TW202146914A - Yield detection device of antenna in package devices - Google Patents
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本發明是關於一種檢測裝置,特別是一種封裝天線良率檢測裝置。The present invention relates to a detection device, in particular to a packaging antenna yield detection device.
參閱圖11,傳統封裝天線良率檢測裝置,包含一隔離箱110、一標準天線120及一網路分析儀130,該隔離箱110的頂面具有一開口111,該標準天線120設置於該隔離箱110中並位於該隔離箱110的底面上。傳統封裝天線良率檢測需將一封裝天線(Antenna in Package Device, AiP)140設置於一測試載板150上,接著將該封裝天線140對準該隔離箱110的該開口111後將該測試載板150設置於該隔離箱110的頂面上,使該封裝天線140位於該開口111且面向該隔離箱110內的該標準天線120,該網路分析儀130電連接該標準天線120及該封裝天線140,並透過該標準天線120去量測該封裝天線140的收發功能是否正常。Referring to FIG. 11 , the conventional package antenna yield detection device includes an
現今5G系統的封裝天線具有波束切換功能,甚至是多波束的場型,然而傳統封裝天線良率檢測裝置只有檢測單一個固定方向的輻射參數(例如振幅),並不適用於現今5G的封裝天線,只檢測單一方向的輻射參數難以滿足5G通訊時代的封裝天線需求。另一方面,若要對每一顆出廠的封裝天線做全球面的輻射場型量測,則每一顆封裝天線所花費的檢測時間將增加許多,因此對各該封裝天線進行全球面的輻射場型量測只適用研發階測試,而不適用於工廠製造的所需要的高速良率檢測。Today's packaged antennas in 5G systems have beam switching functions, even multi-beam field patterns. However, traditional packaged antenna yield detection devices only detect radiation parameters (such as amplitude) in a single fixed direction, which are not suitable for today's 5G packaged antennas. , it is difficult to only detect radiation parameters in a single direction to meet the needs of packaged antennas in the 5G communication era. On the other hand, if you want to measure the global radiation pattern of each packaged antenna, the detection time of each packaged antenna will increase a lot. Therefore, the global radiation of each packaged antenna will be increased. Field measurement is only suitable for R&D-level testing, not for high-speed yield inspection required by factory manufacturing.
為了解決前述的缺點,本發明提出了一種不需要全面量測封裝天線球面場型,而是透過相關於一封裝天線場型的多個振幅信號,藉此快速檢測封裝天線良率的裝置。In order to solve the aforementioned shortcomings, the present invention proposes a device that does not need to comprehensively measure the spherical pattern of the packaged antenna, but can quickly detect the yield of the packaged antenna through a plurality of amplitude signals related to the pattern of the packaged antenna.
本發明封裝天線良率檢測裝置供檢測一封裝天線是否為良品,包含有: 一測試箱,具有一測試窗戶,該測試窗戶用以供該封裝天線的電磁波穿透入該測試箱內; 一測試載板,包含有一射頻訊號線以電連接該封裝天線; N個標準天線,分別間隔設置在該測試箱內部的不同位置,N是大於或等於2的正整數;以及一測試機,包括一訊號產生器、一訊號分析儀及一運算控制單元;該射頻訊號線一端與該封裝天線電連接,另一端與該訊號產生器電連接;該訊號分析儀電連接每一個該標準天線,並透過每一個該標準天線接收來自該封裝天線的一輻射電磁波,且根據每一個該標準天線所接收到的該輻射電磁波的振幅對應產生一振幅信號; 該運算控制單元電連接該訊號分析儀以接收各該振幅信號,且將各該振幅信號與一預設標準值相比對以判斷該封裝天線是否為良品。The packaged antenna yield detection device of the present invention is used to detect whether a packaged antenna is a good product, and includes: a test box with a test window, the test window is used for the electromagnetic wave of the packaged antenna to penetrate into the test box; a test carrier board, including a radio frequency signal line to electrically connect the packaged antenna; N standard antennas, respectively arranged at different positions inside the test box, N is a positive integer greater than or equal to 2; and a test machine, including a signal generator, a signal analyzer and an arithmetic control unit; the radio frequency One end of the signal line is electrically connected to the packaged antenna, and the other end is electrically connected to the signal generator; the signal analyzer is electrically connected to each of the standard antennas, and receives a radiated electromagnetic wave from the packaged antenna through each of the standard antennas, and An amplitude signal is correspondingly generated according to the amplitude of the radiated electromagnetic wave received by each of the standard antennas; the operation control unit is electrically connected to the signal analyzer to receive each of the amplitude signals, and compare each of the amplitude signals with a preset standard value Compare to judge whether the packaged antenna is a good product.
