TW202028692A - System and method for measuring the profile of a part - Google Patents

Abstract

The invention relates to a system and a method for measuring the profile of a part. According to the invention, the measurement system (100) comprises: - a sensor (110) with a probe (120) having at least one degree of freedom, and a first reference element (130) fastened to the probe (120), said sensor (110) being arranged so that said probe (120) is able to follow the internal or external contour of the part (50) while the first reference element (130) is outside the part (50), and - an imaging device (160) adapted to capture an image representing at least a portion of the outside of the part (50) and the first reference element (130). Thus, the first reference element (130) serves as a reference element for the position of the probe (120) relative to the reference system that is the part (50).

Description

System and method for measuring the contour of a part

Invention field

The present invention relates to the field of measuring the size of an object or a part. In detail, the present invention relates to the field of measuring the size of an object or a part using a sensor (touch-sensitive or non-touch-sensitive).

This type of measurement is used in many fields of applied dimensional metrology, including in particular (but not exclusive) the field of machined parts, in detail, the use of a machine tool or any other form of machinery by removing material Processing, but also used for manufacturing by adding materials. This measurement is also particularly suitable for monitoring wear and tear, or during maintenance operations.

In the field of machine tools, there is a need to accurately know the size and/or contour of a part in order to provide a plan consistent with the machining drawings developed during development.

Background of the invention

Various systems have been proposed for measuring the coordinates of an object in an optical touch-sensitive manner, in detail, a system including a flexible probe.

The document US2005259271A utilizes a scanner in the form of a feeler head mounted on a flexible probe extension. Form a unit integrally with the scanner. A first optical system detects the position of the feeler head in a plane x, y, and an autonomous second optical system detects that the feeler head is in the direction z The location.

Documents US2016370172A and US2005000102A describe a coordinate measuring system including a feeler head whose position is tracked by an optical sensor mounted coaxially with the probe. In the document US2016370172A, the probe is provided with a flexible extension, which has a contact element which contacts the component and carries a reference mark in vertical alignment with the touch sensitive component of the probe. In the document US2005000102A, the coordinate measuring instrument includes a gap head, which is mounted on an extension and its position is recognized by an optical system whose optical axis is aligned with the gap head.

In these solutions, it is impossible or not always possible to measure the movement of the feeler head in three directions in space. In detail, if the feeler head is hidden, in detail, in the component In a recess or a hole.

The document US2009144999A describes a probe for measuring the inner contour of a hollow part. The probe includes a rod, the lower end of which carries a feeler head in contact with the surface to be measured, and the upper end of which is exposed from the part and carries its position by an optical sensor (in detail, a mine Radio sensor) to identify a target. The rod is mounted on a spherical joint to cause the rod to move, and also provides freedom of translation. This arrangement requires support for the spherical joint mounted on the part to be measured, which creates an additional manipulation. In addition, the calibration probe requires an accurate and reproducible installation of the probe/support on the part to be measured.

Prior art solutions rely on measuring relative to markings on the outside of the component and measuring system, that is, involving intermediate measurements relative to the precise axis in the measuring procedure. This adds steps to the measurement, and leads to accumulated uncertainty, or even measurement errors, so that the final result is provided with regard to measurements that are not as accurate as needed.

These solutions therefore do not make it possible to quickly set up and use the device, and most importantly, realize the easy measurement of the contour (more specifically, the internal contour) of an object or part (and more specifically, a hollow part) .

In addition, for some applications, the above solutions are not always accurate enough.

Summary of the invention

One of the objectives of the present invention is to propose a measurement technique that does not have the limitations of known measurement techniques that realize the measurement of the contour (and in detail, the internal contour) of an object or a part.

Another object of the present invention is to propose a technique for realizing the measurement of the contour (and more specifically, the internal contour) of an object or a part, which provides a very accurate measurement of a part of a part.

Another object of the present invention is to propose a technique for realizing the measurement of the contour (and more specifically, the internal contour) of an object or a part, which has a minimum of measurement steps.

According to the present invention, the above objectives are achieved in detail by a measuring system for measuring an outer contour of a part or an inner contour of a hollow part, the system comprising: -A part (50) whose internal or external contour is to be measured, -A sensor comprising a probe and a first reference element fastened to the probe, a substrate and a guiding system connecting the probe and the substrate, thereby allowing at least a measurement direction to be defined according to A degree of freedom moves relative to each other, -The sensor is arranged so that during the movement of the sensor relative to the component in a direction different from the measuring direction, the probe can follow the internal or external profile of the component, and the first A reference element is outside the component and performs a path that reproduces the probe's path along the internal or external profile of the component, and -An imaging device adapted to capture images that replace at least a part of the exterior of the component and the first reference element, thereby detecting the first reference element and the first reference element by comparing the images taken by the imaging device The relative movement between the outer part of the component in the measurement direction, and a relative movement between the probe and the substrate is derived therefrom, which corresponds to the measurement along the contour of the component Offset in one of the measurement directions.

This solution particularly has the advantage over the prior art-there is no need to directly identify the position of a probe or a feeler head that will be in contact with the contour of the part, because during the measurement, the first place exists in all situations outside the part. The reference element is suitable for reproducing the movement of the probe and serves as a reference element for determining the position of the contact point between the surface of the part and the probe. Therefore, the first reference element serves as a reference element for the position of the probe relative to the reference system which is the component itself.

In the case of measuring the outer contour of a part or measuring the inner contour of a hollow part, this occurs first, regardless of whether the hollow part has or does not have an opening (open hole or blind hole). Also, secondly, in the case of measuring the internal contour of a component, the probe can remain inside the component in a hollow part due to the spatial offset between the probe and the first reference element, and the The first reference element remains outside of the component, which makes it possible to maintain access to the first reference element (for example, optically or by contact) and thus greatly facilitates the passage of the first reference element relative to the The measurement of the position of the part determines the position of the probe.

When the measurement system is not moving in position to measure the profile of a part and during movement of the part relative to the measurement system, the probe therefore has at least one degree of freedom relative to the part. This possibility of movement of the probe (or the moving part of the sensor) relative to the rest of the measurement system makes it possible to follow the profile (internal or external) of the component to be inspected. Obviously, the imaging device has a light field (or field of view), which makes it possible to view and thus capture an image that includes both an external part of the component and the first reference element. In this way, capturing continuous images when the component moves relative to the measurement system makes it possible for the imaging device to see through the movement of the first reference element in the field of view which contour corresponds to this travel of the first reference element.

According to an arrangement, the inner profile or the outer profile or both the inner profile and the outer profile of the component form a revolving surface around an axis. This axis is, for example, an axis parallel to the main axis of the sensor.

According to one arrangement, the sensor further includes a base and a guiding system connecting the probe and the base. This produces a controlled movement of the probe relative to the rest of the measurement system when the measurement system is in a measurement position relative to the component.

According to one possible arrangement, the guidance system allows only one degree of freedom between the probe and the substrate. Therefore, a measurement system whose design is simple and makes it possible for the probe to follow the change of the profile of the component in a direction allowed by the degree of freedom (which is necessary and sufficient in most cases) is available.

According to another arrangement, the measurement system further comprises a second reference element fastened to the substrate and arranged outside the component, the second reference element being placed so that the imaging device can see the first reference element, The second reference element and the outer part of the component. In fact, the second reference element remains outside the part in all cases, measuring its inner or outer contour. This arrangement can be used with a second reference element of a stationary element of the measurement system. The second reference element serves as another fixed mark, and the movement of the first reference element can be viewed (via the imaging device) relative to the other fixed mark. , And therefore the movement of the probe, in detail, in at least one direction allowed by the guidance system.

According to a first possible embodiment of the present invention, the probe includes a feeler head which can follow and detect the internal or external profile of the component by contact. A feeler head of this type physically follows the profile of the part to be measured, and in detail, the internal and therefore hidden contours (when measuring the internal contour).

According to a second possible embodiment of the present invention, the probe includes a detection head adapted to follow and detect the internal or external profile of the component without contact. For example, and in a non-limiting manner, this is a probe that functions optically (optical detection head), or, for example, a proximity sensor (distance or proximity detection head) or again an electromagnetic Or acoustic wave sensor (electromagnetic or acoustic wave detecting head).

