TW202242358A - Circuit system and method for reading temperature value in circuit - Google Patents

Abstract

A circuit system and a method for reading temperature value in circuit are provided. A latch circuit is incorporated in the circuit system for operating the method for reading temperature value in circuit. After the circuit system is powered on, a control right is transferred to a power-on controller. The power-on controller firstly resets a thermal meter of the circuit system, and issues a latch trigger signal to the latch circuit once an initiation process for the later circuit is completed. The latch circuit latches an initial temperature in response to the latch trigger signal. The initial temperature is recorded to a register and can be accessed at any time. The initial temperature acts as a reference for the temperature meter's calibration.

Description

Circuit system and method for reading temperature value in circuit

The specification proposes a method for reading temperature values in a circuit, especially a method for reading temperature values in a circuit in which a latch circuit is set in the circuit system to record the initial temperature value of the circuit system.

Generally, a thermal meter is built in a chip with high power consumption to know the internal temperature of the chip, and a heat dissipation system is installed outside the chip, such as a fan or a cooling system, which can measure the temperature according to the temperature inside the chip value to adjust the cooling mechanism.

For example, in a large-scale network switch system, there will be many chips with high power consumption. These chips with high power consumption usually have a thermometer function to let the system know the current internal temperature of the chip, so the external heat dissipation system That is, temperature adjustments are performed based on thermometer readings, such as starting fans and controlling the speed, etc. Therefore, the thermometer in the chip is a very important element.

Furthermore, the temperature of the thermometer in the chip needs to be calibrated before being used to improve the accuracy of the thermometer, and accurate temperature calibration must be able to accurately find the corresponding relationship between the reading value of the thermometer and the ambient temperature. For example, usually the thermometer reads the current temperature value of the thermometer through software after the power is turned on, but the temperature value obtained by the thermometer at this time has passed the time point of temperature measurement when the power is turned on, so it is not instant.

In particular, once the chip with high power consumption is started, the temperature of the chip rises very quickly. Since the temperature value of the thermometer cannot be obtained immediately, the temperature correction of the thermometer will be biased. In addition, in actual operation, if only the software is used to dynamically read the temperature value, the function of automatically recording the highest and lowest temperature points during a certain period of time cannot be automatically recorded by the chip, nor can the chip accurately and actively send interrupt information.

In view of the lack of immediacy of the reading value of the thermometer in the chip (integrated circuit) or a specific circuit by using a software method in the conventional technology, a method for reading the temperature value in the circuit and related circuits are proposed. One of the purposes is to improve the circuit The immediacy of the reading value of the internal thermometer solves the problem that the time point of reading the value by the software is too late.

According to an embodiment, in the method for reading a temperature value in a circuit, after a circuit system is started, a latch circuit is activated to latch an initial temperature value generated by a temperature measurement circuit and record it in a temporary register middle. The proposed method of latching the initial temperature value of the hardware circuit can record the initial temperature value of the circuit in real time and accurately, so that the initial temperature value recorded in the temporary register can be used as a part of the temperature measurement circuit in the circuit system. Calibration basis.

Further, the temperature measurement circuit can measure the temperature of the circuit continuously or periodically, and also latch the highest temperature value and the lowest temperature value within a certain period of time through a value storage circuit, and record them respectively in the maximum value register and In the minimum value register, this can improve the conventional problem that the temperature value cannot be read immediately by using the software method, and one of the purposes is to let the user know the highest value and the lowest value of the circuit system.

Furthermore, an interrupt circuit is also provided in the circuit system, which can compare a high threshold value and a low threshold value according to the temperature value output by the temperature measuring circuit to determine whether to send a high interrupt signal or a low interrupt signal. In one embodiment, when the interrupt circuit sends a high interrupt signal or a low interrupt signal to the external circuit, the external circuit can perform temperature regulation according to the received interrupt signal.

