物之該感興趣域;其中, 該使用者藉由該觀測單元觀測該待測物時,該處理單元將該非感興趣區域以黑色顯示於該觀測單元,以及將該感興趣區域影像顯示於該觀測單元。In order to achieve the above purpose or other purposes, the present invention provides a machine vision image storage and representation system for providing a user to detect the object under test, including: an image capture unit for capturing the image of the object under test The image of the measured object; the processing unit is connected to the image capture unit to detect the region of interest and the region of non-interest in the image of the object to be measured, and capture the image of the region of interest of the region of interest; and, store a unit, connected to the processing unit, for storing the image of the region of interest; and an observation unit, connected to the processing unit, for viewing the region of interest of the object under test; wherein, the user observes the region of interest through the observation unit For the object under test, the processing unit displays the non-interest area in black on the observation unit, and displays the image of the interest area on the observation unit.
本發明此方面之第二目的係根據上述機器視覺影像的儲存與表示系統,其中,該待測物影像包含可交換圖檔格式資訊。The second object of this aspect of the present invention is based on the above-mentioned storage and representation system for machine vision images, wherein the image of the object under test includes exchangeable graphic file format information.
本發明此方面之第三目的係根據上述機器視覺影像的儲存與表示系統,其中,該可交換圖檔格式資訊包含影像資訊以及製造商註釋。The third object of this aspect of the present invention is according to the above machine vision image storage and representation system, wherein the exchangeable graphic format information includes image information and manufacturer's annotation.
本發明此方面之第四目的係根據上述機器視覺影像的儲存與表示系統,其中,該製造商註釋包含影像尺寸資訊以及影像座標資訊。The fourth object of this aspect of the present invention is according to the above-mentioned machine vision image storage and representation system, wherein the manufacturer note includes image size information and image coordinate information.
本發明此方面之第五目的係根據上述機器視覺影像的儲存與表示系統,其中,該影像資訊包含拍攝資訊,該拍攝資訊包含光圈值以及快門值。The fifth object of this aspect of the present invention is based on the above-mentioned machine vision image storage and representation system, wherein the image information includes shooting information, and the shooting information includes aperture value and shutter value.
相較於習知技術,本發明提供一種機器視覺影像的儲存與表示方法及其系統,藉由本發明的發明概念,可具有以下的優勢:能主要能避免習知技術在選擇訓練資料對訓練的諸多問題,例如訓練過程中的模型抖動而不利於模型的健壯性、不平衡資料、資料不足、過擬合等。Compared with the prior art, the present invention provides a method for storing and representing machine vision images and its system. With the inventive concept of the present invention, it can have the following advantages: it can mainly avoid the selection of training data for training in the prior art. Many problems, such as model jitter during training, are not conducive to the robustness of the model, unbalanced data, insufficient data, overfitting, etc.
為充分瞭解本發明之目的、特徵及功效,茲藉由下述具體之實施例,並配合所附之圖式,對本發明做一詳細說明,說明如後:In order to fully understand the purpose, features and effects of the present invention, the present invention will be described in detail through the following specific embodiments and accompanying drawings, as follows:
於本發明中,係使用「一」或「一個」來描述本文所述的單元、元件和組件。此舉只是為了方便說明,並且對本發明之範疇提供一般性的意義。因此,除非很明顯地另指他意,否則此種描述應理解為包括一個、至少一個,且單數也同時包括複數。In the present disclosure, "a" or "an" is used to describe the elements, elements and components described herein. This is done for convenience of description only and to provide a general sense of the scope of the invention. Accordingly, unless it is obvious that it is otherwise indicated, such description should be read to include one, at least one, and the singular also includes the plural.
於本文中,用語「包含」、「包括」、「具有」、「含有」或其他任何類似用語意欲涵蓋非排他性的包括物。舉例而言,含有複數要件的一元件、結構、製品或裝置不僅限於本文所列出的此等要件而已,而是可以包括未明確列出但卻是該元件、結構、製品或裝置通常固有的其他要件。除此之外,除非有相反的明確說明,用語「或」是指涵括性的「或」,而不是指排他性的「或」。As used herein, the terms "comprises", "including", "has", "containing" or any other similar terms are intended to cover a non-exclusive inclusion. For example, an element, structure, article, or device that contains a plurality of elements is not limited to those elements listed herein, but may include elements that are not explicitly listed but are generally inherent in the element, structure, article, or apparatus. other requirements. In addition, unless expressly stated to the contrary, the word "or" means an inclusive "or" and not an exclusive "or".
