TW202304259A - Inter-period control for passive power distribution of multiple electrode inductive plasma source - Google Patents

Inter-period control for passive power distribution of multiple electrode inductive plasma source Download PDF

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TW202304259A
TW202304259A TW111104933A TW111104933A TW202304259A TW 202304259 A TW202304259 A TW 202304259A TW 111104933 A TW111104933 A TW 111104933A TW 111104933 A TW111104933 A TW 111104933A TW 202304259 A TW202304259 A TW 202304259A
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plasma
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impedance
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吉狄翁 封扎爾
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新加坡商Aes 全球公司
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/46Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • H05H1/4645Radiofrequency discharges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/32174Circuits specially adapted for controlling the RF discharge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32917Plasma diagnostics
    • H01J37/32935Monitoring and controlling tubes by information coming from the object and/or discharge
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/38Impedance-matching networks
    • H03H7/40Automatic matching of load impedance to source impedance
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/38Impedance-matching networks

Abstract

A generator produces output such as delivered power, voltage, current, forward power etc. that follows a prescribed pattern of output versus time where the pattern repeats with a repetition period by controlling sections of the pattern based on measurements taken one or more repetition periods in the past. A variable impedance match network may control the impedance presented to a radio frequency generator while the generator produces the output that follows the prescribed pattern of output versus time where the pattern repeats with a repetition period by controlling variable impedance elements in the match during sections of the pattern based on measurements taken one or more repetition periods in the past.

Description

用於多電極感應電漿源的被動功率分配之週期間控制Intercycle Control of Passive Power Distribution for Multi-Electrode Inductive Plasma Sources

本揭示內容之態樣係關於用於控制功率遞送系統,且特定言之用於控制電漿功率遞送系統的改良方法及系統。Aspects of the present disclosure relate to improved methods and systems for controlling power delivery systems, and in particular for controlling plasma power delivery systems.

本專利申請案係處於申請中的於2020年12月6日申請之題為「INTER-PERIOD CONTROL SYSTEM FOR PLASMA POWER DELIVERY SYSTEM AND METHOD OF OPERATING THE SAME」的第17/113,088號專利申請案之部分接續申請案,該處於申請中的專利申請案係於2018年7月5日申請且於2020年12月8日經頒予為第10,861,677號美國專利之題為「INTER-PERIOD CONTROL SYSTEM FOR PLASMA POWER DELIVERY SYSTEM AND METHOD OF OPERATING THE SAME」的第16/028,131號專利申請案之接續案,其依據35 U.S.C. § 119(e)主張於2017年7月7日申請之題為「INTER-PERIOD CONTROL SYSTEM FOR PLASMA POWER DELIVERY SYSTEM AND METHOD OF OPERATING THE SAME」的第62/529,963號美國專利申請案之優先權。這些申請案及專利經讓渡給受讓人且特此以引用方式明確地併入本文中。This patent application is a continuation in part of the pending patent application No. 17/113,088 filed on December 6, 2020, entitled "INTER-PERIOD CONTROL SYSTEM FOR PLASMA POWER DELIVERY SYSTEM AND METHOD OF OPERATING THE SAME" application, the pending patent application was filed on July 5, 2018 and issued on December 8, 2020 as U.S. Patent No. 10,861,677 entitled "INTER-PERIOD CONTROL SYSTEM FOR PLASMA POWER DELIVERY Continuation of Patent Application No. 16/028,131, filed under 35 U.S.C. § 119(e), entitled "INTER-PERIOD CONTROL SYSTEM FOR PLASMA" filed on July 7, 2017, for SYSTEM AND METHOD OF OPERATING THE SAME POWER DELIVERY SYSTEM AND METHOD OF OPERATING THE SAME" US Patent Application No. 62/529,963 priority. These applications and patents are assigned to the assignee and are hereby expressly incorporated herein by reference.

電漿處理系統用於使用諸如化學氣相沈積(CVD)及物理氣相沈積(PVD)之製程將薄膜沈積在基板上,亦使用蝕刻製程自基板移除膜。電漿通常藉由將射頻(RF)或直流(DC)產生器耦接至電漿腔室而產生,該電漿腔室填充有在低壓下注射至電漿腔室中之氣體。在一些情況下,RF產生器耦接至在產生器輸出處可將電漿阻抗與典型地為50 Ω之所要阻抗進行匹配之可變阻抗匹配網路。典型地,產生器將RF功率遞送至電漿腔室中之天線或電極,且在天線處遞送之功率點火且維持電漿。在一些實施方案中,感應線圈天線纏繞於反應性腔室周圍且由RF功率主動地驅動,以便促使腔室中之電漿的點火(及維持)。已開發出利用單個產生器來驅動兩個線圈天線之系統。在這些系統中,產生器典型地耦接(例如,經由RF匹配)至第一線圈且串聯電容器將第一線圈耦接至第二線圈,使得兩個線圈均由產生器主動地驅動(例如,經由RF阻抗匹配主動地驅動)。產生器單獨或產生器結合諸如阻抗匹配網路、耦接至相同電漿之其他產生器、電纜等之其他件裝備構成電漿功率遞送系統。Plasma processing systems are used to deposit thin films on substrates using processes such as chemical vapor deposition (CVD) and physical vapor deposition (PVD), and also to remove films from substrates using etching processes. Plasma is typically generated by coupling a radio frequency (RF) or direct current (DC) generator to a plasma chamber filled with gas injected into the plasma chamber at low pressure. In some cases, the RF generator is coupled to a variable impedance matching network that can match the plasma impedance to a desired impedance, typically 50Ω, at the output of the generator. Typically, a generator delivers RF power to an antenna or electrode in the plasma chamber, and the power delivered at the antenna ignites and sustains the plasma. In some implementations, an induction coil antenna is wrapped around the reaction chamber and is actively driven by RF power to facilitate ignition (and maintenance) of the plasma in the chamber. Systems have been developed that utilize a single generator to drive two coil antennas. In these systems, a generator is typically coupled (e.g., via RF matching) to a first coil and a series capacitor couples the first coil to a second coil such that both coils are actively driven by the generator (e.g., actively driven via RF impedance matching). Generators alone or in combination with other pieces of equipment such as impedance matching networks, other generators coupled to the same plasma, cables, etc. constitute a plasma power delivery system.

通常需要調變遞送至電漿系統之功率。重複大多數調變方案,亦即,以波形重複率重複相同調變波形。相關聯之波形重複週期等於一除以波形重複率。使用傳統控制方案遵循規定調變波形之能力需要來自控制器且最終來自量測系統之高頻寬。許多電漿系統具有以不同頻率施加至電漿之功率。電漿負載之非線性性質產生可干擾產生器之量測系統的互調產物。因此,有時有利的係使用窄頻帶量測系統來限制此類干擾。在許多應用中,遞送至電漿負載之功率並非受控制之唯一參數。舉例而言,在RF功率遞送系統中,可經由控制產生器輸出之頻率或經由控制產生器與電漿負載之間的可變阻抗匹配網路來控制由電漿負載呈現至產生器之阻抗。在一些情況下,亦可控制產生器源極阻抗。基於上述各種問題,追蹤及控制功率呈現出更大控制挑戰。It is often desirable to modulate the power delivered to the plasma system. Most modulation schemes are repeated, that is, the same modulated waveform is repeated at the waveform repetition rate. The associated waveform repetition period is equal to one divided by the waveform repetition rate. The ability to follow a prescribed modulated waveform using conventional control schemes requires high bandwidth from the controller and ultimately from the measurement system. Many plasma systems have power applied to the plasma at different frequencies. The nonlinear nature of the plasma load produces intermodulation products that can interfere with the generator's measurement system. Therefore, it is sometimes advantageous to use narrowband measurement systems to limit such interference. In many applications, the power delivered to the plasma load is not the only parameter that is controlled. For example, in an RF power delivery system, the impedance presented by the plasma load to the generator can be controlled by controlling the frequency of the generator output or by controlling a variable impedance matching network between the generator and the plasma load. In some cases, the generator source impedance can also be controlled. Based on the above-mentioned problems, tracking and controlling power presents greater control challenges.

思及上述觀察結果,構想出本揭示內容之態樣。With the above observations in mind, an aspect of this disclosure is conceived.

在下文中概括圖式中所展示之本發明之例示性實施例。這些及其他實施例更充分地描述於實施方式章節中。然而,應瞭解,並不意欲將本發明限制於此發明內容或實施方式中所描述之形式。所屬技術領域中具有通常知識者可認識到存在落入如申請專利範圍中所表述之本發明精神及範圍內的許多修改、等效物及替代構造。Exemplary embodiments of the invention shown in the drawings are summarized below. These and other embodiments are described more fully in the Embodiments section. It should be understood, however, that there is no intention to limit the invention to the forms described in this Summary or Examples. Those skilled in the art will recognize that there are many modifications, equivalents and alternative constructions that fall within the spirit and scope of the invention as expressed in the claims.

根據一個實施例,一產生器產生遵循輸出相對於時間之一規定型樣的諸如遞送功率、電壓、電流、前向功率等之輸出,其中該型樣藉由基於在過去一或多個重複週期所進行之量測而控制該型樣之區段來以一重複週期重複。在一個實例中,一功率遞送系統涉及產生一重複輸出型樣之一產生器,且一控制元件基於在一當前週期之前的一週期進行之該重複型樣之一值的一量測而控制該重複型樣。該控制元件可進一步基於在該當前週期之前的一週期所進行之該重複型樣之該量測結合在一當前週期期間的該重複型樣之一值的一量測來控制該重複輸出型樣。該重複輸出型樣可遵循輸出相對於時間之一規定型樣,其中該規定型樣以一重複週期重複,且其中在該當前週期之前的一週期所進行之該重複型樣之該值的該量測發生在過去一或多個重複週期。According to one embodiment, a generator produces an output such as delivered power, voltage, current, forward power, etc. that follows a prescribed pattern of output versus time, wherein the pattern is determined by Measurements are made to control segments of the pattern to repeat with a repetition period. In one example, a power delivery system involves a generator that produces a repetitive output pattern, and a control element controls the Repeat pattern. The control element may further control the repeating output pattern based on the measurement of the repeating pattern taken in a cycle preceding the current cycle in combination with a measurement of a value of the repeating pattern during a current cycle . The repeating output pattern may follow a prescribed pattern of output versus time, wherein the prescribed pattern repeats at a repeating period, and wherein the value of the repeating pattern for a period preceding the current period Measurements occurred over one or more repetition periods in the past.

根據又一實施例,一可變阻抗匹配網路控制呈現給一RF產生器之阻抗,同時該產生器產生遵循輸出相對於時間之一規定型樣的諸如遞送功率、電壓、電流、前向功率等之輸出,其中該型樣藉由基於在過去一或多個重複週期所進行之量測而控制在該型樣之區段期間處於匹配中的可變阻抗元件來以一重複週期重複。在各種可能實施例中,該產生器可將該遞送功率、電壓、電流、前向功率等提供至一電漿系統,以便點火且維持一電漿。According to yet another embodiment, a variable impedance matching network controls the impedance presented to an RF generator while the generator generates power such as delivered power, voltage, current, forward power, etc. following a prescribed pattern of output versus time. etc., wherein the pattern is repeated for a repetition period by controlling the variable impedance elements in matching during segments of the pattern based on measurements made over one or more past repetition periods. In various possible embodiments, the generator may provide the delivered power, voltage, current, forward power, etc. to a plasma system in order to ignite and maintain a plasma.

根據又一實施例,一產生器產生遵循輸出相對於時間之一規定型樣的輸出,其中該型樣藉由基於在過去一或多個重複週期所進行之量測而控制該型樣之區段且將此控制器與一週期內控制器組合來以一重複週期重複,該週期內控制器基於在過去小於一重複週期所進行之量測而計算該控制輸出。According to yet another embodiment, a generator produces an output that follows a prescribed pattern of output versus time, wherein the pattern is controlled by a region of the pattern based on measurements made over one or more past repetitions. segment and repeats with a repeating period by combining the controller with an inter-period controller that calculates the control output based on measurements taken in the past less than one repeating period.

根據又一實施例,一可變阻抗匹配網路控制呈現給一RF產生器之阻抗,同時該產生器產生遵循輸出相對於時間之一規定型樣的諸如遞送功率、電壓、電流、前向功率等之輸出,其中該型樣藉由基於在過去一或多個重複週期所進行之量測而控制在該型樣之區段期間處於匹配中的可變阻抗元件且將此控制器與一週期內控制器組合來以一重複週期重複,該週期內控制器基於在過去小於一重複週期所進行之量測而計算處於該匹配中之該些可變阻抗元件的控制。According to yet another embodiment, a variable impedance matching network controls the impedance presented to an RF generator while the generator generates power such as delivered power, voltage, current, forward power, etc. following a prescribed pattern of output versus time. etc., wherein the pattern is controlled by controlling a variable impedance element in matching during a segment of the pattern based on measurements made over one or more past repetitions and combining the controller with a cycle The inner controller is combined to repeat with a repetition period in which the controller calculates the control of the variable impedance elements in the matching based on measurements taken in the past less than one repetition period.

根據另一實施例,一產生器產生遵循輸出相對於時間之一規定型樣的輸出,其中該型樣藉由以下來以一重複週期重複:基於在過去一或多個重複週期所進行之量測而控制該型樣之區段,同時調整另一參數,諸如產生器輸出頻率或基於在過去一或多個重複週期所進行之量測而控制在該產生器中或耦接於該產生器與該電漿之間的一可變阻抗匹配網路中所含有之可變阻抗元件,其中呈現給該產生器的諸如功率控制及產生器頻率等控制輸入與諸如遞送功率及阻抗等控制輸出之間的相關性經判定且供控制系統使用。According to another embodiment, a generator produces output that follows a prescribed pattern of output versus time, wherein the pattern repeats in a repetition period by: based on the amount performed over one or more repetition periods in the past control a segment of the pattern by measuring it while adjusting another parameter such as the generator output frequency or control in or coupled to the generator based on measurements made over one or more past repetitions A variable impedance element contained in a variable impedance matching network to the plasma where control inputs such as power control and generator frequency are presented to the generator in relation to control outputs such as delivered power and impedance Correlations between are determined and used by the control system.

根據又一實施例,一產生器產生遵循輸出相對於時間之一規定型樣的輸出,其中該型樣藉由以下來以一重複週期重複:基於在過去一或多個重複週期對該型樣之一區段進行之量測而控制該相同區段;以及藉由擾動該控制輸入、判定對該擾動的響應及使用對該擾動之響應來補償波形中相鄰或緊密定位時段之間的耦接來控制對該型樣中之其他區段的此類量測。According to yet another embodiment, a generator produces output that follows a prescribed pattern of output versus time, wherein the pattern repeats at a repetition period by: and controlling a measurement made by a segment of the same segment; and compensating for coupling between adjacent or closely located segments in the waveform by perturbing the control input, determining the response to the perturbation, and using the response to the perturbation. Such measurements for other segments in the model are then controlled.

