TW202119144A - Device and method for setting product detection threshold and storage medium - Google Patents

Device and method for setting product detection threshold and storage medium Download PDF

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TW202119144A
TW202119144A TW108140142A TW108140142A TW202119144A TW 202119144 A TW202119144 A TW 202119144A TW 108140142 A TW108140142 A TW 108140142A TW 108140142 A TW108140142 A TW 108140142A TW 202119144 A TW202119144 A TW 202119144A
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threshold
product
initial
test
judgment
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TWI721632B (en
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唐婉馨
許涵婷
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新加坡商鴻運科股份有限公司
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Abstract

A method for setting product detection threshold includes: obtaining an initial upper threshold and an initial lower threshold set by a detection device for detecting product parameters of current products; counting the first to fourth determination quantities of the current product under the initial upper threshold and the initial lower threshold, respectively; adding the minimum product parameter determined by the detection device, the initial lower threshold, and a number of values between the minimum product parameter and the initial lower threshold into a set, and adding the maximum product parameter determined by the detection device, the initial upper threshold, and a number of values between the maximum product parameter and the initial upper threshold into a set; repeating obtaining an arbitrary element from the set and setting the arbitrary element as a test threshold until the set becomes an empty set, counting the first to fourth determination quantities of the current product under the test threshold; calculating a benefit of each test threshold; defining an element with the maximum benefit of set as the suggested upper threshold and the suggested lower threshold for detecting the current product. A device for setting product detection threshold and a storage medium are also provided.

Description

產品檢測閾值設定裝置、方法及電腦可讀取存儲介質Product detection threshold setting device, method and computer readable storage medium

本發明涉及檢測技術領域,尤其涉及一種應用於產品檢測之檢測閾值設定裝置、方法及電腦可讀取存儲介質。The present invention relates to the field of detection technology, in particular to a detection threshold setting device, method and computer readable storage medium applied to product detection.

於新產品導入初期,待測物之閾值範圍通常較為嚴格,需藉由大量人工目檢結果及產線實際狀況,一步步將閾值修正到適當範圍。習知之運作方式由工程師根據產線實際狀況,多次來回檔適一段時間後才會確定最終之閾值,因此需投入較多之人力成本。比如,自動光學辨識(AOI)機台應用於SMT組裝線上,檢測電路板上之零件組裝後之品質狀況,或是檢查錫膏印刷後有否符合標準,產線工程師須設定每個待測物之閾值,若標準設定太嚴格,則假警報率過高;若標準設定太寬鬆,又會漏檢。In the initial stage of the introduction of new products, the threshold range of the object to be tested is usually strict. It is necessary to correct the threshold step by step to an appropriate range through a large number of manual visual inspection results and the actual conditions of the production line. The conventional operation method is determined by the engineer according to the actual conditions of the production line, and the final threshold will be determined after a period of time. Therefore, more labor costs are required. For example, the automatic optical identification (AOI) machine is applied to the SMT assembly line to check the quality of the parts on the circuit board after assembly, or to check whether the solder paste meets the standard after printing. The production line engineer must set each object to be tested If the standard setting is too strict, the false alarm rate will be too high; if the standard setting is too loose, the detection will be missed.

有鑑於此,有必要提供一種產品檢測閾值設定裝置、方法及電腦可讀取存儲介質,可給出合適之檢測建議閾值,使得檢測機台誤報率降到最低、效益達到最高。In view of this, it is necessary to provide a product detection threshold setting device, method, and computer readable storage medium, which can give appropriate detection thresholds, so that the false alarm rate of the detection machine is minimized and the benefit is maximized.

本發明一實施方式提供一種產品檢測閾值設定方法,所述方法包括:獲取檢測設備對待測產品之產品參數進行檢測所設定之初始檢測閾值及所述初始檢測閾值之設定方式;統計於所述初始檢測閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量,其中所述第一判定數量為所述檢測設備判定為良品,人工複判亦為良品之數量,所述第二判定數量為所述檢測設備判定為良品,人工複判為不良品之數量,所述第三判定數量為所述檢測設備判定為不良品,人工複判為良品之數量,所述第四判定數量為所述檢測設備判定為不良品,人工複判亦為不良品之數量;若所述初始檢測閾值之設定方式為單邊閾值下界,則獲取被所述檢測設備判定為不良品之所有待測產品中之最小產品參數;將所述最小產品參數、所述初始檢測閾值及所述最小產品參數與所述初始檢測閾值之間之多個數值加入一集合;從所述集合中任意取出一元素設為試驗閾值,並統計於所述試驗閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量;基於所述初始檢測閾值下所述待測產品之第一判定數量、第三判定數量及所述試驗閾值下所述待測產品之第一判定數量、第三判定數量計算所述試驗閾值之效益;重複從所述集合中任意取出一元素設為所述試驗閾值之步驟,直至所述集合為空集,以計算所述集合中每一元素之效益;及將所述集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界。An embodiment of the present invention provides a method for setting a product detection threshold. The method includes: obtaining an initial detection threshold set by a detection device for detecting product parameters of a product to be tested and a setting method of the initial detection threshold; The first judgment quantity, the second judgment quantity, the third judgment quantity, and the fourth judgment quantity of the product to be tested under the detection threshold, wherein the first judgment quantity is the inspection equipment judged to be a good product, and the manual re-judgment is also The quantity of good products, the second judged quantity is the quantity judged by the inspection equipment as good and the manual re-judgment is defective, and the third judged quantity is the quantity of the inspection equipment judged as defective and the manual re-judgment is good The fourth judged quantity is the quantity of defective products judged by the inspection equipment, and the manual re-judgment is also the quantity of defective products; if the initial detection threshold is set to the lower bound of the unilateral threshold, the inspection equipment will be acquired The smallest product parameter among all products to be tested that are judged to be defective; adding the smallest product parameter, the initial detection threshold, and multiple values between the smallest product parameter and the initial detection threshold into a set; Take any element from the set as a test threshold, and count the first, second, third, and fourth determinations of the product under test under the test threshold; based on the test threshold; The first judgment quantity and the third judgment quantity of the product under test under the initial detection threshold and the first judgment quantity and the third judgment quantity of the product under test under the test threshold are used to calculate the benefit of the test threshold; repeat from The step of randomly taking out an element from the set and setting it as the test threshold until the set is empty to calculate the benefit of each element in the set; and taking the element with the greatest benefit in the set as all The lower bound of the recommended threshold for the detection equipment to detect the product to be tested.

優選地,所述方法還包括:若所述初始檢測閾值之設定方式為單邊閾值上界,則獲取被所述檢測設備判定為不良品之所有待測產品中之最大產品參數;將所述最大產品參數、所述初始檢測閾值及所述最大產品參數與所述初始檢測閾值之間之多個數值加入一集合;及將所述集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界。Preferably, the method further includes: if the initial detection threshold is set as a unilateral threshold upper bound, obtaining the largest product parameter among all the products to be tested that are judged as defective by the detection equipment; The maximum product parameter, the initial detection threshold, and a plurality of values between the maximum product parameter and the initial detection threshold are added to a set; and the element with the greatest benefit in the set is used as the detection device to the The upper bound of the recommended threshold for the product to be tested.

優選地,所述將所述集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界之步驟還包括:若所述集合中具有最大效益之元素存於多個,則分別計算該多個元素與所述初始閾值之差值;從該多個元素中選取與所述初始閾值差值最小之元素作為目標元素;及將所述目標元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界。Preferably, the step of using the element with the greatest benefit in the set as the upper bound of the recommended threshold for the detection device to detect the product under test further includes: if the element with the greatest benefit in the set exists If there are multiple elements, the difference between the multiple elements and the initial threshold is calculated respectively; the element with the smallest difference from the initial threshold is selected from the multiple elements as the target element; and the target element is used as the detection The upper bound of the recommended threshold for the device to detect the product under test.