請參照圖3、圖4A以及圖4B,其中,圖3為本發明一實施例所示之機器視覺影像的儲存與表示方法的流程圖。圖4A為本發明待測物之示意圖。圖4B為本發明待測物影像之示意圖。Please refer to FIG. 3 , FIG. 4A and FIG. 4B , wherein FIG. 3 is a flowchart of a method for storing and representing machine vision images according to an embodiment of the present invention. Fig. 4A is a schematic diagram of the analyte of the present invention. FIG. 4B is a schematic diagram of an image of the object to be tested in the present invention.
如圖4A所示,顯示待測物O包含:感興趣區域R 1,以及非感興趣區域R 2。 As shown in FIG. 4A , the analyte O includes: a region of interest R 1 and a region of non-interest R 2 .
如圖4B所示,待測物影像V o包含感興趣區域影像V R1,以及非感興趣區域影像V R2。 As shown in FIG. 4B , the object image V o includes the ROI image V R1 and the non-ROI image V R2 .
本發明一實施例中,感興趣區域影像Vo的儲存與表示方法包括:步驟S31至步驟S38,如圖3所示。In one embodiment of the present invention, the method for storing and representing the ROI image Vo includes: Step S31 to Step S38, as shown in FIG. 3 .
在步驟S31,擷取待測物O之待測物影像V o。如圖4A、圖4B所示。本實施例之待測物,係以一晶圓為例,該晶圓上以製作有電路。需說明的是,本發明之感興趣區域影像V R1的儲存與表示方法可適用於各種待測物,並不以本實施例之晶圓為限,待測物亦可為印刷電路板、立體之機械結構、電路布局圖。 In step S31, the object image V o of the object O is captured. As shown in Figure 4A and Figure 4B. The object to be tested in this embodiment is a wafer as an example, and circuits are fabricated on the wafer. It should be noted that the storage and representation method of the region of interest image V R1 of the present invention can be applied to various objects to be measured, and is not limited to the wafer in this embodiment. The object to be measured can also be a printed circuit board, a three-dimensional The mechanical structure and circuit layout diagram.
步驟S32,偵測待測物影像V o之中感興趣區域R 1以及非感興趣區域R 2。待測物影像V o包含可交換圖檔格式資訊(Exchangeable image file format, Exif)。可交換圖檔格式資訊為專門為數位相機的相片設定的檔案格式,可以記錄數位相片的屬性資訊和拍攝資料。可交換圖檔格式資訊係附加於JPEG、TIFF、RIFF等檔案之中,為其增加有關數位相機拍攝資訊的內容和索引圖或圖像處理軟體的版本資訊。可交換圖檔格式資訊包含例如:影像資訊以、製造商註釋、曝光時間、光圈值及圖像解析度等。需說明的是,製造商註釋包含影像尺寸資訊以及影像座標資訊。 Step S32, detecting the region of interest R 1 and the region of non-interest R 2 in the object image V o . The DUT image V o includes Exchangeable image file format (Exif). The Exchangeable Graphics Format information is a file format specially set for digital camera photos, which can record attribute information and shooting data of digital photos. Exchangeable picture file format information is appended to JPEG, TIFF, RIFF and other files to add content related to digital camera shooting information and index images or version information of image processing software. The Exchangeable Graphics Format information includes, for example, image information, manufacturer's notes, exposure time, aperture value, and image resolution. It should be noted that the manufacturer's note includes image size information and image coordinate information.
根據所擷取之待測物影像V o,搭配上人工智慧技術,偵測待測物O上有瑕疵區域之邊緣,並將該瑕疵區域標示出來,以成為至少一感興趣區域R 1。相對於待測物O之感興趣區域R 1,其他區域則定義為非感興趣區域R 2。需說明的是,假設良率高於正常標準之下,即瑕疵數相對較少之情況,感興趣區域R 1相對於非感興趣區域R 2,通常範圍小很多。本發明之感興趣區域R 1之數目為至少一個,本實施例僅以一個感興趣區域做說明,本發明之範圍不以此實施例一個感興趣區域為限。 According to the captured image V o of the object under test, the artificial intelligence technology is used to detect the edge of the defective area on the object under test O, and mark the defective area to become at least one region of interest R 1 . Relative to the region of interest R 1 of the object O, other regions are defined as regions of non-interest R 2 . It should be noted that, assuming that the yield rate is higher than the normal standard, that is, the number of defects is relatively small, the area of interest R 1 is generally much smaller than the non-interest area R 2 . The number of ROIs R 1 in the present invention is at least one. This embodiment only uses one ROI for illustration, and the scope of the present invention is not limited to one ROI in this embodiment.