本揭示內容的一個實施例可表徵為一種用於控制一處理腔室中之電漿之空間分配的系統。在此實施例中,該系統包括:一初級電感器,其安置為在功率主動地施加至該初級電感器時激發該電漿;至少一個次級電感器,其接近該初級電感器而定位以使得穿過該次級電感器之實質上所有電流由經由該電漿與該初級電感器的互感產生;以及至少一個端接元件,其耦接至該至少一個次級電感器,該至少一個端接元件影響穿過該至少一個次級電感器之該電流以便影響該電漿之該空間分配。One embodiment of the present disclosure may be characterized as a system for controlling the spatial distribution of plasma in a processing chamber. In this embodiment, the system includes: a primary inductor positioned to excite the plasma when power is actively applied to the primary inductor; at least one secondary inductor positioned proximate to the primary inductor to such that substantially all of the current passing through the secondary inductor is generated by mutual inductance through the plasma with the primary inductor; and at least one termination element coupled to the at least one secondary inductor, the at least one terminal A connecting element affects the current through the at least one secondary inductor to affect the spatial distribution of the plasma.

另一實施例可表徵為一種用於控制包括一初級電感器及N個次級電感器之一處理腔室中的電漿之一空間分配的方法。該方法包括:藉由該初級電感器在該處理腔室中激發該電漿;經由該電漿將該初級電感器以感應方式耦接至N個次級電感器中之每一者,其中N等於或大於一;以及端接該N個次級電感器中之每一者,使得穿過該N個次級電感器中之每一者的實質上所有電流由經由該電漿與該初級電感器之互感產生,穿過該N個次級電感器中之每一者的該電流影響該電漿之該空間分配。Another embodiment may be characterized as a method for controlling a spatial distribution of plasma in a processing chamber comprising a primary inductor and N secondary inductors. The method includes: exciting the plasma in the processing chamber with the primary inductor; inductively coupling the primary inductor to each of N secondary inductors via the plasma, where N equal to or greater than one; and terminating each of the N secondary inductors such that substantially all current through each of the N secondary inductors is routed through the plasma and the primary inductor Generated by mutual inductance of the inductors, the current through each of the N secondary inductors affects the spatial distribution of the plasma.

本揭示內容的又一實施例可表徵為一種用於控制一處理腔室中之電漿之空間分配的設備。該設備包括:一初級端子,其經組態以耦接至該電漿處理腔室之一初級電感器且主動地將功率施加至該初級電感器;一次級端子,其經組態以耦接至該電漿處理腔室之一對應次級電感器;以及一端接元件,其耦接至該次級端子,該端接元件安置為提供路徑以供電流流過該次級感應組件,其中穿過該次級電感器及該端接元件之實質上所有電流由經由該電漿與該初級電感器的互感產生。Yet another embodiment of the present disclosure can be characterized as an apparatus for controlling the spatial distribution of plasma in a processing chamber. The apparatus includes: a primary terminal configured to couple to a primary inductor of the plasma processing chamber and actively apply power to the primary inductor; a secondary terminal configured to couple to to a corresponding secondary inductor of the plasma processing chamber; and a terminating element coupled to the secondary terminal, the terminating element being arranged to provide a path for current to flow through the secondary inductive component, wherein the Substantially all of the current through the secondary inductor and the terminating element is generated by mutual inductance through the plasma and the primary inductor.

分佈式感應電極之週期間控制Periodic Control of Distributed Sensing Electrodes

本揭示內容之實施例提供一種電漿功率遞送系統,其產生遵循輸出相對於時間之規定型樣的諸如遞送功率、電壓、電流以及前向功率之輸出,其中該型樣藉由基於在過去一或多個重複週期而非當前週期內所進行之量測而控制該型樣之區段來以重複週期重複。相比於習知控制器,此類週期間控制器可利用較低頻寬量測及控制系統更準確地再產生輸出。在各種情況下,包括在存在電漿產生之混合及互調產物的情況下,由週期間控制器提供之益處可為有利的。在額外實施例中,週期間控制器可與習知週期內控制器組合。在額外實施例中,可基於在過去一或多個重複週期所進行之量測而將諸如產生器輸出頻率之參數與主輸出一起調整,其中諸如功率控制及產生器頻率等控制輸入與諸如呈現給產生器之遞送功率及阻抗等控制輸出之間的相關性經判定且供控制系統使用。在額外實施例中,產生器產生遵循輸出相對於時間之規定型樣的輸出,其中該型樣藉由以下來以重複週期重複:基於在過去一或多個重複週期對該型樣之區段進行之量測而控制該相同區段;以及藉由擾動該控制輸入、判定對該擾動的響應及使用對該擾動之響應來補償波形中相鄰或緊密定位時段之間的耦接來控制對該型樣中之其他區段的此類量測。Embodiments of the present disclosure provide a plasma power delivery system that produces outputs such as delivered power, voltage, current, and forward power that follow a prescribed profile of output versus time, wherein the profile is obtained by or multiple repetition periods other than the measurements made during the current period to control the segment of the pattern to repeat with a repetition period. Such inter-cycle controllers can utilize lower bandwidth measurement and control systems to more accurately reproduce the output than conventional controllers. The benefits provided by the inter-cycle controller may be beneficial in various circumstances, including in the presence of plasma-generated mixing and intermodulation products. In additional embodiments, the inter-cycle controller may be combined with conventional in-cycle controllers. In additional embodiments, parameters such as generator output frequency can be adjusted along with the main output based on measurements taken over one or more past repetitions, where control inputs such as power control and generator frequency are correlated with parameters such as presenting Correlations between control outputs such as delivered power and impedance to the generator are determined and used by the control system. In an additional embodiment, the generator produces an output that follows a prescribed pattern of output versus time, wherein the pattern repeats in a repetition period by: based on a segment of the pattern in the past for one or more repetition periods and control the same segment by perturbing the control input, determining the response to the perturbation, and using the response to the perturbation to compensate for coupling between adjacent or closely located periods in the waveform. Such measurements for other segments in the model.

雖然主要參考用於產生器之控制器進行描述,但本揭示內容之態樣適用於切換模式電源供應器及其控制器,其可用於eV源應用中,以便將偏壓提供至基板作為整個功率遞送系統的部分以及其他基板偏壓方案。本文中所論述之控制器及控制方案亦可用以控制阻抗匹配網路之可變阻抗元件(諸如真空可變電容器或切換式可變電抗元件)。在此類情況下,本揭示內容之態樣亦可或可不用於RF供應器對阻抗匹配網路之控制中作為整個功率遞送系統之部分。控制器可駐存於功率遞送系統(例如,產生器或匹配網路中)之任何部分中,且可以或不需要從功率遞送系統之其他部分接收資訊且控制該些其他部分。舉例而言,駐存於產生器中之控制器可控制作為功率遞送系統之部分的產生器及匹配兩者,該功率遞送系統具有僅自產生器、僅自匹配或自產生器及匹配兩者獲得之資訊。本文中所論述之控制器及控制方案亦可用於在電漿功率遞送環境中具有或不具有遞送功率之其他系統中。Although described primarily with reference to controllers for generators, aspects of the present disclosure are applicable to switched mode power supplies and their controllers, which may be used in eV source applications to provide a bias voltage to a substrate as the overall power part of the delivery system as well as other substrate biasing schemes. The controllers and control schemes discussed herein may also be used to control variable impedance elements of impedance matching networks, such as vacuum variable capacitors or switched varactor elements. In such cases, aspects of the present disclosure may or may not also be used in the RF supplier's control of the impedance matching network as part of the overall power delivery system. The controller may reside in any part of the power delivery system (eg, in the generator or matching network), and may or may not need to receive information from and control other parts of the power delivery system. For example, a controller resident in a generator may control both the generator and the matching as part of a power delivery system with only the self-generator, only the self-matching, or both the self-generator and the matching information obtained. The controllers and control schemes discussed herein may also be used in other systems with or without delivered power in a plasma power delivery environment.

圖1A(先前技術)繪示可用於控制電漿功率遞送系統之簡單類比週期內控制系統,且圖1B(先前技術)繪示可用於控制電漿功率遞送系統之簡單數位週期內控制系統。在圖1A中,輸入101與輸出106之間的差產生控制器103用以向器件105產生控制輸入104之誤差信號102。在此圖式中,控制器係具有k增益之簡單積分器。在實際實施方案中,控制輸入104 c可為功率放大器之驅動電平,且器件105 P係功率放大器。為了繪示此控制器與所揭示之週期間控制器之間的效能差異,器件105 P係單位增益塊,亦即 y= c。根據這些假設,迴路增益在k rad/s或k/(2π)Hz下具有單位增益,系統步驟響應之時間常數係1/k s且系統之脈衝響應的積分在1/k s中達至63.2%(1-1/e)。在圖1B中,以1/T s之取樣速率對輸入151進行取樣且由取樣器157數位化。(在一些應用中,輸入已為數位資料串流,且取樣器157不存在於系統中。)藉由取樣器159對輸出156進行取樣且數位化,且輸入與輸出之間的差產生控制器153用以產生控制輸入154之誤差信號152,該誤差信號藉由數位至類比轉換器158轉換成饋送至器件155的類比控制信號。對於圖1A,為了繪示此控制器與所揭示之週期間控制器之間的效能差異,器件105 P係單位增益塊。關於k與單位增益頻率與響應時間之間的關係之相同陳述針對如圖1A之類比控制器保持,其限制條件為k遠小於2 π/T sFigure 1A (prior art) shows a simple analog intra-cycle control system that can be used to control a plasma power delivery system, and Figure IB (prior art) shows a simple digital intra-cycle control system that can be used to control a plasma power delivery system. In FIG. 1A , the difference between an input 101 and an output 106 generates a controller 103 for generating an error signal 102 to a device 105 that controls an input 104 . In this scheme, the controller is a simple integrator with a gain of k. In a practical implementation, the control input 104c may be the drive level of a power amplifier, and the device 105P is a power amplifier. To illustrate the difference in performance between this controller and the disclosed cycle-by-cycle controller, device 105 P is a unity gain block, ie y = c . Under these assumptions, the loop gain has unity gain at k rad/s or k/(2π) Hz, the time constant of the system step response is 1/ks and the integral of the system's impulse response reaches 63.2% in 1/ks ( 1-1/e). In FIG. 1B , input 151 is sampled at a sampling rate of 1/T s and digitized by sampler 157 . (In some applications, the input is already a digital data stream, and sampler 157 is not present in the system.) Output 156 is sampled and digitized by sampler 159, and the difference between the input and output produces the controller 153 is used to generate an error signal 152 for a control input 154 , which is converted by a digital-to-analog converter 158 into an analog control signal fed to device 155 . For FIG. 1A , to illustrate the difference in performance between this controller and the disclosed cycle-to-cycle controller, device 105P is a unity gain block. The same statement about the relationship between k and unity gain frequency and response time holds for an analog controller like Fig. 1A, with the constraint that k is much smaller than 2π/ Ts .

圖2A(先前技術)展示諸如圖1A或圖1B中所展示之簡單週期內控制器對具有週期T p205,之週期性輸入的響應200。在此實例中,大量不同設定點(例如,設定點功率為1、隨後2、隨後5,其中斜坡為3)界定輸入之一個週期。輸出202跟隨輸入201,具有可見之不準確性(其中輸出與輸入設定點不匹配)。對於此圖式之封閉迴路響應之時間常數係10 µs。可藉由將系統之時間移位時間反轉脈衝響應與輸入相乘且進行積分來獲得給定點A 203處之輸出。單元204之正規化時間移位時間反轉脈衝響應展示在點A,203處之輸出很大程度上受最近的過去(在一個時間常數或點A之前的10 µs內)影響,且幾乎完全不受比點A之前的10個時間常數較早產生之事件影響。為了適應脈衝內之變化的設定點,習知控制器必須非常快。如圖2B中所展示(先前技術),使控制器加速會改良輸出準確跟隨輸入之能力。對於此圖式之封閉迴路響應之時間常數係5 µs。響應250展示輸出252更緊密地跟隨輸入251。正規化時間移位時間反轉脈衝響應254展示點A 253現在受最近過去中之輸入影響甚至更大。 FIG. 2A (prior art) shows the response 200 of a simple intra-cycle controller such as that shown in FIG. 1A or FIG. 1B to a periodic input having a period Tp 205'. In this example, a number of different setpoints (eg, setpoint power of 1, then 2, then 5 with a ramp of 3) define one cycle of the input. The output 202 follows the input 201 with visible inaccuracies (where the output does not match the input setpoint). The time constant of the closed loop response for this diagram is 10 µs. The output at a given point A 203 can be obtained by multiplying and integrating the time-shifted time-reversed impulse response of the system with the input. The normalized time-shifted time-reversed impulse response of unit 204 shows that at point A, the output at 203 is largely influenced by the recent past (within one time constant or 10 µs before point A) and is almost completely independent of Affected by events occurring earlier than 10 time constants before point A. In order to adapt to the changing set point within the pulse, conventional controllers must be very fast. As shown in Figure 2B (prior art), speeding up the controller improves the ability of the output to accurately follow the input. The time constant of the closed loop response for this diagram is 5 µs. Response 250 shows that output 252 follows input 251 more closely. The normalized time-shifted time-reversed impulse response 254 shows that point A 253 is now even more affected by inputs in the recent past.

在這些習知週期內控制器中,誤差控制係基於電流輸出(在週期內)相對於設定點之量測值。因此,參考圖2A,舉例而言,將在時間1.5 ms之輸出的量測值與在同一時間之設定點值進行比較,以產生誤差信號。換言之,將設定點值與當前週期期間之量測值進行比較,以產生用於習知週期內控制器之誤差信號。相比而言,週期間控制器針對給定設定點比較在過去一或多個循環之輸出的量測值,且使用在設定點處之過去量測值以產生當前誤差信號及控制器輸出。舉例而言,再次參考圖2A,控制器將使用在時間1.5 ms時為3之設定點、在時間0.94 ms(其係先前0.56 ms之一個波形重複週期或與時間1.5 ms相關的前述脈衝之部分)時為3之同一設定點的量測值以產生誤差及輸出,而非在時間1.5 ms之脈衝內的量測值。值得注意的係,週期間控制器不必幾乎一樣快,此係因為其依賴於過去一個循環之量測值而非脈衝內之緊鄰值。In these conventional cycle controllers, the error control is based on the measurement of the current output (in cycle) relative to the set point. Thus, referring to FIG. 2A , for example, the measured value of the output at time 1.5 ms is compared with the set point value at the same time to generate an error signal. In other words, the set point value is compared to the measured value during the current cycle to generate an error signal for the controller during the known cycle. In contrast, an inter-cycle controller compares measurements of the output over the past one or more cycles for a given setpoint, and uses the past measurements at the setpoint to generate the current error signal and controller output. For example, referring again to Figure 2A, the controller would use a setpoint of 3 at time 1.5 ms, at time 0.94 ms (which is the previous 0.56 ms of one waveform repetition period or the portion of the preceding pulse relative to time 1.5 ms ) at the same set point as 3 to generate the error and output, rather than the measured value within a pulse of time 1.5 ms. It is worth noting that the controller does not have to be nearly as fast cycle-to-cycle because it relies on measurements from the past cycle rather than immediately adjacent values within a pulse.

在一些實例中,將脈衝(例如,在週期T p內之脈衝)劃分成多個時段,且先前脈衝之相同時段中的對應(相同)輸出值用於誤差信號。緊接著再次參考上述實例,參考在第一脈衝之時間0.94 ms時使用量測值用於在後續第二脈衝之時間1.5 ms時的誤差校正,時段將涵蓋一些範圍內之0.56 ms之特定值。在一個實例中,除傾斜設定點轉換之外,劃分脈衝之時段為使得任何給定時段不涵蓋不同設定點。 In some examples, a pulse (eg, a pulse within period Tp ) is divided into periods, and the corresponding (same) output value in the same period of the previous pulse is used for the error signal. Next referring again to the above example, referring to using the measured value at the time of the first pulse at 0.94 ms for error correction at the time of the subsequent second pulse at 1.5 ms, the time period will cover a certain value of 0.56 ms within some range. In one example, except for ramped setpoint transitions, the periods of the pulses are divided such that no given period covers a different setpoint.

