TW202022488A - Resist pattern forming method - Google Patents

Resist pattern forming method Download PDF

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TW202022488A
TW202022488A TW108122559A TW108122559A TW202022488A TW 202022488 A TW202022488 A TW 202022488A TW 108122559 A TW108122559 A TW 108122559A TW 108122559 A TW108122559 A TW 108122559A TW 202022488 A TW202022488 A TW 202022488A
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hydrocarbon group
aforementioned
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竹下優
白木雄哲
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日商東京應化工業股份有限公司
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Abstract

To provide a resist pattern forming method by which generation of a defect in an unexposed portion of a resist film can be reduced and a resist pattern having a good profile can be formed. The resist pattern forming method includes: a step of forming a resist film on a support by using a resist composition; a step of exposing the resist film; and a step of developing the exposed resist film with an alkali developer solution containing a nonionic surfactant to form a resist pattern. The resist composition comprises a base material component and a compound (B1) represented by general formula (b1-1) as an acid generator component. In the formula, R0101 represents a polycyclic aliphatic hydrocarbon group; R102 is a fluorine atom or the like; Y101 represents a single bond or the like; V101 represents a single bond or the like; m represents an integer of 1 or more; and M'm+ represents an m-valent onium cation.

Description

阻劑圖型形成方法Formation method of resist pattern

本發明為有關阻劑圖型形成方法之發明。The present invention relates to an invention of a method for forming a resist pattern.

微影蝕刻技術中,一般多使用例如於基板上,形成由阻劑材料形成之阻劑膜,並使用光、電子線等的輻射線,介由形成特定圖型之遮罩,對該阻劑膜進行選擇性曝光、施以顯影處理等方式,於前述阻劑膜上形成特定形狀的阻劑圖型等步驟進行。 曝光部份變化為溶解於顯影液之特性的阻劑材料稱為正型、曝光部份變化為不溶解於顯影液之特性的阻劑材料稱為負型。 近年來,於半導體元件或液晶顯示元件之製造中,伴隨微影蝕刻技術的進步,而急速地進入圖型的微細化。 圖型微細化之方法,一般為將曝光光源予以短波長化(高能量化)之方式進行。具體而言,以往為使用g線、i線為代表的紫外線,現在則開始使用KrF準分子雷射,或ArF準分子雷射進行半導體元件之量產。又,目前已開始對於較該些準分子雷射為更短波長(高能量)的電子線、EUV(極端紫外線)或X線等進行研究。 阻劑材料,則尋求對於該些曝光光源具有感度、可重現微細尺寸的圖型之解析性等的微影蝕刻特性。 而滿足該些要求的阻劑材料,目前為使用含有經由酸之作用而使對鹼顯影液之溶解性發生變化的基材成份,與經由曝光而產生酸之酸產生劑成份之化學增幅型阻劑組成物。In the lithographic etching technology, generally used, for example, on a substrate to form a resist film formed of a resist material, and use radiation such as light and electrons to form a mask of a specific pattern to apply the resist The film is selectively exposed, subjected to a development process, and the like, and steps such as forming a resist pattern of a specific shape on the aforementioned resist film are performed. The resist material whose exposed part changes to the characteristic of dissolving in the developer is called positive type, and the resist material whose characteristic of changing the exposed part to insoluble in the developer is called negative type. In recent years, in the manufacture of semiconductor elements or liquid crystal display elements, with the advancement of photolithography technology, the miniaturization of patterns has been rapidly progressed. The method of miniaturizing the pattern is generally performed by shortening the wavelength (higher energy) of the exposure light source. Specifically, in the past, ultraviolet rays represented by g-line and i-line were used, but now KrF excimer lasers or ArF excimer lasers are used for mass production of semiconductor devices. In addition, researches on electron beams, EUV (extreme ultraviolet), or X-rays, which have shorter wavelengths (higher energy) than these excimer lasers, have already begun. For resist materials, lithographic etching characteristics such as sensitivity to these exposure light sources and reproducible resolution of fine-sized patterns are sought. The resist material that meets these requirements currently uses a chemically amplified resist containing a base material component that changes the solubility of an alkali developer through the action of acid, and an acid generator component that generates acid through exposure.剂组合物。 Agent composition.

使解析性更向上提升的方法之一,已知為於曝光機的對物透鏡與試料之間,介由較空氣為更高折射率的液體(浸潤介質)進行曝光(浸漬曝光)之微影蝕刻法,即所謂浸潤微影蝕刻法(Liquid Immersion Lithography。以下,亦稱為「浸潤曝光」)。經由浸潤曝光處理時,即使為使用相同曝光波長的光源,也可以達成與使用更短波長的光源的情形或使用高NA透鏡的情形相同的高解析性,此外,也不會造成焦點景深寬度降低。又,浸潤曝光可使用現有的曝光裝置進行。因此,浸潤曝光可實現以低費用、高解析性,而形成具有優良焦點景深寬度的阻劑圖型,故近年來被廣為使用。浸潤曝光於形成所謂的圖型形狀時為有效者,此外,亦可與相位位移法、變形照明法等之超解析技術組合使用。目前,浸潤曝光技術,對於主要使用ArF準分子雷射作為光源的技術已展開活潑的研究。但,浸潤介質仍以水為主要研究對象。 該浸潤曝光所使用的阻劑組成物中,已有提出添加含有氟原子的化合物之提案。例如專利文獻1中,揭示於阻劑組成物中添加的含有氟原子的化合物,為具有具氟原子的結構單位,與具有由(甲基)丙烯酸所衍生的結構單位的含氟高分子化合物。 [先前技術文獻] [專利文獻]One of the methods to improve resolution is known as the lithography of exposure (immersion exposure) between the objective lens of the exposure machine and the sample through a liquid (wetting medium) with a higher refractive index than air The etching method is a so-called immersion lithography method (Liquid Immersion Lithography. Hereinafter, also referred to as "immersion exposure"). During the immersion exposure process, even if the light source with the same exposure wavelength is used, the same high resolution can be achieved as the case of using a light source of shorter wavelength or the case of using a high NA lens. In addition, it will not cause the depth of focus width to decrease. . In addition, the immersion exposure can be performed using an existing exposure device. Therefore, immersion exposure can achieve low cost, high resolution, and form a resist pattern with excellent focal depth of field width, so it has been widely used in recent years. Immersion exposure is effective when forming a so-called pattern shape. In addition, it can also be used in combination with super-analysis techniques such as phase shift method and anamorphic illumination method. At present, the immersion exposure technology has been actively researched on the technology that mainly uses ArF excimer laser as the light source. However, the infiltration medium is still water as the main research object. In the resist composition used for this immersion exposure, it has been proposed to add a compound containing a fluorine atom. For example, Patent Document 1 discloses that the fluorine atom-containing compound added to the resist composition is a fluorine atom-containing structural unit and a fluorine-containing polymer compound having a (meth)acrylic acid-derived structural unit. [Prior Technical Literature] [Patent Literature]

[專利文獻1]特開2011-13569號公報[Patent Document 1] JP 2011-13569 A

[發明所欲解決之問題][Problems to be solved by the invention]

上述浸潤曝光中,仍尋求一種除通常的微影蝕刻特性(感度、解析性、耐蝕刻性等)以外,亦具有對應浸潤曝光技術之特性的阻劑材料。例如:於浸潤曝光中,使阻劑膜與浸潤溶劑接觸時,會發生阻劑膜中的物質溶出於浸潤溶劑(物質溶出)之現象。物質溶出,會發生阻劑層變質、浸潤溶劑的折射率發生變化等現象,而會造成微影蝕刻特性惡化。該物質溶出之量,受到阻劑膜表面特性(例如親水性・疏水性等)的影響,例如提高阻劑膜表面的疏水性時,即可降低物質溶出之現象。In the above-mentioned immersion exposure, a resist material that has characteristics corresponding to the immersion exposure technology in addition to the usual lithographic etching characteristics (sensitivity, resolution, etching resistance, etc.) is still sought. For example: in the immersion exposure, when the resist film is brought into contact with the immersion solvent, the substance in the resist film will dissolve out of the immersion solvent (material dissolution). The elution of the substance will cause the deterioration of the resist layer and the change of the refractive index of the wetting solvent, which will cause deterioration of the lithographic etching characteristics. The amount of the substance eluted is affected by the surface characteristics of the resist film (such as hydrophilicity, hydrophobicity, etc.). For example, when the hydrophobicity of the resist film surface is increased, the elution of the substance can be reduced.

如上述般,提高阻劑膜表面疏水性時,應可降低物質溶出或提高水追隨性等,而可解決浸潤曝光技術特有的問題。 但,即使僅使阻劑膜疏水化時,仍會對微影蝕刻特性等產生不良影響。例如:提高阻劑膜疏水性時,於鹼顯影後於阻劑膜上會有容易發生缺陷(Defect)之問題。特別是使用鹼顯影製程形成圖型時,於阻劑膜的未曝光部則容易發生缺陷。 此處之「缺陷」,係指例如使用KLA丹克爾公司的表面缺陷觀察裝置(商品名「KLA」),由顯影後的阻劑圖型的正上方觀察圖型時所發現的所有缺失之意。該缺失現象可列舉如:顯影後之浮渣(阻劑殘渣)、泡沫、廢物等異物或析出物附著於阻劑圖型表面所造成的缺失,或線路圖型間的橋接、接觸孔圖型的孔洞(hole)被掩埋等有關圖型形狀之缺失,或圖型之色斑等之意。 上述專利文獻1等記載的阻劑組成物,於曝光時,因具有含氟高分子化合物故於曝光時可提高阻劑膜的撥水性,且,顯影時,因形成親水性基,故可提高阻劑膜的親水性,而降低缺陷。 但,專利文獻1記載的該些以往的阻劑組成物,因使用的顯影液種類之差異,而仍存在有無法充份發揮降低缺陷之效果等問題。 鑑於上述情事,本發明為提供一種可降低阻劑膜的未曝光部缺陷之發生,且可形成具有良好形狀的阻劑圖型之阻劑圖型形成方法為目的。 [解決問題之方法]As mentioned above, when the hydrophobicity of the surface of the resist film is increased, it should be possible to reduce the elution of the substance or improve the water followability, etc., so as to solve the unique problems of the immersion exposure technology. However, even when the resist film is only hydrophobized, it still has an adverse effect on the lithographic etching characteristics. For example, when the hydrophobicity of the resist film is increased, there will be a problem that defects (Defect) are likely to occur on the resist film after alkali development. In particular, when the pattern is formed using an alkali development process, defects are likely to occur in the unexposed part of the resist film. The term "defect" here refers to, for example, the use of KLA Danker's surface defect observation device (trade name "KLA") to observe all the defects found when the pattern is observed directly above the developed resist pattern . The missing phenomenon can include, for example: scum (resist residue), foam, waste and other foreign matter or precipitation after development is attached to the surface of the resist pattern, or the bridging between circuit patterns and contact hole pattern The hole of the burial is buried, such as the lack of the shape of the pattern, or the stain of the pattern. The resist composition described in Patent Document 1 mentioned above can improve the water repellency of the resist film during exposure due to the presence of a fluorine-containing polymer compound during exposure, and can improve the water repellency of the resist film during development by forming a hydrophilic group. The hydrophilicity of the resist film reduces defects. However, these conventional resist compositions described in Patent Document 1 still have problems such as inability to sufficiently exhibit the effect of reducing defects due to differences in the types of developers used. In view of the above situation, the present invention aims to provide a resist pattern forming method that can reduce the occurrence of defects in the unexposed portion of the resist film and can form a resist pattern with a good shape. [Solving the problem]

但於阻劑圖型形成中,若阻劑膜表面的疏水性提高時,鹼顯影液將難以潤濕阻劑膜等,就解析性之觀點亦為問題之一。 對於此點,亦有考量就提高鹼顯影液對阻劑膜之潤濕性等目的時,於鹼顯影液中添加界面活性劑等方法。 但,提高解析性之阻劑膜,於顯影後的阻劑膜之未曝光部中,仍會有容易發生尺寸0.1μm以上的缺陷之問題。 本發明者們,經研究結果,發現於阻劑組成物中,使用具有特定結構的酸產生劑時,即可解決上述問題,因而完成本發明。However, in the formation of the resist pattern, if the hydrophobicity of the surface of the resist film is increased, it will be difficult for the alkali developer to wet the resist film, etc. The analytical point of view is also one of the problems. Regarding this point, when considering the purpose of improving the wettability of the alkali developer to the resist film, methods such as adding a surfactant to the alkali developer are also considered. However, in the resist film with improved resolution, the unexposed part of the resist film after development still has the problem that defects with a size of 0.1 μm or more are likely to occur. As a result of research, the inventors found that when an acid generator having a specific structure is used in a resist composition, the above-mentioned problems can be solved, and the present invention has been completed.

即,本發明之一態樣為,一種阻劑圖型形成方法,其為具有:使用阻劑組成物於支撐體上形成阻劑膜之步驟(i)、使前述阻劑膜曝光之步驟(ii),及將前述曝光後的阻劑膜,使用含有非離子界面活性劑之鹼顯影液進行顯影,而形成阻劑圖型之步驟(iii);又,前述阻劑組成物為含有:經由酸之作用而使對鹼顯影液之溶解性發生變化的基材成份(A),與經由曝光而產生酸之酸產生劑成份(B),前述酸產生劑成份(B)為含有下述通式(b1-1)所表示之化合物(B1)。That is, one aspect of the present invention is a method for forming a resist pattern, which includes the step (i) of forming a resist film on a support using a resist composition, and the step of exposing the aforementioned resist film ( ii), and the step (iii) of forming a resist pattern by developing the exposed resist film using an alkali developer containing a nonionic surfactant; and, the resist composition contains: The base material component (A) that changes the solubility of the alkaline developer due to the action of acid and the acid generator component (B) that generates acid through exposure. The aforementioned acid generator component (B) contains the following Compound (B1) represented by formula (b1-1).

Figure 02_image005
[式中,R0 101 為多環式脂肪族烴基;其中,多環式脂肪族烴基的氫原子亦可被取代基所取代;R102 為氟原子或碳數1~5之氟化烷基;Y101 為單鍵,或含有氧原子的2價之連結基;V101 為單鍵、伸烷基或氟化伸烷基;m為1以上之整數,且M’m 為m價之鎓陽離子]。 [發明之效果]
Figure 02_image005
[In the formula, R 0 101 is a polycyclic aliphatic hydrocarbon group; among them, the hydrogen atom of the polycyclic aliphatic hydrocarbon group may also be substituted by a substituent; R 102 is a fluorine atom or a fluorinated alkyl group with 1 to 5 carbon atoms ; Y 101 is a single bond, or a divalent linking group containing an oxygen atom of a; V 101 is a single bond, an alkylene group or fluorinated alkylene group; m is an integer of 1 or more, and m 'm + m is the valence of Onium cation]. [Effect of invention]

依本發明之阻劑圖型形成方法,可降低阻劑膜的未曝光部缺陷之發生,且可形成具有良好形狀的阻劑圖型。According to the resist pattern forming method of the present invention, the occurrence of defects in the unexposed portion of the resist film can be reduced, and a resist pattern with a good shape can be formed.

[實施發明之形態][Forms for carrying out the invention]

本說明書及本申請專利範圍中,「脂肪族」為,與芳香族為相對性的概念,定義為表示不具有芳香族性之基、化合物等者。 「烷基」,於無特別限定時,為包含直鏈狀、支鏈狀及環狀之1價飽和烴基者。烷氧基中之烷基亦為相同。 「伸烷基」,於無特別限定時,為包含直鏈狀、支鏈狀及環狀的2價飽和烴基者。 「鹵化烷基」為,烷基的氫原子之一部份或全部被鹵素原子取代而得之基,該鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等。 「氟化烷基」或「氟化伸烷基」為,烷基或伸烷基的氫原子之一部份或全部被氟原子取代而得之基。 「結構單位」為,構成高分子化合物(樹脂、聚合物、共聚物)的單體單位(單體單位)之意。 記載為「可具有取代基」或「可具有取代基的」時,為包含氫原子(-H)被1價之基所取代之情形,與伸甲基  (-CH2 -)被2價之基所取代之情形等二者。 「曝光」為包含輻射線照射之全部概念。In this specification and the scope of the patent application, "aliphatic" is a concept that is relative to aromatics, and is defined as meaning a group, compound, etc. that do not have aromaticity. "Alkyl", when not particularly limited, is a monovalent saturated hydrocarbon group including linear, branched, and cyclic. The same applies to the alkyl group in the alkoxy group. The "alkylene group", when not particularly limited, includes a linear, branched, and cyclic divalent saturated hydrocarbon group. The "halogenated alkyl group" is a group obtained by substituting a part or all of the hydrogen atoms of an alkyl group with halogen atoms. Examples of the halogen atom include fluorine atom, chlorine atom, bromine atom, and iodine atom. "Fluorinated alkyl group" or "fluorinated alkylene group" refers to a group in which part or all of the hydrogen atoms of an alkyl group or alkylene group are substituted with fluorine atoms. "Structural unit" means a monomer unit (monomer unit) constituting a polymer compound (resin, polymer, copolymer). When it is described as "substitutable" or "substitutable", it includes the case where the hydrogen atom (-H) is replaced by a monovalent group, and the methylene group (-CH 2 -) is divalent The situation where the group is substituted and so on. "Exposure" refers to the entire concept of radiation exposure.

「丙烯酸酯所衍生的結構單位」係指,丙烯酸酯之乙烯性雙鍵經開裂而構成的結構單位之意。 「丙烯酸酯」為,丙烯酸(CH2 =CH-COOH)的羧基末端之氫原子被有機基取代而得之化合物。 丙烯酸酯中,α位的碳原子鍵結之氫原子可被取代基所取代。取代該α位的碳原子鍵結之氫原子的取代基(Rα0 ),為氫原子以外的原子或基,其可列舉如:碳數1~5之烷基、碳數1~5之鹵化烷基等。又,亦包含取代基(Rα0 )被含有酯鍵結的取代基所取代的依康酸二酯,或取代基(Rα0 )被羥烷基或該羥基被修飾而得之基所取代的α羥基丙烯酸酯。又,丙烯酸酯之α位的碳原子,於無特別限定時,係指丙烯酸的羰基所鍵結的碳原子之意。 以下,亦有將α位的碳原子鍵結之氫原子被取代基取代而得之丙烯酸酯稱為α取代丙烯酸酯之情形。又,包括丙烯酸酯與α取代丙烯酸酯亦統稱為「(α取代)丙烯酸酯」。"Structural unit derived from acrylate" means a structural unit formed by cracking the ethylenic double bond of acrylate. "Acrylate" is a compound obtained by replacing the hydrogen atom at the carboxyl terminal of acrylic acid (CH 2 =CH-COOH) with an organic group. In the acrylate, the hydrogen atom bonded to the carbon atom at the α position may be replaced by a substituent. The substituent (R α0 ) that replaces the hydrogen atom bonded to the carbon atom at the α position is an atom or a group other than a hydrogen atom, and examples thereof include alkyl groups with 1 to 5 carbons, and halogenated groups with 1 to 5 carbons. Alkyl etc. And also comprising a substituent group (R α0) containing itaconic acid are ester-bonded substituent of the substituent group, or substituent (R α0) or the hydroxyalkyl group is a hydroxyl group is modified to give the substituted Alpha hydroxy acrylate. In addition, the carbon atom at the α-position of acrylate means the carbon atom to which the carbonyl group of acrylic acid is bonded, unless it is particularly limited. Hereinafter, the acrylate obtained by replacing the hydrogen atom bonded to the carbon atom at the α-position with a substituent is sometimes referred to as α-substituted acrylate. In addition, acrylate and α-substituted acrylate are also collectively referred to as "(α-substituted) acrylate".

「丙烯醯胺所衍生的結構單位」係指,丙烯醯胺的乙烯性雙鍵經開裂而構成的結構單位之意。 丙烯醯胺中,α位的碳原子鍵結之氫原子可被取代基所取代,或丙烯醯胺的胺基中的氫原子之一者或二者可被取代基所取代。又,丙烯醯胺之α位的碳原子,於無特別限定時,係指丙烯醯胺的羰基所鍵結的碳原子之意。 取代丙烯醯胺之α位的碳原子所鍵結之氫原子的取代基,例如:與前述α取代丙烯酸酯中,被列舉作為α位的取代基者(取代基(Rα0 ))為相同之內容。"A structural unit derived from acrylamide" means a structural unit formed by cracking the ethylenic double bond of acrylamide. In acrylamide, the hydrogen atom bonded to the carbon atom at the α-position may be substituted by a substituent, or one or both of the hydrogen atoms in the amine group of the acrylamide may be substituted by a substituent. In addition, the carbon atom at the α-position of acrylamide means the carbon atom to which the carbonyl group of acrylamide is bonded, unless it is particularly limited. Substituents that replace the hydrogen atom bonded to the carbon atom at the α-position of acrylamide, for example, are the same as the α-substituted acrylates listed as the substituent at the α-position (substituent (R α0 )) content.

「羥基苯乙烯所衍生的結構單位」係指,羥基苯乙烯的乙烯性雙鍵經開裂而構成的結構單位之意。「羥基苯乙烯衍生物所衍生的結構單位」係指,羥基苯乙烯衍生物的乙烯性雙鍵經開裂而構成的結構單位之意。 「羥基苯乙烯衍生物」,為包含羥基苯乙烯的α位之氫原子被烷基、鹵化烷基等其他取代基取代而得者,及該些的衍生物之概念。該些的衍生物,可列舉如:α位之氫原子可被取代基所取代的羥基苯乙烯之羥基中的氫原子被有機基取代者;α位之氫原子可被取代基所取代的羥基苯乙烯之苯環上,鍵結羥基以外的取代基者等。又,α位(α位之碳原子),於無特別限定時,係指苯環上所鍵結的碳原子之意。 取代羥基苯乙烯的α位之氫原子的取代基,例如:與前述α取代丙烯酸酯中,被列舉作為α位的取代基者為相同之內容。"Structural unit derived from hydroxystyrene" means a structural unit formed by cracking the ethylenic double bond of hydroxystyrene. "A structural unit derived from a hydroxystyrene derivative" means a structural unit formed by cracking the ethylenic double bond of a hydroxystyrene derivative. "Hydroxystyrene derivatives" are those obtained by substituting a hydrogen atom at the α position of hydroxystyrene by other substituents such as alkyl groups and halogenated alkyl groups, and the concept of these derivatives. Examples of these derivatives include: hydroxystyrene in which the hydrogen atom at the α-position may be substituted by a substituent, and the hydrogen atom in the hydroxyl group of the hydroxystyrene is substituted by an organic group; The benzene ring of styrene is bonded with substituents other than the hydroxyl group. In addition, the α-position (carbon atom at the α-position) means the carbon atom bonded to the benzene ring when it is not particularly limited. Substituents substituting the hydrogen atom at the α-position of hydroxystyrene are, for example, the same as those listed as the substituent at the α-position in the aforementioned α-substituted acrylate.

「乙烯安息香酸或乙烯安息香酸衍生物所衍生的結構單位」係指,乙烯安息香酸或乙烯安息香酸衍生物的乙烯性雙鍵經開裂而構成的結構單位之意。 「乙烯安息香酸衍生物」,為包含乙烯安息香酸的α位之氫原子被烷基、鹵化烷基等其他取代基所取代者,及該些的衍生物之概念。該些的衍生物,可列舉如:α位之氫原子可被取代基所取代的乙烯安息香酸的羧基中之氫原子被有機基取代者;α位之氫原子可被取代基所取代的乙烯安息香酸之苯環上,鍵結羥基及羧基以外的取代基者等。又,α位(α位之碳原子),於無特別限定時,係指苯環上所鍵結的碳原子之意。"Structural unit derived from ethylene benzoic acid or ethylene benzoic acid derivatives" means a structural unit formed by cracking the ethylenic double bonds of ethylene benzoic acid or ethylene benzoic acid derivatives. "Ethylene benzoic acid derivative" refers to the concept of a hydrogen atom in the α position of ethylene benzoic acid replaced by an alkyl group, a halogenated alkyl group and other substituents, and the concept of these derivatives. Examples of these derivatives include: vinyl benzoic acid in which the hydrogen atom at the α-position may be substituted by a substituent, wherein the hydrogen atom in the carboxyl group of the benzoic acid is replaced by an organic group; The benzene ring of benzoic acid is bonded with substituents other than hydroxyl and carboxyl groups. In addition, the α-position (carbon atom at the α-position) means the carbon atom bonded to the benzene ring when it is not particularly limited.

「苯乙烯衍生物」係指,包含苯乙烯的α位之氫原子被烷基、鹵化烷基等其他取代基所取代者,及該些的衍生物的概念。該些的衍生物,可列舉如:α位之氫原子可被取代基所取代的羥基苯乙烯的苯環上鍵結取代基者等。又,α位(α位之碳原子),於無特別限定時,係指苯環上所鍵結的碳原子之意。 「苯乙烯所衍生的結構單位」、「苯乙烯衍生物所衍生的結構單位」係指,苯乙烯或苯乙烯衍生物的乙烯性雙鍵經開裂而構成的結構單位之意。"Styrenic derivative" refers to the concept that includes a hydrogen atom at the α-position of styrene replaced by other substituents such as alkyl and halogenated alkyl, and the concept of these derivatives. Examples of these derivatives include those having a substituent bonded to the benzene ring of hydroxystyrene in which the hydrogen atom at the α-position may be substituted by a substituent. In addition, the α-position (carbon atom at the α-position) means the carbon atom bonded to the benzene ring when it is not particularly limited. "Structural unit derived from styrene" and "structural unit derived from styrene derivative" refer to a structural unit formed by cracking the ethylenic double bond of styrene or a styrene derivative.

上述作為α位之取代基的烷基,以直鏈狀或支鏈狀之烷基為佳,具體而言,可列舉如:碳數1~5之烷基(甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基)等。 又,作為α位之取代基的鹵化烷基,具體而言,可列舉如:上述「作為α位之取代基的烷基」的氫原子之一部份或全部,被鹵素原子取代而得之基等。該鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。 又,作為α位之取代基的羥烷基,具體而言,可列舉如:上述「作為α位之取代基的烷基」的氫原子之一部份或全部,被羥基取代而得之基等。該羥烷基中的羥基之數,以1~5為佳,以1為最佳。The above-mentioned alkyl group as the substituent at the α position is preferably a linear or branched alkyl group. Specifically, examples include: alkyl groups with 1 to 5 carbon atoms (methyl, ethyl, propyl , Isopropyl, n-butyl, isobutyl, tert-butyl, pentyl, isopentyl, neopentyl) and so on. In addition, the halogenated alkyl group as the substituent at the α-position can be specifically exemplified by the substitution of a part or all of the hydrogen atoms of the aforementioned "alkyl group as the substituent at the α-position" by halogen atoms Base etc. Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom, and a fluorine atom is particularly preferred. In addition, the hydroxyalkyl group as the substituent at the α-position, specifically, includes a group obtained by substituting a part or all of the hydrogen atoms of the above-mentioned "alkyl group as the substituent at the α-position" by a hydroxyl group Wait. The number of hydroxyl groups in the hydroxyalkyl group is preferably 1 to 5, and 1 is the most preferred.

本說明書及本申請專利範圍中,依化學式所表示之結構之差異,而存在有不對稱碳,因而有可能存在鏡像異構物(enantiomer)或非鏡像異構物(diastereomer)者。於該情形時,則以一個化學式代表表示該些的異構物。該些異構物可單獨使用亦可、以混合物形式使用亦可。In this specification and the scope of the patent application, there are asymmetric carbons based on the differences in the structure represented by the chemical formulas, so there may be enantiomers or diastereomers. In this case, a chemical formula represents the isomers. These isomers may be used singly or as a mixture.

[阻劑圖型形成方法] 本發明之一態樣為,一種阻劑圖型形成方法,其為具有:使用阻劑組成物於支撐體上形成阻劑膜之步驟(i)、使前述阻劑膜曝光之步驟(ii),及將前述曝光後的阻劑膜,使用含有非離子界面活性劑之鹼顯影液進行顯影,而形成阻劑圖型之步驟(iii)。前述阻劑組成物,為使用含有:經由酸之作用而使對鹼顯影液之溶解性發生變化的基材成份(A),與經由曝光而產生酸之酸產生劑成份(B)者。此處之酸產生劑成份(B)為包含後述化合物(B1)。 該阻劑圖型形成方法的實施形態之一,例如:依下述方式進行的阻劑圖型之形成方法。[Method of forming resist pattern] One aspect of the present invention is a method for forming a resist pattern, which has: a step (i) of forming a resist film on a support using a resist composition, and a step (ii) of exposing the aforementioned resist film , And the step (iii) of developing the resist film after exposure using an alkali developer containing a non-ionic surfactant to form a resist pattern. The aforementioned resist composition uses a base component (A) that changes the solubility to an alkali developer through the action of acid, and an acid generator component (B) that generates acid through exposure. The acid generator component (B) here includes the compound (B1) described later. One of the embodiments of the resist pattern forming method is, for example, the resist pattern forming method performed in the following manner.

步驟(i): 首先,將後述特定的阻劑組成物,使用旋轉塗佈器等塗佈於支撐體上,再於例如80~150℃,較佳為100~150℃(更佳為超過100℃、150℃以下)的溫度條件下,施以40~120秒鐘,較佳為60~120秒鐘之燒焙(塗佈後燒焙(Post Apply Bake)(PAB))處理,而形成阻劑膜。Step (i): First, the specific resist composition described later is coated on the support using a spin coater or the like, and then at 80 to 150°C, preferably 100 to 150°C (more preferably over 100°C, 150°C or less Under the temperature condition of ), a baking (Post Apply Bake (PAB)) treatment is applied for 40 to 120 seconds, preferably 60 to 120 seconds, to form a resist film.

步驟(ii): 其次,例如曝光裝置等,介由形成特定圖型之遮罩(遮罩圖型),對該阻劑膜進行曝光等的選擇性曝光。 隨後,例如於80~150℃,較佳為90~130℃的溫度條件下,施以40~120秒鐘,較佳為60~100秒鐘之燒焙(曝後燒焙(Post Exposure Bake)(PEB))處理。Step (ii): Next, for example, an exposure device or the like performs selective exposure such as exposure of the resist film via a mask (mask pattern) forming a specific pattern. Subsequently, for example, at a temperature of 80-150°C, preferably 90-130°C, for 40-120 seconds, preferably 60-100 seconds (Post Exposure Bake) (PEB)) processing.

步驟(iii): 其次,將前述曝光後的阻劑膜,使用含有非離子界面活性劑的鹼顯影液進行顯影處理,而形成阻劑圖型。Step (iii): Next, the above-mentioned exposed resist film is developed using an alkali developer containing a nonionic surfactant to form a resist pattern.

顯影處理後,較佳為進行洗滌處理。洗滌處理,以使用純水的水洗滌為佳。 於顯影處理後或洗滌處理後,進行乾燥處理。又,依情形之不同,亦可於上述顯影處理後進行燒焙處理(後燒焙)。 依此方式,即可形成阻劑圖型。After the development treatment, washing treatment is preferably performed. The washing treatment is preferably water washing using pure water. After the development process or the washing process, the drying process is performed. Moreover, depending on the situation, the baking treatment (post-baking) may be performed after the above-mentioned development treatment. In this way, the resist pattern can be formed.

支撐體,並未有特別之限定,而可使用以往公知之物質,可列舉如:電子零件用之基板,或於其上形成特定配線圖型者等。更具體而言,可列舉如:矽晶圓、銅、鉻、鐵、鋁等的金屬製基板,或玻璃基板等。配線圖型之材料,則可使用例如:銅、鋁、鎳、金等。 又,支撐體,亦可為於上述的基板上,設置無機系及/或有機系之膜者。無機系之膜,可列舉如:無機抗反射膜(無機BARC)等。有機系之膜,可列舉如:有機抗反射膜(有機BARC),或多層阻劑法中,作為下層有機膜等的有機膜。 其中,多層阻劑法係指,於基板上設置至少一層的有機膜(下層有機膜),與至少一層的阻劑膜(上層阻劑膜),再使用形成於上層阻劑膜的阻劑圖型作為遮罩,對下層有機膜進行圖型形成(Patterning)之方法,依此方法,可形成高長徑比的圖型。即,多層阻劑法,因可以下層有機膜確保所需要的厚度,故可使阻劑膜薄膜化,而形成高長徑比的微細圖型。 多層阻劑法中,基本上,可分為具有上層阻劑膜,與下層有機膜等二層結構之方法(2層阻劑法),與於上層阻劑膜與下層有機膜之間,設有一層以上的中間層(金屬薄膜等)的具有三層以上的多層結構之方法(3層阻劑法)。The support is not particularly limited, and conventionally known materials can be used, such as substrates for electronic parts, or those with specific wiring patterns formed thereon. More specifically, metal substrates such as silicon wafers, copper, chromium, iron, and aluminum, or glass substrates can be cited. For wiring pattern materials, for example, copper, aluminum, nickel, gold, etc. can be used. In addition, the support may also be one provided with an inorganic and/or organic film on the above-mentioned substrate. Examples of inorganic films include inorganic anti-reflective films (inorganic BARC). The organic film includes, for example, an organic anti-reflection film (organic BARC), or an organic film used as a lower organic film in the multilayer resist method. Among them, the multilayer resist method means that at least one layer of organic film (lower layer organic film) and at least one layer of resist film (upper layer resist film) are provided on a substrate, and then the resist pattern formed on the upper layer resist film is used. The pattern is used as a mask to pattern the underlying organic film. According to this method, a pattern with a high aspect ratio can be formed. That is, the multilayer resist method can ensure the required thickness of the underlying organic film, so that the resist film can be thinned to form a fine pattern with a high aspect ratio. In the multilayer resist method, basically, it can be divided into a method with a two-layer structure (two-layer resist method) such as an upper resist film and a lower organic film, and a method between the upper resist film and the lower organic film. A method of a multilayer structure with three or more layers (three-layer resist method) with one or more intermediate layers (metal thin films, etc.).

曝光時使用的波長,並未有特別之限定,例如可使用ArF準分子雷射、KrF準分子雷射、F2 準分子雷射、EUV(極端紫外線)、VUV(真空紫外線)、EB(電子線)、X線、軟X線等的輻射線進行。The wavelength used for exposure is not particularly limited. For example, ArF excimer laser, KrF excimer laser, F 2 excimer laser, EUV (extreme ultraviolet), VUV (vacuum ultraviolet), EB (electronics) Line), X-ray, soft X-ray, etc.

阻劑膜的曝光方法,可為於空氣或氮氣等的惰性氣體中進行的通常曝光(乾式曝光)亦可、浸潤曝光(Liquid Immersion Lithography)亦可。 浸潤曝光為,預先於阻劑膜與曝光裝置的最下位置的透鏡之間,充滿具有較空氣的折射率為更大折射率的溶劑(浸潤介質),再於該狀態下進行曝光(浸潤曝光)的曝光方法。 浸潤介質,以具有較空氣的折射率為更大,且,較被曝光的阻劑膜之折射率為更小折射率的溶劑為佳。該溶劑的折射率,只要為前述範圍內時,則未有特別之限制。 具有較空氣的折射率為更大,且,較前述阻劑膜的折射率為更小折射率的溶劑,例如:水、氟系惰性液體、矽系溶劑、烴系溶劑等。 氟系惰性液體之具體例,可列舉如:C3 HCl2 F5 、C4 F9 OCH3 、C4 F9 OC2 H5 、C5 H3 F7 等的氟系化合物作為主成份的液體等,其沸點以70~180℃者為佳,以80~160℃者為較佳。氟系惰性液體為具有上述範圍的沸點者時,以其於曝光結束後,可使用簡便之方法去除浸潤時使用的介質,而為較佳。 氟系惰性液體,特別是以烷基的全部氫原子被氟原子取代而得之全氟烷基化合物為佳。全氟烷基化合物,具體而言,可列舉如:全氟烷醚化合物、全氟烷胺化合物等。 此外,具體上,前述全氟烷醚化合物,可列舉如:全氟(2-丁基-四氫呋喃)(沸點102℃)等,前述全氟烷胺化合物,可列舉如:全氟三丁胺(沸點174℃)等。 浸潤介質,就費用、安全性、環境問題、廣用性等的觀點,以使用水為佳。The exposure method of the resist film may be normal exposure (dry exposure) performed in an inert gas such as air or nitrogen, or may be immersion exposure (Liquid Immersion Lithography). The immersion exposure involves filling a solvent (wetting medium) with a refractive index larger than that of air between the resist film and the lens at the lowest position of the exposure device in advance, and then performing exposure in this state (immersion exposure ) The exposure method. The wetting medium is preferably a solvent having a refractive index larger than that of air and a refractive index smaller than that of the exposed resist film. The refractive index of the solvent is not particularly limited as long as it is within the aforementioned range. Solvents that have a higher refractive index than air and a lower refractive index than the aforementioned resist film, such as water, fluorine-based inert liquids, silicon-based solvents, and hydrocarbon-based solvents. Specific examples of fluorine-based inert liquids include: C 3 HCl 2 F 5 , C 4 F 9 OCH 3 , C 4 F 9 OC 2 H 5 , C 5 H 3 F 7 and other fluorine-based compounds as the main component For liquids, the boiling point is preferably 70-180°C, preferably 80-160°C. When the fluorine-based inert liquid has a boiling point in the above-mentioned range, it is preferable that the medium used for wetting can be removed by a simple method after the exposure is completed. The fluorine-based inert liquid is particularly preferably a perfluoroalkyl compound obtained by substituting all hydrogen atoms of an alkyl group with fluorine atoms. Specific examples of perfluoroalkyl compounds include perfluoroalkyl ether compounds and perfluoroalkylamine compounds. In addition, specifically, the aforementioned perfluoroalkyl ether compound includes perfluoro(2-butyl-tetrahydrofuran) (boiling point 102°C) and the like, and the aforementioned perfluoroalkylamine compound includes, for example, perfluorotributylamine ( Boiling point 174℃) and so on. As the infiltration medium, water is preferred from the viewpoints of cost, safety, environmental issues, and universality.

上述步驟(iii)中,顯影液為使用含有非離子界面活性劑的鹼顯影液。例如:顯影液可使用含有非離子界面活性劑的0.1~10質量%氫氧化四甲基銨(TMAH)水溶液等。 又,鹼顯影液所含的非離子界面活性劑,亦可添加公知的非離子界面活性劑。具體而言,可列舉如:聚氧乙烯月桂醚、聚氧乙烯硬脂醚、聚氧乙烯鯨蠟醚、聚氧乙烯油醚等的聚氧乙烯烷醚類;聚氧乙烯辛酚醚、聚氧乙烯壬酚醚等的聚氧乙烯基烯丙醚類;山梨糖醇單月桂酸酯、山梨糖醇單棕櫚酸酯、山梨糖醇單硬脂酸酯、山梨糖醇單油酸酯、山梨糖醇三油酸酯、山梨糖醇三硬脂酸酯等的山梨糖醇脂肪酸酯類;及聚氧乙烯山梨糖醇單月桂酸酯、聚氧乙烯山梨糖醇單棕櫚酸酯、聚氧乙烯山梨糖醇單硬脂酸酯、聚氧乙烯山梨糖醇三油酸酯、聚氧乙烯山梨糖醇三硬脂酸酯等的聚氧乙烯山梨糖醇脂肪酸酯類;乙炔二醇、乙炔二醇的氧乙烯基加成物等的乙炔類等。In the above step (iii), the developer is an alkaline developer containing a nonionic surfactant. For example, a 0.1-10% by mass tetramethylammonium hydroxide (TMAH) aqueous solution containing a nonionic surfactant can be used as the developer. In addition, a well-known nonionic surfactant may be added to the nonionic surfactant contained in the alkali developer. Specifically, examples include polyoxyethylene alkyl ethers such as polyoxyethylene lauryl ether, polyoxyethylene stearyl ether, polyoxyethylene cetyl ether, and polyoxyethylene oleyl ether; polyoxyethylene octyl ether, polyoxyethylene oleyl ether, etc. Polyoxyethylene allyl ethers such as oxyethylene nonphenol ether; sorbitol monolaurate, sorbitol monopalmitate, sorbitol monostearate, sorbitol monooleate, sorbitol Sorbitol fatty acid esters such as sugar alcohol trioleate and sorbitol tristearate; and polyoxyethylene sorbitol monolaurate, polyoxyethylene sorbitol monopalmitate, polyoxyethylene Polyoxyethylene sorbitan fatty acid esters such as sorbitol monostearate, polyoxyethylene sorbitan trioleate, polyoxyethylene sorbitan tristearate, etc.; acetylene glycol, acetylene glycol The oxyethylene adducts and other acetylenes.

非離子界面活性劑的添加量,相對於顯影液之全量,通常以0.001~5質量%為佳,以0.005~2質量%為較佳,以0.01~0.5質量%為更佳。The addition amount of the nonionic surfactant is generally preferably 0.001 to 5 mass%, preferably 0.005 to 2 mass%, and more preferably 0.01 to 0.5 mass% relative to the total amount of the developer.

顯影處理,可使用公知的顯影方法予以實施,例如:將支撐體浸漬於顯影液中維持特定時間之方法(浸漬法)、使顯影液依表面張力覆蓋支撐體表面,於靜止狀態維持特定時間之方法(攪練(puddle)法)、將顯影液對支撐體表面進行噴霧之方法(噴霧法)、將顯影液由依特定速度掃描的顯影液塗出噴嘴持續塗出於依特定速度迴轉的支撐體上之方法(Dynamic dispense法)等。The development treatment can be carried out using known development methods, such as: immersing the support in the developer for a specific time (dipping method), and covering the surface of the support by the surface tension of the developer and maintaining it in a static state for a specific time Method (puddle method), the method of spraying the developer on the surface of the support (spray method), the developer is sprayed from the developer that scans at a specific speed, and the nozzle is continuously applied to the support that rotates at a specific speed The above method (Dynamic dispense method) and so on.

使用洗滌液的洗滌處理(洗淨處理),可依公知的洗滌方法實施。該洗滌處理之方法,例如:將洗滌液持續塗出於依特定速度迴轉的支撐體上之方法(迴轉塗佈法)、將支撐體浸漬於洗滌液中維持特定時間之方法(浸漬法)、將洗滌液對支撐體表面進行噴霧之方法(噴霧法)等。The washing treatment (washing treatment) using the washing liquid can be carried out in accordance with a known washing method. The method of the washing treatment includes, for example, a method of continuously applying the washing liquid on a support rotating at a specific speed (spin coating method), a method of immersing the support in the washing liquid for a specific time (dipping method), The method of spraying the washing liquid on the surface of the support (spray method), etc.

(阻劑組成物) 上述本實施形態之阻劑圖型形成方法中,步驟(i)為使用特定的阻劑組成物。(Resist composition) In the above-mentioned resist pattern forming method of this embodiment, step (i) is to use a specific resist composition.

