TW202127010A - Shift detection method of absorption spectrum by the light intensity differential signals of the rising and falling edges of the absorption spectrum - Google Patents

Abstract

The shift detection method of absorption spectrum of the present invention includes receiving the absorption spectrum of an output light beam, wherein the absorption spectrum includes a rising edge and a falling edge; defining two detection wavelengths corresponding to the rising edge and the falling edge of the absorption spectrum; obtaining the light intensity of two detection wavelengths, wherein the two detection wavelengths correspond to the rising edge and the falling edge of the absorption spectrum; calculating the light intensity of the two detection wavelengths to obtain differential signals; and comparing the initial differential signal with the new differential signal, and determining that the absorption spectrum corresponding to the new differential signal is shifted when the new differential signal is not equal to the initial differential signal.

Description

Absorption spectrum shift detection method

The present invention is related to optical sensing methods, in particular to a method for detecting shifts in absorption spectra.

Surface Plasmon Resonance (SPR) is a phenomenon in which free electrons oscillate longitudinally between the metal layer and the dielectric layer. When excited, the reflected light energy will be completely converted into surface plasma waves. At this time, the reflected light intensity of a specific wavelength approaches zero, which is the absorption spectrum, and the wavelength with the lowest reflected light intensity is called the resonance wavelength. When the thickness of the metal changes or the refractive index of the dielectric layer changes slightly, it is easy to cause the shift of the resonance wavelength, which is often widely used in physics, chemistry, biomedical and biological sensors.

Because changing the refractive index of the surface medium of the surface plasmon resonance element will shift the resonance wavelength of the absorption spectrum, the current absorption spectrum output through the surface plasmon resonance system or other similar sensing systems needs to be transmitted through the spectrum. The analyzer can measure accurately, and it takes a lot of measurement time, which is not conducive to commercialization.

In view of the above-mentioned deficiencies, the purpose of the present invention is to provide a method for detecting absorption spectrum shift, which can detect the shift of absorption spectrum by detecting the light intensity differential signal of the rising edge and falling edge of the absorption spectrum without Need to use a spectrometer to achieve the purpose of simple, low-cost and fast detection.

In order to achieve the above objective, the absorption spectrum shift detection method of the present invention includes receiving the absorption spectrum of the output beam, the absorption spectrum includes a rising edge and a falling edge; defining two detection wavelengths corresponding to the rising edge and the falling edge of the absorption spectrum; and obtaining two Detect the light intensity of the wavelength, the two detection wavelengths correspond to the rising edge and the falling edge of the absorption spectrum; calculate the light intensity of the two detection wavelengths to obtain a differential signal; and compare the initial differential signal and the new differential signal, When the new differential signal is not equal to the initial differential signal, it is determined that the absorption spectrum corresponding to the new differential signal has shifted.

In this way, the absorption spectrum shift detection method of the present invention can learn the shift of the absorption spectrum through the differential signal changes of the light intensity of the two detection wavelengths.

The detailed environment, device, system, use, or operation method of the absorption spectrum shift detection method provided by the present invention will be described in the detailed description of the subsequent embodiments. However, those with ordinary knowledge in the field of the present invention should be able to understand that the detailed description and the specific embodiments listed for implementing the present invention are only used to illustrate the present invention, and are not intended to limit the scope of the patent application of the present invention.

Hereinafter, the corresponding preferred embodiments are listed in conjunction with the drawings to illustrate the technology and the achieved effects of the absorption spectrum shift detection method of the present invention. However, the components, composition, and corresponding processes of the system in the various diagrams are only used to illustrate the technical features of the present invention, but not to limit the present invention.

As shown in FIG. 1, the procedure 10 of the spectral shift detection method of the present invention includes five steps, namely receiving 11, defining 13, obtaining 15, calculating 17, and comparing 19. The step of receiving 11 is to receive the absorption spectrum of the output beam output by the surface plasmon resonance (SPR) sensing system, and the absorption spectrum includes a rising edge and a falling edge. The step of definition 13 is to define two detection wavelengths corresponding to the rising edge and the falling edge of the absorption spectrum. The step of obtaining 15 is to obtain the light intensity of two detection wavelengths, and the two detection wavelengths correspond to the rising edge and the falling edge of the absorption spectrum. The step of calculating 17 is to calculate the light intensity of the two detection wavelengths to obtain a differential signal. The step of comparison 19 is to compare the initial differential signal with the new differential signal, and when the new differential signal is not equal to the initial differential signal, it is determined that the absorption spectrum corresponding to the new differential signal has shifted.