According to one arrangement, the imaging device includes a video camera and a light source adapted to simultaneously illuminate the part of the exterior of the component and the first reference element. This arrangement enables the video camera to provide a sufficiently contrasting image, in particular, if the probe is placed in a hollow part and the first reference element is placed outside the part.

According to one arrangement, the video camera has a field of view that enables it to see the part of the exterior of the component and the first reference element. This arrangement makes it possible for the video camera to produce an image of the outer part of the part or the first reference element, in detail, when the probe is placed in a hollow part and the first reference element is placed When outside the component.

According to one arrangement, the guidance system includes a return member that enables the moving part of the sensor (and therefore the probe) when the probe no longer interacts with the internal or external profile of the part Return to a resting position relative to the base. During the interaction between the probe and the profile of the component, that is, in detail, touch, or when the probe is a feeler head, make contact with the bearing together to ensure effective interaction (in detail, Effective contact), so as to ensure a position of the probe and therefore the first reference element corresponding to the profile of the component. In a non-contact interaction situation, effective detection between the probe and the first reference element is ensured to achieve the measurement. In addition, when the measurement has been carried out, these return members enable the moving part of the sensor and therefore the probe to return to a resting position, wherein in the measurement system, in detail, in the first reference There is no stress (mechanical or other) in the transmission subsystem (in detail, the film subsystem) between the element and the probe. These return members can take many forms, including but not limited to at least one or more of the following elements: deformable and elastic elements, leaf springs (planar, curved, spiral or other), coil springs, and the like. These return members can also be obtained from the structure of the guidance system, due only to gravity, which causes a natural return to this resting position.

According to one arrangement, the guiding system includes a sliding connection or a pivoting connection between the probe (the moving part of the sensor) and the substrate, such as having one of mechanical elements, magnetic elements, hydraulic elements, etc. Pivot.

The present invention also relates to a method for measuring the contour of a part, in detail, using the system for measuring or determining the contour of a part as described herein. In detail, the present invention relates to a method of measuring the internal profile of a part using a measurement system as described herein. According to one possibility, the measurement method for measuring a profile of a hollow part includes the following steps: i) Provide a sensor, which includes a probe and a first reference element fastened to the probe, a substrate, and a guiding system connecting the probe and the substrate, thereby allowing at least a measurement according to the definition The relative movement of one degree of freedom of direction; and an imaging device, ii) Provide a hollow part whose contour is to be measured, iii) Place the sensor so that the probe detects a point on the profile of the part, while the first reference element is outside the part and in the field of view of the imaging device, iv) triggering the imaging system and forming an image representing at least a part of the exterior of the component and the reference element, v) Move the sensor relative to the component in a movement in a direction different from the measurement direction, and enable the probe to be held inside the component and follow the profile of the component, while the first reference The component remains outside the part and performs the same movement as the probe, vi) Perform steps iv) and v) for other points on the profile of the component.

The present invention also relates to a measuring method for measuring the outer contour of a part. In detail, a measuring system as described in this document is used. According to one possibility, the method of measuring the outer contour of a part includes the following steps: i) A sensor is provided, which includes a probe, a first reference element fastened to the probe, a substrate, and a guiding system connecting the probe and the substrate, thereby allowing at least a measurement according to the definition One degree of freedom of direction relative movement between them, and an imaging device is provided, ii) Provide a hollow part whose outer contour is to be measured, iii) Place the sensor so that the probe is outside the part and detects a point on the outer contour of the part, and the first reference element is also outside the part and in the field of view of the imaging device in, iv) triggering the imaging system and forming an image representing at least a part of the exterior of the component and the reference element, v) Move the sensor relative to the part in a movement in a direction different from the measurement direction, and enable the probe to follow the outer profile of the part, while the first reference element remains on the part And perform the same movement as the probe, vi) Perform steps iv) and v) for other points on the outer contour line of the component.

Generally speaking, the present invention also relates to a measuring method for measuring the contour (in detail, the internal or external contour) of a component. According to one possibility, a method of this kind for measuring the contour of a part comprises the following steps: i) A sensor is provided, which includes a probe, a first reference element fastened to the probe, a substrate, and a guiding system connecting the probe and the substrate, thereby allowing at least a measurement according to the definition One degree of freedom of direction relative movement between them, and an imaging device is provided, ii) Provide a hollow part whose contour is to be measured, iii) Place the sensor so that the probe detects a point on the profile of the part, while the first reference element is outside the part and in the field of view of the imaging device, iv) triggering the imaging system and forming an image representing at least a part of the exterior of the component and the reference element, v) Move the sensor relative to the part in a movement in a direction different from the measurement direction, and enable the probe to follow the profile of the part, while the first reference element is held on the part Outside and perform the same movement as the probe, vi) Perform steps iv) and v) for other points on the profile of the component.

According to one of the above measurement methods or another arrangement, further implement the following steps: a) For each image formed by the imaging device, calculate the relative position between the first reference element and the part of the exterior of the component, and b) Based on the continuously calculated relative position of the first reference element, reconstruct the measured (internal or external) profile of the part.

Detailed description of the preferred embodiment

Referring to FIG. 1, a measurement system 100 including a sensor 110 according to the present invention is shown in its resting position, not in contact with a component to be measured. The sensor 110 includes a base 112, here in the form of a rigid and practically non-deformable rectangular parallelepiped prism. The larger size of this base 112 defines the axis Y or measurement axis. Along the axis Y, seen on the base 112 are a first end 112a (on the right in FIGS. 1 to 7) and a second end 112b (on the left in FIGS. 1 to 7).

In a straight line perpendicular to the base 112, the sensor 110 includes a supporting portion 114 having a shape and size close to the shape and size of the base 112. The supporting portion 114 is also rigid and practically non-deformable. Along the axis Y, seen on the supporting portion 114 are a first end 114a (on the right in FIGS. 1 to 7) and a second end 114b (on the left in FIGS. 1 to 7).

A deformable and elastic guide system 140 connects the base 112 of the sensor 110 and the supporting portion 114 along the axis Z or the main axis of the sensor 110, and the axis Z is vertical in the drawings and when the measurement is performed. The base 112 and the support portion 114 are aligned with each other along the axis Z in the resting position of the sensor 110.

In line with the axis Z of the sensor 110, the support portion 114 is turned away from the base 112 by a feeler rod 122 and a rod 131 (also a component of the sensor 110) of the first reference element. Side extension. The feeler rod 122 and the rod 131 of the first reference element are mounted on the supporting portion 114 by one of its free ends. In the resting position, the feeler rod 122 and the rod 131 of the first reference element are parallel to each other and parallel to the main axis Z. The feeler rod 122 and the rod 131 of the first reference element are separated from each other by a distance (and equidistant) along the measurement axis Y by a distance Y0 (see FIG. 6). The feeler rod 122 and the rod 131 of the first reference element therefore define a plane (Y, Z).

In the resting position of the sensor 110, the direction perpendicular to the feeler rod 122 and the rod 131 of the first reference element and passing through these two rods 122 and 131 is the measurement axis Y. A horizontal axis X is defined, which is orthogonal to the plane (Z, Y) and orthogonal to the feeler rod 122 and the rod 131 of the first reference element. The axes X, Y and Z define an orthogonal (preferably standard orthogonal) axis system. These rods 122 and 131 are, for example, metal, specifically steel and rods.

The free end of the feeler rod 122 (the lower end in FIGS. 1 and 2 to 8) is terminated in a feeler head 123, thereby forming a probe head 120 for the sensor 110 of the measurement system 100. The feeler head 123 is made of, for example, metal, and in detail, is made of the same metal or metal alloy as the feeler rod 122. The feeler head 123, for example (see FIG. 6), is formed as a sphere with an axis passing through the feeler rod 21, and the feeler rod passes through the center of the sphere. In an alternative embodiment that can be seen in FIGS. 1, 3 to 5, and 7, the feeler head 123 is in the form of a spherical portion (in this example, a hemisphere), which is mounted on the feeler rod 122 On the side of the free end facing the rod 131 of the first reference element: in other words, the axis of the hemisphere (the feeler head 123) is oriented along the axis Y. In all cases, the feeler head 123 includes a portion that protrudes from the feeler rod 122 in the direction Y and protrudes toward the rod 131 of the first reference element. That is, there is a part of the feeler head 123 extending beyond the feeler rod 122 along the axis Y, and this protruding part of the feeler head 123 faces the reference rod 24 (reference head 25). In this way, as will be shown below, the feeler head 123 can be brought into contact with a surface of a component, and the feeler rod 122 will not contact the surface of the component.