較佳地,每一個該標準天線具有一編號i,該訊號分析儀根據編號i的各該標準天線所接收到的該輻射電磁波的振幅對應產生編號i的一振幅信號Ai,其中,變數i為1~N中任一整數,該運算控制單元將編號i的振幅信號Ai與編號i的預設標準值Si相比對,若每一個該振幅信號Ai與該預設標準值Si間的差值皆小於一閥值SD(i),則判斷該封裝天線為良品。Preferably, each of the standard antennas has a number i, and the signal analyzer generates an amplitude signal Ai of the number i according to the amplitude of the radiated electromagnetic waves received by the standard antennas of the number i, wherein the variable i is Any integer from 1 to N, the arithmetic control unit compares the amplitude signal Ai of the number i with the preset standard value Si of the number i, if the difference between the amplitude signal Ai and the preset standard value Si of each If both are less than a threshold SD(i), the packaged antenna is judged to be a good product.
另一種封裝天線良率檢測裝置,供檢測一封裝天線是否為良品,包含有: 一測試箱,具有一測試窗戶,該測試窗戶用來讓一封裝天線的電磁波穿透入該測試箱內 一測試載板,包含有一射頻訊號線以電連接該封裝天線; N個標準天線,分別間隔設置在該測試箱內部的不同位置,N是大於或等於2的正整數;以及一測試機,包括一訊號產生器、一訊號分析儀及一運算控制單元;該射頻訊號線一端與該封裝天線電連接,另一端與該訊號分析儀電連接;該訊號產生器電連接每一個該標準天線,並透過每一個該標準天線發射一測試信號;該訊號分析儀透過該測試載板及該封裝天線接收各該測試信號,並根據各該測試信號的振幅產生相對應的一振幅信號; 該運算控制單元電連接該訊號分析儀以接收各該振幅信號,且將各該振幅信號與一預設標準值相比對以判斷該封裝天線是否為良品。Another packaged antenna yield detection device is used to detect whether a packaged antenna is a good product, including: A test box with a test window for allowing electromagnetic waves of a packaged antenna to penetrate into the test box a test carrier board, including a radio frequency signal line to electrically connect the packaged antenna; N standard antennas, respectively arranged at different positions inside the test box, N is a positive integer greater than or equal to 2; and a test machine, including a signal generator, a signal analyzer and an arithmetic control unit; the radio frequency One end of the signal line is electrically connected to the packaged antenna, and the other end is electrically connected to the signal analyzer; the signal generator is electrically connected to each of the standard antennas, and transmits a test signal through each of the standard antennas; the signal analyzer transmits a test signal through the The test carrier board and the package antenna receive each test signal, and generate a corresponding amplitude signal according to the amplitude of each test signal; the operation control unit is electrically connected to the signal analyzer to receive each of the amplitude signals, and converts each of the amplitude signals The amplitude signal is compared with a preset standard value to determine whether the packaged antenna is a good product.
