TW202145859A - Weight optimized stiffener and sealing structure for direct liquid cooled modules - Google Patents

Weight optimized stiffener and sealing structure for direct liquid cooled modules Download PDF

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TW202145859A
TW202145859A TW109132017A TW109132017A TW202145859A TW 202145859 A TW202145859 A TW 202145859A TW 109132017 A TW109132017 A TW 109132017A TW 109132017 A TW109132017 A TW 109132017A TW 202145859 A TW202145859 A TW 202145859A
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stiffener
top plate
substrate
base plate
holes
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TWI829965B (en
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馬杜蘇丹 K 艾揚格
康納 伯吉斯
帕單 傑恩
依瑪德 沙瑪迪安尼
元 李
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美商谷歌有限責任公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/46Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
    • H01L23/473Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/562Protection against mechanical damage
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/04Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/16Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/32Holders for supporting the complete device in operation, i.e. detachable fixtures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367Cooling facilitated by shape of device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/40Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
    • H01L23/4006Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00Constructional details common to different types of electric apparatus
    • H05K7/20Modifications to facilitate cooling, ventilating, or heating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/40Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
    • H01L23/4006Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
    • H01L2023/4037Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws characterised by thermal path or place of attachment of heatsink
    • H01L2023/405Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws characterised by thermal path or place of attachment of heatsink heatsink to package
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/40Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
    • H01L23/4006Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
    • H01L2023/4075Mechanical elements
    • H01L2023/4087Mounting accessories, interposers, clamping or screwing parts

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Thermal Sciences (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

A weight optimized stiffener for use in a semiconductor device is disclosed herein. In one example, the stiffener is made of AlSiC for its weight and thermal properties. An O-ring provides sealing between a top surface of the stiffener and a component of the semiconductor device and adhesive provides sealing between a bottom surface of the stiffener and another component of the semiconductor device. The stiffener provides warpage control for a lidless package while enabling direct liquid cooling of a chip or substrate.

Description

用於直接液體冷卻模組的重量最佳化加強件和密封結構Weight-optimized stiffeners and seals for direct liquid cooling modules

互補金屬氧化物半導體(「CMOS」)電路存在於包括微處理器、電池及數位相機影像感測器之若干類型的電子部件中。CMOS技術之主要特點為低靜態功耗及高抗雜訊性。Complementary Metal Oxide Semiconductor ("CMOS") circuits are found in several types of electronic components including microprocessors, batteries, and digital camera image sensors. The main features of CMOS technology are low static power consumption and high noise immunity.

除了工業標準的晶片封裝之外,專用矽之探索可能在伺服器中導致高功率熱源。此技術亦可應用至圖形處理單元(「GPU」)及定製特殊應用積體電路(「ASIC」)。此外,諸如成像及人工智慧(「AI」)等服務將可能需要高密度之大量計算資源,其中許多伺服器彼此非常接近。全球各地之資料中心皆被要求同時提高能效、整合運營及降低成本。為了適應此等高效能且高密度的伺服器,資料中心運營商不僅必須設法解決不斷提高之功率密度,還必須設法解決其帶來的熱挑戰。In addition to industry-standard chip packaging, the search for specialized silicon can lead to high-power heat sources in servers. This technology can also be applied to graphics processing units ("GPUs") and custom application-specific integrated circuits ("ASICs"). In addition, services such as imaging and artificial intelligence ("AI") will likely require high densities of massive computing resources, with many servers in close proximity to each other. Data centers around the world are being asked to simultaneously improve energy efficiency, consolidate operations and reduce costs. To accommodate these high-performance and high-density servers, data center operators must address not only the ever-increasing power density, but also the thermal challenges it brings.

因為液體在儲存及傳遞熱方面比空氣擅長許多倍,所以液體冷卻解決方案可為計算效率、密度及效能提供即時且可量測之益處。使用直接液體冷卻模組可提高計算效能及密度,並降低能耗。Because liquids are many times better at storing and transferring heat than air, liquid cooling solutions can provide immediate and measurable benefits in computing efficiency, density, and performance. Using direct liquid cooling modules can increase computing performance and density, and reduce energy consumption.

電子部件封裝經受廣範圍之溫差。由於各種封裝部件之熱膨脹係數(「CTE」)的差異,電子部件封裝可能隨著電子部件封裝的溫度改變而翹曲。Electronic component packages are subjected to a wide range of temperature differences. Due to differences in coefficients of thermal expansion ("CTE") of various packaged components, electronic component packages may warp as the temperature of the electronic component package changes.

本揭示提供一種重量最佳化加強件,該重量最佳化加強件為無蓋封裝提供翹曲控制,同時實現晶片及/或基板之直接液體冷卻。加強件可由重量最佳化材料構成,並且其幾何特徵可進一步實現重量最佳化。加強件之重量最佳化減小其熱質量以及在將加強件附接至電路總成期間的重量集中影響。The present disclosure provides a weight-optimized stiffener that provides warpage control for lidless packages while enabling direct liquid cooling of the chip and/or substrate. The stiffener may be constructed of a weight-optimized material, and its geometrical features may be further weight-optimized. Weight optimization of the stiffener reduces its thermal mass and weight concentration effects during attachment of the stiffener to the circuit assembly.

本揭示之一個態樣提供一種裝置,其包含重量最佳化加強件,該重量最佳化加強件具有頂表面、底表面、不規則形狀之外周邊以及形成穿過頂表面及底表面之孔的內周邊,其中該孔適用於接納基板的藉由黏著劑耦接至加強件之底表面的一部分。加強件可由鋁基質中的碳化矽顆粒形成。根據一些示例,該裝置可進一步包括藉由黏著劑耦接至加強件之底表面的基板,該基板的一部分突起至加強件之孔中。例如,加強件之底表面可具有用於接納基板上的至少一個突起之至少一個凹部。根據其他示例,加強件之底表面具有自其延伸的複數個突起,當基板耦接至加強件之底表面時,該等突起鄰近基板之外側表面。該裝置可進一步包括耦接至加強件之頂表面的頂板以及用於在加強件與頂板之間提供密封的O形環。在加強件具有與頂板中之複數個孔洞對應的複數個孔洞之情況下,加強件中之複數個孔洞中的每一孔洞可與頂板中之複數個孔洞中的對應一個孔洞形成一對,複數個孔洞中的每一對孔洞適於接納緊固件的穿過其中之一部分以用於將頂板耦接至加強件。頂板可在其內表面中具有凹槽,該凹槽經組態以在頂板耦接至加強件時保持O形環。One aspect of the present disclosure provides a device including a weight-optimized stiffener having a top surface, a bottom surface, an irregularly shaped outer perimeter, and holes formed through the top and bottom surfaces , wherein the hole is adapted to receive a portion of the bottom surface of the substrate coupled to the stiffener by the adhesive. The reinforcement may be formed from silicon carbide particles in an aluminum matrix. According to some examples, the device may further include a substrate coupled to the bottom surface of the stiffener by an adhesive, a portion of the substrate protruding into the hole of the stiffener. For example, the bottom surface of the stiffener may have at least one recess for receiving at least one protrusion on the base plate. According to other examples, the bottom surface of the stiffener has a plurality of protrusions extending therefrom that are adjacent to the outer side surface of the substrate when the substrate is coupled to the bottom surface of the stiffener. The apparatus may further include a top plate coupled to the top surface of the stiffener and an O-ring for providing a seal between the stiffener and the top plate. In the case where the reinforcing member has a plurality of holes corresponding to the plurality of holes in the top plate, each hole of the plurality of holes in the reinforcing member may form a pair with a corresponding one of the plurality of holes in the top plate, the plurality of Each pair of the holes is adapted to receive a portion of the fastener therethrough for coupling the top panel to the stiffener. The top plate can have grooves in its inner surface that are configured to retain the O-rings when the top plate is coupled to the stiffener.

