TW202244532A - Laser jammer and detection method thereof - Google Patents

Laser jammer and detection method thereof Download PDF

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TW202244532A
TW202244532A TW110117155A TW110117155A TW202244532A TW 202244532 A TW202244532 A TW 202244532A TW 110117155 A TW110117155 A TW 110117155A TW 110117155 A TW110117155 A TW 110117155A TW 202244532 A TW202244532 A TW 202244532A
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laser
light
jammer
incident
laser light
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TWI828982B (en
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張晉福
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張晉福
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Abstract

A laser jammer and detection method thereof are provided, the laser jammer including: an optical receiver; an optical transmitter; a processing unit; wherein the processing unit drives the optical transmitter to transmit a test laser beam when the laser jammer is in turn-on state, and the processing unit determines the functional status of the laser jammer according to a state of receiving of the test laser beam.

Description

雷射干擾器及其檢測方法Laser jammer and detection method thereof

本發明是有關於一種雷射干擾器及其檢測方法。The invention relates to a laser jammer and a detection method thereof.

雷射偵測之原理係利用發射一特定波長及特定發射訊號頻率之雷射光至被偵測物,並接收由該被偵測物反射之該雷射光,藉以偵測該被偵測物。The principle of laser detection is to use laser light of a specific wavelength and a specific emission signal frequency to the object to be detected, and receive the laser light reflected by the object to detect the object to be detected.

習知之雷射干擾器一般是在收到該偵測器之雷射光後,透過連續發射一干擾雷射光來覆蓋反射之雷射光。然而此類習知技術並未針對該偵測器之雷射光的波長、訊號發射頻率、振幅等性質進一步分析比對,效果較差。Conventional laser jammers generally cover the reflected laser light by continuously emitting a disturbing laser light after receiving the laser light from the detector. However, such conventional technologies have not further analyzed and compared the properties of the laser light of the detector, such as the wavelength, signal emission frequency, and amplitude, and the effect is poor.

此外,一般習知雷射干擾器未有自我檢測功能,因此在實際運作時,無法預知該雷射干擾器是否可正常作動,可能在完全無作用下持續使用,喪失雷射干擾之功效。In addition, generally known laser jammers do not have a self-test function, so in actual operation, it is impossible to predict whether the laser jammer can operate normally, and it may continue to be used without any effect, losing the effect of laser jamming.

因此,有必要提供一種新穎且具有進步性之雷射干擾器及其檢測方法,以解決上述之問題。Therefore, it is necessary to provide a novel and progressive laser jammer and its detection method to solve the above problems.

本發明之主要目的在於提供一種雷射干擾器及其檢測方法,能有效檢測功能狀態。The main purpose of the present invention is to provide a laser jammer and its detection method, which can effectively detect the functional state.

為達成上述目的,本發明提供一種雷射干擾器,包括:一光接收器;一光發射器;一處理單元;其中,該處理單元在該雷射干擾器於啟動狀態時驅動該光發射器產生一測試雷射光,該處理單元依據該光接收器接收該測試雷射光之狀態,判斷該雷射干擾器之功能狀態。To achieve the above object, the present invention provides a laser jammer, comprising: an optical receiver; an optical transmitter; a processing unit; wherein, the processing unit drives the optical transmitter when the laser jammer is in an activated state A test laser light is generated, and the processing unit judges the functional state of the laser jammer according to the state of the light receiver receiving the test laser light.

為達成上述目的,本發明另提供一種雷射干擾器之檢測方法,包括以下步驟:啟動該雷射干擾器;該雷射干擾器之一處理單元在該雷射干擾器於啟動狀態時驅動該光發射器產生一測試雷射光,該處理單元依據該雷射干擾器之一光接收器接收該測試雷射光之狀態,判斷該雷射干擾器之功能狀態。In order to achieve the above object, the present invention further provides a detection method of a laser jammer, comprising the following steps: starting the laser jammer; a processing unit of the laser jammer drives the laser jammer when the laser jammer is in the activated state The light transmitter generates a test laser light, and the processing unit judges the function status of the laser jammer according to the state of the test laser light received by the light receiver of the laser jammer.

以下僅以實施例說明本發明可能之實施態樣,然並非用以限制本發明所欲保護之範疇,合先敘明。The following examples illustrate possible implementations of the present invention, but are not intended to limit the scope of protection of the present invention.

請參考圖1至6,其顯示本發明之一較佳實施例,本發明之雷射干擾器1包括一光接收器10、一光發射器20及一處理單元30。Please refer to FIGS. 1 to 6 , which show a preferred embodiment of the present invention. The laser jammer 1 of the present invention includes an optical receiver 10 , an optical transmitter 20 and a processing unit 30 .

