TW202144950A - Delay locked loop device and updating method thereof - Google Patents
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本發明是有關於一種延遲鎖相迴路裝置及其更新方法,且特別是有關於一種能夠降低消耗功率的延遲鎖相迴路裝置及其更新方法。The present invention relates to a delay locked loop device and an update method thereof, and more particularly, to a delay phase locked loop device capable of reducing power consumption and an update method thereof.
當DRAM溫度升高或降低時,延遲鎖相迴路(Delay Locked Loop,DLL)會更新延遲碼以調整記憶體裝置內部的時序。一般來說,延遲鎖相迴路可藉由延遲碼進行隨時更新,藉以使延遲鎖相迴路所提供的延遲時脈能夠即時地隨著溫度變化而變化。然而,上述的方案具有很大的消耗功率。When the DRAM temperature increases or decreases, the Delay Locked Loop (DLL) updates the delay code to adjust the timing inside the memory device. Generally speaking, the delay-locked loop can be updated at any time by the delay code, so that the delay clock provided by the delay-locked loop can change with the temperature change in real time. However, the above scheme has a large power consumption.
本發明提供一種能夠降低消耗功率的延遲鎖相迴路裝置及其更新方法。The present invention provides a delay-locked loop device capable of reducing power consumption and an update method thereof.
本發明的延遲鎖相迴路裝置適用於記憶體裝置。延遲鎖相迴路裝置包括延遲鎖相迴路以及更新電路。延遲鎖相迴路經配置以依據致能訊號被致能後接收輸入時脈,並且對輸入時脈進行延遲以提供延遲時脈。更新電路包括旗標產生電路以及致能電路。旗標產生電路經配置以基於一預設時間區間提供更新旗標。致能電路耦接於旗標產生電路以及延遲鎖相迴路。致能電路經配置以依據更新旗標以將致能訊號觸發至第一邏輯準位,並在預設時間區間結束前將致能訊號由第一邏輯準位轉態至第二邏輯準位。預設時間區間小於記憶體裝置的刷新週期。The delay-locked loop device of the present invention is suitable for a memory device. The delay-locked loop device includes a delay-locked loop and an update circuit. The delay locked loop is configured to receive the input clock after being enabled according to the enable signal, and to delay the input clock to provide the delay clock. The update circuit includes a flag generating circuit and an enabling circuit. The flag generation circuit is configured to provide an update flag based on a predetermined time interval. The enabling circuit is coupled to the flag generating circuit and the delay locked loop. The enable circuit is configured to trigger the enable signal to the first logic level according to the update flag, and transition the enable signal from the first logic level to the second logic level before the preset time interval ends. The preset time interval is less than the refresh cycle of the memory device.
在本發明的對延遲鎖相迴路進行更新的更新方法適用於記憶體裝置。更新方法包括:基於一預設時間區間提供更新旗標,其中預設時間區間小於記憶體裝置的刷新週期;依據更新旗標以將致能訊號觸發至第一邏輯準位,並在預設時間區間結束前將致能訊號由第一邏輯準位轉態至第二邏輯準位;以及依據致能訊號致能延遲鎖相迴路,藉以使延遲鎖相迴路對輸入時脈進行延遲以提供延遲時脈。The updating method for updating the delay locked loop of the present invention is applicable to a memory device. The update method includes: providing an update flag based on a preset time interval, wherein the preset time interval is less than a refresh cycle of the memory device; triggering an enable signal to a first logic level according to the update flag, and at a preset time before the end of the interval, the enable signal is changed from the first logic level to the second logic level; and the delay-locked loop is enabled according to the enable signal, so that the delay-locked loop delays the input clock to provide a delay time pulse.
基於上述,本發明是基於一預設時間區間提供更新旗標,依據更新旗標以將致能訊號觸發至第一邏輯準位,並且在預設時間區間結束前將致能訊號由第一邏輯準位轉態至第二邏輯準位。本發明是在預設時間區間內致能延遲鎖相迴路。因此,延遲鎖相迴路是在預設時間區間內才對延遲碼進行更新,藉以降低延遲鎖相迴路的消耗功率。Based on the above, the present invention provides an update flag based on a predetermined time interval, triggers the enable signal to the first logic level according to the update flag, and sends the enable signal to the first logic level before the end of the predetermined time interval The level transitions to the second logic level. The present invention enables the delay-locked loop within a preset time interval. Therefore, the PLL updates the delay code within a predetermined time interval, so as to reduce the power consumption of the PLL.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more obvious and easy to understand, the following embodiments are given and described in detail with the accompanying drawings as follows.
