TW202137739A - Signal optimizing method, electronic device, and storage chipthereof - Google Patents
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Abstract
Description
本發明涉及一種信號優化方法、電子裝置及存儲晶片。The invention relates to a signal optimization method, an electronic device and a storage chip.
隨著電子技術的不斷發展,行動電話、可攜式電腦、個人數位助理(PDA)、平板電腦、媒體播放機等電子裝置在資料處理通常包括檢測以及分析處理。在運行過程中,不同的電子器件之間會產生干擾,進而使得檢測到的信號通常存在雜訊。對於採用分時方式進行檢測的信號,不同時刻採集到的信號之間可能雜訊差異較大,進而使得在對採集到的信號進行分析處理時操作較為複雜,無法簡單快捷的對雜訊進行濾除操作。With the continuous development of electronic technology, data processing of electronic devices such as mobile phones, portable computers, personal digital assistants (PDAs), tablet computers, and media players usually includes detection and analysis. During operation, interference occurs between different electronic devices, which makes the detected signal usually noise. For signals detected by the time-sharing method, there may be large differences in noise between the signals collected at different times, which makes it more complicated to analyze and process the collected signals, and it is impossible to filter the noise simply and quickly. In addition to operations.
有必要提供一種信號優化方法、電子裝置及存儲晶片,旨在解決現有技術中分時檢測過程中採集信號之間差異性較大以及降噪處理複雜的技術問題。It is necessary to provide a signal optimization method, an electronic device, and a storage chip, aiming to solve the technical problems of large differences between collected signals in the time-sharing detection process and complex noise reduction processing in the prior art.
一種信號優化方法,應用於電子裝置中;所述電子裝置包括多個檢測通道、至少一個處理器以及存儲晶片;所述處理器用於執行所述存儲晶片中存儲的電腦程式時實現如下步驟: 將所述檢測通道劃分形成多個檢測區域; 設置至少一個公共檢測通道;所述公共檢測通道在至少兩個不同檢測時刻均被掃描; 採用分時掃描方式對所述檢測通道和所述公共檢測通道進行掃描以得到掃描資料;其中,所述掃描資料包括驅動信號以及雜訊信號; 對所述公共檢測通道在至少兩個不同所述檢測時刻對應的所述掃描資料進行歸一化處理得到雜訊參照值;所述雜訊參照值為某一個所述檢測區域內的雜訊信號;歸一化處理後每個所述檢測區域的雜訊信號均被歸一到與雜訊參照值相關聯; 根據所述雜訊參照值對掃描資料進行降噪處理,以優化掃描資料的降噪處理難度。A signal optimization method applied to an electronic device; the electronic device includes a plurality of detection channels, at least one processor, and a storage chip; when the processor is used to execute a computer program stored in the storage chip, the following steps are implemented: Dividing the detection channel to form a plurality of detection areas; Setting at least one common detection channel; the common detection channel is scanned at at least two different detection moments; Scanning the detection channel and the common detection channel in a time-sharing scanning manner to obtain scan data; wherein the scan data includes a driving signal and a noise signal; Perform normalization processing on the scan data corresponding to the common detection channel at at least two different detection moments to obtain a noise reference value; the noise reference value is a noise signal in a certain detection area ; After the normalization processing, the noise signal of each detection area is normalized to be associated with the noise reference value; Perform noise reduction processing on the scanned data according to the noise reference value to optimize the difficulty of noise reduction processing of the scanned data.
一種電子裝置,包括多個檢測通道、至少一個處理器以及存儲晶片;所述處理器用於執行所述存儲晶片中存儲的電腦程式時實現如下步驟: 將所述檢測通道劃分形成多個檢測區域; 設置至少一個公共檢測通道;所述公共檢測通道在至少兩個不同檢測時刻均被掃描; 採用分時掃描方式對所述檢測通道和所述公共檢測通道進行掃描以得到掃描資料;其中,所述掃描資料包括驅動信號以及雜訊信號; 對所述公共檢測通道在至少兩個不同所述檢測時刻對應的所述掃描資料進行歸一化處理得到雜訊參照值;所述雜訊參照值為某一個所述檢測區域內的雜訊信號;歸一化處理後每個所述檢測區域的雜訊信號均被歸一到與雜訊參照值相關聯; 根據所述雜訊參照值對掃描資料進行降噪處理,以優化掃描資料的降噪處理難度。An electronic device includes a plurality of detection channels, at least one processor, and a storage chip; when the processor is used to execute a computer program stored in the storage chip, the following steps are implemented: Dividing the detection channel to form a plurality of detection areas; Setting at least one common detection channel; the common detection channel is scanned at at least two different detection moments; Scanning the detection channel and the common detection channel in a time-sharing scanning manner to obtain scan data; wherein the scan data includes a driving signal and a noise signal; Perform normalization processing on the scan data corresponding to the common detection channel at at least two different detection moments to obtain a noise reference value; the noise reference value is a noise signal in a certain detection area ; After the normalization processing, the noise signal of each detection area is normalized to be associated with the noise reference value; Perform noise reduction processing on the scanned data according to the noise reference value to optimize the difficulty of noise reduction processing of the scanned data.
