TW202145859A - Weight optimized stiffener and sealing structure for direct liquid cooled modules - Google Patents
Weight optimized stiffener and sealing structure for direct liquid cooled modules Download PDFInfo
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
- H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
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Abstract
Description
互補金屬氧化物半導體(「CMOS」)電路存在於包括微處理器、電池及數位相機影像感測器之若干類型的電子部件中。CMOS技術之主要特點為低靜態功耗及高抗雜訊性。Complementary Metal Oxide Semiconductor ("CMOS") circuits are found in several types of electronic components including microprocessors, batteries, and digital camera image sensors. The main features of CMOS technology are low static power consumption and high noise immunity.
除了工業標準的晶片封裝之外,專用矽之探索可能在伺服器中導致高功率熱源。此技術亦可應用至圖形處理單元(「GPU」)及定製特殊應用積體電路(「ASIC」)。此外,諸如成像及人工智慧(「AI」)等服務將可能需要高密度之大量計算資源,其中許多伺服器彼此非常接近。全球各地之資料中心皆被要求同時提高能效、整合運營及降低成本。為了適應此等高效能且高密度的伺服器,資料中心運營商不僅必須設法解決不斷提高之功率密度,還必須設法解決其帶來的熱挑戰。In addition to industry-standard chip packaging, the search for specialized silicon can lead to high-power heat sources in servers. This technology can also be applied to graphics processing units ("GPUs") and custom application-specific integrated circuits ("ASICs"). In addition, services such as imaging and artificial intelligence ("AI") will likely require high densities of massive computing resources, with many servers in close proximity to each other. Data centers around the world are being asked to simultaneously improve energy efficiency, consolidate operations and reduce costs. To accommodate these high-performance and high-density servers, data center operators must address not only the ever-increasing power density, but also the thermal challenges it brings.
因為液體在儲存及傳遞熱方面比空氣擅長許多倍,所以液體冷卻解決方案可為計算效率、密度及效能提供即時且可量測之益處。使用直接液體冷卻模組可提高計算效能及密度,並降低能耗。Because liquids are many times better at storing and transferring heat than air, liquid cooling solutions can provide immediate and measurable benefits in computing efficiency, density, and performance. Using direct liquid cooling modules can increase computing performance and density, and reduce energy consumption.
電子部件封裝經受廣範圍之溫差。由於各種封裝部件之熱膨脹係數(「CTE」)的差異,電子部件封裝可能隨著電子部件封裝的溫度改變而翹曲。Electronic component packages are subjected to a wide range of temperature differences. Due to differences in coefficients of thermal expansion ("CTE") of various packaged components, electronic component packages may warp as the temperature of the electronic component package changes.
本揭示提供一種重量最佳化加強件,該重量最佳化加強件為無蓋封裝提供翹曲控制,同時實現晶片及/或基板之直接液體冷卻。加強件可由重量最佳化材料構成,並且其幾何特徵可進一步實現重量最佳化。加強件之重量最佳化減小其熱質量以及在將加強件附接至電路總成期間的重量集中影響。The present disclosure provides a weight-optimized stiffener that provides warpage control for lidless packages while enabling direct liquid cooling of the chip and/or substrate. The stiffener may be constructed of a weight-optimized material, and its geometrical features may be further weight-optimized. Weight optimization of the stiffener reduces its thermal mass and weight concentration effects during attachment of the stiffener to the circuit assembly.
