TW202124755A - Film forming apparatus and film forming method for DLC film - Google Patents
Film forming apparatus and film forming method for DLC film Download PDFInfo
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- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
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Abstract
Description
本發明係關於DLC(Diamond Like Carbon:類鑽石碳膜)膜之成膜裝置及成膜方法。The present invention relates to a film forming device and a film forming method for DLC (Diamond Like Carbon) film.
DLC膜係結晶構造為六方晶亦即石墨鍵結,和結晶構造為立方晶亦即鑽石鍵結混合的非晶質的膜。The DLC film is an amorphous film in which the crystalline structure is hexagonal, that is, graphite bonds, and the crystal structure is cubic, that is, diamond bonds.
作為DLC膜之製造法,已知有PVD(Physical Vapor Deposition:物體蒸鍍)法和CVD(Chemical Vapor Deposition:化學蒸鍍)法。在濺鍍法、離子蒸鍍法等之PVD法中,比較CVD法,DLC膜之表面粗,耐磨耗性也低。As a manufacturing method of the DLC film, a PVD (Physical Vapor Deposition) method and a CVD (Chemical Vapor Deposition) method are known. Among PVD methods such as sputtering method and ion vapor deposition method, compared with CVD method, the surface of the DLC film is coarser and the wear resistance is also low.
專利文獻1係在RF電漿CVD法中,將C和F之化合物例如C4 F8 氣體,和碳化氫氣體例如C2 H4 氣體和CO氣體作為成膜氣體使用。專利文獻1揭示將該成膜氣體予以電漿化而生成活性種,在製程溫度400℃之下,藉由其活性種,在半導體晶圓上成膜CF膜的方法。專利文獻1係指摘在CF膜中,混合石墨鍵結和鑽石鍵結。並且,專利文獻1揭示由於CO氣體之添加,鑽石鍵結多於石墨鍵結。 [先前技術文獻] [專利文獻]Patent Document 1 uses a compound of C and F such as C 4 F 8 gas, and hydrocarbon gas such as C 2 H 4 gas and CO gas as the film forming gas in the RF plasma CVD method. Patent Document 1 discloses a method of plasma-forming the film-forming gas to generate active species, and forming a CF film on a semiconductor wafer using the active species at a process temperature of 400°C. Patent Document 1 points out that graphite bonding and diamond bonding are mixed in the CF film. In addition, Patent Document 1 discloses that due to the addition of CO gas, there are more diamond bonds than graphite bonds. [Prior Technical Documents] [Patent Documents]
[專利文獻1]日本特開11-265885號公報[Patent Document 1] JP 11-265885 A
[發明所欲解決之課題][The problem to be solved by the invention]
但是,RF電漿CVD法係必須將成膜對象加熱至250℃以上。若為半導體晶圓等之基板時,加熱載置台即可。但是,當成膜對象非基板而係立體構造體,尤其成膜面具有凹凸的構造體時,難以均勻加熱,以不需要強制加熱的室溫水準的成膜為佳。However, in the RF plasma CVD method, the film-forming object must be heated to 250°C or higher. In the case of a substrate such as a semiconductor wafer, the mounting table can be heated. However, when the film formation object is not a substrate but a three-dimensional structure, especially a structure having unevenness on the film formation surface, it is difficult to uniformly heat, and it is preferable to form a film at a room temperature level that does not require forced heating.
本發明係以提供能夠進行低溫製程,可以抑制微粒或副生成物之產生而成膜DLC膜的成膜裝置及成膜方法為目的。 [用以解決課題之手段]The purpose of the present invention is to provide a film forming apparatus and a film forming method capable of performing a low-temperature process and suppressing the generation of particles or by-products to form a DLC film. [Means to solve the problem]
本發明之一態樣係關於一種成膜裝置,具有: 反應容器; 支持部,其係在上述反應容器內支持成膜對象; 旋轉部,其係使上述支持部旋轉; 第1供給管,其係將含碳化氫的原料氣體經由第1閥體而供給至上述反應容器; 第2供給管,其係在充滿上述原料氣體的上述反應容器內,將藉由感應耦合電漿被活性化的氫自由基的反應氣體,以高於上述反應容器內之壓力的壓力經由第2閥體而供給至上述反應容器; DC電源,其係經由上述支持部而對上述成膜對象施加負偏壓, 將藉由上述原料氣體和上述反應氣體之反應所生成之碳離子,藉由上述負偏壓吸引至上述成膜對象,使DLC膜堆積在上述成膜對象。One aspect of the present invention relates to a film forming device having: Reaction vessel A support part, which supports the film-forming object in the above-mentioned reaction container; A rotating part, which rotates the above-mentioned support part; A first supply pipe for supplying a hydrocarbon-containing raw material gas to the reaction vessel via a first valve body; The second supply pipe is located in the reaction vessel filled with the raw material gas, and passes the reaction gas of hydrogen radicals activated by the inductively coupled plasma through the second supply pipe at a pressure higher than the pressure in the reaction vessel. The valve body is supplied to the above-mentioned reaction vessel; A DC power supply that applies a negative bias to the film-forming object via the support part, The carbon ions generated by the reaction of the raw material gas and the reaction gas are attracted to the film formation target by the negative bias voltage, and the DLC film is deposited on the film formation target.
