TW202224002A - Plating device and plating processing method to suppress the quality deterioration of a wafer plating resulting from a process gas remaining on an undersurface of a separation membrane - Google Patents

Plating device and plating processing method to suppress the quality deterioration of a wafer plating resulting from a process gas remaining on an undersurface of a separation membrane Download PDF

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TW202224002A
TW202224002A TW109143721A TW109143721A TW202224002A TW 202224002 A TW202224002 A TW 202224002A TW 109143721 A TW109143721 A TW 109143721A TW 109143721 A TW109143721 A TW 109143721A TW 202224002 A TW202224002 A TW 202224002A
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anode
plating
substrate
process gas
cover
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TW109143721A
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TWI758006B (en
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張紹華
増田泰之
関正也
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日商荏原製作所股份有限公司
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Abstract

The present invention provides a technique that suppresses the quality deterioration of a wafer plating resulting from a process gas remaining on an undersurface of a separation membrane. A plating device 1000 comprises: a plating tank 10 having an anode chamber 13 in which an anode 11 is disposed; and a wafer clamp 30 allocated on the wafer Wf that is disposed further above the anode chamber and is kept as a cathode, wherein the anode has a cylindrical shape that extends in an up-down direction. The plating device further comprises: a gas storage part 60 in which the anode chamber is arranged so as to form a space with respect to the anode and covers the upper end, outer circumference, and inner circumferential surface of the anode for storing a process gas generated by the anode; and a discharging mechanism 70, which discharges the process gas stored in the gas storage part to the outside of the plating tank.

Description

鍍覆裝置及鍍覆處理方法Plating apparatus and plating treatment method

本發明是關於一種鍍覆裝置及鍍覆處理方法。The present invention relates to a plating device and a plating treatment method.

以往,已知所謂的杯式鍍覆裝置,做為對基板施加鍍覆處理的鍍覆裝置(例如參照專利文獻1)。像這樣的鍍覆裝置,具備:鍍覆槽,配置隔膜,並在此隔膜更下側分隔的陽極室配置有陽極;以及基板夾具,配在比陽極室更上方,保持做為陰極的基板。又,在如此的以往鍍覆裝置中,陽極具有在水平方向延伸的平板形狀。Conventionally, a so-called cup-type plating apparatus is known as a plating apparatus for applying a plating treatment to a substrate (for example, refer to Patent Document 1). Such a plating apparatus includes a plating tank, a separator is arranged, and an anode is arranged in an anode chamber separated from the lower side of the separator, and a substrate holder is arranged above the anode chamber and holds a substrate serving as a cathode. In addition, in such a conventional plating apparatus, the anode has a flat plate shape extending in the horizontal direction.

此外,列舉專利文獻2做為關於本發明的其他先前技術文獻。在此專利文獻2揭露關於陽極罩的技術。具體來說,此專利文獻2揭露一種鍍覆裝置,具有:陽極罩,具有在陽極與基板之間流動的電通過的開口部;以及變更此開口部大小的機構(稱為開口部可變機構)。根據如此鍍覆裝置,可藉由開口部可變機構來變更陽極罩的開口部大小,使陽極與基板之間所形成的電場形成態樣變化。In addition, Patent Document 2 is cited as another prior art document concerning the present invention. Here, Patent Document 2 discloses a technique regarding an anode cover. Specifically, this patent document 2 discloses a plating apparatus including: an anode cover having an opening through which electricity flows between the anode and a substrate; and a mechanism for changing the size of the opening (referred to as an opening variable mechanism). ). According to such a plating apparatus, the size of the opening of the anode cover can be changed by the opening variable mechanism, so that the formation state of the electric field formed between the anode and the substrate can be changed.

[先前技術文獻] [專利文獻] [專利文獻1]特開2008-19496號公報 [專利文獻2]特開2017-137519號公報 [Prior Art Literature] [Patent Literature] [Patent Document 1] Japanese Patent Laid-Open No. 2008-19496 [Patent Document 2] Japanese Patent Laid-Open No. 2017-137519

[發明所欲解決的問題] 在如上述專利文獻1所例示的以往杯式鍍覆裝置中,鍍覆處理時從陽極產生的製程氣體有滯留於隔膜下表面之虞。在此情況下,有因此製程氣體導致基板鍍覆品質惡化之虞。 [Problems to be Solved by Invention] In the conventional cup-type plating apparatus exemplified in the above-mentioned Patent Document 1, there is a possibility that the process gas generated from the anode during the plating treatment may remain on the lower surface of the separator. In this case, there is a possibility that the plating quality of the substrate may be deteriorated due to the process gas.

本發明有鑑於上述問題,其目的為提供一種可抑制因隔膜下表面所滯留的製程氣體導致基板鍍覆品質惡化的技術。The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to provide a technology that can suppress the deterioration of the plating quality of the substrate caused by the process gas retained on the lower surface of the diaphragm.

[解決問題的手段] (態樣1) 為了達成上述目的,關於本發明的一態樣的鍍覆裝置,具備:鍍覆槽,配置有隔膜,在比前述隔膜更下側分隔的陽極室配置有陽極;以及基板夾具,配置於比前述陽極室更上方並保持做為陰極的基板,其中前述陽極具有在上下方向延伸的圓筒形狀,前述鍍覆裝置,更具備:氣體儲藏部,設有陽極室,以在與前述陽極之間具有空間並覆蓋前述陽極的上端、外周以及內周面,來儲藏從前述陽極產生的製程氣體;以及排出機構,使儲藏在前述氣體儲藏部的製程氣體排出至前述鍍覆槽的外部。 [means to solve the problem] (Aspect 1) In order to achieve the above object, a plating apparatus according to an aspect of the present invention includes: a plating tank in which a separator is arranged, and an anode is arranged in an anode chamber separated from the lower side of the separator; The anode chamber is further above and holds a substrate serving as a cathode, wherein the anode has a cylindrical shape extending in an up-down direction, and the plating apparatus further includes: a gas storage part provided with an anode chamber so as to have a space between the anode and the anode. The space covers the upper end, outer periphery and inner periphery of the anode to store the process gas generated from the anode; and a discharge mechanism discharges the process gas stored in the gas storage part to the outside of the coating tank.

根據此態樣,使在上下方向延伸的圓筒形狀的陽極所產生的製程氣體儲藏於氣體儲藏部,可藉由排出機構使此儲藏的製程氣體排出至鍍覆槽的外部。藉此,因為可抑制隔膜的下表面所滯留的製程氣體,所以可抑制因此製程氣體導致基板鍍覆品質惡化。According to this aspect, the process gas generated by the cylindrical anode extending in the vertical direction is stored in the gas storage portion, and the stored process gas can be discharged to the outside of the coating tank by the discharge mechanism. Thereby, since the process gas retained on the lower surface of the diaphragm can be suppressed, the deterioration of the plating quality of the substrate caused by the process gas can be suppressed.

(態樣2) 上述態樣1也可以更具備:陽極罩,配置於前述陽極室,具有前述陽極與前述基板之間流動的電通過的開口部;以及陽極移動機構,使前述陽極在上下方向移動。 (Aspect 2) The above aspect 1 may further include an anode cover disposed in the anode chamber and having an opening through which electricity flows between the anode and the substrate, and an anode moving mechanism that moves the anode in the vertical direction.

根據此態樣,藉由使陽極在上下方向移動,可使在基板與陽極之間形成的電場的形成態樣變化。又,因為以使陽極在上下方向移動的簡單機構,可使電場的形成態樣變化,所以相較於鍍覆裝置具備變更陽極罩開口部大小的開口部可變機構的情況,可抑制鍍覆裝置結構複雜化。According to this aspect, the formation state of the electric field formed between the substrate and the anode can be changed by moving the anode in the vertical direction. In addition, since the formation state of the electric field can be changed with a simple mechanism for moving the anode in the vertical direction, plating can be suppressed compared with the case where the plating apparatus is provided with an opening variable mechanism for changing the size of the opening of the anode cover. The device structure is complicated.

(態樣3) 在上述態樣2中,前述陽極罩也可以配置成前述陽極罩的上表面接於前述隔膜的下表面。 (Aspect 3) In the above aspect 2, the anode cover may be arranged so that the upper surface of the anode cover is in contact with the lower surface of the separator.

(態樣4) 在上述態樣2中,前述陽極罩也可以配置成在前述陽極罩的上表面與前述隔膜的下表面之間形成有空間。 (Aspect 4) In the above-mentioned aspect 2, the anode cover may be arranged so that a space is formed between the upper surface of the anode cover and the lower surface of the separator.

(態樣5) 在上述態樣2中,前述陽極移動機構經由第一連接部件與前述陽極連接,藉由使前述第一連接部件在上下方向移動,來使前述陽極在上下方向移動,前述陽極罩經由第二連接部件連接於前述第一連接部件,在前述陽極移動機構也可以構成為使前述第一連接部件移動後,與前述陽極一起移動。 (Aspect 5) In the above aspect 2, the anode moving mechanism is connected to the anode via a first connection member, the anode is moved in the up-down direction by moving the first connection member in the up-down direction, and the anode cover is connected via the second connection The member is connected to the first connecting member, and the anode moving mechanism may be configured to move together with the anode after moving the first connecting member.