本揭示之一個態樣提供一種裝置,其包含重量最佳化加強件,該重量最佳化加強件具有頂表面、底表面、不規則形狀之外周邊以及形成穿過頂表面及底表面之孔的內周邊,其中該孔適用於接納基板的藉由黏著劑耦接至加強件之底表面的一部分。加強件可由鋁基質中的碳化矽顆粒形成。根據一些示例,該裝置可進一步包括藉由黏著劑耦接至加強件之底表面的基板,該基板的一部分突起至加強件之孔中。例如,加強件之底表面可具有用於接納基板上的至少一個突起之至少一個凹部。根據其他示例,加強件之底表面具有自其延伸的複數個突起,當基板耦接至加強件之底表面時,該等突起鄰近基板之外側表面。該裝置可進一步包括耦接至加強件之頂表面的頂板以及用於在加強件與頂板之間提供密封的O形環。在加強件具有與頂板中之複數個孔洞對應的複數個孔洞之情況下,加強件中之複數個孔洞中的每一孔洞可與頂板中之複數個孔洞中的對應一個孔洞形成一對,複數個孔洞中的每一對孔洞適於接納緊固件的穿過其中之一部分以用於將頂板耦接至加強件。頂板可在其內表面中具有凹槽,該凹槽經組態以在頂板耦接至加強件時保持O形環。One aspect of the present disclosure provides a device including a weight-optimized stiffener having a top surface, a bottom surface, an irregularly shaped outer perimeter, and holes formed through the top and bottom surfaces , wherein the hole is adapted to receive a portion of the bottom surface of the substrate coupled to the stiffener by the adhesive. The reinforcement may be formed from silicon carbide particles in an aluminum matrix. According to some examples, the device may further include a substrate coupled to the bottom surface of the stiffener by an adhesive, a portion of the substrate protruding into the hole of the stiffener. For example, the bottom surface of the stiffener may have at least one recess for receiving at least one protrusion on the base plate. According to other examples, the bottom surface of the stiffener has a plurality of protrusions extending therefrom that are adjacent to the outer side surface of the substrate when the substrate is coupled to the bottom surface of the stiffener. The apparatus may further include a top plate coupled to the top surface of the stiffener and an O-ring for providing a seal between the stiffener and the top plate. In the case where the reinforcing member has a plurality of holes corresponding to the plurality of holes in the top plate, each hole of the plurality of holes in the reinforcing member may form a pair with a corresponding one of the plurality of holes in the top plate, the plurality of Each pair of the holes is adapted to receive a portion of the fastener therethrough for coupling the top panel to the stiffener. The top plate can have grooves in its inner surface that are configured to retain the O-rings when the top plate is coupled to the stiffener.
在一些示例中,該裝置可進一步包括歧管,該歧管經組態以位於由基板、加強件及頂板形成之封閉件內,該歧管經組態以將經冷卻的液體引導至基板。例如,當歧管處於由基板、加強件及頂板形成之封閉件內時,歧管的一部分可位於加強件之孔內並與基板直接接觸。In some examples, the device may further include a manifold configured to be located within the enclosure formed by the base plate, the stiffener, and the top plate, the manifold configured to direct the cooled liquid to the base plate. For example, when the manifold is within an enclosure formed by the base plate, the stiffener, and the top plate, a portion of the manifold may be located within the bore of the stiffener and in direct contact with the base plate.
本揭示之另一態樣提供一種總成,其包含:重量最佳化加強件,該重量最佳化加強件具有頂表面、底表面、外周邊以及形成穿過頂表面及底表面之孔的內周邊;以及基板,該基板由黏著劑耦接至加強件之底表面,該基板的一部分突起至加強件之孔中。加強件可由鋁基質中的碳化矽顆粒形成。加強件之底表面可具有用於接納基板上的至少一個突起之至少一個凹部以及自底表面延伸的複數個突起,當基板耦接至加強件之底表面時,該等突起鄰近基板之外側表面。在一些示例中,該總成可進一步包括耦接至加強件之頂表面的頂板以及用於在加強件與頂板之間提供密封的O形環。Another aspect of the present disclosure provides an assembly that includes a weight-optimized stiffener having a top surface, a bottom surface, an outer perimeter, and holes forming holes through the top and bottom surfaces an inner periphery; and a base plate coupled to the bottom surface of the stiffener by an adhesive, a portion of the base plate protruding into the hole of the stiffener. The reinforcement may be formed from silicon carbide particles in an aluminum matrix. The bottom surface of the stiffener may have at least one recess for receiving at least one protrusion on the base plate and a plurality of protrusions extending from the bottom surface adjacent the outer side surface of the base plate when the base plate is coupled to the bottom surface of the stiffener . In some examples, the assembly may further include a top plate coupled to the top surface of the stiffener and an O-ring for providing a seal between the stiffener and the top plate.