步驟S33,由於,我們對於感興趣區域R 1即瑕疵區域比較有興趣。因此,擷取感興趣區域R 1之感興趣區域影像V R1。 Step S33, because we are more interested in the region of interest R 1 , that is, the defect region. Therefore, the ROI image V R1 of the ROI R 1 is captured.
步驟S34,儲存感興趣區域影像V R1。 Step S34, storing the ROI image V R1 .
步驟S35,讀取感興趣區域影像V R1,顯示感興趣區域影像V R1。。 Step S35 , read the ROI image VR1 and display the ROI image VR1 . .
步驟S36, 將非感興趣區域R 2以黑色顯示,成為非感興趣區域影像V R2。最終,即可同時顯示感興趣區域影像V R1以及黑色的非感興趣區域影像V R2。 In step S36, the non-interest region R2 is displayed in black to become the non-interest region image V R2 . Finally, the ROI image VR1 and the black non-ROI image VR2 can be displayed simultaneously.
於另一實施例中,本發明亦可 在步驟S34之後,執行步驟S37,將非感興趣區域以黑色顯示。以及,步驟S38,讀取感興趣區域影像V R1,並顯示該感興趣區域影像。最終即可同於顯示感興趣區域影像V R1以及黑色的非感興趣區域影像V R2,如圖4B所示。 In another embodiment, the present invention may also execute step S37 after step S34 to display the non-interest region in black. And, step S38 , read the ROI image V R1 , and display the ROI image. Finally, the ROI image V R1 and the black non-ROI image VR2 can be displayed simultaneously, as shown in FIG. 4B .
由於,我們需要的是,藉由本發明之方法,僅需將瑕疵區域(即感興趣區域R 1)之影像顯示出來,而非感興趣區域R 2,在不需要的情況下,以黑色顯示。藉由此顯示結果,可凸顯瑕疵區域(即感興趣區域R 1)之影像,更方便觀看瑕疵區域之影像。 Because, what we need is that, with the method of the present invention, only the image of the defective region (ie, the region of interest R 1 ) needs to be displayed, and the non-region of interest R 2 is displayed in black when it is not needed. By displaying the result, the image of the defective area (ie, the region of interest R 1 ) can be highlighted, making it easier to view the image of the defective area.
在本實施例中,由於僅需儲存一個感興趣區域R 1之感興趣區域影像V R1。感興趣區域R 1由於面積遠小於待測物O。因此,相對於儲存整個待測物O之待測物影像V o,儲存待測物影像V o之檔案大小,相對於儲存感興趣區域影像V R1減少很多。本發明之感興趣區域影像V R1的儲存與表示方法即可減少儲存空間,且減少影像處理之計算量。 In this embodiment, only one ROI image V R1 of the ROI R 1 needs to be stored. The area of interest R 1 is much smaller than the object O to be measured. Therefore, compared to storing the entire object O image V o , the file size of storing the image V o of the object O is greatly reduced compared to storing the image V R1 of the region of interest. The storage and representation method of the ROI image VR1 of the present invention can reduce the storage space and reduce the calculation amount of the image processing.
圖5為本發明一實施例所示之感興趣區域影像的儲存與表示系統方塊圖。請參考圖5,感興趣區域影像的儲存與表示系統500包括影像擷取單元510、處理單元520、觀測單元530以及儲存單元540。使用者藉由感興趣區域影像的儲存與表示系統500之輔助,以偵測待測物O中之之瑕疵。FIG. 5 is a block diagram of a system for storing and displaying ROI images according to an embodiment of the present invention. Please refer to FIG. 5 , the ROI image storage and
如圖4A、圖4B所示。本實施例之待測物,係以一晶圓為例,該晶圓上以製作有電路。需說明的是,本發明之感興趣區域影像Vo的儲存與表示方法可適用於各種待測物,並不以本實施例之晶圓為限,待測物亦可為印刷電路板、立體之機械結構、電路布局圖。As shown in Figure 4A and Figure 4B. The object to be tested in this embodiment is a wafer as an example, and circuits are fabricated on the wafer. It should be noted that the storage and representation method of the region of interest image Vo of the present invention can be applied to various objects to be tested, and is not limited to the wafer in this embodiment. The object to be tested can also be a printed circuit board, a three-dimensional Mechanical structure, circuit layout diagram.