一種存儲晶片,所述存儲晶片為電腦可讀存儲晶片,存儲有至少一個指令,所述至少一個指令被處理器執行時實現如下步驟: 將所述檢測通道劃分形成多個檢測區域; 設置至少一個公共檢測通道;所述公共檢測通道在至少兩個不同檢測時刻均被掃描; 採用分時掃描方式對所述檢測通道和所述公共檢測通道進行掃描以得到掃描資料;其中,所述掃描資料包括驅動信號以及雜訊信號; 對所述公共檢測通道在至少兩個不同所述檢測時刻對應的所述掃描資料進行歸一化處理得到雜訊參照值;所述雜訊參照值為某一個所述檢測區域內的雜訊信號;歸一化處理後每個所述檢測區域的雜訊信號均被歸一到與雜訊參照值相關聯; 根據所述雜訊參照值對掃描資料進行降噪處理,以優化掃描資料的降噪處理難度。A storage chip, the storage chip is a computer-readable storage chip, storing at least one instruction, and when the at least one instruction is executed by a processor, the following steps are implemented: Dividing the detection channel to form a plurality of detection areas; Setting at least one common detection channel; the common detection channel is scanned at at least two different detection moments; Scanning the detection channel and the common detection channel in a time-sharing scanning manner to obtain scan data; wherein the scan data includes a driving signal and a noise signal; Perform normalization processing on the scan data corresponding to the common detection channel at at least two different detection moments to obtain a noise reference value; the noise reference value is a noise signal in a certain detection area ; After the normalization processing, the noise signal of each detection area is normalized to be associated with the noise reference value; Perform noise reduction processing on the scanned data according to the noise reference value to optimize the difficulty of noise reduction processing of the scanned data.
上述信號優化方法、電子裝置以及存儲晶片,藉由設置公共檢測通道,並公共檢測通道在至少兩個檢測時刻均被掃描,藉由對公共檢測通道對應的掃描資料進行歸一化處理得到雜訊參照值,以將不同檢測區域之間的噪音進行關聯,進而優化掃描資料的降噪處理難度。The above-mentioned signal optimization method, electronic device, and storage chip set a common detection channel, and the common detection channel is scanned at least two detection moments, and noise is obtained by normalizing the scan data corresponding to the common detection channel The reference value is used to correlate the noise between different detection areas, thereby optimizing the difficulty of noise reduction processing of scanned data.
為了使本技術領域的人員更好地理解本發明方案,下面將結合本發明實施例中的附圖,對本發明實施例中的技術方案進行清楚、完整地描述,顯然,所描述的實施例僅僅是本發明一部分的實施例,而不是全部的實施例。基於本發明中的實施例,本領域普通技術人員在沒有做出創造性勞動前提下所獲得的所有其他實施例,都應當屬於本發明保護的範圍。In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of the embodiments of the present invention, but not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
本發明的說明書及上述附圖中的術語「第一」、「第二」和「第三」等是用於區別不同物件,而非用於描述特定順序。此外,術語「包括」以及它們任何變形,意圖在於覆蓋不排他的包含。例如包含了一系列步驟或模組的過程、方法、系統、產品或設備沒有限定於已列出的步驟或模組,而是可選地還包括沒有列出的步驟或模組,或可選地還包括對於這些過程、方法、產品或設備固有的其它步驟或模組。The terms "first", "second", and "third" in the description of the present invention and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific sequence. In addition, the term "including" and any variations of them are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or modules is not limited to the listed steps or modules, but optionally includes steps or modules that are not listed, or optional The ground also includes other steps or modules inherent to these processes, methods, products, or equipment.
下面結合附圖對本發明的信號優化方法及系統的具體實施方式進行說明。The specific implementation of the signal optimization method and system of the present invention will be described below with reference to the accompanying drawings.