Preferably, the circuit system is such as an integrated circuit, which is mainly provided with the start-up control circuit, temperature measurement circuit and latch circuit proposed in the above embodiments, so as to be able to operate the method of reading the temperature value in the circuit. Wherein, after the circuit system is activated, the latch circuit is activated to latch the initial temperature value generated by the temperature measurement circuit and record it in the register. In another solution, the highest temperature value and the lowest temperature value within a certain period of time when the circuit latch is locked may be stored as a value.

In order to further understand the features and technical content of the present invention, please refer to the following detailed description and drawings related to the present invention. However, the provided drawings are only for reference and description, and are not intended to limit the present invention.

The implementation of the present invention is described below through specific specific examples, and those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are only for simple illustration, and are not drawn according to the actual size, which is stated in advance. The following embodiments will further describe the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the protection scope of the present invention.

It should be understood that although terms such as "first", "second", and "third" may be used herein to describe various elements or signals, these elements or signals should not be limited by these terms. These terms are mainly used to distinguish one element from another element, or one signal from another signal. In addition, the term "or" used herein may include any one or a combination of more of the associated listed items depending on the actual situation.

The disclosure book proposes a circuit system and a method for reading temperature values in the circuit. One of its purposes is to improve the real-time reading of thermometers inside the circuit system (such as integrated circuits (IC)) and solve the problem of reading values by software intervention. The time point is too late, so that the temperature value can be obtained immediately and correctly. According to the method, the temperature value measured by the thermometer can be read by a latch circuit in the circuit system, replacing the conventional method of reading the temperature value by software.

It should be mentioned here that the temperature measurement circuit in the circuit system needs to be calibrated before it is used to improve the accuracy of temperature measurement, and accurate temperature calibration must be able to accurately find the reading value of the temperature measurement circuit The corresponding relationship with the ambient temperature. Therefore, in order to improve the conventional problem of delay in obtaining temperature readings by software methods, for example, when reading the temperature value of the temperature measurement circuit, the time point at which the circuit system is started has passed, and there is no Immediateness, the proposed method for reading the temperature value in the circuit proposes that the reference basis for calibrating the temperature measurement circuit can be obtained in real time.

According to the embodiment of the method for reading the temperature value in the circuit, the initial temperature value of the circuit system is obtained instantly and accurately by setting a latch circuit in the circuit system, as shown in the flow chart of the embodiment in FIG. 1 . The circuit system that uses the method of reading the temperature value in the circuit is like an integrated circuit (IC) in a system, especially a circuit with large power consumption that requires temperature adjustment.

In this process embodiment, when the circuit system is started (step S101 ), the temperature value at this time can be used for future calibration of the temperature measurement circuit. In this embodiment, a latch trigger signal is sent to the latch circuit through the power-on controller therein, so that the trigger latch circuit latches an initial temperature value output by the temperature measurement circuit at this time (step S103), and store in a register. In this way, the initial temperature value stored in the temporary register is real-time due to the operation of the hardware circuit, and can be used as a calibration basis for the temperature measurement circuit to measure the working temperature of the circuit.

During the operation of the circuit system, the temperature measurement circuit can output temperature values at any time, and the maximum temperature value and the minimum temperature value can be recorded through the numerical storage circuit system (step S105). Once the maximum temperature and the minimum temperature value during the operation of the circuit system can be accurately obtained The lowest temperature, that is, the temperature adjustment can be performed immediately according to the temperature value (step S107 ).

What is mentioned here is that, taking a circuit with high power consumption as an example, the temperature of this type of circuit system usually rises very quickly. If the temperature value of the temperature measurement circuit cannot be obtained at the first time, for example, the initial temperature of the circuit system may be missed. The temperature value may miss the time point when the highest temperature value or the lowest temperature value is generated, and therefore may miss the time point when the circuit system sends an interrupt signal, which will also cause a deviation in temperature correction, and may misjudge the circuit system The maximum and minimum temperature values of , affect the subsequent temperature adjustment measures.

Fig. 2 shows a diagram of an embodiment of a circuit system for realizing the method for reading a temperature value in the circuit.

