TW202033574A - Fluoropolymer composition, molded article, and injection molded article - Google Patents

Fluoropolymer composition, molded article, and injection molded article Download PDF

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TW202033574A
TW202033574A TW108147099A TW108147099A TW202033574A TW 202033574 A TW202033574 A TW 202033574A TW 108147099 A TW108147099 A TW 108147099A TW 108147099 A TW108147099 A TW 108147099A TW 202033574 A TW202033574 A TW 202033574A
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fluoropolymer composition
molded product
mass
conductive carbon
pfa
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今村均
向井恵吏
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日商大金工業股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K7/00Use of ingredients characterised by shape
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    • C08K7/06Elements
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L27/00Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Compositions of derivatives of such polymers
    • C08L27/02Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Compositions of derivatives of such polymers not modified by chemical after-treatment
    • C08L27/12Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Compositions of derivatives of such polymers not modified by chemical after-treatment containing fluorine atoms
    • C08L27/18Homopolymers or copolymers or tetrafluoroethene

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Abstract

Provided is a fluoropolymer composition containing an electroconductive carbon compound and a copolymer that contains a tetrafluoroethylene unit and a fluoroalkyl vinyl ether unit, wherein the fluoroalkyl vinyl ether unit content is 5.0-8.0 mass% relative to the total monomer units constituting the copolymer, the volume resistivity of the fluoropolymer composition is 104-109 [Omega]·cm, and the melt flow rate of the fluoropolymer composition is 1-100 g/10 min.

Description

氟聚合物組成物、成形品及射出成形品Fluoropolymer composition, molded product, and injection molded product

本發明係關於一種氟聚合物組成物、成形品及射出成形品。The present invention relates to a fluoropolymer composition, molded product, and injection molded product.

半導體製造過程中通常包含利用藥液處理晶圓之步驟。作為用於此種處理步驟之裝置,例如,於專利文獻1中記載有一種半導體洗淨裝置,其具備如將進行洗淨之晶圓固定於上表面且能夠旋轉之旋轉台的晶圓旋轉基座,此種晶圓旋轉基座配置於由凹形容器所構成之晶圓杯內。 [先前技術文獻] [專利文獻]The semiconductor manufacturing process usually includes the step of treating wafers with chemical liquids. As an apparatus used in such a processing step, for example, Patent Document 1 describes a semiconductor cleaning apparatus that includes a wafer rotating base such as a rotating table that fixes the wafer to be cleaned on the upper surface and can rotate. The wafer rotating base is arranged in a wafer cup formed by a concave container. [Prior Technical Literature] [Patent Literature]

[專利文獻1]日本特開2012-54269號公報[Patent Document 1] JP 2012-54269 A

[發明所欲解決之課題][The problem to be solved by the invention]

本發明之目的在於提供一種氟聚合物組成物,其可獲得晶圓杯等大型且難以帶電之氟聚合物成形品。 [解決課題之技術手段]The object of the present invention is to provide a fluoropolymer composition that can obtain large-sized and hard-to-charge fluoropolymer molded products such as wafer cups. [Technical means to solve the problem]

根據本發明,提供一種氟聚合物組成物,其含有:含有四氟乙烯單位及氟烷基乙烯醚單位的共聚物、及導電性碳化合物,相對於構成上述共聚物之所有單體單位,上述氟烷基乙烯醚單位之含量為5.0〜8.0質量%,上述氟聚合物組成物之體積電阻率為104 〜109 Ω・cm,上述氟聚合物組成物之熔體流動速率為1〜100 g/10分鐘。According to the present invention, there is provided a fluoropolymer composition comprising: a copolymer containing tetrafluoroethylene units and fluoroalkyl vinyl ether units, and a conductive carbon compound, with respect to all monomer units constituting the copolymer, the above The content of the fluoroalkyl vinyl ether unit is 5.0 to 8.0% by mass, the volume resistivity of the fluoropolymer composition is 10 4 to 10 9 Ω·cm, and the melt flow rate of the fluoropolymer composition is 1 to 100 g/10 minutes.

上述共聚物較佳為選自由下述共聚物所組成之群中之至少一種:僅由四氟乙烯單位及氟烷基乙烯醚單位構成之共聚物、以及0.1〜10質量%之來自於可與四氟乙烯及氟烷基乙烯醚共聚之單體的單體單位且合計為90〜99.9質量%之四氟乙烯單位及氟烷基乙烯醚單位的共聚物。 上述導電性碳化合物較佳為選自由導電性碳黑及奈米碳管所組成之群中之至少一種。 相對於上述氟聚合物組成物,上述導電性碳化合物之含量較佳為0.02〜15質量%。The above-mentioned copolymer is preferably at least one selected from the group consisting of the following copolymers: a copolymer composed only of tetrafluoroethylene units and fluoroalkyl vinyl ether units, and 0.1~10% by mass from which can be combined with The monomer unit of the monomer copolymerized with tetrafluoroethylene and fluoroalkyl vinyl ether is a copolymer of 90 to 99.9% by mass of tetrafluoroethylene units and fluoroalkyl vinyl ether units. The conductive carbon compound is preferably at least one selected from the group consisting of conductive carbon black and carbon nanotubes. The content of the conductive carbon compound is preferably 0.02-15% by mass relative to the fluoropolymer composition.

又,根據本發明,提供一種藉由將上述氟聚合物組成物成形而獲得之成形品。Furthermore, according to the present invention, there is provided a molded product obtained by molding the above-mentioned fluoropolymer composition.

又,根據本發明,提供一種藉由將上述氟聚合物組成物射出成形而獲得之射出成形品。 [發明之效果]Furthermore, according to the present invention, there is provided an injection molded product obtained by injection molding the above-mentioned fluoropolymer composition. [Effects of Invention]

根據本發明,能夠提供一種可獲得難以帶電之大型氟聚合物成形品的氟聚合物組成物。According to the present invention, it is possible to provide a fluoropolymer composition that can obtain a large fluoropolymer molded product that is difficult to charge.

以下,對本發明之具體實施形態詳細地進行說明,但本發明並非限定於以下之實施形態。Hereinafter, specific embodiments of the present invention will be described in detail, but the present invention is not limited to the following embodiments.

如專利文獻1所示,晶圓杯以包圍晶圓旋轉基座之方式設置,收容自晶圓旋轉基座飛散之水或藥液。此種晶圓杯一般為大型,且要求優異之耐化學品性,因此藉由切割聚四氟乙烯塊來製造。As shown in Patent Document 1, the wafer cup is arranged to surround the wafer rotating base, and contains water or chemical liquid scattered from the wafer rotating base. Such wafer cups are generally large and require excellent chemical resistance, so they are manufactured by cutting polytetrafluoroethylene blocks.

然而,切割聚四氟乙烯塊需要較長之時間負擔及較大之經濟負擔,故要求新的材料及製造方法。作為氟聚合物成形品之製造方法,亦已知有將可熔融加工之氟聚合物熔融成形之方法,但藉由將可熔融加工之氟聚合物成形所得之大型成形品存在易產生龜裂,且不易成形之問題。However, cutting polytetrafluoroethylene blocks requires a longer time burden and a greater economic burden, so new materials and manufacturing methods are required. As a method of manufacturing fluoropolymer molded products, there is also known a method of melt-molding a melt-processable fluoropolymer, but large molded products obtained by molding a melt-processable fluoropolymer are prone to cracks. And the problem is not easy to form.

進而,了解到:若飛散之水或藥液等附著於藉由將氟聚合物成形所得之大型成形品,該等水或藥液成為液滴而於成形品之表面流動,則該成形品會因與液滴之摩擦帶電或剝離帶電而帶電。氟聚合物之成形品一旦帶電,則不易放電。因此,可能產生如下問題:向晶圓杯等成形品飛散之液滴由於靜電排斥而於帶有靜電之狀態返回至晶圓,使半導體裝置發生故障等,且推測其原因在於成形品之帶電。因此,半導體製造過程中之生產線之靜電對策係影響半導體裝置之生產之「良率」的重要課題。Furthermore, it has been learned that if scattered water or chemical liquid adheres to a large molded product obtained by molding a fluoropolymer, and the water or chemical liquid becomes droplets and flows on the surface of the molded product, the molded product will It is charged due to frictional charging or peeling charging with the droplets. Once the fluoropolymer molded product is charged, it is not easy to discharge. Therefore, there may be a problem that the droplets scattered on the molded product such as the wafer cup return to the wafer in a static state due to electrostatic repulsion, causing the semiconductor device to malfunction, etc., and it is presumed that the cause is the charging of the molded product. Therefore, countermeasures against static electricity in production lines in the semiconductor manufacturing process are an important issue that affects the "yield rate" of the production of semiconductor devices.