該光接收器可供接收一包括至少一入射脈波之入射雷射光並產生一與該至少一入射脈波相關聯之入射光訊號;該處理單元可依據該入射光訊號驅動該光發射器產生一包括至少一測試脈波之測試雷射光。在本實施例中,該光接收器10供接收一包括複數入射脈波41之入射雷射光40並產生一與該複數入射脈波41相關聯之入射光訊號11。該處理單元30依據該入射光訊號11計算該複數入射脈波41之相鄰二者之間的間隔時間T、且驅動該光發射器20產生一干擾雷射光21,該干擾雷射光21包括複數干擾脈波22,複數該干擾脈波22以一第一時間間隔T1間斷地各於複數該入射脈波41之間隔時間T內發射且各持續至重疊於至少一該入射脈波41,其中,該處理單元30在該雷射干擾器1於啟動狀態時驅動該光發射器20產生一包括複數測試脈波之測試雷射光,該處理單元30依據該光接收器10接收該測試雷射光之測試脈波之狀態,判斷該雷射干擾器1之功能狀態。本發明中之啟動可以是任何時點下之開啟狀態,只要是該雷射干擾器1在電源供給而可作動之條件下即可。其中,該入射脈波41及該干擾脈波22分別包括複數雷射脈衝波。在本實施例中,該測試雷射光可與該干擾雷射光21相同,具有相同之光波長、訊號發射頻率、振幅等性質;然而,該測試雷射光可設定為具有其他光波長、訊號發射頻率、振幅等性質。藉此,能有效檢測功能狀態,避免在無效下使用該雷射干擾器1。The optical receiver is capable of receiving an incident laser light including at least one incident pulse wave and generating an incident light signal associated with the at least one incident pulse wave; the processing unit can drive the light transmitter to generate according to the incident light signal A test laser light including at least one test pulse. In this embodiment, the optical receiver 10 is configured to receive an incident laser light 40 including a complex number of incident pulse waves 41 and generate an incident light signal 11 associated with the complex number of incident pulse waves 41 . The processing unit 30 calculates the interval time T between adjacent two of the complex incident pulse waves 41 according to the incident light signal 11, and drives the light emitter 20 to generate an interfering laser light 21, the interfering laser light 21 includes complex The interference pulse wave 22, the plurality of the interference pulse waves 22 are intermittently emitted in the interval time T between the plurality of the incident pulse waves 41 with a first time interval T1 and each continues to overlap at least one of the incident pulse waves 41, wherein, The processing unit 30 drives the optical transmitter 20 to generate a test laser light including a plurality of test pulse waves when the laser jammer 1 is in the activated state, and the processing unit 30 receives the test laser light according to the light receiver 10. The state of the pulse wave is used to judge the functional state of the laser jammer 1 . The start-up in the present invention can be the open state at any time, as long as the laser jammer 1 is powered and can be activated. Wherein, the incident pulse wave 41 and the interference pulse wave 22 respectively include complex laser pulse waves. In this embodiment, the test laser light can be the same as the interfering laser light 21, having the same light wavelength, signal emission frequency, amplitude and other properties; however, the test laser light can be set to have other light wavelengths, signal emission frequencies , amplitude and other properties. In this way, the functional state can be effectively detected, and the use of the laser jammer 1 in an invalid state can be avoided.

另外,較佳地,後續之一該干擾脈波22a相對於前一該干擾脈波22以一異於該第一時間間隔T1之時間間隔T2而發射。要說明的是,後續之該干擾脈波22a可以是其前複數該入射脈波41之下一個入射脈波,亦可是其前複數該入射脈波41之次個以後之入射脈波。藉此,可干擾發射該入射雷射光40之一雷射偵測器,且能在干擾過程中判斷該入射雷射光40之入射狀態(持續、間段或停止)。In addition, preferably, a subsequent interference pulse wave 22 a is transmitted at a time interval T2 different from the first time interval T1 relative to the previous interference pulse wave 22 . It should be noted that the subsequent interfering pulse wave 22a can be the incident pulse wave below the previous plural number of the incident pulse waves 41 , or it can be the next incident pulse wave after the previous plural number of the incident pulse waves 41 . In this way, the laser detector that emits the incident laser light 40 can be disturbed, and the incident state of the incident laser light 40 (continuous, intermittent or stopped) can be judged during the disturbance process.