本實施形態中之阻劑組成物,為含有經由酸之作用而使對鹼顯影液之溶解性發生變化的基材成份(A)(以下,亦稱為「(A)成份」),與經由曝光而產生酸之酸產生劑成份(B)(以下,亦稱為「(B)成份」),又,前述(B)成份為含有後述通式(b1-1)所表示之化合物(B1)(以下,亦稱為「(B1)成份」)。 使用該阻劑組成物形成阻劑膜,並對該該阻劑膜進行選擇性曝光時,於曝光部會產生酸,並經由該酸之作用而使(A)成份對鹼顯影液之溶解性發生變化的同時,未曝光部中,因(A)成份對鹼顯影液之溶解性並未發生變化,故於曝光部與未曝光部之間,會發生對顯影液之溶解性差異。因此,對該阻劑膜進行顯影時,可形成阻劑圖型。The resist composition in this embodiment contains the base component (A) (hereinafter, also referred to as "component (A)") that changes the solubility to the alkaline developer through the action of acid, and The acid generator component (B) that generates acid by exposure (hereinafter also referred to as "(B) component"), and the aforementioned (B) component contains the compound (B1) represented by the general formula (b1-1) described later (Hereinafter, also referred to as "(B1) component"). When the resist composition is used to form a resist film, and the resist film is selectively exposed, an acid is generated in the exposed part, and the solubility of component (A) in the alkaline developer is made by the action of the acid At the same time, in the unexposed part, the solubility of the component (A) to the alkali developer has not changed, so there will be a difference in the solubility of the developer between the exposed part and the unexposed part. Therefore, when the resist film is developed, a resist pattern can be formed.

例如:(A)成份使用對鹼顯影液為難溶性,且經由酸之作用而使極性增大之基材成份(A-1)(以下,亦稱為「(A-1)成份」)時,經由曝光而產生酸時,於阻劑膜的曝光部對鹼顯影液由難溶性而變化為可溶性的同時,阻劑膜的未曝光部則仍為鹼難溶性而無變化,故經由鹼顯影時,則可形成正型阻劑圖型。 另一方面,(A)成份使用對鹼顯影液為可溶性的基材成份(A-2)(以下,亦稱為「(A-2)成份」),並添加交聯劑成份時,經由曝光而產生酸時,因該酸之作用而引起該(A-2)成份與交聯劑成份之間的交聯,其結果,將會降低對鹼顯影液之溶解性。因此,於阻劑膜的曝光部轉變為對鹼顯影液為難溶性的同時,阻劑膜的未曝光部仍對鹼顯影液為可溶性而無變化,故經由鹼顯影時,則可形成負型阻劑圖型。For example: when component (A) is used as a base component (A-1) (hereinafter also referred to as "(A-1) component") that is poorly soluble in alkaline developer and has increased polarity through the action of acid, When an acid is generated by exposure, the exposed part of the resist film changes from being poorly soluble to alkali developing solution, while the unexposed part of the resist film is still poorly soluble in alkali without change. Therefore, when developing through alkali , Then a positive resist pattern can be formed. On the other hand, when the (A) component uses the base component (A-2) (hereinafter, also referred to as "(A-2) component") that is soluble in alkaline developer, and the crosslinking agent component is added, it is exposed to When an acid is generated, the effect of the acid causes the cross-linking between the component (A-2) and the cross-linking agent component. As a result, the solubility to the alkali developer will be reduced. Therefore, while the exposed part of the resist film becomes poorly soluble in alkali developing solution, the unexposed part of the resist film is still soluble in alkali developing solution without change. Therefore, negative resistance can be formed during alkali development. Dosage pattern.

阻劑組成物,為具有經由曝光而產生酸之酸產生能力者,除(B)成份以外,(A)成份亦可經由曝光而產生酸。 (A)成份經由曝光而產生酸時,該(A)成份則為「經由曝光而產生酸,且,經由酸之作用而對顯影液之溶解性產生變化的基材成份」。 (A)成份為經由曝光而產生酸,且,經由酸之作用而對顯影液之溶解性產生變化的基材成份時,後述(A1)成份,以經由曝光而產生酸,且,經由酸之作用而對顯影液之溶解性產生變化的高分子化合物為佳。該些高分子化合物,可列舉如:具有經由曝光而產生酸的結構單位之樹脂等。而衍生經由曝光而產生酸的結構單位之單體,可使用公知之單體。The resist composition has the ability to generate acid through exposure. In addition to component (B), component (A) can also generate acid through exposure. When the component (A) generates acid through exposure, the component (A) is "the substrate component that generates acid through exposure and changes the solubility of the developer through the action of the acid." When the component (A) is a substrate component that generates acid through exposure and changes the solubility of the developer through the action of the acid, the component (A1) described below is to generate acid through exposure, and through the acid A polymer compound that changes the solubility of the developer is preferred. Examples of these polymer compounds include resins having structural units that generate acid through exposure. As for the monomer deriving the structural unit that generates acid by exposure, a known monomer can be used.

<(A)成份> 本實施形態中,阻劑組成物之(A)成份,為經由酸之作用而對顯影液之溶解性產生變化的基材成份。 本發明中,「基材成份」為具有膜形成能力之有機化合物,較佳為使用分子量為500以上之有機化合物。該有機化合物之分子量為500以上時,可提高膜形成能力,此外,亦容易形成奈米左右的阻劑圖型。 作為基材成份使用的有機化合物,可大致區分為非聚合物與聚合物。 非聚合物,通常為使用分子量為500以上、未達4000者。以下,稱為「低分子化合物」時,為表示分子量500以上、未達4000的非聚合物之意。 聚合物,通常為使用分子量1000以上者。以下,稱為「樹脂」、「高分子化合物」或「聚合物」時,為表示分子量為1000以上的聚合物之意。 聚合物之分子量,為使用GPC(凝膠滲透色層分析)依聚苯乙烯換算而得的重量平均分子量。<(A) Ingredients> In this embodiment, the component (A) of the resist composition is a substrate component that changes the solubility of the developer through the action of acid. In the present invention, the "substrate component" is an organic compound having film-forming ability, and it is preferable to use an organic compound with a molecular weight of 500 or more. When the molecular weight of the organic compound is 500 or more, the film forming ability can be improved. In addition, it is easy to form a resist pattern of about nanometer. Organic compounds used as substrate components can be roughly divided into non-polymers and polymers. Non-polymers are usually those with a molecular weight of 500 or more but less than 4000. Hereinafter, when it is referred to as a "low molecular compound", it means a non-polymer with a molecular weight of 500 or more and less than 4000. The polymer is usually one with a molecular weight of 1,000 or more. Hereinafter, when referred to as "resin", "polymer compound" or "polymer", it means a polymer having a molecular weight of 1,000 or more. The molecular weight of the polymer is the weight average molecular weight converted from polystyrene using GPC (Gel Permeation Chromatography).

本實施形態中,阻劑組成物,於鹼顯影製程中為形成負型阻劑圖型之「鹼顯影製程用負型阻劑組成物」時,如上所述,為使用(A-2)成份與交聯劑成份。 (A-2)成份中,較佳為使用對鹼顯影液為可溶性之樹脂(以下,亦稱為「鹼可溶性樹脂」)。 鹼可溶性樹脂,例如:特開2000-206694號公報所揭示之具有由α-(羥烷基)丙烯酸,或α-(羥烷基)丙烯酸之烷酯(較佳為碳數1~5之烷酯)所選出之至少一個所衍生的結構單位之樹脂;美國專利6949325號公報所揭示之具有磺醯胺基的鍵結於α位的碳原子之氫原子可被取代基所取代的丙烯酸樹脂或多環烯烴樹脂;美國專利6949325號公報、特開2005-336452號公報、特開2006-317803號公報所揭示之含有氟化醇的鍵結於α位的碳原子之氫原子可被取代基所取代的丙烯酸樹脂;特開2006-259582號公報所揭示之具有氟化醇的多環烯烴樹脂等,以其可形成較少膨潤的良好阻劑圖型,而為較佳。 又,前述α-(羥烷基)丙烯酸,係指α位的碳原子鍵結之氫原子可被取代基所取代的丙烯酸中,包含鍵結於羧基之α位的碳原子上鍵結氫原子的丙烯酸,與該α位之碳原子上鍵結羥烷基(較佳為碳數1~5之羥烷基)的α-羥烷基丙烯酸之一者或二者之意。 交聯劑成份,就容易形成較少膨潤的良好阻劑圖型之觀點,以使用具有羥甲基或烷氧甲基的乙炔脲等之胺基系交聯劑,或三聚氰胺系交聯劑等為佳。交聯劑成份之添加量,相對於鹼可溶性樹脂100質量份,以1~50質量份為佳。In this embodiment, when the resist composition is the "negative resist composition for alkali development process" that forms a negative resist pattern in the alkali development process, as described above, the component (A-2) is used With cross-linking agent ingredients. (A-2) Among the components, it is preferable to use a resin that is soluble in an alkali developer (hereinafter, also referred to as "alkali-soluble resin"). Alkali-soluble resins, such as those disclosed in JP 2000-206694 No. 2000-206694, have an alkyl ester of α-(hydroxyalkyl)acrylic acid or α-(hydroxyalkyl)acrylic acid (preferably an alkane having 1 to 5 carbon atoms). Esters) selected at least one derived structural unit resin; U.S. Patent No. 6,694,325 discloses an acrylic resin having a sulfonamide group bonded to the carbon atom at the α position and the hydrogen atom can be replaced by a substituent or Polycyclic olefin resin; U.S. Patent No. 6,694,325, JP 2005-336452, JP 2006-317803, which contain fluorinated alcohols and hydrogen atoms bonded to the carbon atoms at the α position may be substituted by substituents Substituted acrylic resins; the polycyclic olefin resins with fluorinated alcohols disclosed in JP 2006-259582, etc., are preferred because they can form a good resist pattern with less swelling. In addition, the aforementioned α-(hydroxyalkyl)acrylic acid refers to acrylic acid in which the hydrogen atom bonded to the carbon atom at the α position can be substituted by a substituent, and includes a hydrogen atom bonded to the carbon atom at the α position of the carboxyl group. The acrylic acid means one or both of the α-hydroxyalkyl acrylic acid bonded with a hydroxyalkyl group (preferably a hydroxyalkyl group with 1 to 5 carbons) to the carbon atom at the α position. The cross-linking agent component is easy to form a good resist pattern with less swelling. Use amine-based cross-linking agents such as acetylene urea with methylol or alkoxymethyl, or melamine-based cross-linking agents, etc. Better. The addition amount of the crosslinking agent component is preferably 1-50 parts by mass relative to 100 parts by mass of the alkali-soluble resin.

本實施形態中之阻劑組成物,於鹼顯影製程中為形成正型阻劑圖型之「鹼顯影製程用正型阻劑組成物」時,如上所述,為使用(A-1)成份。 (A)成份較佳為使用上述(A-1)成份。When the resist composition in this embodiment is a "positive resist composition for alkaline development process" that forms a positive resist pattern in the alkaline development process, it uses the component (A-1) as described above . The component (A) preferably uses the component (A-1) described above.

本實施形態中之阻劑組成物之(A)成份,可單獨使用1種亦可、將2種以上合併使用亦可。 (A)成份為(A-1)成份時,(A-1)成份以含有樹脂成份(A1)(以下,亦稱為「(A1)成份」)者為佳。The (A) component of the resist composition in this embodiment may be used alone or in combination of two or more. When the component (A) is the component (A-1), the component (A-1) should preferably contain the resin component (A1) (hereinafter, also referred to as "(A1) component").

・(A1)成份 (A1)成份為樹脂成份,其以含有:具有含經由酸之作用而使極性增大之酸分解性基的結構單位(a1)之高分子化合物者為佳。 (A1)成份,除結構單位(a1)以外,亦可為具有含有:含內酯之環式基、含-SO2 -之環式基或含碳酸酯之環式基的結構單位(a2)者。 又,(A1)成份,除結構單位(a1)以外,亦可為具有含有:含極性基之脂肪族烴基的結構單位(a3)(其中,相當於結構單位(a1)或結構單位(a2)者除外)者。 又,(A1)成份,亦可具有結構單位(a1)、結構單位(a2)、結構單位(a3)以外的結構單位。・(A1) Component (A1) is a resin component, which preferably contains a polymer compound having a structural unit (a1) containing an acid-decomposable group that increases polarity by the action of acid. (A1) component, in addition to structural units (A1), having also comprising: the lactone-containing cyclic group containing -SO 2 - group or the cyclic carbon containing cyclic group of the ester constituent unit (a2) By. In addition, the component (A1), in addition to the structural unit (a1), may also be a structural unit (a3) containing an aliphatic hydrocarbon group containing a polar group (wherein, it corresponds to the structural unit (a1) or the structural unit (a2) Except for those). In addition, the component (A1) may have a structural unit other than the structural unit (a1), the structural unit (a2), and the structural unit (a3).

≪結構單位(a1)≫ 結構單位(a1),為含有經由酸之作用而使極性增大之酸分解性基結構單位。 「酸分解性基」,為經由酸之作用,而使該酸分解性基的結構中之至少一部份鍵結形成開裂的具有酸分解性之基。 經由酸之作用而使極性增大之酸分解性基,可列舉如:經由酸之作用而分解而生成極性基之基等。 極性基,可列舉如:羧基、羥基、胺基、磺酸基   (-SO3 H)等。該些之中,又以結構中含有-OH之極性基(以下,亦稱為「含OH之極性基」)為佳,以羧基或羥基為較佳,以羧基為特佳。 酸分解性基,具體而言,可列舉如:前述極性基被酸解離性基保護之基(例如含OH之極性基的氫原子,被酸解離性基保護之基)等。≪Structural unit (a1)≫ Structural unit (a1) is a structural unit containing an acid-decomposable group that increases polarity through the action of acid. The "acid-decomposable group" is an acid-decomposable group that bonds at least a part of the structure of the acid-decomposable group to form a crack through the action of acid. The acid-decomposable group whose polarity increases through the action of acid includes, for example, a group that decomposes through the action of acid to generate a polar group. Examples of polar groups include carboxyl groups, hydroxyl groups, amino groups, and sulfonic acid groups (-SO 3 H). Among these, a polar group containing -OH in the structure (hereinafter, also referred to as "OH-containing polar group") is preferred, a carboxyl group or a hydroxyl group is preferred, and a carboxyl group is particularly preferred. Specifically, the acid-decomposable group includes a group in which the aforementioned polar group is protected by an acid-dissociable group (for example, a hydrogen atom of an OH-containing polar group, a group protected by an acid-dissociable group).

此處之「酸解離性基」係指:(i)經由酸之作用,而使該酸解離性基與該酸解離性基鄰接的原子之間的鍵結形成開裂之具有酸解離性之基,或(ii)經由酸之作用而使一部份鍵結形成開裂之後,再經由所產生的去碳酸反應,使該酸解離性基與該酸解離性基鄰接的原子之間的鍵結形成開裂之基,等二者。 構成酸分解性基的酸解離性基,必須具有較該酸解離性基經解離而生成的極性基為更低極性之基,如此,經由酸之作用而使該酸解離性基解離之際,會生成較該酸解離性基更高極性的極性基,而增大極性。其結果將使(A1)成份全體之極性增大。極性增大結果,相對地使對顯影液之溶解性發生變化,於顯影液為鹼顯影液時會增大溶解性,於顯影液為有機系顯影液時則會降低溶解性。The "acid-dissociable group" here refers to: (i) The bond between the acid-dissociable group and the atom adjacent to the acid-dissociable group forms a cracked acid-dissociable group through the action of acid , Or (ii) After a part of the bond is formed and cracked by the action of acid, the bond between the acid dissociable group and the adjacent atom of the acid dissociable group is formed through the decarbonation reaction The base of cracking, wait for both. The acid dissociable group constituting the acid dissociable group must have a lower polar group than the polar group generated by dissociation of the acid dissociable group. Thus, when the acid dissociable group is dissociated by the action of acid, A polar group with higher polarity than the acid dissociable group is generated, and the polarity is increased. As a result, the polarity of the entire component (A1) will increase. As a result of the increase in polarity, the solubility to the developer is relatively changed. When the developer is an alkaline developer, the solubility is increased, and when the developer is an organic developer, the solubility is reduced.

酸解離性基,例如:可使用目前為止被提案作為化學增幅型阻劑組成物用的基底樹脂之酸解離性基者。 被提案作為化學增幅型阻劑組成物用的基底樹脂之酸解離性基者,具體而言,可列舉如:以下說明之「縮醛型酸解離性基」、「三級烷酯型酸解離性基」、「三級烷氧羰基酸解離性基等。As the acid dissociable group, for example, the acid dissociable group proposed so far as the base resin for the chemically amplified resist composition can be used. The acid dissociable groups of base resins proposed as chemically amplified resist compositions, specifically, include: "acetal type acid dissociable groups" and "tertiary alkyl ester type acid dissociable groups" described below "Tertiary alkoxycarbonyl acid dissociable group", "tertiary alkoxycarbonyl acid dissociable group, etc.

縮醛型酸解離性基: 前述極性基中,保護羧基或羥基的酸解離性基,可列舉如:下述通式(a1-r-1)所表示之酸解離性基(以下,亦稱為「縮醛型酸解離性基」)等。Acetal acid dissociable group: Among the aforementioned polar groups, the acid-dissociable group that protects the carboxyl or hydroxyl group includes, for example, the acid-dissociable group represented by the following general formula (a1-r-1) (hereinafter, also referred to as "acetal acid-dissociable group基") etc.

Figure 02_image007
[式中,Ra’1 、Ra’2 為氫原子或烷基;Ra’3 為烴基,且Ra’3 可與Ra’1 、Ra’2 之任一者鍵結而形成環]。
Figure 02_image007
[In the formula, Ra' 1 and Ra' 2 are hydrogen atoms or alkyl groups; Ra' 3 is a hydrocarbon group, and Ra' 3 may be bonded to any of Ra' 1 and Ra' 2 to form a ring].

式(a1-r-1)中,Ra’1 及Ra’2 中,以至少一者為氫原子為佳,以兩者為氫原子為較佳。 Ra’1 或Ra’2 為烷基時,該烷基例如與上述α取代丙烯酸酯的說明中,被列舉作為可鍵結於α位之碳原子的取代基之烷基為相同之內容,又以碳數1~5之烷基為佳。具體而言,以直鏈狀或支鏈狀之烷基為較佳例示。更具體而言,可列舉如:甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基等,又以甲基或乙基為較佳,以甲基為特佳。In the formula (a1-r-1), at least one of Ra' 1 and Ra' 2 is preferably a hydrogen atom, and both of them are preferably hydrogen atoms. When Ra' 1 or Ra' 2 is an alkyl group, for example, the alkyl group has the same content as the alkyl group exemplified as the substituent that can be bonded to the carbon atom at the α position in the description of the α-substituted acrylate. An alkyl group with 1 to 5 carbon atoms is preferred. Specifically, a linear or branched alkyl group is preferably exemplified. More specifically, examples include methyl, ethyl, propyl, isopropyl, n-butyl, isobutyl, tert-butyl, pentyl, isopentyl, neopentyl, etc., and Methyl or ethyl is preferred, and methyl is particularly preferred.

式(a1-r-1)中,Ra’3 之烴基,可為直鏈狀或支鏈狀之烷基,或環狀之烴基等。 該直鏈狀之烷基,以碳數1~5為佳,以碳數1~4為較佳,以碳數1或2為更佳。具體而言,可列舉如:甲基、乙基、n-丙基、n-丁基、n-戊基等。該些之中,又以甲基、乙基或n-丁基為佳,以甲基或乙基為較佳。Of formula (a1-r-1) of, Ra '3 hydrocarbon group, the alkyl group may be of straight-chain or branched, or cyclic hydrocarbon group of. The linear alkyl group preferably has 1 to 5 carbon atoms, preferably 1 to 4 carbon atoms, and more preferably 1 or 2 carbon atoms. Specifically, examples thereof include methyl, ethyl, n-propyl, n-butyl, n-pentyl, and the like. Among these, methyl, ethyl or n-butyl is preferred, and methyl or ethyl is preferred.

該支鏈狀之烷基,以碳數3~10為佳,以碳數3~5為較佳。具體而言,可列舉如:異丙基、異丁基、tert-丁基、異戊基、新戊基、1,1-二乙基丙基、2,2-二甲基丁基等,又以異丙基為佳。The branched alkyl group preferably has a carbon number of 3-10, and preferably has a carbon number of 3-5. Specifically, examples include isopropyl, isobutyl, tert-butyl, isopentyl, neopentyl, 1,1-diethylpropyl, 2,2-dimethylbutyl, etc., Isopropyl is preferred.

Ra’3 為環狀之烴基時,該烴基可為脂肪族烴基亦可、芳香族烴基亦可,又,可為多環式基亦可、單環式基亦可。 單環式基之脂肪族烴基,以由單環鏈烷去除1個氫原子而得之基為佳。該單環鏈烷,以碳數3~6者為佳,具體而言,可列舉如:環戊烷、環己烷等。 多環式基之脂肪族烴基,以由多環鏈烷去除1個氫原子而得之基為佳,該多環鏈烷,以碳數7~12者為佳,具體而言,可列舉如:金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。When Ra' 3 is a cyclic hydrocarbon group, the hydrocarbon group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group, and it may be a polycyclic group or a monocyclic group. The aliphatic hydrocarbon group of the monocyclic group is preferably a group obtained by removing one hydrogen atom from a monocyclic alkane. The monocyclic alkane is preferably one having 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane. The aliphatic hydrocarbon group of the polycyclic group is preferably a group obtained by removing one hydrogen atom from a polycyclic alkane. The polycyclic alkane is preferably a carbon number of 7-12. Specifically, examples include : Adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc.

Ra’3 之環狀之烴基為芳香族烴基時,該芳香族烴基,為至少具有1個芳香環的烴基。 該芳香環,只要為具有4n+2個π電子的環狀共軛系時,則未有特別之限定,其可為單環式亦可、多環式亦可。芳香環之碳數以5~30為佳,以碳數5~20為較佳,以碳數6~15為更佳,以碳數6~12為特佳。 芳香環,具體而言,可列舉如:苯、萘、蒽、菲等之芳香族烴環;構成前述芳香族烴環的碳原子中之一部份被雜原子取代而得之芳香族雜環等。芳香族雜環中之雜原子,可列舉如:氧原子、硫原子、氮原子等。芳香族雜環,具體而言,可列舉如:吡啶環、噻吩環等。 Ra’3 中之芳香族烴基,具體而言,可列舉如:由前述芳香族烴環或芳香族雜環去除1個氫原子而得之基(芳基或雜芳基);由含有2個以上之芳香環的芳香族化合物(例如聯苯、茀等)去除1個氫原子而得之基;前述芳香族烴環或芳香族雜環的氫原子中之1個被伸烷基取代而得之基(可列舉如:苄基、苯乙基、1-萘基甲基、2-萘基甲基、1-萘基乙基、2-萘基乙基等之芳烷基等)等。前述芳香族烴環或芳香族雜環鍵結的伸烷基之碳數,以1~4為佳,以碳數1~2為較佳,以碳數1為特佳。When the cyclic hydrocarbon group of Ra' 3 is an aromatic hydrocarbon group, the aromatic hydrocarbon group is a hydrocarbon group having at least one aromatic ring. The aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and it may be monocyclic or polycyclic. The carbon number of the aromatic ring is preferably 5-30, preferably 5-20, more preferably 6-15, and particularly preferably 6-12. Aromatic rings, specifically, include: aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, phenanthrene, etc.; aromatic heterocycles in which part of the carbon atoms constituting the aforementioned aromatic hydrocarbon ring is substituted by heteroatoms Wait. Examples of heteroatoms in the aromatic heterocycle include oxygen atoms, sulfur atoms, and nitrogen atoms. Specific examples of the aromatic heterocyclic ring include a pyridine ring and a thiophene ring. Specifically, the aromatic hydrocarbon group in Ra' 3 includes: a group (aryl group or heteroaryl group) obtained by removing one hydrogen atom from the aforementioned aromatic hydrocarbon ring or aromatic heterocyclic ring; The above aromatic compound of the aromatic ring (for example, biphenyl, fluorine, etc.) is obtained by removing one hydrogen atom; one of the hydrogen atoms of the aforementioned aromatic hydrocarbon ring or aromatic heterocyclic ring is substituted by an alkylene group (E.g., aralkyl groups such as benzyl, phenethyl, 1-naphthylmethyl, 2-naphthylmethyl, 1-naphthylethyl, 2-naphthylethyl, etc.) and the like. The number of carbon atoms of the alkylene group bonded to the aforementioned aromatic hydrocarbon ring or aromatic heterocyclic ring is preferably 1 to 4, preferably 1 to 2 carbons, and particularly preferably 1 carbon.

Ra’3 中之環狀之烴基,可具有取代基。該取代基,可列舉如:-RP1 、-RP2 -O-RP1 、-RP2 -CO-RP1 、-RP2 -CO-ORP1 、-RP2 -O-CO-RP1 、-RP2 -OH、-RP2 -CN或-RP2 -COOH(以下,該些取代基統稱為「Ra05 」)等。 其中,RP1 為碳數1~10的1價之鏈狀飽和烴基、碳數3~20的1價之脂肪族環狀飽和烴基或碳數6~30的1價之芳香族烴基。又,RP2 為單鍵、碳數1~10的2價之鏈狀飽和烴基、碳數3~20的2價之脂肪族環狀飽和烴基或碳數6~30的2價之芳香族烴基。其中,RP1 及RP2 的鏈狀飽和烴基、脂肪族環狀飽和烴基及芳香族烴基具有的氫原子之一部份或全部,可被氟原子所取代。上述脂肪族環狀烴基,可單獨具有1個以上的上述取代基亦可、分別具有1個以上的複數種的上述取代基亦可。 碳數1~10的1價之鏈狀飽和烴基,可列舉如:甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、癸基等。 碳數3~20的1價之脂肪族環狀飽和烴基,可列舉如:環丙基、環丁基、環戊基、環己基、環庚基、環辛基、環癸基、環十二烷基等的單環式脂肪族飽和烴基;雙環[2.2.2]庚基、三環[5.2.1. 02,6 ]癸基、三環[3.3.1. 13,7 ]癸基、四環[6.2.1. 13,6 . 02,7 ]十二烷基、金剛烷基等的多環式脂肪族飽和烴基等。 碳數6~30的1價之芳香族烴基,可列舉如:由苯、聯苯、茀、萘、蒽、菲等之芳香族烴環去除1個氫原子而得之基等。The cyclic hydrocarbon group in Ra' 3 may have a substituent. Examples of the substituent include -R P1 , -R P2 -OR P1 , -R P2 -CO-R P1 , -R P2 -CO-OR P1 , -R P2 -O-CO-R P1 , -R P2 -OH, -R P2 -CN or -R P2 -COOH (hereinafter, these substituents are collectively referred to as "Ra 05 ") and the like. Among them, R P1 is a monovalent chain saturated hydrocarbon group having 1 to 10 carbons, a monovalent aliphatic cyclic saturated hydrocarbon group having 3 to 20 carbons, or a monovalent aromatic hydrocarbon group having 6 to 30 carbons. In addition, R P2 is a single bond, a divalent chain saturated hydrocarbon group with 1 to 10 carbons, a divalent aliphatic cyclic saturated hydrocarbon group with 3 to 20 carbons, or a divalent aromatic hydrocarbon group with 6 to 30 carbons . Among them, part or all of the hydrogen atoms of the chain saturated hydrocarbon groups, aliphatic cyclic saturated hydrocarbon groups, and aromatic hydrocarbon groups of R P1 and R P2 may be substituted by fluorine atoms. The aliphatic cyclic hydrocarbon group may have one or more of the above-mentioned substituents alone, or may have one or more of the above-mentioned substituents of plural kinds. Examples of the monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, and decyl. A monovalent aliphatic cyclic saturated hydrocarbon group with 3 to 20 carbons, such as cyclopropyl, cyclobutyl, cyclopentyl, cyclohexyl, cycloheptyl, cyclooctyl, cyclodecyl, cyclodecyl Monocyclic aliphatic saturated hydrocarbon groups such as alkyl groups; bicyclo[2.2.2]heptyl, tricyclo[5.2.1. 0 2,6 ]decyl, tricyclo[3.3.1. 1 3,7 ]decyl , Tetracyclic [6.2.1. 1 3,6.0 2,7 ] dodecyl, adamantyl and other polycyclic aliphatic saturated hydrocarbon groups. The monovalent aromatic hydrocarbon group having 6 to 30 carbon atoms includes, for example, a group obtained by removing one hydrogen atom from an aromatic hydrocarbon ring such as benzene, biphenyl, pyrene, naphthalene, anthracene, and phenanthrene.

Ra’3 與Ra’1 、Ra’2 之任一者鍵結而形成環時,該環式基以4~7員環為佳,以4~6員環為較佳。該環式基之具體例,可列舉如:四氫吡喃基、四氫呋喃基等。When Ra' 3 is bonded to any one of Ra' 1 and Ra' 2 to form a ring, the cyclic group is preferably a 4- to 7-membered ring, and more preferably a 4- to 6-membered ring. Specific examples of the cyclic group include tetrahydropyranyl and tetrahydrofuranyl.

三級烷酯型酸解離性基: 上述極性基中,保護羧基之酸解離性基,可列舉如:下述通式(a1-r-2)所表示之酸解離性基等。 又,下述式(a1-r-2)所表示之酸解離性基中,由烷基所構成者,以下,於簡便上亦稱為「三級烷酯型酸解離性基」。Tertiary alkyl ester type acid dissociable group: Among the above-mentioned polar groups, the acid dissociable group that protects the carboxyl group includes, for example, an acid dissociable group represented by the following general formula (a1-r-2). In addition, among the acid dissociable groups represented by the following formula (a1-r-2), those composed of an alkyl group are hereinafter also referred to as "tertiary alkyl ester type acid dissociable groups" for simplicity.

Figure 02_image009
[式中,Ra’4 ~Ra’6 各別為烴基,且Ra’5 、Ra’6 可相互鍵結而形成環]。
Figure 02_image009
[In the formula, Ra' 4 to Ra' 6 are each a hydrocarbon group, and Ra' 5 and Ra' 6 may be bonded to each other to form a ring].

Ra’4 之烴基,可列舉如:直鏈狀或支鏈狀之烷基、鏈狀或環狀之烯基,或環狀之烴基等。 Ra’4 中之直鏈狀或支鏈狀之烷基、環狀之烴基(單環式基之脂肪族烴基、多環式基之脂肪族烴基、芳香族烴基),例如:與前述Ra’3 為相同之內容。 Ra’4 中之鏈狀或環狀之烯基,以碳數2~10之烯基為佳。 Ra’5 、Ra’6 中之烴基,例如:與前述Ra’3 為相同之內容。The hydrocarbon group of Ra' 4 includes, for example, a linear or branched alkyl group, a chain or cyclic alkenyl group, or a cyclic hydrocarbon group. The linear or branched alkyl group and cyclic hydrocarbon group in Ra' 4 (monocyclic aliphatic hydrocarbon group, polycyclic aliphatic hydrocarbon group, aromatic hydrocarbon group), for example: and the aforementioned Ra' 3 is the same content. The chain or cyclic alkenyl group in Ra' 4 is preferably an alkenyl group having 2 to 10 carbon atoms. The hydrocarbon group in Ra' 5 and Ra' 6 , for example, has the same content as the aforementioned Ra' 3 .

Ra’5 與Ra’6 相互鍵結而形成環時,以下述通式(a1-r2-1)所表示之基、下述通式(a1-r2-2)所表示之基、下述通式(a1-r2-3)所表示之基為較佳之例示。 另一方面,Ra’4 ~Ra’6 未相互鍵結,而為獨立之烴基時,以下述通式(a1-r2-4)所表示之基為較佳之例示。When Ra' 5 and Ra' 6 are bonded to each other to form a ring, the group represented by the following general formula (a1-r2-1), the group represented by the following general formula (a1-r2-2), and the following general The group represented by the formula (a1-r2-3) is a preferable example. On the other hand, when Ra' 4 to Ra' 6 are not bonded to each other but are independent hydrocarbon groups, a group represented by the following general formula (a1-r2-4) is preferably exemplified.

Figure 02_image011
[式(a1-r2-1)中,Ra’10 為碳數1~10之烷基,或下述通式(a1-r2-r1)所表示之基。Ra’11 為與Ra’10 鍵結之碳原子共同形成脂肪族環式基之基;式(a1-r2-2)中,Ya為碳原子;Xa為與Ya共同形成環狀烴基之基;該環狀之烴基所具有的氫原子之一部份或全部可被取代。Ra01 ~Ra03 各別獨立為氫原子、碳數1~10的1價之鏈狀飽和烴基或碳數3~20的1價之脂肪族環狀飽和烴基。該鏈狀飽和烴基及脂肪族環狀飽和烴基所具有的氫原子之一部份或全部可被取代。Ra01 ~Ra03 之2個以上可相互鍵結而形成環狀結構。式(a1-r2-3)中,Yaa為碳原子;Xaa為與Yaa共同形成脂肪族環式基之基。Ra04 為可具有取代基的芳香族烴基。式(a1-r2-4)中,Ra’12 及Ra’13 各別獨立為碳數1~10的1價之鏈狀飽和烴基或氫原子。該鏈狀飽和烴基所具有的氫原子之一部份或全部可被取代。Ra’14 為可具有取代基之烴基。*表示鍵結鍵(以下相同)]。
Figure 02_image011
[In the formula (a1-r2-1), Ra' 10 is an alkyl group having 1 to 10 carbon atoms, or a group represented by the following general formula (a1-r2-r1). Ra' 11 is a group that forms an aliphatic cyclic group together with the carbon atom bonded to Ra'10; in formula (a1-r2-2), Ya is a carbon atom; Xa is a group that forms a cyclic hydrocarbon group together with Ya; Part or all of the hydrogen atoms of the cyclic hydrocarbon group may be substituted. Ra 01 to Ra 03 are each independently a hydrogen atom, a monovalent chain saturated hydrocarbon group with 1 to 10 carbons, or a monovalent aliphatic cyclic saturated hydrocarbon group with 3 to 20 carbons. Part or all of the hydrogen atoms of the chain saturated hydrocarbon group and the aliphatic cyclic saturated hydrocarbon group may be substituted. Two or more of Ra 01 to Ra 03 may be bonded to each other to form a ring structure. In the formula (a1-r2-3), Yaa is a carbon atom; Xaa is a group that forms an aliphatic cyclic group together with Yaa. Ra 04 is an aromatic hydrocarbon group which may have a substituent. In the formula (a1-r2-4), Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms or a hydrogen atom. Part or all of the hydrogen atoms of the chain saturated hydrocarbon group may be substituted. Ra' 14 is a hydrocarbon group which may have a substituent. * indicates the bonding key (the same below)].

Figure 02_image013
[式中,Ya0 為四級碳原子。Ra031 、Ra032 及Ra033 ,為各別獨立之可具有取代基之烴基。其中,Ra031 、Ra032 及Ra033 中之1個以上,為具有至少一個極性基的烴基]。
Figure 02_image013
[In the formula, Ya 0 is a quaternary carbon atom. Ra 031 , Ra 032 and Ra 033 are independent hydrocarbon groups which may have substituents. Among them, one or more of Ra 031 , Ra 032, and Ra 033 is a hydrocarbon group having at least one polar group].

上述式(a1-r2-1)中,Ra’10 之碳數1~10之烷基,以式(a1-r-1)中,Ra’3 之直鏈狀或支鏈狀之烷基所列舉之基為佳。Ra’10 以碳數1~5之烷基為佳。In the above formula (a1-r2-1), the alkyl group with 1 to 10 carbon atoms of Ra' 10 is defined by the linear or branched alkyl group of Ra' 3 in the formula (a1-r-1) The base of enumeration is better. Ra' 10 is preferably an alkyl group with 1 to 5 carbon atoms.

前述式(a1-r2-r1)中,Ya0 為四級碳原子。即,Ya0 (碳原子)鍵結的相鄰碳原子數為4個。In the aforementioned formula (a1-r2-r1), Ya 0 is a quaternary carbon atom. That is, the number of adjacent carbon atoms to which Ya 0 (carbon atom) is bonded is four.

前述式(a1-r2-r1)中,Ra031 、Ra032 及Ra033 ,為各別獨立之可具有取代基之烴基。Ra031 、Ra032 及Ra033 中之烴基,為各別獨立之直鏈狀或支鏈狀之烷基、鏈狀或環狀之烯基,或環狀之烴基等。In the aforementioned formula (a1-r2-r1), Ra 031 , Ra 032 and Ra 033 are each independently a hydrocarbon group which may have a substituent. The hydrocarbyl groups in Ra 031 , Ra 032, and Ra 033 are independently linear or branched alkyl groups, chain or cyclic alkenyl groups, or cyclic hydrocarbon groups.

Ra031 、Ra032 及Ra033 中,直鏈狀之烷基,以碳數1~5為佳,以1~4為較佳,以1或2為更佳。具體而言,可列舉如:甲基、乙基、n-丙基、n-丁基、n-戊基等。該些之中,又以甲基、乙基或n-丁基為佳,以甲基或乙基為較佳。 Ra031 、Ra032 及Ra033 中,支鏈狀之烷基,以碳數3~10為佳,以3~5為較佳。具體而言,可列舉如:異丙基、異丁基、tert-丁基、異戊基、新戊基、1,1-二乙基丙基、2,2-二甲基丁基等,又以異丙基為佳。 Ra031 、Ra032 及Ra033 中,鏈狀或環狀之烯基,以碳數2~10之烯基為佳。In Ra 031 , Ra 032 and Ra 033 , the linear alkyl group preferably has 1 to 5 carbon atoms, preferably 1 to 4, and more preferably 1 or 2. Specifically, examples thereof include methyl, ethyl, n-propyl, n-butyl, n-pentyl, and the like. Among these, methyl, ethyl or n-butyl is preferred, and methyl or ethyl is preferred. In Ra 031 , Ra 032 and Ra 033 , the branched alkyl group preferably has a carbon number of 3-10, more preferably 3-5. Specifically, examples include isopropyl, isobutyl, tert-butyl, isopentyl, neopentyl, 1,1-diethylpropyl, 2,2-dimethylbutyl, etc., Isopropyl is preferred. Among Ra 031 , Ra 032 and Ra 033 , the chain or cyclic alkenyl group is preferably an alkenyl group with 2-10 carbon atoms.

Ra031 、Ra032 及Ra033 中,環狀之烴基,可為脂肪族烴基亦可、芳香族烴基亦可,又,可為多環式基亦可、單環式基亦可。 單環式基之脂肪族烴基,以由單環鏈烷去除1個氫原子而得之基為佳。該單環鏈烷,以碳數3~6者為佳,具體而言,可列舉如:環戊烷、環己烷等。 多環式基之脂肪族烴基,以由多環鏈烷去除1個氫原子而得之基為佳,該多環鏈烷,以碳數7~12者為佳,具體而言,可列舉如:金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。In Ra 031 , Ra 032, and Ra 033 , the cyclic hydrocarbon group may be an aliphatic hydrocarbon group, an aromatic hydrocarbon group, a polycyclic group, or a monocyclic group. The aliphatic hydrocarbon group of the monocyclic group is preferably a group obtained by removing one hydrogen atom from a monocyclic alkane. The monocyclic alkane is preferably one having 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane. The aliphatic hydrocarbon group of the polycyclic group is preferably a group obtained by removing one hydrogen atom from a polycyclic alkane. The polycyclic alkane is preferably a carbon number of 7-12. Specifically, examples include : Adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc.

Ra031 、Ra032 及Ra033 中,該芳香族烴基,為至少具有1個芳香環的烴基。該芳香環,只要為具有4n+2個π電子的環狀共軛系時,則未有特別之限定,其可為單環式亦可、多環式亦可。芳香環之碳數以5~30為佳,以5~20為較佳,以6~15為更佳,以6~12為特佳。芳香環,具體而言,可列舉如:苯、萘、蒽、菲等之芳香族烴環;構成前述芳香族烴環的碳原子中之一部份被雜原子取代而得之芳香族雜環等。芳香族雜環中之雜原子,可列舉如:氧原子、硫原子、氮原子等。芳香族雜環,具體而言,可列舉如:吡啶環、噻吩環等。該芳香族烴基,具體而言,可列舉如:由前述芳香族烴環或芳香族雜環去除1個氫原子而得之基(芳基或雜芳基);由含有2個以上之芳香環的芳香族化合物(例如聯苯、茀等)去除1個氫原子而得之基;前述芳香族烴環或芳香族雜環的氫原子中之1個被伸烷基取代而得之基(可列舉如:苄基、苯乙基、1-萘基甲基、2-萘基甲基、1-萘基乙基、2-萘基乙基等之芳烷基等)等。前述芳香族烴環或芳香族雜環鍵結的伸烷基之碳數,以1~4為佳,以1~2為較佳,以1為特佳。In Ra 031 , Ra 032, and Ra 033 , the aromatic hydrocarbon group is a hydrocarbon group having at least one aromatic ring. The aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and it may be monocyclic or polycyclic. The carbon number of the aromatic ring is preferably 5-30, preferably 5-20, more preferably 6-15, and particularly preferably 6-12. Aromatic rings, specifically, include: aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, phenanthrene, etc.; aromatic heterocycles in which part of the carbon atoms constituting the aforementioned aromatic hydrocarbon ring is substituted by heteroatoms Wait. Examples of heteroatoms in the aromatic heterocycle include oxygen atoms, sulfur atoms, and nitrogen atoms. Specific examples of the aromatic heterocyclic ring include a pyridine ring and a thiophene ring. Specifically, the aromatic hydrocarbon group includes a group (aryl group or heteroaryl group) obtained by removing one hydrogen atom from the aforementioned aromatic hydrocarbon ring or aromatic heterocyclic ring; and a group containing two or more aromatic rings Aromatic compounds (such as biphenyl, stilbene, etc.) obtained by removing one hydrogen atom; a group obtained by substituting one of the hydrogen atoms of the aforementioned aromatic hydrocarbon ring or aromatic heterocyclic ring with an alkylene group (may Examples include aralkyl groups such as benzyl, phenethyl, 1-naphthylmethyl, 2-naphthylmethyl, 1-naphthylethyl, 2-naphthylethyl, etc.). The number of carbon atoms of the alkylene group bonded to the aforementioned aromatic hydrocarbon ring or aromatic heterocyclic ring is preferably 1 to 4, preferably 1 to 2, and particularly preferably 1.