In application, when the measured object of the surface plasma resonance sensing system changes (for example, composition change or concentration change, etc.), the absorption spectrum characteristics of the output beam will also shift accordingly. The spectral shift detection method of the present invention You can monitor whether the absorption spectrum changes by dynamically observing the differential signal.

As shown in FIG. 2, in the step of receiving 11, the surface plasmon resonance sensing system 30 is referred to as the SPR sensing system, which includes a light source 31, a first convex lens 32, a polarizer 33, a first aperture 34, and a surface plasmon resonance device (SPR device for short) 35, a rotating table 36, a second aperture 37, and a second convex lens 38.

The light source 31 is used to generate light. In this embodiment, the light source 31 is a halogen lamp as an example, but in other embodiments, the light source 31 may also use an LED, a bulb, or other light-emitting elements. The light may be single-spectrum light or multi-spectrum light, single-spectrum light such as laser light or monochromatic light, and multi-spectrum light such as full-spectrum light. The light passes through the first convex lens 32, the polarizer 33, the first aperture 34, the SPR device 35, the second aperture 37, and the second convex lens 38 in sequence. The light excites surface plasmon resonance on the SPR device 35.

The rotating table 37 carries the SPR device 35, and can change the angle of the SPR device 35 through rotation.

As shown in FIG. 2, the step of separating 13 is to pass through the spectroscopic system 50. The spectroscopic system 50 is to correctly define the two detection wavelengths so that the two detection wavelengths correspond to the rising edge and the falling edge of the absorption spectrum. In this embodiment, the light splitter system 50 includes a beam splitter 51, a reflector 53 and a band pass filter 55.

The beam splitter 51 receives the output light beam emitted by the second convex lens 38 and separates the output light beam into a first detection beam and a second detection beam. The first detection beam passes through the band pass filter 55 at a first incident angle. The second detection beam passes through the reflector 53 to change the incident angle, and then passes through the band-pass filter 55 at the second incident angle. The first detection beam and the second detection beam correspond to the positions of the two detection wavelengths (λ ₁ and λ _{2 in} FIG. 4). Therefore, in this embodiment, the angle of the band-pass filter 55 can be adjusted to adjust the two wavelengths. The detection wavelength is such that the two detection wavelengths are roughly in the middle of the rising edge and the falling edge of the absorption spectrum of the output beam, and the two are aligned.

In this way, the middle position can be detected more sensitively, and when the spectrum of the output beam is shifted, the middle of the rising edge and the falling edge of the monitoring spectrum has better detection sensitivity.

The filtering range of the band-pass filter 55 can be adjusted. The filtering range of the band-pass filter 53 in this embodiment is 620 nm-700 nm, and the band-pass width is 13 nm. For other embodiments, other capabilities can be selected. The band-pass filter 53 adjusts the filtering range and the band-pass width.

In other embodiments, as shown in FIG. 3, the light splitting system 60 includes a first reflective filter 61 and a second reflective filter 63. The first reflective filter 61 receives the output beam emitted by the second convex lens 38 to generate a first detection beam and a penetrating beam. The first detection beam is reflected to the differential processing system 70, and the penetrating beam passes through the first detection beam. A reflective filter 61. The second reflective filter 63 receives the penetrating light beam to reflect the second detecting light beam to the differential processing system 70. The first detection beam and the second detection beam respectively correspond to two detection wavelengths (λ ₁ and λ _{2 in} FIG. 4 ). In this way, the spectroscopic system 60 can also detect the light intensity of the two detection wavelengths through the first reflective filter 61 and the second reflective filter 63.