請參照圖1,其為本發明一實施方式的電子裝置1的立體示意圖。在本發明的至少一個實施方式中,所述電子裝置1可以為個人電腦、平板電腦、智慧手機、個人數位助理(Personal Digital Assistant,PDA)、遊戲機、互動式網路電視(Internet Protocol Television, IPTV)、智慧式穿戴式設備、導航裝置等等的可移動設備,也可以為臺式電腦、伺服器、數位電視等等的固定設備。所述電子裝置1可具有觸控功能、指紋識別功能以及攝像功能中的一種或多種的結合。Please refer to FIG. 1, which is a three-dimensional schematic diagram of an
所述電子裝置1包括蓋板11以及第一功能層12。The
所述蓋板11為可以為玻璃基板、或其他具有高強度、高硬度的透明基板。在本發明的至少一個實施方式中,所述蓋板11可以由如聚碳酸酯(Polycarbonate, PC),聚酯(Polythylene terephthalate, PET)、聚甲基丙烯酸甲酯(Polymethylmethacrylate, PMMA)、環烯烴共聚合物(Cyclic Olefin Copolymer, COC)或聚醚碸(Polyether sulfone, PES)等材料製成。The
所述第一功能層12用於識別用戶的觸摸操作和/或生物特徵。在本發明的至少一個實施方式中,所述第一功能層12可以為觸控層(圖未示),以識別用戶的觸摸位置以及觸摸力度中的至少一者或二者的結合。所述第一功能層12由導電材料製成,且可被圖案化形成多個第一觸控電極120(如圖3所示)。同時,所述第一功能層12還可以為生物特徵識別層(圖未示),以識別使用者的生物特徵。在本發明的至少一個實施方式中,所述生物特徵可以為指紋、人臉、虹膜等等,但並不局限於此。所述第一功能層12還可以被圖案化形成多個感測電極(圖未示)。The first functional layer 12 is used to identify the user's touch operation and/or biological characteristics. In at least one embodiment of the present invention, the first functional layer 12 may be a touch layer (not shown) to identify at least one or a combination of the user's touch position and touch strength. The first functional layer 12 is made of a conductive material, and can be patterned to form a plurality of first touch electrodes 120 (as shown in FIG. 3). At the same time, the first functional layer 12 may also be a biometric identification layer (not shown in the figure) to identify the biometric characteristics of the user. In at least one embodiment of the present invention, the biological feature may be a fingerprint, a human face, an iris, etc., but it is not limited thereto. The first functional layer 12 can also be patterned to form a plurality of sensing electrodes (not shown).
所述電子裝置1還包括第二功能層14。所述第二功能層14用於顯示圖像資訊。在本發明的至少一個實施方式中,所述第二功能層14可以為液晶顯示層(Liquid crystal display,LCD)、發光二極體(Light emitting diode, LED)顯示層、有機發光二極體(Organic light emitting diode,OLED)顯示層、有機發光二極體(Micro Organic light emitting diode,OLED)顯示層、電泳顯示層等等,但並不局限於此。所述第二功能層14由導電材料製成,且可被圖案化形成多個圖元電極。在其他實施方式中,所述第二功能層14還可形成多個感光元件(圖未示),例如電荷耦合器件(Charge coupled device,CCD)或互補金屬氧化物半導體(Complementary Metal-Oxide-Semiconductor,CMOS)元件,以感測光線變化並產生響應的信號(圖未示)。The
進一步地,所述電子裝置1還包括多個檢測通道16。在本發明的至少一個實施方式中,所述檢測通道16可根據需求設置為所述電子裝置1中的不同結構。在本實施例中,所述檢測通道16可以為所述第一功能層12中的觸控電極、所述第一功能層12中的感測電極、所述第二功能層14中的圖元電極、所述第二功能層14中的感光元件等等。Further, the
請一併參閱圖2及圖3,其為所述電子裝置1的模組示意圖以及所述檢測通道16的模組示意圖。所述電子裝置1還包括處理器20以及存儲晶片30。所述處理器20用於執行所述存儲晶片30中存儲的電腦程式時實現各種功能。具體地,所述處理器20依據預定規則將所述檢測通道16劃分形成多個檢測區域101,並設置至少一個公共檢測通道18。所述公共檢測通道18在至少兩個不同檢測時刻均被掃描。在本發明的至少一個實施方式中,所述公共檢測通道18與所述檢測通道16為相同的結構。舉例來說,在所述檢測通道16為觸控電極時,所述公共檢測通道18也為觸控電極;在所述檢測通道16為指紋感測電極時,所述公共檢測通道18也為指紋感測電極;在所述檢測通道16為圖元電極時,所述公共檢測通道18也為圖元電極;在所述檢測通道16為傳感電極時,所述公共檢測通道18也為傳感電極。其中,所述預定規則可以根據所述電子裝置1的工作原理進行不同的設定。Please refer to FIG. 2 and FIG. 3 together, which are a schematic diagram of a module of the
所述處理器20採用分時掃描方式根據指定順序對所述檢測通道16和所述公共檢測通道18進行掃描並得到所述掃描資料。其中,所述掃描資料包括驅動信號以及雜訊信號。所述處理器20進一步地根據所述公共檢測通道18在不同檢測時刻對應的多個所述掃描資料進行歸一化處理得到雜訊參照值,所述處理器20根據所述雜訊參照值對每個所述檢測通道16以及每個所述公共檢測通道18對應的所述掃描資料進行降噪處理。The
實施方式一Implementation mode one
請一併參閱圖3,其為第一實施方式中所述檢測區域101和所述公共檢測通道18的模組示意圖。在本實施例中,所述電子裝置1包括第一至第三檢測區域101a-101c和一個所述公共檢測通道18。位於同一所述檢測區域101內的所述檢測通道16相鄰設置。所述公共檢測通道18設置於所述檢測區域101的上邊緣。在其他實施方式中,所述公共檢測通道18還可以設置於任意兩個所述檢測區域101之間,或設置於所述檢測區域101的底部、左側或右側,並不以此為限。Please also refer to FIG. 3, which is a schematic diagram of a module of the detection area 101 and the
具體地,所述處理器20根據每個所述公共檢測通道18對應的所述掃描資料Scan(n)計算在兩個不同檢測時刻之間的掃描資料差值Br,對所有所述掃描資料差值Br進行歸一化處理得到所述雜訊參照值。其中,所述掃描資料Scan(n)根據如下公式一計算得到。
Scan(n)=Signal(n)+Noise(n) 公式一Specifically, the
其中,Scan表示掃描信號;Signal表示有效信號;Niose表示雜訊信號;Scan(n)表示第n時刻的掃描信號;Scan(n)表示第n時刻的掃描信號;Noise(n)表示第n時刻的雜訊信號。Among them, Scan represents the scan signal; Signal represents the effective signal; Niose represents the noise signal; Scan(n) represents the scan signal at the nth time; Scan(n) represents the scan signal at the nth time; Noise(n) represents the nth time Noise signal.