在一些示例中,該裝置可進一步包括歧管,該歧管經組態以位於由基板、加強件及頂板形成之封閉件內,該歧管經組態以將經冷卻的液體引導至基板。例如,當歧管處於由基板、加強件及頂板形成之封閉件內時,歧管的一部分可位於加強件之孔內並與基板直接接觸。In some examples, the device may further include a manifold configured to be located within the enclosure formed by the base plate, the stiffener, and the top plate, the manifold configured to direct the cooled liquid to the base plate. For example, when the manifold is within an enclosure formed by the base plate, the stiffener, and the top plate, a portion of the manifold may be located within the bore of the stiffener and in direct contact with the base plate.

本揭示之另一態樣提供一種總成,其包含:重量最佳化加強件,該重量最佳化加強件具有頂表面、底表面、外周邊以及形成穿過頂表面及底表面之孔的內周邊;以及基板,該基板由黏著劑耦接至加強件之底表面,該基板的一部分突起至加強件之孔中。加強件可由鋁基質中的碳化矽顆粒形成。加強件之底表面可具有用於接納基板上的至少一個突起之至少一個凹部以及自底表面延伸的複數個突起,當基板耦接至加強件之底表面時,該等突起鄰近基板之外側表面。在一些示例中,該總成可進一步包括耦接至加強件之頂表面的頂板以及用於在加強件與頂板之間提供密封的O形環。Another aspect of the present disclosure provides an assembly that includes a weight-optimized stiffener having a top surface, a bottom surface, an outer perimeter, and holes forming holes through the top and bottom surfaces an inner periphery; and a base plate coupled to the bottom surface of the stiffener by an adhesive, a portion of the base plate protruding into the hole of the stiffener. The reinforcement may be formed from silicon carbide particles in an aluminum matrix. The bottom surface of the stiffener may have at least one recess for receiving at least one protrusion on the base plate and a plurality of protrusions extending from the bottom surface adjacent the outer side surface of the base plate when the base plate is coupled to the bottom surface of the stiffener . In some examples, the assembly may further include a top plate coupled to the top surface of the stiffener and an O-ring for providing a seal between the stiffener and the top plate.

本揭示之又一態樣提供一種組裝半導體裝置的方法,該半導體裝置用於向直接液體冷卻模組提供翹曲控制。該方法包括:提供重量最佳化加強件,該重量最佳化加強件具有頂表面、底表面、外周邊以及形成穿過頂表面及底表面之中心孔的內周邊;提供具有頂表面的基板,該基板在頂表面的至少第一區域上包括電路;以及將基板之頂表面耦接至加強件之底表面,使得可穿過加強件之孔接達基板的頂表面之第一區域。Yet another aspect of the present disclosure provides a method of assembling a semiconductor device for providing warpage control to a direct liquid cooling module. The method includes: providing a weight-optimized stiffener having a top surface, a bottom surface, an outer perimeter, and an inner perimeter forming a central hole through the top and bottom surfaces; providing a substrate having a top surface , the substrate includes circuitry on at least a first region of the top surface; and couples the top surface of the substrate to the bottom surface of the stiffener so that the first region of the top surface of the substrate is accessible through the holes of the stiffener.

圖1為半導體裝置之封裝子總成100的透視圖,該封裝子總成包括利用安裝至該加強件之緊固件或螺紋硬體180而結合至加強件140的基板120。1 is a perspective view of a packaging sub-assembly 100 for a semiconductor device including a substrate 120 bonded to a stiffener 140 using fasteners or threaded hardware 180 mounted to the stiffener.

加強件140具有頂表面、底表面以及穿過頂表面及底表面之孔。孔可相對於加強件140的外周邊大體上居中,但在其他示例中,孔之位置可被調整。例如,孔的大小、形狀及位置可基於下伏基板120的要穿過孔曝露之電路來調適。The stiffener 140 has a top surface, a bottom surface, and holes through the top and bottom surfaces. The holes may be generally centered relative to the outer perimeter of the stiffener 140, but in other examples, the positions of the holes may be adjusted. For example, the size, shape, and location of the holes may be adapted based on the circuitry of the underlying substrate 120 to be exposed through the holes.

基板120可諸如藉由黏著劑或其他結合技術耦接至加強件之底表面。當基板耦接至加強件之底表面時,加強件140的一部分可覆蓋基板120之一部分。例如,基板可在其頂表面上的至少第一區域上包括電路。僅舉例而言,電路可包括微處理器、記憶體或其他晶片或部件。當基板與加強件組裝在一起時,可穿過加強件之孔接達基板的包括電路之第一區域。基板的由加強件覆蓋之部分可為例如不需要可接達的無效空間或電路。The substrate 120 may be coupled to the bottom surface of the stiffener, such as by adhesive or other bonding techniques. A portion of the stiffener 140 may cover a portion of the substrate 120 when the substrate is coupled to the bottom surface of the stiffener. For example, the substrate may include circuitry on at least a first region on its top surface. For example only, a circuit may include a microprocessor, memory, or other chips or components. When the base plate and the stiffener are assembled together, the first region of the base plate that includes the circuit is accessible through the holes of the stiffener. The portion of the substrate covered by the stiffener may, for example, not require accessible dead space or circuitry.

根據下文進一步描述的一些示例,加強件140及基板120可包括於總成中,其中頂板耦接至加強件之頂表面,並且O形環在加強件與頂板之間提供密封。According to some examples described further below, the stiffener 140 and the base plate 120 may be included in an assembly with a top plate coupled to a top surface of the stiffener and an O-ring providing a seal between the stiffener and the top plate.

