TW202220936A - Glass substrate for display - Google Patents

Glass substrate for display Download PDF

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TW202220936A
TW202220936A TW110141027A TW110141027A TW202220936A TW 202220936 A TW202220936 A TW 202220936A TW 110141027 A TW110141027 A TW 110141027A TW 110141027 A TW110141027 A TW 110141027A TW 202220936 A TW202220936 A TW 202220936A
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glass substrate
vertex
main surface
height difference
plate thickness
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TW110141027A
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Chinese (zh)
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玉村周作
中村隆英
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日商日本電氣硝子股份有限公司
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Publication of TW202220936A publication Critical patent/TW202220936A/en

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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B17/00Forming molten glass by flowing-out, pushing-out, extruding or drawing downwardly or laterally from forming slits or by overflowing over lips
    • C03B17/06Forming glass sheets
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/02Details

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Electroluminescent Light Sources (AREA)
  • Optics & Photonics (AREA)
  • Surface Treatment Of Glass (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

In the present invention, when a sheet thickness distribution TD for a first main surface GS1 is measured in a direction Y perpendicular to a sheet drawing direction X, and where H1 is the difference in height between a first high point A01 and a second high point B01 in the sheet thickness distribution TD for the first main surface GS1, H2 is the difference in height between the second high point B01 and a third high point A02, D1 is the distance between the first high point A01 and the second high point B01 in the direction Y perpendicular to the sheet drawing direction X, and D2 is the distance between the second high point B01 and the third high point A02 in the direction Y perpendicular to the sheet drawing direction X, the height differences (H1, H2) are less than or equal to 0.005 mm, or the slopes (H1/D1, H2/D2) are less than or equal to 1*10<SP>-4</SP> if the height differences (H1, H2) exceed 0.005 mm.

Description

顯示器用玻璃基板Glass substrate for display

本發明是有關於一種例如於有機電致發光(Electroluminescence,EL)顯示器等顯示器中使用的玻璃基板。The present invention relates to a glass substrate used in displays such as organic electroluminescence (Electroluminescence, EL) displays.

如眾所周知般,於有機EL顯示器、液晶顯示器等顯示器中,為了形成微細的電極或隔離壁等元件或結構體而使用玻璃基板。於玻璃基板的表面均勻地塗佈各種膜後,使用光學製程的方法(曝光步驟、顯影步驟等)而形成薄膜電晶體(TFT;Thin Film Transistor)。As is well known, in displays such as organic EL displays and liquid crystal displays, glass substrates are used in order to form elements or structures such as fine electrodes and partition walls. After uniformly coating various films on the surface of the glass substrate, a thin film transistor (TFT; Thin Film Transistor) is formed using an optical process method (exposure step, development step, etc.).

例如專利文獻1中揭示了一種TFT用玻璃基板,所述TFT用玻璃基板構成為矩形,包括第一主表面、以及與第一主表面相向的第二主表面,且具有彼此相鄰的第一邊與第二邊,第一邊與第二邊的長度至少為1200 mm以上。For example, Patent Document 1 discloses a glass substrate for a TFT which is formed in a rectangular shape, includes a first main surface, a second main surface facing the first main surface, and has first adjacent to each other. The length of the side and the second side, and the length of the first side and the second side shall be at least 1200 mm.

於該玻璃基板中,於板厚方向上的剖面中,在沿著與第一邊平行的直線的第一剖面中,將板厚的最大值與板厚的最小值的差、即板厚公差設為小於6.26 μm(參照該文獻的請求項1、段落0006)。 [現有技術文獻] [專利文獻] In this glass substrate, in the cross section in the plate thickness direction, in the first cross section along the straight line parallel to the first side, the difference between the maximum value of the plate thickness and the minimum value of the plate thickness, that is, the plate thickness tolerance It is set to be smaller than 6.26 μm (refer to claim 1 of this document, paragraph 0006). [Prior Art Literature] [Patent Literature]

專利文獻1:日本專利特開2019-34878號公報Patent Document 1: Japanese Patent Laid-Open No. 2019-34878

[發明所欲解決之課題] 若於液晶顯示器用的玻璃基板中存在厚度變得不均勻的部分(厚度偏差部分),則難以精度良好地形成TFT。因此,如所述專利文獻1的玻璃基板般,為了精度良好地形成TFT,有效的是限制板厚公差。 [The problem to be solved by the invention] When the glass substrate for liquid crystal displays has a portion where the thickness becomes non-uniform (thickness uneven portion), it is difficult to form a TFT with high accuracy. Therefore, like the glass substrate of Patent Document 1, it is effective to limit the thickness tolerance in order to form the TFT with high accuracy.

於有機EL顯示器的製造步驟中,實施了檢測形成於玻璃基板上的薄膜的不均的外觀檢查(宏觀檢查)。於該外觀檢查中,例如自光源向玻璃基板照射光,並檢測其反射光。於產生不均的情況下,例如於該部位反射光的方向局部發生變化,因此濃淡發生變化。於此種宏觀檢查中,即使是如專利文獻1般限制板厚公差的玻璃基板,亦產生檢測到外觀異常的事態。於產生薄膜的不均的情況下,玻璃基板作為品質不良被廢棄。In the manufacturing process of an organic EL display, the external appearance inspection (macro inspection) which detects the unevenness of the thin film formed on the glass substrate was implemented. In this appearance inspection, for example, light is irradiated to a glass substrate from a light source, and the reflected light is detected. When unevenness occurs, for example, the direction of the reflected light at that portion changes locally, so that the gradation changes. In such a macro-inspection, even if it is a glass substrate for which the plate|board thickness tolerance is limited like patent document 1, the state which detects abnormal external appearance arises. When unevenness of the thin film occurs, the glass substrate is discarded as poor quality.

本發明是鑒於所述情況而成者,其目的在於提供一種可抑制形成於玻璃基板上的薄膜的不均的顯示器用玻璃基板。 [解決課題之手段] This invention was made in view of the said situation, and it aims at providing the glass substrate for displays which can suppress the unevenness of the thin film formed on the glass substrate. [Means of Solving Problems]

本發明是為了解決所述課題而成者,是一種顯示器用玻璃基板,所述顯示器用玻璃基板具有:沿著板拉伸方向的第一邊、沿著與所述板拉伸方向正交的方向的第二邊、第一主表面、以及於厚度方向上位於所述第一主表面的相反側的第二主表面,所述顯示器用玻璃基板的特徵在於,於沿著與所述板拉伸方向正交的方向測定板厚分佈的情況下,所述板厚分佈包含第一頂點、與所述第一頂點相鄰的第二頂點、以及與所述第二頂點相鄰的第三頂點,在將所述第一頂點與所述第二頂點的高低差設為H1(mm),將所述第二頂點與所述第三頂點的高低差設為H2(mm),將與所述板拉伸方向正交的方向上的所述第一頂點與所述第二頂點的距離設為D1(mm),且將與所述板拉伸方向正交的方向上的所述第二頂點與所述第三頂點的距離設為D2(mm)時,所述H1及所述D1充分滿足下述式(1)及下述式(3),或者充分滿足下述式(4),所述H2及所述D2充分滿足下述式(2)及下述式(5),或者充分滿足下述式(6)。 (H1/D1)≦1×10 -4···(1) (H2/D2)≦1×10 -4···(2) H1>0.005 ···(3) H1≦0.005 ···(4) H2>0.005 ···(5) H2≦0.005 ···(6) The present invention was made in order to solve the above-mentioned problems, and is a glass substrate for a display having a first side along a direction in which the plate is stretched and a direction perpendicular to the direction in which the plate is stretched The second side in the direction, the first main surface, and the second main surface located on the opposite side of the first main surface in the thickness direction, and the glass substrate for a display is characterized in that it is drawn along the When the thickness distribution is measured in a direction orthogonal to the extending direction, the thickness distribution includes a first vertex, a second vertex adjacent to the first vertex, and a third vertex adjacent to the second vertex , where the height difference between the first vertex and the second vertex is set as H1 (mm), the height difference between the second vertex and the third vertex is set as H2 (mm), and the height difference between the second vertex and the third vertex is set as H2 (mm). The distance between the first vertex and the second vertex in the direction orthogonal to the board stretching direction is set to D1 (mm), and the second vertex in the direction orthogonal to the board stretching direction is set as D1 (mm). When the distance from the third vertex is D2 (mm), the H1 and the D1 fully satisfy the following formula (1) and the following formula (3), or the following formula (4), so The above H2 and the above D2 sufficiently satisfy the following formula (2) and the following formula (5), or sufficiently satisfy the following formula (6). (H1/D1)≦1× 10-4・・(1) (H2/D2)≦1× 10-4・・(2) H1>0.005・・(3) H1≦0.005・・( 4) H2>0.005...(5) H2≦0.005...(6)