該干擾雷射光21之發射訊號頻率與該入射雷射光40之發射訊號頻率相同,且該第一時間間隔T1與該間隔時間T之時間長度相同,確保同步干擾該雷射偵測器接收反射之入射雷射光。該干擾脈波22之振幅較佳大於該入射脈波41之振幅,以有效覆蓋該入射脈波41。各該干擾脈波22持續至重疊於其中一該入射脈波41之1/2以上,較佳為重疊3/4以上、甚至完全重疊,以完全阻斷、干擾該雷射偵測器接收反射之入射雷射光。較佳地,該複數入射脈波41之數量至少為3個,該干擾雷射光21相對地於其前三個入射脈波41之後發射,以確定所接收之入射脈波41所具有之光波長、訊號發射頻率、振幅等性質,確實為所欲干擾之目標入射雷射,避免誤判及該光發射器20不必要地發射該干擾雷射光21,精準而節能。The emission signal frequency of the interfering laser light 21 is the same as the emission signal frequency of the incident laser light 40, and the first time interval T1 is the same as the time length of the interval time T, so as to ensure synchronous interference with the laser detector receiving reflected incident laser light. The amplitude of the interference pulse wave 22 is preferably larger than the amplitude of the incident pulse wave 41 so as to effectively cover the incident pulse wave 41 . Each of the interference pulse waves 22 continues to overlap more than 1/2 of one of the incident pulse waves 41, preferably overlaps more than 3/4, or even completely overlaps, so as to completely block and interfere with the laser detector receiving reflection of incident laser light. Preferably, the number of the complex incident pulse waves 41 is at least three, and the interfering laser light 21 is emitted relatively after the first three incident pulse waves 41 to determine the light wavelength of the received incident pulse waves 41 , signal transmission frequency, amplitude and other properties, the incident laser is indeed the target of the desired interference, avoiding misjudgment and unnecessary emission of the interfering laser light 21 by the optical transmitter 20, accurate and energy-saving.

在本實施例中,所述後續之一該干擾脈波22a相對於前一該干擾脈波22以大於該第一時間間隔T1之時間間隔T2而發射。舉例但不限定,間隔一該入射脈波41(亦可間隔複數個入射脈波41)之後,再以該第一時間間隔間斷地發射干擾脈波,如此可依據在該時間間隔T2內是否有接收到該入射脈波41判斷該入射雷射光40之入射狀態。其中,若在該時間間隔T2內有接收到該入射脈波41,則繼續發射該干擾雷射光21;若在該時間間隔T2內沒有接收到該入射脈波41(例如該入射脈波41停止發射),則不發射該干擾雷射光21。另外,透過該時間間隔T2,亦可作為評估該干擾雷射光21之發射時點,是否具有偏移或不準確之情形,可另據以精準調整該干擾雷射光21之發射時點。在其他本實施例中,所述後續之一該干擾脈波22b相對於前一該干擾脈波22以大於該第一時間間隔T1之時間間隔T3而發射,所述後續之一該干擾脈波22b(可為該干擾脈波22之調變所得,或為另外獨立產生之干擾脈波,其可視為一測試脈波(可非依據該入射光訊號計算而得))之持續時間可位於一該入射脈波41之持續時間範圍之內(如圖7所示),同樣具有判斷該入射雷射光40之入射狀態、以及據以精準調整該干擾雷射光21之發射時點的功效。In this embodiment, the subsequent one of the disturbance pulses 22 a is transmitted at a time interval T2 greater than the first time interval T1 relative to the previous disturbance pulse 22 . For example but not limited to, after an interval of the incident pulse wave 41 (or a plurality of incident pulse waves 41), the interfering pulse wave is intermittently emitted at the first time interval, so that it can be based on whether there is a pulse wave in the time interval T2 The incident state of the incident laser light 40 is judged upon receiving the incident pulse wave 41 . Wherein, if the incident pulse wave 41 is received within the time interval T2, then continue to emit the interfering laser light 21; if the incident pulse wave 41 is not received within the time interval T2 (for example, the incident pulse wave 41 stops emission), then the interfering laser light 21 will not be emitted. In addition, the time interval T2 can also be used to evaluate whether the emission timing of the interfering laser light 21 is offset or inaccurate, and can also be used to precisely adjust the emission timing of the interfering laser light 21 . In other present embodiments, the subsequent one of the interference pulse wave 22b is transmitted at a time interval T3 greater than the first time interval T1 relative to the previous interference pulse wave 22, and the subsequent one of the interference pulse wave 22b (which can be obtained by modulation of the interference pulse wave 22, or an interference pulse wave generated independently, which can be regarded as a test pulse wave (which may not be calculated based on the incident light signal)) can be located at a Within the duration range of the incident pulse wave 41 (as shown in FIG. 7 ), it also has the function of judging the incident state of the incident laser light 40 and precisely adjusting the emission time point of the interfering laser light 21 accordingly.

詳細說,該光接收器10包括至少一光電二極體12,該光電二極體12具有一介於40度至80度之光接收角,較佳設有複數個光電二極體12,以提升該光接收器10之接收範圍而不漏接。該光發射器20包括至少一雷射二極體23,該雷射二極體23具有一介於15度至45度之光發射角,將該干擾雷射光21儘量集中在較有效之光發射範圍內,有助於干擾效果。該至少一雷射二極體23之數量可為複數,可包括能發射不同波長之雷射二極體。該干擾雷射光21、該測試雷射光與該入射雷射光40之波長介於850奈米至910奈米之間,該發射訊號頻率介於100赫茲至600赫茲之間,然而上述僅例舉較為常見之雷射偵測器所使用之波長範圍,實際上可依據不同需求而不同,甚至該雷射干擾器1可另設有一發射訊號頻率調整電路,藉以調整該干擾雷射光21或/及該測試雷射光之發射訊號頻率。In detail, the photoreceiver 10 includes at least one photodiode 12, the photodiode 12 has a light receiving angle between 40 degrees and 80 degrees, and a plurality of photodiodes 12 are preferably provided to improve The receiving range of the optical receiver 10 is not missed. The light emitter 20 includes at least one laser diode 23. The laser diode 23 has a light emission angle between 15° and 45°, so that the interfering laser light 21 is concentrated in a more effective light emission range as much as possible. inside, which contributes to the interference effect. The number of the at least one laser diode 23 can be plural, and can include laser diodes capable of emitting different wavelengths. The wavelengths of the interfering laser light 21, the test laser light and the incident laser light 40 are between 850 nm and 910 nm, and the frequency of the emission signal is between 100 Hz and 600 Hz. The wavelength range used by common laser detectors can actually be different according to different needs, and even the laser jammer 1 can also be provided with a transmission signal frequency adjustment circuit to adjust the interference laser light 21 and/or the Test the emission signal frequency of laser light.