本發明之氟聚合物組成物含有氟聚合物及導電性碳化合物,該氟聚合物被嚴格限定比例地含有四氟乙烯單位及氟烷基乙烯醚單位,且體積電阻率及熔體流動速率被調整於嚴格受限之範圍內。本發明之氟聚合物組成物由於具備該等構成,故成形性優異,可在無較長之時間負擔及較大之經濟負擔之情況下提供耐龜裂性優異、且難以帶電之大型成形品。The fluoropolymer composition of the present invention contains a fluoropolymer and a conductive carbon compound. The fluoropolymer contains tetrafluoroethylene units and fluoroalkyl vinyl ether units in a strictly limited ratio, and the volume resistivity and melt flow rate are controlled by Adjust within a strictly restricted range. Since the fluoropolymer composition of the present invention has these constitutions, it has excellent moldability, and can provide large molded products with excellent crack resistance and difficult to be charged without a long time burden and a large economic burden. .

本發明之氟聚合物組成物含有如下共聚物(以下記為PFA),該共聚物含有四氟乙烯單位(TFE單位)及氟烷基乙烯醚單位(FAVE單位)。The fluoropolymer composition of the present invention contains a copolymer (hereinafter referred to as PFA) which contains a tetrafluoroethylene unit (TFE unit) and a fluoroalkyl vinyl ether unit (FAVE unit).

上述PFA較佳為具有熔融加工性之氟樹脂。本發明中,所謂熔融加工性係指可使用擠出機及射出成形機等習知之加工機器使聚合物熔融而進行加工。因此,具有熔融加工性之氟樹脂利用下述測定方法所測得之熔體流動速率通常為0.01〜500 g/10分鐘。The above-mentioned PFA is preferably a fluororesin having melt processability. In the present invention, the term "melt processability" means that the polymer can be melted and processed using conventional processing machines such as extruders and injection molding machines. Therefore, the melt flow rate of a fluororesin with melt processability measured by the following measuring method is usually 0.01 to 500 g/10 minutes.

相對於所有單體單位,上述PFA中FAVE單位之含量為5.0〜8.0質量%,自可獲得耐龜裂性更加優異之大型成形品之方面考慮,較佳為5.5質量%以上,較佳為7.5質量%以下,更佳為7.0質量%以下。上述FAVE單位之含量可利用19 F-NMR法測得。The content of the FAVE unit in the above-mentioned PFA is 5.0 to 8.0% by mass relative to all monomer units. From the viewpoint of obtaining a large molded product with more excellent crack resistance, it is preferably 5.5% by mass or more, more preferably 7.5 Mass% or less, more preferably 7.0 mass% or less. The content of the above FAVE unit can be measured by 19 F-NMR method.

作為構成上述FAVE單位之FAVE,可列舉選自由通式(1)所表示之單體、及通式(2)所表示之單體所組成之群中之至少一種: CF2 =CFO(CF2 CFY1 O)p -(CF2 CF2 CF2 O)q -Rf1 (1) (式中,Y1 表示F或CF3 ,Rf1 表示碳數為1〜5之全氟烷基;p表示0〜5之整數,q表示0〜5之整數); CFX=CXOCF2 OR1 (2) (式中,X相同或不同,表示H、F或CF3 ,R1 表示直鏈或支鏈之碳數為1〜6之氟烷基或碳數為5或6之環狀氟烷基,上述氟烷基可含有1〜2個選自由H、Cl、Br及I所組成之群中之至少一種原子,上述環狀氟烷基可含有1〜2個選自由H、Cl、Br及I所組成之群中之至少一種原子)。As the FAVE constituting the FAVE unit, at least one selected from the group consisting of the monomer represented by the general formula (1) and the monomer represented by the general formula (2): CF 2 =CFO(CF 2 CFY 1 O) p - (CF 2 CF 2 CF 2 O) q -Rf 1 (1) ( wherein, Y 1 represents F or CF 3, Rf 1 represents a perfluoroalkyl group having a carbon number of 1 ~ 5; p Represents an integer from 0 to 5, q represents an integer from 0 to 5); CFX=CXOCF 2 OR 1 (2) (where X is the same or different, represents H, F or CF 3 , and R 1 represents straight or branched chain The fluoroalkyl group with a carbon number of 1 to 6 or a cyclic fluoroalkyl group with a carbon number of 5 or 6. The above-mentioned fluoroalkyl group may contain 1 to 2 selected from the group consisting of H, Cl, Br and I At least one atom, the above-mentioned cyclic fluoroalkyl group may contain 1 to 2 at least one atom selected from the group consisting of H, Cl, Br and I).

其中,作為上述FAVE較佳為通式(1)所表示之單體,更佳為全氟(烷基乙烯基醚),進而較佳為選自由全氟(甲基乙烯基醚)、全氟(乙基乙烯基醚)及全氟(丙基乙烯基醚)(PPVE)所組成之群中之至少一種,特佳為PPVE。Among them, the above-mentioned FAVE is preferably a monomer represented by the general formula (1), more preferably perfluoro (alkyl vinyl ether), and more preferably selected from perfluoro (methyl vinyl ether) and perfluoro At least one of the group consisting of (ethyl vinyl ether) and perfluoro (propyl vinyl ether) (PPVE), particularly preferably PPVE.

上述PFA中,作為TFE單位與FAVE單位之質量比(TFE單位/FAVE單位),較佳為95.0/5.0〜92.0/8.0,更佳為95.0/5.0〜92.5/7.5,進而較佳為94.5/5.5〜93.0/7.0。若TFE單位過多則存在耐龜裂性等機械物性降低之傾向,若TFE單位過少則存在熔點變低而導致耐熱性降低之傾向。In the above-mentioned PFA, the mass ratio of TFE unit to FAVE unit (TFE unit/FAVE unit) is preferably 95.0/5.0~92.0/8.0, more preferably 95.0/5.0~92.5/7.5, and still more preferably 94.5/5.5 ~93.0/7.0. If there are too many TFE units, there is a tendency for mechanical properties such as crack resistance to decrease, and if there are too few TFE units, there is a tendency for the melting point to decrease and heat resistance to decrease.

上述PFA亦較佳為僅由TFE單位及FAVE單位構成之共聚物、或0.1〜10質量%之來自於可與TFE及FAVE共聚之單體的單體單位且合計為90〜99.9質量%之TFE單位及FAVE單位的共聚物。The above-mentioned PFA is also preferably a copolymer composed of only TFE units and FAVE units, or 0.1-10% by mass of monomer units derived from monomers copolymerizable with TFE and FAVE and a total of 90-99.9% by mass of TFE Unit and FAVE unit copolymer.

作為可與TFE及FAVE共聚之單體,可列舉:六氟丙烯(HFP)、以CZ1 Z2 =CZ3 (CF2n Z4 (式中,Z1 、Z2 及Z3 相同或不同,表示H或F,Z4 表示H、F或Cl,n表示2〜10之整數)表示之乙烯單體、及以CF2 =CF-OCH2 -Rf2 (式中,Rf2 表示碳數為1〜5之全氟烷基)表示之烷基全氟乙烯醚衍生物等。其中,較佳為HFP。As monomers copolymerizable with TFE and FAVE, hexafluoropropylene (HFP), CZ 1 Z 2 =CZ 3 (CF 2 ) n Z 4 (wherein Z 1 , Z 2 and Z 3 are the same or Different, it means H or F, Z 4 means H, F or Cl, n means an integer from 2 to 10), and CF 2 =CF-OCH 2 -Rf 2 (where Rf 2 means carbon Perfluoroalkyl groups (numbers 1 to 5) represent alkyl perfluorovinyl ether derivatives, etc. Among them, HFP is preferred.

作為上述PFA,較佳為選自由下述共聚物所組成之群中之至少一種:僅由TFE單位及FAVE單位構成之共聚物、及含有TFE單位、HFP單位及FAVE單位之TFE/HFP/FAVE共聚物,更佳為僅由TFE單位及FAVE單位構成之共聚物。The above-mentioned PFA is preferably at least one selected from the group consisting of the following copolymers: copolymers composed only of TFE units and FAVE units, and TFE/HFP/FAVE containing TFE units, HFP units, and FAVE units The copolymer is more preferably a copolymer composed only of TFE units and FAVE units.

上述PFA之熔點較佳為280〜322℃,更佳為290℃以上,更佳為315℃以下。上述熔點可使用示差掃描熱量計[DSC]測得。The melting point of the above-mentioned PFA is preferably 280 to 322°C, more preferably 290°C or higher, and more preferably 315°C or lower. The above melting point can be measured using a differential scanning calorimeter [DSC].