優選地,所述將所述集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界之步驟包括:若所述集合中具有最大效益之元素存於多個,則分別計算該多個元素與所述初始閾值之差值;從該多個元素中選取與所述初始閾值差值最小之元素作為目標元素;及將所述目標元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界。Preferably, the step of using the element with the greatest benefit in the set as the lower bound of the recommended threshold for the detection device to detect the product under test includes: if the element with the greatest benefit in the set exists in multiple , Calculate the difference between the plurality of elements and the initial threshold respectively; select the element with the smallest difference from the initial threshold from the plurality of elements as the target element; and use the target element as the detection device pair The lower bound of the recommended threshold for testing the product to be tested.

優選地,所述試驗閾值之效益藉由以下公式計算得到:BF=(TN’-TN)*COST1-(FN’-FN)*COST2,其中BF為所述試驗閾值之效益,TN’為於所述試驗閾值下所述待測產品之第一判定數量,TN為於所述初始檢測閾值下所述待測產品之第一判定數量,FN’ 為於所述試驗閾值下所述待測產品之第三判定數量,FN為於所述初始檢測閾值下所述待測產品之第三判定數量,COST1為所述檢測設備將良品判斷為不良品所帶來之成本,COST2為所述檢測設備將不良品判斷為良品所帶來之成本。Preferably, the benefit of the test threshold is calculated by the following formula: BF=(TN'-TN)*COST1-(FN'-FN)*COST2, where BF is the benefit of the test threshold, and TN' is The first determined quantity of the product under test under the test threshold, TN is the first determined quantity of the product under test under the initial detection threshold, and FN' is the product under test under the test threshold The third judgment quantity, FN is the third judgment quantity of the product under test under the initial detection threshold, COST1 is the cost incurred by the detection equipment judging a good product as a defective product, and COST2 is the detection equipment The cost of judging defective products as good products.

本發明一實施方式提供一種產品檢測閾值設定方法,所述方法包括:獲取檢測設備對待測產品之產品參數進行檢測所設定之初始下界檢測閾值及初始上界檢測閾值;統計於所述初始下界檢測閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量;獲取於所述初始下界檢測閾值下被所述檢測設備判定為不良品之所有待測產品中之最小產品參數;將所述最小產品參數、所述初始下界檢測閾值及所述最小產品參數與所述初始下界檢測閾值之間之多個數值加入第一集合;從所述第一集合中任意取出一元素設為第一試驗閾值,並統計於所述第一試驗閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量;基於所述初始下界檢測閾值下所述待測產品之第一判定數量、第三判定數量及所述第一試驗閾值下所述待測產品之第一判定數量、第三判定數量計算所述第一試驗閾值之效益;重複從所述第一集合中任意取出一元素設為所述第一試驗閾值之步驟,直至所述第一集合為空集,以計算所述第一集合中每一元素之效益;將所述第一集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界;統計於所述初始上界檢測閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量;獲取於所述初始上界檢測閾值下被所述檢測設備判定為不良品之所有待測產品中之最大產品參數;將所述最大產品參數、所述初始上界檢測閾值及所述最大產品參數與所述初始上界檢測閾值之間之多個數值加入第二集合;從所述第二集合中任意取出一元素設為第二試驗閾值,並統計於所述第二試驗閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量;基於所述初始上界檢測閾值下所述待測產品之第一判定數量、第三判定數量及所述第二試驗閾值下所述待測產品之第一判定數量、第三判定數量計算所述第二試驗閾值之效益;重複從所述第二集合中任意取出一元素設為所述第二試驗閾值之步驟,直至所述第二集合為空集,以計算所述第二集合中每一元素之效益;及將所述第二集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界;其中,所述第一判定數量為所述檢測設備判定為良品,人工複判亦為良品之數量,所述第二判定數量為所述檢測設備判定為良品,人工複判為不良品之數量,所述第三判定數量為所述檢測設備判定為不良品,人工複判為良品之數量,所述第四判定數量為所述檢測設備判定為不良品,人工複判亦為不良品之數量。An embodiment of the present invention provides a method for setting a product detection threshold, the method comprising: acquiring an initial lower detection threshold and an initial upper detection threshold set by a detection device for detecting product parameters of a product to be tested; and collecting statistics on the initial lower detection The first judgment quantity, the second judgment quantity, the third judgment quantity, and the fourth judgment quantity of the product to be tested under the threshold; to obtain all the products to be tested that are judged as defective by the testing equipment under the initial lower detection threshold The smallest product parameter in the product; adding the smallest product parameter, the initial lower bound detection threshold, and multiple values between the smallest product parameter and the initial lower bound detection threshold to the first set; from the first set Take any element out of the set as the first test threshold, and count the first, second, third, and fourth judgments of the product under test under the first test threshold; The first judgment quantity and the third judgment quantity of the product under test under the initial lower detection threshold and the first judgment quantity and the third judgment quantity of the product under test under the first test threshold are calculated for the first test The benefit of the threshold; repeat the step of taking any element from the first set as the first test threshold until the first set is an empty set to calculate the benefit of each element in the first set ; The element with the greatest benefit in the first set is used as the lower bound of the recommended threshold for the detection of the product under test by the testing device; the first judgment of the product under test under the initial upper bound detection threshold is counted Quantity, the second judgment quantity, the third judgment quantity, and the fourth judgment quantity; obtain the largest product parameter among all the products to be tested that are judged as defective by the testing equipment under the initial upper detection threshold; The maximum product parameter, the initial upper bound detection threshold, and multiple values between the maximum product parameter and the initial upper bound detection threshold are added to the second set; any element from the second set is taken as the first Two test thresholds, and count the first, second, third, and fourth judgments of the product under test under the second test threshold; based on the initial upper bound detection threshold The first judgment quantity, the third judgment quantity of the product to be tested, and the first judgment quantity and the third judgment quantity of the product under the second test threshold are used to calculate the benefit of the second test threshold; The step of randomly taking out an element from the second set as the second test threshold until the second set is an empty set to calculate the benefit of each element in the second set; and setting the second set The element with the greatest benefit in the set is used as the upper limit of the recommended threshold for the detection equipment to detect the product to be tested; wherein, the first judgment quantity is determined by the detection equipment as a good product, and manual re-judgment is also a good product. Quantity, the second judged quantity is the quantity judged by the inspection equipment as a good product and the manual re-judgment is a defective product, and the third judged quantity is the quantity judged by the testing equipment as a defective product and the manual re-judgment is a good product, The fourth judged quantity is judged as defective by the testing equipment, which is manually reproduced The judgment is also the quantity of defective products.

優選地,所述將所述第一集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界之步驟包括:若所述第一集合中具有最大效益之元素存於多個,則分別計算該多個元素與所述初始下界閾值之差值;及從該多個元素中選取與所述初始下界閾值差值最小之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界。Preferably, the step of using the element with the greatest benefit in the first set as the lower bound of the recommended threshold for the detection device to detect the product under test includes: if the element with the greatest benefit in the first set Is stored in a plurality of elements, the difference between the plurality of elements and the initial lower threshold is calculated respectively; and the element with the smallest difference from the initial lower threshold is selected from the plurality of elements as the detection device to the waiting The lower bound of the recommended threshold for testing products.

優選地,所述將所述第二集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界之步驟包括:若所述第二集合中具有最大效益之元素存於多個,則分別計算該多個元素與所述初始上界閾值之差值;從該多個元素中選取與所述初始上界閾值差值最小之元素作為目標元素;及將所述目標元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界。Preferably, the step of using the element with the greatest benefit in the second set as the upper bound of the recommended threshold for the detection device to detect the product under test includes: if the element in the second set has the greatest benefit If there are multiple elements, the difference between the multiple elements and the initial upper threshold is calculated separately; the element with the smallest difference from the initial upper threshold is selected from the multiple elements as the target element; and The target element serves as an upper bound of the recommended threshold for the detection device to detect the product to be tested.