在各種實施方案中,週期間脈衝資訊儲存於某種形式之記憶體中,使得控制器可存取且使用該週期間脈衝資訊以用於後續脈衝之誤差反饋。諸如具有傾斜設定點轉換之複雜脈衝及其他不同設定點可受益於脈衝之相對較小時段分部,且因此可能需要相對較大及較快記憶體。在特定實例中,具有介於100 ms與10 µs週期T p之間的脈衝可細分為1024個時間片,且儲存每片之輸出值以用於與後續脈衝之相同時間片中的量測值進行比較。 In various implementations, the inter-cycle pulse information is stored in some form of memory such that the controller can access and use the inter-cycle pulse information for error feedback of subsequent pulses. Complex pulses such as with ramped setpoint transitions and other different setpoints may benefit from relatively small period divisions of pulses, and thus may require relatively larger and faster memory. In a specific example, a pulse with a period T p between 100 ms and 10 µs can be subdivided into 1024 time slices, and the output value of each slice is stored for measurement in the same time slice as the subsequent pulse Compare.

在一些應用中,未產生誤差信號。在使用週期間控制方案之阻抗匹配應用中,在過去一或多個週期T p205,關於呈現給產生器之阻抗的資訊可用於調整目前匹配網路內之可變阻抗元件。資訊可用於計算對可變阻抗匹配元件之調整而不首先產生誤差信號。在阻抗匹配應用中,設定點(例如101、151、303、351、501)通常係常數,但存在必須與所要輸入阻抗匹配之負載阻抗之週期性干擾。舉例而言,此類週期性干擾可起因於向電漿負載遞送遵循輸出相對於時間之規定型樣的功率,其中該型樣以重複週期重複。在此情況下,來自例如提供功率之規定型樣之電源的同步信號可經提供至匹配網路,以輔助匹配網路與干擾之重複波形同步。 In some applications, no error signal is generated. In impedance matching applications using an inter-cycle control scheme, information about the impedance presented to the generator over the past one or more cycles Tp 205 can be used to adjust the variable impedance elements present in the matching network. The information can be used to calculate adjustments to the variable impedance matching element without first generating an error signal. In impedance matching applications, the set points (such as 101, 151, 303, 351, 501) are usually constant, but there are periodic disturbances of the load impedance that must match the desired input impedance. Such periodic disturbances may result, for example, from delivering power to the plasma load that follows a prescribed pattern of output versus time, where the pattern repeats with a repeating period. In this case, a synchronization signal from, for example, a power supply of a prescribed pattern providing power may be provided to the matching network to assist the matching network in synchronizing with the interfering repetitive waveform.

圖3A繪示根據本揭示內容之一個實施例的可實施於電漿功率遞送系統中之週期間控制器300之一個實例的方塊圖。圖3B繪示根據本揭示內容之另一實施例的可實施於電漿功率遞送系統中之週期間控制器350之替代實例實施方案的方塊圖。本文中所描述之週期間控制器之一些實施方案可視為多輸入多輸出(MIMO)控制器。控制器或更一般而言控制元件可以硬體及軟體實施,具有其各種可能組合。控制元件可與產生器或其他裝置整合,或可為單獨組件。在一些應用中,週期間控制器可駐存於與受控裝備不同之裝備零件中。作為一實例,連接至阻抗匹配網路之控制器可駐存於產生器中,但控制阻抗匹配網路中之可變阻抗元件。在此應用中,來自耦接器之前向及反射信號可自駐存於產生器中之耦接器獲得、在類比中過濾、在類比至數位轉換器中數位化,且經處理以藉由運作軟體程式之微處理器或藉由實施於例如FPGA中的數位邏輯電路進行之匹配來提取呈現給產生器之阻抗。量測可由駐存於FPGA中之微處理器或可重新組態之數位電路儲存於記憶體中。可使用在微處理器中運行之軟體或藉由FPGA來處理含有在不同時間的阻抗量測之樣本的記憶體。軟體或FPGA可在過去一或多個波形重複週期使用樣本以實施週期間控制方案。為了實施此方案,亦可使用關於匹配中之可變阻抗元件之過去值的資訊。控制器接著可將控制信號發送至匹配以改變匹配中之可變阻抗元件。圖3A實施週期間控制器(提供交錯方案)作為數目N個控制器,每一控制器以輸入之重複週期T p運行。區塊301展示第一此類控制器且區塊302展示第N此類控制器。輸入303由類比至數位轉換器304以1/T s之取樣速率取樣且數位化。(輸入可能已作為資料串流存在,在此情況下不使用轉換器304。)經取樣輸入依次由開關305切換或路由至控制器,使得每一控制器以1/T p之速率接收經更新輸入。控制器之輸出由開關306路由至公共控制輸入c。控制輸入由數位至類比轉換器307轉換成類比且施加至器件P 308之控制輸入。輸出y 309係藉由取樣器(控制器301之313)由每一控制器以1/T p之速率取樣。 FIG. 3A shows a block diagram of one example of an inter-cycle controller 300 that may be implemented in a plasma power delivery system, according to one embodiment of the present disclosure. 3B shows a block diagram of an alternate example implementation of an inter-cycle controller 350 that may be implemented in a plasma power delivery system, according to another embodiment of the present disclosure. Some implementations of the cycle-to-cycle controllers described herein may be considered as multiple-input multiple-output (MIMO) controllers. A controller or more generally a control element can be implemented in hardware as well as in software, with various possible combinations thereof. The control element may be integrated with the generator or other device, or may be a separate component. In some applications, the inter-cycle controller may reside in a different piece of equipment than the equipment being controlled. As an example, a controller connected to the impedance matching network may reside in the generator but control the variable impedance elements in the impedance matching network. In this application, the forward and reflected signals from the coupler can be obtained from the coupler resident in the generator, filtered in analog, digitized in an analog-to-digital converter, and processed to operate by The impedance presented to the generator is extracted by a software programmed microprocessor or by matching performed by a digital logic circuit implemented, for example, in an FPGA. Measurements can be stored in memory by a microprocessor resident in the FPGA or by a reconfigurable digital circuit. A memory containing samples of impedance measurements at different times can be processed using software running in a microprocessor or by an FPGA. Software or an FPGA can use samples over the past one or more waveform repetition cycles to implement a cycle-by-cycle control scheme. To implement this approach, information about the past values of the variable impedance elements being matched can also be used. The controller can then send control signals to the match to change the variable impedance elements in the match. Figure 3A implements an inter-cycle controller (providing an interleaving scheme) as a number N of controllers, each operating at an input repetition period Tp . Block 301 shows a first such controller and block 302 shows an Nth such controller. The input 303 is sampled and digitized by an analog-to-digital converter 304 at a sampling rate of 1/T s . (The input may already exist as a data stream, in which case converter 304 is not used.) The sampled input is in turn switched or routed to the controllers by switch 305 such that each controller receives updated at a rate of 1/ Tp enter. The output of the controller is routed by switch 306 to a common control input c. The control input is converted to analog by a digital-to-analog converter 307 and applied to the control input of device P 308 . Output y 309 is sampled by each controller at a rate of 1/ Tp by samplers (313 of controller 301).

每一控制器藉由自經取樣輸出中減去輸入來產生誤差函數(控制器301之310)。(由於經取樣輸出受波形週期T p延遲,因此此實施週期間控制器。)整合誤差函數(藉由控制器301之311),從而產生輸出(控制器301之312)。調整控制器之數目N及取樣週期T s以使得NT s=T p。為了滿足其中輸入之重複週期T p可改變一些取樣週期之情況,可利用額外控制器。舉例而言,可存在N+3個控制器以處理可改變三個取樣週期之T p。當由於短於最大T p而未更新額外控制區段時,可將最後更新的控制器之狀態拷貝至額外控制區段。 Each controller generates an error function by subtracting the input from the sampled output (controllers 301 - 310). (Since the sampled output is delayed by the waveform period Tp , an inter-cycle controller is implemented.) The error function is integrated (by controller 301 of 311) to produce the output (controller 301 of 312). Adjust the number N of controllers and the sampling period T s so that NT s =T p . To cater for cases where the input repetition period Tp can vary by some sampling periods, an additional controller can be utilized. For example, there may be N+3 controllers to handle Tp which may vary by three sampling periods. When the additional control section is not updated due to being shorter than the maximum Tp , the state of the last updated controller may be copied to the additional control section.

圖3B展示根據本揭示內容之實施例的週期間控制器350之替代實施方案。輸入351由類比至數位轉換器352以1/T s之取樣速率取樣且數位化。(輸入可能已作為資料串流存在,在此情況下不使用轉換器352。)輸出358由類比至數位轉換器359取樣且數位化。(輸出可為衍生自輸出之量測的數位資料串流,在此情況下類比至數位轉換器可能未如所展示實施。)誤差函數353係藉由自輸出減去輸入而獲得。控制器354根據至器件 c355之控制輸入的值及誤差函數 e353而在輸入之一個週期T p之前產生至器件 c355之控制輸入。此與如將在下文展示之習知週期內控制器顯著不同。至器件之控制輸入由數位至類比轉換器356轉換成類比信號且施加至器件357。對於控制器300,可規定對其中輸入之重複週期T p可改變一些取樣週期之情況進行處理。在此情況下,允許N基於擬合輸入之先前週期T p中之取樣週期T s的數目而變化。 FIG. 3B shows an alternate implementation of an inter-cycle controller 350 according to an embodiment of the disclosure. The input 351 is sampled and digitized by an analog-to-digital converter 352 at a sampling rate of 1/T s . (The input may already exist as a data stream, in which case converter 352 is not used.) Output 358 is sampled and digitized by analog-to-digital converter 359 . (The output may be a digital data stream derived from measurements of the output, in which case the analog-to-digital converter may not be implemented as shown.) The error function 353 is obtained by subtracting the input from the output. The controller 354 generates the control input to the device c 355 one period T p before the input according to the value of the control input to the device c 355 and the error function e 353 . This is significantly different from conventional cycle controllers as will be shown below. The control input to the device is converted to an analog signal by a digital-to-analog converter 356 and applied to device 357 . For the controller 300, provision can be made to handle the case where the input repetition period Tp can vary by some sampling periods. In this case, N is allowed to vary based on the number of sampling periods Ts in the previous period Tp of the fitted input.

圖4A至圖4D展示根據本揭示內容之一個實施例的可實施於電漿功率遞送系統中之週期間控制器對週期性控制輸入之響應。在圖4A及圖4B中,展示輸出402對週期性輸入401之響應400。如響應400中所展示,輸出緩慢收斂至輸入(圖4A),但在輸入之約30個循環之後(圖4B),輸出404跟隨輸入403,幾乎無不可感知之誤差。圖4C展示響應450上之點A 451及影響點A之點。應注意,對於週期間控制器,點A 451在過去5 ms仍受輸入顯著影響。因此,即使輸出之每一區段接近輸入約5 ms之時間常數,但在輸入之一些週期之後,輸出可以幾乎不可感知的誤差跟隨輸入。對於習知週期內控制器,即使具有5 µs時間常數,輸出亦不以此精度跟隨輸入。4A-4D show the response of an inter-cycle controller to a periodic control input that may be implemented in a plasma power delivery system, according to one embodiment of the present disclosure. In FIGS. 4A and 4B , a response 400 of an output 402 to a periodic input 401 is shown. As shown in response 400, the output converges slowly to the input (FIG. 4A), but after about 30 cycles of the input (FIG. 4B), the output 404 follows the input 403 with little perceptible error. FIG. 4C shows point A 451 on response 450 and the points that affect point A. FIG. It should be noted that for an inter-cycle controller, point A 451 is still significantly affected by the input for the past 5 ms. Thus, even though each segment of the output is close to the input's time constant of about 5 ms, after a few cycles of the input the output can follow the input with almost imperceptible error. For a conventional in-cycle controller, even with a 5 µs time constant, the output does not follow the input with this accuracy.

圖5繪示根據本揭示內容之一個實施例的可實施於電漿功率遞送系統中之實例組合週期間及週期內控制器500的方塊圖。輸入501由類比至數位轉換器502以1/T s之取樣速率取樣且數位化。(輸入可能已作為資料串流存在,在此情況下不使用轉換器502。)輸出509由類比至數位轉換器510取樣且數位化。(輸出可為衍生自輸出之量測的數位資料串流,在此情況下類比至數位轉換器可能未如所展示實施。)誤差函數503係藉由自輸出減去輸入而獲得。控制器504根據至器件 c506之控制輸入的值及誤差函數 e503而在輸入之一個週期T p之前且在一個取樣週期T s之前產生至器件 c506之控制輸入。選擇N及T s以滿足T p=NT s。控制輸入 c506係基於一個取樣週期T s之前及輸入之一個週期T p之前的值之加權平均值。在等式505中所展示之序列(經取樣時間)域中可更清楚地說明此加權。在504及505中,W e係介於0與1之間的實數且W a=1-W e。若W e=1,則控制器係純週期間控制器,且若W e=0,則控制器係習知週期內控制器。至器件 c506之控制輸入由數位至類比轉換器507轉換成類比信號且施加至器件508。可規定對其中輸入之重複週期T p可改變一些取樣週期之情況進行處理。在此情況下,允許N基於擬合輸入之先前週期T p中之取樣週期T s的數目而變化。在此情況下,若最近未更新趨於重複結束之區段,而非自先前樣本中拷貝狀態,則可改變加權以運行純週期內控制器(W e=0),直至輸入之下一週期開始為止。此實例組合週期間及週期內控制器500具有其他優點,亦即其可容易地自具有週期性輸入之操作轉換至具有非重複輸入501的操作。 FIG. 5 shows a block diagram of an example combined inter-cycle and intra-cycle controller 500 that may be implemented in a plasma power delivery system, according to one embodiment of the present disclosure. The input 501 is sampled and digitized by an analog-to-digital converter 502 at a sampling rate of 1/T s . (The input may already exist as a data stream, in which case converter 502 is not used.) Output 509 is sampled by analog-to-digital converter 510 and digitized. (The output may be a digital data stream derived from measurements of the output, in which case the analog-to-digital converter may not be implemented as shown.) The error function 503 is obtained by subtracting the input from the output. The controller 504 generates the control input to device c 506 one period Tp before the input and one sampling period Ts before according to the value of the control input to device c506 and the error function e503 . N and T s are chosen to satisfy T p =NT s . The control input c 506 is based on a weighted average of the values one sample period T s ago and the input one period T p ago. This weighting can be more clearly illustrated in the sequence (sampled time) domain shown in equation 505 . In 504 and 505, W e is a real number between 0 and 1 and W a =1-W e . If W e =1, then the controller is a pure inter-periodic controller, and if W e =0, then the controller is a conventional intra-periodic controller. The control input to device c 506 is converted to an analog signal by a digital-to-analog converter 507 and applied to device 508 . Provision can be made to handle the case where the input repetition period Tp can vary by some sampling periods. In this case, N is allowed to vary based on the number of sampling periods Ts in the previous period Tp of the fitted input. In this case, if the segment towards the end of the repetition has not been updated recently, instead of copying the state from the previous sample, the weights can be changed to run a purely intraperiodic controller (W e =0) until the next period of the input until the beginning. This example combined inter-cycle and intra-cycle controller 500 has the additional advantage that it can be easily switched from operation with a periodic input to operation with a non-repetitive input 501 .