本發明者等反覆進行了努力研究,結果發現:於在玻璃基板的第一主表面形成薄膜的情況下,於板厚分佈中包含的山部高且傾斜度大的部位,容易產生薄膜的不均。另外,發現:於板厚分佈中包含的穀部深且傾斜度大的部位,容易產生薄膜的不均。即,發現:於所述高低差(H1,H2)及傾斜度(H1/D1,H2/D2)大的部位,容易產生薄膜的不均。本發明中,藉由減小板厚分佈中的所述高低差(H1,H2),或者於高低差(H1,H2)大的情況下減小傾斜度(H1/D1,H2/D2),可防止薄膜的不均的產生以及與之相伴的品質不良的產生。The inventors of the present invention have repeatedly studied and found that when a thin film is formed on the first main surface of a glass substrate, the inconsistency of the thin film is likely to occur at a portion with a high mountain portion and a large inclination included in the plate thickness distribution. all. In addition, it was found that the unevenness of the thin film is likely to occur in the portion where the valley portion included in the plate thickness distribution is deep and the inclination is large. That is, it was found that the unevenness of the thin film is likely to occur at the site where the height difference (H1, H2) and the inclination (H1/D1, H2/D2) are large. In the present invention, by reducing the height difference (H1, H2) in the plate thickness distribution, or reducing the inclination (H1/D1, H2/D2) when the height difference (H1, H2) is large, It is possible to prevent the occurrence of unevenness of the film and the occurrence of poor quality associated therewith.

本發明是為了解決所述課題而成者,是一種顯示器用玻璃基板,所述顯示器用玻璃基板具有:沿著板拉伸方向的第一邊、沿著與所述板拉伸方向正交的方向的第二邊、第一主表面、以及於厚度方向上位於所述第一主表面的相反側的第二主表面,所述顯示器用玻璃基板的特徵在於,於沿著與所述板拉伸方向正交的方向測定板厚分佈的情況下,所述板厚分佈包含具有高低差及寬度的斜邊部,在將所述斜邊部的所述高低差設為H(mm)且將所述斜邊部的所述寬度設為D(mm)時,所述H及所述D充分滿足下述式(7)及下述式(8),或者充分滿足下述式(9)。 (H/D)≦1×10 -4···(7) H>0.005 ···(8) H≦0.005 ···(9) The present invention was made in order to solve the above-mentioned problems, and is a glass substrate for a display having a first side along a direction in which the plate is stretched and a direction perpendicular to the direction in which the plate is stretched The second side in the direction, the first main surface, and the second main surface located on the opposite side of the first main surface in the thickness direction, and the glass substrate for a display is characterized in that it is drawn along the When the plate thickness distribution is measured in a direction orthogonal to the extending direction, the plate thickness distribution includes a hypotenuse portion having a height difference and a width, and the height difference of the hypotenuse portion is set to H (mm) and the When the width of the hypotenuse portion is D (mm), the H and the D sufficiently satisfy the following formula (7) and the following formula (8), or sufficiently satisfy the following formula (9). (H/D)≦1× 10-4・・(7) H>0.005・・(8) H≦0.005・・(9)

本發明者等發現:如上所述般,藉由減小板厚分佈中包含的斜邊部的高低差(H),或者於高低差(H)大的情況下減小傾斜度(H/D),可防止薄膜的不均的產生以及與之相伴的品質不良的產生。The inventors of the present invention found that, as described above, by reducing the height difference (H) of the hypotenuse part included in the plate thickness distribution, or by reducing the inclination (H/D) when the height difference (H) is large ), which can prevent the occurrence of film unevenness and the accompanying quality defect.

本發明的顯示器用玻璃基板可為有機EL顯示器用玻璃基板。The glass substrate for displays of this invention may be a glass substrate for organic EL displays.

本發明的顯示器用玻璃基板的板厚的最大值與最小值的差可為6 μm以上。藉由減小板厚公差,可減少玻璃基板中的厚度偏差的程度,且減小山部及斜邊部的高低差或傾斜度的程度,但玻璃基板的製造成本增大。本發明中,藉由將板厚公差設為所述範圍內,可抑制玻璃基板的製造成本,且防止薄膜的不均的產生以及與之相伴的品質不良的產生。The difference between the maximum value and the minimum value of the thickness of the glass substrate for a display of the present invention may be 6 μm or more. By reducing the thickness tolerance, the degree of thickness variation in the glass substrate can be reduced, and the degree of height difference or inclination of the mountain portion and the hypotenuse portion can be reduced, but the manufacturing cost of the glass substrate increases. In the present invention, by setting the plate thickness tolerance within the above-mentioned range, the production cost of the glass substrate can be suppressed, and the occurrence of the unevenness of the thin film and the occurrence of the quality defect accompanying it can be prevented.

顯示器用玻璃基板中的所述第一主表面及所述第二主表面可為鍛造面。或者,所述第一主表面可為鍛造面,所述第二主表面可為蝕刻面。The said 1st main surface and the said 2nd main surface in the glass substrate for a display may be a forging surface. Alternatively, the first major surface may be a forged surface, and the second major surface may be an etched surface.

關於本發明的顯示器用玻璃基板,所述第一邊的尺寸可為1200 mm以上,所述第二邊的尺寸可為1200 mm以上,板厚尺寸可為0.2 mm~1.3 mm。 [發明的效果] Regarding the glass substrate for a display of the present invention, the size of the first side may be 1200 mm or more, the size of the second side may be 1200 mm or more, and the thickness may be 0.2 mm to 1.3 mm. [Effect of invention]

根據本發明,可抑制形成於玻璃基板上的薄膜的不均。According to the present invention, the unevenness of the thin film formed on the glass substrate can be suppressed.

以下,一面參照圖式一面對用於實施本發明的形態進行說明。圖1至圖6表示本發明的顯示器用玻璃基板及其製造方法的一實施形態。於本實施形態中,作為玻璃基板,例示了有機EL顯示器用玻璃基板,但不限於此,亦可於液晶顯示器及其他各種顯示器用的玻璃基板中適用本發明。Hereinafter, the form for implementing this invention is demonstrated, referring drawings. 1 to 6 show one embodiment of the glass substrate for a display and its manufacturing method of the present invention. In this embodiment, although the glass substrate for organic electroluminescent displays was illustrated as a glass substrate, it is not limited to this, You may apply this invention to the glass substrate for liquid crystal displays and other various displays.

如圖1所示般,玻璃基板G例如構成為矩形形狀(長方形形狀)。玻璃基板G具有:沿著板拉伸方向X的第一邊Ga、沿著與板拉伸方向X正交的方向Y的第二邊Gb、與第二邊Gb大致平行的第三邊Gc、以及與第一邊Ga大致平行的第四邊Gd。於本實施形態中,第一邊Ga及第四邊Gd的長度較佳為1200 mm以上,更佳為1800 mm以上,進而更佳為2100 mm以上。第二邊Gb及第三邊Gc的長度較佳為1200 mm以上,更佳為2150 mm以上,進而更佳為2400 mm以上。另一方面,第一邊Ga、第二邊Gb、第三邊Gc及第四邊Gd的長度均較佳為4000 mm以下。As shown in FIG. 1, the glass substrate G is comprised, for example in a rectangular shape (rectangular shape). The glass substrate G has a first side Ga along the sheet stretching direction X, a second side Gb along the direction Y orthogonal to the sheet stretching direction X, a third side Gc substantially parallel to the second side Gb, and a fourth side Gd substantially parallel to the first side Ga. In this embodiment, the lengths of the first side Ga and the fourth side Gd are preferably 1200 mm or more, more preferably 1800 mm or more, and still more preferably 2100 mm or more. The lengths of the second side Gb and the third side Gc are preferably 1200 mm or more, more preferably 2150 mm or more, and still more preferably 2400 mm or more. On the other hand, the lengths of the first side Ga, the second side Gb, the third side Gc, and the fourth side Gd are all preferably 4000 mm or less.