在本發明之一態樣中,藉由感應耦合電漿使反應氣體予以活性化而被生成的氫自由基,係可以在室溫水準抽出反應容器中之作為原料氣體的碳化氫中之氫而生成碳離子。除此之外,在本發明之一態樣中,在充滿經由第1閥體及第1供給管而被導入的原料氣體的反應容器內,將藉由感應耦合電漿被活性化的含氫自由基之反應氣體,以高於反應容器內之壓力的壓力,經由第2閥體及第2供給管供給至反應容器。依此,可以防止原料氣體和反應氣體逆流至第2供給管。其結果,不會有在第2供給管內,原料氣體和反應氣體反應之情形,依此,無第2供給管被微粒或反應副生成物汙染之情形。在反應容器內旋轉的成膜對象,藉由原料氣體和反應氣體之反應所生成的碳離子藉由負偏壓被吸引而可以使DLC膜堆積在成膜對象。依此,即使不對成膜對象進行強制加熱,亦可以在室溫水準堆積DLC膜。In one aspect of the present invention, the hydrogen radicals generated by activating the reaction gas by inductively coupled plasma can extract the hydrogen in the hydrocarbon as the raw material gas in the reaction vessel at room temperature. Generate carbon ions. In addition, in one aspect of the present invention, in the reaction vessel filled with the raw material gas introduced through the first valve body and the first supply pipe, the hydrogen-containing gas activated by the inductively coupled plasma The reaction gas of free radicals is supplied to the reaction vessel through the second valve body and the second supply pipe at a pressure higher than the pressure in the reaction vessel. According to this, it is possible to prevent the raw material gas and the reaction gas from flowing back to the second supply pipe. As a result, there is no situation in which the raw material gas and the reaction gas react in the second supply pipe, and accordingly, there is no situation in which the second supply pipe is contaminated with particles or reaction by-products. The film-forming object rotating in the reaction vessel can cause the DLC film to be deposited on the film-forming object by attracting carbon ions generated by the reaction of the raw material gas and the reaction gas by the negative bias voltage. According to this, even if the film formation target is not forcedly heated, the DLC film can be deposited at room temperature.
在本發明之一態樣中,被供給至上述第1供給管的上述原料氣體可以包含H2 O、HF或HCl作為添加氣體。藉由作為添加氣體之H2 O,可以對成膜對象賦予親水性。藉由從做為添加氣體之HF或HCl產生的負離子F- 或Cl- ,可以對成膜對象賦予撥水性。In one aspect of the present invention, the raw material gas supplied to the first supply pipe may contain H 2 O, HF, or HCl as an additive gas. With H 2 O as an added gas, hydrophilicity can be imparted to the film-forming object. The negative ions F- or Cl - generated from HF or HCl as the added gas can impart water repellency to the film-forming object.
在本發明之一態樣中,被供給至上述第2供給管的活性化前之反應氣體,可以包含CF4 、C2 F6 、C3 F8 、O2 或O3 作為添加氣體。藉由從作為添加氣體的CF4 、C2 F6 、C3 F8 產生的負離子F- ,可以對成膜對象賦予撥水性。藉由從作為添加氣體的O2 、O3 產生的活性氧,可以對成膜對象賦予親水性。In one aspect of the present invention, the reaction gas before activation supplied to the second supply pipe may contain CF 4 , C 2 F 6 , C 3 F 8 , O 2 or O 3 as an additive gas. The negative ions F - generated from CF 4 , C 2 F 6 , and C 3 F 8 that are added gases can impart water repellency to the film-forming object. The active oxygen generated from O 2 and O 3 as the added gas can impart hydrophilicity to the film-forming target.
