TW202122527A - Film for forming protective film and composite sheet for forming protective film capable of improving electrical connection strength between a projecting electrode of a chip and a connecting pad on a circuit board - Google Patents
Film for forming protective film and composite sheet for forming protective film capable of improving electrical connection strength between a projecting electrode of a chip and a connecting pad on a circuit board Download PDFInfo
- Publication number
- TW202122527A TW202122527A TW109132806A TW109132806A TW202122527A TW 202122527 A TW202122527 A TW 202122527A TW 109132806 A TW109132806 A TW 109132806A TW 109132806 A TW109132806 A TW 109132806A TW 202122527 A TW202122527 A TW 202122527A
- Authority
- TW
- Taiwan
- Prior art keywords
- protective film
- film
- forming
- aforementioned
- meth
- Prior art date
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/06—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B27/08—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/32—Layered products comprising a layer of synthetic resin comprising polyolefins
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/36—Layered products comprising a layer of synthetic resin comprising polyesters
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/04—Interconnection of layers
- B32B7/06—Interconnection of layers permitting easy separation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/04—Interconnection of layers
- B32B7/12—Interconnection of layers using interposed adhesives or interposed materials with bonding properties
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
- C09J7/22—Plastics; Metallised plastics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2255/00—Coating on the layer surface
- B32B2255/10—Coating on the layer surface on synthetic resin layer or on natural or synthetic rubber layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2255/00—Coating on the layer surface
- B32B2255/26—Polymeric coating
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2333/00—Characterised by the use of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Derivatives of such polymers
- C08J2333/04—Characterised by the use of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Derivatives of such polymers esters
- C08J2333/06—Characterised by the use of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Derivatives of such polymers esters of esters containing only carbon, hydrogen, and oxygen, the oxygen atom being present only as part of the carboxyl radical
- C08J2333/08—Homopolymers or copolymers of acrylic acid esters
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2463/00—Characterised by the use of epoxy resins; Derivatives of epoxy resins
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K13/00—Use of mixtures of ingredients not covered by one single of the preceding main groups, each of these compounds being essential
- C08K13/06—Pretreated ingredients and ingredients covered by the main groups C08K3/00 - C08K7/00
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K2201/00—Specific properties of additives
- C08K2201/002—Physical properties
- C08K2201/003—Additives being defined by their diameter
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K2201/00—Specific properties of additives
- C08K2201/011—Nanostructured additives
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/02—Elements
- C08K3/04—Carbon
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/02—Elements
- C08K3/08—Metals
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/34—Silicon-containing compounds
- C08K3/36—Silica
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/0008—Organic ingredients according to more than one of the "one dot" groups of C08K5/01 - C08K5/59
- C08K5/0041—Optical brightening agents, organic pigments
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/0091—Complexes with metal-heteroatom-bonds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/16—Nitrogen-containing compounds
- C08K5/34—Heterocyclic compounds having nitrogen in the ring
- C08K5/3467—Heterocyclic compounds having nitrogen in the ring having more than two nitrogen atoms in the ring
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/54—Silicon-containing compounds
- C08K5/544—Silicon-containing compounds containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K7/00—Use of ingredients characterised by shape
- C08K7/16—Solid spheres
- C08K7/18—Solid spheres inorganic
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K9/00—Use of pretreated ingredients
- C08K9/04—Ingredients treated with organic substances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Adhesive Tapes (AREA)
- Dicing (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Laminated Bodies (AREA)
Abstract
Description
本發明係關於一種保護膜形成用膜及保護膜形成用複合片。本申請案基於2019年10月7日在日本所申請之日本特願2019-184718號主張優先權,且引用該申請案之內容至本文中。The present invention relates to a film for forming a protective film and a composite sheet for forming a protective film. This application claims priority based on Japanese Patent Application No. 2019-184718 filed in Japan on October 7, 2019, and the content of the application is cited herein.
作為半導體晶圓或絕緣體晶圓等的晶圓,存在有於該晶圓之一面(電路面)形成有電路、進而於該面(電路面)上具有凸塊等之突狀電極的晶圓。如此般的晶圓係藉由分割而成為晶片,藉由將該突狀電極接觸於電路基板上的連接墊,來搭載於前述電路基板。如此般之晶圓或晶片中,有時為了抑制裂紋的發生等之破損,而以保護膜來保護相對於電路面為相反側之面(內面)( 參照專利文獻1至專利文獻2)。As a wafer such as a semiconductor wafer or an insulator wafer, there is a wafer in which a circuit is formed on one surface (circuit surface) of the wafer and further has protruding electrodes such as bumps on the surface (circuit surface). Such wafers are divided into chips, and the protruding electrodes are contacted with connection pads on the circuit substrate to be mounted on the circuit substrate. In such wafers or wafers, in order to suppress the occurrence of cracks and other damages, a protective film may be used to protect the surface (inner surface) opposite to the circuit surface (refer to Patent Literature 1 to Patent Literature 2).
為了形成如此般之保護膜,而於半導體晶圓之內面貼附用以形成保護膜之保護膜形成用膜,此時可使用構成為具備支撐片、以及設置於前述支撐片之一面上的前述保護膜形成用膜的保護膜形成用複合片。支撐片在將於內面具被有保護膜形成用膜或保護膜的晶圓分割為晶片時,可作為用以固定該晶圓之切割片而加以使用。[先前技術文獻][專利文獻]In order to form such a protective film, a protective film forming film for forming a protective film is attached to the inner surface of the semiconductor wafer. In this case, it is possible to use a structure with a support sheet and a structure provided on one surface of the aforementioned support sheet. The composite sheet for protective film formation of the film for protective film formation mentioned above. The support sheet can be used as a dicing sheet for fixing the wafer when the inner surface of the wafer with the protective film forming film or the protective film is divided into chips. [Prior Technical Document] [Patent Document]
[專利文獻1]日本特開2015-32644號公報。[專利文獻2] 國際公開第2015/146936號。[Patent Document 1] JP 2015-32644 A. [Patent Document 2] International Publication No. 2015/146936.
[發明所欲解決之課題][The problem to be solved by the invention]
如上述般,搭載有晶片之電路基板係作為基板裝置而被各種電子組件所使用,可藉由提高晶片之突狀電極與電路基板上之連接墊的電性連接強度,而製作可靠性更高的基板裝置。針對於此,專利文獻1至專利文獻2並未揭露關於進一步地提高如此般之連接強度用之方法。As mentioned above, the chip-mounted circuit substrate is used as a substrate device for various electronic components. The electrical connection strength between the protruding electrode of the chip and the connection pad on the circuit substrate can be improved, and the manufacturing reliability can be higher.的substrate device. In response to this, Patent Literature 1 to Patent Literature 2 do not disclose a method for further improving such a connection strength.
本發明之目的在於提供一種用以於晶片之內面形成保護膜之保護膜形成用膜、以及具備有前述保護膜形成用膜之保護膜形成用複合片,可提高晶片之突狀電極與電路基板上之連接墊的電性連接強度。[用以解決課題之手段]The object of the present invention is to provide a protective film forming film for forming a protective film on the inner surface of a wafer, and a protective film forming composite sheet provided with the protective film forming film, which can improve the protruding electrodes and circuits of the wafer The electrical connection strength of the connection pads on the substrate. [Means to solve the problem]
本發明提供一種保護膜形成用膜,係用以於晶片之內面形成保護膜;使用前述保護膜於波長1400nm至1500nm之吸光度的最大值Xmax 、以及前述保護膜於150℃之比熱S150 ,藉由Z150 =Xmax /S150 所算出之Z150 為0.38以上且使用前述Xmax 、以及前述保護膜於200℃之比熱S200 ,藉由Z200 =Xmax /S200 所算出之Z200 為0.33以上。本發明之保護膜形成用膜亦可為熱硬化性或能量線硬化性。The present invention provides a protective film forming film, which is used to form a protective film on the inner surface of a wafer; the maximum absorbance X max of the protective film at a wavelength of 1400 nm to 1500 nm is used, and the specific heat S 150 of the protective film at 150°C , calculated by the Z 150 = X max / S 150 Z 150 is 0.38 or more and using the X max, and the protective film in the specific heat of S 200 200 ℃, by Z 200 = X max / S 200 of the calculated Z 200 is 0.33 or more. The film for forming a protective film of the present invention may be thermosetting or energy ray curable.
本發明之保護膜形成用膜亦可含有2種以上的可吸收可見光及紅外線之任一種或兩種的光吸收劑。本發明之保護膜形成用膜亦可含有碳材料。本發明之保護膜形成用膜中,前述保護膜於波長400nm至 750nm之光之穿透率的最小值Tm 較佳為15%以下。本發明之保護膜形成用膜中,前述保護膜於波長1400nm至1500nm之光之反射率的最大值Um 較佳為20%以下。The film for forming a protective film of the present invention may contain two or more kinds of light absorbers that can absorb any one or two of visible light and infrared rays. The film for forming a protective film of the present invention may also contain a carbon material. In the film for forming a protective film of the present invention, the minimum value T m of the transmittance of the protective film to light having a wavelength of 400 nm to 750 nm is preferably 15% or less. In the film for forming a protective film of the present invention, the maximum value U m of the reflectance of the protective film for light having a wavelength of 1400 nm to 1500 nm is preferably 20% or less.
本發明提供一種保護膜形成用複合片,具備:支撐片;以及保護膜形成用膜,係設置於前述支撐片之一面上;此保護膜形成用膜為前述本發明之保護膜形成用膜。本發明之保護膜形成用複合片中,前述支撐片可具備:基材;以及黏著劑層,係設置於前述基材之一面上;前述黏著劑層可配置於前述基材與前述保護膜形成用膜之間。 [發明功效]The present invention provides a composite sheet for forming a protective film, comprising: a support sheet; and a film for forming a protective film, which is provided on one surface of the support sheet; the film for forming a protective film is the film for forming a protective film of the present invention. In the composite sheet for forming a protective film of the present invention, the support sheet may include: a substrate; and an adhesive layer provided on one surface of the substrate; the adhesive layer may be disposed on the substrate and the protective film to form Use between membranes. [Efficacy of invention]
根據本發明,提供一種用以於晶片之內面形成保護膜之保護膜形成用膜、以及具備有前述保護膜形成用膜之保護膜形成用複合片,可提高晶片之突狀電極與電路基板上之連接墊的電性連接強度。According to the present invention, there is provided a protective film forming film for forming a protective film on the inner surface of a wafer, and a protective film forming composite sheet provided with the aforementioned protective film forming film, which can improve the protruding electrodes of the wafer and the circuit board The electrical connection strength of the upper connection pad.
◇保護膜形成用膜本發明一實施形態相關之保護膜形成用膜係用以於晶片之內面形成保護膜者,使用前述保護膜於波長1400nm至1500nm之吸光度之最大值Xmax 、以及前述保護膜於150℃之比熱S150 ,藉由Z150 =Xmax /S150 所算出之Z150 為0.38以上;且使用前述Xmax 、以及前述保護膜於200℃之比熱S200 ,藉由Z200 =Xmax /S200 所算出之Z200 為0.33以上。本實施形態之保護膜形成用膜例如下述般藉由與支撐片進行積層,能夠構成保護膜形成用複合片。◇Protective film forming film The film for forming a protective film according to an embodiment of the present invention is used to form a protective film on the inner surface of a wafer, using the aforementioned protective film, the maximum absorbance X max at a wavelength of 1400nm to 1500nm, and the aforementioned protective film to a specific heat S 150 deg.] C of 150, by the calculated sum Z 150 = X max / S 150 Z 150 is 0.38 or more; and using the X max, and the protective film to a specific heat S 200 deg.] C of 200, with Z the calculated 200 = X max / S 200 Z 200 is 0.33 or more. The film for forming a protective film of this embodiment can be laminated with a support sheet as described below to form a composite sheet for forming a protective film.
本實施形態之保護膜形成用膜係用以於晶片之內面設置保護膜以保護晶片之膜。前述保護膜形成用膜為軟質,且可對分割為晶片前之晶圓進行貼附。The film for forming a protective film of this embodiment is used to provide a protective film on the inner surface of the chip to protect the film of the chip. The aforementioned protective film formation film is soft and can be attached to the wafer before being divided into chips.
本實施形態之保護膜形成用膜可為硬化性,亦可為非硬化性。亦即,前述保護膜形成用膜可藉由該保護膜形成用膜之硬化而發揮作為保護膜之功能,亦可在未硬化之狀態下發揮作為保護膜之功能。硬化性之保護膜形成用膜可為熱硬化性及能量線硬化性之任一者,亦可具有熱硬化性及能量線硬化性兩者之特性。The film for forming a protective film of this embodiment may be curable or non-curable. That is, the film for forming a protective film may function as a protective film by curing the film for forming a protective film, or may function as a protective film in an uncured state. The film for forming a curable protective film may be either thermosetting or energy ray curability, and it may have both thermosetting properties and energy ray curability.
本說明書中,所謂「能量線」,意指具有能量量子之電磁波或帶電粒子束。作為能量線之例,可列舉紫外線、放射線、電子束等。紫外線例如可藉由使用高壓水銀燈、熔合燈、氙氣燈、黑光燈或LED(Light Emitting Diode;發光二極體)燈等作為紫外線源而進行照射。電子束可照射藉由電子束加速器等所產生之電子束。再者,本說明書中,所謂「能量線硬化性」,意指藉由照射能量線而硬化之性質,所謂「非能量線硬化性」,意指即便照射能量線仍不硬化之性質。再者,所謂「非硬化性」,意指即便藉由加熱或能量線之照射等任何方法,仍不硬化之性質。非硬化性之保護膜形成用膜在設置(形成)於作為目標之對象物的階段以後,便視為保護膜。In this specification, the so-called "energy line" refers to electromagnetic waves or charged particle beams with energy quantum. Examples of energy rays include ultraviolet rays, radiation rays, electron beams, and the like. The ultraviolet light can be irradiated by using, for example, a high-pressure mercury lamp, a fusion lamp, a xenon lamp, a black light lamp, or an LED (Light Emitting Diode) lamp as an ultraviolet source. The electron beam can be irradiated with an electron beam generated by an electron beam accelerator or the like. In addition, in this specification, the "energy ray curability" means the property of being hardened by irradiation with energy rays, and the "non-energy ray hardening property" means the property of not being hardened even if the energy rays are irradiated. Furthermore, the so-called "non-curing" refers to the property that it does not harden even by any method such as heating or irradiation with energy rays. The non-curable protective film forming film is regarded as a protective film after it is installed (formed) on the target object.
本說明書中,所謂「晶圓」,可列舉:以矽、鍺、硒等的元素半導體或是由GaAs、GaP、InP、CdTe、ZnSe、SiC等的化合物半導體所構成之半導體晶圓;以藍寶石、玻璃等的絕緣體所構成之絕緣體晶圓。於這些晶圓之一面上形成有電路,本說明書中,將如此般形成有電路之側的晶圓之面稱為「電路面」。並且,將晶圓中之相對於電路面為相反側之面稱為「內面」。晶圓係藉由切割等的方法被分割,而成為晶片。本說明書中,與晶圓之情況同樣地,將形成有電路之側的晶片之面稱為「電路面」,將晶片中之相對於電路面為相反側之面稱為「內面」。晶圓之電路面與晶片之電路面的任一者都設置有凸塊、支柱等的突狀電極。突狀電極較佳為以焊料所構成。In this specification, "wafers" include: semiconductor wafers made of elemental semiconductors such as silicon, germanium, selenium, or compound semiconductors such as GaAs, GaP, InP, CdTe, ZnSe, and SiC; and sapphire Insulator wafers composed of insulators such as, glass, etc. Circuits are formed on one surface of these wafers. In this specification, the surface of the wafer on which the circuits are formed is referred to as the "circuit surface". In addition, the surface of the wafer on the opposite side to the circuit surface is referred to as the "inner surface". Wafers are divided by dicing and other methods to become chips. In this specification, as in the case of a wafer, the surface of the chip on the side where the circuit is formed is called the "circuit surface", and the surface of the chip on the opposite side to the circuit surface is called the "inner surface". Both the circuit surface of the wafer and the circuit surface of the chip are provided with protruding electrodes such as bumps and pillars. The protruding electrode is preferably made of solder.
藉由使用本實施形態之保護膜形成用膜、或是具備有該保護膜形成用膜之保護膜形成用複合片,能夠製造於內面具備有保護膜之晶片(本說明書中有時稱為「具保護膜的晶片」)。By using the protective film forming film of this embodiment or the protective film forming composite sheet provided with the protective film forming film, it is possible to manufacture a wafer with a protective film on the inner surface (sometimes referred to as "Chip with protective film").
進而,藉由使用前述具保護膜的晶片,能夠製造基板裝置。本說明書中,所謂「基板裝置」,意指具保護膜的晶片以電路面上的突狀電極來覆晶連接於電路基板上之連接墊而構成。例如,在使用半導體晶圓作為晶圓的情況,作為基板裝置可列舉半導體裝置。在基板裝置之製造過程中,有時使用搭載有鹵素加熱器之回焊爐,藉由加熱搭載有具保護膜的晶片之電路基板,使具保護膜的晶片上之突狀電極融解,以使突狀電極與電路基板上之連接墊的電性連接變得強固。Furthermore, by using the aforementioned wafer with a protective film, a substrate device can be manufactured. In this specification, the so-called "substrate device" means that a chip with a protective film is constructed by flip-chip connection to the connection pads on the circuit board with protruding electrodes on the circuit surface. For example, when a semiconductor wafer is used as the wafer, a semiconductor device can be cited as the substrate device. In the manufacturing process of the substrate device, a reflow furnace equipped with a halogen heater is sometimes used. By heating the circuit substrate on which the chip with the protective film is mounted, the protruding electrode on the chip with the protective film is melted to make The electrical connection between the protruding electrode and the connection pad on the circuit board becomes stronger.
自本實施形態之保護膜形成用膜所獲得之保護膜係藉由使Z150 為0.38以上,且使Z200 為0.33以上,於前述加熱時,近紅外線之吸收量變多,且加熱時之溫度較通常來得高。從而,因為成為更高溫之該保護膜的作用,具保護膜的晶片上之突狀電極亦成為更高溫,在這高溫的影響下突狀電極容易融解,結果,使前述突狀電極與電路基板上之連接墊的電性連接強度成為較通常更強固。藉由使用搭載有如此般之晶片的電路基板,能夠製作可靠性更高之基板裝置。The protective film obtained from the protective film forming film of this embodiment is that by setting Z 150 to be 0.38 or more and Z 200 to be 0.33 or more, the absorption of near-infrared rays during the aforementioned heating increases, and the temperature during heating It's higher than usual. Therefore, the protruding electrode on the wafer with the protective film also becomes a higher temperature due to the function of the protective film, which becomes a higher temperature, and the protruding electrode is easily melted under the influence of the high temperature. As a result, the protruding electrode and the circuit board The electrical connection strength of the upper connection pad becomes stronger than usual. By using a circuit board equipped with such a chip, a more reliable board device can be manufactured.
前述保護膜之Z150 (=Xmax /S150 )表示於150℃之保護膜的溫度上升之難易度的指標,而為0.38以上,亦可為例如0.41以上、0.45以上、0.55以上、0.65以上、0.8以上、1.2以上、1.5以上、2以上、及2.5以上的任一種。藉由使Z150 為前述下限值以上,可使前述突狀電極與電路基板上之連接墊的電性連接強度成為更強固。 The Z 150 (=X max /S 150 ) of the aforementioned protective film represents an index of the ease of temperature rise of the protective film at 150°C, and is 0.38 or more, for example, 0.41 or more, 0.45 or more, 0.55 or more, or 0.65 or more , 0.8 or more, 1.2 or more, 1.5 or more, 2 or more, and 2.5 or more. By setting Z 150 to be greater than the aforementioned lower limit, the electrical connection strength between the aforementioned protruding electrode and the connection pad on the circuit board can be made stronger.
Z150 之上限值並無特別限定。就更容易形成滿足Z150 之上述條件的保護膜的方面而言,Z150 較佳為4.2以下。The upper limit of Z 150 is not particularly limited. For easier formation of a protective film meeting the above conditions of the Z 150, Z 150 is preferably 4.2 or less.
Z150 可在將上述任一下限值及上限值任意組合而設定之範圍內進行適當調節。例如,一實施形態中,Z150 較佳為0.38至4.2,亦可為例如0.41至4.2、0.45至4.2、0.55至4.2、0.65至4.2、0.8至4.2、1.2至4.2、1.5至4.2、2至4.2、及2.5至4.2之任一種。其中,這些數值範圍為Z150 的一例。Z 150 can be adjusted appropriately within the range set by any combination of the above-mentioned lower limit and upper limit. For example, in one embodiment, Z 150 is preferably 0.38 to 4.2, and may be, for example, 0.41 to 4.2, 0.45 to 4.2, 0.55 to 4.2, 0.65 to 4.2, 0.8 to 4.2, 1.2 to 4.2, 1.5 to 4.2, 2 to 4.2, and any of 2.5 to 4.2. Among them, these numerical ranges are an example of Z 150.
前述保護膜之Z200 (=Xmax /S200 )表示於200℃之保護膜的溫度上升之難易度的指標,而為0.33以上,較佳為0.35以上,亦可為例如0.4以上、0.45以上、0.52以上、0.6以上、0.8以上、1.2以上、1.4以上、1.9以上、及2.4以上之任一種。藉由使Z200 為前述下限值以上,前述突狀電極與電路基板上之連接墊的電性連接強度成為更強固。 Z 200 (=X max /S 200 ) of the aforementioned protective film represents an index of the ease of temperature rise of the protective film at 200°C, and is 0.33 or more, preferably 0.35 or more, and may be, for example, 0.4 or more and 0.45 or more , 0.52 or more, 0.6 or more, 0.8 or more, 1.2 or more, 1.4 or more, 1.9 or more, and 2.4 or more. By making Z 200 greater than the aforementioned lower limit, the electrical connection strength between the aforementioned protruding electrode and the connection pad on the circuit board becomes stronger.
Z200 之上限值並無特別限定。就更容易形成滿足Z200 之上述條件的保護膜的方面而言,Z200 較佳為4以下。The upper limit of Z 200 is not particularly limited. For easier formation of Z meeting the above conditions of the protective film 200, Z 200 is preferably 4 or less.
Z200 可在將上述任一下限值及上限值任意組合而設定之範圍內進行適當調節。例如,一實施形態中,Z200 較佳為0.33至4,更佳為0.35至4,亦可為例如0.4至4、0.45至4、0.52至4、0.6至4、0.8至4、1.2至4、1.4至4、1.9至4、及2.4至4之任一種。其中,這些數值範圍為Z200 之一例。Z 200 can be adjusted appropriately within the range set by any combination of the above-mentioned lower limit and upper limit. For example, in one embodiment, Z 200 is preferably 0.33 to 4, more preferably 0.35 to 4, and may be, for example, 0.4 to 4, 0.45 to 4, 0.52 to 4, 0.6 to 4, 0.8 to 4, 1.2 to 4 , 1.4 to 4, 1.9 to 4, and 2.4 to 4. Among them, these numerical ranges are one example of Z 200.
使用保護膜於150℃與200℃之比熱來特定本實施形態之保護膜形成用膜的理由是因為於將搭載有具保護膜的晶片之電路基板進行加熱時,係於250℃以上之高溫下進行加熱,此時具保護膜的晶片必然經過於150℃、200℃之溫度下的加熱之故。The reason for specifying the protective film forming film of this embodiment using the specific heat of the protective film at 150°C and 200°C is because the circuit board on which the chip with the protective film is mounted is heated at a high temperature of 250°C or higher When heating is performed, the wafer with the protective film must be heated at a temperature of 150°C and 200°C.
前述保護膜於波長1400nm至1500nm之吸光度之最大值Xmax 只要滿足上述Z150 及Z200 的條件,則無特別限定。Xmax 較佳為0.4以上,更佳為0.5以上,亦可為例如0.6以上、0.9以上、1.2以上、1.6以上、2以上、2.4以上、及2.8以上之任一種。Xmax 較佳為4.5以下,亦可為例如3.5以下、2.5以下、2以下、1.5以下、1.4以下、1.2以下、及0.99以下之任一種。Xmax 為前述上限值以下的前述保護膜係更容易形成,再者,於照射近紅外線時,僅照射部位之面以及該面之附近會被瞬間急速加熱,其結果,能夠高度抑制照射部位之面發生變色或粗面化的現象。 The maximum value X max of the absorbance of the aforementioned protective film at a wavelength of 1400 nm to 1500 nm is not particularly limited as long as it satisfies the above-mentioned conditions of Z 150 and Z 200. X max is preferably 0.4 or more, more preferably 0.5 or more, and may be any of, for example, 0.6 or more, 0.9 or more, 1.2 or more, 1.6 or more, 2 or more, 2.4 or more, and 2.8 or more. X max is preferably 4.5 or less, and may be any of 3.5 or less, 2.5 or less, 2 or less, 1.5 or less, 1.4 or less, 1.2 or less, and 0.99 or less, for example. The above-mentioned protective film system with X max below the above-mentioned upper limit is easier to form. Furthermore, when near-infrared rays are irradiated, only the surface of the irradiated part and the vicinity of the surface will be rapidly heated. As a result, the irradiated part can be highly suppressed The surface is discolored or roughened.
Xmax 可在將上述任一下限值及任一上限值任意組合而設定的範圍內進行適當調節。例如,一實施形態中,Xmax 較佳為0.4至4.5,更佳為0.5至4.5,亦可為例如0.6至4.5、0.9至4.5、1.2至4.5、1.6至4.5、2至4.5、2.4至4.5、及2.8至4.5之任一種,在一實施形態中,較佳為0.4至4.5,亦可為例如0.4至3.5、0.4至2.5、0.4至2、0.4至1.5、0.4至1.4、0.4至1.2、及0.4至0.99之任一種。其中,這些數值範圍為Xmax 的一例。X max can be appropriately adjusted within a range set by any combination of any of the above-mentioned lower limit and any upper limit. For example, in one embodiment, X max is preferably 0.4 to 4.5, more preferably 0.5 to 4.5, and may be, for example, 0.6 to 4.5, 0.9 to 4.5, 1.2 to 4.5, 1.6 to 4.5, 2 to 4.5, 2.4 to 4.5 , And any one of 2.8 to 4.5. In one embodiment, it is preferably 0.4 to 4.5, and may be, for example, 0.4 to 3.5, 0.4 to 2.5, 0.4 to 2, 0.4 to 1.5, 0.4 to 1.4, 0.4 to 1.2, And any one of 0.4 to 0.99. Among them, these numerical ranges are an example of X max.
前述保護膜於150℃之比熱S150 只要滿足上述Z150 的條件,則無特別限定。S150 較佳為1以上,更佳為1.1以上,亦可為例如1.2以上。S150 較佳為2以下,更佳為1.9以下,尤佳為1.8以下,特佳為1.7以下,亦可為例如1.65以下。 The specific heat S 150 of the protective film at 150° C. is not particularly limited as long as it satisfies the conditions of the above-mentioned Z 150. S 150 is preferably 1 or more, more preferably 1.1 or more, and may be, for example, 1.2 or more. S 150 is preferably 2 or less, more preferably 1.9 or less, particularly preferably 1.8 or less, particularly preferably 1.7 or less, and may also be 1.65 or less, for example.
S150 可在將上述任一下限值及任一上限值任意組合而設定之範圍內進行適當調節。例如,一實施形態中,S150 較佳為1至2,更佳為1至1.9,尤佳為1至1.8,特佳為1至1.7,亦可為例如1至1.65。其中,這些數值範圍為S150 之一例。S 150 can be adjusted appropriately within the range set by any combination of any of the above-mentioned lower limit and any upper limit. For example, in one embodiment, S 150 is preferably 1 to 2, more preferably 1 to 1.9, particularly preferably 1 to 1.8, particularly preferably 1 to 1.7, and may also be, for example, 1 to 1.65. Among them, these numerical ranges are an example of S 150.
前述保護膜於200℃之比熱S200 只要滿足上述Z200 的條件,則無特別限定。S200 較佳為1.1以上,更佳為1.2以上,亦可為例如1.3以上。S200 較佳為2.1以下,更佳為2以下,尤佳為1.9以下,特佳為1.8以下,亦可為例如1.75以下。 The specific heat S 200 of the protective film at 200° C. is not particularly limited as long as it satisfies the conditions of Z 200. S 200 is preferably 1.1 or more, more preferably 1.2 or more, and may be, for example, 1.3 or more. S 200 is preferably 2.1 or less, more preferably 2 or less, particularly preferably 1.9 or less, particularly preferably 1.8 or less, and may also be, for example, 1.75 or less.
S200 可在將上述任一下限值及任一上限值任意組合而設定之範圍內進行適當調節。例如,一實施形態中,S200 較佳為1.1至2.1,更佳為1.1至2,尤佳為1.1至1.9,特佳為1.1至1.8,亦可為例如1.1至1.75。其中,這些數值範圍為S200 的一例。S 200 can be adjusted appropriately within the range set by any combination of any of the above-mentioned lower limit and any upper limit. For example, in one embodiment, S 200 is preferably 1.1 to 2.1, more preferably 1.1 to 2, particularly preferably 1.1 to 1.9, particularly preferably 1.1 to 1.8, and may also be, for example, 1.1 to 1.75. Among them, these numerical ranges are an example of S 200.
S150 及S200 係依據JIS K 7123:2012,而使用微差掃瞄熱卡計,由將升溫速度設為10℃/min所獲得之保護膜的微差掃描熱量之測定值而算出。S 150 and S 200 are calculated based on JIS K 7123:2012, using a differential scanning calorimeter, and calculating the measured value of the differential scanning calorific value of the protective film obtained by setting the heating rate to 10°C/min.
前述保護膜於波長400nm至750nm之光之穿透率的最小值Tm 並無特別限定,較佳為15%以下,更佳為10%以下,尤佳為7%以下,特佳為4%以下。藉由使Tm 為前述上限值以下,能夠更容易視認有無保護膜之存在。Tm 之下限值並無特別限定,例如,Tm 可為0%以上。 The minimum value T m of the transmittance of the aforementioned protective film for light with a wavelength of 400 nm to 750 nm is not particularly limited, and is preferably 15% or less, more preferably 10% or less, particularly preferably 7% or less, and particularly preferably 4% the following. By making T m below the aforementioned upper limit value, the presence or absence of the protective film can be more easily recognized. The lower limit of T m is not particularly limited. For example, T m may be 0% or more.
前述保護膜於波長1400nm至1500nm之光之反射率的最大值Um 並無特別限定,較佳為20%以下,更佳為15%以下,特佳為12%以下。藉由使Um 為前述上限值以下,在將搭載有上述具保護膜的晶片的電路基板加熱時,能夠容易使保護膜之溫度上升。再者,能夠在使用具保護膜的晶片時,抑制近紅外線反射感應器等的利用近紅外線之裝置產生誤動作。Um 之下限值並無特別限定,例如,Um 亦可為0%以上。就更容易形成滿足Um 之上述條件的保護膜的方面而言,Um 較佳為0.2%以上,更佳為0.5%以上,特佳為1%以上。保護膜對於光之反射率可利用下述實施例所記載之方法加以測定。 The maximum value U m of the reflectance of the aforementioned protective film for light with a wavelength of 1400 nm to 1500 nm is not particularly limited, and is preferably 20% or less, more preferably 15% or less, and particularly preferably 12% or less. By setting U m to be equal to or less than the aforementioned upper limit value, the temperature of the protective film can be easily increased when the circuit board on which the chip with the protective film is mounted is heated. Furthermore, when using a wafer with a protective film, it is possible to suppress malfunctions of devices using near-infrared rays, such as near-infrared reflective sensors. The lower limit of U m is not particularly limited. For example, U m may be 0% or more. For easier formation of the protection film satisfying the above conditions of the U m, U m is preferably 0.2% or more, more preferably 0.5% or more, particularly preferably 1% or more. The reflectance of the protective film to light can be measured by the method described in the following examples.
本實施形態中,制定上述Xmax 、S150 及S200 的保護膜在保護膜形成用膜為熱硬化性的情況,較佳為藉由將保護膜形成用膜於145℃進行加熱處理2小時而獲得之硬化物,在保護膜形成用膜為能量線硬化性的情況,較佳為在照度280mW/cm2 、光量260mJ/cm2 的條件下,藉由對保護膜形成用膜照射2次能量線而獲得之硬化物。另一方面,於保護膜形成用膜為非硬化性的情況,制定上述Xmax 、S150 及S200 的保護膜就是保護膜形成用膜本身。In this embodiment, when the protective films of X max , S 150 and S 200 are specified above, when the protective film forming film is thermosetting, it is preferable to heat the protective film forming film at 145°C for 2 hours the cured product is obtained in the case of forming the protective film is a film of the energy ray curable, preferably under the conditions of an illuminance cm 280mW / cm 2, light quantity of 260mJ / 2, the protective film is formed by irradiating the film 2 Hardened object obtained by energy rays. On the other hand, when the film for forming a protective film is non-curable, the protective films of X max , S 150 and S 200 are formulated as the film for forming a protective film itself.
本實施形態中,在算出上述Z150 時,作為Xmax 及S150 採用使用同一種保護膜而測定出之Xmax 及S150 。同樣地在算出上述Z200 時,作為Xmax 及S200 採用使用同一種保護膜而測定出之Xmax 及S200 。In this embodiment, when calculating the above-mentioned Z 150 , X max and S 150 measured using the same protective film are used as X max and S 150 . Similarly, when calculating the above-mentioned Z 200 , X max and S 200 measured using the same protective film are used as X max and S 200 .
於使保護膜形成用膜熱硬化而形成保護膜的情況,與藉由照射能量線使其硬化的情況不同,由於即便保護膜形成用膜之厚度變厚,仍藉由加熱而充分硬化,故而能夠形成保護性能高之保護膜。再者,藉由加熱烘箱等的通常加熱機構,能夠使多數之保護膜形成用膜一起加熱而熱硬化。於使保護膜形成用膜藉由照射能量線而硬化來形成保護膜的情況,與使其熱硬化的情況不同,保護膜形成用複合片無需具有耐熱性,而能夠構成廣範圍之保護膜形成用複合片。再者,藉由照射能量線能夠在短時間進行硬化。於不使保護膜形成用膜硬化而作為保護膜來使用的情況,由於可省略硬化步驟,故而可以簡化後的步驟來製造具保護膜的晶片。In the case of thermally curing the protective film forming film to form a protective film, it is different from the case of curing by irradiating energy rays. Even if the thickness of the protective film forming film becomes thicker, it is sufficiently cured by heating. It can form a protective film with high protection performance. Furthermore, by a normal heating mechanism such as a heating oven, it is possible to heat and thermally harden a large number of protective film forming films together. When the protective film formation film is cured by irradiation of energy rays to form a protective film, unlike the case where it is thermally cured, the protective film formation composite sheet does not need to have heat resistance and can form a wide range of protective film formation Use composite tablets. Furthermore, it can be cured in a short time by irradiating energy rays. When the film for forming a protective film is used as a protective film without hardening, since the hardening step can be omitted, the subsequent steps can be simplified to manufacture a wafer with a protective film.
前述保護膜形成用膜較佳為熱硬化性或能量線硬化性。The film for forming a protective film is preferably thermosetting or energy ray curable.
無論保護膜形成用膜為硬化性及非硬化性之任一種,並且在為硬化性之情況,無論為熱硬化性及能量線硬化性之任一種,保護膜形成用膜都可由1層(單層)所構成,亦可由2層以上之複數層所構成。在保護膜形成用膜由複數層所構成之情況,這些複數層相互可相同亦可不同,這些複數層的組合並不特別限定。在保護膜形成用膜為由2層以上的複數層所構成之情況,有產生下述等的不良狀況之可能性:各層間之密接性差,或是依據各層之伸縮難易度的差異而於保護膜產生翹曲,使保護膜自晶片之內面剝離,就抑制如此般之不良狀況之方面而言,保護膜形成用膜較佳為由1層所構成。Regardless of whether the protective film forming film is curable or non-curable, and in the case of curable, regardless of whether it is thermosetting or energy ray curable, the protective film forming film can consist of one layer (single Layer), and may also be composed of a plurality of layers of two or more layers. When the film for forming a protective film is composed of plural layers, these plural layers may be the same or different from each other, and the combination of these plural layers is not particularly limited. When the protective film formation film is composed of two or more layers, there is a possibility that the following problems may occur: the adhesion between the layers is poor, or the protection is based on the difference in the difficulty of expansion and contraction of each layer The film is warped and the protective film is peeled from the inner surface of the wafer. In terms of suppressing such defects, the protective film forming film is preferably composed of one layer.
本說明書中,不限於保護膜形成用膜之情況,所謂「複數層相互可相同亦可不同」,意指「可全部層相同,亦可全部層皆不同,還可僅一部分層相同」,進而所謂「複數層相互不同」,意指「各層的構成材料及厚度的至少一者相互不同」。In this specification, it is not limited to the case of the protective film forming film. The so-called "a plurality of layers may be the same or different from each other" means "all the layers may be the same or all the layers may be different, and only a part of the layers may be the same." The phrase "a plurality of layers are different from each other" means that "at least one of the constituent materials and thickness of each layer is different from each other".
無論保護膜形成用膜為硬化性及非硬化性之任一種,並且在為硬化性的情況,無論為熱硬化性及能量線硬化性之任一種,保護膜形成用膜之厚度較佳為1μm至100μm,更佳為3μm至80μm,特佳為5μm至60μm,亦可為例如10μm至50μm、15μm至40μm、17μm至38μm、及20μm至30μm之任一種。藉由使保護膜形成用膜之厚度為前述下限值以上,能夠形成保護能力更高之保護膜,再者,更容易形成吸光度高之保護膜。藉由使保護膜形成用膜之厚度為前述上限值以下,可避免厚度變得過厚,再者,溫度上升時之保護膜的溫度變得容易朝晶片傳導。此處,所謂「保護膜形成用膜之厚度」,意指保護膜形成用膜整體的厚度,例如所謂由複數層所構成之保護膜形成用膜之厚度,意指構成保護膜形成用膜之全部層的合計厚度。Regardless of whether the protective film forming film is curable or non-curable, and in the case of curable, whether it is thermosetting or energy ray curable, the thickness of the protective film forming film is preferably 1 μm To 100 μm, more preferably 3 μm to 80 μm, particularly preferably 5 μm to 60 μm, and may be any of, for example, 10 μm to 50 μm, 15 μm to 40 μm, 17 μm to 38 μm, and 20 μm to 30 μm. By setting the thickness of the protective film forming film to be at least the aforementioned lower limit value, a protective film with higher protective ability can be formed, and furthermore, it is easier to form a protective film with high absorbance. By setting the thickness of the protective film forming film to be equal to or less than the aforementioned upper limit, it is possible to prevent the thickness from becoming too thick, and furthermore, the temperature of the protective film becomes easy to conduct to the wafer when the temperature rises. Here, the "thickness of the protective film formation film" means the overall thickness of the protective film formation film. For example, the thickness of the protective film formation film composed of a plurality of layers means the thickness of the protective film formation film The total thickness of all layers.