The circuit system applying the method is such as an integrated circuit. The circuit shown in the figure can be a related circuit for temperature value reading. The main circuit includes a start-up control circuit 20, which is electrically connected to other circuits, including a temperature measurement circuit 22 and a latch. Lock circuit 201. The temperature measurement circuit 22 is controlled by the startup control circuit 20 , and the temperature measurement circuit 22 can be reset and initialized through the transfer of the control right. The initial temperature is latched by a latch circuit, which may include a maximum temperature value and a minimum temperature value, and then the control right is returned to the relevant system after the temperature value is latched.

During operation, the latch circuit 201 latches the temperature value output by the temperature measurement circuit 22 through the synchronous data processing circuit 24 according to the command generated by the start-up control circuit 20, and can record the temperature value in the temporary register in the circuit system. In this embodiment, a hardware circuit solution is proposed, and the relevant circuit includes a latch circuit 201 and a corresponding temporary register 207, a value storage circuit 203, and a maximum value register 208 for recording the highest temperature value and The minimum value register 209 records the minimum temperature value, and the interrupt circuit 205 can send an interrupt signal immediately according to the change of the temperature value.

For example, when the circuit system is started, the control right is transferred to the start control circuit 20, and the start control circuit 20 not only resets the temperature measurement circuit 22, but also triggers and starts the latch circuit 201 by sending a latch trigger signal 211, An initial temperature value generated by the temperature measurement circuit 22 is latched in real time and recorded in the temporary register 207. The initial temperature value recorded in the temporary register 207 can be accessed by other circuits at any time, including as a temperature value. The measurement circuit 22 is the basis for correcting the temperature of the measurement circuit system. According to one of the implementations, the operation of the latch circuit 201 can be realized by an asynchronous sequential logic circuit (asynchronous sequential logic circuit) in a digital circuit, which can be used to record state information (1 or 0), and a latch (latch) can By storing one bit of information, multiple latches can record a complete information, such as the temperature value stored in the temporary register 207 .

Furthermore, the circuit system is also provided with a value storage circuit 203 that uses latch technology to record the highest temperature value and the minimum temperature value. The temperature measurement circuit 22 continuously measures the temperature of the circuit system, and also passes through the value storage circuit 203 The synchronous data processing circuit 24 obtains the temperature value (temperature signal 212) output by the temperature measurement circuit 22, so as to be able to latch the highest temperature value and the lowest temperature value within a period of time, and record them respectively in the register, as shown in the figure The maximum value register 208 and the minimum value register 209, and the maximum temperature value and the minimum temperature value will be updated dynamically as the temperature of the circuit system is continuously measured.

The value storage circuit 203 in the circuit system actively records the highest and lowest temperature values within a certain period of time and stores them in the temporary register, so that the user can know the most immediate and complete temperature change when the circuit system is in operation. For example, when the circuit system is tested, in the temperature test item, the operation conditions of the circuit system at various temperatures can be obtained through the temperature value recorded by the value storage circuit 203 .

Furthermore, the circuit system is also provided with an interrupt circuit 205, which can be a comparator in an embodiment, and can obtain continuous measurements from the temperature measurement circuit 22 by comparing the high and low thresholds 213 (for example, a high threshold and a low threshold) The interrupt circuit 205 decides to send a high interrupt signal 215 or a low interrupt signal 217 according to the comparison result of the real-time temperature of the circuit system.

In the interrupt circuit 205, an interrupt signal can be actively sent out according to the temperature value measured immediately. For example, when the temperature value (temperature signal 212) output by the temperature measurement circuit 22 is higher than the set high threshold value, a high interrupt signal 215 is sent to an external circuit 26; when the temperature value is judged to be lower than the low threshold value, a low signal is sent. Interrupt signal 217 to external circuit 26 . In this way, the external circuit 26 can perform subsequent measures, such as temperature regulation, according to the received interrupt signal (high interrupt signal 215 or low interrupt signal 217 ).