在本發明之一態樣中,可以藉由增大藉由上述DC電源被施加的上述負偏壓之絕對值,使上述DLC膜所含的鑽石鍵結增加,藉由縮小上述絕對值,使上述DLC膜所含的石墨鍵結增加。如此一來,因應成膜對象之用途,可以變更鑽石鍵結和石墨鍵結的比率。In one aspect of the present invention, by increasing the absolute value of the negative bias applied by the DC power source, the diamond bond contained in the DLC film can be increased, and by reducing the absolute value, The graphite bonds contained in the above-mentioned DLC film increase. In this way, the ratio of diamond bonding and graphite bonding can be changed according to the purpose of the film-forming object.
在本發明之一態樣中,進一步具有被設置在上述第2供給管的感應線圈,和被連接於上述感應線圈的高頻電源, 可以藉由增大上述高頻電源之功率,使上述DLC膜所含的鑽石鍵結增加,藉由縮小上述功率,使上述DLC膜所含的石墨鍵結增加。如此一來,可以藉由高頻電源之功率變更鑽石鍵結和石墨鍵結的比率。In one aspect of the present invention, there is further provided an induction coil provided in the second supply pipe, and a high-frequency power supply connected to the induction coil, It is possible to increase the power of the high-frequency power supply to increase the diamond bonds contained in the DLC film, and reduce the power to increase the graphite bonds contained in the DLC film. In this way, the ratio of diamond bonding to graphite bonding can be changed by the power of the high-frequency power supply.
本發明之其他態樣係關於一種成膜方法, 其係使在反應容器內支持成膜對象之支持部旋轉, 經由上述支持部而對上述成膜對象施加負偏壓, 將原料氣體從第1供給管經由第1閥體而導入至上述反應容器之後,封閉上述第1閥體而將上述反應容器內設為第1壓力, 將反應氣體以高於上述第1壓力的第2壓力,從第2供給管經由第2閥體而導入至上述反應容器之後,封閉上述第2閥體, 將藉由上述原料氣體和上述反應氣體之反應所生成之碳離子,藉由上述負偏壓吸引至上述成膜對象,使DLC膜堆積在上述成膜對象。Another aspect of the present invention relates to a film forming method, It rotates the support part that supports the film-forming object in the reaction vessel, Applying a negative bias to the film-forming object via the supporting part, After the raw material gas is introduced into the reaction vessel from the first supply pipe via the first valve body, the first valve body is closed to set the inside of the reaction vessel to the first pressure, After the reaction gas is introduced into the reaction vessel from the second supply pipe via the second valve body at a second pressure higher than the first pressure, the second valve body is closed, The carbon ions generated by the reaction of the raw material gas and the reaction gas are attracted to the film formation target by the negative bias voltage, and the DLC film is deposited on the film formation target.
本發明之其他方法可以在作為本發明之一態樣的成膜裝置較佳地實施,可以達到與本發明之一態樣相同的作用效果。另外,支持部之旋轉開始時,負偏壓之施加開始的時序即使在原料氣體之導入前亦可即使在導入後亦可。Other methods of the present invention can be preferably implemented in the film forming apparatus as one aspect of the present invention, and can achieve the same effects as the one aspect of the present invention. In addition, when the rotation of the support portion starts, the timing of the start of the application of the negative bias voltage may be before or after the introduction of the raw material gas.
以下,針對本實施型態予以說明。另外,在以下說明的本實施型態非不合理地限定申請專利範圍之記載內容者。再者,並非本實施型態中說明的構成全部都是必要構成要件。Hereinafter, this embodiment will be described. In addition, the present embodiment described below does not unreasonably limit the content of the patent application. In addition, not all the configurations described in this embodiment are necessary constituent elements.
