TW202204861A - Temperature calibration method of infrared thermal image camera and calibration method of temperature sensing system of infrared thermal image camera - Google Patents

Abstract

A temperature calibration method of infrared thermal image camera and calibration method of temperature sensing system of infrared thermal image camera is provided. The temperature calibration method of infrared thermal image camera includes providing a temperature sensing system to measure an object to obtain an uncorrected temperature, and calibrating the uncorrected temperature to a corrected temperature based on the uncorrected temperature and a temperature calibration function. The temperature calibration function is obtained by a regression analysis.

Description

Temperature correction method of infrared thermal imager and correction method of temperature sensing system of infrared thermal imager

The invention relates to a temperature calibration method and a calibration method of a temperature sensing system, in particular to a temperature calibration method of an infrared thermal imager and a calibration method of a temperature sensing system of an infrared thermal imager.

First, the non-contact infrared temperature sensing system generally has a filter, which is mainly used to block visible light, so as to prevent the visible light from interfering with the measured value of the infrared temperature sensing system. However, the setting of the filter will still affect the infrared temperature sensing system to measure the temperature value of the object to be detected, so that the measured temperature is not completely accurate.

Therefore, how to improve the accuracy of the temperature sensing system to overcome the above-mentioned defects has become one of the important issues to be solved by this technology.

The technical problem to be solved by the present invention is to provide a temperature calibration method of an infrared thermal imager and a calibration method of a temperature sensing system of an infrared thermal imager in view of the deficiencies of the prior art.

In order to solve the above-mentioned technical problems, one of the technical solutions adopted by the present invention is to provide a temperature calibration method for an infrared thermal imager, which includes: providing a temperature sensing system to measure an object to be measured to obtain an uncorrected temperature ; and calibrating the uncorrected temperature to a corrected temperature according to the uncorrected temperature and a temperature correction function. Wherein, the temperature correction function is obtained by a regression analysis.

In order to solve the above-mentioned technical problem, another technical solution adopted by the present invention is to provide a temperature correction method for an infrared thermal imager, which includes: providing a temperature sensing system to measure an object to be measured, so as to obtain n uncorrected temperature, wherein the temperature sensing system includes n infrared temperature sensors, the n infrared temperature sensors are arranged in an array in the form of R×L, and the n infrared temperature sensors are sequentially composed of a The first infrared temperature sensor is arranged to the nth infrared temperature sensor, R is a positive integer greater than or equal to 2, L is a positive integer greater than or equal to 2, n is the number of R multiplied by L, wherein, n all The infrared temperature sensor measures the object to be measured respectively to obtain the n uncorrected temperatures; and according to the n uncorrected temperatures and the n temperature correction functions, the n uncorrected temperatures are respectively Calibrating to a calibrated temperature to obtain n calibrated temperatures, wherein each uncalibrated temperature corresponds to the corresponding temperature calibration function, and the first infrared temperature sensor reaches the The nth infrared temperature sensor measures the object to be measured respectively to obtain a corresponding first uncorrected temperature to an nth uncorrected temperature; wherein, the n temperature correction functions are respectively determined by a regression analysis get.

In order to solve the above technical problem, another technical solution adopted by the present invention is to provide a calibration method for a temperature sensing system of an infrared thermal imager, which includes: providing a black body with a preset temperature; obtaining the temperature a correction coefficient and a system temperature coefficient of the sensing system; a plurality of radiation black bodies are provided, and a plurality of the radiation black bodies respectively have a predetermined temperature different from each other; the temperature sensing system is used to measure a plurality of the radiation black bodies Radiating a black body to obtain a plurality of measurement temperatures; performing a regression analysis on a plurality of the measurement temperatures and a plurality of the predetermined temperatures to obtain an initial temperature correction function; and using the initial temperature correction function to obtain a temperature Correction function. Wherein, in the step of obtaining the correction coefficient and the system temperature coefficient, an initial temperature measurement formula is used to obtain the correction coefficient and the system temperature coefficient, and the initial temperature measurement formula includes the following relationship: S=G1×(1+tCo1×(T _amb −T _de ))×((T _objNA ) ⁴ −(T _amb ) ⁴ ). Wherein, S is an initial digital signal obtained by the temperature sensing system measuring a black body, G1 is the correction coefficient, _tCo1 is the temperature coefficient of the system, Tamb is the ambient temperature, and the The unit is Kjeldahl, T _de is the temperature of 298.15 K, T _objNA is the preset temperature of the black body, and the unit of the preset temperature is Kjeldahl. Wherein, the preset temperature of the black body is known.

One of the beneficial effects of the present invention is that the temperature correction method for an infrared thermal imager provided by the present invention can calibrate the uncorrected temperature to a corrected temperature by "according to the uncorrected temperature and a temperature correction function. temperature” technical solution to improve the accuracy of the temperature sensing system of the infrared thermal imaging camera. In addition, the calibration method of the temperature sensing system of the infrared thermal imager provided by the present invention can obtain an initial temperature calibration by performing a regression analysis on a plurality of the measured temperatures and a plurality of the predetermined temperatures function” and the technical solutions of “using the initial temperature correction function to obtain a temperature correction function”, so that the temperature sensing system of the infrared thermal imager can improve the accuracy of the temperature sensing system of the infrared thermal imager through the temperature correction function sex.

For a further understanding of the features and technical content of the present invention, please refer to the following detailed descriptions and drawings of the present invention. However, the drawings provided are only for reference and description, and are not intended to limit the present invention.

The following are specific specific examples to illustrate the embodiments of the present disclosure related to the “temperature calibration method of an infrared thermal imager and a calibration method of a temperature sensing system of an infrared thermal imager”. Those skilled in the art can learn from this specification The disclosure provides an understanding of the advantages and effects of the present invention. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are merely schematic illustrations, and are not drawn according to the actual size, and are stated in advance. The following embodiments will further describe the related technical contents of the present invention in detail, but the disclosed contents are not intended to limit the protection scope of the present invention. Additionally, it should be understood that, although the terms "first," "second," "third," etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are primarily used to distinguish one element from another. In addition, the term "or", as used herein, should include any one or a combination of more of the associated listed items, as the case may be. In addition, the term "or", as used herein, should include any one or a combination of more of the associated listed items, as the case may be.

[First Embodiment]

Please refer to FIG. 1 and FIG. 2. FIG. 1 is a functional block diagram of the temperature sensing system of the infrared thermal imager of the present invention, and FIG. 2 is the temperature sensing of the infrared thermal imager of the present invention. A schematic top view of the infrared temperature sensing device of the system. The present invention provides a method for calibrating temperature of an infrared thermal imager and a method for calibrating a temperature sensing system S of an infrared thermal imager. It is applied to an infrared thermal image camera (Infrared Thermal Image Camera), but the present invention is not limited to this. In addition, it should be noted that the first embodiment will first describe the temperature calibration method of the infrared thermal imager, and then the second embodiment will describe the calibration method of the temperature sensing system of the infrared thermal imager. Further, after the temperature sensing system S of the infrared thermal imager passes the steps of the calibration method of the temperature sensing system S of the infrared thermal imager provided by the second embodiment of the present invention, the temperature sensing of the infrared thermal imager The system S can utilize the temperature calibration method of the infrared thermal imager provided in the first embodiment, so that the temperature sensing system S of the infrared thermal imager can accurately obtain the temperature of an object to be measured (not shown in the figure).

As mentioned above, the temperature sensing system S of the infrared thermal imager includes an infrared temperature sensing device 1 , a temperature measuring device 2 and a control device 3 . The infrared temperature sensing device 1 and the temperature measuring device 2 can be electrically connected to the control device 3 to use the control device 3 to calculate the temperature measured by the infrared temperature sensing device 1 and the temperature measuring device 2 . In addition, the infrared temperature sensing device 1 may include a plurality of infrared temperature sensors 10 , and the plurality of infrared temperature sensors 10 are disposed on a substrate 100 . In addition, it should be noted that, for the convenience of description, the infrared temperature sensing device 1 provided by the present invention takes a 4×4 array of infrared temperature sensors 10 as an example for illustration. However, in other embodiments, the infrared temperature sensor 10 The temperature sensing device 1 is an infrared temperature sensor 10 arranged in an array of 32×32 or 320×240, that is, the infrared temperature sensing device 1 can be arranged in an array of R×L, where R and L are greater than An integer equal to 2. However, it should be noted that the present invention is not limited by the number or arrangement of the infrared temperature sensors 10 . In addition, for example, the infrared temperature sensor 10 can be a Microbolometer or an Infrared Thermometer, and the temperature measuring device 2 can be a Thermocouple sensor or a A thermistor temperature sensor, but the present invention is not limited to this. According to the present invention, the temperature measuring device 2 can be used to measure the ambient temperature, and the infrared temperature sensing device 1 can be used to measure the temperature of an object to be measured. In addition, for example, the control device 3 can be a microcontroller (Microcontroller Unit, MCU) to process the information measured by the infrared temperature sensor 10 and the temperature measurement device 2, but the present invention does not take this as an example. limit.