As shown in FIG. 2, the steps of obtaining 15, calculating 17 and comparing 19 are through the differential processing system 70, which receives the two bandpasses corresponding to the first detection beam and the second detection beam output by the bandpass filter 55 The light beam is converted into electrical signals, so the differential processing system 70 is also called a photoelectric conversion system. From the above description, it can be seen that the two detection wavelengths are roughly in the middle of the rising edge and the falling edge of the absorption spectrum, and the two are aligned. Therefore, the light intensity of the two detection wavelengths should be the same initially, through the differential processing system 70 After the calculation, the initial differential signal of the light intensity of the two detection wavelengths should be zero. In other embodiments, the initial differential signal may not be zero.

The differential processing system 70 includes a first light detecting device 71, a second light detecting device 72, a low-noise amplifying device (or differential signal amplifying device) 73, a data capture card 74 and a computer 75. The first light detecting device 71 and the second light detecting device 72 respectively receive the two band-pass light beams and adjust the light intensity to balance the light intensities of the two band-pass light beams.

In this embodiment, the first light detecting device 71 includes a lens 711, an aperture 713, and a light detecting element 715, and the second light detecting device 72 includes a lens 721 and a light detecting element 723. The aperture 713 is used to control incident light. The light intensity of the light is used to balance the light intensity of the incident light from the first light detecting device 71 and the second light detecting device 72, and the light detecting elements 713 and 725 are used to convert the light signal into an electrical signal.

The low-noise amplifying device 73 receives the electrical signals output by the light detecting elements 713 and 725. The data acquisition card 74 processes the electrical signals in sequence, and imports the processed electrical signals into the computer 75. The low-noise amplifying device 73 uses Stanford Research SR560 to provide processed electrical signals to the data acquisition card 74 and the computer 75.

_{As shown in Figure 4, the differential signal of the light intensity of the two detection wavelengths λ 1} and λ ₂ of the initial output beam (solid line) should be zero, and the new output beam (double-dot chain line) can be clearly obtained on the figure. Compared with the output beam (solid line), the light intensity obtained by the _{new output beam at the two detection wavelengths λ 1} and λ _{2 is different when the offset occurs. After calculation and comparison,} It can be obtained that the differential signal of the new output beam at the two detection wavelengths λ ₁ and λ ₂ is not equal to the initial differential signal. _{The light intensity of the detection wavelength λ 1} is greater than the light intensity of the detection wavelength λ ₂ . The two detection wavelengths λ ₁ and λ ₂ have a light intensity difference ΔR. In addition, it can be seen from the figure that the degree of change of the light intensity difference ΔR is more obvious than the degree of wavelength change Δλ.

As shown in Figure 5, the first detection beam and the second detection beam are aligned with the incident angles of 30 degrees and 48 degrees, respectively, and the absorption spectrum of 48 degrees (solid line) and the absorption spectrum of 30 degrees (single-point chain line) are obtained. ), and through the absorption spectrum (thick dashed line) of the output beam, it can be seen that the two detection wavelengths are roughly in the middle of the rising edge and the falling edge.

The absorption spectrum shift detection method of the present invention only needs to detect the light intensity differential change of the wavelength to obtain the absorption spectrum shift state. Therefore, the present invention can achieve the purpose of rapid detection.

Furthermore, the common noise of the two bandpass spectra is eliminated through the differential processing system to obtain better detection capabilities. Because the environmental noise in the optical detection process easily affects the experimental results, the present invention can achieve real-time monitoring of data and eliminate noise, so that the sensitivity and resolution are improved.

In the experiment, the sucrose concentration of water was sequentially increased in the SPR device to change the refractive index of the liquid from 0% to 0.179%, 0.304%, and 0.396% at three different time points. FIG. 6 is a signal diagram of voltage versus time in a differential processing system, and FIG. 7 is a signal diagram of voltage versus refractive index in a differential processing system. The figure shows that good linearity can be obtained for a refractive index less than 1.3336, and the sensitivity of the system is 1429 V / RIU. It can be found from the partially enlarged 5000 times map in FIG. 6 that the present invention can limit (slow down) the noise to a noise peak of 0.01 V (0.865V-0.875V).