上述Ra031 、Ra032 及Ra033 所表示之烴基被取代時,該取代基,可列舉如:羥基、羧基、鹵素原子(氟原子、氯原子、溴原子等)、烷氧基(甲氧基、乙氧基、丙氧基、丁氧基等)、烷基氧羰基等。When the hydrocarbon group represented by Ra 031 , Ra 032, and Ra 033 is substituted, the substituent includes, for example, a hydroxyl group, a carboxyl group, a halogen atom (fluorine atom, chlorine atom, bromine atom, etc.), and an alkoxy group (methoxy group). , Ethoxy, propoxy, butoxy, etc.), alkyloxycarbonyl, etc.

上述之中,Ra031 、Ra032 及Ra033 中,可具有取代基之烴基,又以可具有取代基直鏈狀或支鏈狀之烷基為佳,直鏈狀之烷基為較佳。Among the above, among Ra 031 , Ra 032, and Ra 033 , the hydrocarbon group that may have a substituent is preferably a linear or branched alkyl group that may have a substituent, and a linear alkyl group is more preferred.

其中,Ra031 、Ra032 及Ra033 中之1個以上,為至少具有極性基之烴基。 「具有極性基之烴基」,為包含構成烴基之伸甲基 (-CH2 -)被極性基取代者,或構成烴基之至少1個氫原子被極性基取代者之任一者。 該「具有極性基之烴基」,以下述通式(a1-p1)所表示之官能基為佳。Among them, one or more of Ra 031 , Ra 032, and Ra 033 is a hydrocarbon group having at least a polar group. The "hydrocarbon group having a polar group" includes either one in which the methylidene group (-CH 2 -) constituting the hydrocarbyl group is substituted by a polar group, or at least one hydrogen atom constituting the hydrocarbyl group is substituted with a polar group. The "hydrocarbon group having a polar group" is preferably a functional group represented by the following general formula (a1-p1).

Figure 02_image015
[式中,Ra07 表示碳數2~12的2價之烴基。Ra08 表示含有雜原子的2價之連結基。Ra06 表示碳數1~12的1價之烴基。np0 為1~6之整數]。
Figure 02_image015
[In the formula, Ra 07 represents a divalent hydrocarbon group having 2-12 carbon atoms. Ra 08 represents a divalent linking group containing a heteroatom. Ra 06 represents a monovalent hydrocarbon group having 1 to 12 carbon atoms. n p0 is an integer of 1 to 6].

前述式(a1-p1)中,Ra07 表示碳數2~12的2價之烴基。 Ra07 之碳數為2~12,又以碳數2~8為佳,以碳數2~6為較佳,以碳數2~4為更佳,以碳數2為特佳。 Ra07 中之烴基,以鏈狀或環狀脂肪族烴基為佳,以鏈狀之烴基為較佳。 Ra07 ,可列舉如:伸乙基、丙烷-1,3-二基、丁烷-1,4-二基、戊烷-1,5-二基、己烷-1,6-二基、庚烷-1,7-二基、辛烷-1,8-二基、壬烷-1,9-二基、癸烷-1,10-二基、十一烷-1,11-二基、十二烷-1,12-二基等之直鏈狀烷二基;丙烷-1,2-二基、1-甲基丁烷-1,3-二基、2-甲基丙烷-1,3-二基、戊烷-1,4-二基、2-甲基丁烷-1,4-二基等之支鏈狀烷二基;環丁烷-1,3-二基、環戊烷-1,3-二基、環己烷-1,4-二基、環辛烷-1,5-二基等之環鏈烷二基;降莰烷-1,4-二基、降莰烷-2,5-二基、金剛烷-1,5-二基、金剛烷-2,6-二基等的多環式的2價之脂環式烴基等。 上述之中,又以鏈烷二基為佳,以直鏈狀烷二基為較佳。In the aforementioned formula (a1-p1), Ra 07 represents a divalent hydrocarbon group having 2 to 12 carbon atoms. The carbon number of Ra 07 is 2-12, and the carbon number is preferably 2-8, preferably the carbon number is 2-6, more preferably the carbon number is 2 to 4, and particularly preferably the carbon number is 2. The hydrocarbon group in Ra 07 is preferably a chain or cyclic aliphatic hydrocarbon group, and a chain hydrocarbon group is preferable. Ra 07 , for example: ethylene, propane-1,3-diyl, butane-1,4-diyl, pentane-1,5-diyl, hexane-1,6-diyl, Heptane-1,7-diyl, octane-1,8-diyl, nonane-1,9-diyl, decane-1,10-diyl, undecane-1,11-diyl , Dodecane-1,12-diyl and other linear alkanediyl groups; propane-1,2-diyl, 1-methylbutane-1,3-diyl, 2-methylpropane-1 ,3-diyl, pentane-1,4-diyl, 2-methylbutane-1,4-diyl and other branched chain alkanediyl groups; cyclobutane-1,3-diyl, ring Cycloalkanediyl such as pentane-1,3-diyl, cyclohexane-1,4-diyl, cyclooctane-1,5-diyl; norbornane-1,4-diyl, Polycyclic divalent alicyclic hydrocarbon groups such as norbornane-2,5-diyl, adamantane-1,5-diyl, and adamantane-2,6-diyl. Among the above, an alkanediyl group is preferred, and a linear alkanediyl group is preferred.

前述式(a1-p1)中,Ra08 表示含有雜原子的2價之連結基。 Ra08 ,可列舉如:-O-、-C(=O)-O-、-C(=O)-、-O-C(=O)-O-、-C(=O)-NH-、-NH-、-NH-C(=NH)-(H可被烷基、醯基等的取代基所取代)、-S-、-S(=O)2 -、-S(=O)2 -O-等。 該些之中,就對顯影液的溶解性之觀點,以-O-、   -C(=O)-O-、-C(=O)-、-O-C(=O)-O-為佳,以-O-、-C(=O)-為特佳。In the aforementioned formula (a1-p1), Ra 08 represents a heteroatom-containing divalent linking group. Ra 08 , such as: -O-, -C(=O)-O-, -C(=O)-, -OC(=O)-O-, -C(=O)-NH-,- NH-, -NH-C(=NH)-(H may be substituted by substituents such as alkyl and acyl), -S-, -S(=O) 2 -, -S(=O) 2- O-etc. Among these, in terms of the solubility of the developer, -O-, -C(=O)-O-, -C(=O)-, -OC(=O)-O- are preferred, -O- and -C(=O)- are particularly preferred.

前述式(a1-p1)中,Ra06 表示碳數1~12的1價之烴基。 Ra06 之碳數為1~12,就對顯影液的溶解性之觀點,以碳數1~8為佳,以碳數1~5為較佳,以碳數1~3為更佳,以碳數1或2為特佳,以1為最佳。In the aforementioned formula (a1-p1), Ra 06 represents a monovalent hydrocarbon group having 1 to 12 carbon atoms. The carbon number of Ra 06 is 1-12. From the viewpoint of the solubility to the developer, the carbon number is preferably 1-8, preferably the carbon number is 1 to 5, and more preferably the carbon number is 1 to 3. Carbon number 1 or 2 is particularly preferred, and 1 is the best.

Ra06 中之烴基,可列舉如:鏈狀烴基或環狀烴基,或鏈狀與環狀組合而得之烴基等。 鏈狀烴基,可列舉如:甲基、乙基、n-丙基、異丙基、n-丁基、sec-丁基、tert-丁基、n-戊基、n-己基、n-庚基、2-乙基己基、n-辛基、n-壬基、n-癸基、n-十一烷基、n-十二烷基等。The hydrocarbyl group in Ra 06 includes, for example, a chain hydrocarbyl group or a cyclic hydrocarbyl group, or a chain and a cyclic hydrocarbyl group. Chain hydrocarbon groups, such as methyl, ethyl, n-propyl, isopropyl, n-butyl, sec-butyl, tert-butyl, n-pentyl, n-hexyl, n-heptyl Yl, 2-ethylhexyl, n-octyl, n-nonyl, n-decyl, n-undecyl, n-dodecyl, etc.

環狀烴基,可為脂環式烴基亦可、芳香族烴基亦可。 脂環式烴基,可為單環式或多環式之任一者皆可,單環式之脂環式烴基,可列舉如:環丙基、環丁基、環戊基、環己基、甲基環己基、二甲基環己基、環庚基、環辛基、環庚基、環癸基等的環烷基等。多環式之脂環式烴基,可列舉如:十氫萘基、金剛烷基、2-烷基金剛烷-2-基、1-(金剛烷-1-基)鏈烷-1-基、降莰基、甲基降莰基、異莰基等。 芳香族烴基,可列舉如:苯基、萘基、蒽基、p-甲基苯基、p-tert-丁基苯基、p-金剛烷基苯基、甲苯基、二甲苯基、異丙苯基、三甲苯基、聯苯、菲基、2,6-二乙基苯基、2-甲基-6-乙基苯基等。The cyclic hydrocarbon group may be an alicyclic hydrocarbon group or an aromatic hydrocarbon group. The alicyclic hydrocarbon group can be either monocyclic or polycyclic. The monocyclic alicyclic hydrocarbon group may include, for example, cyclopropyl, cyclobutyl, cyclopentyl, cyclohexyl, methyl Cycloalkyl groups such as cyclohexyl, dimethylcyclohexyl, cycloheptyl, cyclooctyl, cycloheptyl, and cyclodecyl. Polycyclic alicyclic hydrocarbon groups, such as decahydronaphthyl, adamantyl, 2-alkyladamantan-2-yl, 1-(adamantan-1-yl)alkan-1-yl, Norbornyl, methylnorbornyl, isobornyl, etc. Aromatic hydrocarbon groups, such as phenyl, naphthyl, anthracenyl, p-methylphenyl, p-tert-butylphenyl, p-adamantylphenyl, tolyl, xylyl, isopropyl Phenyl, mesityl, biphenyl, phenanthryl, 2,6-diethylphenyl, 2-methyl-6-ethylphenyl, etc.

Ra06 ,就對顯影液的溶解性之觀點,以鏈狀烴基為佳,以烷基為較佳,以直鏈狀烷基為更佳。Ra 06 , from the viewpoint of solubility to the developer, a chain hydrocarbon group is preferred, an alkyl group is preferred, and a linear alkyl group is more preferred.

前述式(a1-p1)中,np0 為1~6之整數,又以1~3之整數為佳,以1或2為較佳,1為更佳。In the aforementioned formula (a1-p1), n p0 is an integer of 1 to 6, preferably an integer of 1 to 3, preferably 1 or 2, and even more preferably 1.

以下為至少具有極性基之烴基之具體例示。 以下式中,*為四級碳原子(Ya0 )鍵結之鍵結鍵。The following are specific examples of the hydrocarbon group having at least a polar group. In the following formula, * is the bonding bond of the quaternary carbon atom (Ya 0 ) bonding.

Figure 02_image017
Figure 02_image017

前述式(a1-r2-r1)中,Ra031 、Ra032 及Ra033 中,至少具有極性基之烴基的個數,雖為1個以上,但可考量阻劑圖型形成之際,對顯影液的溶解性等,作適當之決定,例如:以Ra031 、Ra032 及Ra033 中之1個或2個為佳,特佳為1個。In the aforementioned formula (a1-r2-r1), in Ra 031 , Ra 032 and Ra 033 , the number of hydrocarbon groups having at least a polar group is one or more, but it can be considered when the resist pattern is formed. The solubility of the liquid is determined appropriately, for example, one or two of Ra 031 , Ra 032, and Ra 033 is preferred, and one is particularly preferred.

前述至少具有極性基之烴基,可具有極性基以外的取代基。該取代基例如:鹵素原子(氟原子、氯原子、溴原子等)、碳數1~5之鹵化烷基等。The aforementioned hydrocarbon group having at least a polar group may have a substituent other than the polar group. Examples of the substituent include halogen atoms (fluorine atoms, chlorine atoms, bromine atoms, etc.), halogenated alkyl groups having 1 to 5 carbon atoms, and the like.

式(a1-r2-1)中,Ra’11 (與Ra’10 鍵結的碳原子共同形成的脂肪族環式基),以式(a1-r-1)中之Ra’3 之單環式基或多環式基之脂肪族烴基所列舉之基為佳。In the formula (a1-r2-1), Ra' 11 (an aliphatic cyclic group formed by the carbon atom bonded to Ra' 10 ) is a monocyclic ring of Ra' 3 in the formula (a1-r-1) The groups exemplified for the aliphatic hydrocarbon group of the formula group or the polycyclic group are preferred.

式(a1-r2-2)中,Xa與Ya共同形成環狀之烴基,可列舉如:由前述式(a1-r-1)中之Ra’3 中之環狀的1價之烴基(脂肪族烴基)再去除1個以上的氫原子而得之基等。 Xa與Ya共同形成環狀之烴基,可具有取代基。該取代基,可列舉如:與上述Ra’3 中的環狀之烴基可具有的取代基為相同之內容。 式(a1-r2-2)中,Ra01 ~Ra03 中,碳數1~10的1價之鏈狀飽和烴基,可列舉如:甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、癸基等。 Ra01 ~Ra03 中,碳數3~20的1價之脂肪族環狀飽和烴基,可列舉如:環丙基、環丁基、環戊基、環己基、環庚基、環辛基、環癸基、環十二烷基等的單環式脂肪族飽和烴基;雙環[2.2.2]庚基、三環[5.2.1. 02,6 ]癸基、三環[3.3.1. 13,7 ]癸基、四環[6.2.1. 13,6 . 02,7 ]十二烷基、金剛烷基等的多環式脂肪族飽和烴基等。 Ra01 ~Ra03 中,就容易合成衍生結構單位(a1)的單體化合物之觀點,又以氫原子、碳數1~10的1價之鏈狀飽和烴基為佳,其中,又以氫原子、甲基、乙基為較佳,以氫原子為特佳。In the formula (a1-r2-2), Xa and Ya together form a cyclic hydrocarbon group, such as the cyclic monovalent hydrocarbon group (aliphatic) in Ra' 3 in the aforementioned formula (a1-r-1) Group hydrocarbon group) and the like obtained by removing one or more hydrogen atoms. Xa and Ya together form a cyclic hydrocarbon group, which may have a substituent. Examples of the substituent include the same content as the substituent that the cyclic hydrocarbon group in Ra' 3 may have. In the formula (a1-r2-2), among Ra 01 to Ra 03 , a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms, such as methyl, ethyl, propyl, butyl, pentyl, Hexyl, heptyl, octyl, decyl, etc. Among Ra 01 to Ra 03 , monovalent aliphatic cyclic saturated hydrocarbon groups with 3 to 20 carbon atoms include, for example, cyclopropyl, cyclobutyl, cyclopentyl, cyclohexyl, cycloheptyl, cyclooctyl, Monocyclic aliphatic saturated hydrocarbon groups such as cyclodecyl and cyclododecyl; bicyclo[2.2.2]heptyl, tricyclo[5.2.1. 0 2,6 ]decyl, tricyclo[3.3.1. 1 3,7] decyl group, tetracyclo [6.2.1. 1 3,6 0 2,7] dodecyl group, adamantyl group and the like polycyclic aliphatic saturated hydrocarbon group and the like. Among Ra 01 to Ra 03 , from the viewpoint of easy synthesis of monomeric compounds derived from the structural unit (a1), hydrogen atoms and monovalent chain saturated hydrocarbon groups with 1 to 10 carbon atoms are preferred. Among them, hydrogen atoms are used. , Methyl and ethyl are preferred, and hydrogen atom is particularly preferred.

上述Ra01 ~Ra03 所表示之鏈狀飽和烴基,或脂肪族環狀飽和烴基所具有的取代基,可列舉如:上述Ra05 為相同之基等。The chain saturated hydrocarbon groups represented by Ra 01 to Ra 03 or the substituents of the aliphatic cyclic saturated hydrocarbon groups include, for example, the same groups as the above Ra 05 .

Ra01 ~Ra03 之2個以上相互鍵結而形成環狀結構所生成的含有碳-碳雙鍵之基,可列舉如:環戊烯基、環己烯基、甲基環戊烯基、甲基環己烯基、環亞戊基乙烯基、環亞己基乙烯基等。該些之中,就容易合成衍生結構單位(a1)的單體化合物之觀點,又以環戊烯基、環己烯基、環亞戊基乙烯基為佳。Two or more of Ra 01 to Ra 03 are bonded to each other to form a carbon-carbon double bond-containing group, such as cyclopentenyl, cyclohexenyl, methylcyclopentenyl, Methylcyclohexenyl, cyclopentylene vinyl, cyclohexylene vinyl, etc. Among these, from the viewpoint of easy synthesis of monomer compounds derived from the structural unit (a1), cyclopentenyl, cyclohexenyl, and cyclopentylene vinyl are preferred.

式(a1-r2-3)中,Xaa與Yaa共同形成的脂肪族環式基,以式(a1-r-1)中的Ra’3 之單環式基或多環式基之脂肪族烴基所列舉之基為佳。 式(a1-r2-3)中,Ra04 中之芳香族烴基,可列舉如:由碳數5~30之芳香族烴環去除1個以上的氫原子而得之基等。其中,Ra04 又以由碳數6~15之芳香族烴環去除1個以上的氫原子而得之基為佳,以由苯、萘、蒽或菲去除1個以上氫原子而得之基為較佳,以由苯、萘或蒽去除1個以上的氫原子而得之基為更佳,以由苯或萘去除1個以上的氫原子而得之基為特佳,以由苯去除1個以上的氫原子而得之基為最佳。In formula (a1-r2-3), the aliphatic cyclic group formed by Xaa and Yaa together is a monocyclic group or polycyclic aliphatic hydrocarbon group of Ra' 3 in formula (a1-r-1) The listed base is better. In the formula (a1-r2-3), the aromatic hydrocarbon group in Ra 04 includes, for example, a group obtained by removing one or more hydrogen atoms from an aromatic hydrocarbon ring having 5 to 30 carbon atoms. Among them, Ra 04 is preferably a group obtained by removing more than one hydrogen atom from an aromatic hydrocarbon ring with 6 to 15 carbon atoms, and a group obtained by removing more than one hydrogen atom from benzene, naphthalene, anthracene or phenanthrene Preferably, the group obtained by removing more than one hydrogen atom from benzene, naphthalene or anthracene is more preferable, and the group obtained by removing more than one hydrogen atom from benzene or naphthalene is particularly preferable, and it is removed from benzene. One or more hydrogen atoms is the best group.

式(a1-r2-3)中之Ra04 可具有的取代基,可列舉如:甲基、乙基、丙基、羥基、羧基、鹵素原子(氟原子、氯原子、溴原子等)、烷氧基(甲氧基、乙氧基、丙氧基、丁氧基等)、烷基氧羰基等。The substituents that Ra 04 in the formula (a1-r2-3) may have include, for example, methyl, ethyl, propyl, hydroxyl, carboxyl, halogen atom (fluorine atom, chlorine atom, bromine atom, etc.), alkane Oxy groups (methoxy, ethoxy, propoxy, butoxy, etc.), alkyloxycarbonyl, etc.

式(a1-r2-4)中,Ra’12 及Ra’13 各別獨立為碳數1~10的1價之鏈狀飽和烴基或氫原子。Ra’12 及Ra’13 中,碳數1~10的1價之鏈狀飽和烴基,可列舉如:與上述Ra01 ~Ra03 中,碳數1~10的1價之鏈狀飽和烴基為相同之內容。該鏈狀飽和烴基所具有的氫原子之一部份或全部可被取代。 Ra’12 及Ra’13 中,又以氫原子、碳數1~5之烷基為佳,以碳數1~5之烷基為較佳,以甲基、乙基為更佳,以甲基為特佳。 上述Ra’12 及Ra’13 所表示之鏈狀飽和烴基被取代時,該取代基可列舉如:與上述之Ra05 為相同之基等。In the formula (a1-r2-4), Ra' 12 and Ra' 13 are each independently a monovalent chain saturated hydrocarbon group having 1 to 10 carbon atoms or a hydrogen atom. In Ra' 12 and Ra' 13 , the monovalent chain saturated hydrocarbon group having 1 to 10 carbons, for example, the monovalent chain saturated hydrocarbon group having 1 to 10 carbons in the above Ra 01 to Ra 03 is The same content. Part or all of the hydrogen atoms of the chain saturated hydrocarbon group may be substituted. Among Ra' 12 and Ra' 13 , a hydrogen atom and an alkyl group with 1 to 5 carbon atoms are preferred, an alkyl group with 1 to 5 carbon atoms is preferred, methyl and ethyl are more preferred, and methyl is preferred. The base is particularly good. When the chain saturated hydrocarbon groups represented by Ra' 12 and Ra' 13 are substituted, examples of the substituent include the same groups as the aforementioned Ra 05 .

式(a1-r2-4)中,Ra’14 為可具有取代基之烴基。Ra’14 中之烴基,可列舉如:直鏈狀或支鏈狀之烷基,或環狀之烴基等。In the formula (a1-r2-4), Ra ' 14 is a substituent group of a hydrocarbon group. Ra '14 in the hydrocarbon group include such as: the straight-chain or branched alkyl, or cyclic hydrocarbon group of.

Ra’14 中之直鏈狀之烷基,以碳數1~5為佳,以1~4為較佳,以1或2為更佳。具體而言,可列舉如:甲基、乙基、n-丙基、n-丁基、n-戊基等。該些之中,又以甲基、乙基或n-丁基為佳,以甲基或乙基為較佳。The straight-chain alkyl group in Ra' 14 preferably has 1 to 5 carbon atoms, preferably 1 to 4, and more preferably 1 or 2. Specifically, examples thereof include methyl, ethyl, n-propyl, n-butyl, n-pentyl, and the like. Among these, methyl, ethyl or n-butyl is preferred, and methyl or ethyl is preferred.

Ra’14 中之支鏈狀之烷基,以碳數3~10為佳,以3~5為較佳。具體而言,可列舉如:異丙基、異丁基、tert-丁基、異戊基、新戊基、1,1-二乙基丙基、2,2-二甲基丁基等,又以異丙基為佳。Ra 'in the alkyl chain of 14 to 10 carbon atoms, preferably 3 ~ to 5 ~ 3 preferred. Specifically, examples include isopropyl, isobutyl, tert-butyl, isopentyl, neopentyl, 1,1-diethylpropyl, 2,2-dimethylbutyl, etc., Isopropyl is preferred.

Ra’14 為環狀之烴基時,該烴基可為脂肪族烴基亦可、芳香族烴基亦可,又,可為多環式基亦可、單環式基亦可。 單環式基之脂肪族烴基,以由單環鏈烷去除1個氫原子而得之基為佳。該單環鏈烷,以碳數3~6者為佳,具體而言,可列舉如:環戊烷、環己烷等。 多環式基之脂肪族烴基,以由多環鏈烷去除1個氫原子而得之基為佳,該多環鏈烷,以碳數7~12者為佳,具體而言,可列舉如:金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。When Ra' 14 is a cyclic hydrocarbon group, the hydrocarbon group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group, and it may be a polycyclic group or a monocyclic group. The aliphatic hydrocarbon group of the monocyclic group is preferably a group obtained by removing one hydrogen atom from a monocyclic alkane. The monocyclic alkane is preferably one having 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane. The aliphatic hydrocarbon group of the polycyclic group is preferably a group obtained by removing one hydrogen atom from a polycyclic alkane. The polycyclic alkane is preferably a carbon number of 7-12. Specifically, examples include : Adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc.

Ra’14 中之芳香族烴基,可列舉如:與Ra04 中之芳香族烴基為相同之內容。其中,Ra’14 又以由碳數6~15之芳香族烴環去除1個以上的氫原子而得之基為佳,以由苯、萘、蒽或菲去除1個以上氫原子而得之基為較佳,由苯、萘或蒽去除1個以上的氫原子而得之基為更佳,由萘或蒽去除1個以上的氫原子而得之基為特佳,由萘去除1個以上的氫原子而得之基為最佳。 Ra’14 可具有的取代基,Ra04 可具有的取代基為相同之內容。Ra '14 in the aromatic hydrocarbon group include such as: and Ra 04 are the same as the aromatic hydrocarbon content. Among them, Ra' 14 is preferably a group obtained by removing more than one hydrogen atom from an aromatic hydrocarbon ring with 6 to 15 carbon atoms, and it is obtained by removing more than one hydrogen atom from benzene, naphthalene, anthracene or phenanthrene The group is preferred, the group obtained by removing more than one hydrogen atom from benzene, naphthalene or anthracene is more preferable, the group obtained by removing more than one hydrogen atom from naphthalene or anthracene is particularly preferable, and one group is removed from naphthalene The group derived from the above hydrogen atom is the best. The substituents that Ra' 14 may have and the substituents that Ra 04 may have are the same.

式(a1-r2-4)中之Ra’14 為萘基時,其與前述式(a1-r2-4)中的三級碳原子鍵結之位置,可為萘基之1位或2位之任一者皆可。 式(a1-r2-4)中之Ra’14 為蒽基時,其與前述式(a1-r2-4)中的三級碳原子鍵結之位置,可為蒽基之1位、2位或9位之任一者皆可。When Ra' 14 in the formula (a1-r2-4) is a naphthyl group, its bonding position to the tertiary carbon atom in the aforementioned formula (a1-r2-4) can be the 1-position or 2-position of the naphthyl group Either one is fine. When Ra' 14 in the formula (a1-r2-4) is an anthracene group, the position where it is bonded to the tertiary carbon atom in the aforementioned formula (a1-r2-4) can be the 1-position or 2-position of the anthracene group Or any of 9 people.

前述式(a1-r2-1)所表示之基的具體例,例如以下所示。Specific examples of the group represented by the aforementioned formula (a1-r2-1) are as follows, for example.

Figure 02_image019
Figure 02_image019

Figure 02_image021
Figure 02_image021

Figure 02_image023
Figure 02_image023

前述式(a1-r2-2)所表示之基的具體例,例如以下所示。Specific examples of the group represented by the aforementioned formula (a1-r2-2) are as follows, for example.

Figure 02_image025
Figure 02_image025

Figure 02_image027
Figure 02_image027

Figure 02_image029
Figure 02_image029

前述式(a1-r2-3)所表示之基的具體例,例如以下所示。Specific examples of the group represented by the aforementioned formula (a1-r2-3) are as follows, for example.

Figure 02_image031
Figure 02_image031

前述式(a1-r2-4)所表示之基的具體例,例如以下所示。Specific examples of the group represented by the aforementioned formula (a1-r2-4) are as follows, for example.

Figure 02_image033
Figure 02_image033

三級烷基氧羰基酸解離性基: 前述保護極性基中的羥基之酸解離性基,可列舉如:下述通式(a1-r-3)所表示之酸解離性基(以下,於簡便上,亦稱為「三級烷基氧羰基酸解離性基」)等。Tertiary alkyloxycarbonyl acid dissociable group: The acid dissociable group for protecting the hydroxyl group in the polar group includes, for example, the acid dissociable group represented by the following general formula (a1-r-3) (hereinafter, for simplicity, also referred to as "tertiary alkyl Oxycarbonyl acid dissociable group") etc.

Figure 02_image035
[式中,Ra’7 ~Ra’9 各別為烷基]。
Figure 02_image035
[In the formula, Ra' 7 to Ra' 9 are each an alkyl group].

式(a1-r-3)中,Ra’7 ~Ra’9 ,以各別為碳數1~5之烷基為佳,以碳數1~3之烷基為較佳。 又,各烷基的合計碳數,以3~7為佳,又以碳數3~5為較佳,以碳數3~4為最佳。In the formula (a1-r-3), Ra' 7 to Ra' 9 are each preferably an alkyl group having 1 to 5 carbon atoms, and preferably an alkyl group having 1 to 3 carbon atoms. In addition, the total carbon number of each alkyl group is preferably 3-7, more preferably 3-5 carbons, and most preferably 3-4 carbons.

結構單位(a1),可列舉如:由α位的碳原子鍵結之氫原子可被取代基所取代的丙烯酸酯所衍生的結構單位、由丙烯醯胺所衍生的結構單位、由羥基苯乙烯或羥基苯乙烯衍生物所衍生的結構單位的羥基中之氫原子的至少一部份被含有前述酸分解性基的取代基所保護的結構單位、由乙烯安息香酸或乙烯安息香酸衍生物所衍生的結構單位的-C(=O)-OH中之氫原子的至少一部份被含有前述酸分解性基的取代基所保護的結構單位等。The structural unit (a1) includes, for example, a structural unit derived from an acrylate whose hydrogen atom bonded to a carbon atom at the α position can be substituted by a substituent, a structural unit derived from acrylamide, and a hydroxystyrene Or a structural unit in which at least part of the hydrogen atom in the hydroxyl group of the structural unit derived from a hydroxystyrene derivative is protected by a substituent containing the aforementioned acid-decomposable group, derived from vinyl benzoic acid or a vinyl benzoic acid derivative The structural unit of -C(=O)-OH has at least a part of the hydrogen atom protected by the substituent containing the aforementioned acid-decomposable group, etc.

結構單位(a1),於上述之中,又以由α位的碳原子鍵結之氫原子可被取代基所取代的丙烯酸酯所衍生的結構單位為佳。 該結構單位(a1)的較佳具體例,可列舉如:下述通式(a1-1)或(a1-2)所表示的結構單位等。The structural unit (a1), among the above, is preferably a structural unit derived from an acrylate in which a hydrogen atom bonded to a carbon atom at the α position can be substituted by a substituent. Preferable specific examples of the structural unit (a1) include structural units represented by the following general formula (a1-1) or (a1-2).

Figure 02_image037
[式中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基;Va1 為可具有醚鍵結的2價之烴基;na1 為0~2之整數;Ra1 為上述通式(a1-r-1)或(a1-r-2)所表示之酸解離性基。Wa1 為na2 +1價之烴基,na2 為1~3之整數,Ra2 為上述通式(a1-r-1)或(a1-r-3)所表示之酸解離性基]。
Figure 02_image037
[In the formula, R is a hydrogen atom, an alkyl group with 1 to 5 carbons or a halogenated alkyl group with 1 to 5 carbons; Va 1 is a divalent hydrocarbon group which may have ether linkages; n a1 is an integer of 0 to 2 ; Ra 1 is an acid dissociable group represented by the general formula (a1-r-1) or (a1-r-2). 1 is a WA n a2 +1 valence of hydrocarbon, n a2 is an integer of 1 to 3, Ra 2 is represented by the above general formula the acid dissociable group (a1-r-1) or (a1-r-3)] .

前述式(a1-1)中,R之碳數1~5之烷基,以碳數1~5的直鏈狀或支鏈狀之烷基為佳,具體而言,可列舉如:甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基等。碳數1~5之鹵化烷基,為前述碳數1~5之烷基的氫原子之一部份或全部被鹵素原子取代而得之基。該鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。 R以氫原子、碳數1~5之烷基或碳數1~5之氟化烷基為佳,就工業上取得之容易度,以氫原子或甲基為最佳。In the aforementioned formula (a1-1), the alkyl group having 1 to 5 carbon atoms in R is preferably a linear or branched alkyl group having 1 to 5 carbon atoms. Specifically, examples include: methyl , Ethyl, propyl, isopropyl, n-butyl, isobutyl, tert-butyl, pentyl, isopentyl, neopentyl, etc. The halogenated alkyl group having 1 to 5 carbon atoms is a group obtained by substituting a part or all of the hydrogen atoms of the aforementioned alkyl group having 1 to 5 carbon atoms by halogen atoms. Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom, and a fluorine atom is particularly preferred. R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms. For ease of industrial acquisition, a hydrogen atom or a methyl group is most preferred.

前述式(a1-1)中,Va1 中的2價之烴基,可為脂肪族烴基亦可、芳香族烴基亦可。In the aforementioned formula (a1-1), the divalent hydrocarbon group in Va 1 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.

Va1 中作為2價之烴基之脂肪族烴基,可為飽和者亦可、不飽和者亦可,通常以飽和者為佳。 該脂肪族烴基,更具體而言,可列舉如:直鏈狀或支鏈狀脂肪族烴基,或結構中含有環之脂肪族烴基等。The aliphatic hydrocarbon group that is the divalent hydrocarbon group in Va 1 may be saturated or unsaturated, and saturated is generally preferred. More specifically, the aliphatic hydrocarbon group includes a linear or branched aliphatic hydrocarbon group, or an aliphatic hydrocarbon group containing a ring in the structure.

前述直鏈狀脂肪族烴基,以碳數為1~10為佳,以碳數1~6為較佳,以碳數1~4為更佳,以碳數1~3為最佳。 直鏈狀脂肪族烴基,以直鏈狀之伸烷基為佳,具體而言,可列舉如:伸甲基[-CH2 -]、伸乙基[-(CH2 )2 -]、伸三甲基[-(CH2 )3 -]、伸四甲基[-(CH2 )4 -]、伸五甲基[-(CH2 )5 -]等。 前述支鏈狀脂肪族烴基,以碳數2~10為佳,以碳數3~6為較佳,以碳數3或4為更佳,以碳數3為最佳。 支鏈狀脂肪族烴基,以支鏈狀之伸烷基為佳,具體而言,可列舉如:-CH(CH3 )-、-CH(CH2 CH3 )-、-C(CH3 )2 -、 -C(CH3 )(CH2 CH3 )-、-C(CH3 )(CH2 CH2 CH3 )-、-C(CH2 CH3 )2 -等之烷基伸甲基;-CH(CH3 )CH2 -、-CH(CH3 )CH(CH3 )-、 -C(CH3 )2 CH2 -、-CH(CH2 CH3 )CH2 -、-C(CH2 CH3 )2 -CH2 -等之烷基伸乙基;-CH(CH3 )CH2 CH2 -、-CH2 CH(CH3 )CH2 -等之烷基伸三甲基;-CH(CH3 )CH2 CH2 CH2 -、 -CH2 CH(CH3 )CH2 CH2 -等之烷基伸四甲基等之烷基伸烷基等。烷基伸烷基中之烷基,以碳數1~5之直鏈狀之烷基為佳。The aforementioned linear aliphatic hydrocarbon group preferably has 1 to 10 carbon atoms, preferably 1 to 6 carbon atoms, more preferably 1 to 4 carbon atoms, and most preferably 1 to 3 carbon atoms. The straight-chain aliphatic hydrocarbon group is preferably a straight-chain alkylene group. Specifically, examples include: methylidene [-CH 2 -], ethylidene [-(CH 2 ) 2 -], Methyl [-(CH 2 ) 3 -], tetramethylene [-(CH 2 ) 4 -], pentamethyl [-(CH 2 ) 5 -], etc. The aforementioned branched aliphatic hydrocarbon group preferably has 2 to 10 carbons, preferably 3 to 6 carbons, more preferably 3 or 4 carbons, and most preferably 3 carbons. The branched aliphatic hydrocarbon group is preferably a branched alkylene group, specifically, for example: -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 -and other alkylene groups; -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 CH 3 ) 2 -CH 2 -and other alkyl ethylene groups; -CH(CH 3 )CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 -and other alkyl ethylene groups; -CH( CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -and other alkylene groups such as tetramethyl group and the like. The alkyl group in the alkylene group is preferably a straight-chain alkyl group with 1 to 5 carbon atoms.

前述結構中含有環之脂肪族烴基,可列舉如:脂環式烴基(由脂肪族烴環去除2個氫原子而得之基)、脂環式烴基鍵結於直鏈狀或支鏈狀脂肪族烴基的末端而得之基、脂環式烴基介於直鏈狀或支鏈狀脂肪族烴基中間而得之基等。前述直鏈狀或支鏈狀脂肪族烴基,例如:與前述直鏈狀脂肪族烴基或前述支鏈狀脂肪族烴基為相同之內容。 前述脂環式烴基,以碳數3~20為佳,以碳數3~12為較佳。 前述脂環式烴基,可為多環式亦可、單環式亦可。單環式之脂環式烴基,以由單環鏈烷去除2個氫原子而得之基為佳。該單環鏈烷以碳數3~6者為佳,具體而言,可列舉如:環戊烷、環己烷等。多環式之脂環式烴基,以由多環鏈烷去除2個氫原子而得之基為佳,該多環鏈烷以碳數7~12者為佳,具體而言,可列舉如:金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。The aliphatic hydrocarbon group containing a ring in the aforementioned structure includes, for example, an alicyclic hydrocarbon group (a group obtained by removing two hydrogen atoms from an aliphatic hydrocarbon ring), an alicyclic hydrocarbon group bonded to a linear or branched aliphatic A group derived from the terminal of a group hydrocarbon group, a group derived from an alicyclic hydrocarbon group between a linear or branched aliphatic hydrocarbon group, etc. The aforementioned straight-chain or branched aliphatic hydrocarbon group is, for example, the same as the aforementioned straight-chain aliphatic hydrocarbon group or the aforementioned branched aliphatic hydrocarbon group. The aforementioned alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, and more preferably 3 to 12 carbon atoms. The aforementioned alicyclic hydrocarbon group may be polycyclic or monocyclic. The monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a monocyclic alkane. The monocyclic alkane preferably has a carbon number of 3 to 6, and specific examples include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a polycyclic alkane. The polycyclic alkane preferably has 7 to 12 carbon atoms. Specifically, examples include: Adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc.

Va1 中作為2價之烴基的芳香族烴基,為具有芳香環之烴基。 該芳香族烴基,以碳數3~30為佳,以5~30為較佳,以5~20為更佳,以6~15為特佳,以6~12為最佳。但,該碳數為不包含取代基中之碳數者。 芳香族烴基所具有的芳香環,具體而言,可列舉如:苯、聯苯、茀、萘、蒽、菲等之芳香族烴環;構成前述芳香族烴環的碳原子中之一部份被雜原子取代而得之芳香族雜環等。芳香族雜環中之雜原子,可列舉如:氧原子、硫原子、氮原子等。 該芳香族烴基,具體而言,可列舉如:由前述芳香族烴環去除2個氫原子而得之基(伸芳基);由前述芳香族烴環去除1個氫原子而得之基(芳基)的氫原子中之1個被伸烷基取代而得之基(例如:由苄基、苯乙基、1-萘基甲基、2-萘基甲基、1-萘基乙基、2-萘基乙基等之芳烷基中的芳基再去除1個氫原子而得之基)等。前述伸烷基(芳烷基中之烷鏈)之碳數,以1~4為佳,以1~2為較佳,以1為特佳。The aromatic hydrocarbon group which is a divalent hydrocarbon group in Va 1 is a hydrocarbon group having an aromatic ring. The aromatic hydrocarbon group preferably has a carbon number of 3-30, preferably 5-30, more preferably 5-20, particularly preferably 6-15, and most preferably 6-12. However, the carbon number is one that does not include the carbon number in the substituent. Specifically, the aromatic ring possessed by the aromatic hydrocarbon group includes: aromatic hydrocarbon rings such as benzene, biphenyl, pyrene, naphthalene, anthracene, phenanthrene, etc.; part of the carbon atoms constituting the aforementioned aromatic hydrocarbon ring Aromatic heterocycles etc. which are substituted by heteroatoms. Examples of heteroatoms in the aromatic heterocycle include oxygen atoms, sulfur atoms, and nitrogen atoms. Specifically, the aromatic hydrocarbon group includes: a group obtained by removing two hydrogen atoms from the aforementioned aromatic hydrocarbon ring (arylene group); a group obtained by removing one hydrogen atom from the aforementioned aromatic hydrocarbon ring ( A group derived from the substitution of one of the hydrogen atoms of an aryl group by an alkylene group (e.g., benzyl, phenethyl, 1-naphthylmethyl, 2-naphthylmethyl, 1-naphthylethyl , 2-naphthylethyl, etc., the aryl group in the aralkyl group is obtained by removing one hydrogen atom), etc. The carbon number of the aforementioned alkylene (alkane chain in the aralkyl group) is preferably 1 to 4, preferably 1 to 2, and particularly preferably 1.

前述式(a1-1)中,Ra1 為上述式(a1-r-1)或(a1-r-2)所表示之酸解離性基。In the aforementioned formula (a1-1), Ra 1 is an acid dissociable group represented by the aforementioned formula (a1-r-1) or (a1-r-2).

前述式(a1-2)中,Wa1 中之na2 +1價之烴基,可為脂肪族烴基亦可、芳香族烴基亦可。該脂肪族烴基,為不具有芳香族性的烴基之意,其可為飽和亦可、不飽和亦可,通常以飽和為佳。前述脂肪族烴基,可列舉如:直鏈狀或支鏈狀脂肪族烴基、結構中含有環之脂肪族烴基,或直鏈狀或支鏈狀脂肪族烴基與結構中含有環之脂肪族烴基組合而得之基等。 前述na2 +1價,以2~4價為佳,以2或3價為較佳。In the formula (a1-2), Wa in the n a2 +1 monovalent hydrocarbon group of 1, may be an aromatic hydrocarbon group may also be an aliphatic hydrocarbon group. The aliphatic hydrocarbon group means a hydrocarbon group that does not have aromaticity, and it may be saturated or unsaturated, and saturated is generally preferred. The aforementioned aliphatic hydrocarbon groups include, for example, linear or branched aliphatic hydrocarbon groups, aliphatic hydrocarbon groups containing rings in the structure, or a combination of linear or branched aliphatic hydrocarbon groups and aliphatic hydrocarbon groups containing rings in the structure And get the base and so on. The aforementioned n a2 + 1 valence is preferably 2 to 4 valences, and 2 or 3 valences are more preferred.

前述式(a1-2)中,Ra2 為上述通式(a1-r-1)或(a1-r-3)所表示之酸解離性基。In the aforementioned formula (a1-2), Ra 2 is an acid dissociable group represented by the aforementioned general formula (a1-r-1) or (a1-r-3).

以下為前述式(a1-1)所表示的結構單位之具體例示。以下各式中,Rα 表示氫原子、甲基或三氟甲基。The following are specific examples of the structural unit represented by the aforementioned formula (a1-1). In the following formulae, R α represents a hydrogen atom, a methyl group or a trifluoromethyl group.

Figure 02_image039
Figure 02_image039

Figure 02_image041
Figure 02_image041

Figure 02_image043
Figure 02_image043

Figure 02_image045
Figure 02_image045

Figure 02_image047
Figure 02_image047

Figure 02_image049
Figure 02_image049

Figure 02_image051
Figure 02_image051

Figure 02_image053
Figure 02_image053

Figure 02_image055
Figure 02_image055

Figure 02_image057
Figure 02_image057

Figure 02_image059
Figure 02_image059

以下為前述式(a1-2)所表示的結構單位之具體例示。The following are specific examples of the structural unit represented by the aforementioned formula (a1-2).

Figure 02_image061
Figure 02_image061

(A1)成份具有的結構單位(a1),可為1種亦可、2種以上亦可。 結構單位(a1),以前述式(a1-1)所表示的結構單位為較佳。 該些之中,結構單位(a1)又以含有下述通式(a1-1-1)所表示的結構單位者為特佳。(A1) The structural unit (a1) possessed by the component may be one type or two or more types. The structural unit (a1) is preferably the structural unit represented by the aforementioned formula (a1-1). Among these, the structural unit (a1) is particularly preferable to contain a structural unit represented by the following general formula (a1-1-1).