該處理單元30包括一與該光接收器10通聯之第一級放大器31、一與該第一級放大器31通聯之第二級放大器32、一與該第二級放大器32通聯之處理器33,該處理器33與該光發射器20通聯,該第一級放大器31處理該入射光訊號11成一放大訊號11a,該第二級放大器32處理該放大訊號11a成一放大訊號11b,該處理器33依據該放大訊號11b之間隔時間T、且透過一驅動電路34驅動該光發射器20產生該干擾雷射光21。該第一級放大器31為電晶體放大器,可原波形放大訊號,該第二級放大器32較佳為視頻放大器,可將經該電晶體放大器處理放大後之該放大訊號11a進一步放大並轉變成方波型態。該處理單元30另包括一通聯於該視頻放大器與該處理器33之間的比較器35,該比較器35設有一閥值,該比較器35僅允許經該視頻放大器處理後之放大訊號11b大於該閥值的峰部部分11c通過,該等峰部部分11c中之相鄰二者之間間隔該間隔時間T。該放大訊號11a經由該視頻放大器處理成方波型態,其可有利該處理器33作數位化處理且經該比較器35篩選掉非所欲干擾之其他雜訊(可能來自環境中的不同雜光),可增加處理速度及判斷訊號來源之正確度、並降低該處理器33之負載。當然,該第一級放大器31及該第二級放大器32亦可皆為電晶體放大器,只要該處理器33具有足夠之資料處理能力。 該閥值可設為該放大訊號11b之電壓值、電流值或振幅值,例如該閥值設為該放大訊號11b之電壓值,該電壓值例如設定為2伏特(V)。該雷射干擾器1也可另設有一閥值調整或切換電路,以依據不同需求調整該閥值、或切換設定該閥值於電壓值、電流值及振幅值其中任一者。以上所述之通聯泛指有線或無線方式。The processing unit 30 includes a first-stage amplifier 31 communicating with the optical receiver 10, a second-stage amplifier 32 communicating with the first-stage amplifier 31, a processor 33 communicating with the second-stage amplifier 32, The processor 33 communicates with the optical transmitter 20, the first stage amplifier 31 processes the incident light signal 11 into an amplified signal 11a, and the second stage amplifier 32 processes the amplified signal 11a into an amplified signal 11b, the processor 33 according to The amplified signal 11 b is separated by a time T, and is driven by a driving circuit 34 to drive the light emitter 20 to generate the interfering laser light 21 . The first-stage amplifier 31 is a transistor amplifier, which can amplify the original waveform signal, and the second-stage amplifier 32 is preferably a video amplifier, which can further amplify and convert the amplified signal 11a processed and amplified by the transistor amplifier into a square wave pattern. The processing unit 30 further includes a comparator 35 connected between the video amplifier and the processor 33, the comparator 35 is provided with a threshold, and the comparator 35 only allows the amplified signal 11b processed by the video amplifier to be greater than The peak portion 11c of the threshold passes through, and the interval time T is spaced between adjacent two of the peak portions 11c. The amplified signal 11a is processed into a square wave form by the video amplifier, which can facilitate the processor 33 to digitize and filter out other noises (possibly from different noises in the environment) that are not desired by the comparator 35. Light), can increase processing speed and judge the correctness of signal source, and reduce the load of this processor 33. Of course, both the first-stage amplifier 31 and the second-stage amplifier 32 can also be transistor amplifiers, as long as the processor 33 has sufficient data processing capability. The threshold value can be set as the voltage value, current value or amplitude value of the amplified signal 11b, for example, the threshold value is set as the voltage value of the amplified signal 11b, and the voltage value is set as 2 volts (V), for example. The laser jammer 1 can also be further provided with a threshold adjustment or switching circuit to adjust the threshold according to different needs, or switch and set the threshold to any one of voltage value, current value and amplitude value. The communications mentioned above generally refer to wired or wireless methods.