According to the method for reading the temperature value in the circuit, further reference may be made to the flow chart of the embodiment shown in FIG. 3 .

After the circuit system is started (step S301), the operation of the circuit related to temperature measurement is controlled by starting the control circuit, including first resetting the temperature measurement circuit (that is, the thermometer in the circuit system) (step S303), and then the temperature measurement circuit starts Perform initialization (step S305). When the temperature measurement circuit completes the initialization and starts to measure the temperature, the startup control circuit sends a latch trigger signal to the latch circuit, so that the latch circuit is triggered to latch the initial temperature value (step S307 ).

Afterwards, the temperature measurement circuit continues to operate and continuously outputs temperature values (step S309). In the circuit system, the highest temperature value and the lowest temperature value within a period of time can also be latched (step S311). The measurement circuit operates continuously, and the maximum and minimum temperature values recorded in the register can be dynamically updated to the latest state.

In the process of continuously obtaining the temperature value, the interrupt circuit can compare the immediately obtained temperature value with the preset high and low thresholds (including the high threshold and the low threshold) to determine whether to send an interrupt message (step S313 ). In step S315, it is judged whether the instant temperature exceeds the threshold value. If the threshold value has not been reached (No), the process returns to step S309 to continuously obtain the temperature value and compare the high and low threshold values to make a subsequent judgment; if the threshold value has been reached (Yes), for example, the immediate temperature is higher than the high threshold value or If the temperature is lower than the low threshold value, measures to adjust the temperature are taken (step S317).

For example, when the real-time temperature exceeds the threshold, that is, the threshold for sending an interrupt signal is reached, the interrupt circuit in the circuit system sends an interrupt signal to the external circuit. The external circuit is, for example, a central processing unit (CPU) or a specific control circuit, which can execute follow-up measures according to the interrupt signal. Take adjusting the temperature as an example, you can speed up the fan speed, reduce the fan speed, reduce or increase the frequency, etc. to adjust the temperature.

In summary, according to the above-described embodiment of the circuit system and the method for reading the temperature value in the circuit, the method is suitable for a circuit with a temperature measurement circuit and a large power consumption, and an additional latch circuit is provided in the circuit , and may include a circuit for latching the highest temperature value and the lowest temperature value, and an interrupt circuit. When the circuit system can accurately obtain the initial temperature value, it means that the relevant temperature measurement circuit can be corrected accordingly, so as to accurately measure the temperature of the circuit system and make an immediate and correct response, such as adjusting the temperature. The maximum and minimum temperature values of the latch can dynamically correct the reading and update the temporary register. One of the purposes is to let the user know the maximum and minimum values of the circuit system, which is beneficial to the circuit system in high and low temperature cycle testing. What's more, an accurate temperature value allows the circuit system to accurately generate an interrupt signal and take subsequent measures, such as heat dissipation measures, correctly.

The content disclosed above is only a preferred feasible embodiment of the present invention, and does not therefore limit the scope of the patent application of the present invention. Therefore, all equivalent technical changes made by using the description and drawings of the present invention are included in the application of the present invention. within the scope of the patent.

20: Start the control circuit 22: Temperature measurement circuit 24: Synchronous data processing circuit 26: External circuit 215: High interrupt signal 217: Low interrupt signal 211: Latch trigger signal 212: temperature signal 201: Latch circuit 207: Temporary register 203: Value storage circuit 208: Maximum value temporary register 209: minimum register 205: interrupt circuit 213: High and low threshold S101～S107 steps: the method flow of reading temperature value in the circuit S301～S317 steps: the method flow of reading temperature value in the circuit

Fig. 1 shows the embodiment flowchart of the method for reading temperature value in circuit system;

Fig. 2 shows the circuit system embodiment diagram that realizes the method for reading temperature value in the circuit; And

FIG. 3 shows a flowchart of an embodiment of a method for reading a temperature value within a circuit.

