TW202216600A - Potassium gold cyanide crystal and potassium gold cyanide solution - Google Patents

Potassium gold cyanide crystal and potassium gold cyanide solution Download PDF

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TW202216600A
TW202216600A TW110109562A TW110109562A TW202216600A TW 202216600 A TW202216600 A TW 202216600A TW 110109562 A TW110109562 A TW 110109562A TW 110109562 A TW110109562 A TW 110109562A TW 202216600 A TW202216600 A TW 202216600A
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potassium
gold
gold cyanide
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cyanide
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水橋正英
久保孝文
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日商松田產業股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/31Coating with metals
    • C23C18/42Coating with noble metals
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25BELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
    • C25B1/00Electrolytic production of inorganic compounds or non-metals
    • C25B1/01Products
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/48Electroplating: Baths therefor from solutions of gold

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Abstract

This potassium gold cyanide crystal is characterized in that the silicon content is 10 wt ppm or less. This potassium gold cyanide solution is characterized in that, per 10 mL of the potassium gold cyanide solution, the number of pieces of foreign matter having a size of 1.0 [mu]m or greater is no more than 100. The present invention addresses the problem of providing potassium gold cyanide used for forming a gold plating film or a gold alloy plating film, the potassium gold cyanide being capable of reducing swelling of the plating film.

Description

氰化金鉀結晶及氰化金鉀溶液Potassium gold cyanide crystal and potassium gold cyanide solution

本發明係關於一種氰化金鉀(gold potassium cyanide)結晶,特別是關於一種能夠用作鍍金液或鍍金合金液之氰化金鉀結晶及氰化金鉀溶液。The present invention relates to a gold potassium cyanide crystal, in particular to a gold potassium cyanide crystal and a gold potassium cyanide solution which can be used as a gold plating solution or a gold plating alloy solution.

金(Au)由於導電性或導熱性優異,故而用作電子零件材料。被稱為軟質鍍金之純度較高之鍍金由於接觸電阻較低、且硬度較低,故而用於IC(積體電路)之接合線等。另一方面,被稱為硬質鍍金之純度較低之鍍金由於硬度較高且有光澤,故而用於電子零件之連接器或裝飾用等。作為鍍金液之用於供給金之藥劑,就化學穩定性或溶解容易性之觀點而言,使用氰化金鉀。Gold (Au) is used as an electronic component material because of its excellent electrical conductivity or thermal conductivity. Gold plating with higher purity, called soft gold plating, is used for bonding wires of ICs (integrated circuits) because of its low contact resistance and low hardness. On the other hand, gold plating with lower purity, called hard gold plating, is used for connectors and decoration of electronic parts because of its high hardness and luster. As the agent for supplying gold in the gold plating solution, potassium gold cyanide is used from the viewpoint of chemical stability and ease of dissolution.

作為氰化金鉀之製造方法,已知如下方法:於氰化鉀溶液之電解槽中配置金之陽極,並配置金屬板作為陰極,進行電解,藉此使氰化金鉀晶析並進行分離(例如專利文獻1、2)。又,於專利文獻3中,已知如下技術:藉由隔膜電解法使氰化金鹽晶析,使結晶分離後,對分離之溶液進行活性碳處理,藉此將該溶液作為隔膜電解法之陽極液進行再利用。 先前技術文獻 專利文獻 As a method for producing potassium gold cyanide, there is known a method in which a gold anode is placed in an electrolytic cell of a potassium cyanide solution, a metal plate is placed as a cathode, and electrolysis is performed, whereby the potassium gold cyanide is crystallized and separated. (For example, Patent Documents 1 and 2). In addition, in Patent Document 3, a technique is known in which a gold cyanide salt is crystallized by a diaphragm electrolysis method, the crystals are separated, and then the separated solution is treated with activated carbon, whereby the solution is used as a diaphragm electrolysis method. The anolyte is reused. prior art literature Patent Literature