本發明一實施方式提供一種產品檢測閾值設定裝置,所述裝置包括處理器及記憶體,所述記憶體上存儲有複數電腦程式,所述處理器用於執行記憶體中存儲之電腦程式時實現上述之產品檢測閾值設定方法之步驟。An embodiment of the present invention provides a product detection threshold setting device. The device includes a processor and a memory. A plurality of computer programs are stored on the memory. The processor is used to execute the computer programs stored in the memory to achieve the above The steps of the product detection threshold setting method.

本發明一實施方式還提供一種電腦可讀取存儲介質,所述電腦可讀取存儲介質存儲有多條指令,多條所述指令可被一個或者多個處理器執行,以實現上述之產品檢測閾值設定方法之步驟。An embodiment of the present invention also provides a computer-readable storage medium. The computer-readable storage medium stores a plurality of instructions, and the plurality of instructions can be executed by one or more processors to realize the above-mentioned product detection. Steps of threshold setting method.

與習知技術相比,上述產品檢測閾值設定裝置、方法及電腦可讀取存儲介質,藉由對設備判定為不良品之資料進行分析,可自動給出合適之檢測建議閾值,使得檢測機台誤報率降到最低、效益達到最高。Compared with the prior art, the above-mentioned product detection threshold setting device, method, and computer readable storage medium can automatically give appropriate detection recommended thresholds by analyzing the equipment judged as defective products, so that the detection machine The false alarm rate is minimized and the benefit is maximized.

請參閱圖1,檢測設備11用於對待測產品13進行檢測,以判斷待測產品13是良品還是不良品。所述檢測設備11可預先存儲有檢測標準,藉由檢測待測產品13之產品參數是否符合所述檢測標準來判斷待測產品13是良品還是不良品。比如,所述檢測設備11為AOI檢測機台,所述待測產品13為電路板,所述產品參數可是電路板之每一元器件之組裝狀況,或者錫膏印刷狀況。電路板中每一產品參數皆有一初始閾值,若量測值介於閾值內,則檢測設備11判斷其為良品;若量測值介於閾值外,則檢測設備11判斷其為不良品。經過所述檢測設備11檢測之電路板再經人工目檢後,複判結果共有以下四種情形:a). 檢測設備11判定為良品,複判後亦為良品,其數量為TN;b). 檢測設備11判定為良品,複判後為不良品,其數量為FN;c). 檢測設備11判定為不良品,複判後為良品,其數量為FP;d). 檢測設備11判定為不良品,複判後亦為不良品,其數量為TP。Please refer to FIG. 1, the testing device 11 is used for testing the product 13 to be tested to determine whether the product 13 to be tested is a good product or a defective product. The detection device 11 may pre-store a detection standard, and determine whether the product 13 to be tested is a good product or a defective product by detecting whether the product parameters of the product 13 to be tested meet the detection standard. For example, the inspection device 11 is an AOI inspection machine, the product 13 to be tested is a circuit board, and the product parameter may be the assembly status of each component of the circuit board, or the solder paste printing status. Each product parameter in the circuit board has an initial threshold. If the measured value is within the threshold, the inspection device 11 determines that it is a good product; if the measured value is outside the threshold, the inspection device 11 determines that it is a defective product. After the circuit board detected by the detection device 11 is manually visually inspected, the results of the re-judgment are as follows: a). The detection device 11 is judged to be a good product, and it is also a good product after the re-judgment, and the quantity is TN; b) The detection equipment 11 is judged as good, and the product is defective after re-judgment, and its quantity is FN; c). The detection equipment 11 is judged as a defective product, and it is a good product after the re-judgment, and its quantity is FP; d). The detection equipment 11 is judged to be a good product. Defective products are also defective after re-judgment, and their quantity is TP.

請參閱圖2,為本發明產品檢測閾值設定裝置較佳實施例之示意圖。Please refer to FIG. 2, which is a schematic diagram of a preferred embodiment of the product detection threshold setting device of the present invention.

所述產品檢測閾值設定裝置100包括記憶體10、處理器20以及存儲於所述記憶體10中並可於所述處理器20上運行之產品檢測閾值設定程式30。所述處理器20執行所述產品檢測閾值設定程式30時實現產品檢測閾值設定方法實施例中之步驟,例如圖4所示之步驟S400~S414。或者,所述處理器20執行所述產品檢測閾值設定程式30時實現產品檢測閾值設定程式實施例中各模組之功能,例如圖3中之模組101~107。The product detection threshold setting device 100 includes a memory 10, a processor 20, and a product detection threshold setting program 30 stored in the memory 10 and running on the processor 20. When the processor 20 executes the product detection threshold setting program 30, the steps in the embodiment of the product detection threshold setting method are implemented, such as steps S400 to S414 shown in FIG. 4. Alternatively, when the processor 20 executes the product detection threshold setting program 30, the functions of the modules in the embodiment of the product detection threshold setting program are implemented, such as the modules 101 to 107 in FIG. 3.

於一實施方式中,所述產品檢測閾值設定裝置100可集成於所述檢測設備11中。In one embodiment, the product detection threshold setting device 100 can be integrated in the detection device 11.

所述產品檢測閾值設定程式30可被分割成一個或多個模組,所述一個或者多個模組被存儲於所述記憶體10中,並由所述處理器20執行,以完成本發明。所述一個或多個模組可是能夠完成特定功能之一系列電腦程式指令段,所述指令段用於描述所述產品檢測閾值設定程式30於所述產品檢測閾值設定裝置100中之執行過程。例如,所述產品檢測閾值設定程式30可被分割成圖3中之第一獲取模組101、統計模組102、第二獲取模組103、加入模組104、試驗模組105、計算模組106及建議模組107。各模組具體功能參見下圖3中各模組之功能。The product detection threshold setting program 30 can be divided into one or more modules, and the one or more modules are stored in the memory 10 and executed by the processor 20 to complete the present invention . The one or more modules may be a series of computer program instruction segments capable of completing specific functions, and the instruction segments are used to describe the execution process of the product detection threshold setting program 30 in the product detection threshold setting device 100. For example, the product detection threshold setting program 30 can be divided into the first acquisition module 101, the statistics module 102, the second acquisition module 103, the addition module 104, the test module 105, and the calculation module in FIG. 3. 106 and suggested module 107. The specific functions of each module refer to the function of each module in Figure 3 below.

本領域技術人員可理解,所述示意圖僅是產品檢測閾值設定裝置100之示例,並不構成對產品檢測閾值設定裝置100之限定,可包括比圖示更多或更少之部件,或者組合某些部件,或者不同之部件,例如所述產品檢測閾值設定裝置100還可包括網路接入設備、匯流排等。Those skilled in the art can understand that the schematic diagram is only an example of the product detection threshold setting device 100, and does not constitute a limitation on the product detection threshold setting device 100. It may include more or less components than shown in the figure, or a combination of Some components, or different components, for example, the product detection threshold setting device 100 may also include network access equipment, buses, and the like.

所稱處理器20可是中央處理單元(Central Processing Unit,CPU),還可是其他通用處理器、數位訊號處理器 (Digital Signal Processor,DSP)、專用積體電路 (Application Specific Integrated Circuit,ASIC)、現成可程式設計閘陣列 (Field-Programmable Gate Array,FPGA) 或者其他可程式設計邏輯器件、分立門或者電晶體邏輯器件、分立硬體元件等。通用處理器可是微處理器或者所述處理器20亦可是任何常規之處理器等,所述處理器20可利用各種介面與匯流排連接產品檢測閾值設定裝置100之各個部分。The so-called processor 20 may be a central processing unit (Central Processing Unit, CPU), other general-purpose processors, digital signal processors (Digital Signal Processors, DSP), dedicated integrated circuits (Application Specific Integrated Circuit, ASIC), ready-made Field-Programmable Gate Array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor 20 may also be any conventional processor, etc. The processor 20 may use various interfaces and buses to connect various parts of the product detection threshold setting device 100.