上述PFA之玻璃轉移溫度(Tg)較佳為70〜110℃,更佳為80℃以上,更佳為100℃以下。上述玻璃轉移溫度可藉由動態黏彈性測定測得。The glass transition temperature (Tg) of the above-mentioned PFA is preferably 70 to 110°C, more preferably 80°C or higher, and more preferably 100°C or lower. The above-mentioned glass transition temperature can be measured by dynamic viscoelasticity measurement.

上述PFA可為於聚合物主鏈及聚合物側鏈之至少一者之部位具有-CF3 、-CF2 H等末端基者,並無特別限定,較佳為經氟化處理之PFA。未經氟化處理之PFA存在含有-COOH、-COOCH3 、-CH2 OH、-COF、-CONH2 等熱特性及電特性不穩定之末端基(以下,亦將此種末端基稱為「不穩定末端基」)之情形。此種不穩定末端基可藉由上述氟化處理而減少。The above-mentioned PFA may be one having terminal groups such as -CF 3 and -CF 2 H in at least one of the polymer main chain and the polymer side chain, and is not particularly limited, but is preferably fluorinated PFA. PFA that has not been fluorinated has terminal groups that contain -COOH, -COOCH 3 , -CH 2 OH, -COF, -CONH 2 and other unstable thermal and electrical characteristics (hereinafter, such terminal groups are also referred to as " Unstable end group"). Such unstable terminal groups can be reduced by the above-mentioned fluorination treatment.

上述PFA較佳為含較少或不含上述不穩定末端基,且不穩定末端基之合計數較佳為相對於碳數每1×106 個為120個以下。The PFA preferably contains less or no such unstable terminal groups, and the total number of unstable terminal groups is preferably 120 or less per 1×10 6 carbons.

關於上述PFA,自可抑制由成形時之發泡所導致之成形不良之方面考慮,上述5種不穩定末端基與-CF2 H末端基之合計數、即-COOH、-COOCH3 、-CH2 OH、-COF、-CONH2 、及-CF2 H之合計數更佳為相對於碳數每1×106 個為120個以下。若多於120個,則存在發生成形不良之虞。上述不穩定末端基更佳為50個以下,進而較佳為20個以下,最佳為10個以下。本發明中,上述不穩定末端基數係由紅外吸收光譜測定所得之值。亦可不存在上述不穩定末端基及-CF2 H末端基而均為-CF3 末端基。可使用紅外分光分析法來鑑定上述官能基之種類及測定官能基數。Regarding the above-mentioned PFA, considering that it can suppress molding defects caused by foaming during molding, the total number of the above-mentioned five kinds of unstable end groups and -CF 2 H end groups, namely -COOH, -COOCH 3 , -CH The total number of 2 OH, -COF, -CONH 2 , and -CF 2 H is more preferably 120 or less per 1×10 6 carbon number. If there are more than 120, there is a risk of forming defects. The above-mentioned unstable terminal groups are more preferably 50 or less, still more preferably 20 or less, and most preferably 10 or less. In the present invention, the aforementioned unstable terminal base is a value obtained by infrared absorption spectrometry. The above-mentioned unstable terminal group and the -CF 2 H terminal group may not be present and both are -CF 3 terminal groups. Infrared spectroscopy can be used to identify the types of functional groups and determine the number of functional groups.

上述氟化處理可藉由使未經氟化處理之PFA與含氟化合物接觸而進行。The above-mentioned fluorination treatment can be performed by contacting PFA that has not been fluorinated with a fluorine-containing compound.

作為上述含氟化合物並無特別限定,可列舉於氟化處理條件下產生氟自由基之氟自由基源。作為上述氟自由基源,可列舉F2 氣體、CoF3 、AgF2 、UF6 、OF2 、N2 F2 、CF3 OF、氟化鹵素(例如IF5 、ClF3 )等。The fluorine-containing compound is not particularly limited, and a fluorine radical source that generates fluorine radicals under fluorination treatment conditions can be mentioned. Examples of the fluorine radical source include F 2 gas, CoF 3 , AgF 2 , UF 6 , OF 2 , N 2 F 2 , CF 3 OF, halogen fluoride (for example, IF 5 , ClF 3 ), and the like.

上述F2 氣體等氟自由基源可為100%濃度者,但從安全性方面考慮,較佳為與非活性氣體混合,稀釋至5〜50質量%後使用,更佳為稀釋至15〜30質量%後使用。作為上述非活性氣體,可列舉氮氣、氦氣、氬氣等,但從經濟方面考慮較佳為氮氣。F 2 gas or the like above the source of fluorine radicals may be 100% by concentration, but in view of safety, is preferably mixed with the inert gas, used after diluted to 5~50 mass%, more preferably diluted to 15~30 Use after mass%. As said inert gas, nitrogen, helium, argon, etc. can be mentioned, but nitrogen is preferable from an economic point of view.

上述氟化處理之條件並無特別限定,可使熔融狀態之上述PFA與含氟化合物接觸,一般可在上述PFA之熔點以下、較佳為20〜220℃、更佳為100〜200℃之溫度下進行。上述氟化處理一般進行1〜30小時,較佳為進行5〜25小時。上述氟化處理較佳為使未經氟化處理之上述PFA與氟氣(F2 氣體)接觸。The conditions of the fluorination treatment are not particularly limited. The molten PFA can be brought into contact with the fluorine-containing compound. Generally, it can be below the melting point of the PFA, preferably 20 to 220°C, more preferably 100 to 200°C Under. The above-mentioned fluorination treatment is generally performed for 1 to 30 hours, preferably for 5 to 25 hours. The fluorination treatment preferably involves contacting the unfluorinated PFA with fluorine gas (F 2 gas).

上述PFA可藉由塊狀聚合、溶液聚合、乳化聚合、懸濁聚合等製造。The above-mentioned PFA can be produced by bulk polymerization, solution polymerization, emulsion polymerization, suspension polymerization, or the like.

本發明之氟聚合物組成物含有導電性碳化合物。藉由使用導電性碳化合物作為導電性填料,可獲得即使與酸性藥液接觸時亦難以溶出導電性填料之成形品。作為導電性碳化合物,可列舉導電性碳黑、石墨、碳纖維、膨脹化石墨、石墨烯、奈米碳管、碳奈米角等,其中,自可獲得更難以帶電之大型成形品之方面考慮,較佳為選自由導電性碳黑及奈米碳管所組成之群中之至少一種。又,作為導電性碳化合物,自即使少量添加亦可賦予成形品優異之防靜電性之觀點出發,更佳為奈米碳管,自於成本方面有利之觀點出發,更佳為導電性碳黑。The fluoropolymer composition of the present invention contains a conductive carbon compound. By using a conductive carbon compound as a conductive filler, a molded product that is difficult to elute the conductive filler even when in contact with an acidic chemical solution can be obtained. Examples of conductive carbon compounds include conductive carbon black, graphite, carbon fiber, expanded graphite, graphene, carbon nanotubes, carbon nanohorns, etc. Among them, it is considered that large molded products that are more difficult to charge can be obtained , Preferably at least one selected from the group consisting of conductive carbon black and carbon nanotubes. In addition, as a conductive carbon compound, from the viewpoint of imparting excellent antistatic properties to molded products even when added in a small amount, carbon nanotubes are more preferable, and from the viewpoint of cost advantages, conductive carbon black is more preferable .

作為導電性碳黑,可列舉乙炔黑、科琴黑(Ketjen black)、槽黑、爐黑、燈黑、熱碳黑等,其中,較佳為選自由乙炔黑及科琴黑所組成之群中之至少一種,更佳為科琴黑。As the conductive carbon black, acetylene black, Ketjen black, channel black, furnace black, lamp black, thermal black, etc. can be cited. Among them, it is preferably selected from the group consisting of acetylene black and Ketjen black. At least one of them, more preferably Ketjen Black.