本揭示之又一態樣提供一種組裝半導體裝置的方法,該半導體裝置用於向直接液體冷卻模組提供翹曲控制。該方法包括:提供重量最佳化加強件,該重量最佳化加強件具有頂表面、底表面、外周邊以及形成穿過頂表面及底表面之中心孔的內周邊;提供具有頂表面的基板,該基板在頂表面的至少第一區域上包括電路;以及將基板之頂表面耦接至加強件之底表面,使得可穿過加強件之孔接達基板的頂表面之第一區域。Yet another aspect of the present disclosure provides a method of assembling a semiconductor device for providing warpage control to a direct liquid cooling module. The method includes: providing a weight-optimized stiffener having a top surface, a bottom surface, an outer perimeter, and an inner perimeter forming a central hole through the top and bottom surfaces; providing a substrate having a top surface , the substrate includes circuitry on at least a first region of the top surface; and couples the top surface of the substrate to the bottom surface of the stiffener so that the first region of the top surface of the substrate is accessible through the holes of the stiffener.
圖1為半導體裝置之封裝子總成100的透視圖,該封裝子總成包括利用安裝至該加強件之緊固件或螺紋硬體180而結合至加強件140的基板120。1 is a perspective view of a
加強件140具有頂表面、底表面以及穿過頂表面及底表面之孔。孔可相對於加強件140的外周邊大體上居中,但在其他示例中,孔之位置可被調整。例如,孔的大小、形狀及位置可基於下伏基板120的要穿過孔曝露之電路來調適。The
基板120可諸如藉由黏著劑或其他結合技術耦接至加強件之底表面。當基板耦接至加強件之底表面時,加強件140的一部分可覆蓋基板120之一部分。例如,基板可在其頂表面上的至少第一區域上包括電路。僅舉例而言,電路可包括微處理器、記憶體或其他晶片或部件。當基板與加強件組裝在一起時,可穿過加強件之孔接達基板的包括電路之第一區域。基板的由加強件覆蓋之部分可為例如不需要可接達的無效空間或電路。The
根據下文進一步描述的一些示例,加強件140及基板120可包括於總成中,其中頂板耦接至加強件之頂表面,並且O形環在加強件與頂板之間提供密封。According to some examples described further below, the
圖2A至圖2D示出子總成100的示例組裝方法。在圖2A中,將加強件140燒結在一起。作為一個示例,加強件可由鋁基質中的碳化矽顆粒形成。完成後處理,諸如,精修加強件之周邊,打磨其頂表面或底表面,或確保孔洞及孔符合規格。在圖2B中,將螺紋硬體180安裝至加強件140之頂表面142。在圖2C中,將基板及/或晶片結合至加強件140之底表面或下側144。在圖2D中,在將子總成100焊接至主板之前對子總成100進行濺射塗覆。雖然圖2A至圖2D提供一個示例,但應理解,可做出變化。例如,可使用除結合之外的耦接技術,可使用不同塗覆技術等。例如,加強件可塗覆或鍍覆有不同金屬或聚合物,以改良黏著性。在其他示例中,可使加強件兼容使用基於焊料或基於聚合物黏著劑的結合。2A-2D illustrate an example method of assembly of the
圖3A為加強件140之下側144的透視圖。加強件140之下側144可具有用於接納自晶片及/或基板延伸的至少一個突起的至少一個凹槽。例如,加強件中的第一凹槽及第二凹槽可經組態以接納基板的各別第一突起及第二突起。FIG. 3A is a perspective view of the