該第一級放大器31、該第二級放大器32及該比較器35、以及電性連接其間之電路36較佳被一金屬罩37所罩蓋屏蔽,可減少外界訊號、電磁波及該雷射干擾器1之其他電路(例如該光發射器20及與其導接之電路)之干擾,確保該光接收器10所接收之訊號不受干擾且不失真,提升訊號判斷準確性。其中,該電路36設於一電路板38上,較佳地於該電路板38之相對二側皆設有一該金屬罩37,該金屬罩37與該電路板38之間存在一跨隙39,該跨隙39例如跨過該電路36連接於該光接收器10與該光發射器20之間的部分,避免該金屬罩37干擾或造成短路。The first-stage amplifier 31, the second-stage amplifier 32, the comparator 35, and the circuit 36 electrically connected therebetween are preferably shielded by a metal cover 37, which can reduce external signals, electromagnetic waves and the laser interference Interference with other circuits of the optical device 1 (such as the optical transmitter 20 and the circuits connected thereto) ensures that the signal received by the optical receiver 10 is free from interference and distortion, and improves the accuracy of signal judgment. Wherein, the circuit 36 is arranged on a circuit board 38, and preferably a metal cover 37 is provided on opposite sides of the circuit board 38, and there is a gap 39 between the metal cover 37 and the circuit board 38, The gap 39 , for example, straddles the portion of the circuit 36 connected between the optical receiver 10 and the optical transmitter 20 to prevent the metal cover 37 from interfering or causing a short circuit.

較佳地,於該光接收器10之前方另設有一濾波透鏡50,該濾波透鏡50例如僅允許700奈米至950奈米(較佳且限縮為700奈米至900奈米之間)波長的光通過,該濾波透鏡50較佳為塑材,透光度佳、強韌不易脆化、且價廉。該濾波透鏡50先濾掉相當程度上非所需的波長,以減少該處理單元30之資料處理負載,並可增加處理速度及判斷訊號來源之正確度。較佳的可能是,若精準的僅允許一特定波長雷射光通過該濾波透鏡50,則甚至可在接收二個入射雷射光40之入射脈波41,即可驅動該光發射器20產生該干擾雷射光21,干擾更快速、準確。Preferably, a filter lens 50 is additionally provided in front of the light receiver 10. For example, the filter lens 50 only allows 700 nm to 950 nm (preferably and limited to between 700 nm and 900 nm) The filter lens 50 is preferably made of plastic material, which has good light transmittance, is strong and not brittle, and is cheap. The filter lens 50 first filters unnecessary wavelengths to a certain extent, so as to reduce the data processing load of the processing unit 30, increase the processing speed and determine the accuracy of the signal source. Preferably, if only laser light of a specific wavelength is accurately allowed to pass through the filter lens 50, the light emitter 20 can be driven to generate the interference even after receiving the incident pulse wave 41 of the two incident laser lights 40 Laser light 21, the interference is faster and more accurate.

該雷射干擾器1較佳另包括一塑材或金屬材質之外殼60,以保護其內部構件。該外殼60設有一供安裝之外接結構61,該外接結構61例如為螺孔、扣帶、磁吸件、或可與相應安裝部件能相對固接之任何機構。The laser jammer 1 preferably further includes a plastic or metal casing 60 to protect its internal components. The housing 60 is provided with an external structure 61 for installation. The external structure 61 is, for example, a screw hole, a buckle, a magnetic element, or any mechanism that can be relatively fixedly connected to a corresponding installation component.

本發明另提供一種雷射干擾器之檢測方法,其可透過上述之雷射干擾器1執行。請配合參考圖1-4及圖4a,該雷射干擾器之檢測方法包括以下步驟:(S1):啟動該雷射干擾器1,其中該雷射干擾器供接收一包括複數入射脈波41之入射雷射光40並產生一與該複數入射脈波41相關聯之入射光訊號11;(S2):該雷射干擾器1可依據該入射光訊號11計算該複數入射脈波41之相鄰二者之間的間隔時間T、且驅動該光發射器20產生一干擾雷射光21,其中,該處理單元30在該雷射干擾器1於啟動狀態時驅動該光發射器20產生一包括複數測試脈波之測試雷射光;(S3):該處理單元30依據該光接收器10接收該測試雷射光之測試脈波之狀態,判斷該雷射干擾器1之功能狀態。The present invention further provides a detection method of a laser jammer, which can be implemented through the above-mentioned laser jammer 1 . Please cooperate with reference to Fig. 1-4 and Fig. 4a, the detection method of this laser jammer comprises the following steps: (S1): start this laser jammer 1, wherein this laser jammer is for receiving a complex incident pulse wave 41 the incident laser light 40 and generate an incident light signal 11 associated with the complex incident pulse wave 41; (S2): the laser jammer 1 can calculate the adjacent of the complex incident pulse wave 41 according to the incident light signal 11 The interval between the two is T, and the light emitter 20 is driven to generate a disturbing laser light 21, wherein the processing unit 30 drives the light emitter 20 to generate a complex number when the laser disruptor 1 is in the activated state. The test laser light of the test pulse wave; (S3): the processing unit 30 judges the functional state of the laser jammer 1 according to the state of the test pulse wave of the test laser light received by the optical receiver 10.