請參考圖1,圖1是依據本發明一實施例所繪示的延遲鎖相迴路裝置的裝置示意圖。在本實施例中,延遲鎖相迴路裝置100是被運用於記憶體裝置中。延遲鎖相迴路裝置100包括延遲鎖相迴路110以及更新電路120。延遲鎖相迴路110依據致能訊號DLL_ACT被致能後接收輸入時脈ICLK,並且對輸入時脈ICLK進行延遲以提供延遲時脈DCLK。在本實施例中,更新電路120包括旗標產生電路121以及致能電路122。旗標產生電路121基於預設時間區間DT提供更新旗標FLG。預設時間區間DT小於記憶體裝置的刷新週期。舉例來說明,如果記憶體裝置的刷新週期是7.8微秒,則預設時間區間DT的時間可以被設定為4微秒(本發明不限於此)。致能電路122耦接於旗標產生電路121以及延遲鎖相迴路110。致能電路122依據更新旗標FLG而將致能訊號DLL_ACT的邏輯準位觸發至第一邏輯準位(例如是高邏輯準位,本發明不限於此)。延遲鎖相迴路110例如會反應於具有第一邏輯準位的DLL_ACT被致能以提供延遲控制訊號DCS,並依據延遲控制訊號DCS中的延遲指令產生對應的延遲碼DCD。致能電路122還並在預設時間區間DT結束前將致能訊號DLL_ACT由第一邏輯準位轉態至第二邏輯準位(例如是低邏輯準位,本發明不限於此)。第二邏輯準位不同於第一邏輯準位。Please refer to FIG. 1 . FIG. 1 is a schematic diagram of a delay locked loop device according to an embodiment of the present invention. In this embodiment, the delay-locked
在本實施例中,致能訊號DLL_ACT維持於第一邏輯準位的時間長度會短於預設時間區間DT。也就是說,致能訊號DLL_ACT維持於第一邏輯準位的時間長度會短於記憶體裝置的刷新週期。延遲鎖相迴路110是在預設時間區間DT內才對延遲碼進行更新,藉以降低延遲鎖相迴路110本身的消耗功率。此外,在預設時間區間DT小於記憶體裝置的刷新週期的情況下,更新旗標FLG的提供週期會小於刷新週期。因此,本實施例可使延遲鎖相迴路110所提供的延遲時脈DCLK能夠跟隨著溫度變化而變化。In this embodiment, the time length for which the enable signal DLL_ACT is maintained at the first logic level is shorter than the predetermined time interval DT. That is to say, the length of time that the enable signal DLL_ACT is maintained at the first logic level is shorter than the refresh period of the memory device. The delay-locked
請同時參考圖1以及圖2,圖2是依據本發明第一實施例所繪示的更新電路120的電路示意圖。在本實施例中,旗標產生電路121包括振盪器1211以及除頻器1212。振盪器1211提供內部時脈ITC。除頻器1212耦接於振盪器1211以及致能電路122。除頻器1212對內部時脈ITC進行除頻。經除頻後,除頻器1212可使內部時脈ITC的週期大致上等於預設時間區間DT,藉以將內部時脈ITC轉換為更新旗標FLG。Please refer to FIG. 1 and FIG. 2 at the same time. FIG. 2 is a schematic circuit diagram of the
在本實施例中,致能電路122包括正反器FF1_1、FF1_2以及計數器CNT1。正反器FF1_1、FF1_2彼此串聯耦接。正反器FF1_1、FF1_2的設定輸入端S分別接收輸入時脈ICLK。正反器FF1_1的資料輸入端D耦接於除頻器1212,藉以接收來自於除頻器1212的更新旗標FLG。正反器FF1_1的輸出端Q耦接至正反器FF1_2的資料輸入端D。正反器FF1_2的輸出端Q用以輸出致能訊號DLL_ACT。在本實施例中,彼此串聯耦接的正反器FF1_1、FF1_2能夠對在更新旗標FLG被提供後藉由第一個輸入時脈ICLK與更新旗標FLG進行同步,並且在下一個輸入時脈ICLK將致能訊號DLL_ACT的邏輯準位觸發至第一邏輯準位。也就是說,正反器FF1_1、FF1_2能夠對更新旗標FLG進行一個輸入時脈ICLK到兩個輸入時脈ICLK之間的延遲,藉以產生具有第一邏輯準位的致能訊號DLL_ACT。在一些實施例中,正反器的數量可以大於2個,也就是說,致能電路122能夠依據正反器的數量對更新旗標FLG進行多個輸入時脈ICLK的延遲,藉以產生具有第一邏輯準位的致能訊號DLL_ACT。In this embodiment, the enabling
在本實施例中,計數器CNT1耦接於正反器FF1_2的輸出端Q以接收致能訊號DLL_ACT。計數器CNT1在接收到致能訊號DLL_ACT時會將致能訊號DLL_ACT維持於第一邏輯準位,並對輸入時脈ICLK的次數進行計數。當輸入時脈ICLK的次數達到一預設次數時,計數器CNT1將致能訊號DLL_ACT由第一邏輯準位轉態至第二邏輯準位。In this embodiment, the counter CNT1 is coupled to the output end Q of the flip-flop FF1_2 to receive the enable signal DLL_ACT. When the counter CNT1 receives the enable signal DLL_ACT, it maintains the enable signal DLL_ACT at the first logic level, and counts the times of the input clock ICLK. When the number of times of inputting the clock ICLK reaches a predetermined number, the counter CNT1 switches the enable signal DLL_ACT from the first logic level to the second logic level.