圖2A至圖2D示出子總成100的示例組裝方法。在圖2A中,將加強件140燒結在一起。作為一個示例,加強件可由鋁基質中的碳化矽顆粒形成。完成後處理,諸如,精修加強件之周邊,打磨其頂表面或底表面,或確保孔洞及孔符合規格。在圖2B中,將螺紋硬體180安裝至加強件140之頂表面142。在圖2C中,將基板及/或晶片結合至加強件140之底表面或下側144。在圖2D中,在將子總成100焊接至主板之前對子總成100進行濺射塗覆。雖然圖2A至圖2D提供一個示例,但應理解,可做出變化。例如,可使用除結合之外的耦接技術,可使用不同塗覆技術等。例如,加強件可塗覆或鍍覆有不同金屬或聚合物,以改良黏著性。在其他示例中,可使加強件兼容使用基於焊料或基於聚合物黏著劑的結合。2A-2D illustrate an example method of assembly of the subassembly 100 . In Figure 2A, the stiffeners 140 are sintered together. As one example, the reinforcement may be formed from silicon carbide particles in an aluminum matrix. Finish post-processing such as finishing the perimeter of the reinforcement, sanding its top or bottom surface, or making sure the holes and holes are to specification. In FIG. 2B , the threaded hardware 180 is mounted to the top surface 142 of the stiffener 140 . In FIG. 2C , the substrate and/or wafer is bonded to the bottom surface or underside 144 of the stiffener 140 . In Figure 2D, the subassembly 100 is sputter coated prior to soldering the subassembly 100 to the main board. While FIGS. 2A-2D provide one example, it should be understood that variations may be made. For example, coupling techniques other than bonding may be used, different coating techniques may be used, and the like. For example, the reinforcements can be coated or plated with different metals or polymers to improve adhesion. In other examples, the stiffener can be made compatible with solder-based or polymer adhesive-based bonding.

圖3A為加強件140之下側144的透視圖。加強件140之下側144可具有用於接納自晶片及/或基板延伸的至少一個突起的至少一個凹槽。例如,加強件中的第一凹槽及第二凹槽可經組態以接納基板的各別第一突起及第二突起。FIG. 3A is a perspective view of the underside 144 of the stiffener 140 . The underside 144 of the stiffener 140 may have at least one groove for receiving at least one protrusion extending from the wafer and/or substrate. For example, the first and second grooves in the stiffener can be configured to receive respective first and second protrusions of the substrate.

根據一個示例,自下側144延伸的突起可各自平行於加強件之中心孔的邊緣。當基板耦接至加強件之底表面時,複數個突起中的每一突起可鄰近基板的各別外側表面。在一個示例中,加強件可具有四個突起,其中每一突起經組態以在基板耦接至加強件之底表面時,鄰近於基板上的矩形晶片之各別外表面側。在其他示例中,可包括附加突起或較少突起。According to one example, the protrusions extending from the lower side 144 may each be parallel to the edge of the central hole of the stiffener. When the substrate is coupled to the bottom surface of the stiffener, each protrusion of the plurality of protrusions may be adjacent to a respective outer side surface of the substrate. In one example, the stiffener may have four protrusions, wherein each protrusion is configured to be adjacent to a respective outer surface side of a rectangular wafer on the substrate when the substrate is coupled to the bottom surface of the stiffener. In other examples, additional protrusions or fewer protrusions may be included.

加強件140具有不規則形狀的外周邊或周界146。孔150界定內周邊或周界148。孔150延伸穿過加強件140之頂表面142及底表面144。加強件之底表面144可在其中包括至少一個凹槽152。The stiffener 140 has an irregularly shaped outer perimeter or perimeter 146 . Aperture 150 defines an inner perimeter or perimeter 148 . The holes 150 extend through the top surface 142 and the bottom surface 144 of the stiffener 140 . The bottom surface 144 of the stiffener may include at least one groove 152 therein.

圖3A示出具有兩個凹部或凹槽152的加強件140,該兩個凹部或凹槽鄰近內周邊148之較長側。還設置自加強件140之底表面144朝向頂表面142延伸的斜坡表面149。斜坡表面149鄰近內周邊148的較短側中之每一較短側。還設置自加強件140之底表面144向外延伸的突起156。兩個突起156被示出為在加強件140的每一側上形成一對突起156,總共八個突起156自加強件140之底表面向外延伸。加強件140還包括延伸穿過其頂表面142及底表面144的周邊孔160。如圖2A所示,加強件140包括八個周邊孔160。此僅為加強件140可具有的凹部或凹槽152、突起156及周邊孔160的數目的一個示例。在其他示例中,加強件140可具有多於或少於兩個的凹部或凹槽152、多於或少於兩個的突起156以及多於或少於八個的周邊孔160。FIG. 3A shows the stiffener 140 having two recesses or grooves 152 adjacent the longer sides of the inner periphery 148 . A ramp surface 149 extending from the bottom surface 144 of the stiffener 140 toward the top surface 142 is also provided. Ramp surface 149 is adjacent to each of the shorter sides of inner perimeter 148 . Protrusions 156 extending outwardly from the bottom surface 144 of the stiffener 140 are also provided. Two protrusions 156 are shown forming a pair of protrusions 156 on each side of the stiffener 140 for a total of eight protrusions 156 extending outwardly from the bottom surface of the stiffener 140 . The stiffener 140 also includes a peripheral hole 160 extending through its top surface 142 and bottom surface 144 . As shown in FIG. 2A , the stiffener 140 includes eight peripheral holes 160 . This is only one example of the number of recesses or grooves 152 , protrusions 156 , and peripheral holes 160 that the reinforcement 140 may have. In other examples, the stiffener 140 may have more or less than two recesses or grooves 152 , more or less than two protrusions 156 , and more or less than eight peripheral holes 160 .

加強件140之不規則形狀的外周邊146可提供重量最佳化。代替矩形外周邊,加強件140設計有圍繞每一周邊孔160的周邊曲線162。加強件的側表面上之每條曲線可為約180°,而加強件的拐角上之每條曲線可為約270°。圖3A所示之元件162的引線通向加強件140之外周邊146的拐角,而鄰近於此拐角的曲線在加強件140之前述側表面上。每條鄰近曲線162之間的空白空間在仍提供控制翹曲所需的結構區域的同時,減小加強件的重量。The irregularly shaped outer perimeter 146 of the stiffener 140 may provide for weight optimization. Instead of a rectangular outer perimeter, the stiffener 140 is designed with a perimeter curve 162 around each perimeter hole 160 . Each curve on the side surfaces of the stiffener may be about 180°, and each curve on the corners of the stiffener may be about 270°. The leads of the element 162 shown in FIG. 3A lead to the corners of the outer periphery 146 of the stiffener 140 , and the curves adjacent to the corners are on the aforementioned side surfaces of the stiffener 140 . The empty space between each adjacent curve 162 reduces the weight of the stiffener while still providing the structural area needed to control buckling.