舉例說明,其係產生與該干擾雷射光21之發射訊號頻率相同之該測試雷射光,且控制該光發射器20之複數雷射二極體23分別發射該測試雷射光。較佳地,其係控制該光發射器20之複數雷射二極體23分別發射該測試雷射光,且分別設定以該光接收器10之複數光電二極體12的指定一者接收該測試雷射光,例如對該複數雷射二極體23及該複數光電二極體12進行編號,某一編號之雷射二極體23所發射之測試雷射光指定由某一編號之光電二極體12接收,如此各該雷射二極體23皆有進行發射檢測,且各該光電二極體12亦皆有進行接收檢測,除可判斷出該雷射干擾器1之功能狀態是否正常,且有利快速、精準判斷發生異常之部件為何者。其中,當該光電二極體12正常接收到測試雷射光,則該處理單元30判斷該雷射干擾器1之功能狀態為正常;當該光電二極體12未接收到測試雷射光或/及該雷射二極體23未發射雷射光,則該處理單元30判斷該雷射干擾器1之功能狀態為異常。For example, it generates the test laser light with the same frequency as the emission signal of the interference laser light 21, and controls the plurality of laser diodes 23 of the light emitter 20 to emit the test laser light respectively. Preferably, it is to control the plurality of laser diodes 23 of the light transmitter 20 to emit the test laser light respectively, and respectively set a specified one of the plurality of photodiodes 12 of the light receiver 10 to receive the test Laser light, such as numbering the plurality of laser diodes 23 and the plurality of photodiodes 12, the test laser light emitted by a certain number of laser diodes 23 is designated by a certain number of photodiodes 12 receiving, so that each of the laser diodes 23 has carried out emission detection, and each of the photodiodes 12 has also carried out reception detection, except that it can be judged whether the functional state of the laser jammer 1 is normal, and It is beneficial to quickly and accurately determine the abnormal component. Wherein, when the photodiode 12 receives the test laser light normally, the processing unit 30 judges that the functional state of the laser jammer 1 is normal; when the photodiode 12 does not receive the test laser light or/and If the laser diode 23 does not emit laser light, the processing unit 30 judges that the functional state of the laser jammer 1 is abnormal.

另外,較佳地,後續之一該干擾脈波22a相對於前一該干擾脈波22以一異於該第一時間間隔T1之時間間隔T2而發射。其中,在所述後續之一該干擾脈波22a之後,可另控制複數該干擾脈波22以該第一時間間隔T1間斷地各於複數該入射脈波41之間隔時間T內發射且各持續至重疊於其中一該入射脈波41,以繼續干擾該入射雷射光40。In addition, preferably, a subsequent interference pulse wave 22 a is transmitted at a time interval T2 different from the first time interval T1 relative to the previous interference pulse wave 22 . Wherein, after the subsequent one of the interference pulse waves 22a, the plurality of the interference pulse waves 22 can be controlled to be intermittently emitted within the interval time T between the plurality of the incident pulse waves 41 at the first time interval T1 and each lasts to overlap one of the incident pulse waves 41 to continue to interfere with the incident laser light 40 .

其中,可控制所述後續之一該干擾脈波22a相對於前一該干擾脈波22以大於該第一時間間隔T1之時間間隔T2而發射(如圖6),或控制所述後續之一該干擾脈波22b之持續時間位於一該入射脈波41之持續時間範圍之內(如圖7),皆能在干擾過程中判斷該入射雷射光40之入射狀態。Wherein, the subsequent one of the interference pulse wave 22a can be controlled to be transmitted at a time interval T2 greater than the first time interval T1 relative to the previous interference pulse wave 22 (as shown in FIG. 6 ), or the subsequent one can be controlled The duration of the interference pulse wave 22b is within the range of the duration of the incident pulse wave 41 (as shown in FIG. 7 ), and the incident state of the incident laser light 40 can be judged during the interference process.

其中,該雷射干擾器1之啟閉,以及該雷射干擾器1之狀態,例如但不限定該雷射干擾器1之功能正常/異常狀態、接收該入射雷射光40之資料狀態(距離、頻帶、位置、時間等)、取得之運動狀態(例如該雷射干擾器1所安裝之裝置的速度),可經有線傳輸方式(如圖4)或/及無線傳輸方式(如圖4b)與一提示裝置70通聯,而由該提示裝置70發出相應之提示(可為音訊、光訊、震訊),以供提示、通知、警告。該提示裝置70可配至於一裝置之內部、外部,或可為一可與該雷射干擾器1遠端通聯之裝置。Wherein, the opening and closing of the laser jammer 1, and the state of the laser jammer 1, such as but not limited to the normal/abnormal state of the function of the laser jammer 1, the data status of receiving the incident laser light 40 (distance , frequency band, position, time, etc.), obtained motion status (such as the speed of the device installed in the laser jammer 1), can be transmitted via wired transmission (as shown in Figure 4) or/and wireless transmission (as shown in Figure 4b) It communicates with a prompting device 70, and the prompting device 70 sends out corresponding prompts (audio, light, and vibration) for prompting, notification, and warning. The prompting device 70 can be arranged inside or outside a device, or can be a device that can communicate with the laser jammer 1 remotely.