所述記憶體10可用於存儲所述產品檢測閾值設定程式30與/或模組,所述處理器20藉由運行或執行存儲於所述記憶體10內之電腦程式與/或模組,以及調用存儲於記憶體10內之資料,實現所述產品檢測閾值設定裝置100之各種功能。所述記憶體10可包括高速隨機存取記憶體,還可包括非易失性記憶體,例如硬碟機、記憶體、插接式硬碟機,智慧存儲卡(Smart Media Card, SMC),安全數位(Secure Digital, SD)卡,快閃記憶體卡(Flash Card)、至少一個磁碟記憶體件、快閃記憶體器件、或其他非易失性固態記憶體件。The memory 10 can be used to store the product detection threshold setting program 30 and/or modules, the processor 20 runs or executes the computer programs and/or modules stored in the memory 10, and The data stored in the memory 10 is called to realize various functions of the product detection threshold setting device 100. The memory 10 may include a high-speed random access memory, and may also include a non-volatile memory, such as a hard disk drive, a memory, a plug-in hard disk drive, and a smart memory card (Smart Media Card, SMC), Secure Digital (SD) card, flash memory card (Flash Card), at least one magnetic disk memory device, flash memory device, or other non-volatile solid state memory device.

圖3為本發明產品檢測閾值設定程式較佳實施例之功能模組圖。3 is a functional module diagram of a preferred embodiment of the product detection threshold setting program of the present invention.

參閱圖3所示,產品檢測閾值設定程式30可包括第一獲取模組101、統計模組102、第二獲取模組103、加入模組104、試驗模組105、計算模組106及建議模組107。於一實施方式中,上述模組可為存儲於所述記憶體10中且可被所述處理器20調用執行之可程式化軟體指令。可理解之是,於其他實施方式中,上述模組亦可為固化於所述處理器20中之程式指令或固件(firmware)。Referring to FIG. 3, the product detection threshold setting program 30 may include a first acquisition module 101, a statistics module 102, a second acquisition module 103, an addition module 104, a test module 105, a calculation module 106, and a suggestion module. Group 107. In one embodiment, the above-mentioned modules may be programmable software instructions that are stored in the memory 10 and can be invoked and executed by the processor 20. It can be understood that, in other embodiments, the above-mentioned modules may also be program instructions or firmware that are solidified in the processor 20.

所述第一獲取模組101用於獲取所述檢測設備11對待測產品13之產品參數進行檢測所設定之初始檢測閾值及所述初始檢測閾值之設定方式。The first acquisition module 101 is used to acquire the initial detection threshold set by the detection device 11 for detecting the product parameters of the product 13 under test and the setting method of the initial detection threshold.

於一實施方式中,所述初始檢測閾值可是測試人員根據以往測試經驗於所述檢測設備11中設定之檢測閾值。當初始檢測閾值被設定後,所述第一獲取模組101可獲取得到所述檢測設備11所設定之初始檢測閾值。所述初始檢測閾值之設定方式可包括三種:第一種為僅設置初始閾值下界LSL,該初始檢測閾值為[LSL, ∞];第二種為僅設置初始閾值上界USL,該初始檢測閾值為[0, USL];第三種為設置了初始閾值下界LSL及初始閾值上界USL,該初始檢測閾值為[LSL, USL]。以下以僅設置初始閾值下界LSL為例進行說明。In one embodiment, the initial detection threshold may be a detection threshold set in the detection device 11 by a tester based on previous test experience. After the initial detection threshold is set, the first acquisition module 101 can obtain the initial detection threshold set by the detection device 11. The initial detection threshold can be set in three ways: the first is to set only the initial lower threshold LSL, the initial detection threshold is [LSL, ∞]; the second is to only set the initial upper threshold USL, the initial detection threshold It is [0, USL]; the third is to set the initial threshold lower bound LSL and initial threshold upper bound USL, the initial detection threshold is [LSL, USL]. The following takes only the initial threshold lower bound LSL as an example for description.

所述統計模組102用於統計於所述初始閾值下界下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量。The statistics module 102 is used to count the first determination quantity, the second determination quantity, the third determination quantity, and the fourth determination quantity of the product under test 13 under the lower bound of the initial threshold.

於一實施方式中,所述第一判斷數量為TN,即所述檢測設備11判定為良品,人工複判亦為良品之數量,所述第二判定數量為FN,即所述檢測設備11判定為良品,人工複判為不良品之數量,所述第三判定數量為FP,即所述檢測設備11判定為不良品,人工複判為良品之數量,所述第四判定數量為TP,即所述檢測設備11判定為不良品,人工複判亦為不良品之數量。In one embodiment, the first judgment quantity is TN, that is, the detection device 11 judges that it is a good product, and the manual re-judgment is also the quantity of a good product. The second judgment quantity is FN, that is, the detection device 11 judges It is a good product, and the manual re-judgment is the quantity of defective products. The third judgment quantity is FP, that is, the detection device 11 judges the defective product and the manual re-judgment is the quantity of good products. The fourth judgment quantity is TP, that is The detection equipment 11 determines that it is a defective product, and the manual re-judgment is also the quantity of the defective product.

於一實施方式中,由於每一所述待測產品13需要進行人工複判,所述第一判定數量、第二判定數量、第三判定數量及第四判定數量可由人工複判統計得到,再錄入至所述檢測設備11,進而所述統計模組102可統計得到於所述初始閾值下界下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量。In one embodiment, since each of the products 13 to be tested requires manual re-judgment, the first judgment quantity, second judgment quantity, third judgment quantity, and fourth judgment quantity can be obtained by manual re-judgment statistics. Entered into the detection device 11, and then the statistics module 102 can obtain the first determination quantity, the second determination quantity, the third determination quantity, and the fourth determination of the product under test 13 under the lower bound of the initial threshold. Quantity.

所述第二獲取模組103用於獲取被所述檢測設備11判定為不良品之所有待測產品13中之最小產品參數。The second acquisition module 103 is used to acquire the minimum product parameters of all the products to be tested 13 determined as defective by the testing equipment 11.

於一實施方式中,由於是以僅設置初始閾值下界LSL為例進行說明,則檢測設備11判為不良品之量測範圍為[0, LSL],判為良品之量測範圍為[LSL, ∞]。於實際生產中,由於生產環境、生產參數等不能處於理想之生產狀態,所述檢測設備11可檢測得到多個設備判定之不良品,其產品參數之量測範圍於[0, LSL]之間,所述第二獲取模組103可獲取得到所有設備判定為不良品中之最小產品參數。舉例而言,LSL=10mm,設備判定為不良品之產品參數包括5 mm、6 mm、5 mm、8 mm、9 mm、7 mm,則待測產品13為不良品之最小產品參數為5mm。In one embodiment, since only the initial threshold lower limit LSL is set as an example for description, the measurement range of the detection device 11 as a defective product is [0, LSL], and the measurement range as a good product is [LSL, ∞]. In actual production, because the production environment, production parameters, etc. cannot be in an ideal production state, the inspection equipment 11 can detect defective products judged by multiple equipment, and the measurement range of its product parameters is between [0, LSL] , The second acquisition module 103 can acquire the smallest product parameter among all equipment judged to be defective. For example, if LSL=10mm, the product parameters judged as defective by the equipment include 5 mm, 6 mm, 5 mm, 8 mm, 9 mm, and 7 mm, and the minimum product parameter for the product 13 to be tested as defective is 5 mm.

所述加入模組104用於將所述最小產品參數、所述初始閾值下界及所述最小產品參數與所述初始閾值下界之間之多個數值加入一集合。The adding module 104 is configured to add the minimum product parameter, the initial threshold lower bound, and multiple values between the minimum product parameter and the initial threshold lower bound to a set.

於一實施方式中,該多個數值可是所述最小產品參數與所述初始閾值下界之間之整數值,該多個數值還可是與所述初始閾值下界或所述最小產品參數構成一等差數列,等差數列之差值可根據實際需求進行設定。當所述加入模組104將所述最小產品參數、所述初始閾值下界及所述最小產品參數與所述初始閾值下界之間之多個數值加入所述集合後,所述集合即包括了多個元素。In one embodiment, the multiple values may be integer values between the minimum product parameter and the lower bound of the initial threshold, and the multiple values may also constitute an arithmetic difference with the lower bound of the initial threshold or the minimum product parameter. The difference between the sequence and the arithmetic sequence can be set according to actual needs. When the adding module 104 adds the minimum product parameter, the lower bound of the initial threshold, and multiple values between the minimum product parameter and the lower bound of the initial threshold, the set includes multiple values. Elements.