圖6A、圖6B、圖6C及圖6D繪示根據本揭示內容之一個實施例的可實施於電漿功率遞送系統中之諸如300、350或500(其中W e=1)等實例週期間控制器之屬性。為了易於說明,在圖6中,器件P 308、357或506係簡單之單位增益區塊,樣本週期T s=1 µs,重複週期T p=1 ms,且因此N=Tp/Ts=1000,且k(在500中為k e)=62.83。週期間控制器之迴路增益之波德曲線展示於圖6A中。迴路增益與傳統週期內控制器極為不同。正如增益可預期,在10 Hz處存在第一增益交越頻率,k(在500中為k e)=62.83=2π10,但增益之幅值在輸入之諧波處返回至無窮大(1/T p之倍數);週期間控制器的獨特屬性,其允許其以前所未有之精度跟隨週期性輸入。圖6B展示迴路增益之奈奎斯曲線。為了便於解釋奈奎斯曲線,迴路增益之幅值以log 2(1+log 2(1+●))按比例調整。此映射將0映射至0、1映射至1且單調遞增,因此吾等仍可驗證複雜平面中之點-1+j0是否未經環繞。儘管波德曲線中存在多個增益交叉點,但奈奎斯曲線展示系統為穩定的。圖6C展示系統之封閉迴路響應之幅值及相位。圖6D展示系統之封閉迴路響應在僅輸入之諧波及來自輸入之諧波的+/-1 Hz處之幅值及相位。圖6D展示諧波處之增益係單位增益,從而確證具有週期T p之週期性輸入將被精確跟隨。在圖6D中,具有恰好0 dB增益及0相位(單位增益)之點恰好在輸入之諧波處,具有-0.04 dB的增益及+/-5度之相位的點在輸入之諧波之上及之下1 Hz。 6A, 6B, 6C, and 6D illustrate example inter-cycle controls such as 300, 350, or 500 (where We = 1) that may be implemented in a plasma power delivery system according to one embodiment of the present disclosure. properties of the device. For ease of illustration, in Fig. 6, device P 308, 357 or 506 is a simple unity gain block with sample period T s =1 µs, repetition period T p =1 ms, and thus N=Tp/Ts=1000, And k (k e in 500) = 62.83. A Bode curve for the loop gain of the controller during cycle is shown in Figure 6A. Loop gain is very different from traditional in-cycle controllers. As expected for the gain, there is a first gain crossover frequency at 10 Hz, k (k e in 500) = 62.83 = 2π10, but the magnitude of the gain returns to infinity at harmonics of the input (1/T p multiples of ); a unique property of the inter-cycle controller that allows it to follow a periodic input with unprecedented accuracy. Figure 6B shows the Nyquis curve of the loop gain. To facilitate the interpretation of the Nyquis curve, the magnitude of the loop gain is scaled by log 2 (1+log 2 (1+●)). This mapping maps 0 to 0 and 1 to 1 and is monotonically increasing, so we can still verify that the point -1+j0 in the complex plane is not surrounded. Although there are multiple gain crossing points in the Bode curve, the Nyquist curve shows that the system is stable. Figure 6C shows the magnitude and phase of the closed loop response of the system. Figure 6D shows the magnitude and phase of the closed loop response of the system at harmonics of the input only and +/- 1 Hz from the input. Figure 6D shows that the gain at the harmonics is unity gain, confirming that a periodic input with period Tp will be followed exactly. In Figure 6D, the point with exactly 0 dB gain and 0 phase (unity gain) is just at the harmonic of the input, and the point with -0.04 dB gain and +/-5 degrees of phase is above the harmonic of the input and below 1 Hz.

圖7A、圖7B、圖7C及圖7D繪示根據本揭示內容之一個實施例的可實施於電漿功率遞送系統中之實例組合週期間控制器及週期內控制器500的屬性,其中W e=0.1。為了易於說明,在圖7中,器件P 506係簡單之單位增益區塊,樣本週期T s=1 µs,重複週期T p=1 ms,且因此N=Tp/Ts=1000,k e=62.83且k a=62830。在圖7A中展示組合週期間及週期內控制器之迴路增益之波德曲線。迴路增益與傳統週期內控制器極為不同。在100 Hz處存在第一增益交越頻率,其介於10 Hz之W e=1的交越頻率與10 kHz之W e=0的交越之間。增益之幅值在輸入的諧波(1/T p之倍數)處返回至高但有限值;組合週期間及週期內控制器之獨特屬性。圖7B展示迴路增益之奈奎斯曲線。為了便於解釋奈奎斯曲線,迴路增益之幅值以log 2(1+log 2(1+●))按比例調整。此映射將0映射至0、1映射至1且單調遞增,因此吾等仍可驗證複雜平面中之點-1+j0是否未經環繞。儘管波德曲線中存在多個增益交叉點,但奈奎斯曲線展示系統為穩定的。圖7C展示系統之封閉迴路響應之幅值及相位。圖7D展示系統之封閉迴路響應在僅輸入之諧波及來自輸入之諧波的+/-1 Hz處之幅值及相位。圖7D展示輸入之前幾個諧波處之增益接近於單位增益,從而展示輸入的前幾個諧波分量將以良好精度被跟隨。 7A, 7B, 7C, and 7D illustrate an example combined inter-cycle controller and properties of an intra-cycle controller 500 that may be implemented in a plasma power delivery system, according to one embodiment of the present disclosure, where W e =0.1. For ease of illustration, in Figure 7, device P 506 is a simple unity-gain block with sample period T s =1 µs, repetition period T p =1 ms, and thus N=Tp/Ts=1000, k e =62.83 And k a =62830. Bode curves for the loop gain of the combined cycle-to-cycle and cycle-to-cycle controllers are shown in FIG. 7A. Loop gain is very different from traditional in-cycle controllers. There is a first gain crossover frequency at 100 Hz, which is between the crossover frequency for We = 1 at 10 Hz and the crossover for We = 0 at 10 kHz. The magnitude of the gain returns to high but finite values at harmonics of the input (multiples of 1/T p ); unique properties of combined cycle-cycle and cycle-cycle controllers. Figure 7B shows the Nyquis curve of the loop gain. To facilitate the interpretation of the Nyquis curve, the magnitude of the loop gain is scaled by log 2 (1+log 2 (1+●)). This mapping maps 0 to 0 and 1 to 1 and is monotonically increasing, so we can still verify that the point -1+j0 in the complex plane is not surrounded. Although there are multiple gain crossing points in the Bode curve, the Nyquist curve shows that the system is stable. Figure 7C shows the magnitude and phase of the closed loop response of the system. Figure 7D shows the magnitude and phase of the closed loop response of the system at harmonics of the input only and +/- 1 Hz from the input. Figure 7D shows that the gain at the first few harmonics of the input is close to unity gain, showing that the first few harmonic components of the input will be followed with good accuracy.

圖8A、圖8B、圖8C及圖8D繪示根據本揭示內容之一個實施例的可實施於電漿功率遞送系統中之實例組合週期間控制器及週期內控制器500的屬性,其中W e=0.01。在圖8中,器件P 506係簡單之單位增益區塊,樣本週期T s=1 µs,重複週期T p=1 ms,且因此N=Tp/Ts=1000,k e=62.83且k a=62830。在圖8A中展示組合週期間及週期內控制器之迴路增益之波德曲線。該迴路增益接近傳統週期內控制器之迴路增益。在9.1 kHz處存在第一增益交越頻率,其介於10 Hz之W e=1的交越頻率與10 kHz之W e=0的交越之間。隨著頻率增加,增益之幅值返回至高於單位兩倍多之值。圖8B展示迴路增益之奈奎斯曲線。為了便於解釋奈奎斯曲線,迴路增益之幅值以log 2(1+log 2(1+●))按比例調整。此映射將0映射至0、1映射至1且單調遞增,因此吾等仍可驗證複雜平面中之點-1+j0是否未經環繞。儘管波德曲線中存在多個增益交叉點,但奈奎斯曲線展示系統為穩定的。圖8C展示系統之封閉迴路響應之幅值及相位。圖7D展示系統之封閉迴路響應在僅輸入之諧波及來自輸入之諧波的+/-1 Hz處之幅值及相位。圖7D展示輸入之前幾個諧波處之增益接近於單位增益,從而展示輸入的前幾個諧波分量將以良好精度被跟隨。此控制器接近具有10 kHz增益交越頻率之週期內控制器之效能。 8A, 8B, 8C, and 8D illustrate an example combined inter-cycle controller and properties of an intra-cycle controller 500 that may be implemented in a plasma power delivery system, according to one embodiment of the present disclosure, where W e =0.01. In Fig. 8, device P 506 is a simple unity gain block with sample period T s =1 µs, repetition period T p =1 ms, and thus N=Tp/Ts=1000, k e =62.83 and k a = 62830. Bode curves for the loop gain of the combined cycle-to-cycle and cycle-to-cycle controllers are shown in FIG. 8A. This loop gain is close to the loop gain of a conventional cycle-by-cycle controller. There is a first gain crossover frequency at 9.1 kHz, which is between the crossover frequency for We = 1 at 10 Hz and the crossover for We = 0 at 10 kHz. As frequency increases, the magnitude of the gain returns to a value more than twice above unity. Figure 8B shows the Nyquis curve of the loop gain. To facilitate the interpretation of the Nyquis curve, the magnitude of the loop gain is scaled by log 2 (1+log 2 (1+●)). This mapping maps 0 to 0 and 1 to 1 and is monotonically increasing, so we can still verify that the point -1+j0 in the complex plane is not surrounded. Although there are multiple gain crossing points in the Bode curve, the Nyquist curve shows that the system is stable. Figure 8C shows the magnitude and phase of the closed loop response of the system. Figure 7D shows the magnitude and phase of the closed loop response of the system at harmonics of the input only and +/- 1 Hz from the input. Figure 7D shows that the gain at the first few harmonics of the input is close to unity gain, showing that the first few harmonic components of the input will be followed with good precision. This controller approaches the performance of an in-cycle controller with a gain crossover frequency of 10 kHz.

圖9繪示根據本揭示內容之一個實施例的可實施於電漿功率遞送系統中之實例組合週期間及週期內控制器900的多輸入多輸出版本之方塊圖。輸入901由類比至數位轉換器902以1/T s之取樣速率取樣且數位化。(輸入可能已作為資料串流存在,在此情況下不使用轉換器902。)輸入係多維的且可例如含有用於輸出功率及產生器源極阻抗之輸入。輸出907由類比至數位轉換器909取樣且數位化。(輸出可為衍生自輸出之量測的數位資料串流,在此情況下類比至數位轉換器可能未如所展示實施)。輸出係多維的且例如可包括呈現給產生器之輸出功率及阻抗之量測。輸入901及輸出907之維度不必一致。此係因為輸出之元素可含有經最小化或最大化之某物的量測,且因此不需要輸入(例如,呈現給產生器之負載阻抗與所要負載阻抗之不匹配)。此外,若可僅設定值且不需要對應量測(例如,設定產生器源極阻抗),則輸入之元素可不需要對應量測。輸入901、控制輸入904、擾動908及輸出907之量測儲存於記憶體910中。控制器903根據儲存於記憶體中的值在輸入之一個週期T p之前且在一個取樣週期T s之前產生至器件 c904之控制輸入。選擇N及T s以滿足T p=NT sFIG. 9 shows a block diagram of an example combined inter-cycle and MIMO version of an intra-cycle controller 900 that may be implemented in a plasma power delivery system, according to one embodiment of the present disclosure. The input 901 is sampled and digitized by an analog-to-digital converter 902 at a sampling rate of 1/T s . (The input may already exist as a data stream, in which case converter 902 is not used.) The input is multi-dimensional and may include, for example, inputs for output power and generator source impedance. The output 907 is sampled and digitized by an analog-to-digital converter 909 . (The output may be a digital data stream derived from the output's measurements, in which case the analog-to-digital converter may not be implemented as shown). The output is multidimensional and may include, for example, measurements of output power and impedance presented to the generator. The dimensions of input 901 and output 907 do not have to be identical. This is because an element of the output may contain a measure of something that is minimized or maximized, and therefore does not require an input (eg, a mismatch between the load impedance presented to the generator and the desired load impedance). Furthermore, elements of an input may not require a corresponding measurement if only a value can be set and no corresponding measurement is required (eg, setting generator source impedance). The measurements of input 901 , control input 904 , disturbance 908 and output 907 are stored in memory 910 . The controller 903 generates the control input to the device c 904 one period Tp before the input and one sample period Ts before according to the value stored in memory. N and T s are chosen to satisfy T p =NT s .

除了計算至器件904之控制輸入的值之外,控制器亦可產生添加至所計算控制中之擾動908。添加至擾動908中之器件的控制輸入904由數位至類比轉換器905轉換成類比信號且施加至器件906。擾動908可用於提取控制輸入904與輸出907之間的相關性。舉例而言,擾動904中之控制元件主要控制輸出功率(例如,功率放大器之驅動電平)且觀測由電漿負載呈現給產生器之輸出功率及阻抗兩者的變化,且接著擾動控制元件主要控制呈現給產生器之阻抗(例如,產生器頻率)且觀測由電漿負載呈現給產生器之輸出功率及阻抗兩者,允許控制器提取控制輸入904與輸出907之間的相關性。若週期性地調變輸入,則亦調變控制輸入904與輸出907之間的相關性(假定負載係非線性的,如大多數電漿負載之情況)。週期間控制器可在重複輸入循環內關聯每一特定時段之控制輸入904及輸出907。舉例而言,對於T p=1 ms及T s=1 µs,控制器可針對輸入中之1000個時段中之每一者而保持使904與907相關的1000個矩陣。除了針對每一特定時段提取控制輸入904之元素與輸出907之元素之間的相關性之外,亦可在不同時段之間提取相關性。舉例而言,控制器可判定一個時段中之控制輸入之元素的變化如何影響連續時段中之輸出。 In addition to calculating the value of the control input to the device 904, the controller may also generate a disturbance 908 that is added to the calculated control. The control input 904 of the device added to the disturbance 908 is converted to an analog signal by a digital-to-analog converter 905 and applied to the device 906 . Perturbation 908 may be used to extract the correlation between control input 904 and output 907 . For example, the control element in disturbance 904 primarily controls the output power (e.g., the drive level of a power amplifier) and observes changes in both output power and impedance presented to the generator by the plasma load, and then the disturbance control element primarily Controlling the impedance presented to the generator (eg, generator frequency) and observing both the output power and impedance presented to the generator by the plasma load allows the controller to extract the correlation between control input 904 and output 907 . If the input is modulated periodically, the dependency between the control input 904 and output 907 is also modulated (assuming the load is non-linear, as is the case with most plasma loads). A cycle-by-cycle controller may correlate control input 904 and output 907 for each specific period of time within a repeating input cycle. For example, for Tp = 1 ms and Ts = 1 μs, the controller may maintain 1000 matrices correlating 904 and 907 for each of the 1000 time periods in the input. In addition to extracting correlations between elements of the control input 904 and elements of the output 907 for each specific time period, correlations may also be extracted between different time periods. For example, a controller may determine how a change in an element of a control input in one period of time affects the output in successive periods of time.