硬體180穿過加強件140之周邊孔160中的每一周邊孔而被安裝。每一緊固件或硬體180具有基部184、軸186及螺紋孔洞188。為了將每一硬體180耦接至加強件140,軸186自底表面144被插入,穿過孔洞188並穿過加強件140的頂表面142,直至基部184與底表面144直接接觸為止。根據一些示例,加強件中的每一緊固件孔或孔洞對應於頂板中之各別孔或孔洞。例如,加強件中的複數個孔洞中之每一孔洞與頂板中的複數個孔洞中之各別一個孔洞形成一對。複數個孔洞中之每一對孔洞適於接納緊固件的穿過其中的一部分以用於將頂板耦接至加強件。The hardware 180 is installed through each of the peripheral holes 160 of the stiffener 140 . Each fastener or hardware 180 has a base 184 , a shaft 186 and a threaded hole 188 . To couple each piece of hardware 180 to the stiffener 140 , the shaft 186 is inserted from the bottom surface 144 , through the hole 188 and through the top surface 142 of the stiffener 140 until the base 184 is in direct contact with the bottom surface 144 . According to some examples, each fastener hole or hole in the stiffener corresponds to a respective hole or hole in the top plate. For example, each of the plurality of holes in the reinforcement member forms a pair with a respective one of the plurality of holes in the top plate. Each pair of the plurality of holes is adapted to receive a portion of the fastener therethrough for coupling the top plate to the stiffener.

可利用硬體180,該硬體可附接至微處理器,以使得其能夠在直接液體冷卻狀態下處置壓力負載,同時仍足夠輕以焊接至主板上並在大批量生產環境中處置。例如,歧管可經組態以位於由基板、加強件及頂板形成的封閉件內。歧管可經組態以將經冷卻的液體供應至基板。當歧管在由基板、加強件及頂板形成之封閉件內時,歧管的一部分可位於加強件之中心孔內,並與基板直接接觸。Hardware 180 is available that can be attached to the microprocessor to enable it to handle pressure loads in direct liquid cooling, while still being light enough to be soldered onto a motherboard and handled in a high volume production environment. For example, the manifold can be configured to be located within the enclosure formed by the base plate, the stiffener, and the top plate. The manifold can be configured to supply cooled liquid to the substrate. When the manifold is within the enclosure formed by the base plate, the stiffener and the top plate, a portion of the manifold may be located within the central hole of the stiffener and in direct contact with the base plate.

如圖3B及圖4B所示,基板120耦接至加強件140的底表面144。子總成100包括基板120,該基板還包括亦可被稱為晶片的晶粒130。晶粒130可為積體電路(「IC」)晶片、系統單晶片(「SoC」)或其一部分,它們可包括各種被動及主動微電子裝置,諸如,電阻器、電容器、電感器、二極體、金屬氧化物半導體場效(「MOSFET」)電晶體、CMOS電晶體、雙極接面電晶體(「BJT」)、橫向擴散金屬氧化物矽(「LDMOS」)電晶體、高功率MOS電晶體、其他類型之電晶體或其他類型之裝置。作為示例,晶粒130可包含記憶體裝置、邏輯裝置或其他類型的電路。晶粒130被示出為結合至載體基板或基板120。基板120可為例如矽基板、塑膠基板、具有例如聚醯亞胺及銅層之可撓性基板、層壓基板、陶瓷基板、插入物或任何其他合適支撐結構。As shown in FIGS. 3B and 4B , the substrate 120 is coupled to the bottom surface 144 of the stiffener 140 . The subassembly 100 includes a substrate 120, which also includes a die 130, which may also be referred to as a wafer. Die 130 may be an integrated circuit ("IC") chip, a system-on-chip ("SoC"), or a portion thereof, which may include various passive and active microelectronic devices such as resistors, capacitors, inductors, diodes Bulk, Metal Oxide Semiconductor Field Effect (“MOSFET”) Transistors, CMOS Transistors, Bipolar Junction Transistors (“BJT”), Laterally Diffused Metal Oxide Silicon (“LDMOS”) Transistors, High Power MOS Transistors Crystals, other types of transistors, or other types of devices. As an example, die 130 may include memory devices, logic devices, or other types of circuits. Die 130 is shown bonded to carrier substrate or substrate 120 . The substrate 120 may be, for example, a silicon substrate, a plastic substrate, a flexible substrate with layers such as polyimide and copper, a laminate substrate, a ceramic substrate, an interposer, or any other suitable support structure.

基板120包括頂表面122、底表面124以及在頂表面122與底表面124之間延伸的側表面126。頂表面122還包括向外延伸的斜坡表面128,該斜坡表面形成晶片130之周界。鄰近晶片130之較長側的為突起132,該等突起亦自基板120的頂表面122向外延伸。Substrate 120 includes top surface 122 , bottom surface 124 , and side surfaces 126 extending between top surface 122 and bottom surface 124 . Top surface 122 also includes an outwardly extending ramp surface 128 that forms the perimeter of wafer 130 . Adjacent to the longer side of the wafer 130 are protrusions 132 that also extend outward from the top surface 122 of the substrate 120 .

在將基板120之頂表面122結合至加強件之底表面144之前,可將黏著劑170層施加至基板120的頂表面及/或加強件140的底表面144。作為示例,圖4A示出被施加至基板120之頂表面122的黏著劑170。黏著劑用於將基板120及加強件140機械耦接在一起。可使用工業中使用的任何類型之黏著劑,包括但不限於天然黏著劑、合成黏著劑、乾燥黏著劑、熱塑性黏著劑、反應性黏著劑、壓敏黏著劑或任何其他常用黏著劑。Before bonding the top surface 122 of the substrate 120 to the bottom surface 144 of the stiffener, a layer of adhesive 170 may be applied to the top surface of the substrate 120 and/or the bottom surface 144 of the stiffener 140 . As an example, FIG. 4A shows adhesive 170 applied to top surface 122 of substrate 120 . The adhesive is used to mechanically couple the substrate 120 and the stiffener 140 together. Any type of adhesive used in the industry can be used, including but not limited to natural adhesives, synthetic adhesives, drying adhesives, thermoplastic adhesives, reactive adhesives, pressure sensitive adhesives or any other commonly used adhesives.

當在結合此等部件之前將基板120相對於加強件140定位時,基板的突起132被定位在加強件140之凹槽152內,並且基板120的側表面126被定位成鄰近於加強件140之突起132,如圖3B及圖4B所示。基板120的斜坡表面128亦被定位成與加強件140之對應斜坡表面149接觸。When the base plate 120 is positioned relative to the stiffener 140 prior to joining these components, the protrusions 132 of the base plate are positioned within the grooves 152 of the stiffener 140 and the side surfaces 126 of the base plate 120 are positioned adjacent to the stiffener 140 The protrusions 132 are shown in FIGS. 3B and 4B . The ramp surface 128 of the base plate 120 is also positioned in contact with the corresponding ramp surface 149 of the stiffener 140 .