(態樣6) 又,為了達成上述目的,關於本發明的一態樣的鍍覆處理方法,是使用鍍覆裝置的鍍覆處理方法,該鍍覆裝置具備:鍍覆槽,配置有隔膜,在比前述隔膜更下側分隔的陽極室配置有陽極;以及基板夾具,配置於比前述陽極室更上方並保持做為陰極的基板,其中前述陽極具有在上下方向延伸的圓筒形狀,前述鍍覆裝置,更具備:氣體儲藏部,設有陽極室,以在與前述陽極之間具有空間並覆蓋前述陽極的上端、外周以及內周面,來儲藏從前述陽極產生的製程氣體;以及排出機構,使儲藏在前述氣體儲藏部的製程氣體排出至前述鍍覆槽的外部,前述鍍覆處理方法包含:在對前述基板施加鍍覆處理時,藉由前述排出機構使前述氣體儲藏部所儲藏的製程氣體排出至前述鍍覆槽的外部。上述基板搬送裝置,可以包含:位置檢測部,檢測前述基板的高度位置。前述控制部將前述端效應器向前述基板上升且前述位置檢測部的檢測結果改變時,可以判斷前述端效應器開始使前述基板的高度位置上升。 (Aspect 6) Furthermore, in order to achieve the above-mentioned object, a plating treatment method according to an aspect of the present invention is a plating treatment method using a plating apparatus including a plating tank and a separator disposed thereon, which is further than the separator. The anode chamber separated from the lower side is arranged with an anode; and a substrate holder is arranged above the anode chamber and holds a substrate serving as a cathode, wherein the anode has a cylindrical shape extending in an up-down direction, and the plating apparatus further includes : a gas storage part, which is provided with an anode chamber to have a space between the anode and the upper end, the outer circumference and the inner circumference of the anode to store the process gas generated from the anode; and a discharge mechanism to store the gas in the anode The process gas in the gas storage part is discharged to the outside of the plating tank, and the plating treatment method includes: when the substrate is subjected to a plating treatment, the process gas stored in the gas storage part is discharged to the above-mentioned by the discharge mechanism. The outside of the plating tank. The said board|substrate conveyance apparatus may comprise the position detection part which detects the height position of the said board|substrate. When the control unit lifts the end effector toward the substrate and the detection result of the position detection unit changes, it can be determined that the end effector starts to raise the height position of the substrate.

根據此態樣,可使從在上下方向延伸的圓筒形狀的陽極所產生的製程氣體儲藏在氣體儲藏部,來藉由排出機構使此儲藏的製程氣體排出至鍍覆槽的外部。藉此,可抑制在陽極室的隔膜的下表面所滯留的製程氣體。結果,可抑制因此製程氣體導致基板鍍覆品質惡化。According to this aspect, the process gas generated from the cylindrical anode extending in the vertical direction can be stored in the gas storage portion, and the stored process gas can be discharged to the outside of the coating tank by the discharge mechanism. Thereby, the process gas remaining on the lower surface of the separator of the anode chamber can be suppressed. As a result, the deterioration of the plating quality of the substrate caused by the process gas can be suppressed.

以下,參照圖式來說明關於本發明的實施形態。此外,在以下實施形態或實施形態的變形例,對於相同或對應的結構,有賦予相同符號並適當省略說明的情況。又,圖式是為了容易理解實施形態或變形例的特徵而概略圖示,各構成要素的尺寸比率等並不限於與實際物相同者。又,在一些圖式中,圖式有X-Y-Z直角座標做為參考用。此直角座標中,Z方向相當於上方,-Z方向相當於下方(重力作用的方向)。Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, in the following embodiment or the modification of an embodiment, the same code|symbol is attached|subjected to the same or corresponding structure, and description may be abbreviate|omitted suitably. In addition, the drawings are schematic diagrams in order to facilitate understanding of the features of the embodiment and the modification, and the dimensional ratios and the like of the respective components are not limited to those of the actual ones. Also, in some drawings, the drawings have X-Y-Z rectangular coordinates for reference. In this rectangular coordinate, the Z direction corresponds to the upper direction, and the -Z direction corresponds to the downward direction (the direction of gravity).

第一圖表示本實施形態的鍍覆裝置1000的整體結構的斜視圖。第二圖表示本實施形態的鍍覆裝置1000的整體結構的平面圖。如第一圖及第二圖所示,鍍覆裝置1000具備:裝載埠100、搬送電動機110、對準器120、預濕模組200、預浸模組300、鍍覆膜組400、洗淨模組500、旋乾機600、搬送裝置700以及控制模組800。FIG. 1 is a perspective view showing the overall configuration of a coating apparatus 1000 according to the present embodiment. FIG. 2 is a plan view showing the overall configuration of the coating apparatus 1000 according to the present embodiment. As shown in the first and second figures, the plating apparatus 1000 includes a loading port 100, a conveying motor 110, an aligner 120, a pre-wet module 200, a pre-preg module 300, a plating film group 400, a cleaning The module 500 , the spin dryer 600 , the conveying device 700 and the control module 800 .

裝載埠100是用來將未圖示在鍍覆裝置1000的FOUP等卡匣所收容的基板搬入,從鍍覆裝置1000將基板搬出卡匣的模組。在本實施形態中,四台裝載埠100在水平方向並列配置,但裝載埠100的數量及配置為任意。搬送電動機110是用來搬送基板的電動機,構成為在裝載埠100、對準器120以及搬送裝置700之間傳遞基板。搬送電動機110及搬送裝置700是在搬送電動機110與搬送裝置700之間傳遞基板時,可經由暫置台(圖未顯示)進行基板傳遞。The loading port 100 is a module for carrying in the substrates accommodated in a cassette such as a FOUP not shown in the plating apparatus 1000 , and carrying out the substrates from the plating apparatus 1000 to the cassette. In this embodiment, the four load ports 100 are arranged in parallel in the horizontal direction, but the number and arrangement of the load ports 100 are arbitrary. The transfer motor 110 is a motor for transferring the substrate, and is configured to transfer the substrate among the load port 100 , the aligner 120 , and the transfer device 700 . The transfer motor 110 and the transfer device 700 can transfer the substrate through a temporary stage (not shown) when transferring the substrate between the transfer motor 110 and the transfer device 700 .

對準器120是用來將基板的定向平面或凹口等位置配合特定方向的模組。在本實施形態中,雖然二台對準器120在水平方向並列配置,但對準器120的數量及配置為任意。預濕模組200是藉由鍍覆處理前的基板的被鍍覆面被純水或脫氣水等處理液弄濕,將形成於基板表面的圖案內部的空氣置換為處理液。預濕模組200構成為藉由在鍍覆時將圖案內部的處理液置換為鍍覆液,施加使鍍覆液容易供給至圖案內部的預濕處理。在本實施形態中,雖然二台預濕模組200在上下方向並列配置,但預濕模組200的數量及配置為任意。The aligner 120 is a module used to match the orientation plane or notch of the substrate to a specific orientation. In the present embodiment, the two aligners 120 are arranged in parallel in the horizontal direction, but the number and arrangement of the aligners 120 are arbitrary. The pre-wetting module 200 replaces the air inside the pattern formed on the surface of the substrate with the processing liquid by wetting the plated surface of the substrate before the plating treatment with a processing liquid such as pure water or degassed water. The pre-moistening module 200 is configured to apply a pre-moisture treatment that facilitates supply of the plating liquid to the inside of the pattern by substituting the treatment liquid inside the pattern with a plating liquid during plating. In the present embodiment, although the two pre-wet modules 200 are arranged in parallel in the vertical direction, the number and arrangement of the pre-wet modules 200 are arbitrary.

預浸模組300構成為例如施加以硫酸或鹽酸等處理液蝕刻除去在鍍覆處理前的基板的被鍍覆面所形成的晶種層表面等存在的電阻的大氧化膜,洗淨或活化鍍覆基底表面的預浸處理。在本實施形態中,雖然在上下方向並列配置有二台預浸模組300,但預浸模組300的數量及配置為任意。鍍覆膜組400對基板施加鍍覆處理。在本實施形態中,雖然上下方向三台且水平方向四台並列配置的12台鍍覆膜組400組有二個,設有合計24台的鍍覆膜組400,但鍍覆膜組400的數量及配置為任意。The prepreg module 300 is configured to, for example, apply a treatment solution such as sulfuric acid or hydrochloric acid to etch away the large oxide film of resistance existing on the surface of the seed layer formed on the plated surface of the substrate before the plating treatment, and then wash or activate the plating process. Prepreg treatment of the substrate surface. In the present embodiment, although two prepreg modules 300 are arranged in parallel in the vertical direction, the number and arrangement of the prepreg modules 300 are arbitrary. The plating film group 400 applies a plating process to the substrate. In the present embodiment, there are two 12 plating film groups 400 in which three in the vertical direction and four in the horizontal direction are arranged side by side, and a total of 24 plating film groups 400 are provided. The number and configuration are arbitrary.