根據一個示例,自下側144延伸的突起可各自平行於加強件之中心孔的邊緣。當基板耦接至加強件之底表面時,複數個突起中的每一突起可鄰近基板的各別外側表面。在一個示例中,加強件可具有四個突起,其中每一突起經組態以在基板耦接至加強件之底表面時,鄰近於基板上的矩形晶片之各別外表面側。在其他示例中,可包括附加突起或較少突起。According to one example, the protrusions extending from the
加強件140具有不規則形狀的外周邊或周界146。孔150界定內周邊或周界148。孔150延伸穿過加強件140之頂表面142及底表面144。加強件之底表面144可在其中包括至少一個凹槽152。The
圖3A示出具有兩個凹部或凹槽152的加強件140,該兩個凹部或凹槽鄰近內周邊148之較長側。還設置自加強件140之底表面144朝向頂表面142延伸的斜坡表面149。斜坡表面149鄰近內周邊148的較短側中之每一較短側。還設置自加強件140之底表面144向外延伸的突起156。兩個突起156被示出為在加強件140的每一側上形成一對突起156,總共八個突起156自加強件140之底表面向外延伸。加強件140還包括延伸穿過其頂表面142及底表面144的周邊孔160。如圖2A所示,加強件140包括八個周邊孔160。此僅為加強件140可具有的凹部或凹槽152、突起156及周邊孔160的數目的一個示例。在其他示例中,加強件140可具有多於或少於兩個的凹部或凹槽152、多於或少於兩個的突起156以及多於或少於八個的周邊孔160。FIG. 3A shows the
加強件140之不規則形狀的外周邊146可提供重量最佳化。代替矩形外周邊,加強件140設計有圍繞每一周邊孔160的周邊曲線162。加強件的側表面上之每條曲線可為約180°,而加強件的拐角上之每條曲線可為約270°。圖3A所示之元件162的引線通向加強件140之外周邊146的拐角,而鄰近於此拐角的曲線在加強件140之前述側表面上。每條鄰近曲線162之間的空白空間在仍提供控制翹曲所需的結構區域的同時,減小加強件的重量。The irregularly shaped
硬體180穿過加強件140之周邊孔160中的每一周邊孔而被安裝。每一緊固件或硬體180具有基部184、軸186及螺紋孔洞188。為了將每一硬體180耦接至加強件140,軸186自底表面144被插入,穿過孔洞188並穿過加強件140的頂表面142,直至基部184與底表面144直接接觸為止。根據一些示例,加強件中的每一緊固件孔或孔洞對應於頂板中之各別孔或孔洞。例如,加強件中的複數個孔洞中之每一孔洞與頂板中的複數個孔洞中之各別一個孔洞形成一對。複數個孔洞中之每一對孔洞適於接納緊固件的穿過其中的一部分以用於將頂板耦接至加強件。The
可利用硬體180,該硬體可附接至微處理器,以使得其能夠在直接液體冷卻狀態下處置壓力負載,同時仍足夠輕以焊接至主板上並在大批量生產環境中處置。例如,歧管可經組態以位於由基板、加強件及頂板形成的封閉件內。歧管可經組態以將經冷卻的液體供應至基板。當歧管在由基板、加強件及頂板形成之封閉件內時,歧管的一部分可位於加強件之中心孔內,並與基板直接接觸。
如圖3B及圖4B所示,基板120耦接至加強件140的底表面144。子總成100包括基板120,該基板還包括亦可被稱為晶片的晶粒130。晶粒130可為積體電路(「IC」)晶片、系統單晶片(「SoC」)或其一部分,它們可包括各種被動及主動微電子裝置,諸如,電阻器、電容器、電感器、二極體、金屬氧化物半導體場效(「MOSFET」)電晶體、CMOS電晶體、雙極接面電晶體(「BJT」)、橫向擴散金屬氧化物矽(「LDMOS」)電晶體、高功率MOS電晶體、其他類型之電晶體或其他類型之裝置。作為示例,晶粒130可包含記憶體裝置、邏輯裝置或其他類型的電路。晶粒130被示出為結合至載體基板或基板120。基板120可為例如矽基板、塑膠基板、具有例如聚醯亞胺及銅層之可撓性基板、層壓基板、陶瓷基板、插入物或任何其他合適支撐結構。As shown in FIGS. 3B and 4B , the
基板120包括頂表面122、底表面124以及在頂表面122與底表面124之間延伸的側表面126。頂表面122還包括向外延伸的斜坡表面128,該斜坡表面形成晶片130之周界。鄰近晶片130之較長側的為突起132,該等突起亦自基板120的頂表面122向外延伸。
