TW202226688A - Differential circuit board and semiconductor light-emitting device - Google Patents
Differential circuit board and semiconductor light-emitting device Download PDFInfo
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
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Abstract
Description
本揭示內容涉及差動電路板和半導體發光裝置。 相關申請的交叉引用 The present disclosure relates to differential circuit boards and semiconductor light emitting devices. CROSS-REFERENCE TO RELATED APPLICATIONS
本申請案主張2020年9月14日提交的日本專利申請JP2020-153685和2020年11月10日提交的JP2020-186989的優先權,其內容通過引用明確結合於此。This application claims priority to Japanese Patent Applications JP2020-153685 filed on September 14, 2020 and JP2020-186989 filed on November 10, 2020, the contents of which are expressly incorporated herein by reference.
背景技術Background technique
已知差動驅動系統用於確保通信光學模組(例如電吸收調製器積體雷射(EML))的電信號品質。一種差動驅動系統具有一對相同線寬的差動傳輸線,以平衡一對相位相反的信號。在某些情況下,線寬需要足夠寬,以便將EML安裝在一對差動傳輸線之一上。在這種情況下,與單端驅動系統相比,很難縮小差動驅動系統的尺寸。Differential drive systems are known to ensure electrical signal quality in communication optical modules such as electro-absorption modulator integrated lasers (EMLs). A differential drive system has a pair of differential transmission lines of the same line width to balance a pair of signals in opposite phases. In some cases, the line width needs to be wide enough to fit the EML on one of a pair of differential transmission lines. In this case, it is difficult to downsize the differential drive system compared to the single-ended drive system.
根據一些可能的實施方式,差動電路板可以包括:具有第一表面和第二表面的介電層,該介電層具有在第一表面和第二表面之間具有第一厚度的第一部分,該介電層具有在第一表面和第二表面之間具有小於第一厚度的第二厚度的第二部分;具有第一線寬的第一導體線,該第一導體線設置在第一部分的第一表面上;第二導體線,其具有小於第一線寬的第二線寬,第二導體線設置在第二部分的第一表面上;以及設置在第一部分的第二表面和第二部分的第二表面上的接地導體,該接地導體與第一導體線和第二導體線重疊。第一導體線和第二導體線可以是差動傳輸線。According to some possible embodiments, the differential circuit board may include a dielectric layer having a first surface and a second surface, the dielectric layer having a first portion having a first thickness between the first surface and the second surface, The dielectric layer has a second portion between the first surface and the second surface having a second thickness less than the first thickness; a first conductor line having a first line width, the first conductor line being disposed on the first portion on the first surface; a second conductor line having a second line width smaller than the first line width, the second conductor line being disposed on the first surface of the second portion; and disposed on the second surface and the second portion of the first portion A ground conductor on the second surface of the portion, the ground conductor overlapping the first conductor line and the second conductor line. The first conductor line and the second conductor line may be differential transmission lines.
根據一些可能的實施方式,半導體發光裝置可以包括:差動電路板;和安裝在差動電路板上的光學半導體裝置。According to some possible embodiments, the semiconductor light emitting device may include: a differential circuit board; and an optical semiconductor device mounted on the differential circuit board.
在下文中,將參考附圖具體和詳細地描述一些實施方式。在所有附圖中,具有相同附圖標記的構件具有完全相同或相同的特徵,並且將省略它們的重複描述。附圖的大小並不總是與放大倍數相符。Hereinafter, some embodiments will be described in detail and in detail with reference to the accompanying drawings. In all the drawings, members having the same reference numerals have exactly the same or the same features, and their repeated descriptions will be omitted. The size of the drawings does not always correspond to the magnification.