所述試驗模組105用於從所述集合中任意取出一元素設為試驗閾值,並統計於所述試驗閾值下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量。The test module 105 is used to randomly extract an element from the set as a test threshold, and count the first determination quantity, the second determination quantity, and the third determination of the product under test 13 under the test threshold. Quantity and the fourth judgment quantity.

於一實施方式中,試驗模組105可從所述集合中任意取出一元素設為試驗閾值,並統計於所述試驗閾值下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量。In one embodiment, the test module 105 can randomly select an element from the set as a test threshold, and count the first determination quantity, second determination quantity, and the second determination quantity of the product under test 13 under the test threshold. The third judgment quantity and the fourth judgment quantity.

可理解所述試驗模組105可重複元素取出過程,直至所述集合為空集,即可統計得到所述集合中每一元素所對應之第一判定數量、第二判定數量、第三判定數量及第四判定數量。It can be understood that the test module 105 can repeat the element extraction process until the set is empty, and then the first judgment quantity, the second judgment quantity, and the third judgment quantity corresponding to each element in the set can be obtained by statistics. And the fourth judgment quantity.

所述計算模組106用於基於所述初始閾值下界下所述待測產品13之第一判定數量、第三判定數量及所述試驗閾值下所述待測產品13之第一判定數量、第三判定數量計算所述試驗閾值之效益。The calculation module 106 is configured to be based on the first judgment quantity and the third judgment quantity of the product under test 13 under the lower bound of the initial threshold, and the first judgment quantity and the first judgment quantity of the product under test 13 under the test threshold. 3. Determine the number to calculate the benefit of the test threshold.

於一實施方式中,當所述試驗模組105得到於所述試驗閾值下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量時,所述計算模組106可基於所述初始閾值下界下所述待測產品13之第一判定數量、第三判定數量及所述試驗閾值下所述待測產品13之第一判定數量、第三判定數量計算所述試驗閾值之效益。可理解所述集合中之每一元素均是一試驗閾值,所述計算模組106可以相同之計算方式計算得到每一元素之效益。In one embodiment, when the test module 105 obtains the first, second, third, and fourth judgments of the product 13 under the test threshold, the The calculation module 106 can be based on the first judgment quantity and the third judgment quantity of the product under test 13 under the lower bound of the initial threshold, and the first judgment quantity and the third judgment quantity of the product under test 13 under the test threshold. Calculate the benefit of the test threshold. It can be understood that each element in the set is a test threshold, and the calculation module 106 can calculate the benefit of each element in the same calculation method.

於一實施方式中,所述試驗閾值之效益可根據實際需求設定計算公式,比如藉由以下公式計算得到:BF=(TN’-TN)*COST1-(FN’-FN)*COST2,其中BF為所述試驗閾值之效益,TN’為於所述試驗閾值下所述待測產品13之第一判定數量,TN為於所述初始閾值下界下所述待測產品13之第一判定數量,FN’ 為於所述試驗閾值下所述待測產品13之第三判定數量,FN為於所述初始閾值下界下所述待測產品13之第三判定數量,COST1為所述檢測設備11將良品判斷為不良品所帶來之成本,COST2為所述檢測設備11將不良品判斷為良品所帶來之成本。In one embodiment, the benefit of the test threshold can be calculated according to actual needs. For example, it can be calculated by the following formula: BF=(TN'-TN)*COST1-(FN'-FN)*COST2, where BF For the benefit of the test threshold, TN' is the first determined quantity of the product under test 13 under the test threshold, TN is the first determined quantity of the product under test 13 under the lower bound of the initial threshold, FN' is the third judged quantity of the product under test 13 under the test threshold, FN is the third judged quantity of the product under test 13 under the lower bound of the initial threshold, and COST1 is the test equipment 11 The good product is judged to be the cost caused by the defective product, and COST2 is the cost caused by the detection equipment 11 judging the defective product as a good product.

所述建議模組107用於將所述集合中具有最大效益之元素作為所述檢測設備11對所述待測產品13進行檢測之建議閾值下界。The suggestion module 107 is configured to use the element with the greatest benefit in the set as the lower bound of the suggestion threshold for the detection device 11 to detect the product 13 under test.

於一實施方式中,當計算模組106計算得到所述集合中每一元素之效益時,所述建議模組107可從該些計算得到之效益中查找具有最大效益之元素,並將具有最大效益之元素作為所述檢測設備11對所述待測產品13進行檢測之建議閾值下界。In one embodiment, when the calculation module 106 calculates the benefit of each element in the set, the suggestion module 107 can find the element with the greatest benefit from the calculated benefits, and will have the greatest benefit. The element of benefit serves as the lower bound of the recommended threshold for the detection device 11 to detect the product 13 under test.

於一實施方式中,若產生最大效益之元素不僅一個,則所述建議模組107可取最接近所述初始閾值下界之元素作為所述建議閾值下界。具體地,若所述集合中具有最大效益之元素存於多個,則所述建議模組107可分別計算該多個元素與所述初始閾值下界之差值,再從該多個元素中選取與所述初始閾值下界差值最小之元素作為目標元素,最後將所述目標元素設定為所述檢測設備11對所述待測產品13進行檢測之建議閾值下界。In one embodiment, if there is more than one element that produces the greatest benefit, the suggestion module 107 may select the element closest to the lower bound of the initial threshold as the lower bound of the suggested threshold. Specifically, if there are multiple elements in the set with the greatest benefit, the suggestion module 107 may calculate the difference between the multiple elements and the lower bound of the initial threshold, and then select from the multiple elements The element with the smallest difference from the lower bound of the initial threshold is taken as the target element, and finally the target element is set as the recommended lower bound of the threshold for the detection device 11 to detect the product 13 under test.

於一實施方式中,若所述初始檢測閾值之設定方式為僅設置初始閾值上界USL。則檢測設備11判為不良品之量測範圍為[USL, ∞],判為良品之量測範圍為[0, USL]。所述檢測設備11可檢測得到多個設備判定之不良品,其產品參數之量測範圍於[USL, ∞]之間,所述第二獲取模組103可獲取得到所有設備判定為不良品中之最大產品參數。舉例而言,USL=10mm,設備判定為不良品之產品參數包括15 mm、16 mm、15 mm、18 mm、19 mm、17 mm,則待測產品13為不良品之最大產品參數為19mm。In one embodiment, if the initial detection threshold is set in a manner that only the initial upper threshold USL is set. Then, the measuring range judged by the testing equipment 11 as a defective product is [USL, ∞], and the measuring range judged as a good product is [0, USL]. The detection device 11 can detect defective products judged by multiple equipment, and the measurement range of its product parameters is between [USL, ∞], and the second acquisition module 103 can acquire all equipment judged as defective products The maximum product parameters. For example, USL=10mm, and the product parameters judged by the equipment as defective include 15 mm, 16 mm, 15 mm, 18 mm, 19 mm, and 17 mm, and the maximum product parameter for which the product 13 to be tested is defective is 19 mm.