Finally, it is emphasized again that the constituent elements disclosed in the previously disclosed embodiments of the present invention are only examples and are not used to limit the scope of the case. The substitution or changes of other equivalent elements shall also be subject to the scope of the patent application of this case. Covered.

10: Program 11: Receive 13: Definition 15: Acquire 17: Calculation 19: Comparison 30: Surface Plasma Resonance Sensing System 31: Light Source 32: First Convex Lens 33: Polarizer 34: First Aperture 35: Surface Plasma Resonance Device 36: rotating table 37: second aperture 38: second convex lens 50: spectroscopic system 51: spectroscope 53: reflector 55: band-pass filter 60: spectroscopic system 61: first reflective filter 63: first Second reflection filter 70: differential processing system 71: first light detecting device 711: lens 713 aperture 715: light detecting element 72: second light detecting device 721: lens 723: light detecting element 73: Low noise amplifier 74: data capture card 75: computer λ ₁ , λ ₂ : detection wavelength

FIG. 1 is a flow chart of the steps of the method for detecting the shift of the absorption spectrum of the present invention. FIG. 2 is a schematic diagram of an environment in which an embodiment of the absorption spectrum shift detection method of the present invention is applied. FIG. 3 is a schematic diagram of another environment in which an embodiment of the absorption spectrum shift detection method of the present invention is applied. Figure 4 is a spectrum diagram of the original output beam and the new output beam. FIG. 5 is a spectrum diagram of the absorption spectra of the initial output beam, the first detection beam, and the second detection beam. Fig. 6 is a voltage-time signal diagram generated by the differential processing system in Fig. 2. FIG. 7 is a signal diagram of the voltage-refractive index generated by the differential processing system in FIG. 2.

10: Procedure

11: receive

13: Definition

15: Obtain

17: calculation

19: Comparison

Claims (9)

The absorption spectrum shift detection method includes the following steps: Receiving an absorption spectrum of an output beam, the absorption spectrum including a rising edge and a falling edge; Define the two detection wavelengths corresponding to the rising edge and the falling edge of the absorption spectrum; Obtain the light intensity of the two detection wavelengths, the two detection wavelengths corresponding to the rising edge and the falling edge of the absorption spectrum; Calculate the light intensity of the two detection wavelengths to obtain a differential signal; and The initial differential signal and the new differential signal are compared, and when the new differential signal is not equal to the initial differential signal, it is determined that the absorption spectrum corresponding to the new differential signal has shifted. According to the method for detecting the shift of the absorption spectrum described in the scope of the patent application, the output beam is generated through a surface plasmon resonance sensing system. The method for detecting the shift of the absorption spectrum as described in claim 1, wherein the definition includes a spectroscopic system to determine the two detection wavelengths. According to the method for detecting the shift of the absorption spectrum described in the scope of patent application, wherein the light splitting system includes a beam splitter, a reflector and a band pass filter, and the beam splitter receives the output light beam to generate a first A detection beam and a second detection beam, the mirror reflects the second detection beam, the band-pass filter receives the first detection beam and the second detection beam, the first detection beam and The second detection beam corresponds to two detection wavelengths. Such as the absorption spectrum shift detection method described in claim 4, wherein the acquisition, the calculation and the comparison include a differential processing system that receives and processes the first detection beam and the second detection Light beam to obtain the corresponding light intensity. The absorption spectrum shift detection method according to the third item of the scope of patent application, wherein the spectroscopic system includes a first reflective filter and a second reflective filter, and the first reflective filter The output beam is received to generate a first detection beam and a penetrating beam, the second reflective filter receives the penetrating beam to generate a second detection beam, the first detection beam and the second The detection beam corresponds to two detection wavelengths. Such as the absorption spectrum shift detection method described in item 6 of the scope of patent application, wherein the acquisition, the calculation and the comparison include a differential processing system that receives and processes the first detection beam and the second detection Light beam to obtain the corresponding light intensity. According to the method for detecting the shift of the absorption spectrum described in the first item of the scope of the patent application, the initial differential signal is equal to zero. The method for detecting the shift of the absorption spectrum as described in item 1 or item 8 of the scope of patent application, wherein the two detection wavelengths correspond to the middle of the rising edge and the falling edge of the absorption spectrum.

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