舉例來說明,請同時參考圖1至圖3,圖3是依據本發明第一實施例所繪示的訊號時序圖。在本實施例中,旗標產生電路121在時間點t1基於預設時間區間DT提供更新旗標FLG。預設時間區間DT大致上等於從時間點t1到時間點t4之間的時間長度(如,4微秒)。更新旗標FLG被提供後(即,在時間點t1後)的時間點t2,致能訊號DLL_ACT的邏輯準位會在第二個輸入時脈ICLK的上升沿被觸發至第一邏輯準位。因此,延遲鎖相迴路110會反應於具有第一邏輯準位的DLL_ACT被致能以提供延遲控制訊號DCS,並依據延遲控制訊號DCS中的延遲指令(UP或DN)產生對應的延遲碼DCD。For example, please refer to FIG. 1 to FIG. 3 at the same time. FIG. 3 is a signal timing diagram according to the first embodiment of the present invention. In this embodiment, the flag generating
在時間點t2,致能電路122的計數器CNT1也會開始對輸入時脈ICLK進行計數。在本實施例中,計數器CNT1例如是對輸入時脈ICLK的上升沿進行計數,本發明不限於此。在一些實施例中,計數器CNT1例如是對輸入時脈ICLK的下降沿進行計數。在本實施例中,當輸入時脈ICLK的次數達到預設次數(如,64次)時,計數器CNT1在時間點t3將致能訊號DLL_ACT由第一邏輯準位轉態至第二邏輯準位。因此,在時間點t3時,延遲鎖相迴路110反應於具有第二邏輯準位的致能訊號DLL_ACT被禁能。At the time point t2, the counter CNT1 of the enabling
在本實施例中,預設時間區間DT的時間長度以及預設次數可以依據設計需求被適當地設定。因此,基於上述的設定,延遲鎖相迴路110是在預設時間區間DT內才對延遲碼DCD進行更新,藉以降低延遲鎖相迴路110的消耗功率。另外,在預設時間區間DT的時間長度(如,4微秒)小於記憶體裝置的刷新週期(如,7.8微秒)的情況下,本實施例可使延遲鎖相迴路110所提供的延遲時脈DCLK能夠即時地隨著溫度變化而變化。此外,本實施例能夠不依賴於記憶體裝置的外部命令提供致能訊號DLL_ACT。In this embodiment, the time length of the preset time interval DT and the preset number of times can be appropriately set according to design requirements. Therefore, based on the above setting, the
請同時參考圖1以及圖4,圖4是依據本發明第二實施例所繪示的更新電路的裝置示意圖。在本實施例中,更新電路220包括旗標產生電路121以及致能電路222。致能電路222包括更新指令產生器2221、正反器FF1_1、FF1_2以及計數器CNT2。更新指令產生器2221在接收到更新旗標FLG後反應於致能指令CMD_ACT產生更新指令UD_CMD。在本實施例中,更新指令產生器2221可包括觸發器TG1、TG2。觸發器TG1耦接於旗標產生電路121以接收更新旗標FLG。觸發器TG1反應於更新旗標FLG的上升沿將位於觸發器TG1的輸出端U1的邏輯準位觸發至第一邏輯準位。觸發器TG1還會依據重置訊號RST將位於觸發器TG1的輸出端U1的邏輯準位由第一邏輯準位轉態至第二邏輯準位。Please refer to FIG. 1 and FIG. 4 at the same time. FIG. 4 is a schematic diagram of an apparatus of a refresh circuit according to a second embodiment of the present invention. In this embodiment, the
在本實施例中,觸發器TG1接收更新旗標FLG以及重置訊號RST,並且對更新旗標FLG以及重置訊號RST進行反相。觸發器TG1包括反及(NAND)閘NAND1、NAND2。反及閘NAND1的第一輸入端用以接收被反相的更新旗標FLG。反及閘NAND1的第二輸入端耦接於反及閘NAND2的輸出端。反及閘NAND1的輸出端被作為觸發器TG1的輸出端U1。反及閘NAND2的第一輸入端耦接於反及閘NAND1的輸出端。反及閘NAND1的第二輸入端用以接收被反相的重置訊號RST。In this embodiment, the flip-flop TG1 receives the update flag FLG and the reset signal RST, and inverts the update flag FLG and the reset signal RST. The flip-flop TG1 includes NAND gates NAND1 and NAND2. The first input terminal of the inversion gate NAND1 is used for receiving the inverted update flag FLG. The second input terminal of the inversion gate NAND1 is coupled to the output terminal of the inversion gate NAND2. The output terminal of the inversion gate NAND1 is used as the output terminal U1 of the flip-flop TG1. The first input terminal of the inversion gate NAND2 is coupled to the output terminal of the inversion gate NAND1. The second input terminal of the inversion gate NAND1 is used for receiving the inverted reset signal RST.