影像擷取單元510用以擷取待測物O之待測物影像Vo。待測物影像Vo包含可交換圖檔格式資訊(Exchangeable image file format, Exif)。可交換圖檔格式資訊為專門為數位相機的相片設定的檔案格式,可以記錄數位相片的屬性資訊和拍攝資料。可交換圖檔格式資訊係附加於JPEG、TIFF、RIFF等檔案之中,為其增加有關數位相機拍攝資訊的內容和索引圖或圖像處理軟體的版本資訊。可交換圖檔格式資訊包含例如:影像資訊以、製造商註釋曝光時間、光圈值及圖像解析度等。需說明的是,製造商註釋包含影像尺寸資訊以及影像座標資訊。The
本發明之影像擷取單元510擷取待測物O之待測物影像Vo。處理單元520連接影像擷取單元510。處理單元520偵測待測物影像Vo中之感興趣區域R
1與非感興趣區域R
2,並擷取感興趣區域R
1之感興趣區域影像V
R1。由於,我們對於感興趣區域R
1即瑕疵區域比較有興趣。因此,處理單元520偵測待測物影像Vo中之感興趣區域R
1,擷取感興趣區域R
1之感興趣區域影像V
R1。將感興趣區域影像V
R1儲存於儲存單元540中。處理單元520讀取感興趣區域影像V
R1,並將感興趣區域影像V
R1顯示於觀測單元530中。處理單元520將非感興趣區域R
2以黑色顯示,成為非感興趣區域影像V
R2。最終,使用者藉由觀測單元530即可看到同時顯示感興趣區域影像V
R1以及黑色的非感興趣區域影像V
R2,如圖4B所示。
The
使用者藉由觀測單元530觀測待測物O時,處理單元520將非感興趣區域R
2以黑色顯示於觀測單元530,以及將感興趣區域影像V
R1顯示於該觀測單元530中,最終即同時出顯示感興趣區域影像V
R1於黑色背景中之影像,如圖4B所示。使用者藉由觀察觀測單元530之輔助,可以很容易發現待測物O中之瑕疵區域(即感興趣區域R
1),並且減少儲存之空間,以及額外處理非感興趣區域影像之數據計算處理。
When the user observes the object O through the
於另一實施例中,本發明亦可影像擷取單元510擷取待測物O之待測物影像Vo。處理單元520連接影像擷取單元510。處理單元520偵測待測物影像Vo中之感興趣區域R
1與非感興趣區域R
2,並擷取感興趣區域R
1之感興趣區域影像V
R1。由於,我們對於感興趣區域R
1即瑕疵區域比較有興趣。因此,處理單元520偵測待測物影像Vo中之感興趣區域R
1,擷取感興趣區域R
1之感興趣區域影像V
R1。將感興趣區域影像V
R1儲存於儲存單元540中。處理單元520讀取感興趣區域影像V
R1,並將感興趣區域影像V
R1顯示於觀測單元530中。處理單元520將非感興趣區域R
2以黑色顯示,成為黑色之非感興趣區域影像V
R2。非感興趣區域影像V
R2儲存於儲存單元540。處理單元520讀取儲存單元540中之感興趣區域影像V
R1,以及非感興趣區域影像V
R2,並顯示該感興趣區域影像。最終即可同於顯示感興趣區域影像V
R1以及黑色的非感興趣區域影像V
R2,如圖4B所示。
In another embodiment, in the present invention, the
本發明在上文中已以較佳實施例揭露,然熟習本項技術者應理解的是,該實施例僅用於描繪本發明,而不應解讀為限制本發明之範圍。應注意的是,舉凡與該實施例等效之變化與置換,均應設為涵蓋於本發明之範疇內。因此,本發明之保護範圍當以申請專利範圍所界定者為準。The present invention has been disclosed above with preferred embodiments, but those skilled in the art should understand that the embodiments are only used to describe the present invention, and should not be construed as limiting the scope of the present invention. It should be noted that all changes and substitutions equivalent to the embodiment should be included in the scope of the present invention. Therefore, the scope of protection of the present invention should be defined by the scope of the patent application.