在第一檢測時刻,所述處理器20同時對所述第一檢測區域101a內的所述檢測通道16以及所述公共檢測通道18進行掃描並得到對應的所述掃描資料SCAN1。在第二檢測時刻,所述處理器20同時對所述第二檢測區域101b內的所述檢測通道16以及所述公共檢測通道18進行掃描並得到對應的所述掃描資料SCAN2。所述處理器20計算所述公共檢測通道18在所述第一檢測時刻和所述第二檢測時刻的掃描資料差值Br1。在第三檢測時刻,所述處理器20同時對所述第三檢測區域101c內的所述檢測通道16以及所述公共檢測通道18進行掃描並得到對應的所述掃描資料SCAN3。所述處理器20計算所述公共檢測通道18在所述第二檢測時刻和所述第三檢測時刻的掃描資料差值Br2。At the first detection moment, the
表示有效信號的頻率;表示雜訊信號的頻率;當時,多次掃描有效信號的差異可以忽略不計。即存在以下關係:() Indicates the frequency of the effective signal; Indicates the frequency of the noise signal; when At the time, the difference of the effective signal of multiple scans can be ignored. That is, the following relationship exists: ( )
所述歸一化處理為對所有所述掃描資料差值Br進行求和。 The normalization process is to sum all the scan data difference Br.
從而得到: To get:
從上述公式中可以看出,每個所述檢測區域101的雜訊均被歸一到與最後一個所述檢測區域101內的雜訊Noise(n)相關聯。即,消除了不同檢測時刻下,每個所述檢測區域101之間的雜訊差異。It can be seen from the above formula that the noise of each detection area 101 is normalized to be associated with the noise (n) in the last detection area 101. That is, the noise difference between each detection area 101 at different detection moments is eliminated.
在所述電子裝置1中的所述檢測通道16和所述公共檢測通道18為觸控電極時,所述公共檢測通道18由呈一行且串聯設置的多個觸控電極構成。When the
在本實施例中,所述處理器20根據指定順序對多個所述檢測區域101內的多個所述檢測通道16以及所述公共檢測通道18進行掃描。其中,所述指定順序可以為根據排列順序從上至下。所述指定順序還可以根據使用者的需求進行設定,例如,所述掃描順序還還可以為先依次對位於兩端的所述檢測區域101內的所述檢測通道16進行掃描後,再對位於中間的所述檢測區域101內的所述檢測通道16進行掃描。以圖3為例,所述處理器20可以在第一檢測時刻對第一所述檢測區域101a內的所述檢測通道16以及所述公共檢測通道18進行掃描,在第二檢測時刻對第三個所述檢測區域101c內的所述檢測通道16以及所述公共檢測通道18進行掃描,在第三檢測時刻對第二個所述檢測區域101b內的所述檢測通道16以及所述公共檢測通道18進行掃描。In this embodiment, the
實施方式二Implementation mode two
請一併參閱圖4,其為第二實施方式中所述檢測區域101和所述公共檢測通道18的模組示意圖。所述第二實施方式的所述電子裝置1與所述第一實施方式中的所述電子裝置1的結構相同。也就是說,所述第一實施方式描述的所述電子裝置1的描述基本上均可以適用於所述第二實施方式的所述電子裝置1,二者的主要差別在於:位於所述檢測區域101內的所述檢測通道16呈相等間隔設置。每個所述檢測通道16之間被位於其他所述檢測區域101內的所述檢測通道16間隔。在本實施例中,位於第一個檢測區域101內的相鄰兩個所述檢測通道16之間間隔有一個位於第二個所述檢測區域101內的以及一個位於第三個所述檢測區域101內的所述檢測通道16。Please also refer to FIG. 4, which is a schematic diagram of a module of the detection area 101 and the
實施方式三Implementation mode three
請一併參閱圖5,其為第三實施方式中所述檢測區域101和所述公共檢測通道18的模組示意圖。所述第三實施方式的所述電子裝置1與所述第一實施方式中的所述電子裝置1的結構相同。也就是說,所述第一實施方式描述的所述電子裝置1的描述基本上均可以適用於所述第三實施方式的所述電子裝置1,二者的主要差別在於:所述電子裝置1包括第一公共檢測通道18a和第二公共檢測通道18b。所述第一公共檢測通道18a和所述第二公共檢測通道18b分別設置於相鄰兩個所述檢測區域101之間。在本實施方式中,所述第一公共檢測通道18a設置於所述第一檢測區域101a和第二檢測區域101b之間,所述第二公共檢測通道18b設置於所述第二檢測區域101b和第三檢測區域101c之間。Please also refer to FIG. 5, which is a schematic diagram of a module of the detection area 101 and the