在將基板120之頂表面122結合至加強件之底表面144之前,可將黏著劑170層施加至基板120的頂表面及/或加強件140的底表面144。作為示例,圖4A示出被施加至基板120之頂表面122的黏著劑170。黏著劑用於將基板120及加強件140機械耦接在一起。可使用工業中使用的任何類型之黏著劑,包括但不限於天然黏著劑、合成黏著劑、乾燥黏著劑、熱塑性黏著劑、反應性黏著劑、壓敏黏著劑或任何其他常用黏著劑。Before bonding the
當在結合此等部件之前將基板120相對於加強件140定位時,基板的突起132被定位在加強件140之凹槽152內,並且基板120的側表面126被定位成鄰近於加強件140之突起132,如圖3B及圖4B所示。基板120的斜坡表面128亦被定位成與加強件140之對應斜坡表面149接觸。When the
圖4B提供結合至加強件140的基板120之透明度,其示出了加強件的中心孔150,即使當基板120結合至加強件140時,至少基板120的晶片130覆蓋中心孔150。4B provides transparency of the
子總成100可根據特定規格來設計。例如,子總成100的重量應總計小於130 g,使得球狀柵格陣列(「BGA」)在焊料回流期間不會被壓碎。在一個示例中,加強件140加上硬體或鉚釘螺母180的經最佳化重量小於50 g。在基板120或印刷電路板(PCB)上的晶片130小於25 g並且用於將基板120及晶片130結合至加強件140之黏著劑重量小於5 g的情況下,子總成100的總封裝重量為約80 g,此遠低於總封裝的最大130 g重量規格。在其他示例中,加強件140加上硬體180可大於或小於50 g,基板120上之晶片130可大於或小於25 g,並且用於將加強件140結合至基板120之黏著劑可大於或小於5 g。The
在設計子總成100的部件時,總熱質量應較低,並且傳導率應較高,以使得在不損壞其他部件的情況下,熱可自上方施加以使下伏焊料熔融。子總成100之外周邊可被設計成適配在現有托盤上。黏著劑及O形環接合部/表面應針對液態水為子總成100提供密封。子總成100的設計不應促進電解連接的部件之間的任何電偶腐蝕。出於最小化熱應力的目的,子總成100之熱膨脹應與其所結合至的基板之係數緊密匹配。When designing the components of
根據一些示例,加強件140可由AlSiC製成。螺紋硬體180可在AlSiC被製造之後附接。AlSiC為金屬陶瓷複合材料,其由分散在鋁合金基質(A)中的碳化矽顆粒(SiC)組成,如例如圖5所示。鋁基質含有大量位錯,對材料的強度負責。由於位錯的不同熱膨脹係數,位錯可由SiC顆粒在冷卻期間引入。According to some examples, the
AlSiC結合金屬的高導熱性(180 W/m K至 200 W/m K)及陶瓷的低CTE的益處。由於AlSiC的複合特徵,AlSiC為一種用於高技術熱管理的進階封裝材料。AlSiC的熱膨脹可被調整成匹配其他材料,例如,矽及砷化鎵晶片以及各種陶瓷。當在微電子裝置中用作功率半導體裝置及高密度多晶片模組之基板時,AlSiC有助於去除廢熱。AlSiC combines the benefits of the high thermal conductivity of metals (180 W/m K to 200 W/m K) and the low CTE of ceramics. Due to its composite characteristics, AlSiC is an advanced packaging material for high-tech thermal management. The thermal expansion of AlSiC can be tuned to match other materials such as silicon and gallium arsenide wafers and various ceramics. AlSiC helps remove waste heat when used in microelectronic devices as a substrate for power semiconductor devices and high-density multi-chip modules.
