CN107782746A - Material reflectance test system based on vector network analysis - Google Patents

Material reflectance test system based on vector network analysis Download PDF

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Publication number
CN107782746A
CN107782746A CN201711009582.XA CN201711009582A CN107782746A CN 107782746 A CN107782746 A CN 107782746A CN 201711009582 A CN201711009582 A CN 201711009582A CN 107782746 A CN107782746 A CN 107782746A
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CN
China
Prior art keywords
wave
absorber
vector network
electromagnetic horn
test system
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CN201711009582.XA
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Chinese (zh)
Inventor
阳安源
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Sichuan Laiyuan Technology Co Ltd
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Sichuan Laiyuan Technology Co Ltd
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Priority to CN201711009582.XA priority Critical patent/CN107782746A/en
Publication of CN107782746A publication Critical patent/CN107782746A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The invention discloses a kind of material reflectance test system based on vector network analysis, including arch frame, being provided with arch frame can be along the transmitting electromagnetic horn and reception electromagnetic horn that the arcuate edge of arch frame moves, the first wave-absorber is provided with below arch frame, the second wave-absorber is additionally provided with above first wave-absorber, first wave-absorber and the second wave-absorber are that multiple bullets are consecutively arranged to form, sample arm is provided with second wave-absorber, transmitting electromagnetic horn is connected with directional coupler, directional coupler is connected with vector network analyzer, electromagnetic horn is received with vector network analyzer to be connected.Present invention introduces the wedge area that the second wave-absorber can more introduce the interference signal in space bullet, multiple reflections not only each occur in the first wave-absorber and in the second wave-absorber simultaneously, it will also be possible to the ripple reflected from the second wave-absorber, it is re-introduced into the first wave-absorber, assimilation effect is enhanced, greatly reduces the influence of testing background.