1. 成膜裝置
圖1表示實施型態所涉及之成膜裝置。在圖1中,成膜裝置10具有例如石英製之反應容器20。反應容器20具有原料氣體導入口30、反應氣體導入口40、排氣口50。在反應容器20內,涵蓋反應容器20之內外設置例如載置支持成膜對象1的支持部60。使支持部60自轉的旋轉部例如馬達70被設置在反應容器20之外。並且,經由支持部60而對成膜對象1施加負偏壓的DC電源80被設置在反應容器20之外。1. Film forming device
Fig. 1 shows a film forming apparatus according to an embodiment. In FIG. 1, the
在原料氣體導入口30連結第1供給管100。第1供給管100係在第1閥體120呈開啟狀態之時,藉由流量控制器130被控制之流量之原料氣體從原料氣體容器110被供給至原料氣體導入口30。在反應氣體導入口40連結第2供給管200。在第2供給管200設置反應氣體活性化裝置210和第2閥體230。反應氣體容器220係對反應氣體活性化裝置210供給反應氣體。在反應氣體活性化裝置210被活性化之反應氣體係藉由第2供給管200經由第2閥體230被供給至反應氣體導入口40。原料氣體為碳化氫,例如CH4
、C2
H2
或C2
H4
。被活性化的反應氣體為H自由基(H*
)。使碳化氫和H自由基(H*
)反應,在室溫水準抽出碳化氫中的氫,而生成碳離子。將碳離子吸引至被施加負偏壓之成膜對象1而成膜DLC膜。在排氣口50連結排氣管300。在排氣管300設置排氣泵310和排氣閥320。另外,控制部400係控制DLC膜之成膜動作,可以控制閥體120、230、320、馬達70、DC電源80、高頻電源212及排氣泵310。The
圖2表示反應氣體容器220及反應氣體活性化裝置210之一例。在圖2中,反應氣體為例如水蒸氣H2
O,使水蒸氣活性化而生成H自由基(H*
)。因此,反應氣體容器220包含蓄積水2的加濕器240,和惰性氣體容器250。在加濕器240經由管260被導入來自惰性氣體容器250的惰性氣體例如氬Ar。藉由氬Ar被氣泡化的水2成為水蒸氣,而被供給至第2供給管200。例如,在石英製之第2供給管200之周圍設置感應線圈270。在感應線圈270連接圖1所示的高頻電源212。例如,藉由感應線圈270被施加的電磁能為20W,頻率為13.56MHz。藉由感應線圈270,在第2供給管200內生成反應氣體之感應耦合電漿3。依此,成為Ar+ H2
O→Ar*
+OH*
+H*
,可以生成H自由基(H*
)。FIG. 2 shows an example of the
即使與圖2不同,在圖1之反應氣體容器220收容例如HF作為反應氣體亦可。藉由反應氣體HF在反應氣體活性化裝置210被活性化,成為HF→H*
+H+
+F*
+F-
,可以生成H自由基(H*
)。另外,藉由作為分極狀態的負離子F-
附著於DLC膜,如同後述般DLC膜可以具有撥水性。Even if it is different from FIG. 2, the
如圖3或圖4所示般,即使對原料氣體及/或反應氣體追加添加氣體亦可。因此,如圖3所示般,即使將添加氣體容器140及流量控制器150連接於第1供給管100亦可。除此之外,或是如圖4所示般,即使將添加氣體容器280連接於反應氣體活性化裝置210以取代此亦可。As shown in FIG. 3 or FIG. 4, the raw material gas and/or the reaction gas may be additionally added with gas. Therefore, as shown in FIG. 3, even if the added
在此,藉由被追加於原料氣體及/或反應氣體的添加氣體,可以將被成膜的DLC膜設為撥水性(疏水性)。當在反應容器20內存在負離子F-
或Cl-
時,該負離子被形成在DLC膜之表面,DLC膜成為撥水性。作為被收容在添加氣體容器140之撥水性用的添加氣體,可以舉出HF或HCl。作為被收容在添加氣體容器280之撥水性用的添加氣體,可以舉出氟化碳CxFy、例如CF4
、C2
F6
或C3
F8
。Here, the DLC film to be formed can be made water-repellent (hydrophobic) by the addition gas added to the source gas and/or the reaction gas. When the negative ions F - or Cl - are present in the
同樣,藉由被追加於原料氣體及/或反應氣體的添加氣體,可以將被成膜的DLC膜設為親水性。藉由親水性高的官能基(OH、CHO、COOH等)被形成在DLC膜之表面,DLC膜可以具有親水性。作為被收容在添加氣體容器140之親水性用的添加氣體,可以舉出H2
O。作為被收容在添加氣體容器280之親水性用的添加氣體,可以舉出生成活性氧的O2
或O3
。Similarly, the DLC film to be formed can be made hydrophilic by the addition gas added to the source gas and/or the reaction gas. By forming highly hydrophilic functional groups (OH, CHO, COOH, etc.) on the surface of the DLC film, the DLC film can be hydrophilic. As the hydrophilic additive gas contained in the
2. DLC膜之成膜方法
圖5為表示DLC膜之成膜方法的時序圖。在初期狀態,閥體120、230及320被封閉。在圖5之時刻t1,第1閥體120被開放,來自原料氣體容器110之原料氣體經由第1供給管100及第1閥體120而被供給至反應容器20。在時刻t2,將第1閥體120被封閉之時的反應容器20內之第1壓力設為P1。在時刻t2後的時刻t3,第2閥體230被開啟,在反應氣體活性化裝置210被活性化之包含氫自由基的反應氣體經由第2供給管200及第2閥體230被供給至反應容器20。2. DLC film forming method