奈米碳管係將由縮合苯環構成之石墨烯片材捲為圓筒狀而成者,可列舉單層奈米碳管(SWCNT)、多層奈米碳管(MWCNT)、氣相生長碳纖維(VGCF)等。奈米碳管可為直徑(纖維直徑)為2〜250 nm,長度為1〜200 μm之纖維狀之物質。由於奈米碳管之縱橫比較高,故而易於基質樹脂中形成網絡。又,由於其較微細,故每單位重量之根數較多。因此,有少量添加便可賦予組成物充分之導電性之可能性。Carbon nanotubes are formed by rolling graphene sheets composed of condensed benzene rings into a cylindrical shape. Examples include single-layer carbon nanotubes (SWCNT), multilayer carbon nanotubes (MWCNT), and vapor-grown carbon fibers ( VGCF) and so on. Carbon nanotubes can be fibrous materials with a diameter (fiber diameter) of 2 to 250 nm and a length of 1 to 200 μm. Because of the high aspect ratio of carbon nanotubes, it is easy to form a network in the matrix resin. Also, because it is relatively fine, the number of roots per unit weight is large. Therefore, there is a possibility that a small amount of addition can give the composition sufficient conductivity.

本發明之氟聚合物組成物根據需要可含有其他成分。作為其他成分,可列舉填充劑、交聯劑、耐熱穩定劑、發泡劑、發泡核劑、抗氧化劑、界面活性劑、光聚合起始劑、抗磨耗劑、表面改質劑等添加劑等。The fluoropolymer composition of the present invention may contain other components as necessary. Other components include fillers, crosslinking agents, heat-resistant stabilizers, foaming agents, foaming nucleating agents, antioxidants, surfactants, photopolymerization initiators, anti-wear agents, surface modifiers, and other additives. .

本發明之氟聚合物組成物之體積電阻率為104 〜109 Ω·cm,自可獲得更難以帶電之大型成形品之方面考慮,較佳為106 Ω·cm以上,較佳為108 Ω·cm以下。The volume resistivity of the fluoropolymer composition of the present invention is 10 4 to 10 9 Ω·cm. From the viewpoint of obtaining large molded products that are more difficult to charge, it is preferably 10 6 Ω·cm or more, and more preferably 10 8 Ω·cm or less.

本發明之氟聚合物組成物之體積電阻率係將本發明之氟聚合物組成物成形而得之成形品之體積電阻率。本發明之氟聚合物組成物之體積電阻率於測定低電阻區域時依據ASTM D 991,於測定高電阻區域時依據ASTM D 257,可於室溫23℃、濕度50%之環境下,使用高精度電阻率計或多用途型高電阻率計來進行測定。The volume resistivity of the fluoropolymer composition of the present invention is the volume resistivity of a molded product obtained by molding the fluoropolymer composition of the present invention. The volume resistivity of the fluoropolymer composition of the present invention is in accordance with ASTM D 991 when measuring low-resistance areas and ASTM D 257 when measuring high-resistance areas. It can be used at a room temperature of 23°C and a humidity of 50%. Accuracy resistivity meter or multi-purpose high resistivity meter for measurement.

本發明之氟聚合物組成物之體積電阻率可藉由調整導電性碳化合物之種類及含量來進行調整。即,本發明之氟聚合物組成物中,導電性碳化合物之種類及含量較佳為調整為使氟聚合物組成物之體積電阻率成為上述範圍內。The volume resistivity of the fluoropolymer composition of the present invention can be adjusted by adjusting the type and content of the conductive carbon compound. That is, in the fluoropolymer composition of the present invention, the type and content of the conductive carbon compound are preferably adjusted so that the volume resistivity of the fluoropolymer composition falls within the aforementioned range.

主要根據導電性碳化合物之形狀,組成物中之含量與組成物之體積電阻率之關係會不同,因此可根據導電性碳化合物之形狀選擇最佳之組成物中之含量。作為導電性碳化合物之形狀,可為粒狀、纖維狀、鱗片狀、片狀等,較佳為粒狀或纖維狀。例如,奈米碳管以細長纖維狀之形狀形成通電路徑,因此存在即使於含量較少之情形時亦可獲得適當之體積電阻率之傾向。另一方面,於使用導電性碳黑作為導電性碳化合物時,存在需要多於奈米碳管之含量之傾向。 又,於導電性碳化合物使用一次粒子較小者時,一次粒子集合而變為稍大之塊,進而該塊變為凝聚之集塊,從而易巨大化。因此,比較一次粒子之大小不同之2種導電性碳化合物,得知即使組成物中之含量相同,亦存在組成物中之導電性碳化合物之分散性不同,組成物之體積電阻率不同之可能性。Mainly according to the shape of the conductive carbon compound, the relationship between the content in the composition and the volume resistivity of the composition will be different, so the optimal content in the composition can be selected according to the shape of the conductive carbon compound. The shape of the conductive carbon compound may be granular, fibrous, scaly, flake, etc., and is preferably granular or fibrous. For example, carbon nanotubes have a slender fiber-like shape to form an electric path, so there is a tendency to obtain an appropriate volume resistivity even when the content is small. On the other hand, when conductive carbon black is used as the conductive carbon compound, there is a tendency that more than the content of carbon nanotubes is required. In addition, when the conductive carbon compound uses a smaller primary particle, the primary particles gather to become a slightly larger mass, and the mass becomes agglomerated mass, which tends to increase in size. Therefore, comparing two kinds of conductive carbon compounds with different primary particle sizes, it is found that even if the content in the composition is the same, the dispersibility of the conductive carbon compound in the composition is different, and the volume resistivity of the composition is different. Sex.

本發明之氟聚合物組成物之熔體流動速率(MFR)為1〜100 g/10分鐘,自成形性更加優異,可獲得耐龜裂性更加優異之大型成形品之方面考慮,更佳為10 g/10分鐘以上,進而較佳為20 g/10分鐘以上,特佳為25 g/10分鐘以上,且更佳為90 g/10分鐘以下,進而較佳為70 g/10分鐘以下,特佳為60 g/10分鐘以下。氟聚合物組成物之MFR係依據ASTM D1238,使用熔融指數測定儀(安田精機製作所公司製)於372℃、5 kg負載下所得到自內徑為2 mm、長度為8 mm之噴嘴每10分鐘所流出之聚合物之質量(g/10分鐘)之值。The fluoropolymer composition of the present invention has a melt flow rate (MFR) of 1-100 g/10 minutes, and is more excellent in self-formability, and in terms of obtaining large-scale molded products with more excellent crack resistance, it is more preferable 10 g/10 minutes or more, more preferably 20 g/10 minutes or more, particularly preferably 25 g/10 minutes or more, more preferably 90 g/10 minutes or less, and still more preferably 70 g/10 minutes or less, Particularly preferred is less than 60 g/10 minutes. The MFR of the fluoropolymer composition is based on ASTM D1238, using a melt index tester (manufactured by Yasuda Seiki Co., Ltd.) at 372°C and a load of 5 kg. From a nozzle with an inner diameter of 2 mm and a length of 8 mm every 10 minutes The value of the mass of polymer flowing out (g/10 minutes).

本發明之氟聚合物組成物之MFR可藉由調整導電性碳化合物之種類及含量、以及PFA之MFR來進行調整。即,於本發明之氟聚合物組成物中,導電性碳化合物之種類及含量、以及PFA之MFR較佳為調整為使氟聚合物組成物之MFR成為上述範圍內。又,於利用熔融混練法製備氟聚合物組成物時,亦可藉由調整混練溫度、剪力等熔融混練條件來調整氟聚合物組成物之MFR。The MFR of the fluoropolymer composition of the present invention can be adjusted by adjusting the type and content of the conductive carbon compound, and the MFR of PFA. That is, in the fluoropolymer composition of the present invention, the type and content of the conductive carbon compound and the MFR of PFA are preferably adjusted so that the MFR of the fluoropolymer composition falls within the aforementioned range. In addition, when the fluoropolymer composition is prepared by the melt-kneading method, the MFR of the fluoropolymer composition can also be adjusted by adjusting the melt-kneading conditions such as the kneading temperature and the shear force.

如上所述,導電性碳化合物之含量對氟聚合物組成物之體積電阻率產生影響,同時亦對氟聚合物組成物之成形性及所得之成形品之耐龜裂性產生影響。例如,若導電性碳化合物之含量變多,則存在氟聚合物組成物之流動性降低,成形性變差之傾向。於使用導電性碳黑作為導電性碳化合物之情形時,為獲得所需之體積電阻率,需要相對大量之導電性碳黑,因此較佳為選擇MFR較大之PFA。然而,若選擇MFR較大之PFA,則存在所得之成形品之機械強度易下降,尤其是於成形品較大時易產生龜裂之傾向。如此,不容易同時改善氟聚合物組成物之成形性、及自氟聚合物組成物所得之成形品之耐龜裂性及防靜電性。然而,本發明之氟聚合物組成物由於具備上述構成,故成形性優異,並且可提供耐龜裂性優異、且難以帶電之大型成形品。As mentioned above, the content of the conductive carbon compound affects the volume resistivity of the fluoropolymer composition, and also affects the formability of the fluoropolymer composition and the crack resistance of the resulting molded product. For example, if the content of the conductive carbon compound increases, the fluidity of the fluoropolymer composition decreases and the moldability tends to deteriorate. In the case of using conductive carbon black as the conductive carbon compound, in order to obtain the required volume resistivity, a relatively large amount of conductive carbon black is required. Therefore, it is better to choose PFA with a larger MFR. However, if PFA with a larger MFR is selected, the mechanical strength of the resulting molded product is likely to decrease, especially when the molded product is large, cracks are likely to occur. In this way, it is not easy to simultaneously improve the moldability of the fluoropolymer composition and the crack resistance and antistatic properties of the molded article obtained from the fluoropolymer composition. However, since the fluoropolymer composition of the present invention has the above-mentioned structure, it has excellent moldability and can provide a large-sized molded product that is excellent in crack resistance and is difficult to charge.