圖1是示例差動電路板的平面圖。圖2是圖1所示的示例差動電路板的II-II截面圖。差動電路板具有介電層10。介電層10包括電介質,例如氮化鋁。介電層10是單層。介電層10具有第一表面12和第二表面14。介電層10包括第一部分16。第一部分16在第一表面12和第二表面14之間具有第一厚度h1。介電層10包括第二部分18。第二部分18在第一表面12和第二表面14之間具有小於第一厚度h1的第二厚度h2。第一部分16和第二部分18在第一表面12上齊平。第二表面14在第一部分16和第二部分18之間具有臺階(step)(高度轉換單元)20。即,第一部分16和第二部分18之間的厚度差出現在第二表面14上。FIG. 1 is a plan view of an example differential circuit board. FIG. 2 is a II-II cross-sectional view of the example differential circuit board shown in FIG. 1 . The differential circuit board has a
示例差動電路板具有第一導體線22。第一導體線22具有第一線寬W1。第一導體線22設置在第一部分16的第一表面12上。差動電路板具有第二導體線24。第二導體線24具有小於第一線寬W1的第二線寬W2。第二導體線24設置在第二部分18的第一表面12上。第二導體線24位於第二部分18在第一導體線22和第二導體線24的對齊方向上的中心。第二表面14的臺階20正好在第一導體線22和第二導體線24之間的空間中心的下方。即,從第一導體線22到中心的距離d1等於從第二導體線24到中心的距離d2。The example differential circuit board has a
第一導體線22和第二導體線24包括諸如金的材料,並且可以使用層壓材料。第一導體線22和第二導體線24構成差動傳輸線。第一線寬W1、第二線寬W2、第一厚度h1和第二厚度h2被設計成具有差動傳輸線100Ω的特性阻抗。The
示例差動電路板具有接地導體26。接地導體26包括諸如金的材料,並且可以使用層壓材料。接地導體26設置在第一部分16的第二表面14和第二部分18的第二表面14上。接地導體26在第一部分16的第二表面14和第二部分18的第二表面14上是連續的。接地導體26也形成在第一部分16的鄰近第二部分18的側表面上。接地導體26是整體形成的,因此消除了圖案化並簡化了與示例性差動電路板相關的製造過程。The example differential circuit board has
接地導體26與第一導體線22和第二導體線24重疊。因此,第一導體線22和接地導體線26構成微帶線類型的具有GND的高頻線。此外,第二導體線24和接地導體線26也構成微帶線類型的具有GND的高頻線。The
這樣,當第二線寬W2小於第一線寬W1時,示例性差動電路板可以縮小尺寸(例如,與傳統差動電路板相比)。儘管第二線寬W2小於第一線寬W1,但是第二厚度h2小於第一厚度h1,從而平衡了要差動傳輸的信號對,並且不會導致特性阻抗的惡化。In this way, when the second line width W2 is smaller than the first line width W1, the exemplary differential circuit board can be downsized (eg, compared to a conventional differential circuit board). Although the second line width W2 is smaller than the first line width W1, the second thickness h2 is smaller than the first thickness h1, thereby balancing the signal pair to be differentially transmitted without causing deterioration of characteristic impedance.
圖3是示例差動電路板的模擬模型的示意圖。第一導體線22、第二導體線24、第一部分16和第二部分18具有上面結合圖1和2描述的特徵。具體尺寸如圖所示。差動阻抗設置為100Ω。3 is a schematic diagram of a simulation model of an example differential circuit board. The
圖4是示例差動電路板的模擬模型的示意圖。這對導體線的寬度與圖3所示的相同,並且介電層的厚度也是均勻的。具體尺寸如圖所示。差動阻抗設置為100Ω。4 is a schematic diagram of a simulation model of an example differential circuit board. The width of the pair of conductor lines is the same as that shown in FIG. 3, and the thickness of the dielectric layer is also uniform. The specific size is shown in the picture. The differential impedance is set to 100Ω.