簡單實例繪示瞭解這些相關性之優點。考慮關於如何在週期性輸入中更新第7時段之二維控制向量(例如,驅動及頻率)及二維輸出(例如,輸出功率及負載電阻)的決定。使第7時段之輸出中之所要變化為:

Figure 02_image001
假設經由擾動評估第7時段中之輸出與第6及第7時段中之控制輸入之間的相關性:
Figure 02_image003
由此得出(大致):
Figure 02_image005
當需要調整第7時段之輸入時,已對第6時段之輸入做出更改,因此:
Figure 02_image007
係已知的且由此得出:
Figure 02_image009
Simple examples illustrate the advantages of understanding these dependencies. Consider the decision on how to update the 2D control vector (eg, drive and frequency) and 2D output (eg, output power and load resistance) of period 7 in periodic inputs. Make the desired change in the output of the 7th period as:
Figure 02_image001
Assume that the correlation between the output in period 7 and the control inputs in periods 6 and 7 is evaluated via perturbation:
Figure 02_image003
From this it follows (roughly):
Figure 02_image005
When the input for period 7 needed to be adjusted, a change was made to the input for period 6, so:
Figure 02_image007
is known and thus follows:
Figure 02_image009

簡單實例使用至器件之兩個輸入(驅動及頻率)及兩個輸出(輸出功率及負載電阻)。輸出電阻僅為負載阻抗之一個分量。在實際應用中,負載阻抗很重要,而不僅僅係負載阻抗之電阻部分。在此情況下,將必須利用第三輸入(例如,匹配網路中之可變電抗元件),或可採用最佳化技術來僅使用控制三個輸出的兩個輸入而非實例中之簡單計算來尋找最佳解決方案。The simple example uses two inputs (drive and frequency) and two outputs (output power and load resistance) to the device. Output resistance is only one component of load impedance. In practical applications, the load impedance is very important, not just the resistive part of the load impedance. In this case, a third input will have to be utilized (for example, a variable reactive element in a matching network), or optimization techniques can be employed to use only two inputs controlling three outputs instead of the simple calculations to find the optimal solution.

多輸入多輸出控制與週期間控制結合允許控制一個控制迴路中之多個參數。此避免了干擾控制迴路之問題,這通常需要在相同電漿功率遞送系統中對不同控制迴路使用廣泛不同之速度。MIMO control combined with cycle-by-cycle control allows multiple parameters to be controlled in one control loop. This avoids the problem of disturbing control loops, which typically requires the use of widely different speeds for different control loops in the same plasma power delivery system.

週期間控制允許單個控制器更容易地控制多個產生器將功率遞送至同一電漿系統。週期間及週期內控制器之資料速率係相同的,此係因為至器件之控制輸入以取樣速率1/T s更新。然而,週期內控制器需要來自較早之一個取樣週期T s之資訊以更新至器件的當前控制輸入,然而週期間控制器需要來自較早之一個輸入週期T p以更新至器件之控制輸入。由於在大多數情況下T p比T s長多倍,在週期間控制器需要資訊之前,更易於獲得至控制器及來自控制器之資訊。因此,週期間控制器可更加容易地考慮不同產生器之間的互動,以改良向同一電漿系統遞送功率之所有產生器之整體控制。 In-cycle control allows a single controller to more easily control multiple generators delivering power to the same plasma system. The data rate of the controller is the same between cycle and cycle because the control input to the device is updated at the sample rate 1/T s . However, the intra-cycle controller needs information from one sampling period T s earlier to update the current control input to the device, whereas the inter-cycle controller needs information from an input cycle T p earlier to update the control input to the device. Since Tp is many times longer than Ts in most cases, it is easier to obtain information to and from the controller before the controller needs it during the cycle. Thus, the inter-cycle controller can more easily take into account the interaction between the different generators to improve the overall control of all generators delivering power to the same plasma system.

在週期間及混合週期間及週期內控制器之給定實例中,控制器在過去一個取樣週期T s或一個重複週期T p使用信號之樣本。當然,控制器亦可在過去多個取樣週期或重複週期使用信號之樣本。 用於多電極感應電漿源之被動功率分配 In a given instance of an inter-cycle and hybrid inter-cycle and intra-cycle controller, the controller uses samples of the signal in the past one sampling period Ts or one repetition period Tp . Of course, the controller can also use samples of the signal over multiple sampling periods or repetition periods in the past. Passive Power Distribution for Multi-Electrode Induced Plasma Sources

圖10展示以感應方式耦接之電漿處理系統1000,其包括由產生器1004主動地驅動(經由匹配1006)以點火且在電漿處理腔室1010中維持電漿1008之初級線圈1002。如所描繪,例示性系統1000包括以感應方式耦接至電漿1008之N個次級線圈L 1至L N,且電漿1008以感應方式耦接至初級線圈1002。因此,次級線圈L 1至L N經由電漿1008以感應方式耦接至初級線圈1002,使得藉由電漿1008將功率施加至次級線圈L 1至L N。在一些實施例中,產生器1004可為圖3A中之器件308、圖3B中之器件357、圖5中的器件508或圖9中之器件906之實例。 10 shows an inductively coupled plasma processing system 1000 comprising a primary coil 1002 actively driven (via matching 1006 ) by a generator 1004 to ignite and maintain a plasma 1008 in a plasma processing chamber 1010 . As depicted, exemplary system 1000 includes N secondary coils L 1 through L N inductively coupled to plasma 1008 , and plasma 1008 is inductively coupled to primary coil 1002 . Accordingly, the secondary coils L 1 through L N are inductively coupled to the primary coil 1002 via the plasma 1008 such that power is applied to the secondary coils L 1 through L N through the plasma 1008 . In some embodiments, generator 1004 may be an instance of device 308 in FIG. 3A , device 357 in FIG. 3B , device 508 in FIG. 5 , or device 906 in FIG. 9 .

如所描繪,N個被動元件1012 1至1012 N中之對應一者耦接至N個次級線圈L 1至L N中之每一者,該些被動元件被動地端接N個次級線圈L 1至L N中之每一者。此架構與依賴於主動地驅動每一第二線圈L 1至L N之已知技術極為不同。有利地,因為並未主動地驅動次級電感器,所以可更加輕易地將次級線圈置放於腔室1010周圍,且更方便地達成電漿空間均一度控制,此係因為次級電感器L 1至L N係藉由經由電漿1008與初級線圈1002之相互耦接來驅動,且因此,缺乏對直接功率饋送的需求。歸因於額外供電饋送之固有複雜性及成本,多個次級線圈可以超出實際用於添加多個定向供電次級線圈之方式的方式添加。因此,可以更具成本效益之方式操控電漿密度。 As depicted, a corresponding one of the N passive elements 10121 through 1012N is coupled to each of the N secondary coils L1 through LN , the passive elements passively terminating the N secondary coils Each of L1 through LN . This architecture is very different from known techniques which rely on actively driving each second coil L1 to LN . Advantageously, since the secondary inductor is not actively driven, it is easier to place the secondary coil around the chamber 1010 and achieve plasma spatial uniformity control more easily because the secondary inductor L 1 through L N are driven by mutual coupling with the primary coil 1002 via the plasma 1008 and, thus, lack the need for direct power feed. Due to the inherent complexity and cost of additional power feeds, multiple secondary coils can be added in ways beyond what is practical for adding multiple directional powered secondary coils. Therefore, the plasma density can be manipulated in a more cost-effective manner.

在操作中,經由匹配1006將功率施加至初級線圈1002,該初級線圈將功率有效地施加至腔室1010,且一旦點火,電漿1008有效地作為變壓器之次級而操作,且電漿1008中誘發的電流誘發次級線圈L 1至L N中之電流。轉而,在次級線圈L 1至L N中誘發之電流誘發電漿1008中之電流,且影響接近於次級線圈L 1至L N中之每一者的區域中之電漿1008之密度。 In operation, power is applied via matching 1006 to primary coil 1002, which effectively applies power to chamber 1010, and once ignited, plasma 1008 effectively operates as the secondary of a transformer, and the plasma 1008 The induced current induces a current in the secondary coils L1 to LN . In turn, the current induced in the secondary coils L 1 through L N induces a current in the plasma 1008 and affects the density of the plasma 1008 in a region close to each of the secondary coils L 1 through L N .

在例示性實施例中被描繪為可變電容器之N個被動元件1012 1至1012 N使得能夠調節穿過N個線圈L 1至L N中之每一者的電流;因此使得能夠調節初級線圈1002與N個次級線圈L 1至L N之間的電流之比率。因此,可調節接近於初級線圈1002及次級線圈L 1至L N中之每一者之區域中的電漿密度。 The N passive elements 1012 1 to 1012 N , depicted in the exemplary embodiment as variable capacitors, enable adjustment of the current through each of the N coils L 1 to L N ; thus enabling adjustment of the primary coil 1002 The ratio of the current to the N secondary coils L 1 to L N. Accordingly, the plasma density in regions close to each of the primary coil 1002 and secondary coils L 1 -L N can be adjusted.

產生器1004可為13.56 MHz產生器,但此當然並非所需的且其他頻率當然涵蓋在內。且匹配1006可由多種匹配網路架構實現。如所屬技術領域中具有通常知識者將瞭解,匹配1006用以將電漿1008之負載與產生器1004匹配。藉由匹配網路1006之正確設計(在產生器內部或如圖10中所展示在外部),有可能將負載之阻抗變換成接近產生器1004之所要負載阻抗的值。Generator 1004 may be a 13.56 MHz generator, although this is of course not required and other frequencies are of course encompassed. And the matching 1006 can be implemented by various matching network architectures. As will be appreciated by those of ordinary skill in the art, matching 1006 is used to match the load of plasma 1008 to generator 1004 . With proper design of the matching network 1006 (inside the generator or externally as shown in FIG. 10 ), it is possible to transform the impedance of the load to a value close to the desired load impedance of the generator 1004 .

初級線圈1002及/或次級線圈L 1至L N中之電流可為上文所提及之MIMO控制器所考慮的輸出之非限制性實例。電漿密度或指示諸如次級線圈L 1至L N中之電流等局部電漿密度之量測係MIMO控制器可考慮的輸出之其他非限制性實例。MIMO控制器可考慮之輸入包括但不限於產生器1004設定、匹配1006之設定及N個被動元件1012 1至1012 N的設定。 The currents in primary coil 1002 and/or secondary coils L 1 -L N may be non-limiting examples of outputs considered by the MIMO controllers mentioned above. Plasma density or measurements indicative of local plasma density such as current in secondary coils L 1 -L N are other non-limiting examples of outputs that may be considered by a MIMO controller. Inputs that may be considered by the MIMO controller include, but are not limited to, generator 1004 settings, matching 1006 settings, and N passive elements 1012 1 through 1012 N settings.

儘管圖中未示,但一或多個週期內控制器,諸如300、350或500,可提供對產生器1004、匹配1006及/或N個被動元件1012 1至1012 N中之一或多者的控制。 Although not shown, one or more in-cycle controllers, such as 300, 350, or 500, may provide one or more control.

接下來參考圖11A,展示了其中被動元件1112a(例如,可變電容器)及匹配1106a兩者均定位於同一外殼1120內之例示性實施例。如所展示,耦接至第一輸出導體1122之初級端子1121在外殼1120處或附近,該第一輸出導體將產生器1104(經由匹配1106a及初級端子1121)耦接至初級線圈1102。且定位於外殼1120處或附近之次級端子1123耦接至第二輸出導體1124,該第二輸出導體將被動端接元件1112及次級端子1123耦接至次級線圈1113。另外,控制部分1126(在本文中亦稱作控制器)(諸如如圖3至圖9中所描述之週期間控制器)經安置為接收信號1128、1130,該些信號分別指示來自第一感測器1132及第二感測器1134(例如,電流換能器)的第一輸出導體1122及第二輸出導體1124中之電流電平(其指示接近於線圈1102、1113之區域中的電漿1108之密度)。且控制部分1126亦經配置以控制被動元件1112a(例如,可變電容器)之值(例如,電容)。Referring next to FIG. 11A , an exemplary embodiment is shown in which the passive element 1112a (eg, a variable capacitor) and matching 1106a are both positioned within the same housing 1120 . As shown, primary terminal 1121 is at or near housing 1120 coupled to first output conductor 1122 , which couples generator 1104 (via matching 1106a and primary terminal 1121 ) to primary coil 1102 . And a secondary terminal 1123 located at or near housing 1120 is coupled to a second output conductor 1124 that couples passive termination element 1112 and secondary terminal 1123 to secondary coil 1113 . Additionally, a control portion 1126 (also referred to herein as a controller), such as an inter-cycle controller as described in FIGS. 3-9 , is arranged to receive signals 1128 , 1130 respectively indicative of The current level in the first output conductor 1122 and the second output conductor 1124 of the detector 1132 and the second sensor 1134 (e.g., a current transducer), which is indicative of the plasma in the area close to the coils 1102, 1113 1108 density). And the control portion 1126 is also configured to control the value (eg, capacitance) of the passive element 1112a (eg, a variable capacitor).

在圖11A中所描繪之實施例的變體中,替代電流感測器1132、1134(或除電流感測器1132、1134之外),其他感測組件(在外殼1120內或外部)可用以提供緊密接近線圈1113之電漿密度的指示。舉例而言,光學感測器可用以感測電漿屬性(例如,電漿密度),或提供基板偏壓至腔室1110之eV源可用以感測電漿屬性(例如,電漿密度及離子電流)。In variations of the embodiment depicted in FIG. 11A , instead of (or in addition to) current sensors 1132, 1134, other sensing components (inside or outside of housing 1120) may be used to provide An indication of the density of the plasma in close proximity to the coil 1113. For example, an optical sensor can be used to sense plasma properties such as plasma density, or an eV source that provides substrate bias to chamber 1110 can be used to sense plasma properties such as plasma density and ion density. current).

應認識到,圖11A中所描繪之組件為邏輯的且並不意欲形成硬體圖。舉例而言,控制部分1126及感測器1132、1134可各自藉由分散式組件實現,且可藉由硬體、韌體、軟體或其組合實施。在圖11A中所描繪之實施例的許多變體中,將所感測電流電平轉換成數位表示,且控制器1126使用電流信號1128、1130之數位表示以產生控制信號1135以驅動被動元件1112a。另外,匹配1106a可由控制部分1126控制或可分開控制。It should be appreciated that the components depicted in FIG. 11A are logical and are not intended to form a hardware diagram. For example, the control part 1126 and the sensors 1132, 1134 can each be implemented by distributed components, and can be implemented by hardware, firmware, software or a combination thereof. In many variations of the embodiment depicted in FIG. 11A, the sensed current level is converted to a digital representation, and the digital representation of the current signals 1128, 1130 is used by the controller 1126 to generate a control signal 1135 to drive the passive element 1112a. Additionally, matching 1106a may be controlled by control portion 1126 or may be separately controlled.

亦應認識到,為了簡單起見,描繪僅一個次級線圈1113及一個被動端接元件1112a,但當然經考慮,可結合兩個或更多個被動端接元件1112a(例如,容納於外殼1120內之兩個或更多個被動端接元件)來實施兩個或更多個次級線圈1113。It should also be appreciated that, for simplicity, only one secondary coil 1113 and one passive terminating element 1112a are depicted, but it is of course contemplated that two or more passive terminating elements 1112a may be combined (e.g., housed in housing 1120 Two or more passive termination elements within) to implement two or more secondary coils 1113.