[保護膜形成用組成物]保護膜形成用膜可使用含有該保護膜形成用膜的構成材料之保護膜形成用組成物而形成。例如,保護膜形成用膜可藉由於該保護膜形成用膜之形成對象面塗敷保護膜形成用組成物,依需要使之乾燥而加以形成。保護膜形成用組成物中的常溫下不會氣化的成分彼此的含量之比率通常成為與保護膜形成用膜中的前述成分彼此的含量之比率相同。本說明書中,所謂「常溫」,意指不特別冷或特別熱的溫度,亦即平常的溫度,可列舉例如15℃至25℃之溫度等。[Composition for Forming Protective Film] A film for forming a protective film can be formed using a composition for forming a protective film containing the constituent material of the film for forming a protective film. For example, the protective film formation film can be formed by coating the protective film formation composition on the surface to be formed of the protective film formation film, and drying it as needed. The ratio of the contents of the components that do not vaporize at room temperature in the protective film formation composition is usually the same as the ratio of the contents of the aforementioned components in the protective film formation film. In this specification, the "normal temperature" means a temperature that is not particularly cold or particularly hot, that is, a normal temperature, for example, a temperature of 15°C to 25°C and the like.
熱硬化性保護膜形成用膜可使用熱硬化性保護膜形成用組成物而形成,能量線硬化性保護膜形成用膜可使用能量線硬化性保護膜形成用組成物而形成,非硬化性保護膜形成用膜可使用非硬化性保護膜形成用組成物而形成。此外,本說明書中,在保護膜形成用膜具有熱硬化性及能量線硬化性之兩種特性之情況,於對形成保護膜而言保護膜形成用膜之熱硬化之貢獻大於能量線硬化之貢獻的情況下,係將保護膜形成用膜當作熱硬化性之膜。相反地,於對形成保護膜而言保護膜形成用膜之能量線硬化之貢獻大於熱硬化之貢獻的情況下,則將保護膜形成用膜當作能量線硬化之膜。The film for forming a thermosetting protective film can be formed using the composition for forming a thermosetting protective film, and the film for forming an energy ray curable protective film can be formed using the composition for forming an energy ray curable protective film, and it is non-curable protection. The film for film formation can be formed using the composition for non-curable protective film formation. In addition, in this specification, when the protective film forming film has two characteristics of thermosetting and energy ray curability, the contribution of the thermal curing of the protective film forming film to the formation of the protective film is greater than that of the energy ray curing. When making a contribution, the film for forming a protective film is regarded as a thermosetting film. On the contrary, when the contribution of the energy ray hardening of the protective film formation film to the formation of the protective film is greater than the contribution of the thermal hardening, the protective film formation film is regarded as the energy ray hardening film.
利用公知的方法塗敷保護膜形成用組合物即可,可列舉例如使用以下各種塗佈機之方法:氣刀塗佈機、刮刀塗佈機、棒式塗佈機、凹版塗佈機、輥式塗佈機、輥刀塗佈機、簾幕式塗佈機、模具塗佈機、刀式塗佈機、網版塗佈機、Meyer棒式塗佈機、輕觸式塗佈機等。The composition for forming a protective film may be applied by a known method. For example, methods using the following various coaters: air knife coater, knife coater, bar coater, gravure coater, roll Type coater, roll knife coater, curtain coater, die coater, knife coater, screen coater, Meyer bar coater, touch coater, etc.
無論保護膜形成用膜為硬化性及非硬化性之任一種,並且在為硬化性的情況,無論為熱硬化性及能量線硬化性之任一種,保護膜形成用組成物的乾燥條件並無特別限定。其中,保護膜形成用組成物在含有下述溶媒的情況,較佳為進行加熱乾燥。並且,含有溶媒之保護膜形成用組成物較佳為於例如70℃至130℃且10秒鐘至5分鐘的條件下進行加熱乾燥。其中,熱硬化性保護膜形成用組成物較佳為已使該組成物本身、及由該組成物所形成的熱硬化性保護膜形成用膜不致熱硬化之方式進行加熱乾燥。Regardless of whether the protective film formation film is curable or non-curable, and when it is curable, whether it is thermosetting or energy-ray curable, the drying conditions of the protective film forming composition are not Specially limited. Among them, when the composition for forming a protective film contains the solvent described below, it is preferable to heat and dry it. In addition, the solvent-containing composition for forming a protective film is preferably heat-dried under the conditions of, for example, 70°C to 130°C and 10 seconds to 5 minutes. Among them, the composition for forming a thermosetting protective film is preferably heated and dried so that the composition itself and the film for forming a thermosetting protective film formed from the composition are not cured by heat.
以下,依序就熱硬化性保護膜形成用膜、能量線硬化性保護膜形成用膜及非硬化性保護膜形成用膜加以說明。Hereinafter, the film for forming a thermosetting protective film, the film for forming an energy ray curable protective film, and the film for forming a non-curing protective film will be described in order.
◎熱硬化性保護膜形成用膜關於使熱硬化性保護膜形成用膜熱硬化而形成保護膜時的硬化條件,只要保護膜成為充分地發揮保護膜的功能之程度的硬化度,則不特別限定,依熱硬化性保護膜形成用膜的種類適當選擇即可。例如,熱硬化性保護膜形成用膜之熱硬化時的加熱溫度較佳為100℃至200℃,更佳為110℃至170℃,特佳為120℃至150℃。並且,前述熱硬化時之加熱時間較佳為0.5小時至5小時,更佳為0.5小時至4小時,特佳為1小時至3小時。藉由熱硬化所形成後之保護膜較佳為逐步冷卻至常溫為止。逐步冷卻方法並不特別限定,亦可為靜置冷卻。◎Film for forming a thermosetting protective film Regarding the curing conditions when the film for forming a thermosetting protective film is thermally cured to form a protective film, as long as the protective film has a degree of hardening sufficient to perform the function of the protective film, it is not particularly It is limited and may be appropriately selected depending on the type of film for forming a thermosetting protective film. For example, the heating temperature during thermal curing of the film for forming a thermosetting protective film is preferably 100°C to 200°C, more preferably 110°C to 170°C, particularly preferably 120°C to 150°C. In addition, the heating time during the thermal curing is preferably 0.5 hour to 5 hours, more preferably 0.5 hour to 4 hours, and particularly preferably 1 hour to 3 hours. The protective film formed by thermal curing is preferably gradually cooled to room temperature. The gradual cooling method is not particularly limited, and it may be static cooling.
藉由將常溫之保護膜形成用膜加熱至超過常溫之溫度為止,繼而冷卻至常溫,而成為加熱、冷卻後之保護膜形成用膜,於相同溫度下比較加熱、冷卻後之保護膜形成用膜的硬度、以及加熱前之保護膜形成用膜的硬度時,當加熱、冷卻後之保護膜形成用膜為較硬的情況,該保護膜形成用膜為熱硬化性。By heating the film for forming a protective film at room temperature to a temperature higher than normal temperature, and then cooling to room temperature, it becomes a film for forming a protective film after heating and cooling. It is used for forming a protective film after heating and cooling at the same temperature. In the case of the hardness of the film and the hardness of the film for forming a protective film before heating, when the film for forming a protective film after heating and cooling is hard, the film for forming a protective film is thermosetting.
作為較佳的熱硬化性保護膜形成用膜可列舉例如含有聚合物成分(A)、熱硬化性成分(B)及光吸收劑(I)之膜。聚合物成分(A)係視為聚合性化合物進行聚合反應而形成的成分。熱硬化性成分(B)係將熱作為反應之觸發而進行硬化(聚合)反應之成分。此外,本說明書中,聚合反應亦包含縮聚反應。As a preferable film for thermosetting protective film formation, a film containing a polymer component (A), a thermosetting component (B), and a light absorber (I) is mentioned, for example. The polymer component (A) is regarded as a component formed by the polymerization reaction of a polymerizable compound. The thermosetting component (B) is a component that undergoes a hardening (polymerization) reaction using heat as a trigger for the reaction. In addition, in this specification, a polymerization reaction also includes a polycondensation reaction.
[熱硬化性保護膜形成用組成物(III-1)]作為較佳的熱硬化性保護膜形成用組成物,可列舉例如含有前述聚合物成分(A)、熱硬化性成分(B)及光吸收劑(I)之熱硬化性保護膜形成用組成物(III-1)(本說明書中有時僅簡稱為「組成物(III-1)」)等。[The composition for forming a thermosetting protective film (III-1)] A preferable composition for forming a thermosetting protective film includes, for example, the aforementioned polymer component (A), thermosetting component (B), and The thermosetting protective film forming composition (III-1) of the light absorber (I) (in this specification may be simply referred to as "composition (III-1)") and the like.
[聚合物成分(A)]聚合物成分(A)係用以對熱硬化性保護膜形成用膜賦予造膜性、可撓性、韌性、延展性等,對保護膜賦予可撓性、韌性、延展性等的成分。組成物(III-1)及熱硬化性保護膜形成用膜所含有之聚合物成分(A)可僅為1種,亦可為2種以上,於為2種以上的情況,這些聚合物成分(A)的組合及比率可任意選擇。[Polymer component (A)] The polymer component (A) is used to impart film forming properties, flexibility, toughness, ductility, etc. to the film for forming a thermosetting protective film, and to impart flexibility and toughness to the protective film , Ductility and other ingredients. The polymer component (A) contained in the composition (III-1) and the film for forming a thermosetting protective film may be only one type or two or more types. In the case of two or more types, these polymer components The combination and ratio of (A) can be arbitrarily selected.
作為聚合物成分(A)可列舉例如、丙烯酸樹脂、胺基甲酸酯樹脂、苯氧基樹脂、聚矽氧樹脂、飽和聚酯樹脂等,較佳為丙烯酸樹脂。Examples of the polymer component (A) include acrylic resins, urethane resins, phenoxy resins, silicone resins, saturated polyester resins, and the like, and acrylic resins are preferred.
作為聚合物成分(A)中之前述丙烯酸樹脂可列舉公知之丙烯酸聚合物。丙烯酸樹脂之重量平均分子量(Mw)較佳為10000至2000000,更佳為100000至1500000。藉由使丙烯酸樹脂的重量平均分子量為前述下限值以上,熱硬化性保護膜形成用膜的形狀穩定性(保管時的經時穩定性)提高。再者,藉由使丙烯酸樹脂的重量平均分子量為前述上限值以下,熱硬化性保護膜形成用膜變得易於追隨於被接著體的凹凸面,而可更加抑制在被接著體與熱硬化性保護膜形成用膜之間產生空隙(void)等。此外,本說明書中,所謂「重量平均分子量」,只要無特別說明,係藉由凝膠滲透層析(GPC;Gel Permeation Chromatography)法所測定之聚苯乙烯換算值。As the aforementioned acrylic resin in the polymer component (A), known acrylic polymers can be cited. The weight average molecular weight (Mw) of the acrylic resin is preferably 10,000 to 2,000,000, more preferably 100,000 to 1,500,000. By setting the weight average molecular weight of the acrylic resin to be equal to or higher than the aforementioned lower limit, the shape stability of the film for forming a thermosetting protective film (stability with time during storage) is improved. Furthermore, by making the weight average molecular weight of the acrylic resin below the aforementioned upper limit, the film for forming a thermosetting protective film becomes easy to follow the uneven surface of the adherend, and it is possible to further suppress the adhesion and thermal curing of the adherend. There are voids between the films for forming a protective film. In addition, in this specification, the "weight average molecular weight" is a polystyrene conversion value measured by a gel permeation chromatography (GPC; Gel Permeation Chromatography) method unless otherwise specified.
丙烯酸樹脂的玻璃轉移溫度(Tg)較佳為-60℃至70℃,更佳為-30℃至50℃。藉由使丙烯酸樹脂的Tg為前述下限值以上,例如保護膜形成用膜之硬化物與支撐片之接著力得到抑制,而適度地提高支撐片的剝離性。再者,藉由使丙烯酸樹脂的Tg為前述上限值以下,提高熱硬化性保護膜形成用膜及該熱硬化性保護膜形成用膜之硬化物與被接著體之接著力。The glass transition temperature (Tg) of the acrylic resin is preferably -60°C to 70°C, more preferably -30°C to 50°C. By making the Tg of the acrylic resin more than the aforementioned lower limit, for example, the adhesive force between the cured product of the protective film forming film and the support sheet is suppressed, and the releasability of the support sheet is appropriately improved. Furthermore, by setting the Tg of the acrylic resin to the aforementioned upper limit or less, the adhesive force between the film for forming a thermosetting protective film and the cured product and the adherend of the film for forming a thermosetting protective film is improved.
當於丙烯酸樹脂具有m種(m為2以上之整數)構成單元,針對衍生成這些構成單元之m種單體,分別分配1至m為止之任一個不重複之編號,並命名為「單體m」之情況下,丙烯酸樹脂的玻璃轉移溫度(Tg)可使用以下所示之Fox公式而算出。When the acrylic resin has m types (m is an integer of 2 or more) of structural units, the m types of monomers derived from these structural units are assigned a non-repeated number from 1 to m and named as "monomers" In the case of m", the glass transition temperature (Tg) of the acrylic resin can be calculated using the Fox formula shown below.
[數1](式中,Tg為丙烯酸樹脂的玻璃轉移溫度;m為2以上之整數;Tgk 為單體m之均聚物的玻璃轉移溫度;Wk 為丙烯酸樹脂中的由單體m所衍生出之構成單元m的質量分率,其中,Wk 滿足下述式。)[Number 1] (In the formula, Tg is the glass transition temperature of acrylic resin; m is an integer greater than 2; Tg k is the glass transition temperature of the homopolymer of monomer m; W k is the acrylic resin derived from monomer m The mass fraction of the constituent unit m, where W k satisfies the following formula.)
[數2](式中,m及Wk 與前述相同。)[Number 2] (In the formula, m and W k are the same as above.)
作為前述Tgk ,可使用高分子資料手冊、黏著手冊或Polymer Handbook等所記載之值。例如,丙烯酸甲酯之均聚物的Tgk 為10℃,甲基丙烯酸甲酯之均聚物的Tgk 為105℃,丙烯酸2-羥基乙酯之均聚物的Tgk 為-15℃。As the aforementioned Tg k , a value described in a polymer material handbook, an adhesive handbook, or a polymer handbook can be used. For example, the methacrylate homopolymer Tg k of 10 ℃, of a methyl methacrylate homopolymer Tg k of 105 ℃, of 2-hydroxyethyl acrylate homopolymer Tg k of -15 ℃.
作為丙烯酸樹脂,可列舉例如: 1種或2種以上之(甲基)丙烯酸酯之聚合物;1種或2種以上之(甲基)丙烯酸酯與選自(甲基)丙烯酸、衣康酸、乙酸乙烯酯、丙烯腈、苯乙烯及N-羥甲基丙烯醯胺等中的1種或2種以上之單體之共聚物等。Examples of acrylic resins include: 1 or 2 or more (meth)acrylate polymers; 1 or 2 or more (meth)acrylates and selected from (meth)acrylic acid and itaconic acid , Vinyl acetate, acrylonitrile, styrene and N-methylol acrylamide, etc., a copolymer of one or more monomers, etc.
作為構成丙烯酸樹脂之前述(甲基)丙烯酸酯,可列舉例如:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯((甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯((甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯((甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯((甲基)丙烯酸硬脂酯)等的構成烷基酯之烷基為碳數為1至18之鏈狀結構之(甲基)丙烯酸烷基酯;(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯等的(甲基)丙烯酸環烷基酯;(甲基)丙烯酸苄酯等的(甲基)丙烯酸芳烷基酯;(甲基)丙烯酸二環戊烯酯等的(甲基)丙烯酸環烯酯;(甲基)丙烯酸二環戊烯氧基乙酯等的(甲基)丙烯酸環烯氧基烷基酯;(甲基)丙烯醯亞胺;(甲基)丙烯酸縮水甘油酯等的含縮水甘油基之(甲基)丙烯酸酯;(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸3-羥基丙酯、(甲基)丙烯酸2-羥基丁酯、(甲基)丙烯酸3-羥基丁酯、(甲基)丙烯酸4-羥基丁酯等的含羥基之(甲基)丙烯酸酯;(甲基)丙烯酸N-甲基胺基乙酯等的含取代胺基之(甲基)丙烯酸酯等。此處所謂「取代胺基」,意指胺基的1個或2個氫原子被氫原子以外的基取代而成之基。Examples of the (meth)acrylate constituting the acrylic resin include methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, and isopropyl (meth)acrylate. , N-butyl (meth)acrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, tertiary butyl (meth)acrylate, pentyl (meth)acrylate, (meth) )Hexyl acrylate, heptyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, n-octyl (meth)acrylate, n-nonyl (meth)acrylate Ester, isononyl (meth)acrylate, decyl (meth)acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate (lauryl (meth)acrylate), Tridecyl (meth)acrylate, tetradecyl (meth)acrylate (myristyl (meth)acrylate), pentadecyl (meth)acrylate, hexadecyl (meth)acrylate Alkyl ester (palmityl (meth)acrylate), heptadecyl (meth)acrylate, stearyl (meth)acrylate (stearyl (meth)acrylate), etc. The alkyl group is an alkyl (meth)acrylate with a chain structure of carbon number 1 to 18; (meth)acrylic acid rings such as isobornyl (meth)acrylate and dicyclopentyl (meth)acrylate Alkyl esters; aralkyl (meth)acrylates such as benzyl (meth)acrylate; cycloalkenyl (meth)acrylates such as dicyclopentenyl (meth)acrylate; di(meth)acrylate Cycloalkenyloxyalkyl (meth)acrylate such as cyclopentenoxyethyl; (meth)acrylimines; glycidyl-containing (meth) containing glycidyl (meth)acrylate, etc. Acrylate; hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, 3-hydroxypropyl (meth)acrylate, (meth)acrylic acid Hydroxyl-containing (meth)acrylates such as 2-hydroxybutyl, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate, etc.; (meth)acrylic acid N-methylamino group (Meth)acrylates containing substituted amino groups such as ethyl esters, etc. Here, the "substituted amino group" means a group in which one or two hydrogen atoms of the amino group are substituted with groups other than hydrogen atoms.
構成丙烯酸樹脂之單體可僅為1種,亦可為2種以上,於為2種以上的情況,這些單體的組合及比率可任意選擇。The monomer constituting the acrylic resin may be only one type or two or more types. In the case of two or more types, the combination and ratio of these monomers can be arbitrarily selected.
丙烯酸樹脂亦可具有乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等的可與其他化合物鍵結之官能基。丙烯酸樹脂的前述官能基可透過下述之交聯劑(F)與其他化合物鍵結,亦可不透過交聯劑(F)而與其他化合物直接鍵結。藉由丙烯酸樹脂藉由前述官能基與其他化合物鍵結,有提高使用保護膜形成用複合片所獲得之封裝體的可靠性之傾向。The acrylic resin may also have functional groups such as vinyl groups, (meth)acrylic groups, amino groups, hydroxyl groups, carboxyl groups, and isocyanate groups that can be bonded to other compounds. The aforementioned functional groups of the acrylic resin may be bonded to other compounds through the crosslinking agent (F) described below, or may be directly bonded to other compounds without the crosslinking agent (F). When the acrylic resin is bonded to other compounds via the aforementioned functional group, there is a tendency to improve the reliability of the package obtained by using the composite sheet for forming a protective film.
本發明中,作為聚合物成分(A),可不使用丙烯酸樹脂而單獨使用丙烯酸樹脂以外的熱塑性樹脂(以下有時僅簡稱為「熱塑性樹脂」),亦可與丙烯酸樹脂併用。藉由使用前述熱塑性樹脂,有時提高保護膜自支撐片之剝離性,或熱硬化性保護膜形成用膜變得易於追隨於被接著體的凹凸面,而可更加抑制在被接著體與熱硬化性保護膜形成用膜之間產生空隙等。In the present invention, as the polymer component (A), a thermoplastic resin other than the acrylic resin (hereinafter sometimes simply referred to as "thermoplastic resin") may be used alone instead of the acrylic resin, or may be used in combination with the acrylic resin. By using the aforementioned thermoplastic resin, the peelability of the protective film self-supporting sheet may be improved, or the thermosetting protective film forming film may easily follow the uneven surface of the adherend, which can further suppress the heat on the adherend. There are voids and the like between the films for forming the curable protective film.
前述熱塑性樹脂之重量平均分子量較佳為1000至100000,更佳為3000至80000。The weight average molecular weight of the aforementioned thermoplastic resin is preferably 1,000 to 100,000, more preferably 3,000 to 80,000.
前述熱塑性樹脂之玻璃轉移溫度(Tg)較佳為-30℃至150℃,更佳為-20℃至120℃。The glass transition temperature (Tg) of the aforementioned thermoplastic resin is preferably -30°C to 150°C, more preferably -20°C to 120°C.
作為前述熱塑性樹脂可列舉例如:聚酯、聚胺基甲酸酯、苯氧基樹脂、聚丁烯、聚丁二烯、聚苯乙烯等。As said thermoplastic resin, polyester, polyurethane, phenoxy resin, polybutene, polybutadiene, polystyrene, etc. are mentioned, for example.
組成物(III-1)及熱硬化性保護膜形成用膜所含有之前述熱塑性樹脂可僅為1種,亦可為2種以上,於為2種以上的情況,這些熱塑性樹脂的組合及比率可任意選擇。The aforementioned thermoplastic resin contained in the composition (III-1) and the film for forming a thermosetting protective film may be only one type or two or more types. In the case of two or more types, the combination and ratio of these thermoplastic resins You can choose any.
組成物(III-1)中,無論聚合物成分(A)之種類為何,聚合物成分(A)之含量相對於除溶媒以外的全部成分之總含量的比例(亦即熱硬化性保護膜形成用膜中之聚合物成分(A)之含量相對於熱硬化性保護膜形成用膜之總質量的比例)較佳為5質量%至80質量%,更佳為8質量%至70質量%,尤佳為11質量%至60質量%,特佳為14質量%至50質量%,可為例如17質量%至45質量%、及20質量%至40質量%的任一種。保護膜形成用膜及保護膜通常因為厚度薄,故而在使用韌性低且脆弱之保護膜形成用膜或保護膜的情況,於製造具保護膜的晶片時,會於保護膜形成用膜或保護膜產生裂痕(間隙)。這種情況下,於將最終所製造出之具保護膜的晶片加熱時,有自成為高溫之保護膜朝晶片上之突狀電極的傳熱效果下降之可能性。然而,藉由使前述比例為前述下限值以上,保護膜形成用膜及保護膜之韌性變得更高,抑制如此般之不良狀況的效果變高。In the composition (III-1), regardless of the type of the polymer component (A), the ratio of the content of the polymer component (A) to the total content of all components except the solvent (that is, the thermosetting protective film is formed) The ratio of the content of the polymer component (A) in the film to the total mass of the film for forming a thermosetting protective film) is preferably 5 mass% to 80 mass%, more preferably 8 mass% to 70 mass%, It is particularly preferably 11% by mass to 60% by mass, particularly preferably 14% by mass to 50% by mass, and may be any of, for example, 17% by mass to 45% by mass, and 20% by mass to 40% by mass. The protective film formation film and the protective film are generally thin, so when the protective film formation film or protective film with low toughness and fragility is used, when manufacturing a wafer with a protective film, the protective film formation film or the protective film The film has cracks (gaps). In this case, when heating the finally manufactured wafer with a protective film, there is a possibility that the heat transfer effect of the protective film from the high temperature to the protruding electrode on the wafer may decrease. However, by making the said ratio more than the said lower limit, the toughness of the film for protective film formation and a protective film becomes higher, and the effect of suppressing such a defect becomes high.
聚合物成分(A)有時亦相當於熱硬化性成分(B)。本發明中,於組成物(III-1)含有如此般相當於聚合物成分(A)及熱硬化性成分(B)兩者之成分之情況,組成物(III-1)視為含有聚合物成分(A)及熱硬化性成分(B)。The polymer component (A) may also correspond to the thermosetting component (B). In the present invention, when the composition (III-1) contains components corresponding to both the polymer component (A) and the thermosetting component (B) in this way, the composition (III-1) is regarded as containing the polymer Component (A) and thermosetting component (B).
[熱硬化性成分(B)]熱硬化性成分(B)係用以使熱硬化性保護膜形成用膜硬化之成分。組成物(III-1)及熱硬化性保護膜形成用膜所含有之熱硬化性成分(B)可僅為1種,亦可為2種以上,於為2種以上的情況,這些熱硬化性成分(B)的組合及比率可任意選擇。[Thermosetting component (B)] The thermosetting component (B) is a component for curing the film for forming a thermosetting protective film. The composition (III-1) and the thermosetting component (B) contained in the film for forming a thermosetting protective film may be only one type, or two or more types. In the case of two or more types, these are heat-cured The combination and ratio of the sexual component (B) can be arbitrarily selected.
作為熱硬化性成分(B)可列舉例如:環氧系熱硬化性樹脂、聚醯亞胺樹脂、不飽和聚酯樹脂等,較佳為環氧系熱硬化性樹脂。Examples of the thermosetting component (B) include epoxy-based thermosetting resins, polyimide resins, unsaturated polyester resins, and the like, and epoxy-based thermosetting resins are preferred.
[環氧系熱硬化性樹脂]環氧系熱硬化性樹脂係由環氧樹脂(B1)及熱硬化劑(B2)所構成。組成物(III-1)及熱硬化性保護膜形成用膜所含有之環氧系熱硬化性樹脂可僅為1種,亦可為2種以上,於為2種以上的情況,這些環氧系熱硬化性樹脂的組合及比率可任意選擇。[Epoxy-based thermosetting resin] The epoxy-based thermosetting resin is composed of an epoxy resin (B1) and a thermosetting agent (B2). The epoxy-based thermosetting resin contained in the composition (III-1) and the film for forming a thermosetting protective film may be only one type or two or more types. In the case of two or more types, these epoxy resins The combination and ratio of the thermosetting resin can be arbitrarily selected.
・環氧樹脂(B1)作為環氧樹脂(B1),可列舉公知的環氧樹脂,可列舉例如:多官能系環氧樹脂、聯苯化合物、雙酚A二縮水甘油醚及其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂等2官能以上之環氧化合物。・Epoxy resin (B1) As the epoxy resin (B1), well-known epoxy resins can be cited, for example, polyfunctional epoxy resins, biphenyl compounds, bisphenol A diglycidyl ether and its hydrogenated products, Ortho-cresol novolak epoxy resin, dicyclopentadiene type epoxy resin, biphenyl type epoxy resin, bisphenol A type epoxy resin, bisphenol F type epoxy resin, phenylene skeleton type epoxy resin Epoxy compounds with more than two functions.
作為環氧樹脂(B1)亦可使用具有不飽和烴基之環氧樹脂。As the epoxy resin (B1), an epoxy resin having an unsaturated hydrocarbon group can also be used.
作為具有不飽和烴基之環氧樹脂,可列舉例如:將多官能系環氧樹脂的一部分環氧基置換為具有不飽和烴基之基而成之化合物。如此般之化合物例如藉由使(甲基)丙烯酸或其衍生物與環氧基進行加成反應而獲得。再者,作為具有不飽和烴基之環氧樹脂,可列舉例如:於構成環氧樹脂之芳香環等直接鍵結有具有不飽和烴基之基之化合物等。不飽和烴基為具有聚合性之不飽和基,作為該不飽和烴基的具體例,可列舉:次乙基(乙烯基)、2-丙烯基(烯丙基)、(甲基)丙烯醯基、(甲基)丙烯醯胺基等,較佳為丙烯醯基。As an epoxy resin having an unsaturated hydrocarbon group, for example, a compound obtained by substituting a part of the epoxy group of a polyfunctional epoxy resin with a group having an unsaturated hydrocarbon group is mentioned. Such a compound can be obtained, for example, by performing an addition reaction of (meth)acrylic acid or a derivative thereof with an epoxy group. Furthermore, as an epoxy resin having an unsaturated hydrocarbon group, for example, a compound having a group having an unsaturated hydrocarbon group directly bonded to an aromatic ring constituting the epoxy resin or the like can be cited. The unsaturated hydrocarbon group is a polymerizable unsaturated group. Specific examples of the unsaturated hydrocarbon group include ethylene (vinyl), 2-propenyl (allyl), (meth)acrylic, The (meth)acrylamido group, etc., is preferably an acrylamido group.
環氧樹脂(B1)之數量平均分子量並不特別限定,就熱硬化性保護膜形成用膜之硬化性、以及作為該熱硬化性保護膜形成用膜之硬化物的保護膜之強度及耐熱性方面而言,較佳為300至30000,更佳為300至10000,特佳為300至3000。環氧樹脂(B1)之環氧當量較佳為100g/eq至1000g/eq,更佳為150g/eq至950g/eq。The number-average molecular weight of the epoxy resin (B1) is not particularly limited, and the curability of the film for forming a thermosetting protective film, and the strength and heat resistance of the protective film as the cured product of the film for forming the thermosetting protective film In terms of aspect, it is preferably 300 to 30,000, more preferably 300 to 10,000, and particularly preferably 300 to 3,000. The epoxy equivalent of the epoxy resin (B1) is preferably 100 g/eq to 1000 g/eq, more preferably 150 g/eq to 950 g/eq.
環氧樹脂(B1)可單獨使用1種,亦可併用2種以上,於併用2種以上的情況,這些環氧樹脂(B1)的組合及比率可任意選擇。The epoxy resin (B1) may be used individually by 1 type, and may use 2 or more types together, and when using 2 or more types together, the combination and ratio of these epoxy resins (B1) can be selected arbitrarily.
・熱硬化劑(B2)熱硬化劑(B2)發揮作為針對環氧樹脂(B1)之硬化劑之功能。作為熱硬化劑(B2),可列舉例如:1分子中具有2個以上之可與環氧基反應之官能基之化合物。作為前述官能基,可列舉例如:酚性羥基、醇性羥基、胺基、羧基、酸基經酐化而成之基等,較佳為酚性羥基、胺基、或酸基經酐化而成之基,更佳為酚性羥基或胺基。・Thermo-hardener (B2) The thermo-hardener (B2) functions as a hardener for epoxy resin (B1). As a thermosetting agent (B2), the compound which has 2 or more functional groups which can react with an epoxy group in 1 molecule is mentioned, for example. As the aforementioned functional group, for example, a phenolic hydroxyl group, an alcoholic hydroxyl group, an amino group, a carboxyl group, an acid group formed by anhydride, etc. are preferably The formed group is more preferably a phenolic hydroxyl group or an amino group.
熱硬化劑(B2)中,作為具有酚性羥基之酚系硬化劑,可列舉例如:多官能酚樹脂、聯苯酚、酚醛清漆型酚樹脂、二環戊二烯型酚樹脂、芳烷基型酚樹脂等。熱硬化劑(B2)中,作為具有胺基之胺硬化劑,可列舉例如雙氰胺等。Among the thermosetting agents (B2), examples of phenolic curing agents having phenolic hydroxyl groups include polyfunctional phenol resins, biphenols, novolac type phenol resins, dicyclopentadiene type phenol resins, and aralkyl type phenol resins. Phenolic resin, etc. In the thermosetting agent (B2), examples of the amine curing agent having an amine group include dicyandiamide.
熱硬化劑(B2)亦可具有不飽和烴基。The thermosetting agent (B2) may have an unsaturated hydrocarbon group.
熱硬化劑(B2)中,例如多官能酚樹脂、酚醛清漆型酚樹脂、二環戊二烯型酚樹脂、芳烷基型酚樹脂等的樹脂成分的數量平均分子量較佳為300至30000,更佳為400至10000,特佳為500至3000。熱硬化劑(B2)中,例如聯苯酚、雙氰胺等的非樹脂成分的分子量並不特別限定,例如較佳為60至500。In the thermosetting agent (B2), for example, the number average molecular weight of resin components such as polyfunctional phenol resin, novolak type phenol resin, dicyclopentadiene type phenol resin, aralkyl type phenol resin, etc. is preferably 300 to 30,000, More preferably, it is 400 to 10,000, particularly preferably 500 to 3,000. In the thermosetting agent (B2), the molecular weight of non-resin components such as biphenol and dicyandiamide is not particularly limited, but is preferably 60 to 500, for example.
熱硬化劑(B2)可單獨使用1種,亦可併用2種以上,於併用2種以上的情況,這些熱硬化劑(B2)的組合及比率可任意選擇。A thermosetting agent (B2) may be used individually by 1 type, and may use 2 or more types together. When using 2 or more types together, the combination and ratio of these thermosetting agents (B2) can be selected arbitrarily.
組成物(III-1)及熱硬化性保護膜形成用膜中,熱硬化劑(B2)之含量相對於環氧樹脂(B1)之含量100質量份,較佳為0.1質量份至500質量份,更佳為0.1質量份至200質量份,尤佳為0.1質量份至100質量份,特佳為0.5質量份至50質量份,可為例如0.5質量份至25質量份、0.5質量份至10質量份、及0.5質量份至5質量份之任一種。藉由使熱硬化劑(B2)之前述含量為前述下限值以上,熱硬化性保護膜形成用膜變得容易進行硬化。藉由使熱硬化劑(B2)之前述含量為前述上限值以下,降低熱硬化性保護膜形成用膜之吸濕率,而更提高使用保護膜形成用複合片所獲得之封裝體的可靠性。In the composition (III-1) and the film for forming a thermosetting protective film, the content of the thermosetting agent (B2) relative to the content of the epoxy resin (B1) is 100 parts by mass, preferably 0.1 to 500 parts by mass , More preferably 0.1 parts by mass to 200 parts by mass, particularly preferably 0.1 parts by mass to 100 parts by mass, particularly preferably 0.5 parts by mass to 50 parts by mass, for example, 0.5 parts by mass to 25 parts by mass, 0.5 parts by mass to 10 parts by mass Parts by mass, and any one of 0.5 parts by mass to 5 parts by mass. By making the said content of a thermosetting agent (B2) more than the said lower limit, the film for thermosetting protective film formation becomes easy to harden. By making the aforementioned content of the thermosetting agent (B2) below the aforementioned upper limit, the moisture absorption rate of the thermosetting protective film formation film is reduced, and the reliability of the package obtained by using the protective film formation composite sheet is further improved Sex.
組成物(III-1)及熱硬化性保護膜形成用膜中,熱硬化性成分(B)之含量(例如環氧樹脂(B1)及熱硬化劑(B2)之總含量)相對於聚合物成分(A)之含量100質量份,較佳為10質量份至200質量份,更佳為20質量份至150質量份,可為例如30質量份至100質量份、40質量份至80質量份、及50質量份至70質量份之任一種。藉由使熱硬化性成分(B)之前述含量為如此般範圍,例如抑制保護膜形成用膜之硬化物與支撐片的接著力,而提高支撐片之剝離性。In the composition (III-1) and the film for forming a thermosetting protective film, the content of the thermosetting component (B) (for example, the total content of the epoxy resin (B1) and the thermosetting agent (B2)) relative to the polymer The content of component (A) is 100 parts by mass, preferably 10 parts by mass to 200 parts by mass, more preferably 20 parts by mass to 150 parts by mass, and may be, for example, 30 parts by mass to 100 parts by mass, 40 parts by mass to 80 parts by mass , And any one of 50 parts by mass to 70 parts by mass. By setting the aforementioned content of the thermosetting component (B) in such a range, for example, the adhesive force between the cured product of the protective film forming film and the support sheet is suppressed, and the releasability of the support sheet is improved.
[光吸收劑(I)]光吸收劑(I)係於存在於保護膜中的狀態下,藉由吸收光而容易使保護膜之溫度上升的成分。藉由組成物(III-1)及熱硬化性保護膜形成用膜含有光吸收劑(I),保護膜之Xmax 變得更大,而更容易使Z150 及Z200 變大。再者,藉由保護膜於波長400nm至750nm之光之穿透率變小,能夠容易視認有無保護膜之存在。[Light absorber (I)] The light absorber (I) is a component that absorbs light in a state where it is present in the protective film to easily increase the temperature of the protective film. When the composition (III-1) and the thermosetting protective film forming film contain the light absorber (I), the X max of the protective film becomes larger, and it is easier to enlarge Z 150 and Z 200. Furthermore, since the transmittance of the protective film to light with a wavelength of 400 nm to 750 nm is reduced, the presence or absence of the protective film can be easily recognized.
作為光吸收劑(I)可列舉例如有機色素、無機顔料等。Examples of the light absorber (I) include organic dyes and inorganic pigments.
作為前述有機色素,可列舉例如:二亞銨系色素、銨系色素、花青系色素、部花青系色素、克酮鎓(croconium)系色素、方酸鎓(squalilium)系色素、薁鎓系色素、聚次甲基系色素、萘醌系色素、吡喃鎓系色素、酞菁系色素、萘酞菁系色素、萘內醯胺系色素、偶氮系色素、縮合偶氮系色素、靛藍系色素、紫環酮(perinone)系色素、苝系色素、二噁嗪系色素、喹吖啶酮系色素、異吲哚啉酮系色素、喹啉黃(quinophthalone)系色素、吡咯系色素、硫代靛藍系色素、金屬錯合物系色素(金屬錯鹽染料)、二硫醇金屬錯合物系色素、吲哚酚系色素、三烯丙基甲烷系色素、蒽醌系色素、雙噁嗪系色素、萘酚系色素、偶氮次甲基系色素、次甲基偶氮系色素、苯并咪唑酮系色素、皮蒽酮系色素及士林(threne)系色素等。Examples of the aforementioned organic pigments include diiminium-based pigments, ammonium-based pigments, cyanine-based pigments, merocyanine-based pigments, croconium-based pigments, squalilium-based pigments, and azulene Pigments, polymethine pigments, naphthoquinone pigments, pyrylium pigments, phthalocyanine pigments, naphthalocyanine pigments, naphthalene lactam pigments, azo pigments, condensed azo pigments, Indigo dyes, perinone dyes, perylene dyes, dioxazine dyes, quinacridone dyes, isoindolinone dyes, quinophthalone dyes, pyrrole dyes , Thioindigo dyes, metal complex dyes (metal complex salt dyes), dithiol metal complex dyes, indoxyphenol dyes, triallylmethane dyes, anthraquinone dyes, double Oxazine dyes, naphthol dyes, azomethine dyes, methine azo dyes, benzimidazolone dyes, pyranthrone dyes, threne dyes, and the like.
作為前述無機顔料可列舉例如:碳黑等的碳材料、鑭系材料、錫系材料、銻系材料、鎢系材料等。此處所謂的鑭系材料、錫系材料、銻系材料、鎢系材料係分別意指含鑭之材料、含錫之材料、含銻之材料、含鎢之材料。這些材料當中,就分散性較優異、且因熱所導致材料本身的變質少的方面而言,前述無機顔料較佳為碳材料,更佳為碳黑。Examples of the aforementioned inorganic pigments include carbon materials such as carbon black, lanthanide-based materials, tin-based materials, antimony-based materials, and tungsten-based materials. The lanthanide-based materials, tin-based materials, antimony-based materials, and tungsten-based materials referred to herein refer to lanthanum-containing materials, tin-containing materials, antimony-containing materials, and tungsten-containing materials, respectively. Among these materials, the aforementioned inorganic pigment is preferably a carbon material, and more preferably carbon black in terms of superior dispersibility and less deterioration of the material itself due to heat.
光吸收劑(I)較佳為可吸收可見光及紅外線之任一者或兩者。The light absorber (I) is preferably capable of absorbing either or both of visible light and infrared light.
組成物(III-1)及熱硬化性保護膜形成用膜所含有之光吸收劑(I)可僅為1種,亦可為2種以上,於為2種以上的情況,這些光吸收劑(I)的組合及比率可任意選擇。例如,組成物(III-1)及熱硬化性保護膜形成用膜可僅含有1種或2種以上的有機色素,亦可僅含有1種或2種以上的無機顔料,亦可一併含有1種或2種以上的有機色素及無機顔料來作為光吸收劑(I)。The light absorbing agent (I) contained in the composition (III-1) and the film for forming a thermosetting protective film may be one type or two or more types. In the case of two or more types, these light absorbing agents The combination and ratio of (I) can be arbitrarily selected. For example, the composition (III-1) and the film for forming a thermosetting protective film may contain only one or two or more organic pigments, or only one or two or more inorganic pigments, or together One type or two or more types of organic pigments and inorganic pigments are used as the light absorber (I).