於一實施方式中,所述加入模組104可將所述最大產品參數、所述初始閾值上界及所述最大產品參數與所述初始閾值上界之間之多個數值加入一集合。該多個數值可是所述最大產品參數與所述初始閾值上界之間之整數值,該多個數值還可是與所述初始閾值上界或所述最大產品參數構成一等差數列,等差數列之差值可根據實際需求進行設定。當所述加入模組104將所述最大產品參數、所述初始閾值上界及所述最大產品參數與所述初始閾值上界之間之多個數值加入所述集合後,所述集合即包括了多個元素。所述試驗模組105可從所述集合中任意取出一元素設為試驗閾值,並統計於所述試驗閾值下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量。In one embodiment, the adding module 104 may add the maximum product parameter, the upper bound of the initial threshold value, and multiple values between the maximum product parameter and the upper bound of the initial threshold value into a set. The multiple numerical values may be integer values between the maximum product parameter and the upper bound of the initial threshold, and the multiple numerical values may also form an arithmetic sequence with the upper bound of the initial threshold or the maximum product parameter. The difference of the sequence can be set according to actual needs. When the adding module 104 adds the maximum product parameter, the upper bound of the initial threshold, and multiple values between the maximum product parameter and the upper bound of the initial threshold to the set, the set includes Multiple elements. The test module 105 can select any element from the set as a test threshold, and count the first, second, and third judgments of the product under test 13 under the test threshold. And the fourth judgment quantity.

於一實施方式中,試驗模組105同樣可從所述集合中任意取出一元素設為試驗閾值,並統計於所述試驗閾值下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量。所述計算模組106可基於所述初始閾值上界下所述待測產品13之第一判定數量、第三判定數量及所述試驗閾值下所述待測產品13之第一判定數量、第三判定數量計算所述試驗閾值之效益。In one embodiment, the test module 105 can also take any element from the set as a test threshold, and count the first and second determined quantities of the product under test 13 under the test threshold. , The third judgment quantity and the fourth judgment quantity. The calculation module 106 may be based on the first judgment quantity and the third judgment quantity of the product under test 13 under the upper limit of the initial threshold, and the first judgment quantity and the first judgment quantity of the product under test 13 under the test threshold. 3. Determine the number to calculate the benefit of the test threshold.

於一實施方式中,當所述試驗模組105得到於所述試驗閾值下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量時,所述計算模組106可基於所述初始閾值上界下所述待測產品13之第一判定數量、第三判定數量及所述試驗閾值下所述待測產品13之第一判定數量、第三判定數量計算所述試驗閾值之效益。In one embodiment, when the test module 105 obtains the first, second, third, and fourth judgments of the product 13 under the test threshold, the The calculation module 106 can be based on the first judgment quantity and the third judgment quantity of the product under test 13 under the upper limit of the initial threshold, and the first judgment quantity and the third judgment of the product under test 13 under the test threshold. Calculate the benefit of the test threshold by quantity.

於一實施方式中,當計算模組106計算得到所述集合中每一元素之效益時,所述建議模組107可從該些計算得到之效益中查找具有最大效益之元素,並將具有最大效益之元素作為所述檢測設備11對所述待測產品13進行檢測之建議閾值上界。In one embodiment, when the calculation module 106 calculates the benefit of each element in the set, the suggestion module 107 can find the element with the greatest benefit from the calculated benefits, and will have the greatest benefit. The element of benefit serves as the upper bound of the recommended threshold for the detection device 11 to detect the product 13 under test.

於一實施方式中,若產生最大效益之元素不僅一個,則所述建議模組107可取最接近所述初始閾值上界之元素作為所述建議閾值上界。具體地,若所述集合中具有最大效益之元素存於多個,則所述建議模組107可分別計算該多個元素與所述初始閾值上界之差值,再從該多個元素中選取與所述初始閾值上界差值最小之元素作為目標元素,最後將所述目標元素設定為所述檢測設備11對所述待測產品13進行檢測之建議閾值上界。In one embodiment, if there is more than one element that produces the greatest benefit, the suggestion module 107 may select the element closest to the upper bound of the initial threshold as the upper bound of the suggested threshold. Specifically, if there are multiple elements in the set with the greatest benefit, the suggestion module 107 can calculate the difference between the multiple elements and the upper bound of the initial threshold, and then select the element from the multiple elements. The element with the smallest difference from the upper bound of the initial threshold is selected as the target element, and finally the target element is set as the recommended upper bound of the threshold for the detection device 11 to detect the product 13 under test.

於一實施方式中,若所述初始檢測閾值之設定方式為同時設定了初始閾值下界LSL及初始閾值上界USL,則檢測設備11判為不良品之量測範圍為[USL, ∞]及[0, USL],判為良品之量測範圍為[LSL, USL]。基於上述確定建議閾值下界之方式,對在於[0, USL] 區間設備判定之不良品,可找到所述檢測設備11對所述待測產品13進行檢測之建議閾值下界,於此不再重複敘述。基於上述確定建議閾值上界之方式,對在於[USL, ∞] 區間設備判定之不良品,可找到所述檢測設備11對所述待測產品13進行檢測之建議閾值上界,於此不再重複敘述。In one embodiment, if the initial detection threshold is set in a way that the initial lower threshold LSL and the initial upper threshold USL are set at the same time, the measurement range of the detection device 11 as a defective product is [USL, ∞] and [ 0, USL], the measurement range judged as good product is [LSL, USL]. Based on the above method of determining the lower limit of the recommended threshold, for the defective product judged by the equipment in the [0, USL] interval, the lower limit of the recommended threshold for the detection device 11 to detect the product under test 13 can be found, which will not be repeated here . Based on the above method of determining the upper bound of the recommended threshold, for the defective products judged by the equipment in the [USL, ∞] interval, the upper bound of the recommended threshold for the detection device 11 to detect the product under test 13 can be found. Repeat the narrative.

圖4為本發明一實施方式中產品檢測閾值設定方法之流程圖。根據不同之需求,所述流程圖中步驟之順序可改變,某些步驟可省略。4 is a flowchart of a method for setting a product detection threshold in an embodiment of the present invention. According to different needs, the order of the steps in the flowchart can be changed, and some steps can be omitted.

步驟S400,獲取檢測設備11對待測產品13之產品參數進行檢測所設定之初始檢測閾值及所述初始檢測閾值之設定方式。In step S400, the initial detection threshold set by the detection device 11 for detecting the product parameters of the product 13 to be tested and the setting method of the initial detection threshold are acquired.

步驟S402,統計於所述初始檢測閾值下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量。Step S402: Count the first judgment quantity, the second judgment quantity, the third judgment quantity, and the fourth judgment quantity of the product 13 under test under the initial detection threshold.

步驟S404,若所述初始檢測閾值之設定方式為單邊閾值下界,則獲取被所述檢測設備11判定為不良品之所有待測產品13中之最小產品參數。In step S404, if the setting method of the initial detection threshold is the lower bound of the unilateral threshold, the minimum product parameter of all the products to be tested 13 judged as defective by the detection device 11 is obtained.

步驟S406,將所述最小產品參數、所述初始檢測閾值及所述最小產品參數與所述初始檢測閾值之間之多個數值加入一集合。Step S406: Add the minimum product parameter, the initial detection threshold, and multiple values between the minimum product parameter and the initial detection threshold into a set.

步驟S408,從所述集合中任意取出一元素設為試驗閾值,並統計於所述試驗閾值下所述待測產品13之第一判定數量、第二判定數量、第三判定數量及第四判定數量。Step S408: Take any element from the set as a test threshold, and count the first, second, third, and fourth judgments of the product under test 13 under the test threshold. Quantity.

步驟S410,基於所述初始檢測閾值下所述待測產品13之第一判定數量、第三判定數量及所述試驗閾值下所述待測產品13之第一判定數量、第三判定數量計算所述試驗閾值之效益。Step S410, based on the first judgment quantity and the third judgment quantity of the product under test 13 under the initial detection threshold, and the first judgment quantity and the third judgment quantity of the product under test 13 under the test threshold. Describe the benefits of the test threshold.

步驟S412,重複從所述集合中任意取出一元素設為所述試驗閾值之步驟,直至所述集合為空集,以計算所述集合中每一元素之效益。Step S412: Repeat the step of randomly extracting an element from the set as the test threshold until the set is empty, so as to calculate the benefit of each element in the set.

步驟S414,將所述集合中具有最大效益之元素作為所述檢測設備11對所述待測產品13進行檢測之建議閾值下界。In step S414, the element with the greatest benefit in the set is used as the lower bound of the recommended threshold for the detection device 11 to detect the product 13 under test.