專利文獻1:日本特開昭62-260084號公報 專利文獻2:日本特開平6-192866號公報 專利文獻3:日本特開平4-221086號公報 Patent Document 1: Japanese Patent Laid-Open No. 62-260084 Patent Document 2: Japanese Patent Application Laid-Open No. 6-192866 Patent Document 3: Japanese Patent Application Laid-Open No. 4-221086

[發明所欲解決之課題][The problem to be solved by the invention]

金(Au)顯示如下優異之特性:導電性或導熱性優異,亦無觸媒作用,對化學性腐蝕具有耐性,不會形成氧化被膜。並且,鍍金或鍍金合金由於具有導電性、導熱性、耐蝕性、低接觸電阻、接合性、焊接性、高頻特性、光反射性等優異之特性,故而廣泛用於電子學領域中之各種電性接點、端子、連接器插針、引線框架、IC、各種電氣電路零件等。Gold (Au) exhibits the following excellent properties: excellent electrical conductivity or thermal conductivity, no catalytic effect, resistance to chemical corrosion, and no oxide film formation. In addition, gold-plated or gold-plated alloys have excellent properties such as electrical conductivity, thermal conductivity, corrosion resistance, low contact resistance, bondability, solderability, high-frequency characteristics, and light reflectivity, so they are widely used in various electrical fields in the field of electronics. Contacts, terminals, connector pins, lead frames, ICs, various electrical circuit parts, etc.

然而,於使鍍金較厚地附著之情形時,存在鍍金膜產生鼓起之缺陷之問題。此種鍍膜之鼓起之缺陷可能成為各種電子零件之不良之原因。鑒於此種問題,本發明之課題在於提供一種用於形成鍍金膜或鍍金合金膜、且能夠減少鍍膜之鼓起之氰化金鉀結晶及氰化金鉀溶液。 [解決課題之技術手段] However, when the gold plating film is thickly adhered, there is a problem that the gold plating film bulges. The bulging defect of this kind of coating may be the cause of the failure of various electronic parts. In view of such a problem, an object of the present invention is to provide a potassium gold cyanide crystal and a potassium gold cyanide solution for forming a gold-plated film or a gold-plated alloy film and capable of reducing the swelling of the plated film. [Technical means to solve the problem]

能夠解決上述課題之本發明之第一態樣係一種矽含量為10 wtppm以下之氰化金鉀結晶。又,本發明之第二態樣係一種特徵在於氰化金鉀溶液10 mL中所含之1.0 μm以上之異物之數為100個以下的氰化金鉀溶液。 [發明之效果] A first aspect of the present invention capable of solving the above-mentioned problems is a potassium gold cyanide crystal having a silicon content of 10 wtppm or less. Furthermore, the second aspect of the present invention is a potassium gold cyanide solution characterized in that the number of foreign substances of 1.0 μm or more contained in 10 mL of the potassium gold cyanide solution is 100 or less. [Effect of invention]

根據本發明,使用氰化金鉀溶液所製作之鍍金膜或者鍍金合金膜有鍍膜鼓起之缺陷較少之優異效果。According to the present invention, the gold-plated film or the gold-plated alloy film produced by using the potassium gold cyanide solution has the excellent effect that the defects of the coating film bulge are less.

氰化金鉀溶液用作用於形成鍍金膜或鍍金合金膜之鍍覆液。於將氰化金鉀溶液用作鍍覆液來形成鍍金膜或者鍍金合金膜之情形時,有產生鍍膜鼓起之缺陷之情況。並且,鍍膜之鼓起會引起製品良率之降低。作為氰化金鉀溶液中所含之主要雜質,已知有Ag、Cu、Fe等過渡金屬,即便減少該等金屬雜質,亦未能改善鍍膜鼓起之缺陷。The potassium gold cyanide solution is used as a plating solution for forming a gold-plated film or a gold-plated alloy film. When a gold-plated film or a gold-plated alloy film is formed by using a potassium gold cyanide solution as a plating solution, there is a case where the defect of the bulging of the plating film occurs. In addition, the swelling of the coating film will cause a decrease in the yield of the product. As the main impurities contained in the potassium gold cyanide solution, transition metals such as Ag, Cu, and Fe are known. Even if these metal impurities are reduced, the defect of the coating film bulging cannot be improved.