The free end (the lower end in FIGS. 1 and 3 to 8) of the rod 131 of the first reference element is terminated in a first reference element 130. The first reference element 130 is made of, for example, metal, and in detail, is made of the same metal or metal alloy as the rod 131 of the first reference element. The first reference element 130 is in the form of a sphere, for example (see FIGS. 1 to 7), in which the axis of the rod 131 of the first reference element passes through the center of the sphere.

In the embodiment shown in FIGS. 1 to 8, the feeler head 123 is therefore mounted on the free end of the feeler rod 122 and the first reference element 130 is mounted on the free end of the rod 131 of the first reference element. Moreover, in the embodiments shown in FIGS. 1 to 8, the feeler rod 122 and the rod 131 of the first reference element are the same length, or more precisely, extend along the axis Z and extend the same distance beyond the support portion 114. The feeler head 123 and the first reference element 130 are therefore at the same distance Z0 from the support portion 114 (see FIG. 6). In other words, the feeler head 123 and the first reference element 130 are below the supporting portion 114 and at the same distance from the supporting portion 114.

In order that the movement of the feeler head 123 along the axis Y can be given to the first reference element 130, the guiding system 140 connecting the support portion 114 to the base 112 is deformable and elastic at least along the axis Y. Various embodiments including one or more elastic elements mounted between the support portion 114 and the base 112 are possible. In the case of the embodiment shown in FIGS. 1 to 8, two leaf springs 141, 142 are used as the guide system 140. These two leaf springs 141 and 142 are identical, and are parallel to each other, parallel to the main axis Z and parallel to the horizontal axis X in the resting position of the sensor 110. In other words, the planes of the stationary leaf springs 141 and 142 are parallel to the planes X and Z, and the planes of the stationary leaf springs 141 and 142 are orthogonal to the axis Y. As can be seen in FIG. 1, a first leaf spring 141 is installed between the first end 112 a of the base 112 and the first end 114 a of the supporting portion 114. The second leaf spring 142 is installed between the second end 112 b of the base 112 and the second end 114 b of the supporting portion 114. Alternatively, four leaf springs parallel to each other and parallel to the axes Z and X can be used, which are installed in pairs, and a pair of leaf springs are installed between the first end 112a of the base 112 and the first end 114a of the support portion 114, And another pair of leaf springs are installed between the second end 112b of the base 112 and the second end 114b of the supporting portion 114.

With this arrangement, in the resting position of the sensor 110 (the resting position of the measurement system 100), a frame, the base 112, the supporting portion 114, and the two leaf springs 141 and 142 are formed together. The frame is formed to form a rectangle in the plane (Y, Z) in the resting position of the sensor 110, wherein the length of the rectangle is parallel to the axis Z and the width of the rectangle is parallel to the axis Y. With this arrangement, in the measurement position of the sensor 110, the rectangle can be deformed, as can be seen in FIG. 5. In this case, the base 112 and the supporting portion 114 remain parallel to each other and parallel to the axis Y, have an offset dY1 along the axis Y of the supporting portion 114, and the first reference element 131 (130) and the second reference element 151 The rod (head) of (150) and the leaf springs 141 and 142 are deformed. In this measurement position, the deformed contours of the leaf springs 141 and 142 include two substantially straight end parts in the plane (X, Z) and a central part that forms a curve with a turning point.

Therefore, the moving part of the sensor 110 forms a probe 120, which includes a supporting part 114 and elements attached to it: a feeler rod 122, a feeler head 123, a first reference element (rod 130 and head 131) and Guide system 140 (plate springs 141 and 142). When passing from the measurement position to the resting position, that is, the feeler head 123 no longer contacts the surface of the component, the leaf springs 141 and 142 return to their original linear form and the support portion 114 returns to the vertical direction of the base 112.

According to the embodiment shown in Figures 1 to 5 and Figure 8, the guiding system 140 further includes a rod 143 whose first end 143a (in these figures, the upper end) is firmly fixed to the base 112, and The two ends 143b (in the figures, the lower end) are mounted on the supporting portion 114 by sliding connection in at least one of the directions Y. In this embodiment, the connection between the second end 143b of the rod 140c and the support portion 114 is also a sliding connection in the direction Z, which makes the absorption in the leaf springs 141, 142 or more generally the guiding system 140 Deformation in direction Z is possible.

In practice, in the arrangement shown in FIGS. 1 to 5 and 8, the supporting portion 114 includes a groove 114 c facing the base 112 leading to the upper surface of the supporting portion 114. As can be seen in FIG. 2, the groove 114c has a width 10 along the axis X, which is sufficient to accommodate the free end or the second end 143a of the rod 143 without play. As can be seen in FIG. 2, the groove 114c has a length L0 along the axis Y to accommodate and allow the free end or the second end 143b of the rod 143 to move toward the first end 114a or the second end 114b of the support portion 114 A predetermined maximum distance corresponding to the permitted maximum offset dY1 (dY1 _max ). If the rod 143 has a cylindrical shape with a circular cross-section with a diameter D, the groove 114c therefore has a width l0 equal to or substantially greater than D (l0 is between D and 1.05D, including D and 1.05D) And is equal to a length L0 of D+2(dY1 _max ). The groove 114c therefore has an elongated general shape along the axis Y. To illustrate by way of example, the groove 114c may be rectangular, oval or rectangular (button hole shape). This groove 114c leads or does not lead (blind groove) to the lower surface of the supporting portion 114. Taking an example to illustrate, the maximum offset dY1 (dY1 _max ) is a few millimeters, for example, 2, 5, 7 or 10 millimeters, which is to the right or left in FIGS. 2 to 5.

Referring to FIGS. 3 to 5, the sensor 110 is shown in the case of measuring the outer contour of the part 50, so the face 51 of the part forms an outer face 51. Preferably, this component 50 is a component that revolves around the axis Z for the surface to be measured, that is, for the external surface 51 (and optionally, also for the internal surface 54).

More generally, a method of the above types for measuring the outer contour of a part includes the following steps: a) Obtain a sensor 110 as described herein, b) Obtain a part 50 whose outer contour, that is, the contour of the surface 51 (outer surface) to be measured is to be measured, c) Obtain an imaging device 160 (such as the external sensor in FIG. 7), which is suitable for determining the position of the first reference element 130 (here, as can be seen in FIG. 3, the sensor 110 is in a position In the resting position, in which the support portion 114 and the base 112 are in an initial position aligned one on top of the other along the axis Z), d) Place the feeler head 123 against the outer surface 51, while the first reference element 130 is kept at a distance from the part 50 (that is, outside the part 50) (moving along the arrow F1 in FIG. 3, by The sensor 110 and the outer surface 51 of the component 50 move toward each other along the axis Y to end in the intermediate position from FIG. 4, in which the guiding system 140 is not deformed), e) Move the sensor 110 so that the feeler head 123 remains in contact with the outer surface 51 of the component, wherein the base 112 moves relative to the supporting portion 114 and relative to the component 50 along the axis Y (between the probe 120 and the base 112 Relative movement), (movement in the direction of arrow F1 in FIG. 4, where the base 112 of the sensor 110 moves a distance dY1 relative to the component 50 along the axis Y to end in the measurement position of the sensor 110 ),and f) The position of the first reference element 130 is recognized by the imaging device 160, which makes it possible to determine the position of the feeler head 123 on the face 51 of the component 50, and g) Move the sensor 110 so that the feeler head 123 of the probe 120 travels to another position on the outer surface 51 of the component 50 while maintaining the contact between the feeler head 123 and the outer surface 51 of the component 50 (in In Figure 5, the vertical movement in the direction of the arrow F2 along the axis Z, but this can be the movement in the direction X and/or the direction Y, depending on the geometric size of the component 50), after that, repeat the steps f) and g) until the outer contour (or part of the outer contour) of the component 50 is measured.

In the case of the hollow member 50 (holes, recesses, holes, openings, housing 52), the procedure is similar, placing the feeler head 123 of the probe 120 against the inner surface 54 of the part 50 inside the part 50 (In the housing 52), while the first reference element 130 remains outside the part 50, as explained with reference to FIGS. 6 and 7. In FIG. 6, the component 50 includes an opening hole 52 as a housing, and in FIG. 7, the component includes a blind hole 52 as a housing. Preferably, this component 50 is a component that revolves around the axis Z for the surface to be measured, that is, for the inner surface 54 (and optionally, also for the outer surface 51).