洗淨模組500構成為為了除去在鍍覆處理後的基板所殘留的鍍覆液等,對基板施加洗淨處理。在本實施形態中,雖然二台洗淨模組500在上下方向並列配置,但洗淨模組500的數量及配置為任意。旋乾機600是用來使洗淨處理後的基板高速旋轉並乾燥的模組。在本實施形態中,雖然二台旋乾機600在上下方向並列配置,但旋乾機600的數量及配置為任意。搬送裝置700是用來在鍍覆裝置1000內的複數個模組間搬送基板的裝置。控制模組800構成為控制鍍覆裝置1000的複數個模組,可由例如具備運算子之間的輸出入介面的一般電腦或專用電腦所構成。The cleaning module 500 is configured to perform cleaning treatment on the substrate in order to remove the plating solution and the like remaining on the substrate after the plating treatment. In the present embodiment, the two cleaning modules 500 are arranged side by side in the vertical direction, but the number and arrangement of the cleaning modules 500 are arbitrary. The spin dryer 600 is a module for rotating and drying the cleaned substrate at high speed. In this embodiment, although the two spin dryers 600 are arranged in parallel in the vertical direction, the number and arrangement of the spin dryers 600 are arbitrary. The conveyance apparatus 700 is an apparatus for conveying a board|substrate between the some modules in the plating apparatus 1000. The control module 800 is constituted as a plurality of modules for controlling the coating apparatus 1000 , and can be constituted by, for example, a general computer or a dedicated computer provided with an I/O interface between operators.

說明鍍覆裝置1000進行一連串的鍍覆處理的一例。首先,將卡匣所收容的基板搬入裝載埠100。然後,搬送電動機110從裝載埠100的卡匣取出基板,搬送基板至對準器120。對準器120將基板的定向平面或凹口等位置配合特定方向。搬送電動機110將以對準器120配合方向的基板傳遞至搬送裝置700。An example in which the plating apparatus 1000 performs a series of plating processes will be described. First, the substrate accommodated in the cassette is carried into the load port 100 . Then, the transfer motor 110 takes out the substrate from the cassette of the loading port 100 and transfers the substrate to the aligner 120 . The aligner 120 matches the position of the substrate's orientation flats or notches to a particular orientation. The transfer motor 110 transfers the substrate in the mating direction of the aligner 120 to the transfer device 700 .

搬送裝置700將從搬送電動機110接收的基板搬送到預濕模組200。預濕模組200對基板施加預濕處理。搬送裝置700將施加過預濕處理的基板搬送到預浸模組300。預浸模組300對基板施加預浸處理。搬送裝置700將施加過預浸處理的基板搬送到鍍覆膜組400。鍍覆膜組400對基板施加鍍覆。The transfer device 700 transfers the substrate received from the transfer motor 110 to the pre-wetting module 200 . The pre-wetting module 200 applies a pre-wetting process to the substrate. The transport device 700 transports the pre-moistened substrate to the prepreg module 300 . The prepreg module 300 applies prepreg treatment to the substrate. The conveying device 700 conveys the prepreg-treated substrate to the plating film group 400 . The plating film group 400 applies plating to the substrate.

搬送裝置700將施加過鍍覆處理的基板搬送到洗淨模組500。洗淨模組500對基板施加洗淨處理。搬送裝置700將施加過洗淨處理的基板搬送到旋乾機600。旋乾機600對基板施加乾燥處理。搬送裝置700將施加過乾燥處理的基板傳遞到搬送電動機110。搬送電動機110將從搬送裝置700接收的基板搬送到裝載埠100的卡匣。最後,從裝載埠100收容基板的卡匣被搬出。The conveying device 700 conveys the plated substrate to the cleaning module 500 . The cleaning module 500 applies a cleaning process to the substrate. The transfer device 700 transfers the cleaned substrate to the spin dryer 600 . The spin dryer 600 applies a drying process to the substrate. The transfer device 700 transfers the over-dried substrate to the transfer motor 110 . The conveyance motor 110 conveys the substrate received from the conveyance device 700 to the cassette of the loading port 100 . Finally, the cassette for accommodating the substrate from the load port 100 is carried out.

此外,第一圖或第二圖所說明的鍍覆裝置1000的結構只不過是一例,鍍覆裝置1000的結構並非受限於第一圖或第二圖的結構。In addition, the structure of the plating apparatus 1000 described in the first or second figures is merely an example, and the structure of the plating apparatus 1000 is not limited to the structure of the first or second figures.

接下來,說明關於鍍覆膜組400。此外,因為關於本實施形態的鍍覆裝置1000所具有的複數個鍍覆膜組400具有相同結構,所以說明關於一個鍍覆膜組400。Next, the plating film group 400 will be described. In addition, since the plurality of plating film groups 400 included in the plating apparatus 1000 of the present embodiment have the same structure, the description will be made about one plating film group 400 .

第三圖是用來說明關於本實施形態的鍍覆裝置1000的鍍覆膜組400的結構的圖。關於本實施形態的鍍覆裝置1000是杯式的鍍覆裝置。關於本實施形態的鍍覆裝置1000的鍍覆膜組400主要具備:鍍覆槽10、溢流槽20、基板夾具30、旋轉機構40、升降機構45、氣體儲藏部60、排出機構70、準位感測器75以及陽極移動機構80。此外,在第三圖中,概略地剖面圖示鍍覆槽10、溢流槽20以及基板夾具30。FIG. 3 is a diagram for explaining the structure of the plating film group 400 of the plating apparatus 1000 according to the present embodiment. The plating apparatus 1000 concerning this embodiment is a cup type plating apparatus. The coating film group 400 of the coating apparatus 1000 of the present embodiment mainly includes a coating tank 10 , an overflow tank 20 , a substrate holder 30 , a rotation mechanism 40 , a lifting mechanism 45 , a gas storage unit 60 , a discharge mechanism 70 , a Position sensor 75 and anode moving mechanism 80 . In addition, in the third figure, the plating tank 10 , the overflow tank 20 , and the substrate holder 30 are schematically shown in cross-section.

關於本實施形態的鍍覆槽10,是以上方具有開口的有底容器所構成。具體來說,鍍覆槽10具有:底壁部10a;以及外周壁部10b,從此底壁部10a的外周緣向上方延伸,此外周壁部10b的形狀並沒有特別限定,但關於本實施形態的外周壁部10b,具有圓筒形狀來做為一例。The plating tank 10 of the present embodiment is constituted by a bottomed container having an upper opening. Specifically, the plating tank 10 has a bottom wall portion 10a and an outer peripheral wall portion 10b extending upward from the outer peripheral edge of the bottom wall portion 10a. The shape of the peripheral wall portion 10b is not particularly limited. The outer peripheral wall portion 10b has a cylindrical shape as an example.

在鍍覆槽10的內部,儲藏有鍍覆液Ps。鍍覆液Ps可為包含構成鍍覆皮膜的金屬元素離子的溶液,其具體例並未特別限定。在本實施形態中,使用銅鍍覆處理做為鍍覆處理的一例,使用硫酸銅溶液做為鍍覆液Ps的一例。又,在本實施形態中,鍍覆液Ps包含特定添加劑。但是,並非受限於此結構,鍍覆液Ps也可以做為不包含添加劑的結構。Inside the plating tank 10, the plating solution Ps is stored. The plating solution Ps may be a solution containing metal element ions constituting the plating film, and its specific example is not particularly limited. In this embodiment, a copper plating process is used as an example of the plating process, and a copper sulfate solution is used as an example of the plating solution Ps. In addition, in the present embodiment, the plating solution Ps contains a specific additive. However, it is not limited to this structure, and the plating solution Ps may have a structure that does not contain additives.

在鍍覆槽10的內部配置有陽極11。第四圖是陽極11的概略斜視圖。參照第三圖及第四圖,關於本實施形態的陽極11,具有在上下方向延伸的圓筒形狀。如第三圖所示,在陽極11的下端,連接有做為導電性部件的匯流排50。匯流排50經由配線55電連接於通電裝置(未圖示)。此外,做為陰極的基板Wf也經由配線(未圖示)電連接於此通電裝置。An anode 11 is arranged inside the coating tank 10 . FIG. 4 is a schematic perspective view of the anode 11 . Referring to FIGS. 3 and 4, the anode 11 of the present embodiment has a cylindrical shape extending in the vertical direction. As shown in FIG. 3 , a bus bar 50 as a conductive member is connected to the lower end of the anode 11 . The bus bar 50 is electrically connected to an energizing device (not shown) via the wiring 55 . In addition, the substrate Wf serving as the cathode is also electrically connected to this energizing device through wiring (not shown).

雖然陽極11的具體例可為產生後述的製程氣體Ga者,並未特別限定,但在本實施形態中,使用不溶性陽極做為陽極11的具體例。此不溶性陽極的具體種類並未特別限定,可使用白金或氧化銥等。A specific example of the anode 11 may be one that generates a process gas Ga, which will be described later, and is not particularly limited, but in this embodiment, an insoluble anode is used as a specific example of the anode 11 . The specific type of this insoluble anode is not particularly limited, and platinum, iridium oxide, or the like can be used.

根據本實施形態,因為陽極11具有在上下方向延伸的圓筒形狀,所以可用後述的氣體儲藏部60容易地回收從陽極11產生的製程氣體Ga。According to the present embodiment, since the anode 11 has a cylindrical shape extending in the vertical direction, the process gas Ga generated from the anode 11 can be easily recovered by the gas storage unit 60 described later.