Figure 02_image063
[式中,Ra1 ”為通式(a1-r2-1)所表示之酸解離性基]。
Figure 02_image063
[In the formula, Ra 1 "is an acid dissociable group represented by the general formula (a1-r2-1)].

前述式(a1-1-1)中,R、Va1 及na1 ,與前述式(a1-1)中之R、Va1 及na1 為相同之內容。 通式(a1-r2-1)所表示之酸解離性基之說明,係如上述內容。In the formula (a1-1-1), R, Va 1 and n a1, as in the above formula (a1-1) R, Va 1 and n a1 is the same as the contents. The description of the acid dissociable group represented by the general formula (a1-r2-1) is as described above.

(A1)成份中的結構單位(a1)之比例,相對於構成(A1)成份的全結構單位之合計(100莫耳%),以5~80莫耳%為佳,以10~75莫耳%為較佳,以20~60莫耳%為更佳。 結構單位(a1)的比例,於前述較佳範圍的下限值以上時,可提高感度、解析性、改善粗糙度等的微影蝕刻特性。另一方面,於前述較佳範圍的上限值以下時,可容易取得與其他結構單位之平衡,而可使各種微影蝕刻特性更良好。(A1) The ratio of the structural unit (a1) in the component, relative to the total (100 mol%) of the total structural units constituting the component (A1), is preferably 5 to 80 mol%, and 10 to 75 mol% % Is better, more preferably 20-60 mol%. When the ratio of the structural unit (a1) is more than the lower limit of the aforementioned preferable range, the sensitivity, resolution, and roughness of lithographic etching characteristics can be improved. On the other hand, when it is below the upper limit of the aforementioned preferred range, it is easy to achieve a balance with other structural units, and various lithographic etching characteristics can be made better.

≪結構單位(a2)≫ (A1)成份,除結構單位(a1)以外,以再具有含有:含內酯之環式基、含-SO2 -之環式基或含碳酸酯之環式基的結構單位(a2)(其中,相當於結構單位(a1)者除外)者為佳。 結構單位(a2)的含內酯之環式基、含-SO2 -之環式基或含碳酸酯之環式基,於(A1)成份使用於形成阻劑膜時,對於提高阻劑膜對基板之密著性上為有效者。又,具有結構單位(a2)時,因具有可適當地調整酸之擴散長度、提高阻劑膜對基板之密著性、適度地調整顯影時的溶解性、提高耐蝕刻性等的效果,而可使微影蝕刻特性等更為良好。≪Structural unit (a2)≫ (A1), in addition to the structural unit (a1), it may contain: lactone-containing cyclic group, -SO 2 --containing cyclic group or carbonate-containing cyclic group The structural unit (a2) (except those equivalent to the structural unit (a1)) is preferred. The structural unit (a2) contains lactone-containing cyclic group, -SO 2 --containing cyclic group or carbonate-containing cyclic group, when component (A1) is used to form a resist film, it is useful for improving the resist film Effective for the adhesion of the substrate. In addition, when it has the structural unit (a2), it has the effects of appropriately adjusting the diffusion length of the acid, improving the adhesion of the resist film to the substrate, appropriately adjusting the solubility during development, and improving the etching resistance. It can make the lithographic etching characteristics more favorable.

「含內酯之環式基」係指,其環骨架中含有含-O-C(=O)-之環(內酯環)的環式基之意。以內酯環作為1個環之方式計數,僅為內酯環時稱為單環式基,尚具有其他環結構時,無論其結構為何,皆稱為多環式基。含內酯之環式基,可為單環式基亦可、多環式基亦可。 結構單位(a2)中的含內酯之環式基,並未有特別限定,而可使用任意之成份。具體而言,例如:下述通式(a2-r-1)~(a2-r-7)所各別表示之基等。"Lactone-containing cyclic group" means a cyclic group containing a ring (lactone ring) containing -O-C(=O)- in its ring skeleton. The lactone ring is counted as one ring. When it is only the lactone ring, it is called a monocyclic group. When there are other ring structures, no matter its structure, it is called a polycyclic group. The lactone-containing cyclic group may be a monocyclic group or a polycyclic group. The lactone-containing cyclic group in the structural unit (a2) is not particularly limited, and any components can be used. Specifically, for example, groups represented by the following general formulas (a2-r-1) to (a2-r-7), and the like.

Figure 02_image065
[式中,Ra’21 各別獨立為氫原子、烷基、烷氧基、鹵素原子、鹵化烷基、羥基、-COOR”、-OC(=O)R”、羥烷基或氰基;R”為氫原子、烷基、含內酯之環式基、含碳酸酯之環式基,或含-SO2 -之環式基;A”為可含有氧原子(-O-)或硫原子(-S-)的碳數1~5之伸烷基、氧原子或硫原子,n’為0~2之整數,m’為0或1]。
Figure 02_image065
[In the formula, Ra' 21 are each independently a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, -COOR", -OC(=O)R", a hydroxyalkyl group or a cyano group; R" is a hydrogen atom, an alkyl group, a lactone-containing cyclic group, a carbonate-containing cyclic group, or a -SO 2 --containing cyclic group; A" is an oxygen atom (-O-) or sulfur The atom (-S-) has an alkylene group with 1 to 5 carbon atoms, an oxygen atom or a sulfur atom, n'is an integer of 0 to 2, and m'is 0 or 1].

前述通式(a2-r-1)~(a2-r-7)中,Ra’21 中之烷基,以碳數1~6之烷基為佳。該烷基,以直鏈狀或支鏈狀為佳。具體而言,可列舉如:甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基、己基等。該些之中,又以甲基或乙基為佳,以甲基為特佳。 Ra’21 中之烷氧基,以碳數1~6之烷氧基為佳。該烷氧基,以直鏈狀或支鏈狀為佳。具體而言,例如:前述Ra’21 中,被列舉作為烷基之烷基,與氧原子(-O-)連結而得之基等。 Ra’21 中之鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 Ra’21 中之鹵化烷基,可列舉如:前述Ra’21 中的烷基之氫原子的一部份或全部被前述鹵素原子取代而得之基等。該鹵化烷基,以氟化烷基為佳,特別是以全氟烷基為佳。In the aforementioned general formulas (a2-r-1) to (a2-r-7), the alkyl group in Ra' 21 is preferably an alkyl group with 1 to 6 carbon atoms. The alkyl group is preferably linear or branched. Specifically, examples thereof include methyl, ethyl, propyl, isopropyl, n-butyl, isobutyl, tert-butyl, pentyl, isopentyl, neopentyl, and hexyl. Among these, methyl or ethyl is preferred, and methyl is particularly preferred. The alkoxy group in Ra' 21 is preferably an alkoxy group with 1 to 6 carbon atoms. The alkoxy group is preferably linear or branched. Specifically, for example, in the aforementioned Ra' 21 , an alkyl group as an alkyl group, a group formed by linking an oxygen atom (-O-), and the like are exemplified. The halogen atom in Ra' 21 can be exemplified by fluorine atom, chlorine atom, bromine atom, iodine atom, etc., and fluorine atom is preferred. Ra '21 In the halogenated alkyl group include such as: the Ra' a part of the hydrogen atoms in the alkyl group of 21 or all of the preceding groups substituted by a halogen atom and the like. The halogenated alkyl group is preferably a fluorinated alkyl group, particularly a perfluoroalkyl group.

Ra’21 中的-COOR”、-OC(=O)R”中,任一個R”皆為氫原子、烷基、含內酯之環式基、含碳酸酯之環式基,或含-SO2 -之環式基。 R”中之烷基可為直鏈狀、支鏈狀、環狀之任一者,其以碳數為1~15為佳。 R”為直鏈狀或支鏈狀之烷基時,以碳數1~10為佳,以碳數1~5為更佳,以甲基或乙基為特佳。 R”為環狀之烷基時,以碳數3~15為佳,以碳數4~12為更佳,以碳數5~10為最佳。具體而言,可列舉如:由可被氟原子或氟化烷基所取代,或未被取代的單環鏈烷去除1個以上的氫原子而得之基;由雙環鏈烷、三環鏈烷、四環鏈烷等多環鏈烷去除1個以上的氫原子而得之基等。更具體而言,可列舉如:由環戊烷、環己烷等的單環鏈烷去除1個以上的氫原子而得之基;由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等多環鏈烷去除1個以上的氫原子而得之基等。 R”中的含內酯之環式基,前述通式(a2-r-1)~(a2-r-7)所各別表示之基為相同之內容。 R”中的含碳酸酯之環式基,與後述含碳酸酯之環式基為相同內容,具體而言,可列舉如:(ax3-r-1)~(ax3-r-3)所各別表示之基等。 R”中之含-SO2 -之環式基,與後述之含-SO2 -之環式基為相同內容,具體而言,可列舉如:通式(a5-r-1)~(a5-r-4)所各別表示之基等。 Ra’21 中之羥烷基,以碳數1~6者為佳,具體而言,例如:前述Ra’21 中的烷基之至少一個氫原子被羥基取代而得之基等。In Ra' 21 -COOR" and -OC(=O)R", any R" is a hydrogen atom, an alkyl group, a lactone-containing cyclic group, a carbonate-containing cyclic group, or a- The cyclic group of SO 2 -. The alkyl group in R" may be linear, branched, or cyclic, and the carbon number is preferably 1-15. When R" is a linear or branched alkyl group, it preferably has 1 to 10 carbon atoms, more preferably 1 to 5 carbon atoms, and particularly preferably methyl or ethyl. R" is cyclic In the case of an alkyl group, the carbon number is preferably 3-15, more preferably 4-12, and most preferably 5-10. Specifically, examples include: groups obtained by removing one or more hydrogen atoms from a monocyclic alkane that may be substituted by a fluorine atom or a fluorinated alkyl group, or unsubstituted; from a bicyclic alkane, a tricyclic chain Polycyclic alkanes such as alkanes and tetracyclic alkanes are groups obtained by removing one or more hydrogen atoms. More specifically, examples include: radicals obtained by removing one or more hydrogen atoms from monocyclic alkanes such as cyclopentane and cyclohexane; radicals obtained from adamantane, norbornane, isobornane, and tricyclodecane Polycyclic alkanes such as alkanes and tetracyclododecane are groups obtained by removing one or more hydrogen atoms. The lactone-containing cyclic group in R" has the same content as the groups represented by the aforementioned general formulas (a2-r-1) to (a2-r-7). The carbonate-containing ring in R" The formula group has the same content as the carbonate-containing cyclic group described below, and specifically, the groups represented by (ax3-r-1) to (ax3-r-3) and the like can be mentioned. The cyclic group containing -SO 2 -in R" has the same content as the cyclic group containing -SO 2 -described later. Specifically, examples include: general formulas (a5-r-1) to (a5) -R-4) The groups respectively represented by the groups, etc. The hydroxyalkyl group in Ra' 21 preferably has 1 to 6 carbon atoms, specifically, for example: at least one hydrogen in the alkyl group in Ra' 21 Atoms are substituted by hydroxyl groups, etc.

前述通式(a2-r-2)、(a2-r-3)、(a2-r-5)中,A”中之碳數1~5之伸烷基,以直鏈狀或支鏈狀之伸烷基為佳,可列舉如:伸甲基、伸乙基、n-伸丙基、伸異丙基等。該伸烷基含有氧原子或硫原子時,其具體例如:於前述伸烷基末端或碳原子間介有-O-或-S-而得之基等,可列舉如:-O-CH2 -、-CH2 -O-CH2 -、-S-CH2 -、-CH2 -S-CH2 -等。A”以碳數1~5之伸烷基或-O-為佳,以碳數1~5之伸烷基為較佳,以伸甲基為最佳。In the aforementioned general formulas (a2-r-2), (a2-r-3), (a2-r-5), the alkylene group having 1 to 5 carbon atoms in A" is linear or branched The alkylene group is preferably, such as: methylene, ethylidene, n-propylene group, isopropylidene, etc. When the alkylene group contains an oxygen atom or a sulfur atom, specific examples are as follows: Groups derived from -O- or -S- interposed between the end of the alkyl group or the carbon atoms, etc., for example: -O-CH 2 -, -CH 2 -O-CH 2 -, -S-CH 2 -, -CH 2 -S-CH 2 -etc. A" is preferably an alkylene having 1 to 5 carbon atoms or -O-, preferably an alkylene having 1 to 5 carbon atoms, and most preferably a methylene group good.

以下為列舉通式(a2-r-1)~(a2-r-7)所各別表示之基的具體例。The following are specific examples of groups represented by the general formulas (a2-r-1) to (a2-r-7).

Figure 02_image067
Figure 02_image067

Figure 02_image069
Figure 02_image069

「含-SO2 -之環式基」係指,其環骨架中含有含-SO2 -之環的環式基之意,具體而言,為-SO2 -中的硫原子(S)形成為環式基的環骨架之一部份的環式基。以其環骨架中含有含-SO2 -之環作為1個環之方式計數,僅為該環時稱為單環式基,尚具有其他環結構時,無論其結構為何,皆稱為多環式基。含-SO2 -之環式基,可為單環式基亦可、多環式基亦可。 含-SO2 -之環式基,特別是其環骨架中含有含-O-SO2 -之環式基,即-O-SO2 -中的-O-S-形成為環骨架的一部份之磺內酯(sultone)環的環式基為佳。 含-SO2 -之環式基,更具體而言,可列舉如:下述通式(a5-r-1)~(a5-r-4)所各別表示之基等。"Containing -SO 2 - the cyclic group" means, contained in the cyclic skeleton containing -SO 2 - meaning of cyclic ring group, specifically, -SO 2 - sulfur atom (S) is formed A cyclic group that is a part of the cyclic skeleton of a cyclic group. It is counted in the way that the ring containing -SO 2 -in its ring skeleton is regarded as a ring. When only this ring is called a monocyclic group, when there are other ring structures, no matter what the structure is, it is called a polycyclic ring.式基。 Formula base. The cyclic group containing -SO 2 -may be a monocyclic group or a polycyclic group. The cyclic group containing -SO 2 -, especially the cyclic group containing -O-SO 2 -in the ring skeleton, that is, the -OS- in -O-SO 2 -forms part of the ring skeleton The cyclic group of the sultone ring is preferred. More specifically, the -SO 2 --containing cyclic group includes groups represented by the following general formulas (a5-r-1) to (a5-r-4).

Figure 02_image071
[式中,Ra’51 各別獨立為氫原子、烷基、烷氧基、鹵素原子、鹵化烷基、羥基、-COOR”、-OC(=O)R”、羥烷基或氰基;R”為氫原子、烷基、含內酯之環式基、含碳酸酯之環式基,或含-SO2 -之環式基;A”為可含有氧原子或硫原子的碳數1~5之伸烷基、氧原子或硫原子,n’為0~2之整數]
Figure 02_image071
[In the formula, Ra' 51 are each independently a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, -COOR", -OC(=O)R", a hydroxyalkyl group or a cyano group; R "is a hydrogen atom, an alkyl group, the lactone-containing cyclic group, the cyclic group containing carbonate, or an -SO 2 - group of cyclic; a" carbon atoms which may contain an oxygen atom or a sulfur atom ~5 alkylene, oxygen atom or sulfur atom, n'is an integer of 0-2]

前述通式(a5-r-1)~(a5-r-2)中,A”與前述通式(a2-r-2)、(a2-r-3)、(a2-r-5)中之A”為相同之內容。 Ra’51 中之烷基、烷氧基、鹵素原子、鹵化烷基、   -COOR”、-OC(=O)R”、羥烷基,分別與前述通式(a2-r-1)~(a2-r-7)中之Ra’21 的說明中所列舉者為相同之內容。 以下為列舉通式(a5-r-1)~(a5-r-4)所各別表示之基的具體例。式中之「Ac」,為表示乙醯基。In the aforementioned general formulas (a5-r-1) to (a5-r-2), A" and the aforementioned general formulas (a2-r-2), (a2-r-3), (a2-r-5) The "A" is the same content. Ra '51 in the alkyl group, alkoxy group, halogen atom, halogenated alkyl group, -COOR ", - OC (= O) R", a hydroxyl group, respectively, with the general formula (a2-r-1) ~ ( The contents listed in the description of Ra' 21 in a2-r-7) are the same. The following are specific examples of groups represented by the general formulas (a5-r-1) to (a5-r-4). The "Ac" in the formula means acetyl group.

Figure 02_image073
Figure 02_image073

Figure 02_image075
Figure 02_image075

Figure 02_image077
Figure 02_image077

「含碳酸酯之環式基」係指,其環骨架中含有含-O-C(=O)-O-之環(碳酸酯環)的環式基之意。以碳酸酯環作為1個環之方式計數,僅為碳酸酯環時稱為單環式基,尚具有其他環結構時,無論其結構為何,皆稱為多環式基。含碳酸酯之環式基,可為單環式基亦可、多環式基亦可。 含碳酸酯環之環式基,並未有特別限定,而可使用任意之成份。具體而言,可列舉如:下述通式(ax3-r-1)~(ax3-r-3)所各別表示之基等。"Carbonate-containing cyclic group" means a cyclic group containing a -O-C(=O)-O- ring (carbonate ring) in its ring skeleton. The carbonate ring is counted as one ring. When it is only a carbonate ring, it is called a monocyclic group. When there are other ring structures, it is called a polycyclic group regardless of the structure. The carbonate-containing cyclic group may be a monocyclic group or a polycyclic group. The cyclic group containing a carbonate ring is not particularly limited, and any component can be used. Specifically, for example, groups represented by the following general formulas (ax3-r-1) to (ax3-r-3) and the like can be cited.

Figure 02_image079
[式中,Ra’x31 各別獨立為氫原子、烷基、烷氧基、鹵素原子、鹵化烷基、羥基、-COOR”、-OC(=O)R”、羥烷基或氰基;R”為氫原子、烷基、含內酯之環式基、含碳酸酯之環式基,或含-SO2 -之環式基;A”為可含有氧原子或硫原子的碳數1~5之伸烷基、氧原子或硫原子,p’為0~3之整數,q’為0或1]。
Figure 02_image079
[In the formula, Ra' x31 are each independently a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, -COOR", -OC(=O)R", a hydroxyalkyl group or a cyano group; R "is a hydrogen atom, an alkyl group, the lactone-containing cyclic group, the cyclic group containing carbonate, or an -SO 2 - group of cyclic; a" carbon atoms which may contain an oxygen atom or a sulfur atom ~5 alkylene, oxygen atom or sulfur atom, p'is an integer of 0 to 3, q'is 0 or 1].

前述通式(ax3-r-2)~(ax3-r-3)中,A”與前述通式(a2-r-2)、(a2-r-3)、(a2-r-5)中之A”為相同之內容。 Ra’31 中之烷基、烷氧基、鹵素原子、鹵化烷基、   -COOR”、-OC(=O)R”、羥烷基,分別與前述通式(a2-r-1)~(a2-r-7)中之Ra’21 的說明中所列舉者為相同之內容。 以下為列舉通式(ax3-r-1)~(ax3-r-3)所各別表示之基的具體例。In the aforementioned general formulas (ax3-r-2) to (ax3-r-3), A" and the aforementioned general formulas (a2-r-2), (a2-r-3), (a2-r-5) The "A" is the same content. The alkyl group, alkoxy group, halogen atom, halogenated alkyl group, -COOR", -OC(=O)R", and hydroxyalkyl group in Ra' 31 are respectively the same as the aforementioned general formulas (a2-r-1)~( The contents listed in the description of Ra' 21 in a2-r-7) are the same. The following are specific examples of groups represented by the general formulas (ax3-r-1) to (ax3-r-3).

Figure 02_image081
Figure 02_image081

結構單位(a2)中,又以由α位的碳原子鍵結之氫原子可被取代基所取代的丙烯酸酯所衍生的結構單位為佳。 該結構單位(a2),以下述通式(a2-1)所表示的結構單位為佳。In the structural unit (a2), a structural unit derived from an acrylate in which a hydrogen atom bonded to a carbon atom at the α position can be substituted by a substituent is preferred. This structural unit (a2) is preferably a structural unit represented by the following general formula (a2-1).

Figure 02_image083
[式中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基。Ya21 為單鍵或2價之連結基;La21 為-O-、      -COO-、-CON(R’)-、-OCO-、-CONHCO-或-CONHCS-,R’表示氫原子或甲基。但,La21 為-O-時,Ya21 不為-CO-。Ra21 為含內酯之環式基、含碳酸酯之環式基,或含-SO2 -之環式基]。
Figure 02_image083
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbons, or a halogenated alkyl group having 1 to 5 carbons. Ya 21 is a single bond or a bivalent linking group; La 21 is -O-, -COO-, -CON(R')-, -OCO-, -CONHCO- or -CONHCS-, R'represents a hydrogen atom or a base. However, when La 21 is -O-, Ya 21 is not -CO-. Ra 21 is a cyclic group containing lactone, a cyclic group containing carbonate, or a cyclic group containing -SO 2 -].

前述式(a2-1)中,R與前述為相同內容。R以氫原子、碳數1~5之烷基或碳數1~5之氟化烷基為佳,就工業上取得之容易度而言,以氫原子或甲基為特佳。In the aforementioned formula (a2-1), R has the same content as described above. R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms. In terms of ease of industrial availability, a hydrogen atom or a methyl group is particularly preferred.

前述式(a2-1)中,Ya21 的2價之連結基,並未有特別之限定,又以可具有取代基的2價之烴基、含有雜原子的2價之連結基等為較佳之例示。Ya21 中,有關可具有取代基的2價之烴基、含有雜原子的2價之連結基等說明,分別與上述通式(a10-1)中之Yax1 中之可具有取代基的2價之烴基、含有雜原子的2價之連結基的說明為相同內容。 Ya21 以單鍵、酯鍵結[-C(=O)-O-]、醚鍵結(-O-)、直鏈狀或支鏈狀的伸烷基,或該些之組合為佳。In the aforementioned formula (a2-1), the divalent linking group of Ya 21 is not particularly limited, and it is preferably a bivalent hydrocarbon group which may have a substituent, a divalent linking group containing a heteroatom, etc. Exemplify. In Ya 21 , the description of the divalent hydrocarbon group that may have a substituent, the divalent linking group containing a heteroatom, etc. are respectively the same as the divalent substituent of the Ya x1 in the above general formula (a10-1) The description of the hydrocarbon group and the heteroatom-containing divalent linking group are the same. Ya 21 is preferably a single bond, an ester bond [-C(=O)-O-], an ether bond (-O-), a linear or branched alkylene group, or a combination of these.

前述式(a2-1)中,Ra21 為含內酯之環式基、含-SO2 -之環式基或含碳酸酯之環式基。 Ra21 中之含內酯之環式基、含-SO2 -之環式基、含碳酸酯之環式基,分別以前述通式(a2-r-1)~(a2-r-7)所各別表示之基、通式(a5-r-1)~(a5-r-4)所各別表示之基、通式(ax3-r-1)~(ax3-r-3)所各別表示之基為較佳之例示內容。 其中,又以含內酯之環式基或含-SO2 -之環式基為佳,以前述通式(a2-r-1)、(a2-r-2)、(a2-r-6)或(a5-r-1)所各別表示之基為較佳。具體而言,以前述化學式(r-lc-1-1)~(r-lc-1-7)、(r-lc-2-1)~(r-lc-2-18)、(r-lc-6-1)、(r-sl-1-1)、(r-sl-1-18)各別表示之任一基團為較佳。In the aforementioned formula (a2-1), Ra 21 is a lactone-containing cyclic group, -SO 2 --containing cyclic group, or a carbonate-containing cyclic group. The lactone-containing cyclic group, -SO 2 --containing cyclic group, and carbonate-containing cyclic group in Ra 21 are respectively represented by the aforementioned general formulas (a2-r-1) to (a2-r-7) Each of the groups represented by the formulas (a5-r-1)~(a5-r-4), the groups represented by the formulas (ax3-r-1)~(ax3-r-3) Do not indicate the basis for better exemplified content. Among them, the lactone-containing cyclic group or the -SO 2 -containing cyclic group is preferred, and the aforementioned general formulas (a2-r-1), (a2-r-2), (a2-r-6 The groups represented by) or (a5-r-1) are preferred. Specifically, according to the aforementioned chemical formulas (r-lc-1-1) ~ (r-lc-1-7), (r-lc-2-1) ~ (r-lc-2-18), (r- Any group represented by lc-6-1), (r-sl-1-1), and (r-sl-1-18) is preferred.

(A1)成份具有的結構單位(a2),可為1種亦可、2種以上亦可。 (A1)成份具有結構單位(a2)時,結構單位(a2)之比例,相對於構成(A1)成份的全結構單位之合計(100莫耳%),以20~70莫耳%為佳,以40~60莫耳%為較佳。 結構單位(a2)的比例於較佳的下限值以上時,含有結構單位(a2)時可得到充分的效果,於上限值以下時,可容易取得與其他結構單位之平衡,而可使各種微影蝕刻特性更良好。(A1) The structural unit (a2) possessed by the component may be one type or two or more types. When the component (A1) has the structural unit (a2), the ratio of the structural unit (a2) relative to the total of the total structural units (100 mol%) constituting the component (A1) is preferably 20 to 70 mol%. 40-60 mol% is preferred. When the ratio of the structural unit (a2) is above the preferred lower limit, sufficient effects can be obtained when the structural unit (a2) is contained. When the ratio is below the upper limit, the balance with other structural units can be easily achieved, and the Various lithography etching characteristics are better.

≪結構單位(a3)≫ (A1)成份,以除結構單位(a1)以外,再具有含有含極性基之脂肪族烴基的結構單位(a3)(其中,相當於結構單位(a1)、結構單位(a2)者除外)者為佳。(A1)成份具有結構單位(a3)時,因具有可適當地調整酸之擴散長度、提高阻劑膜對基板之密著性、適度地調整顯影時的溶解性、提高耐蝕刻性等的效果,而可使微影蝕刻特性等更為良好。≪Structural unit (a3)≫ (A1) Ingredients, in addition to the structural unit (a1), a structural unit (a3) containing an aliphatic hydrocarbon group containing a polar group (except those equivalent to the structural unit (a1) and the structural unit (a2)) Better. (A1) When the component has a structural unit (a3), it has the effects of appropriately adjusting the diffusion length of the acid, improving the adhesion of the resist film to the substrate, appropriately adjusting the solubility during development, and improving the etching resistance. , And can make the lithography etching characteristics better.

極性基,可列舉如:羥基、氰基、羧基、烷基的氫原子中之一部份被氟原子取代而得之羥烷基等,特別又以羥基為佳。 脂肪族烴基,可列舉如:碳數1~10之直鏈狀或支鏈狀之烴基(較佳為伸烷基),或環狀脂肪族烴基(環式基)等。該環式基,可為單環式基亦可、多環式基亦可,例如:可由ArF準分子雷射用阻劑組成物用的樹脂中,被多數提案的成份中,適當地選擇使用。該環式基以多環式基為佳,以碳數7~30為較佳。 其中,又以由含有羥基、氰基、羧基,或含有烷基的氫原子中之一部份被氟原子取代而得之羥烷基的脂肪族多環式基之丙烯酸酯所衍生的結構單位為較佳。該多環式基,可列舉如:由雙環鏈烷、三環鏈烷、四環鏈烷等去除2個以上的氫原子而得之基等。具體而言,可列舉如:由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等之多環鏈烷去除2個以上的氫原子而得之基等。該些多環式基之中,又以由金剛烷去除2個以上的氫原子而得之基、由降莰烷去除2個以上的氫原子而得之基、由四環十二烷去除2個以上的氫原子而得之基,就工業上為較佳。Examples of the polar groups include hydroxyl groups, cyano groups, carboxyl groups, and hydroxyalkyl groups in which a part of the hydrogen atoms of the alkyl groups are substituted with fluorine atoms. The hydroxyl group is particularly preferred. The aliphatic hydrocarbon group includes, for example, a linear or branched hydrocarbon group having 1 to 10 carbon atoms (preferably an alkylene group), or a cyclic aliphatic hydrocarbon group (cyclic group). The cyclic group may be a monocyclic group or a polycyclic group. For example, among the resins that can be used in the resist composition for ArF excimer lasers, the most proposed components are appropriately selected and used. . The cyclic group is preferably a polycyclic group, and the carbon number is preferably 7-30. Among them, it is a structural unit derived from an aliphatic polycyclic acrylate containing a hydroxyl group, a cyano group, a carboxyl group, or a part of the hydrogen atom containing an alkyl group by a fluorine atom. For better. Examples of the polycyclic group include groups obtained by removing two or more hydrogen atoms from bicyclic alkane, tricyclic alkane, tetracyclic alkane, and the like. Specifically, examples thereof include groups obtained by removing two or more hydrogen atoms from polycyclic alkanes such as adamantane, norbornane, isobornane, tricyclodecane, and tetracyclododecane. Among these polycyclic groups, two or more hydrogen atoms are removed from adamantane, two or more hydrogen atoms are removed from norbornane, and two are removed from tetracyclododecane. A base derived from more than one hydrogen atom is industrially preferred.

結構單位(a3),只要為含有含極性基之脂肪族烴基時,並未有特別限定,而可使用任意之成份。 結構單位(a3),以由α位的碳原子鍵結之氫原子可被取代基所取代的丙烯酸酯所衍生的結構單位,且含有含極性基之脂肪族烴基的結構單位為佳。 結構單位(a3),於含極性基之脂肪族烴基中的烴基為碳數1~10之直鏈狀或支鏈狀的烴基時,以由丙烯酸的羥乙酯所衍生的結構單位為佳。 又,結構單位(a3),於含極性基之脂肪族烴基中的該烴基為多環式基時,以下述式(a3-1)所表示的結構單位、式(a3-2)所表示的結構單位、式(a3-3)所表示的結構單位為較佳之例示。The structural unit (a3) is not particularly limited as long as it contains a polar group-containing aliphatic hydrocarbon group, and any component can be used. The structural unit (a3) is preferably a structural unit derived from an acrylate in which a hydrogen atom bonded to a carbon atom at the α position can be substituted by a substituent, and a structural unit containing an aliphatic hydrocarbon group containing a polar group is preferred. The structural unit (a3), when the hydrocarbon group in the polar group-containing aliphatic hydrocarbon group is a linear or branched hydrocarbon group having 1 to 10 carbon atoms, a structural unit derived from hydroxyethyl acrylic acid is preferred. In addition, the structural unit (a3), when the hydrocarbon group in the polar group-containing aliphatic hydrocarbon group is a polycyclic group, is represented by the structural unit represented by the following formula (a3-1) and the formula (a3-2) The structural unit and the structural unit represented by formula (a3-3) are preferred examples.

Figure 02_image085
[式中,R與前述為相同內容,j為1~3之整數,k為1~3之整數,t’為1~3之整數,l為1~5之整數,s為1~3之整數]。
Figure 02_image085
[In the formula, R is the same as the above, j is an integer of 1 to 3, k is an integer of 1 to 3, t'is an integer of 1 to 3, l is an integer of 1 to 5, and s is an integer of 1 to 3. Integer].

式(a3-1)中,j以1或2為佳,以1為更佳。j為2時,羥基以鍵結於金剛烷基的3位與5位者為佳。j為1時,羥基以鍵結於金剛烷基的3位者為佳。 j以1為佳,羥基以鍵結於金剛烷基的3位者為特佳。In the formula (a3-1), j is preferably 1 or 2, and more preferably 1. When j is 2, the hydroxyl group is preferably bonded to the 3-position and 5-position of the adamantyl group. When j is 1, the hydroxyl group is preferably bonded to the 3-position of the adamantyl group. j is preferably 1, and the hydroxyl group is particularly preferably bonded to the 3 position of the adamantyl group.

式(a3-2)中,k以1為佳。氰基以鍵結於降莰基的5位或6位者為佳。In formula (a3-2), k is preferably 1. The cyano group is preferably bonded to the 5 or 6 position of the norbornyl group.

式(a3-3)中,t’以1為佳。l以1為佳。s以1為佳。該些以於丙烯酸的羧基末端,鍵結2-降莰基或3-降莰基者為佳。氟化烷醇以鍵結於降莰基的5或6位者為佳。In the formula (a3-3), t'is preferably 1. l is preferably 1. s is preferably 1. These are preferably those bonded to the carboxyl end of acrylic acid with 2-norbornyl or 3-norbornyl. The fluorinated alkanol is preferably bonded to the 5 or 6 position of the norbornyl group.

(A1)成份具有的結構單位(a3),可為1種亦可、2種以上亦可。 (A1)成份具有結構單位(a3)時,相對於構成該(A1)成份的全結構單位之合計,以1~40莫耳%為佳,以10~30莫耳%為較佳,以20~30莫耳%為更佳。 結構單位(a3)的比例,於前述較佳範圍的下限值以上時,含有結構單位(a3)時,可得到充分的效果,於前述較佳範圍的上限值以下時,可容易取得與其他結構單位之平衡,而可使各種微影蝕刻特性更良好。(A1) The structural unit (a3) possessed by the component may be one type or two or more types. When the component (A1) has a structural unit (a3), relative to the total of the total structural units constituting the component (A1), 1-40 mol% is preferred, 10-30 mol% is preferred, and 20 ~30 mol% is better. When the ratio of the structural unit (a3) is more than the lower limit of the aforementioned preferable range, sufficient effects can be obtained when the structural unit (a3) is contained, and when the ratio is less than the upper limit of the aforementioned preferable range, it can be easily obtained with The balance of other structural units can make various lithography etching characteristics better.

≪其他結構單位≫ (A1)成份,可具有上述結構單位(a1)、結構單位(a2)、結構單位(a3)以外的其他結構單位。 其他結構單位,可列舉如:後述之含有羥基苯乙烯骨架之結構單位(a10)、通式(a9-1)所表示的結構單位(a9)、苯乙烯所衍生的結構單位(其中,相當於結構單位(a10)者除外)、含有非酸解離性之脂肪族環式基的結構單位(a4)等。≪Other structural units≫ The component (A1) may have structural units other than the above-mentioned structural unit (a1), structural unit (a2), and structural unit (a3). Other structural units include, for example, the structural unit (a10) containing a hydroxystyrene skeleton, the structural unit (a9) represented by the general formula (a9-1), and the structural unit derived from styrene (wherein, equivalent to Structural units (except for a10)), structural units (a4) containing non-acid dissociable aliphatic cyclic groups, etc.

≪含有羥基苯乙烯骨架之結構單位(a10)≫ (A1)成份,除結構單位(a1)以外,以再具有含有羥基苯乙烯骨架之結構單位(a10)者為佳。 該結構單位(a10),例如:以下述通式(a10-1)所表示的結構單位為較佳之例示。≪Structural unit containing hydroxystyrene skeleton (a10)≫ (A1) In addition to the structural unit (a1), the component (A1) preferably has a structural unit (a10) containing a hydroxystyrene skeleton. The structural unit (a10) is preferably exemplified by the structural unit represented by the following general formula (a10-1).

Figure 02_image087
[式中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基;Yax1 為單鍵或2價之連結基。Wax1 為(nax1 +1)價之芳香族烴基。nax1 為1~3之整數]。
Figure 02_image087
[In the formula, R is a hydrogen atom, an alkyl group with 1 to 5 carbons or a halogenated alkyl group with 1 to 5 carbons; Ya x1 is a single bond or a divalent linking group. Wa x1 is an aromatic hydrocarbon group with (n ax1 +1) valence. n ax1 is an integer of 1 to 3].

前述式(a10-1)中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基; R之碳數1~5之烷基,以碳數1~5的直鏈狀或支鏈狀之烷基為佳,具體而言,可列舉如:甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基等。R之碳數1~5之鹵化烷基,為前述碳數1~5之烷基的氫原子之一部份或全部被鹵素原子取代而得之基。該鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。 R以氫原子、碳數1~5之烷基或碳數1~5之氟化烷基為佳,就工業上取得之容易度,以氫原子或甲基為最佳。In the aforementioned formula (a10-1), R is a hydrogen atom, an alkyl group with 1 to 5 carbons, or a halogenated alkyl group with 1 to 5 carbons; The C1-C5 alkyl group of R is preferably a C1-C5 linear or branched chain alkyl group. Specifically, examples include methyl, ethyl, propyl, isopropyl Base, n-butyl, isobutyl, tert-butyl, pentyl, isopentyl, neopentyl, etc. The halogenated alkyl group having 1 to 5 carbon atoms of R is a group obtained by substituting a part or all of the hydrogen atoms of the aforementioned alkyl group having 1 to 5 carbon atoms by halogen atoms. Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom, and a fluorine atom is particularly preferred. R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms. For ease of industrial acquisition, a hydrogen atom or a methyl group is most preferred.

前述式(a10-1)中,Yax1 為單鍵或2價之連結基。 Yax1 中的2價之連結基,例如:以可具有取代基的2價之烴基、含有雜原子的2價之連結基為較佳之例示內容。In the aforementioned formula (a10-1), Ya x1 is a single bond or a divalent linking group. The divalent linking group in Ya x1 is preferably exemplified by, for example, a divalent hydrocarbon group which may have a substituent and a divalent linking group containing a heteroatom.

・可具有取代基的2價之烴基: Yax1 為可具有取代基的2價之烴基時,該烴基,可為脂肪族烴基亦可、芳香族烴基亦可。・An optionally substituted divalent hydrocarbon group: When Ya x1 is an optionally substituted divalent hydrocarbon group, the hydrocarbon group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.

・・Yax1 中之脂肪族烴基 該脂肪族烴基係指,不具有芳香族性之烴基之意。該脂肪族烴基,可為飽和亦可、不飽和亦可,通常以飽和為佳。 前述脂肪族烴基,可列舉如:直鏈狀或支鏈狀脂肪族烴基,或結構中含有環之脂肪族烴基等。・・The aliphatic hydrocarbon group in Ya x1 This aliphatic hydrocarbon group refers to a hydrocarbon group that is not aromatic. The aliphatic hydrocarbon group may be saturated or unsaturated, and saturated is usually preferred. The aforementioned aliphatic hydrocarbon group includes, for example, a linear or branched aliphatic hydrocarbon group, or an aliphatic hydrocarbon group containing a ring in the structure.

・・・直鏈狀或支鏈狀脂肪族烴基 該直鏈狀脂肪族烴基,以碳數為1~10為佳,以碳數1~6為較佳,以碳數1~4為更佳,以碳數1~3為最佳。 直鏈狀脂肪族烴基,以直鏈狀之伸烷基為佳,具體而言,可列舉如:伸甲基[-CH2 -]、伸乙基[-(CH2 )2 -]、伸三甲基[-(CH2 )3 -]、伸四甲基[-(CH2 )4 -]、伸五甲基[-(CH2 )5 -]等。 該支鏈狀脂肪族烴基,以碳數2~10為佳,以碳數3~6為較佳,以碳數3或4為更佳,以碳數3為最佳。 支鏈狀脂肪族烴基,以支鏈狀之伸烷基為佳,具體而言,可列舉如:-CH(CH3 )-、-CH(CH2 CH3 )-、-C(CH3 )2 -、  -C(CH3 )(CH2 CH3 )-、-C(CH3 )(CH2 CH2 CH3 )-、-C(CH2 CH3 )2 -等之烷基伸甲基;-CH(CH3 )CH2 -、-CH(CH3 )CH(CH3 )-、 -C(CH3 )2 CH2 -、-CH(CH2 CH3 )CH2 -、-C(CH2 CH3 )2 -CH2 -等之烷基伸乙基;-CH(CH3 )CH2 CH2 -、-CH2 CH(CH3 )CH2 -等之烷基伸三甲基;-CH(CH3 )CH2 CH2 CH2 -、 -CH2 CH(CH3 )CH2 CH2 -等之烷基伸四甲基等之烷基伸烷基等。烷基伸烷基中之烷基,以碳數1~5之直鏈狀之烷基為佳。・・・Straight-chain or branched aliphatic hydrocarbon group The straight-chain aliphatic hydrocarbon group preferably has 1 to 10 carbon atoms, preferably 1 to 6 carbon atoms, and more preferably 1 to 4 carbon atoms , The best carbon number is 1~3. The straight-chain aliphatic hydrocarbon group is preferably a straight-chain alkylene group. Specifically, examples include: methylidene [-CH 2 -], ethylidene [-(CH 2 ) 2 -], Methyl [-(CH 2 ) 3 -], tetramethylene [-(CH 2 ) 4 -], pentamethyl [-(CH 2 ) 5 -], etc. The branched aliphatic hydrocarbon group preferably has a carbon number of 2-10, preferably a carbon number of 3-6, more preferably a carbon number of 3 or 4, and a carbon number of 3 is the most preferred. The branched aliphatic hydrocarbon group is preferably a branched alkylene group, specifically, for example: -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 -and other alkylene groups; -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 CH 3 ) 2 -CH 2 -and other alkyl ethylene groups; -CH(CH 3 )CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 -and other alkyl ethylene groups; -CH( CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -and other alkylene groups such as tetramethyl group and the like. The alkyl group in the alkylene group is preferably a straight-chain alkyl group with 1 to 5 carbon atoms.

前述之直鏈狀或支鏈狀脂肪族烴基,可具有取代基亦可、不具有取代基亦可。該取代基,可列舉如:氟原子、被氟原子取代的碳數1~5之氟化烷基、羰基等。The aforementioned linear or branched aliphatic hydrocarbon group may or may not have a substituent. Examples of the substituent include a fluorine atom, a fluorinated alkyl group having 1 to 5 carbon atoms substituted by a fluorine atom, and a carbonyl group.

・・・結構中含有環之脂肪族烴基 該結構中含有環之脂肪族烴基,可列舉如:環結構中可含有含雜原子之取代基的環狀脂肪族烴基(由脂肪族烴環去除2個氫原子而得之基)、前述環狀脂肪族烴基鍵結於直鏈狀或支鏈狀脂肪族烴基的末端而得之基、前述環狀脂肪族烴基介於直鏈狀或支鏈狀脂肪族烴基中間而得之基等。前述之直鏈狀或支鏈狀脂肪族烴基,與前述為相同之內容。 環狀脂肪族烴基,以碳數3~20為佳,以碳數3~12為較佳。 環狀脂肪族烴基,可為多環式基亦可、單環式基亦可。單環式之脂環式烴基,以由單環鏈烷去除2個氫原子而得之基為佳。該單環鏈烷,以碳數3~6者為佳,具體而言,可列舉如:環戊烷、環己烷等。多環式之脂環式烴基,以由多環鏈烷去除2個氫原子而得之基為佳,該多環鏈烷,以碳數7~12者為佳,具體而言,可列舉如:金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。・・・Aliphatic hydrocarbon group with ring in the structure The aliphatic hydrocarbon group containing a ring in the structure includes, for example, a cyclic aliphatic hydrocarbon group (a group obtained by removing two hydrogen atoms from an aliphatic hydrocarbon ring) that may contain a heteroatom-containing substituent in the ring structure, the aforementioned ring A group in which a linear or branched aliphatic hydrocarbon group is bonded to the terminal of a linear or branched aliphatic hydrocarbon group, a group in which the aforementioned cyclic aliphatic hydrocarbon group is interposed between a linear or branched aliphatic hydrocarbon group, etc. The aforementioned linear or branched aliphatic hydrocarbon group has the same content as the aforementioned. The cycloaliphatic hydrocarbon group preferably has 3 to 20 carbon atoms, and preferably 3 to 12 carbon atoms. The cyclic aliphatic hydrocarbon group may be a polycyclic group or a monocyclic group. The monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a monocyclic alkane. The monocyclic alkane is preferably one having 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a polycyclic alkane. The polycyclic alkane is preferably a carbon number of 7-12. Specifically, examples include : Adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc.