In this case, a method of this type for measuring the internal profile of a part 50 includes the following steps (see Figures 6 and 7): a) Obtain a sensor 110, b) Obtain a hollow part 50 whose internal contour (the internal surface 54 of the housing 52) is to be measured, c) Obtain an imaging device 160 (such as the external sensor in FIG. 7), which can determine the position of the first reference element 130, d) Place the feeler head 123 inside the hollow part 50, wherein the feeler head 123 abuts against the inner surface 54 while the first reference element 130 is kept outside the hollow part 50 (here, as in FIG. 6 It can be seen that the sensor 110 is in the resting position, where the probe 120, and in detail, the supporting portion 114 and the base 112 are in the initial position, and the supporting portion 114 and the base 112 are stacked on top of each other on the axis Z. quasi), e) Move the sensor 110 so that the feeler head 123 becomes (or remains) in contact with the inner surface 54 of the component 50, and f) The new position of the first reference element 130 is recognized by the imaging device 160, which realizes the determination of the new position of the feeler head 123 in the part 50, and g) Move the sensor 110 to another position on the inner surface 54 of the component 50, while maintaining the contact between the feeler head 123 and the inner surface 54 of the component 50, after that, repeat steps f) and g) , Until the determination of the internal contour of the component 50 is completed.

Whenever the sensor 110 is moved relative to the face 51 or 54 of the part 50 to be measured, and therefore whenever the feeler head 123 is moved on the face 51 or 54 to be measured, an imaging device (external sensor) is used 160 locates and determines the position of the first reference element 130 and its change in position. In fact, in the case of FIG. 7, if the new position of the first reference element 130 exactly corresponds to the movement along Z according to the position of the sensor 110, then the new position of the feeler head 123 and therefore the internal profile of the component 50 The new measurement point of, remains at the same position on Y as before (dY = 0). In another case not shown, where the surface 54 to be measured is not parallel to the vertical direction Z, but for example a truncated cone corresponding to the cone of the axis Z, then after moving on the vertical axis Z of the sensor 110, the first The new position of a reference element 130 not only corresponds to the movement along Z according to the position of the sensor 110, but also corresponds to the movement along Y, the new position of the feeler head 123, and therefore the new measurement of the internal profile of the part 50 The point, comes to a new position on Y relative to the previous position of the sensor (dY is not 0). For this purpose, the imaging device 160 includes an optional sensor. In this case, an imaging device 160 can be used with its optical axis O, which is arranged in a way orthogonal to the plane (Y, Z) (see FIG. 7), so as to be able to detect the first reference element 130 (And therefore, indirectly, the feeler head 123) moves along axis Y.

An imaging device 160 is formed by, for example, an optical system (in detail, a centered optical system), and the optical system includes a set of optical components and an image capturing system. Such an image acquisition system realizes the capture of photos and/or videos, and is, for example, a video camera or a still camera, in detail, a digital still camera.

The imaging device 160 has inherent properties that enable it to use a field of view 162 that covers the first reference element 130 disposed outside the component 50. In FIG. 6, the protrusions to the plane (Y, Z) of the field of view 162 can be seen, or the solid angle when the imaging device 160 is sensitive to electromagnetic radiation (light). In the situation shown in FIG. 6, the field of view 162 of the imaging device 160 includes the first reference element 130, and also covers or covers the part 50 or at least part of the part 50 including the surface 54 (inner surface 54) to be measured, in detail Yes, it is located in the plane (Y, Z) of the field of view 162 and corresponds to the surface to be measured (if it is the external surface 51) or the part of the external surface opposite to the surface 54 to be measured (if it is the internal surface 54) .

According to a variant of the first embodiment shown in FIG. 8, the sensor 110' further includes a second reference element 150, which is mounted on the base 112 and fastened to the base 112, and is located on the first reference element Near 130, and in all cases outside of component 50 (in the arrangement of Fig. 8, in front of and above the first reference element 130). To be more precise, the rod 151 of the second reference element is fixed to the side of the base 112 forming the first end 112a of the base, and is located in line perpendicular to the first end of the supporting portion 114 and the first reference element 130. In addition, the shape and length of the rod 151 of the second reference element that rigidly connects the base 112 to the second reference element 150 are arranged so as to avoid any contact with the first reference element 130 and the second reference element 150 and any collision between the bases. . In this embodiment, the second reference element 150 is a sphere of similar size to the sphere constituting the first reference element 130. In this context, a sensor with a reference 110' therefore corresponds to a situation where there is a second reference element 150 that interacts with the first reference element 130 to allow measurement. In fact, it should be understood that the second reference element 150 is fastened to the base 112 (and is integral with the base 112), which is fixed relative to this base 112, and the probe 120, and in detail, the first reference element 130, is relative to The base 112 is mobile.

Due to this second reference element 150, the offset along the axis Y of the feeler head 123 can be detected, and the offset (not shown) is used when the feeler head 123 abuts the surface 51 or 54 to be measured. The result of rod 122 deflection. In this case, in the measurement method described above, a second reference element 150 is further obtained, which is mounted on the substrate 112 and fastened to the substrate 112, and is located near the first reference element 130, and in the measurement step During f), the relative movement between the first reference element 130 and the second reference element 150 (in detail, along the axis Y) is further detected, and this relative movement is considered when determining the position of the feeler head 123. Therefore, it is obvious that the field of view 162 of the imaging device 160 also includes the second reference element 150.

This second reference element 150 is also suitable for measuring outer contours, because the same deflection phenomenon around the axis Y of the feeler rod 122 is prone to occur. Again, any deflection of the rod 131 without the first reference element is due to the first A reference element 130 is not in contact with any surface, and therefore does not experience any bearing force that can generate a return force on the parts of the surface and therefore deformation due to the deflection of the rod 131 of the first reference element.

In the case of this variation of the first embodiment, the method for measuring the internal profile of a part 50 includes the following steps (see Figure 9, Figure 10A and Figure 10B): a) Obtain one of the sensors 110' as described above, b) Obtain a hollow part 50 whose internal contour (the internal surface 54 of the housing 52) is to be measured, c) Obtain an imaging device 160 (such as the external sensor in FIG. 9), which can determine the relative position between the first reference element 130 and the second reference element 150, d) Place the feeler head 123 inside the hollow part 50, where the feeler head 123 abuts against the inner surface 54, while the first reference element 130 and the second reference element 150 are kept outside the hollow part 50 (here As seen in FIG. 10A, the sensor 110' is in the resting position, in which the support portion 114 and the base 112 are aligned on the axis Z one by one in the initial position, and the first reference element 130 and the second reference element 150 are aligned one on top of the other on the axis Z on the reference line R), e) Move the sensor 110' (arrow F1, FIG. 10B) relative to the component 50 along the axis Y, so that the feeler head 123 becomes (or remains) in contact with the internal surface 54 of the component 50: this produces abutment against the internal surface The supporting force of the first reference element 130 of 54 (arrow A) and the deformation of the leaf springs 141 and 142 have equal and opposite movement of the supporting portion 114 relative to the base 112 (arrow F3), which is in the direction of the first reference element 130 An offset dY1 is generated on Y relative to the second reference element 150 (FIG. 10B has an offset in direction Y, in the direction of arrow F3 of all probes 120), and f) The position of the first reference element 130 relative to the second reference element 150 is recognized by the imaging device 160, which realizes the determination of the position of the feeler head 123 in the component 50, and g) Move the sensor 110' to another position on the inner surface 54 of the part 50 in the direction Z (vertical direction), while maintaining the contact between the feeler head 123 and the inner surface 54 of the part 50, here After that, steps f) and g) are repeated until the internal contour of the component 50 is measured. In this way, as seen in FIG. 9, as and when the continuous position is adopted by the first reference element 130, a measurement line M is constructed point by point, which represents the internal profile of the internal surface 54. Obviously, the vertical reference line R passing through the second reference element 150 (for example, passing through its center or some other point) is used as a reference, and the measurement line M is to the internal profile line (internal profile) to be measured The external transposition of the component 50 of the line C (Figure 9)

In the first embodiment, the sensor 110 or 110' and the substrate 112 forming the fixed reference in the sensor form a parallel deformable structure, which includes a parallel non-deformable substrate 112 stacked on top of one another. And the supporting portion 114, and two leaf springs 141 and 142 that are deformable in the horizontal direction Y. This realizes the definition of a measurement axis (here, axis Y), and applies a supporting force of the feeler head 123 on the component 50. This supporting force depends on the characteristics (length, width, thickness) of the leaf springs 141 and 142 and their deformation.