較佳地,每一個該標準天線具有一編號i,該訊號產生器透過編號i的各該標準天線發射編號i的一測試信號,其中變數i=1~N,該訊號分析儀接收編號i的該測試信號,並根據接收後的編號i的該測試信號對應產生編號i的一振幅信號Ai,該運算控制單元將編號i的振幅信號Ai與編號i的預設標準值Si相比對,若每一個該振幅信號Ai與該預設標準值Si間的差值皆小於一閥值SD(i),則判斷該封裝天線為良品。Preferably, each of the standard antennas has a number i, the signal generator transmits a test signal of number i through each of the standard antennas of number i, wherein the variable i=1~N, the signal analyzer receives the signal of number i the test signal, and correspondingly generate an amplitude signal Ai of number i according to the received test signal of number i, the arithmetic control unit compares the amplitude signal Ai of number i with the preset standard value Si of number i, if Each difference between the amplitude signal Ai and the preset standard value Si is smaller than a threshold SD(i), and the packaged antenna is judged to be a good product.
較佳地,該測試箱包括一頂板、一底板及四片側板,該四片側板圍繞設置於該頂板及該底板之間,並分別連接於該頂板及該底板的四邊,該測試窗戶設置於該頂板上。Preferably, the test box includes a top plate, a bottom plate and four side plates, the four side plates are arranged around the top plate and the bottom plate, and are respectively connected to the four sides of the top plate and the bottom plate, and the test window is disposed in the the top plate.
較佳地,本發明包含至少一反射鏡,該至少一反射鏡設置於該測試箱中且分別貼附於該四側板上。Preferably, the present invention includes at least one reflection mirror, which is disposed in the test box and attached to the four side plates respectively.
較佳地,該測試載板還包括一基頻控制線,該基頻控制線的一端電連接該封裝天線,另一端用以接收一波束切換控制信號。Preferably, the test carrier board further includes a baseband control line, one end of the baseband control line is electrically connected to the packaged antenna, and the other end is used for receiving a beam switching control signal.
與現有技術相比,本發明具有的有益效果是︰Compared with the prior art, the beneficial effects that the present invention has are:
利用設置在該測試箱內的N個(N=2、3、4、5…)標準天線與該封裝天線兩者間做無線電磁波的收發,並以測試機將N個振幅信號與預設標準值做簡單的比對就能相較傳統技術只從一個角度量測得到更精準的結果,且降低封裝天線檢測所耗費的時間,另一方面,由於本發明是用來大量逐一檢測封裝天線出廠品質是否合格,而非精準量測輻射場型,所以本發明的測試箱內甚至也不需要貼昂貴的吸波材料,因此相較傳統天線場型量測更具低成本、易建置、可移動的優勢。Use N (N=2, 3, 4, 5...) standard antennas set in the test box and the package antenna to send and receive wireless electromagnetic waves, and use the test machine to compare the N amplitude signals with the preset standard By simply comparing the values, more accurate results can be obtained by measuring from only one angle compared to the traditional technology, and the time spent on packaged antenna testing can be reduced. Whether the quality is qualified or not is not an accurate measurement of the radiation pattern, so the test box of the present invention does not even need to paste expensive absorbing materials, so compared with the traditional antenna pattern measurement, it is more low-cost, easy to build, and can be Mobile advantage.