因此,於本發明中,較佳為考慮氟聚合物組成物之成形性及所得之成形品之耐龜裂性及防靜電性,而選擇導電性碳黑之種類及含量、以及PFA之MFR。Therefore, in the present invention, it is preferable to select the type and content of conductive carbon black and the MFR of PFA in consideration of the moldability of the fluoropolymer composition and the crack resistance and antistatic properties of the resulting molded article.

本發明之氟聚合物組成物中,作為導電性碳化合物之含量,自可獲得更加優異之成形性,可獲得更難以帶電之大型成形品之方面考慮,相對於氟聚合物組成物,較佳為0.02〜15質量%,更佳為10質量%以下,進而較佳為9.0質量%以下,更佳為0.03質量%以上。In the fluoropolymer composition of the present invention, the content of the conductive carbon compound is preferable to the fluoropolymer composition in terms of obtaining more excellent moldability and obtaining large molded products that are more difficult to charge. It is 0.02-15 mass%, more preferably 10 mass% or less, still more preferably 9.0 mass% or less, and more preferably 0.03 mass% or more.

本發明之氟聚合物組成物中,作為導電性碳黑之含量,自可獲得更加優異之成形性,可獲得更難以帶電之大型成形品之方面考慮,相對於氟聚合物組成物,較佳為0.02〜15質量%,更佳為5.5質量%以上,進而較佳為6.0質量%以上,特佳為7.0質量%以上,更佳為10質量%以下,進而較佳為9.0質量%以下。In the fluoropolymer composition of the present invention, the content of the conductive carbon black is better than the fluoropolymer composition in terms of obtaining more excellent moldability and obtaining large molded products that are more difficult to charge. It is 0.02-15 mass%, more preferably 5.5 mass% or more, still more preferably 6.0 mass% or more, particularly preferably 7.0 mass% or more, more preferably 10 mass% or less, and still more preferably 9.0 mass% or less.

本發明之氟聚合物組成物中,作為奈米碳管之含量,自可獲得更加優異之成形性,可獲得更難以帶電之大型成形品之方面考慮,相對於氟聚合物組成物,較佳為0.02〜15質量%,更佳為0.03質量%以上,更佳為10.0質量%以下,進而較佳為7.0質量%以下,特佳為5.0質量%以下。In the fluoropolymer composition of the present invention, as the content of carbon nanotubes, it is better than the fluoropolymer composition in terms of obtaining more excellent formability and obtaining large-scale molded products that are more difficult to charge. It is 0.02 to 15% by mass, more preferably 0.03% by mass or more, more preferably 10.0% by mass or less, still more preferably 7.0% by mass or less, particularly preferably 5.0% by mass or less.

作為存在於本發明之氟聚合物組成物中之PFA之熔體流動速率(MFR),自可獲得更加優異之成形性,可獲得耐龜裂性更加優異之大型成形品之方面考慮,較佳為1.0〜100 g/10分鐘,更佳為6.0 g/10分鐘以上,進而較佳為10 g/10分鐘以上,更佳為90 g/10分鐘以下,進而較佳為80 g/10分鐘以下,特佳為70 g/10分鐘以下。PFA之MFR係依據ASTM D 1238,使用熔融指數測定儀(安田精機製作所公司製)於372℃、5 kg負載下所得到之自內徑為2 mm、長度為8 mm之噴嘴每10分鐘所流出之聚合物之質量(g/10分鐘)之值。As the melt flow rate (MFR) of the PFA present in the fluoropolymer composition of the present invention, it is preferable in terms of obtaining more excellent formability and obtaining large-scale molded products with more excellent crack resistance 1.0~100 g/10 minutes, more preferably 6.0 g/10 minutes or more, still more preferably 10 g/10 minutes or more, more preferably 90 g/10 minutes or less, and still more preferably 80 g/10 minutes or less , Particularly preferably less than 70 g/10 minutes. The MFR of PFA is based on ASTM D 1238, using a melt index tester (manufactured by Yasuda Seiki Seisakusho Co., Ltd.) at 372°C and a load of 5 kg. It flows out from a nozzle with an inner diameter of 2 mm and a length of 8 mm every 10 minutes. The value of the polymer mass (g/10 minutes).

PFA之MFR可藉由調整構成PFA之單體之聚合時所添加之鏈轉移劑之種類及量、聚合起始劑之種類及量等來進行調整。又,於藉由擠出成形使由聚合所得之PFA顆粒化時,亦可藉由調整擠出溫度或調整附加於PFA之剪力而進行調整。再者,PFA之MFR於下述氟聚合物組成物之製備步驟中亦會產生變化,因此存在於氟聚合物組成物中之PFA之MFR與用作製備氟聚合物組成物之原料之PFA之MFR不一定相同。The MFR of PFA can be adjusted by adjusting the type and amount of the chain transfer agent added during the polymerization of the monomers constituting the PFA, and the type and amount of the polymerization initiator. In addition, when the PFA obtained by polymerization is pelletized by extrusion molding, it can also be adjusted by adjusting the extrusion temperature or adjusting the shear force added to the PFA. Furthermore, the MFR of PFA will also change during the preparation steps of the fluoropolymer composition described below. Therefore, the MFR of PFA existing in the fluoropolymer composition differs from the PFA used as the raw material for the preparation of the fluoropolymer composition. MFR is not necessarily the same.

作為本發明之氟聚合物組成物之製備方法並無特別限定,可列舉利用溶劑分散法製備之方法、及利用熔融混練法製備之方法等。溶劑分散法例如可包含:藉由將PFA之粉末或分散液與使導電性碳化合物分散於溶劑中而成之分散液混合,而獲得混合液之步驟;及自所得之混合液去除溶劑之步驟。作為使導電性碳化合物分散於溶劑中之溶劑,可列舉水、醇、酯系溶劑、酮系溶劑、脂肪族烴系溶劑、芳香族烴系溶劑、氯化烴系溶劑等。於使導電性碳化合物分散於溶劑中時,亦可使用丙烯酸系分散劑、聚乙烯吡咯啶酮、聚苯胺磺酸等分散劑。可藉由加熱乾燥等公知之方法自所得之混合液去除溶劑。又,為了高效地自混合液去除溶劑或分散劑,亦可將混合液供給至次臨界二氧化碳或超臨界二氧化碳中,使溶劑或分散液溶解於二氧化碳後,回收含有PFA及導電性碳化合物之氟聚合物組成物。The preparation method of the fluoropolymer composition of the present invention is not particularly limited, and examples thereof include a method of preparation by a solvent dispersion method, a method of preparation by a melt-kneading method, and the like. The solvent dispersion method may include, for example, a step of obtaining a mixed solution by mixing a powder or dispersion of PFA with a dispersion of a conductive carbon compound dispersed in a solvent; and a step of removing the solvent from the obtained mixed solution . Examples of the solvent for dispersing the conductive carbon compound in the solvent include water, alcohols, ester solvents, ketone solvents, aliphatic hydrocarbon solvents, aromatic hydrocarbon solvents, and chlorinated hydrocarbon solvents. When dispersing the conductive carbon compound in a solvent, dispersing agents such as acrylic dispersants, polyvinylpyrrolidone, and polyaniline sulfonic acid may also be used. The solvent can be removed from the obtained mixed liquid by a known method such as heating and drying. In addition, in order to efficiently remove the solvent or dispersant from the mixed liquid, the mixed liquid can also be supplied to subcritical carbon dioxide or supercritical carbon dioxide, and the solvent or dispersion liquid is dissolved in carbon dioxide, and then fluorine containing PFA and conductive carbon compounds is recovered Polymer composition.