圖6為考慮到由AlSiC製成的加強件140之特定材料的熱比較圖。如可看出,AlSiC的熱膨脹係數為例如平面電路板(平面中)、304不鏽鋼及銅的熱膨脹係數的至少一半。AlSiC具有不到銅的一半的導熱率,但具有比電路板或304不鏽鋼高得多的導熱率。還在此等材料之間突顯根據百分比的+50℃時的應變及相對應變。FIG. 6 is a thermal comparison diagram considering the specific material of the
上文論述的圖2A陳述了加強件140被燒結在一起。AlSiC零件亦可藉由近淨形法製造,方法為藉由SiC-黏結劑漿料的金屬注射成型來創建SiC預製件,燒製以移除黏結劑,然後在壓力下用熔融鋁滲透。零件可被製造成具有足夠低的容限,以不需要進一步加工。根據其他示例,可執行加強件140之進一步處理以滿足某些規格。Figure 2A, discussed above, states that the
AlSiC為完全緻密的,沒有空隙,並且為氣密的。AlSiC可藉由熱噴塗而鍍覆有鎳及鎳金或其他金屬。陶瓷及金屬嵌入件可在鋁滲透之前插入至預製件中,從而導致氣密密封。AlSiC亦可藉由機械合金化來製備。當使用較低程度的SiC含量時,可自AlSiC片材衝壓成零件。AlSiC is completely dense, without voids, and hermetic. AlSiC can be plated with nickel and nickel gold or other metals by thermal spraying. Ceramic and metal inserts can be inserted into the preform prior to aluminum infiltration, resulting in a hermetic seal. AlSiC can also be prepared by mechanical alloying. When lower levels of SiC content are used, parts can be stamped from AlSiC sheets.
圖7A為配合總成300的組裝圖,而圖7B為配合總成300的分解圖,該分解圖示出了配合總成的部件中的每一部件。配合總成300包括子總成100的部件,即,基板120及晶片130、加強件140、黏著劑170及硬體180,以及O形環190、歧管200、頂板220及緊固件280的附加部件。7A is an assembled view of the
加強件140中的每一緊固件孔或孔洞160對應於頂板220中的各別孔或孔洞260。例如,加強件140中的複數個孔洞160中之每一孔洞與頂板220中的複數個孔洞260中之各別一個孔洞形成一對。如圖7B所示,複數個孔洞260的每對孔洞適於接納緊固件280的穿過其中的一部分,以用於接合螺紋硬體180並將頂板220耦接至加強件140。Each fastener hole or
頂板220具有如圖7C所示的頂部222以及可在圖7D的截面圖中至少部分地看到的底部224。在圖4A中有指向頂部222的箭頭,該箭頭表示將延伸穿過頂部222及底部224的流動狀態或通道,其未關於頂板220示出。凹槽230形成在頂板220之底部224中。凹槽230經組態以在頂板220耦接至加強件140時保持O形環190。在如圖7C所示的配合總成300的分解側視圖中,並且如圖7D的對應截面圖所示,可看到O形環190相對於中心孔150的位置及其在加強件140上的大致定向。The
圖7D還示出封閉件的分解圖,歧管200經組態以位於該封閉件內。如圖7A所示,當基板120、加強件140及頂板220耦接在一起時,形成封閉件。歧管200被設計成在微處理器上引導流動,以便顯著改良微處理器與工作流體之間的熱傳遞。歧管200的一部分被設計成當歧管200在由基板120、加強件140及頂板220形成之封閉件內時,位於加強件140的中心孔150內,並與基板120之晶片130直接接觸。歧管200坐置於具有流動通道的晶片130的頂部上。歧管被設計成具有用於冷卻劑的複雜交叉流動路徑,從而導致了晶片130與工作流體之間的經改良交叉流動路徑。經冷卻的流體或液體流動穿過歧管200中的入口通道205並引導至晶片130上。先前已經用於冷卻晶片130的液體穿過出口通道215排出。Figure 7D also shows an exploded view of the closure within which the
當配合總成300如圖7A所示完全組裝時,重量最佳化加強件140可藉由使用O形環190而在其頂表面142上提供密封,並藉由使用黏著劑170在其底表面144上提供密封。頂板在其內表面中具有凹槽,該凹槽經組態以當頂板耦接至加強件時保持O形環。When the
加強件140在實現晶片130及/或基板120的直接液體冷卻的同時,為無蓋封裝提供翹曲控制。加強件包含重量最佳化材料(諸如,AlSiC)及幾何特徵(諸如,不規則形狀的外周邊146)。加強件140之重量最佳化減小其熱質量以及在將加強件140附接至例如主板期間的重量集中影響。The