Next, please refer to FIG. 3 , which is a flowchart of a temperature calibration method for an infrared thermal imager according to a first embodiment of the present invention. In detail, the method for calibrating the temperature of an infrared thermal imager includes the following steps: as shown in step S102 : providing a temperature sensing system S to measure an object to be measured to obtain an uncorrected temperature. For example, one of the infrared temperature sensors 10 in the infrared temperature sensing device 1 of the temperature sensing system S of the infrared thermal imaging camera can be used to measure an object to be measured to obtain an uncorrected temperature. In addition, it should be noted that the method of obtaining an uncorrected temperature in the present invention is that one of the infrared temperature sensors 10 measures an object to be measured as an example, and the other infrared temperature sensors 10 obtain an uncorrected temperature The method is similar to this, and will not be repeated here.

Next, as shown in step S104: the uncorrected temperature is calibrated to a corrected temperature. For example, the uncalibrated temperature can be calibrated to a calibrated temperature according to the uncalibrated temperature and a temperature calibration function, and the temperature calibration function can be obtained by a regression analysis. For example, the temperature correction function can be obtained by a nonlinear regression analysis, such as a polynomial regression analysis, but the invention is not limited thereto. Further, according to the present invention, the temperature correction function may include the following relation: T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ + C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ ). T1 _obj is the corrected temperature of the object to be measured obtained by one of the infrared temperature sensors 10 (or the first infrared temperature sensor 10a ) measuring the object to be measured, and the unit of the corrected temperature T1 _obj is Celsius (°C), T1 _objN is the uncorrected temperature of the object to be measured obtained after one of the infrared temperature sensors 10 (or can be called the first infrared temperature sensor 10a) to measure the object to be measured, in the temperature correction function The unit of uncorrected temperature T1 _objN is Celsius, C1 ₀ is a first temperature correction regression coefficient, C1 ₁ is a second temperature correction regression coefficient, C1 ₂ is a third temperature correction regression coefficient, C1 ₃ is a fourth temperature correction regression coefficient The temperature correction regression coefficient, C1 ₄ is a fifth temperature correction regression coefficient, and C1 ₅ is a sixth temperature correction regression coefficient. That is to say, the uncorrected temperature of the object to be measured obtained in the aforementioned step S102 can be brought into the above temperature correction function to obtain the corrected temperature of the object to be measured. That is, the value measured by each infrared temperature sensor 10 can be corrected by using the above-mentioned temperature correction function.

Based on the above, it should be noted that since each infrared temperature sensor 10 may still have differences in the manufacturing process or other parameters, other infrared temperature sensors 10 may also have corresponding temperature correction functions respectively. , and other multiple infrared temperature sensors 10 (or can be called the second infrared temperature sensor 10b, the third infrared temperature sensor or the nth infrared temperature sensor, n is a positive integer greater than 1) In the temperature correction function, the first temperature correction regression coefficient Cn ₁ , the second temperature correction regression coefficient Cn ₂ , the third temperature correction regression coefficient Cn ₃ , the fourth temperature correction regression coefficient Cn ₄ , the fifth temperature correction regression coefficient Cn ₅ and The sixth temperature correction regression coefficient Cn ₆ may still be the same as the first temperature correction regression coefficient C1 1 , the second temperature correction regression coefficient C1 2 , the third temperature correction regression coefficient C1 3 , the first temperature correction regression coefficient C1 ₁ , the second temperature correction regression coefficient C1 ₂ , the third temperature correction regression coefficient C1 ₃ , The fourth temperature correction regression coefficient C1 ₄ , the fifth temperature correction regression coefficient C1 ₅ , and the sixth temperature correction regression coefficient C1 ₆ are different. In addition, the above-mentioned first temperature correction regression coefficients (C1 ₁ to Cn ₁ ), second temperature correction regression coefficients (C1 ₂ to Cn ₂ ), third temperature correction regression coefficients (C1 ₃ to Cn ₃ ), and fourth temperature correction regression coefficients The values of the coefficients (C1 ₄ to Cn ₄ ), the fifth temperature correction regression coefficients (C1 ₅ to Cn ₅ ), and the sixth temperature correction regression coefficients (C1 ₆ to Cn ₆ ) can be stored in the temperature sensing system S, such as Stored in a correction coefficient table, and the correction coefficient table may be a lookup table. The control device 3 can obtain the corresponding numerical value by using the correction coefficient table. In addition, the method for generating the above correction regression coefficient will be described in the following embodiments. In addition, it should be noted that, although the above-mentioned embodiment analyzes with a quintic equation, in other embodiments, a quartic equation, a hexadecimal equation, or a septutic equation may be used. In other words, in other embodiments, the temperature correction function of the nth infrared temperature sensor 10 may also be a K-th equation, which includes the following relationship, for example: Tn _obj =(Cn ₀ +Cn ₁ ×Tn _objN +Cn ₂ ×(Tn _objN ) ² +Cn ₃ ×(Tn _objN ) ³ +Cn ₄ ×(Tn _objN ) ⁴ +…+Cn _K ×(Tn _objN ) ^K ).

Next, please refer to FIG. 4 , which is a flowchart of step S102 of the temperature calibration method according to the first embodiment of the present invention. The step of measuring the object to be measured to obtain the uncorrected temperature in step S102 includes the following steps: as shown in step S1022 : using the temperature sensing system S to measure a radiation energy of the object to be measured to generate a digital signal. For example, the digital signal can be a digital signal generated by one of the infrared temperature sensors 10 of the infrared temperature sensing device 1 measuring the radiation energy of the object to be measured. In addition, the digital signal can be generated by measuring the radiation energy of the object to be measured by one of the infrared temperature sensors 10, and converting it into a voltage signal. A converter (Analog-to-Digital Converter) converts it into a digital signal.

Next, as shown in step S1024, the uncorrected temperature of the object to be measured is calculated according to the digital signal S1 and a temperature measurement formula. For example, the control device 3 can receive the digital signal measured by the infrared temperature sensor 10, and use the temperature measurement formula to calculate the uncorrected temperature of the object to be measured. Further, according to the present invention, the temperature measurement formula includes the following relationship: S1=G1×(1+tCo1×(T _amb −T _de ))×((T1 _objN ) ⁴ −(T _amb ) ⁴ ) . S1 is a digital signal, G1 is a correction coefficient, _tCo1 is a system temperature coefficient, Tamb is an ambient temperature, the unit of ambient temperature is Kelvin (Kelvin, K), T1 _objN is the uncorrected temperature of the object to be measured , the unit of uncorrected temperature T1 _objN in the temperature measurement formula is Kjeldahl, and T _de is the temperature of 298.15K. In addition, it should be noted that the ambient temperature _Tamb can be measured by the temperature measuring device 2 , and the digital signal S1 can be measured by one of the infrared temperature sensors 10 of the infrared temperature sensing device 1 . In addition, T _de is a temperature of 298.15K which means that T _de is a temperature of 25°C. Therefore, in step S1024, the uncorrected temperature of the object to be measured can be calculated by using the digital signal S1 and a temperature measurement formula, and then, the uncorrected temperature of the object to be measured can be calculated by using the temperature correction function in step S104. Enter the above temperature correction function to obtain the corrected temperature of the object to be measured. It should be noted that the above temperature measurement formula can be obtained by Stefan-Boltzmann law.

Based on the above, it should be noted that since each infrared temperature sensor 10 may still have differences in the manufacturing process or other parameters, other infrared temperature sensors 10 may also have corresponding temperature measurements respectively. formula, and other multiple infrared temperature sensors 10 (or can be called the second infrared temperature sensor 10b, the third infrared temperature sensor or the nth infrared temperature sensor, n is a positive integer greater than 1) The correction coefficient Gn and the system temperature coefficient tCon in the temperature measurement formula may still be different from the correction coefficient G1 and the system temperature coefficient tCo1 of one of the infrared temperature sensors 10 described above. In addition, the values of the above-mentioned correction coefficients (G1 to Gn) and system temperature coefficients (tCo1 to tCon) can be stored in the temperature sensing system S of the infrared thermal imaging camera, for example, can be stored in a correction coefficient table, and the correction coefficient table Can be a lookup table. The control device 3 can obtain the corresponding numerical value by using the correction coefficient table. In addition, the method for generating the correction coefficient and the system temperature coefficient will be described in the following embodiments.