要說明的是,上述實施例中,該干擾脈波22, 22a, 22b可於該間隔時間T內提早於該入射脈波41而發射且與一或多個該入射脈波41重疊;或,該干擾脈波22, 22a, 22b可於該間隔時間T內晚於該入射脈波41而發射且與一或多個該入射脈波41重疊;或,該干擾脈波22, 22a, 22b可同時於該入射脈波41而發射且與一或多個該入射脈波41重疊。其中,上述之重疊,可為部分重疊或全部重疊;該干擾脈波22, 22a, 22b與該入射脈波41之脈波結束時點可為同時或不同時。It should be noted that, in the above embodiment, the interference pulse wave 22, 22a, 22b can be transmitted earlier than the incident pulse wave 41 within the interval time T and overlap with one or more of the incident pulse wave 41; or, The interference pulse wave 22, 22a, 22b may be emitted later than the incident pulse wave 41 within the interval time T and overlap with one or more of the incident pulse wave 41; or, the interference pulse wave 22, 22a, 22b may Simultaneously, the incident pulse wave 41 is emitted and overlapped with one or more incident pulse waves 41 . Wherein, the above-mentioned overlapping can be partially or completely overlapping; the end time points of the interference pulse wave 22, 22a, 22b and the incident pulse wave 41 can be at the same time or not.

1:雷射干擾器 10:光接收器 11:入射光訊號 11a, 11b:放大訊號 11c:峰部部分 12:光電二極體 20:光發射器 21:干擾雷射光 22, 22a, 22b:干擾脈波 23:雷射二極體 30:處理單元 31:第一級放大器 32:第二級放大器 33:處理器 34:驅動電路 35:比較器 36:電路 37:金屬罩 38:電路板 39:跨隙 40:入射雷射光 41:入射脈波 50:濾波透鏡 60:外殼 61:外接結構 70:提示裝置 S1~S3:步驟 T:間隔時間 T1:第一間隔時間 T2:時間間隔 T3:時間間隔 1: Laser jammer 10: Optical receiver 11: Incident light signal 11a, 11b: amplified signal 11c: peak part 12: Photodiode 20: Optical transmitter 21: Interfering with laser light 22, 22a, 22b: Interference pulse wave 23:Laser diode 30: Processing unit 31: First stage amplifier 32: second stage amplifier 33: Processor 34: Drive circuit 35: Comparator 36: circuit 37: metal cover 38: circuit board 39: Gap 40: Incident laser light 41: Incident pulse wave 50: filter lens 60: shell 61: External structure 70: Prompt device S1~S3: steps T: interval time T1: first interval time T2: time interval T3: time interval

圖1為本發明一較佳實施例之立體圖。 圖2為本發明一較佳實施例之分解圖。 圖3為本發明一較佳實施例之一剖面圖。 圖4為本發明一較佳實施例之結構關係方塊圖。 圖4a為本發明一較佳實施例之雷射干擾器之檢測方法流程圖。 圖4b為本發明一較佳實施例之另一結構關係方塊圖。 圖5為本發明一較佳實施例之訊號處理示意圖。 圖6為本發明一較佳實施例之訊號干擾示意圖。 圖7為本發明一較佳實施例之另一種訊號干擾示意圖。 Fig. 1 is a perspective view of a preferred embodiment of the present invention. Fig. 2 is an exploded view of a preferred embodiment of the present invention. Fig. 3 is a sectional view of a preferred embodiment of the present invention. Fig. 4 is a block diagram of the structural relationship of a preferred embodiment of the present invention. Fig. 4a is a flowchart of a detection method of a laser jammer according to a preferred embodiment of the present invention. Fig. 4b is another structural relationship block diagram of a preferred embodiment of the present invention. FIG. 5 is a schematic diagram of signal processing in a preferred embodiment of the present invention. FIG. 6 is a schematic diagram of signal interference in a preferred embodiment of the present invention. FIG. 7 is another schematic diagram of signal interference in a preferred embodiment of the present invention.

1:雷射干擾器 1: Laser jammer

37:金屬罩 37: metal cover

50:濾波透鏡 50: filter lens

60:外殼 60: shell

61:外接結構 61: External structure

Claims (10)