上述產品檢測閾值設定裝置、方法及電腦可讀取存儲介質,藉由對設備判定為不良品之資料進行分析,可自動給出合適之檢測建議閾值,使得檢測機台誤報率降到最低、效益達到最高。The above-mentioned product detection threshold setting device, method, and computer readable storage medium can automatically give appropriate detection thresholds by analyzing the equipment judged to be defective products, so that the false alarm rate of the detection machine is minimized and beneficial Reach the highest.

綜上所述,本發明符合發明專利要件,爰依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,本發明之範圍並不以上述實施方式為限,舉凡熟悉本案技藝之人士爰依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。In summary, the present invention meets the requirements of an invention patent, and Yan filed a patent application in accordance with the law. However, the above are only the preferred embodiments of the present invention, and the scope of the present invention is not limited to the above embodiments. Anyone familiar with the art of the present case makes equivalent modifications or changes based on the spirit of the present invention. Should be covered in the scope of the following patent applications.

11:檢測設備 13:待測產品 10:記憶體 20:處理器 30:產品檢測閾值設定程式 101:第一獲取模組 102:統計模組 103:第二獲取模組 104:加入模組 105:試驗模組 106:計算模組 107:建議模組 100:產品檢測閾值設定裝置11: Testing equipment 13: Product to be tested 10: Memory 20: processor 30: Product detection threshold setting program 101: The first acquisition module 102: Statistics Module 103: The second acquisition module 104: add module 105: Test Module 106: calculation module 107: Suggested Module 100: Product detection threshold setting device

圖1是本發明一實施方式之待測產品之檢測環境示意圖。FIG. 1 is a schematic diagram of a testing environment for a product to be tested according to an embodiment of the present invention.

圖2是本發明一實施方式之產品檢測閾值設定裝置之功能模組圖。Fig. 2 is a functional module diagram of a product detection threshold setting device according to an embodiment of the present invention.

圖3是本發明一實施方式之產品檢測閾值設定程式之功能模組圖。3 is a functional module diagram of a product detection threshold setting program according to an embodiment of the present invention.

圖4是本發明一實施方式之產品檢測閾值設定方法之流程圖。Fig. 4 is a flowchart of a method for setting a product detection threshold according to an embodiment of the present invention.

Claims (10)