環狀脂肪族烴基,可具有取代基亦可、不具有取代基亦可。該取代基,可列舉如:烷基、烷氧基、鹵素原子、鹵化烷基、羥基、羰基等。 前述作為取代基之烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為最佳。 前述作為取代基之烷氧基,以碳數1~5之烷氧基為佳,以甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基為較佳,以甲氧基、乙氧基為最佳。 前述作為取代基之鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 前述作為取代基之鹵化烷基,可列舉如:前述烷基的氫原子之一部份或全部被前述鹵素原子取代而得之基等。 環狀脂肪族烴基中,構成其環結構的碳原子之一部份可被含有雜原子的取代基所取代。該含有雜原子的取代基,以-O-、-C(=O)-O-、-S-、-S(=O)2 -、-S(=O)2 -O-為佳。The cycloaliphatic hydrocarbon group may or may not have a substituent. Examples of the substituent include an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, and a carbonyl group. The aforementioned alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably methyl, ethyl, propyl, n-butyl, and tert-butyl. The aforementioned alkoxy group as a substituent is preferably an alkoxy group with 1 to 5 carbon atoms, methoxy, ethoxy, n-propoxy, iso-propoxy, n-butoxy, tert -Butoxy is preferred, methoxy and ethoxy are the most preferred. The aforementioned halogen atom as the substituent includes, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom, etc., and a fluorine atom is preferred. The halogenated alkyl group as the substituent includes, for example, a group obtained by substituting part or all of the hydrogen atoms of the alkyl group with the halogen atom. In the cyclic aliphatic hydrocarbon group, part of the carbon atoms constituting the ring structure may be substituted by a substituent containing a heteroatom. The heteroatom-containing substituent is preferably -O-, -C(=O)-O-, -S-, -S(=O) 2 -, -S(=O) 2 -O-.

・・Yax1 中之芳香族烴基 該芳香族烴基,為至少具有1個芳香環的烴基。 該芳香環,只要為具有4n+2個π電子的環狀共軛系時,則未有特別之限定,其可為單環式亦可、多環式亦可。芳香環之碳數以5~30為佳,以碳數5~20為較佳,以碳數6~15為更佳,以碳數6~12為特佳。但,該碳數為不包含取代基中之碳數者。芳香環,具體而言,可列舉如:苯、萘、蒽、菲等之芳香族烴環;構成前述芳香族烴環的碳原子中之一部份被雜原子取代而得之芳香族雜環等。芳香族雜環中之雜原子,可列舉如:氧原子、硫原子、氮原子等。芳香族雜環,具體而言,可列舉如:吡啶環、噻吩環等。 芳香族烴基,具體而言,可列舉如:由前述芳香族烴環或芳香族雜環去除2個氫原子而得之基(伸芳基或雜伸芳基);由含有2個以上的芳香環之芳香族化合物(例如:聯苯、茀等)去除2個氫原子而得之基;由前述芳香族烴環或芳香族雜環去除1個氫原子而得之基(芳基或雜芳基)的氫原子中之1個被伸烷基取代而得之基(例如:由苄基、苯乙基、1-萘基甲基、2-萘基甲基、1-萘基乙基、2-萘基乙基等之芳烷基中的芳基再去除1個氫原子而得之基)等。前述鍵結於芳基或雜芳基的伸烷基之碳數,以1~4為佳,以碳數1~2為較佳,以碳數1為特佳。・・The aromatic hydrocarbon group in Ya x1 The aromatic hydrocarbon group is a hydrocarbon group having at least one aromatic ring. The aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and it may be monocyclic or polycyclic. The carbon number of the aromatic ring is preferably 5-30, preferably 5-20, more preferably 6-15, and particularly preferably 6-12. However, the carbon number is one that does not include the carbon number in the substituent. Aromatic rings, specifically, include: aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, phenanthrene, etc.; aromatic heterocycles in which part of the carbon atoms constituting the aforementioned aromatic hydrocarbon ring is substituted by heteroatoms Wait. Examples of heteroatoms in the aromatic heterocycle include oxygen atoms, sulfur atoms, and nitrogen atoms. Specific examples of the aromatic heterocyclic ring include a pyridine ring and a thiophene ring. Specifically, the aromatic hydrocarbon group includes: a group obtained by removing two hydrogen atoms from the aforementioned aromatic hydrocarbon ring or aromatic heterocyclic ring (arylene group or heteroarylene group); A ring of aromatic compounds (for example: biphenyl, fen, etc.) is a group obtained by removing two hydrogen atoms; a group obtained by removing one hydrogen atom from the aforementioned aromatic hydrocarbon ring or aromatic heterocyclic ring (aryl or heteroaromatic (For example, benzyl, phenethyl, 1-naphthylmethyl, 2-naphthylmethyl, 1-naphthylethyl, The aryl group in the aralkyl group such as 2-naphthylethyl group is obtained by removing one more hydrogen atom). The carbon number of the alkylene group bonded to the aryl or heteroaryl group is preferably 1 to 4, preferably 1 to 2 carbons, and particularly preferably 1 carbon.

前述芳香族烴基中,該芳香族烴基所具有的氫原子,可被取代基所取代。例如:該芳香族烴基中之芳香環鍵結的氫原子可被取代基所取代。該取代基,可列舉如:烷基、烷氧基、鹵素原子、鹵化烷基、羥基等。 前述作為取代基之烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為最佳。 前述作為取代基之烷氧基、鹵素原子及鹵化烷基,例如:被列舉作為取代前述環狀脂肪族烴基所具有的氫原子之取代基者。In the aforementioned aromatic hydrocarbon group, the hydrogen atom of the aromatic hydrocarbon group may be substituted with a substituent. For example: the hydrogen atom bonded to the aromatic ring in the aromatic hydrocarbon group can be replaced by a substituent. Examples of the substituent include alkyl groups, alkoxy groups, halogen atoms, halogenated alkyl groups, and hydroxyl groups. The aforementioned alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably methyl, ethyl, propyl, n-butyl, and tert-butyl. The alkoxy group, halogen atom, and halogenated alkyl group as the aforementioned substituents are, for example, exemplified as substituents that replace the hydrogen atom of the aforementioned cyclic aliphatic hydrocarbon group.

・含有雜原子的2價之連結基: Yax1 為含有雜原子的2價之連結基時,該連結基之較佳者,可列舉如:-O-、-C(=O)-O-、-C(=O)-、-O-C(=O)-O-、-C(=O)-NH-、-NH-、-NH-C(=NH)-(H可被烷基、醯基等的取代基所取代)、-S-、-S(=O)2 -、-S(=O)2 -O-、通式  -Y21 -O-Y22 -、-Y21 -O-、-Y21 -C(=O)-O-、-C(=O)-O-Y21 -、 -[Y21 -C(=O)-O]m” -Y22 -、-Y21 -O-C(=O)-Y22 -或-Y21 -S(=O)2 -O-Y22 -所表示之基[式中,Y21 及Y22 各別獨立為可具有取代基的2價之烴基,O為氧原子,m”為0~3之整數]等。 前述含有雜原子的2價之連結基為-C(=O)-NH-、    -C(=O)-NH-C(=O)-、-NH-、-NH-C(=NH)-時,該H可被烷基、醯基等的取代基所取代。該取代基(烷基、醯基等),以碳數為1~10為佳,以1~8為更佳,以1~5為特佳。 通式-Y21 -O-Y22 -、-Y21 -O-、-Y21 -C(=O)-O-、-C(=O)-O-Y21 -、-[Y21 -C(=O)-O]m” -Y22 -、-Y21 -O-C(=O)-Y22 -或   -Y21 -S(=O)2 -O-Y22 -中,Y21 及Y22 各別獨立為可具有取代基的2價之烴基。該2價之烴基,例如:與前述2價之連結基的說明中所列舉的(可具有取代基的2價之烴基)為相同之內容。 Y21 以直鏈狀脂肪族烴基為佳,以直鏈狀之伸烷基為較佳,以碳數1~5之直鏈狀之伸烷基為更佳,以伸甲基或伸乙基為特佳。 Y22 以直鏈狀或支鏈狀脂肪族烴基為佳,以伸甲基、伸乙基或烷基伸甲基為較佳。該烷基伸甲基中之烷基,以碳數1~5之直鏈狀之烷基為佳,以碳數1~3之直鏈狀之烷基為較佳,以甲基為最佳。 式-[Y21 -C(=O)-O]m” -Y22 -所表示之基中,m”為0~3之整數,又以0~2之整數為佳,以0或1為較佳,以1為特佳。即,式-[Y21 -C(=O)-O]m” -Y22 -所表示之基,以式-Y21 -C(=O)-O-Y22 -所表示之基為特佳。其中,又以式-(CH2 )a -C(=O)-O-(CH2 )b -所表示之基為佳。該式中,a’為1~10之整數,又以1~8之整數為佳,以1~5之整數為較佳,以1或2為更佳,以1為最佳。b’為1~10之整數,又以1~8之整數為佳,以1~5之整數為較佳,以1或2為更佳,以1為最佳。・Divalent linking group containing heteroatoms: When Ya x1 is a divalent linking group containing heteroatoms, the preferred linking group includes: -O-, -C(=O)-O- , -C(=O)-, -OC(=O)-O-, -C(=O)-NH-, -NH-, -NH-C(=NH)-(H can be alkyl, 醯Substituents such as groups), -S-, -S(=O) 2 -, -S(=O) 2 -O-, general formula -Y 21 -OY 22 -, -Y 21 -O-, -Y 21 -C(=O)-O-, -C(=O)-OY 21 -, -[Y 21 -C(=O)-O] m” -Y 22 -, -Y 21 -OC( =O)-Y 22 -or -Y 21 -S(=O) 2 -OY 22 -represents a group [wherein, Y 21 and Y 22 are each independently an optionally substituted divalent hydrocarbon group, O Is an oxygen atom, m" is an integer of 0 to 3] and the like. The aforementioned heteroatom-containing divalent linking group is -C(=O)-NH-, -C(=O)-NH-C(=O)-, -NH-, -NH-C(=NH)- In case, the H may be substituted by substituents such as alkyl and acyl groups. The substituent (alkyl group, acyl group, etc.) preferably has a carbon number of 1-10, more preferably 1-8, and particularly preferably 1-5. General formula -Y 21 -OY 22 -, -Y 21 -O-, -Y 21 -C(=O)-O-, -C(=O)-OY 21 -, -(Y 21 -C(=O )-O] m” -Y 22 -, -Y 21 -OC(=O)-Y 22 -or -Y 21 -S(=O) 2 -OY 22 -, Y 21 and Y 22 are independently A divalent hydrocarbon group that may have a substituent. The divalent hydrocarbon group is, for example, the same as those listed in the description of the divalent linking group (the divalent hydrocarbon group that may have a substituent). Y 21 is Straight-chain aliphatic hydrocarbon groups are preferred, and straight-chain alkylene groups are preferred, straight-chain alkylene groups with 1 to 5 carbon atoms are more preferred, and methylidene or ethylidene groups are particularly preferred. 。 Y 22 is preferably a straight-chain or branched aliphatic hydrocarbon group, preferably a methylidene, an ethylene group or an alkylene group. The alkyl group in the alkylene group has 1 to 5 carbon atoms. The straight-chain alkyl group is preferred, the straight-chain alkyl group with 1 to 3 carbon atoms is preferred, and the methyl group is the most preferred. Formula -[Y 21 -C(=O)-O] m" In the group represented by -Y 22 -, m" is an integer from 0 to 3, preferably an integer from 0 to 2, preferably 0 or 1, and particularly preferably 1. That is, the formula -[Y 21 The group represented by -C(=O)-O] m" -Y 22 -is particularly preferably the group represented by the formula -Y 21 -C(=O)-OY 22 -. Among these are the formula - (CH 2) a '-C (= O) -O- (CH 2) b' - preferably the group represented. In this formula, a'is an integer of 1-10, preferably an integer of 1-8, more preferably an integer of 1-5, more preferably 1 or 2, and most preferably 1. b'is an integer of 1-10, preferably an integer of 1-8, preferably an integer of 1-5, more preferably 1 or 2, and most preferably 1.

Yax1 以單鍵、酯鍵結[-C(=O)-O-]、醚鍵結 (-O-)、-C(=O)-NH-、直鏈狀或支鏈狀之伸烷基,或該些之組合為佳,其中,又以單鍵為特佳。Ya x1 is a single bond, ester bond [-C(=O)-O-], ether bond (-O-), -C(=O)-NH-, linear or branched alkylene A base or a combination of these is preferred, and among them, a single bond is particularly preferred.

前述式(a10-1)中,Wax1 為(nax1 +1)價之芳香族烴基。 Wax1 中之芳香族烴基,可列舉如:由芳香環去除 (nax1 +1)個氫原子而得之基等。此處之芳香環,只要為具有4n+2個的π電子之環狀共軛系時,則未有特別之限定,其可為單環式亦可、多環式亦可。芳香環之碳數以5~30為佳,以碳數5~20為較佳,以碳數6~15為更佳,以碳數6~12為特佳。芳香環,具體而言,可列舉如:苯、萘、蒽、菲等之芳香族烴環;構成前述芳香族烴環的碳原子中之一部份被雜原子取代而得之芳香族雜環等。芳香族雜環中之雜原子,可列舉如:氧原子、硫原子、氮原子等。芳香族雜環,具體而言,可列舉如:吡啶環、噻吩環等。In the aforementioned formula (a10-1), Wa x1 is an aromatic hydrocarbon group having a valence of (n ax1 + 1). The aromatic hydrocarbon group in Wa x1 includes, for example, a group obtained by removing (n ax1 +1) hydrogen atoms from an aromatic ring. The aromatic ring here is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and it may be monocyclic or polycyclic. The carbon number of the aromatic ring is preferably 5-30, preferably 5-20, more preferably 6-15, and particularly preferably 6-12. Aromatic rings, specifically, include: aromatic hydrocarbon rings such as benzene, naphthalene, anthracene, phenanthrene, etc.; aromatic heterocycles in which part of the carbon atoms constituting the aforementioned aromatic hydrocarbon ring is substituted by heteroatoms Wait. Examples of heteroatoms in the aromatic heterocycle include oxygen atoms, sulfur atoms, and nitrogen atoms. Specific examples of the aromatic heterocyclic ring include a pyridine ring and a thiophene ring.

前述式(a10-1)中,nax1 為1~3之整數,以1或2為佳,以1為較佳。In the aforementioned formula (a10-1), n ax1 is an integer of 1 to 3, preferably 1 or 2, and more preferably 1.

以下為前述通式(a10-1)所表示的結構單位之具體例示。 下述式中,Rα 表示氫原子、甲基或三氟甲基。The following are specific examples of the structural unit represented by the aforementioned general formula (a10-1). In the following formula, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group.

Figure 02_image089
Figure 02_image089

(A1)成份具有的結構單位(a10),可為1種亦可、2種以上亦可。 (A1)成份中,結構單位(a10)之比例,相對於構成(A1)成份的全結構單位之合計(100莫耳%),例如為0~80莫耳%,又以10~80莫耳%為佳,以20~70莫耳%為較佳,以30~60莫耳%為特佳。 結構單位(a10)的比例,於前述較佳範圍的下限值以上時,可提高感度、解析性、改善粗糙度等的微影蝕刻特性。另一方面,於前述較佳範圍的上限值以下時,可容易取得與其他結構單位之平衡,而可使各種微影蝕刻特性更良好。(A1) The structural unit (a10) possessed by the component may be one type or two or more types. (A1) The proportion of the structural unit (a10) in the component, relative to the total (100 mol%) of the total structural units constituting the component (A1), is for example 0 to 80 mol%, and 10 to 80 mol% % Is better, preferably 20 to 70 mol%, and particularly preferably 30 to 60 mol%. When the ratio of the structural unit (a10) is more than the lower limit of the aforementioned preferable range, the sensitivity, resolution, and roughness of lithographic etching characteristics can be improved. On the other hand, when it is below the upper limit of the aforementioned preferred range, it is easy to achieve a balance with other structural units, and various lithographic etching characteristics can be made better.

結構單位(a9): 結構單位(a9)為下述通式(a9-1)所表示的結構單位。Structural unit (a9): The structural unit (a9) is a structural unit represented by the following general formula (a9-1).

Figure 02_image091
[式中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基;Ya91 為單鍵或2價之連結基。Ya92 為2價之連結基。R91 為可具有取代基之烴基]。
Figure 02_image091
[In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbons, or a halogenated alkyl group having 1 to 5 carbons; Ya 91 is a single bond or a divalent linking group. Ya 92 is the link base of 2 valence. R 91 is a hydrocarbon group which may have a substituent].

前述式(a9-1)中,R與前述為相同內容。 R以氫原子、碳數1~5之烷基或碳數1~5之氟化烷基為佳,就工業上取得之容易度而言,以氫原子或甲基為特佳。In the foregoing formula (a9-1), R is the same as the foregoing. R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a fluorinated alkyl group having 1 to 5 carbon atoms. In terms of ease of industrial availability, a hydrogen atom or a methyl group is particularly preferred.

前述式(a9-1)中,Ya91 中的2價之連結基,與上述通式(a10-1)中之Yax1 中的2價之連結基為相同之內容。其中,Ya91 又以單鍵為佳。In the aforementioned formula (a9-1), the divalent linking group in Ya 91 is the same as the divalent linking group in Ya x1 in the above general formula (a10-1). Among them, Ya 91 is preferably a single bond.

前述式(a9-1)中,Ya92 中的2價之連結基,與上述通式(a10-1)中之Yax1 的2價之連結基為相同之內容。 Ya92 中的2價之連結基中,可具有取代基的2價之烴基,以直鏈狀或支鏈狀脂肪族烴基為佳。 又,Ya92 中的2價之連結基中,含有雜原子的2價之連結基,可列舉如:-O-、-C(=O)-O-、-C(=O)-、-O-C(=O)-O-、-C(=O)-NH-、-NH-、-NH-C(=NH)-(H可被烷基、醯基等的取代基所取代)、-S-、-S(=O)2 -、-S(=O)2 -O-、      -C(=S)-、通式-Y21 -O-Y22 -、-Y21 -O-、-Y21 -C(=O)-O-、    -C(=O)-O--Y21 、[Y21 -C(=O)-O]m’ -Y22 -或-Y21 -O-C(=O)-Y22 -所表示之基[式中,Y21 及Y22 各別獨立為可具有取代基的2價之烴基,O為氧原子,m’為0~3之整數]等。其中,又以-C(=O)-、-C(=S)-為佳。In the aforementioned formula (a9-1), the divalent linking group in Ya 92 has the same content as the divalent linking group of Ya x1 in the general formula (a10-1). Among the divalent linking groups in Ya 92 , the divalent hydrocarbon group which may have a substituent is preferably a linear or branched aliphatic hydrocarbon group. In addition, among the divalent linking groups in Ya 92 , the divalent linking groups containing heteroatoms include: -O-, -C(=O)-O-, -C(=O)-,- OC(=O)-O-, -C(=O)-NH-, -NH-, -NH-C(=NH)-(H can be substituted by substituents such as alkyl and acyl),- S-, -S(=O) 2 -, -S(=O) 2 -O-, -C(=S)-, general formula -Y 21 -OY 22 -, -Y 21 -O-, -Y 21 -C (= O) -O-, -C (= O) -O - Y 21, [Y 21 -C (= O) -O] m '-Y 22 - or -Y 21 -OC (= O) A group represented by -Y 22- [In the formula, Y 21 and Y 22 are each independently an optionally substituted divalent hydrocarbon group, O is an oxygen atom, and m'is an integer of 0 to 3] and the like. Among them, -C(=O)- and -C(=S)- are better.

前述式(a9-1)中,R91 中之烴基,可列舉如:烷基、1價之脂環式烴基、芳基、芳烷基等。 R91 中之烷基,以碳數1~8為佳,以碳數1~6為較佳,以碳數1~4為更佳,其可為直鏈狀亦可、支鏈狀亦可。具體而言,例如:以甲基、乙基、丙基、丁基、己基、辛基等為較佳之例示。 R91 中的1價之脂環式烴基,以碳數3~20為佳,以碳數3~12為較佳,其可為多環式亦可、單環式亦可。單環式之脂環式烴基,以由單環鏈烷去除1個以上的氫原子而得之基為佳。該單環鏈烷以碳數3~6者為佳,具體而言,可列舉如:環丁烷、環戊烷、環己烷等。多環式之脂環式烴基,以由多環鏈烷去除1個以上的氫原子而得之基為佳,該多環鏈烷以碳數7~12者為佳,具體而言,可列舉如:金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。 R91 中之芳基,以碳數6~18者為佳,以碳數6~10者為較佳,具體而言,以苯基為特佳。 R91 中之芳烷基,以碳數1~8之伸烷基與上述「R91 中之芳基」鍵結而得之芳烷基為佳,以碳數1~6之伸烷基與上述「R91 中之芳基」鍵結而得之芳烷基為較佳,以碳數1~4之伸烷基與上述「R91 中之芳基」鍵結而得之芳烷基為特佳。 R91 中之烴基,以該烴基中的氫原子之一部份或全部被氟原子取代者為佳,以該烴基中的氫原子之30~100%被氟原子取代者為較佳。其中,又以上述烷基中的全部氫原子被氟原子取代之全氟烷基為特佳。In the aforementioned formula (a9-1), the hydrocarbon group in R 91 includes, for example, an alkyl group, a monovalent alicyclic hydrocarbon group, an aryl group, and an aralkyl group. The alkyl group in R 91 preferably has 1 to 8 carbon atoms, preferably 1 to 6 carbon atoms, and more preferably 1 to 4 carbon atoms. It can be linear or branched. . Specifically, for example, methyl, ethyl, propyl, butyl, hexyl, octyl, etc. are preferable examples. The monovalent alicyclic hydrocarbon group in R 91 preferably has 3 to 20 carbon atoms, preferably 3 to 12 carbon atoms, and it may be polycyclic or monocyclic. The monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a monocyclic alkane. The monocyclic alkane is preferably one having 3 to 6 carbon atoms, and specific examples thereof include cyclobutane, cyclopentane, and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a polycyclic alkane, and the polycyclic alkane is preferably one with 7 to 12 carbon atoms. Specifically, it can be exemplified Such as: adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc. The aryl group in R 91 preferably has 6 to 18 carbons, preferably 6 to 10 carbons. Specifically, phenyl is particularly preferred. R 91 in the aralkyl, the alkylene group of carbon number 1 to 8 of the above-described "aryl group R 91 in the" aralkyl group bonded to give it better to 6 carbon atoms, alkyl of 1 to extend and The aralkyl group obtained by bonding the aforementioned "aryl group in R 91 " is preferred, and the aralkyl group obtained by bonding an alkylene group with 1 to 4 carbon atoms to the aforementioned "aryl group in R 91 " is Especially good. The hydrocarbyl group in R 91 is preferably one in which part or all of the hydrogen atoms in the hydrocarbyl group are substituted by fluorine atoms, and it is preferable that 30-100% of the hydrogen atoms in the hydrocarbyl group are substituted by fluorine atoms. Among them, a perfluoroalkyl group in which all hydrogen atoms in the above-mentioned alkyl group are replaced by fluorine atoms is particularly preferred.

R91 中之烴基,可具有取代基。該取代基,可列舉如:鹵素原子、側氧(oxo)基(=O)、羥基(-OH)、胺基(-NH2 )、-SO2 -NH2 等。又,構成該烴基的碳原子之一部份可被含有雜原子的取代基所取代。該含有雜原子的取代基,例如:-O-、-NH-、-N=、-C(=O)-O-、-S-、       -S(=O)2 -、-S(=O)2 -O-等。 R91 中,具有取代基之烴基,可列舉如:前述通式(a2-r-1)~(a2-r-7)各別表示之含內酯之環式基等。The hydrocarbon group in R 91 may have a substituent. Examples of the substituent include a halogen atom, a pendant oxygen (oxo) group (=O), a hydroxyl group (-OH), an amino group (-NH 2 ), -SO 2 -NH 2 and the like. In addition, part of the carbon atoms constituting the hydrocarbon group may be substituted with a substituent containing a heteroatom. The substituents containing heteroatoms, for example: -O-, -NH-, -N=, -C(=O)-O-, -S-, -S(=O) 2 -, -S(=O ) 2 -O- etc. In R 91 , the hydrocarbon group having a substituent includes, for example, the lactone-containing cyclic group represented by the aforementioned general formulas (a2-r-1) to (a2-r-7).

又,R91 中,具有取代基之烴基,又可列舉如:前述通式(a5-r-1)~(a5-r-4)各別表示之含-SO2 -之環式基;下述化學式所表示之取代芳基、1價之雜環式基等。In addition, in R 91 , the hydrocarbon group having a substituent includes, for example, the -SO 2 -containing cyclic group represented by the aforementioned general formulas (a5-r-1) to (a5-r-4); The substituted aryl group, monovalent heterocyclic group, etc. represented by the above chemical formula.

Figure 02_image093
Figure 02_image093

結構單位(a9)之中,又以下述通式(a9-1-1)所表示的結構單位為佳。Among the structural units (a9), a structural unit represented by the following general formula (a9-1-1) is preferred.

Figure 02_image095
[式中,R與前述為相同之內容,Ya91 為單鍵或2價之連結基,R91 為可具有取代基之烴基,R92 為氧原子或硫原子]。
Figure 02_image095
[In the formula, R is the same as the above, Ya 91 is a single bond or a divalent linking group, R 91 is an optionally substituted hydrocarbon group, and R 92 is an oxygen atom or a sulfur atom].

通式(a9-1-1)中,Ya91 、R91 、R之說明係與前述為相同內容。又,R92 為氧原子或硫原子。In the general formula (a9-1-1), the description of Ya 91 , R 91 and R is the same as the above. In addition, R 92 is an oxygen atom or a sulfur atom.

以下為前述式(a9-1)或通式(a9-1-1)所表示的結構單位之具體例示。下述式中,Rα 表示氫原子、甲基或三氟甲基。The following are specific examples of the structural unit represented by the aforementioned formula (a9-1) or general formula (a9-1-1). In the following formula, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group.

Figure 02_image097
Figure 02_image097

Figure 02_image099
Figure 02_image099

Figure 02_image101
Figure 02_image101

(A1)成份所含有的結構單位(a9),可為1種亦可、2種以上亦可。 (A1)成份具有結構單位(a9)時,結構單位(a9)之比例,相對於構成(A1)成份的全結構單位之合計(100莫耳%),以1~40莫耳%為佳,以3~30莫耳%為較佳,以5~25莫耳%為更佳,以10~20莫耳%為特佳。 結構單位(a9)的比例,於前述較佳範圍的下限值以上時,例如可得到適當地調整酸之擴散長度、提高阻劑膜對基板之密著性、適度地調整顯影時的溶解性、提高耐蝕刻性等的效果,於前述較佳範圍的上限值以下時,可容易取得與其他結構單位之平衡,而可使各種微影蝕刻特性更良好。(A1) The structural unit (a9) contained in the component may be one type or two or more types. When the component (A1) has a structural unit (a9), the ratio of the structural unit (a9) relative to the total structural unit (100 mol%) of the component (A1) is preferably 1-40 mol%. It is preferably 3-30 mol%, more preferably 5-25 mol%, and particularly preferably 10-20 mol%. When the ratio of the structural unit (a9) is above the lower limit of the aforementioned preferable range, for example, it is possible to appropriately adjust the diffusion length of the acid, improve the adhesion of the resist film to the substrate, and appropriately adjust the solubility during development. , The effect of improving the etching resistance, etc., when it is below the upper limit of the above-mentioned preferred range, the balance with other structural units can be easily achieved, and various lithographic etching characteristics can be made better.

結構單位(a4): 結構單位(a4)為含有非酸解離性環式基的結構單位。(A1)成份具有結構單位(a4)時,可提高所形成的感光性樹脂圖型之耐乾蝕刻性。又,可提升(A1)成份之疏水性。 結構單位(a4)中之「非酸解離性環式基」,於經由曝光而由後述(B)成份等產生酸之際,即使受到該酸之作用也不會發生解離,而仍殘留於該結構單位中的環式基。Structural unit (a4): The structural unit (a4) is a structural unit containing a non-acid dissociable cyclic group. When the component (A1) has the structural unit (a4), the dry etching resistance of the formed photosensitive resin pattern can be improved. In addition, the hydrophobicity of (A1) component can be improved. The "non-acid dissociable cyclic group" in the structural unit (a4), when an acid is generated from the component (B) described later by exposure, will not be dissociated even if it is subjected to the action of the acid, but will remain in the The cyclic group in the structural unit.

結構單位(a4),例如:以含有非酸解離性之脂肪族環式基的丙烯酸酯所衍生的結構單位等為佳。該環式基,可列舉如:與前述的結構單位(a1)中所例示者為相同之例示,其可使用以往已知被作為ArF準分子雷射用、KrF準分子雷射用(較佳為ArF準分子雷射用)等阻劑組成物的樹脂成份之基團。特別是由三環癸基、金剛烷基、四環十二烷基、異莰基、降莰基所選出之至少1種時,就工業上容易取得等觀點而為較佳。該些多環式基,可具有作為取代基的碳數1~5之直鏈狀或支鏈狀之烷基。The structural unit (a4) is preferably a structural unit derived from an acrylic ester containing a non-acid dissociable aliphatic cyclic group. The cyclic group can be exemplified by the same exemplification as exemplified in the aforementioned structural unit (a1), and it can be used conventionally known as ArF excimer lasers and KrF excimer lasers (preferably It is the group of resin component of resist composition such as ArF excimer laser. In particular, when at least one selected from tricyclodecyl, adamantyl, tetracyclododecyl, isobornyl, and norbornyl, it is preferred from the viewpoint of easy industrial availability. These polycyclic groups may have a linear or branched alkyl group having 1 to 5 carbon atoms as a substituent.

結構單位(a4),具體而言,可列舉如:具有下述通式(a4-1)~(a4-7)所示結構者。Specific examples of the structural unit (a4) include those having a structure represented by the following general formulas (a4-1) to (a4-7).

Figure 02_image103
[式中,Rα 表示氫原子、甲基或三氟甲基]。
Figure 02_image103
[In the formula, R α represents a hydrogen atom, a methyl group, or a trifluoromethyl group].

(A1)成份含有的結構單位(a4),可為1種亦可、2種以上亦可。 (A1)成份含有結構單位(a4)之際,結構單位(a4)之比例,相對於構成(A1)成份的全結構單位之合計,以1~30莫耳%為佳,以10~20莫耳%為較佳。(A1) The structural unit (a4) contained in the component may be one type or two or more types. (A1) When the component contains the structural unit (a4), the ratio of the structural unit (a4) relative to the total of the total structural units constituting the component (A1) is preferably 1-30 mol%, and 10-20 mol% Ear% is better.

阻劑組成物所含有的(A1)成份,可單獨使用1種亦可、將2種以上合併使用亦可。 (A1)成份,以含有具有結構單位(a1)之高分子化合物(A1-1)(以下,亦稱為「(A1-1)成份」)者為佳。 較佳的(A1-1)成份,可列舉如:具有結構單位(a1)與結構單位(a2)之重複結構的高分子化合物等。 除上述2種各個結構單位之組合以外,有關第3個或第3個以上的結構單位,可適當地配合所期待之效果,而與上述說明的結構單位組合。第3個的結構單位,較佳為結構單位(a3)等。The (A1) component contained in the resist composition may be used alone or in combination of two or more. The component (A1) preferably contains a polymer compound (A1-1) (hereinafter, also referred to as "(A1-1) component") having the structural unit (a1). The preferred (A1-1) component includes, for example, a polymer compound having a repeating structure of the structural unit (a1) and the structural unit (a2). In addition to the combination of the above two types of structural units, the third or more structural units can be combined with the above-described structural units appropriately according to the desired effect. The third structural unit is preferably structural unit (a3) or the like.

該(A1)成份,可將衍生各結構單位的單體溶解於聚合溶劑中,再將例如偶氮雙異丁腈(AIBN)、偶氮雙異丁酸二甲酯(例如V-601等)等的自由基聚合起始劑加入其中,進行聚合反應之方式而製得。或,該(A1)成份,可將衍生結構單位(a1)之單體,與必要時添加的可衍生結構單位(a1)以外的結構單位之前驅體單體(官能基被保護的單體),溶解於聚合溶劑中,再將上述自由基聚合起始劑加入其中,進行聚合反應,隨後,再進行去保護反應之方式而製得。又,聚合之際,可併用例如:HS-CH2 -CH2 -CH2 -C(CF3 )2 -OH等的鏈移轉劑,於末端導入-C(CF3 )2 -OH基。依此方式所製得的導入「烷基的氫原子中之一部份被氟原子取代而得之羥烷基」的共聚物,可有效地降低顯影缺陷或降低LER(線路粗糙度:線路側壁的不均勻之凹凸)。The (A1) component can dissolve the monomers that derive each structural unit in the polymerization solvent, and then dissolve, for example, azobisisobutyronitrile (AIBN), dimethyl azobisisobutyrate (such as V-601, etc.) It is prepared by adding other free radical polymerization initiators to it and conducting polymerization reaction. Or, the component (A1) can combine the monomer of the derivatized structural unit (a1) and the precursor monomer of the structural unit other than the derivatized structural unit (a1) (a monomer with a protected functional group). , Dissolved in the polymerization solvent, and then added the above-mentioned free radical polymerization initiator to the polymerization reaction, followed by the deprotection reaction. In addition, during polymerization, a chain transfer agent such as HS-CH 2 -CH 2 -CH 2 -C(CF 3 ) 2 -OH can be used in combination to introduce a -C(CF 3 ) 2 -OH group at the end. In this way, the copolymer produced by introducing the "hydroxyalkyl group obtained by replacing part of the hydrogen atoms of the alkyl group with fluorine atoms" can effectively reduce development defects or reduce LER (line roughness: line sidewall The uneven unevenness).

(A1)成份之重量平均分子量(Mw)(凝膠滲透色層分析(GPC)之聚苯乙烯換算基準),並未有特別之限定,一般以1000~50000為佳,以2000~30000為較佳,以3000~20000為更佳。 (A1)成份之Mw於該範圍的較佳上限值以下時,作為阻劑使用時,對阻劑溶劑具有充份的溶解性,於該範圍的較佳下限值以上時,可具有良好的耐乾蝕刻性或阻劑圖型之斷面形狀。 (A1)成份之分散度(Mw/Mn),並未有特別之限定,一般以1.0~4.0為佳,以1.0~3.0為較佳,以1.1~2.0為特佳。又,Mn表示數平均分子量。(A1) The weight average molecular weight (Mw) of the component (GPC conversion standard for polystyrene) is not particularly limited. Generally, 1000~50,000 is better, and 2000~30,000 is better. Good, more preferably 3000 to 20000. (A1) When the Mw of the component is below the preferred upper limit of the range, when used as a resist, it has sufficient solubility in the resist solvent, and when it is above the preferred lower limit of the range, it has good solubility. The dry etching resistance or the cross-sectional shape of the resist pattern. (A1) The degree of dispersion (Mw/Mn) of the components is not particularly limited. Generally, 1.0-4.0 is preferred, 1.0-3.0 is preferred, and 1.1-2.0 is particularly preferred. In addition, Mn represents the number average molecular weight.

・(A2)成份 本實施形態之阻劑組成物中,(A)成份,可併用不相當於前述(A1)成份的經由酸之作用而對顯影液之溶解性產生變化的基材成份(以下,亦稱為「(A2)成份」)。 (A2)成份,並未有特別之限定,其可由以往已知作為化學增幅型阻劑組成物用的基材成份的多數成份中任意地選擇使用。 (A2)成份,可單獨使用1種高分子化合物或低分子化合物,或將2種以上組合使用皆可。・(A2) Ingredients In the resist composition of this embodiment, the (A) component may be combined with a base component that does not correspond to the aforementioned (A1) component that changes the solubility of the developer through the action of acid (hereinafter, also referred to as " (A2) Ingredients"). The component (A2) is not particularly limited, and it can be arbitrarily selected and used from many components conventionally known as substrate components for chemically amplified resist compositions. (A2) Ingredients, one type of high molecular compound or low molecular compound can be used alone, or two or more types can be used in combination.

(A)成份中的(A1)成份之比例,相對於(A)成份之總質量,以25質量%以上為佳,以50質量%以上為較佳,以75質量%以上為更佳,亦可為100質量%。該比例為25質量%以上時,可容易形成高感度化或解析性、改善粗糙度等各種優良的微影蝕刻特性之阻劑圖型。(A) The ratio of (A1) component in component (A) is preferably 25% by mass or more, preferably 50% by mass or more, and more preferably 75% by mass or more relative to the total mass of (A) components. It can be 100% by mass. When the ratio is 25% by mass or more, it is easy to form a resist pattern with various excellent lithographic etching characteristics such as high sensitivity, resolution, and roughness improvement.

本實施形態之阻劑組成物中,(A)成份之含量,可配合所欲形成的阻劑膜厚度等作適當之調整即可。In the resist composition of this embodiment, the content of component (A) can be adjusted appropriately according to the thickness of the resist film to be formed.

<(B)成份> 本實施形態中的阻劑組成物之(B)成份,為含有下述通式(b1-1)所表示之化合物(B1)(以下,亦稱為「(B1)成份」)。<(B) Ingredients> The (B) component of the resist composition in this embodiment contains the compound (B1) represented by the following general formula (b1-1) (hereinafter, also referred to as "(B1) component").

Figure 02_image105
[式中,R0 101 為多環式脂肪族烴基;其中,多環式脂肪族烴基的氫原子亦可被取代基所取代;R102 為氟原子或碳數1~5之氟化烷基;Y101 為單鍵,或含有氧原子的2價之連結基;V101 為單鍵、伸烷基或氟化伸烷基;m為1以上之整數,且M’m 為m價之鎓陽離子]。
Figure 02_image105
[In the formula, R 0 101 is a polycyclic aliphatic hydrocarbon group; among them, the hydrogen atom of the polycyclic aliphatic hydrocarbon group may also be substituted by a substituent; R 102 is a fluorine atom or a fluorinated alkyl group with 1 to 5 carbon atoms ; Y 101 is a single bond, or a divalent linking group containing an oxygen atom of a; V 101 is a single bond, an alkylene group or fluorinated alkylene group; m is an integer of 1 or more, and m 'm + m is the valence of Onium cation].

{陰離子部} 式(b1-1)中,R0 101 為多環式脂肪族烴基。其中,多環式脂肪族烴基的氫原子亦可被取代基所取代。{Anion portion} In the formula (b1-1), R 0 101 is a polycyclic aliphatic hydrocarbon group. Among them, the hydrogen atom of the polycyclic aliphatic hydrocarbon group may be substituted by a substituent.

多環式脂肪族烴基,以由多環鏈烷去除1個氫原子而得之基為佳,該多環鏈烷,以碳數7~30者為佳。其中,該多環鏈烷,可列舉如:金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等具有交聯環系之多環式骨架的多環鏈烷;具有膽固醇骨架之環式基等縮合環系之具有多環式骨架的多環鏈烷等。其中,又以具有交聯環系之多環式骨架的多環鏈烷為佳。多環式脂肪族烴基的較佳具體例,可舉如:金剛烷基等。The polycyclic aliphatic hydrocarbon group is preferably a group obtained by removing one hydrogen atom from a polycyclic alkane, and the polycyclic alkane is preferably one having 7-30 carbons. Among them, the polycyclic alkane may include, for example, adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, and other polycyclic alkane having a cross-linked ring system with a polycyclic skeleton; Condensed ring systems such as a cyclic group having a cholesterol skeleton and a polycyclic alkane having a polycyclic skeleton, etc. Among them, polycyclic alkanes having a crosslinked ring system with a polycyclic skeleton are preferred. Preferred specific examples of the polycyclic aliphatic hydrocarbon group include adamantyl group and the like.

上述多環式脂肪族烴基的氫原子被取代時,該取代基,可列舉如:羥基、羧基、鹵素原子(氟原子、氯原子、溴原子等)、烷氧基(甲氧基、乙氧基、丙氧基、丁氧基等)、烷基氧羰基等。取代基中,就更容易抑制阻劑膜的未曝光部的缺陷之發生等觀點,又以羥基為佳。多環式脂肪族烴基的複數之氫原子,可各別獨立地被上述取代基等所取代。When the hydrogen atom of the polycyclic aliphatic hydrocarbon group is substituted, the substituent includes, for example, a hydroxyl group, a carboxyl group, a halogen atom (fluorine atom, chlorine atom, bromine atom, etc.), alkoxy (methoxy, ethoxy) Group, propoxy group, butoxy group, etc.), alkyloxycarbonyl group and the like. Among the substituents, it is easier to suppress the occurrence of defects in the unexposed portion of the resist film, and the hydroxyl group is preferred. The plural hydrogen atoms of the polycyclic aliphatic hydrocarbon group may be independently substituted with the above-mentioned substituents and the like.

式(b1-1)中,Y101 為單鍵或含有氧原子的2價之連結基。 Y101 為含有氧原子的2價之連結基時,該Y101 亦可含有氧原子以外的原子。氧原子以外的原子,例如:碳原子、氫原子、硫原子、氮原子等。 含有氧原子的2價之連結基,可列舉如:氧原子(醚鍵結:-O-)、酯鍵結(-C(=O)-O-)、氧羰基(-O-C(=O)-)、醯胺鍵結(-C(=O)-NH-)、羰基(-C(=O)-)、碳酸酯鍵結(-O-C(=O)-O-)等的非烴系之含有氧原子的連結基;該非烴系之含有氧原子的連結基與伸烷基之組合等。該組合中,可再連結磺醯基(-SO2 -)。該含有氧原子的2價之連結基,例如:下述通式(y-al-1)~(y-al-7)各別表示之連結基等。In the formula (b1-1), Y 101 is a single bond or a divalent linking group containing an oxygen atom. When Y 101 is a divalent linking group containing an oxygen atom, the Y 101 may contain atoms other than the oxygen atom. Atoms other than oxygen atoms, such as carbon atoms, hydrogen atoms, sulfur atoms, and nitrogen atoms. The divalent linking group containing an oxygen atom, for example, an oxygen atom (ether bond: -O-), an ester bond (-C(=O)-O-), an oxycarbonyl group (-OC(=O) -), amide bond (-C(=O)-NH-), carbonyl group (-C(=O)-), carbonate bond (-OC(=O)-O-) and other non-hydrocarbon systems The linking group containing oxygen atoms; the combination of the non-hydrocarbon linking group containing oxygen atoms and alkylene groups. In this combination, a sulfonyl group (-SO 2 -) can be connected. The divalent linking group containing an oxygen atom is, for example, a linking group represented by the following general formulas (y-al-1) to (y-al-7).