圖5是使用三維電場分析工具通過模擬獲得的與圖3所示的示例差動電路板和圖4所示的示例差動電路板相關的頻率特性圖。如圖5所示,對於圖3的示例差動電路板和圖4的示例差動電路板,在0GHz至60GHz的範圍內獲得足夠的傳輸特性(S21)。在高達至少50GHz的應用中,示例性差動電路板的圖3實施方式可以獲得與普通差動電路板一樣好的特性,示例性差動電路板的尺寸小20%。這些尺寸僅僅是一個例子,並且可以根據諸如期望的差動阻抗、所需的頻帶和介電層10的介電常數等條件來確定。5 is a graph of frequency characteristics related to the example differential circuit board shown in FIG. 3 and the example differential circuit board shown in FIG. 4 obtained through simulation using a three-dimensional electric field analysis tool. As shown in FIG. 5 , for the example differential circuit board of FIG. 3 and the example differential circuit board of FIG. 4 , sufficient transmission characteristics are obtained in the range of 0 GHz to 60 GHz ( S21 ). In applications up to at least 50 GHz, the FIG. 3 embodiment of the exemplary differential circuit board can achieve as good characteristics as a conventional differential circuit board, with the exemplary differential circuit board being 20% smaller in size. These dimensions are just an example, and may be determined according to conditions such as desired differential impedance, desired frequency band, and dielectric constant of
圖6是示例差動電路板的截面圖。示例性差動電路板與在此結合圖1-5描述的示例性差動電路板的不同之處在於介電層是多層(例如,具有不同介電常數的層10A、10B)。上面結合圖1-5描述的內容適用於此。6 is a cross-sectional view of an example differential circuit board. The exemplary differential circuit board differs from the exemplary differential circuit board described herein in connection with FIGS. 1-5 in that the dielectric layers are multiple layers (eg,
圖7是示例差動電路板的截面圖。示例性差動電路板與在此結合圖1-6描述的示例性差動電路板的不同之處在於接地導體是分開的。接地導體包括在第一部分16的第二表面14上的第一接地導體26A。接地導體包括設置在第二部分18的第二表面14上並與第一接地導體26A分離的第二接地導體26B。接地導體26沒有形成在第一部分16的與第二部分18相鄰的側表面上。上面結合圖1-6描述的內容適用於此。7 is a cross-sectional view of an example differential circuit board. The exemplary differential circuit board differs from the exemplary differential circuit board described herein in connection with FIGS. 1-6 in that the ground conductors are separate. The ground conductors include a
圖8是示例差動電路板的截面圖。示例性差動電路板與這裡中結合圖1-7描述的示例性差動電路板的不同之處在於,第二表面14的臺階20B不僅僅位於第一導體線22和第二導體線24之間的空間中心下方。上面結合圖1-7描述的內容適用於此。8 is a cross-sectional view of an example differential circuit board. The exemplary differential circuit board differs from the exemplary differential circuit board described herein in connection with FIGS. 1-7 in that the
圖9是示例差動電路板的截面圖。介電層10具有厚度在第一部分16和第二部分18之間變化的第三部分28。第三部分28不與第一導體線22和第二導體線24重疊。第二導體線24位於第二部分18在第一導體線22和第二導體線24的對齊(align)方向上的中心。第三部分28以第一厚度h1與第一部分16成一體,並以第二厚度h2與第二部分18成一體。第一部分16的第二表面14和第二部分18的第二表面14與第三部分28的傾斜表面連接。這種形狀在高頻特性方面也沒有實際上嚴重的水平差異。9 is a cross-sectional view of an example differential circuit board. The
圖10是示例差動電路板的平面圖。圖11是圖10所示的示例差動電路板的XI-XI截面圖。FIG. 10 is a plan view of an example differential circuit board. FIG. 11 is an XI-XI cross-sectional view of the example differential circuit board shown in FIG. 10 .
介電層210包括一些第一部分216。介電層210包括一些第二部分218。第一部分216和第二部分218交替佈置。第一導體線222設置在每個第一部分216的第一表面212上。第二導體線224設置在每個第二部分218的第一表面212上。第一導體線222和第二導體線224在多個通道CH的每一個中構成差動傳輸線。
第一表面212上的每個第一部分216包括佈線區域230,第一導體線222形成在佈線區域230中。第一表面212上的每個第一部分216包括鄰近佈線區域230的邊緣區域(margin area)232,邊緣寬度Wm在與第二導體線224相反的方向上。這些第一部分216的邊緣寬度Wm相等。Each
接地導體226在第一部分216的第二表面214和第二部分218的第二表面214上是連續的。第二表面214在第一部分216和第二部分218之間具有臺階220。第二表面214的臺階220正好在第一導體線222和第二導體線224之間的空間中心的下方。第二導體線224位於第二部分218在第一導體線222和第二導體線224的對齊方向上的中心。上面結合圖1-9描述的內容適用於此。The
在一些實施方式中,每個通道CH中的第二線寬W2小於第一線寬W1,從而提供小陣列型差動電路板。或者,相鄰通道CH之間的距離可以增加,而不改變陣列型差動電路板的尺寸。這能夠減少串擾。或者,相鄰通道CH之間的距離可以更大,而差動電路板更小。In some embodiments, the second line width W2 in each channel CH is smaller than the first line width W1, thereby providing a small array type differential circuit board. Alternatively, the distance between adjacent channels CH may be increased without changing the size of the array type differential circuit board. This can reduce crosstalk. Alternatively, the distance between adjacent channels CH can be larger and the differential circuit board smaller.