作為熔融混練法,例如可列舉將PFA之粉末及導電性碳化合物以高於PFA之熔點之溫度進行熔融混練之方法。熔融混練中可使用擠出機,此時,亦可將定量進料器設置於擠出機,自定量進料器向擠出機供給導電性碳化合物,並且使導電性碳化合物與PFA熔融混練。雖然存在於擠出機中施加於PFA之剪力越高,PFA與導電性碳化合物越充分地混練之傾向,但是存在因高剪力使PFA之主鏈之一部分被切斷,導致PFA之MFR變高之情形。於此情形時,以MFR升高為前提,選擇投入至擠出機之PFA之MFR即可。 又,可將PFA與導電性碳化合物一起混練,亦可預先製作含有高濃度之導電性碳化合物之PFA之母料,將所得之母料與PFA熔融混練。As the melt-kneading method, for example, a method of melt-kneading PFA powder and a conductive carbon compound at a temperature higher than the melting point of PFA. An extruder can be used for melt kneading. In this case, a quantitative feeder can also be installed in the extruder, and the conductive carbon compound can be supplied to the extruder from the quantitative feeder, and the conductive carbon compound and PFA can be melted and kneaded . Although there is a tendency that the higher the shear force applied to PFA in the extruder, the more fully the PFA and the conductive carbon compound are mixed, but the high shear force causes part of the main chain of PFA to be cut, resulting in the MFR of PFA The situation of getting higher. In this case, based on the premise that the MFR is increased, the MFR of the PFA fed into the extruder can be selected. In addition, PFA and conductive carbon compounds can be kneaded together, or a PFA masterbatch containing a high concentration of conductive carbon compounds can be prepared in advance, and the resulting masterbatch can be melted and kneaded with PFA.

本發明之氟聚合物組成物之形狀並無特別限定,可為粉末、漿料、分散液、顆粒等。The shape of the fluoropolymer composition of the present invention is not particularly limited, and may be powder, slurry, dispersion, granules, and the like.

藉由將本發明之氟聚合物組成物成形,可獲得成形品。本發明之成形品即使為大型成形品時,耐龜裂性亦優異、且難以帶電。By molding the fluoropolymer composition of the present invention, a molded product can be obtained. Even when the molded product of the present invention is a large-sized molded product, it has excellent crack resistance and is difficult to charge.

本發明中成形品之大小並無特別限定,可為大型成形品。本發明之成形品可具有例如較「具有至少300 mm或至少450 mm之直徑的晶圓(半導體晶圓)」更大之投影面積。本發明之成形品之投影面積較佳為1000 cm2 以上,更佳為1100 cm2 以上,可為5000 cm2 以下。具有上述範圍內之投影面積之成形品之形狀並無特別限定,可為圓筒狀、碗狀、箱形、籠狀等,只要自任意方向所見之成形品之投影面積中最大之投影面積為上述範圍內即可。又,於成形品為射出成形品時,較佳為射出方向之投影面積為上述範圍內。所謂射出方向之投影面積係指於自射出成形機之噴嘴方向觀察射出成形品時之可見面積,即噴嘴方向之投影面積。又,具有上述範圍內之射出方向之投影面積的射出成形品進而較佳為射出面積擴散比為3000以上。所謂射出面積比係指朝向與射出方向正交之方向的射出面積擴散比,即噴嘴部前端之開口面積與射出成形品之投影面積之比。The size of the molded product in the present invention is not particularly limited, and it may be a large molded product. The molded product of the present invention may have a larger projected area than "a wafer (semiconductor wafer) having a diameter of at least 300 mm or at least 450 mm", for example. The projected area of the molded article of the present invention is preferably 1000 cm 2 or more, more preferably 1100 cm 2 or more, and may be 5000 cm 2 or less. The shape of the molded product having a projected area within the above range is not particularly limited. It can be cylindrical, bowl, box, cage, etc., as long as the largest projected area of the molded product seen from any direction is The above range is sufficient. Moreover, when the molded product is an injection molded product, it is preferable that the projected area of the injection direction is within the above-mentioned range. The so-called projected area of the injection direction refers to the visible area of the injection molded product when viewed from the nozzle direction of the injection molding machine, that is, the projected area of the nozzle direction. In addition, it is more preferable that the injection molded product having a projected area in the injection direction within the above-mentioned range has an injection area diffusion ratio of 3000 or more. The so-called shot area ratio refers to the shot area diffusion ratio in the direction orthogonal to the shot direction, that is, the ratio of the opening area of the nozzle tip to the projected area of the injection molded product.

作為將本發明之氟聚合物組成物成形之方法並無特別限定,可列舉擠出成形、射出成形、轉移成形、充氣成形(inflation molding)、壓縮成形等公知之方法。該等成形方法根據所得之成形品之形狀適當選擇即可。該等成形方法之中,自可容易地製造大型成形品之方面考慮,較佳為射出成形。The method of molding the fluoropolymer composition of the present invention is not particularly limited, and known methods such as extrusion molding, injection molding, transfer molding, inflation molding, and compression molding can be cited. These molding methods may be appropriately selected according to the shape of the obtained molded product. Among these molding methods, injection molding is preferred because of the ease of manufacturing large-scale molded products.

作為藉由將本發明之氟聚合物組成物射出成形所得之射出成形品並無特別限定,藉由使用本發明之氟聚合物組成物,可獲得即使較為大型,亦難以產生龜裂、且防靜電性優異之成形品,因此較佳為大型之射出成形品。The injection molded product obtained by injection molding the fluoropolymer composition of the present invention is not particularly limited. By using the fluoropolymer composition of the present invention, it is possible to obtain a relatively large size, which is hard to crack and prevent A molded product with excellent electrostatic properties, so a large injection molded product is preferred.

作為本發明之射出成形品,例如可列舉具有可收容「具有至少300 mm或至少450 mm之直徑的晶圓(半導體晶圓)」之圓筒狀部位的射出成形品。射出成形品之圓筒狀部位亦較佳為可收容轉盤、旋轉基座、旋轉夾盤等保持手段之部位,上述保持手段用以保持具有上述範圍內之直徑之晶圓。於利用水或藥液洗淨晶圓之半導體洗淨裝置、塗佈抗蝕劑而形成抗蝕劑膜之半導體製造裝置、進行抗蝕劑膜之顯影之半導體製造裝置等中,一面使晶圓旋轉一面將水或藥液供給至晶圓上。或,藉由使晶圓旋轉,甩掉晶圓上之水或藥液,使晶圓乾燥。因此,晶圓之周圍飛散有水或藥液。本發明之射出成形品可用作晶圓杯,可設置於晶圓之周圍以防止水或藥液之飛散。晶圓杯有時亦稱為防護杯、防濺板等。本發明之射出成形品由於難以帶電,故例如即使以包圍晶圓之方式設置,亦幾乎不存在使晶圓帶電或使帶電液滴濺至晶圓上之虞。因此,可較大地有助於提高半導體裝置製造之良率。As the injection molded product of the present invention, for example, an injection molded product having a cylindrical portion capable of accommodating a "wafer (semiconductor wafer) having a diameter of at least 300 mm or at least 450 mm" can be cited. The cylindrical part of the injection molded product is also preferably a part that can accommodate holding means such as a turntable, a rotating base, and a rotating chuck. The holding means is used to hold a wafer having a diameter within the above range. In a semiconductor cleaning device that cleans wafers with water or a chemical solution, a semiconductor manufacturing device that coats a resist to form a resist film, a semiconductor manufacturing device that develops a resist film, etc., the wafer The rotating side supplies water or chemical solution to the wafer. Or, by rotating the wafer to shake off the water or chemical solution on the wafer, the wafer is dried. Therefore, there is water or chemical liquid scattered around the wafer. The injection molded product of the present invention can be used as a wafer cup, and can be placed around the wafer to prevent water or chemical liquid from scattering. Wafer cups are sometimes called protective cups, splash guards, etc. Since the injection molded product of the present invention is difficult to charge, for example, even if it is arranged to surround the wafer, there is almost no possibility of charging the wafer or splashing charged liquid droplets on the wafer. Therefore, it can greatly contribute to improving the yield of semiconductor device manufacturing.