如第三圖所示,在鍍覆槽10的內部中,在比陽極11更上方,配置有隔膜12。具體來說,隔膜12配置在陽極11與基板Wf(陰極)之間的位置。關於本實施形態的隔膜12的外周部,連接於後述的氣體儲藏部60的側壁部60b。又,關於本實施形態的隔膜12,配置成隔膜12的面方向呈水平方向。As shown in FIG. 3 , in the coating tank 10 , a separator 12 is arranged above the anode 11 . Specifically, the separator 12 is arranged at a position between the anode 11 and the substrate Wf (cathode). The outer peripheral part of the diaphragm 12 of this embodiment is connected to the side wall part 60b of the gas storage part 60 mentioned later. Moreover, regarding the diaphragm 12 of this embodiment, the surface direction of the diaphragm 12 is arrange|positioned so that it may become a horizontal direction.

鍍覆槽10的內部被隔膜12二分割成上下方向。分隔在比隔膜12更下方的區域稱為陽極室13。分隔在比隔膜12更上方的區域稱為陰極室14。前述陽極11配置於陽極室13。The inside of the coating tank 10 is divided into two parts in the vertical direction by the diaphragm 12 . The area divided below the diaphragm 12 is called the anode chamber 13 . The area divided above the diaphragm 12 is called the cathode chamber 14 . The aforementioned anode 11 is arranged in the anode chamber 13 .

隔膜12容許金屬離子通過,並由抑制鍍覆液Ps所包含的添加劑通過的膜所構成。也就是說,在本實施形態中,雖然陰極室14的鍍覆液Ps包含添加劑,但陽極室13的鍍覆液Ps不包含添加劑。然而並不受限於此結構,例如,陽極室13的鍍覆液Ps也可以包含添加劑。但是,即使在此情況下,陽極室13的添加劑濃度也會比陰極室14的添加劑濃度更低。隔膜12的具體種類並未特別限定,可使用公知的隔膜。列舉此隔膜12的具體例,例如可使用電解隔膜,例如可使用傑士湯淺國際股份有限公司 ( GS YUASA INTERNATIONAL LTD. ) 製造的鍍覆用電解隔膜,或使用離子交換膜等。The separator 12 allows the passage of metal ions, and is composed of a film that suppresses the passage of additives contained in the plating solution Ps. That is, in this embodiment, although the plating liquid Ps of the cathode chamber 14 contains an additive, the plating liquid Ps of the anode chamber 13 does not contain an additive. However, not limited to this structure, for example, the plating solution Ps of the anode chamber 13 may also contain additives. However, even in this case, the additive concentration of the anode chamber 13 will be lower than that of the cathode chamber 14 . The specific type of the separator 12 is not particularly limited, and a known separator can be used. As a specific example of this separator 12, for example, an electrolytic separator can be used, for example, an electrolytic separator for plating manufactured by GS YUASA INTERNATIONAL LTD., an ion exchange membrane, or the like can be used.

如本實施形態,因為鍍覆裝置1000具備隔膜12,藉由在陽極側的反應可抑制鍍覆液Ps所包含的添加劑的成分分解或反應,藉此,可以致因此添加劑的成分的分解或反應導致對鍍覆的壞影響成分產生。Since the coating apparatus 1000 is provided with the separator 12 as in the present embodiment, the decomposition or reaction of the components of the additives contained in the plating solution Ps can be suppressed by the reaction on the anode side, whereby the components of the additives can be decomposed or reacted. Lead to the generation of components that adversely affect plating.

在鍍覆槽10設有用來供給鍍覆液Ps到陽極室13的陽極用供給口15。又,在鍍覆槽10設有用來將陽極室13的鍍覆液Ps從陽極室13排出的陽極用排出口16。從陽極用排出口16排出的鍍覆液Ps,之後儲藏在陽極用儲藏槽(未圖示)後,從陽極用供給口15再供給至陽極室13。The plating tank 10 is provided with an anode supply port 15 for supplying the plating solution Ps to the anode chamber 13 . In addition, the plating tank 10 is provided with an anode discharge port 16 for discharging the plating solution Ps of the anode chamber 13 from the anode chamber 13 . The plating solution Ps discharged from the discharge port 16 for anodes is then stored in a storage tank for anodes (not shown), and then supplied to the anode chamber 13 from the supply port 15 for anodes.

在鍍覆槽10設有用來供給鍍覆液Ps至陰極室14的陰極用供給口17。具體來說,在關於本實施形態的鍍覆槽10的外周壁部10b的陰極室14所對應部分的一部分,設有在鍍覆槽10的中心側突出的突出部10c,此突出部10c設有陰極用供給口17。The plating tank 10 is provided with a cathode supply port 17 for supplying the plating solution Ps to the cathode chamber 14 . Specifically, in a part of the portion corresponding to the cathode chamber 14 of the outer peripheral wall portion 10b of the coating tank 10 of the present embodiment, a protrusion 10c protruding on the center side of the coating tank 10 is provided, and the protrusion 10c is provided There is a cathode supply port 17 .

溢流槽20是由配置於鍍覆槽10外側的有底容器所構成。溢流槽20是為了儲藏超過鍍覆槽10的外周壁部10b上端的鍍覆液Ps(即從鍍覆槽10溢流的鍍覆液Ps)所設的槽。從陰極用供給口17供給至陰極室14的鍍覆液Ps,在流入溢流槽20後,從溢流槽20用排出口(未圖示)排出,儲藏在陰極用的儲藏槽(未圖示)。之後,鍍覆液Ps從陰極用供給口17再供給至陰極室14。The overflow tank 20 is constituted by a bottomed container arranged outside the coating tank 10 . The overflow tank 20 is a tank provided to store the plating solution Ps that exceeds the upper end of the outer peripheral wall portion 10 b of the coating tank 10 (ie, the plating solution Ps overflowing from the coating tank 10 ). The plating solution Ps supplied from the cathode supply port 17 to the cathode chamber 14 flows into the overflow tank 20, is discharged from the overflow tank 20 discharge port (not shown), and is stored in a cathode storage tank (not shown in the figure). Show). After that, the plating solution Ps is resupplied to the cathode chamber 14 from the cathode supply port 17 .

在本實施形態的陰極室14,配置有多孔質的抵抗體18。具體來說,關於本實施形態的抵抗體18,設於突出部10c的上端部附近位置。抵抗體18是由具有複數個孔(細孔)的多孔性板部件所構成。但是,抵抗體18並非本實施形態必須的結構,鍍覆裝置1000也可以做為不具備抵抗體18的結構。In the cathode chamber 14 of the present embodiment, a porous resist 18 is arranged. Specifically, the resisting body 18 of the present embodiment is provided in the vicinity of the upper end portion of the protruding portion 10c. The resisting body 18 is constituted by a porous plate member having a plurality of holes (fine holes). However, the resister 18 is not an essential structure of the present embodiment, and the coating apparatus 1000 may have a structure without the resister 18 .

又,在本實施形態中,陽極室13配置有陽極罩19。此陽極罩19的細節將後述。In addition, in this embodiment, the anode cover 19 is arranged in the anode chamber 13 . Details of this anode cover 19 will be described later.

基板夾具30是用來保持做為陰極的基板Wf的部件。關於本實施形態的基板夾具30,保持著基板Wf成使基板Wf的被鍍覆面向下。基板夾具30連接於旋轉機構40。旋轉機構40是用來使基板夾具30旋轉的機構。可使用旋轉馬達等公知機構來做為旋轉機構40。旋轉機構40連接於升降機構45。升降機構45是由在上下方向延伸的支軸46所支持。升降機構45是用來使基板夾具30及旋轉機構40在上下方向升降的機構。可使用直動式致動器等公知的升降機構來做為升降機構45。The substrate holder 30 is a member for holding the substrate Wf serving as the cathode. The substrate holder 30 of the present embodiment holds the substrate Wf with the plated surface of the substrate Wf facing downward. The substrate holder 30 is connected to the rotation mechanism 40 . The rotation mechanism 40 is a mechanism for rotating the substrate holder 30 . A known mechanism such as a rotary motor can be used as the rotation mechanism 40 . The rotation mechanism 40 is connected to the lift mechanism 45 . The elevating mechanism 45 is supported by a support shaft 46 extending in the vertical direction. The elevating mechanism 45 is a mechanism for elevating the substrate holder 30 and the rotation mechanism 40 in the vertical direction. As the elevating mechanism 45, a known elevating mechanism such as a linear actuator can be used.

在執行鍍覆處理時,旋轉機構40使基板夾具30旋轉,且升降機構45使基板夾具30向下方移動,來使基板Wf浸漬於鍍覆槽10的鍍覆液Ps。接下來,藉由通電裝置,電在陽極11與基板Wf之間流動。藉此,在基板Wf的被鍍覆面Wfa形成有鍍覆皮膜。When the plating process is performed, the rotation mechanism 40 rotates the substrate holder 30 , and the elevating mechanism 45 moves the substrate holder 30 downward to immerse the substrate Wf in the plating solution Ps of the plating tank 10 . Next, electricity flows between the anode 11 and the substrate Wf by the energizing means. Thereby, a plated film is formed on the plated surface Wfa of the substrate Wf.

鍍覆膜組400的動作是被控制模組800所控制。控制模組800具備微電腦,此微電腦具備:做為處理器的CPU(中央處理單元)801與做為非暫時記憶媒體的記憶部802等。在控制模組800,根據記憶部802所記憶的程式指令,CPU801控制鍍覆膜組400的被控制部的動作。The action of the coating film group 400 is controlled by the control module 800 . The control module 800 includes a microcomputer including a CPU (Central Processing Unit) 801 as a processor, a storage unit 802 as a non-transitory storage medium, and the like. In the control module 800 , the CPU 801 controls the operation of the controlled part of the coating film group 400 according to the program command stored in the memory part 802 .