在本實施例中,觸發器TG2耦接於觸發器TG1的輸出端U1。在位於觸發器TG1的輸出端U1的邏輯準位為第一邏輯準位的情況下,觸發器TG2會反應於致能指令CMD_ACT的上升沿觸發更新指令UD_CMD。在本實施例中,更新指令產生器2221可接收記憶體裝置的外部命令(如致能命令)。在接收到外部命令時,更新指令產生器2221會依據輸入時脈ICLK的上升沿觸發致能指令CMD_ACT。因此,在本實施例中,致能指令CMD_ACT的上升沿會與輸入時脈ICLK的上升沿同步。觸發器TG2會依據重置訊號RST重置更新指令UD_CMD。In this embodiment, the flip-flop TG2 is coupled to the output end U1 of the flip-flop TG1. When the logic level of the output terminal U1 of the flip-flop TG1 is the first logic level, the flip-flop TG2 will trigger the update command UD_CMD in response to the rising edge of the enable command CMD_ACT. In this embodiment, the
在本實施例中,正反器FF1_1、FF1_2彼此串聯耦接。正反器FF1_1、FF1_2的設定輸入端S分別接收輸入時脈ICLK。正反器FF1_1的資料輸入端D耦接於更新指令產生器2221,藉以接收來自於更新指令產生器2221的更新指令UD_CMD。正反器FF1_1的輸出端Q耦接至正反器FF1_2的資料輸入端D。正反器FF1_2的輸出端Q用以輸出致能訊號DLL_ACT。在本實施例中,彼此串聯耦接的正反器FF1_1、FF1_2能夠對在更新指令UD_CMD被提供時藉由第一個輸入時脈ICLK與更新指令UD_CMD進行同步,並且在下一個輸入時脈ICLK依據更新指令UD_CMD將致能訊號DLL_ACT的邏輯準位觸發至第一邏輯準位。也就是說,正反器FF1_1、FF1_2能夠對更新指令UD_CMD進行一個輸入時脈ICLK到兩個輸入時脈ICLK之間的延遲,藉以產生具有第一邏輯準位的致能訊號DLL_ACT。In this embodiment, the flip-flops FF1_1 and FF1_2 are coupled to each other in series. The setting input terminals S of the flip-flops FF1_1 and FF1_2 respectively receive the input clock pulse ICLK. The data input terminal D of the flip-flop FF1_1 is coupled to the
在本實施例中,計數器CNT2耦接於正反器FF1_2的輸出端Q以接收致能訊號DLL_ACT。計數器CNT2在接收到致能訊號DLL_ACT時會將致能訊號DLL_ACT維持於第一邏輯準位,並對輸入時脈ICLK的次數進行計數。當輸入時脈ICLK的次數達到第一預設次數時,計數器CNT2會產生用以重置更新指令UD_CMD的重置訊號RST。當輸入時脈ICLK的次數達到第二預設次數時,計數器CNT2將致能訊號DLL_ACT由第一邏輯準位轉態至第二邏輯準位。第二預設次數大於第一預設次數。因此在致能訊號DLL_ACT被轉態至第二邏輯準位之前,更新指令UD_CMD會被重置。因此,相較於第一實施例,本實施例可基於記憶體裝置的外部命令提供致能訊號DLL_ACT。In this embodiment, the counter CNT2 is coupled to the output end Q of the flip-flop FF1_2 to receive the enable signal DLL_ACT. When the counter CNT2 receives the enable signal DLL_ACT, it maintains the enable signal DLL_ACT at the first logic level, and counts the times of the input clock ICLK. When the number of times of inputting the clock ICLK reaches the first preset number, the counter CNT2 will generate a reset signal RST for resetting the update command UD_CMD. When the number of times of inputting the clock ICLK reaches the second preset number of times, the counter CNT2 switches the enable signal DLL_ACT from the first logic level to the second logic level. The second preset number of times is greater than the first preset number of times. Therefore, before the enable signal DLL_ACT is transitioned to the second logic level, the update command UD_CMD is reset. Therefore, compared with the first embodiment, the present embodiment can provide the enable signal DLL_ACT based on the external command of the memory device.