Next, please refer to FIG. 1 and FIG. 2 again, and also refer to FIG. 5 . FIG. 5 is another flowchart of the temperature calibration method of the infrared thermal imager according to the first embodiment of the present invention. It should be noted that, since the temperature sensing system S provided by the present invention is applied to an infrared thermal imager, the infrared temperature sensing device 1 of the temperature sensing system S will have a plurality of infrared rays arranged in an array temperature sensor 10 . However, each infrared temperature sensor 10 may still have differences in manufacturing process or other parameters. Therefore, other infrared temperature sensors 10 may also have corresponding temperature correction functions respectively. The following will further illustrate the temperature calibration methods of the plurality of infrared temperature sensors 10 .

Based on the above, the temperature calibration method includes the following steps: as shown in step S202 : providing a temperature sensing system S to measure an object to be measured to obtain n uncalibrated temperatures. For example, the object to be measured can be measured by using the first infrared temperature sensor 10a in at least one first group 10A and/or the first infrared temperature sensor 10b in at least one second group 10B, so as to Obtain n (or can be said to be multiple) uncorrected temperatures. In addition, the temperature sensing system S includes n infrared temperature sensors 10 , the n infrared temperature sensors 10 are arranged in an array in the form of R×L, and the n infrared temperature sensors 10 are sequentially composed of a first infrared temperature sensor 10 . The sensors 10 are arranged to an nth infrared temperature sensor 10, R is a positive integer greater than or equal to 2, L is a positive integer greater than or equal to 2, n is the number of R times L, wherein, n infrared temperature sensors The measuring device 10 respectively measures the object to be measured to obtain n uncorrected temperatures.

Next, as shown in step S204: according to the n uncorrected temperatures and the n temperature correction functions, the n uncorrected temperatures are respectively calibrated to a corrected temperature to obtain n corrected temperatures and n temperature correction functions were obtained by a regression analysis. Further, each uncorrected temperature corresponds to a corresponding temperature correction function, and the first infrared temperature sensor to the n-th infrared temperature sensor 10 measure the object to be measured respectively to obtain a corresponding first infrared temperature sensor from the uncorrected temperature to an nth uncorrected temperature.

Based on the above, according to the present invention, a first temperature correction function among the n temperature correction functions includes the following relationship: T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ ). T1 _obj is a first calibrated temperature obtained by the first infrared temperature sensor 10 after measuring the object to be measured, the unit of the first calibrated temperature is Celsius, and T1 _objN is the first infrared temperature sensor 10 to measure the temperature to be measured The first uncorrected temperature obtained after measuring the object, the unit of the first uncorrected temperature of the first temperature correction function is Celsius, C1 ₀ is a first temperature correction regression coefficient of the first temperature correction function, and C1 ₁ is the first temperature A second temperature correction regression coefficient of the correction function, C1 ₂ is a third temperature correction regression coefficient of the first temperature correction function, C1 ₃ is a fourth temperature correction regression coefficient of the first temperature correction function, C1 ₄ is the first temperature correction regression coefficient A fifth temperature correction regression coefficient of the temperature correction function, C1 ₅ is a sixth temperature correction regression coefficient of the first temperature correction function. That is to say, the first uncorrected temperature of the object to be measured obtained in the aforementioned step S202 can be brought into the above-mentioned first temperature correction function to obtain the first corrected temperature of the object to be measured. That is, the value of the first uncorrected temperature measured by the first infrared temperature sensor 10 can be corrected by using the above-mentioned first temperature correction function.

Based on the above, further, a jth temperature correction function in the n temperature correction functions includes the following relational expression, wherein, j is a positive integer greater than 1 and less than or equal to n, and the jth temperature correction function includes the following relational expression: Tj _obj =(Cj ₀ +Cj ₁ ×Tj _objN +Cj ₂ ×(Tj _objN ) ² +Cj ₃ ×(Tj _objN ) ³ +Cj ₄ ×(Tj _objN ) ⁴ +Cj ₅ ×(Tj _objN ) ⁵ ). Tj _obj is a j-th corrected temperature obtained after the j-th infrared temperature sensor 10 measures the object to be measured, the unit of the j-th corrected temperature is Celsius, and Tj _objN is the j-th infrared temperature sensor 10 to measure the temperature to be measured. The jth uncorrected temperature obtained after measuring the object, the unit of the jth uncorrected temperature of the jth temperature correction function is Celsius, Cj ₀ is a first temperature correction regression coefficient of the jth temperature correction function, and Cj ₁ is the jth A second temperature correction regression coefficient of the temperature correction function, Cj2 is a _third temperature correction regression coefficient of the jth temperature correction function, _Cj3 is a fourth temperature correction regression coefficient of the jth temperature correction function, _Cj4 is the th A fifth temperature correction regression coefficient of the j temperature correction function, Cj ₅ is a sixth temperature correction regression coefficient of the jth temperature correction function. That is, the jth uncorrected temperature of the object to be measured obtained in the aforementioned step S202 can be brought into the above jth temperature correction function to obtain the jth corrected temperature of the object to be measured. That is, the value of the jth uncorrected temperature measured by the jth infrared temperature sensor 10 can be corrected by using the jth temperature correction function.

Based on the above, further, the nth temperature correction function includes the following relationship: Tn _obj =(Cn ₀ +Cn ₁ ×Tn _objN +Cn ₂ ×(Tn _objN ) ² +Cn ₃ ×(Tn _objN ) ³ +Cn ₄ ×(Tn _objN ) ⁴ +Cn ₅ ×(Tn _objN ) ⁵ ). Tn _obj is an n-th corrected temperature obtained after the n-th infrared temperature sensor 10 measures the object to be measured, the unit of the n-th corrected temperature is Celsius, and Tn _objN is the n-th infrared temperature sensor 10 to measure the temperature to be measured. The nth uncorrected temperature obtained after measuring the object, the unit of the nth uncorrected temperature of the nth temperature correction function is Celsius, Cn ₀ is a first temperature correction regression coefficient of the nth temperature correction function, and Cn ₁ is the nth temperature A second temperature correction regression coefficient of the correction function, Cn ₂ is a third temperature correction regression coefficient of the nth temperature correction function, Cn ₃ is a fourth temperature correction regression coefficient of the nth temperature correction function, Cn ₄ is the nth temperature correction regression coefficient A fifth temperature correction regression coefficient of the temperature correction function, Cn ₅ is a sixth temperature correction regression coefficient of the nth temperature correction function. Enter the above nth temperature correction function to obtain the nth corrected temperature of the object to be measured. That is, the value of the n-th uncorrected temperature measured by the n-th infrared temperature sensor 10 can be corrected by using the n-th temperature correction function.

Next, please refer to FIG. 6 , which is a flowchart of step S202 of the method for calibrating the temperature of the infrared thermal imager according to the first embodiment of the present invention. The step of measuring the object to be measured in step S202 to obtain n uncorrected temperatures includes the following steps: as shown in step S2022: using the first infrared temperature sensor 10 to measure a first predetermined temperature of the object to be measured a radiant energy at a position to generate a first digital signal, use the jth infrared temperature sensor 10 to measure a radiant energy at a jth predetermined position of the object to be measured, to generate a jth digital signal, and use the jth infrared temperature sensor 10 to measure a radiant energy at a jth predetermined position of the object to be measured The n-infrared temperature sensor 10 measures a radiant energy at an n-th predetermined position of the object to be measured, so as to generate an n-th digital signal.

Next, as shown in step S2024: calculate the first uncorrected temperature of the object to be measured according to the first digital signal and a first temperature measurement formula, and calculate the temperature to be measured according to the jth digital signal and a jth temperature measurement formula The jth uncorrected temperature of the object is calculated, and the nth uncorrected temperature of the object to be measured is calculated according to the nth digital signal and an nth temperature measurement formula. For example, the control device 3 can receive the first digital signal measured by the first infrared temperature sensor 10 , the jth digital signal measured by the jth infrared temperature sensor 10 , and the nth infrared temperature sensor. The nth digital signal measured by the measuring device 10 is used to calculate the first uncorrected temperature of the object to be measured, the jth uncalibrated temperature and the jth uncorrected temperature of the Correction temperature and nth bit correction temperature. Further, according to the present invention, the first temperature measurement formula includes the following relationship: S1=G1×(1+tCo1×(T _amb −T _de ))×((T1 _objN ) ⁴ −(T _amb ) ⁴ ). In addition, the jth temperature measurement formula includes the following relation: Sj=Gj×(1+tCoj×(T _amb −T _de ))×((Tj _objN ) ⁴ −(T _amb ) ⁴ ). In addition, the nth temperature measurement formula includes the following relation: Sn=Gn×(1+tCon×(T _amb −T _de ))×((Tn _objN ) ⁴ −(T _amb ) ⁴ ). S1 is the first digital signal, Sj is the jth digital signal, Sn is the nth digital signal, G1 is a correction coefficient of the first temperature measurement formula, Gj is a correction coefficient of the jth temperature measurement formula, Gn is the A correction coefficient of the n temperature measurement formula, tCo1 is a system temperature coefficient of the first temperature measurement formula, tCoj is a system temperature coefficient of the jth temperature measurement formula, tCon is a system temperature of the nth temperature measurement formula coefficient, T _amb is an ambient temperature, the unit of ambient temperature is Kelvin, T _de is a temperature of 298.15K, T1 _objN is the first uncorrected temperature of the object to be measured, the first uncorrected temperature in the first temperature measurement formula The unit of temperature is Kjeldahl, Tj _objN is the jth uncorrected temperature of the object to be measured, the unit of the jth uncorrected temperature in the jth temperature measurement formula is Kjeldahl, and the nth uncorrected temperature in the nth temperature measurement formula The unit of calibration temperature is Kelvin.