又,將氰化金鉀溶解於超純水,並使用ICP分析進行了雜質測定,但未能確認到特別令人在意之雜質。進而進行調查,結果判明:以SiO 2為主之氧化物作為異物懸浮於氰化金鉀溶液中,其被帶入至鍍覆液中而成為鍍膜鼓起之原因。認為該以SiO 2為主之氧化物由於以固形物而非離子之形式存在,故而未能用ICP檢測到。 Further, potassium gold cyanide was dissolved in ultrapure water, and impurities were measured by ICP analysis, but no particularly interesting impurities were confirmed. As a result of further investigation, it was found that oxides mainly composed of SiO 2 were suspended in the potassium gold cyanide solution as foreign substances, and were carried into the plating solution to cause the swelling of the plating film. It is considered that the oxide mainly composed of SiO 2 cannot be detected by ICP because it exists in the form of a solid rather than an ion.

根據上述見解,本發明之實施形態之氰化金鉀結晶之特徵在於:矽含量為10 wtppm以下。藉由將矽含量設為10 wtppm以下,能夠減少上述異物之數,能夠抑制起因於此之鍍膜之鼓起。較佳為5 wtppm以下,更佳為1 wtppm以下。鍍膜之鼓起會使製品良率降低,因此可期待鍍膜鼓起之抑制有助於製品良率之改善。Based on the above findings, the potassium gold cyanide crystal according to the embodiment of the present invention is characterized in that the silicon content is 10 wtppm or less. By setting the silicon content to be 10 wtppm or less, the number of the above-mentioned foreign substances can be reduced, and the swelling of the plating film caused by this can be suppressed. It is preferably 5 wtppm or less, more preferably 1 wtppm or less. The swelling of the coating film will reduce the product yield, so it is expected that the suppression of the coating swelling will contribute to the improvement of the product yield.

氰化鉀通常係使氰化氫與氫氧化鉀反應而製造,係使用石英作為反應容器而製造。認為因此SiO 2由於該石英攪拌時之摩擦而混入。又,判明:SiO 2亦自周圍之環境混入。此前從未將SiO 2作為雜質加以關注,藉由減少氰化金鉀之製造時混入之SiO 2而能夠抑制鍍膜之鼓起極為重要。 Potassium cyanide is usually produced by reacting hydrogen cyanide with potassium hydroxide, and is produced using quartz as a reaction vessel. Therefore, it is considered that SiO 2 was mixed in due to the friction during stirring of the quartz. Further, it was found that SiO 2 was also mixed in from the surrounding environment. SiO 2 has never been paid attention to as an impurity before, and it is extremely important to be able to suppress the swelling of the coating film by reducing the amount of SiO 2 mixed in during the production of potassium gold cyanide.

本實施形態之氰化金鉀溶液較佳為氰化金鉀溶液10 mL中所含之1.0 μm以上之異物之數為100個以下。異物係指由以SiO 2為主之氧化物所構成者,但由其他成分構成者亦會成為鍍膜鼓起之原因,因此關於異物之成分未作特別限定。藉由如上所述將1.0 μm以上之異物之數設為100個以下,能夠有效地抑制鍍膜之鼓起。 In the potassium gold cyanide solution of the present embodiment, it is preferable that the number of foreign objects of 1.0 μm or more contained in 10 mL of the potassium gold cyanide solution is 100 or less. The foreign matter is composed of oxides mainly composed of SiO 2 , but those composed of other components may also cause the coating film to bulge, so the composition of the foreign matter is not particularly limited. By setting the number of foreign objects of 1.0 μm or more to 100 or less as described above, the swelling of the plating film can be effectively suppressed.