圖12是示例差動電路板的截面圖。第一表面312上的每個第一部分316具有佈線區域330,第一導體線322形成在佈線區域330中。第一表面312上的每個第一部分316在在第二導體線324相反的方向上沒有與佈線區域330相鄰的邊緣。第二表面314的臺階320正好在第一導體線322和第二導體線324之間的空間中心的下方。上面結合圖10-11描述的內容適用於此。12 is a cross-sectional view of an example differential circuit board. Each
圖13是示例半導體發光裝置的平面圖。圖14是圖13中所示的示例半導體發光裝置的XIV-XIV截面圖。半導體發光裝置具有差動電路板400。上面結合圖1-9描述的內容適用於差動電路板400。13 is a plan view of an example semiconductor light emitting device. FIG. 14 is a cross-sectional view XIV-XIV of the example semiconductor light emitting device shown in FIG. 13 . The semiconductor light emitting device has the
光學半導體裝置434安裝在差動電路板400上。光學半導體裝置434具有用於發光的半導體雷射436。光學半導體裝置434具有電吸收調製器438,用於通過電吸收效應調製光。光學半導體裝置434是整合有半導體雷射436和電吸收調製器438的電吸收調製器積體雷射。The
圖15是示例性光學半導體裝置434的截面圖(例如,上面參照圖13-14描述的示例性半導體發光裝置的截面圖)。半導體雷射436和電吸收調製器438內置於半導體基板440中。半導體基板440是n型InP基板。半導體雷射436在半導體基板440上具有插在下SCH(分離限制異質結構)層442A和上SCH層444A之間的多量子阱446A。在上SCH層444A上有一個繞射光柵層448,覆蓋有一個包覆層450A。雷射436可以是分布式布拉格反射器(DBR)配置或分布式反饋(DFB)配置。15 is a cross-sectional view of an exemplary optical semiconductor device 434 (eg, the cross-sectional views of the exemplary semiconductor light emitting device described above with reference to FIGS. 13-14). The
電吸收調製器438在半導體基板440上方具有插在下SCH層442B和上SCH層444B之間的多量子阱446B。上SCH層444B被包覆層450B覆蓋。包覆層450A和包覆層450B可以是相同的材料或不同的材料。電吸收調製器438和半導體雷射436可以不整合在同一半導體基板440上,而是可以形成在不同的半導體基板440上。
光學半導體裝置434具有電吸收調製器438和半導體雷射436共用的下電極452(例如陰極)。下電極452可以分別形成在電吸收調製器438和半導體雷射436上。半導體雷射436具有用於施加直流電壓的上電極454(例如陽極)。直流電壓施加在上電極454和下電極452之間。光學半導體裝置434具有電吸收調製器438的上電極456(例如陽極)。在上電極456和下電極452之間施加AC電壓。The
光學半導體裝置434(下電極452)與第一導體線422相對,沒有突起。第一導體線422的第一線寬W1(例如,如圖13所示)被設置為足以安裝光學半導體裝置434的尺寸,並且在延伸方向上是恒定的。電吸收調製器438的上電極456通過導線468連接到第二導體線424。儘管未示出,但是半導體雷射436的上電極454通過諸如導線的連接裝置電連接到直流電源。The optical semiconductor device 434 (the lower electrode 452 ) is opposed to the
差動電路板400具有設置在第一表面412上並在與第二導體線424相反的方向上鄰近第一導體線422的墊(pad)458(例如,如圖14所示)。墊458設置在第一部分416上。差動電路板400具有串聯在墊458和第一導體線422之間的匹配電阻器460。匹配電阻器460被連接用於阻抗匹配。半導體發光裝置具有被配置為連接電吸收調製器438的上電極456和墊458的導線470。因此,匹配電阻器460並聯連接到電吸收調製器438。The
用於差動信號傳輸的高頻信號被輸入到第一導體線422和第二導體線424。高頻信號分別施加到電吸收調製器438的下電極452和上電極456,用於通過差動信號驅動它。High-frequency signals for differential signal transmission are input to the
圖16是示例半導體發光裝置的平面圖。第二導體線524具有在與第一導體線522相反的方向上延伸的短截線(stub)562。短截線562包括與第二導體線524相同的材料或相同的層壓材料。第一導體線522具有鄰近墊558的部分和短截線562延伸的鄰近第二導體線524的部分。16 is a plan view of an example semiconductor light emitting device. The