組成物(III-1)及熱硬化性保護膜形成用膜較佳為含有2種以上的可吸收可見光及紅外線之任一者或兩者的光吸收劑(I),更佳為含有2種至7種。The composition (III-1) and the film for forming a thermosetting protective film preferably contain two or more kinds of light absorbers (I) that can absorb either or both of visible light and infrared rays, and more preferably contain two kinds of light absorbers (I) To 7 kinds.
組成物(III-1)及熱硬化性保護膜形成用膜在含有無機顔料作為光吸收劑(I)的情況,較佳為含有碳材料,於此種情況下,亦可例如一併含有碳材料及有機色素。When the composition (III-1) and the film for forming a thermosetting protective film contain an inorganic pigment as the light absorber (I), it is preferable to contain a carbon material. In this case, for example, it may also contain carbon together. Materials and organic pigments.
組成物(III-1)中,光吸收劑(I)之含量相對於除溶媒以外之全部成分之總含量的比例(亦即,熱硬化性保護膜形成用膜中之光吸收劑(I)之含量相對於熱硬化性保護膜形成用膜之總質量的比例)較佳為0.1質量%至20質量%,更佳為0.3質量%至17.5質量%,尤佳為0.5質量%至16質量%,特佳為1質量%至15質量%。藉由使前述比例為前述下限值以上,能更加明顯地獲得使用光吸收劑(I)所帶來之效果。藉由使前述比例為前述上限值以下,能抑制使用過量的光吸收劑(I)。In the composition (III-1), the ratio of the content of the light absorber (I) to the total content of all ingredients except the solvent (ie, the light absorber (I) in the film for forming a thermosetting protective film) The ratio of the content relative to the total mass of the film for forming a thermosetting protective film) is preferably 0.1% by mass to 20% by mass, more preferably 0.3% by mass to 17.5% by mass, and particularly preferably 0.5% by mass to 16% by mass , Particularly preferably 1% by mass to 15% by mass. By making the aforementioned ratio more than the aforementioned lower limit value, the effect of using the light absorber (I) can be more clearly obtained. By setting the aforementioned ratio to be equal to or less than the aforementioned upper limit, it is possible to suppress the use of excessive light absorber (I).
[硬化促進劑(C)]組成物(III-1)及熱硬化性保護膜形成用膜亦可含有硬化促進劑(C)。硬化促進劑(C)係用以調整組成物(III-1)的硬化速度之成分。作為較佳的硬化促進劑(C),可列舉例如:三乙二胺、苄基二甲胺、三乙醇胺、二甲胺基乙醇、三(二甲胺基甲基)苯酚等的三級胺;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑等的咪唑類(1個以上之氫原子被氫原子以外的基取代而成之咪唑);三丁基膦、二苯基膦、三苯基膦等的有機膦類(1個以上之氫原子被有機基取代而成之膦);四苯基硼酸四苯基膦、四苯基硼酸三苯基膦等的四苯基硼鹽等。[Curing accelerator (C)] The composition (III-1) and the film for forming a thermosetting protective film may contain a curing accelerator (C). The hardening accelerator (C) is a component for adjusting the hardening speed of the composition (III-1). Examples of preferable hardening accelerators (C) include tertiary amines such as triethylenediamine, benzyldimethylamine, triethanolamine, dimethylaminoethanol, and tris(dimethylaminomethyl)phenol. ; 2-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5 -Imidazoles such as hydroxymethylimidazole (imidazoles in which one or more hydrogen atoms are replaced by groups other than hydrogen atoms); organic phosphines such as tributylphosphine, diphenylphosphine, and triphenylphosphine (1 Phosphine in which more than one hydrogen atom is replaced by an organic group); tetraphenyl boron salt such as tetraphenyl phosphine tetraphenyl borate, triphenyl phosphine tetraphenyl borate, etc.
組成物(III-1)及熱硬化性保護膜形成用膜所含有之硬化促進劑(C)可僅為1種,亦可為2種以上,於為2種以上的情況,這些硬化促進劑(C)的組合及比率可任意選擇。The curing accelerator (C) contained in the composition (III-1) and the film for forming a thermosetting protective film may be one type or two or more types. In the case of two or more types, these curing accelerators The combination and ratio of (C) can be arbitrarily selected.
於使用硬化促進劑(C)之情況,組成物(III-1)及熱硬化性保護膜形成用膜中,硬化促進劑(C)的含量相對於熱硬化性成分(B)的含量100質量份,較佳為0.01質量份至10質量份,更佳為0.1質量份至7質量份。藉由使硬化促進劑(C)的前述含量為前述下限值以上,可更加明顯地獲得使用硬化促進劑(C)所帶來之效果。藉由使硬化促進劑(C)的含量為前述上限值以下,例如抑制高極性之硬化促進劑(C)於高溫、高濕度條件下在熱硬化性保護膜形成用膜中朝熱硬化性保護膜形成用膜與被接著體之接著界面側移動而偏析之效果變高。結果而言,更加提高使用保護膜形成用複合片所獲得之具保護膜的晶片的可靠性。In the case of using a curing accelerator (C), the content of the curing accelerator (C) in the composition (III-1) and the film for forming a thermosetting protective film is relative to the content of the thermosetting component (B) 100 mass Parts, preferably 0.01 parts by mass to 10 parts by mass, more preferably 0.1 parts by mass to 7 parts by mass. By making the aforementioned content of the hardening accelerator (C) more than the aforementioned lower limit, the effect of using the hardening accelerator (C) can be more clearly obtained. By making the content of the hardening accelerator (C) below the aforementioned upper limit, for example, the hardening accelerator (C) with high polarity is prevented from becoming thermosetting in the film for forming a thermosetting protective film under high temperature and high humidity conditions. The adhesion interface side of the film for protective film formation and the adherend moves and the effect of segregation becomes high. As a result, the reliability of a wafer with a protective film obtained by using the composite sheet for forming a protective film is further improved.
[填充材料(D)]組成物(III-1)及熱硬化性保護膜形成用膜亦可含有填充材料(D)。藉由熱硬化性保護膜形成用膜含有填充材料(D),熱硬化性保護膜形成用膜與該熱硬化性保護膜形成用膜之硬化物(亦即保護膜)變得容易調整熱膨脹係數,藉由將該熱膨脹係數對於保護膜之形成對象物最佳化,更加提高使用保護膜形成用複合片所獲得之具保護膜的晶片的可靠性。再者,藉由熱硬化性保護膜形成用膜含有填充材料(D),亦可降低保護膜的吸濕率或提高散熱性。[Filling material (D)] The composition (III-1) and the film for forming a thermosetting protective film may contain a filling material (D). When the thermosetting protective film forming film contains the filler (D), the thermosetting protective film forming film and the cured product (ie, protective film) of the thermosetting protective film forming film can easily adjust the thermal expansion coefficient , By optimizing the thermal expansion coefficient for the object to be formed of the protective film, the reliability of the chip with the protective film obtained by using the composite sheet for forming the protective film is further improved. Furthermore, when the film for forming a thermosetting protective film contains the filler (D), the moisture absorption rate of the protective film can be reduced or the heat dissipation can be improved.
填充材料(D)可為有機填充材料及無機填充材料之任一種,較佳為無機填充材料。作為較佳的無機填充材料,可列舉例如:二氧化矽、不鏽鋼、氧化鋁、滑石、碳酸鈣、鈦白、鐵丹、碳化矽、氮化硼等之粉末;將這些無機填充材料球形化而成之珠粒;這些無機填充材料的表面改質品;這些無機填充材料的單晶纖維;玻璃纖維等。這些之中,無機填充材料較佳為二氧化矽、氧化鋁或不鏽鋼。於使用氧化鋁的情況,保護膜之S150 及S200 的調節變得更容易,再者,於保護膜要求絕緣性的情況,容易對保護膜賦予絕緣性。於使用不鏽鋼的情況,保護膜之S150 及S200 的調節變得特別容易。The filling material (D) can be any one of organic filling material and inorganic filling material, preferably inorganic filling material. As a preferable inorganic filler, for example, powders of silicon dioxide, stainless steel, alumina, talc, calcium carbonate, titanium dioxide, iron oxide, silicon carbide, boron nitride, etc. can be cited; these inorganic fillers are made into spheroids. Beads; surface modification products of these inorganic fillers; single crystal fibers of these inorganic fillers; glass fibers, etc. Among these, the inorganic filler is preferably silica, alumina or stainless steel. When aluminum oxide is used, the adjustment of S 150 and S 200 of the protective film becomes easier. Furthermore, when the protective film requires insulation, it is easy to impart insulation to the protective film. In the case of using stainless steel, the adjustment of S 150 and S 200 of the protective film becomes particularly easy.
填充材料(D)之平均粒徑並不特別限定,較佳為10nm至4000nm,更佳為30nm至3500nm。藉由使填充材料(D)之平均粒徑為如此般之範圍,可更明顯地獲得使用填充材料(D)所帶來之效果。例如,在可容易增大組成物(III-1)及熱硬化性保護膜形成用膜中之填充材料(D)的量,而使保護膜之S150 及S200 的調節變得容易的方面而言,填充材料(D)之平均粒徑較佳為10nm至2500nm,更佳為20nm至1000nm,特佳為30nm至600nm。另一方面,無論在任一種情況下,平均粒徑為前述下限值以上之填充材料(D)的操作性為良好,因此組成物(III-1)的品質穩定,而在穩定獲得使用保護膜所帶來之效果的方面而言是有利的。此外,本說明書中所謂「平均粒徑」只要無特別說明,則意指藉由雷射繞射散射法所求出之粒度分佈曲線中的累計值50%時的粒徑(D50 )的值。The average particle size of the filler (D) is not particularly limited, but is preferably 10 nm to 4000 nm, more preferably 30 nm to 3500 nm. By making the average particle size of the filler (D) within such a range, the effect of using the filler (D) can be more clearly obtained. For example, it is possible to easily increase the amount of the filler (D) in the composition (III-1) and the film for forming a thermosetting protective film, thereby facilitating the adjustment of S 150 and S 200 of the protective film In particular, the average particle size of the filler (D) is preferably 10 nm to 2500 nm, more preferably 20 nm to 1000 nm, particularly preferably 30 nm to 600 nm. On the other hand, in either case, the filler (D) whose average particle size is above the aforementioned lower limit has good operability, so the quality of the composition (III-1) is stable, and the use of a protective film is stably obtained In terms of the effect it brings, it is advantageous. In addition, the "average particle size" in this specification means the value of the particle size (D 50 ) at 50% of the cumulative value in the particle size distribution curve obtained by the laser diffraction scattering method, unless otherwise specified. .
組成物(III-1)及熱硬化性保護膜形成用膜所含有之填充材料(D)可僅為1種,亦可為2種以上,於為2種以上的情況,這些填充材料(D)的組合及比率可任意選擇。The filler (D) contained in the composition (III-1) and the film for forming a thermosetting protective film may be only one type or two or more types. In the case of two or more types, these fillers (D) ) The combination and ratio can be selected arbitrarily.
於使用填充材料(D)之情況,組成物(III-1)中,填充材料(D)之含量相對於除溶媒以外之全部成分之總含量的比例(亦即熱硬化性保護膜形成用膜中之填充材料(D)之含量相對於熱硬化性保護膜形成用膜之總質量的比例)較佳為15質量%至75質量%,更佳為18質量%至70質量%,可為例如45質量%至70質量%、50質量%至70質量%、及60質量%至70質量%的任一種。藉由使前述比例為如此般之範圍,上述之熱硬化性保護膜形成用膜與該熱硬化性保護膜形成用膜之硬化物(亦即保護膜)的熱膨脹係數之調節及保護膜之S150 及S200 之調節變得更容易。In the case of using the filler (D), in the composition (III-1), the ratio of the content of the filler (D) to the total content of all ingredients except the solvent (ie, the film for forming a thermosetting protective film) The ratio of the content of the filler (D) to the total mass of the thermosetting protective film forming film) is preferably 15% to 75% by mass, more preferably 18% to 70% by mass, and may be, for example Any of 45% to 70% by mass, 50% to 70% by mass, and 60% to 70% by mass. By setting the aforementioned ratio within such a range, the thermal expansion coefficient of the film for forming the thermosetting protective film and the cured product (ie, the protective film) of the film for forming the thermosetting protective film can be adjusted and the S of the protective film The adjustment of 150 and S 200 has become easier.
[偶合劑(E)]組成物(III-1)及熱硬化性保護膜形成用膜亦可含有偶合劑(E)。藉由使用具有可與無機化合物或有機化合物進行反應之官能基之化合物作為偶合劑(E),能夠提高熱硬化性保護膜形成用膜相對於被接著體之接著性及密接性。再者,藉由使用偶合劑(E),熱硬化性保護膜形成用膜之硬化物不會損害耐熱性而提高耐水性。[Coupling agent (E)] The composition (III-1) and the film for forming a thermosetting protective film may contain a coupling agent (E). By using a compound having a functional group capable of reacting with an inorganic compound or an organic compound as the coupling agent (E), the adhesiveness and adhesion of the film for forming a thermosetting protective film to the adherend can be improved. Furthermore, by using the coupling agent (E), the cured product of the film for forming a thermosetting protective film does not impair heat resistance and improves water resistance.
偶合劑(E)較佳為具有可與聚合物成分(A)、熱硬化性成分(B)等所具有之官能基進行反應的官能基之化合物,更佳為矽烷偶合劑。作為較佳的前述矽烷偶合劑,可列舉例如:3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基甲基二乙氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、3-縮水甘油氧基甲基二乙氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-胺基丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基甲基二乙氧基矽烷、3-(苯基胺基)丙基三甲氧基矽烷、3-苯胺基丙基三甲氧基矽烷、3-脲基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、雙(3-三乙氧基矽基丙基)四硫烷、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙醯氧基矽烷、咪唑矽烷等。The coupling agent (E) is preferably a compound having a functional group capable of reacting with the functional group possessed by the polymer component (A) and the thermosetting component (B), and more preferably a silane coupling agent. As a preferred silane coupling agent, for example, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, 3-glycidoxypropyl Triethoxysilane, 3-glycidoxymethyldiethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxysilane, 3-methacryloxypropyltrimethyl Oxyoxysilane, 3-aminopropyltrimethoxysilane, 3-(2-aminoethylamino)propyltrimethoxysilane, 3-(2-aminoethylamino)propylmethyl Diethoxysilane, 3-(phenylamino)propyltrimethoxysilane, 3-anilinopropyltrimethoxysilane, 3-ureidopropyltriethoxysilane, 3-mercaptopropyltrimethyl Oxysilane, 3-mercaptopropylmethyldimethoxysilane, bis(3-triethoxysilylpropyl)tetrasulfane, methyltrimethoxysilane, methyltriethoxysilane, ethylene Trimethoxysilane, vinyl triacetoxysilane, imidazole silane, etc.
組成物(III-1)及熱硬化性保護膜形成用膜所含有之偶合劑(E)可僅為1種,亦可為2種以上,於為2種以上的情況,這些偶合劑(E)的組合及比率可任意選擇。The coupling agent (E) contained in the composition (III-1) and the film for forming a thermosetting protective film may be only one type or two or more types. In the case of two or more types, these coupling agents (E) ) The combination and ratio can be selected arbitrarily.
於使用偶合劑(E)之情況,組成物(III-1)及熱硬化性保護膜形成用膜中,偶合劑(E)的含量相對於聚合物成分(A)及熱硬化性成分(B)的總含量100質量份,較佳為0.03質量份至10質量份,更佳為0.05質量份至5質量份,特佳為0.1質量份至2質量份。藉由使偶合劑(E)的前述含量為前述下限值以上,能更明顯地獲得如下之由使用偶合劑(E)所帶來之效果:提高填充材料(D)於樹脂中之分散性、或提高熱硬化性保護膜形成用膜與被接著體之接著性等。再者,藉由使偶合劑(E)的前述含量為前述上限值以下,能進一步抑制產生逸氣。In the case of using the coupling agent (E), the content of the coupling agent (E) in the composition (III-1) and the thermosetting protective film formation film is relative to the polymer component (A) and the thermosetting component (B) The total content of) is 100 parts by mass, preferably 0.03 parts by mass to 10 parts by mass, more preferably 0.05 parts by mass to 5 parts by mass, particularly preferably 0.1 parts by mass to 2 parts by mass. By making the aforementioned content of the coupling agent (E) above the aforementioned lower limit value, the following effect brought by the use of the coupling agent (E) can be obtained more obviously: improving the dispersibility of the filler (D) in the resin , Or improve the adhesion between the film for forming a thermosetting protective film and the adherend, etc. Furthermore, by making the aforementioned content of the coupling agent (E) below the aforementioned upper limit value, the generation of outgassing can be further suppressed.
[交聯劑(F)]於使用具有可與其他化合物鍵結之乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等的官能基之上述丙烯酸樹脂等作為聚合物成分(A)之情況,組成物(III-1)及熱硬化性保護膜形成用膜亦可含有交聯劑(F)。交聯劑(F)係用以使聚合物成分(A)中的前述官能基與其他化合物鍵結而進行交聯之成分,藉由如此般進行交聯,能夠調節熱硬化性保護膜形成用膜的初始接著力及凝聚力。[Crosslinking agent (F)] for the use of the above-mentioned acrylic resins having functional groups such as vinyl, (meth)acrylic groups, amino groups, hydroxyl groups, carboxyl groups, and isocyanate groups that can be bonded to other compounds as polymers In the case of the component (A), the composition (III-1) and the film for forming a thermosetting protective film may contain a crosslinking agent (F). The cross-linking agent (F) is a component used to bond the aforementioned functional groups in the polymer component (A) to other compounds for cross-linking. By cross-linking in this way, it is possible to adjust the thermosetting protective film formation. The initial adhesion and cohesion of the film.
作為交聯劑(F),可列舉例如:有機多元異氰酸酯化合物、有機多元亞胺化合物、金屬螯合物交聯劑(具有金屬螯合物結構之交聯劑)、氮丙啶交聯劑(具有氮丙啶基之交聯劑)等。Examples of the crosslinking agent (F) include organic polyisocyanate compounds, organic polyimine compounds, metal chelate crosslinking agents (crosslinking agents having a metal chelate structure), and aziridine crosslinking agents ( Crosslinking agent with aziridinyl group) and so on.
於使用具有上述官能基之丙烯酸樹脂等作為聚合物成分(A)的情況,組成物(III-1)及熱硬化性保護膜形成用膜亦可含有藉由加熱而與前述官能基進行反應之交聯劑作為交聯劑(F)。作為藉由加熱而與前述官能基進行反應之交聯劑可列舉例如:使有機多元異氰酸酯化合物中之異氰酸酯基經嵌段化之嵌段異氰酸酯化合物、具有酯交換反應性之多官能化合物等。In the case of using an acrylic resin or the like having the aforementioned functional group as the polymer component (A), the composition (III-1) and the film for forming a thermosetting protective film may also contain a functional group that reacts with the aforementioned functional group by heating The crosslinking agent is used as the crosslinking agent (F). Examples of the crosslinking agent that reacts with the aforementioned functional group by heating include a blocked isocyanate compound in which an isocyanate group in an organic polyvalent isocyanate compound is blocked, a polyfunctional compound having transesterification reactivity, and the like.
組成物(III-1)及熱硬化性保護膜形成用膜所含有之交聯劑(F)可僅為1種,亦可為2種以上,於為2種以上的情況,這些交聯劑(F)的組合及比率可任意選擇。The composition (III-1) and the crosslinking agent (F) contained in the film for forming a thermosetting protective film may be one type or two or more types. In the case of two or more types, these crosslinking agents The combination and ratio of (F) can be arbitrarily selected.
於使用交聯劑(F)之情況,組成物(III-1)中,交聯劑(F)的含量相對於聚合物成分(A)的含量100質量份,較佳為0.01質量份至20質量份,更佳為0.1質量份至10質量份,特佳為0.5質量份至5質量份。藉由使交聯劑(F)的前述含量為前述下限值以上,可更明顯地獲得使用交聯劑(F)所帶來之效果。再者,藉由使交聯劑(F)的前述含量為前述上限值以下,可抑制使用過量的交聯劑(F)。In the case of using the crosslinking agent (F), in the composition (III-1), the content of the crosslinking agent (F) relative to 100 parts by mass of the polymer component (A), preferably 0.01 to 20 parts by mass Parts by mass, more preferably 0.1 parts by mass to 10 parts by mass, particularly preferably 0.5 parts by mass to 5 parts by mass. By making the aforementioned content of the cross-linking agent (F) more than the aforementioned lower limit, the effect of using the cross-linking agent (F) can be more clearly obtained. Furthermore, by making the aforementioned content of the crosslinking agent (F) below the aforementioned upper limit value, it is possible to suppress the use of an excessive amount of the crosslinking agent (F).
[能量線硬化性樹脂(G)]組成物(III-1)及熱硬化性保護膜形成用膜亦可含有能量線硬化性樹脂(G)。熱硬化性保護膜形成用膜可藉由含有能量線硬化性樹脂(G),而以照射能量線來改變特性。[Energy ray curable resin (G)] The composition (III-1) and the film for forming a thermosetting protective film may contain an energy ray curable resin (G). The film for forming a thermosetting protective film contains energy-ray-curable resin (G) and can be irradiated with energy rays to change its characteristics.
能量線硬化性樹脂(G)係使能量線硬化性化合物聚合(硬化)而獲得。作為前述能量線硬化性化合物,可列舉例如分子內具有至少1個聚合性雙鍵之化合物,較佳為具有(甲基)丙烯醯基之丙烯酸酯化合物。The energy ray curable resin (G) is obtained by polymerizing (curing) an energy ray curable compound. Examples of the aforementioned energy ray curable compound include compounds having at least one polymerizable double bond in the molecule, and acrylate compounds having a (meth)acryloyl group are preferred.
作為前述丙烯酸酯化合物,可列舉例如:三羥甲基丙烷三(甲基)丙烯酸酯、四羥甲基甲烷四(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇單羥基五(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯等的含鏈狀脂肪族骨架之(甲基)丙烯酸酯;二(甲基)丙烯酸二環戊酯等的含環狀脂肪族骨架之(甲基)丙烯酸酯;聚乙二醇二(甲基)丙烯酸酯等的聚伸烷基二醇(甲基)丙烯酸酯;寡酯(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯低聚物;環氧改質(甲基)丙烯酸酯;前述聚伸烷基二醇(甲基)丙烯酸酯以外的聚醚(甲基)丙烯酸酯;衣康酸低聚物等。As the aforementioned acrylate compound, for example, trimethylolpropane tri(meth)acrylate, tetramethylolmethane tetra(meth)acrylate, pentaerythritol tri(meth)acrylate, pentaerythritol tetra(meth)acrylate ) Acrylate, dipentaerythritol monohydroxy penta(meth)acrylate, dipentaerythritol hexa(meth)acrylate, 1,4-butanediol di(meth)acrylate, 1,6-hexanediol di( (Meth)acrylates containing chain aliphatic skeletons such as meth)acrylates; (meth)acrylates containing cyclic aliphatic skeletons such as dicyclopentyl di(meth)acrylate; polyethylene di(meth)acrylates Polyalkylene glycol (meth)acrylate such as alcohol di(meth)acrylate; oligoester (meth)acrylate; (meth)acrylate urethane oligomer; epoxy modification (Meth)acrylates; polyether (meth)acrylates other than the aforementioned polyalkylene glycol (meth)acrylates; itaconic acid oligomers, etc.
前述能量線硬化性化合物之重量平均分子量較佳為100至30000,更佳為300至10000。The weight average molecular weight of the aforementioned energy ray curable compound is preferably 100 to 30,000, more preferably 300 to 10,000.
用於聚合之前述能量線硬化性化合物可僅為1種,亦可為2種以上,於為2種以上的情況,這些能量線硬化性化合物的組合及比率可任意選擇。The aforementioned energy ray curable compound used for polymerization may be only one type or two or more types. In the case of two or more types, the combination and ratio of these energy ray curable compounds can be arbitrarily selected.
組成物(III-1)及熱硬化性保護膜形成用膜所含有之能量線硬化性樹脂(G)可僅為1種,亦可為2種以上,於為2種以上的情況,這些能量線硬化性樹脂(G)的組合及比率可任意選擇。The energy ray curable resin (G) contained in the composition (III-1) and the film for forming a thermosetting protective film may be only one type, or two or more types. In the case of two or more types, these energy The combination and ratio of the linear curable resin (G) can be arbitrarily selected.
於使用能量線硬化性樹脂(G)的情況,組成物(III-1)中,能量線硬化性樹脂(G)之含量相對於組成物(III-1)之總質量的比例較佳為1質量%至95質量%,較佳為5質量%至90質量%,特佳為10質量%至85質量%。In the case of using energy ray curable resin (G), in the composition (III-1), the ratio of the content of the energy ray curable resin (G) to the total mass of the composition (III-1) is preferably 1 Mass% to 95% by mass, preferably 5% to 90% by mass, particularly preferably 10% to 85% by mass.
[光聚合起始劑(H)]於組成物(III-1)及熱硬化性保護膜形成用膜含有能量線硬化性樹脂(G)之情況,為了使能量線硬化性樹脂(G)之聚合反應有效率地進行,亦可含有光聚合起始劑(H)。[Photopolymerization initiator (H)] When the composition (III-1) and the film for forming a thermosetting protective film contain energy ray curable resin (G), in order to make the energy ray curable resin (G) The polymerization reaction proceeds efficiently, and a photopolymerization initiator (H) may be contained.
作為組成物(III-1)中之光聚合起始劑(H),可列舉例如:安息香、安息香甲醚、安息香乙醚、安息香異丙醚、安息香異丁醚、安息香苯甲酸、安息香苯甲酸甲酯、安息香二甲基縮酮等的安息香化合物;苯乙酮、2-羥基-2-甲基-1-苯基-丙烷-1-酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮、2-羥基-1-(4-(4-(2-羥基-2-甲基丙醯基)苄基)苯基)-2-甲基丙烷-1-酮等的苯乙酮化合物;雙(2,4,6-三甲基苯甲醯基)苯基氧化膦、2,4,6-三甲基苯甲醯基二苯基氧化膦等的醯基氧化膦化合物;苄基苯基硫醚、一硫化四甲基秋蘭姆等的硫醚化合物;1-羥基環己基苯基酮等的α-酮醇化合物;偶氮雙異丁腈等的偶氮化合物;二茂鈦等的二茂鈦化合物;噻噸酮等的噻噸酮化合物;過氧化物化合物;二乙醯等的二酮化合物;苯偶醯;二苯偶醯;二苯甲酮;2,4-二乙基噻噸酮;1,2-二苯基甲烷;2-羥基-2-甲基-1-[4-(1-甲基乙烯基)苯基]丙酮;1-氯蒽醌、2-氯蒽醌等的醌化合物。再者,作為光聚合起始劑(H)亦可使用例如胺等的光增感劑等。Examples of the photopolymerization initiator (H) in the composition (III-1) include benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoin benzoic acid, and benzoin methyl benzoate. Benzoin compounds such as esters and benzoin dimethyl ketal; acetophenone, 2-hydroxy-2-methyl-1-phenyl-propane-1-one, 2,2-dimethoxy-1,2- Diphenylethane-1-one, 2-hydroxy-1-(4-(4-(2-hydroxy-2-methylpropanyl)benzyl)phenyl)-2-methylpropane-1- Acetophenone compounds such as ketones; bis(2,4,6-trimethylbenzyl)phenylphosphine oxide, 2,4,6-trimethylbenzyldiphenylphosphine oxide, etc. Phosphine oxide compounds; thioether compounds such as benzyl phenyl sulfide and tetramethylthiuram monosulfide; α-keto alcohol compounds such as 1-hydroxycyclohexyl phenyl ketone; azobisisobutyronitrile, etc. Azo compounds; titanocene compounds such as titanocene; thioxanthone compounds such as thioxanthone; peroxide compounds; diketone compounds such as diacetyl; Ketone; 2,4-Diethylthioxanthone; 1,2-diphenylmethane; 2-hydroxy-2-methyl-1-[4-(1-methylvinyl)phenyl]acetone; 1 -Quinone compounds such as chloroanthraquinone and 2-chloroanthraquinone. In addition, as the photopolymerization initiator (H), for example, photosensitizers such as amines can also be used.
組成物(III-1)及熱硬化性保護膜形成用膜所含有之光聚合起始劑(H)可僅為1種,亦可為2種以上,於為2種以上的情況,這些光聚合起始劑(H)的組合及比率可任意選擇。The photopolymerization initiator (H) contained in the composition (III-1) and the film for forming a thermosetting protective film may be only one type, or two or more types. In the case of two or more types, these photopolymerization initiators (H) The combination and ratio of the polymerization initiator (H) can be arbitrarily selected.
於使用光聚合起始劑(H)的情況,組成物(III-1)中,光聚合起始劑(H)之含量相對於能量線硬化性樹脂(G)之含量100質量份,較佳為0.1質量份至20質量份,更佳為1質量份至10質量份,特佳為2質量份至5質量份。In the case of using the photopolymerization initiator (H), the content of the photopolymerization initiator (H) in the composition (III-1) is preferably 100 parts by mass relative to the content of the energy ray curable resin (G) It is 0.1 to 20 parts by mass, more preferably 1 to 10 parts by mass, particularly preferably 2 to 5 parts by mass.
[通用添加劑(J)]組成物(III-1)及熱硬化性保護膜形成用膜亦可在無損本發明的效果之範圍內,含有通用添加劑(J)。通用添加劑(J)可為公知的化合物,可對應於目的而任意選擇,並無特別限定,作為較佳的通用添加劑,可列舉例如:塑化劑、抗靜電劑、抗氧化劑、吸氣劑(gettering agent)、紫外線吸收劑、黏著賦予劑等。[General-purpose additive (J)] The composition (III-1) and the film for forming a thermosetting protective film may contain a general-purpose additive (J) within a range that does not impair the effect of the present invention. The general additives (J) may be well-known compounds, which can be arbitrarily selected according to the purpose, and are not particularly limited. Preferred general additives include, for example, plasticizers, antistatic agents, antioxidants, and getters ( gettering agent), ultraviolet absorber, adhesion imparting agent, etc.
組成物(III-1)及熱硬化性保護膜形成用膜所含有之通用添加劑(J)可僅為1種,亦可為2種以上,於為2種以上的情況,這些通用添加劑(J)的組合及比率可任意選擇。組成物(III-1)及熱硬化性保護膜形成用膜之通用添加劑(J)之含量並無特別限定,對應於目的而適當選擇即可。The general additives (J) contained in the composition (III-1) and the film for forming a thermosetting protective film may be only one type or two or more types. In the case of two or more types, these general additives (J) ) The combination and ratio can be selected arbitrarily. The content of the general additive (J) of the composition (III-1) and the film for forming a thermosetting protective film is not particularly limited, and may be appropriately selected according to the purpose.
[溶媒]組成物(III-1)較佳為進一步含有溶媒。含有溶媒之組成物(III-1)的操作性變得良好。前述溶媒並無特別限定,作為較佳的溶媒,可列舉例如:甲苯、二甲苯等烴;甲醇、乙醇、2-丙醇、異丁醇(2-甲基丙烷-1-醇)、1-丁醇等醇;乙酸乙酯等酯;丙酮、甲基乙基酮等酮;四氫呋喃等醚;二甲基甲醯胺、N-甲基吡咯啶酮等醯胺(具有醯胺鍵之化合物)等。組成物(III-1)所含有之溶媒可僅為1種,亦可為2種以上,於為2種以上的情況,這些溶媒的組合及比率可任意選擇。[Solvent] Composition (III-1) preferably further contains a solvent. The operability of the solvent-containing composition (III-1) becomes better. The aforementioned solvent is not particularly limited. Preferred solvents include hydrocarbons such as toluene and xylene; methanol, ethanol, 2-propanol, isobutanol (2-methylpropane-1-ol), 1- Alcohols such as butanol; esters such as ethyl acetate; ketones such as acetone and methyl ethyl ketone; ethers such as tetrahydrofuran; amides such as dimethylformamide and N-methylpyrrolidone (compounds with amide bonds) Wait. The solvent contained in the composition (III-1) may be only one type, or two or more types. In the case of two or more types, the combination and ratio of these solvents can be arbitrarily selected.
組成物(III-1)所含有之溶媒中,作為更佳的溶媒,就能夠使組成物(III-1)中之含有成分更均勻地混合的方面而言,可列舉例如:甲基乙基酮、甲苯、乙酸乙酯等。Among the solvents contained in the composition (III-1), as a more preferable solvent, in terms of allowing the components contained in the composition (III-1) to be more uniformly mixed, for example, methyl ethyl Ketones, toluene, ethyl acetate, etc.
組成物(III-1)之溶媒之含量並無特別限定,例如對應於除溶媒以外之成分的種類而適當選擇即可。The content of the solvent of the composition (III-1) is not particularly limited, and may be appropriately selected in accordance with the types of components other than the solvent, for example.
[熱硬化性保護膜形成用組成物之製造方法]組成物(III-1)等的熱硬化性保護膜形成用組成物係藉由調配用以構成該組成物之各成分而獲得。各成分調配時之添加順序並無特別限定,亦可同時添加2種以上的成分。調配時混合各成分之方法並無特別限定,只要自下述公知方法來適當選擇即可:使攪拌子或攪拌翼等旋轉而進行混合之方法;使用混合機進行混合之方法;施加超音波進行混合之方法等。關於添加及混合各成分時的溫度及時間,只要不使各調配成分劣化,則無特別限定,適當調節即可,溫度較佳為15℃至30℃。[Method for producing composition for forming thermosetting protective film] The composition for forming a thermosetting protective film, such as the composition (III-1), is obtained by blending the components constituting the composition. The order of addition at the time of preparing each component is not particularly limited, and two or more components may be added at the same time. The method of mixing each component at the time of compounding is not particularly limited, as long as it is appropriately selected from the following known methods: a method of rotating a stirrer or a stirring blade, etc. for mixing; a method of mixing using a mixer; applying ultrasonic waves Methods of mixing, etc. Regarding the temperature and time when each component is added and mixed, as long as it does not deteriorate each compounding component, it is not particularly limited and may be adjusted appropriately, and the temperature is preferably 15°C to 30°C.
◎能量線硬化性保護膜形成用膜使能量線硬化性保護膜形成用膜經進行能量線硬化而形成保護膜時的硬化條件,只要保護膜成為充分發揮保護膜之功能的程度之硬化度,則無別特限定,對應於能量線硬化性保護膜形成用膜之種類而適當選擇即可。例如,能量線硬化性保護膜形成用膜之能量線硬化時的能量線之照度較佳為60mW/cm2 至320mW/cm2 。並且,前述硬化時的能量線之光量較佳為100mJ/cm2 至1000mJ/cm2 。◎The curing conditions when the energy ray curable protective film formation film is cured by energy ray curable protective film formation to form a protective film, as long as the protective film has a degree of curing that can fully perform the function of the protective film, There is no particular limitation, and it may be appropriately selected according to the type of the film for forming an energy ray curable protective film. For example, the illuminance of the energy ray when the energy ray of the film for forming an energy ray curable protective film is cured is preferably 60 mW/cm 2 to 320 mW/cm 2 . In addition, the amount of light of the energy ray during curing is preferably 100 mJ/cm 2 to 1000 mJ/cm 2 .
作為能量線硬化性保護膜形成用膜可列舉例如含有能量線硬化性成分(a)及光吸收劑之膜,較佳為含有能量線硬化性成分(a)、光吸收劑及填充材料之膜。能量線硬化性保護膜形成用膜中,能量線硬化性成分(a)較佳為未硬化,較佳為具有黏著性,更佳為未硬化且具有黏著性。Examples of the film for forming an energy ray curable protective film include a film containing an energy ray curable component (a) and a light absorber, preferably a film containing an energy ray curable component (a), a light absorber, and a filler . In the film for forming an energy ray curable protective film, the energy ray curable component (a) is preferably uncured, preferably has adhesiveness, and more preferably has uncured and adhesiveness.
[能量線硬化性保護膜形成用組成物(IV-1)]作為較佳的能量線硬化性保護膜形成用組成物可列舉例如含有前述能量線硬化性成分(a)及光吸收劑之能量線硬化性保護膜形成用組成物(IV-1)(本說明書中有時僅簡稱為「組成物(IV-1)」)等。[Composition for forming energy ray curable protective film (IV-1)] As a preferable composition for forming energy ray curable protective film, for example, energy containing the aforementioned energy ray curable component (a) and a light absorber The composition (IV-1) for forming a linear curable protective film (in this specification may be simply referred to as "composition (IV-1)") and the like.
[能量線硬化性成分(a)]能量線硬化性成分(a)係藉由照射能量線而硬化之成分,該成分亦用以對能量線硬化性保護膜形成用膜賦予造膜性或可撓性等,並且於硬化後形成硬質的保護膜。作為能量線硬化性成分(a),可列舉例如:具有能量線硬化性基且重量平均分子量為80000至2000000之聚合物(a1)、及具有能量線硬化性基且分子量為100至80000之化合物(a2)。前述聚合物(a1)可至少一部分藉由交聯劑進行交聯,亦可不進行交聯。[Energy ray curable component (a)] The energy ray curable component (a) is a component that is cured by irradiating energy rays. This component is also used to impart film-forming properties or properties to the film for forming an energy-ray curable protective film. Flexibility, etc., and form a hard protective film after curing. As the energy ray curable component (a), for example, a polymer (a1) having an energy ray curable group and a weight average molecular weight of 80,000 to 2,000,000, and a compound having an energy ray curable group and a molecular weight of 100 to 80,000 can be cited (a2). The aforementioned polymer (a1) may be crosslinked at least partially by a crosslinking agent, or may not be crosslinked.
[具有能量線硬化性基且重量平均分子量為80000至2000000之聚合物(a1)]作為具有能量線硬化性基且重量平均分子量為80000至2000000之聚合物(a1),可列舉例如丙烯酸樹脂(a1-1),係使丙烯酸聚合物(a11)與能量線硬化性化合物(a12)進行反應而成,該丙烯酸聚合物(a11)具有可與其他化合物所具有之基進行反應之官能基,該能量線硬化性化合物(a12)具有與前述官能基進行反應之基及能量線硬化性雙鍵等的能量線硬化性基。[Polymer (a1) having an energy-ray curable group and a weight average molecular weight of 80,000 to 2,000,000] As the polymer (a1) having an energy ray curable group and a weight average molecular weight of 80,000 to 2,000,000, for example, acrylic resin ( a1-1) is formed by reacting an acrylic polymer (a11) with an energy ray curable compound (a12), and the acrylic polymer (a11) has a functional group capable of reacting with groups possessed by other compounds. The energy ray curable compound (a12) has a group that reacts with the aforementioned functional group and an energy ray curable group such as an energy ray curable double bond.
作為可與其他化合物所具有之基進行反應之前述官能基,可列舉例如:羥基、羧基、胺基、取代胺基(胺基之1個或2個氫原子被氫原子以外的基取代而成之基)、環氧基等。其中,就防止晶圓或晶片等的電路腐蝕之方面而言,前述官能基較佳為羧基以外的基。這些之中,前述官能基較佳為羥基。Examples of the aforementioned functional group that can react with groups possessed by other compounds include hydroxyl, carboxyl, amino, and substituted amino (one or two hydrogen atoms of the amino group are substituted with groups other than hydrogen atoms. The base), epoxy and so on. Among them, in terms of preventing corrosion of circuits such as wafers or wafers, the aforementioned functional group is preferably a group other than a carboxyl group. Among these, the aforementioned functional group is preferably a hydroxyl group.