舉例來說明,請同時參考圖1、圖4以及圖5,圖5是依據本發明第二實施例所繪示的訊號時序圖。在本實施例中,旗標產生電路121在時間點t1基於預設時間區間DT提供更新旗標FLG。預設時間區間DT大致上等於從時間點t1到時間點t6之間的時間長度(如,4微秒)。更新旗標FLG被提供後(即,在時間點t1後),位於觸發器TG1的輸出端U1的邏輯準位會被觸發至第一邏輯準位。在位於觸發器TG1的輸出端U1的邏輯準位為第一邏輯準位的情況下,更新指令產生器2221接收到記憶體裝置的外部命令中的致能命令ACT(本發明不限於此),並在時間點t2依據輸入時脈ICLK的上升沿觸發致能指令CMD_ACT。因此在時間點t2,觸發器TG2反應於致能指令CMD_ACT的上升沿將更新指令UD_CMD的邏輯準位觸發至第一邏輯準位。For example, please refer to FIG. 1 , FIG. 4 and FIG. 5 at the same time. FIG. 5 is a signal timing diagram according to the second embodiment of the present invention. In this embodiment, the
在時間點t3,在更新指令UD_CMD的上升沿與輸入時脈ICLK(即,第一個輸入時脈ICLK)的上升沿同步的情況下,致能訊號DLL_ACT的邏輯準位會在下一個輸入時脈ICLK(即,第二個輸入時脈ICLK)的上升沿被觸發至第一邏輯準位。在本實施例中,致能指令CMD_ACT會依據輸入時脈ICLK的上升沿被重置。在一些情況下,更新指令UD_CMD因為延遲而使更新指令UD_CMD的時序落後於輸入時脈ICLK的時序。因此,時間點t3會被延遲到下一個輸入時脈ICLK的上升沿。本發明的致能訊號DLL_ACT的觸發時間點並不以本實施例的時間點t3為限。在時間點t3,延遲鎖相迴路110會反應於具有第一邏輯準位的DLL_ACT被致能以提供延遲控制訊號DCS,並依據延遲控制訊號DCS中的延遲指令產生對應的延遲碼DCD。At time point t3, under the condition that the rising edge of the update command UD_CMD is synchronized with the rising edge of the input clock ICLK (ie, the first input clock ICLK), the logic level of the enable signal DLL_ACT will be at the next input clock The rising edge of ICLK (ie, the second input clock ICLK) is triggered to the first logic level. In this embodiment, the enable command CMD_ACT is reset according to the rising edge of the input clock ICLK. In some cases, the update command UD_CMD is delayed so that the timing of the update command UD_CMD lags behind the timing of the input clock ICLK. Therefore, the time point t3 is delayed to the rising edge of the next input clock ICLK. The triggering time point of the enable signal DLL_ACT of the present invention is not limited to the time point t3 in this embodiment. At time point t3 , the delay-locked
在時間點t3,計數器CNT2也會開始對輸入時脈ICLK進行計數。在本實施例中,計數器CNT2例如是對輸入時脈ICLK的上升沿進行計數。當輸入時脈ICLK的次數達到第一預設次數(如,31次)時,計數器CNT2會在時間點t4提供重置訊號RST。在時間點t4,更新指令產生器2221會依據重置訊號RST將位於觸發器TG1的輸出端U1的邏輯準位重置為第二邏輯準位,並將更新指令UD_CMD重置為第二邏輯準位。因此,更新指令UD_CMD的邏輯準位維持於第一邏輯準位的時間長度(即,時間點t2到時間點t4之間的時間長度)接近或等於輸入時脈ICLK的週期的32倍。At the time point t3, the counter CNT2 also starts to count the input clock ICLK. In this embodiment, the counter CNT2 counts the rising edge of the input clock ICLK, for example. When the number of times of inputting the clock ICLK reaches the first preset number of times (eg, 31 times), the counter CNT2 will provide the reset signal RST at the time point t4 . At time point t4, the
當輸入時脈ICLK的次數達到第二預設次數(如,64次)時,計數器CNT2會在時間點t5將致能訊號DLL_ACT的邏輯準位由第一邏輯準位轉態至第二邏輯準位。因此,在時間點t5時,延遲鎖相迴路110會反應於具有第二邏輯準位的致能訊號DLL_ACT被禁能。When the number of times of inputting the clock ICLK reaches the second preset number of times (eg, 64 times), the counter CNT2 will change the logic level of the enable signal DLL_ACT from the first logic level to the second logic level at the time point t5 bit. Therefore, at the time point t5, the delay-locked