第二導體線524具有短截線562,從而在電特性上更接近於連接到匹配電阻器560和墊558的第一導體線522。結果,第一導體線522和第二導體線524的高頻線在高頻特性上變得更近,從而改善了差動信號驅動的信號品質。上面結合圖13-15描述的內容適用於此。The
圖17是示例半導體發光裝置的平面圖。圖18是圖17所示的示例發光裝置的XVIII-XVIII截面圖。17 is a plan view of an example semiconductor light emitting device. 18 is a XVIII-XVIII cross-sectional view of the example light emitting device shown in FIG. 17 .
示例半導體發光裝置具有差動電路板600。上面關於圖11和圖13所描述的適用於差動電路板600。半導體示例發光裝置具有光學半導體裝置634。上面關於圖13所描述的適用於光學半導體裝置634。The example semiconductor light emitting device has a
第一表面612上的每個第一部分616包括佈線區域630,其中形成第一導體線622。第一表面612上的每個第一部分616包括與佈線區域630相鄰的邊緣區域632,邊緣寬度Wm在與第二導體線624相反的方向上(例如,如上文關於圖11所述)。這些第一部分616的邊緣寬度Wm相等。墊658設置在第一部分616上。Each
在每個通道CH中,用於差動信號傳輸的高頻信號被輸入到第一導體線622和第二導體線624。高頻信號分別施加到電吸收調製器638的下電極(未示出)和上電極656,用於差動信號驅動。In each channel CH, a high-frequency signal for differential signal transmission is input to the
圖19是示例半導體發光裝置的平面圖。圖20是圖19所示的示例半導體發光裝置的XX-XX截面圖。FIG. 19 is a plan view of an example semiconductor light emitting device. FIG. 20 is a XX-XX cross-sectional view of the example semiconductor light emitting device shown in FIG. 19 .
相鄰通道CH之間的差動電路板700具有設置在第一表面712上的通道間導體764(例如,通路,諸如填充通路或通孔通路)。差動電路板700具有連接導體766,連接導體766連接接地導體726和通道間導體764並穿透介電層710。連接導體766穿透第一部分716,而不穿透第二部分718。墊758設置在第一部分716上。The
連接到接地導體726的通道間導體764設置在相鄰通道CH之間,從而減少相鄰通道CH之間的電串擾。
圖21是示例半導體發光裝置的截面圖。差動電路板800具有佈置在相鄰通道CH之間的第一表面812上的通道間導體864。差動電路板800穿透介電層810,並且具有連接導體866,該連接導體866連接接地導體826和通道間導體864。連接導體866穿透第二部分818,而不穿透第一部分816。墊858設置在第二部分818上。21 is a cross-sectional view of an example semiconductor light emitting device. The
通道間導體864形成在薄的第二部分818上,使得通孔更小。例如,可以形成小直徑通孔。因此,提供了更小的半導體發光裝置。The
前述公開內容提供了說明和描述,但不旨在窮舉或將實施方式限制於所公開的精確形式。可以根據上述公開進行修改和變化,或者可以從實現的實踐中獲得修改和變化。此外,這裡描述的任何實施方式都可以被組合,除非前述公開明確地提供了一個或多個實施方式不能被組合的理由。The foregoing disclosure provides illustration and description, but is not intended to be exhaustive or to limit embodiments to the precise form disclosed. Modifications and variations may be made in light of the above disclosure or may be acquired from practice of implementation. Furthermore, any of the embodiments described herein may be combined unless the foregoing disclosure expressly provides a reason why one or more embodiments cannot be combined.