一種雷射干擾器,包括: 一光接收器; 一光發射器; 一處理單元; 其中,該處理單元在該雷射干擾器於啟動狀態時驅動該光發射器產生一測試雷射光,該處理單元依據該光接收器接收該測試雷射光之狀態,判斷該雷射干擾器之功能狀態。 A laser jammer comprising: a light receiver; a light emitter; a processing unit; Wherein, the processing unit drives the light transmitter to generate a test laser light when the laser jammer is in the activated state, and the processing unit judges the function of the laser jammer according to the state of the light receiver receiving the test laser light state. 如請求項1所述的雷射干擾器,其中該處理單元依據一入射雷射光之入射光訊號計算該入射雷射光之複數入射脈波之相鄰二者之間的間隔時間、且驅動該光發射器產生一干擾雷射光,該干擾雷射光包括複數干擾脈波,複數該干擾脈波以一第一時間間隔間斷地各於複數該入射脈波之間隔時間內發射且各持續至重疊於至少一該入射脈波。The laser jammer as described in Claim 1, wherein the processing unit calculates the interval time between adjacent two of the plurality of incident pulse waves of the incident laser light according to the incident light signal of the incident laser light, and drives the light The emitter generates an interfering laser light, the interfering laser light includes a plurality of interfering pulses, the plurality of interfering pulses are intermittently emitted at intervals between the plurality of incident pulses at a first time interval and each continues until overlapping at least - the incident pulse wave. 如請求項2所述的雷射干擾器,其中後續之一該干擾脈波相對於前一該干擾脈波以一異於該第一時間間隔之時間間隔而發射,所述後續之一該干擾脈波相對於前一該干擾脈波以大於該第一時間間隔之時間間隔而發射。The laser jammer as claimed in claim 2, wherein the subsequent one of the interference pulses is transmitted at a time interval different from the first time interval relative to the previous interference pulse, and the subsequent one of the interference The pulse is transmitted at a time interval greater than the first time interval relative to the previous interference pulse. 如請求項3所述的雷射干擾器,其中所述後續之一該干擾脈波之持續時間位於一該入射脈波之持續時間範圍之內。The laser jammer as claimed in claim 3, wherein the duration of the subsequent one of the interference pulses is within a duration range of the incident pulse. 如請求項2至4其中任一項所述的雷射干擾器,其中該處理單元包括一與該光接收器通聯之第一級放大器、一與該第一級放大器通聯之第二級放大器、一與該第二級放大器通聯之處理器,該處理器與該光發射器通聯,該第一級及第二級放大器處理該入射光訊號成一放大訊號,該處理器依據該放大訊號間隔時間、且驅動該光發射器產生該干擾雷射光。The laser jammer according to any one of claims 2 to 4, wherein the processing unit includes a first-stage amplifier in communication with the optical receiver, a second-stage amplifier in communication with the first-stage amplifier, A processor in communication with the second-stage amplifier, the processor in communication with the optical transmitter, the first-stage and second-stage amplifiers process the incident light signal into an amplified signal, the processor depends on the amplified signal interval time, And driving the light emitter to generate the interfering laser light. 如請求項5所述的雷射干擾器,其中該第一級放大器為電晶體放大器,該第二級放大器為視頻放大器,該處理單元另包括一通聯於該視頻放大器與該處理器之間的比較器,該比較器設有一閥值,該比較器僅允許經該視頻放大器處理後之放大訊號大於該閥值的峰部部分通過,該等峰部部分中之相鄰二者之間間隔該間隔時間。The laser jammer as described in claim 5, wherein the first-stage amplifier is a transistor amplifier, the second-stage amplifier is a video amplifier, and the processing unit further includes a communication link between the video amplifier and the processor A comparator, the comparator is provided with a threshold value, the comparator only allows the peak part of the amplified signal processed by the video amplifier to be greater than the threshold value to pass through, and the adjacent two of the peak parts are separated by the Intervals. 一種雷射干擾器之檢測方法,包括以下步驟: 啟動該雷射干擾器; 該雷射干擾器之一處理單元在該雷射干擾器於啟動狀態時驅動該光發射器產生一測試雷射光,該處理單元依據該雷射干擾器之一光接收器接收該測試雷射光之狀態,判斷該雷射干擾器之功能狀態。 A method for detecting a laser jammer, comprising the following steps: Activate the laser jammer; A processing unit of the laser jammer drives the light emitter to generate a test laser light when the laser jammer is in the activated state, and the processing unit receives the test laser light according to an optical receiver of the laser jammer Status, to judge the functional status of the laser jammer. 如請求項7所述的雷射干擾器之檢測方法,其中係產生與該干擾雷射光之發射訊號頻率相同之該測試雷射光。The method for detecting a laser jammer as described in Claim 7, wherein the test laser light is generated at the same frequency as the emission signal of the interfering laser light. 如請求項7所述的雷射干擾器之檢測方法,其中係控制該光發射器之複數雷射二極體分別發射該測試雷射光。The method for detecting a laser jammer according to claim 7, wherein the plurality of laser diodes of the light transmitter are controlled to emit the test laser light respectively. 如請求項7所述的雷射干擾器之檢測方法,其中係控制該光發射器之複數雷射二極體分別發射該測試雷射光,且分別設定以該光接收器之複數光電二極體的指定一者接收該測試雷射光。The detection method of the laser jammer as described in Claim 7, wherein the plurality of laser diodes of the light transmitter are controlled to emit the test laser light respectively, and the plurality of photodiodes of the light receiver are respectively set The specified one receives the test laser light.
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