請同時參考圖1以及圖6,圖6是依據本發明第三實施例所繪示的更新電路的裝置示意圖。在本實施例中,更新電路320包括旗標產生電路121以及致能電路322。致能電路322包括更新指令產生器3321、正反器FF1_1、FF1_2、正反器FF2以及邏輯電路LGC。更新指令產生器3321在接收到更新旗標FLG時反應於致能指令CMD_ACT產生更新指令UD_CMD。進一步地,在本實施例中,更新指令產生器3321包括觸發器TG1以及觸發器TG2。觸發器TG1耦接於旗標產生電路121以更新旗標FLG。觸發器TG1反應於更新旗標FLG的上升沿將位於觸發器TG1的輸出端U1的邏輯準位觸發至第一邏輯準位。觸發器TG1還會依據重置訊號RST將位於觸發器TG1的輸出端U1的邏輯準位由第一邏輯準位轉態至第二邏輯準位。觸發器TG1時施細節可以由圖4的實施例中獲致足夠的教示,故不再贅述。Please refer to FIG. 1 and FIG. 6 at the same time. FIG. 6 is a schematic diagram of an apparatus of a refresh circuit according to a third embodiment of the present invention. In this embodiment, the
在本實施例中,觸發器TG2耦接於觸發器TG1的輸出端U1。在位於觸發器TG1的輸出端U1的邏輯準位為第一邏輯準位的情況下,觸發器TG2會反應於致能指令CMD_ACT的上升沿觸發更新指令UD_CMD。此外,觸發器TG2依據結束指令CMD_PRE重置更新指令UD_CMD。在本實施例中,更新指令產生器3321可接收記憶體裝置的第一外部命令(如,致能命令)。在接收到第一外部命令時,更新指令產生器3321會依據輸入時脈ICLK的上升沿觸發致能指令CMD_ACT。在本實施例中,更新指令產生器3321也會接收記憶體裝置的第二外部命令(如,刷新命令)。在接收到第二外部命令時,更新指令產生器3321會依據輸入時脈ICLK的上升沿觸發結束指令CMD_PRE。因此,在本實施例中,致能指令CMD_ACT的上升沿會與輸入時脈ICLK的上升沿同步。結束指令CMD_PRE的上升沿會與輸入時脈ICLK的上升沿同步。In this embodiment, the flip-flop TG2 is coupled to the output end U1 of the flip-flop TG1. When the logic level of the output terminal U1 of the flip-flop TG1 is the first logic level, the flip-flop TG2 will trigger the update command UD_CMD in response to the rising edge of the enable command CMD_ACT. In addition, the flip-flop TG2 resets the update command UD_CMD according to the end command CMD_PRE. In this embodiment, the
在本實施例中,正反器FF1_1、FF1_2彼此串聯耦接。正反器FF1_1、FF1_2的設定輸入端S分別接收輸入時脈ICLK。正反器FF1_1的資料輸入端D耦接於更新指令產生器3321,藉以接收來自於更新指令產生器3321的更新指令UD_CMD。正反器FF1_1的輸出端Q耦接至正反器FF1_2的資料輸入端D。正反器FF1_2的輸出端Q用以輸出致能訊號DLL_ACT。正反器FF2資料輸入端D耦接至正反器FF1_2的輸出端Q。正反器FF2的設定輸入端S分別接收輸入時脈ICLK。正反器FF2的輸出端Q對致能訊號DLL_ACT進行延遲以產生內部訊號。邏輯電路LGC耦接於正反器FF2的輸出端Q以及正反器FF1_2的輸出端Q。邏輯電路LGC對內部訊號進行反相,並且對致能訊號DLL_ACT以及被反相的內部訊號進行邏輯及運算以產生重置訊號RST。重置訊號RST用以重置位於觸發器TG1的輸出端U1的邏輯準位。In this embodiment, the flip-flops FF1_1 and FF1_2 are coupled to each other in series. The setting input terminals S of the flip-flops FF1_1 and FF1_2 respectively receive the input clock pulse ICLK. The data input terminal D of the flip-flop FF1_1 is coupled to the
進一步地,邏輯電路LGC包括及閘AND3。及閘AND3接收致能訊號DLL_ACT以及被反相的內部訊號,並且對致能訊號DLL_ACT以及被反相的內部訊號進行邏輯及運算以產生重置訊號RST。相較於第一實施例以及第二實施例,本實施例可不需要計數器提供致能訊號DLL_ACT或重置訊號RST。Further, the logic circuit LGC includes an AND3 gate. The AND gate AND3 receives the enable signal DLL_ACT and the inverted internal signal, and performs a logical AND operation on the enable signal DLL_ACT and the inverted internal signal to generate the reset signal RST. Compared with the first embodiment and the second embodiment, the present embodiment does not require the counter to provide the enable signal DLL_ACT or the reset signal RST.