參閱圖1及圖2,於第一較佳實施例中,本發明封裝天線良率檢測裝置用以檢測一封裝天線(Antenna in Package Device, AiP)1的良率,本發明包含一測試箱2、一測試載板3、N個標準天線4及一測試機5,在第一較佳實施例中,該封裝天線1作為發射天線而該N個標準天線4作為接收天線。Referring to FIG. 1 and FIG. 2 , in a first preferred embodiment, the package antenna yield detection device of the present invention is used to detect the yield of an antenna in package device (AiP) 1 , and the present invention includes a
該測試箱2為可活動式的結構,可折疊收闔而呈平板狀或是撐開而呈箱型,也可以是固定式的長方箱型,該測試箱2包括一頂板21、一底板22及四片側板23。該四側板23圍繞設置於該頂板21及該底板22之間,並分別連接於該頂板21及該底板22的四邊,該頂板21有一測試窗戶211,該測試窗戶211供用以讓該封裝天線1所發出的電磁波W穿透入該測試箱2內。The
該N個標準天線4分別間隔地設置在該測試箱2內部的不同位置,N是大於或等於2的正整數。圖3顯示的是N=3的實施態樣,圖4顯示的是N=4的實施態樣,即四個標準天線4設置於該測試箱2的底板22,圖5顯示的是N=8的實施態樣,即其中四個標準天線4設置於該測試箱2的底板22,另外四個標準天線4分別設置於該測試箱2內的四片側板23。The N
該測試機5如圖2所示包括一訊號產生器51、一訊號分析儀52、一運算控制單元53、一可程式化邏輯控制器(Programmable Logic Controller, PLC)54及一電源供應器55,其中,該訊號產生器51、該訊號分析儀52及該運算控制單元53分別電連接該可程式化邏輯控制器54。As shown in FIG. 2 , the
請配合參看圖1及圖3,該測試載板3設置於該頂板21上,該測試載板3上設置有一封裝測試基座10,該封裝測試基座10用以設置該封裝天線1,該封裝天線1可外露於該封裝測試基座10的底面,將該封裝天線1固定於該測試箱2的該測試窗戶211處,使該封裝天線1面向設置於該測試箱2中的該N個標準天線4,且該訊號產生器51及該運算控制單元53設置於該測試載板3上。該測試載板3包括一射頻訊號線31及一基頻控制線32,該射頻訊號線31的一端電連接該封裝天線1,該射頻訊號線31的另一端電連接該訊號產生器51,該測試機5還可以透過該射頻訊號線31以傳導的方式量測該封裝天線1的射頻傳導特性參數(例如S參數),該基頻控制線32的一端電連接該封裝天線1,該基頻控制線32的另一端用以接收該運算控制單元53所傳輸的一波束切換控制信號,該波束切換控制信號用以控制該封裝天線1的波束成型,此外,該測試機5還可以透過該基頻控制線32量取該封裝天線1的基頻特性參數(例如直流位準驗證及供給)。Please refer to FIG. 1 and FIG. 3 , the
該訊號分析儀52電連接每一個該標準天線4,並透過每一個該標準天線4去接收該封裝天線1所產生的一輻射電磁波,每一個該標準天線4具有一編號i,該訊號分析儀52根據該編號i的各該標準天線4所接收到的該輻射電磁波的振幅對應產生編號i的一振幅信號Ai,其中,變數i為1~N中任一整數。The
該運算控制單元53將編號i的該振幅信號Ai與編號i的一預設標準值Si相比對以檢測該封裝天線1是否為良品,若每一個該振幅信號Ai與相對應的該預設標準值Si間的差值皆小於一閥值SD(i)則判斷該封裝天線1品質良好,為良品,反之則判斷該封裝天線1存在損壞,為不良品。如此判斷的原因在於本發明可應用在於封裝天線經由產線製造後的逐一檢測流程,在量產前可以先選取已知良好的一封裝天線1,並經由本實施例量得對應編號i=1~N的該振幅信號Ai,其中,每一個該標準天線4接收良好的該封裝天線1所發射的一輻射電磁波,該訊號分析儀52根據編號i的各該標準天線4所接收到的該輻射電磁波的振幅,產生良好的該封裝天線1對應編號i=1~N的該振幅信號Ai,並依序當作編號i=1~N的該預設標準值Si,而如果是良品的該封裝天線1所量到對應編號i的各該振幅信號Ai會與對應編號i的各該預設標準值Si趨近一致,較佳地,各該振幅信號Ai可幾乎等於各該預設標準值Si,相對地,非良品的該封裝天線1所量到的各該振幅信號Ai中,其中至少會有一個或多個顯著地偏離各該預設標準值Si,也就是至少一個|Ai-Si|> SD(i),i=1~N的任一者。The