氰化金鉀溶液係將氰化金鉀結晶1 g溶解於純水/超純水10 mL而製作者。本實施形態之氰化金鉀更佳為氰化金鉀溶液中所含之1.0 μm以上之異物之數為50個以下。進而較佳為異物之數為30個以下,尤佳為異物之數為10個以下。藉由如上所述減少異物之數,能夠抑制鍍膜之鼓起,能夠防止製品良率之降低。The potassium gold cyanide solution is prepared by dissolving 1 g of potassium gold cyanide crystals in 10 mL of pure water/ultra pure water. In the potassium gold cyanide of the present embodiment, it is more preferable that the number of foreign substances of 1.0 μm or more contained in the potassium gold cyanide solution is 50 or less. Furthermore, it is preferable that the number of foreign objects is 30 or less, and it is especially preferable that the number of foreign objects is 10 or less. By reducing the number of foreign substances as described above, the swelling of the coating film can be suppressed, and the decrease in the product yield can be prevented.

(氰化金鉀之製造方法) 氰化金鉀例如可如下所述地製造。 將市售之氰化鉀結晶溶解於純水中,製作氰化鉀溶液。其次,將氰化鉀溶液利用孔徑0.1 μm~1 μm之過濾器進行過濾。藉由該過濾步驟,能夠某種程度上去除作為雜質而混入之SiO 2等氧化物。 繼而,於過濾後之氰化鉀溶液中,將金作為陽極進行電解而溶解。利用離子交換膜隔開陰極,使用不溶性電極以使金不會電沈積。在金濃度成為一定濃度之時點,自陽極室取出氰化金鉀之溶液,以100℃以上進行加熱而濃縮(使結晶析出)。 (Production method of potassium gold cyanide) Potassium gold cyanide can be produced, for example, as follows. A potassium cyanide solution was prepared by dissolving commercially available potassium cyanide crystals in pure water. Next, the potassium cyanide solution is filtered through a filter with a pore size of 0.1 μm to 1 μm. By this filtering step, oxides such as SiO 2 mixed as impurities can be removed to some extent. Next, in the potassium cyanide solution after filtration, gold was electrolyzed and dissolved as an anode. The cathode is separated by an ion exchange membrane, and an insoluble electrode is used so that gold does not electrodeposit. When the gold concentration becomes a certain concentration, a solution of potassium gold cyanide is taken out from the anode chamber, and heated at 100°C or higher to concentrate (precipitate crystals).

濃縮時,去除初期析出之結晶之1%~10%左右後,利用純水或醇進行洗浄,製成氰化金鉀結晶。初期析出之結晶中,存在以主要為SiO 2之氧化物等為核而生長之結晶,因此將其去除。其後,將上述中所獲得之氰化金鉀結晶溶解於溫度50~90℃之純水/超純水中,利用活性碳過濾器等進行過濾後,冷卻至10℃以下而使其再結晶化,藉此可進一步去除雜質(再結晶化處理)。 During concentration, about 1% to 10% of the crystals precipitated at the initial stage are removed, and then washed with pure water or alcohol to obtain potassium gold cyanide crystals. Among the crystals precipitated at the initial stage, there are crystals grown with oxides mainly composed of SiO 2 as nuclei, so these are removed. Then, the potassium gold cyanide crystals obtained above are dissolved in pure water/ultrapure water at a temperature of 50 to 90°C, filtered through an activated carbon filter, etc., and then cooled to 10°C or less to recrystallize. crystallization, whereby impurities can be further removed (recrystallization treatment).