再者,所謂「板拉伸方向」,是指於成形出玻璃基板G時進行板拉伸的方向。關於玻璃基板G的板拉伸方向X,例如藉由在暗室中調整玻璃基板G的角度的同時自光源(例如氙燈)照射光,並將其透過光投影至屏幕,而可作為條紋狀的條帶花紋來觀測到。因此,即使為成形後的玻璃基板G的狀態,亦可確定成形時的板拉伸方向X。In addition, the "plate stretching direction" refers to the direction in which the plate stretching is performed when the glass substrate G is formed. Regarding the plate stretching direction X of the glass substrate G, for example, by adjusting the angle of the glass substrate G in a dark room, irradiating light from a light source (for example, a xenon lamp), and projecting the transmitted light on a screen, it can be used as a striped stripe Observed with patterns. Therefore, even if it is the state of the glass substrate G after shaping|molding, the board stretching direction X at the time of shaping|molding can be determined.

另外,所謂「沿著板拉伸方向」,是如下含義:不僅包含與板拉伸方向X在幾何學上平行的情況,亦包含視為實質上平行的方向。另外,所謂「沿著與板拉伸方向正交的方向」,是如下含義:不僅包含與板拉伸方向X在幾何學上正交的方向,亦包含視為實質上正交的方向。In addition, "along the plate stretching direction" means not only a case where the plate stretching direction X is geometrically parallel, but also a direction considered to be substantially parallel. In addition, "along the direction orthogonal to the board stretching direction" means not only a direction that is geometrically orthogonal to the board stretching direction X, but also a direction considered to be substantially orthogonal.

玻璃基板G具有第一主表面GS1、以及於厚度方向上位於第一主表面GS1的相反側的第二主表面GS2。於本實施形態中,第一主表面GS1為保證面,第二主表面GS2為非保證面。此處,所謂「保證面」,是指例如於顯示器的製造過程中形成有薄膜的一側的面。The glass substrate G has a first main surface GS1 and a second main surface GS2 located on the opposite side of the first main surface GS1 in the thickness direction. In this embodiment, the first main surface GS1 is a guaranteed surface, and the second main surface GS2 is a non-guaranteed surface. Here, the "guarantee surface" refers to, for example, the surface on the side where the thin film is formed in the manufacturing process of the display.

玻璃基板G中的第一主表面GS1及第二主表面GS2較佳為鍛造面。此處,所謂「鍛造面」,是指不與成形裝置等接觸,而是以非接觸的狀態形成的面。此種鍛造面儘管未研磨,但具有優異的表面性狀。The first main surface GS1 and the second main surface GS2 in the glass substrate G are preferably forged surfaces. Here, the "forged surface" refers to a surface formed in a non-contact state without being in contact with a forming device or the like. Although this forged surface is not ground, it has excellent surface properties.

不限於該結構,關於玻璃基板G,亦可將第一主表面GS1設為鍛造面,將第二主表面GS2設為蝕刻面。此處,所謂「蝕刻面」,是指實施了粗面化處理的面。粗面化處理的方法並無特別限定,可列舉:蝕刻等化學研磨、帶研磨/刷研磨/研磨粒研磨等機械研磨、化學機械研磨(Chemical Mechanical Polishing,CMP)等。此種蝕刻面減少了靜電的產生,因此例如於抬起載置於支撐台的玻璃基板時,可防止玻璃基板因靜電而貼附於支撐台從而發生破損的情況。Not limited to this structure, regarding the glass substrate G, the first main surface GS1 may be the forging surface, and the second main surface GS2 may be the etching surface. Here, the "etched surface" refers to a surface to which a roughening process has been performed. The method of the roughening treatment is not particularly limited, and examples thereof include chemical polishing such as etching, mechanical polishing such as tape polishing, brush polishing, and abrasive grain polishing, chemical mechanical polishing (CMP), and the like. Such an etched surface reduces the generation of static electricity. Therefore, for example, when the glass substrate placed on the support table is lifted, the glass substrate can be prevented from being damaged by sticking to the support table due to static electricity.

玻璃基板G的板厚(厚度尺寸)較佳為1.0 mm以下,更佳為0.7 mm以下,進而更佳為0.5 mm以下。另一方面,玻璃基板G的板厚較佳為0.2 mm以上,更佳為0.3 mm以上。就抑制製造成本的增大的觀點而言,玻璃基板G中的板厚的最大值與最小值的差(板厚公差)的較佳的下限為3 μm以上、4 μm以上、5 μm以上、6 μm以上、7 μm以上、尤其是7.5 μm以上。另一方面,就均勻地保持液晶顯示器的單元間隙的觀點而言,板厚公差較佳為20 μm以下,更佳為15 μm以下。The plate thickness (thickness dimension) of the glass substrate G is preferably 1.0 mm or less, more preferably 0.7 mm or less, and still more preferably 0.5 mm or less. On the other hand, the plate thickness of the glass substrate G is preferably 0.2 mm or more, more preferably 0.3 mm or more. From the viewpoint of suppressing an increase in the manufacturing cost, the preferable lower limits of the difference between the maximum value and the minimum thickness of the glass substrate G (plate thickness tolerance) are 3 μm or more, 4 μm or more, 5 μm or more, 6 μm or more, 7 μm or more, especially 7.5 μm or more. On the other hand, from the viewpoint of uniformly maintaining the cell gap of the liquid crystal display, the plate thickness tolerance is preferably 20 μm or less, and more preferably 15 μm or less.

玻璃基板G例如使用矽酸鹽玻璃、二氧化矽玻璃,較佳為包含硼矽酸玻璃、鈉鈣玻璃、鋁矽酸鹽玻璃、化學強化玻璃、無鹼玻璃。此處,所謂無鹼玻璃,是實質上不含鹼成分(鹼金屬氧化物)的玻璃,具體而言是鹼成分的重量比為3000 ppm以下的玻璃。本發明中的鹼成分的重量比較佳為1000 ppm以下,更佳為500 ppm以下,最佳為300 ppm以下。As the glass substrate G, for example, silicate glass and silica glass are used, and borosilicate glass, soda lime glass, aluminosilicate glass, chemically strengthened glass, and alkali-free glass are preferably used. Here, the so-called alkali-free glass is a glass that does not substantially contain an alkali component (alkali metal oxide), specifically, a glass whose weight ratio of the alkali component is 3000 ppm or less. The weight ratio of the alkali component in the present invention is preferably 1000 ppm or less, more preferably 500 ppm or less, and most preferably 300 ppm or less.

如圖1所示般,玻璃基板G的第一主表面GS1沿著以和與板拉伸方向X正交的方向Y大致平行的方式設定的測定預定線ML,測定其板厚分佈(板厚分佈曲線)。板厚分佈的測定是藉由雷射位移計以10 mm間距沿著測定預定線ML進行。雷射位移計測定玻璃基板G的厚度方向上的第一主表面GS1與第二主表面GS2的距離(板厚)。所測定的板厚分佈包含穀部及/或山部。As shown in FIG. 1 , the thickness distribution (plate thickness) of the first main surface GS1 of the glass substrate G is measured along a planned measurement line ML set substantially parallel to the direction Y perpendicular to the plate stretching direction X. distribution curve). The measurement of the plate thickness distribution was performed along the measurement planned line ML at a pitch of 10 mm by a laser displacement meter. The laser displacement meter measures the distance (plate thickness) of the 1st main surface GS1 and the 2nd main surface GS2 in the thickness direction of the glass substrate G. The measured plate thickness distribution includes valley parts and/or mountain parts.