此外,在本實施形態中,雖然一個控制模組800做為統合控制鍍覆膜組400的被控制部的控制裝置來運作,但並非受限於此結構。例如,控制模組800具備複數個控制裝置,此複數個控制裝置也可以個別控制各鍍覆膜組400的被控制部。In addition, in this embodiment, although one control module 800 operates as a control device that controls the controlled parts of the coating film group 400 in an integrated manner, it is not limited to this structure. For example, the control module 800 includes a plurality of control devices, and the plurality of control devices may individually control the controlled parts of each plating film group 400 .

接下來,說明關於氣體儲藏部60及排出機構70。第五(A)圖及第五(B)圖是用來說明氣體儲藏部60及排出機構70的概略剖面圖。第五(A)圖是概略地剖面圖示第三圖的鍍覆槽10的排出機構70的周邊結構,第五(B)圖是概略地剖面圖示第三圖的鍍覆槽10的準位感測器75的周邊結構。Next, the gas storage unit 60 and the discharge mechanism 70 will be described. 5th (A) figure and 5th (B) figure are schematic cross-sectional views for demonstrating the gas storage part 60 and the discharge mechanism 70 . Fig. 5(A) is a schematic cross-sectional view showing the peripheral structure of the discharge mechanism 70 of the coating tank 10 of the third Fig. Peripheral structure of the bit sensor 75 .

在此,在以鍍覆裝置1000進行的基板Wf的鍍覆處理時,根據以下反應式,做為製程氣體Ga的氧氣(O 2)在陽極室13產生。 2H O→O +4H ++4e - Here, in the plating process of the substrate Wf by the plating apparatus 1000 , oxygen gas (O 2 ) as the process gas Ga is generated in the anode chamber 13 according to the following reaction formula. 2H 2 O→O 2 +4H + +4e -

在像這樣的製程氣體Ga滯留在隔膜12的下表面12a的情況下,此製程氣體Ga有遮蔽電場之虞。在此情況下,基板Wf的鍍覆品質有惡化之虞。因此,關於本實施形態的鍍覆膜組400,為了抑制製程氣體Ga滯留在隔膜12的下表面12a,並抑制因此製程氣體Ga導致基板Wf的鍍覆品質惡化,具備以下說明的氣體儲藏部60及排出機構70。When such a process gas Ga remains on the lower surface 12a of the diaphragm 12, the process gas Ga may block the electric field. In this case, the plating quality of the substrate Wf may deteriorate. Therefore, the coating film group 400 of the present embodiment is provided with a gas storage portion 60 described below in order to prevent the process gas Ga from remaining on the lower surface 12 a of the diaphragm 12 and to prevent the process gas Ga from deteriorating the coating quality of the substrate Wf due to the process gas Ga. and discharge mechanism 70 .

氣體儲藏部60設於陽極室13。氣體儲藏部60構成為儲藏從陽極11產生的製程氣體Ga。具體來說,關於本實施形態的氣體儲藏部60設於陽極室13,與圓筒形狀的陽極11之間有空間,並覆蓋陽極11的上端11c、外周面11a以及內周面11b(符號參照第四圖)。The gas storage unit 60 is provided in the anode chamber 13 . The gas storage unit 60 is configured to store the process gas Ga generated from the anode 11 . Specifically, the gas storage part 60 of the present embodiment is provided in the anode chamber 13 with a space between it and the cylindrical anode 11 , and covers the upper end 11 c , the outer peripheral surface 11 a , and the inner peripheral surface 11 b of the anode 11 (see reference numerals). Fourth picture).

更具體來說,關於本實施形態的氣體儲藏部60具有上壁部60a與側壁部60b。上壁部60a是連接於鍍覆槽10的外周壁部10b,並配置在比陽極11的上端11c更上方的部位。側壁部60b構成為是其上端部連接於上壁部60a,從上壁部60a上下方延伸的部位。此外,關於本實施形態的上壁部60a具有環形狀(或凸緣形狀),側壁部60b具有圓筒形狀。在被鍍覆槽10的外周壁部10b與氣體儲藏部60的上壁部60a與側壁部60b分隔的區域,儲藏從陽極11產生的製程氣體Ga。More specifically, the gas storage part 60 of this embodiment has the upper wall part 60a and the side wall part 60b. The upper wall portion 60 a is connected to the outer peripheral wall portion 10 b of the coating tank 10 , and is arranged above the upper end 11 c of the anode 11 . The side wall part 60b is comprised so that the upper end part is connected to the upper wall part 60a, and is comprised so that it may extend up and down from the upper wall part 60a. In addition, the upper wall part 60a of this embodiment has a ring shape (or a flange shape), and the side wall part 60b has a cylindrical shape. The process gas Ga generated from the anode 11 is stored in a region separated from the outer peripheral wall portion 10b of the plating tank 10 and the upper wall portion 60a and the side wall portion 60b of the gas storage portion 60 .

參照第五(A)圖,排出機構70構成為將儲藏在氣體儲藏部60的製程氣體Ga排出至鍍覆槽10外部的機構。具體來說,關於本實施形態的排出機構70,具備排出管71以及配置於此排出管71的開關閥72。排出管71連通於氣體儲藏部60與鍍覆槽10的外部。開關閥72的開關動作是由控制模組800所控制。開關閥72通常是關閥狀態。藉由開關閥72成開閥狀態,氣體儲藏部60的製程氣體Ga通過排出管71,排出至鍍覆槽10的外部(具體來說是大氣中)。Referring to FIG. 5(A), the discharge mechanism 70 is configured as a mechanism for discharging the process gas Ga stored in the gas storage unit 60 to the outside of the coating tank 10 . Specifically, the discharge mechanism 70 of the present embodiment includes a discharge pipe 71 and an on-off valve 72 arranged in the discharge pipe 71 . The discharge pipe 71 communicates with the outside of the gas storage unit 60 and the coating tank 10 . The switching action of the on-off valve 72 is controlled by the control module 800 . The on-off valve 72 is normally closed. When the on-off valve 72 is in an open state, the process gas Ga in the gas storage unit 60 is discharged to the outside of the coating tank 10 (specifically, the atmosphere) through the discharge pipe 71 .

參照第五(B)圖,準位感測器75是用來檢測在氣體儲藏部60的鍍覆液Ps的液面位置(高度)的感測器。準位感測器75將其檢測結果傳送至控制模組800。在氣體儲藏部60不存在製程氣體Ga的情況下,氣體儲藏部60充滿鍍覆液Ps。當氣體儲藏部60儲藏製程氣體Ga時,在氣體儲藏部60的鍍覆液Ps的液面降低。如此,在氣體儲藏部60的鍍覆液Ps的液面,與氣體儲藏部60所儲藏的製程氣體Ga的量具有相關關係。因此,關於本實施形態的控制模組800,根據準位感測器75的檢測結果,控制排出機構70。如下,使用流程圖來說明關於此控制模組800的排出機構70的控制。Referring to FIG. 5(B), the level sensor 75 is a sensor for detecting the liquid level position (height) of the plating solution Ps in the gas storage portion 60 . The level sensor 75 transmits its detection result to the control module 800 . When the process gas Ga is not present in the gas storage portion 60, the gas storage portion 60 is filled with the plating solution Ps. When the gas storage part 60 stores the process gas Ga, the liquid level of the plating solution Ps in the gas storage part 60 decreases. In this way, the liquid level of the plating solution Ps in the gas storage unit 60 has a correlation with the amount of the process gas Ga stored in the gas storage unit 60 . Therefore, in the control module 800 of the present embodiment, the discharge mechanism 70 is controlled based on the detection result of the level sensor 75 . The control of the discharge mechanism 70 of the control module 800 will be described below using a flowchart.

第六圖是關於本實施形態的以控制模組800進行排出機構的控制流程圖的一例。在步驟S10中,控制模組800判斷是否滿足開始排出氣體儲藏部60的製程氣體Ga的條件(「排出開始條件」)。FIG. 6 is an example of a control flowchart of the discharge mechanism performed by the control module 800 according to the present embodiment. In step S10 , the control module 800 determines whether or not a condition for starting the discharge of the process gas Ga from the gas storage unit 60 (“discharge start condition”) is satisfied.

具體來說,在此步驟S10中,控制模組800是根據準位感測器75的檢測結果,判斷氣體儲藏部60的鍍覆液Ps的液面是否在特定基準位置的更下方位置。控制模組800判斷鍍覆液Ps的液面在基準位置的更下方位置時,判斷滿足開始排出條件(YES)。Specifically, in this step S10 , the control module 800 determines whether the liquid level of the plating solution Ps in the gas storage part 60 is lower than the specific reference position according to the detection result of the level sensor 75 . When the control module 800 determines that the liquid level of the plating solution Ps is at a position further below the reference position, it determines that the discharge start condition (YES) is satisfied.

在步驟S10判斷為YES的情況下,控制模組800使開關閥72開閥(步驟S11)。藉此,氣體儲藏部60的製程氣體Ga被排出至鍍覆槽10的外部。When the determination in step S10 is YES, the control module 800 opens the on-off valve 72 (step S11 ). Thereby, the process gas Ga in the gas storage part 60 is discharged to the outside of the coating tank 10 .