舉例來說明,請同時參考圖1、圖6以及圖7,圖7是依據本發明第三實施例所繪示的訊號時序圖。在本實施例中,關於時間點t1~t3的實施細節可以由第二實施例中獲致足夠的教示,故不再贅述。在時間點t4,邏輯電路LGC產生重置訊號RST。因此在時間點t4,位於觸發器TG1的輸出端U1的邏輯準位會依據重置訊號RST被重置。在本實施例中,重置訊號RST可以被延遲以在時間點t4被產生。在一些實施例中,重置訊號RST可以以在時間點t3被產生,本發明並不以重置訊號RST的產生時間點為限。For example, please refer to FIG. 1 , FIG. 6 and FIG. 7 at the same time. FIG. 7 is a signal timing diagram according to a third embodiment of the present invention. In this embodiment, the implementation details of the time points t1 to t3 can be sufficiently taught from the second embodiment, so they are not repeated here. At time point t4, the logic circuit LGC generates the reset signal RST. Therefore, at the time point t4, the logic level of the output terminal U1 of the flip-flop TG1 is reset according to the reset signal RST. In this embodiment, the reset signal RST may be delayed to be generated at the time point t4. In some embodiments, the reset signal RST may be generated at the time point t3, and the present invention is not limited to the time point when the reset signal RST is generated.
接下來,更新指令產生器3321接收到外部命令中的刷新命令PRE(本發明不限於此)。更新指令產生器3321會在時間點t5依據輸入時脈ICLK的上升沿觸發結束指令CMD_PRE。觸發器TG2在時間點t5依據結束指令CMD_PRE將更新指令UD_CMD的邏輯準位重置為第二邏輯準位。在時間點t6,致能訊號DLL_ACT的邏輯準位由第一邏輯準位轉態至第二邏輯準位。因此,在時間點t6時,延遲鎖相迴路110會反應於具有第二邏輯準位的致能訊號DLL_ACT被禁能。在本實施例中,致能指令CMD_PRE在時間點t6會依據輸入時脈ICLK的上升沿被重置(本發明不限於此)。Next, the
請同時參考圖1以及圖8,圖8是依據本發明一實施例所繪示的更新方法流程圖。在本實施例中,更新方法會在步驟S110中基於預設時間區間DT提供更新旗標FLG。預設時間區間DT小於記憶體裝置的刷新週期。在步驟S120中,依據更新旗標FLG以將致能訊號DLL_ACT觸發至第一邏輯準位,並在預設時間區間DT結束前將致能訊號DLL_ACT由第一邏輯準位轉態至第二邏輯準位。在步驟S130中,依據致能訊號DLL_ACT致能延遲鎖相迴路110,藉以使延遲鎖相迴路110對輸入時脈ICLK進行延遲以提供延遲時脈DCLK。Please refer to FIG. 1 and FIG. 8 at the same time. FIG. 8 is a flowchart of an update method according to an embodiment of the present invention. In this embodiment, the update method provides the update flag FLG based on the preset time interval DT in step S110. The preset time interval DT is less than the refresh period of the memory device. In step S120, the enable signal DLL_ACT is triggered to the first logic level according to the update flag FLG, and the enable signal DLL_ACT is transitioned from the first logic level to the second logic level before the preset time period DT ends level. In step S130, the delay locked
綜上所述,本發明是基於一預設時間區間提供更新旗標,依據更新旗標以將致能訊號觸發至第一邏輯準位,並且在預設時間區間結束前將致能訊號由第一邏輯準位轉態至第二邏輯準位。本發明是在預設時間區間內致能延遲鎖相迴路。因此,延遲鎖相迴路是在預設時間區間內才對延遲碼進行更新,藉以降低延遲鎖相迴路的消耗功率。此外,在預設時間區間小於記憶體裝置的刷新週期的情況下,本發明能夠使延遲鎖相迴路所提供的延遲時脈能夠跟隨著溫度變化而變化。