圖2示出玻璃基板G的第一主表面GS1的板厚分佈中包含的穀部。板厚分佈TD包含第一頂點A01、與第一頂點A01相鄰的第二頂點B01、以及與第二頂點B01相鄰的第三頂點A02。第一頂點A01、第二頂點B01及第三頂點A02的傾斜度均為0(零),構成穀部。FIG. 2 shows valleys included in the thickness distribution of the first main surface GS1 of the glass substrate G. FIG. The plate thickness distribution TD includes a first vertex A01, a second vertex B01 adjacent to the first vertex A01, and a third vertex A02 adjacent to the second vertex B01. The inclinations of the first vertex A01 , the second vertex B01 , and the third vertex A02 are all 0 (zero), and constitute a valley.

進而,板厚分佈TD包含:位於第一頂點A01與第二頂點B01之間的第一斜邊部C01、以及位於第二頂點B01與第三頂點A02之間的第二斜邊部C02。Furthermore, the plate thickness distribution TD includes a first hypotenuse portion C01 between the first vertex A01 and the second vertex B01, and a second hypotenuse portion C02 between the second vertex B01 and the third vertex A02.

第一斜邊部C01具有第一高低差H1及第一寬度D1。第一斜邊部C01的第一高低差H1是第一頂點A01與第二頂點B01的高度的差。第一斜邊部C01的第一寬度D1是和板拉伸方向X正交的方向Y上的第一頂點A01與第二頂點B01的距離。The first hypotenuse portion C01 has a first height difference H1 and a first width D1. The first height difference H1 of the first hypotenuse portion C01 is the difference between the heights of the first vertex A01 and the second vertex B01. The first width D1 of the first hypotenuse portion C01 is the distance between the first vertex A01 and the second vertex B01 in the direction Y orthogonal to the board stretching direction X.

第二斜邊部C02具有第二高低差H2及第二寬度D2。第二斜邊部C02的第二高低差H2是第二頂點B01與第三頂點A02的高低差。第二斜邊部C02的第二寬度D2是和板拉伸方向X正交的方向Y上的第二頂點B01與第三頂點A02的距離。The second hypotenuse portion C02 has a second height difference H2 and a second width D2. The second height difference H2 of the second hypotenuse portion C02 is the height difference between the second vertex B01 and the third vertex A02. The second width D2 of the second hypotenuse portion C02 is the distance between the second vertex B01 and the third vertex A02 in the direction Y orthogonal to the board stretching direction X.

圖3示出玻璃基板G的第一主表面GS1的板厚分佈中包含的山部。板厚分佈TD包含第一頂點B11、與第一頂點B11相鄰的第二頂點A11、以及與第二頂點A11相鄰的第三頂點B12。第一頂點B11、第二頂點A11及第三頂點B12的傾斜度均為0(零),構成山部。FIG. 3 shows a mountain portion included in the plate thickness distribution of the first main surface GS1 of the glass substrate G. As shown in FIG. The plate thickness distribution TD includes a first vertex B11, a second vertex A11 adjacent to the first vertex B11, and a third vertex B12 adjacent to the second vertex A11. The inclinations of the first vertex B11 , the second vertex A11 , and the third vertex B12 are all 0 (zero), and constitute a mountain portion.

進而,板厚分佈TD包含:位於第一頂點B11與第二頂點A11之間的第一斜邊部C11、以及位於第二頂點A11與第三頂點B12之間的第二斜邊部C12。Furthermore, the plate thickness distribution TD includes a first hypotenuse portion C11 located between the first vertex B11 and the second vertex A11, and a second hypotenuse portion C12 located between the second vertex A11 and the third vertex B12.

第一斜邊部C11具有第一高低差H1及第一寬度D1。第一斜邊部C11的第一高低差H1是第一頂點B11與第二頂點A11的高度的差。第一斜邊部C11的第一寬度D1是和板拉伸方向X正交的方向Y上的第一頂點B11與第二頂點A11的距離。The first hypotenuse portion C11 has a first height difference H1 and a first width D1. The first height difference H1 of the first hypotenuse portion C11 is the difference between the heights of the first vertex B11 and the second vertex A11. The first width D1 of the first hypotenuse portion C11 is the distance between the first vertex B11 and the second vertex A11 in the direction Y orthogonal to the board stretching direction X.

第二斜邊部C12具有第二高低差H2及第二寬度D2。第二斜邊部C12的第二高低差H2是第二頂點A11與第三頂點B12的高低差。第二斜邊部C12的第二寬度D2是和板拉伸方向X正交的方向Y上的第二頂點A11與第三頂點B12的距離。The second hypotenuse portion C12 has a second height difference H2 and a second width D2. The second height difference H2 of the second hypotenuse portion C12 is the height difference between the second vertex A11 and the third vertex B12. The second width D2 of the second hypotenuse portion C12 is the distance between the second vertex A11 and the third vertex B12 in the direction Y orthogonal to the board stretching direction X.

於在板厚分佈TD中存在山部及/或穀部的情況下,第一高低差H1(mm)及第一寬度D1(mm)充分滿足下述式(1)及下述式(3),或者充分滿足下述式(4)。另外,第二高低差H2(mm)及第二寬度D2(mm)充分滿足下述式(2)及下述式(5),或者充分滿足下述式(6)。When there are peaks and/or valleys in the plate thickness distribution TD, the first height difference H1 (mm) and the first width D1 (mm) fully satisfy the following formula (1) and the following formula (3) , or fully satisfy the following formula (4). In addition, the second height difference H2 (mm) and the second width D2 (mm) sufficiently satisfy the following formula (2) and the following formula (5), or sufficiently satisfy the following formula (6).

(H1/D1)≦1×10 -4···(1) (H2/D2)≦1×10 -4···(2) H1>0.005 ···(3) H1≦0.005 ···(4) H2>0.005 ···(5) H2≦0.005 ···(6) (H1/D1)≦1× 10-4・・(1) (H2/D2)≦1× 10-4・・(2) H1>0.005・・(3) H1≦0.005・・( 4) H2>0.005...(5) H2≦0.005...(6)

於在板厚分佈TD中存在多個山部或穀部的情況下,所有山部及谷部充分滿足基於所述式(1)~式(6)的條件。換言之,於在板厚分佈TD中高低差(H1,H2)大於0.005 mm的情況下,不存在具有傾斜度(H1/D1,H2/D2)大於1×10 -4的斜邊部的山部及穀部。 When there are a plurality of peaks or valleys in the plate thickness distribution TD, all the peaks and valleys fully satisfy the conditions based on the above-mentioned expressions (1) to (6). In other words, in the case where the height difference (H1, H2) in the plate thickness distribution TD is greater than 0.005 mm, there is no mountain portion having a hypotenuse portion with an inclination (H1/D1, H2/D2) greater than 1×10 −4 and Valley.

本發明者等反覆進行了努力研究,結果發現:於在玻璃基板G的第一主表面GS1形成薄膜的情況下,於板厚分佈中包含的山部高且傾斜度大的部位,容易產生薄膜的不均。另外,發現:於板厚分佈中包含的穀部深且傾斜度大的部位,容易產生薄膜的不均。即,發現:於所述高低差(H1,H2)及傾斜度(H1/D1,H2/D2)大的部位,容易產生薄膜的不均。即,藉由減小板厚分佈TD中的所述高低差(H1,H2),或者於高低差(H1,H2)大的情況下減小傾斜度(H1/D1,H2/D2),可防止薄膜的不均的產生以及與之相伴的品質不良的產生。The inventors of the present invention have repeatedly made intensive studies, and as a result, found that when a thin film is formed on the first main surface GS1 of the glass substrate G, a thin film is likely to be generated in a portion with a high mountain portion and a large slope included in the plate thickness distribution. of unevenness. In addition, it was found that the unevenness of the thin film is likely to occur in the portion where the valley portion included in the plate thickness distribution is deep and the inclination is large. That is, it was found that the unevenness of the thin film is likely to occur at the site where the height difference (H1, H2) and the inclination (H1/D1, H2/D2) are large. That is, by reducing the height difference (H1, H2) in the plate thickness distribution TD, or reducing the inclination (H1/D1, H2/D2) when the height difference (H1, H2) is large, it is possible to The occurrence of film unevenness and the accompanying quality defect are prevented.