在操作中,產生器1104經由匹配1106a將功率施加至初級線圈1102且初級線圈1102中之電流(其由第一感測器1132感測)誘發電漿1108中的電流,此轉而誘發次級線圈1113中之電流。且第二感測器1134感測流過次級線圈1113且因此流經第二輸出導體1124及次級端子1123之電流。如參考圖10所論述,不同於先前技術實施方案,由次級線圈1113施加至電漿1108之功率係衍生自流過初級線圈1102之電流。更特定言之,次級線圈1113經由電漿1108自初級線圈1102獲得功率。換言之,除經由電漿1108之互感以外,不存在用於次級線圈1113之直接電源。In operation, generator 1104 applies power to primary coil 1102 via matching 1106a and current in primary coil 1102 (which is sensed by first sensor 1132) induces a current in plasma 1108, which in turn induces a secondary Current in coil 1113. And the second sensor 1134 senses the current flowing through the secondary coil 1113 and thus through the second output conductor 1124 and the secondary terminal 1123 . As discussed with reference to FIG. 10 , unlike prior art implementations, the power applied by the secondary coil 1113 to the plasma 1108 is derived from the current flowing through the primary coil 1102 . More specifically, secondary coil 1113 receives power from primary coil 1102 via plasma 1108 . In other words, there is no direct power source for the secondary coil 1113 other than the mutual inductance via the plasma 1108 .

控制部分1126、感測器1132、1134及被動元件1112a共同形成控制系統以控制電漿1108之態樣(例如,電漿1108之空間分配及密度)。回應於初級線圈1102及次級線圈1113中之相對電流電平,此實施例中之控制部分1126經組態以更改被動元件1112a(例如,可變電容器)的值(例如,電容),使得初級線圈1102與次級線圈1113之間的電流之比係處於對應於腔室1110內之所要電漿密度輪廓的值。儘管圖中未示,但控制部分1126可包括人機介面(例如,顯示器及輸入控制件)以使得使用者能夠接收反饋且促進對電漿1108之控制。Control portion 1126, sensors 1132, 1134, and passive element 1112a together form a control system to control the state of plasma 1108 (eg, the spatial distribution and density of plasma 1108). In response to the relative current levels in the primary coil 1102 and the secondary coil 1113, the control portion 1126 in this embodiment is configured to change the value (eg, capacitance) of the passive element 1112a (eg, a variable capacitor) such that the primary The ratio of current between coil 1102 and secondary coil 1113 is at a value corresponding to a desired plasma density profile within chamber 1110 . Although not shown, the control portion 1126 may include a human interface (eg, a display and input controls) to enable a user to receive feedback and facilitate control of the plasma 1108 .

初級線圈1102及/或次級線圈1113中之電流係上文所提及之MIMO控制器之例示性輸出。電漿密度或指示諸如感測器1132、1134處之電流等局部電漿密度之量測係MIMO控制器可考慮之輸出的其他實例。MIMO控制器之輸入可包括但不限於產生器1104之設定、匹配1106a的設定及被動元件1112a之設定。The currents in primary coil 1102 and/or secondary coil 1113 are exemplary outputs of the MIMO controllers mentioned above. Plasma density or measurements indicative of local plasma density such as current at sensors 1132, 1134 are other examples of outputs that may be considered by a MIMO controller. Inputs to the MIMO controller may include, but are not limited to, settings for generator 1104, settings for matching 1106a, and settings for passive element 1112a.

儘管圖中未示,但一或多個週期內控制器,諸如300、350或500,可提供對產生器1104、匹配1106a及/或諸如被動元件1113等被動元件中之一或多者的控制。Although not shown, one or more in-cycle controllers, such as 300, 350, or 500, may provide control of one or more of generator 1104, match 1106a, and/or passive elements such as passive element 1113 .

接下來參考圖11B,展示了其中被動端接元件1112b係實施於與腔室緊密接近之單獨外殼(與匹配1106b及控制器分離)中之另一實施例。在本實施例中之組件以實質上與圖11A中所描繪之組件類似的方式操作,但被動元件1112b可實施為單獨器具或可與腔室整合。Referring next to FIG. 11B , another embodiment is shown in which the passive termination element 1112b is implemented in a separate housing (separate from the mating 1106b and controller) in close proximity to the chamber. The components in this embodiment operate in a substantially similar manner to the components depicted in FIG. 11A , although the passive element 1112b may be implemented as a separate appliance or may be integrated with the chamber.

初級線圈及/或次級線圈中之電流可為上文所提及之MIMO控制器考慮的輸出。電漿密度或指示諸如次級線圈中之電流等局部電漿密度之量測係MIMO控制器可考慮的輸出之其他實例。MIMO控制器可考慮之輸入包括但不限於產生器設定、匹配1106b中之可變電容器的設定及被動元件1112b之設定。The current in the primary coil and/or the secondary coil may be an output considered by the MIMO controller mentioned above. Plasma density or measurements indicative of local plasma density such as current in the secondary coil are other examples of outputs that may be considered by a MIMO controller. Inputs that may be considered by the MIMO controller include, but are not limited to, generator settings, settings for variable capacitors in matching 1106b, and settings for passive element 1112b.

儘管圖中未示,但一或多個週期內控制器,諸如300、350或500,可提供對產生器、匹配1106b之可變電容器及/或被動元件1112b中之一或多者的控制。Although not shown, one or more in-cycle controllers, such as 300, 350, or 500, may provide control of one or more of the generator, the variable capacitor matching 1106b, and/or the passive element 1112b.

接下來參考圖12,其為描繪可結合參考圖10至圖11B所描述之實施例而詳細研究的步驟之流程圖,其用於控制處理腔室(例如,腔室1008及1108)中電漿之空間分配。如所描繪,當將功率施加(例如,直接由產生器1004、1104經由匹配施加)至初級電感器(例如,初級線圈1002、1102)時,腔室中之電漿經激發(區塊1202)。此外,初級電感器經由電漿以感應方式耦接至N(N等於或大於一)個次級導體(例如,次級線圈L 1至L N或L secondary)中之每一者(區塊1204),且N個次級電感器中之每一者經端接以使得穿過N個次級電感器中之每一者的實質上所有電流由經由電漿與初級電感器之互感產生(區塊1206)。如先前所論述,穿過N個次級電感器中之每一者的電流影響電漿之空間分配。儘管不需要,但在一些變體中,調節穿過N個次級電感器之電流以便調節電漿之空間分配(區塊1208)。舉例而言,次級電感器可經由一或多個可變元件,諸如可變電抗元件,諸如可變電容器來端接。藉由調整端接(例如,次級電感器與地面之間的電容),方法1200可藉由使用較大數目個次級電感器而實現之控制的較大解析度或粒度來局部控制電漿密度。 Referring next to FIG. 12, which is a flowchart depicting the steps that may be studied in detail in conjunction with the embodiments described with reference to FIGS. space allocation. As depicted, when power is applied (e.g., directly from the generator 1004, 1104 via matching) to the primary inductor (e.g., the primary coil 1002, 1102), the plasma in the chamber is excited (block 1202) . In addition, the primary inductor is inductively coupled to each of N (N is equal to or greater than one) secondary conductors (eg, secondary coils L 1 through L N or L secondary ) via the plasma (block 1204 ), and each of the N secondary inductors is terminated such that substantially all of the current through each of the N secondary inductors results from the mutual inductance through the plasma and the primary inductor (region block 1206). As previously discussed, the current through each of the N secondary inductors affects the spatial distribution of the plasma. Although not required, in some variations the current through the N secondary inductors is adjusted in order to adjust the spatial distribution of the plasma (block 1208 ). For example, the secondary inductor may be terminated via one or more variable elements, such as variable reactive elements, such as variable capacitors. By adjusting the termination (e.g., the capacitance between the secondary inductors and ground), the method 1200 can locally control the plasma with greater resolution or granularity of control achieved using a larger number of secondary inductors density.

在一些實施例中,方法1200之控制可利用MIMO控制器,例如使用產生器、匹配及被動元件設定作為輸入,且與諸如初級線圈中之電流及次級線圈中之電流的輸出相關。 替代性實施例 In some embodiments, control of method 1200 may utilize a MIMO controller, eg, using generators, matching, and passive element settings as inputs and related to outputs such as current in the primary coil and current in the secondary coil. alternative embodiment

在一個實施例中,揭示一種功率遞送系統,其包含產生器及控制器。該產生器可經組態以產生功率信號,該功率信號包含在包含該功率信號之週期的時段內產生之週期性重複型樣。該控制器可經組態以基於在該功率信號之當前週期之前的該功率信號之週期中所進行的該週期性重複型樣之量測及多維控制輸入值之元素與多維輸出值之元素之間的複數個相關性而控制該週期性重複型樣之當前週期。該功率信號可經組態以經由初級電感器激發處理腔室中之電漿。該功率遞送系統可進一步包含用於經由電漿將初級電感器以感應方式耦接至N個次級電感器中之每一者的構件,其中N等於或大於一,且其中穿過N個次級電感器中之每一者的電流經組態以影響電漿之空間分配。In one embodiment, a power delivery system is disclosed that includes a generator and a controller. The generator can be configured to generate a power signal comprising a periodically repeating pattern generated over a period comprising a period of the power signal. The controller can be configured to base on measurements of the periodically repeating pattern in a period of the power signal prior to the current period of the power signal and a relationship between elements of multidimensional control input values and elements of multidimensional output values The current cycle of the periodically repeating pattern is controlled by a plurality of dependencies among them. The power signal can be configured to excite the plasma in the processing chamber via the primary inductor. The power delivery system may further include means for inductively coupling a primary inductor to each of N secondary inductors via a plasma, where N is equal to or greater than one, and where N passes through The current of each of the stage inductors is configured to affect the spatial distribution of the plasma.

該控制器可經組態以基於在當前週期之前的週期所進行之週期性重複型樣之量測結合在當前週期期間的週期性重複型樣之量測而控制週期性重複型樣。The controller can be configured to control the periodically repeating pattern based on measurements of the periodically repeating pattern made in a cycle preceding the current cycle in combination with measurements of the periodically repeating pattern during the current cycle.

該產生器可經組態以產生具有規定型樣之週期性重複型樣,其中該規定型樣以重複週期重複,且其中在當前週期之前的週期中進行之週期性重複型樣之量測發生在過去一或多個重複週期。該控制器亦可經組態以判定且使用週期性重複型樣中之特定時段的多維控制輸入值之元素與相同特定時段的多維輸出值之元素之間的相關性。該控制器亦可經組態以擾動控制輸入以獲得多維控制輸入值之元素與多維輸出值之元素之間的相關性。週期性重複型樣中之特定時段及鄰近於該特定時段之時段的多維控制輸入值之元素與該特定時段的多維輸出值之元素之間的相關性可經判定且供控制器使用。多維控制輸入值之元素與多維輸出值之元素之間的相關性可藉由擾動控制輸入且觀測對該擾動之響應來判定。週期性重複型樣之一個元素可為電壓、電流及功率中之一者或其組合,且週期性重複型樣之另一元素可為呈現給產生器的阻抗及產生器之源極阻抗中之一者。週期性重複型樣之一個元素可為電壓、電流及功率中之一者或其組合,且週期性重複型樣之另一元素為呈現給產生器的阻抗及產生器之源極阻抗中之一者。The generator can be configured to generate a periodically repeating pattern of a prescribed pattern, wherein the prescribed pattern repeats at a repeating period, and wherein measurements of the periodically repeating pattern taken in a period preceding the current period occur One or more recurrences in the past. The controller can also be configured to determine and use correlations between elements of the multidimensional control input values for specific periods of time and elements of the multidimensional output values for the same specific time periods in a periodically repeating pattern. The controller can also be configured to perturb the control input to obtain a correlation between elements of the multidimensional control input value and elements of the multidimensional output value. Correlations between elements of the multidimensional control input value for a particular time period and periods adjacent to the particular time period in the periodically repeating pattern and elements of the multidimensional output value for the particular time period can be determined and used by the controller. The correlation between elements of the multidimensional control input value and elements of the multidimensional output value can be determined by perturbing the control input and observing the response to the perturbation. One element of the periodically repeating pattern may be one or a combination of voltage, current, and power, and the other element of the periodically repeating pattern may be one of the impedance presented to the generator and the source impedance of the generator one. One element of the periodically repeating pattern may be one or a combination of voltage, current, and power, and the other element of the periodically repeating pattern is one of the impedance presented to the generator and the source impedance of the generator By.

該產生器可為單個射頻產生器或直流產生器中之一者,且週期性重複型樣為電壓、電流及功率中之至少一者。The generator can be one of a single radio frequency generator or a direct current generator, and the periodically repeating pattern is at least one of voltage, current and power.

該產生器可包含複數個射頻產生器或複數個直流產生器或射頻產生器與直流產生器之組合,且週期性重複型樣為遞送至電漿系統的電壓、電流及功率中之至少一者。The generator may comprise a plurality of radio frequency generators or a plurality of direct current generators or a combination of radio frequency generators and direct current generators, and the periodically repeating pattern is at least one of voltage, current and power delivered to the plasma system .

在另一實施例中,揭示一種功率遞送系統,其具有產生器、控制器、初級電感器及N個次級電感器。該產生器可經組態以產生功率信號,該功率信號包含在包含該功率信號之週期的時段內產生之週期性重複型樣,該功率信號經組態以經由初級電感器激發處理腔室中之電漿。該控制器可經組態以基於多維控制輸入值之元素與多維輸出值之元素之間的複數個相關性而控制週期性重複型樣之當前週期,其中該些輸出值係在該當前週期之前的功率信號之週期中量測。N個次級電感器可具有經組態以在空間上影響電漿之分配之電流。由N個次級電感器施加之功率可實質上衍生自流過初級線圈之電流。In another embodiment, a power delivery system is disclosed having a generator, a controller, a primary inductor, and N secondary inductors. The generator can be configured to generate a power signal comprising a periodically repeating pattern generated over a period that includes the period of the power signal, the power signal configured to excite a process chamber via a primary inductor The plasma. The controller can be configured to control a current period of a periodically repeating pattern based on a plurality of correlations between elements of multidimensional control input values and elements of multidimensional output values, wherein the output values precede the current period The period measurement of the power signal. The N secondary inductors may have currents configured to spatially affect the distribution of the plasma. The power applied by the N secondary inductors can be derived substantially from the current flowing through the primary coil.