Description

Material reflectance test system based on vector network analysis
Technical field
The present invention relates to testing of materials field, and in particular to the material reflectance test system based on vector network analysis.
Background technology
Vector network analysis is to frequency scanning and the amplitude and phase of power scan test signal by measuring cell Influence carrys out a kind of method of accurate Characterization element characteristics.Network analysis refers to compared with the electricity of element used and circuit in complication system The process that device performance measures.During signal of these systems transmission with the information content, we are most concerned with as how most High efficiency and minimum distortion make signal pass to another place at one.Vector network analyzer is microwave and millimeter wave field of test instrument In a kind of mostly important, high-accuracy intelligent tester for being most widely used, in the industry cycle enjoy that " microwave/millimeter wave is tested The good reputation of the king of instrument ", it is mainly used in the characteristic letter such as amplitude-frequency, phase frequency and group delay of the two-way S parameter of tested network scattering parameters The measurement of breath, it is widely used in the development of New Generation Military electronics, production, maintenance and metering using phased-array radar as representative Deng field, precise guidance, stealthy and anti-stealthy, Aero-Space, satellite communication, radar detecting and monitoring, religion can also be applied to Learn experiment and the numerous areas such as antenna and RCS tests, component testing, testing of materials.
The present invention is namely based on the system that vector network analyzer is detected to the reflectivity of material.
The content of the invention
The technical problems to be solved by the invention are, and it is an object of the present invention to provide a kind of material reflection based on vector network analysis Rate test system, the test system can more introduce the interference signal in space the wedge area of bullet, increase reflection Number, assimilation effect is enhanced, greatly reduce the influence of testing background.
The present invention is achieved through the following technical solutions:
Material reflectance test system based on vector network analysis, including arch frame, being provided with arch frame being capable of edge The transmitting electromagnetic horn of the arcuate edge movement of arch frame and receive electromagnetic horn, the first suction ripple is provided with below arch frame Body, the first wave-absorber top are additionally provided with the second wave-absorber, and the first wave-absorber and the second wave-absorber are that multiple bullets are continuous Arrangement forms, and is provided with sample arm on the second wave-absorber, and transmitting electromagnetic horn is connected with directional coupler, directional coupler and Vector network analyzer is connected, and receives electromagnetic horn and is connected with vector network analyzer.
Present invention introduces the wedge area that the second wave-absorber can more introduce the interference signal in space bullet, together When not only in the first wave-absorber and the second wave-absorber in each occur multiple reflections, will also be possible to reflect from the second wave-absorber The ripple gone out, it is re-introduced into the first wave-absorber, enhances assimilation effect, greatly reduces the influence of testing background.The present invention Implementation such as existing test system, so repeating no more.
The bullet of the bullet of first wave-absorber and the second wave-absorber is Heterogeneous Permutation.The setting of Heterogeneous Permutation can increase Add the order of reflection between the first wave-absorber and the second wave-absorber, avoid signal from being escaped in reflection process, improve absorption effect Fruit.
Vector network analyzer is also associated with computer.
It is pyramid loudspeaker to launch electromagnetic horn and receive electromagnetic horn.
Double ridge structures are provided with transmitting electromagnetic horn.
The present invention compared with prior art, has the following advantages and advantages:
Present invention introduces the wedge area that the second wave-absorber can more introduce the interference signal in space bullet, together When not only in the first wave-absorber and the second wave-absorber in each occur multiple reflections, will also be possible to reflect from the second wave-absorber The ripple gone out, it is re-introduced into the first wave-absorber, enhances assimilation effect, greatly reduces the influence of testing background.
Brief description of the drawings
Accompanying drawing described herein is used for providing further understanding the embodiment of the present invention, forms one of the application Point, do not form the restriction to the embodiment of the present invention.In the accompanying drawings:
Fig. 1 is schematic structural view of the invention.
Mark and corresponding parts title in accompanying drawing:
1- arch frames, 2- transmitting electromagnetic horns, 3- reception electromagnetic horns, 4- directional couplers, 5- vector network analyzers, 6- sample arms, 7- computers, the wave-absorbers of 8- first, the wave-absorbers of 9- second.
Embodiment
For the object, technical solutions and advantages of the present invention are more clearly understood, with reference to embodiment and accompanying drawing, to this Invention is described in further detail, and exemplary embodiment of the invention and its explanation are only used for explaining the present invention, do not make For limitation of the invention.
Embodiment 1
As shown in figure 1, the material reflectance test system based on vector network analysis, including arch frame 1, on arch frame 1 Being provided with can be along the transmitting electromagnetic horn 2 and reception electromagnetic horn 3 that the arcuate edge of arch frame 1 moves, the lower section of arch frame 1 The first wave-absorber 8 is provided with, the top of the first wave-absorber 8 is additionally provided with the second wave-absorber 9, the first wave-absorber 8 and the second wave-absorber 9 It is that multiple bullets are consecutively arranged to form, sample arm 6, transmitting electromagnetic horn 2 and orientation coupling is provided with the second wave-absorber 9 Clutch 4 is connected, and directional coupler 4 is connected with vector network analyzer 5, receives electromagnetic horn 3 and the phase of vector network analyzer 5 Even.
Present invention introduces the wedge area that the second wave-absorber 9 can more introduce the interference signal in space bullet, Multiple reflections each not only occur in the first wave-absorber 8 and in the second wave-absorber 9 simultaneously, will also be possible to from the second wave-absorber 9 On the ripple that reflects, be re-introduced into the first wave-absorber 8, enhance assimilation effect, greatly reduce the influence of testing background. The implementation of the present invention is such as existing test system, so repeating no more.
Embodiment 2
The bullet of the bullet of first wave-absorber 8 and the second wave-absorber 9 is Heterogeneous Permutation.The setting of Heterogeneous Permutation can Increase the order of reflection between the first wave-absorber 8 and the second wave-absorber 9, avoid signal from being escaped in reflection process, improve suction Produce effects fruit.
Vector network analyzer 5 is also associated with computer 7.
It is pyramid loudspeaker to launch electromagnetic horn 2 and receive electromagnetic horn 3.
Double ridge structures are provided with transmitting electromagnetic horn 2.
Above-described embodiment, the purpose of the present invention, technical scheme and beneficial effect are carried out further Describe in detail, should be understood that the embodiment that the foregoing is only the present invention, be not intended to limit the present invention Protection domain, within the spirit and principles of the invention, any modification, equivalent substitution and improvements done etc., all should include Within protection scope of the present invention.