圖4表示玻璃基板G的第一主表面GS1的板厚分佈的其他例子。如圖3所示般,板厚分佈TD具有相對於測定方向(與板拉伸方向正交的方向)Y傾斜的斜邊部C。斜邊部C具有高低差H及寬度D。FIG. 4 shows another example of the plate thickness distribution of the first main surface GS1 of the glass substrate G. As shown in FIG. As shown in FIG. 3 , the plate thickness distribution TD has a hypotenuse portion C inclined with respect to the measurement direction (direction orthogonal to the plate stretching direction) Y. The hypotenuse portion C has a height difference H and a width D.

於在板厚分佈TD中存在斜邊部C的情況下,斜邊部C的高低差H(mm)及寬度D(mm)充分滿足下述式(7)及下述式(8),或者充分滿足下述式(9)。When there is a hypotenuse portion C in the plate thickness distribution TD, the height difference H (mm) and the width D (mm) of the hypotenuse portion C fully satisfy the following formula (7) and the following formula (8), or The following formula (9) is sufficiently satisfied.

(H/D)≦1×10 -4···(7) H>0.005 ···(8) H≦0.005 ···(9) (H/D)≦1× 10-4・・(7) H>0.005・・(8) H≦0.005・・(9)

於在板厚分佈TD中存在多個斜邊部C的情況下,所有斜邊部C充分滿足基於所述式(7)~式(9)的條件。換言之,於在板厚分佈TD中高低差H大於0.005 mm的情況下,不存在傾斜度H/D大於1×10 -4的斜邊部。 When there are a plurality of hypotenuse portions C in the plate thickness distribution TD, all the hypotenuse portions C fully satisfy the conditions based on the above-mentioned formulae (7) to (9). In other words, when the height difference H in the plate thickness distribution TD is larger than 0.005 mm, there is no oblique side portion with an inclination H/D larger than 1×10 −4 .

本發明者等發現:於玻璃基板G的第一主表面GS1形成薄膜的情況下,若板厚分佈TD中存在的斜邊部C的高低差及傾斜度大,則容易產生薄膜的不均。即,藉由減小斜邊部C的高低差H,或者於高低差H大的情況下減小傾斜度(H/D),可防止薄膜的不均的產生以及與之相伴的品質不良的產生。The present inventors found that when a thin film is formed on the first main surface GS1 of the glass substrate G, when the height difference and inclination of the hypotenuse portion C existing in the plate thickness distribution TD are large, the unevenness of the thin film is likely to occur. That is, by reducing the height difference H of the hypotenuse portion C, or by reducing the inclination (H/D) when the height difference H is large, it is possible to prevent the occurrence of unevenness of the film and the accompanying quality defect. produce.

此處,下述表1表示板厚分佈中包含的斜邊部的傾斜度及高低差、以及於該部位中的薄膜的不均的產生狀況。Here, the following Table 1 shows the inclination and the level difference of the oblique side part included in the plate thickness distribution, and the occurrence situation of the unevenness of the thin film in this part.

[表1] 記號 斜邊部的傾斜度 斜邊部的高低差(mm) 薄膜的不均 No.1 0.8×10 -4 0.006 No.2 1.2×10 -4 0.006 No.3 1.2×10 -4 0.004 [Table 1] mark The inclination of the hypotenuse Height difference of the hypotenuse (mm) film unevenness No.1 0.8× 10-4 0.006 none No.2 1.2× 10-4 0.006 Have No.3 1.2× 10-4 0.004 none

No.1及No.2中,斜邊部的高低差(H)均超過0.005 mm。No.1中,傾斜度(H/D)為1×10 -4以下,其結果未產生薄膜的不均,相對於此,No.2中,傾斜度(H/D)超過1×10 -4,產生了薄膜的不均。即,可確認:即使斜邊部有高低差,若傾斜度(H/D)為1×10 -4以下,則亦可抑制薄膜的不均。 In both No. 1 and No. 2, the height difference (H) of the hypotenuse portion exceeded 0.005 mm. In No. 1, the inclination (H/D) was 1×10 −4 or less, and as a result, no unevenness of the film occurred, whereas in No. 2, the inclination (H/D) exceeded 1×10 − 4 , resulting in unevenness of the film. That is, it was confirmed that the unevenness of the film can be suppressed if the inclination (H/D) is 1×10 −4 or less even if there is a level difference in the oblique side portion.

No.2及No.3中,斜邊部的傾斜度均超過1×10 -4。No.3中,高低差(H)為0.005 mm以下,其結果未產生薄膜的不均,相對於此,No.2中,高低差(H)超過0.005 mm,產生了薄膜的不均。即,可確認:即使斜邊部有傾斜度,若高低差(H)為0.005 mm以下,則亦可抑制薄膜的不均。 In both No. 2 and No. 3, the inclination of the hypotenuse portion exceeded 1×10 -4 . In No. 3, the height difference (H) was 0.005 mm or less, and as a result, film unevenness did not occur, whereas in No. 2, the height difference (H) exceeded 0.005 mm, and film unevenness occurred. That is, it was confirmed that even if the oblique portion has an inclination, if the height difference (H) is 0.005 mm or less, the unevenness of the film can be suppressed.

就進一步減少薄膜的不均而形成均勻的薄膜的觀點而言,高低差(H1,H2,H)大於0.005 mm時的傾斜度(H1/D1,H2/D2,H/D)較佳為0.5×10 -4以下。另外,於高低差(H1,H2,H)大於0.005 mm的情況下,高低差(H1,H2,H)較佳為0.02 mm以下。另一方面,就抑制與減小傾斜度相伴的製造成本的增大的觀點而言,傾斜度(H1/D1,H2/D2,H/D)較佳為0.05×10 -4以上。 From the viewpoint of further reducing the unevenness of the film and forming a uniform film, the inclination (H1/D1, H2/D2, H/D) when the height difference (H1, H2, H) is larger than 0.005 mm is preferably 0.5 ×10 -4 or less. In addition, when the height difference (H1, H2, H) is larger than 0.005 mm, the height difference (H1, H2, H) is preferably 0.02 mm or less. On the other hand, the inclination (H1/D1, H2/D2, H/D) is preferably 0.05×10 −4 or more from the viewpoint of suppressing an increase in manufacturing cost associated with decreasing the inclination.

玻璃基板G利用溢流下拉法、流孔下拉法(slot down draw method)等下拉法、或浮式法(float method)等公知的成形方法來製造。於本實施形態中,例示了利用溢流下拉法製造玻璃基板G的情況。The glass substrate G is manufactured by a well-known molding method, such as a down-draw method, such as an overflow down-draw method, a slot down-draw method, or a float method. In this embodiment, the case where the glass substrate G is manufactured by the overflow down-draw method is illustrated.

以下,對製造所述結構的玻璃基板G的方法進行說明。如圖5所示般,本方法主要包括成形步驟S1、緩冷步驟S2、冷卻步驟S3、切斷步驟S4、端面加工步驟S5、清洗步驟S6、以及檢查步驟S7。Hereinafter, the method of manufacturing the glass substrate G of the said structure is demonstrated. As shown in FIG. 5 , the method mainly includes forming step S1 , slow cooling step S2 , cooling step S3 , cutting step S4 , end face processing step S5 , cleaning step S6 , and inspection step S7 .