・具有官能基之丙烯酸聚合物(a11)作為具有前述官能基之丙烯酸聚合物(a11),可列舉例如:使具有前述官能基之丙烯酸單體與不具有前述官能基之丙烯酸單體進行共聚而成之共聚物,亦可為除了這些單體以外,進而使丙烯酸單體以外的單體(非丙烯酸單體)進行共聚而成之共聚物。再者,前述丙烯酸聚合物(a11)可為無規共聚物,亦可為嵌段共聚物,關於聚合方法亦可採用公知的方法。・Acrylic polymer (a11) having a functional group As the acrylic polymer (a11) having the aforementioned functional group, for example, an acrylic monomer having the aforementioned functional group and an acrylic monomer not having the aforementioned functional group are copolymerized. The resulting copolymer may also be a copolymer obtained by copolymerizing monomers other than acrylic monomers (non-acrylic monomers) in addition to these monomers. In addition, the aforementioned acrylic polymer (a11) may be a random copolymer or a block copolymer, and a known method may also be adopted for the polymerization method.
作為具有前述官能基之丙烯酸單體,可列舉例如:含羥基之單體、含羧基之單體、含胺基之單體、含取代胺基之單體、含環氧基之單體等。Examples of acrylic monomers having the aforementioned functional groups include hydroxyl group-containing monomers, carboxyl group-containing monomers, amine group-containing monomers, substituted amine group-containing monomers, epoxy group-containing monomers, and the like.
作為前述含羥基之單體,可列舉例如:(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸3-羥基丙酯、(甲基)丙烯酸2-羥基丁酯、(甲基)丙烯酸3-羥基丁酯、(甲基)丙烯酸4-羥基丁酯等的(甲基)丙烯酸羥基烷基酯;乙烯醇、烯丙醇等的非(甲基)丙烯酸不飽和醇(不具有(甲基)丙烯醯基骨架之不飽和醇)等。Examples of the aforementioned hydroxyl-containing monomers include: hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, 3-hydroxypropyl (meth)acrylate Hydroxypropyl (meth)acrylate, 2-hydroxybutyl (meth)acrylate, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate, etc.; vinyl alcohol , Allyl alcohol and other non-(meth)acrylic unsaturated alcohols (unsaturated alcohols without (meth)acrylic acid skeleton), etc.
作為前述含羧基之單體,可列舉例如:(甲基)丙烯酸、丁烯酸等的乙烯性不飽和單羧酸(具有乙烯性不飽和鍵之單羧酸);富馬酸、衣康酸、馬來酸、檸康酸等的乙烯性不飽和二羧酸(具有乙烯性不飽和鍵之二羧酸);前述乙烯性不飽和二羧酸之酐;甲基丙烯酸2-羧基乙酯等的(甲基)丙烯酸羧基烷基酯等。Examples of the aforementioned carboxyl group-containing monomer include ethylenically unsaturated monocarboxylic acids (monocarboxylic acids having ethylenically unsaturated bonds) such as (meth)acrylic acid and crotonic acid; fumaric acid and itaconic acid , Maleic acid, citraconic acid and other ethylenically unsaturated dicarboxylic acids (dicarboxylic acids with ethylenically unsaturated bonds); anhydrides of the aforementioned ethylenically unsaturated dicarboxylic acids; 2-carboxyethyl methacrylate, etc. The (meth) carboxyalkyl acrylate and so on.
具有前述官能基之丙烯酸單體較佳為含羥基之單體。The acrylic monomer having the aforementioned functional group is preferably a hydroxyl-containing monomer.
構成前述丙烯酸聚合物(a11)之具有前述官能基之丙烯酸單體可僅為1種,亦可為2種以上,於為2種以上的情況,這些丙烯酸單體的組合及比率可任意選擇。The acrylic monomer having the aforementioned functional group constituting the aforementioned acrylic polymer (a11) may be only one type, or two or more types. In the case of two or more types, the combination and ratio of these acrylic monomers can be arbitrarily selected.
作為不具有前述官能基之丙烯酸單體,可列舉例如:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯((甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯((甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯((甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯((甲基)丙烯酸硬脂酯)等的構成烷基酯之烷基為碳數為1至18之鏈狀結構之(甲基)丙烯酸烷基酯等。Examples of acrylic monomers that do not have the aforementioned functional group include: methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, isopropyl (meth)acrylate, ( N-Butyl (meth)acrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, tertiary butyl (meth)acrylate, amyl (meth)acrylate, (meth)acrylic acid Hexyl ester, heptyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, n-octyl (meth)acrylate, n-nonyl (meth)acrylate, Isononyl (meth)acrylate, decyl (meth)acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate (lauryl (meth)acrylate), (meth)acrylate Base) tridecyl acrylate, tetradecyl (meth)acrylate (myristyl (meth)acrylate), pentadecyl (meth)acrylate, hexadecyl (meth)acrylate Alkyl esters (palmityl (meth)acrylate), heptadecyl (meth)acrylate, stearyl (meth)acrylate (stearyl (meth)acrylate), etc. The group is an alkyl (meth)acrylate with a chain structure of 1 to 18 carbon atoms.
再者,作為不具有前述官能基之丙烯酸單體,亦可列舉例如:(甲基)丙烯酸甲氧基甲酯、(甲基)丙烯酸甲氧基乙酯、(甲基)丙烯酸乙氧基甲酯、(甲基)丙烯酸乙氧基乙酯等的含烷氧基烷基之(甲基)丙烯酸酯;包含(甲基)丙烯酸苯酯等的(甲基)丙烯酸芳基酯等之具有芳香族基之(甲基)丙烯酸酯;非交聯性之(甲基)丙烯醯胺及其衍生物;(甲基)丙烯酸N,N-二甲胺基乙酯、(甲基)丙烯酸N,N-二甲胺基丙酯等的非交聯性之具有三級胺基之(甲基)丙烯酸酯等。Furthermore, as acrylic monomers that do not have the aforementioned functional groups, for example, methoxymethyl (meth)acrylate, methoxyethyl (meth)acrylate, and ethoxymethyl (meth)acrylate can also be cited. (Meth)acrylates containing alkoxyalkyl groups such as ethoxyethyl (meth)acrylate, etc.; aryl (meth)acrylates containing phenyl (meth)acrylate, etc. have aromatic Group-based (meth)acrylate; non-crosslinkable (meth)acrylamide and its derivatives; (meth)acrylic acid N,N-dimethylaminoethyl, (meth)acrylic acid N, Non-crosslinkable (meth)acrylates with tertiary amino groups such as N-dimethylaminopropyl ester.
構成前述丙烯酸聚合物(a11)之不具有前述官能基之丙烯酸單體可僅為1種,亦可為2種以上,於為2種以上的情況,這些丙烯酸單體的組合及比率可任意選擇。The acrylic monomer that does not have the aforementioned functional group constituting the aforementioned acrylic polymer (a11) may be only one type or two or more types. In the case of two or more types, the combination and ratio of these acrylic monomers can be arbitrarily selected .
作為前述非丙烯酸單體,可列舉例如:乙烯、降冰片烯等烯烴;乙酸乙烯酯;苯乙烯等。構成前述丙烯酸聚合物(a11)之前述非丙烯酸單體可僅為1種,亦可為2種以上,於為2種以上的情況,這些非丙烯酸單體的組合及比率可任意選擇。Examples of the aforementioned non-acrylic monomers include olefins such as ethylene and norbornene; vinyl acetate; styrene and the like. The aforementioned non-acrylic monomer constituting the aforementioned acrylic polymer (a11) may be only one type or two or more types, and in the case of two or more types, the combination and ratio of these non-acrylic monomers can be arbitrarily selected.
前述丙烯酸聚合物(a11)中,由具有前述官能基之丙烯酸單體所衍生之構成單元的量相對於構成該丙烯酸聚合物(a11)之構成單元的總量之比例(含量)較佳為0.1質量%至50質量%,更佳為1質量%至40質量%,特佳為3質量%至30質量%。藉由使前述比例為此般範圍,能夠將藉由前述丙烯酸聚合物(a11)與前述能量線硬化性化合物(a12)之共聚所獲得之前述丙烯酸樹脂(a1-1)中之能量線硬化性基的含量可使保護膜的硬化程度調節至較佳之範圍。In the aforementioned acrylic polymer (a11), the ratio (content) of the amount of structural units derived from the acrylic monomer having the aforementioned functional group to the total amount of structural units constituting the acrylic polymer (a11) is preferably 0.1 Mass% to 50% by mass, more preferably 1% to 40% by mass, particularly preferably 3% to 30% by mass. By setting the aforementioned ratio to this range, the energy-ray curable properties of the acrylic resin (a1-1) obtained by the copolymerization of the aforementioned acrylic polymer (a11) and the aforementioned energy-ray curable compound (a12) can be achieved The content of the base can adjust the degree of hardening of the protective film to a preferable range.
構成前述丙烯酸樹脂(a1-1)之前述丙烯酸聚合物(a11)可僅為1種,亦可為2種以上,於為2種以上的情況,這些丙烯酸聚合物(a11)的組合及比率可任意選擇。The acrylic polymer (a11) constituting the acrylic resin (a1-1) may be only one type or two or more types. In the case of two or more types, the combination and ratio of these acrylic polymers (a11) may be Arbitrary choice.
組成物(IV-1)中,丙烯酸樹脂(a1-1)的含量相對於除溶媒以外的成分的總含量之比例(亦即能量線硬化性保護膜形成用膜中的丙烯酸樹脂(a1-1)的含量相對於前述膜的總質量之比例)較佳為1質量%至70質量%,更佳為5質量%至60質量%,特佳為10質量%至50質量%。In the composition (IV-1), the ratio of the content of the acrylic resin (a1-1) to the total content of the components other than the solvent (that is, the acrylic resin (a1-1) in the film for forming an energy ray curable protective film The ratio of the content of) to the total mass of the aforementioned film) is preferably 1% to 70% by mass, more preferably 5% to 60% by mass, and particularly preferably 10% to 50% by mass.
・能量線硬化性化合物(a12)前述能量線硬化性化合物(a12)較佳為具有選自由異氰酸酯基、環氧基及羧基所組成之群組中的1種或2種以上作為可與前述丙烯酸聚合物(a11)所具有之官能基進行反應之基,更佳為具有異氰酸酯基作為前述基。於前述能量線硬化性化合物(a12)具有例如異氰酸酯基作為前述基之情況,該異氰酸酯基與具有羥基作為前述官能基之丙烯酸聚合物(a11)的該羥基容易進行反應。・Energy ray curable compound (a12) The aforementioned energy ray curable compound (a12) preferably has one or two or more selected from the group consisting of an isocyanate group, an epoxy group, and a carboxyl group. It is more preferable that the functional group of the polymer (a11) reacts with an isocyanate group as the aforementioned group. When the energy ray curable compound (a12) has, for example, an isocyanate group as the group, the isocyanate group and the hydroxyl group of the acrylic polymer (a11) having a hydroxyl group as the functional group easily react.
前述能量線硬化性化合物(a12)於1分子中所具有之前述能量線硬化性基的數量並無特別限定,例如可考慮對目標保護膜所要求之收縮率等物性而適當選擇。例如,前述能量線硬化性化合物(a12)較佳為於1分子中具有1個至5個前述能量線硬化性基,更佳為具有1個至3個。The number of the energy-ray-curable compound (a12) contained in one molecule is not particularly limited. For example, it can be appropriately selected in consideration of physical properties such as shrinkage rate required for the target protective film. For example, the aforementioned energy-ray-curable compound (a12) preferably has 1 to 5 of the aforementioned energy-ray-curable group in one molecule, and more preferably has 1 to 3.
作為前述能量線硬化性化合物(a12),可列舉例如:異氰酸2-甲基丙烯醯氧基乙酯、間-異丙烯基-α,α-二甲基苄基異氰酸酯、甲基丙烯醯基異氰酸酯、異氰酸烯丙酯、異氰酸1,1-(雙丙烯醯氧基甲基)乙酯;藉由二異氰酸酯化合物或多異氰酸酯化合物與(甲基)丙烯酸羥基乙酯之反應所獲得之丙烯醯基單異氰酸酯化合物;藉由二異氰酸酯化合物或多異氰酸酯化合物、多元醇化合物及(甲基)丙烯酸羥基乙酯之反應所獲得之丙烯醯基單異氰酸酯化合物等。這些之中,前述能量線硬化性化合物(a12)較佳為異氰酸2-甲基丙烯醯氧基乙酯。Examples of the energy ray curable compound (a12) include 2-methacryloxyethyl isocyanate, m-isopropenyl-α,α-dimethylbenzyl isocyanate, and methacrylic acid Isocyanate, allyl isocyanate, 1,1-(bisacryloxymethyl) ethyl isocyanate; by the reaction of diisocyanate compound or polyisocyanate compound and hydroxyethyl (meth)acrylate Acrylic monoisocyanate compound obtained; Acrylic monoisocyanate compound obtained by reaction of diisocyanate compound or polyisocyanate compound, polyol compound and hydroxyethyl (meth)acrylate, etc. Among these, the aforementioned energy ray curable compound (a12) is preferably 2-methacryloxyethyl isocyanate.
構成前述丙烯酸樹脂(a1-1)之前述能量線硬化性化合物(a12)可僅為1種,亦可為2種以上,於為2種以上的情況,這些能量線硬化性化合物(a12)的組合及比率可任意選擇。The aforementioned energy ray curable compound (a12) constituting the aforementioned acrylic resin (a1-1) may be only one type or two or more types. In the case of two or more types, these energy ray curable compounds (a12) The combination and ratio can be chosen arbitrarily.
前述丙烯酸樹脂(a1-1)中,源自前述能量線硬化性化合物(a12)之能量線硬化性基的含量相對於源自前述丙烯酸聚合物(a11)之前述官能基的含量之比例較佳為20莫耳%至120莫耳%,更佳為35莫耳%至100莫耳%,特佳為50莫耳%至100莫耳%。藉由使前述含量之比例為此般範圍,能量線硬化性保護膜形成用膜之硬化物的接著力變得更大。此外,於前述能量線硬化性化合物(a12)為一官能(於1分子中具有1個前述基)化合物之情況,前述含量之比例的上限值成為100莫耳%,但於前述能量線硬化性化合物(a12)為多官能(於1分子中具有2個以上之前述基)化合物之情況,則前述含量之比例的上限值有時超過100莫耳%。In the acrylic resin (a1-1), the ratio of the content of the energy ray curable group derived from the energy ray curable compound (a12) to the content of the functional group derived from the acrylic polymer (a11) is preferable It is 20 mol% to 120 mol%, more preferably 35 mol% to 100 mol%, particularly preferably 50 mol% to 100 mol%. By setting the ratio of the aforementioned content in such a range, the adhesive force of the cured product of the film for forming an energy ray curable protective film becomes larger. In addition, in the case where the energy ray curable compound (a12) is a monofunctional (having one group in one molecule) compound, the upper limit of the ratio of the content becomes 100 mol%, but the energy ray curable compound (a12) When the sexual compound (a12) is a polyfunctional (having two or more of the aforementioned groups in one molecule) compound, the upper limit of the ratio of the aforementioned content may exceed 100 mol%.
前述聚合物(a1)的重量平均分子量(Mw)較佳為100000至2000000,更佳為300000至1500000。此處,所謂「重量平均分子量」係如上文所說明。The weight average molecular weight (Mw) of the aforementioned polymer (a1) is preferably 100,000 to 2,000,000, more preferably 300,000 to 1,500,000. Here, the so-called "weight average molecular weight" is as described above.
組成物(IV-1)及能量線硬化性保護膜形成用膜所含有之前述聚合物(a1)可僅為1種,亦可為2種以上,於為2種以上的情況,這些聚合物(a1)的組合及比率可任意選擇。The aforementioned polymer (a1) contained in the composition (IV-1) and the film for forming an energy ray curable protective film may be only one type or two or more types. In the case of two or more types, these polymers The combination and ratio of (a1) can be arbitrarily selected.
[具有能量線硬化性基且分子量為100至80000之化合物(a2)]作為具有能量線硬化性基且分子量為100至80000之化合物(a2)中的前述能量線硬化性基,可列舉包含能量線硬化性雙鍵之基,作為較佳的該基,可列舉(甲基)丙烯醯基、乙烯基等。[Compound (a2) having an energy ray curable group and a molecular weight of 100 to 80,000] As the aforementioned energy ray curable group in a compound (a2) having an energy ray curable group and a molecular weight of 100 to 80,000, examples include energy As the group of the linear hardenable double bond, preferred examples of the group include (meth)acryloyl group and vinyl group.
前述化合物(a2)只要滿足上述條件,則無特別限定,可列舉:具有能量線硬化性基之低分子量化合物、具有能量線硬化性基之環氧樹脂、具有能量線硬化性基之酚樹脂等。The aforementioned compound (a2) is not particularly limited as long as it satisfies the above-mentioned conditions. Examples thereof include low molecular weight compounds having energy ray curable groups, epoxy resins having energy ray curable groups, phenol resins having energy ray curable groups, etc. .
前述化合物(a2)中,作為具有能量線硬化性基之低分子量化合物,可列舉例如多官能之單體或低聚物等,較佳為具有(甲基)丙烯醯基之丙烯酸酯化合物。作為前述丙烯酸酯化合物,可列舉例如:甲基丙烯酸2-羥基-3-(甲基)丙烯醯氧基丙酯、聚乙二醇二(甲基)丙烯酸酯、丙氧基化乙氧基化雙酚A二(甲基)丙烯酸酯、2,2-雙[4-((甲基)丙烯醯氧基聚乙氧基)苯基]丙烷、乙氧基化雙酚A二(甲基)丙烯酸酯、2,2-雙[4-((甲基)丙烯醯氧基二乙氧基)苯基]丙烷、9,9-雙[4-(2-(甲基)丙烯醯氧基乙氧基)苯基]茀、2,2-雙[4-((甲基)丙烯醯氧基聚丙氧基)苯基]丙烷、三環癸烷二甲醇二(甲基)丙烯酸酯、1,10-癸二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯、1,9-壬二醇二(甲基)丙烯酸酯、二丙二醇二(甲基)丙烯酸酯、三丙二醇二(甲基)丙烯酸酯、聚丙二醇二(甲基)丙烯酸酯、聚四亞甲基二醇二(甲基)丙烯酸酯、乙二醇二(甲基)丙烯酸酯、二乙二醇二(甲基)丙烯酸酯、三乙二醇二(甲基)丙烯酸酯、2,2-雙[4-((甲基)丙烯醯氧基乙氧基)苯基]丙烷、新戊二醇二(甲基)丙烯酸酯、乙氧基化聚丙二醇二(甲基)丙烯酸酯、2-羥基-1,3-二(甲基)丙烯醯氧基丙烷等的2官能(甲基)丙烯酸酯;異氰脲酸三(2-(甲基)丙烯醯氧基乙基)酯、ε-己內酯改質異氰脲酸三-(2-(甲基)丙烯醯氧基乙基)酯、乙氧基化甘油三(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、二-三羥甲基丙烷四(甲基)丙烯酸酯、乙氧基化季戊四醇四(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇聚(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯等的多官能(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯低聚物等的多官能(甲基)丙烯酸酯低聚物等。Among the aforementioned compounds (a2), examples of the low-molecular-weight compound having an energy ray-curable group include polyfunctional monomers or oligomers, and preferably acrylate compounds having a (meth)acryloyl group. As the aforementioned acrylate compound, for example, 2-hydroxy-3-(meth)acryloxypropyl methacrylate, polyethylene glycol di(meth)acrylate, propoxylated ethoxylated Bisphenol A di(meth)acrylate, 2,2-bis[4-((meth)acryloyloxypolyethoxy)phenyl]propane, ethoxylated bisphenol A di(methyl) Acrylate, 2,2-bis[4-((meth)acryloyloxydiethoxy)phenyl]propane, 9,9-bis[4-(2-(meth)acryloyloxyethyl Oxy) phenyl] 茀, 2,2-bis[4-((meth)acryloyloxypolypropoxy)phenyl]propane, tricyclodecane dimethanol di(meth)acrylate, 1, 10-decanediol di(meth)acrylate, 1,6-hexanediol di(meth)acrylate, 1,9-nonanediol di(meth)acrylate, dipropylene glycol di(meth) Acrylate, tripropylene glycol di(meth)acrylate, polypropylene glycol di(meth)acrylate, polytetramethylene glycol di(meth)acrylate, ethylene glycol di(meth)acrylate, two Ethylene glycol di(meth)acrylate, triethylene glycol di(meth)acrylate, 2,2-bis[4-((meth)acryloyloxyethoxy)phenyl]propane, new Pentylene glycol di(meth)acrylate, ethoxylated polypropylene glycol di(meth)acrylate, 2-hydroxy-1,3-bis(meth)acryloyloxypropane and other bifunctional (methyl) ) Acrylate; Tris(2-(meth)acryloyloxyethyl) isocyanurate, ε-caprolactone modified isocyanurate tris-(2-(meth)acryloyloxyethyl) Base) ester, ethoxylated glycerol tri(meth)acrylate, pentaerythritol tri(meth)acrylate, trimethylolpropane tri(meth)acrylate, di-trimethylolpropane tetra(methyl) ) Acrylate, ethoxylated pentaerythritol tetra(meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol poly(meth)acrylate, dipentaerythritol hexa(meth)acrylate, etc. Meth)acrylate; (meth)acrylate urethane oligomer and other polyfunctional (meth)acrylate oligomers.
前述化合物(a2)中,作為具有能量線硬化性基之環氧樹脂、具有能量線硬化性基之酚樹脂,可使用例如「日本特開2013-194102號公報」之段落0043等中所記載之樹脂。如此般之樹脂亦相當於構成後述之熱硬化性成分之樹脂,但組成物(IV-1)中視作前述化合物(a2)。Among the aforementioned compounds (a2), as an epoxy resin having an energy ray curable group and a phenol resin having an energy ray curable group, for example, those described in paragraph 0043 of "JP 2013-194102 A" can be used. Resin. Such a resin is also equivalent to the resin constituting the thermosetting component described later, but it is regarded as the aforementioned compound (a2) in the composition (IV-1).
前述化合物(a2)之重量平均分子量較佳為100至30000,更佳為300至10000。The weight average molecular weight of the aforementioned compound (a2) is preferably 100 to 30,000, more preferably 300 to 10,000.
組成物(IV-1)及能量線硬化性保護膜形成用膜所含有之前述化合物(a2)可僅為1種,亦可為2種以上,於為2種以上的情況,這些化合物(a2)的組合及比率可任意選擇。The aforementioned compound (a2) contained in the composition (IV-1) and the film for forming an energy ray curable protective film may be only one type or two or more types. In the case of two or more types, these compounds (a2) ) The combination and ratio can be selected arbitrarily.
[不具有能量線硬化性基之聚合物(b)]於組成物(IV-1)及能量線硬化性保護膜形成用膜含有前述化合物(a2)作為前述能量線硬化性成分(a)之情況,較佳為亦進一步地含有不具有能量線硬化性基之聚合物(b)。前述聚合物(b)可至少一部分藉由交聯劑進行交聯,亦可不進行交聯。[Polymer without energy ray curable group (b)] The composition (IV-1) and the film for forming an energy ray curable protective film contain the aforementioned compound (a2) as the aforementioned energy ray curable component (a) In this case, it is preferable to further contain a polymer (b) that does not have an energy-ray curable group. The aforementioned polymer (b) may be crosslinked at least partially by a crosslinking agent, or may not be crosslinked.
作為不具有能量線硬化性基之聚合物(b),可列舉例如:丙烯酸聚合物、苯氧基樹脂、胺基甲酸酯樹脂、聚酯、橡膠系樹脂、丙烯酸胺基甲酸酯樹脂等。這些之中,前述聚合物(b)較佳為丙烯酸聚合物(以下有時簡稱為「丙烯酸聚合物(b-1)」)。Examples of the polymer (b) that does not have an energy-ray curable group include acrylic polymers, phenoxy resins, urethane resins, polyesters, rubber-based resins, acrylic urethane resins, etc. . Among these, the aforementioned polymer (b) is preferably an acrylic polymer (hereinafter sometimes simply referred to as "acrylic polymer (b-1)").
丙烯酸聚合物(b-1)可為公知的聚合物,可為例如1種丙烯酸單體之均聚物,亦可為2種以上之丙烯酸單體之共聚物,亦可為1種或2種以上之丙烯酸單體與1種或2種以上之丙烯酸單體以外的單體(非丙烯酸單體)之共聚物。The acrylic polymer (b-1) may be a known polymer, for example, a homopolymer of one acrylic monomer, or a copolymer of two or more acrylic monomers, or one or two A copolymer of the above acrylic monomers and one or more monomers other than acrylic monomers (non-acrylic monomers).
作為構成丙烯酸聚合物(b-1)之前述丙烯酸單體,可列舉例如:(甲基)丙烯酸烷基酯、具有環狀骨架之(甲基)丙烯酸酯、含縮水甘油基之(甲基)丙烯酸酯、含羥基之(甲基)丙烯酸酯、含取代胺基之(甲基)丙烯酸酯等。此處所謂「取代胺基」係如上文所說明。Examples of the aforementioned acrylic monomers constituting the acrylic polymer (b-1) include alkyl (meth)acrylates, (meth)acrylates having a cyclic skeleton, and (meth) glycidyl groups. Acrylate, hydroxyl-containing (meth)acrylate, substituted amino group-containing (meth)acrylate, etc. The "substituted amino group" referred to herein is as described above.
作為前述(甲基)丙烯酸烷基酯,可列舉例如與上文說明之構成丙烯酸聚合物(a11)之不具有前述官能基之丙烯酸單體(構成烷基酯之烷基為碳數為1至18之鏈狀結構之(甲基)丙烯酸烷基酯等)相同的化合物。As the aforementioned (meth)acrylic acid alkyl esters, for example, the acrylic monomers that do not have the aforementioned functional groups that constitute the acrylic polymer (a11) described above (the alkyl groups constituting the alkyl esters have a carbon number of 1 to The chain structure of 18 (meth)acrylic acid alkyl ester etc.) is the same compound.
作為前述具有環狀骨架之(甲基)丙烯酸酯,可列舉例如:(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯等的(甲基)丙烯酸環烷基酯;(甲基)丙烯酸苄酯等的(甲基)丙烯酸芳烷基酯;(甲基)丙烯酸二環戊烯酯等的(甲基)丙烯酸環烯酯;(甲基)丙烯酸二環戊烯氧基乙酯等的(甲基)丙烯酸環烯氧基烷基酯等。Examples of (meth)acrylates having a cyclic skeleton include cycloalkyl (meth)acrylates such as isobornyl (meth)acrylate and dicyclopentyl (meth)acrylate; (Meth)acrylic acid aralkyl ester such as benzyl acrylate; (meth)acrylic acid cycloalkenyl ester such as dicyclopentenyl (meth)acrylate; (meth)acrylic acid dicyclopentenyloxy ethyl Cycloalkenyloxyalkyl (meth)acrylates such as esters and the like.
作為前述含縮水甘油基之(甲基)丙烯酸酯,可列舉例如(甲基)丙烯酸縮水甘油酯等。作為前述含羥基之(甲基)丙烯酸酯,可列舉例如:(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸3-羥基丙酯、(甲基)丙烯酸2-羥基丁酯、(甲基)丙烯酸3-羥基丁酯、(甲基)丙烯酸4-羥基丁酯等。作為前述含取代胺基之(甲基)丙烯酸酯,可列舉例如(甲基)丙烯酸N-甲基胺基乙酯等。As said glycidyl group-containing (meth)acrylate, glycidyl (meth)acrylate etc. are mentioned, for example. Examples of the aforementioned hydroxyl-containing (meth)acrylate include: hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, (meth) ) 3-hydroxypropyl acrylate, 2-hydroxybutyl (meth)acrylate, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate, etc. Examples of the aforementioned substituted amino group-containing (meth)acrylate include N-methylaminoethyl (meth)acrylate and the like.
作為構成丙烯酸聚合物(b-1)之前述非丙烯酸單體,可列舉例如:乙烯、降冰片烯等的烯烴;乙酸乙烯酯;苯乙烯等。Examples of the non-acrylic monomer constituting the acrylic polymer (b-1) include olefins such as ethylene and norbornene; vinyl acetate; styrene and the like.
作為至少一部分藉由交聯劑進行交聯且不具有前述能量線硬化性基之聚合物(b),可列舉例如前述聚合物(b)中的反應性官能基與交聯劑進行反應而成之聚合物。前述反應性官能基對應於交聯劑的種類等適當選擇即可,並無特別限定。例如,於交聯劑為多異氰酸酯化合物之情況,作為前述反應性官能基,可列舉羥基、羧基、胺基等,這些之中,較佳為與異氰酸酯基之反應性高之羥基。再者,於交聯劑為環氧化合物之情況,作為前述反應性官能基,可列舉羧基、胺基、醯胺基等,這些之中,較佳為與環氧基之反應性高之羧基。其中,就防止晶圓或晶片的電路腐蝕之方面而言,前述反應性官能基較佳為羧基以外的基。As a polymer (b) which is cross-linked at least partly by a cross-linking agent and does not have the aforementioned energy ray curable group, for example, a reactive functional group in the aforementioned polymer (b) reacts with a cross-linking agent.的polymers. The aforementioned reactive functional group may be appropriately selected in accordance with the type of crosslinking agent and the like, and is not particularly limited. For example, when the crosslinking agent is a polyisocyanate compound, as the aforementioned reactive functional group, a hydroxyl group, a carboxyl group, an amino group, etc. can be exemplified. Among these, a hydroxyl group having high reactivity with an isocyanate group is preferred. Furthermore, when the crosslinking agent is an epoxy compound, the reactive functional group may include a carboxyl group, an amino group, an amide group, etc. Among these, a carboxyl group having high reactivity with an epoxy group is preferred. . Among them, in terms of preventing corrosion of the wafer or the circuit of the wafer, the reactive functional group is preferably a group other than a carboxyl group.
作為具有前述反應性官能基且不具有能量線硬化性基之聚合物(b),可列舉例如:至少使具有前述反應性官能基之單體進行聚合而獲得之聚合物。若為丙烯酸聚合物(b-1)之情況,作為構成該丙烯酸聚合物(b-1)之單體所列舉之前述丙烯酸單體及非丙烯酸單體之任一者或兩者,係使用具有前述反應性官能基之單體即可。作為具有羥基來作為反應性官能基之前述聚合物(b),可列舉例如使含羥基之(甲基)丙烯酸酯進行聚合而獲得之聚合物,除此之外,亦可列舉使上文所列舉之前述丙烯酸單體或非丙烯酸單體中1個或2個以上之氫原子被前述反應性官能基取代而成之單體進行聚合而獲得之聚合物。As a polymer (b) which has the said reactive functional group and does not have an energy-ray curable group, the polymer obtained by polymerizing at least the monomer which has the said reactive functional group is mentioned, for example. In the case of acrylic polymer (b-1), any one or both of the aforementioned acrylic monomers and non-acrylic monomers listed as monomers constituting the acrylic polymer (b-1) are used with The monomer of the aforementioned reactive functional group may be sufficient. As the aforementioned polymer (b) having a hydroxyl group as a reactive functional group, for example, a polymer obtained by polymerizing a hydroxyl group-containing (meth)acrylate may be mentioned. In addition, the above-mentioned polymer (b) may also be mentioned. A polymer obtained by polymerizing a monomer in which one or more hydrogen atoms of the aforementioned acrylic monomer or non-acrylic monomer is substituted by the aforementioned reactive functional group.
具有反應性官能基之前述聚合物(b)中,由具有反應性官能基之單體所衍生之構成單元的量相對於構成該聚合物(b)之構成單元的總量之比例(含量)較佳為1質量%至20質量%,更佳為2質量%至10質量%。藉由使前述比例為此般範圍,前述聚合物(b)中,交聯程度成為更佳的範圍。In the aforementioned polymer (b) having a reactive functional group, the ratio (content) of the amount of constituent units derived from a monomer having a reactive functional group to the total amount of constituent units constituting the polymer (b) It is preferably 1% by mass to 20% by mass, more preferably 2% by mass to 10% by mass. By setting the aforementioned ratio to this range, the degree of crosslinking in the aforementioned polymer (b) becomes a more preferable range.
就組成物(IV-1)的造膜性變得更良好之方面而言,不具有能量線硬化性基之聚合物(b)的重量平均分子量(Mw)較佳為10000至2000000,更佳為100000至1500000。此處所謂「重量平均分子量」係如上文所說明。In terms of the film forming properties of the composition (IV-1) becoming better, the weight average molecular weight (Mw) of the polymer (b) that does not have an energy ray curable group is preferably 10,000 to 2,000,000, more preferably Between 100,000 and 1,500,000. The "weight average molecular weight" referred to herein is as described above.
組成物(IV-1)及能量線硬化性保護膜形成用膜所含有之不具有能量線硬化性基之聚合物(b)可僅為1種,亦可為2種以上,於為2種以上的情況,這些不具有能量線硬化性基之聚合物(b)的組合及比率可任意選擇。The composition (IV-1) and the polymer (b) that does not have an energy ray curable group contained in the film for forming an energy ray curable protective film may be only one type, or two or more types, or two types In the above case, the combination and ratio of these polymers (b) which do not have an energy-ray curable group can be arbitrarily selected.
作為組成物(IV-1),可列舉含有前述聚合物(a1)及前述化合物(a2)之任一者或兩者之組成物。並且,於組成物(IV-1)含有前述化合物(a2)之情況,較佳為亦進一步地含有不具有能量線硬化性基之聚合物(b),於該情況,亦較佳為進一步地含有前述聚合物(a1)。再者,組成物(IV-1)亦可不含有前述化合物(a2),而一併含有前述聚合物(a1)及不具有能量線硬化性基之聚合物(b)。As the composition (IV-1), a composition containing either or both of the aforementioned polymer (a1) and aforementioned compound (a2) can be cited. In addition, when the composition (IV-1) contains the aforementioned compound (a2), it is preferable to further contain a polymer (b) that does not have an energy-ray curable group. In this case, it is also preferable to further Contains the aforementioned polymer (a1). Furthermore, the composition (IV-1) may not contain the aforementioned compound (a2), but may contain the aforementioned polymer (a1) and a polymer (b) that does not have an energy-ray curable group together.
於組成物(IV-1)含有前述聚合物(a1)、前述化合物(a2)及不具有能量線硬化性基之聚合物(b)之情況,組成物(IV-1)中,前述化合物(a2)的含量相對於前述聚合物(a1)及不具有能量線硬化性基之聚合物(b)的總含量100質量份,較佳為10質量份至400質量份,更佳為30質量份至350質量份。In the case where the composition (IV-1) contains the aforementioned polymer (a1), the aforementioned compound (a2), and the polymer (b) without an energy-ray curable group, in the composition (IV-1), the aforementioned compound ( The content of a2) is relative to 100 parts by mass of the total content of the aforementioned polymer (a1) and polymer (b) without energy ray curable groups, preferably 10 parts by mass to 400 parts by mass, more preferably 30 parts by mass To 350 parts by mass.
組成物(IV-1)中,前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的合計含量相對於除溶媒以外的成分的總含量之比例(亦即能量線硬化性保護膜形成用膜中的前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的合計含量相對於前述膜的總質量之比例)較佳為5質量%至90質量%,更佳為10質量%至80質量%,特佳為20質量%至70質量%。藉由使能量線硬化性成分的含量之前述比例為此般範圍,能量線硬化性保護膜形成用膜的能量線硬化性變得更良好。In the composition (IV-1), the ratio of the total content of the aforementioned energy ray curable component (a) and polymer (b) without energy ray curable group to the total content of components other than the solvent (ie The ratio of the total content of the aforementioned energy-ray-curable component (a) and the polymer (b) not having an energy-ray-curable group to the total mass of the aforementioned film in the film for forming an energy-ray curable protective film is preferably 5 mass% to 90 mass%, more preferably 10 mass% to 80 mass%, particularly preferably 20 mass% to 70 mass%. By setting the aforementioned ratio of the content of the energy ray curable component to this range, the energy ray curability of the film for forming an energy ray curable protective film becomes more favorable.
[光吸收劑]前述光吸收劑係在存在於保護膜中的狀態下藉由吸收光而容易使保護膜之溫度上升的成分。藉由組成物(IV-1)及能量線硬化性保護膜形成用膜含有光吸收劑,保護膜之Xmax 變得更大,而更容易使Z150 及Z200 變大。[Light Absorber] The aforementioned light absorber is a component that absorbs light in a state where it is present in the protective film to easily increase the temperature of the protective film. When the composition (IV-1) and the film for forming an energy ray curable protective film contain a light absorber, the X max of the protective film becomes larger, and it is easier to enlarge Z 150 and Z 200.
組成物(IV-1)及能量線硬化性保護膜形成用膜所含有之前述光吸收劑與如上文所說明之組成物(III-1)及熱硬化性保護膜形成用膜所含有之光吸收劑(I)相同。The light absorber contained in the composition (IV-1) and the film for forming an energy ray curable protective film, and the light contained in the composition (III-1) and the film for forming a thermosetting protective film as described above The absorbent (I) is the same.
組成物(IV-1)及能量線硬化性保護膜形成用膜之含有光吸收劑的態樣可與組成物(III-1)及熱硬化性保護膜形成用膜之含有光吸收劑(I)的態樣相同。The composition (IV-1) and the form of the film for forming an energy ray curable protective film containing the light absorber can be combined with the composition (III-1) and the form of the film for forming a thermosetting protective film containing the light absorber (I ) Is the same.
例如,組成物(IV-1)及能量線硬化性保護膜形成用膜所含有之光吸收劑較佳為可吸收可見光及紅外線之任一者或兩者。For example, the light absorber contained in the composition (IV-1) and the film for forming an energy ray curable protective film is preferably capable of absorbing either or both of visible light and infrared light.
組成物(IV-1)及能量線硬化性保護膜形成用膜所含有之光吸收劑可僅為1種,亦可為2種以上,於為2種以上的情況,這些光吸收劑的組合及比率可任意選擇。例如,組成物(IV-1)及能量線硬化性保護膜形成用膜可僅含有有機色素1種或2種以上,亦可僅含有無機顔料1種或2種以上,亦可一併含有有機色素及無機顔料1種或2種以上作為光吸收劑。The light absorbing agent contained in the composition (IV-1) and the film for forming an energy ray curable protective film may be only one type or two or more types. In the case of two or more types, a combination of these light absorbing agents And the ratio can be chosen arbitrarily. For example, the composition (IV-1) and the film for forming an energy ray curable protective film may contain only one or two or more organic pigments, or only one or two or more inorganic pigments, or a combination of organic pigments. One or more of pigments and inorganic pigments are used as light absorbers.
組成物(IV-1)及能量線硬化性保護膜形成用膜較佳為含有2種以上的可吸收可見光及紅外線之任一者或兩者的光吸收劑,更佳為含有2種至7種。The composition (IV-1) and the film for forming an energy ray curable protective film preferably contain two or more kinds of light absorbers that can absorb either or both of visible light and infrared rays, and more preferably contain two to seven kinds of light absorbers. Kind.