Claims (5)

1. the material reflectance test system based on vector network analysis, it is characterised in that including arch frame (1), arch frame (1) On be provided with can along arch frame (1) arcuate edge move transmitting electromagnetic horn (2) and reception electromagnetic horn (3), arch The first wave-absorber (8) is provided with below frame (1), the second wave-absorber (9) is additionally provided with above the first wave-absorber (8), first inhales Ripple body (8) and the second wave-absorber (9) are that multiple bullets are consecutively arranged to form, and the second wave-absorber is provided with sample branch on (9) Frame (6), transmitting electromagnetic horn (2) are connected with directional coupler (4), directional coupler (4) and vector network analyzer (5) phase Even, electromagnetic horn (3) is received with vector network analyzer (5) to be connected.
2. the material reflectance test system according to claim 1 based on vector network analysis, it is characterised in that first The bullet of wave-absorber (8) and the bullet of the second wave-absorber (9) are Heterogeneous Permutation.
3. the material reflectance test system according to claim 1 based on vector network analysis, it is characterised in that vector Network Analyzer (5) is also associated with computer (7).
4. the material reflectance test system according to claim 1 based on vector network analysis, it is characterised in that transmitting Electromagnetic horn (2) and reception electromagnetic horn (3) are pyramid loudspeaker.
5. the material reflectance test system according to claim 4 based on vector network analysis, it is characterised in that transmitting Double ridge structures are provided with electromagnetic horn (2).
CN201711009582.XA 2017-10-25 2017-10-25 Material reflectance test system based on vector network analysis Pending CN107782746A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711009582.XA CN107782746A (en) 2017-10-25 2017-10-25 Material reflectance test system based on vector network analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711009582.XA CN107782746A (en) 2017-10-25 2017-10-25 Material reflectance test system based on vector network analysis

Publications (1)

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CN107782746A true CN107782746A (en) 2018-03-09

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111239165A (en) * 2020-01-22 2020-06-05 西北核技术研究院 Antenna surface material high power impulse response testing arrangement
CN113189121A (en) * 2021-05-11 2021-07-30 中北大学 Dynamic test system and method for reflectivity of wave-absorbing material of self-adaptive time domain gate

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1079592A (en) * 1996-09-05 1998-03-24 Fujitsu Ltd Blackbody for eliminating background signal and method for measuring spectrum using it
CN201266180Y (en) * 2008-07-30 2009-07-01 电子科技大学 Measuring apparatus for reflection index of wave suction material
CN202328554U (en) * 2011-12-05 2012-07-11 Tcl空调器(中山)有限公司 Novel muffler
CN203658500U (en) * 2013-12-27 2014-06-18 深圳市计量质量检测研究院 Anechoic chamber
CN105352978A (en) * 2015-11-26 2016-02-24 电子科技大学 Handheld wave-absorbing material reflectivity measuring device
CN106770374A (en) * 2016-11-30 2017-05-31 北京无线电计量测试研究所 A kind of absorbing material reflecting measurement device and method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1079592A (en) * 1996-09-05 1998-03-24 Fujitsu Ltd Blackbody for eliminating background signal and method for measuring spectrum using it
CN201266180Y (en) * 2008-07-30 2009-07-01 电子科技大学 Measuring apparatus for reflection index of wave suction material
CN202328554U (en) * 2011-12-05 2012-07-11 Tcl空调器(中山)有限公司 Novel muffler
CN203658500U (en) * 2013-12-27 2014-06-18 深圳市计量质量检测研究院 Anechoic chamber
CN105352978A (en) * 2015-11-26 2016-02-24 电子科技大学 Handheld wave-absorbing material reflectivity measuring device
CN106770374A (en) * 2016-11-30 2017-05-31 北京无线电计量测试研究所 A kind of absorbing material reflecting measurement device and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111239165A (en) * 2020-01-22 2020-06-05 西北核技术研究院 Antenna surface material high power impulse response testing arrangement
CN113189121A (en) * 2021-05-11 2021-07-30 中北大学 Dynamic test system and method for reflectivity of wave-absorbing material of self-adaptive time domain gate
CN113189121B (en) * 2021-05-11 2024-04-16 中北大学 Dynamic test method for reflectivity of wave-absorbing material of self-adaptive time domain door

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Application publication date: 20180309