此外,一旦控制模組800使開關閥72開閥後,根據準位感測器75的檢測結果,判斷氣體儲藏部60的鍍覆液Ps的液面在基準位置或在此基準位置的更上方位置時,也可以使開關閥72回到關閥狀態。或者是,控制模組800在使開關閥72開閥後經過預設特定時間後,也可以使開關閥72回到關閥狀態(也就是說,在此情況下,開關閥72在特定時間之間為開閥狀態)。In addition, once the control module 800 opens the on-off valve 72, according to the detection result of the level sensor 75, it is determined that the liquid level of the plating solution Ps in the gas storage part 60 is at the reference position or above the reference position In the position, the on-off valve 72 can also be returned to the closed state. Alternatively, the control module 800 can also make the on-off valve 72 return to the closed state after a preset specific time has elapsed after the on-off valve 72 is opened (that is, in this case, the on-off valve 72 is closed within a specific time period). the valve is open during the period).

根據如以上的本實施形態,可使從在上下方向延伸的圓筒形狀的陽極11所產生的製程氣體Ga儲藏在氣體儲藏部60,並藉由排出機構70使儲藏在此氣體儲藏部60的製程氣體Ga排出至鍍覆槽10的外部。藉此,可抑制製程氣體Ga滯留在陽極室13的隔膜12的下表面12a。結果,可抑制因此製程氣體Ga導致基板Wf的鍍覆品質惡化。According to the present embodiment as described above, the process gas Ga generated from the cylindrical anode 11 extending in the vertical direction can be stored in the gas storage part 60 , and the gas stored in the gas storage part 60 can be stored in the gas storage part 60 by the discharge mechanism 70 . The process gas Ga is discharged to the outside of the coating tank 10 . As a result, the process gas Ga can be suppressed from remaining on the lower surface 12 a of the separator 12 of the anode chamber 13 . As a result, deterioration of the plating quality of the substrate Wf due to the process gas Ga can be suppressed.

接下來,說明關於陽極罩19。第七(A)圖是隔膜12及陽極罩19的概略剖面圖。第七(B)圖是陽極罩19的概略斜視圖。參照第三圖、第七(A)圖及第七(B)圖,陽極罩19配置於陽極室13。關於本實施形態的陽極罩19具有環形狀。陽極罩19具有:在陽極11與基板Wf之間流動的電所通過的開口部19b。在本實施形態中,開口部19b的徑(直徑)比陽極11的內徑更小。又,關於本實施形態的陽極罩19,如第七(A)圖所示,配置成陽極罩19的上表面19a接於隔膜12的下表面12a。Next, the anode cover 19 will be described. FIG. 7(A) is a schematic cross-sectional view of the separator 12 and the anode cover 19 . FIG. 7(B) is a schematic perspective view of the anode cover 19 . Referring to the third, seventh (A), and seventh (B) drawings, the anode cover 19 is arranged in the anode chamber 13 . The anode cover 19 of the present embodiment has a ring shape. The anode cover 19 has an opening 19b through which electricity flowing between the anode 11 and the substrate Wf passes. In the present embodiment, the diameter (diameter) of the opening 19 b is smaller than the inner diameter of the anode 11 . Moreover, regarding the anode cover 19 of this embodiment, as shown in FIG. 7(A), the upper surface 19a of the anode cover 19 is arrange|positioned so that the lower surface 12a of the separator 12 may be contacted.

接下來說明關於陽極移動機構80。第八圖概略表示關於實施形態的鍍覆膜組的陽極移動機構的周邊結構的剖面圖。陽極移動機構80是用來使陽極11在上下方向移動的機構。具體來說,關於本發明的陽極移動機構80是經由匯流排50與陽極11連接。Next, the anode moving mechanism 80 will be described. FIG. 8 is a cross-sectional view schematically showing the peripheral structure of the anode moving mechanism of the plating film group according to the embodiment. The anode moving mechanism 80 is a mechanism for moving the anode 11 in the vertical direction. Specifically, the anode moving mechanism 80 according to the present invention is connected to the anode 11 via the bus bar 50 .

也就是說,關於本實施形態的匯流排50,是連接陽極移動機構80與陽極11的「第一連接部件90」的一例。關於本實施形態的陽極移動機構80藉由使做為第一連接部件90的匯流排50在上下方向移動,來讓陽極11在上下方向移動。That is, the bus bar 50 of the present embodiment is an example of the “first connection member 90 ” that connects the anode moving mechanism 80 and the anode 11 . The anode moving mechanism 80 of the present embodiment moves the anode 11 in the up-down direction by moving the bus bar 50 serving as the first connection member 90 in the up-down direction.

此外,關於本實施形態的匯流排50具備:棒狀部50b,在上下方向延伸;以及平板部50a,連接於棒狀部50b的上端,並在水平方向延伸。平板部50a的外周緣連接於陽極11的下端。平板部50a及棒狀部50b是由導電性素材所構成。又,關於本實施形態的匯流排50也具備被覆平板部50a及棒狀部50b的被覆材50c。被覆材50c的具體材質並沒有特別限定,但在本實施形態中,使用聚四氟乙烯或聚醚醚酮等的樹脂做為一例。Further, the bus bar 50 according to the present embodiment includes a rod-shaped portion 50b extending in the vertical direction, and a flat plate portion 50a connected to the upper end of the rod-shaped portion 50b and extending in the horizontal direction. The outer peripheral edge of the flat plate portion 50 a is connected to the lower end of the anode 11 . The flat plate portion 50a and the rod-shaped portion 50b are made of a conductive material. In addition, the bus bar 50 of the present embodiment also includes the covering material 50c covering the flat plate portion 50a and the rod-shaped portion 50b. The specific material of the covering material 50c is not particularly limited, but in the present embodiment, a resin such as polytetrafluoroethylene or polyether ether ketone is used as an example.

做為陽極移動機構80,若為能使陽極11在上下方向移動者即可,其具體結構並無特別限定,但關於本實施形態的陽極移動機構80,是由活塞/汽缸機構所構成來做為一例。具體來說,關於本實施形態的陽極移動機構80具備:汽缸81;活塞82,相對於汽缸81滑動並出入汽缸81;以及致動器83,驅動活塞82。致動器83的動作是控制模組800所控制。又,陽極移動機構80配置成活塞82在上下方向移位。The anode moving mechanism 80 may be any one that can move the anode 11 in the vertical direction, and its specific structure is not particularly limited, but the anode moving mechanism 80 of the present embodiment is constituted by a piston/cylinder mechanism. as an example. Specifically, the anode moving mechanism 80 of the present embodiment includes a cylinder 81 ; a piston 82 that slides relative to the cylinder 81 to move in and out of the cylinder 81 ; and an actuator 83 that drives the piston 82 . The action of the actuator 83 is controlled by the control module 800 . Moreover, the anode moving mechanism 80 is arrange|positioned so that the piston 82 may be displaced in an up-down direction.

在活塞82的上端,連接有匯流排50的棒狀部50b(具體來說是覆蓋棒狀部50b周圍的被覆材50c)。藉由接受控制模組800的指示,致動器83使活塞82向上方移位,匯流排50向上方移動,藉此,陽極11也向上方移動。另一方面,藉由接受控制模組800的指示,致動器83使活塞82向下方移位,匯流排50向下方移動,藉此,陽極11也向下方移動。The rod-shaped part 50b of the bus bar 50 (specifically, the covering material 50c covering the circumference of the rod-shaped part 50b) is connected to the upper end of the piston 82 . By receiving the instruction of the control module 800, the actuator 83 displaces the piston 82 upward, and the bus bar 50 moves upward, whereby the anode 11 also moves upward. On the other hand, by receiving an instruction from the control module 800, the actuator 83 displaces the piston 82 downward, and the bus bar 50 moves downward, whereby the anode 11 also moves downward.

此外,在鍍覆槽10的底壁部10a,設有用來讓匯流排50的棒狀部50b通過的貫穿孔,在此貫穿孔的內周面設有密封部件57。藉由此密封部件57,有效抑制陽極室13的鍍覆液Ps從此貫穿孔洩漏至外部。In addition, the bottom wall portion 10a of the plating tank 10 is provided with a through hole through which the rod-shaped portion 50b of the bus bar 50 passes, and a sealing member 57 is provided on the inner peripheral surface of the through hole. The sealing member 57 effectively suppresses leakage of the plating solution Ps in the anode chamber 13 from the through hole to the outside.

第九(A)圖及第九(B)圖表示在陽極11的上下方向的位置變化的情況下的電場形成態樣變化的概略剖面圖。具體來說,第九(A)圖是概略地剖面圖示鍍覆處理時陽極11位於較第九(B)圖更上方的狀態,第九(B)圖是概略地剖面圖示鍍覆處理時陽極11位於較第九(A)圖更下方的狀態。在第九(A)圖及第九(B)圖所示的「Ef」表示電力線。The ninth (A) and ninth (B) diagrams are schematic cross-sectional views showing changes in the state of electric field formation when the position of the anode 11 in the vertical direction changes. Specifically, Fig. 9(A) is a schematic cross-sectional view showing a state in which the anode 11 is positioned higher than that in Fig. 9(B) during the plating process, and Fig. 9(B) is a schematic cross-sectional view showing the plating process At this time, the anode 11 is located in a lower state than in the ninth (A) figure. "Ef" shown in the ninth (A) and ninth (B) diagrams represents power lines.

