TW202143078A - Test path coordinating method, electronic device and storage medium - Google Patents

Abstract

A test path coordinating method includes: acquiring information of products to be tested, the information of products includes a number of products, test items for each product, test equipment required for the test items, and a test time for each test item; acquiring information of each test equipment, the information of the test equipment includes whether the product is being tested and test information of the product being tested, the test information of the product includes a length of time the product has been tested and a test result; and planning a test path of each product according to the information of the products, the information of test equipment and a preset rule. The invention also provides an electronic device and a storage medium that execute the above test path coordinating method.

Description

Test path coordination method, electronic equipment and storage medium

The invention relates to product testing, in particular to a testing path overall planning method, electronic equipment and storage medium.

Communication products need to be tested before shipment. Due to cost and space considerations, some types of test equipment are purchased more, and some types of test equipment are less purchased. When testing multiple products, because there are multiple products Test projects often appear when a product needs to be tested with a test device, and the test device is being occupied by other products, and some test devices may not test any products. This makes the entire test time unsatisfactory.

In view of this, it is necessary to provide a test path coordination method, electronic equipment, and storage medium that can reduce the time required for testing of multiple products.

A test path coordination method, which is applied to electronic equipment. The test path coordination method includes: obtaining information of multiple products to be tested. The test equipment that the project needs to use, the test duration of each test project; obtain information about each test equipment, the information about the test equipment includes whether the product is being tested and the test information of the product being tested, the The test information of the product includes the length of time the product has been tested and the test result; and the test path of each product is planned according to preset rules based on the information of the multiple products and the information of each test device, and the test path includes each The sequence in which the products are tested and the sequence in which the test items of each product are tested.

An electronic device includes a processor and a memory, and a plurality of program modules are stored in the memory, and the plurality of program modules are loaded by the processor and execute the above-mentioned test path coordination method.

A storage medium has at least one computer instruction stored thereon, and the instruction is loaded by a processor to execute the above-mentioned test path coordination method.

The above-mentioned test path coordination method, electronic equipment, and storage medium plan the test path of each product according to preset rules based on the information of multiple products and the information of test equipment, which can avoid congestion or waiting in the test process according to the preset rules. It helps to reduce the test time of the multiple products.

In order to be able to understand the above objectives, features and advantages of the present invention more clearly, the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other if there is no conflict.

In the following description, many specific details are set forth in order to fully understand the present invention. The described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field of the present invention. The terms used in the specification of the present invention herein are only for the purpose of describing specific embodiments, and are not intended to limit the present invention.

Please refer to FIG. 1, the present invention provides a method for overall planning of test paths. The test path coordination method is used for coordinating the sequence of multiple products being tested on multiple test devices, and the test path coordination method includes the following steps.

Step S102: Obtain information of multiple products to be tested, the information of the multiple products includes the number of products, the test project of each product, the test equipment that the test project needs to use, and the test duration of each test project. The test duration of the test item is the standard duration or the average duration, and the operator can modify it according to the actual situation. In one embodiment, the multiple products are the same product, for example, all are switches, and the same product has the same test project. In another embodiment, the multiple products include multiple products, for example, some products are switches, and some products are routers, and the information of the multiple products includes the quantity of each product. Different types of products have at least one different test item. The information of the product also includes the identification information of the product, so that the type of the product can be identified according to the identification information of the product.

Step S104: Obtain the information of each test equipment, the information of the test equipment includes whether the product is being tested and the test information of the product being tested, and the test information of the product includes the length of time the product has been tested and the test result .

Step S106: According to the information of the multiple products and the information of each test device, the test path of each product is planned according to a preset rule. The test path includes the order in which each product is tested, that is, which one is tested first Or which products, and the order in which the test items of each product are tested, that is, which test item is tested first for each product.

In one embodiment, the information of the product further includes the test sequence of at least two test projects among the multiple test projects of the product, and the test path conforms to the test sequence in the product information.

In one embodiment, the preset rule is that the test process of a plurality of the products takes the shortest time. In one embodiment, the test equipment includes parallel test equipment and at least one non-parallel test equipment. The non-parallel test equipment can only test one product at a time and cannot test multiple products in parallel. The preset rule When a plurality of said products are tested on a non-parallel device, there is no need to wait or the total waiting time is the shortest, or the non-parallel test device does not wait or the total waiting time is the shortest during the test. Specifically, the preset rule is to re-plan the test path when the non-parallel test equipment has the shortest total waiting time in the test process and when there is no product test on the non-parallel test equipment. In this way, the test path can be re-planned according to whether the product is located in the non-parallel test equipment. The conditions on the parallel test equipment adjust the test path in time so that the total waiting time of the non-parallel test equipment is the shortest.