圖4B提供結合至加強件140的基板120之透明度,其示出了加強件的中心孔150,即使當基板120結合至加強件140時,至少基板120的晶片130覆蓋中心孔150。4B provides transparency of the substrate 120 bonded to the stiffener 140 showing the central hole 150 of the stiffener, even though at least the wafer 130 of the substrate 120 covers the central hole 150 when the substrate 120 is bonded to the stiffener 140 .

子總成100可根據特定規格來設計。例如,子總成100的重量應總計小於130 g,使得球狀柵格陣列(「BGA」)在焊料回流期間不會被壓碎。在一個示例中,加強件140加上硬體或鉚釘螺母180的經最佳化重量小於50 g。在基板120或印刷電路板(PCB)上的晶片130小於25 g並且用於將基板120及晶片130結合至加強件140之黏著劑重量小於5 g的情況下,子總成100的總封裝重量為約80 g,此遠低於總封裝的最大130 g重量規格。在其他示例中,加強件140加上硬體180可大於或小於50 g,基板120上之晶片130可大於或小於25 g,並且用於將加強件140結合至基板120之黏著劑可大於或小於5 g。The subassembly 100 may be designed according to specific specifications. For example, the weight of the sub-assembly 100 should total less than 130 g so that the ball grid array ("BGA") is not crushed during solder reflow. In one example, the optimized weight of the stiffener 140 plus the hard body or rivet nut 180 is less than 50 g. Total package weight of sub-assembly 100 with wafer 130 on substrate 120 or printed circuit board (PCB) less than 25 g and the weight of the adhesive used to bond substrate 120 and wafer 130 to stiffener 140 is less than 5 g is about 80 g, which is well below the maximum weight specification of 130 g for the total package. In other examples, the stiffener 140 plus the hardware 180 can be greater than or less than 50 g, the wafer 130 on the substrate 120 can be greater or less than 25 g, and the adhesive used to bond the stiffener 140 to the substrate 120 can be greater than or less than 25 g less than 5 g.

在設計子總成100的部件時,總熱質量應較低,並且傳導率應較高,以使得在不損壞其他部件的情況下,熱可自上方施加以使下伏焊料熔融。子總成100之外周邊可被設計成適配在現有托盤上。黏著劑及O形環接合部/表面應針對液態水為子總成100提供密封。子總成100的設計不應促進電解連接的部件之間的任何電偶腐蝕。出於最小化熱應力的目的,子總成100之熱膨脹應與其所結合至的基板之係數緊密匹配。When designing the components of subassembly 100, the total thermal mass should be low and the conductivity should be high so that heat can be applied from above to melt the underlying solder without damaging other components. The outer perimeter of the subassembly 100 can be designed to fit over existing pallets. The adhesive and O-ring joints/surfaces should provide a seal for the subassembly 100 against liquid water. The design of subassembly 100 should not promote any galvanic corrosion between electrolytically connected components. For the purpose of minimizing thermal stress, the thermal expansion of subassembly 100 should closely match the coefficient of the substrate to which it is bonded.

根據一些示例,加強件140可由AlSiC製成。螺紋硬體180可在AlSiC被製造之後附接。AlSiC為金屬陶瓷複合材料,其由分散在鋁合金基質(A)中的碳化矽顆粒(SiC)組成,如例如圖5所示。鋁基質含有大量位錯,對材料的強度負責。由於位錯的不同熱膨脹係數,位錯可由SiC顆粒在冷卻期間引入。According to some examples, the reinforcement 140 may be made of AlSiC. The threaded hardware 180 may be attached after the AlSiC is fabricated. AlSiC is a cermet composite material consisting of silicon carbide particles (SiC) dispersed in an aluminum alloy matrix (A), as shown for example in FIG. 5 . The aluminum matrix contains a large number of dislocations and is responsible for the strength of the material. Dislocations can be introduced by SiC particles during cooling due to the different thermal expansion coefficients of dislocations.

AlSiC結合金屬的高導熱性(180 W/m K至 200 W/m K)及陶瓷的低CTE的益處。由於AlSiC的複合特徵,AlSiC為一種用於高技術熱管理的進階封裝材料。AlSiC的熱膨脹可被調整成匹配其他材料,例如,矽及砷化鎵晶片以及各種陶瓷。當在微電子裝置中用作功率半導體裝置及高密度多晶片模組之基板時,AlSiC有助於去除廢熱。AlSiC combines the benefits of the high thermal conductivity of metals (180 W/m K to 200 W/m K) and the low CTE of ceramics. Due to its composite characteristics, AlSiC is an advanced packaging material for high-tech thermal management. The thermal expansion of AlSiC can be tuned to match other materials such as silicon and gallium arsenide wafers and various ceramics. AlSiC helps remove waste heat when used in microelectronic devices as a substrate for power semiconductor devices and high-density multi-chip modules.

圖6為考慮到由AlSiC製成的加強件140之特定材料的熱比較圖。如可看出,AlSiC的熱膨脹係數為例如平面電路板(平面中)、304不鏽鋼及銅的熱膨脹係數的至少一半。AlSiC具有不到銅的一半的導熱率,但具有比電路板或304不鏽鋼高得多的導熱率。還在此等材料之間突顯根據百分比的+50℃時的應變及相對應變。FIG. 6 is a thermal comparison diagram considering the specific material of the stiffener 140 made of AlSiC. As can be seen, the coefficient of thermal expansion of AlSiC is at least half that of, for example, planar circuit boards (in plane), 304 stainless steel, and copper. AlSiC has less than half the thermal conductivity of copper, but a much higher thermal conductivity than circuit boards or 304 stainless steel. The strain at +50°C and the relative strain in terms of percentage are also highlighted between these materials.

上文論述的圖2A陳述了加強件140被燒結在一起。AlSiC零件亦可藉由近淨形法製造,方法為藉由SiC-黏結劑漿料的金屬注射成型來創建SiC預製件,燒製以移除黏結劑,然後在壓力下用熔融鋁滲透。零件可被製造成具有足夠低的容限,以不需要進一步加工。根據其他示例,可執行加強件140之進一步處理以滿足某些規格。Figure 2A, discussed above, states that the stiffeners 140 are sintered together. AlSiC parts can also be fabricated by the near-net shape method by creating SiC preforms by metal injection molding of SiC-binder slurries, firing to remove the binder, and then infiltrating with molten aluminum under pressure. Parts can be manufactured with low enough tolerances that no further machining is required. According to other examples, further processing of the stiffener 140 may be performed to meet certain specifications.