即使特徵的特定組合在申請專利範圍中被引用和/或在說明書中被公開,這些組合並不旨在限制各種實施方式的公開。事實上,這些特徵中的許多可以以申請專利範圍中沒有具體敘述和/或說明書中沒有公開的方式組合。儘管下面列出的每個從屬請求項可以直接依賴於僅一個請求項,但是各種實施方式的公開包括每個從屬請求項以及請求項集中的每個其他請求項。如這裡所使用的,涉及物品列表中的“至少一個”的短語是指那些物品的任何組合,包括單個構件。例如,“a、b或c中的至少一個”意在涵蓋a、b、c、a-b、a-c、b-c和a-b-c,以及多個相同物品的任意組合。Even if specific combinations of features are cited in the claims and/or disclosed in the specification, these combinations are not intended to limit the disclosure of various embodiments. Indeed, many of these features may be combined in ways not specifically recited in the claims and/or disclosed in the specification. Although each dependent request item listed below may directly depend on only one request item, the disclosure of various embodiments includes each dependent request item as well as every other request item in the set of request items. As used herein, phrases referring to "at least one" of a list of items refer to any combination of those items, including individual components. For example, "at least one of a, b, or c" is intended to encompass a, b, c, a-b, a-c, b-c, and a-b-c, as well as any combination of multiples of the same item.
除非明確描述,否則這裡使用的元件、動作或指令不應被解釋為關鍵或必要的。此外,如這裡所用,冠詞“一”和“一個”旨在包括一個或多個物品,並且可以與“一個或多個”互換使用。此外,如這裡所用,冠詞“該”旨在包括與冠詞“該”相關聯的一個或多個物品,並且可以與“該一個或多個”互換使用。此外,如這裡所用,術語“集合”旨在包括一個或多個物品(例如,相關物品、不相關物品或相關和不相關物品的組合),並且可以與“一個或多個”互換使用。當只打算使用一個物品時,使用短語“僅一個”或類似的語言。此外,如這裡所用,術語“有”、“具有”、“含有”等意在是開放式術語。此外,短語“基於”意在表示“至少部分基於”,除非另有明確說明。此外,如這裡所用,術語“或”在串聯使用時旨在包括在內,並且可以與“和/或”互換使用,除非另有明確說明(例如,如果與“任一”或“僅其中之一”結合使用)。此外,為了便於描述,這裡可以使用空間上相對的術語,例如“下方”、“下”、“上方”、“上”等,來描述一個元件或特徵與圖中所示的另一個(另一些)元件或特徵的關係。除了圖中所示的取向之外,空間相對術語旨在包括使用或操作中的裝置、裝置和/或元件的不同取向。該裝置可以以其他方式取向(旋轉90度或以其他取向),並且這裡使用的空間相對描述符同樣可以相應地解釋。No element, act, or instruction used herein should be construed as critical or essential unless explicitly described as such. Also, as used herein, the articles "a" and "an" are intended to include one or more items, and can be used interchangeably with "one or more." Also, as used herein, the article "the" is intended to include the one or more items associated with the article "the", and can be used interchangeably with "the one or more." Also, as used herein, the term "collection" is intended to include one or more items (eg, related items, unrelated items, or a combination of related and unrelated items), and can be used interchangeably with "one or more." When only one item is intended to be used, the phrase "only one" or similar language is used. Furthermore, as used herein, the terms "has," "has," "includes," and the like are intended to be open-ended terms. Furthermore, the phrase "based on" is intended to mean "based at least in part on" unless expressly stated otherwise. Also, as used herein, the term "or" when used in tandem is intended to be inclusive and can be used interchangeably with "and/or" unless expressly stated otherwise (eg, if used in conjunction with "either" or "only one of" a" used in combination). Also, for ease of description, spatially relative terms, such as "below," "lower," "above," "over," etc., may be used herein to describe one element or feature as being different from another (other) shown in the figures. ) component or feature relationship. In addition to the orientation shown in the figures, spatially relative terms are intended to encompass different orientations of the device, device, and/or element in use or operation. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