除非另有陳述,否則前述替代示例並不相互排斥,而是可以各種組合實施,以實現獨特優勢。因為可利用上文所論述特徵之此等及其他變化及組合,而不脫離申請專利範圍所界定之標的物,所以前述描述應係以說明申請專利範圍所界定之標的物的方式進行,而非以對其加以限制的方式進行。此外,本文所述示例的提供以及用措詞「諸如」、「包括」等描述的短句不應被解釋為將申請專利範圍之標的物限於具體示例;相反,該等示例旨在僅說明許多可能實施中的一種。此外,不同附圖中的相同附圖標記可標識相同或相似元件。Unless otherwise stated, the foregoing alternative examples are not mutually exclusive, but can be implemented in various combinations to achieve unique advantages. Because these and other variations and combinations of the above-discussed features may be utilized without departing from the subject matter defined by the scope of the claims, the foregoing description should be made by way of illustration of the subject matter defined by the scope of the claims, and not by the scope of the claims. in a way that restricts it. Furthermore, the provision of examples described herein and the phrases described with the words "such as", "including", etc. should not be construed as limiting patentable subject matter to particular examples; rather, such examples are intended to illustrate many One of the possible implementations. Furthermore, the same reference numbers in different figures may identify the same or similar elements.
100:封裝子總成 120:基板 122:頂表面 124:底表面 126:側表面 128:斜坡表面 130:晶粒/晶片 132:突起 140:加強件 142:頂表面 144:底表面/下側 146:不規則形狀的外周邊或周界 148:內周邊或周界 149:斜坡表面 150:中心孔 152:凹槽 156:突起 160:周邊孔/孔洞 162:周邊曲線/元件 170:黏著劑 180:螺紋硬體 184:基部 186:軸 188:螺紋孔洞 190:O形環 200:歧管 205:入口通道 215:出口通道 220:頂板 222:頂部 224:底部 230:凹槽 260:孔洞 280:緊固件 300:配合總成100: Package sub-assembly 120: Substrate 122: Top surface 124: Bottom surface 126: Side Surface 128: Slope Surface 130: Die/Wafer 132: Protrusion 140: Reinforcement 142: Top surface 144: Bottom surface/underside 146: Irregularly shaped outer perimeter or perimeter 148: Inner perimeter or perimeter 149: Slope Surface 150: Center hole 152: Groove 156: Protrusion 160: Perimeter hole/hole 162: Peripheral Curves/Elements 170: Adhesive 180: Threaded hardware 184: Base 186: Shaft 188: Threaded holes 190: O-ring 200: Manifold 205: Entryway 215: Exit channel 220: top plate 222: top 224: Bottom 230: Groove 260: Hole 280: Fasteners 300: with the assembly
圖1為包括晶片之子總成的透視圖,該晶片利用安裝至加強件之螺紋硬體而結合至加強件。1 is a perspective view of a sub-assembly including a wafer bonded to a stiffener using threaded hardware mounted to the stiffener.