Figure 02_image107
[式中,V’101 為單鍵或碳數1~5之伸烷基,V’102 為碳數1~30的2價之飽和烴基]。
Figure 02_image107
[In the formula, V'101 is a single bond or an alkylene group having 1 to 5 carbons, and V'102 is a divalent saturated hydrocarbon group having 1 to 30 carbons].

V’102 中的2價之飽和烴基,以碳數1~30之伸烷基為佳,以碳數1~10之伸烷基為較佳,以碳數1~5之伸烷基為更佳。V '2 of the monovalent saturated hydrocarbon group 102, extends carbon number of alkyl group having 1 to 30 is preferable, and an alkylene group having a carbon number of 1 to 10 is preferred to extend 1 to 5 carbon atoms of the alkyl group is more good.

V’101 及V’102 中之伸烷基,可為直鏈狀之伸烷基亦可、支鏈狀之伸烷基亦可,又以直鏈狀之伸烷基為佳。 V’101 及V’102 中之伸烷基,具體而言,可列舉如:伸甲基[-CH2 -];-CH(CH3 )-、-CH(CH2 CH3 )-、-C(CH3 )2 -、   -C(CH3 )(CH2 CH3 )-、-C(CH3 )(CH2 CH2 CH3 )-、-C(CH2 CH3 )2 -等之烷基伸甲基;伸乙基[-CH2 CH2 -];-CH(CH3 )CH2 -、   -CH(CH3 )CH(CH3 )-、-C(CH3 )2 CH2 -、-CH(CH2 CH3 )CH2 -等之烷基伸乙基;伸三甲基(n-伸丙基)[-CH2 CH2 CH2 -];    -CH(CH3 )CH2 CH2 -、-CH2 CH(CH3 )CH2 -等之烷基伸三甲基;伸四甲基[-CH2 CH2 CH2 CH2 -]; -CH(CH3 )CH2 CH2 CH2 -、-CH2 CH(CH3 )CH2 CH2 -等之烷基伸四甲基;伸五甲基[-CH2 CH2 CH2 CH2 CH2 -]等。V '101 and V' 102 in the alkylene may be straight-chain alkylene it may, the alkylene chain may also be branched, again preferably straight chain alkylene of. V '101 and V' 102 in the alkylene group, specific examples thereof include such as: Methyl extension [-CH 2 -]; - CH (CH 3) -, - CH (CH 2 CH 3) -, - C(CH 3 ) 2 -, -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 -etc. Alkyl ethylene; ethylene [-CH 2 CH 2 -]; -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2- , -CH(CH 2 CH 3 )CH 2 -, etc. alkyl ethylene; trimethyl (n-propylene) [-CH 2 CH 2 CH 2 -]; -CH(CH 3 )CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 -and other alkyl trimethylidene; tetramethylidene [-CH 2 CH 2 CH 2 CH 2 -]; -CH(CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -such as alkyltetramethylene; pentamethyl [-CH 2 CH 2 CH 2 CH 2 CH 2 -] and so on.

Y101 以含有酯鍵結的2價之連結基,或含有醚鍵結的2價之連結基為佳。Y 101 is preferably a divalent linking group containing an ester bond, or a divalent linking group containing an ether bond.

式(b1-1)中,V101 為單鍵、伸烷基或氟化伸烷基。V101 中之伸烷基、氟化伸烷基,以碳數1~4為佳。V101 中之氟化伸烷基,例如:V101 中之伸烷基的氫原子之一部份或全部被氟原子取代而得之基等。其中,V101 又以單鍵,或碳數1~4之氟化伸烷基為佳,以碳數1~4之氟化伸烷基為較佳。In the formula (b1-1), V 101 is a single bond, an alkylene group or a fluorinated alkylene group. The alkylene group and fluorinated alkylene group in V 101 preferably have 1 to 4 carbon atoms. V 101 In the fluorinated alkylene group, for example: V 101 in the alkylene group, one hydrogen atom is partially or completely substituted by fluorine atoms of the group. Among them, V 101 is preferably a single bond or a fluorinated alkylene group having 1 to 4 carbon atoms, and a fluorinated alkylene group having 1 to 4 carbon atoms is preferred.

式(b1-1)中,R102 為氟原子或碳數1~5之氟化烷基。其中,又以氟原子或碳數1~5之全氟烷基為佳,以氟原子為較佳。In the formula (b1-1), R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. Among them, a fluorine atom or a perfluoroalkyl group having 1 to 5 carbon atoms is preferred, and a fluorine atom is preferred.

(b1-1)成份的陰離子部之具體例,例如:下述式(an-b-1)~(an-b-3)所表示之陰離子等。(b1-1) Specific examples of the anion portion of the component include, for example, anions represented by the following formulas (an-b-1) to (an-b-3).

Figure 02_image109
Figure 02_image109

{陽離子部} 式(b1-1)中,m為1以上之整數,且M’m 為m價之鎓陽離子,又以鋶陽離子、錪陽離子為較佳之例示,例如下述通式(ca-1)~(ca-4)各別表示之有機陽離子等。{} In the cation portion of formula (b1-1), m is an integer of 1 or more, and M 'm + m is the valence of the cation, again sulfonium cation, iodonium cation of the preferred embodiment illustrated, for example, by the following general formula (CA -1)~(ca-4) Organic cations, etc. respectively represented.

Figure 02_image111
[式中,R201 ~R207 及R211 ~R212 各別獨立表示可具有取代基的芳基、可具有取代基的烷基,或可具有取代基的烯基。R201 ~R203 、R206 ~R207 、R211 ~R212 可各別相互鍵結並與式中的硫原子共同形成環。R208 ~R209 表示各別獨立之氫原子或碳數1~5之烷基,或相互鍵結並與式中的硫原子共同形成環。R210 為可具有取代基的芳基、可具有取代基的烷基、可具有取代基的烯基,或可具有取代基的含-SO2 -之環式基。L201 表示-C(=O)-或-C(=O)-O-。複數個Y201 各別獨立表示伸芳基、伸烷基或伸烯基。x為1或2。W201 表示(x+1)價之連結基]。
Figure 02_image111
[In the formula, R 201 to R 207 and R 211 to R 212 each independently represent an optionally substituted aryl group, an optionally substituted alkyl group, or an optionally substituted alkenyl group. R 201 to R 203 , R 206 to R 207 , and R 211 to R 212 may be individually bonded to each other and form a ring with the sulfur atom in the formula. R 208 to R 209 represent independent hydrogen atoms or alkyl groups with 1 to 5 carbon atoms, or they are bonded to each other and form a ring with the sulfur atom in the formula. R 210 is an optionally substituted aryl group, an optionally substituted alkyl group, an optionally substituted alkenyl group, or an optionally substituted -SO 2 -containing cyclic group. L 201 represents -C(=O)- or -C(=O)-O-. A plurality of Y 201 each independently represents an arylene group, an alkylene group or an alkenylene group. x is 1 or 2. W 201 represents the link base of (x+1) valence].

R201 ~R207 及R211 ~R212 中之芳基,可列舉如:碳數6~20之芳基等,又以苯基、萘基為佳。 R201 ~R207 及R211 ~R212 中之烷基,以鏈狀或環狀之烷基,且為碳數1~30者為佳。 R201 ~R207 及R211 ~R212 中之烯基,以碳數2~10為佳。 R201 ~R207 及R211 ~R212 可具有的取代基,可列舉如:烷基、鹵素原子、鹵化烷基、羰基、氰基、胺基、芳基、下述通式(ca-r-1)~(ca-r-7)所各別表示之基等。The aryl groups in R 201 to R 207 and R 211 to R 212 include, for example, aryl groups with 6 to 20 carbon atoms, and phenyl and naphthyl are preferred. The alkyl group in R 201 to R 207 and R 211 to R 212 is preferably a chain or cyclic alkyl group having 1 to 30 carbon atoms. The alkenyl groups in R 201 to R 207 and R 211 to R 212 preferably have 2 to 10 carbon atoms. The substituents that R 201 to R 207 and R 211 to R 212 may have include, for example, alkyl groups, halogen atoms, halogenated alkyl groups, carbonyl groups, cyano groups, amino groups, aryl groups, and the following general formula (ca-r -1) ~ (ca-r-7) the base and so on.

Figure 02_image113
[式中,R’201 各別獨立為氫原子、可具有取代基之環式基、可具有取代基之鏈狀烷基,或可具有取代基之鏈狀烯基]。
Figure 02_image113
[Wherein, R '201 independently of each other a hydrogen atom, a cyclic group may have a substituent group, the group may have a substituent of an alkyl chain, or a chain substituent groups of the alkenyl group].

R’201 為可具有取代基之環式基、可具有取代基之鏈狀烷基,或可具有取代基之鏈狀烯基。 R'201 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent.

可具有取代基之環式基: 該環式基,以環狀之烴基為佳,該環狀之烴基,可為芳香族烴基亦可、脂肪族烴基亦可。脂肪族烴基係指,不具有芳香族性之烴基之意。又,脂肪族烴基,可為飽和者亦可、不飽和者亦可,通常以飽和者為佳。Cyclic groups that may have substituents: The cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group. An aliphatic hydrocarbon group means a hydrocarbon group that is not aromatic. In addition, the aliphatic hydrocarbon group may be saturated or unsaturated, and saturated ones are generally preferred.

R’201 中之芳香族烴基,為具有芳香環之烴基。該芳香族烴基之碳數以3~30為佳,以5~30為較佳,以5~20為更佳,以6~15為特佳,以6~10為最佳。其中,該碳數為不包含取代基中之碳數者。 R’201 中之芳香族烴基所具有的芳香環,具體而言,可列舉如:苯、茀、萘、蒽、菲、聯苯,或構成該些芳香環的碳原子之一部份被雜原子取代而得之芳香族雜環等。芳香族雜環中之雜原子,可列舉如:氧原子、硫原子、氮原子等。 R’201 中之芳香族烴基,具體而言,可列舉如:由前述芳香環去除1個氫原子而得之基(芳基:可列舉如:苯基、萘基等)、前述芳香環的氫原子中之1個被伸烷基取代而得之基(可列舉如:苄基、苯乙基、1-萘基甲基、2-萘基甲基、1-萘基乙基、2-萘基乙基等之芳烷基等)等。前述伸烷基(芳烷基中之烷鏈)之碳數,以1~4為佳,以1~2為較佳,以1為特佳。R '201 in the aromatic hydrocarbon group, an aromatic hydrocarbon group having rings. The carbon number of the aromatic hydrocarbon group is preferably 3-30, preferably 5-30, more preferably 5-20, particularly preferably 6-15, and most preferably 6-10. Wherein, the carbon number is one that does not include the carbon number in the substituent. R '201 in the aromatic hydrocarbon group has an aromatic ring, specific examples thereof include such as: benzene, fluorene, naphthalene, anthracene, phenanthrene, biphenyl, or an aromatic ring constituting the plurality of portion of one of the carbon atoms is heteroaryl Aromatic heterocyclic ring derived from atom substitution. Examples of heteroatoms in the aromatic heterocycle include oxygen atoms, sulfur atoms, and nitrogen atoms. R 'is an aromatic hydrocarbon group of 201, specifically, include such as: the aromatic ring is removed by a hydrogen atom to give the group (aryl group: include such as: phenyl, naphthyl, etc.), the aromatic ring One of the hydrogen atoms is substituted by an alkylene group (e.g., benzyl, phenethyl, 1-naphthylmethyl, 2-naphthylmethyl, 1-naphthylethyl, 2- Aralkyl groups such as naphthylethyl, etc.). The carbon number of the aforementioned alkylene (alkane chain in the aralkyl group) is preferably 1 to 4, preferably 1 to 2, and particularly preferably 1.

R’201 中之環狀脂肪族烴基,可列舉如:結構中含有環之脂肪族烴基等。 該結構中含有環之脂肪族烴基,可列舉如:脂環式烴基(由脂肪族烴環去除1個氫原子而得之基)、脂環式烴基鍵結於直鏈狀或支鏈狀脂肪族烴基的末端而得之基、脂環式烴基介於直鏈狀或支鏈狀脂肪族烴基中間而得之基等。 前述脂環式烴基,以碳數3~20為佳,以3~12為較佳。 前述脂環式烴基,可為多環式基亦可、單環式基亦可。單環式之脂環式烴基,以由單環鏈烷去除1個以上的氫原子而得之基為佳。該單環鏈烷,以碳數3~6者為佳,具體而言,可列舉如:環戊烷、環己烷等。多環式之脂環式烴基,以由多環鏈烷去除1個以上的氫原子而得之基為佳,該多環鏈烷,以碳數7~30者為佳。其中,該多環鏈烷又以金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等的具有交聯環系之多環式骨架的多環鏈烷;具有膽固醇骨架之環式基等縮合環系之具有多環式骨架的多環鏈烷為較佳。R '201 in the cyclic aliphatic hydrocarbon group include such as: aliphatic hydrocarbon group containing a ring of the structure. The aliphatic hydrocarbon group containing the ring in the structure, for example, alicyclic hydrocarbon group (a group obtained by removing one hydrogen atom from an aliphatic hydrocarbon ring), an alicyclic hydrocarbon group is bonded to a linear or branched aliphatic A group derived from the terminal of a group hydrocarbon group, a group derived from an alicyclic hydrocarbon group between a linear or branched aliphatic hydrocarbon group, etc. The aforementioned alicyclic hydrocarbon group preferably has a carbon number of 3-20, preferably 3-12. The aforementioned alicyclic hydrocarbon group may be a polycyclic group or a monocyclic group. The monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing one or more hydrogen atoms from a monocyclic alkane. The monocyclic alkane is preferably one having 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane. The polycyclic alicyclic hydrocarbon group is preferably a group obtained by removing more than one hydrogen atom from a polycyclic alkane, and the polycyclic alkane preferably has 7-30 carbon atoms. Among them, the polycyclic alkane is a polycyclic alkane with a cross-linked ring system such as adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc.; with cholesterol A polycyclic alkane having a polycyclic skeleton of a condensed ring system such as a cyclic group of the skeleton is preferable.

可具有取代基之鏈狀烷基: R’201 之鏈狀烷基,可為直鏈狀或支鏈狀之任一者。 直鏈狀之烷基,以碳數1~20為佳,以1~15為較佳,以1~10為最佳。具體而言,可列舉如:甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、十一烷基、十二烷基、十三烷基、異十三烷基、十四烷基、十五烷基、十六烷基、異十六烷基、十七烷基、十八烷基、十九烷基、二十烷基、二十一烷基、二十二烷基等。 支鏈狀之烷基,以碳數3~20為佳,以3~15為較佳,以3~10為最佳。具體而言,可列舉如:1-甲基乙基、1-甲基丙基、2-甲基丙基、1-甲基丁基、2-甲基丁基、3-甲基丁基、1-乙基丁基、2-乙基丁基、1-甲基戊基、2-甲基戊基、3-甲基戊基、4-甲基戊基等。Chain alkyl group may have a substituent group of: R 'alkyl chain of 201, may be any linear or branched chain of one. The linear alkyl group preferably has a carbon number of 1-20, preferably 1-15, and most preferably 1-10. Specifically, examples include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, undecyl, dodecyl, tridecyl Group, isotridecyl, tetradecyl, pentadecyl, hexadecyl, isohexadecyl, heptadecyl, octadecyl, nonadecyl, eicosyl, two Undecyl, behenyl, etc. The branched alkyl group preferably has a carbon number of 3-20, preferably 3-15, and most preferably 3-10. Specifically, examples include: 1-methylethyl, 1-methylpropyl, 2-methylpropyl, 1-methylbutyl, 2-methylbutyl, 3-methylbutyl, 1-ethylbutyl, 2-ethylbutyl, 1-methylpentyl, 2-methylpentyl, 3-methylpentyl, 4-methylpentyl, etc.

可具有取代基之鏈狀烯基: R’201 之鏈狀烯基,可為直鏈狀或支鏈狀之任一者皆可,又以碳數2~10為佳,以2~5為較佳,以2~4為更佳,以3為特佳。直鏈狀之烯基,例如:乙烯基、丙烯基(烯丙基)、丁炔基等。支鏈狀之烯基,可列舉如:1-甲基乙烯基、2-甲基乙烯基、1-甲基丙烯基、2-甲基丙烯基等。 鏈狀之烯基,於上述之中,又以直鏈狀之烯基為佳,以乙烯基、丙烯基為較佳,以乙烯基為特佳。Chain alkenyl group may have a substituent group of: R 'chain alkenyl group of 201, may be any linear or branched chain of one can, again preferably 2 to 10 carbon atoms, 2 to 5 Preferably, 2 to 4 are more preferable, and 3 is particularly preferable. Linear alkenyl, for example: vinyl, propenyl (allyl), butynyl, etc. Examples of the branched alkenyl group include 1-methylvinyl, 2-methylvinyl, 1-methylpropenyl, and 2-methylpropenyl. Among the above-mentioned chain alkenyl groups, linear alkenyl groups are preferred, vinyl and propenyl are preferred, and vinyl is particularly preferred.

R’201 之鏈狀烷基或烯基中的取代基,可列舉如:烷氧基、鹵素原子、鹵化烷基、羥基、羰基、硝基、胺基、上述R’201 中之環式基等。R 'chain alkyl or alkenyl substituent group 201 of the group may include: an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a carbonyl group, a nitro group, an amino group, the above-described R' are the cyclic group 201 Wait.

R201 ~R203 、R206 ~R207 、R211 ~R212 ,於相互鍵結並與式中的硫原子共同形成環時,其可介由硫原子、氧原子、氮原子等的雜原子,或羰基、-SO-、     -SO2 -、-SO3 -、-COO-、-CONH-或-N(RN )-(該RN 為碳數1~5之烷基)等的官能基予以鍵結。所形成之環,以式中的硫原子包含於該環骨架而形成的1個之環,包含硫原子,以3~10員環為佳,以5~7員環為特佳。所形成之環的具體例,例如:噻吩環、噻唑環、苯併噻吩環、噻蒽環、苯併噻吩環、二苯併噻吩環、9H-硫

Figure 108122559-A0304-12-01
Figure 108122559-A0304-12-02
環、氧硫
Figure 108122559-A0304-12-01
Figure 108122559-A0304-12-02
環、噻蒽環、啡噁噻環、四氫噻吩鎓環、四氫硫代吡喃鎓環等。When R 201 ~R 203 , R 206 ~R 207 , R 211 ~R 212 are bonded to each other and form a ring with the sulfur atom in the formula, they can be interposed by heteroatoms such as sulfur atom, oxygen atom, nitrogen atom, etc. , Or carbonyl, -SO-, -SO 2 -, -SO 3 -, -COO-, -CONH- or -N(R N )- (the RN is an alkyl group with 1 to 5 carbons), etc. The base is bonded. The formed ring is a ring formed by including a sulfur atom in the ring skeleton in the formula, and contains a sulfur atom. A 3-10 membered ring is preferred, and a 5-7 membered ring is particularly preferred. Specific examples of the ring formed, for example: thiophene ring, thiazole ring, benzothiophene ring, thianthene ring, benzothiophene ring, dibenzothiophene ring, 9H-sulfur
Figure 108122559-A0304-12-01
Figure 108122559-A0304-12-02
Ring, oxygen sulfur
Figure 108122559-A0304-12-01
Figure 108122559-A0304-12-02
Ring, thianthracene ring, phenanthrene ring, tetrahydrothiophenium ring, tetrahydrothiopyrylium ring, etc.

R208 ~R209 各別獨立表示氫原子或碳數1~5之烷基,又以氫原子或碳數1~3之烷基為佳,為烷基時,其亦可相互鍵結而形成環。R 208 to R 209 each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, and preferably a hydrogen atom or an alkyl group having 1 to 3 carbon atoms. When the alkyl group is an alkyl group, they may be formed by bonding to each other ring.

R210 為可具有取代基之芳基、可具有取代基之烷基、可具有取代基之烯基,或可具有取代基之含   -SO2 -之環式基。 R210 中之芳基,可列舉如:碳數6~20之無取代之芳基等,又以苯基、萘基為佳。 R210 中之烷基,以鏈狀或環狀之烷基,且為碳數1~30者為佳。 R210 中之烯基,以碳數2~10為佳。 R210 中,可具有取代基之-SO2 -環式基,以「含-SO2 -之多環式基」為佳,以上述通式(a5-r-1)所表示之基為較佳。R 210 is an optionally substituted aryl group, an optionally substituted alkyl group, an optionally substituted alkenyl group, or an optionally substituted -SO 2 -containing cyclic group. The aryl group in R 210 includes, for example, unsubstituted aryl groups with 6 to 20 carbon atoms, etc., and phenyl and naphthyl are preferred. The alkyl group in R 210 is preferably a chain or cyclic alkyl group with 1-30 carbon atoms. The alkenyl group in R 210 preferably has 2 to 10 carbon atoms. R 210 may be the group having a substituent -SO 2 - cyclic group, with "containing -SO 2 - many cyclic group" preferably, in the formula (a5-r-1) is a group represented by the more good.

Y201 各別獨立表示伸芳基、伸烷基或伸烯基。 Y201 中之伸芳基,可列舉如:由上述R210 中之芳基去除1個氫原子而得之基等。 Y201 中之伸烷基、伸烯基,可列舉如:由上述R’201 的鏈狀烷基、鏈狀烯基所例示之基去除1個氫原子而得之基等。Y 201 each independently represents an arylene group, an alkylene group or an alkenylene group. The aryl group in Y 201 includes, for example, a group obtained by removing one hydrogen atom from the aryl group in R 210 . 201 of the Y in the alkylene, alkenylene group may include: by the R 'alkyl chain, alkenyl chain 201 is illustrated removal of the group a group derived from the hydrogen atom and the like.

前述式(ca-4)中,x為1或2。 W201 為(x+1)價,即2價或3價之連結基。 W201 中的2價之連結基,以可具有取代基的2價之烴基為佳,可列舉如:與上述通式(a2-1)中之Ya21 為相同的可具有取代基的2價之烴基。W201 中的2價之連結基,可為直鏈狀、支鏈狀、環狀之任一者皆可,又以環狀為佳。其中,又以伸芳基的兩端組合2個的羰基而得之基為佳。伸芳基可列舉如:伸苯基、伸萘基等,又以伸苯基為特佳。 W201 中的3價之連結基,可列舉如:由前述W201 中的2價之連結基去除1個氫原子而得之基、前述2價之連結基再鍵結前述2價之連結基而得之基等。W201 中的3價之連結基,以伸芳基鍵結2個的羰基而得之基為佳。In the aforementioned formula (ca-4), x is 1 or 2. W 201 is (x+1) valence, that is, the linking base of divalent or trivalent. The divalent linking group in W 201 is preferably a divalent hydrocarbon group that may have a substituent, and examples thereof include the same divalent substituent that may have a substituent as Ya 21 in the above general formula (a2-1) The hydrocarbon group. The divalent linking group in W 201 may be linear, branched, or cyclic, and cyclic is preferred. Among them, a group obtained by combining two carbonyl groups at both ends of the aryl group is preferred. The arylene group may be exemplified by phenylene, naphthylene, etc., and phenylene is particularly preferred. W 201 of the trivalent linking group include such as: derived by removing one hydrogen atom from the aforementioned group of W 201 of the divalent linking group, the divalent linking group of the bonded and then the divalent linking group And get the base and so on. The trivalent linking group in W 201 is preferably a group obtained by bonding two carbonyl groups with an aryl group.

前述式(ca-1)所表示的較佳之陽離子,具體而言,可列舉如:下述化學式(ca-1-1)~(ca-1-78)、(ca-1-101)~(ca-1-149)各別表示之陽離子等。 下述化學式中,g1表示重複之數目,g1為1~5之整數。g2表示重複之數目,g2為0~20之整數。g3表示重複之數目,g3為0~20之整數。Preferred cations represented by the aforementioned formula (ca-1), specifically, include the following chemical formulas (ca-1-1)~(ca-1-78), (ca-1-101)~( ca-1-149) cations, etc. respectively expressed. In the following chemical formula, g1 represents the number of repetitions, and g1 is an integer of 1-5. g2 represents the number of repetitions, and g2 is an integer from 0 to 20. g3 represents the number of repetitions, and g3 is an integer from 0 to 20.

Figure 02_image115
Figure 02_image115

Figure 02_image117
Figure 02_image117

Figure 02_image119
Figure 02_image119

Figure 02_image121
Figure 02_image121

Figure 02_image123
Figure 02_image123

Figure 02_image125
Figure 02_image125

Figure 02_image127
Figure 02_image127

Figure 02_image129
Figure 02_image129

Figure 02_image131
Figure 02_image131

Figure 02_image133
[式中,R”201 為氫原子或取代基。該取代基,可列舉如:上述R201 ~R207 及R211 ~R212 可具有的取代基中所列舉的烷基、鹵素原子、鹵化烷基、羰基、氰基、胺基、芳基、通式(ca-r-1)~(ca-r-7)所各別表示之基等]。
Figure 02_image133
[In the formula, R" 201 is a hydrogen atom or a substituent. Examples of the substituent include alkyl groups, halogen atoms, and halogenated groups as mentioned in the substituents that R 201 to R 207 and R 211 to R 212 may have. Alkyl group, carbonyl group, cyano group, amino group, aryl group, groups represented by the general formulas (ca-r-1) to (ca-r-7), etc.].

前述式(ca-2)所表示的較佳之陽離子,具體而言,可列舉如:下述式(ca-2-1)~(ca-2-2)各別表示之陽離子、二苯基錪陽離子、雙(4-tert-丁基苯基)錪陽離子等。Preferred cations represented by the aforementioned formula (ca-2), specifically, cations represented by the following formulas (ca-2-1)~(ca-2-2), diphenylidium Cation, bis(4-tert-butylphenyl) iodonium cation, etc.

Figure 02_image135
Figure 02_image135

前述式(ca-3)所表示的較佳之陽離子,具體而言,可列舉如:下述式(ca-3-1)~(ca-3-7)各別表示之陽離子等。Preferable cations represented by the aforementioned formula (ca-3) include, specifically, cations represented by the following formulas (ca-3-1) to (ca-3-7), and the like.

Figure 02_image137
Figure 02_image137

前述式(ca-4)所表示的較佳之陽離子,具體而言,可列舉如:下述式(ca-4-1)~(ca-4-2)各別表示之陽離子等。Preferable cations represented by the aforementioned formula (ca-4), specifically, cations represented by the following formulas (ca-4-1) to (ca-4-2), etc.

Figure 02_image139
Figure 02_image139

上述之中,陽離子部((Mm )1/m ),又以通式(ca-1)所表示之陽離子為佳,以化學式(ca-1-1)~(ca-1-78)、(ca-1-101)~(ca-1-149)各別表示之陽離子為較佳。Among the above, the cation part ((M m + ) 1/m ) is preferably the cation represented by the general formula (ca-1), and the chemical formula (ca-1-1)~(ca-1-78) The cations represented by (ca-1-101)~(ca-1-149) are preferred.

(B1)成份,於上述之中,又以下述式(b1-1-1)所表示之化合物(B11)為更佳。(B1) Among the above components, the compound (B11) represented by the following formula (b1-1-1) is more preferable.

Figure 02_image141
[式中,R0 201 為具有羥基的多環式脂肪族烴基。R102 為氟原子或碳數1~5之氟化烷基。V0 101 為碳數1~4之氟化伸烷基。m為1以上之整數,且M’m 為m價之鎓陽離子]。
Figure 02_image141
[In the formula, R 0 201 is a polycyclic aliphatic hydrocarbon group having a hydroxyl group. R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. V 0 101 is a fluorinated alkylene group having 1 to 4 carbon atoms. m is an integer of 1 or more, and M 'm + is an onium cation of valence m].

式(b1-1-1)中,R0 201 為具有羥基的多環式脂肪族烴基。多環式脂肪族烴基中的複數之氫原子,可被羥基所取。 多環式脂肪族烴基,例如與式(b1-1)中之R0 101 所說明之內容為相同之內容。In the formula (b1-1-1), R 0 201 is a polycyclic aliphatic hydrocarbon group having a hydroxyl group. The plural hydrogen atoms in the polycyclic aliphatic hydrocarbon group can be taken by the hydroxyl group. The polycyclic aliphatic hydrocarbon group has, for example, the same content as that described in R 0 101 in the formula (b1-1).

式(b1-1-1)中,R102 為氟原子或碳數1~5之氟化烷基,其與式(b1-1)中所說明之內容為相同之內容。 式(b1-1-1)中,V0 101 為碳數1~4之氟化伸烷基。V0 101 中之氟化伸烷基,例如:伸烷基的氫原子之一部份或全部被氟原子取代而得之基等。其中,又以伸烷基的氫原子之一部份被氟原子取代而得之基為佳。V0 101 之氟化伸烷基中,氟原子之數以1~6為佳,以1~3為較佳,以2或3為更佳。In the formula (b1-1-1), R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms, which is the same as the content explained in the formula (b1-1). In the formula (b1-1-1), V 0 101 is a fluorinated alkylene group having 1 to 4 carbon atoms. The fluorinated alkylene group in V 0 101 , for example: a part or all of the hydrogen atoms of the alkylene group are substituted by fluorine atoms. Among them, a group obtained by replacing part of the hydrogen atoms of the alkylene group with fluorine atoms is preferred. In the fluorinated alkylene group of V 0 101 , the number of fluorine atoms is preferably 1 to 6, preferably 1 to 3, and more preferably 2 or 3.

式(b1-1-1)中,M’m 與式(b1-1)中所說明之內容為相同之內容。In the formula (b1-1-1), M 'm + content in the formula (b1-1) described the same as the contents.

本實施形態中,阻劑組成物之(B1)成份,其較佳之具體例如以下所示;但並不僅限定於該內容。In this embodiment, the preferred specific examples of the component (B1) of the resist composition are as follows; however, it is not limited to this content.

Figure 02_image143
Figure 02_image143

本實施形態中的阻劑組成物之(B1)成份,可單獨使用1種亦可、將2種以上合併使用亦可。The (B1) component of the resist composition in this embodiment may be used alone or in combination of two or more.

本實施形態中的阻劑組成物之(B1)成份之含量,相對於(A)成份100質量份,以50質量份以下為佳,以1~40質量份為較佳,以5~30質量份為更佳。 (B1)成份之含量為上述下限值以上時,於阻劑圖型之形成中,可更提升感度、解析性能、降低LWR(Line Wise Roughness)、形狀等的微影蝕刻特性,或更有效地抑制阻劑膜的未曝光部之缺陷的發生。 (B1)成份之含量為上述上限值以下時,於各成份溶解於有機溶劑之際,可容易製得均勻的溶液,並能更提高阻劑組成物之保存安定性。The content of the (B1) component of the resist composition in this embodiment is preferably 50 parts by mass or less, preferably 1-40 parts by mass, and 5-30 parts by mass relative to 100 parts by mass of the (A) component Servings are better. (B1) When the content of the component is above the above lower limit, in the formation of the resist pattern, the sensitivity, resolution performance, LWR (Line Wise Roughness), shape and other lithographic etching characteristics can be reduced, or more effective It suppresses the occurrence of defects in the unexposed part of the resist film. (B1) When the content of the component is below the above upper limit, when each component is dissolved in an organic solvent, a uniform solution can be easily prepared, and the storage stability of the resist composition can be improved.

阻劑組成物中,於對(A)成份進行作用而生成酸的酸產生劑成份(B)成份全體中,上述(B1)成份之比例,例如為50質量%以上,較佳為70質量%以上,更佳為95質量%以上。又,亦可為100質量%。 (B1)成份之比例,於前述較佳範圍的下限值以上時,可更降低阻劑膜的未曝光部之缺陷的發生。In the resist composition, the ratio of the above-mentioned (B1) component is, for example, 50% by mass or more, preferably 70% by mass in the total acid generator component (B) that acts on component (A) to generate acid Above, more preferably 95% by mass or more. In addition, it may be 100% by mass. (B1) When the ratio of the components is more than the lower limit of the aforementioned preferable range, the occurrence of defects in the unexposed part of the resist film can be further reduced.

<任意成份> 本實施形態中的阻劑組成物,可再含有上述(A)成份及(B1)成份以外的成份(任意成份)。 該任意成份,可列舉如:以下所示之(B2)成份、(D)成份、(E)成份、(F)成份、(S)成份等。<Optional ingredients> The resist composition in this embodiment may further contain components (optional components) other than the above-mentioned (A) component and (B1) component. The optional components include (B2) component, (D) component, (E) component, (F) component, (S) component, etc. as shown below.

≪(B2)成份≫ 本實施形態中的阻劑組成物,於無損本發明效果之範圍時,可含有上述(B1)成份以外的酸產生劑成份(以下,亦稱為「(B2)成份」)。 (B2)成份,並未有特別之限定,其可使用目前為止被提案作化學增幅型阻劑組成物用之酸產生劑者。 該些酸產生劑,可列舉如:錪鹽或鋶鹽等的鎓鹽系酸產生劑、肟磺酸酯系酸產生劑;雙烷基或雙芳基磺醯基重氮甲烷類、聚(雙磺醯基)重氮甲烷類等的重氮甲烷系酸產生劑;硝基苄基磺酸酯系酸產生劑、亞胺磺酸酯系酸產生劑、二碸系酸產生劑等多種的成份。≪(B2) Ingredients≫ The resist composition in the present embodiment may contain acid generator components other than the above-mentioned (B1) component (hereinafter, also referred to as "(B2) component") without impairing the effect of the present invention. (B2) The ingredients are not particularly limited, and the acid generators that have been proposed so far as chemically amplified resist compositions can be used. These acid generators include, for example, onium salt-based acid generators such as iodonium salt or sulfonium salt, oxime sulfonate-based acid generators; dialkyl or bisarylsulfonyl diazomethanes, poly( Diazomethane acid generators such as bissulfonyl) diazomethanes; nitrobenzyl sulfonate acid generators, iminosulfonate acid generators, diazonium acid generators, etc. Ingredients.

鎓鹽系酸產生劑,例如:下述通式(b-1)所表示之化合物(以下,亦稱為「(b-1)成份」)、通式(b-2)所表示之化合物(以下,亦稱為「(b-2)成份」)或通式(b-3)所表示之化合物(以下,亦稱為「(b-3)成份」)等。又,(b-1)成份為不含有相當於上述(B1)成份之化合物。Onium salt-based acid generators, for example: the compound represented by the following general formula (b-1) (hereinafter, also referred to as "(b-1) component"), the compound represented by the general formula (b-2) ( Hereinafter, it is also referred to as "(b-2) component") or a compound represented by general formula (b-3) (hereinafter, also referred to as "(b-3) component"), etc. In addition, the component (b-1) does not contain a compound corresponding to the component (B1).

Figure 02_image145
[式中,R101 、R104 ~R108 各別獨立為可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基。R104 、R105 可相互鍵結而形成環。R102 為氟原子或碳數1~5之氟化烷基;Y101 為單鍵,或含有氧原子的2價之連結基;V101 ~V103 各別獨立為單鍵、伸烷基或氟化伸烷基。L101 ~L102 各別獨立為單鍵或氧原子。L103 ~L105 各別獨立為單鍵、-CO-或-SO2 -。m為1以上之整數,且M’m 為m價之鎓陽離子]。
Figure 02_image145
[In the formula, R 101 , R 104 to R 108 are each independently a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent. R 104 and R 105 may be bonded to each other to form a ring. R 102 is a fluorine atom or a fluorinated alkyl group with 1 to 5 carbon atoms; Y 101 is a single bond or a divalent linking group containing an oxygen atom; V 101 to V 103 are each independently a single bond, alkylene group or Fluorinated alkylene. L 101 to L 102 are each independently a single bond or an oxygen atom. L 103 to L 105 are each independently a single bond, -CO- or -SO 2 -. m is an integer of 1 or more, and M 'm + is an onium cation of valence m].

{陰離子部} ・(b-1)成份之陰離子部 式(b-1)中,R101 為可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基。{Anion part} ・In formula (b-1) of the anion part of component (b-1), R 101 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or may have a substituent The chain of alkenyl.

可具有取代基的環式基: 該環式基,以環狀之烴基為佳,該環狀之烴基,可為芳香族烴基亦可、脂肪族烴基亦可。脂肪族烴基係指,不具有芳香族性之烴基之意。又,脂肪族烴基,可為飽和者亦可、不飽和者亦可,通常以飽和者為佳。Cyclic groups that may have substituents: The cyclic group is preferably a cyclic hydrocarbon group, and the cyclic hydrocarbon group may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group. An aliphatic hydrocarbon group means a hydrocarbon group that is not aromatic. In addition, the aliphatic hydrocarbon group may be saturated or unsaturated, and saturated ones are generally preferred.

R101 中之芳香族烴基,為具有芳香環之烴基。該芳香族烴基之碳數,以3~30為佳,以碳數5~30為較佳,以碳數5~20為更佳,以碳數6~15為特佳,以碳數6~12為最佳。其中,該碳數為不包含取代基中之碳數者。 R101 中之芳香族烴基所具有的芳香環,具體而言,可列舉如:苯、茀、萘、蒽、菲、聯苯,或構成該些芳香環的碳原子之一部份被雜原子取代而得之芳香族雜環等。芳香族雜環中之雜原子,可列舉如:氧原子、硫原子、氮原子等。R101 中之芳香族烴基所具有的芳香環,就與(A)成份之相溶性等觀點,以不含雜原子者為佳,又以苯、茀、萘、蒽、菲、聯苯等的芳香環為佳。 R101 中之芳香族烴基,具體而言,可列舉如:由前述芳香環去除1個氫原子而得之基(芳基:可列舉如:苯基、萘基等)、前述芳香環的氫原子中之1個被伸烷基取代而得之基(可列舉如:苄基、苯乙基、1-萘基甲基、2-萘基甲基、1-萘基乙基、2-萘基乙基等之芳烷基等)等。前述伸烷基(芳烷基中之烷鏈)之碳數,以1~4為佳,以碳數1~2為較佳,以碳數1為特佳。The aromatic hydrocarbon group in R 101 is a hydrocarbon group having an aromatic ring. The carbon number of the aromatic hydrocarbon group is preferably 3-30, preferably 5-30, more preferably 5-20, particularly preferably 6-15, and 6- 12 is the best. Wherein, the carbon number is one that does not include the carbon number in the substituent. The aromatic ring possessed by the aromatic hydrocarbon group in R 101 , specifically, can be exemplified as: benzene, sulphur, naphthalene, anthracene, phenanthrene, biphenyl, or a part of the carbon atoms constituting these aromatic rings are heteroatoms Aromatic heterocyclic ring derived from substitution. Examples of heteroatoms in the aromatic heterocycle include oxygen atoms, sulfur atoms, and nitrogen atoms. The aromatic ring of the aromatic hydrocarbon group in R 101 , from the viewpoint of compatibility with component (A), is preferably one that does not contain heteroatoms, and it is also benzene, fen, naphthalene, anthracene, phenanthrene, biphenyl, etc. Aromatic ring is preferred. Specifically, the aromatic hydrocarbon group in R 101 includes a group obtained by removing one hydrogen atom from the aforementioned aromatic ring (aryl group: exemplified by phenyl, naphthyl, etc.), and hydrogen of the aforementioned aromatic ring One of the atoms is substituted by alkylene group (e.g., benzyl, phenethyl, 1-naphthylmethyl, 2-naphthylmethyl, 1-naphthylethyl, 2-naphthalene Aralkyl, etc.), etc. The carbon number of the aforementioned alkylene (alkane chain in the aralkyl group) is preferably 1 to 4, preferably 1 to 2 carbons, and particularly preferably 1 carbon.

R101 中之環狀脂肪族烴基,可列舉如:結構中含有環之脂肪族烴基等。 該結構中含有環之脂肪族烴基,可列舉如:脂環式烴基(由脂肪族烴環去除1個氫原子而得之基)、脂環式烴基鍵結於直鏈狀或支鏈狀脂肪族烴基的末端而得之基、脂環式烴基介於直鏈狀或支鏈狀脂肪族烴基中間而得之基等。 前述脂環式烴基,以碳數3~20為佳,以碳數3~12為較佳。 前述脂環式烴基,可列舉如:單環式之脂環式烴基等,又以由單環鏈烷去除1個以上的氫原子而得之基為佳。該單環鏈烷,以碳數3~6者為佳,具體而言,可列舉如:環戊烷、環己烷等。The cyclic aliphatic hydrocarbon group in R 101 includes, for example, an aliphatic hydrocarbon group containing a ring in the structure. The aliphatic hydrocarbon group containing the ring in the structure, for example, alicyclic hydrocarbon group (a group obtained by removing one hydrogen atom from an aliphatic hydrocarbon ring), an alicyclic hydrocarbon group is bonded to a linear or branched aliphatic A group derived from the terminal of a group hydrocarbon group, a group derived from an alicyclic hydrocarbon group between a linear or branched aliphatic hydrocarbon group, etc. The aforementioned alicyclic hydrocarbon group preferably has 3 to 20 carbon atoms, and more preferably 3 to 12 carbon atoms. The aforementioned alicyclic hydrocarbon group includes, for example, a monocyclic alicyclic hydrocarbon group, etc., and it is preferably a group obtained by removing one or more hydrogen atoms from a monocyclic alkane. The monocyclic alkane is preferably one having 3 to 6 carbon atoms, and specific examples thereof include cyclopentane and cyclohexane.

其中,R101 中之環狀脂肪族烴基,又以由單環鏈烷或多環鏈烷去除1個以上的氫原子而得之基為佳,由單環鏈烷去除1個氫原子而得之基為較佳,由環戊烷或環己烷去除1個氫原子而得之基為特佳。Among them, the cyclic aliphatic hydrocarbon group in R 101 is preferably obtained by removing more than one hydrogen atom from a monocyclic alkane or polycyclic alkane, and it is obtained by removing one hydrogen atom from a monocyclic alkane. The group is preferable, and the group obtained by removing one hydrogen atom from cyclopentane or cyclohexane is particularly preferable.