組成物(IV-1)及能量線硬化性保護膜形成用膜於含有無機顔料作為光吸收劑的情況,較佳為含有碳材料,更佳為一併含有碳材料及有機色素。When the composition (IV-1) and the film for forming an energy ray curable protective film contain an inorganic pigment as a light absorber, it is preferable to contain a carbon material, and it is more preferable to contain a carbon material and an organic pigment together.
組成物(IV-1)中,光吸收劑之含量相對於除溶媒以外之全部成分之總含量的比例(亦即,能量線硬化性保護膜形成用膜中的光吸收劑之含量相對於能量線硬化性保護膜形成用膜之總質量的比例)可為0.1質量%至20質量%。藉由使前述比例為前述下限值以上,能更明顯地獲得使用光吸收劑所帶來之效果。藉由使前述比例為前述上限值以下,能抑制使用過量的光吸收劑。In the composition (IV-1), the ratio of the content of the light absorber to the total content of all ingredients except the solvent (that is, the content of the light absorber in the film for forming an energy ray curable protective film relative to the energy The ratio) of the total mass of the film for forming a linear curable protective film may be 0.1% by mass to 20% by mass. By making the aforementioned ratio more than the aforementioned lower limit value, the effect of using the light absorber can be more clearly obtained. By making the aforementioned ratio below the aforementioned upper limit value, it is possible to suppress the use of excessive light absorbers.
組成物(IV-1)及能量線硬化性保護膜形成用膜亦可對應於目的,而含有不相當於前述能量線硬化性成分(a)、前述聚合物(b)、前述光吸收劑之任一種而為選自由熱硬化性成分、填充材料、偶合劑、交聯劑、光聚合起始劑及通用添加劑所構成之群組中的1種或2種以上。The composition (IV-1) and the film for forming an energy ray curable protective film may also correspond to the purpose, and may contain one that does not correspond to the energy ray curable component (a), the polymer (b), and the light absorber. Any one is one or two or more selected from the group consisting of thermosetting components, fillers, coupling agents, crosslinking agents, photopolymerization initiators, and general additives.
作為組成物(IV-1)中之前述熱硬化性成分、填充材料、偶合劑、交聯劑、光聚合起始劑及通用添加劑可分別列舉與組成物(III-1)中之熱硬化性成分(B)、填充材料(D)、偶合劑(E)、交聯劑(F)、光聚合起始劑(H)及通用添加劑(J)相同之化合物。As the aforementioned thermosetting components, fillers, coupling agents, crosslinking agents, photopolymerization initiators, and general additives in the composition (IV-1), the thermosetting components in the composition (III-1) can be listed respectively. Compounds with the same components (B), filler (D), coupling agent (E), crosslinking agent (F), photopolymerization initiator (H) and general additives (J).
例如,於組成物(IV-1)含有熱硬化性成分的情況,藉由使用如此般的組成物(IV-1),所形成之能量線硬化性保護膜形成用膜可藉由加熱而提高對被接著體的接著力,由該能量線硬化性保護膜形成用膜所形成之保護膜的強度亦提升。For example, when the composition (IV-1) contains a thermosetting component, by using such a composition (IV-1), the formed film for forming an energy ray curable protective film can be enhanced by heating The adhesive force to the adherend is also improved in the strength of the protective film formed by the film for forming the energy ray curable protective film.
組成物(IV-1)中,前述熱硬化性成分、填充材料、偶合劑、交聯劑、光聚合起始劑及通用添加劑分別可單獨使用1種,亦可併用2種以上,於併用2種以上的情況,這些的組合及比率可任意選擇。In the composition (IV-1), the aforementioned thermosetting components, fillers, coupling agents, crosslinking agents, photopolymerization initiators, and general additives may be used singly, or two or more of them may be used in combination. In the case of more than one type, the combination and ratio of these can be arbitrarily selected.
組成物(IV-1)中之前述熱硬化性成分、填充材料、偶合劑、交聯劑、光聚合起始劑及通用添加劑的含量對應於目的而適當調節即可,並無特別限定。The content of the aforementioned thermosetting component, filler, coupling agent, crosslinking agent, photopolymerization initiator, and general additives in the composition (IV-1) may be appropriately adjusted according to the purpose, and is not particularly limited.
就藉由稀釋而提高該組成物之操作性而言,組成物(IV-1)較佳為進一步地含有溶媒。作為組成物(IV-1)所含有之溶媒,可列舉例如與組成物(III-1)中之溶媒相同的溶媒。組成物(IV-1)所含有之溶媒可僅為1種,亦可為2種以上。組成物(IV-1)之溶媒的含量並無特別限定,例如對應於除溶媒以外的成分之種類而適當選擇即可。In terms of improving the operability of the composition by dilution, the composition (IV-1) preferably further contains a solvent. Examples of the solvent contained in the composition (IV-1) include the same solvents as the solvent in the composition (III-1). The solvent contained in the composition (IV-1) may be only one type or two or more types. The content of the solvent of the composition (IV-1) is not particularly limited, and may be appropriately selected in accordance with the types of components other than the solvent, for example.
[能量線硬化性保護膜形成用組成物之製造方法]組成物(IV-1)等的能量線硬化性保護膜形成用組成物藉由調配用以構成該組成物之各成分而獲得。能量線硬化性保護膜形成用組成物例如除了調配成分之種類不同的方面以外,能夠利用與上文說明之熱硬化性保護膜形成用組成物的情況相同的方法進行製造。[Method for producing composition for forming energy ray curable protective film] The composition for forming an energy ray curable protective film, such as the composition (IV-1), is obtained by blending the components constituting the composition. The composition for forming an energy ray-curable protective film can be manufactured by the same method as the case of the composition for forming a thermosetting protective film described above, except for the difference in the types of ingredients.
◎非硬化性保護膜形成用膜作為較佳的非硬化性保護膜形成用膜可列舉例如含有熱塑性樹脂、光吸收劑及填充材料之膜。◎ Film for forming a non-curable protective film As a preferable film for forming a non-curable protective film, for example, a film containing a thermoplastic resin, a light absorber, and a filler can be cited.
[非硬化性保護膜形成用組成物(V-1)]作為較佳的非硬化性保護膜形成用組成物可列舉例如含有前述熱塑性樹脂、光吸收劑及填充材料的非硬化性保護膜形成用組成物(V-1)(本說明書中有時僅稱為「組成物(V-1)」)等。[Composition for forming a non-curable protective film (V-1)] A preferable composition for forming a non-curable protective film includes, for example, the formation of a non-curing protective film containing the aforementioned thermoplastic resin, light absorber, and filler Use the composition (V-1) (in this specification, it may only be referred to as the "composition (V-1)") and the like.
[熱塑性樹脂]前述熱塑性樹脂並無特別限定。作為前述熱塑性樹脂,更具體而言,可列舉例如與作為上述之組成物(III-1)的含有成分所列舉之丙烯酸樹脂、聚酯、聚胺基甲酸酯、苯氧基樹脂、聚丁烯、聚丁二烯、聚苯乙烯等的非硬化性之樹脂相同的樹脂。[Thermoplastic resin] The aforementioned thermoplastic resin is not particularly limited. As the aforementioned thermoplastic resins, more specifically, for example, acrylic resins, polyesters, polyurethanes, phenoxy resins, and polybutylene resins listed as components of the above-mentioned composition (III-1) can be cited. Non-curable resins such as olefin, polybutadiene, polystyrene, etc. are the same resins.
組成物(V-1)及非硬化性保護膜形成用膜所含有之前述熱塑性樹脂可僅為1種,亦可為2種以上,於為2種以上的情況,這些熱塑性樹脂的組合及比率可任意選擇。The aforementioned thermoplastic resin contained in the composition (V-1) and the film for forming a non-curable protective film may be only one type or two or more types. In the case of two or more types, the combination and ratio of these thermoplastic resins Can be chosen arbitrarily.
組成物(V-1)中,前述熱塑性樹脂之含量相對於除溶媒以外之成分之總含量的比例(亦即非硬化性保護膜形成用膜中之前述熱塑性樹脂之含量相對於非硬化性保護膜形成用膜之總質量的比例)較佳為25質量%至75質量%。In the composition (V-1), the ratio of the content of the aforementioned thermoplastic resin to the total content of the components other than the solvent (that is, the content of the aforementioned thermoplastic resin in the film for forming a non-curable protective film relative to the non-curable protective film The ratio of the total mass of the film for film formation) is preferably 25% by mass to 75% by mass.
[光吸收劑]前述光吸收劑係在存在於保護膜中的狀態下藉由吸收光而容易使保護膜之溫度上升的成分。藉由組成物(V-1)及非硬化性保護膜形成用膜含有光吸收劑,保護膜之Xmax 變得更大,而更容易使Z150 及Z200 變大。[Light Absorber] The aforementioned light absorber is a component that absorbs light in a state where it is present in the protective film to easily increase the temperature of the protective film. When the composition (V-1) and the non-curable protective film forming film contain a light absorber, the X max of the protective film becomes larger, and it is easier to enlarge Z 150 and Z 200.
組成物(V-1)及非硬化性保護膜形成用膜所含有之前述光吸收劑為與上文說明之組成物(III-1)及熱硬化性保護膜形成用膜所含有之光吸收劑(I)相同。The aforementioned light absorber contained in the composition (V-1) and the film for forming a non-curable protective film is the same as the light absorber contained in the above-described composition (III-1) and the film for forming a thermosetting protective film The agent (I) is the same.
組成物(V-1)及非硬化性保護膜形成用膜之含有光吸收劑的態樣亦可與組成物(III-1)及熱硬化性保護膜形成用膜之含有光吸收劑(I)的態樣相同。The composition (V-1) and the non-curable protective film forming film containing the light absorber can also be combined with the composition (III-1) and the thermosetting protective film forming film containing the light absorber (I ) Is the same.
例如,組成物(V-1)及非硬化性保護膜形成用膜所含有之光吸收劑較佳為可吸收可見光及紅外線之任一者或兩者。For example, the light absorber contained in the composition (V-1) and the film for forming a non-curable protective film is preferably capable of absorbing either or both of visible light and infrared light.
組成物(V-1)及非硬化性保護膜形成用膜所含有之光吸收劑可僅為1種,亦可為2種以上,於為2種以上的情況,這些光吸收劑的組合及比率可任意選擇。例如,組成物(V-1)及非硬化性保護膜形成用膜可僅含有有機色素1種或2種以上,亦可僅含有無機顔料1種或2種以上,亦可一併含有有機色素及無機顔料1種或2種以上作為光吸收劑。The composition (V-1) and the non-curable protective film forming film may contain only one type of light absorber, or two or more types. In the case of two or more types, the combination of these light absorbers and The ratio can be selected arbitrarily. For example, the composition (V-1) and the film for forming a non-curable protective film may contain only one or two or more organic pigments, or only one or two or more inorganic pigments, or a combination of organic pigments. And one or two or more kinds of inorganic pigments as light absorbers.
組成物(V-1)及非硬化性保護膜形成用膜較佳為含有2種以上的可吸收可見光及紅外線之任一者或兩者的光吸收劑,較佳為含有2種至7種。The composition (V-1) and the film for forming a non-curable protective film preferably contain two or more kinds of light absorbers that can absorb either or both of visible light and infrared rays, and preferably contain 2 to 7 kinds of light absorbers .
組成物(V-1)及非硬化性保護膜形成用膜於含有無機顔料作為光吸收劑的情況,較佳為含有碳材料,更佳為一併含有碳材料及有機色素。When the composition (V-1) and the film for forming a non-curable protective film contain an inorganic pigment as a light absorber, it is preferable to contain a carbon material, and it is more preferable to contain a carbon material and an organic pigment together.
組成物(V-1)中,光吸收劑之含量相對於除溶媒以外之全部成分之總含量的比例(亦即,非硬化性保護膜形成用膜中之光吸收劑之含量相對於非硬化性保護膜形成用膜之總質量的比例)可為0.1質量%至20質量%。藉由使前述比例為前述下限值以上,能更明顯地獲得使用光吸收劑所帶來之效果。藉由使前述比例為前述上限值以下,能抑制使用過量之光吸收劑。In the composition (V-1), the ratio of the content of the light absorbing agent to the total content of all ingredients except the solvent (that is, the content of the light absorbing agent in the film for forming a non-curing protective film relative to the non-curing The ratio) of the total mass of the film for forming a protective film may be 0.1% by mass to 20% by mass. By making the aforementioned ratio more than the aforementioned lower limit value, the effect of using the light absorber can be more clearly obtained. By making the aforementioned ratio below the aforementioned upper limit, it is possible to suppress the use of excessive light absorbers.
[填充材料]含有填充材料之非硬化性保護膜形成用膜係發揮與含有填充材料(D)之熱硬化性保護膜形成用膜同樣的效果。[Filling material] The film system for forming a non-curable protective film containing a filler exerts the same effect as the film for forming a thermosetting protective film containing a filler (D).
作為組成物(V-1)及非硬化性保護膜形成用膜所含有之填充材料,可列舉與組成物(III-1)及熱硬化性保護膜形成用膜所含有之填充材料(D)相同的化合物。Examples of the filler contained in the composition (V-1) and the film for forming a non-curable protective film include the filler (D) contained in the composition (III-1) and the film for forming a thermosetting protective film The same compound.
組成物(V-1)及非硬化性保護膜形成用膜所含有之填充材料可僅為1種,亦可為2種以上,於為2種以上的情況,這些填充材料的組合及比率可任意選擇。The filler material contained in the composition (V-1) and the film for forming a non-curable protective film may be only one type or two or more types. In the case of two or more types, the combination and ratio of these filler materials may be Arbitrary choice.
組成物(V-1)中,填充材料之含量相對於除溶媒以外的全部成分之總含量的比例(亦即,非硬化性保護膜形成用膜中的填充材料之含量相對於非硬化性保護膜形成用膜之總質量的比例)較佳為25質量%至75質量%。藉由使前述比例為此般範圍,與使用組成物(III-1)之情況同樣地,調整非硬化性保護膜形成用膜(亦即保護膜)的熱膨脹係數變得更容易。In the composition (V-1), the ratio of the content of the filler to the total content of all ingredients except the solvent (that is, the content of the filler in the film for forming a non-curing protective film relative to the content of the non-curing protective film The ratio of the total mass of the film for film formation) is preferably 25% by mass to 75% by mass. By setting the aforementioned ratio to such a range, as in the case of using the composition (III-1), it becomes easier to adjust the thermal expansion coefficient of the film for forming a non-curable protective film (that is, the protective film).
組成物(V-1)亦可對應於目的,而含有不相當於前述熱塑性樹脂、前述光吸收劑、前述填充材料之任一種的其他成分。前述其他成分並無特別限定,可對應於目的而任意選擇。The composition (V-1) may correspond to the purpose, and may contain other components that do not correspond to any of the thermoplastic resin, the light absorber, and the filler. The aforementioned other components are not particularly limited, and can be arbitrarily selected according to the purpose.
組成物(V-1)中,前述其他成分可單獨使用1種,亦可併用2種以上,於併用2種以上之情況,這些其他成分的組合及比率可任意選擇。In the composition (V-1), the aforementioned other components may be used alone or in combination of two or more types. When two or more types are used in combination, the combination and ratio of these other components can be arbitrarily selected.
組成物(V-1)中的前述其他成分的含量對應於目的適當調節即可,並無特別限定。The content of the aforementioned other components in the composition (V-1) may be appropriately adjusted according to the purpose, and is not particularly limited.
就藉由稀釋而提高該組成物之操作性而言,組成物(V-1)較佳為進一步地含有溶媒。 作為組成物(V-1)所含有之溶媒可列舉例如與上述組成物(III-1)中之溶媒相同的溶媒。組成物(V-1)所含有之溶媒可僅為1種,亦可為2種以上。組成物(V-1)之溶媒之含量並無特別限定,例如對應於除溶媒以外之成分之種類而適當選擇即可。In terms of improving the operability of the composition by dilution, the composition (V-1) preferably further contains a solvent. Examples of the solvent contained in the composition (V-1) include the same solvents as the solvent in the above-mentioned composition (III-1). The solvent contained in the composition (V-1) may be only one type or two or more types. The content of the solvent in the composition (V-1) is not particularly limited. For example, it may be appropriately selected in accordance with the types of components other than the solvent.
[非硬化性保護膜形成用組成物之製造方法]組成物(V-1)等之非硬化性保護膜形成用組成物係藉由調配用以構成該組成物之各成分而獲得。非硬化性保護膜形成用組成物例如除了調配成分的種類不同之方面以外,可利用與上文說明之熱硬化性保護膜形成用組成物之情形相同的方法進行製造。[Method for producing composition for forming non-curable protective film] The composition for forming a non-curable protective film, such as the composition (V-1), is obtained by blending the components that constitute the composition. The composition for forming a non-curable protective film, for example, can be manufactured by the same method as the case of the composition for forming a thermosetting protective film described above, except for the difference in the types of ingredients.
圖1係以示意方式顯示本發明一實施形態相關的保護膜形成用膜的一例之剖面圖。此外,以下說明所使用之圖式為了易於瞭解本發明之特徴,基於方便起見有將作為重要部分之部分加以放大顯示的情況,各構成要素之尺寸比率等並不限於與實際情況相同之情況。Fig. 1 is a cross-sectional view schematically showing an example of a film for forming a protective film according to an embodiment of the present invention. In addition, the drawings used in the following descriptions are used to make it easier to understand the characteristics of the present invention. For convenience, the important parts may be enlarged and displayed, and the size ratio of each component is not limited to the case where it is the same as the actual situation. .
此處所示之保護膜形成用膜13係在該保護膜形成用膜13之一面(本說明書中有時稱為「第1面」)13a上具備第1剝離膜151,在相對於前述第1面13a為相反側之另一面(本說明書中有時稱為「第2面」)13b上具備第2剝離膜152。如此般之保護膜形成用膜13例如適於作為輥狀而加以保存。The protective
保護膜形成用膜13具有上述特性。保護膜形成用膜13可使用上述保護膜形成用組成物來形成。The
第1剝離膜151及第2剝離膜152之任一者可為公知之膜。第1剝離膜151及第2剝離膜152可為彼此相同之膜,亦可為例如自膜狀接著劑13剝離時所需之剝離力彼此不同等彼此不同之膜。Any one of the
圖1所示之保護膜形成用膜13移除第1剝離膜151及第2剝離膜152之任一者,而使產生之露出面成為貼附於晶圓(省略圖示)之內面之面。並且,移除第1剝離膜151及第2剝離膜152剩下的另一者,而使產生之露出面成為後述之支撐片或切割片(本說明書中亦有時稱為「切割帶」)之貼附面。例如,於前述第1面13a為貼附於晶圓之內面之面的情況,則前述第2面13b為支撐片或切割片之貼附面。The protective
圖1中,雖顯示剝離膜設置於保護膜形成用膜13之兩面(第1面13a、第2面13b)之例,然而剝離膜亦可僅設置於保護膜形成用膜13之任一面,亦即僅設置於第1面13a或僅設置於第2面13b。Although FIG. 1 shows an example in which the release film is provided on both sides (the
本實施形態之保護膜形成用膜能夠不與後述之支撐片併用,而貼附於晶圓之內面。在這種情況下,相對於保護膜形成用膜貼附於晶圓之面為相反側之面亦可設置有剝離膜,該剝離膜在適當時機點移除即可。於移除該剝離膜後之保護膜形成用膜的露出面貼附切割片,藉由進行切割(亦即晶圓之分割)、及保護膜形成用膜或保護膜之切斷,能夠製作具保護膜的晶片。The protective film forming film of this embodiment can be attached to the inner surface of the wafer without being used in combination with the support sheet described later. In this case, a release film may be provided on the surface opposite to the surface on which the protective film forming film is attached to the wafer, and the release film may be removed at an appropriate timing. A dicing sheet is attached to the exposed surface of the protective film forming film after the release film is removed, and the tool can be manufactured by cutting (ie, dividing the wafer) and cutting the protective film forming film or the protective film Protective film for wafers.
另一方面,本實施形態之保護膜形成用膜能夠藉由與後述之支撐片併用,而構成可一併進行保護膜之形成與切割的保護膜形成用複合片。以下,就如此般之保護膜形成用複合片來加以說明。On the other hand, the film for forming a protective film of this embodiment can be used in combination with a support sheet described later to form a composite sheet for forming a protective film that can be formed and diced together. Hereinafter, such a composite sheet for forming a protective film will be described.
◇保護膜形成用複合片本發明一實施形態相關之保護膜形成用複合片具備:支撐片;以及設置於前述支撐片之一面上的保護膜形成用膜,此保護膜形成用膜為上述本發明一實施形態相關之保護膜形成用膜。◇Composite sheet for forming a protective film The composite sheet for forming a protective film according to an embodiment of the present invention includes: a support sheet; and a film for forming a protective film provided on one surface of the support sheet, and the film for forming a protective film is the above-mentioned one. A film for forming a protective film according to an embodiment of the invention.
本實施形態之保護膜形成用複合片藉由具備前述保護膜形成用膜,能夠在基板裝置之製造過程中使得作為具保護膜的晶片中的突狀電極與電路基板上之連接墊的電性連接強度變得更強固。The composite sheet for forming a protective film of this embodiment is provided with the aforementioned film for forming a protective film, so that the electrical properties of the protruding electrodes in the wafer with the protective film and the connection pads on the circuit board can be made during the manufacturing process of the substrate device. The connection strength becomes stronger.
本說明書中,即便於保護膜形成用膜硬化後,只要維持住由支撐片與保護膜形成用膜之硬化物而成的積層結構,則將該積層結構體稱為「保護膜形成用複合片」。In this specification, even after the protective film formation film is cured, as long as the laminated structure formed by the support sheet and the cured product of the protective film formation film is maintained, the laminated structure is referred to as a "composite sheet for protective film formation" ".
以下,就構成前述保護膜形成用複合片之各層進行詳細說明。Hereinafter, each layer constituting the aforementioned composite sheet for forming a protective film will be described in detail.
◎支撐片前述支撐片可由1層(單層)所構成,亦可為2層以上之複數層所構成。於支撐片為複數層所構成之情況,這些複數層之構成材料及厚度可彼此相同或彼此不同,這些複數層的組合只要無損本發明之效果,則無特別限定。◎Support sheet The aforementioned support sheet may be composed of one layer (single layer), or may be composed of two or more layers. In the case where the support sheet is composed of multiple layers, the constituent materials and thicknesses of these multiple layers may be the same or different from each other, and the combination of these multiple layers is not particularly limited as long as the effect of the present invention is not impaired.
支撐片可為透明,亦可為不透明,亦可對應於目的而加以著色。例如,於保護膜形成用膜具有能量線硬化性的情況,支撐片較佳為讓能量線穿透。The support sheet may be transparent or opaque, and may be colored according to the purpose. For example, in the case where the film for forming a protective film has energy ray curability, the support sheet preferably allows the energy ray to penetrate.
作為支撐片,可列舉例如:具備基材以及設置於前述基材之一面上的黏著劑層之支撐片;僅由基材所構成之支撐片等。於支撐片具備黏著劑層的情況,黏著劑層在保護膜形成用複合片中係配置於基材與保護膜形成用膜之間。As the support sheet, for example, a support sheet provided with a base material and an adhesive layer provided on one surface of the aforementioned base material; a support sheet composed only of the base material, and the like. When the support sheet is provided with an adhesive layer, the adhesive layer is arranged between the base material and the protective film formation film in the composite sheet for protective film formation.
於使用具備有基材及黏著劑層之支撐片的情況,保護膜形成用複合片中可容易調節支撐片與保護膜形成用膜之間的黏著力或密接性。於使用僅由基材所構成之支撐片的情況,可以低成本製造保護膜形成用複合片。In the case of using a support sheet provided with a base material and an adhesive layer, in the composite sheet for forming a protective film, the adhesive force or adhesion between the support sheet and the film for forming a protective film can be easily adjusted. In the case of using a support sheet composed only of a base material, a composite sheet for forming a protective film can be manufactured at low cost.
以下,參照圖式,依照支撐片的種類來說明本實施形態之保護膜形成用複合片之例。Hereinafter, with reference to the drawings, an example of the composite sheet for forming a protective film of the present embodiment will be described in accordance with the type of the support sheet.
圖2係以示意方式顯示本發明一實施形態相關的保護膜形成用複合片之一例之剖面圖。此外,關於圖2之後的圖式中,與已說明完畢之圖式所示的要素為相同之構成要素係賦予與該說明完畢之圖式的情況相同之符號,並省略該要素之詳細說明。此處所示之保護膜形成用複合片101係構成為具備:支撐片10;以及設置於支撐片10之一面(本說明書中有時稱為「第1面」)10a上的保護膜形成用膜13。支撐片10係構成為具備:基材11;以及設置於基材11之一面(亦即第1面)11a上的黏著劑層12。保護膜形成用複合片101中,黏著劑層12配置於基材11與保護膜形成用膜13之間。亦即,保護膜形成用複合片101係將基材11、黏著劑層12及保護膜形成用膜13依序在這些層的厚度方向上進行積層而構成。支撐片10之保護膜形成用膜13側之面(本說明書中,有時稱為「第1面」)10a與黏著劑層12中之相對於基材11側為相反側之面(本說明書中,有時稱為「第1面」)12a相同。Fig. 2 is a cross-sectional view schematically showing an example of a composite sheet for forming a protective film according to an embodiment of the present invention. In addition, in the drawings following FIG. 2, elements that are the same as the elements shown in the already-explained drawings are given the same reference numerals as in the case of the already-explained drawings, and detailed explanations of the elements are omitted. The
保護膜形成用複合片101進而於保護膜形成用膜13上具備治具用接著劑層16及剝離膜15。保護膜形成用複合片101中,黏著劑層12之第1面12a的整面或大致整面積層有保護膜形成用膜13,於保護膜形成用膜13中之相對於黏著劑層12側為相反側之面(本說明書中,有時稱為「第1面」)13a的一部分(亦即周緣部附近之區域)積層有治具用接著劑層16。進而,於保護膜形成用膜13之第1面13a中未積層治具用接著劑層16之區域、及治具用接著劑層16中之相對於保護膜形成用膜13側為相反側之面(本說明書中,有時稱為「第1面」)16a積層有剝離膜15。The
不限於保護膜形成用複合片101的情況,本實施形態之保護膜形成用複合片中,剝離膜(例如圖3所示之剝離膜15)為任意之構成,本實施形態之保護膜形成用複合片可具備剝離膜,亦可不具備剝離膜。It is not limited to the case of the composite sheet for forming a
保護膜形成用複合片101中,亦可在剝離膜15與直接接觸於該剝離膜15之層之間產生一部分間隙。例如,此處雖顯示出於治具用接著劑層16之側面16c接觸(積層)有剝離膜15之狀態,但亦存在有於前述側面16c未接觸剝離膜15之情況。再者,此處雖顯示出保護膜形成用膜13之第1面13a中在治具用接著劑層16之附近區域接觸(積層)有剝離膜15的狀態,但亦存在有前述區域未接觸剝離膜15之情況。再者,亦存在有無法明確區別治具用接著劑層16之第1面16a及側面16c之邊界的情況。上述方面在具備有治具用接著劑層之其他實施形態的保護膜形成用複合片中亦相同。In the
治具用接著劑層16係用於將保護膜形成用複合片101固定於環狀框等的治具。治具用接著劑層16可具有例如含有接著劑成分之單層結構,亦可具有於成為芯材之片的雙面積層有含接著劑成分之層而成之複數層結構。The
由保護膜形成用複合片101所獲得之保護膜中,如上文所說明般,Z150
為0.38以上,且Z200
為0.33以上。In the protective film obtained from the
保護膜形成用複合片101係以下述方式使用:在移除掉剝離膜15之狀態,於保護膜形成用膜13之第1面13a貼附晶圓之內面,進而將治具用接著劑層16之第1面16a貼附於環狀框等的治具。The
圖3係以示意方式表示本發明的一實施形態的保護膜形成用複合片的另一例之剖面圖。此處所示之保護膜形成用複合片102除了保護膜形成用膜之形狀及大小不同,且治具用接著劑層積層於黏著劑層之第1面而並非保護膜形成用膜之第1面之方面以外,都與圖1所示之保護膜形成用複合片101相同。Fig. 3 is a cross-sectional view schematically showing another example of a composite sheet for forming a protective film according to an embodiment of the present invention. The protective film forming
更具體而言,保護膜形成用複合片102中,保護膜形成用膜23係積層於黏著劑層12之第1面12a之一部分區域、亦即黏著劑層12之寬度方向(圖3中之左右方向)中的中央側之區域。進而,黏著劑層12之第1面12a中未積層保護膜形成用膜23之區域、亦即周緣部附近之區域積層有治具用接著劑層16。並且,於保護膜形成用膜23中之相對於黏著劑層12側為相反側之面(本說明書中,有時稱為「第1面」)23a及治具用接著劑層16之第1面16a積層有剝離膜15。More specifically, in the
圖4係以示意方式顯示本發明一實施形態相關之保護膜形成用複合片的又一例的剖面圖。此處所示之保護膜形成用複合片103除了不具備治具用接著劑層16之方面以外,都與圖3所示之保護膜形成用複合片102相同。4 is a cross-sectional view schematically showing another example of the composite sheet for forming a protective film according to an embodiment of the present invention. The
圖5係以示意方式顯示本發明一實施形態相關之保護膜形成用複合片的又一例的剖面圖。此處所示之保護膜形成用複合片104除了構成為具備支撐片20代替支撐片10之方面以外,都與圖2所示之保護膜形成用複合片101相同。支撐片20僅由基材11所構成。亦即,保護膜形成用複合片104係將基材11及保護膜形成用膜13在這些層之厚度方向上積層而構成。支撐片20之保護膜形成用膜13側之面(本說明書中,有時稱為「第1面」)20a與基材11之第1面11a相同。基材11至少於第1面11a具有黏著性。Fig. 5 is a cross-sectional view schematically showing another example of a composite sheet for forming a protective film according to an embodiment of the present invention. The
本實施形態之保護膜形成用複合片並不限於圖1至圖5所示之保護膜形成用複合片,在無損本發明之效果的範圍內,亦可將圖1至圖5所示之保護膜形成用複合片的一部分構成進行變更或削除,或是對目前為止所說明之保護膜形成用複合片進一步地追加其他構成。更具體而言,如下所述。The composite sheet for forming a protective film of this embodiment is not limited to the composite sheet for forming a protective film shown in Figs. A part of the structure of the composite sheet for film formation is changed or removed, or another structure is further added to the composite sheet for protective film formation described so far. More specifically, it is as follows.
目前為止,關於具備有僅由基材所構成之支撐片之保護膜形成用複合片,僅顯示出圖5所示之保護膜形成用複合片104,但作為具備有僅由基材所構成之支撐片之保護膜形成用複合片,亦可列舉例如於圖3所示之保護膜形成用複合片102、或圖4所示之保護膜形成用複合片103中不具備黏著劑層12之保護膜形成用複合片。不過,此僅為具備有僅由基材所構成之支撐片之其他保護膜形成用複合片的一例。So far, with regard to the composite sheet for forming a protective film having a support sheet composed of only a base material, only the
目前為止,關於不具備治具用接著劑層之保護膜形成用複合片,僅顯示出圖4所示之保護膜形成用複合片103,但作為不具備治具用接著劑層之保護膜形成用複合片亦可列舉例如:於圖2所示之保護膜形成用複合片101中不具備治具用接著劑層16之保護膜形成用複合片;於圖5所示之保護膜形成用複合片104中不具備治具用接著劑層16之保護膜形成用複合片。不過,此僅為不具備治具用接著劑層之其他保護膜形成用複合片的一例。So far, regarding the composite sheet for forming a protective film without an adhesive layer for jigs, only the
目前為止,作為構成保護膜形成用複合片之層,雖顯示出基材、黏著劑層、保護膜形成用膜及剝離膜,但保護膜形成用複合片亦可具備有不相當於這些層之任一者的其他層。前述其他層的種類並無特別限定,可對應於目的而任意選擇。關於前述其他層之配置位置、形狀、大小等亦可對應於該層之種類而任意選擇,並無特別限定。So far, as the layers constituting the protective film forming composite sheet, although the base material, the adhesive layer, the protective film forming film, and the release film have been shown, the protective film forming composite sheet may be provided with layers that are not equivalent to these layers. Any other layer. The types of the aforementioned other layers are not particularly limited, and can be arbitrarily selected according to the purpose. The arrangement position, shape, size, etc. of the aforementioned other layers can also be arbitrarily selected according to the type of the layer, and is not particularly limited.
作為前述其他層可列舉例如可對保護膜形成用複合片賦予任何特性的中間層等,係配置於支撐片與保護膜形成用膜之間,而調節保護膜形成用膜或該保護膜形成用膜之硬化物自支撐片的剝離性等。不過,此僅為具備有前述其他層之其他保護膜形成用複合片的一例。As the aforementioned other layer, for example, an intermediate layer that can impart any characteristics to the composite sheet for forming a protective film, etc., is arranged between the support sheet and the film for forming a protective film, and adjusts the film for forming the protective film or the protective film for forming The releasability of the cured product of the film from the supporting sheet, etc. However, this is only an example of the other protective film formation composite sheet provided with the other layer mentioned above.
本實施形態之保護膜形成用複合片中,各層之大小及形狀可對應於目標而任意選擇。In the composite sheet for forming a protective film of this embodiment, the size and shape of each layer can be arbitrarily selected according to the target.
繼而,就構成支撐片之各層來進一步地詳細說明。Then, each layer constituting the support sheet will be described in further detail.
○基材前述基材為片狀或膜狀,作為該基材之構成材料可列舉例如各種樹脂。作為前述樹脂可列舉例如:低密度聚乙烯(LDPE;Low Density Polyethylene)、線性低密度聚乙烯(LLDPE:Linear Low Density Polyethylene)、高密度聚乙烯(HDPE;High Density Polyethylene)等的聚乙烯;聚丙烯、聚丁烯、聚丁二烯、聚甲基戊烯、降冰片烯樹脂等的聚乙烯以外之聚烯烴;乙烯-乙酸乙烯酯共聚物、乙烯-(甲基)丙烯酸共聚物、乙烯-(甲基)丙烯酸酯共聚物、乙烯-降冰片烯共聚物等的乙烯共聚物(使用乙烯作為單體所獲得之共聚物);聚氯乙烯、氯乙烯共聚物等的氯乙烯樹脂(使用氯乙烯作為單體所獲得之樹脂);聚苯乙烯;聚環烯烴;聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯、聚對苯二甲酸丁二酯、聚間苯二甲酸乙二酯、聚-2,6-萘二甲酸乙二酯、全部構成單元具有芳香族環式基之全芳香族聚酯等的聚酯;2種以上之前述聚酯的共聚物;聚(甲基)丙烯酸酯;聚胺基甲酸酯;聚丙烯酸胺基甲酸酯;聚醯亞胺;聚醯胺;聚碳酸酯;氟樹脂;聚縮醛;改質聚伸苯醚;聚苯硫醚;聚碸;聚醚酮等。再者,作為前述樹脂可列舉例如前述聚酯與前述聚酯以外的樹脂之混合物等的聚合物合金。前述聚酯與前述聚酯以外的樹脂的聚合物合金較佳為聚酯以外之樹脂的量為相對較少量。再者,作為前述樹脂亦可列舉例如:目前為止所例示之前述樹脂的1種或2種以上進行交聯而成的交聯樹脂;使用目前為止所例示之前述樹脂的1種或2種以上的離子聚合物等的改質樹脂。○ Substrate The aforementioned substrate is in the form of a sheet or film, and various resins can be cited as a constituent material of the substrate. Examples of the aforementioned resin include polyethylene such as low density polyethylene (LDPE; Low Density Polyethylene), linear low density polyethylene (LLDPE: Linear Low Density Polyethylene), and high density polyethylene (HDPE; High Density Polyethylene); poly Polyolefins other than polyethylene such as propylene, polybutene, polybutadiene, polymethylpentene, norbornene resin; ethylene-vinyl acetate copolymer, ethylene-(meth)acrylic acid copolymer, ethylene- (Meth) acrylate copolymers, ethylene-norbornene copolymers and other ethylene copolymers (copolymers obtained by using ethylene as a monomer); vinyl chloride resins such as polyvinyl chloride and vinyl chloride copolymers (using chlorine Resin obtained from ethylene as a monomer); polystyrene; polycyclic olefin; polyethylene terephthalate, polyethylene naphthalate, polybutylene terephthalate, polyethylene isophthalate Diesters, poly(ethylene-2,6-naphthalate), wholly aromatic polyesters with aromatic cyclic groups in all constituent units; copolymers of two or more of the aforementioned polyesters; poly(formaldehyde) Base) acrylate; polyurethane; polyacrylic urethane; polyimide; polyamide; polycarbonate; fluororesin; polyacetal; modified polyphenylene oxide; polyphenylene sulfide Ether; polysulfide; polyether ketone and so on. In addition, examples of the resin include polymer alloys such as a mixture of the polyester and a resin other than the polyester. The polymer alloy of the aforementioned polyester and a resin other than the aforementioned polyester preferably has a relatively small amount of the resin other than the polyester. In addition, as the aforementioned resin, for example, a crosslinked resin obtained by crosslinking one or more of the aforementioned resins exemplified so far; using one or more of the aforementioned resins exemplified so far The modified resin such as ionic polymer.
構成基材之樹脂可僅為1種,亦可為2種以上,於為2種以上的情況,這些樹脂的組合及比率可任意選擇。The resin constituting the base material may be only one type or two or more types. In the case of two or more types, the combination and ratio of these resins can be arbitrarily selected.
基材可由1層(單層)所構成,亦可由2層以上的複數層所構成,於由複數層所構成之情況,這些複數層相互可相同亦可不同,這些複數層的組合並無特別限定。The base material can be composed of one layer (single layer), or two or more layers. In the case of multiple layers, these multiple layers may be the same or different from each other. There is no special combination of these multiple layers. limited.
基材之厚度較佳為50μm至300μm,更佳為60μm至100μm。藉由使基材之厚度為此般範圍,更加提高前述保護膜形成用複合片之可撓性、及對晶圓之貼附性。此處,所謂「基材之厚度」意指基材整體之厚度,例如所謂由複數層所構成之基材之厚度,意指構成基材之全部層的合計厚度。The thickness of the substrate is preferably 50 μm to 300 μm, more preferably 60 μm to 100 μm. By setting the thickness of the substrate in this range, the flexibility of the composite sheet for forming the protective film and the adhesion to the wafer are further improved. Here, the "thickness of the substrate" means the thickness of the entire substrate. For example, the thickness of the substrate composed of a plurality of layers means the total thickness of all the layers constituting the substrate.
基材除前述樹脂等的主要構成材料以外,亦可含有填充材料、著色劑、抗氧化劑、有機滑劑、觸媒、軟化劑(塑化劑)等的公知之各種添加劑。The base material may contain various known additives such as fillers, colorants, antioxidants, organic lubricants, catalysts, and softeners (plasticizers) in addition to the main constituent materials such as the aforementioned resins.
基材可為透明,亦可為不透明,亦可對應於目的而著色,亦可蒸鍍其他層。例如,於保護膜形成用膜具有能量線硬化性的情況,基材較佳為使能量線穿透。The substrate may be transparent or opaque, may be colored according to the purpose, and may also be vapor-deposited with other layers. For example, when the film for forming a protective film has energy ray curability, it is preferable that the base material allows energy ray to penetrate.