控制系統可經組態以組合自一或多個先前重複週期進行之量測與自當前重複週期進行之量測。控制系統可經組態以產生且使用在相對於重複週期之開始之一個時刻的多維控制輸入值之複數個控制輸入元素與在相對於重複週期之開始之相同時刻的多維輸出值之複數個輸出元素之間的相關性。控制系統可經組態以擾動控制輸入且量測對擾動之響應,以產生多維控制輸入值之控制輸入元素與多維輸出值之輸出元素之間的相關性。控制系統經組態以判定且使用在相對於重複週期之開始之一個時刻及在鄰近該一個時刻的時刻的多維控制輸入值之複數個控制輸入元素與在相對於重複週期之開始之一個時刻的多維輸出值之輸出元素之間的相關性。控制系統可經組態以藉由擾動控制輸入且量測對擾動之響應來產生多維控制輸入值之控制輸入元素與多維輸出值之輸出元素之間的相關性。功率遞送系統可包含單個射頻(RF)或直流(DC)產生器,且輸出之元素包含遞送至電漿系統的電壓、電流及功率電平中之至少一者。功率遞送系統可包含各自包含RF產生器、DC產生器或RF與DC產生器之組合的複數個產生器,且該複數個產生器之輸出中之每一者的元素包含電壓、電流及功率電平中之至少一者。該輸出之輸出元素中的一者可包含電壓、電流及功率中之至少一者,其中該輸出之另一輸出元素可包含呈現給產生器的負載阻抗及產生器之源極阻抗中之至少一者。該輸出之一個輸出元素可包含電壓、電流及功率電平中之至少一者,其中該輸出之另一輸出元素可包含呈現給產生器的負載阻抗及產生器之源極阻抗中之至少一者。The control system can be configured to combine measurements taken from one or more previous iterations with measurements taken from the current iteration. The control system can be configured to generate and use a plurality of control input elements of a multidimensional control input value at one time relative to the start of the repeat period and a plurality of outputs of the multidimensional output value at the same time relative to the start of the repeat period Dependencies between elements. The control system can be configured to perturb the control input and measure the response to the perturbation to generate correlations between control input elements of multidimensional control input values and output elements of multidimensional output values. The control system is configured to determine and use a plurality of control input elements of multidimensional control input values at a time relative to the beginning of the repeating period and at times adjacent to the one time and a value at a time relative to the beginning of the repeating period Correlation between output elements of multidimensional output values. A control system can be configured to generate a correlation between a control input element of a multidimensional control input value and an output element of a multidimensional output value by perturbing a control input and measuring the response to the disturbance. The power delivery system may include a single radio frequency (RF) or direct current (DC) generator, and elements of the output include at least one of voltage, current, and power level delivered to the plasma system. The power delivery system may include a plurality of generators each including an RF generator, a DC generator, or a combination of RF and DC generators, and elements of the output of each of the plurality of generators include voltage, current, and power voltage. At least one of the average. One of the output elements of the output may comprise at least one of voltage, current and power, wherein another output element of the output may comprise at least one of a load impedance presented to the generator and a source impedance of the generator By. One output element of the output may comprise at least one of voltage, current, and power level, wherein another output element of the output may comprise at least one of a load impedance presented to the generator and a source impedance of the generator .

在一個實施例中,揭示一種用於控制處理腔室中之電漿之空間分配的系統。該系統可包括初級端子、次級端子及控制器。該初級端子可經組態以耦接至電漿處理腔室之初級電感器且主動地將功率施加至該初級電感器。該次級端子可經組態以耦接至電漿處理腔室之對應次級電感器。穿過次級電感器之實質上所有電流由經由電漿與初級電感器之互感產生。控制器可經組態以控制遞送至該初級端子之功率信號的週期性重複型樣之當前週期。該控制可基於多維控制輸入值之元素與多維輸出值之元素之間的複數個相關性,其中該些輸出值係在當前週期之前的功率信號之週期中量測。在一實施例中,次級端子可耦接至端接元件,諸如可變電容器或某一其他可變電抗元件。In one embodiment, a system for controlling spatial distribution of plasma in a processing chamber is disclosed. The system may include primary terminals, secondary terminals and a controller. The primary terminal can be configured to couple to and actively apply power to a primary inductor of a plasma processing chamber. The secondary terminals can be configured to couple to corresponding secondary inductors of the plasma processing chamber. Substantially all of the current through the secondary inductor results from mutual inductance through the plasma and the primary inductor. The controller can be configured to control the current period of the periodically repeating pattern of the power signal delivered to the primary terminal. The control may be based on complex correlations between elements of multidimensional control input values and elements of multidimensional output values measured in periods of the power signal preceding the current period. In an embodiment, the secondary terminals may be coupled to a terminating element, such as a variable capacitor or some other variable reactive element.

在另一實施例中,揭示一種用於控制包括初級電感器及N個次級電感器之處理腔室中的電漿之空間分配的方法。該方法可包括:藉由初級電感器在處理腔室中激發電漿;經由該電漿將該初級電感器以感應方式耦接至N個次級電感器中之每一者,其中N等於或大於一;以及端接N個次級電感器中之每一者,使得穿過N個次級電感器中之每一者的實質上所有電流由經由該電漿與該初級電感器之互感產生,穿過N個次級電感器中之每一者的該電流影響該電漿之空間分配。In another embodiment, a method for controlling spatial distribution of plasma in a processing chamber including a primary inductor and N secondary inductors is disclosed. The method may include: exciting a plasma in the processing chamber with a primary inductor; inductively coupling the primary inductor to each of N secondary inductors via the plasma, where N is equal to or greater than one; and terminating each of the N secondary inductors such that substantially all of the current through each of the N secondary inductors results from mutual inductance through the plasma and the primary inductor , the current through each of the N secondary inductors affects the spatial distribution of the plasma.

該端接可包括被動地端接N個次級電感器中之每一者。該方法可進一步包括調節穿過N個次級電感器之電流以便調節電漿之空間分配。該方法可進一步包括藉由阻抗可調式端接元件來端接N個次級電感器中之每一者,且調節穿過N個次級電感器的電流包括藉由調整該些阻抗可調式端接元件中之每一者之阻抗來調節該電流。該方法亦可感測指示接近N個次級電感器之區域中之電漿密度之至少一個參數,且回應於該感測而調整阻抗可調式端接元件之阻抗。該方法亦可感測在N個次級電感器中之每一者中之電流,且藉由調整阻抗可調式端接元件之電容來調整阻抗可調式端接元件之阻抗。The termination may include passively terminating each of the N secondary inductors. The method may further include adjusting the current through the N secondary inductors to adjust the spatial distribution of the plasma. The method may further include terminating each of the N secondary inductors by an impedance-tunable termination element, and adjusting the current through the N secondary inductors includes adjusting the impedance-tunable terminations The impedance of each of the connecting elements is used to adjust the current. The method can also sense at least one parameter indicative of plasma density in a region proximate to the N secondary inductors, and adjust the impedance of the impedance-tunable terminating element in response to the sensing. The method can also sense the current in each of the N secondary inductors and adjust the impedance of the impedance-adjustable termination element by adjusting the capacitance of the impedance-adjustable termination element.

本揭示內容的另一實施例可描述為一種用於控制處理腔室中之電漿之空間分配的設備,該設備包含初級端子、次級端子及耦接至次級端子之端接元件。該初級端子可經組態以耦接至電漿處理腔室之初級電感器且主動地將功率施加至該初級電感器。該次級端子可經組態以耦接至電漿處理腔室之對應次級電感器。端接元件可安置為提供路徑以供電流流過次級感應組件,其中穿過次級電感器及端接元件之實質上所有電流由穿過電漿與初級電感器的互感產生。Another embodiment of the present disclosure may be described as an apparatus for controlling the spatial distribution of a plasma in a processing chamber, the apparatus including a primary terminal, a secondary terminal, and a termination element coupled to the secondary terminal. The primary terminal can be configured to couple to and actively apply power to a primary inductor of a plasma processing chamber. The secondary terminals can be configured to couple to corresponding secondary inductors of the plasma processing chamber. The terminating element may be positioned to provide a path for current to flow through the secondary inductive component, wherein substantially all of the current through the secondary inductor and terminating element is generated by mutual inductance through the plasma and primary inductor.

總之,本揭示內容尤其提供一種方法、系統及設備,其使用MIMO控制藉由主動驅動線圈及一或多個被動端接之電感器實現可控制的電漿密度。所屬技術領域中具有通常知識者可易於認識到,可在本揭示內容、其用途及其組態中進行眾多變化及替代,以達成與由本文中所描述之實施例所達成之結果實質上相同的結果。因此,並不意欲將本揭示內容限於所揭示之例示性形式。許多變化、修改及替代構造處於本揭示內容之範圍及精神內。In summary, the present disclosure provides, inter alia, a method, system, and apparatus for achieving controllable plasma density by actively driving a coil and one or more passively terminated inductors using MIMO control. Those of ordinary skill in the art can readily recognize that numerous changes and substitutions can be made in the present disclosure, its use, and its configuration to achieve substantially the same results as those achieved by the embodiments described herein. the result of. Accordingly, there is no intention to limit the disclosure to the exemplary forms disclosed. Many variations, modifications and alternative constructions are within the scope and spirit of the disclosure.

101:輸入/設定點 102:誤差信號 103:控制器 104:控制輸入 105:器件 106:輸出 151:輸入/設定點 152:誤差信號 153:控制器 154:控制輸入 155:器件 156:輸出 157:取樣器 158:數位至類比轉換器 159:取樣器 200:響應 201:輸入 202:輸出 203:給定點A/點A 204:單元 205:週期 250:響應 251:輸入 252:輸出 253:點A 254:正規化時間移位時間反轉脈衝響應 300:週期間控制器/控制器/週期內控制器 301:區塊/控制器 302:區塊 303:設定點/輸入 304:類比至數位轉換器/轉換器 305:開關 306:開關 307:數位至類比轉換器 308:器件 309:輸出 310:誤差函數 311:誤差函數 312:輸出 313:取樣器 350:週期間控制器/週期內控制器 351:設定點/輸入 352:類比至數位轉換器/轉換器 353:誤差函數 354:控制器 355:器件 356:數位至類比轉換器 357:器件 358:輸出 359:類比至數位轉換器 400:響應 401:週期性輸入 402:輸出 403:輸入 404:輸出 450:響應 451:點A 500:組合週期間及週期內控制器/週期間控制器/週期內控制器/組合週期間控制器及週期內控制器 501:設定點/輸入 502:類比至數位轉換器/轉換器 503:誤差函數 504:控制器 505:等式 506:器件/控制輸入 507:數位至類比轉換器 508:器件 509:輸出 510:類比至數位轉換器 900:組合週期間及週期內控制器 901:輸入 902:類比至數位轉換器/轉換器 903:控制器 904:控制輸入/器件 905:數位至類比轉換器 906:器件 907:輸出 908:擾動 909:類比至數位轉換器 910:記憶體 1000:以感應方式耦接之電漿處理系統 1002:初級線圈 1004:產生器 1006:匹配/匹配網路 1008:電漿 1010:電漿處理腔室/腔室 1012 1:被動元件 1012 2:被動元件 1012 3:被動元件 1102:初級線圈/線圈 1104:產生器 1106a:匹配 1106b:匹配 1108:電漿 1110:腔室 1112a:被動元件/被動端接元件 1112b:被動元件/被動端接元件 1113:次級線圈/線圈 1120:外殼 1121:初級端子 1122:第一輸出導體 1123:次級端子 1124 第二輸出導體 1126:控制部分/控制器 1128:信號/電流信號 1130:信號/電流信號 1132:第一感測器/電流感測器/感測器 1134:第二感測器/電流感測器/感測器 1135:控制信號 1202:區塊 1204:區塊 1206:區塊 1208:區塊 c:控制輸入/器件 e:誤差函數 L 1:次級線圈/線圈/次級電感器 L 2:次級線圈/線圈/次級電感器 L N:次級線圈/線圈/次級電感器 L secondary:次級線圈 P:器件 T p:週期/重複週期/波形週期/輸入週期 T s:取樣週期/樣本週期 y:輸出 101: Input/Setpoint 102: Error Signal 103: Controller 104: Control Input 105: Device 106: Output 151: Input/Setpoint 152: Error Signal 153: Controller 154: Control Input 155: Device 156: Output 157: Sampler 158: DAC 159: Sampler 200: Response 201: Input 202: Output 203: Set Point A/Point A 204: Unit 205: Period 250: Response 251: Input 252: Output 253: Point A 254 : Normalized Time-Shifted Time-Reversed Impulse Response 300: Periodic Controller/Controller/Intra-Cycle Controller 301: Block/Controller 302: Block 303: Setpoint/Input 304: Analog-to-Digital Converter/ Converter 305: Switch 306: Switch 307: Digital to Analog Converter 308: Device 309: Output 310: Error Function 311: Error Function 312: Output 313: Sampler 350: Intercycle Controller/Intracycle Controller 351: Setting Points/Inputs 352: Analog to Digital Converter/Converter 353: Error Function 354: Controller 355: Device 356: Digital to Analog Converter 357: Device 358: Output 359: Analog to Digital Converter 400: Response 401: Period Sexual input 402: output 403: input 404: output 450: response 451: point A 500: combined inter-cycle and intra-cycle controller / inter-cycle controller / intra-cycle controller / combined inter-cycle controller and intra-cycle controller 501 : Setpoint/Input 502: Analog to Digital Converter/Converter 503: Error Function 504: Controller 505: Equation 506: Device/Control Input 507: Digital to Analog Converter 508: Device 509: Output 510: Analog to Digitizer 900: Combined Intercycle and Intercycle Controller 901: Input 902: Analog to Digital Converter/Converter 903: Controller 904: Control Input/Device 905: Digital to Analog Converter 906: Device 907: Output 908 : Perturbation 909 : Analog-to-Digital Converter 910 : Memory 1000 : Inductively Coupled Plasma Processing System 1002 : Primary Coil 1004 : Generator 1006 : Matching/Matching Network 1008 : Plasma 1010 : Plasma Processing Chamber Chamber/chamber 1012 1 : passive element 1012 2 : passive element 1012 3 : passive element 1102: primary coil/coil 1104: generator 1106a: matching 1106b: matching 1108: plasma 1110: chamber 1112a: passive element/passive end Connecting element 1112b: passive element/passive termination element 1113: secondary coil/coil 1120: housing 1121: primary terminal 1122: first output conductor 1123: secondary terminal 1124 second output conductor 1126: control section/controller 1128: Signal/Current Signal 1130: Letter Number/Current Signal 1132: First Sensor/Current Sensor/Sensor 1134: Second Sensor/Current Sensor/Sensor 1135: Control Signal 1202: Block 1204: Block 1206: Block 1208: Block c: Control Input/Device e: Error Function L1 : Secondary Coil/Coil/Secondary Inductor L2 : Secondary Coil/Coil/Secondary Inductor LN : Secondary Coil/Coil /secondary inductor L secondary :secondary coil P:device T p :period/repetitive period/waveform period/input period T s :sampling period/sample period y:output

本揭示內容之技術的各種特徵及優點將從這些技術之特定實施例之以下描述顯而易見,如隨附圖式中所繪示。應注意,圖式未必按比例繪製;然而,重點實際上放在繪示技術概念之原理上。另外,在圖式中,相同元件符號在不同視圖中可指代相同部件。各圖式僅描繪本揭示內容之典型實施例,且因此不應被視為在範圍上係限制性的。Various features and advantages of the techniques of this disclosure will be apparent from the following descriptions of specific embodiments of these techniques, as illustrated in the accompanying drawings. It should be noted that the drawings are not necessarily to scale; however, emphasis is instead placed upon illustrating the principles of technical concepts. In addition, in the drawings, the same reference numerals may refer to the same components in different views. The drawings depict only typical embodiments of the disclosure, and therefore should not be considered limiting in scope.

[圖1A]繪示可用於控制電漿功率遞送系統之簡單類比週期內控制系統。[FIG. 1A] A simple analog intra-cycle control system that can be used to control a plasma power delivery system is shown.

[圖1B]繪示可用於控制電漿功率遞送系統之簡單數位週期內控制系統。[ FIG. 1B ] shows a simple digital cycle control system that can be used to control the plasma power delivery system.

[圖2A]繪示相對緩慢週期內控制系統對週期性輸入之響應。[FIG. 2A] shows the response of the control system to a periodic input during a relatively slow period.

[圖2B]繪示相對快速週期內控制系統對週期性輸入之響應。[FIG. 2B] shows the response of the control system to a periodic input in a relatively fast period.