可鍵結於脂環式烴基之直鏈狀脂肪族烴基,以碳數為1~10為佳,以碳數1~6為較佳,以碳數1~4為更佳,以碳數1~3為最佳。直鏈狀脂肪族烴基,以直鏈狀之伸烷基為佳,具體而言,可列舉如:伸甲基[-CH2 -]、伸乙基[-(CH2 )2 -]、伸三甲基[-(CH2 )3 -]、伸四甲基       [-(CH2 )4 -]、伸五甲基[-(CH2 )5 -]等。 可鍵結於脂環式烴基之支鏈狀脂肪族烴基,以碳數2~10為佳,以碳數3~6為較佳,以碳數3或4為更佳,以碳數3為最佳。支鏈狀脂肪族烴基,以支鏈狀之伸烷基為佳,具體而言,可列舉如:-CH(CH3 )-、-CH(CH2 CH3 )-、 -C(CH3 )2 -、-C(CH3 )(CH2 CH3 )-、-C(CH3 )(CH2 CH2 CH3 )-、 -C(CH2 CH3 )2 -等之烷基伸甲基;-CH(CH3 )CH2 -、       -CH(CH3 )CH(CH3 )-、-C(CH3 )2 CH2 -、-CH(CH2 CH3 )CH2 -、  -C(CH2 CH3 )2 -CH2 -等之烷基伸乙基;-CH(CH3 )CH2 CH2 -、 -CH2 CH(CH3 )CH2 -等之烷基伸三甲基; -CH(CH3 )CH2 CH2 CH2 -、-CH2 CH(CH3 )CH2 CH2 -等之烷基伸四甲基等之烷基伸烷基等。烷基伸烷基中之烷基,以碳數1~5之直鏈狀之烷基為佳。A straight-chain aliphatic hydrocarbon group that can be bonded to an alicyclic hydrocarbon group, preferably having 1 to 10 carbons, preferably 1 to 6 carbons, more preferably 1 to 4 carbons, and 1 ~3 is the best. The straight-chain aliphatic hydrocarbon group is preferably a straight-chain alkylene group. Specifically, examples include: methylidene [-CH 2 -], ethylidene [-(CH 2 ) 2 -], Methyl [-(CH 2 ) 3 -], tetramethylene [-(CH 2 ) 4 -], pentamethyl [-(CH 2 ) 5 -], etc. A branched aliphatic hydrocarbon group that can be bonded to an alicyclic hydrocarbon group, preferably with a carbon number of 2-10, preferably a carbon number of 3-6, more preferably a carbon number of 3 or 4, and a carbon number of 3 optimal. The branched aliphatic hydrocarbon group is preferably a branched alkylene group, specifically, for example: -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2- , -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 -etc. alkylene; -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 CH 3 ) 2 -CH 2 -and other alkylene groups; -CH(CH 3 )CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 -and other alkyl groups; -CH( CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -and other alkylene groups such as tetramethyl group and the like. The alkyl group in the alkylene group is preferably a straight-chain alkyl group with 1 to 5 carbon atoms.

R101 的環式基中之取代基,可列舉如:烷基、烷氧基、鹵素原子、鹵化烷基、羥基、硝基、羰基等。 作為取代基之烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為最佳。 作為取代基之烷氧基,以碳數1~5之烷氧基為佳,以甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基為較佳,以甲氧基、乙氧基為最佳。 作為取代基之鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 作為取代基之鹵化烷基,例如碳數1~5之烷基,可列舉如:甲基、乙基、丙基、n-丁基、tert-丁基等的氫原子之一部份或全部被前述鹵素原子取代而得之基等。 作為取代基之羰基,為取代構成環狀烴基的伸甲基 (-CH2 -)之基。 其中,R101 的環式基中之取代基,就與(A)成份之相溶性等觀點,又以烷基、鹵素原子、鹵化烷基等為佳,烷基為較佳。Examples of the substituents in the cyclic group of R 101 include alkyl groups, alkoxy groups, halogen atoms, halogenated alkyl groups, hydroxyl groups, nitro groups, carbonyl groups, and the like. As the alkyl group as the substituent, an alkyl group having 1 to 5 carbon atoms is preferred, and methyl, ethyl, propyl, n-butyl, and tert-butyl are preferred. As the alkoxy group of the substituent, an alkoxy group having 1 to 5 carbon atoms is preferred, and methoxy, ethoxy, n-propoxy, iso-propoxy, n-butoxy, tert- Butoxy is preferred, and methoxy and ethoxy are the most preferred. The halogen atom of the substituent includes, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom, etc., and a fluorine atom is preferred. As the halogenated alkyl group of the substituent, for example, an alkyl group having 1 to 5 carbon atoms, such as a part or all of hydrogen atoms such as methyl, ethyl, propyl, n-butyl, tert-butyl, etc. Substitution by the aforementioned halogen atom, etc. The carbonyl group as a substituent is a group substituted for the methylene group (-CH 2 -) constituting the cyclic hydrocarbon group. Among them, the substituent in the cyclic group of R 101 is preferably an alkyl group, a halogen atom, a halogenated alkyl group, etc., from the viewpoint of compatibility with component (A), and an alkyl group is preferred.

可具有取代基的鏈狀之烷基: R101 之鏈狀烷基,可為直鏈狀或支鏈狀之任一者。 直鏈狀之烷基,以碳數1~20為佳,以碳數1~15為較佳,以碳數1~10為最佳。具體而言,可列舉如:甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、十一烷基、十二烷基、十三烷基、異十三烷基、十四烷基、十五烷基、十六烷基、異十六烷基、十七烷基、十八烷基、十九烷基、二十烷基、二十一烷基、二十二烷基等。 支鏈狀之烷基,以碳數3~20為佳,以碳數3~15為較佳,以碳數3~10為最佳。具體而言,可列舉如:1-甲基乙基、1,1-二甲基乙基、1-甲基丙基、2-甲基丙基、1-甲基丁基、2-甲基丁基、3-甲基丁基、1-乙基丁基、2-乙基丁基、1-甲基戊基、2-甲基戊基、3-甲基戊基、4-甲基戊基等。The chain alkyl group which may have a substituent: The chain alkyl group of R 101 may be either linear or branched. The linear alkyl group preferably has 1 to 20 carbon atoms, preferably 1 to 15 carbon atoms, and most preferably 1 to 10 carbon atoms. Specifically, examples include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, undecyl, dodecyl, tridecyl Group, isotridecyl, tetradecyl, pentadecyl, hexadecyl, isohexadecyl, heptadecyl, octadecyl, nonadecyl, eicosyl, two Undecyl, behenyl, etc. The branched alkyl group preferably has 3 to 20 carbons, preferably 3 to 15 carbons, and most preferably 3 to 10 carbons. Specifically, examples include: 1-methylethyl, 1,1-dimethylethyl, 1-methylpropyl, 2-methylpropyl, 1-methylbutyl, 2-methyl Butyl, 3-methylbutyl, 1-ethylbutyl, 2-ethylbutyl, 1-methylpentyl, 2-methylpentyl, 3-methylpentyl, 4-methylpentyl Base etc.

可具有取代基的鏈狀之烯基: R101 之鏈狀烯基,可為直鏈狀或支鏈狀之任一者皆可,又以碳數2~10為佳,以碳數2~5為較佳,以碳數2~4為更佳,以碳數3為特佳。直鏈狀之烯基,例如:乙烯基、丙烯基(烯丙基)、丁炔基等。支鏈狀之烯基,可列舉如:1-甲基乙烯基、2-甲基乙烯基、1-甲基丙烯基、2-甲基丙烯基等。 鏈狀之烯基,於上述之中,又以直鏈狀之烯基為佳,以乙烯基、丙烯基為較佳,以乙烯基為特佳。The chain-like alkenyl group which may have a substituent: The chain-like alkenyl group of R 101 can be either linear or branched, and preferably has a carbon number of 2 to 10, and a carbon number of 2 to 5 is preferred, carbon number 2 to 4 is more preferred, and carbon number 3 is particularly preferred. Linear alkenyl, for example: vinyl, propenyl (allyl), butynyl, etc. Examples of the branched alkenyl group include 1-methylvinyl, 2-methylvinyl, 1-methylpropenyl, and 2-methylpropenyl. Among the above-mentioned chain alkenyl groups, linear alkenyl groups are preferred, vinyl and propenyl are preferred, and vinyl is particularly preferred.

R101 之鏈狀烷基或烯基中的取代基,可列舉如:烷氧基、鹵素原子(氟原子、氯原子、溴原子、碘原子等)、鹵化烷基、羥基、羰基、硝基、胺基、上述R101 中之環式基等。 其中,R101 之鏈狀烷基或烯基中的取代基,就與(A)成份之相溶性等觀點,又以鹵素原子、鹵化烷基、上述R101 中之環式基所列舉之基等為佳,又以上述R101 中之環式基所列舉之基為較佳。The substituents in the chain alkyl or alkenyl group of R 101 include, for example, alkoxy, halogen atom (fluorine atom, chlorine atom, bromine atom, iodine atom, etc.), halogenated alkyl group, hydroxyl group, carbonyl group, nitro group , Amine group, cyclic group in the above R 101 , etc. Wherein chain alkyl or alkenyl group of R 101 substituents, and on the (A) ingredient and the like compatibility viewpoint, again a halogen atom, a halogenated alkyl group, R 101 in the above-described cyclic group enumerated yl Etc. are preferable, and the groups exemplified in the cyclic group in R 101 above are preferable.

上述之中,R101 又以可具有取代基的環式基為佳,以可具有取代基的環狀之烴基為較佳。更具體而言,可列舉如:由苯基、萘基、多環鏈烷去除1個以上的氫原子而得之基;前述通式(a2-r-1)、(a2-r-3)~(a2-r-7)各別表示之含內酯之環式基;前述通式(a5-r-1)~(a5-r-4)各別表示之含-SO2 -之環式基等為佳。Among the above, R 101 is preferably a cyclic group which may have a substituent, and preferably a cyclic hydrocarbon group which may have a substituent. More specifically, examples include groups obtained by removing one or more hydrogen atoms from phenyl, naphthyl, and polycyclic alkanes; the aforementioned general formulas (a2-r-1), (a2-r-3) ~(a2-r-7) The lactone-containing cyclic group separately represented; The aforementioned general formulas (a5-r-1)~(a5-r-4) respectively represent the -SO 2 -containing cyclic formula The base is better.

前述式(b-1)中,Y101 為單鍵或含有氧原子的2價之連結基。 Y101 為含有氧原子的2價之連結基時,該Y101 亦可含有氧原子以外的原子。氧原子以外的原子,例如:碳原子、氫原子、硫原子、氮原子等。 該含有氧原子的2價之連結基,可列舉如:上述通式(y-al-1)~(y-al-8)各別表示之連結基等。 Y101 以含有酯鍵結的2價之連結基,或含有醚鍵結的2價之連結基為佳,以上述通式(y-al-1)~(y-al-5)各別表示之連結基為較佳。In the aforementioned formula (b-1), Y 101 is a single bond or a divalent linking group containing an oxygen atom. When Y 101 is a divalent linking group containing an oxygen atom, the Y 101 may contain atoms other than the oxygen atom. Atoms other than oxygen atoms, such as carbon atoms, hydrogen atoms, sulfur atoms, and nitrogen atoms. Examples of the divalent linking group containing an oxygen atom include linking groups represented by the general formulas (y-al-1) to (y-al-8). Y 101 is preferably a divalent linking group containing ester linkage, or a divalent linking group containing ether linkage, and is represented by the above general formulas (y-al-1) ~ (y-al-5) respectively The linking base is better.

前述式(b-1)中,V101 為單鍵、伸烷基或氟化伸烷基。V101 中之伸烷基、氟化伸烷基,以碳數1~4為佳。V101 中之氟化伸烷基,例如:V101 中之伸烷基的氫原子之一部份或全部被氟原子取代而得之基等。其中,V101 又以單鍵,或碳數1~4之氟化伸烷基為佳。In the aforementioned formula (b-1), V 101 is a single bond, an alkylene group or a fluorinated alkylene group. The alkylene group and fluorinated alkylene group in V 101 preferably have 1 to 4 carbon atoms. V 101 In the fluorinated alkylene group, for example: V 101 in the alkylene group, one hydrogen atom is partially or completely substituted by fluorine atoms of the group. Among them, V 101 is preferably a single bond or a fluorinated alkylene group with 1 to 4 carbon atoms.

前述式(b-1)中,R102 為氟原子或碳數1~5之氟化烷基。R102 以氟原子或碳數1~5之全氟烷基為佳,以氟原子為較佳。In the aforementioned formula (b-1), R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. R 102 is preferably a fluorine atom or a perfluoroalkyl group having 1 to 5 carbon atoms, and preferably a fluorine atom.

(b-1)成份的陰離子部之具體例,例如:Y101 為單鍵時,可列舉如:三氟甲烷磺酸酯陰離子或全氟丁烷磺酸酯陰離子等的氟化烷基磺酸酯陰離子;Y101 為含有氧原子的2價之連結基時,可列舉如:下述式(an1)~(an3)中任一者所表示之陰離子等。(b-1) Specific examples of the anion part of the component, for example, when Y 101 is a single bond, fluorinated alkyl sulfonic acids such as trifluoromethanesulfonate anion or perfluorobutanesulfonate anion Ester anion; when Y 101 is a divalent linking group containing an oxygen atom, examples include anions represented by any of the following formulas (an1) to (an3).

Figure 02_image147
[式中,R”101 為可具有取代基的脂肪族環式基、上述化學式(r-hr-1)~(r-hr-6)各別表示之1價之雜環式基,或可具有取代基的鏈狀之烷基。R”102 為可具有取代基的脂肪族環式基、前述通式(a2-r-1)、(a2-r-3)~(a2-r-7)各別表示之含內酯之環式基,或前述通式(a5-r-1)~(a5-r-4)各別表示之含-SO2 -之環式基。R”103 為可具有取代基的芳香族環式基、可具有取代基的脂肪族環式基,或可具有取代基的鏈狀之烯基。V”101 為碳數1~4之伸烷基,或碳數1~4之氟化伸烷基。R102 為氟原子或碳數1~5之氟化烷基。v”各別獨立為0~3之整數,q”各別獨立為1~20之整數,n”為0或1]。
Figure 02_image147
[In the formula, R" 101 is an aliphatic cyclic group which may have a substituent, a monovalent heterocyclic group represented by the above chemical formulas (r-hr-1) to (r-hr-6), or A chain-like alkyl group having substituents. R" 102 is an aliphatic cyclic group which may have substituents, the aforementioned general formulas (a2-r-1), (a2-r-3) to (a2-r-7) ) The lactone-containing cyclic group represented separately, or the -SO 2 -containing cyclic group represented by the aforementioned general formulas (a5-r-1) to (a5-r-4). R" 103 is an optionally substituted aromatic cyclic group, an optionally substituted aliphatic cyclic group, or an optionally substituted chain alkenyl group. V" 101 is an alkylene group having 1 to 4 carbons Group, or a fluorinated alkylene group with 1 to 4 carbon atoms. R 102 is a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. v" is independently an integer of 0 to 3, q" is independently an integer of 1 to 20, and n" is 0 or 1].

R”101 、R”102 及R”103 的可具有取代基的脂肪族環式基,以前述式(b-1)中之R101 中被例示作為環狀脂肪族烴基之基為佳。前述取代基,與前述式(b-1)中之R101 中之可取代環狀脂肪族烴基的取代基為相同之內容。The aliphatic cyclic group which may have a substituent of R" 101 , R " 102 and R" 103 is preferably a group exemplified as a cyclic aliphatic hydrocarbon group in R 101 in the aforementioned formula (b-1). The substituent has the same content as the substituent of the substitutable cycloaliphatic hydrocarbon group in R 101 in the aforementioned formula (b-1).

R”103 中之可具有取代基的芳香族環式基,以前述式(b-1)中之R101 中被例示作為環狀烴基中之芳香族烴基之基為佳。前述取代基,與前述式(b-1)中之R101 中之可取代該芳香族烴基的取代基為相同之內容。The aromatic cyclic group which may have a substituent in R" 103 is preferably the group exemplified as the aromatic hydrocarbon group in the cyclic hydrocarbon group in R 101 in the aforementioned formula (b-1). The aforementioned substituents are as follows: The substituents that can replace the aromatic hydrocarbon group in R 101 in the aforementioned formula (b-1) have the same content.

R”101 中之可具有取代基的鏈狀之烷基,以前述式(b-1)中之R101 中被例示作為鏈狀烷基之基為佳。R”103 中之可具有取代基的鏈狀之烯基,以前述式(b-1)中之R101 中被例示作為鏈狀烯基之基為佳。The chain alkyl group which may have a substituent in R" 101 is preferably a group exemplified as the chain alkyl group in R 101 in the aforementioned formula (b-1). R" 103 may have a substituent The chain-like alkenyl group of is preferably the group exemplified as the chain-like alkenyl group in R 101 in the aforementioned formula (b-1).

・(b-2)成份之陰離子部 式(b-2)中,R104 、R105 為各別獨立之可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基,其分別與前述式(b-1)中之R101 中,可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基為相同之內容。又,R104 、R105 可相互鍵結而形成環。 R104 、R105 以可具有取代基的鏈狀之烷基為佳,以直鏈狀或支鏈狀之烷基,或直鏈狀或支鏈狀之氟化烷基為較佳。 該鏈狀之烷基之碳數,以1~10為佳,更佳為碳數1~7,特佳為碳數1~3。R104 、R105 之鏈狀烷基之碳數,於上述碳數之範圍內時,基於對阻劑用溶劑亦具有良好溶解性等的理由,以越小越佳。又,R104 、R105 的鏈狀之烷基中,被氟原子取代的氫原子數越多時,以其酸之強度越強,而為更佳。前述鏈狀烷基中的氟原子之比例,即氟化率,較佳為70~100%,更佳為90~100%,最佳為全部的氫原子被氟原子取代之全氟烷基。 式(b-2)中,V102 、V103 各別獨立為單鍵、伸烷基,或氟化伸烷基,其分別與式(b-1)中之V101 為相同之內容。 式(b-2)中,L101 、L102 各別獨立為單鍵或氧原子。・In the anion part formula (b-2) of the component (b-2), R 104 and R 105 are independent cyclic groups that may have substituents, chain alkyl groups that may have substituents, or A chain-like alkenyl group with substituents, respectively, and R 101 in the aforementioned formula (b-1), a cyclic group that may have a substituent, a chain-like alkyl group that may have a substituent, or a substituted The chain alkenyl group of the group has the same content. In addition, R 104 and R 105 may be bonded to each other to form a ring. R 104 and R 105 are preferably a chain alkyl group which may have a substituent, and preferably a linear or branched alkyl group, or a linear or branched fluorinated alkyl group. The carbon number of the chain alkyl group is preferably from 1 to 10, more preferably from 1 to 7, and particularly preferably from 1 to 3. When the carbon number of the chain alkyl group of R 104 and R 105 is within the above-mentioned carbon number range, for reasons such as good solubility in the solvent for the resist, the smaller the better. In addition, in the chain alkyl group of R 104 and R 105 , the greater the number of hydrogen atoms substituted by fluorine atoms, the stronger the acid strength, which is more preferable. The ratio of fluorine atoms in the aforementioned chain alkyl group, that is, the fluorination rate, is preferably 70-100%, more preferably 90-100%, and most preferably a perfluoroalkyl group in which all hydrogen atoms are replaced by fluorine atoms. In the formula (b-2), V 102 and V 103 are each independently a single bond, an alkylene group, or a fluorinated alkylene group, which respectively have the same content as V 101 in the formula (b-1). In formula (b-2), L 101 and L 102 are each independently a single bond or an oxygen atom.

・(b-3)成份之陰離子部 式(b-3)中,R106 ~R108 為各別獨立之可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基,其分別與前述式(b-1)中之R101 中,可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基為相同之內容。 L103 ~L105 各別獨立為單鍵、-CO-或-SO2 -。・In the anion part formula (b-3) of the component (b-3), R 106 to R 108 are independently cyclic groups that may have substituents, chain alkyl groups that may have substituents, or A chain-like alkenyl group with substituents, respectively, and R 101 in the aforementioned formula (b-1), a cyclic group that may have a substituent, a chain-like alkyl group that may have a substituent, or a substituted The chain alkenyl group of the group has the same content. L 103 to L 105 are each independently a single bond, -CO- or -SO 2 -.

{陽離子部} 式(b-1)、(b-2)及(b-3)中,m為1以上之整數,且M’m 為m價之鎓陽離子,又以鋶陽離子、錪陽離子為較佳之例示,例如上述式(ca-1-1)~(ca-1-78)、(ca-1-101)~(ca-1-149)各別表示之有機陽離子等。{} Cationic unit of formula (b-1), (b -2) and (b-3), m is an integer of 1 or more, and M 'm + m is the valence of the cation, again sulfonium cation, iodonium cation For preferred examples, for example, organic cations represented by the above formulas (ca-1-1) to (ca-1-78), (ca-1-101) to (ca-1-149), and the like.

又,式(b-1)、(b-2)及(b-3)中之M’m ,又可列舉如:二苯基錪陽離子、雙(4-tert-丁基苯基)錪陽離子、上述式(ca-3-1)~(ca-3-6)各別表示之陽離子、上述式(ca-4-1)~(ca-4-2)各別表示之陽離子等。Further, the formula (b-1), in the (b-2) and (b-3) M 'm +, but also include such as: diphenyl iodonium cation, bis (4-tert- butylphenyl) iodonium Cations, cations represented by the above formulas (ca-3-1) to (ca-3-6), cations represented by the above formulas (ca-4-1) to (ca-4-2), etc.

上述之中,陽離子部[(M’m )1/m ]又以式(ca-1-1)~(ca-1-78)、(ca-1-101)~(ca-1-149)各別表示之有機陽離子各別表示之有機陽離子為較佳。Among the above, the cation part [(M' m + ) 1/m ] is in the formula (ca-1-1)~(ca-1-78), (ca-1-101)~(ca-1-149 ) The organic cations separately expressed are preferably organic cations expressed separately.

本實施形態的阻劑組成物中,(B2)成份,可單獨使用1種亦可、將2種以上合併使用亦可。 阻劑組成物含有(B2)成份時,阻劑組成物中,(B2)成份之含量,相對於(A)成份100質量份,以50質量份以下為佳,以1~40質量份為較佳,以5~30質量份為更佳。 又,阻劑組成物含有(B2)成份時,阻劑組成物中,於對(A)成份進行作用而生成酸的酸產生劑成份(B)成份全體中,(B2)成份之含量,例如為50質量%以下,又以30質量%以下為較佳,以0質量%以上、5質量%以下為更佳。 (B2)成份之含量於上述範圍時,可充分地進行圖型形成。In the resist composition of this embodiment, the component (B2) may be used alone or in combination of two or more. When the resist composition contains component (B2), the content of component (B2) in the resist composition relative to 100 parts by mass of (A) component is preferably 50 parts by mass or less, and 1-40 parts by mass Preferably, it is more preferably 5-30 parts by mass. In addition, when the resist composition contains component (B2), the content of component (B2) in the total acid generator component (B) component that acts on component (A) to generate acid in the resist composition, for example It is 50% by mass or less, preferably 30% by mass or less, and more preferably 0% by mass or more and 5% by mass or less. (B2) When the content of the component is within the above range, pattern formation can be sufficiently performed.

≪(D)成份≫ 本實施形態中的阻劑組成物,除(A)成份及(B)成份以外,可再含有酸擴散控制劑成份(以下,亦稱為「(D)成份」)(D)成份,於阻劑組成物中,為具有捕集因曝光所產生的酸之抑制劑(酸擴散控制劑)作用者。 (D)成份,可列舉如:含氮有機化合物(D1)(以下,亦稱為「(D1)成份」)、不相當於該(D1)成份,但可經由曝光而分解、喪失酸擴散控制性的光崩壞性鹼(D2)(以下,亦稱為「(D2)成份」))等。 為含有(D)成份的阻劑組成物時,於形成阻劑圖型之際,可更提升阻劑膜的曝光部與未曝光部之對比。≪(D) Ingredients≫ In addition to the (A) component and (B) component, the resist composition in this embodiment may further contain an acid diffusion control agent component (hereinafter, also referred to as "(D) component") (D) component. In the agent composition, one has an inhibitor (acid diffusion control agent) function that traps acid generated by exposure. (D) Components, such as: nitrogen-containing organic compounds (D1) (hereinafter also referred to as "(D1) component"), which is not equivalent to the (D1) component, but can be decomposed by exposure to lose acid diffusion control Photodisintegratable base (D2) (hereinafter, also referred to as "(D2) component")) etc. In the case of a resist composition containing the component (D), the contrast between the exposed part and the unexposed part of the resist film can be improved when the resist pattern is formed.

・(D1)成份 (D1)成份為鹼成份,且具有作為阻劑組成物中的酸擴散控制劑之作用的含氮有機化合物成份。・(D1) Ingredients (D1) The component is an alkali component and a nitrogen-containing organic compound component that functions as an acid diffusion control agent in the resist composition.

(D1)成份,只要為具有作為酸擴散控制劑之作用者時,則未有特別之限定,可列舉如:脂肪族胺、芳香族胺等。The component (D1) is not particularly limited as long as it functions as an acid diffusion control agent, and examples include aliphatic amines and aromatic amines.

脂肪族胺中,又以二級脂肪族胺或三級脂肪族胺為佳。 脂肪族胺,為具有1個以上的脂肪族基之胺,該脂肪族基又以碳數1~12為佳。 脂肪族胺,可列舉如:氨NH3 中的至少1個氫原子,被碳數12以下之烷基或羥烷基取代而得之胺(烷胺或烷醇胺)或環式胺等。 烷胺及烷醇胺之具體例,可列舉如:n-己胺、n-庚胺、n-辛胺、n-壬胺、n-癸胺等的單烷胺;二乙胺、二-n-丙胺、二-n-庚胺、二-n-辛胺、二環己胺等的二烷胺;三甲胺、三乙胺、三-n-丙胺、三-n-丁胺、三-n-戊胺、三-n-己胺、三-n-庚胺、三-n-辛胺、三-n-壬胺、三-n-癸胺、三-n-十二烷胺等的三烷胺;二乙醇胺、三乙醇胺、二異丙醇胺、三異丙醇胺、二-n-辛醇胺、三-n-辛醇胺等之烷醇胺等。該些之中,又以碳數5~10之三烷胺為更佳,以三-n-戊胺或三-n-辛胺為特佳。Among the aliphatic amines, secondary aliphatic amines or tertiary aliphatic amines are preferred. The aliphatic amine is an amine having one or more aliphatic groups, and the aliphatic group preferably has 1-12 carbon atoms. Aliphatic amines, include such as: ammonia NH 3, at least one hydrogen atom is 12 or less carbon atoms of alkyl or hydroxyalkyl substituted to give the amine (alkylamine or alkanolamine) or a cyclic amine. Specific examples of alkylamines and alkanolamines include monoalkylamines such as n-hexylamine, n-heptylamine, n-octylamine, n-nonylamine, and n-decylamine; diethylamine, di- n-propylamine, di-n-heptylamine, di-n-octylamine, dicyclohexylamine and other dialkylamines; trimethylamine, triethylamine, tri-n-propylamine, tri-n-butylamine, tri- n-pentylamine, tri-n-hexylamine, tri-n-heptylamine, tri-n-octylamine, tri-n-nonylamine, tri-n-decylamine, tri-n-dodecylamine, etc. Trialkanolamine; diethanolamine, triethanolamine, diisopropanolamine, triisopropanolamine, di-n-octanolamine, tri-n-octanolamine and other alkanolamines. Among these, trialkylamine having 5 to 10 carbon atoms is more preferred, and tri-n-pentylamine or tri-n-octylamine is particularly preferred.

環式胺,可列舉如:含有作為雜原子的氮原子之雜環化合物等。該雜環化合物可為單環式者(脂肪族單環式胺)亦可、多環式者(脂肪族多環式胺)亦可。 脂肪族單環式胺,具體而言,可列舉如:哌啶、哌嗪等。 脂肪族多環式胺,以碳數6~10者為佳,具體而言,可列舉如:1,5-二氮雜雙環[4.3.0]-5-壬烯、1,8-二氮雜雙環[5.4.0]-7-十一烯、六甲基四胺、1,4-二氮雜雙環[2.2.2]辛烷等。Cyclic amines include, for example, heterocyclic compounds containing a nitrogen atom as a hetero atom. The heterocyclic compound may be monocyclic (aliphatic monocyclic amine) or polycyclic (aliphatic polycyclic amine). Specific examples of aliphatic monocyclic amines include piperidine and piperazine. The aliphatic polycyclic amine preferably has 6 to 10 carbon atoms. Specifically, examples include: 1,5-diazabicyclo[4.3.0]-5-nonene, 1,8-diaza Heterobicyclo[5.4.0]-7-undecene, hexamethyltetraamine, 1,4-diazabicyclo[2.2.2]octane, etc.

其他脂肪族胺,可列舉如:三(2-甲氧基甲氧基乙基)胺、三{2-(2-甲氧基乙氧基)乙基}胺、三{2-(2-甲氧基乙氧基甲氧基)乙基}胺、三{2-(1-甲氧基乙氧基)乙基}胺、三{2-(1-乙氧基乙氧基)乙基}胺、三{2-(1-乙氧基丙氧基)乙基}胺、三[2-{2-(2-羥基乙氧基)乙氧基}乙基]胺、三乙醇胺三乙酸酯等,又以三乙醇胺三乙酸酯為佳。Other aliphatic amines include, for example, tris(2-methoxymethoxyethyl)amine, tris{2-(2-methoxyethoxy)ethyl}amine, tris{2-(2- Methoxyethoxymethoxy)ethyl)amine, tris{2-(1-methoxyethoxy)ethyl)amine, tris{2-(1-ethoxyethoxy)ethyl }Amine, tris{2-(1-ethoxypropoxy)ethyl}amine, tris[2-{2-(2-hydroxyethoxy)ethoxy}ethyl]amine, triethanolamine triethyl Acid esters, etc., and triethanolamine triacetate is preferred.

芳香族胺,可列舉如:4-二甲胺基吡啶、吡咯、吲哚、吡唑、咪唑或該些的衍生物、三苄胺、苯胺化合物、N-tert-丁氧基羰基吡咯啶等。Aromatic amines include, for example, 4-dimethylaminopyridine, pyrrole, indole, pyrazole, imidazole or their derivatives, tribenzylamine, aniline compounds, N-tert-butoxycarbonylpyrrolidine, etc. .

(D1)成份,可單獨使用1種亦可、將2種以上組合使用亦可。 (D1)成份,於上述之中,又以芳香族胺為佳,以苯胺化合物為較佳。苯胺化合物,可列舉如:2,6-二異丙基苯胺、N,N-二甲基苯胺、N,N-二丁基苯胺、N,N-二己基苯胺等。(D1) The component may be used alone or in combination of two or more. (D1) Among the above components, aromatic amines are preferred, and aniline compounds are preferred. Examples of the aniline compound include 2,6-diisopropylaniline, N,N-dimethylaniline, N,N-dibutylaniline, and N,N-dihexylaniline.

・(D2)成份 (D2)成份,只要為經由曝光而分解而喪失酸擴散控制性之成份時,並未有特別之限定,又以由下述通式(d2-1)所表示之化合物(以下,亦稱為「(d2-1)成份」)、下述通式(d2-2)所表示之化合物(以下,亦稱為「(d2-2)成份」)及下述通式(d2-3)所表示之化合物(以下,亦稱為「(d2-3)成份」)所成之群所選出的1種以上之化合物為佳。 (d2-1)~(d2-3)成份,於阻劑膜的曝光部中,並不具有因分解而喪失酸擴散控制性(鹼性)的抑制劑之作用,而於阻劑膜的未曝光部中具有作為抑制劑之作用。・(D2) Ingredients The component (D2) is not particularly limited as long as it is a component that decomposes through exposure and loses acid diffusion controllability. It is also a compound represented by the following general formula (d2-1) (hereinafter also referred to as "(D2-1) component"), the compound represented by the following general formula (d2-2) (hereinafter also referred to as "(d2-2) component") and the following general formula (d2-3) One or more compounds selected from the group of the compound (hereinafter also referred to as "(d2-3) component") are preferred. The components (d2-1) to (d2-3), in the exposed part of the resist film, do not act as an inhibitor that loses acid diffusion controllability (alkaline) due to decomposition. It acts as an inhibitor in the exposed part.

Figure 02_image149
[式中,Rd1 ~Rd4 為可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基。其中,通式(d2-2)中之Rd2 中,S原子鄰接的碳原子上,為不鍵結氟原子者。Yd1 為單鍵或2價之連結基;m為1以上之整數,且M’m 各別獨立為m價之鎓陽離子]。
Figure 02_image149
[In the formula, Rd 1 to Rd 4 are a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent. Among them, in Rd 2 in the general formula (d2-2), the carbon atom adjacent to the S atom is not bonded with a fluorine atom. YD 1 is a single bond or the divalent linking group; m is an integer of 1 or more, and M 'm + m are independently of the monovalent cation].

{(d2-1)成份} ・陰離子部 式(d2-1)中,Rd1 為可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基,其分別與前述式(b-1)中之R101 等為相同之內容。 該些之中,Rd1 又以可具有取代基的芳香族烴基、可具有取代基的脂肪族環式基,或可具有取代基的鏈狀之烷基為佳。該些之基所可具有的取代基,可列舉如:羥基、側氧(oxo)基、烷基、芳基、氟原子、氟化烷基、上述通式(a2-r-1)~(a2-r-7)各別表示之含內酯之環式基、醚鍵結、酯鍵結,或該些之組合等。含有作為取代基之醚鍵結或酯鍵結時,其鏈中可介有伸烷基,該情形之取代基,又以上述式(y-al-1)~(y-al-5)各別表示之連結基為佳。 前述芳香族烴基,以苯基、萘基、含有雙環辛烷骨架的多環結構(可列舉如:雙環辛烷骨架的環結構與其以外的環結構所形成的多環結構等)為較佳之例示。 前述脂肪族環式基,以由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等的多環鏈烷去除1個以上的氫原子而得之基為較佳。 前述鏈狀之烷基,以碳數為1~10為佳,具體而言,可列舉如:甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基等之直鏈狀之烷基;1-甲基乙基、1-甲基丙基、2-甲基丙基、1-甲基丁基、2-甲基丁基、3-甲基丁基、1-乙基丁基、2-乙基丁基、1-甲基戊基、2-甲基戊基、3-甲基戊基、4-甲基戊基等之支鏈狀之烷基等。{(d2-1) component} ・In the anion formula (d2-1), Rd 1 is a cyclic group that may have a substituent, a chain alkyl that may have a substituent, or a chain that may have a substituent The alkenyl group has the same content as R 101 in the aforementioned formula (b-1). Among these, Rd 1 is preferably an aromatic hydrocarbon group which may have a substituent, an aliphatic cyclic group which may have a substituent, or a chain alkyl group which may have a substituent. The substituents that these groups may have include, for example, a hydroxyl group, a pendant oxo group, an alkyl group, an aryl group, a fluorine atom, a fluorinated alkyl group, and the above general formulas (a2-r-1) to ( a2-r-7) The lactone-containing cyclic group, ether linkage, ester linkage, or a combination of these separately represented. In the case of ether or ester bonding as a substituent, an alkylene group may be intervened in the chain. In this case, the substituents are represented by the above formulas (y-al-1) to (y-al-5). Do not indicate the link base is better. The aforementioned aromatic hydrocarbon group is preferably exemplified by a phenyl group, a naphthyl group, and a polycyclic structure containing a bicyclooctane skeleton (e.g., a polycyclic structure formed by a bicyclic octane skeleton and other ring structures) . The aforementioned aliphatic cyclic group is preferably a group obtained by removing one or more hydrogen atoms from a polycyclic alkane such as adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc. . The aforementioned chain alkyl group preferably has a carbon number of 1-10. Specifically, examples include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, and nonyl , Decyl and other linear alkyl groups; 1-methylethyl, 1-methylpropyl, 2-methylpropyl, 1-methylbutyl, 2-methylbutyl, 3-methyl Branched chains of butyl, 1-ethylbutyl, 2-ethylbutyl, 1-methylpentyl, 2-methylpentyl, 3-methylpentyl, 4-methylpentyl, etc.的alkyl etc.

前述鏈狀之烷基為具有作為取代基的氟原子或氟化烷基之氟化烷基時,氟化烷基之碳數,以1~11為佳,以1~8為較佳,以1~4為更佳。該氟化烷基,可含有氟原子以外的原子。氟原子以外的原子,例如:氧原子、硫原子、氮原子等。 Rd1 ,以構成直鏈狀之烷基的一部份或全部的氫原子被氟原子取代而得之氟化烷基為佳,以構成直鏈狀之烷基的全部氫原子被氟原子取代而得之氟化烷基(直鏈狀之全氟烷基)為特佳。When the aforementioned chain alkyl group is a fluorinated alkyl group having a fluorine atom or a fluorinated alkyl group as a substituent, the carbon number of the fluorinated alkyl group is preferably from 1 to 11, preferably from 1 to 8, and 1 to 4 are more preferable. The fluorinated alkyl group may contain atoms other than fluorine atoms. Atoms other than fluorine atoms, such as oxygen atoms, sulfur atoms, and nitrogen atoms. Rd 1 is preferably a fluorinated alkyl group in which part or all of the hydrogen atoms constituting the linear alkyl group are replaced by fluorine atoms, and all the hydrogen atoms constituting the linear alkyl group are replaced by fluorine atoms The obtained fluorinated alkyl group (linear perfluoroalkyl group) is particularly preferred.

以下為(d2-1)成份之陰離子部的較佳具體例示。The following are preferred specific examples of the anion part of the component (d2-1).

Figure 02_image151
Figure 02_image151

・陽離子部 式(d2-1)中,M’m 為m價之鎓陽離子。 M’m 之鎓陽離子,以與前述通式(ca-1)~(ca-4)各別表示之陽離子為相同內容者為較佳之例示,又以前述通式(ca-1)所表示之陽離子為較佳,以前述式(ca-1-1)~(ca-1-78)、(ca-1-101)~(ca-1-149)各別表示之陽離子為更佳。 (d2-1)成份,可單獨使用1種亦可、將2種以上組合使用亦可。Cationic the unit of formula (d2-1), M 'm + is an onium cation of valence m. M 'm + of the cation, a cationic (ca-4) with the general formula (ca-1) represented by the ~ same respective content provider of the preferred embodiment is illustrated, again the general formula (ca-1) represented by The cations are preferred, and the cations represented by the aforementioned formulas (ca-1-1) to (ca-1-78) and (ca-1-101) to (ca-1-149) are more preferred. (d2-1) The component may be used alone or in combination of two or more.

{(d2-2)成份} ・陰離子部 式(d2-2)中,Rd2 為可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基,其可列舉如:與前述式(b-1)中之R101 等為相同之內容。 其中,Rd2 中,S原子鄰接的碳原子為不鍵結氟原子(未被氟取代)者。如此,可使(d2-2)成份之陰離子形成適度的弱酸陰離子,而可提高(D2)成份的抑制能力。 Rd2 以可具有取代基的鏈狀之烷基,或可具有取代基的脂肪族環式基為佳。鏈狀之烷基,以碳數1~10為佳,以3~10為較佳。脂肪族之環式基,以由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等去除1個以上的氫原子而得之基(可具有取代基的);由樟腦等去除1個以上的氫原子而得之基為較佳。 Rd2 之烴基可具有取代基,該取代基,例如與前述式(d2-1)的Rd1 中之烴基(芳香族烴基、脂肪族環式基、鏈狀之烷基)所可具有的取代基為相同之內容。{(d2-2) Ingredient} ・In the anion formula (d2-2), Rd 2 is a cyclic group that may have a substituent, a chain alkyl that may have a substituent, or a chain that may have a substituent Examples of the alkenyl group include the same content as R 101 in the aforementioned formula (b-1). Among them, in Rd 2 , the carbon atom adjacent to the S atom is not bonded to a fluorine atom (not substituted with fluorine). In this way, the anion of the (d2-2) component can form a moderately weak acid anion, and the inhibitory ability of the (D2) component can be improved. Rd 2 is preferably a chain alkyl group which may have a substituent or an aliphatic cyclic group which may have a substituent. The chain-like alkyl group preferably has 1-10 carbon atoms, preferably 3-10. An aliphatic cyclic group, a group obtained by removing more than one hydrogen atom from adamantane, norbornane, isobornane, tricyclodecane, tetracyclododecane, etc. (which may have substituents); A group obtained by removing one or more hydrogen atoms from camphor or the like is preferred. The hydrocarbon group of Rd 2 may have a substituent. The substituent may be substituted with the hydrocarbon group (aromatic hydrocarbon group, aliphatic cyclic group, chain alkyl group) in Rd 1 of the aforementioned formula (d2-1), for example The base is the same content.

以下為(d2-2)成份之陰離子部的較佳具體例示。The following are preferred specific examples of the anion part of the component (d2-2).

Figure 02_image153
Figure 02_image153

・陽離子部 式(d2-2)中,M’m 為m價之鎓陽離子,前述式(d2-1)中之M’m 為相同之內容。 (d2-2)成份,可單獨使用1種亦可、將2種以上組合使用亦可。Cationic the unit of formula (d2-2), M 'm + m is the valence of the cation, the formula (D2-1) in the M' m + is the same as the contents. (d2-2) The component may be used alone or in combination of two or more.

{(d2-3)成份} ・陰離子部 式(d2-3)中,Rd3 為可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基,其可列舉如:與前述式(b-1)中之R101 等為相同之內容等,又以含有氟原子之環式基、鏈狀之烷基,或鏈狀之烯基為佳。其中又以氟化烷基為佳,以與前述Rd1 之氟化烷基為相同之內容為較佳。{(d2-3) Ingredients} ・In the anion part formula (d2-3), Rd 3 is a cyclic group that may have a substituent, a chain alkyl that may have a substituent, or a chain that may have a substituent Examples of the alkenyl group include: the same content as R 101 in the aforementioned formula (b-1), etc., and a cyclic group containing a fluorine atom, a chain alkyl group, or a chain alkenyl group Better. Among them, a fluorinated alkyl group is preferred, and the same content as the aforementioned fluorinated alkyl group of Rd 1 is preferred.

式(d2-3)中,Rd4 為可具有取代基的環式基、可具有取代基的鏈狀之烷基,或可具有取代基的鏈狀之烯基,其可列舉如:與前述式(b-1)中之R101 等為相同之內容。 其中,又以可具有取代基的烷基、烷氧基、烯基、環式基為佳。 Rd4 中之烷基,以碳數1~5的直鏈狀或支鏈狀之烷基為佳,具體而言,可列舉如:甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基等。Rd4 之烷基的氫原子中之一部份可被羥基、氰基等所取代。 Rd4 中之烷氧基,以碳數1~5之烷氧基為佳,以碳數1~5之烷氧基,具體而言,可列舉如:甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基等。其中,又以甲氧基、乙氧基為佳。In the formula (d2-3), Rd 4 is a cyclic group which may have a substituent, a chain alkyl group which may have a substituent, or a chain alkenyl group which may have a substituent. Examples thereof include: and the aforementioned R 101 in the formula (b-1) has the same content. Among them, an alkyl group, an alkoxy group, an alkenyl group, and a cyclic group which may have a substituent are preferred. The alkyl group in Rd 4 is preferably a linear or branched alkyl group having 1 to 5 carbon atoms. Specifically, examples include methyl, ethyl, propyl, isopropyl, n- Butyl, isobutyl, tert-butyl, pentyl, isopentyl, neopentyl, etc. Part of the hydrogen atoms of the alkyl group of Rd 4 may be substituted by a hydroxyl group or a cyano group. The alkoxy group in Rd 4 is preferably an alkoxy group having 1 to 5 carbon atoms, and an alkoxy group having 1 to 5 carbon atoms is preferred. Specifically, methoxy, ethoxy, n- Propoxy, iso-propoxy, n-butoxy, tert-butoxy, etc. Among them, methoxy and ethoxy are preferred.