In this first embodiment, but also generally, and as seen in FIG. 11, the present invention realizes that the feeler head 123 of the probe 120 held in contact with the component 50 is along the inner face 54 (outer face 51). It follows the internal (or external) profile of the component 50 very accurately. In the described embodiment, the reconstruction and following of the profile is performed in the vertical direction Z (the orientation of the measurement line M and the profile line C to be reconstructed), but it can be foreseen in some other direction This reconstruction and this follow-up of the profile, in detail, in a horizontal direction, for example, in the direction X or some other direction in the plane (X, Y), or again in the part of the profile Go to the first one of the aforementioned directions and then the second one of the aforementioned directions to change the profile part and return to the first one of the aforementioned directions to view the new profile part. Despite the fact that the feeler head 123 is not visible from the outside of the component 50, due to its position inside the housing 52, the present invention enables its movement on the surface 54 to be measured to be observed via the first reference element 130 . The guiding system 140 realizes the movement of the feeler head 123 relative to the substrate 112 in one or more directions.

Through the imaging device 160 having a field of view 162 including the first reference element 130 and the outer profile of the part and/or the second reference element 150, the present invention realizes continuous image capture during the movement of the first reference element 130 Take the measurement of its position relative to the outer profile of the component 50 (and possibly relative to the second reference element 150). These images realize the point-by-point production of the measurement line M that reconstructs the line C of the internal profile to be measured. Because the measurement system is transferred to the first reference element 130 outside the part, the movement of the feeler head 123 when it follows the inner (or outer) contour of the part 50 and therefore the inner (or outer) contour of the part 50 is may. The measurement line M in FIG. 9 corresponds to the internal contour of the component 50 at a position (a point) in a horizontal plane parallel to the plane (X, Y) in the vertical direction Z. In order to reconstruct all the internal (or external) contours of the part 50, that is, all the surfaces of the internal (external) surface 54 (51), the measurement steps must be repeated to reconstruct the other side of the plane parallel to the plane (X, Y). Another measurement line M'of another position (point) of the component (housing 52) in the horizontal plane, etc. is for the necessary number of points. The reconstructed measurement line M is equal to the "slice" of the part 50 in a plane parallel to the vertical axis Z and orthogonal to the plane (X, Y), which is reproduced outside the part 50. By also reconstructing other slices, each slice of the profile of the part 20 located in another plane parallel to the vertical axis Z and orthogonal to the plane (X, Y) is offset from the plane of the previously reconstructed slice For an angle θ, the juxtaposition of measurement lines M, M', etc. in the three-dimensional space is obtained by image addition. In the case of a revolving (rotationally symmetric) part 50 with a small number of slices, this is more rapid.

Perform a preliminary step of preliminary calibration to accurately determine the relative position between the first reference element 130 and the position of the feeler head 123, so that the measurement line M to be transferred later can be measured and cannot be measured from outside the part. See line C of the internal profile. For this purpose, according to one possibility, the imaging device 160 is used to capture an image of the sensor 110 or 110' without the component 50, so as to define the first reference element 130 and the feeler head 123 on the sensor 110 or 110' The relative position in the resting position.

The sensor 110 or 110' can be held by a holder or a support (shown diagrammatically in FIG. 12) by its base 112 and controlled by any movement system (such as a control system and a motorized shaft 170) The articulated arm) moves to realize the relative movement between the sensor 110 or 110' and the component 50: -Horizontally along axis Y in the direction of arrow F1 in Fig. 12, And/or -Vertically along axis Z in the direction of arrow F2 in FIG. 12.

Now refer to FIG. 13A and FIG. 13B showing a measurement system 200 according to a second embodiment of the present invention. In this case, the elements of the measurement system 200 similar to the elements of the measurement system (measurement system 100) of the first embodiment described above carry a reference sign, which is the reference sign of the element of the first embodiment increased by 100. There is a sensor 210, which includes: -A supporting portion 214, which faces the bottom of the feeler rod 222 (carrying a feeler head 223 at its free end) and a parallel rod 231 of the first reference element (carrying the first reference element 230 at its free end) Extend vertically, -A base 232 which extends vertically towards the bottom of a rod 251 of the second reference element (carrying the second reference element 250 at its free end). A variant not shown may not include this second reference element 250, but only the substrate 232.

The supporting part 214 and the base 212 are placed one by one in front (in the horizontal direction X) by a guiding system 240, and the guiding system 240 allows rotational movement between them about an axis P parallel to the horizontal direction X . This direction X is orthogonal to the horizontal measurement direction Y separating the gap probe 223 and the first reference element 230. For this purpose, the guiding system 240 connecting the support portion 214 and the base 212 can be designed in many ways, and in detail, including being parallel to the axis P and in line with the feeler head 223 (in FIGS. 13A and 13B Vertically, that is, in the direction Z) a shaft (not shown). The shaft passes through the supporting portion 214 and the base 212, and is fixedly installed relative to the supporting portion 214 or the base 212, and movably installed relative to the other of the supporting portion 214 or the base 212, which constitutes a bearing. The guiding system 240 further optionally includes a coil spring (not shown), wherein an axis parallel to the axis P (and possibly coaxial with the axis P) surrounds the shaft, wherein the inner end is fixed to the shaft and the outer The end is fixed to the other of the supporting part 214 or the base 212. This rotational movement of the guide system 240 about the axis P (see the arrow F3 in FIG. 13A and FIG. 13B) is facilitated by the presence of a counterweight 241 connected to the outside of the support portion 214. The support portion 214 and the counterweight There is an offset between 241 in direction Y. The counterweight 241 therefore acts as a counterweight to the assembly formed by the feeler head 223 and the first reference element 230. The mass of this counterweight 241 can be modified, and likewise, the distance L1 separating it from the shaft (axis P) and therefore from the feeler head 223 can be modified to form an adjustable lever arm.

In this case, the probe 220 (the feeler head 223 at the free end of the feeler rod 222) is connected to the fixed part of the measurement system by a guide system 240, thereby allowing only relative to the direction orthogonal to the measurement direction Y A rotation of the axis P. Here, it is therefore one of the problems of the pivotal guidance system 240. Other designs can naturally be used for this guiding system that pivots between the probe 220 and the fixed part of the sensor 210 (for example, the base 212), thereby allowing rotation therebetween about an axis P parallel to the horizontal direction X A guide system 240 is moved.

Therefore, a pendulum-type structure is formed that functions in the same manner as the sensor 110 ′ according to the variant of the first embodiment and realizes the definition of a measurement axis in the direction Y. This structure realizes that a constant and extremely weak supporting force A of the feeler head 223 is provided on the inner surface 54 (or outer surface 51) of the component, regardless of the deformation of the coil spring. In this case, the guiding system 240 allows one degree of freedom of the probe 220, which is a rotational movement about an axis P parallel to the axis X. Once the feeler head 223 is no longer in contact with the surface of the component 50, the probe 220 (in detail, the supporting portion 214 and the components attached to it) is returned to its resting position by simple gravity. The use of the sensor 210 in combination with an imaging device 160 enables a component profile measurement system to be formed using the same measurement method as the measurement method already described with reference to the first embodiment.

This arrangement forms a measurement system 200 in which: -The component 50 is hollow and the internal profile of the component 50 forms a revolving surface 54 around a revolving axis (the revolving axis is for example parallel to the main axis of the sensor 110, for example, along the axis Z), -The probe 220 includes a feeler head 223, which can detect the internal profile of the component 50 by contacting it, and can follow a degree of freedom in a measurement direction (direction Y) perpendicular to the rotation axis The internal profile of the component 50. This measuring direction (direction Y) separates the feeler head 223 and the first reference element 230 from each other, -The guiding system 240 includes a pivotal connection between the probe 220 and the base 212 around an axis (P) perpendicular to the rotation axis and orthogonal to the measuring direction (direction Y). It should be understood that the measurement system 200 further includes a second reference element 250 fastened to the base 212 (and integral with it) and located outside the component, and the imaging device 160 can capture an image further including the second reference element 250 Therefore, the change of the relative position between the first reference element 230 and the second reference element 250 allows the measurement of the contour of the internal profile of the component 50.