如第九(A)圖及第九(B)圖所示,藉由陽極移動機構80使陽極11在上方及下方移動,可變更基板Wf與陽極11的距離。藉此,鍍覆處理時,可使在基板Wf與陽極11之間所形成的電場的形成態樣變化。As shown in FIGS. 9(A) and 9(B) , the distance between the substrate Wf and the anode 11 can be changed by moving the anode 11 upward and downward by the anode moving mechanism 80 . Thereby, the formation state of the electric field formed between the substrate Wf and the anode 11 can be changed during the plating process.

又,根據本實施形態,因為藉由以陽極移動機構80使陽極11在上下方向移動的簡單機構,可使電場的形成態樣變化,所以相較於例如鍍覆裝置1000具備變更開口部19b大小的開口部可變機構的情況,可抑制鍍覆裝置1000的結構複雜化。藉此,可試圖降低鍍覆裝置1000的成本。In addition, according to the present embodiment, the formation of the electric field can be changed by the simple mechanism of moving the anode 11 in the vertical direction by the anode moving mechanism 80. Therefore, the size of the opening 19b can be changed compared to, for example, the plating apparatus 1000. In the case of a variable mechanism of the opening portion, the structure of the coating apparatus 1000 can be prevented from being complicated. Thereby, an attempt can be made to reduce the cost of the plating apparatus 1000 .

此外,在本實施形態,陽極11越是向下方移動,通過陽極罩19的開口部19b的電力線Ef密度會越大。因此,在想要增加通過陽極罩19的開口部19b的電力線Ef密度的情況下,使陽極11移動到下方即可,相反地,在想要減少通過陽極罩19的開口部19b的電力線Ef密度的情況下,使陽極11移動到上方即可。In addition, in the present embodiment, the more the anode 11 moves downward, the higher the density of the lines of electric force Ef passing through the opening 19b of the anode cover 19 is. Therefore, when it is desired to increase the density of the lines of electric force Ef passing through the opening 19b of the anode cover 19, the anode 11 may be moved downward. Conversely, when it is desired to decrease the density of the lines of electric force Ef passing through the opening 19b of the anode cover 19 In this case, the anode 11 may be moved upward.

此外,關於本實施形態的鍍覆處理方法,是藉由上述的鍍覆裝置1000來實現。因此,因為省略重複說明,所以省略此鍍覆處理方法的細節說明。In addition, the plating treatment method of the present embodiment is realized by the above-described plating apparatus 1000 . Therefore, the detailed description of this plating treatment method is omitted because repeated description is omitted.

(變形例1) 在上述實施形態中,雖然陽極罩19配置成其上表面19a接於隔膜12的下表面12a(第七(A)圖),但不受限於此結構。例如,陽極罩19也可以配置在以下位置。 (Variation 1) In the above-described embodiment, the anode cover 19 is arranged so that the upper surface 19a of the anode cover 19 is in contact with the lower surface 12a of the separator 12 (Fig. 7(A)), but it is not limited to this configuration. For example, the anode cover 19 may be arranged in the following positions.

第十(A)圖表示關於實施形態的變形例1的在鍍覆裝置1000A的鍍覆模組400A的陽極罩19的周邊結構的概略剖面圖。關於本變形例的陽極罩19,配置成陽極罩19的上表面19a不接於隔膜12的下表面12a,陽極罩19的上表面19a與隔膜12的下表面12a之間形成空間。在本變形例中,也可以達成與前述實施形態一樣的作用效果。FIG. 10(A) is a schematic cross-sectional view showing the peripheral structure of the anode cover 19 in the plating module 400A of the plating apparatus 1000A according to the modification 1 of the embodiment. The anode cover 19 of this modification is arranged so that the upper surface 19a of the anode cover 19 is not in contact with the lower surface 12a of the separator 12, and a space is formed between the upper surface 19a of the anode cover 19 and the lower surface 12a of the separator 12. Also in this modification, the same functions and effects as those of the aforementioned embodiment can be achieved.

(變形例2) 第十(B)圖表示關於實施形態的變形例2的在鍍覆裝置1000B的鍍覆模組400B的陽極罩的周邊結構的概略剖面圖。關於本變形例的鍍覆模組400B,在主要更具備第二連接部件91這點,與前述鍍覆模組400、鍍覆模組400A不同。 (Variation 2) The tenth (B) figure shows the schematic cross-sectional view of the surrounding structure of the anode cover in the plating module 400B of the plating apparatus 1000B concerning the modification 2 of embodiment. The plating module 400B of this modification is different from the plating module 400 and the plating module 400A described above in that the second connection member 91 is further provided.

第二連接部件91是用來連接陽極罩19與第一連接部件90(在本變形例是匯流排50)的部件。藉此,關於本變形例的陽極罩19,為了使陽極11在上下方向移動,在陽極移動機構80使第一連接部件90在上下方向移動的情況下,可與陽極11一起在上下方向移動。The second connecting member 91 is a member for connecting the anode cover 19 and the first connecting member 90 (the bus bar 50 in this modification). Accordingly, in order to move the anode 11 in the vertical direction, the anode cover 19 of the present modification can move in the vertical direction together with the anode 11 when the anode moving mechanism 80 moves the first connecting member 90 in the vertical direction.

第二連接部件91的具體例並沒有特別限定,但在本變形例中,使用第二體抗體18B來做為第二連接部件91的一例。具體來說,第二體抗體18B與抵抗體18一樣,是由多孔質部件所構成。又,第二體抗體18B配置於比在陽極室13的陽極11的徑方向(陽極11的徑方向)更內側的區域。又,第二體抗體18B具有圓筒形狀。然後,第二體抗體18B的上端連接於陽極罩19,第二體抗體18B的下端連接於覆蓋匯流排50的平板部50a表面的被覆材50c。The specific example of the second connection member 91 is not particularly limited, but in this modification, the second antibody 18B is used as an example of the second connection member 91 . Specifically, the second antibody 18B is formed of a porous member like the resist 18 . In addition, the second antibody 18B is arranged in a region inside the anode chamber 13 in the radial direction of the anode 11 (the radial direction of the anode 11 ). In addition, the second antibody 18B has a cylindrical shape. Then, the upper end of the secondary antibody 18B is connected to the anode cover 19 , and the lower end of the secondary antibody 18B is connected to the covering material 50 c covering the surface of the flat plate portion 50 a of the bus bar 50 .

在本變形例中,可達成與前述的實施形態相同的作用效果。又,根據本變形例,可使陽極罩19與陽極11在上下方向移動。In this modification, the same effect as that of the aforementioned embodiment can be achieved. Moreover, according to this modification, the anode cover 19 and the anode 11 can be moved up and down.

以上,詳述關於本發明的實施例或變形例,但本發明並非受限於像這樣的特定實施形態或變形例,在申請專利範圍所記載的本發明的要旨範圍內,可進一步進行各種變形或變更。As described above, the embodiments and modifications of the present invention have been described in detail, but the present invention is not limited to such specific embodiments or modifications, and various modifications can be made within the gist of the present invention described in the scope of claims. or change.

10:鍍覆槽 10a:底壁部 10b:外周壁部 10c:突出部 11:陽極 11a:外周面 11b:內周面 11c:上端 12:隔膜 12a:下表面 13:陽極室 14:陰極室 15:陽極用供給口 16:陽極用排出口 17:陰極用供給口 18:抵抗體 18B:第二體抗體 19:陽極罩 19a:上表面 19b:開口部 20:溢流槽 30:基板夾具 40:旋轉機構 45:升降機構 46:支軸 50:匯流排 50a:平板部 50b:棒狀部 50c:被覆材 55:配線 57:密封部件 60:氣體儲藏部 60a:上壁部 60b:側壁部 70:排出機構 71:排出管 72:開關閥 75:準位感測器 80:陽極移動機構 81:汽缸 82:活塞 83:致動器 90:第一連接部件 91:第二連接部件 100:裝載埠 110:搬送電動機 120:對準器 200:預濕模組 300:預浸模組 400、400A、400B:鍍覆膜組 500:洗淨模組 600:旋乾機 700:搬送裝置 800:控制模組 801:CPU 802:記憶部 1000、1000A、1000B:鍍覆裝置 Ef:電力線 Ga:製程氣體 Ps:鍍覆液 S10、S11:步驟 Wf:基板 Wfa:被鍍覆面 10: Plating tank 10a: Bottom wall 10b: Peripheral wall portion 10c: Protrusion 11: Anode 11a: Outer peripheral surface 11b: Inner peripheral surface 11c: upper end 12: Diaphragm 12a: lower surface 13: Anode chamber 14: Cathode Chamber 15: Supply port for anode 16: Discharge port for anode 17: Supply port for cathode 18: Resistors 18B: secondary antibody 19: Anode cover 19a: Upper surface 19b: Opening 20: Overflow tank 30: Substrate fixture 40: Rotary Mechanism 45: Lifting mechanism 46: Pivot 50: Busbar 50a: Flat plate 50b: Rod 50c: Coating material 55: Wiring 57: Sealing parts 60: Gas Storage Department 60a: upper wall 60b: side wall 70: Discharge mechanism 71: Discharge pipe 72: On-off valve 75: Level sensor 80: Anode moving mechanism 81: Cylinder 82: Piston 83: Actuator 90: The first connecting part 91: Second connecting part 100: Load port 110: Conveying motor 120: Aligner 200: Pre-wet module 300: Prepreg module 400, 400A, 400B: Coating group 500: Cleaning Module 600: Spin dryer 700: Conveyor 800: Control Module 801:CPU 802: Memory Department 1000, 1000A, 1000B: Coating device Ef: Powerline Ga: Process gas Ps: plating solution S10, S11: Steps Wf: substrate Wfa: plated surface