圖6表示自成形步驟S1執行至切斷步驟S4的玻璃基板G的製造裝置。製造裝置1主要包括:執行成形步驟S1的成形爐2、執行緩冷步驟S2的緩冷爐3、進行冷卻步驟S3的冷卻區4、以及執行切斷步驟S4的切斷裝置5。於該製造裝置1中,於成形爐2、緩冷爐3及冷卻區4分別配置有上下多段的輥對6。FIG. 6 : has shown the manufacturing apparatus of the glass substrate G performed from the shaping|molding process S1 to the cutting process S4. The manufacturing apparatus 1 mainly includes the forming furnace 2 that performs the forming step S1 , the slow cooling furnace 3 that performs the slow cooling step S2 , the cooling zone 4 that performs the cooling step S3 , and the cutting device 5 that performs the cutting step S4 . In this manufacturing apparatus 1, the roll pair 6 of the upper and lower multistages is arrange|positioned in the shaping|molding furnace 2, the slow cooling furnace 3, and the cooling zone 4, respectively.

於成形爐2的內部空間配置有成形體7,所述成形體7利用溢流下拉法自熔融玻璃Gm成形出玻璃帶Gr。於成形步驟S1中,使供給至成形體7的熔融玻璃Gm自形成於成形體7的頂部7a的槽部溢出,使該熔融玻璃Gm沿著成形體7的兩側面7b流動,於成形體7的下端使該些熔融玻璃Gm合流。藉此,連續成形有板狀的玻璃帶Gr。然後,玻璃帶Gr由輥對6以縱向姿勢(較佳為鉛垂姿勢)向下方搬運。於該情況下,圖6中示出的X方向成為板拉伸方向。In the inner space of the forming furnace 2, a forming body 7 is arranged, and the forming body 7 forms the glass ribbon Gr from the molten glass Gm by the overflow down-draw method. In the molding step S1, the molten glass Gm supplied to the molded body 7 is made to overflow from the groove portion formed in the top portion 7a of the molded body 7, and the molten glass Gm is caused to flow along the both side surfaces 7b of the molded body 7, and the molten glass Gm flows in the molded body 7. The lower end of the molten glass Gm joins. Thereby, the plate-shaped glass ribbon Gr is continuously formed. Then, the glass ribbon Gr is conveyed downward in a vertical posture (preferably a vertical posture) by the roller pair 6 . In this case, the X direction shown in FIG. 6 becomes the plate stretching direction.

於成形爐2的側壁部中,與沿著成形體7的兩側面7b流動的熔融玻璃Gm及玻璃帶Gr相向的部分(以下稱為「相向部」)較佳為於玻璃帶Gr的寬度方向上不具有接合部,而由單一的耐火物構成。於由在玻璃帶Gr的寬度方向上被分割的多個耐火物構成相向部的情況下,由於耐火物彼此接合而成的接合部,玻璃帶Gr(熔融玻璃Gm)的溫度分佈容易變得不均勻。其結果,於產生熔融玻璃Gm的溫度下降的部位,玻璃帶Gr的板厚發生變化,於藉此形成的玻璃基板G的板厚分佈TD中,山部或斜邊部的高度(高低差)及傾斜度變大。相對於此,若相向部於玻璃帶Gr的寬度方向上不具有接合部,而由單一的耐火物構成,則於玻璃基板G的板厚分佈TD中,山部及斜邊部的高度(高低差)及傾斜度變小。In the side wall portion of the forming furnace 2, the portion facing the molten glass Gm and the glass ribbon Gr flowing along the both side surfaces 7b of the forming body 7 (hereinafter referred to as "opposing portion") is preferably in the width direction of the glass ribbon Gr. It does not have a joint, but is composed of a single refractory. When the opposing portion is constituted by a plurality of refractories divided in the width direction of the glass ribbon Gr, the temperature distribution of the glass ribbon Gr (molten glass Gm) tends to become poor due to the junction where the refractories are joined to each other. evenly. As a result, the plate thickness of the glass ribbon Gr changes at the place where the temperature drop of the molten glass Gm occurs, and in the plate thickness distribution TD of the glass substrate G formed by this, the height (difference in height) of the mountain portion or the oblique portion is and the inclination increases. On the other hand, if the opposing portion does not have a junction in the width direction of the glass ribbon Gr, but is formed of a single refractory material, in the thickness distribution TD of the glass substrate G, the heights (height and low) of the mountain portion and the oblique portion will be poor) and the inclination becomes smaller.

緩冷爐3的內部空間朝向下方具有規定的溫度梯度。緩冷爐3的內部空間的溫度梯度例如可藉由設置於緩冷爐3的內表面的加熱裝置等溫度調整裝置進行調整。於緩冷步驟S2中,縱向姿勢的玻璃帶Gr由輥對6搬運,且以隨著在緩冷爐3的內部空間朝向下方移動而溫度變低的方式受到緩冷。藉由該緩冷步驟S2,玻璃帶Gr的內部應變減少。The inner space of the slow cooling furnace 3 has a predetermined temperature gradient downward. The temperature gradient of the inner space of the slow cooling furnace 3 can be adjusted by a temperature adjusting device, such as a heating apparatus provided in the inner surface of the slow cooling furnace 3, for example. In the slow cooling step S2, the glass ribbon Gr of the vertical orientation is conveyed by the roll pair 6, and is slow-cooled so that the temperature may become lower as it moves downward in the inner space of the slow-cooling furnace 3. By this slow cooling step S2, the internal strain of the glass ribbon Gr is reduced.

於冷卻步驟S3中,由輥對6向下方搬運通過緩冷爐3的玻璃帶Gr,且使其通過冷卻區4。藉此,玻璃帶Gr被冷卻至室溫。In cooling process S3, the glass ribbon Gr which passed through the slow cooling furnace 3 is conveyed downward by the roll pair 6, and it is made to pass through the cooling zone 4. Thereby, the glass ribbon Gr was cooled to room temperature.

如圖6所示般,切斷裝置5位於冷卻區4的下方。於切斷步驟S4中,利用該切斷裝置5,將通過冷卻區4的縱向姿勢的玻璃帶Gr每隔規定的長度於寬度方向上切斷。藉此,可自玻璃帶Gr依次切出玻璃基板G。此處,玻璃帶Gr的寬度方向是與玻璃帶Gr的長邊方向(板拉伸方向X)正交的方向,於本實施形態中實質上與水平方向一致。As shown in FIG. 6 , the cutting device 5 is located below the cooling zone 4 . In the cutting step S4, the glass ribbon Gr passing through the vertical orientation of the cooling zone 4 is cut in the width direction at every predetermined length by the cutting device 5. As shown in FIG. Thereby, the glass substrate G can be cut out sequentially from the glass ribbon Gr. Here, the width direction of the glass ribbon Gr is a direction orthogonal to the longitudinal direction (plate stretching direction X) of the glass ribbon Gr, and in this embodiment, it substantially corresponds to the horizontal direction.

切斷裝置5包括:車輪刀(wheel cutter)(省略圖示),藉由在自冷卻區4下降的玻璃帶Gr的其中一主表面上行進,而沿著玻璃帶Gr的寬度方向形成劃線S;接觸部8,於形成有劃線S的區域自另一主表面側進行支撐;以及保持部9,於保持與作為切出對象的玻璃基板G對應的部分的玻璃帶Gr的狀態下,進行用於使彎曲應力作用於劃線S及其附近的動作(圖6中的A方向上的動作)。The cutting device 5 includes: a wheel cutter (not shown), which forms a scribe line along the width direction of the glass ribbon Gr by traveling on one of the main surfaces of the glass ribbon Gr descended from the cooling zone 4 S; the contact part 8 is supported from the other main surface side in the region where the scribe line S is formed; An operation for applying a bending stress to the scribe line S and its vicinity (operation in the direction A in FIG. 6 ) is performed.

於切斷步驟S4中,車輪刀追隨下降過程中的玻璃帶Gr而下降,且於玻璃帶Gr的寬度方向上的整個區域或一部分區域形成劃線S。再者,劃線S亦可藉由雷射的照射等而形成。In the cutting step S4, the wheel cutter descends following the glass ribbon Gr in the descending process, and forms a scribe line S in the entire area or a part of the area in the width direction of the glass ribbon Gr. In addition, the scribe line S may be formed by irradiation of a laser or the like.