An arrangement such as the arrangement according to FIGS. 13A and 13B allows the implementation of one of the measurement methods described above, wherein the following steps are further carried out: -Compare the images taken by the imaging device 160 to detect the relative movement in the measurement direction between the first reference element 130 and the outer part of the component 50, and -Derive from it the relative movement between the probe 120 and the substrate 112, which corresponds to an offset in the measurement direction along the measured profile of the component 50. In detail, when the component 50 is hollow and the internal profile of the component 50 forms a revolving surface 54 around a revolving axis (notably, a revolving axis parallel to the main axis Z of the sensor 110) Time, -The probe 220 includes a feeler head 223, which can detect the internal profile of the component 50 by contacting it, and can follow a measurement direction Y perpendicular to the axis of rotation (notably, perpendicular to the sensing One degree of freedom in a measurement direction Y) of the main axis Z of the device 110 follows the internal profile of the component 50, and the measurement direction Y separates the feeler head 223 and the first reference element 230 from each other, -The guiding system 240 includes a pivotal connection between the probe 220 and the base 212 around an axis P perpendicular to the revolving axis and orthogonal to the measuring direction Y. In the embodiment illustrated in FIGS. 13A and 13B, the sensor 210 further includes a second reference element 250 fastened to the base 212 and located outside the component 50, and the imaging device 160 can photograph and further include a second reference An image of the element 250, whereby the change in the relative position between the first reference element 230 and the second reference element 250 allows the contour of the internal profile of the part 50 to be measured.

Now refer to FIG. 14A and FIG. 14B showing a measurement system 300 according to a third embodiment of the present invention. In this case, the elements of the measurement system 300 similar to the elements of the measurement system of the first embodiment described above carry a reference number, which is the reference number of the elements of the first embodiment increased by 200. There is a sensor 310, which includes: -A supporting portion 314 facing towards the bottom of the feeler rod 322 (carrying a feeler head 323 at its free end) and a parallel rod 331 of the first reference element (carrying the first reference element 330 at its free end) Extending vertically, the supporting portion 314 has a general shape of L, where the rod of L is oriented in the vertical direction Z, and the bottom edge of L is parallel to the direction Y and carries the feeler head 323 and the first reference element 330, -A base 312 that extends vertically toward the bottom of the second reference element rod 351 (carrying the second reference element 350 at its free end). A variant not shown may not include this second reference element 350 but only the substrate 312.

The supporting portion 314 and the base 312 move in translation relative to each other in the direction of the horizontal measurement axis Y. Here, the base 312 is in the shape of a stirrup. In detail, it is in the shape of an inverted U, where the base of U is parallel to the direction Y and the two branches of U are parallel to the direction Z. Extend one of the two branches of U of the base 312 to the second reference element rod 351 and extend the second reference element 350. Two guiding members parallel to each other and parallel to the direction Y connect the two branches of U to each other to realize the translational movement of the supporting portion 314. More precisely, a rail 344 forms a first guide member in the form of a rod, which preferably has a circular cross-section, and the support portion 314 is mounted on it, in an opening that passes through the part of the rod of L The level. In addition, the slider 345 forms a second guide member in the form of a rod parallel to the rail 344. In order to cooperate with the translation of the slider 345, other parts of the rod of L include, for example, a notch to partially surround the slider 345, or form a through hole for a passage of one of the sliders 345.

In order for the feeler head 323 to apply a supporting force (arrow A) oriented in the vertical direction on the inner (or outer) surface 54 (51) of the component and to return to the supporting portion 314 along the axis Y relative to the base In the resting position (FIG. 14A ), two compression springs 346 and 347 are used, which form a return member for the support portion 314. These springs 346 and 347 are installed on the rails on the respective opposite sides of the supporting portion 314. These springs 346 and 347 have one end that is in contact with the support portion 314 (one spring is in contact with one surface) and is supported on the support portion 314, and is in contact with the base 312 and supported by the base 312 (each spring becomes supported by the U of the base 312). On one of the different branches. As in the examples shown in FIGS. 14A and 14B, these are, for example, two coil springs 346 and 347. In the example shown in FIGS. 14A and 14B, these are two coil springs 346 and 347 of the same length and the same compression resistance per unit length, which place the resting position of the support portion 314 (see FIG. 14A) Between the two arms of the base 312 (ends in the measurement direction Y). However, the geometric and/or physical characteristics of each spring 346 and 347 can be adjusted according to specific requirements. Obviously, with this arrangement, the supporting force A of the feeler head 323 on the component 50 depends on the deformation of the springs 346 and 347: Therefore, in the case of FIG. 14B, the feeler head 323 is supported on the inner surface 54 of the component 50 In the right area of the figure, on a part of the vertical inner surface 54 as seen by the imaging device; in this case, the sensor 310 is shifted toward the right with respect to the component 50, which has shifted the support portion 314 The first spring 346 located on the left side of the supporting part 314 is moved to the left by a distance dY1 (see FIG. 14B) relative to the base 312 and compresses (more). The distance dY1 is between the first reference element 330 fastened to the supporting portion 314 and the second reference element 350 fastened to the base 312.

Now refer to FIG. 15A and FIG. 15B showing a measurement system 400 according to a fourth embodiment of the present invention. In this case, the elements of the measurement system 400 similar to the elements of the measurement system 300 according to the third embodiment described above carry a reference number, which is the reference number of the third embodiment increased by 100. There is a sensor 410, which includes: -A support portion 414, which faces the bottom of the feeler rod 422 (carrying a feeler head 423 at its free end) and parallel to a first reference element rod 431 (carrying the first reference element 430 at its free end) ) Extending vertically, this support portion 414 has a general shape U on its side, wherein the bottom of U is oriented in the vertical direction Z, the upper part of U is oriented in the direction Y and the lower part of U (carrying the gap head 423 And the first reference element 430) is also oriented parallel to the direction Y; -A base 412 that extends vertically toward the bottom of the second reference element rod 451 (carrying the second reference element 450 at its free end). A variant not shown may not include this second reference element 450, but only the substrate 412.

The supporting portion 414 and the base 412 move in translation relative to each other toward the measurement axis which is the vertical axis Z this time. Here, the base 412 is also in the shape of a stirrup, in detail, it is in the shape of a U with its side lying down, wherein the base of U is parallel to the vertical axis Z and the two branches of U are parallel to the direction of the axis Y; the supporting part The opening surface of U of 414 faces the base 412; the opening surface of U of the base 412 faces the supporting portion 414. One of the two branches (lower branch) of U of the base 412 extends the second reference element rod 451 and extends the second reference element 450, and is partially disposed in the housing bounded by the support portion 414, at least protruding to FIG. 15A Or in the plane of FIG. 15B, that is, as seen in the direction X by the imaging device 160 (not shown). Two guiding members parallel to each other and parallel to the direction Z connect the two branches of U of the base 412 to each other to realize the translational movement of the supporting portion 414. More precisely, a rail 444 forms a first guide member in the form of a rod, which preferably has a circular cross-section, and the support portion 414 is mounted on it, at the two branches of U passing through the base 412 The level of the opening in the other part (the upper branch). In addition, the slider 445 forms a second guide portion in the form of a rod parallel to the rail 444. In order to cooperate with the translation of the slider 445, this other part of the other of the two branches of U of the base 412 (the upper branch) includes, for example, a notch to partially surround the slider 445, or is formed for one of the sliders 445 A through hole of the road.

