TW202022341A - The reaction gas supply equipment of an inductive coupled plasma mass spectrometer comprises an ammonia supply end and a helium supply end and a reaction gas supply equipment - Google Patents

The reaction gas supply equipment of an inductive coupled plasma mass spectrometer comprises an ammonia supply end and a helium supply end and a reaction gas supply equipment Download PDF

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TW202022341A
TW202022341A TW108108479A TW108108479A TW202022341A TW 202022341 A TW202022341 A TW 202022341A TW 108108479 A TW108108479 A TW 108108479A TW 108108479 A TW108108479 A TW 108108479A TW 202022341 A TW202022341 A TW 202022341A
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helium
ammonia
gas
pipeline
gas supply
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TW108108479A
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陳韋帆
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詠馥企業股份有限公司
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Priority to US16/587,201 priority Critical patent/US20200294782A1/en
Publication of TW202022341A publication Critical patent/TW202022341A/en

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Abstract

The reaction gas supply equipment of an inductive coupled plasma mass spectrometer comprises an ammonia supply end and a helium supply end and a reaction gas supply equipment, which is supplied with an ammonia supply end and the helium supply end, and the reaction gas supply equipment is provided with an ammonia mass flowmeter to adjust the flow of ammonia and helium, Helium mass flowmeter; The ammonia mass flowmeter and helium mass flowmeter are adjusted by the proportion of reaction gas specified by the inductive coupled Plasma spectrometer, and the reaction gas is formed by mixing ammonia gas with helium, which is then provided to the inductive coupled Plasma mass spectrometer, which can be used to protect the detection instrument and reduce the cost of reaction gas through the technical means of the invention.

Description

感應耦合電漿質譜儀之反應氣體供應設備與調配方法 Reactive gas supply equipment and deployment method of inductively coupled plasma mass spectrometer

本發明關於檢測設備之反應氣體供應模組有關,特別係指一種感應耦合電漿質譜儀之反應氣體供應設備與調配方法;藉由本發明所提供的反應氣體供應設備及反應氣體調配方式,讓檢驗單位以正確的反應氣體進行元素檢測,能提高元素的檢出率及保護感應耦合電漿質譜儀的產品優勢。 The present invention relates to the reactive gas supply module of detection equipment, and in particular refers to a reactive gas supply device and deployment method of an inductively coupled plasma mass spectrometer; the reactive gas supply device and reactive gas deployment method provided by the present invention allow inspection The unit uses the correct reaction gas for element detection, which can increase the detection rate of elements and protect the product advantages of inductively coupled plasma mass spectrometers.

感應耦合電漿質譜儀進行測量分析,分析技術可以定量測量材料的元素含量,範圍為ppt到wt%。只有C(炭),H(氫),O(氧),N(氮)和鹵素不適用。 Inductively coupled plasma mass spectrometer for measurement and analysis, analysis technology can quantitatively measure the element content of the material, the range is ppt to wt%. Only C (carbon), H (hydrogen), O (oxygen), N (nitrogen) and halogen are not applicable.

其應用方式為將樣品溶液噴入感應耦合電漿的核心中,電漿溫度高達8000℃,在這樣的高溫下,所有的分析物種都會被原子化、離子化和熱激發,然後待測物可以被偵測和定量。 The application method is to spray the sample solution into the core of inductively coupled plasma. The plasma temperature is as high as 8000°C. Under such high temperature, all analytical species will be atomized, ionized and thermally excited, and then the test object can be Be detected and quantified.

其中感應耦合電漿質譜儀主要測量由高溫氬離子電漿產生的元素離子質量;在電漿中產生的離子依據其荷質比分離,使未知材料可以被識別和定量。 Among them, the inductively coupled plasma mass spectrometer mainly measures the mass of element ions produced by high temperature argon ion plasma; the ions produced in the plasma are separated according to their charge-to-mass ratio, so that unknown materials can be identified and quantified.

因此如:航太工業、濺射靶、化學品、合金生產商、食品/飲料、地質、製藥、環境水、廢水和處理水等產業當需要提出材質證明等相關報告時大多會透過檢測單位透過感應耦合電漿質譜儀進行元素含量、濃度等相關數據分析。 Therefore, industries such as aerospace industry, sputtering targets, chemicals, alloy manufacturers, food/beverage, geology, pharmacy, environmental water, wastewater, and water treatment industries will pass through the testing unit when they need to submit related reports such as material certification. Inductively coupled plasma mass spectrometer for element content, concentration and other related data analysis.

其中,以安捷倫科技公司產品Agilent8900系列的感應耦合電漿質譜儀受到國內各大檢驗單位或者半導體高科技公司所使用,由於在半導體的製造過程中,為了測定出特定的元素,必須透過感應耦合電漿質譜儀檢驗出如晶片含有的元素等;該公司所提供的反應氣體規格為10%NH3(氨氣)及90%He(氦氣),但是本案的發明人發現國內的各大廠商都是向氣體公司購買氨氣鋼瓶,以100%的NH3(氨氣)進行元素檢驗,因此造成下列問題: Among them, the Agilent 8900 series of inductively coupled plasma mass spectrometers from Agilent Technologies are used by major domestic inspection units or semiconductor high-tech companies. Because in the semiconductor manufacturing process, in order to determine specific elements, inductively coupled electrical The plasma mass spectrometer has detected elements such as those contained in the wafer; the reaction gas specifications provided by the company are 10% NH 3 (ammonia) and 90% He (helium), but the inventor of this case found that all major domestic manufacturers The ammonia cylinder was purchased from the gas company, and the element test was performed with 100% NH 3 (ammonia), which caused the following problems:

1. NH3(氨氣)具有腐蝕的特性對感應耦合電漿質譜儀具有破壞性,因此國內各大檢驗單位時常報修,不僅延遲檢驗進度,感應耦合電漿質譜儀的供應廠商也為此問題苦惱。 1. The corrosive nature of NH 3 (ammonia gas) is destructive to inductively coupled plasma mass spectrometers. Therefore, major domestic inspection units often report for repairs, which not only delays the inspection progress, but also the suppliers of inductively coupled plasma mass spectrometers. distressed.