接觸部8包含板狀體(壓盤),所述板狀體具有追隨下降過程中的玻璃帶Gr而下降且與玻璃帶Gr的寬度方向上的整個區域或一部分區域接觸的平面。接觸部8的接觸面亦可為沿著寬度方向彎曲的曲面。保持部9包含自表背兩側夾持玻璃帶Gr的寬度方向兩側的側端部的卡盤。保持部9於玻璃帶Gr的各側端部,在玻璃帶Gr的長邊方向上隔開間隔而設置有多個。設置於其中一側的側端部的多個保持部9全部由同一臂(省略圖示)保持。另外,同樣地,設置於另一側的側端部的多個保持部9亦全部由同一臂(省略圖示)保持。The contact portion 8 includes a plate-shaped body (platen) having a flat surface that descends following the glass ribbon Gr in the process of descending and is in contact with the entire area or a part of the area in the width direction of the glass ribbon Gr. The contact surface of the contact portion 8 may be a curved surface curved in the width direction. The holding portion 9 includes a chuck that sandwiches side end portions on both sides in the width direction of the glass ribbon Gr from both sides of the front and back. A plurality of holding parts 9 are provided at intervals in the longitudinal direction of the glass ribbon Gr at each side end of the glass ribbon Gr. All of the plurality of holding portions 9 provided at one of the side end portions are held by the same arm (not shown). Moreover, similarly, the some holding part 9 provided in the other side edge part is also hold|maintained by the same arm (illustration omitted).

於在玻璃帶Gr形成有劃線S時,藉由各臂的動作,多個保持部9追隨下降過程中的玻璃帶Gr而下降且以接觸部8為支點進行用於使玻璃帶Gr彎曲的動作(A方向上的動作)。藉此,對劃線S及其附近賦予彎曲應力,將玻璃帶Gr沿著劃線S於寬度方向上割斷。該割斷的結果是自玻璃帶Gr切出玻璃基板G。然後,相當於玻璃帶Gr的寬度方向上的端部(耳部)的玻璃基板G的端部被切除。藉此,製造具有四邊Ga~Gd、第一主表面GS1及第二主表面GS2的矩形形狀的玻璃基板G。When the scribe line S is formed on the glass ribbon Gr, the plurality of holding parts 9 follow the glass ribbon Gr in the process of descending and descend by the operation of each arm, and perform a bending process for bending the glass ribbon Gr with the contact part 8 as a fulcrum. Action (action in direction A). Thereby, bending stress is given to the scribe line S and its vicinity, and the glass ribbon Gr is cut|disconnected in the width direction along the scribe line S. As a result of this cutting, the glass substrate G is cut out from the glass ribbon Gr. Then, the edge part of the glass substrate G corresponding to the edge part (ear part) in the width direction of the glass ribbon Gr is cut off. Thereby, the rectangular glass substrate G which has four sides Ga-Gd, 1st main surface GS1, and 2nd main surface GS2 is manufactured.

於端面加工步驟S5中,對與玻璃基板G的各邊Ga~Gd對應的端面實施磨削加工及研磨加工。然後,於清洗步驟S6中,利用清洗用具對玻璃基板G進行各主表面GS1、GS2的擦拭清洗。接著,對玻璃基板G進行漂洗清洗。然後,藉由包括氣刀等的乾燥裝置,去除附著於玻璃基板G的漂洗液。亦可根據需要實施對第二主表面GS2實施粗面化處理的粗面化步驟。In the end surface processing step S5 , the end surfaces corresponding to the respective sides Ga to Gd of the glass substrate G are ground and polished. Then, in cleaning step S6, wiping cleaning of each main surface GS1 and GS2 is performed on the glass substrate G with a cleaning tool. Next, the glass substrate G is rinsed and washed. Then, the rinsing liquid adhering to the glass substrate G is removed by a drying apparatus including an air knife or the like. A roughening step of roughening the second main surface GS2 may be performed as needed.

於檢查步驟S7中,進行玻璃基板G的板厚的測定。玻璃基板G的板厚例如藉由雷射位移計進行測定。板厚分佈是沿著與玻璃基板G的板拉伸方向X正交的方向Y以10 mm間距測定多個部位。除此以外,於檢查步驟S7中,藉由公知的檢查裝置檢查玻璃基板G中有無缺陷等。In inspection step S7, the measurement of the plate thickness of the glass substrate G is performed. The plate thickness of the glass substrate G is measured by, for example, a laser displacement meter. The plate thickness distribution was measured at a plurality of locations along the direction Y orthogonal to the plate stretching direction X of the glass substrate G at a pitch of 10 mm. In addition, in inspection step S7, the presence or absence of a defect etc. in the glass substrate G is inspected by a well-known inspection apparatus.

於檢查步驟S7中,根據是否充分滿足基於所述式(1)~式(6)的條件或基於所述式(7)~式(9)的條件、玻璃基板G的厚度分佈中的厚度偏差的程度及缺陷的程度等,判定作為製品的玻璃基板G的良否。In the inspection step S7, the thickness variation in the thickness distribution of the glass substrate G is determined according to whether the conditions based on the above-mentioned formulae (1) to (6) or the conditions based on the above-mentioned formulae (7) to (9) are sufficiently satisfied. The degree and the degree of defect, etc., judge the quality of the glass substrate G as a product.

再者,本發明並不限定於所述實施形態的結構,亦不限定於所述作用效果。本發明可於不脫離本發明的主旨的範圍內進行各種變更。In addition, this invention is not limited to the structure of the said embodiment, nor is it limited to the said effect. In the present invention, various modifications can be made without departing from the gist of the present invention.

1:製造裝置 2:成形爐 3:緩冷爐 4:冷卻區 5:切斷裝置 6:輥對 7:成形體 7a:頂部 7b:兩側面 8:接觸部 9:保持部 A:方向 A01、B11:第一頂點 A02、A11:第二頂點 B01、B12:第三頂點 C:斜邊部 C01、C11:第一斜邊部 C02、C12:第二斜邊部 D:斜邊部的寬度/寬度 D1:第一頂點與第二頂點的距離/第一寬度 D2:第二頂點與第三頂點的距離/第二寬度 G:玻璃基板 Ga:玻璃基板的第一邊/第一邊/邊 Gb:玻璃基板的第二邊/第二邊/邊 Gc:玻璃基板的第三邊/第三邊/邊 Gd:玻璃基板的第四邊/第四邊/邊 Gr:玻璃帶 Gm:熔融玻璃 GS1:玻璃基板的第一主表面/第一主表面/主表面 GS2:玻璃基板的第二主表面/第二主表面/主表面 H:斜邊部的高低差/高低差 H1:第一頂點與第二頂點的高低差/高低差/第一高低差 H2:第二頂點與第三頂點的高低差/高低差/第二高低差 ML:測定預定線 TD:板厚分佈 X:板拉伸方向/方向 Y:與板拉伸方向正交的方向/方向 S:劃線 S1:成形步驟 S2:緩冷步驟 S3:冷卻步驟 S4:切斷步驟 S5:端面加工步驟 S6:清洗步驟 S7:檢查步驟 1: Manufacturing device 2: Forming furnace 3: Slow cooling furnace 4: Cooling zone 5: cutting device 6: Roll pair 7: Formed body 7a: Top 7b: Both sides 8: Contact part 9: Keeping Department A: Direction A01, B11: The first vertex A02, A11: The second vertex B01, B12: The third vertex C: hypotenuse C01, C11: the first hypotenuse C02, C12: The second hypotenuse D: width/width of the hypotenuse D1: the distance between the first vertex and the second vertex/the first width D2: the distance between the second vertex and the third vertex/the second width G: glass substrate Ga: first side/first side/side of glass substrate Gb: second side/second side/side of glass substrate Gc: third side/third side/side of glass substrate Gd: Fourth side/fourth side/side of glass substrate Gr: Glass Ribbon Gm: molten glass GS1: First main surface of glass substrate/first main surface/main surface GS2: Second Main Surface of Glass Substrate/Second Main Surface/Main Surface H: The height difference/height difference of the hypotenuse H1: The height difference between the first vertex and the second vertex/height difference/first height difference H2: The height difference between the second vertex and the third vertex/height difference/second height difference ML: Determination of predetermined line TD: Plate Thickness Distribution X: Board stretch direction/direction Y: direction/direction orthogonal to the direction of sheet stretching S: dash S1: Forming step S2: Slow cooling step S3: Cooling step S4: Cut off step S5: end face processing steps S6: Cleaning step S7: Check Steps