另外,該訊號分析儀52可以是如圖1所示的多連接埠,透過各連接埠與每一個該標準天線4電連接,該訊號分析儀52也可以如圖6所示的單連接埠再串接一個1×N的訊號切換開關521在該N個標準天線4與該訊號分析儀52之間,使該訊號分析儀52透過該訊號切換開關521與該N個標準天線4電連接。In addition, the
圖7是本發明的第二較佳實施例,第二較佳實施例與第一較佳實施例的差異在於︰該N個(N=7)標準天線4作為發射天線而該封裝天線1作為接收天線,該訊號分析儀52及該運算控制單元53設置於該測試載板3上,該訊號產生器51電連接每一個該標準天線4,並透過編號i的各該標準天線4發射編號i的一測試信號,其中變數i=1~N,而該射頻訊號線31的一端電連接該封裝天線1,另一端電連接該訊號分析儀52,該訊號分析儀52透過該測試載板3及該封裝天線1去接收編號i的該測試信號,並對應接收後的編號i的該測試信號產生編號i的一振幅信號Ai。7 is a second preferred embodiment of the present invention. The difference between the second preferred embodiment and the first preferred embodiment is that the N (N=7)
同樣地,該運算控制單元53將編號i的該振幅信號Ai與編號i的一預設標準值Si相比對以檢測該封裝天線1是否為良品,若每一個該振幅信號Ai與相對應的該預設標準值Si間的差值皆小於一閥值SD(i)則判斷該封裝天線1良好,反之則損壞。而於本發明的第二較佳實施例中,該預設標準值Si是選取已知良好的一封裝天線1,並經由本實施例量得對應編號i=1~N的該振幅信號Ai,其中,該訊號產生器51透過編號i的各該標準天線4發射編號i的一測試信號,其中變數i=1~N,該訊號分析儀52根據良好的該封裝天線1所接收的編號i的該測試信號,對應產生編號i的一振幅信號Ai,並依序當作編號i=1~N的該預設標準值Si。Likewise, the
參閱圖8及圖9,是本發明第三較佳實施例的示意圖,第三較佳實施例相較第一或第二較佳實施例進一步包括︰分別貼附於該等側板23的兩反射鏡9。該兩反射鏡可為平面鏡或凹面鏡,而於圖8中各該反射鏡9以平面鏡表示,於圖9中各該反射鏡9以凹面鏡表示,該兩反射鏡9用來將該封裝天線1所偏向該等側板23的輻射波束反射到該N個標準天線4,如此,該運算控制單元6更可以透過該等標準天線4蒐集該封裝天線1於各種不同波束成型(beamforming)時直接入射或是反射的多種環境訊號,並加以儲存形成大數據資料庫,特別是將已判斷為不良品的該封裝天線1於各種波束切換時該N個標準天線4所收到來自該封裝天線1的多個訊號儲存,並利用人工智慧(AI)技術歸納出不良品的該封裝天線1大多是切換到何種波束型態時發生錯誤,並由此倒推如圖10所示該封裝天線1的所有封裝天線切換開關11~14中的哪一個或多個在製程中損壞。Referring to FIG. 8 and FIG. 9 , it is a schematic diagram of a third preferred embodiment of the present invention. Compared with the first or second preferred embodiment, the third preferred embodiment further includes: two reflectors attached to the
與現有技術相比,本發明封裝天線良率檢測裝置具有的有益效果是︰Compared with the prior art, the beneficial effects of the package antenna yield detection device of the present invention are:
(1)、利用設置在該測試箱2內的N個(N=2、3、4、5…)標準天線4與該封裝天線1兩者間做無線電磁波的收發,再以該運算控制單元53將N個振幅信號Ai與預設標準值Si做簡單的比對,就能取得相較於圖11所示的先前技術技術只從一個角度量測得到更精準的結果,且降低封裝天線檢測所耗費的時間,另一方面,由於本發明是用來大量逐一檢測封裝天線出廠的品質是否合格,而非精準量測封裝天線的輻射場型,所以本發明中的該測試箱2內不需要貼附昂貴的吸波材料,因此相較傳統天線場型量測更具低成本、易建置、可移動的優勢。(1) Use the N (N=2, 3, 4, 5...)