Further, the preset rule also includes that when the test result of a test item of the product is unqualified, the unqualified product is determined as a product not to be tested, and re-planning according to the preset rule The test path of the remaining product to be tested. Since a test project of the product is unqualified, there is no need to test other remaining test items of the product. In this case, re-plan the test of the product to be tested after removing the unqualified product. The path can further save the remaining time for the product to be tested for testing.

Referring to FIG. 2, in one embodiment, the test path coordination method further includes step S103 after step S102, and further includes step S108 after step S106.

Step S103: Determine whether the acquired information of the multiple products includes the test duration of the test project of each product. When the information of the multiple products includes the test duration of the test project of each product, step S104 is entered; otherwise, step S105 is entered.

It can be understood that the step S103 may also be after the step S104 and before the step S106. When the information of the multiple products includes the test duration of the test project of each product, go to step S106; otherwise, go to step S105.

Step S105: Output reminding information with incomplete information to remind related operators to supplement product information. The reminder information can be text information or audio information. In one embodiment, the product information includes product identification information, and the reminder information includes product identification information with incomplete information. In this way, the operator can know which product has incomplete information without requiring the operator to Checking the product information helps to quickly complete the product information.

Step S108: Transmit the test path to the execution device, so that the execution device transfers a plurality of the products to the corresponding test equipment for testing according to the test path.

Please refer to FIG. 3 for the schematic structural diagram of the electronic device 10 provided by the present invention and FIG. 4 for the module diagram of the test path coordination system 30 provided by the present invention.

The electronic device 10 includes, but is not limited to, a processor 12, a memory 14 and a computer program 16 stored in the memory 14 and running on the processor 12, and the computer program 16 includes a test path Coordinating the program. When the processor 12 executes the computer program 16, the steps S102 to S108 in the test path coordination system method shown in FIG. 1 are implemented. Alternatively, when the processor 12 executes the computer program 16, the function of the test path coordination system 30 shown in FIG. 4 is realized.

The electronic device 10 may be a computing device such as a computer or a server. Those skilled in the art can understand that the schematic diagram is only an example of the electronic device 10, and does not constitute a limitation on the electronic device 10. Components, for example, the electronic device 10 may also include an input/output device, a network access device, a bus, and the like.

The so-called processor 12 may be a central processing unit (Central Processing Unit, CPU), other general-purpose processors, digital signal processors (Digital Signal Processor, DSP), and dedicated integrated circuits (Application Specific Integrated Circuit, ASIC). , Ready-made programmable gate array (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or the processor 12 can also be any conventional processor, etc. The processor 12 is the control center of the electronic device 10, which uses various interfaces and lines to connect the entire electronic device 10 Various parts.

The memory 14 can be used to store the computer programs 16 and/or modules/units, and the processor 12 runs or executes the computer programs and/or modules/units stored in the memory 14, and The data stored in the memory 14 is called to realize various functions of the electronic device 10. The memory 14 may mainly include a storage program area and a storage data area. The storage program area can store an operating system, an application program (such as an image processing program) required by at least one function, etc.; 10 use the created information (such as the face image of each student and the corresponding student’s name, screening rules), etc. In addition, the memory 14 may include high-speed random access memory, and may also include non-volatile memory, such as hard disks, memory, plug-in hard disks, smart memory cards (Smart Media Card, SMC), and secure digital (Secure Digital, SD) card, flash memory card (Flash Card), at least one magnetic disk memory device, flash memory device, or other volatile solid-state memory device.

The test path coordination system 30 runs in the electronic device 10. The test path coordination system 30 may include multiple functional modules composed of code segments. The program codes of each program segment in the test path coordination system 30 can be stored in the memory 14 of the electronic device 10 and executed by the at least one processor 12 to realize the test path coordination function.

In this embodiment, the test path coordination system 30 is divided into multiple functional modules according to the functions it performs. The functional modules include a product information acquisition module 31, a judgment module 32, a reminder module 33, and equipment. The information acquisition module 34, the planning module 35, and the transmission module 36. The module referred to in the present invention refers to a series of computer program segments that can be executed by at least one processor and can complete fixed functions, which are stored in the memory 14. It can be understood that, in other embodiments, the above-mentioned modules may also be program instructions or firmware solidified in the processor 12.

The product information acquisition module 31 is used to acquire information about multiple products to be tested. The information on the multiple products includes the number of products, the test project of each product, the test equipment required for the test project, and each product. The test duration of the test project. The information of the multiple products can be stored in the memory 14 or in another electronic device that is communicatively connected with the electronic device 10.

The judgment module 32 is used for judging whether the acquired information of the multiple products includes the test duration of each product's test project. The reminder module 33 is used for outputting reminder information with incomplete information, which does not include the test duration of the test project of each product in the acquired information of the multiple products.