以下揭示各種評價所使用之測定裝置或測定條件等。 (矽含量之測定) 於鐵氟龍燒杯內使用酸使氰化金鉀結晶分解(SiO 2等溶解),向藉由酸進行了分解之氰化金溶液中添加混合標準液,利用基質匹配法,使用ICP(高頻電感耦合電漿)分析裝置進行矽含量之測定。 The measurement apparatus, measurement conditions, etc. used for various evaluations are disclosed below. (Measurement of silicon content) Use acid to decompose potassium gold cyanide crystals in a Teflon beaker (dissolve SiO 2 , etc.), add mixed standard solution to the decomposed gold cyanide solution by acid, and use matrix matching method. , the use of ICP (high frequency inductively coupled plasma) analyzer for the determination of silicon content.

(異物之測定) 將氰化金鉀結晶1 g溶解於超純水10 mL中,製作氰化金鉀溶液,對該溶液使用粒子計數器(Rion製造 KS-28、光散射法),分析氰化金鉀溶液中之1.0 μm以上之異物之數。 (Determination of foreign bodies) Dissolve 1 g of potassium gold cyanide crystals in 10 mL of ultrapure water to prepare a potassium gold cyanide solution, and use a particle counter (KS-28 manufactured by Rion, light scattering method) to analyze the potassium gold cyanide solution for the solution. The number of foreign objects larger than 1.0 μm.

(電解鍍金之條件) 金離子供給源:氰化金鉀 12 g/L 游離氰化物離子源:氰化鉀 20 g/L 導電性提高:碳酸鉀 20 L pH緩衝劑:磷酸氫硼酸鹽 20/L pH:12 浴溫:70℃ 電流密度:1 A/dm 2膜厚:5 μm (Conditions for electrolytic gold plating) Gold ion supply source: Potassium gold cyanide 12 g/L Free cyanide ion source: Potassium cyanide 20 g/L Conductivity improvement: Potassium carbonate 20 L pH buffer: hydrogen phosphate borate 20/ L pH: 12 Bath temperature: 70°C Current density: 1 A/dm 2 Film thickness: 5 μm

(無電解鍍金之條件) 金離子供給源:氰化金鉀 3 g/L 檸檬酸銨 90 g/L 鹽酸肼 19 g/L pH:7.5 浴溫:95℃ (Conditions for electroless gold plating) Gold ion supply source: potassium gold cyanide 3 g/L Ammonium citrate 90 g/L Hydrazine hydrochloride 19 g/L pH: 7.5 Bath temperature: 95℃

(鍍膜鼓起之評價) 對鍍膜利用SEM(掃描式電子顯微鏡:JEOL製造之JSM-7000F)進行觀察,將鍍膜上產生之凹凸之中,凸部之尺寸具有5 μm以上之寬度者定義為「鼓起」。 實施例 (evaluation of coating bulge) The coating film was observed with a SEM (Scanning Electron Microscope: JSM-7000F manufactured by JEOL), and among the unevenness generated on the coating film, the size of the convex portion with a width of 5 μm or more was defined as “swelling”. Example

接下來,對本發明之實施例等進行說明。再者,以下之實施例僅表示代表性之例,本發明無需受該等實施例限制,應在說明書記載之技術思想之範圍內進行解釋。Next, embodiments and the like of the present invention will be described. Furthermore, the following examples are only representative examples, and the present invention is not limited by these examples, and should be interpreted within the scope of the technical idea described in the specification.

(實施例1) 將市售之氰化鉀結晶400 g溶解於1 L之純水溶液。其次,將所獲得之氰化鉀液利用0.1 μ之過濾器進行過濾後,將濾液用作陽極電解液用之溶液,使用金作為陽極進行電解。在金濃度成為10 g/L之時點取出液體,其後,在100℃以上進行加熱而濃縮。此時,去除初期析出之結晶10%後,將析出之氰化金鉀利用醇洗淨而製成氰化金鉀結晶。進而,其後,進行再結晶化處理,對氰化金鉀結晶進行精製。 (Example 1) Dissolve 400 g of commercially available potassium cyanide crystals in 1 L of pure aqueous solution. Next, after filtering the obtained potassium cyanide solution with a 0.1 μ filter, the filtrate was used as a solution for an anolyte, and electrolysis was performed using gold as an anode. When the gold concentration became 10 g/L, the liquid was taken out, and thereafter, the liquid was heated at 100° C. or higher and concentrated. At this time, after removing 10% of the crystals precipitated at the initial stage, the precipitated potassium gold cyanide was washed with alcohol to obtain potassium gold cyanide crystals. Furthermore, after that, a recrystallization treatment was performed to refine the potassium gold cyanide crystals.