Fig. 5 is a timing chart showing a method of forming a DLC film. In the initial state, the
在此,在反應氣體活性化裝置210被活性化的反應氣體需要能夠生成電漿的壓力。在反應氣體活性化裝置210可以生成電漿的第2壓力P2為例如5~15Pa。在本實施型態中,反應容器20內之第1壓力P1被設定成P1<P2,例如將第2壓力P2設為10Pa之時,第1壓力P1被設定成例如1Pa程度較佳為低於一位數以上。Here, the reaction gas activated by the reaction
因P1<P2,故不會有原料氣體經由第2閥體230而朝向第2供給管200逆流之情形。依此,在第2供給管200及反應氣體活性化裝置210之中,不會有原料氣體和反應氣體反應之情形。如此一來,可以防止藉由原料氣體和反應氣體反應而可能產生的微粒或反應副生成物,汙染第2供給管200及反應氣體活性化裝置210之情形。Since P1<P2, there is no case where the raw material gas flows back toward the
在時刻t3之後,因在反應容器20內,原料氣體和氫自由基反應而生成碳離子,故開始DLC膜朝成膜對象1成膜。因此,在至少較第2閥體230被開啟之時刻t3之前的例如時刻t2,馬達70被旋轉,藉由DC電源80,負偏壓被施加於成膜對象1。如此一來,藉由負偏壓,碳離子被吸引至被旋轉的成膜對象1而在成膜對象1成膜DLC膜。該成膜動作係被持續至排氣閥320被開啟而反應容器20內藉由排氣泵310被排氣的時刻t5。在時刻t5之後的時刻t6,馬達70及DC電源80被斷開。在排氣結束的時刻t7,DLC膜之成膜動作結束。After time t3, since the source gas and hydrogen radicals react in the
在此,藉由感應耦合電漿使反應氣體予以活性化而被生成的氫自由基,係可以在室溫水準抽出反應容器20中之作為原料氣體的碳化氫中之氫而生成碳離子。依此,即使不對成膜對象進行強制加熱,亦可以在室溫水準堆積DLC膜。此點係比必須將成膜對象加熱至250℃以上之RF電漿CVD法更優良。尤其,若為成膜對象1非基板而係立體構造體,尤其成膜面具有凹凸的構造體時,因難以均勻地進行加熱,故本實施型態也適用於朝具有凹凸之立體構造體成膜。Here, the hydrogen radicals generated by activating the reaction gas by the inductively coupled plasma can extract the hydrogen in the hydrocarbon as the raw material gas in the
再者,報告有具有DLC膜之成膜對象被使用於各種用途。因應其用途,藉由使用圖3及/或圖4所示之添加氣體,可以將成膜對象1之表面設為親水性或撥水性。並且,因應成膜對象1之用途,可以變更DLC膜中之鑽石鍵結和石墨鍵結的比率。例如,可以藉由增大藉由上述DC電源80被施加的負偏壓之絕對值,使DLC膜所含的鑽石鍵結增加,藉由縮小其絕對值,使DLC膜所含的石墨鍵結增加。或是,可以藉由增大高頻電源212之功率,使DLC膜所含的鑽石鍵結增加,藉由縮小其功率,使DLC膜所含的石墨鍵結增加。此點較藉由CO氣體之添加/非添加而控制比率的專利文獻1更優良。Furthermore, it is reported that a film-forming object with a DLC film is used in various applications. According to its use, the surface of the film-forming object 1 can be made hydrophilic or water-repellent by using the additive gas shown in FIG. 3 and/or FIG. 4. In addition, the ratio of diamond bonding and graphite bonding in the DLC film can be changed according to the purpose of the film-forming object 1. For example, by increasing the absolute value of the negative bias applied by the
1:成膜對象 2:水 3:電漿 10:成膜裝置 20:反應容器 30:原料氣體導入口 40:反應氣體導入口 50:排氣口 60:支持部 70:馬達 80:DC電源 100:第1供給管 110:原料氣體容器 130:第1閥體 140:添加氣體容器 200:第2供給管 210:反應氣體活性化裝置 212:高頻電源 220:反應氣體容器 230:第2閥體 270:感應線圈 280:添加氣體容器 300:排氣管 310:排氣泵 320:排氣閥1: Filming object 2: water 3: Plasma 10: Film forming device 20: reaction vessel 30: Raw material gas inlet 40: Reactive gas inlet 50: exhaust port 60: Support Department 70: Motor 80: DC power supply 100: 1st supply pipe 110: Raw gas container 130: 1st valve body 140: add gas container 200: 2nd supply pipe 210: Reactive gas activation device 212: high frequency power supply 220: Reactive gas container 230: 2nd valve body 270: induction coil 280: Add gas container 300: Exhaust pipe 310: Exhaust pump 320: exhaust valve