為了調節基材與設置於該基材上之層(例如黏著劑層、保護膜形成用膜、或前述其他層)的接著性,亦可對基材之表面施加利用噴砂處理、溶媒處理等的凹凸化處理;電暈放電處理、電子束照射處理、電漿處理、臭氧/紫外線照射處理、火焰處理、鉻酸處理、熱風處理等的氧化處理;親油處理;親水處理等。再者,基材的表面亦可進行底塗處理。In order to adjust the adhesion between the substrate and the layer provided on the substrate (such as an adhesive layer, a protective film forming film, or the aforementioned other layers), the surface of the substrate can also be treated with sandblasting, solvent treatment, etc. Concave-convex treatment; corona discharge treatment, electron beam irradiation treatment, plasma treatment, ozone/ultraviolet irradiation treatment, flame treatment, chromic acid treatment, hot air treatment, etc. oxidation treatment; lipophilic treatment; hydrophilic treatment, etc. Furthermore, the surface of the substrate may also be primed.
基材亦可藉由含有特定範圍之成分(例如樹脂等),使至少一面具有黏著性。The substrate may also have adhesiveness on at least one side by containing components (such as resin, etc.) in a specific range.
基材可利用公知之方法進行製造。例如,含有樹脂之基材可利用將含有前述樹脂之樹脂組成物加以成形而進行製造。The substrate can be manufactured by a known method. For example, a resin-containing substrate can be manufactured by molding a resin composition containing the aforementioned resin.
○黏著劑層前述黏著劑層為片狀或膜狀,且含有黏著劑。作為前述黏著劑可列舉例如:丙烯酸樹脂、胺基甲酸酯樹脂、橡膠系樹脂、聚矽氧樹脂、環氧系樹脂、聚乙烯醚、聚碳酸酯、酯系樹脂等的黏著性樹脂。○ Adhesive layer The aforementioned adhesive layer is in the form of a sheet or film and contains an adhesive. Examples of the aforementioned adhesive include adhesive resins such as acrylic resins, urethane resins, rubber resins, silicone resins, epoxy resins, polyvinyl ethers, polycarbonates, and ester resins.
本說明書中,「黏著性樹脂」包含具有黏著性之樹脂以及具有接著性之樹脂兩者。例如,前述黏著性樹脂不僅包含樹脂本身具有黏著性之樹脂,亦包含藉由與添加劑等的其他成分併用而顯示黏著性之樹脂、及藉由存在熱或水等的觸發(trigger)而顯示接著性之樹脂等。In this specification, "adhesive resin" includes both adhesive resin and adhesive resin. For example, the aforementioned adhesive resin includes not only resins with adhesive properties, but also resins that exhibit adhesiveness by being used in combination with other ingredients such as additives, and exhibit adhesion by the presence of heat or water as a trigger. Sexual resin, etc.
黏著劑層可由1層(單層)所構成,亦可為2層以上之複數層所構成,於由複數層所構成之情況,這些複數層相互可相同亦可不同,這些複數層的組合並無特別限定。The adhesive layer can be composed of one layer (single layer), or two or more layers. In the case of multiple layers, these multiple layers may be the same or different from each other. The combination of these multiple layers There is no particular limitation.
黏著劑層之厚度並無特別限定,較佳為1μm至100μm,更佳為1μm至60μm,特佳為1μm至30μm。此處,所謂「黏著劑層之厚度」意指黏著劑層整體之厚度,例如所謂由複數層所構成之黏著劑層之厚度意指構成黏著劑層之全部層的合計厚度。The thickness of the adhesive layer is not particularly limited, and is preferably 1 μm to 100 μm, more preferably 1 μm to 60 μm, particularly preferably 1 μm to 30 μm. Here, the "thickness of the adhesive layer" means the thickness of the entire adhesive layer. For example, the thickness of the adhesive layer composed of a plurality of layers means the total thickness of all the layers constituting the adhesive layer.
黏著劑層可使用能量線硬化性黏著劑而形成,亦可使用非能量線硬化性黏著劑而形成。亦即,黏著劑層可為能量線硬化性及非能量線硬化性之任一種。能量線硬化性之黏著劑層能夠容易調節硬化前及硬化後之物性。The adhesive layer can be formed using an energy ray-curable adhesive or may be formed using a non-energy ray-curable adhesive. That is, the adhesive layer may be either energy ray curable or non-energy ray curable. The energy-ray curable adhesive layer can easily adjust the physical properties before and after curing.
黏著劑層可使用含有黏著劑之黏著劑組成物而形成。例如,於黏著劑層之形成對象面塗敷黏著劑組成物,依需要使之乾燥,藉此能夠於目標部位形成黏著劑層。黏著劑組成物中於常溫下不會氣化的成分彼此之含量的比率通常與黏著劑層中之前述成分彼此之含量的比率相同。The adhesive layer can be formed using an adhesive composition containing an adhesive. For example, the adhesive composition is coated on the surface to be formed of the adhesive layer, and dried as needed, so that the adhesive layer can be formed on the target site. The ratio of the contents of the components that do not vaporize at room temperature in the adhesive composition is usually the same as the ratio of the contents of the aforementioned components in the adhesive layer.
黏著劑組成物之塗敷可利用例如與上述之保護膜形成用組成物的塗敷之情況相同的方法加以進行。The application of the adhesive composition can be performed by, for example, the same method as the application of the above-mentioned protective film forming composition.
於基材上設置黏著劑層的情況,例如於基材上塗敷黏著劑組成物,而依需要使之乾燥,藉此於基材上積層黏著劑層即可。再者,於基材上設置黏著劑層的情況,可藉由例如下述方式於基材上積層黏著劑層:於剝離膜上塗敷黏著劑組成物,而依需要使之乾燥,藉此於剝離膜上預先形成黏著劑層,使該黏著劑層之露出面貼合於基材之一表面。這種情況下的剝離膜於保護膜形成用複合片之製造過程或使用過程的任意時間點移除即可。In the case of disposing the adhesive layer on the substrate, for example, the adhesive composition is coated on the substrate, and the adhesive composition is dried as needed, thereby laminating the adhesive layer on the substrate. Furthermore, when the adhesive layer is provided on the substrate, the adhesive layer can be laminated on the substrate by, for example, coating the adhesive composition on the release film, and drying it as needed, thereby An adhesive layer is formed in advance on the release film, and the exposed surface of the adhesive layer is attached to a surface of the substrate. The release film in this case may be removed at any point in the manufacturing process or use process of the composite sheet for forming a protective film.
無論黏著劑層為能量線硬化性及非能量線硬化性的哪一種,黏著劑組成物之乾燥條件並無特別限定。其中,於黏著劑組成物含有後述之溶媒的情況,較佳為進行加熱乾燥。並且,含有溶媒之黏著劑組成物較佳為例如於70℃至130℃且10秒鐘至5分鐘的條件下進行加熱乾燥。Regardless of whether the adhesive layer is energy ray curable or non-energy ray curable, the drying conditions of the adhesive composition are not particularly limited. Among them, when the adhesive composition contains a solvent described later, it is preferable to heat and dry it. In addition, the adhesive composition containing the solvent is preferably heated and dried under the conditions of 70°C to 130°C for 10 seconds to 5 minutes, for example.
於黏著劑層為能量線硬化性的情況,作為能量線硬化性之黏著劑組成物,可列舉例如以下之黏著劑組成物等:黏著劑組成物(I-1),係含有非能量線硬化性之黏著性樹脂(I-1a)(以下,有時簡稱為「黏著性樹脂(I-1a)」)、以及能量線硬化性化合物;黏著劑組成物(I-2),係含有於非能量線硬化性之黏著性樹脂(I-1a)的側鏈導入有不飽和基之能量線硬化性之黏著性樹脂(I-2a)(以下,有時簡稱為「黏著性樹脂(I-2a)」);以及黏著劑組成物(I-3),係含有前述黏著性樹脂(I-2a)、以及能量線硬化性化合物。When the adhesive layer is energy ray curable, as the energy ray curable adhesive composition, for example, the following adhesive composition, etc.: The adhesive composition (I-1) contains non-energy ray hardening Adhesive resin (I-1a) (hereinafter sometimes referred to as "adhesive resin (I-1a)") and energy ray curable compound; adhesive composition (I-2), which is contained in non- Energy-ray curable adhesive resin (I-1a) with unsaturated groups introduced into the side chain of energy-ray curable adhesive resin (I-2a) (hereinafter, sometimes referred to as "adhesive resin (I-2a) )”); and the adhesive composition (I-3), which contains the aforementioned adhesive resin (I-2a) and an energy ray curable compound.
於黏著劑層為非能量線硬化性的情況,作為非能量線硬化性之黏著劑組成物可列舉例如含有前述非能量線硬化性之黏著性樹脂(I-1a)的黏著劑組成物(I-4)等。When the adhesive layer is non-energy-ray-curable, as the non-energy-ray-curable adhesive composition, for example, an adhesive composition (I-1a) containing the aforementioned non-energy-ray-curable adhesive resin (I-1a) -4) etc.
[黏著性樹脂(I-1a)]前述黏著劑組成物(I-1)、黏著劑組成物(I-2)、黏著劑組成物(I-3)及黏著劑組成物(I-4)(以下將這些黏著劑組成物概括性地簡稱為「黏著劑組成物(I-1)至黏著劑組成物(I-4)」)中的前述黏著性樹脂(I-1a)較佳為丙烯酸樹脂。[Adhesive resin (I-1a)] The aforementioned adhesive composition (I-1), adhesive composition (I-2), adhesive composition (I-3), and adhesive composition (I-4) (Hereinafter, these adhesive compositions are generally referred to as "adhesive composition (I-1) to adhesive composition (I-4)"). The aforementioned adhesive resin (I-1a) is preferably acrylic Resin.
作為前述丙烯酸樹脂,可列舉例如至少具有源自(甲基)丙烯酸烷基酯的構成單元之丙烯酸聚合物。作為前述(甲基)丙烯酸烷基酯,可列舉例如構成烷基酯之烷基的碳數為1至20之(甲基)丙烯酸烷基酯,前述烷基較佳為直鏈狀或支鏈狀。As said acrylic resin, the acrylic polymer which has at least the structural unit derived from the alkyl (meth)acrylate, for example is mentioned. Examples of the aforementioned alkyl (meth)acrylate include alkyl (meth)acrylates having 1 to 20 carbon atoms in the alkyl group constituting the alkyl ester, and the aforementioned alkyl group is preferably linear or branched. shape.
前述丙烯酸聚合物除了具有源自(甲基)丙烯酸烷基酯之構成單元以外,較佳為進而具有源自含官能基之單體之構成單元。作為前述含官能基之單體,可列舉例如:可藉由前述官能基與後述交聯劑進行反應而成為交聯的起點的單體;或者可藉由前述官能基與後述之含不飽和基之化合物中之不飽和基進行反應而能夠於丙烯酸聚合物之側鏈導入不飽和基的單體。The aforementioned acrylic polymer preferably has a structural unit derived from a functional group-containing monomer in addition to a structural unit derived from an alkyl (meth)acrylate. As the aforementioned functional group-containing monomer, for example, a monomer that can be a starting point for crosslinking by reacting the aforementioned functional group with the crosslinking agent described later; or can be a monomer that can be made by the aforementioned functional group and the aforementioned unsaturated group-containing monomer. The unsaturated group in the compound reacts to introduce the unsaturated group into the side chain of the acrylic polymer.
作為前述含官能基之單體,可列舉例如:含羥基之單體、含羧基之單體、含胺基之單體、含環氧基之單體等。Examples of the aforementioned functional group-containing monomers include hydroxyl group-containing monomers, carboxyl group-containing monomers, amine group-containing monomers, epoxy group-containing monomers, and the like.
前述丙烯酸聚合物除了源自(甲基)丙烯酸烷基酯之構成單元、及源自含官能基之單體之構成單元以外,亦可進而具有源自其他單體之構成單元。前述其他單體只要可與(甲基)丙烯酸烷基酯等共聚合,則無特別限定。作為前述其他單體,可列舉例如:苯乙烯、α-甲基苯乙烯、乙烯基甲苯、甲酸乙烯酯、乙酸乙烯酯、丙烯腈、丙烯醯胺等。In addition to the structural unit derived from the alkyl (meth)acrylate and the structural unit derived from the monomer containing a functional group, the said acrylic polymer may further have the structural unit derived from another monomer. The aforementioned other monomers are not particularly limited as long as they can be copolymerized with alkyl (meth)acrylates and the like. Examples of the aforementioned other monomers include styrene, α-methylstyrene, vinyl toluene, vinyl formate, vinyl acetate, acrylonitrile, acrylamide, and the like.
黏著劑組成物(I-1)至黏著劑組成物(I-4)中,前述丙烯酸聚合物等的前述丙烯酸樹脂所具有之構成單元可僅為1種,亦可為2種以上,於為2種以上的情況,這些構成單元的組合及比率可任意選擇。In the adhesive composition (I-1) to the adhesive composition (I-4), the structural unit of the acrylic resin such as the acrylic polymer may be only one type or two or more types. In the case of two or more types, the combination and ratio of these structural units can be arbitrarily selected.
前述丙烯酸聚合物中,源自含官能基之單體之構成單元的含量相對於構成單元之總量較佳為1質量%至35質量%。In the aforementioned acrylic polymer, the content of the structural unit derived from the functional group-containing monomer relative to the total amount of the structural unit is preferably 1% by mass to 35% by mass.
黏著劑組成物(I-1)或黏著劑組成物(I-4)所含有之黏著性樹脂(I-1a)可僅為1種,亦可為2種以上,於為2種以上的情況,這些黏著性樹脂(I-1a)的組合及比率可任意選擇。Adhesive composition (I-1) or adhesive composition (I-4) may contain only one type of adhesive resin (I-1a), or two or more types, in the case of two or more types , The combination and ratio of these adhesive resins (I-1a) can be arbitrarily selected.
黏著劑組成物(I-1)或黏著劑組成物(I-4)中,黏著性樹脂(I-1a)之含量相對於黏著劑組成物(I-1)或黏著劑組成物(I-4)之總質量的比例較佳為5質量%至99質量%。In the adhesive composition (I-1) or the adhesive composition (I-4), the content of the adhesive resin (I-1a) is relative to the adhesive composition (I-1) or the adhesive composition (I- The ratio of the total mass of 4) is preferably 5 mass% to 99 mass%.
[黏著性樹脂(I-2a)]前述黏著劑組成物(I-2)及黏著劑組成物(I-3)中的前述黏著性樹脂(I-2a)例如藉由使黏著性樹脂(I-1a)中之官能基與具有能量線聚合性不飽和基的含不飽和基之化合物進行反應而獲得。[Adhesive resin (I-2a)] The adhesive resin (I-2a) in the adhesive composition (I-2) and the adhesive composition (I-3) is, for example, made of the adhesive resin (I-2) It is obtained by reacting the functional group in -1a) with an unsaturated group-containing compound having an energy-ray polymerizable unsaturated group.
前述含不飽和基之化合物係除了具有前述能量線聚合性不飽和基以外,進而具有可藉由與黏著性樹脂(I-1a)中之官能基反應,而與黏著性樹脂(I-1a)鍵結的基之化合物。作為前述能量線聚合性不飽和基,可列舉例如:(甲基)丙烯醯基、乙烯基(次乙基)、烯丙基(2-丙烯基)等,較佳為(甲基)丙烯醯基。作為可與黏著性樹脂(I-1a)中的官能基鍵結的基,可列舉例如:可與羥基或胺基鍵結的異氰酸酯基及縮水甘油基、以及可與羧基或環氧基鍵結之羥基及胺基等。The aforementioned unsaturated group-containing compound not only has the aforementioned energy-ray polymerizable unsaturated group, but also has the ability to react with the functional group in the adhesive resin (I-1a) to react with the adhesive resin (I-1a) The compound of the bonded base. Examples of the energy ray polymerizable unsaturated group include (meth)acrylic acid group, vinyl (ethylene group), allyl group (2-propenyl group), etc., and (meth)acrylic acid group is preferred. base. Examples of groups that can be bonded to the functional groups in the adhesive resin (I-1a) include isocyanate groups and glycidyl groups that can be bonded to hydroxyl groups or amino groups, and carboxyl groups or epoxy groups that can be bonded The hydroxyl and amino groups, etc.
作為前述含不飽和基之化合物,可列舉例如:異氰酸(甲基)丙烯醯氧基乙酯、(甲基)丙烯醯基異氰酸酯、(甲基)丙烯酸縮水甘油酯等。Examples of the aforementioned unsaturated group-containing compound include (meth)acryloxyethyl isocyanate, (meth)acryloyl isocyanate, glycidyl (meth)acrylate, and the like.
黏著劑組成物(I-2)或黏著劑組成物(I-3)所含有之黏著性樹脂(I-2a)可僅為1種,亦可為2種以上,於為2種以上的情況,這些黏著性樹脂(I-2a)的組合及比率可任意選擇。The adhesive composition (I-2) or the adhesive composition (I-3) may contain only one type of adhesive resin (I-2a), or two or more types, in the case of two or more types , The combination and ratio of these adhesive resins (I-2a) can be arbitrarily selected.
黏著劑組成物(I-2)或黏著劑組成物(I-3)中,黏著性樹脂(I-2a)之含量相對於黏著劑組成物(I-2)或黏著劑組成物(I-3)之總質量的比例較佳為5質量%至99質量%。In the adhesive composition (I-2) or the adhesive composition (I-3), the content of the adhesive resin (I-2a) is relative to the adhesive composition (I-2) or the adhesive composition (I- The ratio of the total mass of 3) is preferably 5 mass% to 99 mass%.
[能量線硬化性化合物]作為前述黏著劑組成物(I-1)及黏著劑組成物(I-3)中的前述能量線硬化性化合物,可列舉具有能量線聚合性不飽和基、且可藉由照射能量線而硬化的單體或低聚物。[Energy ray curable compound] As the energy ray curable compound in the adhesive composition (I-1) and the adhesive composition (I-3), there may be mentioned an energy ray polymerizable unsaturated group. A monomer or oligomer that is hardened by irradiation with energy rays.
能量線硬化性化合物中,作為單體可列舉例如:三羥甲基丙烷三(甲基)丙烯酸酯、季戊四醇(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、1,6-己二醇(甲基)丙烯酸酯等的多元(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯;聚酯(甲基)丙烯酸酯;聚醚(甲基)丙烯酸酯;環氧(甲基)丙烯酸酯等。能量線硬化性化合物中,作為低聚物可列舉例如上述所例示之單體聚合而成低聚物等。Among the energy ray curable compounds, examples of monomers include trimethylolpropane tri(meth)acrylate, pentaerythritol (meth)acrylate, pentaerythritol tetra(meth)acrylate, and dipentaerythritol hexa(meth)acrylate. ) Poly(meth)acrylates such as acrylate, 1,4-butanediol di(meth)acrylate, 1,6-hexanediol (meth)acrylate, etc.; (meth)acrylic urethane Acid ester; polyester (meth)acrylate; polyether (meth)acrylate; epoxy (meth)acrylate, etc. Among the energy ray curable compounds, examples of the oligomer include oligomers such as those exemplified by the polymerization of monomers above.
黏著劑組成物(I-1)或黏著劑組成物(I-3)所含有之前述能量線硬化性化合物可僅為1種,亦可為2種以上,於為2種以上的情況,這些能量線硬化性化合物的組合及比率可任意選擇。The aforementioned energy ray curable compound contained in the adhesive composition (I-1) or the adhesive composition (I-3) may be only one type, or two or more types. In the case of two or more types, these The combination and ratio of the energy ray curable compound can be arbitrarily selected.
前述黏著劑組成物(I-1)中,前述能量線硬化性化合物之含量相對於黏著劑組成物(I-1)之總質量的比例較佳為1質量%至95質量%。前述黏著劑組成物(I-3)中,前述能量線硬化性化合物之含量相對於黏著性樹脂(I-2a)之含量100質量份,較佳為0.01質量份至300質量份。In the adhesive composition (I-1), the ratio of the content of the energy ray curable compound to the total mass of the adhesive composition (I-1) is preferably 1% to 95% by mass. In the adhesive composition (I-3), the content of the energy ray curable compound is preferably 0.01 to 300 parts by mass relative to 100 parts by mass of the adhesive resin (I-2a).
[交聯劑]於使用除了具有源自(甲基)丙烯酸烷基酯之構成單元以外,進而具有源自含官能基之單體之構成單元的前述丙烯酸聚合物作為黏著性樹脂(I-1a)之情況,黏著劑組成物(I-1)或黏著劑組成物(I-4)較佳為進一步地含有交聯劑。再者,例如於使用與黏著性樹脂(I-1a)中之聚合物相同的具有源自含官能基之單體的構成單元之前述丙烯酸聚合物作為黏著性樹脂(I-2a)的情況,黏著劑組成物(I-2)或黏著劑組成物(I-3)亦可進一步地含有交聯劑。[Crosslinking agent] In addition to having structural units derived from alkyl (meth)acrylates, the aforementioned acrylic polymers having structural units derived from functional group-containing monomers are used as adhesive resins (I-1a In the case of ), the adhesive composition (I-1) or the adhesive composition (I-4) preferably further contains a crosslinking agent. Furthermore, for example, when the aforementioned acrylic polymer having the same structural unit derived from a functional group-containing monomer as the polymer in the adhesive resin (I-1a) is used as the adhesive resin (I-2a), The adhesive composition (I-2) or the adhesive composition (I-3) may further contain a crosslinking agent.
前述交聯劑例如與前述官能基進行反應,而使黏著性樹脂(I-1a)彼此或黏著性樹脂(I-2a)彼此交聯。作為交聯劑,可列舉例如:甲苯二異氰酸酯、六亞甲基二異氰酸酯、苯二甲基二異氰酸酯、這些二異氰酸酯之加合物等的異氰酸酯交聯劑(具有異氰酸酯基之交聯劑);乙二醇縮水甘油醚等的環氧交聯劑(具有縮水甘油基之交聯劑);六[1-(2-甲基)-氮丙啶基]三磷醯基三嗪等的氮丙啶交聯劑(具有氮丙啶基之交聯劑);鋁螯合物等的金屬螯合物交聯劑(具有金屬螯合物結構之交聯劑);異氰脲酸酯交聯劑(具有異氰脲酸骨架之交聯劑)等。The aforementioned crosslinking agent reacts with the aforementioned functional group, for example, to crosslink the adhesive resins (I-1a) or the adhesive resins (I-2a). Examples of the crosslinking agent include isocyanate crosslinking agents (crosslinking agents having isocyanate groups) such as toluene diisocyanate, hexamethylene diisocyanate, xylylene diisocyanate, and adducts of these diisocyanates; Epoxy crosslinking agent such as ethylene glycol glycidyl ether (crosslinking agent with glycidyl group); aziridine such as hexa[1-(2-methyl)-aziridinyl] triphosphoryl triazine, etc. Pyridine crosslinking agent (crosslinking agent with aziridinyl group); metal chelate crosslinking agent such as aluminum chelate (crosslinking agent with metal chelate structure); isocyanurate crosslinking agent (Crosslinking agent with isocyanuric acid skeleton) and so on.
黏著劑組成物(I-1)、黏著劑組成物(I-2)或黏著劑組成物(I-4)所含有之交聯劑可僅為1種,亦可為2種以上,於為2種以上的情況,這些交聯劑的組合及比率可任意選擇。The adhesive composition (I-1), the adhesive composition (I-2), or the adhesive composition (I-4) may contain only one type of crosslinking agent, or two or more types. In the case of two or more types, the combination and ratio of these crosslinking agents can be arbitrarily selected.
前述黏著劑組成物(I-1)或黏著劑組成物(I-4)中,交聯劑之含量相對於黏著性樹脂(I-1a)之含量100質量份,較佳為0.01質量份至50質量份。前述黏著劑組成物(I-2)或黏著劑組成物(I-3)中,交聯劑之含量相對於黏著性樹脂(I-2a)之含量100質量份,較佳為0.01質量份至50質量份。In the aforementioned adhesive composition (I-1) or adhesive composition (I-4), the content of the crosslinking agent is relative to 100 parts by mass of the adhesive resin (I-1a), preferably 0.01 parts by mass to 50 parts by mass. In the aforementioned adhesive composition (I-2) or adhesive composition (I-3), the content of the crosslinking agent relative to the content of the adhesive resin (I-2a) is 100 parts by mass, preferably 0.01 parts by mass to 50 parts by mass.
[光聚合起始劑]黏著劑組成物(I-1)、黏著劑組成物(I-2)及黏著劑組成物(I-3)(以下,將這些黏著劑組成物概括性地簡稱為「黏著劑組成物(I-1)至黏著劑組成物(I-3)」)亦可進一步地含有光聚合起始劑。含有光聚合起始劑之黏著劑組成物(I-1)至黏著劑組成物(I-3)即便照射紫外線等相對較低能量的能量線,仍充分進行硬化反應。[Photopolymerization initiator] Adhesive composition (I-1), adhesive composition (I-2), and adhesive composition (I-3) (hereinafter, these adhesive compositions are generally referred to as "Adhesive composition (I-1) to adhesive composition (I-3)") may further contain a photopolymerization initiator. The adhesive composition (I-1) to the adhesive composition (I-3) containing the photopolymerization initiator fully undergoes the curing reaction even if they are irradiated with relatively low-energy energy rays such as ultraviolet rays.
作為前述光聚合起始劑,可列舉例如:安息香、安息香甲醚、安息香乙醚、安息香異丙醚、安息香異丁醚、安息香苯甲酸、安息香苯甲酸甲酯、安息香二甲基縮酮等的安息香化合物;苯乙酮、2-羥基-2-甲基-1-苯基-丙烷-1-酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮等的苯乙酮化合物;雙(2,4,6-三甲基苯甲醯基)苯基氧化膦、2,4,6-三甲基苯甲醯基二苯基氧化膦等的醯基氧化膦化合物;苄基苯基硫醚、一硫化四甲基秋蘭姆等的硫醚化合物;1-羥基環己基苯基酮等的α-酮醇化合物;偶氮雙異丁腈等的偶氮化合物;二茂鈦等的二茂鈦化合物;噻噸酮等的噻噸酮化合物;過氧化物化合物;二乙醯等的二酮化合物;苯偶醯;二苯偶醯;二苯甲酮;2,4-二乙基噻噸酮;1,2-二苯基甲烷;2-羥基-2-甲基-1-[4-(1-甲基乙烯基)苯基]丙酮;1-氯蒽醌、2-氯蒽醌等的醌化合物。再者,作為前述光聚合起始劑,亦可使用例如胺等光增感劑等。Examples of the aforementioned photopolymerization initiator include benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoin benzoic acid, benzoin methyl benzoate, and benzoin dimethyl ketal. Compounds; acetophenone, 2-hydroxy-2-methyl-1-phenyl-propane-1-one, 2,2-dimethoxy-1,2-diphenylethane-1-one, etc. Acetophenone compounds; bis(2,4,6-trimethylbenzyl)phenyl phosphine oxide, 2,4,6-trimethylbenzyl diphenyl phosphine oxide, etc. Compounds; thioether compounds such as benzyl phenyl sulfide and tetramethylthiuram monosulfide; α-ketol compounds such as 1-hydroxycyclohexyl phenyl ketone; azo compounds such as azobisisobutyronitrile ; Titanocene compounds such as titanocene; thioxanthone compounds such as thioxanthone; peroxide compounds; diketone compounds such as diacetyl; benzophenone; benzophenone; benzophenone; 2 ,4-Diethylthioxanthone; 1,2-diphenylmethane; 2-hydroxy-2-methyl-1-[4-(1-methylvinyl)phenyl]acetone; 1-chloroanthracene Quinone, 2-chloroanthraquinone and other quinone compounds. Furthermore, as the aforementioned photopolymerization initiator, for example, photosensitizers such as amines can also be used.
黏著劑組成物(I-1)至黏著劑組成物(I-3)所含有之光聚合起始劑可僅為1種,亦可為2種以上,於為2種以上的情況,這些光聚合起始劑的組合及比率可任意選擇。The photopolymerization initiator contained in the adhesive composition (I-1) to the adhesive composition (I-3) may be only one type or two or more types. In the case of two or more types, these light The combination and ratio of the polymerization initiator can be arbitrarily selected.
黏著劑組成物(I-1)中,光聚合起始劑之含量相對於前述能量線硬化性化合物之含量100質量份,較佳為0.01質量份至20質量份。黏著劑組成物(I-2)中,光聚合起始劑之含量相對於黏著性樹脂(I-2a)之含量100質量份,較佳為0.01質量份至20質量份。黏著劑組成物(I-3)中,光聚合起始劑之含量相對於黏著性樹脂(I-2a)及前述能量線硬化性化合物之總含量100質量份,較佳為0.01質量份至20質量份。In the adhesive composition (I-1), the content of the photopolymerization initiator is preferably 0.01 to 20 parts by mass relative to 100 parts by mass of the aforementioned energy ray curable compound. In the adhesive composition (I-2), the content of the photopolymerization initiator relative to 100 parts by mass of the adhesive resin (I-2a) is preferably 0.01 to 20 parts by mass. In the adhesive composition (I-3), the content of the photopolymerization initiator is 100 parts by mass relative to the total content of the adhesive resin (I-2a) and the aforementioned energy ray curable compound, preferably 0.01 to 20 parts by mass Mass parts.
[其他添加劑]黏著劑組成物(I-1)至黏著劑組成物(I-4)亦可在無損本發明之效果的範圍內,含有不相當於上述任一種成分之其他添加劑。作為前述其他添加劑,可列舉例如:抗靜電劑、抗氧化劑、軟化劑(塑化劑)、填充材料(填料)、防鏽劑、著色劑(顏料、染料)、增感劑、黏著賦予劑、反應延遲劑、交聯促進劑(觸媒)等公知的添加劑。此外,所謂反應延遲劑,例如係指抑制因混入至黏著劑組成物(I-1)至黏著劑組成物(I-4)中之觸媒的作用,而導致保存中的黏著劑組成物(I-1)至黏著劑組成物(I-4)中進行目標外之交聯反應之成分。作為反應延遲劑,可列舉例如藉由針對觸媒之螯合物而形成螯合物錯合物之化合物,更具體而言,可列舉於1分子中具有2個以上的羰基(-C(=O)-)之化合物。[Other additives] The adhesive composition (I-1) to the adhesive composition (I-4) may also contain other additives that do not correspond to any of the above-mentioned components within a range that does not impair the effects of the present invention. Examples of the aforementioned other additives include antistatic agents, antioxidants, softeners (plasticizers), fillers (fillers), rust inhibitors, colorants (pigments, dyes), sensitizers, adhesion-imparting agents, Known additives such as reaction delay agents and crosslinking accelerators (catalysts). In addition, the so-called reaction delay agent, for example, refers to the suppression of the effect of the catalyst mixed in the adhesive composition (I-1) to the adhesive composition (I-4), resulting in the adhesive composition ( I-1) To the components of the adhesive composition (I-4) that undergo cross-linking reactions outside the target. As the reaction delay agent, for example, a compound that forms a chelate complex by a chelate against a catalyst is exemplified. More specifically, a compound having two or more carbonyl groups (-C(= O)-) Compounds.
黏著劑組成物(I-1)至黏著劑組成物(I-4)所含有之其他添加劑可僅為1種,亦可為2種以上,於為2種以上的情況,這些其他添加劑的組合及比率可任意選擇。The other additives contained in the adhesive composition (I-1) to the adhesive composition (I-4) may be only one type, or two or more types. In the case of two or more types, a combination of these other additives And the ratio can be chosen arbitrarily.
黏著劑組成物(I-1)至黏著劑組成物(I-4)的其他添加劑之含量並無特別限定,對應於該其他添加劑之種類而適當選擇即可。The content of other additives of the adhesive composition (I-1) to the adhesive composition (I-4) is not particularly limited, and may be appropriately selected according to the type of the other additives.
[溶媒]黏著劑組成物(I-1)至黏著劑組成物(I-4)亦可含有溶媒。黏著劑組成物(I-1)至黏著劑組成物(I-4)藉由含有溶媒,提高對塗敷對象面之塗敷適性。[Solvent] The adhesive composition (I-1) to the adhesive composition (I-4) may also contain a solvent. The adhesive composition (I-1) to the adhesive composition (I-4) contain a solvent to improve the applicability to the surface to be coated.
前述溶媒較佳為有機溶媒,作為前述有機溶媒,可列舉例如:甲基乙基酮、丙酮等酮;乙酸乙酯等酯(羧酸酯);四氫呋喃、二噁烷等醚;環己烷、正己烷等脂肪族烴;甲苯、二甲苯等芳香族烴;1-丙醇、2-丙醇等醇等。The aforementioned solvent is preferably an organic solvent. Examples of the aforementioned organic solvent include ketones such as methyl ethyl ketone and acetone; esters (carboxylic acid esters) such as ethyl acetate; ethers such as tetrahydrofuran and dioxane; cyclohexane; Aliphatic hydrocarbons such as n-hexane; aromatic hydrocarbons such as toluene and xylene; alcohols such as 1-propanol and 2-propanol.
黏著劑組成物(I-1)至黏著劑組成物(I-4)所含有之溶媒可僅為1種,亦可為2種以上,於為2種以上的情況,這些溶媒的組合及比率可任意選擇。The solvent contained in the adhesive composition (I-1) to the adhesive composition (I-4) may be only one type, or two or more types. In the case of two or more types, the combination and ratio of these solvents Can be chosen arbitrarily.
黏著劑組成物(I-1)至黏著劑組成物(I-4)的溶媒之含量並無特別限定,適當調節即可。The content of the solvent of the adhesive composition (I-1) to the adhesive composition (I-4) is not particularly limited, and may be adjusted appropriately.
○黏著劑組成物之製造方法黏著劑組成物(I-1)至黏著劑組成物(I-4)等的黏著劑組成物藉由調配前述黏著劑、及依需要之前述黏著劑以外的成分等用以構成黏著劑組成物之各成分而獲得。黏著劑組成物例如除了調配成分之種類不同的方面以外,能夠利用與上文所說明之熱硬化性保護膜形成用組成物的情況相同之方法而製造。○The manufacturing method of the adhesive composition The adhesive composition of the adhesive composition (I-1) to the adhesive composition (I-4) is prepared by mixing the aforementioned adhesive and components other than the aforementioned adhesive as required Obtained by the components used to make up the adhesive composition. For example, the adhesive composition can be manufactured by the same method as the case of the thermosetting protective film formation composition described above, except for the point that the types of the compounding components are different.
作為本實施形態的較佳之保護膜形成用膜之其他例,可列舉一種保護膜形成用膜,係用以於晶片之內面形成保護膜,使用前述保護膜於波長1400nm至1500nm之吸光度的最大值Xmax 、以及前述保護膜於150℃之比熱S150 ,藉由Z150 =Xmax /S150 所算出之Z150 為0.38以上;且使用前述Xmax 、以及前述保護膜於200℃之比熱S200 ,藉由Z200 =Xmax /S200 所算出之Z200 為0.33以上;前述保護膜形成用膜含有聚合物成分、熱硬化性成分及光吸收劑;前述聚合物成分為丙烯酸樹脂;前述熱硬化性成分為環氧系熱硬化性樹脂;前述光吸收劑為選自由有機色素及無機顔料所構成之群組中的1種或2種以上;前述保護膜形成用膜中之前述聚合物成分之含量相對於前述保護膜形成用膜之總質量的比例為5質量%至80質量%;前述保護膜形成用膜中之前述熱硬化性成分之含量相對於前述聚合物成分之含量100質量份的比例為10質量%至200質量份;前述保護膜形成用膜中之前述光吸收劑之含量相對於前述保護膜形成用膜之總質量的比例為0.1質量%至20質量%。As another example of the preferred protective film forming film of the present embodiment, a protective film forming film is used to form a protective film on the inner surface of a wafer. The maximum absorbance of the protective film at a wavelength of 1400nm to 1500nm is used. value X max, and the protective film to a specific heat S 150 deg.] C of 150, by the calculated sum Z 150 = X max / S 150 Z 150 is 0.38 or more; and using the X max, and the protective film is the specific heat at 200 ℃ of S 200, calculated by the Z 200 = X max / S 200 Z 200 is 0.33 or more; the protective film containing the film-forming polymer component, the thermosetting component and the light absorbing agent; the polymer component is an acrylic resin; The thermosetting component is an epoxy-based thermosetting resin; the light absorber is one or two or more selected from the group consisting of organic pigments and inorganic pigments; the polymerization of the film for forming a protective film The ratio of the content of the material component to the total mass of the protective film forming film is 5 to 80% by mass; the content of the thermosetting component in the protective film forming film is relative to the content of the polymer component 100 The ratio of parts by mass is 10% by mass to 200 parts by mass; the ratio of the content of the light absorber in the film for forming a protective film to the total mass of the film for forming a protective film is from 0.1% by mass to 20% by mass.
◇保護膜形成用複合片之製造方法前述保護膜形成用複合片可藉由將上述各層以成為對應的位置關係的方式進行積層,依需要調節一部分或全部層之形狀而進行製造。各層之形成方法如上文所說明。◇Method for manufacturing composite sheet for protective film formation The aforementioned composite sheet for protective film formation can be manufactured by laminating the above-mentioned layers in a corresponding positional relationship, and adjusting the shape of a part or all of the layers as necessary. The formation method of each layer is as described above.
例如,於製造支撐片時,於基材上積層黏著劑層的情況,只要於基材上塗敷上述黏著劑組成物再依需要使之乾燥即可。再者,亦可藉由以下方法來於基材上積層黏著劑層:於剝離膜上塗敷黏著劑組成物,依需要使之乾燥,藉此於剝離膜上預先形成黏著劑層,使該黏著劑層之露出面與基材之一表面貼合。此時,黏著劑組成物較佳為塗敷於剝離膜之剝離處理面。目前為止,雖列舉了於基材上積層黏著劑層的情況為例,但上述方法亦可適用於例如在基材上積層中間層或前述其他層的情況。For example, in the case of laminating an adhesive layer on a substrate when manufacturing a support sheet, it is only necessary to apply the above-mentioned adhesive composition on the substrate and then dry it as needed. Furthermore, the adhesive layer can also be laminated on the substrate by the following method: apply an adhesive composition on the release film, and dry it as needed, thereby forming an adhesive layer on the release film in advance to make the adhesive The exposed surface of the agent layer is attached to one of the surfaces of the substrate. In this case, the adhesive composition is preferably applied to the release treatment surface of the release film. Although the case where the adhesive layer is laminated on the base material has been cited as an example so far, the above method can also be applied to, for example, the case where the intermediate layer or the aforementioned other layers are laminated on the base material.