The device information acquisition module 34 is used to acquire information about each test device. The information about the test device includes whether the product is being tested, the test information of the product being tested, and the test information of the product includes the product being tested. The length of the test and the test result. In one embodiment, the electronic device 10 communicates with each device, and obtains the information of the test device from each of the test devices. In another embodiment, the information of each test device is uploaded to a server, and the electronic device 10 communicates with the server, and obtains the information of the test device from the server.

The test path planning module 35 is used to plan the test path of each product according to preset rules according to the information of each product and the information of each test device, and the test path includes the test path of each product to be tested. The order of sequence, that is, which product or products to test first, and the order in which the test items of each product are tested, that is, which test item is tested for each product first.

The transmission module 36 is configured to transmit the test path to one or more execution devices so that the execution device transfers a plurality of the products to the corresponding test equipment for testing according to the test path. In this way, manual handling is not required, and the execution device transfers the product according to the test path, so that the product can be accurately transmitted. The execution device may be a manipulator.

If the integrated module/unit of the electronic device 10 is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer readable storage medium. Based on this understanding, the present invention implements all or part of the processes in the above-mentioned embodiments and methods, and can also be completed by instructing relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the foregoing method embodiments can be realized. Wherein, the computer program includes computer program code, and the computer program code may be in the form of original program code, object code, executable file, or some intermediate forms. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, U disk, removable hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM, Read- Only Memory), Random Access Memory (RAM, Random Access Memory), electric carrier signal, telecommunications signal, software distribution medium, etc.

The above-mentioned test path coordination method, electronic equipment, and storage medium plan the test path of each product according to preset rules based on the information of multiple products and the information of test equipment, which can avoid congestion or waiting in the test process according to the preset rules. It helps to reduce the test time of the multiple products.

For those skilled in the art, other corresponding changes or adjustments can be made according to the inventive scheme and inventive concept of the present invention in combination with actual production needs, and these changes and adjustments should all fall within the scope of the disclosure of the present invention.

Steps S102-S108: Test path coordination method 10: Electronic equipment 30: Test path coordination system 12: processor 14: Memory 16: computer program 31: Product information acquisition module 32: Judgment module 33: Reminder module 34: Equipment information acquisition module 35: Planning Module 36: Transmission module

Fig. 1 is a flow chart of the test path coordination method provided by the present invention.

Fig. 2 is a flowchart of a test path coordination method according to another embodiment of the present invention.

Fig. 3 is a schematic diagram of the structure of an electronic device provided by the present invention.

Fig. 4 is a schematic diagram of the structure of the test path coordination system provided by the present invention.

30: Test path coordination system

31: Product information acquisition module

32: Judgment module

33: Reminder module

34: Equipment information acquisition module

35: Planning Module

36: Transmission module

Claims (10)

A method for overall planning of test paths is applied to electronic equipment, and the method for overall planning of test paths includes: Obtain the information of multiple products to be tested, the information of the multiple products includes the number of products, the test project of each product, the test equipment that the test project needs to use, and the test duration of each test project; Obtain the information of each test equipment, the information of the test equipment includes whether the product is being tested and the test information of the product being tested, and the test information of the product includes the length of time the product has been tested and the test result; and According to the information of the multiple products and the information of each test device, the test path of each product is planned according to preset rules. The test path includes the order in which each product is tested and the test project of each product. The order of testing. The method for coordinating test paths according to claim 1, wherein the multiple products include multiple products, and the information on the multiple products includes the quantity of each product. The method for coordinating test paths as described in claim 1, which further includes the following steps: Determine whether the acquired information of the multiple products includes the test duration of each product's test project; and When the information of the multiple products does not include the test duration of the test project of each product, a reminder information of incomplete information is output. The method for coordinating test paths as described in claim 1, which further includes the following steps: The test path is transmitted to an execution device, and the execution device is used to transfer the plurality of products to the test equipment. The method for coordinating test paths according to claim 1, wherein the information of the product further includes the test sequence of at least two test items among the multiple test items of the product, and the test path conforms to all the items in the product information. Describe the test sequence. The method for coordinating test paths according to claim 1, wherein the preset rule is that the test process of a plurality of the products takes the shortest time. The method for coordinating test paths according to claim 1, wherein the test equipment includes parallel test equipment and at least one non-parallel test equipment, and the preset rule is the waiting time when a plurality of the products are tested on the non-parallel equipment The sum is the shortest. The method for coordinating test paths according to claim 1, wherein the preset rule includes determining that the unqualified product is not a product to be tested when the test result of a test project of the product is unqualified , And re-plan the test paths of the remaining products to be tested according to the preset rules. An electronic device including a processor and a memory, the memory stores a plurality of program modules, and the plurality of program modules are loaded by the processor and executed such as any one of request items 1 to 8 The described test path overall planning method. A storage medium having at least one computer instruction stored thereon, and the instruction is loaded by a processor to execute the test path coordination method described in any one of request items 1 to 8.

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