[圖3A]及[圖3B]繪示根據本揭示內容之實施例的可實施於電漿功率遞送系統中之實例週期間控制器的方塊圖。[ FIG. 3A ] and [ FIG. 3B ] depict block diagrams of example cycle-to-cycle controllers that may be implemented in a plasma power delivery system according to embodiments of the present disclosure.

[圖4A]至[圖4D]繪示實例週期間控制器對週期性輸入之響應。[FIG. 4A] to [FIG. 4D] illustrate the controller's response to periodic input during example cycles.

[圖5]繪示根據本揭示內容之一個實施例的可實施於電漿功率遞送系統中之實例組合週期間及週期內控制器的方塊圖。[ FIG. 5 ] A block diagram illustrating an example combined inter-cycle and intra-cycle controller that may be implemented in a plasma power delivery system according to one embodiment of the present disclosure.

[圖6A]繪示隨實例純週期間控制器之頻率而變化之迴路增益。[FIG. 6A] shows the loop gain as a function of frequency of an example pure periodic controller.

[圖6B]繪示用於產生圖6A之迴路增益之週期間控制器的迴路增益之奈奎斯(Nyquist)曲線。[ FIG. 6B ] shows a Nyquist curve of the loop gain of the cycle-to-cycle controller used to generate the loop gain of FIG. 6A .

[圖6C]繪示隨產生圖6A之迴路增益的週期間控制器之頻率而變化的封閉迴路響應。[FIG. 6C] shows the closed loop response as a function of the frequency of the controller during the cycle that produces the loop gain of FIG. 6A.

[圖6D]繪示隨在純週期間控制器之輸入波形之諧波處及附近的頻率而變化之封閉迴路響應。[FIG. 6D] Shows the closed loop response as a function of frequency at and near harmonics of the controller's input waveform during pure cycles.

[圖7A]繪示隨實例組合之週期間及週期內控制器的頻率而變化之迴路增益,其中對於週期間部件具有0.1加權且對於週期內部件具有0.9加權。[ FIG. 7A ] Shows the loop gain as a function of the frequency of the inter-cycle and intra-cycle controllers for an example combination with 0.1 weighting for the inter-cycle component and 0.9 weighting for the in-cycle component.

[圖7B]繪示與圖7A相關之迴路增益之奈奎斯曲線。[FIG. 7B] shows the Nyquis curve of the loop gain related to FIG. 7A.

[圖7C]繪示隨與圖7A相關之實例組合控制器之頻率而變化的封閉迴路響應。[FIG. 7C] Shows the closed loop response as a function of frequency for the example combined controller associated with FIG. 7A.

[圖7D]繪示隨在與圖7A相關的組合週期間及週期內控制器之輸入波形之諧波處及附近的頻率而變化之封閉迴路響應。[ FIG. 7D ] Shows the closed loop response as a function of frequency at and near harmonics of the controller's input waveform during and during the combined cycle associated with FIG. 7A .

[圖8A]繪示隨實例組合之週期間及週期內控制器的頻率而變化之迴路增益,其中對於週期間部件具有0.01加權且對於週期內部件具有0.99加權。[ FIG. 8A ] Shows the loop gain as a function of the frequency of the inter-cycle and intra-cycle controllers for an example combination with a weight of 0.01 for the inter-cycle component and a 0.99 weight for the in-cycle component.

[圖8B]繪示與圖8A相關之組合控制器之迴路增益的奈奎斯曲線。[FIG. 8B] A Nyquis curve showing the loop gain of the combined controller associated with FIG. 8A.

[圖8C]繪示隨與圖8A相關之組合控制器之頻率而變化的封閉迴路響應。[FIG. 8C] shows the closed loop response as a function of frequency of the combined controller associated with FIG. 8A.

[圖8D]繪示隨在與圖8A相關的相同組合週期間及週期內控制器之輸入波形之諧波處及附近的頻率而變化之封閉迴路響應。[ FIG. 8D ] Shows the closed loop response as a function of frequency at and near harmonics of the controller's input waveform during and around the same combined cycle associated with FIG. 8A .

[圖9]繪示根據本揭示內容之一個實施例的組合週期間及週期內控制器之多輸入多輸出版本之方塊圖。[ FIG. 9 ] Illustrates a block diagram of a MIMO version of a combined inter-cycle and intra-cycle controller according to one embodiment of the present disclosure.

[圖10]係描繪本揭示內容之一例示性實施例之方塊圖。[ FIG. 10 ] is a block diagram depicting an exemplary embodiment of the present disclosure.

[圖11A]係描繪本揭示內容之另一例示性實施例之方塊圖。[ FIG. 11A ] is a block diagram depicting another exemplary embodiment of the present disclosure.

[圖11B]係描繪本揭示內容之又一實施例之方塊圖。[ FIG. 11B ] is a block diagram depicting yet another embodiment of the present disclosure.

[圖12]係描繪可結合參考圖10至圖11所描述之實施例而詳細研究的方法之流程圖。[ FIG. 12 ] is a flowchart depicting a method that can be studied in detail in conjunction with the embodiments described with reference to FIGS. 10 to 11 .

1102:初級線圈/線圈 1102: primary coil/coil

1104:產生器 1104: generator

1106a:匹配 1106a: match

1108:電漿 1108: Plasma

1110:腔室 1110: chamber

1112a:被動元件/被動端接元件 1112a: Passive components/passive termination components

1113:次級線圈/線圈 1113: Secondary coil/coil

1120:外殼 1120: shell

1121:初級端子 1121: primary terminal

1122:第一輸出導體 1122: first output conductor

1123:次級端子 1123: Secondary terminal

1124:第二輸出導體 1124: second output conductor

1126:控制部分/控制器 1126: Control part/controller

1128:信號/電流信號 1128: signal/current signal

1130:信號/電流信號 1130: signal/current signal

1132:第一感測器/電流感測器/感測器 1132: first sensor/current sensor/sensor

1134:第二感測器/電流感測器/感測器 1134: second sensor/current sensor/sensor

1135:控制信號 1135: control signal

Claims (20)

一種用於控制處理腔室中之電漿的空間分配之系統,其包含: 一控制系統; 一記憶體,其與該控制系統通信; 一初級電感器及N個次級電感器,該初級電感器和該N個次級電感器被配置為由該電漿間隔開; 其中該控制系統經組態以: 儲存多維控制輸入值之元素與多維輸出值之元素之間的複數個相關性; 基於該多維控制輸入值之該些元素與該多維輸出值之該些元素之間的所儲存之該複數個相關性而控制該初級電感器中之電流,其中該複數個相關性係自該初級電感器中之該電流的一或多個先前週期獲取, 其中,該初級電感器中之該電流實質上誘發該N個次級電感器中之所有電流,且其中該N個次級電感器中之電流經組態以在空間上影響該電漿之分配。 A system for controlling spatial distribution of a plasma in a processing chamber comprising: a control system; a memory in communication with the control system; a primary inductor and N secondary inductors configured to be spaced apart by the plasma; where the control system is configured to: storing a plurality of correlations between elements of the multidimensional control input value and elements of the multidimensional output value; The current in the primary inductor is controlled based on the plurality of stored correlations between the elements of the multidimensional control input value and the elements of the multidimensional output value, wherein the plurality of correlations are obtained from the primary One or more previous cycle acquisitions of the current in the inductor, wherein the current in the primary inductor induces substantially all current in the N secondary inductors, and wherein the current in the N secondary inductors is configured to spatially affect the distribution of the plasma . 如請求項1之系統,其中該N個次級電感器中之每一者耦接至一阻抗可調式被動端接元件。The system of claim 1, wherein each of the N secondary inductors is coupled to an impedance adjustable passive termination element. 如請求項2之系統,其進一步包含: 用於感測指示靠近該N個次級電感器之區域中之電漿密度之至少一個參數的構件,以及用於回應於該感測而調整該些阻抗可調式被動端接元件之阻抗的構件。 As the system of claim 2, it further includes: means for sensing at least one parameter indicative of plasma density in a region proximate the N secondary inductors, and means for adjusting impedance of the impedance-tunable passive termination elements in response to the sensing . 如請求項1之系統,其進一步包含用於感測該N個次級電感器中之每一者中之電流的構件,以及用於調整該些阻抗可調式被動端接元件之電容的構件。The system of claim 1, further comprising means for sensing current in each of the N secondary inductors, and means for adjusting capacitance of the impedance adjustable passive termination elements. 一種用於控制處理腔室中之電漿的空間分配之系統,其包含: 一初級電感器,其經組態以接收一功率信號,該功率信號包含一週期性重複型樣,該週期性重複型樣在包含該功率信號之一週期的一時段內產生,該功率信號經組態以經由該初級電感器激發該處理腔室中之該電漿; 一控制器,其經組態以基於多維控制輸入值之元素與多維輸出值之元素之間的複數個相關性而控制該週期性重複型樣之一當前週期,其中該些輸出值係在該當前週期之前的該功率信號之一週期中量測;以及 用於經由該電漿將該初級電感器以感應方式耦接至N個次級電感器中之每一者的構件,其中N等於或大於一,且其中穿過該N個次級電感器中之每一者的電流經組態以影響該電漿之該空間分配。 A system for controlling spatial distribution of a plasma in a processing chamber comprising: a primary inductor configured to receive a power signal comprising a periodically repeating pattern generated during a period comprising a period of the power signal via configured to excite the plasma in the processing chamber via the primary inductor; A controller configured to control a current period of the periodically repeating pattern based on a plurality of correlations between elements of multidimensional control input values and elements of multidimensional output values, wherein the output values are at the measured in a cycle of the power signal preceding the current cycle; and means for inductively coupling the primary inductor to each of N secondary inductors via the plasma, where N is equal to or greater than one, and wherein passes through the N secondary inductors The current of each is configured to affect the spatial distribution of the plasma. 如請求項5之系統,其進一步包含用於端接該N個次級電感器中之每一者的構件,其使得穿過該N個次級電感器中之每一者的實質上所有電流由經由該電漿與該初級電感器之互感來產生。The system of claim 5, further comprising means for terminating each of the N secondary inductors such that substantially all current passes through each of the N secondary inductors Produced by the mutual inductance through the plasma and the primary inductor. 如請求項6之系統,其中該用於端接該N個次級電感器中之每一者的構件包含用於被動地端接該N個次級電感器中之每一者的構件。The system of claim 6, wherein the means for terminating each of the N secondary inductors comprises means for passively terminating each of the N secondary inductors. 如請求項6之系統,其中該用於端接的構件包含一阻抗可調式被動端接元件,以便使得能夠調整穿過該N個次級電感器之電流。The system of claim 6, wherein the means for terminating includes an impedance-adjustable passive terminating element, so as to enable adjustment of current through the N secondary inductors. 如請求項8之系統,其中該控制器經組態以回應於指示該電漿之該空間分配的一信號而調整該阻抗可調式被動端接元件之一阻抗。The system of claim 8, wherein the controller is configured to adjust an impedance of the impedance-tunable passive termination element in response to a signal indicative of the spatial allocation of the plasma. 如請求項5之系統,其進一步包含用於調節穿過該N個次級電感器之電流以便調節該電漿之該空間分配的構件。The system of claim 5, further comprising means for adjusting current through the N secondary inductors to adjust the spatial distribution of the plasma. 如請求項10之系統,其中該用於端接該N個次級電感器中之每一者的構件包含用於藉由一阻抗可調式端接元件來端接該N個次級電感器中之每一者的構件,且該用於調節穿過該N個次級電感器之電流的構件包含用於調整該些阻抗可調式端接元件中之每一者之一阻抗的構件。The system of claim 10, wherein the means for terminating each of the N secondary inductors includes terminating one of the N secondary inductors by an impedance adjustable termination element means for each of the N secondary inductors, and the means for adjusting current through the N secondary inductors includes means for adjusting an impedance of each of the impedance-adjustable terminating elements. 如請求項5之系統,其中該N個次級電感器並不具有一直接功率饋送。The system of claim 5, wherein the N secondary inductors do not have a direct power feed. 如請求項5之系統,其中該N個次級電感器中之每一者耦接至一可變電抗元件,且該可變電抗元件之調整影響該電漿之該空間分配。The system of claim 5, wherein each of the N secondary inductors is coupled to a varactor, and adjustment of the varactor affects the spatial distribution of the plasma. 如請求項5之系統,其中該些多維輸出值中之一者係靠近該N個次級電感器中之每一者的電漿密度之一量度。The system of claim 5, wherein one of the multidimensional output values is a measure of plasma density near each of the N secondary inductors. 一種用於控制處理腔室中之電漿的空間分配之系統,其包含: 一電漿處理腔室,其用以容納一電漿; 一產生器,其產生一功率信號,該功率信號藉由以一重複週期而重複之一週期性調變型樣來調變該電漿之電漿屬性; 一阻抗匹配網路,其耦接於該電漿處理腔室與該產生器之間; 一初級線圈;以及 N個次級線圈,其具有經組態以在空間上影響該電漿之分配的電流,且其中藉由該N個次級線圈施加至該電漿之功率實質上衍生自流過該初級線圈之電流;以及 控制構件,其可操作地耦接至該阻抗匹配網路,該控制構件包含用於基於指示過去在該週期性調變型樣之一或多個重複週期取得之一負載阻抗的一量測及多維控制輸入值之元素與多維輸出值之元素之間的複數個相關性而控制該阻抗匹配網路中之一可變阻抗元件的構件。 A system for controlling spatial distribution of a plasma in a processing chamber comprising: a plasma processing chamber for containing a plasma; a generator that generates a power signal that modulates the plasma properties of the plasma by repeating a periodic modulation pattern with a repetition period; an impedance matching network coupled between the plasma processing chamber and the generator; a primary coil; and N secondary coils having currents configured to spatially affect distribution of the plasma, and wherein power applied to the plasma by the N secondary coils is substantially derived from flow through the primary coils current; and control means, operatively coupled to the impedance matching network, the control means comprising a measure and multi-dimensional information for indicating a load impedance obtained at one or more repetitions of the periodic modulation pattern in the past A means for controlling a variable impedance element in the impedance matching network by controlling a plurality of correlations between elements of the input value and elements of the multidimensional output value. 如請求項15之系統,其進一步包含一端接元件,該端接元件耦接至該N個次級線圈中之每一者,使得該N個次級線圈中之實質上所有電流衍生自經由該電漿與該初級線圈之互感。The system of claim 15, further comprising a terminating element coupled to each of the N secondary coils such that substantially all current in the N secondary coils is derived from passing through the N secondary coils The mutual inductance between the plasma and the primary coil. 如請求項16之系統,其中該端接元件係一阻抗可調式被動端接元件。The system according to claim 16, wherein the terminating element is an impedance-adjustable passive terminating element. 如請求項16之系統,其中, 該控制構件進一步包含用以回應於指示該電漿之該分配的至少一個信號而控制該阻抗可調式被動端接元件之阻抗的構件。 The system of claim 16, wherein, The control means further includes means for controlling the impedance of the impedance-tunable passive termination element in response to at least one signal indicative of the distribution of the plasma. 如請求項16之系統,其中該端接元件包含一可變電容器。The system of claim 16, wherein the terminating element comprises a variable capacitor. 如請求項16之系統,其中該多維輸出值之該些元素至少包含該初級線圈中之電流及該N個次級線圈中之電流。The system according to claim 16, wherein the elements of the multidimensional output value at least include the current in the primary coil and the current in the N secondary coils.
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