又,本發明之成形品及射出成形品可用作例如設置於用以實施半導體之前步驟之裝置之構件。作為半導體之前步驟,可列舉如下步驟。 a.洗淨作為基片之矽晶圓的「洗淨步驟」 b.於矽晶圓上形成作為電路素材之薄膜的「成膜步驟」 c.均勻塗佈光阻劑(感光液)的「抗蝕劑塗佈步驟」 d.進行電路圖案之轉印的「曝光步驟」 e.使經曝光部分之光阻劑溶解的「顯影步驟」 f.去除由於藥液或離子而露出之基底之薄膜的「蝕刻步驟」 g.注入磷等雜質,使矽具有電特性的「離子注入步驟」 h.去除多餘光阻劑的「剝離步驟」In addition, the molded product and the injection molded product of the present invention can be used as, for example, a member provided in a device for implementing the previous step of a semiconductor. As the steps before the semiconductor, the following steps can be cited. a. The "cleaning step" for cleaning the silicon wafer as the substrate b. "Film forming step" to form a thin film as a circuit material on a silicon wafer c. "Resist coating step" for uniformly coating photoresist (photosensitive liquid) d. "Exposure step" for transferring circuit patterns e. "Development step" to dissolve the photoresist in the exposed part f. "Etching step" to remove the film of the substrate exposed by the chemical liquid or ions g. "Ion implantation step" to implant phosphorus and other impurities to make silicon have electrical properties h. "Peeling step" to remove excess photoresist

為實施該等步驟,使用供給水或藥液來處理晶圓之半導體洗淨裝置或半導體製造裝置。藉由利用本發明之成形品或射出成形品構成半導體洗淨裝置或半導體製造裝置中接觸水或藥液之表面的至少一部分,可使半導體洗淨裝置或半導體製造裝置對水或藥液之耐久性提高,抑制由靜電所引起之對半導體裝置之不良影響。To implement these steps, a semiconductor cleaning device or a semiconductor manufacturing device that processes wafers with water or chemical solution is used. By using the molded article or injection molded article of the present invention to form at least a part of the surface in contact with water or chemicals in a semiconductor cleaning device or semiconductor manufacturing device, the semiconductor cleaning device or semiconductor manufacturing device can be durable against water or chemicals Improved performance and suppress the adverse effects on semiconductor devices caused by static electricity.

作為本發明之成形品及射出成形品之較佳用途,亦可列舉半導體製造用之藥液供給設備之配管、半導體製造裝置用之管類、接頭類、閥、槽、容器、藥液袋、晶圓載體等全氟系氟樹脂構件。As a preferable application of the molded product and the injection molded product of the present invention, piping of the chemical liquid supply equipment for semiconductor manufacturing, pipes for semiconductor manufacturing equipment, joints, valves, tanks, containers, chemical liquid bags, Perfluorinated fluororesin components such as wafer carriers.

本發明之成形品並不限定於射出成形品,亦不限定形狀。本發明之成形品之形狀並無特別限定,例如可列舉顆粒、膜、片、板、桿、塊、圓筒、容器、電線、管等。又,亦可為形成電鍋之內鍋、加熱板、煎鍋等烹飪用具之被覆層,或電子照相方式或靜電記錄方式之影印機、雷射印表機等圖像形成裝置用之固定輥之面塗層等的氟樹脂製塗膜。氟樹脂製塗膜可藉由將含有氟聚合物組成物之塗料塗佈於基材而形成。The molded product of the present invention is not limited to the injection molded product, and the shape is not limited. The shape of the molded article of the present invention is not particularly limited, and examples thereof include pellets, films, sheets, plates, rods, blocks, cylinders, containers, wires, tubes, and the like. In addition, it can also be used to form the coating layer of cooking utensils such as inner pots, heating plates, and frying pans of electric pans, or fixed rollers for image forming devices such as photocopiers and laser printers using electrophotographic or electrostatic recording methods. Fluorine resin coating film such as the top coat. The fluororesin coating film can be formed by applying a coating material containing a fluoropolymer composition to a substrate.

本發明之成形品及射出成形品並無特別限定,例如,可適用於以下之用途: 隔膜泵之隔膜部、波紋管成形品、電線被覆品、半導體用零件、迫緊封、複製輥用薄壁管、單絲、帶、墊片、光學透鏡零件、石油發掘用管、地熱發電用管、石油發掘用電線、衛星用電線、核能發電用電線、飛機用電線、太陽電池面板膜、二次電池或電雙層電容器等墊片、OA輥等。The molded product and injection molded product of the present invention are not particularly limited. For example, they can be applied to the following applications: Diaphragm parts of diaphragm pumps, corrugated tube molded products, wire coating products, semiconductor parts, compression seals, thin-walled tubes for copy rolls, monofilaments, tapes, gaskets, optical lens parts, petroleum exploration tubes, geothermal power generation Pipes, wires for petroleum exploration, wires for satellites, wires for nuclear power generation, wires for airplanes, solar panel films, gaskets such as secondary batteries or electric double layer capacitors, OA rollers, etc.

又,上述成形品及射出成形品可較好地利用於:用以供氣體或藥液流通之管、用以保管藥品之瓶、充氣袋、藥液袋、藥液容器、冷凍保存用袋等。In addition, the above-mentioned molded products and injection molded products can be preferably used in: tubes for the circulation of gas or liquid medicine, bottles for storing medicines, inflatable bags, liquid medicine bags, liquid medicine containers, bags for cryopreservation, etc. .

又,上述成形品及射出成形品可較好地利用於開閉閥之本體或零件類、於連接接頭與管時所使用之套筒類、藥液瓶或容器之螺旋蓋類、及齒輪類、螺絲類、煎鍋、鍋、電鍋、於金屬等基片上被覆有氟樹脂之製品類、脫模膜等。In addition, the above-mentioned molded products and injection molded products can be preferably used for the main body or parts of the opening and closing valve, the sleeves used when connecting the joint and the pipe, the screw cap of the liquid medicine bottle or the container, and the gears, Screws, frying pans, pots, electric pans, products coated with fluororesin on metal substrates, mold release films, etc.

以上,對實施形態進行了說明,但應理解,可於不脫離申請專利範圍之主旨及範圍之情況下進行形態或詳情之多樣化之變更。 [實施例]The embodiments have been described above, but it should be understood that various changes in the form or details can be made without departing from the spirit and scope of the patent application. [Example]

繼而列舉實施例對本發明之實施形態進行說明,但是本發明並不僅限於該實施例。Next, examples are given to describe the embodiments of the present invention, but the present invention is not limited to these examples.

實施例之各數值係藉由以下之方法而測得。Each numerical value of the embodiment is measured by the following method.

(熔點) 使用示差掃描熱量計[DSC]求出成為以10℃/分鐘之速度升溫時之熔解熱曲線中之極大值所對應之溫度。(Melting point) Use a differential scanning calorimeter [DSC] to find the temperature corresponding to the maximum value in the melting heat curve when the temperature is increased at a rate of 10°C/min.

(MFR) 依據ASTM D1238,使用熔融指數測定儀(安田精機製作所公司製),求得於372℃、5 kg負載下自內徑為2 mm、長度為8 mm之噴嘴每10分鐘所流出之聚合物之質量(g/10分鐘)。(MFR) According to ASTM D1238, using a melt index tester (manufactured by Yasuda Seiki Seisakusho Co., Ltd.), the mass of polymer flowing out every 10 minutes from a nozzle with an inner diameter of 2 mm and a length of 8 mm under a load of 5 kg at 372°C (G/10 minutes).

(單體單位之含量) 各單體單位之含量藉由19 F-NMR法而測得。(The content of monomer unit) The content of each monomer unit is measured by 19 F-NMR method.

(體積電阻率) 使用將氟聚合物組成物成形所得之厚度為0.25〜0.3 mm之膜,於測定低電阻區域時依據ASTM D 991,於測定高電阻區域時依據ASTM D 257,於室溫23℃、濕度50%之環境下,使用高精度電阻率計或多用途型高電阻率計測得體積電阻率。(Volume resistivity) Use a film with a thickness of 0.25~0.3 mm obtained by forming a fluoropolymer composition, according to ASTM D 991 when measuring low-resistance areas, and according to ASTM D 257 when measuring high-resistance areas, at room temperature 23°C, humidity 50% Under the environment, use a high-precision resistivity meter or a multi-purpose high-resistivity meter to measure the volume resistivity.