10:介電層 10A:層 10B:層 12:第一表面 14:第二表面 16:第一部分 18:第二部分 20:臺階 20B:臺階 22:第一導體線 24:第二導體線 26:接地導體 26A:第一接地導體 26B:第二接地導體 28:第三部分 210:介電層 212:第一表面 214:第二表面 216:第一部分 218:第二部分 220:臺階 222:第一導體線 224:第二導體線 226:接地導體 230:佈線區域 232:邊緣區域 312:第一表面 314:第二表面 316:第一部分 320:臺階 322:第一導體線 324:第二導體線 330:佈線區域 400:差動電路板 416:第一部分 422:第一導體線 424:第二導體線 434:光學半導體裝置 436:半導體雷射 438:電吸收調製器 440:半導體基板 442A:下SCH(分離限制異質結構)層 442B:上SCH層 444A:上SCH層 444B:上SCH層 446A:多量子阱 446B:多量子阱 448:繞射光柵層 450A:包覆層 450B:包覆層 452:下電極 454:上電極 456:上電極 458:墊 460:匹配電阻器 468:導線 470:導線 522:第一導體線 524:第二導體線 558:墊 560:匹配電阻器 562:短截線 600:差動電路板 612:第一表面 616:第一部分 622:第一導體線 624:第二導體線 630:佈線區域 632:邊緣區域 634:光學半導體裝置 638:電吸收調製器 656:上電極 658:墊 700:差動電路板 710:介電層 712:第一表面 716:第一部分 718:第二部分 726:接地導體 758:墊 764:通道間導體 766:連接導體 800:差動電路板 810:介電層 816:第一部分 818:第二部分 826:接地導體 858:墊 864:通道間導體 866:連接導體 CH:通道 d1:距離 d2:距離 h1:第一厚度 h2:第二厚度 W1:第一線寬 W2:第二線寬 Wm:邊緣寬度 10: Dielectric layer 10A: Layer 10B: Layer 12: First surface 14: Second Surface 16: Part One 18: Part Two 20: steps 20B: Steps 22: The first conductor line 24: Second conductor wire 26: Ground conductor 26A: First ground conductor 26B: Second ground conductor 28: Part Three 210: Dielectric Layer 212: First Surface 214: Second Surface 216: Part One 218: Part II 220: Steps 222: first conductor line 224: Second conductor line 226: Ground conductor 230: Routing area 232: Edge Region 312: First Surface 314: Second Surface 316: Part One 320: Steps 322: first conductor line 324: Second conductor line 330: Routing area 400: Differential circuit board 416: Part 1 422: first conductor line 424: Second conductor line 434: Optical Semiconductor Devices 436: Semiconductor Laser 438: Electro-absorption modulator 440: Semiconductor substrate 442A: Lower SCH (Separation Confinement Heterostructure) Layer 442B: Upper SCH layer 444A: Upper SCH layer 444B: Upper SCH layer 446A: Multiple Quantum Wells 446B: Multiple Quantum Wells 448: Diffraction grating layer 450A: Cladding 450B: Cladding 452: Lower electrode 454: Upper electrode 456: Upper electrode 458: Pad 460: Matching resistor 468: Wire 470: Wire 522: first conductor line 524: Second conductor line 558: Pad 560: Matching resistor 562: Stub 600: Differential circuit board 612: First Surface 616: Part 1 622: first conductor line 624: Second conductor line 630: Routing area 632: Edge Region 634: Optical Semiconductor Devices 638: Electro-absorption modulator 656: Upper electrode 658: Pad 700: Differential circuit board 710: Dielectric layer 712: First Surface 716: Part 1 718: Part Two 726: Ground conductor 758: Pad 764: Conductor between channels 766: Connecting conductors 800: Differential circuit board 810: Dielectric layer 816: Part 1 818: Part II 826: Ground conductor 858: Pad 864: Conductor between channels 866: Connecting conductors CH: channel d1: distance d2: distance h1: first thickness h2: second thickness W1: first line width W2: Second line width Wm: Margin width
[圖1]是這裡描述的示例差動電路板的平面圖。[Fig. 1] is a plan view of an example differential circuit board described here.
[圖2]是圖1所示的示例差動電路板的II-II截面圖。[ FIG. 2 ] is a II-II sectional view of the example differential circuit board shown in FIG. 1 .