對如此獲得之氰化金鉀結晶分析矽之含量,結果未達1 wtppm。又,將氰化金鉀結晶溶解於超純水,製作氰化金鉀溶液,對該溶液使用粒子計數器分析1.0 μm以上之異物之數。其結果,1.0 μm以上之異物之個數為1~3個/10 mL。又,使用實施例1之氰化金鉀溶液進行電解鍍覆/無電解鍍覆,形成鍍金皮膜,對獲得之鍍金膜之表面進行觀察,結果,鼓起之數為0個。將以上之結果示於表1。The silicon content of the potassium gold cyanide crystal thus obtained was analyzed and found to be less than 1 wtppm. In addition, potassium gold cyanide crystals were dissolved in ultrapure water to prepare a potassium gold cyanide solution, and the solution was analyzed for the number of foreign matters of 1.0 μm or more using a particle counter. As a result, the number of foreign objects of 1.0 μm or more was 1 to 3 per 10 mL. Furthermore, electrolytic plating/electroless plating was performed using the potassium gold cyanide solution of Example 1 to form a gold-plated film, and the surface of the obtained gold-plated film was observed. As a result, the number of bulges was 0. The above results are shown in Table 1.

[表1]    製造條件 氰化金鉀溶液 鍍金膜 Si含量(wtppm) 1.0μm以上之異物之個數(每10 mL) 鍍覆之種類 鼓起之個數(換算成每cm 2 實施例1 將氰化鉀溶液利用0.1 μm濾紙進行過濾+去除氰化金鉀結晶化時初期10%+再結晶化 <1 3 電解鍍覆 0 <1 1 無電解鍍覆 0 實施例2 去除氰化金鉀結晶化時初期5%+再結晶化 1 10 電解鍍覆 2 1 8 無電解鍍覆 1 實施例3 將氰化鉀溶液利用0.1 μm濾紙進行過濾+去除氰化金鉀結晶化時初期1% 3 28 電解鍍覆 4 5 26 無電解鍍覆 3 實施例4 去除氰化金鉀結晶化時初期10% 10 100 電解鍍覆 10 9 96 無電解鍍覆 9 比較例1 將氰化鉀溶液利用1 μm濾紙進行過濾 21 498 電解鍍覆 26 18 458 無電解鍍覆 24 比較例2 直接使用市售之氰化鉀 52 746 電解鍍覆 52 47 718 無電解鍍覆 48 [Table 1] Manufacturing conditions Potassium gold cyanide solution Gold-plated film Si content (wtppm) The number of foreign objects over 1.0μm (per 10 mL) Types of Plating Number of bulges (converted to per cm 2 ) Example 1 Filter the potassium cyanide solution with 0.1 μm filter paper + remove the initial 10% of potassium gold cyanide during crystallization + recrystallization <1 3 Electrolytic Plating 0 <1 1 Electroless Plating 0 Example 2 Removal of potassium gold cyanide 5% at the initial stage of crystallization + recrystallization 1 10 Electrolytic Plating 2 1 8 Electroless Plating 1 Example 3 Filter the potassium cyanide solution with 0.1 μm filter paper + remove the initial 1% of potassium gold cyanide during crystallization 3 28 Electrolytic Plating 4 5 26 Electroless Plating 3 Example 4 Remove the initial 10% of potassium gold cyanide during crystallization 10 100 Electrolytic Plating 10 9 96 Electroless Plating 9 Comparative Example 1 The potassium cyanide solution was filtered through 1 μm filter paper twenty one 498 Electrolytic Plating 26 18 458 Electroless Plating twenty four Comparative Example 2 Direct use of commercially available potassium cyanide 52 746 Electrolytic Plating 52 47 718 Electroless Plating 48