Based on the above, it should be noted that the ambient temperature _Tamb can be measured by the temperature measuring device 2, the first digital signal S1 can be measured by the first infrared temperature sensor 10, and the jth digital signal Sj can be measured by the jth infrared light The temperature sensor 10 measures, and the nth digital signal Sn can be measured by the nth infrared temperature sensor 10 . In addition, T _de is a temperature of 298.15K which means that T _de is a temperature of 25°C. Therefore, in step S2024, the object to be measured can be calculated by using the first digital signal, the jth digital signal, the nth digital signal, the first temperature measurement formula, the jth temperature measurement formula and the nth temperature measurement formula The first uncorrected temperature, the jth corrected temperature, and the nth corrected temperature of The first uncorrected temperature, the jth uncorrected temperature, and the nth corrected temperature are brought into the above-mentioned first temperature correction function, jth temperature correction function, and nth temperature correction function to obtain the first corrected temperature of the object to be measured, The jth corrected temperature and the nth corrected temperature. In addition, it should be noted that the above-mentioned first temperature measurement formula, jth temperature measurement formula and nth temperature measurement formula can be obtained by Stefan-Boltzmann law.

Next, please refer to FIG. 7 , which is another flowchart of the temperature calibration method of the infrared thermal imager according to the first embodiment of the present invention. The following will further illustrate two of the plurality of infrared temperature sensors 10 . A temperature calibration method for each infrared temperature sensor 10 (a first infrared temperature sensor 10a and a second infrared temperature sensor 10b). In addition, although the present invention uses the first infrared temperature sensor 10a and the second infrared temperature sensor 10b to use a first temperature correction function and a second temperature correction function to perform temperature measurement and correction, respectively, in other embodiments , it can also be a group formed by a plurality of first infrared temperature sensors 10a (for example, the first group 10A) using the first temperature correction function to perform temperature measurement and correction, and a plurality of second infrared temperature sensors The group formed by 10b (eg, the second group 10B) uses the second temperature correction function to perform temperature measurement correction.

Based on the above, the temperature calibration method includes the following steps: as shown in step S302 : providing a temperature sensing system S to measure an object to be measured to obtain a first uncalibrated temperature and a second uncalibrated temperature. For example, the first infrared temperature sensor 10a in the first group 10A can be used to measure the object to be measured to obtain a first uncorrected temperature, and at the same time, the second infrared temperature in the second group 10B can be used The sensor 10b measures the object to be measured to obtain a second uncorrected temperature.

Based on the above, as shown in step S304, the first uncalibrated temperature is calibrated to a first calibrated temperature, and the second uncalibrated temperature is calibrated to a second calibrated temperature. For example, the first uncalibrated temperature may be calibrated to a first calibrated temperature according to the first uncalibrated temperature, the second uncalibrated temperature, a first temperature calibration function, and a second temperature calibration function, and the first uncalibrated temperature may be calibrated to a first calibrated temperature. The two uncorrected temperatures are calibrated to a second corrected temperature, and the first temperature correction function and the second temperature correction function can be obtained by a regression analysis, respectively. Further, according to the present invention, the first temperature correction function may include the following relation: T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ ). T1 _obj is the first corrected temperature of the object to be measured obtained by the first infrared temperature sensor 10a after measuring the object to be measured, the unit of the first corrected temperature T1 _obj is Celsius, and T1 _objN is the first infrared temperature sensor The first uncorrected temperature of the object to be measured obtained by the measuring device 10a after measuring the object to be measured, the unit of the first uncorrected temperature of the first temperature correction function is Celsius, and _C10 is a first temperature of the first temperature correction function. The temperature correction regression coefficient, C1 ₁ is a second temperature correction regression coefficient of the first temperature correction function, C1 ₂ is a third temperature correction regression coefficient of the first temperature correction function, and C1 ₃ is a first temperature correction function. Four temperature correction regression coefficients, C1 ₄ is a fifth temperature correction regression coefficient of the first temperature correction function, and C1 ₅ is a sixth temperature correction regression coefficient of the first temperature correction function. That is to say, the first uncorrected temperature of the object to be tested obtained in the foregoing step S302 can be brought into the above-mentioned first temperature correction function to obtain the first corrected temperature of the object to be tested. That is, the value of the first uncorrected temperature measured by the first infrared temperature sensor 10a can be corrected by using the above-mentioned first temperature correction function.

Based on the above, further, according to the present invention, the second temperature correction function may include the following relationship: T2 _obj =(C2 ₀ +C2 ₁ ×T2 _objN +C2 ₂ ×(T2 _objN ) ² +C2 ₃ ×( T2 _objN ) ³ +C2 ₄ ×(T2 _objN ) ⁴ +C2 ₅ ×(T2 _objN ) ⁵ ). T2 _obj is the second corrected temperature of the object to be measured obtained after the second infrared temperature sensor 10b measures the object to be measured, the unit of the second corrected temperature T2 _obj is Celsius, and T2 _objN is the second infrared temperature sensor The second uncorrected temperature of the object to be measured obtained by the measuring device 10b after measuring the object to be measured, the unit of the second uncorrected temperature T2 _objN of the second temperature correction function is Celsius, and C2 ₀ is a unit of the second temperature correction function. The first temperature correction regression coefficient, C2 ₁ is a second temperature correction regression coefficient of the second temperature correction function, C2 ₂ is a third temperature correction regression coefficient of the second temperature correction function, and C2 ₃ is the second temperature correction function. A fourth temperature correction regression coefficient, C2 ₄ is a fifth temperature correction regression coefficient of the second temperature correction function, and C2 ₅ is a sixth temperature correction regression coefficient of the second temperature correction function. That is, the second uncorrected temperature of the object to be tested obtained in the aforementioned step S302 can be brought into the above-mentioned second temperature correction function to obtain the second corrected temperature of the object to be tested. That is, the value of the second uncorrected temperature measured by the second infrared temperature sensor 10b can be corrected by using the above-mentioned second temperature correction function.

Next, please refer to FIG. 8 , which is a flowchart of step S302 of the temperature calibration method according to the first embodiment of the present invention. The step of measuring the object to be measured in step S302 to obtain a first uncorrected temperature and a second uncorrected temperature includes the following steps: as shown in step S3022: using the first infrared temperature sensor 10a to measure An infrared energy at a first predetermined position of the object to be measured is used to generate a first digital signal, and a second infrared temperature sensor is used to measure an infrared energy at a second predetermined position of the object to be measured to generate a The second digital signal. For example, the first digital signal and the second digital signal can be obtained after measuring the radiation energy of the object to be measured by the first infrared temperature sensor 10a and the second infrared temperature sensor 10b of the infrared temperature sensing device 1, respectively. generated signal.

Next, as shown in step S3024: calculate the first uncorrected temperature of the object to be measured according to the first digital signal and a first temperature measurement formula, and calculate the obtained temperature according to the second digital signal and a second temperature measurement formula the second uncorrected temperature of the object to be measured. For example, the control device 3 can receive the first digital signal measured by the first infrared temperature sensor 10a and the second digital signal measured by the second infrared temperature sensor 10b, and use the first temperature The measurement formula and the second temperature measurement formula calculate the first uncorrected temperature and the second corrected temperature of the object to be measured. Further, according to the present invention, the first temperature measurement formula includes the following relationship: S1=G1×(1+tCo1×(T _amb −T _de ))×((T1 _objN ) ⁴ −(T _amb ) ⁴ ). In addition, the second temperature measurement formula includes the following relation: S2=G2×(1+tCo2×(T _amb −T _de ))×((T2 _objN ) ⁴ −(T _amb ) ⁴ ). S1 is the first digital signal, S2 is the second digital signal, G1 is a correction coefficient of the first temperature measurement formula, G2 is a correction coefficient of the second temperature measurement formula, tCo1 is a correction coefficient of the first temperature measurement formula System temperature coefficient, _tCo2 is a system temperature coefficient of the second temperature measurement formula, Tamb is an ambient temperature, the unit of ambient temperature Tamb is Kjeldahl, T _de is the temperature of _298.15K , T1 _objN is the temperature of the object to be measured. The first uncorrected temperature, T2 _objN is the second uncorrected temperature of the object to be measured, the unit of the first uncorrected temperature T1 _objN in the first temperature measurement formula is Kjeldahl, and the second temperature in the second temperature measurement formula The unit of uncorrected temperature T2 _objN is Kjeldahl. Therefore, in step S3024, the first uncorrected temperature and the second corrected temperature of the object to be measured can be calculated by using the first digital signal, the second digital signal, the first temperature measurement formula and the second temperature measurement formula , and then use the first temperature correction function and the second temperature correction function in step S304 to bring the first uncorrected temperature and the second corrected temperature of the object to be measured into the first temperature correction function and the second temperature correction function. function to obtain the first corrected temperature and the second corrected temperature of the object to be tested. In addition, it should be noted that although the first infrared temperature sensor 10a and the second infrared temperature sensor 10b are used as examples for illustration, there are other ways of obtaining the corrected temperature of the infrared temperature sensors 10. It is also similar to the foregoing description, and will not be repeated here. In addition, it should be noted that the above-mentioned first temperature measurement formula and second temperature measurement formula can be obtained by Stefan-Boltzmann law.