另一方面,例如於已積層在基材上之黏著劑層上進而積層保護膜形成用膜的情況,可於黏著劑層上塗敷保護膜形成用組成物,而直接形成保護膜形成用膜。保護膜形成用膜以外之層亦可使用形成該層用之組成物,利用相同的方法,於黏著劑層上積層該層。如此般,於已積層在基材上的任一層(以下簡稱為「第1層」)上形成新的層(以下簡稱為「第2層」)而形成連續2層的積層結構(換言之即第1層及第2層的積層結構)的情況,可適用於前述第1層上塗敷用以形成前述第2層之組成物,依需要使之乾燥的方法。其中,較佳為藉由下述方式形成連續2層的積層結構:使用形成第2層用之組成物,於剝離膜上預先形成第2層,使該已形成的第2層中相對於接觸前述剝離膜之側為相反側的露出面與第1層之露出面貼合。此時,前述組成物較佳為塗敷於剝離膜之剝離處理面。於形成積層結構後,依需要移除剝離膜即可。此處雖列舉於黏著劑層上積層保護膜形成用膜的情況為例,但例如於黏著劑層上積層中間層或前述其他層的情況等,成為對象之積層結構可任意選擇。On the other hand, for example, when a protective film forming film is laminated on an adhesive layer already laminated on a base material, the protective film forming composition can be coated on the adhesive layer to directly form the protective film forming film. For layers other than the protective film forming film, the composition for forming the layer can also be used, and the layer is laminated on the adhesive layer by the same method. In this way, a new layer (hereinafter referred to as the “second layer”) is formed on any layer that has been laminated on the substrate (hereinafter referred to as the “first layer”) to form a continuous two-layer laminate structure (in other words, the “second layer”). In the case of a layered structure of 1 layer and 2 layer), it can be applied to the method of coating the composition for forming the second layer on the first layer and drying it as needed. Among them, it is preferable to form a continuous two-layer laminated structure by using a composition for forming the second layer, and forming a second layer on the release film in advance, so that the second layer is relatively in contact with The side of the aforementioned release film is the exposed surface on the opposite side and is bonded to the exposed surface of the first layer. In this case, the aforementioned composition is preferably applied to the release-treated surface of the release film. After the build-up structure is formed, the release film can be removed as needed. Here, the case where the protective film forming film is laminated on the adhesive layer is taken as an example, but for example, when an intermediate layer or the aforementioned other layers are laminated on the adhesive layer, the target laminated structure can be arbitrarily selected.
如此般,構成保護膜形成用複合片之基材以外的層都可利用預先形成於剝離膜上,再貼合於目標層之表面的方法進行積層,故而只要依需要適當選擇採用此般步驟之層,來製造保護膜形成用複合片即可。In this way, all layers other than the base material constituting the protective film forming composite sheet can be laminated by pre-formed on the release film and then bonded to the surface of the target layer. Therefore, as long as you need to appropriately select and adopt these steps It is sufficient to manufacture a composite sheet for forming a protective film.
此外,保護膜形成用複合片通常以於該保護膜形成用複合片中之相對於支撐片為相反側之最表層(例如保護膜形成用膜)的表面貼合有剝離膜的狀態保管。從而,藉由以下述方式來獲得具剝離膜的保護膜形成用複合片:於該剝離膜(較佳為該剝離膜之剝離處理面)上塗敷保護膜形成用組成物等用以形成構成最表層之層的組成物,依需要使之乾燥,藉此於剝離膜上預先形成構成最表層之層,於該層中之相對於接觸剝離膜之側為相反側的露出面上利用上述任一種方法來積層剩餘各層,不移除剝離膜而保持貼合狀態不變。In addition, the composite sheet for forming a protective film is usually stored in a state where a release film is attached to the surface of the outermost layer (for example, a film for forming a protective film) on the opposite side to the support sheet in the composite sheet for forming a protective film. Thus, a composite sheet for forming a protective film with a release film is obtained by coating the release film (preferably the release treatment surface of the release film) with a composition for forming a protective film, etc. to form the most The composition of the surface layer is dried as needed to form a layer constituting the outermost layer on the release film in advance, and use any of the above on the exposed surface of the layer opposite to the side contacting the release film The method is to laminate the remaining layers without removing the release film and keep the attached state unchanged.
◇具保護膜的晶片之製造方法(保護膜形成用膜及保護膜形成用複合片之使用方法)前述保護膜形成用膜及保護膜形成用複合片可用於前述具保護膜的晶片之製造。◇Method for manufacturing wafer with protective film (using method of protective film forming film and protective film forming composite sheet) The aforementioned protective film forming film and protective film forming composite sheet can be used for manufacturing the aforementioned protective film wafer.
[製造方法1]作為前述保護膜形成用膜不併用支撐片即貼附於晶圓,以製造具保護膜的晶片之方法,可列舉例如下述具保護膜的晶片之製造方法(本說明書中稱為「製造方法1」),係具有下述步驟:第1積層步驟,係經由將保護膜形成用膜貼附於晶圓之內面的製程,獲得具備有晶圓以及設置於前述晶圓之內面的保護膜形成用膜之積層體(1)、或是具備有晶圓以及設置於前述晶圓之內面的保護膜的積層體(1’);第2積層步驟,係經由於前述積層體(1)中之前述保護膜形成用膜中的相對於前述晶圓側為相反側之面、或是於前述積層體(1’)中之前述保護膜中的相對於前述晶圓側為相反側之面來貼附切割片之製程,而獲得將前述切割片、前述保護膜形成用膜、及前述晶圓依序在這些層的厚度方向上進行積層而構成的積層體(2)、或是將前述切割片、前述保護膜、以及前述晶圓依序在這些層的厚度方向上進行積層而構成的積層體(2’);分割/切斷步驟,係經由將前述積層體(2)中之前述晶圓分割而製作晶片並沿著前述晶圓之分割部位切斷前述保護膜形成用膜之製程,來獲得具備有前述晶片以及設置於前述晶片之內面的切斷後之前述保護膜形成用膜而成的複數個具保護膜形成用膜的晶片被保持在前述切割片上而構成之具保護膜形成用膜的晶片集合體、或是經由將前述積層體(2’)中之前述晶圓分割而製作晶片並沿著前述晶圓之分割部位切斷前述保護膜之製程,來獲得具備有前述晶片以及設置於前述晶片之內面的切斷後之前述保護膜而成的複數個具保護膜的晶片被保持在前述切割片上而構成的具保護膜的晶片集合體;以及,具保護膜的晶片取得步驟,係經由將前述具保護膜形成用膜的晶片集合體中之具保護膜形成用膜的晶片、或是前述具保護膜的晶片集合體中之具保護膜的晶片自前述切割片扯離而進行拾取的製程,來獲得具保護膜的晶片;於前述保護膜形成用膜為硬化性的情況,進而具有硬化步驟,係自前述第1積層步驟中之前述保護膜形成用膜貼附於前述晶圓之內面後到前述具保護膜的晶片取得步驟中拾取前述具保護膜形成用膜的晶片後為止的任一階段中,使前述積層體(1)、積層體(2)、具保護膜形成用膜的晶片集合體、或具保護膜形成用膜的晶片中之保護膜形成用膜硬化而形成保護膜,藉此製作前述積層體(1’)、積層體(2’)、具保護膜的晶片集合體、或具保護膜的晶片。[Manufacturing method 1] As a method of attaching the film for forming a protective film to a wafer without using a support sheet to manufacture a chip with a protective film, for example, the following manufacturing method of a chip with a protective film (in this specification Called "manufacturing method 1"), it has the following steps: the first build-up step is a process of attaching a protective film forming film to the inner surface of the wafer to obtain a wafer equipped with and set on the aforementioned wafer The layered body (1) of the film for forming the protective film on the inner surface, or the layered body (1') provided with the wafer and the protective film provided on the inner surface of the wafer; the second layering step is through The surface of the protective film forming film in the laminated body (1) is opposite to the wafer side, or the protective film in the laminated body (1') is opposite to the wafer The process of attaching the dicing sheet on the opposite side is the process of attaching the dicing sheet to obtain a laminate (2) by laminating the dicing sheet, the protective film forming film, and the wafer in sequence in the thickness direction of these layers. ), or a layered body (2') formed by sequentially layering the dicing sheet, the protective film, and the wafer in the thickness direction of these layers; the dividing/cutting step is performed by combining the layered body (2) The process of dividing the aforementioned wafer to produce a chip and cutting the aforementioned protective film forming film along the divided portion of the aforementioned wafer to obtain a cut-off piece provided with the aforementioned chip and the inner surface of the aforementioned chip A plurality of wafers with a film for forming a protective film formed of the film for forming a protective film are held on the dicing sheet to form a wafer assembly with a film for forming a protective film, or through the layered body (2') The process in which the wafer is divided to produce a chip and the protective film is cut along the divided portion of the wafer to obtain the chip provided with the chip and the cut protective film provided on the inner surface of the chip A plurality of wafers with protective films are held on the aforementioned dicing sheet to form a wafer assembly with protective film; and, the step of obtaining the wafers with protective film is performed by combining the aforementioned wafer assembly with a protective film forming film. A wafer with a protective film forming film, or a wafer with a protective film in the aforementioned chip assembly with a protective film is pulled from the dicing sheet and picked up to obtain a wafer with a protective film; in the aforementioned protective film When the forming film is curable, there is a curing step, which is from the step of attaching the protective film forming film to the inner surface of the wafer in the first layering step to the picking-up step of the wafer with the protective film In any stage after the wafer with the film for forming a protective film, the laminate (1), the laminate (2), the wafer assembly with the film for forming a protective film, or the wafer with the film for forming a protective film is used The protective film forming film in the wafer is cured to form a protective film, thereby producing the aforementioned laminated body (1'), laminated body (2'), a wafer assembly with a protective film, or a wafer with a protective film.
在前述製造方法1之第1積層步驟中所使用之前述保護膜形成用膜為上述本發明一實施形態相關之保護膜形成用膜。The film for forming a protective film used in the first build-up step of the manufacturing method 1 is the film for forming a protective film according to one embodiment of the present invention.
製造方法1之第1積層步驟中,於前述保護膜形成用膜為硬化性的情況,在晶圓之內面貼附保護膜形成用膜後,能夠使該貼附後的保護膜形成用膜硬化,藉此獲得前述積層體(1’)。另一方面,於前述保護膜形成用膜為非硬化性的情況,藉由在晶圓之內面貼附保護膜形成用膜,直接獲得前述積層體(1’)。In the first layering step of manufacturing method 1, in the case where the protective film forming film is curable, the protective film forming film can be attached to the inner surface of the wafer, and then the attached protective film forming film can be made Hardening, thereby obtaining the aforementioned laminate (1'). On the other hand, when the film for forming a protective film is non-curable, the laminate (1') is directly obtained by sticking the film for forming a protective film on the inner surface of the wafer.
在製造方法1之第2積層步驟中所使用之前述切割片可為公知之切割片。The aforementioned dicing sheet used in the second lamination step of the manufacturing method 1 may be a well-known dicing sheet.
前述硬化步驟只要是在前述第1積層步驟中於保護膜形成用膜貼附於晶圓之內面後,則可在任一階段中進行。例如,硬化步驟可在下述任一階段中進行:在第1積層步驟中獲得積層體(1)後;在第1積層步驟與第2積層步驟之間;在第2積層步驟中獲得積層體(2)後;在第2積層步驟與分割/切斷步驟之間;在分割/切斷步驟中獲得具保護膜形成用膜的晶片集合體後;在分割/切斷步驟與具保護膜的晶片取得步驟之間;在具保護膜的晶片取得步驟中拾取具保護膜形成用膜的晶片後。前述保護膜形成用膜為非硬化性的情況,製造方法1不具有前述硬化步驟。The curing step may be performed at any stage as long as the protective film forming film is attached to the inner surface of the wafer in the first build-up step. For example, the hardening step can be carried out in any of the following stages: after the layered body (1) is obtained in the first layering step; between the first layering step and the second layering step; and the layered body is obtained in the second layering step ( 2) After; between the second layering step and the dividing/cutting step; after obtaining the wafer assembly with the protective film forming film in the dividing/cutting step; and the wafer with the protective film in the dividing/cutting step Between the obtaining steps; after picking up the wafer with the protective film forming film in the protective film obtaining step. In the case where the film for forming a protective film is non-curable, the manufacturing method 1 does not have the curing step.
製造方法1中,保護膜形成用膜之硬化無論在任一階段中都為熱硬化或能量線硬化。此時之熱硬化的條件、及能量線硬化的條件如上文所說明。In the manufacturing method 1, the curing of the film for forming a protective film is thermal curing or energy ray curing at any stage. The thermal hardening conditions and the energy ray hardening conditions at this time are as described above.
製造方法1中之前述第1積層步驟、第2積層步驟、分割/切斷步驟、具保護膜的晶片取得步驟、及硬化步驟除了使用本實施形態相關之保護膜形成用膜這點以外,都可利用與以往具保護膜的晶片之製造方法的情況相同之方法加以進行。例如,作為保護膜形成用膜之貼附對象的晶圓之厚度並無特別限定,較佳為20μm至600μm,更佳為40μm至400μm。The aforementioned first layering step, second layering step, dividing/cutting step, wafer obtaining step with protective film, and curing step in manufacturing method 1 are all except the use of the protective film forming film related to this embodiment. It can be performed by the same method as in the case of the conventional manufacturing method of a wafer with a protective film. For example, the thickness of the wafer to be attached to the protective film formation film is not particularly limited, but is preferably 20 μm to 600 μm, and more preferably 40 μm to 400 μm.
製造方法1中,亦可將分割/切斷步驟中之晶圓的分割、以及保護膜形成用膜或保護膜的切斷的順序交換。本說明書中將如此般的具保護膜的晶片之製造方法稱為製造方法2。In the manufacturing method 1, the order of the division of the wafer in the division/cutting step and the cutting of the protective film formation film or the protective film may be exchanged. In this specification, the manufacturing method of such a wafer with a protective film is referred to as manufacturing method 2.
[製造方法2]亦即,製造方法2具有:切斷/分割步驟,係經由切斷前述積層體(2)中之前述保護膜形成用膜並沿著前述保護膜形成用膜之切斷部位分割前述晶圓以製作晶片的製程,來獲得具備有前述晶片以及設置於前述晶片之內面的切斷後之前述保護膜形成用膜而成的複數個具保護膜形成用膜的晶片被保持在前述切割片上而構成之具保護膜形成用膜的晶片集合體、或是經由切斷前述積層體(2’)中之前述保護膜並沿著前述保護膜之切斷部位分割前述晶圓以製作晶片的製程,來獲得具備有前述晶片以及設置於前述晶片之內面的切斷後之前述保護膜而成的複數個具保護膜的晶片被保持在前述切割片上而構成的具保護膜的晶片集合體。製造方法2除了具有切斷/分割步驟來取代分割/切斷步驟的方面之外,都與製造方法1相同。亦即,製造方法2具有前述第1積層步驟、前述第2積層步驟、前述切斷/分割步驟、以及前述具保護膜的晶片取得步驟,於前述保護膜形成用膜為硬化性的情況,進而在自前述第1積層步驟中將前述保護膜形成用膜貼附於前述晶圓之內面後到前述具保護膜的晶片取得步驟中拾取前述具保護膜形成用膜的晶片後為止的任一階段中具有硬化步驟,係使得前述積層體(1)、積層體(2)、具保護膜形成用膜的晶片集合體、或具保護膜形成用膜的晶片中之保護膜形成用膜硬化來形成保護膜,藉此製作前述積層體(1’)、積層體(2’)、具保護膜的晶片集合體、或具保護膜的晶片。[Manufacturing method 2] That is, the manufacturing method 2 has: a cutting/dividing step of cutting the protective film forming film in the laminate (2) along the cutting portion of the protective film forming film The process of dividing the wafer to produce a wafer to obtain a plurality of wafers with protective film forming films, which are provided with the wafer and the cut protective film forming film provided on the inner surface of the wafer. A wafer assembly with a protective film forming film formed on the dicing sheet, or by cutting the protective film in the laminated body (2') and dividing the wafer along the cut portion of the protective film to produce The process of wafer manufacturing to obtain a wafer assembly with a protective film formed by a plurality of wafers with a protective film formed by the above-mentioned wafer and the above-mentioned protective film after cutting provided on the inner surface of the above-mentioned wafer and held on the dicing sheet body. The manufacturing method 2 is the same as the manufacturing method 1 except that it has a cutting/dividing step instead of the dividing/cutting step. That is, the manufacturing method 2 has the first layering step, the second layering step, the cutting/dividing step, and the wafer obtaining step with a protective film, and when the protective film forming film is curable, Any one from after the film for forming a protective film is attached to the inner surface of the wafer in the first layering step to after the wafer with the film for forming a protective film is picked up in the step of obtaining a wafer with a protective film There is a curing step in the stage, which hardens the protective film forming film in the aforementioned laminate (1), laminate (2), wafer assembly with a film for forming a protective film, or wafer with a film for forming a protective film. A protective film is formed, thereby producing the aforementioned laminated body (1'), laminated body (2'), a wafer assembly with a protective film, or a wafer with a protective film.
[製造方法3]作為前述保護膜形成用膜併用支撐片而作為保護膜形成用複合片貼附於晶圓,以製造具保護膜的晶片之方法,可列舉例如下述具保護膜的晶片之製造方法(本說明書中稱為「製造方法3」),具有:積層步驟,係經由將保護膜形成用複合片中之保護膜形成用膜貼附於晶圓之內面的製程,來獲得支撐片、保護膜形成用膜、及晶圓依序在這些層的厚度方向上積層而構成的積層體(3)、或是獲得支撐片、保護膜、及晶圓依序在這些層的厚度方向上積層而構成的積層體(3’);分割/切斷步驟,係經由將前述積層體(3)中之前述晶圓分割而製作晶片並沿著前述晶圓之分割部位切斷前述保護膜形成用膜的製程,來獲得具備有前述晶片以及設置於前述晶片之內面的切斷後之前述保護膜形成用膜而成的複數個具保護膜形成用膜的晶片被保持在前述支撐片上而構成的具保護膜形成用膜的晶片集合體,或是經由將前述積層體(3’)中之前述晶圓分割而製作晶片並沿著前述晶圓之分割部位切斷前述保護膜的製程,來獲得具備有前述晶片以及設置於前述晶片之內面的切斷後之前述保護膜而成的複數個具保護膜的晶片被保持在前述支撐片上而構成的具保護膜的晶片集合體;以及具保護膜的晶片取得步驟,係經由將前述具保護膜形成用膜的晶片集合體中之具保護膜形成用膜的晶片、或是前述具保護膜的晶片集合體中之具保護膜的晶片自前述支撐片扯離而進行拾取的製程,來獲得具保護膜的晶片;於前述保護膜形成用膜為硬化性的情況,進而在自前述積層步驟中將前述保護膜形成用複合片中的保護膜形成用膜貼附於前述晶圓之內面後到前述具保護膜的晶片取得步驟中之拾取前述具保護膜形成用膜的晶片後為止的任一階段中具有硬化步驟,係使前述積層體(3)、具保護膜形成用膜的晶片集合體、或具保護膜形成用膜的晶片中之保護膜形成用膜硬化而形成保護膜,藉此製作前述積層體(3’)、具保護膜的晶片集合體、或具保護膜的晶片。[Manufacturing method 3] A method of attaching a protective film forming composite sheet to a wafer as the aforementioned protective film forming film combined with a support sheet and manufacturing a protective film-equipped wafer, for example, includes the following protective film-equipped wafers The manufacturing method (referred to as "manufacturing method 3" in this specification) has: a lamination step, which is a process of attaching the protective film forming film in the protective film forming composite sheet to the inner surface of the wafer to obtain support A layered body (3) composed of a sheet, a protective film forming film, and a wafer sequentially stacked in the thickness direction of these layers, or a support sheet, a protective film, and a wafer are sequentially stacked in the thickness direction of these layers The laminated body (3') constituted by the upper build-up layer; the dividing/cutting step is to produce a wafer by dividing the wafer in the laminated body (3) and cut the protective film along the divided portion of the wafer The process of forming a film to obtain a plurality of wafers with protective film forming films comprising the wafer and the cut protective film forming film provided on the inner surface of the wafer. The wafers with protective film forming films are held on the support sheet. A chip assembly with a film for forming a protective film is formed, or a process in which a wafer is produced by dividing the wafer in the laminated body (3') and the protective film is cut along the divided portion of the wafer, To obtain a plurality of wafers with protective films formed by the above-mentioned wafers and the above-mentioned protective films after cutting provided on the inner surface of the above-mentioned wafers, which are held on the support sheet and have a wafer assembly with protective films; and The step of obtaining a protective film for the wafer is performed by removing the protective film-forming wafer from the protective film-forming wafer assembly or the protective film-forming wafer assembly from the protective film-forming wafer assembly. The support sheet is pulled apart and picked up to obtain a wafer with a protective film; in the case where the protective film forming film is curable, the protective film is further protected in the composite sheet for forming the protective film during the lamination step. After the film for film formation is attached to the inner surface of the wafer, there is a curing step in any of the steps from the picking up of the wafer with the film for protective film formation in the step of obtaining the wafer with the protective film. The body (3), a wafer assembly with a film for forming a protective film, or a film for forming a protective film in a wafer with a film for forming a protective film is cured to form a protective film, thereby producing the aforementioned laminated body (3'), A wafer assembly with a protective film, or a wafer with a protective film.
在前述製造方法3之積層步驟中所使用的前述保護膜形成用膜為上述本發明一實施形態相關之保護膜形成用膜。The film for forming a protective film used in the layering step of the manufacturing method 3 is the film for forming a protective film according to one embodiment of the present invention.
製造方法3之積層步驟中,於前述保護膜形成用膜為硬化性的情況,在晶圓之內面貼附保護膜形成用複合片後,能夠使該貼附後之保護膜形成用複合片中之保護膜形成用膜硬化,藉此能夠獲得前述積層體(3’)。另一方面,於前述保護膜形成用膜為非硬化性的情況,藉由在晶圓之內面貼附保護膜形成用複合片,直接獲得前述積層體(3’)。In the lamination step of manufacturing method 3, when the protective film forming film is curable, the protective film forming composite sheet can be attached to the inner surface of the wafer, and then the attached protective film forming composite sheet can be made The protective film forming film in the middle is cured, whereby the aforementioned laminate (3') can be obtained. On the other hand, when the film for forming a protective film is non-curable, the laminate (3') is directly obtained by attaching a composite sheet for forming a protective film on the inner surface of the wafer.
在製造方法3之積層步驟中所獲得之積層體(3)實質上與製造方法1之第2積層步驟中所獲得之積層體(2)相同。同樣地,在製造方法3之積層步驟中所獲得之積層體(3’)實質上與製造方法1之第2積層步驟中所獲得之積層體(2’)相同。The layered body (3) obtained in the layering step of the manufacturing method 3 is substantially the same as the layered body (2) obtained in the second layering step of the manufacturing method 1. Similarly, the layered body (3') obtained in the layering step of the manufacturing method 3 is substantially the same as the layered body (2') obtained in the second layering step of the manufacturing method 1.
前述硬化步驟只要是在前述積層步驟中之將保護膜形成用複合片中之保護膜形成用膜貼附於晶圓之內面後,則可在任一階段中進行。例如,硬化步驟可在下述任一階段中進行:於積層步驟中獲得積層體(3)後;於積層步驟與分割/切斷步驟之間;於分割/切斷步驟中獲得具保護膜形成用膜的晶片集合體後;於分割/切斷步驟與具保護膜的晶片取得步驟之間;於具保護膜的晶片取得步驟中拾取具保護膜形成用膜的晶片後。於前述保護膜形成用膜為非硬化性的情況,製造方法3不具有前述硬化步驟。The curing step may be performed at any stage as long as the protective film forming film in the protective film forming composite sheet is attached to the inner surface of the wafer in the layering step. For example, the hardening step can be carried out in any of the following stages: after the layered body (3) is obtained in the layering step; between the layering step and the dividing/cutting step; in the dividing/cutting step, the protective film is formed After the wafer assembly of the film; between the dividing/cutting step and the step of obtaining a wafer with a protective film; after picking up the wafer with a film for forming a protective film in the step of obtaining a wafer with a protective film. In the case where the film for forming a protective film is non-curable, the manufacturing method 3 does not have the curing step.
製造方法3中,保護膜形成用膜之硬化無論在任一階段中都為熱硬化或能量線硬化。此時之熱硬化的條件、及能量線硬化的條件如上文所說明。In the manufacturing method 3, the curing of the protective film forming film is thermal curing or energy ray curing at any stage. The thermal hardening conditions and the energy ray hardening conditions at this time are as described above.
製造方法3中之前述積層步驟、分割/切斷步驟、具保護膜的晶片取得步驟、及硬化步驟除了使用本實施形態相關之保護膜形成用複合片這點以外,可利用與以往具保護膜的晶片之製造方法的情況相同的方法加以進行。例如,作為保護膜形成用複合片之貼附對象的晶圓之厚度並無特別限定,較佳為20μm至600μm,更佳為40μm至400μm。In addition to the use of the composite sheet for forming a protective film related to this embodiment, the above-mentioned lamination step, dividing/cutting step, wafer obtaining step with protective film, and curing step in manufacturing method 3 can be used with the conventional protective film The same method as the case of the manufacturing method of the wafer is carried out. For example, the thickness of the wafer to be attached to the composite sheet for forming a protective film is not particularly limited, but is preferably 20 μm to 600 μm, and more preferably 40 μm to 400 μm.
[其他步驟]製造方法1亦可在無損本發明之效果的範圍內,除了前述第1積層步驟、第2積層步驟、分割/切斷步驟、具保護膜的晶片取得步驟、及硬化步驟的各步驟以外,具有不相當於這些步驟之任一種的其他步驟。同樣地,製造方法2亦可在無損本發明之效果的範圍內,除了前述第1積層步驟、第2積層步驟、切斷/分割步驟、具保護膜的晶片取得步驟、及硬化步驟的各步驟以外,具有不相當於這些步驟之任一種的其他步驟。同樣地,製造方法3亦可在無損本發明之效果的範圍內,除了前述積層步驟、分割/切斷步驟、具保護膜的晶片取得步驟、及硬化步驟的各步驟以外,具有不相當於這些步驟的其他步驟。製造方法1至製造方法3之任一種的情況,前述其他步驟的種類與進行該其他步驟的時機亦可對應於目的而任意選擇,並無特別限定。[Other steps] The manufacturing method 1 may also be within the range that does not impair the effect of the present invention, except for the first lamination step, the second lamination step, the dividing/cutting step, the wafer obtaining step with a protective film, and the hardening step. In addition to the steps, there are other steps that are not equivalent to any of these steps. Similarly, the manufacturing method 2 may be within a range that does not impair the effects of the present invention, except for the first lamination step, the second lamination step, the cutting/dividing step, the wafer obtaining step with a protective film, and the hardening step. In addition, there are other steps that are not equivalent to any of these steps. Similarly, the manufacturing method 3 may be in a range that does not impair the effects of the present invention, except for the aforementioned lamination step, division/cutting step, wafer obtaining step with protective film, and hardening step, it does not correspond to these steps. Step of the other steps. In the case of any of manufacturing method 1 to manufacturing method 3, the types of the aforementioned other steps and the timing of performing the other steps may be arbitrarily selected according to the purpose, and are not particularly limited.
◇基板裝置之製造方法在藉由上述製造方法獲得具保護膜的晶片後,除了使用該具保護膜的晶片這點之外,可利用與以往製造方法相同的方法來製造基板裝置。作為如此般的基板裝置之製造方法可列舉例如下述製造方法,具有:晶片配置步驟,係使得使用前述保護膜形成用膜所獲得之具保護膜的晶片上的突狀電極接觸於電路基板上的連接墊,藉此於前述電路基板上配置前述具保護膜的晶片;以及覆晶連接步驟,係使用鹵素加熱器將配置於前述電路基板上的前述具保護膜的晶片進行加熱,藉此使前述具保護膜的晶片上之突狀電極融解,以提高前述突狀電極與前述電路基板上之連接墊的連接強度。◇Method of manufacturing substrate device After obtaining a wafer with a protective film by the above-mentioned manufacturing method, except for using the wafer with a protective film, the substrate device can be manufactured by the same method as the conventional manufacturing method. As a manufacturing method of such a substrate device, for example, the following manufacturing method includes: a wafer arranging step in which protruding electrodes on a wafer with a protective film obtained by using the aforementioned protective film forming film are brought into contact with a circuit board The connection pad, whereby the chip with the protective film is arranged on the circuit substrate; and the flip-chip connection step is to use a halogen heater to heat the chip with the protective film arranged on the circuit substrate, thereby making The protruding electrode on the chip with the protective film is melted to improve the connection strength between the protruding electrode and the connection pad on the circuit board.
在由前述製造方法所獲得之基板裝置中,藉由使用前述具保護膜的晶片,突狀電極與電路基板上之連接墊的電性連接強度成為相較於通常更強固。因此,如此般的基板裝置具有高可靠性。這是因為在前述覆晶連接步驟中,如上文說明般,加熱時之具保護膜的晶片中的保護膜對於近紅外線之吸收量多,而相較於通常加熱時之保護膜之溫度變高之故。藉由成為更高溫後的該保護膜之作用,具保護膜的晶片上之突狀電極亦成為更高溫,受此影響突狀電極容易融解,其結果,突狀電極與電路基板上之連接墊的電性連接強度成為相較於通常更強固。In the substrate device obtained by the aforementioned manufacturing method, by using the aforementioned chip with a protective film, the electrical connection strength between the protruding electrode and the connection pad on the circuit substrate becomes stronger than usual. Therefore, such a substrate device has high reliability. This is because in the aforementioned flip-chip connection step, as explained above, the protective film in the chip with protective film absorbs more near-infrared rays when heated, and the temperature of the protective film becomes higher than that of normal heating. For this reason. By the function of the protective film after becoming higher temperature, the protruding electrode on the chip with the protective film also becomes higher temperature, and the protruding electrode is easily melted under the influence of this, as a result, the protruding electrode and the connection pad on the circuit board The electrical connection strength becomes stronger than usual.
覆晶連接步驟中,可將加熱時之保護膜的最高到達溫度設為例如250℃以上,亦可設為260℃以上、270℃以上、及280℃以上之任一種。In the flip-chip connection step, the maximum reach temperature of the protective film during heating can be set to, for example, 250°C or higher, or any of 260°C or higher, 270°C or higher, and 280°C or higher.
圖6係以示意方式顯示前述覆晶連接步驟中,使具保護膜的晶片與電路基板成為電性連接後之狀態之剖面圖。此處顯示使得具保護膜的晶片901與電路基板8成為電性連接後的狀態。具保護膜的晶片901構成為具備晶片9、以及設置於該晶片9之內面9b的切斷後之保護膜130’。晶片9之電路面9a上設置有複數個突狀電極91。電路基板8之電路面8a上設置有複數個連接墊81。晶片9上之1個突狀電極91與電路基板8上之1個連接墊81互相接觸,藉由使得具保護膜的晶片901具備保護膜130’,加熱時之突狀電極91相較於通常更容易融解,故而突狀電極91與連接墊81的接觸面相較於通常更寬廣。此外,此處所示的是具保護膜的晶片與電路基板呈電性連接後狀態的一例,連接狀態並不限於此處所示之狀態。FIG. 6 is a cross-sectional view schematically showing the state after the chip with the protective film and the circuit substrate are electrically connected in the aforementioned flip-chip connection step. Here is shown the state after the
前述製造方法中之前述晶片配置步驟及覆晶連接步驟除了使用前述具保護膜的晶片的方面以外,可利用與以往基板裝置之製造方法的情況相同的方法加以進行。例如,前述覆晶連接步驟中之具保護膜的晶片的加熱能夠使用例如搭載有鹵素加熱器之回焊爐而進行。此時,可使用鹵素加熱器,藉由照射例如1400nm至1500nm之任一者或所有波長區域的近紅外線,來加熱具保護膜的晶片。[實施例]The chip placement step and the flip chip connection step in the aforementioned manufacturing method can be performed by the same method as in the case of the conventional manufacturing method of the substrate device, except for the aspect of using the aforementioned chip with the protective film. For example, the heating of the chip with the protective film in the flip chip connection step can be performed using, for example, a reflow furnace equipped with a halogen heater. At this time, a halogen heater can be used to heat the wafer with the protective film by irradiating near infrared rays in any or all wavelength ranges from 1400 nm to 1500 nm, for example. [Example]
以下,藉由具體的實施例,就本發明進行詳細說明。但是,本發明完全不受限於以下所示之實施例。Hereinafter, the present invention will be described in detail through specific embodiments. However, the present invention is not limited to the examples shown below at all.
[樹脂之製造原料]以下顯示本實施例及參考例中簡稱之樹脂之製造原料的正式名稱。BA:丙烯酸正丁酯MA:丙烯酸甲酯HEA:丙烯酸2-羥基乙酯2EHA:丙烯酸-2-乙基己酯[Materials for the production of resins] The official names of the raw materials for the production of resins abbreviated in this embodiment and reference examples are shown below. BA: n-butyl acrylate MA: methyl acrylate HEA: 2-hydroxyethyl acrylate 2EHA: 2-ethylhexyl acrylate
[保護膜形成用組成物之製造原料]以下顯示保護膜形成用組成物之製造所使用的原料。[聚合物成分(A)](A)-1:BA(45質量份)、MA(40質量份)及HEA(15質量份)共聚所獲得之丙烯酸樹脂(重量平均分子量500000、玻璃轉移溫度-26℃)。[熱硬化性成分(B1)](B1)-1:雙酚A型環氧樹脂(三菱化學公司製造的「jER828」,環氧當量184g/eq至194g/eq)(B1)-2:雙酚A型環氧樹脂(三菱化學公司製造的「jER1055」,環氧當量800g/eq至900g/eq)(B1)-3:二環戊二烯型環氧樹脂(DIC公司製造的「Epiclon HP-7200HH」,環氧當量255g/eq至260g/eq)[熱硬化劑(B2)](B2)-1:雙氰胺(ADEKA公司製造的「Adeka Hardener EH-3636AS」,熱活性潛伏性環氧樹脂硬化劑,活性氫量21g/eq)[硬化促進劑(C)](C)-1:2-苯基-4,5-二羥基甲基咪唑(四國化成工業公司製造的「Curezol 2PHZ」)[填充劑(D)](D)-1:二氧化矽填料(Admatechs公司製造的「SC2050MA」,利用環氧化合物進行表面修飾後之二氧化矽填料,平均粒徑0.5μm)(D)-2:球狀氧化鋁(昭和電工公司製造的「CB-P02J」,平均粒徑3.0μm)(D)-3:二氧化矽填料(Admatechs公司製造的「YA050C-MJA」,平均粒徑50nm)(D)-4:不鏽鋼製粒子(將SUS(Stainless Steel)304打碎而設為平均粒徑2.0μm的粒子)[偶合劑(E)](E)-1:3-胺基丙基三甲氧基矽烷(Nippon Unicar公司製造的「A-1110」)[光吸收劑(I)](I)-1:將萘酞菁系藍色色素(Pigment Blue 15:3)32質量份、異吲哚啉酮系黃色色素(Pigment Yellow 139)18質量份、及蒽醌系紅色色素(Pigment Red 177)50質量份進行調配,以成為前述3種色素的合計量/苯乙烯丙烯酸樹脂量=1/3(質量比)的方式進行顔料化所獲得之顔料。(I)-2:碳黑(三菱化學公司製造的「MA600」,平均粒徑20nm)(I)-3:2,3,9,10,16,17,23,24-八(辛氧基)-29H,31H-酞菁銅(II) (Sigma-Aldrich公司製)(I)-4:2,9,16,23-四叔丁基-29H,31H-酞菁銅(II)(Sigma-Aldrich公司製)(I)-5:2,11,20,29-四叔丁基-2,3-萘酞菁(Sigma-Aldrich公司製)(I)-6:二亞銨系色素(Japan Carlit公司製造的「CIR-1085F」,可見光及紅外線吸收劑)[Production raw materials of the protective film forming composition] The raw materials used in the production of the protective film forming composition are shown below. [Polymer component (A)] (A)-1: Acrylic resin obtained by copolymerization of BA (45 parts by mass), MA (40 parts by mass) and HEA (15 parts by mass) (weight average molecular weight 500,000, glass transition temperature- 26°C). [Thermosetting component (B1)] (B1)-1: Bisphenol A epoxy resin ("jER828" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 184g/eq to 194g/eq) (B1)-2: Double Phenolic A type epoxy resin ("jER1055" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 800g/eq to 900g/eq) (B1)-3: Dicyclopentadiene type epoxy resin ("Epiclon HP manufactured by DIC" -7200HH", epoxy equivalent 255g/eq to 260g/eq) [Thermal Hardener (B2)] (B2)-1: Dicyandiamide ("Adeka Hardener EH-3636AS" manufactured by ADEKA Corporation, thermally active latent ring Oxygen resin hardener, active hydrogen content 21g/eq) [hardening accelerator (C)](C)-1: 2-phenyl-4,5-dihydroxymethylimidazole (manufactured by Shikoku Kasei Kogyo Co., Ltd. "Curezol 2PHZ") [filler (D)](D)-1: silica filler ("SC2050MA" manufactured by Admatechs, silica filler with epoxy compound surface modification, average particle size 0.5μm) ( D)-2: Spherical alumina ("CB-P02J" manufactured by Showa Denko Corporation, average particle size 3.0μm) (D)-3: Silica filler ("YA050C-MJA" manufactured by Admatechs Corporation, average particle size) Diameter 50nm) (D)-4: Stainless steel particles (SUS (Stainless Steel) 304 is crushed to make particles with an average particle diameter of 2.0 μm) [Coupling agent (E)] (E)-1: 3-amino group Propyl trimethoxysilane ("A-1110" manufactured by Nippon Unicar) [Light absorber (I)] (I)-1: 32 parts by mass of naphthalocyanine-based blue pigment (Pigment Blue 15: 3) , 18 parts by mass of isoindolinone-based yellow pigment (Pigment Yellow 139) and 50 parts by mass of anthraquinone-based red pigment (Pigment Red 177) are blended to become the total amount of the aforementioned three pigments per styrene acrylic resin amount = 1/3 (mass ratio) of the pigment obtained by pigmentation. (I)-2: Carbon black ("MA600" manufactured by Mitsubishi Chemical Corporation, with an average particle size of 20nm) (I)-3: 2,3,9,10,16,17,23,24-octa(octyloxy) )-29H,31H-copper phthalocyanine (II) (manufactured by Sigma-Aldrich) (I)-4: 2,9,16,23-tetra-tert-butyl-29H,31H-copper phthalocyanine (II) (Sigma-Aldrich -Aldrich Co.) (I)-5: 2,11,20,29-Tetra-tert-butyl-2,3-naphthalocyanine (Sigma-Aldrich Co.) (I)-6: Diimonium dye ( "CIR-1085F" manufactured by Japan Carlit, visible light and infrared absorber)
[實施例1][保護膜形成用膜之製造][保護膜形成用組成物(III-1)之製造]使聚合物成分(A)-1(150質量份)、熱硬化性成分(B1)-1(60質量份)、(B1)-2(20質量份)、(B1)-3(20質量份)、(B2)-1(2.2質量份)、硬化促進劑(C)-1(2.2質量份)、填充劑(D)-1(320質量份)、偶合劑(E)-1(3質量份)、光吸收劑(I)-1(10質量份)及光吸收劑(I)-2(2.7質量份)溶解或分散於甲基乙基酮,在23℃進行攪拌,藉此獲得除溶媒以外的全部成分之合計濃度為45質量%的熱硬化性之保護膜形成用組成物(III-1)。此外,此處所示之除前述溶媒以外的成分之調配量皆為不含溶媒之目標物的調配量。[Example 1] [Production of protective film forming film] [Production of protective film forming composition (III-1)] The polymer component (A)-1 (150 parts by mass) and the thermosetting component (B1) )-1 (60 parts by mass), (B1)-2 (20 parts by mass), (B1)-3 (20 parts by mass), (B2)-1 (2.2 parts by mass), hardening accelerator (C)-1 (2.2 parts by mass), filler (D)-1 (320 parts by mass), coupling agent (E)-1 (3 parts by mass), light absorber (I)-1 (10 parts by mass), and light absorber ( I)-2 (2.7 parts by mass) is dissolved or dispersed in methyl ethyl ketone and stirred at 23°C to obtain a thermosetting protective film with a total concentration of 45% by mass of all ingredients except the solvent Composition (III-1). In addition, the blending amounts of components other than the aforementioned solvents shown here are all blending amounts of the target substance without solvent.