(實施例2) 於實施例2中,未利用0.1μ之過濾器進行過濾、且去除了初期析出之結晶5%,除此以外,藉由與實施例1相同之方法,製造氰化金鉀結晶。對氰化金鉀中之矽之含量進行分析,結果為1 wtppm。又,對氰化金鉀溶液10 mL中所含之1.0 μm以上之異物之數進行分析,結果異物之個數為8~10個。又,使用實施例2之氰化金鉀溶液實施電解鍍覆/無電解鍍覆,形成鍍金皮膜,對獲得之鍍金膜之表面進行觀察,結果鼓起之數為2個或1個。 (Example 2) A potassium gold cyanide crystal was produced by the same method as in Example 1, except that in Example 2, the filtration was not performed with a 0.1 μ filter and 5% of the crystals precipitated at the initial stage were removed. The content of silicon in potassium gold cyanide was analyzed and found to be 1 wtppm. In addition, the number of foreign objects with a size of 1.0 μm or more contained in 10 mL of the potassium gold cyanide solution was analyzed, and the results showed that the number of foreign objects was 8 to 10. Furthermore, electrolytic plating/electroless plating was performed using the potassium gold cyanide solution of Example 2 to form a gold-plated film, and the surface of the obtained gold-plated film was observed, and as a result, the number of bulges was 2 or 1.

(實施例3) 於實施例3中,去除了初期析出之結晶1%、且未實施再結晶化,除此以外,藉由與實施例1相同之方法,製造氰化金鉀結晶。對氰化金鉀中之矽之含量進行分析,結果為3~5 wtppm。又,對氰化金鉀溶液10 mL中所含之1.0 μm以上之異物之數進行分析,結果異物之個數為26~28個。又,使用實施例3之氰化金鉀溶液實施電解鍍覆/無電解鍍覆,形成鍍金皮膜,對獲得之鍍金膜之表面進行觀察,結果鼓起之數為4個或3個。 (Example 3) In Example 3, except that 1% of the crystals precipitated at the initial stage were removed and recrystallization was not carried out, gold potassium cyanide crystals were produced by the same method as in Example 1. The content of silicon in potassium gold cyanide was analyzed, and the result was 3-5 wtppm. In addition, the number of foreign objects of 1.0 μm or more contained in 10 mL of the potassium gold cyanide solution was analyzed, and the results showed that the number of foreign objects was 26 to 28. Furthermore, electrolytic plating/electroless plating was performed using the potassium gold cyanide solution of Example 3 to form a gold-plated film, and the surface of the obtained gold-plated film was observed, and the number of bulges was 4 or 3.

(實施例4) 於實施例4中,未利用0.1 μ之過濾器進行過濾,且未實施再結晶化,除此以外,藉由與實施例1相同之方法,製造氰化金鉀結晶。對氰化金鉀中之矽之含量進行分析,結果為9~10 wtppm。又,對氰化金鉀溶液10 mL中所含之1.0 μm以上之異物之數進行分析,結果異物之個數為96~100個。又,使用實施例4之氰化金鉀溶液實施電解鍍覆/無電解鍍覆,形成鍍金皮膜,對獲得之鍍金膜之表面進行觀察,結果鼓起之數為10個或9個。 (Example 4) In Example 4, except that filtration with a 0.1 μ filter was not carried out, and recrystallization was not carried out, a potassium gold cyanide crystal was produced by the same method as in Example 1. The content of silicon in potassium gold cyanide was analyzed, and the result was 9-10 wtppm. In addition, the number of foreign objects of 1.0 μm or more contained in 10 mL of the potassium gold cyanide solution was analyzed, and the results showed that the number of foreign objects was 96 to 100. Furthermore, electrolytic plating/electroless plating was performed using the potassium gold cyanide solution of Example 4 to form a gold-plated film, and the surface of the obtained gold-plated film was observed, and the number of bulges was 10 or 9.