S31、S32、S33、S34、S35、S36、S37、S38:步驟 100:待測物影像 102:感興趣區域 104:非感興趣區域影像 200:待測物影像 202:感興趣區影像 204:非感興趣區影像 206:黑底影像 500:機器視覺影像的儲存與表示系統 510:影像擷取單元 520:處理單元 530:觀測單元 540:儲存單元 O:待測物 V o:待測物影像 V R1:感興趣區域影像 V R2:非感興趣區域影像 R 1:感興趣區域 R 2:非感興趣區域 S31, S32, S33, S34, S35, S36, S37, S38: step 100: object image 102: region of interest 104: non-interest region image 200: object image 202: region of interest image 204: non- Region of interest image 206: black background image 500: storage and representation system of machine vision image 510: image capture unit 520: processing unit 530: observation unit 540: storage unit O: object under test V o : object under test image V R1 : Region of interest image V R2 : Region of non-interest image R1 : Region of interest R2 : Region of non-interest
圖1是待測物影像之示意圖; 圖2為另一待測物影像之示意圖; 圖3為本發明一實施例所示之機器視覺影像的儲存與表示方法的流程圖; 圖4A為本發明待測物示意圖; 圖4B為本發明待測物影像示意圖; 圖5為本發明一實施例所示之機器視覺影像的儲存與表示系統方塊圖。 Figure 1 is a schematic diagram of the image of the object under test; Figure 2 is a schematic diagram of another image of the object under test; 3 is a flow chart of a method for storing and representing machine vision images shown in an embodiment of the present invention; Fig. 4A is a schematic diagram of the object to be tested in the present invention; FIG. 4B is a schematic diagram of an image of the object to be tested in the present invention; FIG. 5 is a block diagram of a storage and presentation system for machine vision images shown in an embodiment of the present invention.
S31、S32、S33、S34、S35、S36、S37、S38:步驟 S31, S32, S33, S34, S35, S36, S37, S38: steps
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW110136978A TW202316369A (en) | 2021-10-05 | 2021-10-05 | Storage and representation method of machine vision image and system thereof wherein the method includes displaying a non-region of interest image in black |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW110136978A TW202316369A (en) | 2021-10-05 | 2021-10-05 | Storage and representation method of machine vision image and system thereof wherein the method includes displaying a non-region of interest image in black |
Publications (1)
Publication Number | Publication Date |
---|---|
TW202316369A true TW202316369A (en) | 2023-04-16 |
Family
ID=86943164
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110136978A TW202316369A (en) | 2021-10-05 | 2021-10-05 | Storage and representation method of machine vision image and system thereof wherein the method includes displaying a non-region of interest image in black |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW202316369A (en) |
-
2021
- 2021-10-05 TW TW110136978A patent/TW202316369A/en unknown
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200423276A (en) | Reading apparatus of probe trace and reading method of probe trace | |
CN101335832B (en) | Image processing device and image processing method | |
US8238640B2 (en) | Display testing apparatus and method | |
US20140184778A1 (en) | Image processing apparatus, control method for the same, image processing system, and program | |
JP2011244046A (en) | Imaging apparatus, image processing method, and program storage medium | |
CN109951635A (en) | It takes pictures processing method, device, mobile terminal and storage medium | |
CN115797359B (en) | Detection method, equipment and storage medium based on solder paste on circuit board | |
WO2022017197A1 (en) | Intelligent product quality inspection method and apparatus | |
TW200908017A (en) | Structure visual inspection apparatus and inspection method therefor | |
JP2018175366A5 (en) | ||
TWI651644B (en) | Mobile device, method for mobile device, and non-transitory computer readable storage medium | |
TW202316369A (en) | Storage and representation method of machine vision image and system thereof wherein the method includes displaying a non-region of interest image in black | |
CN116993654B (en) | Camera module defect detection method, device, equipment, storage medium and product | |
TWM621960U (en) | Machine vision image storage and presentation system | |
KR101663226B1 (en) | Digital image processing apparatus and digital image processing method | |
JP4373038B2 (en) | Measurement program | |
JP2008014857A (en) | Device, method, and program for acquiring coordinate for inspection of printed board | |
TWI522888B (en) | Electronic device and method for viewing image thereof | |
TW201522949A (en) | Inspection method for image data | |
TWI714924B (en) | Method for identifying pointer of analog meter and image capture apparatus | |
JP2005045194A (en) | Probe-mark reader and probe-mark reading method | |
TWI765587B (en) | Intelligent imaging and measurement system and method | |
CN107426497A (en) | The method, apparatus and computer-readable recording medium of a kind of recording image | |
JP2010187119A (en) | Image capturing apparatus, and program for the same | |
JPH1188732A (en) | Solid-state image pickup camera |