In order for the feeler head 423 to apply a supporting force (arrow A) oriented in the horizontal direction on a part of the inner (or outer) surface 54 (51) of the component and to return to the base 412 along the vertical axis Z, In the resting position of the supporting part 414 (FIG. 15A ), two compression springs 446 and 447 are used, which form a return member for the supporting part 412. These springs 446 and 447 are installed on the rails 444 on the respective opposite sides of the supporting portion 414. These springs 446 and 447 have an end in contact with and supported on the support portion 414 and an end in contact with and supported on the base 412 (each ring becomes supported on a different branch of the base 412). As in the examples shown in FIGS. 15A and 15B, these are, for example, two coil springs 446 and 447. In the example shown in FIGS. 15A and 15B, these are two coil springs 446 and 447 of the same length and the same compression resistance per unit length, which place the resting position of the support portion 414 (see FIG. 15A) Between the two arms (ends in the measurement direction Z) of the base 412. However, the geometric and/or physical characteristics of each spring 446 and 447 can be adjusted according to specific requirements. Obviously, with this arrangement, the supporting force A of the feeler head 423 on the part 50 depends on the deformation of the spring: therefore, in the case of FIG. 15B, the feeler head 423 is supported by the part 50 in the right area in the figure. On the inner surface 54, here as seen by the imaging device on a horizontal surface portion, the feeler head includes a concave shoulder; in this case, there is already a sensor 410 in the direction Z relative to the part 50 The upward and upward translational offset has moved the support portion 414 downward relative to the base 412 by a distance dZ1 (see FIG. 15B) and compresses (more) the second spring 447 that sits on the support portion 414 and is partially supported. The distance dZ1 is between the first reference element 430 fastened to the supporting portion 414 and the second reference element 450 fastened to the base 412.

As shown diagrammatically in FIG. 16, an imaging device 160 used in a measurement system according to the present invention (for example, according to one of the embodiments shown in these figures and described above) includes: -A video camera and a set of lenses, which enable the focal plane of the imaging device 160 to be placed on the component 50 and the first reference element 130 (230, 330, 430), but also on the second reference when applicable On element 150 (250, 350, 450). In order to improve the contrast of the image captured by the imaging device 160 in its field of view 162, in an embodiment as shown in FIG. 16, a light source 164 is placed relative to the object (or the object) observed by the imaging device 160. Etc.) Provide backlight. In this way, the object or objects present in the field of view 162 of the imaging device 160 (the video camera of) are placed between the imaging device 160 and the light source 164. This backlight produces an image, such as the image in FIG. 17A (for example a spherical portion of the feeler head), with a gray or dark/light gradation between the part and the outside of the part. Processing this image (Figures 17B to 17F) enables an image to be obtained after processing I. Processing I realizes very accurate demarcation of the position of the object or the outline of the object seen by the imaging device 160 (Figure 17F) .

The above has described a technique in which the determination of the position of the first reference element 130 (and where applicable, the position of the second reference element 150) is performed by the imaging device 160 in an optical manner. The present invention is equally applicable to determining the first position in some other way and in detail according to the contact between a sensor of some other type and the position of the first reference element 130 and, if applicable, the second reference element 150 The position of the reference element 130 (and where applicable, the position of the second reference element 150). It should be noted that if the position of the first reference element 130 and, when applicable, the position of the second reference element 150 are determined by an optical method, this implementation eliminates the rod 131 (of the first reference element 130 (second reference element 150) 151) the additional deformation and therefore the offset of the first reference element 130 (second reference element 150) that will modify the measurement result.

It can be pointed out that some or all of these embodiments, in detail, the measurement system 100 of the first embodiment (with the sensor 110 coupled to the second reference element 150 or the variant of the sensor 110') , The common point between the measurement system 200 of the second embodiment and the measurement system 300 of the third embodiment, the guiding systems 140, 240, 340 are at least one flexible system in the direction Y. In the case of the measurement system 400 of the fourth embodiment, the guiding system 440 is a flexible system at least in the direction Z.

Also, in detail, between the measurement system 100 of the first embodiment, the measurement system 200 of the second embodiment, the measurement system 300 of the third embodiment, and the measurement system 400 of the fourth embodiment, the following arrangements A to J Any one or more of them is applicable to a sensor that also constitutes the subject of the present invention or a measurement system that constitutes the subject of the present invention and includes a sensor of that type.

*Arrangement A: The sensor forms a mechanical gap measuring device, which is suitable for measuring the internal contour of the component 50 and includes: -A base, -A support part which is elastically connected to the base by a guiding system, -A feeler head, which is mounted on the support part via a feeler rod, -A reference head, which is mounted on the support part via a reference rod, wherein: -The reference head and the feeler head are located on the opposite side of the supporting part opposite to the base, -The reference rod and the feeler rod are arranged in a plane Y, Z, and in the resting position of the device, parallel to each other and parallel to a direction Z.

* Arrangement B: The guidance system is such that when the feeler head becomes and remains in contact with a surface of the component, the relative movement between the feeler head and the substrate is at least partially transmitted to the reference via the guidance system head.

* Arrangement C: The guiding system makes any relative movement between the feeler head and the substrate in direction Y at least when the feeler head becomes and remains in contact with one of the surfaces that are not parallel to the plane Y, Z Part of it is transmitted to the reference head via the guidance system.

*Arrangement D: The guiding system includes at least one element forming a spring. In detail, the guiding system includes two parallel leaf springs connecting the support part to the base. In the resting position of the device, the plane of each leaf spring is orthogonal to the direction Y.

*Arrangement E: The feeler head is installed at the free end of the feeler rod, and the reference head (first reference element) is installed at the free end of the reference rod.

* Arrangement F: The feeler rod and the reference rod are the same length.

*Arrangement G: The device further includes a calibration indicator (second reference element) installed on the base and fastened to the base and located near the reference head. This calibration indicator (second reference element) realizes the detection of the offset of the feeler head in the direction Y (or in the direction Z, or in the direction X).

* Arrangement H: A measurement system includes one of the above types of mechanical gap measurement devices and an external device with an external sensor (such as an imaging device), the external device is suitable for measuring the reference head (first reference element) position.

* Arrangement I: One of the above types of measurement systems, where the external sensor is an optical device with an optical sensor, and its optical axis is arranged in a way orthogonal to one of the planes (Y, Z).

* Arrangement J: The measurement direction is orthogonal to the main axis (Z) of the sensor (110), for example, in the horizontal direction Y.

The first embodiment 100, the second embodiment 200, the third embodiment 300, and the fourth embodiment 400 of the measurement system described above include a mechanical sensor, and therefore are an example of a contact profile measurement technique. However, the measurement system according to the present invention can equally be in the form of a contactless system.

The above kind of measuring system according to the present invention can be equipped with a measuring table or a station for inspecting parts during machining, and can even be an integrated module of a machine tool.

X: horizontal axis Y: measuring axis Z: main (vertical) axis Y0: Separate the distance between the feeler rod and the first reference element rod Z0: Separate the distance between the feeler head and the first reference element and the supporting part dY1: Offset between the base and the supporting part in the measurement position l0: groove 114c width L0: Length of groove 114c F1, F2: Arrow (movement of sensor 110) F3: Arrow (movement of supporting part relative to base 112) A: Arrow (the supporting force of the first reference element 130 on the component 50) R: Reference line (the vertical line passing through the second reference element 150) M: Measuring line of the internal contour of the internal surface 54 C: Follow the line of the internal contour to be measured 50: Parts 51: Surface to be measured (external surface) 52: Shell (holes, holes, etc.) 54: Surface to be measured (internal surface) 100: Measuring system (first embodiment) 110, 110', 210, 310, 410: sensor 112,212: base 112a: first end 112b: second end 114,214: supporting part 114a: The first end of the supporting part 114b: The second end of the supporting part 114c: groove 120, 220, 320, 420: probe 122,222,322,422: feeler rod 123,223,323,423: feeler head 130, 230, 330, 430: the first reference element 131,231,331,431: first reference element rod 140, 240, 340, 440: guidance system 141: The first leaf spring 142: second leaf spring 143: Stick 143a: The first end of the stick 143b: The second end of the stick 150, 250, 350, 450: second reference element 151, 251, 351, 451: second reference element rod 160: imaging device 162: Field of Vision of Imaging Device 164: light source I: Processed image 200: measurement system (second embodiment) 241: Counterweight P: Rotation axis between 214 and 212 L1: Length of lever arm 300: measurement system (third embodiment) 312,412: Base (Stirrup-shaped) 314: Support part (L-shaped sliding action frame) 344,444: Orbit 345,445: Slider 346,446: first coil spring 347,447: second coil spring 400: measurement system (third embodiment) 414: Support part (U-shaped sliding action frame)

The embodiments of the present invention are indicated in the description illustrated by the drawings, in which: Fig. 1 is a perspective view of a measurement system according to a first embodiment of the present invention, 2 is a partial perspective view of the measurement system according to the first embodiment of the present invention in the direction of arrow II in FIG. 1, Figures 3 to 5 are front views of various steps of using the measurement system of Figure 1, Fig. 6 is a sectional front view showing the principle of measuring the internal profile of a component using the measuring system from Fig. 1, Fig. 7 is a schematic perspective view of the principle of the measuring method using the measuring system according to the first embodiment of the present invention from Fig. 1 in the case of measuring the internal profile of a component, Fig. 8 is a front view of a variation of the measurement system according to the first embodiment of the present invention, Fig. 9 is a more diagrammatic front view of a variation of the measurement system according to the first embodiment of the present invention showing the principle of measurement achieved in the case of the internal profile of a component, 10A and 10B show the steps of a measurement method using a variant of FIG. 9 of the measurement system according to the first embodiment of the present invention, 11 and 12 diagrammatically show the general principle of the measurement system according to the present invention, 13A and 13B show the steps of measurement using a measurement system according to a second embodiment of the present invention, 14A and 14B show the steps of measurement using a measurement system according to a third embodiment of the present invention, 15A and 15B show the steps of measurement using a measurement system according to a fourth embodiment of the present invention, FIGS. 16 and 17A to 17F respectively show an imaging device that can be used in the measurement system according to the present invention and possible steps for processing or analyzing images captured by the imaging device when using the measurement method according to the present invention.