(比較例1) 將市售之氰化鉀結晶400 g溶解於1 L之純水溶液。將獲得之溶液利用1 μ之過濾器進行過濾,製造氰化金鉀溶液。於獲得之氰化金鉀溶液中,1.0 μm以上之異物之個數為458~498個/10 mL。又,氰化金鉀結晶中之矽含量為18~21 wtppm。其次,使用比較例1之氰化金鉀溶液,實施電解鍍覆/無電解鍍覆,形成鍍金皮膜。對獲得之鍍金膜之表面進行觀察,結果鼓起之數為26個或24個。 (Comparative Example 1) Dissolve 400 g of commercially available potassium cyanide crystals in 1 L of pure aqueous solution. The obtained solution was filtered with a 1 μ filter to prepare a potassium gold cyanide solution. In the obtained potassium gold cyanide solution, the number of foreign objects larger than 1.0 μm is 458 to 498 per 10 mL. In addition, the silicon content in the potassium gold cyanide crystal is 18 to 21 wtppm. Next, using the potassium gold cyanide solution of Comparative Example 1, electrolytic plating/electroless plating was performed to form a gold plating film. When the surface of the obtained gold-plated film was observed, the number of bulges was 26 or 24.

(比較例2) 將市售之氰化鉀結晶400 g溶解於1 L之純水溶液中,製造氰化金鉀溶液。於如此製造之氰化金鉀溶液中,1.0 μm以上之異物之個數為718~746個/10 mL。又,氰化金鉀溶液中之矽含量為47~52 wtppm。其次,使用比較例2之氰化金鉀溶液實施電解鍍覆/無電解鍍覆,形成鍍金皮膜。對獲得之鍍金膜之表面進行觀察,結果鼓起之數為52個或48個。 [產業上之可利用性] (Comparative Example 2) 400 g of commercially available potassium cyanide crystals were dissolved in 1 L of pure aqueous solution to prepare a potassium gold cyanide solution. In the potassium gold cyanide solution produced in this way, the number of foreign objects with a thickness of 1.0 μm or more was 718 to 746 per 10 mL. In addition, the silicon content in the potassium gold cyanide solution is 47-52 wtppm. Next, electrolytic plating/electroless plating was performed using the potassium gold cyanide solution of Comparative Example 2 to form a gold plating film. When the surface of the obtained gold-plated film was observed, the number of bulges was 52 or 48. [Industrial Availability]

本發明具有使用氰化金鉀溶液製作之鍍金膜或鍍金合金膜中,鍍膜鼓起之缺陷較少之優異效果。含有本發明之氰化金鉀之鍍覆液作為電子學領域中之各種電性接點、端子、連接器插針、引線框架、IC、各種電氣電路零件等中之鍍覆液有用。The present invention has the excellent effect that the gold-plated film or the gold-plated alloy film produced by using the potassium gold cyanide solution has fewer defects of the coating film bulging. The plating solution containing the potassium gold cyanide of the present invention is useful as a plating solution for various electrical contacts, terminals, connector pins, lead frames, ICs, various electrical circuit parts, etc. in the field of electronics.

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Claims (2)

一種氰化金鉀(gold potassium cyanide)結晶,其矽含量為10 wtppm以下。A crystal of gold potassium cyanide with a silicon content of less than 10 wtppm. 一種氰化金鉀溶液,其氰化金鉀溶液10 mL中所含之1.0 μm以上之異物之數為100個以下。A potassium gold cyanide solution, the number of foreign objects above 1.0 μm contained in 10 mL of the potassium gold cyanide solution is less than 100.
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