在本實施例中,所述處理器20根據指定順序對多個所述檢測區域101內的多個所述檢測通道16以及至少一個所述公共檢測通道18進行掃描。其中,所述指定順序可以為根據排列順序從上至下。所述指定順序還可以根據使用者的需求進行設定,例如,所述掃描順序還還可以為先依次對位於兩端的所述檢測區域101內的所述檢測通道16進行掃描後,再對位於中間的所述檢測區域101內的所述檢測通道16進行掃描。以圖6為例,所述處理器20可以在第一檢測時刻對第一所述檢測區域101a內的所述檢測通道16以及所述第一公共檢測通道18a進行掃描,在第二檢測時刻對第二個所述檢測區域101b內的所述檢測通道16、所述第一公共檢測通道18a以及所述第二公共檢測通道18b進行掃描,在第三檢測時刻對第三個所述檢測區域101c內的所述檢測通道16以及所述第二公共檢測通道18b進行掃描。In this embodiment, the
實施方式四Implementation mode four
請一併參閱圖6,其為第四實施方式中所述檢測區域101、所述公共檢測通道18以及所述處理器20的模組示意圖。所述第四實施方式的所述電子裝置1與所述第三實施方式中的所述電子裝置1的結構相同。也就是說,所述第三實施方式描述的所述電子裝置1的描述基本上均可以適用於所述第四實施方式的所述電子裝置1,二者的主要差別在於:第三實施方式描述的所述電子裝置為自容式觸控電子裝置,本實施方式所述電子裝置1為互容式觸控電子裝置。所述電子裝置1包括多個相互平行設置的第一觸控電極120以及與所述第一觸控電極120垂直設置的第二觸控電極140。每個所述檢測通道16為一個所述第一觸控電極120。在本實施方式中,所述檢測通道16、所述第一公共檢測通道18a以及所述第二公共檢測通道18b均為觸摸驅動電極。在所述第一檢測區域101a內的所述檢測通道16被掃描時,所述第一公共檢測通道18a一併被掃描;在所述第二檢測區域101b內的所述檢測通道16被掃描時,所述第一公共檢測通道18a和所述第二公共檢測通道18b一併被掃描。在所述第三檢測區域101c內的所述檢測通道16被掃描時,所述第二公共檢測通道18b被掃描。在所述第二觸控電極140被掃描時,所述第一公共檢測通道18a和所述第二公共檢測通道18b均未被掃描。此時,所述第二觸控電極140作為屏蔽層使用,每個所述第二觸控電極140上載入相同信號,或者每個所述第二觸控電極140懸空設置。在本實施方式中,所述處理器20藉由第一走線102與所述第一觸控電極120電性連接,藉由第二走線104與所述第二觸控電極140電性連接。Please also refer to FIG. 6, which is a schematic diagram of modules of the detection area 101, the
實施方式五Implementation mode five
請一併參閱圖7,其為第五實施方式中所述檢測區域101、所述公共檢測通道18以及所述處理器20的模組示意圖。所述第五實施方式的所述電子裝置1與所述第一實施方式中的所述電子裝置1的結構相同。也就是說,所述第一實施方式描述的所述電子裝置1的描述基本上均可以適用於所述第五實施方式的所述電子裝置1,二者的主要差別在於:所述電子裝置1為自容式觸控電子裝置。所述電子裝置1包括呈矩陣設置的多個第一觸控電極120。所述處理器20藉由第一走線102與所述第一觸控電極120電性連接。所述處理器20將所述第一觸控電極120沿與所述第一走線102延伸方向進行劃分形成所述檢測通道16。多條所述檢測通道16對稱設置於所述公共檢測通道18的兩側。即,所述電子裝置1包括第一檢測區域101a和第二檢測區域101b。Please also refer to FIG. 7, which is a schematic diagram of modules of the detection area 101, the
實施方式六Embodiment Six
請一併參閱圖8,其為第六實施方式中所述檢測區域101、所述公共檢測通道18以及所述處理器20的模組示意圖。所述第六實施方式的所述電子裝置1與所述第五實施方式中的所述電子裝置1的結構相同。也就是說,所述第五實施方式描述的所述電子裝置1的描述基本上均可以適用於所述第六實施方式的所述電子裝置1,二者的主要差別在於:所述電子裝置1包括呈矩陣設置的多個第一觸控電極120。每個所述第一觸控電極120包括第一子電極121和第二子電極123。所述第一子電極121和所述第二子電極123均大致呈三角形。所述第一子電極121和所述第二子電極123互補排列,以形成四邊形的所述第一觸控電極120。每個所述第一子電極121和每個所述第二子電極123分別構成一條所述檢測通道16。所述公共檢測通道18為兩個所述第一觸控電極120。多條所述檢測通道16對稱設置於所述公共檢測通道18的兩側。即,所述電子裝置1包括第一檢測區域101a和第二檢測區域101b,且二者相對所述公共檢測通道18對稱設置。Please also refer to FIG. 8, which is a schematic diagram of modules of the detection area 101, the
在本實施例中,Br1值等於第一時刻的公共檢測通道18的兩個所述第一觸控電極120的信號平均值或求和值, Br2值等於第二時刻的公共檢測通道18的兩個所述第一觸控電極120的信號平均值或求和值。In this embodiment, the value of Br1 is equal to the average value or the sum of the signals of the two
實施方式七Implementation mode seven