To sum up, the present invention provides an update flag based on a preset time interval, triggers the enable signal to the first logic level according to the update flag, and activates the enable signal from the first logic level before the preset time interval ends. A logic level transitions to a second logic level. The present invention enables the delay-locked loop within a preset time interval. Therefore, the PLL updates the delay code within a predetermined time interval, so as to reduce the power consumption of the PLL. In addition, when the preset time interval is smaller than the refresh period of the memory device, the present invention enables the delay clock provided by the delay locked loop to change with the temperature change.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed above by the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, The protection scope of the present invention shall be determined by the scope of the appended patent application.
100:延遲鎖相迴路裝置
110:延遲鎖相迴路
120、220、320:更新電路
121:旗標產生電路
1211:振盪器
1212:除頻器
122、222、322:致能電路
2221、3321:更新指令產生器
ACT:致能命令
NAND1、NAND2:反及閘
AND3:及閘
CMD_ACT:致能指令
CMD_PRE:結束指令
CNT1、CNT2:計數器
D:正反器的資料輸入端
DCD:延遲碼
DCLK:延遲時脈
DCS:延遲控制訊號
DT:預設時間區間
DLL_ACT:致能訊號
FF1_1、FF1_2、FF2:正反器
FLG:更新旗標
ICLK:輸入時脈
ITC:內部時脈
LGC:邏輯電路
PRE:刷新命令
Q:正反器的輸出端
RST:重置訊號
S:正反器的設定輸入端
S110~S130:步驟
t1~t7:時間點
TG1:第一觸發器
TG2:第二觸發器
U1:第一觸發器的輸出端
UD_CMD:更新指令100: Delay locked loop device
110: Delay locked
圖1是依據本發明一實施例所繪示的延遲鎖相迴路裝置的裝置示意圖。 圖2是依據本發明第一實施例所繪示的更新電路的電路示意圖。 圖3是依據本發明第一實施例所繪示的訊號時序圖。 圖4是依據本發明第二實施例所繪示的更新電路的裝置示意圖。 圖5是依據本發明第二實施例所繪示的訊號時序圖。 圖6是依據本發明第三實施例所繪示的更新電路的裝置示意圖。 圖7是依據本發明第三實施例所繪示的訊號時序圖。 圖8是依據本發明一實施例所繪示的更新方法流程圖。FIG. 1 is a schematic diagram of a delay-locked loop device according to an embodiment of the present invention. FIG. 2 is a schematic circuit diagram of a refresh circuit according to the first embodiment of the present invention. FIG. 3 is a signal timing diagram according to the first embodiment of the present invention. FIG. 4 is a schematic diagram of an apparatus of a refresh circuit according to a second embodiment of the present invention. FIG. 5 is a signal timing diagram according to the second embodiment of the present invention. FIG. 6 is a schematic diagram of an apparatus of a refresh circuit according to a third embodiment of the present invention. FIG. 7 is a signal timing diagram according to a third embodiment of the present invention. FIG. 8 is a flowchart of an update method according to an embodiment of the present invention.
100:延遲鎖相迴路裝置100: Delay locked loop device
110:延遲鎖相迴路110: Delay locked loop
120:更新電路120: Update circuit
121:旗標產生電路121: Flag generation circuit
122:致能電路122: Enable circuit
DCD:延遲碼DCD: Delay Code
DCLK:延遲時脈DCLK: Delayed clock
DCS:延遲控制訊號DCS: Delay Control Signal
DLL_ACT:致能訊號DLL_ACT: enable signal
DT:預設時間區間DT: preset time interval
FLG:更新旗標FLG: update flag
ICLK:輸入時脈ICLK: input clock
Claims (16)
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