[第一圖]表示關於實施形態的鍍覆裝置的整體結構的斜視圖。 [第二圖]表示關於實施形態的鍍覆裝置的整體結構的平面圖。 [第三圖]用來說明關於實施形態的模組結構的圖。 [第四圖]關於實施形態的陽極的概略斜視圖。 [第五圖]第五(A)及五(B)圖是用來說明關於實施形態的氣體儲藏部及排出機構的概略剖面圖。 [第六圖]關於實施形態的排出機構的控制流程圖的一例。 [第七圖]第七(A)圖是關於實施形態的隔膜及陽極罩的概略剖面圖。第七(B)圖是關於實施形態的陽極罩的概略斜視圖。 [第八圖]概略表示關於實施形態的鍍覆膜組的陽極移動機構的周邊結構的剖面圖。 [第九圖]第九(A)及九(B)圖表示關於實施形態的陽極上下方向的位置變化的情況下的電場形成態樣變化的概略剖面圖。 [第十圖]第十(A)圖表示關於實施形態的變形例1的鍍覆裝置的陽極罩的周邊結構的概略剖面圖。第十(B)圖表示關於實施形態的變形例2的鍍覆裝置的陽極罩的周邊結構的概略剖面圖。 [FIGURE 1] A perspective view showing the overall configuration of the coating apparatus according to the embodiment. [Fig. 2] A plan view showing the overall configuration of the coating apparatus according to the embodiment. [Fig. 3] A diagram for explaining the structure of the module according to the embodiment. [FIG. 4] A schematic perspective view of the anode of the embodiment. [FIG. 5] FIGS. 5(A) and 5(B) are schematic cross-sectional views for explaining the gas storage unit and the discharge mechanism according to the embodiment. [Fig. 6] An example of a control flowchart of the discharge mechanism according to the embodiment. [Fig. 7] Fig. 7(A) is a schematic cross-sectional view of the separator and the anode cover according to the embodiment. Fig. 7(B) is a schematic perspective view of the anode cover of the embodiment. [Fig. 8] A cross-sectional view schematically showing the peripheral structure of the anode moving mechanism of the plating film group according to the embodiment. [Fig. 9] Figs. 9(A) and 9(B) are schematic cross-sectional views showing changes in the state of electric field formation when the position of the anode in the vertical direction of the embodiment changes. [Fig. 10] Fig. 10(A) is a schematic cross-sectional view showing the peripheral structure of the anode cover of the coating apparatus according to Modification 1 of the embodiment. The tenth (B) figure shows the schematic cross-sectional view of the surrounding structure of the anode cover of the coating apparatus concerning the modification 2 of embodiment.

10:鍍覆槽 10: Plating tank

10a:底壁部 10a: Bottom wall

10b:外周壁部 10b: Peripheral wall portion

10c:突出部 10c: Protrusion

11:陽極 11: Anode

12:隔膜 12: Diaphragm

13:陽極室 13: Anode chamber

14:陰極室 14: Cathode Chamber

15:陽極用供給口 15: Supply port for anode

16:陽極用排出口 16: Discharge port for anode

17:陰極用供給口 17: Supply port for cathode

18:抵抗體 18: Resistors

19:陽極罩 19: Anode cover

19b:開口部 19b: Opening

20:溢流槽 20: Overflow tank

30:基板夾具 30: Substrate fixture

40:旋轉機構 40: Rotary Mechanism

45:升降機構 45: Lifting mechanism

46:支軸 46: Pivot

50:匯流排 50: Busbar

50a:平板部 50a: Flat plate

50c:被覆材 50c: Coating material

55:配線 55: Wiring

60:氣體儲藏部 60: Gas Storage Department

70:排出機構 70: Discharge mechanism

71:排出管 71: Discharge pipe

72:開關閥 72: On-off valve

75:準位感測器 75: Level sensor

80:陽極移動機構 80: Anode moving mechanism

400:鍍覆膜組 400: Coating group

800:控制模組 800: Control Module

801:CPU 801:CPU

802:記憶部 802: Memory Department

1000:鍍覆裝置 1000: Coating device

Ps:鍍覆液 Ps: plating solution

Wf:基板 Wf: substrate

Wfa:被鍍覆面 Wfa: plated surface

Claims (6)

一種鍍覆裝置,具備: 一鍍覆槽,配置有一隔膜,在比前述隔膜更下側分隔的一陽極室配置有一陽極;以及 一基板夾具,配置於比前述陽極室更上方並保持做為一陰極的一基板,其中前述陽極具有在上下方向延伸的圓筒形狀,前述鍍覆裝置,更具備: 一氣體儲藏部,設有前述陽極室,以在與前述陽極之間具有一空間並覆蓋前述陽極的一上端、一外周以及一內周面,來儲藏從前述陽極產生的一製程氣體;以及 一排出機構,使儲藏在前述氣體儲藏部的前述製程氣體排出至前述鍍覆槽的外部。 A coating device, comprising: a plating tank equipped with a diaphragm, and an anode is disposed in an anode chamber separated from the lower side of the diaphragm; and A substrate holder is disposed above the anode chamber and holds a substrate serving as a cathode, wherein the anode has a cylindrical shape extending in an up-down direction, and the coating device further includes: a gas storage part provided with the anode chamber so as to have a space between the anode and the anode and cover an upper end, an outer circumference and an inner circumference of the anode for storing a process gas generated from the anode; and a discharge mechanism for discharging the process gas stored in the gas storage part to the outside of the coating tank. 如請求項1所述的鍍覆裝置,更具備: 一陽極罩,配置於前述陽極室,具有前述陽極與前述基板之間流動的電通過的一開口部;以及 一陽極移動機構,使前述陽極在上下方向移動。 The coating device according to claim 1, further comprising: an anode cover disposed in the anode chamber and having an opening through which electricity flows between the anode and the substrate; and An anode moving mechanism makes the anode move up and down. 如請求項2所述的鍍覆裝置,其中前述陽極罩配置成前述陽極罩的一上表面接於前述隔膜的一下表面。The coating apparatus according to claim 2, wherein the anode cover is configured such that an upper surface of the anode cover is connected to a lower surface of the diaphragm. 如請求項2所述的鍍覆裝置,其中前述陽極罩配置成在前述陽極罩的前述上表面與前述隔膜的前述下表面之間形成有一空間。The plating apparatus according to claim 2, wherein the anode cover is configured to form a space between the upper surface of the anode cover and the lower surface of the separator. 如請求項2所述的鍍覆裝置,其中前述陽極移動機構經由一第一連接部件與前述陽極連接,藉由使前述第一連接部件在上下方向移動,來使前述陽極在上下方向移動; 前述陽極罩經由一第二連接部件連接於前述第一連接部件,在前述陽極移動機構構成為使前述第一連接部件移動後,與前述陽極一起移動。 The coating apparatus according to claim 2, wherein the anode moving mechanism is connected to the anode via a first connecting member, and moves the anode in the vertical direction by moving the first connecting member in the vertical direction; The anode cover is connected to the first connecting member via a second connecting member, and the anode moving mechanism is configured to move together with the anode after moving the first connecting member. 一種使用鍍覆裝置的鍍覆處理方法,該鍍覆裝置具備:一鍍覆槽,配置有一隔膜,在比前述隔膜更下側分隔的一陽極室配置有一陽極;以及一基板夾具,配置於比前述陽極室更上方並保持做為一陰極的一基板,其中前述陽極具有在上下方向延伸的圓筒形狀,前述鍍覆裝置,更具備: 一氣體儲藏部,設有前述陽極室,以在與前述陽極之間具有一空間並覆蓋前述陽極的一上端、一外周以及一內周面,來儲藏從前述陽極產生的一製程氣體;以及 一排出機構,使儲藏在前述氣體儲藏部的前述製程氣體排出至前述鍍覆槽的外部,前述鍍覆處理方法包含:在對前述基板施加鍍覆處理時,藉由前述排出機構使前述氣體儲藏部所儲藏的前述製程氣體排出至前述鍍覆槽的外部。 A plating treatment method using a plating apparatus, the plating apparatus comprising: a plating tank provided with a diaphragm, an anode is disposed in an anode chamber separated from the lower side of the diaphragm; The anode chamber is further above and holds a substrate as a cathode, wherein the anode has a cylindrical shape extending in the up-down direction, and the plating device further includes: a gas storage part provided with the anode chamber so as to have a space between the anode and the anode and cover an upper end, an outer circumference and an inner circumference of the anode for storing a process gas generated from the anode; and a discharge mechanism for discharging the process gas stored in the gas storage part to the outside of the plating tank, and the plating treatment method includes: when the substrate is subjected to a plating treatment, using the discharge mechanism to store the gas The process gas stored in the part is discharged to the outside of the coating tank.
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