請一併參閱圖9,其為第七實施方式中所述檢測區域101、所述公共檢測通道18以及所述處理器20的模組示意圖。所述第七實施方式的所述電子裝置1與所述第四實施方式中的所述電子裝置1的結構相同。也就是說,所述第四實施方式描述的所述電子裝置1的描述基本上均可以適用於所述第七實施方式的所述電子裝置1,二者的主要差別在於:所述電子裝置1為自容互容一體式觸控顯示裝置。所述電子裝置1包括多個相互平行設置的第一觸控電極120以及與所述第一觸控電極120垂直設置的第二觸控電極140。所述電子裝置1包括多個第一檢測通道16a以及多個第二檢測通道16b。每個所述第一檢測通道16a為一個所述第一觸控電極120。每個所述第二檢測通道16b為一個所述第二觸控電極140。所述電子裝置1包括第一至第四檢測區域101a-101d。其中,所述第一檢測區域101a和所述第二檢測區域101b沿第一方向延伸設置,所述第三檢測區域101c和所述第四檢測區域101d沿與所述第一方向垂直的第二方向延伸設置。所述電子裝置1還包括第一公共檢測通道18a以及第二公共檢測通道18b。所述第一公共檢測通道18a和所述第二公共檢測通道18b垂直設置。所述第一公共檢測通道18a為兩個平行設置的所述第一觸控電極120構成。所述第二公共檢測通道18b為兩個平行設置的所述第二觸控電極140構成。在所述第一檢測區域101a內的所述第一檢測通道16a被掃描時,所述第一公共檢測通道18a一併被掃描;在所述第二檢測區域101b內的所述第一檢測通道16a被掃描時,所述第一公共檢測通道18a一併被掃描。在所述第三檢測區域101c內的所述第二檢測通道16b被掃描時,所述第二公共檢測通道18b被掃描。在所述第四檢測區域101d內的所述第二檢測通道16b被掃描時,所述第二公共檢測通道18b被掃描。在本實施方式中,所述處理器20藉由第一走線102與所述第一觸控電極120電性連接,藉由第二走線104與所述第二觸控電極140電性連接。Please also refer to FIG. 9, which is a schematic diagram of modules of the detection area 101, the
在本實施例中,驅動所述第一觸控電極120時,Br1值等於第一時刻的第一公共檢測通道18a的兩個所述第一觸控電極120的信號平均值或求和值,Br2值等於第二時刻的所述第一公共檢測通道18a的兩個所述第一觸控電極120的信號平均值或求和值。In this embodiment, when the
驅動所述第二觸控電極140時,Br1值等於第一時刻的所述第二公共檢測通道18b的兩個所述第二觸控電極140的信號平均值或求和值,Br2值等於第二時刻的所述第二公共檢測通道18b的兩個所述第二觸控電極140的信號平均值或求和值。When the
上述所述電子裝置1,藉由設置所述公共檢測通道18,並所述公共檢測通道18在至少兩個檢測時刻均被掃描,藉由對所述公共檢測通道18對應的掃描資料進行歸一化處理得到雜訊參照值,已將不同檢測區域之間的噪音進行關聯,進而優化掃描資料的降噪處理難度。In the above-mentioned
請參閱圖10,其為示出了一種信號優化方法的流程圖。所述信號優化方法應用於實施方式一至實施方式七對應的所述電子裝置1中。所述電子裝置1包括多條檢測通道16、至少一個處理器20以及存儲晶片30。Please refer to FIG. 10, which is a flowchart showing a signal optimization method. The signal optimization method is applied to the
S10、所述處理器20根據預定規則將所述檢測通道16劃分形成多個檢測區域101。S10. The
S11、所述處理器20設置至少一個公共檢測通道18。S11. The
S12、所述處理器20採用分時掃描方式對所述檢測通道和所述公共檢測通道進行掃描以得到掃描資料。S12. The
其中,所述公共檢測通道18在兩個不同檢測時刻均被掃描。所述掃描資料包括驅動信號以及雜訊信號。Wherein, the
S13、所述處理器20根據每個所述公共檢測通道18在至少兩個不同檢測時刻對應的所述掃描資料進行歸一化處理得到雜訊參照值。S13. The
其中,所述雜訊參照值為某一個所述檢測區域內的雜訊信號。歸一化處理後每個所述檢測區域的雜訊信號均被歸一到與雜訊參照值相關聯。Wherein, the noise reference value is a noise signal in a certain detection area. After the normalization process, the noise signal of each detection area is normalized to be correlated with the noise reference value.
S14、所述處理器20根據所述雜訊參照值對掃描資料進行降噪處理,以優化掃描資料的降噪處理難度。S14. The
上述所述信號優化方法,藉由設置所述公共檢測通道18,並所述公共檢測通道18在至少兩個檢測時刻均被掃描,藉由對所述公共檢測通道18對應的掃描資料進行歸一化處理得到雜訊參照值,已將不同檢測區域之間的噪音進行關聯,進而優化掃描資料的降噪處理難度。In the signal optimization method described above, the