Rd4 中之烯基,例如與前述式(b-1)中之R101 等為相同之內容,又以乙烯基、丙烯基(烯丙基)、1-甲基丙烯基、2-甲基丙烯基為佳。該些之基再具有取代基時,可具有碳數1~5之烷基或碳數1~5之鹵化烷基。The alkenyl group in Rd 4 , for example, has the same content as R 101 in the aforementioned formula (b-1), etc., and also includes vinyl, propenyl (allyl), 1-methylpropenyl, 2-methyl Propylene is preferred. When these groups further have a substituent, they may have an alkyl group having 1 to 5 carbons or a halogenated alkyl group having 1 to 5 carbons.

Rd4 中之環式基,與前述式(b-1)中之R101 等為相同之內容,其中又以由環戊烷、環己烷、金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等的環鏈烷去除1個以上的氫原子而得之脂環式基,或苯基、萘基等之芳香族基為佳。Rd4 為脂環式基時,因阻劑組成物可良好地溶解於有機溶劑,而可使微影蝕刻特性更良好。The cyclic group in Rd 4 has the same content as R 101 in the aforementioned formula (b-1), among which it is composed of cyclopentane, cyclohexane, adamantane, norbornane, isobornane, tri Cycloalkanes, such as cyclodecane and tetracyclododecane, are alicyclic groups obtained by removing one or more hydrogen atoms, or aromatic groups such as phenyl and naphthyl are preferred. When Rd 4 is an alicyclic group, since the resist composition can be dissolved in an organic solvent well, the lithographic etching characteristics can be improved.

式(d2-3)中,Yd1 為單鍵或2價之連結基。 Yd1 中的2價之連結基,並未有特別之限定,可列舉如:可具有取代基的2價之烴基(脂肪族烴基、芳香族烴基)、含有雜原子的2價之連結基等。該些分別與上述式(a10-1)中之Yax1 中的2價之連結基的說明中所列舉的可具有取代基的2價之烴基、含有雜原子的2價之連結基為相同之內容。 Yd1 以羰基、酯鍵結、醯胺鍵結、伸烷基或該些之組合為佳。伸烷基,以直鏈狀或支鏈狀之伸烷基為較佳,以伸甲基或伸乙基為更佳。In formula (d2-3), Yd 1 is a single bond or a divalent linking group. The divalent linking group in Yd 1 is not particularly limited, and examples include: bivalent hydrocarbon groups (aliphatic hydrocarbon groups, aromatic hydrocarbon groups) that may have substituents, heteroatom-containing divalent linking groups, etc. . These are the same as the divalent hydrocarbon groups that may have substituents and the divalent linking groups containing heteroatoms listed in the description of the bivalent linking group in Ya x1 in the above formula (a10-1). content. Yd 1 is preferably a carbonyl group, an ester bond, an amide bond, an alkylene group or a combination of these. The alkylene group is preferably a linear or branched alkylene group, and a methylene group or an ethylene group is more preferred.

以下為(d2-3)成份之陰離子部的較佳具體例示。The following are preferred specific examples of the anion part of the component (d2-3).

Figure 02_image155
Figure 02_image155

Figure 02_image157
Figure 02_image157

・陽離子部 式(d2-3)中,M’m 為m價之鎓陽離子,其與前述式(d2-1)中之M’m 為相同之內容。 (d2-3)成份,可單獨使用1種亦可、將2種以上組合使用亦可。Cationic the unit of formula (d2-3), M 'm + is a cation of valence m, with the formula (D2-1) in the M' m + is the same as the contents. (d2-3) The component may be used alone or in combination of two or more.

(D2)成份,可僅使用上述(d2-1)~(d2-3)成份之任一種,或將2種以上組合使用皆可。 阻劑組成物含有(D2)成份時,阻劑組成物中,(D2)成份之含量,相對於(A)成份100質量份,以0.5~35質量份為佳,以1~25質量份為較佳,以2~20質量份為更佳,以3~15質量份為特佳。 (D2)成份之含量為較佳下限值以上時,特別是容易得到良好的微影蝕刻特性及阻劑圖型形狀。另一方面,於上限值以下時,可取得與其他成份之平衡,而可使各種微影蝕刻特性更良好。For the component (D2), only one of the above components (d2-1) to (d2-3) can be used, or two or more of them can be used in combination. When the resist composition contains component (D2), the content of component (D2) in the resist composition is preferably 0.5 to 35 parts by weight, and preferably 1 to 25 parts by weight relative to 100 parts by weight of (A) Preferably, it is more preferably 2-20 parts by mass, particularly preferably 3-15 parts by mass. When the content of the component (D2) is above the preferable lower limit, it is particularly easy to obtain good lithographic etching characteristics and resist pattern shape. On the other hand, when it is below the upper limit, a balance with other components can be achieved, and various lithographic etching characteristics can be made better.

(D2)成份之製造方法: 前述(d2-1)成份、(d2-2)成份之製造方法,並未有特別之限定,其可依公知之方法而製得。 又,(d2-3)成份之製造方法,並未有特別之限定,例如:可依與US2012-0149916號公報記載之相同方法予以製得。(D2) Manufacturing method of ingredients: The production method of the aforementioned (d2-1) component and (d2-2) component is not particularly limited, and it can be produced according to a known method. In addition, the manufacturing method of (d2-3) component is not particularly limited. For example, it can be prepared according to the same method described in US2012-0149916.

≪(E)成份:由有機羧酸及磷之含氧酸及其衍生物所成之群所選出的至少1種的化合物≫ 本實施形態之阻劑組成物中,就防止感度劣,或提高阻劑圖型形狀、處理時的存放安定性( temporal stability)等目的,可含有作為任意成份之由有機羧酸及磷之含氧酸及其衍生物所成之群所選出的至少1種的化合物(E)(以下,亦稱為「(E)成份」)。≪(E) Ingredients: at least one compound selected from the group of organic carboxylic acids and phosphorus oxyacids and their derivatives≫ The resist composition of this embodiment may contain organic carboxylic acid and phosphorus as optional ingredients for the purpose of preventing poor sensitivity, improving resist pattern shape, and temporal stability during processing. At least one compound (E) selected from the group of oxyacids and their derivatives (hereinafter, also referred to as "(E) component").

有機羧酸,例如:以乙酸、丙二酸、枸椽酸、蘋果酸、琥珀酸、安息香酸、羥基安息香酸、水楊酸、苯二甲酸、對苯二甲酸、異苯二甲酸等為佳。 磷之含氧酸,可列舉如:磷酸、膦酸(phosphonic acid)、次膦酸(phosphine acid)等,該些之中,特別是以膦酸為佳。 磷之含氧酸的衍生物,可列舉如:上述含氧酸的氫原子被烴基取代而得之酯等,前述之烴基,可列舉如:碳數1~5之烷基、碳數6~15之芳基等。 磷酸之衍生物,可列舉如:磷酸二-n-丁酯、磷酸二苯酯等的磷酸酯等。 膦酸的衍生物,可列舉如:膦酸二甲酯、膦酸-二-n-丁酯、膦酸苯酯、膦酸二苯酯、膦酸二苄酯等的膦酸酯等。 次膦酸的衍生物,可列舉如:次膦酸酯或次膦酸苯酯等。Organic carboxylic acids, such as acetic acid, malonic acid, citric acid, malic acid, succinic acid, benzoic acid, hydroxybenzoic acid, salicylic acid, phthalic acid, terephthalic acid, isophthalic acid, etc. . Examples of phosphorus-containing oxygen acids include phosphoric acid, phosphonic acid, and phosphine acid. Among these, phosphonic acid is particularly preferred. Examples of phosphorus oxo acid derivatives include esters in which the hydrogen atoms of the above oxo acids are substituted with hydrocarbon groups. Examples of the aforementioned hydrocarbon groups include alkyl groups with 1 to 5 carbons and 6 to carbon atoms. 15 of aryl etc. Examples of phosphoric acid derivatives include phosphoric acid esters such as di-n-butyl phosphate and diphenyl phosphate. Examples of phosphonic acid derivatives include phosphonates such as dimethyl phosphonate, di-n-butyl phosphonate, phenyl phosphonate, diphenyl phosphonate, and dibenzyl phosphonate. Examples of the derivatives of phosphinic acid include phosphinate or phenyl phosphinate.

(E)成份,於上述之中,又以有機羧酸為佳,以芳香族羧酸為較佳。具體而言,可列舉如:安息香酸、羥基安息香酸、水楊酸、苯二甲酸、對苯二甲酸、異苯二甲酸等。(E) Among the above components, organic carboxylic acids are preferred, and aromatic carboxylic acids are preferred. Specifically, examples thereof include benzoic acid, hydroxybenzoic acid, salicylic acid, phthalic acid, terephthalic acid, and isophthalic acid.

本實施形態的阻劑組成物中,(E)成份,可單獨使用1種亦可、將2種以上合併使用亦可。 阻劑組成物含有(E)成份時,(E)成份之含量,相對於(A)成份100質量份,以0.01~5質量份為佳,0.1~1.5質量份為較佳。 於上述範圍時,可取得與其他成份之平衡,而可使各種微影蝕刻特性更良好。In the resist composition of this embodiment, the (E) component may be used alone or in combination of two or more. When the resist composition contains component (E), the content of component (E) is preferably 0.01-5 parts by mass, and more preferably 0.1-1.5 parts by mass relative to 100 parts by mass of (A). In the above range, a balance with other components can be achieved, and various lithographic etching characteristics can be made better.

≪(F)成份:氟添加劑成份≫ 本實施形態中的阻劑組成物,就賦予阻劑膜撥水性或提高微影蝕刻特性等目的時,可含有氟添加劑成份(以下,亦稱為「(F)成份」)。 (F)成份,例如:可使用特開2010-002870號公報、特開2010-032994號公報、特開2010-277043號公報、特開2011-13569號公報、特開2011-128226號公報記載的含氟高分子化合物。 (F)成份,更具體而言,可列舉如:具有下述式(f1-1)所表示的結構單位(f1)的聚合物等。該聚合物,更具體而言,可列舉如:僅由下述式(f1-1)所表示的結構單位(f1)所形成的聚合物(均聚物);該結構單位(f1)與前述結構單位(a4)之共聚物;該結構單位(f1)與前述結構單位(a1)之共聚物;該結構單位(f1)與由丙烯酸或甲基丙烯酸所衍生的結構單位與前述結構單位(a1)之共聚物為佳。其中,與該結構單位(f1)共聚之前述結構單位(a1),以1-乙基-1-環辛基(甲基)丙烯酸酯所衍生的結構單位、1-甲基-1-金剛烷基(甲基)丙烯酸酯所衍生的結構單位為佳。≪(F) Ingredient: Fluorine additive ingredient≫ The resist composition in this embodiment may contain a fluorine additive component (hereinafter, also referred to as "(F) component") for the purpose of imparting water repellency to the resist film or improving lithographic etching characteristics. (F) Ingredients, for example: JP 2010-002870, JP 2010-032994, JP 2010-277043, JP 2011-13569, JP 2011-128226 can be used Fluorine-containing polymer compounds. (F) The component, more specifically, includes a polymer having a structural unit (f1) represented by the following formula (f1-1). More specifically, the polymer includes: a polymer (homopolymer) formed only by the structural unit (f1) represented by the following formula (f1-1); the structural unit (f1) is the same as the aforementioned The copolymer of the structural unit (a4); the copolymer of the structural unit (f1) and the aforementioned structural unit (a1); the structural unit (f1) and the structural unit derived from acrylic acid or methacrylic acid and the aforementioned structural unit (a1) ) Is preferred. Among them, the aforementioned structural unit (a1) copolymerized with the structural unit (f1) is a structural unit derived from 1-ethyl-1-cyclooctyl (meth)acrylate, 1-methyl-1-adamantane The structural unit derived from the base (meth)acrylate is preferred.

Figure 02_image159
[式中,R與前述為相同之內容,Rf102 及Rf103 各別獨立表示氫原子、鹵素原子、碳數1~5之烷基或碳數1~5之鹵化烷基;Rf102 及Rf103 可為相同亦可、相異亦可。nf1 為0~5之整數,Rf101 為含有氟原子之有機基]。
Figure 02_image159
[In the formula, R is the same as the above, Rf 102 and Rf 103 each independently represent a hydrogen atom, a halogen atom, an alkyl group with 1 to 5 carbons or a halogenated alkyl group with 1 to 5 carbons; Rf 102 and Rf 103 may be the same or different. nf 1 is an integer of 0-5, and Rf 101 is an organic group containing a fluorine atom].

式(f1-1)中,α位的碳原子鍵結之R,與前述為相同之內容。又,R以氫原子或甲基為佳。 式(f1-1)中,Rf102 及Rf103 之鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。Rf102 及Rf103 之碳數1~5之烷基,例如:與上述R的碳數1~5之烷基為相同之內容,又以甲基或乙基為佳。Rf102 及Rf103 的碳數1~5之鹵化烷基,具體而言,可列舉如:碳數1~5之烷基的氫原子之一部份或全部,被鹵素原子取代而得之基等。該鹵素原子,可列舉如:氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。其中,Rf102 及Rf103 又以氫原子、氟原子,或碳數1~5之烷基為佳,以氫原子、氟原子、甲基,或乙基為佳。In formula (f1-1), the R to which the carbon atom at the α-position is bonded is the same as described above. Furthermore, R is preferably a hydrogen atom or a methyl group. In the formula (f1-1), the halogen atoms of Rf 102 and Rf 103 include, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom, etc., and a fluorine atom is particularly preferred. The alkyl group having 1 to 5 carbon atoms of Rf 102 and Rf 103 , for example, has the same content as the alkyl group having 1 to 5 carbon atoms of R, and preferably methyl or ethyl. The halogenated alkyl groups of Rf 102 and Rf 103 having 1 to 5 carbon atoms, specifically, examples include groups obtained by substituting a part or all of the hydrogen atoms of the alkyl group having 1 to 5 carbon atoms by halogen atoms Wait. Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom, and a fluorine atom is particularly preferred. Among them, Rf 102 and Rf 103 are preferably a hydrogen atom, a fluorine atom, or an alkyl group having 1 to 5 carbon atoms, and preferably a hydrogen atom, a fluorine atom, a methyl group, or an ethyl group.

式(f1-1)中,nf1 為0~5之整數,以0~3之整數為佳,以0或1為較佳。In the formula (f1-1), nf 1 is an integer of 0-5, preferably an integer of 0-3, and more preferably 0 or 1.

式(f1-1)中,Rf101 為含有氟原子之有機基,又以含有氟原子之烴基為佳。 含有氟原子之烴基,可為直鏈狀、支鏈狀或環狀之任一者皆可,又以碳數1~20為佳,以碳數1~15為較佳,以碳數1~10為特佳。 又,含有氟原子之烴基,以該烴基中的25%以上之氫原子被氟化者為佳,以50%以上被氟化者為較佳,又以60%以上被氟化時,可提高浸漬曝光時的阻劑膜之疏水性,而為特佳。 其中,Rf101 又以碳數1~6之氟化烴基為較佳,以三氟甲基、-CH2 -CF3 、-CH2 -CF2 -CF3 、-CH(CF3 )2 、-CH2 -CH2 -CF3 、-CH2 -CH2 -CF2 -CF2 -CF2 -CF3 為特佳。In the formula (f1-1), Rf 101 is an organic group containing a fluorine atom, and preferably a hydrocarbon group containing a fluorine atom. The hydrocarbon group containing a fluorine atom can be linear, branched or cyclic, and preferably has a carbon number of 1-20, preferably a carbon number of 1-15, and a carbon number of 1 to 10 is particularly good. In addition, for hydrocarbon groups containing fluorine atoms, it is preferable that more than 25% of the hydrogen atoms in the hydrocarbon group are fluorinated, and more than 50% are preferably fluorinated. When more than 60% are fluorinated, the increase The hydrophobicity of the resist film during immersion exposure is particularly good. Among them, Rf 101 is preferably a fluorinated hydrocarbon group with 1 to 6 carbon atoms, and is preferably trifluoromethyl, -CH 2 -CF 3 , -CH 2 -CF 2 -CF 3 , -CH(CF 3 ) 2 , -CH 2 -CH 2 -CF 3 and -CH 2 -CH 2 -CF 2 -CF 2 -CF 2 -CF 3 are particularly preferred.

(F)成份之重量平均分子量(Mw)(凝膠滲透色層分析之聚苯乙烯換算基準),以1000~50000為佳,以5000~40000為較佳,以10000~30000為最佳。於該範圍的上限值以下時,作為阻劑使用時,可對阻劑用溶劑具有充份的溶解性,於該範圍的下限值以上時,可具有良好的耐乾蝕刻性或阻劑圖型之斷面形狀。 (F)成份之分散度(Mw/Mn),以1.0~5.0為佳,以1.0~3.0為較佳,以1.2~2.5為最佳。(F) The weight average molecular weight (Mw) of the component (polystyrene conversion standard for gel permeation chromatography) is preferably 1,000 to 50,000, preferably 5,000 to 40,000, and most preferably 10,000 to 30,000. Below the upper limit of this range, when used as a resist, it can have sufficient solubility in the solvent for the resist. When it is above the lower limit of this range, it can have good dry etching resistance or resist pattern. The cross-sectional shape of the type. (F) The degree of dispersion (Mw/Mn) of the component is preferably 1.0-5.0, preferably 1.0-3.0, and most preferably 1.2-2.5.

本實施形態的阻劑組成物中,(F)成份,可單獨使用1種亦可、將2種以上合併使用亦可。 阻劑組成物含有(F)成份時,(F)成份之含量,相對於(A)成份100質量份,通常為使用0.5~10質量份之比例。In the resist composition of this embodiment, the component (F) may be used alone or in combination of two or more. When the resist composition contains component (F), the content of component (F) is usually 0.5-10 parts by mass relative to 100 parts by mass of (A) component.

≪(S)成份:有機溶劑成份≫ 本實施形態中的阻劑組成物,可將阻劑材料溶解於有機溶劑成份(以下,亦稱為「(S)成份」)中而製得。 (S)成份,只要為可溶解所使用的各種成份、形成均勻溶液者即可,其可由以往作為化學增幅型阻劑組成物的溶劑使用的公知成份中,適當地選擇使用任意之成份。 (S)成份,可列舉如:γ-丁內酯等的內酯類;丙酮、甲基乙酮、環己酮、甲基-n-戊酮、甲基異戊酮、2-庚酮、乙烯碳酸酯、丙烯碳酸酯等之酮類;乙二醇、二乙二醇、丙二醇、二丙二醇等之多元醇類;乙二醇單乙酸酯、二乙二醇單乙酸酯、丙二醇單乙酸酯,或二丙二醇單乙酸酯等的具有酯鍵結之化合物、前述多元醇類或前述具有酯鍵結之化合物的單甲醚、單乙醚、單丙醚、單丁醚等的單烷醚或單苯醚等具有醚鍵結之化合物等的多元醇類之衍生物[該些之中,又以丙二醇單甲醚乙酸酯(PGMEA)、丙二醇單甲醚(PGME)為佳];二噁烷等的環式醚類,或乳酸甲酯、乳酸乙酯(EL)、乙酸甲酯、乙酸乙酯、乙酸丁酯、丙酮酸甲酯、丙酮酸乙酯、甲氧基丙酸甲酯、乙氧基丙酸乙酯等之酯類;苯甲醚、乙基苄醚、甲苯酚基甲醚、二苯醚、二苄醚、苯乙醚、丁基苯醚、乙基苯、二乙基苯、戊基苯、異丙基苯、甲苯、二甲苯、異丙基甲苯、三甲苯等之芳香族系有機溶劑、二甲亞碸(DMSO)等。 本實施形態的阻劑組成物中,(S)成份,可單獨使用1種亦可,以2種以上之混合溶劑方式使用亦可。 其中,又以PGMEA、PGME、γ-丁內酯、丙烯碳酸酯、EL、環己酮為佳。 又,亦可使用PGMEA與極性溶劑混合而得的混合溶劑。其添加比(質量比),可於考量PGMEA與極性溶劑之相溶性等之後,作適當之決定即可,較佳為1:9~9:1,更佳為於2:8~8:2之範圍內為佳。 更具體而言,混合作為極性溶劑的EL或環己酮時,PGMEA:EL或環己酮之質量比,較佳為1:9~9:1,更佳為2:8~8:2。又,混合作為極性溶劑的PGME時,PGMEA:PGME之質量比,較佳為1:9~9:1,更佳為2:8~8:2,更較佳為3:7~7:3。此外,亦可使用PGMEA與PGME與環己酮之混合溶劑。 又,(S)成份,其他例如:由PGMEA及EL中所選出之至少1種,與由γ-丁內酯及丙烯碳酸酯中所選出之至少一種所得的混合溶劑亦佳。於該情形時,混合比例依前者與後者之質量比,較佳為60:40~99:1,更佳為70:30~95:5。 (S)成份之使用量,並未有特別之限定,而可配合可塗佈於基板等的濃度、塗佈膜厚等作適當之設定。一般而言,(S)成份之使用量,為使阻劑組成物的固形成份濃度為0.1~20質量%,較佳為0.2~15質量%之範圍內。≪(S) Ingredients: organic solvent ingredients≫ The resist composition in this embodiment can be prepared by dissolving the resist material in an organic solvent component (hereinafter, also referred to as "(S) component"). The (S) component may be any component that can dissolve the various components used and form a uniform solution. Any component can be appropriately selected and used from known components conventionally used as solvents for chemically amplified resist compositions. (S) Ingredients, such as lactones such as γ-butyrolactone; acetone, methyl ethyl ketone, cyclohexanone, methyl-n-pentanone, methyl isopentanone, 2-heptanone, Ketones such as ethylene carbonate and propylene carbonate; polyols such as ethylene glycol, diethylene glycol, propylene glycol, and dipropylene glycol; ethylene glycol monoacetate, diethylene glycol monoacetate, propylene glycol mono Acetate, or dipropylene glycol monoacetate and other ester-bonded compounds, the aforementioned polyols or the aforementioned ester-bonded compounds such as monomethyl ether, monoethyl ether, monopropyl ether, monobutyl ether, etc. Derivatives of polyols such as compounds with ether linkages such as alkyl ethers or monophenyl ethers [Among these, propylene glycol monomethyl ether acetate (PGMEA) and propylene glycol monomethyl ether (PGME) are preferred] ; Cyclic ethers such as dioxane, or methyl lactate, ethyl lactate (EL), methyl acetate, ethyl acetate, butyl acetate, methyl pyruvate, ethyl pyruvate, methoxypropionic acid Esters such as methyl ester, ethyl ethoxypropionate, etc.; anisole, ethyl benzyl ether, cresol methyl ether, diphenyl ether, dibenzyl ether, phenethyl ether, butyl phenyl ether, ethyl benzene, Aromatic organic solvents such as diethylbenzene, amylbenzene, cumene, toluene, xylene, cumene, trimethylbenzene, etc., dimethyl sulfide (DMSO), etc. In the resist composition of this embodiment, the (S) component may be used alone or in a mixed solvent of two or more. Among them, PGMEA, PGME, γ-butyrolactone, propylene carbonate, EL, and cyclohexanone are preferred. In addition, a mixed solvent obtained by mixing PGMEA and a polar solvent may also be used. The addition ratio (mass ratio) can be appropriately determined after considering the compatibility of PGMEA and the polar solvent, etc., preferably 1:9-9:1, more preferably 2:8-8:2 Within the range is better. More specifically, when EL or cyclohexanone as a polar solvent is mixed, the mass ratio of PGMEA:EL or cyclohexanone is preferably 1:9-9:1, more preferably 2:8-8:2. Moreover, when mixing PGME as a polar solvent, the mass ratio of PGMEA:PGME is preferably 1:9-9:1, more preferably 2:8-8:2, and more preferably 3:7-7:3 . In addition, a mixed solvent of PGMEA, PGME and cyclohexanone can also be used. In addition, the (S) component, for example: a mixed solvent of at least one selected from PGMEA and EL, and at least one selected from γ-butyrolactone and propylene carbonate is also preferable. In this case, the mixing ratio is based on the mass ratio of the former to the latter, preferably 60:40 to 99:1, more preferably 70:30 to 95:5. The amount of (S) component used is not particularly limited, and can be appropriately set according to the concentration that can be coated on the substrate, etc., the coating film thickness, etc. Generally speaking, the amount of (S) component used is such that the solid content concentration of the resist composition is 0.1-20% by mass, preferably 0.2-15% by mass.

本實施形態之阻劑組成物中,可再配合目的,適當地添加含有具有混合性的添加劑,例如改良阻劑膜性能而添加的樹脂、溶解抑制劑、可塑劑、安定劑、著色劑、抗暈劑、染料等。In the resist composition of this embodiment, it is possible to further match the purpose and appropriately add mixed additives, such as resins added to improve the performance of the resist film, dissolution inhibitors, plasticizers, stabilizers, colorants, and Halo agents, dyes, etc.

以上說明的使用本實施形態之含有非離子界面活性劑之鹼顯影液進行顯影、形成阻劑圖型之阻劑圖型形成方法,因使用特定的阻劑組成物,即,使用含有上述(A)成份與(B)成份,且前述(B)成份為含有(B1)成份之阻劑組成物,故可降低阻劑膜的未曝光部缺陷之發生,且可形成具有良好形狀的阻劑圖型。 [實施例]The above-explained method for forming a resist pattern using the alkali developer containing a nonionic surfactant of this embodiment for development to form a resist pattern is due to the use of a specific resist composition, that is, the use of the above-mentioned (A ) Component and (B) component, and the aforementioned (B) component is a resist composition containing (B1) component, so it can reduce the occurrence of defects in the unexposed part of the resist film, and can form a good-shaped resist pattern type. [Example]

以下,將以實施例對本發明作更詳細的說明,但本發明並不受該些例示所限定。Hereinafter, the present invention will be described in more detail with examples, but the present invention is not limited by these examples.

<阻劑組成物之製造> 將表1所示各成份混合、溶解,分別製造阻劑組成物(1)~(5)。<Manufacture of resist composition> The components shown in Table 1 were mixed and dissolved to prepare resist compositions (1) to (5), respectively.

Figure 02_image161
Figure 02_image161

表1中,各簡稱分別具有以下之意義。[ ]內之數值為添加量(質量份)。In Table 1, each abbreviation has the following meanings. The value in [ ] is the added amount (parts by mass).

(A)-1:下述化學式(A-1)所表示之高分子化合物。該高分子化合物(A)-1,可將衍生構成該高分子化合物的結構單位之單體,使用特定莫耳比進行自由基聚合反應之方式而製得。該高分子化合物(A)-1,依GPC測定所求得的標準聚苯乙烯換算的重量平均分子量(Mw)為7000、分子量分散度(Mw/Mn)為1.68。依13 C-NMR所求得的共聚組成比(結構式中的各結構單位之比例(莫耳比)為l/m/n/o=45/30/15/10。(A)-1: A polymer compound represented by the following chemical formula (A-1). The polymer compound (A)-1 can be prepared by deriving the monomer constituting the structural unit of the polymer compound by radical polymerization reaction using a specific molar ratio. The polymer compound (A)-1 had a weight average molecular weight (Mw) of 7000 and a molecular weight dispersion (Mw/Mn) of 1.68 in terms of standard polystyrene obtained by GPC measurement. The copolymer composition ratio (the ratio of each structural unit in the structural formula (mole ratio)) obtained by 13 C-NMR is 1/m/n/o=45/30/15/10.

Figure 02_image163
Figure 02_image163

(B1)-1~(B1)-3:由下述化合物(B1-1)~(B1-3)所形成之酸產生劑。(B1)-1 to (B1)-3: Acid generators formed from the following compounds (B1-1) to (B1-3).

Figure 02_image165
Figure 02_image165

(B2)-1:由下述化合物(B2-1)所形成之酸產生劑。 (B2)-2:由下述化合物(B2-2)所形成之酸產生劑。(B2)-1: An acid generator formed from the following compound (B2-1). (B2)-2: An acid generator formed from the following compound (B2-2).

Figure 02_image167
Figure 02_image167

(D)-1:由下述化學式(D-1)所表示之化合物所形成之酸擴散控制劑。 (E)-1:下述化學式(E-1)所表示之化合物。 (F)-1:下述化學式(F-1)所表示之含氟高分子化合物。GPC測定所求得的標準聚苯乙烯換算之重量平均分子量(Mw)為23000、分子量分散度(Mw/Mn)為1.40。 (S)-1:丙二醇單甲醚乙酸酯/丙二醇單甲醚(質量比60/40)的混合溶劑。(D)-1: An acid diffusion control agent formed from a compound represented by the following chemical formula (D-1). (E)-1: A compound represented by the following chemical formula (E-1). (F)-1: A fluorine-containing polymer compound represented by the following chemical formula (F-1). The weight average molecular weight (Mw) in terms of standard polystyrene obtained by the GPC measurement was 23,000, and the molecular weight dispersion (Mw/Mn) was 1.40. (S)-1: A mixed solvent of propylene glycol monomethyl ether acetate/propylene glycol monomethyl ether (mass ratio 60/40).

Figure 02_image169
Figure 02_image169

<阻劑圖型之形成(1)> (實施例1) 將有機系抗反射膜組成物「ARC29A」(商品名、普力瓦科技公司製),使用旋轉塗佈器塗佈於12英吋的矽晶圓上,於加熱板上進行205℃、60秒鐘燒結、乾燥結果,形成膜厚89nm的有機系抗反射膜。 將表1的阻劑組成物(1),使用Coater/Developer Lithius(東京電子公司製)塗佈於上述抗反射膜上,於加熱板上,進行105℃、60秒鐘的預燒焙(PAB)處理,經乾燥後,形成膜厚150nm的阻劑膜。 其次,使用浸潤用ArF曝光裝置NSR-S609B[尼康公司製;NA(開口數)=1.07,Dipole(in/out=0.78/0.97)with Polano,浸潤介質:水],介由穿透型相位位移遮罩,對前述阻劑膜,以ArF準分子雷射(193nm)進行選擇性照射。 隨後,進行100℃、60秒鐘之PEB處理。 其次,使用Coater/Developer Lithius(東京電子公司製),於23℃下,使用含有乙炔系活性劑的2.38質量%之TMAH水溶液(商品名:NMD-W、東京應化工業公司製)進行30秒鐘鹼顯影,隨後,使用純水施以30秒鐘的水洗滌後,進行振動乾燥。 其結果,阻劑膜的曝光部經上述顯影液而被溶解去除,而未曝光部殘留而形成膜。<Formation of resist pattern (1)> (Example 1) The organic anti-reflective film composition "ARC29A" (trade name, manufactured by Polywatt Technology Co., Ltd.) was coated on a 12-inch silicon wafer using a spin coater, and heated on a hot plate at 205°C for 60 seconds As a result of sintering and drying, an organic anti-reflective film with a thickness of 89 nm was formed. The resist composition (1) of Table 1 was coated on the anti-reflective film using Coater/Developer Lithius (manufactured by Tokyo Electronics Co., Ltd.), and pre-baked at 105°C for 60 seconds on a hot plate (PAB ) After drying, a resist film with a thickness of 150 nm is formed. Next, use ArF exposure device NSR-S609B for infiltration [manufactured by Nikon; NA (number of openings)=1.07, Dipole (in/out=0.78/0.97) with Polano, infiltration medium: water], through the penetration type phase shift Mask, selectively irradiate the aforementioned resist film with ArF excimer laser (193nm). Subsequently, PEB treatment was performed at 100°C for 60 seconds. Next, using Coater/Developer Lithius (manufactured by Tokyo Electronics Co., Ltd.), a 2.38% by mass TMAH aqueous solution (trade name: NMD-W, manufactured by Tokyo Ohka Kogyo Co., Ltd.) containing an acetylene-based active agent was used for 30 seconds at 23°C. The calcined alkali was developed, followed by washing with pure water for 30 seconds, followed by vibration drying. As a result, the exposed part of the resist film is dissolved and removed by the developer, and the unexposed part remains to form a film.

(實施例2、3、比較例1、2) 除將表1的阻劑組成物(1)分別變更為阻劑組成物(2)~(5)以外,其他皆依與上述實施例1為相同之方法,形成阻劑圖型。又,實施例2為使用阻劑組成物(2)、實施例3為使用阻劑組成物(3)、比較例1為使用阻劑組成物(4)、比較例2為使用阻劑組成物(5)。(Examples 2, 3, Comparative Examples 1, 2) Except that the resist composition (1) in Table 1 was changed to resist composition (2) to (5), the other all followed the same method as in Example 1 above to form a resist pattern. In addition, Example 2 used the resist composition (2), Example 3 used the resist composition (3), Comparative Example 1 used the resist composition (4), and Comparative Example 2 used the resist composition (5).

<阻劑圖型之評估(1)> [缺陷之評估] 使用表面缺陷觀察裝置(KLA丹克爾公司製、製品名:KLA-2371),測定上述<阻劑圖型之形成(1)>方法所形成的阻劑圖型中,未曝光部的殘膜部份具有0.1μm以上的缺陷之個數。 缺陷之評估,為依下述評估基準進行,該評估結果以「缺陷」記載如表2所示。 評估基準 〇:100個以下 ×:超過100個<Evaluation of resist pattern (1)> [Assessment of defects] Using a surface defect observation device (manufactured by KLA Danker, product name: KLA-2371), the remaining film portion of the unexposed portion of the resist pattern formed by the above-mentioned <Formation of resist pattern (1)> method was measured The number of defects with 0.1μm or more. The assessment of defects is carried out according to the following assessment criteria, and the assessment results are described as "Defects" as shown in Table 2. Evaluation benchmark 〇: Less than 100 ×: more than 100

Figure 02_image171
Figure 02_image171

使用本發明的實施例1~3的阻劑圖型形成方法,與比較例1及2的阻劑圖型形成方法相比較時,確認於未曝光部的殘膜部份發生0.1μm以上缺陷的狀況受到抑制。其中,特別是實施例3的阻劑圖型形成方法,其抑制缺陷發生的效果更高,該抑制缺陷發生的效果之高低,依序為實施例3、實施例2、實施例1之順序。Using the resist pattern forming methods of Examples 1 to 3 of the present invention, when compared with the resist pattern forming methods of Comparative Examples 1 and 2, it was confirmed that defects of 0.1 μm or more occurred in the residual film portion of the unexposed area The situation is suppressed. Among them, the resist pattern forming method of Example 3 has a higher effect of suppressing the occurrence of defects. The effect of suppressing the occurrence of defects is the order of Example 3, Example 2, and Example 1.

<阻劑圖型之形成(2)> (實施例4) 將有機系抗反射膜組成物「ARC29A」(商品名、普力瓦科技公司製),使用旋轉塗佈器塗佈於12英吋的矽晶圓上,於加熱板上進行205℃、60秒鐘燒結、乾燥結果,形成膜厚89nm的有機系抗反射膜。 將表1的阻劑組成物(3),使用 Coater/Developer Lithius(東京電子公司製)塗佈於上述抗反射膜上,於加熱板上,進行105℃、60秒鐘的預燒焙(PAB)處理,經乾燥後,形成膜厚150nm的阻劑膜。 其次,使用浸潤用ArF曝光裝置NSR-S609B[尼康公司製;NA(開口數)=1.07,Dipole(in/out=0.78/0.97)with Polano,浸潤介質:水],介由穿透型相位位移遮罩,對前述阻劑膜,以ArF準分子雷射(193nm)進行選擇性照射。 隨後,進行100℃、60秒鐘之PEB處理。 其次,使用Coater/Developer Lithius(東京電子公司製),於23℃下,使用含有乙炔系活性劑的2.38質量%之TMAH水溶液(商品名:NMD-W、東京應化工業公司製)進行30秒鐘鹼顯影,隨後,使用純水施以30秒鐘的水洗滌後,進行振動乾燥。 其結果,形成線路寬65nm,間距130nm的1:1之線路與空間(LS)圖型。<Formation of resist pattern (2)> (Example 4) The organic anti-reflective film composition "ARC29A" (trade name, manufactured by Polywatt Technology Co., Ltd.) was coated on a 12-inch silicon wafer using a spin coater, and heated on a hot plate at 205°C for 60 seconds As a result of sintering and drying, an organic anti-reflective film with a thickness of 89 nm was formed. The resist composition (3) of Table 1 was coated on the anti-reflective film using Coater/Developer Lithius (manufactured by Tokyo Electron Co., Ltd.), and pre-baked at 105°C for 60 seconds on a hot plate (PAB ) After drying, a resist film with a thickness of 150 nm is formed. Next, use ArF exposure device NSR-S609B for infiltration [manufactured by Nikon; NA (number of openings)=1.07, Dipole (in/out=0.78/0.97) with Polano, infiltration medium: water], through the penetration type phase shift Mask, selectively irradiate the aforementioned resist film with ArF excimer laser (193nm). Subsequently, PEB treatment was performed at 100°C for 60 seconds. Next, using Coater/Developer Lithius (manufactured by Tokyo Electronics Co., Ltd.), a 2.38% by mass TMAH aqueous solution (trade name: NMD-W, manufactured by Tokyo Ohka Kogyo Co., Ltd.) containing an acetylene-based active agent was used for 30 seconds at 23°C. The calcined alkali was developed, followed by washing with pure water for 30 seconds, followed by vibration drying. As a result, a 1:1 line and space (LS) pattern with a line width of 65 nm and a pitch of 130 nm was formed.

(比較例3) 除將顯影液變更為2.38質量%的TMAH水溶液(商品名:NMD-3、東京應化工業股份有限公司製)以外,其他皆依與實施例4為相同之方法,形成LS圖型。(Comparative example 3) Except that the developer was changed to a 2.38% by mass TMAH aqueous solution (trade name: NMD-3, manufactured by Tokyo Ohka Kogyo Co., Ltd.), the same method as in Example 4 was followed to form an LS pattern.

<阻劑圖型之評估(2)> [阻劑圖型形狀之評估] 使用掃瞄型電子顯微鏡(商品名:SU-8000、日立高科技公司製)觀察依上述<阻劑圖型之形成(2)>所形成的LS圖型之斷面形狀,並評估該形狀。 其結果得知,使用本發明的實施例4的阻劑圖型形成方法時,該阻劑圖型為具有高矩形性的良好形狀。另一方面,鹼顯影液使用不含非離子界面活性劑的比較例3的阻劑圖型形成方法,會發生鹼顯影液不易潤濕阻劑膜等解析性上之問題,使得阻劑圖型形成為錐形之形狀。<Evaluation of resist pattern (2)> [Evaluation of resist pattern shape] A scanning electron microscope (trade name: SU-8000, manufactured by Hitachi High-Tech Co., Ltd.) was used to observe the cross-sectional shape of the LS pattern formed in accordance with the above-mentioned <Formation of resist pattern (2)>, and evaluate the shape. As a result, it was found that when the resist pattern forming method of Example 4 of the present invention is used, the resist pattern has a good shape with high rectangularity. On the other hand, when the alkali developer uses the resist pattern forming method of Comparative Example 3 that does not contain a nonionic surfactant, there may be analytical problems such as difficulty in wetting the resist film by the alkali developer, which makes the resist pattern Formed into a tapered shape.

由以上結果得知,確認使用本發明的實施例之阻劑圖型形成方法時,可降低阻劑膜的未曝光部缺陷之發生,且可形成良好形狀的阻劑圖型。From the above results, it is confirmed that when the resist pattern forming method of the embodiment of the present invention is used, the occurrence of defects in the unexposed portion of the resist film can be reduced, and a good-shaped resist pattern can be formed.

Figure 108122559-A0101-11-0002-2
Figure 108122559-A0101-11-0002-2

Claims (3)

一種阻劑圖型形成方法,其特徵為具有:使用阻劑組成物於支撐體上形成阻劑膜之步驟(i)、 使前述阻劑膜曝光之步驟(ii),及 將前述曝光後的阻劑膜,使用含有非離子界面活性劑之鹼顯影液進行顯影,而形成阻劑圖型之步驟(iii)之阻劑圖型形成方法;又 前述阻劑組成物為含有:經由酸之作用而使對鹼顯影液之溶解性發生變化的基材成份(A),與經由曝光而產生酸之酸產生劑成份(B), 前述酸產生劑成份(B)為含有下述通式(b1-1)所表示之化合物(B1);
Figure 03_image001
[式中,R0 101 為多環式脂肪族烴基;其中,多環式脂肪族烴基的氫原子亦可被取代基所取代;R102 為氟原子或碳數1~5之氟化烷基;Y101 為單鍵,或含有氧原子的2價之連結基;V101 為單鍵、伸烷基或氟化伸烷基;m為1以上之整數,且M’m 為m價之鎓陽離子]。
A method for forming a resist pattern, which is characterized by having: a step (i) of forming a resist film on a support using a resist composition, a step (ii) of exposing the aforementioned resist film, and the step of exposing the aforementioned exposed The resist film is developed using an alkali developer containing a non-ionic surfactant to form the resist pattern forming method of step (iii); and the resist composition mentioned above contains: through the action of acid The base component (A) that changes the solubility to the alkali developer and the acid generator component (B) that generates acid through exposure, the aforementioned acid generator component (B) contains the following general formula (b1) -1) The represented compound (B1);
Figure 03_image001
[In the formula, R 0 101 is a polycyclic aliphatic hydrocarbon group; among them, the hydrogen atom of the polycyclic aliphatic hydrocarbon group may also be substituted by a substituent; R 102 is a fluorine atom or a fluorinated alkyl group with 1 to 5 carbon atoms ; Y 101 is a single bond, or a divalent linking group containing an oxygen atom of a; V 101 is a single bond, an alkylene group or fluorinated alkylene group; m is an integer of 1 or more, and m 'm + m is the valence of Onium cation].
如請求項1之阻劑圖型形成方法,其中,前述V101 為氟化伸烷基。The resist pattern forming method of claim 1, wherein the aforementioned V 101 is a fluorinated alkylene group. 如請求項1或2之阻劑圖型形成方法,其中,前述R0 101 為具有羥基的多環式脂肪族烴基。The resist pattern forming method of claim 1 or 2, wherein the aforementioned R 0 101 is a polycyclic aliphatic hydrocarbon group having a hydroxyl group.
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