圖1是顯示器用玻璃基板的立體圖。 圖2是表示顯示器用玻璃基板的板厚分佈的曲線圖。 圖3是表示顯示器用玻璃基板的板厚分佈的曲線圖。 圖4是表示顯示器用玻璃基板的板厚分佈的曲線圖。 圖5是表示顯示器用玻璃基板的製造方法的流程圖。 圖6是表示顯示器用玻璃基板的製造裝置的側面圖。 FIG. 1 is a perspective view of a glass substrate for a display. FIG. 2 is a graph showing the thickness distribution of the glass substrate for a display. FIG. 3 is a graph showing the thickness distribution of the glass substrate for a display. FIG. 4 is a graph showing the thickness distribution of the glass substrate for a display. It is a flowchart which shows the manufacturing method of the glass substrate for displays. It is a side view which shows the manufacturing apparatus of the glass substrate for displays.

G:玻璃基板 G: glass substrate

Ga:玻璃基板的第一邊/第一邊/邊 Ga: first side/first side/side of glass substrate

Gb:玻璃基板的第二邊/第二邊/邊 Gb: second side/second side/side of glass substrate

Gc:玻璃基板的第三邊/第三邊/邊 Gc: third side/third side/side of glass substrate

Gd:玻璃基板的第四邊/第四邊/邊 Gd: Fourth side/fourth side/side of glass substrate

GS1:玻璃基板的第一主表面/第一主表面/主表面 GS1: First main surface of glass substrate/first main surface/main surface

GS2:玻璃基板的第二主表面/第二主表面/主表面 GS2: Second Main Surface of Glass Substrate/Second Main Surface/Main Surface

ML:測定預定線 ML: Determination of predetermined line

X:板拉伸方向/方向 X: Board stretch direction/direction

Y:與板拉伸方向正交的方向/方向 Y: direction/direction orthogonal to the direction of sheet stretching

Claims (7)

一種顯示器用玻璃基板,具有:沿著板拉伸方向的第一邊、沿著與所述板拉伸方向正交的方向的第二邊、第一主表面、以及於厚度方向上位於所述第一主表面的相反側的第二主表面,所述顯示器用玻璃基板的特徵在於, 於沿著與所述板拉伸方向正交的方向測定板厚分佈的情況下,所述板厚分佈包含第一頂點、與所述第一頂點相鄰的第二頂點、以及與所述第二頂點相鄰的第三頂點, 在將所述第一頂點與所述第二頂點的高低差設為H1(mm),將所述第二頂點與所述第三頂點的高低差設為H2(mm),將與所述板拉伸方向正交的方向上的所述第一頂點與所述第二頂點的距離設為D1(mm),且將與所述板拉伸方向正交的方向上的所述第二頂點與所述第三頂點的距離設為D2(mm)時, 所述H1及所述D1充分滿足下述式(1)及下述式(3),或者充分滿足下述式(4), 所述H2及所述D2充分滿足下述式(2)及下述式(5),或者充分滿足下述式(6): (H1/D1)≦1×10 -4···(1) (H2/D2)≦1×10 -4···(2) H1>0.005 ···(3) H1≦0.005 ···(4) H2>0.005 ···(5) H2≦0.005 ···(6)。 A glass substrate for a display comprising: a first side along a sheet stretching direction, a second side along a direction orthogonal to the sheet stretching direction, a first main surface, and a The second main surface on the opposite side of the first main surface, the glass substrate for a display, when the plate thickness distribution is measured in a direction orthogonal to the plate stretching direction, the plate thickness distribution It includes a first vertex, a second vertex adjacent to the first vertex, and a third vertex adjacent to the second vertex, where the height difference between the first vertex and the second vertex is set as H1 (mm), the height difference between the second vertex and the third vertex is H2 (mm), and the first vertex and the When the distance between the two vertices is D1 (mm), and the distance between the second vertex and the third vertex in the direction orthogonal to the plate stretching direction is D2 (mm), the H1 And the said D1 fully satisfies the following formula (1) and the following formula (3), or fully satisfies the following formula (4), the said H2 and the said D2 fully satisfy the following formula (2) and the following formula ( 5), or fully satisfy the following formula (6): (H1/D1)≦1× 10-4 (1) (H2/D2)≦1× 10-4 (2) H1>0.005 ···(3) H1≦0.005 ···(4) H2>0.005 ···(5) H2 ≦0.005 ···(6). 一種顯示器用玻璃基板,具有:沿著板拉伸方向的第一邊、沿著與所述板拉伸方向正交的方向的第二邊、第一主表面、以及於厚度方向上位於所述第一主表面的相反側的第二主表面,所述顯示器用玻璃基板的特徵在於, 於沿著與所述板拉伸方向正交的方向測定板厚分佈的情況下,所述板厚分佈包含具有高低差及寬度的斜邊部, 在將所述斜邊部的所述高低差設為H(mm)且將所述斜邊部的所述寬度設為D(mm)時, 所述H及所述D充分滿足下述式(7)及下述式(8),或者充分滿足下述式(9): (H/D)≦1×10 -4···(7) H>0.005 ···(8) H≦0.005 ···(9)。 A glass substrate for a display comprising: a first side along a sheet stretching direction, a second side along a direction orthogonal to the sheet stretching direction, a first main surface, and a The second main surface on the opposite side of the first main surface, the glass substrate for a display, when the plate thickness distribution is measured in a direction orthogonal to the plate stretching direction, the plate thickness distribution A hypotenuse portion having a height difference and a width is included, and when the height difference of the hypotenuse portion is H (mm) and the width of the hypotenuse portion is D (mm), the H and the above-mentioned D sufficiently satisfy the following formula (7) and the following formula (8), or sufficiently satisfy the following formula (9): (H/D)≦1×10 −4 (7) H> 0.005...(8) H≦0.005...(9). 如請求項1或請求項2所述的顯示器用玻璃基板,是有機電致發光顯示器用玻璃基板。The glass substrate for a display according to claim 1 or claim 2, which is a glass substrate for an organic electroluminescence display. 如請求項1至請求項3中任一項所述的顯示器用玻璃基板,其中板厚的最大值與最小值的差為6 μm以上。The glass substrate for a display according to any one of Claims 1 to 3, wherein the difference between the maximum value and the minimum value of the plate thickness is 6 μm or more. 如請求項1至請求項4中任一項所述的顯示器用玻璃基板,其中所述第一主表面及所述第二主表面是鍛造面。The glass substrate for a display according to any one of Claims 1 to 4, wherein the first main surface and the second main surface are forged surfaces. 如請求項1至請求項4中任一項所述的顯示器用玻璃基板,其中所述第一主表面是鍛造面,所述第二主表面是蝕刻面。The glass substrate for a display according to any one of Claims 1 to 4, wherein the first main surface is a forged surface, and the second main surface is an etched surface. 如請求項1至請求項6中任一項所述的顯示器用玻璃基板,其中所述第一邊的尺寸為1200 mm以上,所述第二邊的尺寸為1200 mm以上,板厚為0.2 mm~1.3 mm。The glass substrate for a display according to any one of claim 1 to claim 6, wherein the size of the first side is 1200 mm or more, the size of the second side is 1200 mm or more, and the plate thickness is 0.2 mm ~1.3 mm.
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