本發明創造提出的信號優化方法,可應用於電容式觸控晶片、電容式指紋晶片、光學式指紋晶片、CMOS/CCD攝像頭晶片等採用分時檢測、且資料的降噪要求較高的電子裝置中。The signal optimization method proposed by the present invention can be applied to capacitive touch chip, capacitive fingerprint chip, optical fingerprint chip, CMOS/CCD camera chip and other electronic devices that adopt time-sharing detection and have high data noise reduction requirements middle.
需要說明的是,對於前述的各方法實施方式,為了簡單描述,故將其都表述為一系列的動作組合,但是本領域技術人員應該知悉,本發明並不受所描述的動作順序的限制,因為依據本發明,某些步驟可以採用其他順序或者同時進行。其次,本領域技術人員也應該知悉,說明書中所描述的實施方式均屬於優選實施方式,所涉及的動作和模組並不一定是本發明所必須的。It should be noted that for the foregoing method implementations, for the sake of simple description, they are all expressed as a series of action combinations, but those skilled in the art should know that the present invention is not limited by the described sequence of actions. Because according to the present invention, certain steps can be performed in other order or simultaneously. Secondly, those skilled in the art should also know that the implementations described in the specification are all preferred implementations, and the actions and modules involved are not necessarily required by the present invention.
在本申請所提供的幾個實施方式中,應該理解到,所揭露的裝置,可藉由其它的方式實現。例如,以上所描述的裝置實施方式僅僅是示意性的,例如所述模組的劃分,僅僅為一種邏輯功能劃分,實際實現時可以有另外的劃分方式,例如多個模組或元件可以結合或者可以集成到另一個系統,或一些特徵可以忽略,或不執行。另一點,所顯示或討論的相互之間的耦合或直接耦合或通信連接可以是藉由一些介面,裝置或模組的間接耦合或通信連接,可以是電性或其它的形式。In the several implementation manners provided in this application, it should be understood that the disclosed device can be implemented in other ways. For example, the device implementation described above is only illustrative, for example, the division of the modules is only a logical function division, and there may be other divisions in actual implementation, for example, multiple modules or components can be combined or It can be integrated into another system, or some features can be ignored or not implemented. In addition, the displayed or discussed mutual coupling or direct coupling or communication connection may be indirect coupling or communication connection through some interfaces, devices or modules, and may be in electrical or other forms.
所述作為分離部件說明的模組可以是或者也可以不是物理上分開的,作為模組顯示的部件可以是或者也可以不是物理模組,即可以位於一個地方,或者也可以分佈到多個網路模組上。可以根據實際的需要選擇其中的部分或者全部模組來實現本實施方式方案的目的。The modules described as separate components may or may not be physically separate, and the components displayed as modules may or may not be physical modules, that is, they may be located in one place, or they may be distributed to multiple networks. On the road module. Some or all of the modules may be selected according to actual needs to achieve the objectives of the solutions of this embodiment.