[圖3]是這裡描述的示例差動電路板的模擬模型的圖。[FIG. 3] is a diagram of a simulation model of the example differential circuit board described here.
[圖4]是這裡描述的示例差動電路板的模擬模型的圖。[FIG. 4] is a diagram of a simulation model of the example differential circuit board described here.
[圖5]是通過使用三維電場分析工具的模擬獲得的與這裡描述的示例差動電路板相關的頻率特性圖。[Fig. 5] is a graph of frequency characteristics related to the example differential circuit board described here obtained by simulation using a three-dimensional electric field analysis tool.
[圖6]是這裡描述的示例差動電路板的截面圖。[FIG. 6] is a cross-sectional view of an example differential circuit board described here.
[圖7]是這裡描述的示例差動電路板的截面圖。[FIG. 7] is a cross-sectional view of an example differential circuit board described herein.
[圖8]是這裡描述的示例差動電路的截面圖。[FIG. 8] is a cross-sectional view of an example differential circuit described herein.
[圖9]是這裡描述的示例差動電路板的截面圖。[ FIG. 9 ] is a cross-sectional view of an example differential circuit board described here.
[圖10]是這裡描述的示例差動電路板的平面圖。[ FIG. 10 ] is a plan view of an example differential circuit board described here.
[圖11]是圖10所示的示例差動電路板的XI-XI截面圖。[ FIG. 11 ] is an XI-XI cross-sectional view of the example differential circuit board shown in FIG. 10 .
[圖12]是這裡描述的示例差動電路板的截面圖。[ FIG. 12 ] is a cross-sectional view of an example differential circuit board described here.
[圖13]是這裡描述的示例半導體發光裝置的平面圖。[ FIG. 13 ] is a plan view of an example semiconductor light emitting device described herein.
[圖14]是圖13中所示的示例半導體發光裝置的XIV-XIV截面圖。[ FIG. 14 ] is an XIV-XIV cross-sectional view of the example semiconductor light emitting device shown in FIG. 13 .
[圖15]是這裡描述的示例光學半導體裝置的截面圖。[ FIG. 15 ] is a cross-sectional view of an example optical semiconductor device described herein.
[圖16]是這裡描述的示例半導體發光裝置的平面圖。[ FIG. 16 ] is a plan view of an example semiconductor light emitting device described herein.
[圖17]是這裡描述的示例半導體發光裝置的平面圖。[ FIG. 17 ] is a plan view of an example semiconductor light emitting device described herein.
[圖18]是圖17所示的示例發光裝置的XVIII-XVIII截面圖。[ Fig. 18 ] is an XVIII-XVIII cross-sectional view of the example light-emitting device shown in Fig. 17 .
[圖19]是這裡描述的示例半導體發光裝置的平面圖。[ FIG. 19 ] is a plan view of an example semiconductor light emitting device described herein.
[圖20]是圖19所示的示例半導體發光裝置的XX-XX截面圖。[ FIG. 20 ] is a XX-XX cross-sectional view of the example semiconductor light emitting device shown in FIG. 19 .
[圖21]是這裡描述的示例半導體發光裝置的截面圖。[ FIG. 21 ] is a cross-sectional view of an example semiconductor light emitting device described herein.
10:介電層 10: Dielectric layer
12:第一表面 12: First surface
14:第二表面 14: Second Surface
16:第一部分 16: Part One
18:第二部分 18: Part Two
20:臺階 20: steps
22:第一導體線 22: The first conductor line
24:第二導體線 24: Second conductor line
26:接地導體 26: Ground conductor
d1:距離 d1: distance
d2:距離 d2: distance
h1:第一厚度 h1: first thickness
h2:第二厚度 h2: second thickness
W1:第一線寬 W1: first line width
W2:第二線寬 W2: Second line width
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JP2020-153685 | 2020-09-14 | ||
JP2020-186989 | 2020-11-10 | ||
JP2020186989A JP2022048059A (en) | 2020-09-14 | 2020-11-10 | Differential wiring board and semiconductor light-emitting device |
US17/216,118 | 2021-03-29 | ||
US17/216,118 US20220087007A1 (en) | 2020-09-14 | 2021-03-29 | Differential circuit board and semiconductor light emitting device |
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