20: Start the control circuit

22: Temperature measurement circuit

24: Synchronous data processing circuit

26: External circuit

215: High interrupt signal

217: Low interrupt signal

211: Latch trigger signal

212: temperature signal

201: Latch circuit

207: Temporary register

203: Value storage circuit

208: Maximum value register

209: minimum register

205: interrupt circuit

213: High and low threshold

Claims (10)

A method of reading a temperature value within a circuit, comprising: activating a latch circuit after activation of a circuit; and An initial temperature value generated by a temperature measurement circuit is latched by the latch circuit and recorded in a register; Wherein, the initial temperature value recorded in the register is used as a correction basis for the temperature measuring circuit to measure the temperature of the circuit. The method for reading a temperature value in a circuit as described in Claim 1, wherein the temperature of the circuit is continuously measured through the temperature measurement circuit, and a maximum temperature value and a minimum temperature value within a certain period of time are also latched by a value storage circuit The temperature value is recorded into a maximum value temporary register and a minimum value temporary register respectively, wherein the maximum temperature value and the minimum temperature value respectively recorded in the maximum value temporary register and the minimum value temporary register follow with The temperature of the circuit is continuously measured and dynamically updated. The method for reading a temperature value in a circuit as described in claim 1, wherein the temperature of the circuit is continuously measured through the temperature measurement circuit, and an interrupt circuit is also provided in the circuit, according to a signal output by the temperature measurement circuit The temperature value is compared with a high threshold value and a low threshold value to determine whether to send a high interrupt signal or a low interrupt signal; wherein the interrupt circuit judges that the temperature value is higher than the high threshold value, and sends the high interrupt signal to a An external circuit; when it is determined that the temperature value is lower than the low threshold value, the low interrupt signal is sent to the external circuit. The method for reading a temperature value in a circuit according to claim 3, wherein the external circuit performs temperature adjustment according to the high interrupt signal or the low interrupt signal sent by the interrupt circuit. The method for reading a temperature value in a circuit as described in any one of claims 1 to 4, wherein the circuit is provided with a startup control circuit, and after the circuit is started, a latch trigger signal is sent to the latch circuit to trigger the latch circuit A latch circuit latches the initial temperature value. The method for reading a temperature value in a circuit as described in Claim 5, wherein the startup control circuit resets the temperature measurement circuit after the circuit is started, and sends the latch trigger after the temperature measurement circuit is initialized Signal. A circuit system in which a method of reading a temperature value within a circuit operates, comprising: - start the control circuit; A temperature measurement circuit, controlled by the start-up control circuit, continuously measures the temperature of the circuit; A latch circuit, electrically connected to the start control circuit, latches a temperature value output by the temperature measurement circuit according to an instruction generated by the start control circuit, and records it in a temporary register; Wherein, after the circuit is started, a latch trigger signal is sent to the latch circuit to trigger the latch circuit to latch an initial temperature value generated by the temperature measurement circuit, and record it in the register ; The initial temperature value recorded in the register is used as a correction basis for the temperature measurement circuit to measure the temperature of the circuit. The circuit system as described in claim item 7, further includes a value storage circuit, which receives the temperature value output by the temperature measurement circuit, and is used to latch a maximum temperature value and a minimum temperature value within a period of time, and record them respectively to a maximum value register and a minimum value register, wherein the maximum temperature value and the minimum temperature value respectively recorded in the maximum value register and the minimum value register are continuously measured as the temperature of the circuit And dynamic updates. In the circuit system described in claim 7, an interrupt circuit is also provided, and a high threshold value and a low threshold value are compared according to the temperature value output by the temperature measurement circuit to determine whether to send a high interrupt signal or a low interrupt signal. The circuit system as described in claim 9, wherein the interrupt circuit judges that the temperature value is higher than the high threshold value, and sends the high interrupt signal to an external circuit; when it judges that the temperature value is lower than the low threshold value, sends The low interrupt signal is sent to the external circuit; wherein the external circuit performs temperature regulation according to the high interrupt signal or the low interrupt signal sent by the interrupt circuit.

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