[圖1]為本發明之一實施型態所涉及之成膜裝置之概略說明圖。 [圖2]為表示圖1所示之反應氣體活性化裝置之一例的圖。 [圖3]為表示將原料氣體和添加氣體供給至第1供給管之變形例的圖。 [圖4]為表示將反應氣體和添加氣體供給至第2供給管之變形例的圖。 [圖5]為表示成膜方法的時序圖。[Fig. 1] is a schematic explanatory diagram of a film forming apparatus according to an embodiment of the present invention. [Fig. 2] A diagram showing an example of the reactive gas activation device shown in Fig. 1. [Fig. [Fig. 3] is a diagram showing a modified example of supplying source gas and additive gas to the first supply pipe. [Fig. 4] is a diagram showing a modified example of supplying reaction gas and additive gas to the second supply pipe. [Fig. 5] is a timing chart showing the film forming method.
10:成膜裝置 10: Film forming device
20:反應容器 20: reaction vessel
30:原料氣體導入口 30: Raw material gas inlet
40:反應氣體導入口 40: Reactive gas inlet
50:排氣口 50: exhaust port
60:支持部 60: Support Department
70:馬達 70: Motor
80:DC電源 80: DC power supply
100:第1供給管 100: 1st supply pipe
110:原料氣體容器 110: Raw gas container
120:第1閥體 120: 1st valve body
130:第1閥體 130: 1st valve body
200:第2供給管 200: 2nd supply pipe
210:反應氣體活性化裝置 210: Reactive gas activation device
212:高頻電源 212: high frequency power supply
220:反應氣體容器 220: Reactive gas container
230:第2閥體 230: 2nd valve body
300:排氣管 300: Exhaust pipe
310:排氣泵 310: Exhaust pump
320:排氣閥 320: exhaust valve
400:控制部 400: Control Department
Claims (6)
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JPS6055480B2 (en) * | 1982-08-23 | 1985-12-05 | 住友電気工業株式会社 | Diamond vapor phase synthesis method |
JPS61189634A (en) * | 1985-02-19 | 1986-08-23 | Canon Inc | Formation of deposited film |
JPS6425984A (en) * | 1987-03-23 | 1989-01-27 | Canon Kk | Formation of deposited film |
JP3027866B2 (en) * | 1991-04-17 | 2000-04-04 | 石川島播磨重工業株式会社 | Reactive gas pretreatment CVD method |
JP5219562B2 (en) * | 2007-04-02 | 2013-06-26 | 株式会社日立国際電気 | Substrate processing apparatus, substrate processing method, and semiconductor device manufacturing method |
US8105660B2 (en) * | 2007-06-28 | 2012-01-31 | Andrew W Tudhope | Method for producing diamond-like carbon coatings using PECVD and diamondoid precursors on internal surfaces of a hollow component |
EP2694700B1 (en) * | 2011-04-07 | 2016-11-16 | Picosun Oy | Atomic layer deposition with plasma source |
JP5292502B1 (en) * | 2012-09-06 | 2013-09-18 | 成康 町田 | Electrical device |
JP6534129B2 (en) * | 2017-05-29 | 2019-06-26 | 株式会社都ローラー工業 | DLC and CD fixed base material, DLC and CD fixed product |
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