[Second Embodiment]

Please refer to FIG. 9 and FIG. 10. FIG. 9 is a flowchart of a calibration method for a temperature sensing system according to a second embodiment of the present invention, and FIG. 10 shows steps of a calibration method for a temperature sensing system according to the second embodiment of the present invention. The flowchart of S12. The calibration method of the temperature sensing system will be further described below, and at the same time, the method of generating the aforementioned calibration regression coefficient, calibration coefficient and system temperature coefficient will be further described. According to the present invention, the first temperature correction regression coefficient, the second temperature correction regression coefficient, the third temperature correction regression coefficient, the fourth temperature correction regression coefficient, the fifth temperature correction regression coefficient, the sixth temperature correction regression coefficient, the correction coefficient And the value of the system temperature coefficient is generated during the calibration process of the temperature sensing system.

As mentioned above, the calibration method of the temperature sensing system S includes the following steps: as shown in step S11 : providing a black body with a preset temperature. For example, the predetermined temperature of the black body is known and used to calculate the correction coefficient and the system temperature coefficient. Next, as shown in step S12: a correction coefficient G1 and a system temperature coefficient tCo1 of the temperature sensing system S are obtained. For example, in the step of obtaining the correction coefficient and the system temperature coefficient, an initial temperature measurement formula is used to obtain the correction coefficient and the system temperature coefficient, and the initial temperature measurement formula includes the following relationship: S=G1×(1 +tCo1×(T _amb −T _de ))×((T _objNA ) ⁴ −(T _amb ) ⁴ ). S is an initial digital signal obtained by measuring a black body by the infrared temperature sensor 10 of the temperature sensing system S, G1 is the correction coefficient, _tCo1 is the system temperature coefficient, Tamb is the ambient temperature, and the ambient temperature can be sensed by temperature The temperature measuring device 2 of the system S is obtained by measuring the temperature of the environment, the unit of the ambient temperature T _amb is Kelvin, T _de is the temperature of 298.15 K, T _objNA is the preset temperature of the black body, and the unit of the preset temperature is Kelvin 's. For example, the predetermined temperature of the black body may be 100°C, ie, 373.15K. In addition, it should be noted that the above-mentioned initial temperature measurement formula can be obtained by Stefan-Boltzmann law.

Based on the above, in the step of obtaining the correction coefficient and the system temperature coefficient, it includes the following steps: as shown in step S122, obtaining the correction coefficient in an environment where the ambient temperature is 298.15 K. In other words, when the ambient temperature _Tamb is 298.15 K, the correction coefficient G1 can be calculated using the initial temperature measurement formula. Next, as shown in step S124: according to the obtained correction coefficient G1, the system temperature coefficient _tCo1 is obtained under the environment where the ambient temperature Tamb is not 298.15 K. In other words, since the correction coefficient G1 can be obtained in step S122, the system temperature coefficient tCo1 can be recalculated through the initial temperature measurement formula. In addition, it should be noted that in step S11 and step S12, Wien's displacement compensation is not considered. Therefore, the subsequent steps S13, S14, S15 and S16 still need to be performed.

Next, as shown in step S13, a plurality of radiation black bodies are provided, and the predetermined temperatures of the plurality of radiation black bodies are different from each other. For example, a predetermined temperature of a plurality of radiating black bodies is known and used to calculate the correction regression coefficient. In addition, the unit of the predetermined temperature of the plurality of radiation black bodies is Celsius. Next, as shown in step S14, the temperature sensing system S is used to measure a plurality of radiation black bodies to obtain a plurality of measured temperatures. For example, the infrared temperature sensor 10 of the temperature sensing system S can be used to directly measure a plurality of radiation black bodies. In addition, the units of the plurality of measured temperatures are in degrees Celsius. Further, the predetermined temperatures of the plurality of radiation black bodies described above are the actual temperature values of the plurality of radiation black bodies, and the plurality of measured temperatures are the temperature values measured by the temperature sensing system. Therefore, the two There may still be errors between them. Therefore, it is necessary to correct for the error between the two.

Based on the above, for example, in step S13, a first radiation black body with a first predetermined temperature, a second radiation black body with a second predetermined temperature, and a third radiation black body with a third predetermined temperature can be provided A radiation black body, a fourth radiation black body having a fourth predetermined temperature, a fifth radiation black body having a fifth predetermined temperature, and a sixth radiation black body having a sixth predetermined temperature. Further, the first predetermined temperature, the second predetermined temperature, the third predetermined temperature, the fourth predetermined temperature, the fifth predetermined temperature, and the sixth predetermined temperature are different from each other. In addition, the units of the first predetermined temperature, the second predetermined temperature, the third predetermined temperature, the fourth predetermined temperature, the fifth predetermined temperature, and the sixth predetermined temperature are Celsius. However, it should be noted that the present invention is not limited by the number of the above-mentioned plurality of radiation black bodies.

Based on the above, for example, in step S14, the infrared temperature sensor 10 of the temperature sensing system can be used to measure the first radiation black body, the second radiation black body, the third radiation black body, the fourth radiation black body, and the fifth radiation black body The black body and the sixth radiate the black body to obtain a first measurement temperature, a second measurement temperature, a third measurement temperature, a fourth measurement temperature, a fifth measurement temperature and a sixth measurement temperature. In addition, the units of the first measurement temperature, the second measurement temperature, the third measurement temperature, the fourth measurement temperature, the fifth measurement temperature and the sixth measurement temperature are Celsius. In one embodiment, the correction coefficient G1 and the system temperature coefficient tCo1 have been obtained in the aforementioned steps S11 and S12. Therefore, the measured temperature can be obtained by directly using the temperature measurement formula: S=G1×(1+tCo1×(T _amb −T _de ))×((T _objNR ) ⁴ −(T _amb ) ⁴ ). In addition, T _objNR is the measurement temperature (eg, the first measurement temperature, the second measurement temperature, the third measurement temperature, the fourth measurement temperature, the fifth measurement temperature, and the sixth measurement temperature). In addition, it should be noted that the units of the plurality of measurement temperatures obtained by using the temperature measurement formula are Kjeldahl temperature scale, therefore, it needs to be converted into Celsius temperature scale, and further use step S15 to obtain the correction regression coefficient.

Based on the above, please refer to Table 1 together. Further, the first measured temperature corresponds to the first predetermined temperature, the second measured temperature corresponds to the second predetermined temperature, and the third measured temperature corresponds to the third The predetermined temperature, the fourth measurement temperature corresponds to the fourth predetermined temperature, the fifth measurement temperature corresponds to the fifth predetermined temperature, and the sixth measurement temperature corresponds to the sixth predetermined temperature.

For example, the first measurement temperature may be 346.42°C, the second measurement temperature may be 300.59°C, the third measurement temperature may be 181.57°C, the fourth measurement temperature may be 100°C, and the fifth measurement temperature may be 100°C. The measurement temperature may be -3.5°C, and the sixth measurement temperature may be -41.28°C. In addition, the first predetermined temperature may be 500°C, the second predetermined temperature may be 400°C, the third predetermined temperature may be 200°C, the fourth predetermined temperature may be 100°C, and the fifth predetermined temperature may be 0° C, the sixth predetermined temperature may be -30°C. However, it should be noted that the above-mentioned measured temperature and predetermined temperature are only illustrative, and the present invention is not limited thereto.