50: Parts

52: Shell (holes, holes, etc.)

54: Surface to be measured (internal surface)

100: Measuring system (first embodiment)

110: Sensor

112: Base

112a: first end

112b: second end

114: support part

114a: The first end of the supporting part

114b: The second end of the supporting part

114c: groove

122: feeler rod

123: feeler head

130: The first reference element

131: first reference element rod

140: Guidance System

141: The first leaf spring

142: second leaf spring

143: Stick

160: imaging device

Claims (19)

A measuring system for measuring the outer contour of a part or the inner contour of a hollow part, comprising: A part whose internal or external contour is to be measured, A sensor including a probe, a first reference element fastened to the probe, a substrate, and a guiding system connecting the probe and the substrate, thereby allowing at least one of the measurement directions defined according to The relative movement of degrees of freedom in between, The sensor is arranged so that during the movement of the sensor relative to the part in a direction different from the measuring direction, the probe can follow the inner or outer contour of the part, and the The first reference element is outside the part and performs a path that reproduces the path of the probe along the inner or outer profile of the part, and An imaging device adapted to capture images that replace at least a part of the exterior of the part and the first reference element, thereby detecting the first reference element and the part by comparing the images taken by the imaging device The relative movement between the outer parts in the measurement direction, and a relative movement between the probe and the substrate is derived therefrom, which corresponds to the measured contour along the part in the measurement direction One is offset. Such as the measurement system of claim 1, wherein the inner profile or the outer profile of the component forms a revolving surface around an axis. Such as the measurement system of claim 2, wherein the guiding system only allows one degree of freedom between the probe and the substrate. For example, the measurement system of claim 2 or 3, further comprising a second reference element fastened to the base and arranged outside the component, the second reference element being placed so that the imaging device can see the first reference at the same time Component, the second reference component, and the part of the exterior of the component. Such as the measurement system of any one of claims 1 to 4, where The probe includes a feeler head, which can follow and detect the internal or external profile of the component by contact. Such as the measurement system of any one of claims 1 to 4, where The probe includes a detection head, which is adapted to follow and detect the internal or external profile of the component without contact. Such as the measurement system of any one of claims 1 to 6, where The imaging device includes a video camera and a light source, which is suitable for simultaneously illuminating the part of the exterior of the component and the first reference element. Such as the measurement system of claim 7, where The video camera has a field of view so that it can see the part of the exterior of the component and the first reference element. Such as the measurement system of any one of claims 2 to 8, where The guiding system includes a return member, which enables the probe to return to a resting position relative to the substrate when the probe no longer interacts with the internal or external profile of the component. Such as the measurement system of any one of claims 1 to 9, where The guiding system includes a sliding connection and a pivoting connection between the probe and the base. Such as the measurement system of any one of claims 1 to 9, in which: The part is hollow and the internal profile of the part forms a revolving surface around a revolving axis, The probe includes a feeler head, which can detect the internal profile of the part by contact, and can follow the part of the part according to a degree of freedom in a measurement direction perpendicular to the rotation axis Internal profile, this measuring direction separates the feeler head and the first reference element from each other, The guiding system includes a pivotal connection between the probe and the base about an axis perpendicular to the revolving axis and orthogonal to the measuring direction. For example, the measurement system of any one of claims 1 to 11, further comprising a second reference element fastened to the base and located outside the component, and the imaging device can capture an image further including the second reference element, Thereby, the change in the relative position between the first reference element and the second reference element allows the measurement of the profile of the internal profile of the component. A measurement method for measuring the internal profile of a hollow part, including the following steps: i) A sensor is provided, which includes a probe, a first reference element fastened to the probe, a substrate, and a guiding system connecting the probe and the substrate, thereby allowing at least a measurement according to the definition One degree of freedom of direction relative movement between them, and an imaging device is provided, ii) Provide a hollow part whose internal contour is to be measured, iii) placing the sensor so that the probe is inside the component and detects a point on the internal contour of the component, and the first reference element is outside the component and in the field of view of the imaging device, iv) triggering the imaging system and forming an image representing at least a part of the exterior of the component and the reference element, v) Move the sensor relative to the component in a movement in a direction different from the measurement direction, and enable the probe to be held inside the component and follow the internal profile of the component, and the first reference The component remains outside the part and performs the same movement as the probe, vi) Perform steps iv) and v) for other points on the internal profile of the part. A measurement method for measuring the outer contour of a part, including the following steps: i) A sensor is provided, which includes a probe, a first reference element fastened to the probe, a substrate, and a guiding system connecting the probe and the substrate, thereby allowing at least a measurement according to the definition One degree of freedom of direction relative movement between them, and an imaging device is provided, ii) Provide a part whose outer contour is to be measured, iii) Place the sensor so that the probe is outside the part and detects a point on the outer contour of the part, and the first reference element is also outside the part and in the field of view of the imaging device in, iv) triggering the imaging system and forming an image representing at least a part of the exterior of the component and the reference element, v) Move the sensor relative to the part in a movement in a direction different from the measurement direction, and enable the probe to follow the outer profile of the part, while the first reference element remains on the part And perform the same movement as the probe, vi) Perform steps iv) and v) for other points on the outer contour line of the component. A measurement method for measuring the contour of a part, including the following steps: i) A sensor is provided, which includes a probe, a first reference element fastened to the probe, a substrate, and a guiding system connecting the probe and the substrate, thereby allowing at least a measurement according to the definition One degree of freedom of direction relative movement between them, and an imaging device is provided, ii) Provide a part whose outline is to be determined, iii) Place the sensor so that the probe detects a point on the shape of the part, while the first reference element is outside the part and in the field of view of the imaging device, iv) triggering the imaging system and forming an image representing at least a part of the exterior of the component and the reference element, v) Move the sensor relative to the part in a movement in a direction different from the measurement direction, and enable the probe to follow the profile of the part, while the first reference element is held on the part Outside and perform the same movement as the probe, vi) Perform steps iv) and v) for other points on the profile of the component. Such as the measurement method of any one of claim 13 to 15, wherein the following steps are further implemented: a) For each image formed by the imaging device, calculate the relative position between the first reference element and the part of the exterior of the component, and b) Based on the continuously calculated relative position of the first reference element, reconstruct the measured profile of the part. Such as the measurement method of any one of claims 13 to 16, wherein the following steps are further implemented: Comparing the images taken by the imaging device to detect the relative movement in the measurement direction between the first reference element and the part of the exterior of the component, and A relative movement between the probe and the substrate is derived therefrom, which corresponds to an offset in the measurement direction along the measured profile of the component. Such as the measurement method of claim 14, wherein the component is hollow and the internal profile of the component forms a revolving surface around a revolving axis, The probe includes a feeler head, which can detect the internal profile of the component by contact, and can follow the interior of the component according to a degree of freedom in a measurement direction perpendicular to the axis of rotation Profile, this measuring direction separates the feeler head and the first reference element from each other, The guiding system includes a pivotal connection between the probe and the base about an axis perpendicular to the revolving axis and orthogonal to the measuring direction. Such as the measurement method of claim 18, wherein the sensor further includes a second reference element fastened to the substrate and located outside the component, and the imaging device can capture an image further including the second reference element, by This change in the relative position between the first reference element and the second reference element allows the profile of the internal profile of the part to be measured.

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