AlSiC為完全緻密的,沒有空隙,並且為氣密的。AlSiC可藉由熱噴塗而鍍覆有鎳及鎳金或其他金屬。陶瓷及金屬嵌入件可在鋁滲透之前插入至預製件中,從而導致氣密密封。AlSiC亦可藉由機械合金化來製備。當使用較低程度的SiC含量時,可自AlSiC片材衝壓成零件。AlSiC is completely dense, without voids, and hermetic. AlSiC can be plated with nickel and nickel gold or other metals by thermal spraying. Ceramic and metal inserts can be inserted into the preform prior to aluminum infiltration, resulting in a hermetic seal. AlSiC can also be prepared by mechanical alloying. When lower levels of SiC content are used, parts can be stamped from AlSiC sheets.

圖7A為配合總成300的組裝圖,而圖7B為配合總成300的分解圖,該分解圖示出了配合總成的部件中的每一部件。配合總成300包括子總成100的部件,即,基板120及晶片130、加強件140、黏著劑170及硬體180,以及O形環190、歧管200、頂板220及緊固件280的附加部件。7A is an assembled view of the mating assembly 300, and FIG. 7B is an exploded view of the mating assembly 300 showing each of the components of the mating assembly. The mating assembly 300 includes the components of the subassembly 100 , namely the base plate 120 and wafer 130 , the stiffener 140 , the adhesive 170 and the hardware 180 , and the addition of the O-ring 190 , manifold 200 , top plate 220 and fasteners 280 part.

加強件140中的每一緊固件孔或孔洞160對應於頂板220中的各別孔或孔洞260。例如,加強件140中的複數個孔洞160中之每一孔洞與頂板220中的複數個孔洞260中之各別一個孔洞形成一對。如圖7B所示,複數個孔洞260的每對孔洞適於接納緊固件280的穿過其中的一部分,以用於接合螺紋硬體180並將頂板220耦接至加強件140。Each fastener hole or hole 160 in the stiffener 140 corresponds to a respective hole or hole 260 in the top plate 220 . For example, each of the plurality of holes 160 in the reinforcement member 140 forms a pair with a respective one of the plurality of holes 260 in the top plate 220 . As shown in FIG. 7B , each pair of the plurality of holes 260 is adapted to receive a portion of the fastener 280 therethrough for engaging the threaded hardware 180 and coupling the top plate 220 to the stiffener 140 .

頂板220具有如圖7C所示的頂部222以及可在圖7D的截面圖中至少部分地看到的底部224。在圖4A中有指向頂部222的箭頭,該箭頭表示將延伸穿過頂部222及底部224的流動狀態或通道,其未關於頂板220示出。凹槽230形成在頂板220之底部224中。凹槽230經組態以在頂板220耦接至加強件140時保持O形環190。在如圖7C所示的配合總成300的分解側視圖中,並且如圖7D的對應截面圖所示,可看到O形環190相對於中心孔150的位置及其在加強件140上的大致定向。The top plate 220 has a top portion 222 as shown in FIG. 7C and a bottom portion 224 which can be at least partially seen in the cross-sectional view of FIG. 7D . In FIG. 4A there is an arrow pointing to the top 222 that represents the flow conditions or channels that will extend through the top 222 and the bottom 224 , which are not shown with respect to the top plate 220 . A groove 230 is formed in the bottom 224 of the top plate 220 . The groove 230 is configured to retain the O-ring 190 when the top plate 220 is coupled to the stiffener 140 . In the exploded side view of the mating assembly 300 shown in FIG. 7C , and the corresponding cross-sectional view of FIG. 7D , the position of the O-ring 190 relative to the center hole 150 and its position on the reinforcement member 140 can be seen roughly oriented.

圖7D還示出封閉件的分解圖,歧管200經組態以位於該封閉件內。如圖7A所示,當基板120、加強件140及頂板220耦接在一起時,形成封閉件。歧管200被設計成在微處理器上引導流動,以便顯著改良微處理器與工作流體之間的熱傳遞。歧管200的一部分被設計成當歧管200在由基板120、加強件140及頂板220形成之封閉件內時,位於加強件140的中心孔150內,並與基板120之晶片130直接接觸。歧管200坐置於具有流動通道的晶片130的頂部上。歧管被設計成具有用於冷卻劑的複雜交叉流動路徑,從而導致了晶片130與工作流體之間的經改良交叉流動路徑。經冷卻的流體或液體流動穿過歧管200中的入口通道205並引導至晶片130上。先前已經用於冷卻晶片130的液體穿過出口通道215排出。Figure 7D also shows an exploded view of the closure within which the manifold 200 is configured. As shown in FIG. 7A, when the base plate 120, the stiffener 140 and the top plate 220 are coupled together, a closure is formed. Manifold 200 is designed to direct flow over the microprocessor to significantly improve heat transfer between the microprocessor and the working fluid. A portion of the manifold 200 is designed to be located within the central hole 150 of the stiffener 140 and in direct contact with the wafer 130 of the substrate 120 when the manifold 200 is within the enclosure formed by the substrate 120, stiffener 140 and top plate 220. Manifold 200 sits on top of wafer 130 with flow channels. The manifolds are designed with complex cross flow paths for the coolant, resulting in improved cross flow paths between the wafers 130 and the working fluid. The cooled fluid or liquid flows through inlet channels 205 in manifold 200 and is directed onto wafer 130 . The liquid that has previously been used to cool the wafer 130 is drained through the outlet channel 215 .

當配合總成300如圖7A所示完全組裝時,重量最佳化加強件140可藉由使用O形環190而在其頂表面142上提供密封,並藉由使用黏著劑170在其底表面144上提供密封。頂板在其內表面中具有凹槽,該凹槽經組態以當頂板耦接至加強件時保持O形環。When the mating assembly 300 is fully assembled as shown in FIG. 7A , the weight-optimized stiffener 140 may provide a seal on its top surface 142 by using an O-ring 190 and on its bottom surface by using an adhesive 170 Seals are provided on 144. The top plate has a groove in its inner surface that is configured to retain the O-ring when the top plate is coupled to the stiffener.

加強件140在實現晶片130及/或基板120的直接液體冷卻的同時,為無蓋封裝提供翹曲控制。加強件包含重量最佳化材料(諸如,AlSiC)及幾何特徵(諸如,不規則形狀的外周邊146)。加強件140之重量最佳化減小其熱質量以及在將加強件140附接至例如主板期間的重量集中影響。The stiffener 140 provides warpage control for the capless package while enabling direct liquid cooling of the wafer 130 and/or the substrate 120 . The reinforcement includes weight-optimized materials such as AlSiC and geometric features such as the irregularly shaped outer perimeter 146 . Weight optimization of the stiffener 140 reduces its thermal mass and weight concentration effects during attachment of the stiffener 140 to, for example, a mainboard.