一種產品檢測閾值設定方法,所述方法包括: 獲取檢測設備對待測產品之產品參數進行檢測所設定之初始檢測閾值及所述初始檢測閾值之設定方式; 統計於所述初始檢測閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量,其中所述第一判定數量為所述檢測設備判定為良品,人工複判亦為良品之數量,所述第二判定數量為所述檢測設備判定為良品,人工複判為不良品之數量,所述第三判定數量為所述檢測設備判定為不良品,人工複判為良品之數量,所述第四判定數量為所述檢測設備判定為不良品,人工複判亦為不良品之數量; 若所述初始檢測閾值之設定方式為單邊閾值下界,則獲取被所述檢測設備判定為不良品之所有待測產品中之最小產品參數; 將所述最小產品參數、所述初始檢測閾值及所述最小產品參數與所述初始檢測閾值之間之多個數值加入一集合; 從所述集合中任意取出一元素設為試驗閾值,並統計於所述試驗閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量; 基於所述初始檢測閾值下所述待測產品之第一判定數量、第三判定數量及所述試驗閾值下所述待測產品之第一判定數量、第三判定數量計算所述試驗閾值之效益; 重複從所述集合中任意取出一元素設為所述試驗閾值之步驟,直至所述集合為空集,以計算所述集合中每一元素之效益;及 將所述集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界。A method for setting a product detection threshold, the method comprising: obtaining an initial detection threshold set by a detection device for detecting product parameters of a product to be tested and a setting method of the initial detection threshold; Counting the first, second, third, and fourth judgments of the product to be tested under the initial detection threshold, where the first judgment is that the detection device judges it to be a good product, Manual re-judgment is also the quantity of good products. The second judged quantity is the quantity judged by the testing equipment as good and manual re-judgment as defective. The third judged quantity is the quantity judged as defective by the testing equipment. The re-judgment is the quantity of good products, the fourth judged quantity is the quantity of defective products judged by the testing equipment, and the manual re-judgment is also the quantity of defective products; If the setting method of the initial detection threshold is the lower bound of the unilateral threshold, obtain the minimum product parameter among all the products to be tested that are judged as defective by the detection equipment; Adding the minimum product parameter, the initial detection threshold, and multiple values between the minimum product parameter and the initial detection threshold into a set; Take any element from the set as a test threshold, and count the first, second, third, and fourth judgments of the product to be tested under the test threshold; Calculate the benefit of the test threshold based on the first judgment quantity and the third judgment quantity of the product under test under the initial detection threshold, and the first judgment quantity and the third judgment quantity of the product under test under the test threshold ; Repeat the step of randomly taking out an element from the set as the test threshold until the set is empty to calculate the benefit of each element in the set; and The element with the greatest benefit in the set is used as the recommended lower bound of the threshold for the detection device to detect the product under test. 如申請專利範圍第1項所述之方法,還包括: 若所述初始檢測閾值之設定方式為單邊閾值上界,則獲取被所述檢測設備判定為不良品之所有待測產品中之最大產品參數; 將所述最大產品參數、所述初始檢測閾值及所述最大產品參數與所述初始檢測閾值之間之多個數值加入一集合;及 將所述集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界。The method described in item 1 of the scope of patent application also includes: If the setting method of the initial detection threshold is the upper limit of the unilateral threshold, the maximum product parameter among all the products to be tested that are judged to be defective by the detection equipment is acquired; Adding the maximum product parameter, the initial detection threshold, and multiple values between the maximum product parameter and the initial detection threshold into a set; and The element with the greatest benefit in the set is used as the upper bound of the recommended threshold for the detection device to detect the product under test. 如申請專利範圍第2項所述之方法,其中所述將所述集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界之步驟還包括: 若所述集合中具有最大效益之元素存於多個,則分別計算該多個元素與所述初始閾值之差值; 從該多個元素中選取與所述初始閾值差值最小之元素作為目標元素;及 將所述目標元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界。The method described in item 2 of the scope of patent application, wherein the step of using the element with the greatest benefit in the set as the upper bound of the recommended threshold for the testing equipment to test the product under test further includes: If there are multiple elements with the greatest benefit in the set, the difference between the multiple elements and the initial threshold is calculated respectively; Selecting the element with the smallest difference from the initial threshold from the plurality of elements as the target element; and The target element is used as the upper bound of the recommended threshold for the detection device to detect the product under test. 如申請專利範圍第1項所述之方法,其中所述將所述集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界之步驟包括: 若所述集合中具有最大效益之元素存於多個,則分別計算該多個元素與所述初始閾值之差值; 從該多個元素中選取與所述初始閾值差值最小之元素作為目標元素;及 將所述目標元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界。The method described in item 1 of the scope of the patent application, wherein the step of using the element with the greatest benefit in the set as the lower bound of the recommended threshold for the detection device to detect the product under test includes: If there are multiple elements with the greatest benefit in the set, the difference between the multiple elements and the initial threshold is calculated respectively; Selecting the element with the smallest difference from the initial threshold from the plurality of elements as the target element; and The target element is used as the lower bound of the recommended threshold for the detection device to detect the product under test. 如申請專利範圍第1項所述之方法,其中所述試驗閾值之效益藉由以下公式計算得到:BF=(TN’-TN)*COST1-(FN’-FN)*COST2,其中BF為所述試驗閾值之效益,TN’為於所述試驗閾值下所述待測產品之第一判定數量,TN為於所述初始檢測閾值下所述待測產品之第一判定數量,FN’ 為於所述試驗閾值下所述待測產品之第三判定數量,FN為於所述初始檢測閾值下所述待測產品之第三判定數量,COST1為所述檢測設備將良品判斷為不良品所帶來之成本,COST2為所述檢測設備將不良品判斷為良品所帶來之成本。The method described in item 1 of the scope of patent application, wherein the benefit of the test threshold is calculated by the following formula: BF=(TN'-TN)*COST1-(FN'-FN)*COST2, where BF is the result The benefit of the test threshold, TN' is the first determined quantity of the product under test under the test threshold, TN is the first determined quantity of the product under test under the initial detection threshold, and FN' is The third judged quantity of the product under test under the test threshold, FN is the third judged quantity of the product under test under the initial detection threshold, and COST1 is the test equipment that judges a good product as a defective product. For the cost, COST2 is the cost incurred by the testing equipment in judging defective products as good products. 一種產品檢測閾值設定方法,所述方法包括: 獲取檢測設備對待測產品之產品參數進行檢測所設定之初始下界檢測閾值及初始上界檢測閾值; 統計於所述初始下界檢測閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量; 獲取於所述初始下界檢測閾值下被所述檢測設備判定為不良品之所有待測產品中之最小產品參數; 將所述最小產品參數、所述初始下界檢測閾值及所述最小產品參數與所述初始下界檢測閾值之間之多個數值加入第一集合; 從所述第一集合中任意取出一元素設為第一試驗閾值,並統計於所述第一試驗閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量; 基於所述初始下界檢測閾值下所述待測產品之第一判定數量、第三判定數量及所述第一試驗閾值下所述待測產品之第一判定數量、第三判定數量計算所述第一試驗閾值之效益; 重複從所述第一集合中任意取出一元素設為所述第一試驗閾值之步驟,直至所述第一集合為空集,以計算所述第一集合中每一元素之效益; 將所述第一集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界; 統計於所述初始上界檢測閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量; 獲取於所述初始上界檢測閾值下被所述檢測設備判定為不良品之所有待測產品中之最大產品參數; 將所述最大產品參數、所述初始上界檢測閾值及所述最大產品參數與所述初始上界檢測閾值之間之多個數值加入第二集合; 從所述第二集合中任意取出一元素設為第二試驗閾值,並統計於所述第二試驗閾值下所述待測產品之第一判定數量、第二判定數量、第三判定數量及第四判定數量; 基於所述初始上界檢測閾值下所述待測產品之第一判定數量、第三判定數量及所述第二試驗閾值下所述待測產品之第一判定數量、第三判定數量計算所述第二試驗閾值之效益; 重複從所述第二集合中任意取出一元素設為所述第二試驗閾值之步驟,直至所述第二集合為空集,以計算所述第二集合中每一元素之效益;及 將所述第二集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界; 其中,所述第一判定數量為所述檢測設備判定為良品,人工複判亦為良品之數量,所述第二判定數量為所述檢測設備判定為良品,人工複判為不良品之數量,所述第三判定數量為所述檢測設備判定為不良品,人工複判為良品之數量,所述第四判定數量為所述檢測設備判定為不良品,人工複判亦為不良品之數量。A method for setting a product detection threshold, the method comprising: Obtain the initial lower detection threshold and the initial upper detection threshold set by the testing equipment for testing the product parameters of the product to be tested; Count the first judgment quantity, second judgment quantity, third judgment quantity, and fourth judgment quantity of the product to be tested under the initial lower detection threshold; Acquiring the minimum product parameter of all the products to be tested that are judged to be defective by the testing equipment under the initial lower detection threshold; Adding the minimum product parameter, the initial lower bound detection threshold, and multiple values between the minimum product parameter and the initial lower bound detection threshold into the first set; An element is randomly selected from the first set as the first test threshold, and the first determination quantity, second determination quantity, third determination quantity, and first determination quantity of the product to be tested under the first test threshold are counted 4. The number of judgments; The first determination quantity and the third determination quantity of the product to be tested under the initial lower detection threshold value and the first determination quantity and the third determination quantity of the product under test under the first test threshold are calculated. 1. The benefit of the test threshold; Repeating the step of randomly extracting an element from the first set as the first test threshold until the first set is an empty set, so as to calculate the benefit of each element in the first set; Taking the element with the greatest benefit in the first set as the lower bound of the recommended threshold for the detection device to detect the product under test; Count the first judgment quantity, second judgment quantity, third judgment quantity, and fourth judgment quantity of the product to be tested under the initial upper detection threshold; Acquiring the maximum product parameter of all products to be tested that are judged to be defective by the testing equipment under the initial upper detection threshold; Adding the maximum product parameter, the initial upper bound detection threshold, and multiple values between the maximum product parameter and the initial upper bound detection threshold into the second set; Take an element from the second set arbitrarily as the second test threshold, and count the first, second, third, and third judgments of the product to be tested under the second test threshold. 4. The number of judgments; The calculation is based on the first judgment quantity and the third judgment quantity of the product under test under the initial upper detection threshold and the first judgment quantity and the third judgment quantity of the product under test under the second test threshold. The benefit of the second test threshold; Repeat the step of randomly taking out an element from the second set as the second test threshold until the second set is an empty set to calculate the benefit of each element in the second set; and Taking the element with the greatest benefit in the second set as the upper bound of the recommended threshold for the detection device to detect the product under test; Wherein, the first judged quantity is the quantity judged by the inspection equipment as good products, the manual re-judgment is also the quantity of good products, and the second judged quantity is the quantity judged by the inspection equipment as good products and the manual re-judgment is defective. The third judged quantity is the quantity judged as defective by the inspection equipment and the manual re-judgment is good. The fourth judged quantity is judged as defective by the inspection equipment, and the manual re-judgment is also the quantity of defective products. 如申請專利範圍第6項所述之方法,其中所述將所述第一集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界之步驟包括: 若所述第一集合中具有最大效益之元素存於多個,則分別計算該多個元素與所述初始下界閾值之差值;及 從該多個元素中選取與所述初始下界閾值差值最小之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值下界。The method described in item 6 of the scope of patent application, wherein the step of using the most effective element in the first set as the lower bound of the recommended threshold for the testing equipment to test the product under test includes: If there are multiple elements with the greatest benefit in the first set, the difference between the multiple elements and the initial lower threshold is calculated respectively; and The element with the smallest difference from the initial lower threshold is selected from the plurality of elements as the recommended lower threshold for the detection device to detect the product under test. 如申請專利範圍第6項所述之方法,其中所述將所述第二集合中具有最大效益之元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界之步驟包括: 若所述第二集合中具有最大效益之元素存於多個,則分別計算該多個元素與所述初始上界閾值之差值; 從該多個元素中選取與所述初始上界閾值差值最小之元素作為目標元素;及 將所述目標元素作為所述檢測設備對所述待測產品進行檢測之建議閾值上界。The method described in item 6 of the scope of the patent application, wherein the step of using the element with the greatest benefit in the second set as the upper bound of the recommended threshold for the detection device to detect the product under test includes: If there are multiple elements with the greatest benefit in the second set, the difference between the multiple elements and the initial upper threshold is calculated respectively; Selecting the element with the smallest difference from the initial upper threshold from the plurality of elements as the target element; and The target element is used as the upper bound of the recommended threshold for the detection device to detect the product under test. 一種產品檢測閾值設定裝置,包括處理器及記憶體,所述記憶體上存儲有複數電腦程式,所述處理器用於執行記憶體中存儲之電腦程式時實現如請求項1至8任一項所述之產品檢測閾值設定方法之步驟。A product detection threshold setting device, comprising a processor and a memory, wherein a plurality of computer programs are stored on the memory, and the processor is used to execute the computer programs stored in the memory to realize the requirements as specified in any one of request items 1 to 8. The steps of the product detection threshold setting method described. 一種電腦可讀取存儲介質,所述電腦可讀取存儲介質存儲有多條指令,多條所述指令可被一個或者多個處理器執行,以實現如請求項1至8任一項所述之產品檢測閾值設定方法之步驟。A computer-readable storage medium, wherein the computer-readable storage medium stores a plurality of instructions, and the plurality of instructions can be executed by one or more processors, so as to realize any one of claims 1 to 8 The steps of the product detection threshold setting method.
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