實施例中使用了以下材料。 共聚物1:TFE/PPVE共聚物、TFE與PPVE之組成比(TFE/PPVE)=94.5/5.5(質量%)、熔點304℃、MFR28 g/10分鐘 碳1:奈米碳管、纖維直徑為15 nm、纖維長度為200 μm 碳2:奈米碳管、纖維直徑為150 nm、纖維長度為9 μm 碳3:科琴黑、平均粒子直徑為40 nmThe following materials were used in the examples. Copolymer 1: TFE/PPVE copolymer, composition ratio of TFE and PPVE (TFE/PPVE)=94.5/5.5 (mass%), melting point 304℃, MFR28 g/10 minutes Carbon 1: Carbon nanotubes, fiber diameter is 15 nm, fiber length is 200 μm Carbon 2: Carbon nanotubes, fiber diameter of 150 nm, fiber length of 9 μm Carbon 3: Ketjen Black, with an average particle diameter of 40 nm

實施例1 使用亨舍爾混合機(Henschel mixer),以碳1之含量成為表1所記載之量之方式混合共聚物1及碳1,獲得混合物。將所得之混合物投入至螺旋型擠出機(軸徑32 mm、L/D=52.5),於料缸內使共聚物1熔融後,自模嘴擠出。其次,將自模嘴擠出之線料投入至自模嘴隔開一定距離地設置之水槽,冷卻後,將其供給至造粒機,利用切割機切斷,製備顆粒。進而,重複3遍使所得之顆粒熔融而製備顆粒之步驟,使碳1均勻地分散於氟聚合物組成物(顆粒)中,並且調整氟聚合物組成物之MFR。所得之顆粒係長度為3.0 mm、直徑為2.0 mm之圓柱狀。 對所得之顆粒藉由上述方法測定MFR。將結果示於表1。 又,將所得之顆粒於330〜340℃下熔融30分鐘,進行壓縮成形,製作厚度為0.25〜0.3 mm之膜,對所得之膜藉由上述方法測得體積電阻率。將結果示於表1。Example 1 Using a Henschel mixer, copolymer 1 and carbon 1 were mixed so that the content of carbon 1 became the amount described in Table 1, to obtain a mixture. Put the obtained mixture into a screw extruder (shaft diameter 32 mm, L/D=52.5), melt the copolymer 1 in the cylinder, and extrude it from the die nozzle. Next, the strands extruded from the die nozzle are put into a water tank provided at a certain distance from the die nozzle, and after cooling, they are fed to a pelletizer and cut by a cutter to prepare pellets. Furthermore, the steps of melting the obtained pellets to prepare pellets were repeated 3 times to uniformly disperse carbon 1 in the fluoropolymer composition (particles), and to adjust the MFR of the fluoropolymer composition. The obtained particles are cylindrical with a length of 3.0 mm and a diameter of 2.0 mm. The MFR of the obtained particles was determined by the above method. The results are shown in Table 1. Furthermore, the obtained pellets were melted at 330~340°C for 30 minutes and compression-molded to produce a film with a thickness of 0.25~0.3 mm. The volume resistivity of the obtained film was measured by the above method. The results are shown in Table 1.

實施例2〜8、比較例1〜5 除了將導電性碳化合物之種類及含量變更為如表1所示以外,以與實施例1相同之方式製備顆粒,製作膜。但是,於使用碳1或碳2作為導電性碳化合物時,重複進行多次使所得之顆粒熔融而製備顆粒之步驟,使碳1或碳2均勻地分散至氟聚合物組成物(顆粒)中,並且,調整氟聚合物組成物之MFR。將該等之評估結果示於表1。再者,於表1中,作為體積電阻率之值之「aE+b」表示a×10b 。即,例如,「1.0E+16」為a=1.0、b=16,表示1.0×1016 ,「1.8E+05」為a=1.8、b=5,表示1.8×105Examples 2 to 8, Comparative Examples 1 to 5 Except for changing the type and content of the conductive carbon compound as shown in Table 1, particles were prepared in the same manner as in Example 1, and a film was produced. However, when using carbon 1 or carbon 2 as the conductive carbon compound, repeat the steps of melting the obtained particles to prepare particles multiple times, so that carbon 1 or carbon 2 is uniformly dispersed in the fluoropolymer composition (particles) And, adjust the MFR of the fluoropolymer composition. The evaluation results are shown in Table 1. Furthermore, in Table 1, "aE+b" as the value of volume resistivity represents a×10 b . That is, for example, "1.0E+16" is a=1.0, b=16, which means 1.0×10 16 , and "1.8E+05" is a=1.8, b=5, which means 1.8×10 5 .

[表1]       導電性碳化合物 氟聚合物組成物    種類 含量 (質量%) 體積電阻率 (Ω·cm) MFR (g/10分鐘) 比較例1 碳1 0.01 1.0E+16 35 實施例1 碳1 0.03 1.0E+08 40 實施例2 碳1 0.04 1.0E+07 42 實施例3 碳1 0.05 1.0E+05 45 比較例2 碳1 0.10 1.0E+03 50 比較例3 碳2 2.20 1.4E+14 60 比較例4 碳2 2.50 1.5E+10 65 實施例4 碳2 3.00 1.8E+05 70 實施例5 碳2 4.00 1.4E+04 80 比較例5 碳3 5.00 1.5E+13 24 實施例6 碳3 7.50 1.5E+06 23 實施例7 碳3 8.00 3.4E+05 22 實施例8 碳3 10.00 2.4E+04 21 [Table 1] Conductive carbon compound Fluoropolymer composition species Content (mass%) Volume resistivity (Ω·cm) MFR (g/10 minutes) Comparative example 1 Carbon 1 0.01 1.0E+16 35 Example 1 Carbon 1 0.03 1.0E+08 40 Example 2 Carbon 1 0.04 1.0E+07 42 Example 3 Carbon 1 0.05 1.0E+05 45 Comparative example 2 Carbon 1 0.10 1.0E+03 50 Comparative example 3 Carbon 2 2.20 1.4E+14 60 Comparative example 4 Carbon 2 2.50 1.5E+10 65 Example 4 Carbon 2 3.00 1.8E+05 70 Example 5 Carbon 2 4.00 1.4E+04 80 Comparative example 5 Carbon 3 5.00 1.5E+13 twenty four Example 6 Carbon 3 7.50 1.5E+06 twenty three Example 7 Carbon 3 8.00 3.4E+05 twenty two Example 8 Carbon 3 10.00 2.4E+04 twenty one

no

no

Claims (6)

一種氟聚合物組成物,其含有:含有四氟乙烯單位及氟烷基乙烯醚單位的共聚物、及導電性碳化合物, 相對於構成上述共聚物之所有單體單位,上述氟烷基乙烯醚單位之含量為5.0〜8.0質量%, 上述氟聚合物組成物之體積電阻率為104 〜109 Ω·cm, 上述氟聚合物組成物之熔體流動速率為1〜100 g/10分鐘。A fluoropolymer composition comprising: a copolymer containing tetrafluoroethylene units and fluoroalkyl vinyl ether units, and a conductive carbon compound, relative to all monomer units constituting the copolymer, the fluoroalkyl vinyl ether The unit content is 5.0-8.0% by mass, the volume resistivity of the fluoropolymer composition is 10 4 to 10 9 Ω·cm, and the melt flow rate of the fluoropolymer composition is 1 to 100 g/10 minutes. 如請求項1之氟聚合物組成物,其中,上述共聚物係選自由下述共聚物所組成之群中之至少一種: 僅由四氟乙烯單位及氟烷基乙烯醚單位構成之共聚物、以及 0.1〜10質量%之來自於可與四氟乙烯及氟烷基乙烯醚共聚之單體的單體單位且合計為90〜99.9質量%之四氟乙烯單位及氟烷基乙烯醚單位的共聚物。The fluoropolymer composition of claim 1, wherein the copolymer is at least one selected from the group consisting of the following copolymers: Copolymers composed only of tetrafluoroethylene units and fluoroalkyl vinyl ether units, and 0.1~10% by mass of monomer units derived from monomers copolymerizable with tetrafluoroethylene and fluoroalkyl vinyl ether, and a total of 90~99.9% by mass copolymers of tetrafluoroethylene units and fluoroalkyl vinyl ether units . 如請求項1或2之氟聚合物組成物,其中,上述導電性碳化合物係選自由導電性碳黑及奈米碳管所組成之群中之至少一種。The fluoropolymer composition of claim 1 or 2, wherein the conductive carbon compound is at least one selected from the group consisting of conductive carbon black and carbon nanotubes. 如請求項1至3中任一項之氟聚合物組成物,其中,相對於上述氟聚合物組成物,上述導電性碳化合物之含量為0.02〜15質量%。The fluoropolymer composition according to any one of claims 1 to 3, wherein the content of the conductive carbon compound is 0.02-15% by mass relative to the fluoropolymer composition. 一種成形品,其係藉由將請求項1至4中任一項之氟聚合物組成物成形而獲得。A molded product obtained by molding the fluoropolymer composition of any one of claims 1 to 4. 一種射出成形品,其係藉由將請求項1至4中任一項之氟聚合物組成物射出成形而獲得。An injection molded product obtained by injection molding the fluoropolymer composition of any one of claims 1 to 4.
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