除非另有陳述,否則前述替代示例並不相互排斥,而是可以各種組合實施,以實現獨特優勢。因為可利用上文所論述特徵之此等及其他變化及組合,而不脫離申請專利範圍所界定之標的物,所以前述描述應係以說明申請專利範圍所界定之標的物的方式進行,而非以對其加以限制的方式進行。此外,本文所述示例的提供以及用措詞「諸如」、「包括」等描述的短句不應被解釋為將申請專利範圍之標的物限於具體示例;相反,該等示例旨在僅說明許多可能實施中的一種。此外,不同附圖中的相同附圖標記可標識相同或相似元件。Unless otherwise stated, the foregoing alternative examples are not mutually exclusive, but can be implemented in various combinations to achieve unique advantages. Because these and other variations and combinations of the above-discussed features may be utilized without departing from the subject matter defined by the scope of the claims, the foregoing description should be made by way of illustration of the subject matter defined by the scope of the claims, and not by the scope of the claims. in a way that restricts it. Furthermore, the provision of examples described herein and the phrases described with the words "such as", "including", etc. should not be construed as limiting patentable subject matter to particular examples; rather, such examples are intended to illustrate many One of the possible implementations. Furthermore, the same reference numbers in different figures may identify the same or similar elements.

100:封裝子總成 120:基板 122:頂表面 124:底表面 126:側表面 128:斜坡表面 130:晶粒/晶片 132:突起 140:加強件 142:頂表面 144:底表面/下側 146:不規則形狀的外周邊或周界 148:內周邊或周界 149:斜坡表面 150:中心孔 152:凹槽 156:突起 160:周邊孔/孔洞 162:周邊曲線/元件 170:黏著劑 180:螺紋硬體 184:基部 186:軸 188:螺紋孔洞 190:O形環 200:歧管 205:入口通道 215:出口通道 220:頂板 222:頂部 224:底部 230:凹槽 260:孔洞 280:緊固件 300:配合總成100: Package sub-assembly 120: Substrate 122: Top surface 124: Bottom surface 126: Side Surface 128: Slope Surface 130: Die/Wafer 132: Protrusion 140: Reinforcement 142: Top surface 144: Bottom surface/underside 146: Irregularly shaped outer perimeter or perimeter 148: Inner perimeter or perimeter 149: Slope Surface 150: Center hole 152: Groove 156: Protrusion 160: Perimeter hole/hole 162: Peripheral Curves/Elements 170: Adhesive 180: Threaded hardware 184: Base 186: Shaft 188: Threaded holes 190: O-ring 200: Manifold 205: Entryway 215: Exit channel 220: top plate 222: top 224: Bottom 230: Groove 260: Hole 280: Fasteners 300: with the assembly

圖1為包括晶片之子總成的透視圖,該晶片利用安裝至加強件之螺紋硬體而結合至加強件。1 is a perspective view of a sub-assembly including a wafer bonded to a stiffener using threaded hardware mounted to the stiffener.

圖2A至圖2D示出圖1之子總成的示例性製造方法。2A-2D illustrate an exemplary method of manufacturing the subassembly of FIG. 1 .

圖3A為圖1的具有所安裝硬體之加強件的下側的透視圖。3A is a perspective view of the underside of the stiffener of FIG. 1 with installed hardware.

圖3B為圖1之子總成的下側的透視圖。3B is a perspective view of the underside of the subassembly of FIG. 1 .

圖4A為示例性晶片的透視圖。4A is a perspective view of an exemplary wafer.

圖4B為圖4A之晶片的透視圖,該晶片被示出為結合至加強件的下側。4B is a perspective view of the wafer of FIG. 4A shown bonded to the underside of the stiffener.

圖5為示例性鋁碳化矽(「AlSiC」)複合物的放大照片,示出了鋁基質中的碳化矽顆粒。5 is an enlarged photograph of an exemplary aluminum silicon carbide ("AlSiC") composite showing silicon carbide particles in an aluminum matrix.

圖6為考慮到由AlSiC製成之加強件的特定材料的熱比較圖表。Figure 6 is a thermal comparison chart considering specific materials for reinforcements made of AlSiC.

圖7A為包括固定至圖1之子總成的頂板的配合總成之組裝圖。7A is an assembled view of a mating assembly including a top plate secured to the subassembly of FIG. 1 .

圖7B為圖7A之配合總成的分解透視圖。Figure 7B is an exploded perspective view of the mating assembly of Figure 7A.

圖7C為圖7A之配合總成的另一分解圖的側視圖。Figure 7C is a side view of another exploded view of the mating assembly of Figure 7A.

圖7D為圖7C之分解側視圖沿著線A-A截取的截面圖,該線A-A界定頂板的較短側表面之中點。7D is a cross-sectional view of the exploded side view of FIG. 7C taken along line A-A, which defines the midpoint of the shorter side surfaces of the top plate.

100:封裝子總成100: Package sub-assembly

120:基板120: Substrate

140:加強件140: Reinforcement

180:螺紋硬體180: Threaded hardware

Claims (20)