圖2A至圖2D示出圖1之子總成的示例性製造方法。2A-2D illustrate an exemplary method of manufacturing the subassembly of FIG. 1 .
圖3A為圖1的具有所安裝硬體之加強件的下側的透視圖。3A is a perspective view of the underside of the stiffener of FIG. 1 with installed hardware.
圖3B為圖1之子總成的下側的透視圖。3B is a perspective view of the underside of the subassembly of FIG. 1 .
圖4A為示例性晶片的透視圖。4A is a perspective view of an exemplary wafer.
圖4B為圖4A之晶片的透視圖,該晶片被示出為結合至加強件的下側。4B is a perspective view of the wafer of FIG. 4A shown bonded to the underside of the stiffener.
圖5為示例性鋁碳化矽(「AlSiC」)複合物的放大照片,示出了鋁基質中的碳化矽顆粒。5 is an enlarged photograph of an exemplary aluminum silicon carbide ("AlSiC") composite showing silicon carbide particles in an aluminum matrix.
圖6為考慮到由AlSiC製成之加強件的特定材料的熱比較圖表。Figure 6 is a thermal comparison chart considering specific materials for reinforcements made of AlSiC.
圖7A為包括固定至圖1之子總成的頂板的配合總成之組裝圖。7A is an assembled view of a mating assembly including a top plate secured to the subassembly of FIG. 1 .
圖7B為圖7A之配合總成的分解透視圖。Figure 7B is an exploded perspective view of the mating assembly of Figure 7A.
圖7C為圖7A之配合總成的另一分解圖的側視圖。Figure 7C is a side view of another exploded view of the mating assembly of Figure 7A.
圖7D為圖7C之分解側視圖沿著線A-A截取的截面圖,該線A-A界定頂板的較短側表面之中點。7D is a cross-sectional view of the exploded side view of FIG. 7C taken along line A-A, which defines the midpoint of the shorter side surfaces of the top plate.
100:封裝子總成100: Package sub-assembly
120:基板120: Substrate
140:加強件140: Reinforcement
180:螺紋硬體180: Threaded hardware
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US16/877,730 US11721641B2 (en) | 2020-05-19 | 2020-05-19 | Weight optimized stiffener and sealing structure for direct liquid cooled modules |
US16/877,730 | 2020-05-19 |
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US20080284047A1 (en) | 2007-05-15 | 2008-11-20 | Eric Tosaya | Chip Package with Stiffener Ring |
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US9265176B2 (en) * | 2013-03-08 | 2016-02-16 | International Business Machines Corporation | Multi-component electronic module with integral coolant-cooling |
US9224673B2 (en) * | 2013-03-08 | 2015-12-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Packages for semiconductor devices, packaged semiconductor devices, and methods of cooling packaged semiconductor devices |
US10090173B2 (en) | 2015-06-05 | 2018-10-02 | International Business Machines Corporation | Method of fabricating a chip module with stiffening frame and directional heat spreader |
WO2017015000A1 (en) | 2015-07-17 | 2017-01-26 | Mc10, Inc. | Conductive stiffener, method of making a conductive stiffener, and conductive adhesive and encapsulation layers |
US9583408B1 (en) * | 2015-08-21 | 2017-02-28 | International Business Machines Corporation | Reducing directional stress in an orthotropic encapsulation member of an electronic package |
JP6728363B2 (en) * | 2016-01-07 | 2020-07-22 | ザイリンクス インコーポレイテッドXilinx Incorporated | Laminated silicon package assembly with improved stiffeners |
US10643913B2 (en) * | 2017-12-06 | 2020-05-05 | Google Llc | Apparatus and mechanisms for reducing warpage and increasing surface mount technology yields in high performance integrated circuit packages |
US10083920B1 (en) | 2018-02-01 | 2018-09-25 | Google Llc | Package stiffener for protecting semiconductor die |
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US20210366841A1 (en) | 2021-11-25 |
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