[保護膜形成用膜之製造]使用將聚對苯二甲酸乙二酯製膜之單面藉由聚矽氧處理進行了剝離處理之剝離膜(第2剝離膜,琳得科公司製造的「SP-PET50 1031」,厚度50μm),於該剝離膜的前述剝離處理面塗敷上述所獲得之保護膜形成用組成物(III-1),於100℃乾燥2分鐘,藉此製造厚度25μm之熱硬化性之保護膜形成用膜。[Manufacturing of protective film forming film] A peeling film made of polyethylene terephthalate film on one side was peeled off by a silicone treatment (the second peeling film, manufactured by Lindk Co., Ltd.) SP-PET50 1031", thickness 50μm), the above-obtained protective film forming composition (III-1) was coated on the release-treated surface of the release film, and dried at 100°C for 2 minutes to produce a thickness of 25μm A film for forming a thermosetting protective film.
進而,於所獲得之保護膜形成用膜中不具備第2剝離膜之側的露出面貼合剝離膜(第1剝離膜,琳得科公司製造的「SP-PET38 1031」,厚度38μm)之剝離處理面,藉此獲得構成為具備保護膜形成用膜、設置於前述保護膜形成用膜之一面的第1剝離膜、及設置於前述保護膜形成用膜之另一面的第2剝離膜之積層膜。Furthermore, a peeling film (the first peeling film, "SP-PET38 1031" manufactured by Lindek Co., Ltd., thickness 38μm) was attached to the exposed surface of the obtained protective film forming film on the side not equipped with the second release film. The peeling treatment surface obtains a structure including a protective film forming film, a first peeling film provided on one side of the protective film forming film, and a second peeling film provided on the other side of the protective film forming film Laminated film.
[保護膜之評價][保護膜之Xmax 的測定]自上述所獲得之積層膜移除第1剝離膜。繼而,在空氣氛圍下,藉由將移除掉第1剝離膜之具備有第2剝離膜的保護膜形成用膜在145℃進行加熱處理2小時,使之熱硬化而形成保護膜。繼而,自前述保護膜移除第2剝離膜,針對保護膜,使用UV-Vis分光光度計(島津製作所公司製造的「UV-VIS-NIR SPECTROPHOTOMETER UV-3600」),不使用該分光光度計附屬之積分球,而在包含近紅外線區域之1400nm至3200nm的波長區域中,以每1nm來測定吸光度。並且,自該測定結果求得Xmax 。將結果顯示於表1。[Evaluation of protective film] [ Measurement of X max of protective film] The first release film was removed from the laminated film obtained above. Then, in an air atmosphere, the protective film formation film provided with the second peeling film from which the first peeling film was removed was heat-treated at 145° C. for 2 hours to thermally cure the protective film to form a protective film. Next, the second release film was removed from the protective film. For the protective film, a UV-Vis spectrophotometer ("UV-VIS-NIR SPECTROPHOTOMETER UV-3600" manufactured by Shimadzu Corporation) was used for the protective film, and the spectrophotometer attached was not used. In the 1400nm to 3200nm wavelength region including the near infrared region, the absorbance is measured every 1nm. Then, X max is obtained from the measurement result. The results are shown in Table 1.
[保護膜之S150 及S200 的測定]自上述所獲得之積層膜移除第1剝離膜。繼而,藉由使用ESPEC公司製造的烘箱,來將移除掉第1剝離膜之具備有第2剝離膜的保護膜形成用膜在145℃進行加熱處理2小時,使之熱硬化而形成保護膜。繼而,自前述保護膜移除第2剝離膜,再依據JIS K 7123:2012,使用微差掃瞄熱卡計(PerkinElmer公司製造的「PYRIS1」),將升溫速度設為10℃/min,於40℃至250℃的溫度範圍、在大氣壓下測量保護膜的微差掃描熱量。然後,自所獲得之熱流圖算出各溫度下之熱流,並考量保護膜之使用量,而算出保護膜之S150 與S200 。將結果顯示於表1。[Measurement of S 150 and S 200 of Protective Film] The first release film was removed from the laminated film obtained above. Then, by using an oven made by ESPEC, the protective film forming film with the second peeling film from which the first peeling film was removed was heat-treated at 145°C for 2 hours, and it was thermally cured to form a protective film. . Then, the second release film was removed from the aforementioned protective film, and then in accordance with JIS K 7123:2012, using a micro-difference scanning calorimeter ("PYRIS1" manufactured by PerkinElmer), the heating rate was set to 10°C/min. Measure the differential scanning heat of the protective film at a temperature range of 40°C to 250°C under atmospheric pressure. Then, calculate the heat flow at each temperature from the obtained heat flow diagram, and consider the usage of the protective film, and calculate the S 150 and S 200 of the protective film. The results are shown in Table 1.
[保護膜之Z150 及Z200 的算出]自上述所獲得之Xmax 、S150 及S200 的值算出Z150 及Z200 。將結果顯示於表1。[Calculation of Z 150 and Z 200 of the protective film] Calculate Z 150 and Z 200 from the values of X max , S 150 and S 200 obtained above. The results are shown in Table 1.
[保護膜之Tm 的測定]自上述所獲得之積層膜移除第1剝離膜。繼而,在空氣氛圍下,藉由將移除掉第1剝離膜之具備有第2剝離膜之保護膜形成用膜在145℃進行加熱處理2小時,使之熱硬化,而形成保護膜。繼而,自前述保護膜移除第2剝離膜,針對保護膜,使用UV-Vis分光光度計(島津製作所公司製造的「UV-VIS-NIR SPECTROPHOTOMETER UV-3600」),不使用該分光光度計附屬之積分球,而在400nm至750nm的波長區域(亦即可見光區)中,以每1nm測量光的穿透率。並且,自該測定結果求得Tm 。將結果顯示於表1。[Measurement of T m of protective film] The first release film was removed from the laminated film obtained above. Then, in an air atmosphere, the protective film formation film provided with the second release film from which the first release film was removed was heat-treated at 145° C. for 2 hours to be thermally cured to form a protective film. Next, the second release film was removed from the protective film. For the protective film, a UV-Vis spectrophotometer ("UV-VIS-NIR SPECTROPHOTOMETER UV-3600" manufactured by Shimadzu Corporation) was used for the protective film, and the spectrophotometer attached was not used. Integrating sphere, and in the wavelength region of 400nm to 750nm (that is, the visible light region), the light transmittance is measured per 1nm. Then, T m is obtained from the measurement result. The results are shown in Table 1.
[保護膜之Um 的測定]自上述所獲得之積層膜移除第1剝離膜。繼而,於空氣氛圍下,藉由將移除掉第1剝離膜之具備有第2剝離膜的保護膜形成用膜在145℃進行加熱處理2小時,使之熱硬化,而形成保護膜。繼而,自前述保護膜移除第2剝離膜,針對保護膜,使用UV-Vis分光光度計(島津製作所公司製造的「UV-VIS-NIR SPECTROPHOTOMETER UV-3600」),於包含近紅外線區域的1400nm至2600nm之波長區域中,以每1nm藉由SCI(Specular Component Included;包含鏡面正反射光)方式而測定包括鏡面反射光(正反射光)與擴散反射光的全光線反射光之光量。進而,針對硫酸鋇製之基準板,亦利用相同方法測量全光線反射光之光量。無論任一情況,作為試料夾都使用島津製作所公司製造的「大型試料室MPC-3100」,作為積分球使用島津製作所公司製造的「積分球附屬裝置ISR-3100」,將朝測定對象物入射之光的入射角設為8°。然後,求出前述保護膜中之測定值相對於前述基準板中之測定值的比率([保護膜中之全光線反射光之光量的測定值]/[基準板中之全光線反射光之光量的測定值]×100),亦即前述保護膜之相對全光線反射率,採用該反射率作為光之反射率。然後,自該測定結果求出Um 。將結果顯示於表1。[Measurement of U m of Protective Film] The first release film was removed from the laminated film obtained above. Then, under an air atmosphere, the protective film formation film provided with the second release film from which the first release film was removed was heat-treated at 145° C. for 2 hours to heat-cured to form a protective film. Then, the second release film was removed from the aforementioned protective film, and for the protective film, a UV-Vis spectrophotometer ("UV-VIS-NIR SPECTROPHOTOMETER UV-3600" manufactured by Shimadzu Corporation) was used for the protective film at 1400nm including the near infrared region. In the wavelength range of 2600nm, the amount of total light reflection light including specular reflection light (regular reflection light) and diffuse reflection light is measured by SCI (Specular Component Included; including specular specular reflection light) per 1 nm. Furthermore, for a reference plate made of barium sulfate, the same method was used to measure the amount of light reflected by the total light. In either case, the "Large Sample Chamber MPC-3100" manufactured by Shimadzu Corporation is used as the sample holder, and the "Integrating Sphere Attachment ISR-3100" manufactured by Shimadzu Corporation is used as the integrating sphere. The incident angle of light is set to 8°. Then, calculate the ratio of the measured value in the protective film to the measured value in the reference plate ([Measurement value of the total light reflected light in the protective film]/[Light intensity of the total light reflected in the reference plate The measured value of]×100), that is, the relative total light reflectivity of the aforementioned protective film, and the reflectivity is used as the reflectivity of light. Then, U m is obtained from the measurement result. The results are shown in Table 1.
[加熱時之保護膜之最高到達溫度的測定]自上述所獲得之積層膜移除第1剝離膜,將藉此所產生之保護膜形成用膜之露出面貼附於不具有凸塊(突狀電極)之8英寸矽晶圓(厚度350μm)的內面(相當於研磨面)。進而,自該貼附後之保護膜形成用膜移除第2剝離膜,獲得構成為積層有保護膜形成用膜與矽晶圓之積層體(1)(第1積層步驟)。[Measurement of the highest reaching temperature of the protective film during heating] The first release film was removed from the laminated film obtained above, and the exposed surface of the protective film forming film produced thereby was attached to the exposed surface of the protective film without bumps (protrusions). The inner surface (equivalent to the polished surface) of the 8-inch silicon wafer (thickness 350μm) of the shaped electrode. Furthermore, the second release film is removed from the film for forming a protective film after the attachment, and a laminate (1) in which the film for forming a protective film and a silicon wafer are laminated is obtained (first lamination step).
繼而,藉由使用ESPEC公司製造的烘箱來將該積層體(1)在145℃進行加熱處理2小時,使保護膜形成用膜熱硬化而形成保護膜(硬化步驟)。繼而,將該熱硬化後之積層體(1)逐漸冷卻後,於該積層體(1)中之前述保護膜之露出面(亦即,相對於設置有矽晶圓之側為相反側之面)貼附切割帶,藉此獲得將切割帶(相當於支撐片)、保護膜及矽晶圓依序在這些層之厚度方向上進行積層而構成的積層體(2’)(第2積層步驟)。Then, the laminate (1) was heat-treated at 145°C for 2 hours using an oven manufactured by ESPEC Corporation, and the protective film formation film was thermally cured to form a protective film (curing step). Then, after the thermally hardened laminate (1) is gradually cooled, the exposed surface of the protective film in the laminate (1) (that is, the surface opposite to the side where the silicon wafer is provided) ) Attach a dicing tape to obtain a layered body (2') formed by sequentially layering the dicing tape (equivalent to a support sheet), a protective film, and a silicon wafer in the thickness direction of these layers (second layering step) ).
繼而,使用切割刀片,將前述積層體(2’)中之矽晶圓分割(切割)為20mm×20mm的大小,並且亦將保護膜切斷為相同大小,藉此製作出將於內面具備有切斷後之保護膜的矽晶片保持為於前述切割帶上呈複數排列的狀態下之具保護膜的矽晶片集合體(分割/切斷步驟)。繼而,將該具保護膜的矽晶片集合體中之具保護膜的矽晶片自切割帶扯離而進行拾取(具保護膜的晶片取得步驟)。Then, using a dicing blade, the silicon wafer in the aforementioned laminate (2') is divided (cut) into a size of 20mm×20mm, and the protective film is also cut into the same size, thereby producing a The silicon wafer with the protective film after being cut is held as an assembly of silicon wafers with the protective film in a state in which they are arranged in plural on the dicing tape (dividing/cutting step). Then, the silicon wafer with a protective film in the assembly of silicon wafers with a protective film is pulled from the dicing tape and picked up (a step of obtaining a wafer with a protective film).
將經拾取之具保護膜的矽晶片載置於輸送帶上。此時,將具保護膜的矽晶片中之晶片朝向下而接觸於輸送帶,將保護膜朝向上,使熱電偶接觸並固定在該保護膜。將此狀態下的具保護膜的矽晶片搬送至回焊爐(相模理工公司製造的「WL-15-20DNX型」)之內部,使用位在該回焊爐之內部的鹵素加熱器,將具保護膜的矽晶片進行加熱。此時,將鹵素加熱器之輸出調節鈕(上面NO.2輸出VR)設定為100,而成為與可供實用的加熱處理條件相同。然後,使用前述熱電偶,測定利用該鹵素加熱器所進行的加熱時之保護膜之最高到達溫度。將結果顯示於表1。Place the picked up silicon wafer with protective film on the conveyor belt. At this time, the silicon wafer with the protective film faces downward to contact the conveyor belt, and the protective film faces upward so that the thermocouple is in contact with and fixed on the protective film. The silicon wafer with the protective film in this state is transferred to the inside of the reflow furnace (“WL-15-20DNX” manufactured by Sagami Riko Co., Ltd.), and the halogen heater located in the inside of the reflow furnace is used. The protective film of the silicon wafer is heated. At this time, set the output adjustment button of the halogen heater (No. 2 output VR above) to 100, which becomes the same as the practical heating treatment conditions. Then, using the aforementioned thermocouple, the highest reached temperature of the protective film at the time of heating by the halogen heater was measured. The results are shown in Table 1.
[保護膜形成用膜之製造、以及保護膜之評價][實施例2至實施例21、參考例1至參考例6]除了改變在製造保護膜形成用組成物(III-1)時之調配成分之種類及調配量的任一者或兩者而使得保護膜形成用組成物(III-1)的含有成分之種類及含量成為如表1至表4所示般以外,都利用與實施例1的情況相同的方法,來製造保護膜形成用膜,而評價保護膜。將結果顯示於表1至表4。[Production of protective film forming film and evaluation of protective film] [Example 2 to Example 21, Reference Example 1 to Reference Example 6] Except for changing the formulation when manufacturing the protective film forming composition (III-1) Either or both of the type of the components and the amount of the ingredients so that the type and content of the components contained in the protective film forming composition (III-1) are as shown in Tables 1 to 4, they are all used in the examples In the same manner as in the case of 1, a protective film formation film was produced, and the protective film was evaluated. The results are shown in Table 1 to Table 4.
[表1]
[表2]
[表3]
[表4]
由上述結果可知,實施例1至實施例21中,在Xmax 測定時的保護膜之最高到達溫度為254℃以上,明顯為高。這是因為保護膜對於包含近紅外線區域的波長區域之光的吸收量多之故。事前已確認到於搭載於電路基板的具保護膜的晶片之溫度到達如此般之區域的情況,晶片上的焊料製凸塊會融解,而使晶片與電路基板上之連接墊的電性連接強度變得強固。亦即,確認到於內面具備實施例1至實施例21之保護膜、且於電路面具有焊料製凸塊的具保護膜的晶片與電路基板的連接強度呈強固,而可構成可靠性明顯高的基板裝置。From the above results, it can be seen that in Examples 1 to 21, the maximum reached temperature of the protective film at the time of X max measurement was 254° C. or higher, which was significantly higher. This is because the protective film absorbs a large amount of light in the wavelength region including the near-infrared region. It has been confirmed in advance that when the temperature of a chip with a protective film mounted on a circuit board reaches such an area, the solder bumps on the chip will melt, and the electrical connection between the chip and the connection pad on the circuit board will be strengthened Become strong. That is, it was confirmed that the chip with the protective film of Example 1 to Example 21 on the inner surface and solder bumps on the circuit surface has strong connection strength with the circuit board, and the reliability of the structure is obvious. High substrate device.
實施例1至實施例21中,Z150 為0.39以上,Z200 為0.37以上。實施例1至實施例21中,保護膜形成用膜(組成物(III-1))所含有之光吸收劑(I)為2種至7種。實施例1至實施例21中,組成物(III-1)中之光吸收劑(I)之含量相對於除溶媒以外的所有成分之總含量的比例(亦即,熱硬化性保護膜形成用膜中之光吸收劑(I)之含量相對於熱硬化性保護膜形成用膜之總質量的比例)為2.2質量%以上,前述比例為高。因此,推測出實施例1至實施例21中,對於包含近紅外線區域之波長區域之光的吸收量多。In Examples 1 to 21, Z 150 is 0.39 or more, and Z 200 is 0.37 or more. In Example 1 to Example 21, the light absorber (I) contained in the protective film forming film (composition (III-1)) was 2 to 7 types. In Examples 1 to 21, the ratio of the content of the light absorber (I) in the composition (III-1) to the total content of all ingredients except the solvent (that is, for forming a thermosetting protective film) The ratio of the content of the light absorber (I) in the film to the total mass of the film for forming a thermosetting protective film) is 2.2% by mass or more, and the aforementioned ratio is high. Therefore, it is inferred that in Examples 1 to 21, the absorption amount of light in the wavelength region including the near-infrared region is large.
實施例1至實施例21中,Tm 為2%以下,可見光之穿透率低,而可容易視認有無保護膜之存在。再者,實施例1至實施例21中,Um 為12%以下,近紅外線之反射率為低。亦即,實施例1至實施例21之保護膜形成用膜可形成加熱時之溫度容易上升的保護膜、以及可抑制利用近紅外線之裝置的誤動作之保護膜。In Examples 1 to 21, the T m is 2% or less, the visible light transmittance is low, and the presence or absence of the protective film can be easily recognized. Furthermore, in Examples 1 to 21, U m is 12% or less, and the reflectance of near infrared rays is low. That is, the protective film forming films of Examples 1 to 21 can form a protective film whose temperature easily rises when heated, and a protective film that can suppress malfunctions of devices using near infrared rays.
相對於此,參考例1至參考例6中,Xmax 測定時之保護膜的最高到達溫度為248℃以下,相對於上述實施例的情況較低。這是因為保護膜對於包含近紅外線區域之波長區域之光的吸收量難以說是多之故。事前已確認到於搭載於電路基板的具保護膜的晶片之溫度為如此般之區域的情況,晶片上之焊料製凸塊完全未融解、或是融解不充分,而無法認為晶片與電路基板上之連接墊的電性連接強度有所提升。亦即,確認到於內面具備參考例1至參考例6之保護膜、且於電路面具有焊料製凸塊的具保護膜的晶片與電路基板的連接強度並未提升,而無法認為基板裝置之可靠性有所提升。In contrast, in Reference Example 1 to Reference Example 6, the maximum reach temperature of the protective film at the time of X max measurement was 248° C. or less, which was lower than the case of the above-mentioned Examples. This is because it is difficult to say that the protective film absorbs light in a wavelength region including the near-infrared region. It has been confirmed in advance that the temperature of the chip with a protective film mounted on the circuit board is such an area that the solder bumps on the chip are not melted at all, or the melting is insufficient, and it cannot be regarded as the chip and the circuit board. The electrical connection strength of the connection pad has been improved. That is, it was confirmed that the connection strength of the chip with the protective film with the protective film of Reference Example 1 to Reference Example 6 on the inner surface and the solder bumps on the circuit surface and the circuit board was not improved, and it could not be considered as a substrate device The reliability has been improved.
參考例1至參考例6中,Z150 為0.37以下,Z200 為0.35以下。參考例1至參考例6中,保護膜形成用膜(組成物(III-1))所含有之光吸收劑(I)為2種至4種。參考例1至參考例6中,組成物(III-1)中之光吸收劑(I)之含量相對於除溶媒以外的所有成分之總含量的比例(亦即,熱硬化性保護膜形成用膜中之光吸收劑(I)之含量相對於熱硬化性保護膜形成用膜之總質量的比例)為8.8質量%以下,前述比例在整體上較低。In Reference Example 1 to Reference Example 6, Z 150 is 0.37 or less, and Z 200 is 0.35 or less. In Reference Example 1 to Reference Example 6, the light absorber (I) contained in the protective film forming film (composition (III-1)) was 2 to 4 types. In Reference Example 1 to Reference Example 6, the ratio of the content of the light absorber (I) in the composition (III-1) to the total content of all components except the solvent (that is, for forming a thermosetting protective film) The ratio of the content of the light absorber (I) in the film to the total mass of the film for forming a thermosetting protective film) is 8.8% by mass or less, which is generally low.
[保護膜形成用複合片之製造][實施例1]使用上述實施例1中所獲得之保護膜形成用膜,接著製造保護膜形成用複合片。更具體而言,如下所述。此外,本說明書中,後續說明係將上述保護膜形成用膜之製造時與保護膜之評價時之實施例及參考例的編號維持接續使用作為保護膜形成用複合片之製造時的實施例及參考例之編號。[Production of a composite sheet for forming a protective film] [Example 1] The film for forming a protective film obtained in Example 1 above was used, and then a composite sheet for forming a protective film was produced. More specifically, it is as follows. In addition, in this specification, the subsequent description is to maintain the numbers of the examples and reference examples at the time of the production of the protective film formation film and the evaluation of the protective film as the examples and the examples at the time of the production of the composite sheet for the protective film formation. Reference example number.
[黏著劑組成物(I-4)之製造]製備非能量線硬化性之黏著劑組成物(I-4),係含有丙烯酸樹脂(100質量份)、及3官能苯二甲基二異氰酸酯交聯劑(三井武田化學公司製造的「TAKENATE D110N」)(10質量份),進而含有甲基乙基酮作為溶媒,除溶媒以外的全部成分之合計濃度為25質量%。此外,此處所示之甲基乙基酮以外的成分之含量皆為不含溶媒之目標物的含量。前述丙烯酸樹脂係將丙烯酸-2-乙基己酯(80質量份)、及丙烯酸-2-羥基乙酯(20質量份)共聚而獲得,且重量平均分子量800000的丙烯酸樹脂。[Production of Adhesive Composition (I-4)] Preparation of non-energy-ray curable adhesive composition (I-4), containing acrylic resin (100 parts by mass), and trifunctional xylylene diisocyanate The coupling agent ("TAKENATE D110N" manufactured by Mitsui Takeda Chemical Co., Ltd.) (10 parts by mass) further contains methyl ethyl ketone as a solvent, and the total concentration of all components except the solvent is 25% by mass. In addition, the content of components other than methyl ethyl ketone shown here is the content of the target substance without solvent. The aforementioned acrylic resin is an acrylic resin obtained by copolymerizing 2-ethylhexyl acrylate (80 parts by mass) and 2-hydroxyethyl acrylate (20 parts by mass), and has a weight average molecular weight of 800,000.
[支撐片之製造]使用將聚對苯二甲酸乙二酯製膜之單面藉由聚矽氧處理進行了剝離處理之剝離膜(琳得科公司製造的「SP-PET38 1031」,厚度38μm),於該剝離膜之前述剝離處理面塗敷上述所獲得之黏著劑組成物(I-4),於100℃加熱乾燥2分鐘,藉此形成厚度5μm的非能量線硬化性之黏著劑層。[Manufacturing of support sheet] Use a peeling film (SP-PET38 1031 manufactured by Lindeco, thickness 38μm) in which one side of a polyethylene terephthalate film is peeled off by silicone treatment ), apply the above-obtained adhesive composition (I-4) on the peeling treatment surface of the peeling film, and heat and dry at 100°C for 2 minutes to form a non-energy ray-curable adhesive layer with a thickness of 5μm .
繼而,使用一面為平滑面、另一面為凹凸面的聚丙烯製膜(1)(厚度80μm、無色) 作為基材,於該聚丙烯製膜之前述平滑面貼合上述所獲得之非能量線硬化性之黏著劑層的露出面,藉此製造出基材、黏著劑層及剝離膜依序在這些層之厚度方向上積層而構成之積層片、亦即具剝離膜的支撐片。Next, a polypropylene film (1) (thickness 80 μm, colorless) having a smooth surface on one side and an uneven surface on the other side was used as a substrate, and the non-energy ray obtained above was bonded to the smooth surface of the polypropylene film The exposed surface of the hardenable adhesive layer is used to produce a laminated sheet composed of a substrate, an adhesive layer and a release film in the thickness direction of these layers in sequence, that is, a support sheet with a release film.
[保護膜形成用複合片之製造]自上述所獲得之支撐片移除剝離膜。再者,自實施例1中所獲得之積層膜(亦即具備有第1剝離膜及第2剝離膜之保護膜形成用膜)移除第1剝離膜。然後,將移除掉上述剝離膜所產生之黏著劑層的露出面與移除掉上述第1剝離膜所產生之保護膜形成用膜的露出面貼合,藉此製造出基材、黏著劑層、保護膜形成用膜及第2剝離膜依序在這些層之厚度方向上積層而構成的保護膜形成用複合片。[Production of a composite sheet for forming a protective film] The release film was removed from the support sheet obtained above. Furthermore, the first release film was removed from the laminated film obtained in Example 1 (that is, the protective film formation film provided with the first release film and the second release film). Then, the exposed surface of the adhesive layer produced by removing the above-mentioned release film and the exposed surface of the protective film forming film produced by removing the above-mentioned first release film are bonded together, thereby manufacturing a base material and an adhesive A composite sheet for forming a protective film composed of layers, a film for forming a protective film, and a second release film laminated in the thickness direction of these layers in this order.
[實施例2至實施例21、參考例1至參考例6]使用實施例2至實施例21、參考例1至參考例6中所獲得之積層膜取代實施例1中所獲得之積層膜,除此以外,都利用與上述實施例1之情況相同的方法來製造保護膜形成用複合片。[Example 2 to Example 21, Reference Example 1 to Reference Example 6] Using the laminated film obtained in Example 2 to Example 21 and Reference Example 1 to Reference Example 6 instead of the laminated film obtained in Example 1, Except for this, the same method as in the case of the above-mentioned Example 1 was used to manufacture a composite sheet for forming a protective film.
[保護膜之評價][保護膜之Xmax 、S150 、S200 、Tm 及Um 的測定、及保護膜之Z150 及Z200 的算出]使用上述實施例5中所獲得之保護膜形成用複合片取代上文之實施例5中之積層膜,除此以外,都利用與上文之實施例5的情況相同之方法測定保護膜之Xmax 、S150 、S200 、Tm 及Um ,而算出保護膜之Z150 及Z200 。例如,Xmax 之測定時,自保護膜形成用複合片移除第2剝離膜,藉由將此狀態下之保護膜形成用複合片中之保護膜形成用膜在145℃進行加熱處理2小時,使之熱硬化而形成保護膜。然後,自前述保護膜移除基材及黏著劑層之積層物(亦即支撐片),針對該保護膜,測定在1400nm至3200nm之波長區域中的吸光度。S150 、S200 、Tm 及Um 的測定時亦同樣地進行保護膜的形成、以及保護膜之這些物性的測定。[Evaluation of protective film] [ Measurement of X max , S 150 , S 200 , T m and U m of the protective film, and calculation of Z 150 and Z 200 of the protective film] The protective film obtained in Example 5 above was used A composite sheet was used to replace the laminated film in Example 5 above. Except for this, the X max , S 150 , S 200 , T m and T m of the protective film were measured in the same manner as in Example 5 above. U m , and calculate the Z 150 and Z 200 of the protective film. For example, in the measurement of X max , the second release film is removed from the composite sheet for forming a protective film, and the film for forming a protective film in the composite sheet for forming a protective film in this state is heated at 145°C for 2 hours , Make it thermally harden to form a protective film. Then, the laminate of the substrate and the adhesive layer (that is, the support sheet) was removed from the protective film, and the absorbance in the wavelength region of 1400 nm to 3200 nm was measured for the protective film. When measuring S 150 , S 200 , T m and U m , the formation of the protective film and the measurement of these physical properties of the protective film were also performed in the same manner.
[加熱時之保護膜之最高到達溫度的測定]自上述實施例5中所獲得之保護膜形成用複合片移除第2剝離膜,將藉此所產生之保護膜形成用膜之露出面貼附於不具有凸塊(突狀電極)之8英寸矽晶圓(厚度350μm)的內面(相當於研磨面)。[Measurement of the highest reaching temperature of the protective film during heating] The second release film was removed from the composite sheet for forming a protective film obtained in Example 5 above, and the exposed surface of the film for forming a protective film produced thereby was pasted Attached to the inner surface (equivalent to the polished surface) of an 8-inch silicon wafer (thickness 350μm) without bumps (protruding electrodes).
繼而,使用ESPEC公司製造的烘箱來將具備有該保護膜形成用複合片之矽晶圓在145℃進行加熱處理2小時,藉此使保護膜形成用膜熱硬化而形成保護膜(硬化步驟)。藉此獲得支撐片、保護膜及矽晶圓依序在這些層的厚度方向上積層而構成的積層體(3’)(積層步驟)。往後,除了使用該積層體(3’)的方面以外,都利用與上文實施例5的情況相同之方法來進行矽晶圓之分割(切割)、保護膜之切斷(以上為分割/切斷步驟)、具保護膜的矽晶片之拾取(具保護膜的晶片取得步驟),並測定保護膜之最高到達溫度。Then, using an oven manufactured by ESPEC Corporation, the silicon wafer provided with the protective film forming composite sheet was heat-treated at 145°C for 2 hours, thereby thermally curing the protective film forming film to form a protective film (curing step) . Thereby, a laminate (3') formed by laminating the support sheet, the protective film, and the silicon wafer in the thickness direction of these layers in order is obtained (layering step). From now on, except for the use of the laminate (3'), the same method as in the case of Example 5 above was used to divide the silicon wafer (dicing) and the protective film (the above is the division/ Cutting step), pick-up of silicon wafer with protective film (getting step of wafer with protective film), and measure the maximum reach temperature of the protective film.
其結果,使用此處之保護膜形成用複合片的情況之保護膜之評價結果全部相較於使用積層膜之上文的實施例5之評價結果為完全相同、或是僅有可忽視程度之誤差而為幾乎相同,實質上為相同。[產業可利用性]As a result, the evaluation results of the protective film in the case of using the composite sheet for forming a protective film here are all the same or only negligible compared to the evaluation result of the above Example 5 using the laminated film. The errors are almost the same, but are substantially the same. [Industry Availability]
本發明可利用在以半導體裝置為代表的各種基板裝置之製造。The present invention can be used in the manufacture of various substrate devices represented by semiconductor devices.
8:電路基板
8a:電路基板之電路面
9:晶片
9a:晶片之電路面
9b:晶片之內面
10,20:支撐片
10a,20a:支撐片之一面(第1面)
11:基材
11a:基材之一面(第1面)
12:黏著劑層
12a:黏著劑層之第1面
13,23:保護膜形成用膜
13a,23a:保護膜形成用膜之第1面
13b:保護膜形成用膜之第2面
15:剝離膜
16:治具用接著劑層
16a:治具用接著劑層之第1面
16c:治具用接著劑層之側面
81:連接墊
91:突狀電極
101,102,103,104:保護膜形成用複合片
130’:切斷後之保護膜
151:第1剝離膜
152:第2剝離膜
901:具保護膜的晶片8:
[圖1]係以示意方式顯示本發明一實施形態相關的保護膜形成用膜的一例之剖面圖。[圖2]係以示意方式顯示本發明一實施形態相關的保護膜形成用複合片之一例之剖面圖。[圖3]係以示意方式顯示本發明一實施形態相關的保護膜形成用複合片之另一例之剖面圖。[圖4]係以示意方式顯示本發明一實施形態相關的保護膜形成用複合片之又一例之剖面圖。[圖5]係以示意方式顯示本發明一實施形態相關的保護膜形成用複合片之又一例之剖面圖。[圖6]係以示意方式顯示使用本發明一實施形態相關的保護膜形成用膜之情況下,具保護膜的晶片與電路基板之連接狀態的一例之剖面圖。Fig. 1 is a cross-sectional view schematically showing an example of a film for forming a protective film according to an embodiment of the present invention. Fig. 2 is a cross-sectional view schematically showing an example of a composite sheet for forming a protective film according to an embodiment of the present invention. Fig. 3 is a cross-sectional view schematically showing another example of a composite sheet for forming a protective film according to an embodiment of the present invention. Fig. 4 is a cross-sectional view schematically showing another example of the composite sheet for forming a protective film according to an embodiment of the present invention. Fig. 5 is a cross-sectional view schematically showing another example of the composite sheet for forming a protective film according to an embodiment of the present invention. [Fig. 6] Fig. 6 is a cross-sectional view schematically showing an example of the connection state of a wafer with a protective film and a circuit board when the film for forming a protective film according to an embodiment of the present invention is used.
10:支撐片 10: Support piece
10a:支撐片之一面(第1面) 10a: One side of the support sheet (side 1)
11:基材 11: Substrate
11a:基材11之第1面
11a: The first side of
12:黏著劑層 12: Adhesive layer
12a:黏著劑層12之第1面
12a: The first side of the
13:保護膜形成用膜 13: Film for forming protective film
13a:保護膜形成用膜之第1面 13a: The first side of the protective film forming film
13b:保護膜形成用膜之第2面 13b: The second side of the protective film forming film
15:剝離膜 15: Peel off the film
16:治具用接著劑層 16: Adhesive layer for jigs
16a:治具用接著劑層之第1面 16a: The first side of the adhesive layer for jigs
16c:治具用接著劑層之側面 16c: Side of the adhesive layer for jigs
101:保護膜形成用複合片 101: Composite sheet for protective film formation
Claims (8)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019-184718 | 2019-10-07 | ||
JP2019184718A JP7326100B2 (en) | 2019-10-07 | 2019-10-07 | Protective film forming film and protective film forming composite sheet |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202122527A true TW202122527A (en) | 2021-06-16 |
TWI848177B TWI848177B (en) | 2024-07-11 |
Family
ID=75302815
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW109132806A TWI848177B (en) | 2019-10-07 | 2020-09-23 | Film for forming protective film and composite sheet for forming protective film |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7326100B2 (en) |
KR (1) | KR20210041496A (en) |
CN (1) | CN112625275B (en) |
TW (1) | TWI848177B (en) |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6250265B2 (en) * | 2012-03-16 | 2017-12-20 | リンテック株式会社 | Adhesive composition, adhesive sheet, and method for manufacturing semiconductor device |
JP6405556B2 (en) * | 2013-07-31 | 2018-10-17 | リンテック株式会社 | Protective film forming film, protective film forming sheet and inspection method |
KR102356171B1 (en) | 2014-03-24 | 2022-01-26 | 린텍 가부시키가이샤 | Protection membrane forming film, protection membrane forming utilization sheet, production method and inspection method for workpiece or processed product, workpiece determined as adequate product, and processed product determined as adequate product |
JP6826452B2 (en) * | 2017-02-10 | 2021-02-03 | 三菱重工業株式会社 | Adhesive method |
CN109789666B (en) * | 2017-03-30 | 2024-06-04 | 琳得科株式会社 | Composite sheet for forming protective film |
JP7058096B2 (en) * | 2017-09-27 | 2022-04-21 | 日東電工株式会社 | Adhesive film |
WO2019131852A1 (en) * | 2017-12-28 | 2019-07-04 | 日東電工株式会社 | Semiconductor back surface adhering film |
JP7182603B2 (en) * | 2018-03-09 | 2022-12-02 | リンテック株式会社 | Composite sheet for forming protective film and method for manufacturing semiconductor chip with protective film |
JP6838018B2 (en) * | 2018-09-06 | 2021-03-03 | リンテック株式会社 | Protective film forming film, protective film forming sheet and inspection method |
-
2019
- 2019-10-07 JP JP2019184718A patent/JP7326100B2/en active Active
-
2020
- 2020-09-23 TW TW109132806A patent/TWI848177B/en active
- 2020-09-25 KR KR1020200125159A patent/KR20210041496A/en active Search and Examination
- 2020-09-29 CN CN202011052837.2A patent/CN112625275B/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN112625275A (en) | 2021-04-09 |
CN112625275B (en) | 2024-08-23 |
JP7326100B2 (en) | 2023-08-15 |
TWI848177B (en) | 2024-07-11 |
KR20210041496A (en) | 2021-04-15 |
JP2021061321A (en) | 2021-04-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI663642B (en) | Curable resin film and sheet for forming first protective film | |
TW201837136A (en) | Composite sheet for forming protective film | |
TWI719200B (en) | Protective film forming film, composite sheet for forming protective film, and method of manufacturing semiconductor chip | |
TW202028321A (en) | Heat-curable protective-membrane-forming film, composite sheet for forming protective film, and manufacturing method of chip | |
TWI743361B (en) | Resin layer forming film and resin layer forming composite sheet | |
TW202106502A (en) | Composite sheet for forming protective film | |
TW201728638A (en) | Curable resin film and sheet for forming first protective film | |
CN112625276B (en) | Film for forming protective film and composite sheet for forming protective film | |
TW201728640A (en) | Kit for heat-curable resin film and second protective film forming film, heat-curable resin film, sheet for forming first protective film, and method of forming first protective film for conductive wafer | |
TWI849223B (en) | Film for forming protective film and composite sheet for forming protective film | |
TW202122527A (en) | Film for forming protective film and composite sheet for forming protective film capable of improving electrical connection strength between a projecting electrode of a chip and a connecting pad on a circuit board | |
TWI731964B (en) | Complex sheet for forming protective film | |
TW202115433A (en) | Support sheet, film for forming protective film, composite sheet for forming protective film, and method for manufacturing workpiece with protective film in which the composite sheet for forming protective film includes a support sheet and a film for forming protective film on one side of the support sheet | |
TWI796297B (en) | Composite sheet for forming protective film | |
TW202124545A (en) | Film for forming protective film and composite sheet for forming protective film the present invention is a composite sheet for forming a protective film, comprising: a supporting sheet; and the protective film forming film provided on one side of the supporting sheet | |
TW202025264A (en) | Protective film forming film, composite sheet for forming protective film, method for inspection and method for identification | |
TW202140722A (en) | Protective film forming film, composite sheet for forming protective film, and method for conveying workpiece with protective film forming film wherein the protective film forming film contains white pigment | |
TW202111054A (en) | Film for forming protective film, composite sheet for forming protective film, and manufacturing method of workpiece processing article with protective film wherein the composite sheet for forming a protective film includes a support sheet and a film | |
TW202409227A (en) | Protective film-forming film, protective film-forming composite sheet, kit, and application of the protective film-forming film wherein the protective film-forming film has a transmittance to the near-infrared ray having a wavelength of 1300 nm of 10% or less | |
TW202348757A (en) | Protective film-forming film, composite sheet for forming protective film, method of manufacturing semiconductor device, and use of protective film-forming film providing a protective film-forming composite sheet including a support sheet and the protective film-forming film provided on one surface of the support sheet | |
TW202313339A (en) | Protective film-forming film, protective film-forming composite sheet, and method of manufacturing workpiece processed object with protective film capable of suppressing light absorbing | |
TW202239895A (en) | Protective film forming film, protective film forming composite sheet and manufacturing method of chip having protective film wherein the protective film forming film has a gel fraction of components other than inorganic fillers of 60% or more | |
TW202239602A (en) | Protective film forming film, composite sheet for forming protective film, method for manufacturing processed workpiece having protective film, and method for manufacturing workpiece having protective film capable of suppressing occurrence of an abnormality in a protective film even if a protective film forming film is thermally cured at a higher temperature | |
TW202409235A (en) | Protective film forming film, composite sheet and kit for forming protective film, and use of protective film forming film wherein the near-infrared transmittance of the protective film forming film at a wavelength of 1300 nm is 10% or less |