一種裝置,包含: 一重量最佳化加強件,該重量最佳化加強件具有一頂表面、一底表面、一不規則形狀的外周邊以及形成穿過該頂表面及該底表面的一孔之一內周邊, 其中該孔適於接納一基板的藉由一黏著劑耦接至該加強件之該底表面的一部分。A device comprising: a weight-optimized stiffener having a top surface, a bottom surface, an irregularly shaped outer perimeter, and an inner perimeter forming an aperture through the top surface and the bottom surface, wherein the hole is adapted to receive a portion of the bottom surface of a substrate coupled to the stiffener by an adhesive. 如請求項1之裝置,其中該加強件由一鋁基質中的碳化矽顆粒形成。The device of claim 1, wherein the reinforcement is formed from silicon carbide particles in an aluminum matrix. 如請求項1之裝置,進一步包含: 該基板,該基板藉由一黏著劑耦接至該加強件之該底表面,該基板的一部分突起至該加強件之該孔中。The device of claim 1, further comprising: The base plate is coupled to the bottom surface of the reinforcement member by an adhesive, and a portion of the base plate protrudes into the hole of the reinforcement member. 如請求項3之裝置,其中該加強件之該底表面具有用於接納該基板上的至少一個突起之至少一個凹部。The device of claim 3, wherein the bottom surface of the stiffener has at least one recess for receiving at least one protrusion on the base plate. 如請求項3之裝置,其中該加強件之該底表面具有自其延伸的複數個突起,當該基板耦接至該加強件之該底表面時,該複數個突起鄰近該基板之外側表面。The device of claim 3, wherein the bottom surface of the stiffener has a plurality of protrusions extending therefrom, the plurality of protrusions being adjacent to the outer side surface of the substrate when the substrate is coupled to the bottom surface of the stiffener. 如請求項3之裝置,進一步包含: 一頂板,該頂板耦接至該加強件之該頂表面;及 一O形環,該O形環用於在該加強件與該頂板之間提供一密封。The device of claim 3, further comprising: a top plate coupled to the top surface of the stiffener; and An O-ring for providing a seal between the stiffener and the top plate. 如請求項6之裝置,其中該加強件具有與該頂板中的複數個孔洞對應的複數個孔洞,該加強件中的該複數個孔洞中之每一孔洞與該頂板中的該複數個孔洞中之各別一個孔洞形成一對,該複數個孔洞中的每一對適於接納一緊固件的穿過其中的一部分以用於將該頂板耦接至該加強件。The device of claim 6, wherein the reinforcement member has a plurality of holes corresponding to the plurality of holes in the top plate, and each hole of the plurality of holes in the reinforcement member is in contact with the plurality of holes in the top plate A respective one of the holes forms a pair, each pair of the plurality of holes is adapted to receive a portion of a fastener therethrough for coupling the top plate to the stiffener. 如請求項6之裝置,進一步包含: 一歧管,該歧管經組態以位於由該基板、該加強件及該頂板形成的一封閉件內,該歧管經組態以將經冷卻的液體引導至該基板。The device of claim 6, further comprising: A manifold configured to be located within an enclosure formed by the base plate, the stiffener, and the top plate, the manifold configured to direct cooled liquid to the base plate. 如請求項8之裝置,其中當該歧管在由該基板、該加強件及該頂板形成的該封閉件內時,該歧管的一部分位於該加強件之該孔內並與該基板直接接觸。8. The apparatus of claim 8, wherein when the manifold is within the enclosure formed by the base plate, the stiffener and the top plate, a portion of the manifold is located within the hole of the stiffener and is in direct contact with the base plate . 如請求項6之裝置,其中該頂板在其一內表面中具有一凹槽,該凹槽經組態以當該頂板耦接至該加強件時保持該O形環。6. The device of claim 6, wherein the top plate has a groove in an inner surface thereof, the groove configured to retain the O-ring when the top plate is coupled to the stiffener. 一種總成,包含: 一重量最佳化加強件,該重量最佳化加強件具有一頂表面、一底表面、一外周邊以及形成穿過該頂表面及該底表面的一孔之一內周邊;及 一基板,該基板藉由一黏著劑耦接至該加強件的該底表面,該基板的一部分突起至該加強件之該孔中。An assembly containing: a weight-optimized stiffener having a top surface, a bottom surface, an outer perimeter, and an inner perimeter forming an aperture through the top surface and the bottom surface; and a base plate coupled to the bottom surface of the reinforcement member by an adhesive, a portion of the base plate protruding into the hole of the reinforcement member. 如請求項11之總成,其中該加強件由一鋁基質中的碳化矽顆粒形成。The assembly of claim 11, wherein the reinforcement is formed of silicon carbide particles in an aluminum matrix. 如請求項11之總成,其中該加強件的該底表面具有用於接納該基板上之至少一個突起的至少一個凹部。The assembly of claim 11, wherein the bottom surface of the stiffener has at least one recess for receiving at least one protrusion on the base plate. 如請求項11之總成,其中該加強件的該底表面具有自其延伸之複數個突起,當該基板耦接至該加強件的該底表面時,該複數個突起鄰近該基板之外側表面。The assembly of claim 11, wherein the bottom surface of the reinforcement member has a plurality of protrusions extending therefrom, the plurality of protrusions being adjacent to the outer side surface of the base plate when the base plate is coupled to the bottom surface of the reinforcement member . 如請求項12之總成,進一步包含: 一頂板,該頂板耦接至該加強件之該頂表面;及 一O形環,該O形環用於在該加強件與該頂板之間提供一密封。As in the assembly of claim 12, further comprising: a top plate coupled to the top surface of the stiffener; and An O-ring for providing a seal between the stiffener and the top plate. 如請求項15之總成,其中該加強件具有與該頂板中的複數個孔洞對應的複數個孔洞,該加強件中的該複數個孔洞中之每一孔洞與該頂板中的該複數個孔洞中之各別一個孔洞形成一對,該複數個孔洞中的每一對適於接納一緊固件的穿過其中的一部分以用於將該頂板耦接至該加強件。The assembly of claim 15, wherein the reinforcement member has a plurality of holes corresponding to the plurality of holes in the top plate, each hole of the plurality of holes in the reinforcement member and the plurality of holes in the top plate A respective one of the holes forms a pair, and each pair of the plurality of holes is adapted to receive a portion of a fastener therethrough for coupling the top plate to the stiffener. 如請求項15之總成,進一步包含: 一歧管,該歧管經組態以位於由該基板、該加強件及該頂板形成的一封閉件內,該歧管經組態以將經冷卻的液體引導至該基板。As in the assembly of claim 15, further comprising: A manifold configured to be located within an enclosure formed by the base plate, the stiffener, and the top plate, the manifold configured to direct cooled liquid to the base plate. 如請求項17之總成,其中當該歧管在由該基板、該加強件及該頂板形成的該封閉件內時,該歧管的一部分位於該加強件之該孔內,並且該歧管的一底表面與該基板直接接觸。The assembly of claim 17, wherein when the manifold is within the enclosure formed by the base plate, the stiffener, and the top plate, a portion of the manifold is located within the hole of the stiffener, and the manifold A bottom surface of the substrate is in direct contact with the substrate. 如請求項15之總成,其中該頂板在其一內表面中具有一凹槽,該凹槽經組態以當該頂板耦接至該加強件時保持該O形環。The assembly of claim 15, wherein the top plate has a groove in an inner surface thereof, the groove configured to retain the O-ring when the top plate is coupled to the stiffener. 一種組裝一半導體裝置的方法,該半導體裝置用於向一直接液體冷卻模組提供翹曲控制,該方法包含: 提供一重量最佳化加強件,該重量最佳化加強件具有一頂表面、一底表面、一外周邊以及形成穿過該頂表面及該底表面的一中心孔的一內周邊; 提供具有一頂表面的一基板,該基板在該頂表面的至少一第一區域上包括電路;及 將該基板之該頂表面耦接至該加強件之該底表面,使得能夠穿過該加強件的該孔接達該基板之該頂表面的該第一區域。A method of assembling a semiconductor device for providing warpage control to a direct liquid cooling module, the method comprising: providing a weight-optimized stiffener having a top surface, a bottom surface, an outer perimeter, and an inner perimeter forming a central hole through the top and bottom surfaces; providing a substrate having a top surface, the substrate including circuitry on at least a first region of the top surface; and The top surface of the substrate is coupled to the bottom surface of the stiffener so that the first region of the top surface of the substrate can be accessed through the hole of the stiffener.
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