Next, as shown in step S15, a regression analysis is performed on the plurality of measured temperatures and the plurality of preset temperatures to obtain an initial temperature correction function. In the present invention, the initial temperature correction function includes the following relation: T _obj =(C1 ₀ +C1 ₁ ×T1 _objNB +C1 ₂ ×(T _objNB ) ² +C1 ₃ ×(T _objNB ) ³ +C1 ₄ ×( T _objNB ) ⁴ +C1 ₅ ×(T _objNB ) ⁵ ). C1 ₀ , C1 ₁ , C1 ₂ , C1 ₃ , C1 ₄ and C1 ₅ are respectively a temperature correction regression coefficient. In addition, in the step of obtaining the initial temperature correction function, a plurality of predetermined temperature values are sequentially brought into T _obj , and a plurality of measured temperature values are sequentially brought into T _objNB , and regression analysis is performed, and Obtain multiple temperature-corrected regression coefficients. In addition, it should be noted that the units of the plurality of predetermined temperatures are in degrees Celsius, and the units of the plurality of measured temperatures are in degrees Celsius.

Based on the above, for example, the values of the first predetermined temperature, the second predetermined temperature, the third predetermined temperature, the fourth predetermined temperature, the fifth predetermined temperature and the sixth predetermined temperature can be brought into T _obj in sequence, and according to Then, the values of the first measurement temperature, the second measurement temperature, the third measurement temperature, the fourth measurement temperature, the fifth measurement temperature and the sixth measurement temperature are brought into T _objNB , and regression analysis is performed, The first temperature correction regression coefficient C1 ₀ , the second temperature correction regression coefficient C1 ₁ , the third temperature correction regression coefficient C1 ₂ , the fourth temperature correction regression coefficient C1 ₃ , the fifth temperature correction regression coefficient C1 ₄ and the sixth temperature correction coefficient C1 3 are obtained. Correction regression coefficient C1 ₅ . For example, in one embodiment, a table calculation software (eg, Excel) can be used to perform regression analysis to obtain the first temperature-corrected regression coefficient C1 ₀ , the second temperature-corrected regression coefficient C1 ₁ , and the third temperature-corrected regression coefficient C1 _2. The fourth temperature correction regression coefficient C1 ₃ , the fifth temperature correction regression coefficient C1 ₄ and the sixth temperature correction regression coefficient C1 ₅ .

Next, as shown in step S16, a temperature correction function is obtained by using the initial temperature correction function. For example, the temperature correction function includes the following relationship: T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ ). T1 _obj is a corrected temperature of an object to be measured, the unit of the corrected temperature is Celsius, T1 _objN is an uncorrected temperature of the object to be measured, the unit of uncorrected temperature in the temperature correction function is Celsius, C1 ₀ , C1 ₁ , C1 ₂ , C1 ₃ , C1 ₄ , and C1 ₅ are temperature correction regression coefficients. In other words, the temperature correction function used in the temperature correction method provided in the first embodiment can be obtained by using a plurality of temperature correction regression coefficients obtained from the above-mentioned initial temperature correction function.

In addition, it should be noted that the above temperature correction regression coefficient is only the temperature correction regression coefficient of one of the infrared temperature sensors 10 , and the other infrared temperature sensors 10 (for example, the first infrared temperature sensor 10 to the nth infrared temperature sensor 10 The temperature correction regression coefficient of the sensor 10) can also be calculated using the above method, and the calculation methods are similar to each other, and will not be repeated here. In addition, it should be noted that, although the above-mentioned embodiment analyzes with a fifth-order equation, in other embodiments, a third-order equation, a fourth-order equation, a sixth-order equation, or a seventh-order equation may be used. In other words, in other embodiments, the temperature correction function may also include the following relationship, for example: T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ) ³ ), T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ ), T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ +C1 ₆ ×(T1 _objN ) ) ⁶ ) or T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ +C1 ₆ ×(T1 _objN ) ⁶ +C1 ₇ ×(T1 _objN ) ⁷ ), the present invention is not limited by the power of the temperature correction function. Measuring temperature (°C) Predetermined temperature (°C) Temperature Corrected Regression Coefficient -41.28 -30 _C15 : -1.27613× ^10-11 -3.5 0 _C14 : 1.27168× ^10-8 100 100 _C13 : -1.53674× ^10-6 181.57 200 C12: _0.001217651 300.59 400 C11: _0.852474723 346.42 500 _C10 : 2.968677498 Table I

Therefore, in one embodiment, the manufacturer can obtain a temperature correction function by using the above-mentioned correction method of the temperature sensing system S, and store the temperature correction function in the control device 3 of the temperature sensing system S. When the user uses the temperature sensing system S, the temperature sensing system S can be used to measure the object to be measured, and the temperature correction function can be used to obtain the accurate temperature of the object to be measured.

[Advantageous effects of the embodiment]

One of the beneficial effects of the present invention is that the temperature correction method for an infrared thermal imager provided by the present invention can use the technology of "calibrating the uncorrected temperature to a corrected temperature according to the uncorrected temperature and a temperature correction function" solution to improve the accuracy of the temperature sensing system S. In addition, the calibration method of the temperature sensing system S of the infrared thermal imager provided by the present invention can obtain an initial temperature correction function by "performing a regression analysis on a plurality of measured temperatures and a plurality of predetermined temperatures" and The technical solution of "using the initial temperature correction function to obtain a temperature correction function" enables the temperature sensing system S to improve the accuracy through the temperature correction function.

Furthermore, since the infrared thermal imager has multiple infrared temperature sensors 10, most of the multiple infrared temperature sensors 10 have different parameters. There will be several different angles of incidence in the camera. Therefore, the above factors will affect the accuracy of the infrared thermal imaging camera. The present invention can correct the uncorrected temperature measured by each infrared temperature sensor 10 to a corrected temperature through the temperature correction method provided by the first embodiment, thereby improving the accuracy of the temperature sensing system S.

Furthermore, since the temperature correction method of the present application uses a temperature correction function for calculation, and the temperature correction coefficient of the temperature correction function has been known by the manufacturer after correcting each infrared temperature sensor 10 before leaving the factory. , and stored in the temperature sensing system. Therefore, in the temperature correction method provided by the present invention, the corrected temperature can be obtained as long as the uncorrected temperature measured by the temperature sensing system S is brought into the temperature correction function for calculation, and the operation speed can be greatly improved.

The contents disclosed above are only preferred feasible embodiments of the present invention, and are not intended to limit the scope of the present invention. Therefore, any equivalent technical changes made by using the contents of the description and drawings of the present invention are included in the application of the present invention. within the scope of the patent.

S: temperature sensing system 1: Infrared temperature sensing device 100: Substrate 10: Infrared temperature sensor 10a: The first infrared temperature sensor 10b: Second infrared temperature sensor 10A: Group 1 10B: The second group 2: Temperature measuring device 3: Control device S102, S1022, S1024, S104, S202, S2022, S2024, S204, S302, S3022, S3024, S304, S11, S12, S122, S124, S13, S14, S15, S16: Steps

FIG. 1 is a functional block diagram of the temperature sensing system of the infrared thermal imager of the present invention.

2 is a schematic top view of the infrared temperature sensing device of the temperature sensing system of the infrared thermal imager of the present invention.

FIG. 3 is a flow chart of the temperature calibration method of the infrared thermal imager according to the first embodiment of the present invention.

FIG. 4 is a flowchart of step S102 of the temperature calibration method of the infrared thermal imager according to the first embodiment of the present invention.

FIG. 5 is another flowchart of the temperature calibration method of the infrared thermal imager according to the first embodiment of the present invention.

FIG. 6 is a flowchart of step S202 of the temperature calibration method of the infrared thermal imager according to the first embodiment of the present invention.

FIG. 7 is still another flowchart of the temperature calibration method of the infrared thermal imager according to the first embodiment of the present invention.

FIG. 8 is a flowchart of step S302 of the temperature calibration method of the infrared thermal imager according to the first embodiment of the present invention.

FIG. 9 is a flowchart of a calibration method for a temperature sensing system of an infrared thermal imager according to a second embodiment of the present invention.

FIG. 10 is a flowchart of step S12 of the calibration method of the temperature sensing system of the infrared thermal imager according to the second embodiment of the present invention.