(2)、相較傳統技術更可以如前所述判斷該封裝天線1的所有封裝天線切換開關11~14中的哪一個或多個開關在製程中損壞。(2) Compared with the conventional technology, it is possible to determine which one or more switches of all the antenna-in-package switching switches 11 to 14 of the antenna-in-
惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單地等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。However, the above are only examples of the present invention, and should not limit the scope of implementation of the present invention. Any simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the contents of the patent specification are still included in the scope of the present invention. within the scope of the invention patent.
1,140:封裝天線
10:封裝測試基座
11~14:封裝天線切換開關
2:測試箱
21:頂板
211:測試窗戶
22:底板
23:側板
3,150:測試載板
31:射頻訊號線
32:基頻控制線
4,120:標準天線
5:測試機
51:訊號產生器
52:訊號分析儀
521:訊號切換開關
53:運算控制單元
54:可程式化邏輯控制器
55:電源供應器
9:反射鏡
110:隔離箱
111:開口
130:網路分析儀
Ai:振幅信號
Si:預設標準值
SD(i):閥值
W:電磁波1,140: Package Antenna
10:
圖1是本發明封裝天線良率檢測裝置第一較佳實施例的剖面側視示意圖。 圖2是第一較佳實施例的測試機的方塊示意圖。 圖3是本發明第一較佳實施例的局部示意圖。 圖4是本發明第一較佳實施例的示意圖,說明標準天線的數量是4個。 圖5是本發明第一較佳實施例的示意圖,說明標準天線的數量是8個。 圖6是本發明第一較佳實施例更包括一切換開關的示意圖。 圖7是本發明第二較佳實施例的剖面側視示意圖。 圖8是本發明第三較佳實施例更包括多個平面反射鏡的示意圖。 圖9是本發明第三較佳實施例更包括多個凹面反射鏡的示意圖。 圖10是封裝天線的示意圖。 圖11是一種傳統封裝天線良率檢測裝置的示意圖。FIG. 1 is a schematic cross-sectional side view of a first preferred embodiment of a package antenna yield detection device according to the present invention. FIG. 2 is a block diagram of the testing machine of the first preferred embodiment. FIG. 3 is a partial schematic view of the first preferred embodiment of the present invention. FIG. 4 is a schematic diagram of the first preferred embodiment of the present invention, illustrating that the number of standard antennas is four. FIG. 5 is a schematic diagram of the first preferred embodiment of the present invention, illustrating that the number of standard antennas is eight. FIG. 6 is a schematic diagram of the first preferred embodiment of the present invention further including a switch. 7 is a schematic cross-sectional side view of a second preferred embodiment of the present invention. FIG. 8 is a schematic diagram of the third preferred embodiment of the present invention further including a plurality of flat mirrors. FIG. 9 is a schematic diagram of a third preferred embodiment of the present invention further including a plurality of concave mirrors. 10 is a schematic diagram of a packaged antenna. FIG. 11 is a schematic diagram of a conventional package antenna yield detection apparatus.
1:封裝天線1: encapsulated antenna
10:封裝測試基座10: Package test base
2:測試箱2: Test box
21:頂板21: Top plate
211:測試窗戶211: Test Windows
22:底板22: Bottom plate
23:側板23: Side panels
3:測試載板3: Test carrier board
31:射頻訊號線31: RF signal line
32:基頻控制線32: Base frequency control line
4:標準天線4: Standard Antenna
5:測試機5: Test machine
51:訊號產生器51: Signal generator
52:訊號分析儀52: Signal Analyzer
53:運算控制單元53: Operation control unit
W:電磁波W: electromagnetic wave
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