還需要說明的是,在本文中,術語「包括」、「包含」或者其任何其他變體意在涵蓋非排他性的包含,從而使得包括一系列要素的過程、方法、物品或者裝置不僅包括那些要素,而且還包括沒有明確列出的其他要素,或者是還包括為這種過程、方法、物品或者裝置所固有的要素。在沒有更多限制的情況下,由語句「包括一個……」限定的要素,並不排除在包括該要素的過程、方法、物品或者裝置中還存在另外的相同要素。It should also be noted that in this article, the terms "include", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements , And also include other elements not explicitly listed, or elements inherent to the process, method, article, or device. If there are no more restrictions, the element defined by the sentence "including a..." does not exclude the existence of other identical elements in the process, method, article, or device that includes the element.
以上所述,以上實施例僅用以說明本發明的技術方案,而非對其限制;儘管參照前述實施例對本發明進行了詳細的說明,本領域的普通技術人員應當理解:其依然可以對前述各實施例所記載的技術方案進行修改,或者對其中部分技術特徵進行等同替換;而這些修改或者替換,並不使相應技術方案的本質脫離本發明各實施例技術方案的範圍。As mentioned above, the above embodiments are only used to illustrate the technical solutions of the present invention, but not to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: The technical solutions recorded in the embodiments are modified, or some of the technical features thereof are equivalently replaced; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.
綜上所述,本發明符合發明專利要件,爰依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,舉凡熟悉本案技藝之人士,在爰依本案創作精神所作之等效修飾或變化,皆應包含於以下之申請專利範圍內。In summary, the present invention meets the requirements of an invention patent, and Yan filed a patent application in accordance with the law. However, the above are only the preferred embodiments of the present invention. For those who are familiar with the technique of this case, equivalent modifications or changes made in accordance with the creative spirit of this case should be included in the scope of the following patent applications.
1:電子裝置
11:蓋板
12:第一功能層
120:第一觸控電極
121:第一子電極
123:第二子電極
140:第二觸控電極
14:第一功能層
16:檢測通道
16a:第一檢測通道
16b:第二檢測通道
101:檢測區域
101a:第一檢測區域
101b:第二檢測區域
101c:第三檢測區域
101d:第四檢測區域
18:公共檢測通道
18a:第一公共檢測通道
18b:第二公共檢測通道
102:第一走線
104:第二走線
20:處理器
30:存儲晶片
S10-S14:步驟1: Electronic device
11: Cover
12: The first functional layer
120: The first touch electrode
121: first sub-electrode
123: second sub-electrode
140: second touch electrode
14: The first functional layer
16:
圖1為本發明電子裝置的立體示意圖。FIG. 1 is a three-dimensional schematic diagram of an electronic device of the present invention.
圖2為圖1中所述電子裝置的模組示意圖。FIG. 2 is a schematic diagram of a module of the electronic device in FIG. 1.
圖3為圖1中第一實施方式之所述電子裝置中檢測通道和公共檢測通道的模組示意圖。FIG. 3 is a schematic diagram of modules of a detection channel and a common detection channel in the electronic device of the first embodiment in FIG. 1.
圖4為圖1中第二實施方式之所述電子裝置中檢測通道和公共檢測通道的模組示意圖。4 is a schematic diagram of a module of a detection channel and a common detection channel in the electronic device of the second embodiment in FIG. 1.
圖5為圖1中第三實施方式之所述電子裝置中檢測通道和公共檢測通道的模組示意圖。FIG. 5 is a schematic diagram of modules of the detection channel and the common detection channel in the electronic device of the third embodiment in FIG. 1.
圖6為圖1中第四實施方式之所述電子裝置中檢測通道和公共檢測通道的模組示意圖。FIG. 6 is a schematic diagram of modules of a detection channel and a common detection channel in the electronic device of the fourth embodiment in FIG. 1.
圖7為圖1中第五實施方式之所述電子裝置中檢測通道和公共檢測通道的模組示意圖。FIG. 7 is a schematic diagram of modules of the detection channel and the common detection channel in the electronic device of the fifth embodiment in FIG. 1.
圖8為圖1中第六實施方式之所述電子裝置中檢測通道和公共檢測通道的模組示意圖。FIG. 8 is a schematic diagram of modules of a detection channel and a common detection channel in the electronic device of the sixth embodiment in FIG. 1.
圖9為圖1中第七實施方式之所述電子裝置中檢測通道和公共檢測通道的模組示意圖。FIG. 9 is a schematic diagram of modules of the detection channel and the common detection channel in the electronic device of the seventh embodiment in FIG. 1.
圖10為本發明至少一個實施方式的信號優化方法的流程圖。FIG. 10 is a flowchart of a signal optimization method according to at least one embodiment of the present invention.
S10-S14:步驟 S10-S14: steps
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