S102, S104: Steps

Claims (15)

A temperature correction method for an infrared thermal imager, comprising: providing a temperature sensing system to measure an object to be measured to obtain an uncorrected temperature; and calibrating the uncorrected temperature to a corrected temperature according to the uncorrected temperature and a temperature correction function; Wherein, the temperature correction function is obtained by a regression analysis. The temperature correction method for an infrared thermal imager according to claim 1, wherein the temperature correction function includes the following relation: T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² + C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ ); wherein, T1 _obj is the corrected temperature of the object to be measured, and the corrected temperature The unit is Celsius, T1 _objN is the uncorrected temperature of the object to be measured, the unit of the uncorrected temperature in the temperature correction function is Celsius, C1 ₀ is a first temperature correction regression coefficient, C1 ₁ is a second temperature correction regression coefficient, C1 ₂ is a third temperature correction regression coefficient, C1 ₃ is a fourth temperature correction regression coefficient, C1 ₄ is a fifth temperature correction regression coefficient, and C1 ₅ is a sixth temperature correction coefficient Regression coefficients. The method for calibrating the temperature of an infrared thermal imager according to claim 2, wherein in the step of measuring the object to be measured to obtain the uncorrected temperature, the method comprises: using the temperature sensing system to measure the temperature a radiation energy of the object to be measured to generate a digital signal; and calculate the uncorrected temperature of the object to be measured according to the digital signal and a temperature measurement formula; wherein, the temperature measurement formula includes the following Relational formula: S1=G1×(1+tCo1×(T _amb -T _de ))×((T1 _objN ) ⁴ -(T _amb ) ⁴ ); wherein, S1 is the digital signal, G1 is a correction coefficient, tCo1 is a system temperature coefficient, T _amb is an ambient temperature, the unit of the ambient temperature is Kjeldahl, T _de is a temperature of 298.15K, T1 _objN is the uncorrected temperature of the object to be measured, and the temperature The unit of the uncorrected temperature in the measurement formula is Kjeldahl. The temperature correction method for an infrared thermal imager according to claim 3, wherein the first temperature correction regression coefficient, the second temperature correction regression coefficient, the third temperature correction regression coefficient, the fourth temperature correction regression coefficient The values of the correction regression coefficient, the fifth temperature correction regression coefficient, the sixth temperature correction regression coefficient, the correction coefficient and the system temperature coefficient are stored in the temperature sensing system. The temperature correction method for an infrared thermal imager according to claim 4, wherein the first temperature correction regression coefficient, the second temperature correction regression coefficient, the third temperature correction regression coefficient, the fourth temperature correction regression coefficient The values of the correction regression coefficient, the fifth temperature correction regression coefficient, the sixth temperature correction regression coefficient, the correction coefficient and the system temperature coefficient are generated during the calibration process of the temperature sensing system. The temperature calibration method for an infrared thermal imager according to claim 5, wherein before the step of providing the temperature sensing system to measure the object to be measured, the method further comprises: calibrating the temperature sensing system , the calibration method of the temperature sensing system includes: providing a black body with a preset temperature; and obtaining the calibration coefficient and the system temperature coefficient of the temperature sensing system; wherein, after obtaining the calibration coefficient And in the step of the system temperature coefficient, an initial temperature measurement formula is used to obtain the correction coefficient and the system temperature coefficient, and the initial temperature measurement formula includes the following relationship: S=G1×(1+tCo1 ×(T _amb -T _de ))×((T _objNA ) ⁴ -(T _amb ) ⁴ ); wherein, S is an initial digital signal obtained by the temperature sensing system measuring a black body, and G1 is the Correction coefficient, tCo1 is the temperature coefficient of the system, Tamb is the ambient temperature, the unit of the ambient temperature is _{Kjeldahl, Tde is the temperature of 298.15 K, T objNA is the} preset temperature of the black body, The unit of the preset temperature is Kjeldahl; wherein, the preset temperature of the black body is known. The temperature correction method for an infrared thermal imager according to claim 6, wherein, in the step of obtaining the correction coefficient and the system temperature coefficient, the method includes: obtaining the correction factor in an environment where the ambient temperature is 298.15 K; and According to the obtained correction coefficient, the system temperature coefficient is obtained in an environment where the ambient temperature is not 298.15 K. The temperature correction method for an infrared thermal imager according to claim 6, wherein after obtaining the correction coefficient and the system temperature coefficient of the temperature sensing system, the method further comprises: providing a first predetermined temperature a first radiating black body, a second radiating black body having a second predetermined temperature, a third radiating black body having a third predetermined temperature, a fourth radiating black body having a fourth predetermined temperature, a fifth radiating black body having a A fifth radiant black body with a predetermined temperature and a sixth radiant black body with a sixth predetermined temperature, wherein the first predetermined temperature, the second predetermined temperature, the third predetermined temperature, the fourth predetermined temperature temperature, the fifth predetermined temperature, and the sixth predetermined temperature are different from each other, wherein the first predetermined temperature, the second predetermined temperature, the third predetermined temperature, the fourth predetermined temperature, the The unit of the fifth predetermined temperature and the sixth predetermined temperature is Celsius; the temperature sensing system is used to measure the first radiation black body, the second radiation black body, the third radiation black body, and the first radiation black body. Four radiation black bodies, the fifth radiation black body and the sixth radiation black body are used to obtain a first measurement temperature, a second measurement temperature, a third measurement temperature, a fourth measurement temperature, and a fifth measurement temperature. The measured temperature and a sixth measured temperature, wherein the first measured temperature corresponds to the first predetermined temperature, the second measured temperature corresponds to the second predetermined temperature, and the third measured temperature corresponds to the first predetermined temperature. The measured temperature corresponds to the third predetermined temperature, the fourth measured temperature corresponds to the fourth predetermined temperature, the fifth measured temperature corresponds to the fifth predetermined temperature, and the sixth measured temperature Corresponding to the sixth predetermined temperature, wherein the first measurement temperature, the second measurement temperature, the third measurement temperature, the fourth measurement temperature, and the fifth measurement temperature and the unit of the sixth measurement temperature is Celsius; for the first measurement temperature, the second measurement temperature, the third measurement temperature, the fourth measurement temperature, the fifth measurement temperature Measurement temperature, the sixth measurement temperature, the first predetermined temperature, the second predetermined temperature, the third predetermined temperature, the fourth predetermined temperature, the fifth predetermined temperature, and the first predetermined temperature Performing a regression analysis on six predetermined temperatures to obtain an initial temperature correction function; and using the initial temperature correction function to obtain the temperature correction function; wherein, the initial temperature correction function includes the following relation: T _obj =(C1 ₀ +C1 ₁ ×T1 _objNB +C1 ₂ ×(T _objNB ) ² +C1 ₃ ×(T _objNB ) ³ +C1 ₄ ×(T _objNB ) ⁴ +C1 ₅ ×(T _objNB ) ⁵ ); wherein, after obtaining the In the step of initializing the temperature correction function, the first predetermined temperature, the second predetermined temperature, the third predetermined temperature, the fourth predetermined temperature, the fifth predetermined temperature and the sixth predetermined temperature are sequentially The value of the predetermined temperature is brought into T _obj , and the first measured temperature, the all The values of the second measurement temperature, the third measurement temperature, the fourth measurement temperature, the fifth measurement temperature, and the sixth measurement temperature are brought into T _objNB , and the regression analysis to obtain the first temperature correction regression coefficient, the second temperature correction regression coefficient, the third temperature correction regression coefficient, the fourth temperature correction regression coefficient, and the first temperature correction regression coefficient of the temperature correction function. Five temperature correction regression coefficients and the sixth temperature correction regression coefficient. A method for calibrating a temperature sensing system of an infrared thermal imager, comprising: providing a black body with a preset temperature; obtaining a correction coefficient and a system temperature coefficient of the temperature sensing system; providing a plurality of radiation black bodies, and a plurality of the radiation black bodies respectively have a predetermined temperature different from each other; using the temperature sensing system to measure a plurality of the radiation black bodies to obtain a plurality of measured temperatures; for a plurality of the measured temperatures and performing a regression analysis on a plurality of the predetermined temperatures to obtain an initial temperature correction function; and using the initial temperature correction function to obtain a temperature correction function; wherein, in the step of obtaining the correction coefficient and the system temperature coefficient , the calibration coefficient and the system temperature coefficient are obtained by using an initial temperature measurement formula, the initial temperature measurement formula includes the following relationship: S=G1×(1+tCo1×(T _amb -T _de ) )×((T _objNA ) ⁴ -(T _amb ) ⁴ ); wherein, S is an initial digital signal obtained by the temperature sensing system measuring a black body, G1 is the correction coefficient, and tCo1 is the system temperature coefficient, T _amb is the ambient temperature, the unit of the ambient temperature is Kjeldahl, T _de is the temperature of 298.15 K, T _objNA is the preset temperature of the black body, and the unit of the preset temperature is Kjeldahl; wherein the preset temperature of the black body is known. The method for calibrating a temperature sensing system of an infrared thermal imager according to claim 9, wherein, in the step of obtaining the calibration coefficient and the temperature coefficient of the system, the steps include: obtaining the correction factor in an environment where the ambient temperature is 298.15 K; and According to the obtained correction coefficient, the system temperature coefficient is obtained in an environment where the ambient temperature is not 298.15 K. The method for calibrating a temperature sensing system of an infrared thermal imager according to claim 9, wherein the initial temperature correction function includes the following relation: T _obj =(C1 ₀ +C1 ₁ ×T _objNB +C1 ₂ ×( T _objNB ) ² +C1 ₃ ×(T _objNB ) ³ +C1 ₄ ×(T _objNB ) ⁴ +C1 ₅ ×(T _objNB ) ⁵ ); wherein C1 ₀ , C1 ₁ , C1 ₂ , C1 ₃ , C1 ₄ and C1 ₅ are respectively a temperature correction regression coefficient; wherein, in the step of obtaining the initial temperature correction function, a plurality of the predetermined temperature values are sequentially brought into T _obj , and a plurality of the The numerical value of the measured temperature is brought into T _objNB , and the regression analysis is performed to obtain a plurality of the temperature correction regression coefficients; wherein, the units of the plurality of predetermined temperatures are Celsius, and the units of the plurality of measured temperatures are to Celsius. The method for calibrating a temperature sensing system of an infrared thermal imaging camera according to claim 11, wherein the temperature correction function includes the following relation: T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ ); wherein, T1 _obj is a corrected temperature of an object to be measured, and the The unit of the corrected temperature is Celsius, T1 _objN is an uncorrected temperature of the object to be measured, and the unit of the uncorrected temperature in the temperature correction function is Celsius, C1 ₀ , C1 ₁ , C1 ₂ , C1 ₃ , C1 ₄ and C1 ₅ are the temperature-corrected regression coefficients. A temperature correction method for an infrared thermal imager, comprising: A temperature sensing system is provided to measure an object to be measured to obtain n uncorrected temperatures, wherein the temperature sensing system includes n infrared temperature sensors, and the n infrared temperature sensors are R× The n infrared temperature sensors are arranged in an array in the form of L, from a first infrared temperature sensor to an nth infrared temperature sensor in sequence, R is a positive integer greater than or equal to 2, and L is greater than or equal to A positive integer of 2, n is the number of R multiplied by L, wherein the n infrared temperature sensors respectively measure the object to be measured to obtain n uncorrected temperatures; and According to the n uncorrected temperatures and the n temperature correction functions, the n uncorrected temperatures are respectively calibrated to a corrected temperature to obtain n corrected temperatures, wherein each uncorrected temperature is The temperature corresponds to the corresponding temperature correction function respectively, and the first infrared temperature sensor to the nth infrared temperature sensor measure the object to be measured respectively to obtain a corresponding first temperature sensor. calibrate the temperature to an nth uncalibrated temperature; Wherein, the n temperature correction functions are respectively obtained by a regression analysis. The temperature correction method for an infrared thermal imager according to claim 13, wherein a first temperature correction function among the n temperature correction functions includes the following relation: T1 _obj =(C1 ₀ +C1 ₁ ×T1 _objN +C1 ₂ ×(T1 _objN ) ² +C1 ₃ ×(T1 _objN ) ³ +C1 ₄ ×(T1 _objN ) ⁴ +C1 ₅ ×(T1 _objN ) ⁵ ); wherein, T1 _obj is the first infrared temperature sensor A first calibrated temperature obtained by the detector after measuring the object to be measured, the unit of the first calibrated temperature is Celsius, and T1 _objN is the object to be measured measured by the first infrared temperature sensor The first uncorrected temperature obtained later, the unit of the first uncorrected temperature of the first temperature correction function is Celsius, and C1 ₀ is a first temperature correction regression coefficient of the first temperature correction function, C1 ₁ is a second temperature correction regression coefficient of the first temperature correction function, C1 ₂ is a third temperature correction regression coefficient of the first temperature correction function, and C1 ₃ is a temperature correction regression coefficient of the first temperature correction function The _fourth temperature correction regression coefficient, C14 is a _fifth temperature correction regression coefficient of the first temperature correction function, and C15 is a sixth temperature correction regression coefficient of the first temperature correction function; A jth temperature correction function in the temperature correction function includes the following relational expression, wherein j is a positive integer greater than 1 and less than or equal to n, and the jth temperature correction function includes the following relational expression: Tj _obj =(Cj ₀ + Cj ₁ ×Tj _objN +Cj ₂ ×(Tj _objN ) ² +Cj ₃ ×(Tj _objN ) ³ +Cj ₄ ×(Tj _objN ) ⁴ +Cj ₅ ×( _{Tj objN} ) ⁵ ); A jth corrected temperature obtained after the jth infrared temperature sensor measures the object to be measured, the unit of the jth corrected temperature is Celsius, and Tj _objN is the measurement of the jth infrared temperature sensor A jth uncorrected temperature obtained after the object to be measured, the unit of the jth uncorrected temperature of the jth temperature correction function is Celsius, and Cj ₀ is a first temperature of the jth temperature correction function Correction regression coefficient, Cj ₁ is a second temperature correction regression coefficient of the jth temperature correction function, Cj ₂ is a third temperature correction regression coefficient of the jth temperature correction function, Cj ₃ is the jth temperature a fourth temperature correction regression coefficient of the correction function, Cj ₄ is a fifth temperature correction regression coefficient of the jth temperature correction function, Cj ₅ is a sixth temperature correction regression coefficient of the jth temperature correction function; wherein , the nth temperature correction function includes the following relation: Tn _obj =(Cn ₀ +Cn ₁ ×Tn _objN +Cn ₂ ×(Tn _objN ) ² +Cn ₃ ×(Tn _objN ) ³ +Cn ₄ ×(Tn _objN ) ⁴ +Cn ₅ ×(Tn _objN ) ⁵ ); wherein, Tn _obj is the quantity of the nth infrared temperature sensor An nth corrected temperature obtained after measuring the object to be measured, the unit of the nth corrected temperature is Celsius, Tn _objN is the nth infrared temperature sensor obtained after measuring the object to be measured For the nth uncorrected temperature, the unit of the nth uncorrected temperature of the nth temperature correction function is Celsius, Cn ₀ is a first temperature correction regression coefficient of the nth temperature correction function, and Cn ₁ is A second temperature correction regression coefficient of the nth temperature correction function, Cn ₂ is a third temperature correction regression coefficient of the nth temperature correction function, Cn ₃ is a fourth temperature of the nth temperature correction function Correction regression coefficient, Cn ₄ is a fifth temperature correction regression coefficient of the nth temperature correction function, Cn ₅ is a sixth temperature correction regression coefficient of the nth temperature correction function. The temperature calibration method for an infrared thermal imager according to claim 14, wherein in the step of measuring the object to be measured to obtain n uncorrected temperatures, the method comprises: using the first infrared temperature sensing The device measures a radiation energy of a first predetermined position of the object to be tested to generate a first digital signal, and uses the jth infrared temperature sensor to measure a jth predetermined position of the object to be tested to generate a j-th digital signal, and use the n-th infrared temperature sensor to measure a radiation energy of an n-th predetermined position of the object to be tested to generate an n-th digital signal; and calculating the first uncorrected temperature of the object to be measured according to the first digital signal and a first temperature measurement formula, and calculating the obtained temperature according to the jth digital signal and a jth temperature measurement formula the jth uncorrected temperature of the object to be measured, and the nth uncorrected temperature of the object to be measured is calculated according to the nth digital signal and an nth temperature measurement formula; wherein, the nth uncorrected temperature of the object to be measured is calculated; A temperature measurement formula includes the following relationship: S1=G1×(1+tCo1×(T _amb −T _de ))×((T1 _objN ) ⁴ −(T _amb ) ⁴ ); wherein, the jth temperature measurement The measurement formula includes the following relationship: Sj=Gj×(1+tCoj×(T _amb −T _de ))×((Tj _objN ) ⁴ −(T _amb ) ⁴ ); wherein, the nth temperature measurement formula includes The following relational formula: Sn=Gn×(1+tCon×(T _amb -T _de ))×((Tn _objN ) ⁴ -(T _amb ) ⁴ ); wherein, S1 is the first digital signal, and Sj is the the jth digital signal, Sn is the nth digital signal, G1 is a correction coefficient of the first temperature measurement formula, Gj is a correction coefficient of the jth temperature measurement formula, Gn is the A correction coefficient of the n temperature measurement formula, tCo1 is a system temperature coefficient of the first temperature measurement formula, tCoj is a system temperature coefficient of the jth temperature measurement formula, tCon is the nth temperature measurement formula A system temperature coefficient of the measurement formula, T _amb is an ambient temperature, the unit of the ambient temperature is Kjeldahl, T _de is a temperature of 298.15K, T1 _objN is the first uncorrected temperature of the object to be measured, The unit of the first uncorrected temperature in the first temperature measurement formula is Kjeldahl, Tj _objN is the jth uncorrected temperature of the object to be measured, and in the jth temperature measurement formula The unit of the jth uncorrected temperature is Kjeldahl, and the unit of the nth uncorrected temperature in the nth temperature measurement formula is Kjeldahl.

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