2.發明人發現前述的問題在於國內的檢測單位因為無法自行調控反應氣體比例造成檢驗人員直接以氨氣作為反應氣體進行檢測。 2. The inventor found that the aforementioned problem lies in the fact that the domestic testing unit cannot adjust the proportion of the reaction gas by itself, and the inspector directly uses ammonia as the reaction gas for the detection.

3.而且前述的反應氣體(氨氣、氨氣)使用量不大,更導致檢驗單位為了節省成本直接使用氨氣,間接造成檢驗儀器的損壞問題。 3. In addition, the aforementioned reaction gas (ammonia, ammonia) is not used in a large amount, which causes the inspection unit to directly use ammonia in order to save costs, which indirectly causes damage to the inspection equipment.

4.感應耦合電漿質譜儀維修費用高,造成檢驗單位成本大增。 4. The maintenance cost of the inductively coupled plasma mass spectrometer is high, resulting in a significant increase in the unit cost of inspection.

5.由於反應氣體是氨氣,若以純氨氣作為反應氣體可能造成管線破損、氨氣外洩的疑慮,而氨氣對人體有害,容易造成工安問題。 5. Since the reaction gas is ammonia, if pure ammonia is used as the reaction gas, it may cause pipeline damage and ammonia leakage. Ammonia is harmful to the human body and is likely to cause industrial safety problems.

是以,要如何解決上述習知之問題與缺失,即為相關業者所亟欲研發之課題。 Therefore, how to solve the problems and deficiencies of the above-mentioned conventional knowledge is a topic that the related industry urgently wants to develop.

本發明的主要目的即在於提供一種感應耦合電漿質譜儀之反應氣體供應設備與調配方法,主要透過一反應氣體供應設備連接一氨氣氣體供應端及一氦氣氣體供應端,將兩種反應氣體於混合管路,再控制混合管路內的管線壓力,即可讓反應氣體充分混合,將反應氣體輸出至感應耦合電漿質譜儀即可進行檢驗,透過本發明的技術手段可以達到保護檢測儀器、降低反應氣體成本等多項優點。 The main purpose of the present invention is to provide a reactive gas supply device and a deployment method for an inductively coupled plasma mass spectrometer, which mainly connects an ammonia gas supply terminal and a helium gas supply terminal through a reactive gas supply device to combine the two reactions The gas is in the mixing pipeline, and then the pipeline pressure in the mixing pipeline is controlled to allow the reaction gas to be fully mixed, and the reaction gas is output to the inductively coupled plasma mass spectrometer for inspection. The technical means of the present invention can achieve protection detection Many advantages such as instrument, lower reaction gas cost, etc.

緣此,本發明感應耦合電漿質譜儀之反應氣體供應設備透過以下的技術手段達成,一氨氣供應端其可提供氨氣;一氦氣供應端,其提供氦氣;其特徵在於:一反應氣體供應設備,其分別與該氨氣供應端、該氦氣供應端相連接,並且該反應氣體供應設備設有一輸出端其與該感應耦合電漿質譜儀連接,該反應氣體供應設備包含有一氨氣管路及一氦氣管路;前述的氨氣管路上更包含有一第一氨氣調壓閥、一氨氣質量流量計及一第二氨氣調壓閥;前述的氦氣管路上更包含有一第一氦氣調壓閥、一氦氣質量流量計及一第二氦氣調壓閥;該氨氣管路相對該氨氣供應端一側、該氦氣管路相對該氦氣供應端一側上拉一混合管路,該混合管路與該氨氣管路、該氦氣管路連接;該混合管路與該輸出端相接將反應氣體供應給該感應耦合電漿質譜儀。 For this reason, the reactive gas supply device of the inductively coupled plasma mass spectrometer of the present invention is achieved through the following technical means. An ammonia supply end can provide ammonia; a helium supply end can provide helium; and it is characterized by: The reactive gas supply device is respectively connected to the ammonia gas supply end and the helium gas supply end, and the reactive gas supply device is provided with an output end connected to the inductively coupled plasma mass spectrometer, and the reactive gas supply device includes a Ammonia gas pipeline and a helium gas pipeline; the aforementioned ammonia gas pipeline further includes a first ammonia gas pressure regulating valve, an ammonia gas mass flow meter and a second ammonia gas pressure regulating valve; the aforementioned helium gas pipeline further includes a first A helium gas pressure regulating valve, a helium gas mass flow meter and a second helium gas pressure regulating valve; the ammonia gas pipeline is pulled up on the side of the ammonia gas supply end, and the helium gas pipeline is pulled up on the side of the helium gas supply end A mixing pipeline connected with the ammonia pipeline and the helium pipeline; the mixing pipeline is connected with the output end to supply reaction gas to the inductively coupled plasma mass spectrometer.

透過上述設備,本發明反應氣體的調配方式為;步驟一:將前述的氨氣供應端與氦氣供應端開啟,使氨氣與氦氣流入該氨氣管路及該 氦氣管路;步驟二:調整前述第一氨氣調壓閥、第二氨氣調壓閥、第一氦氣調壓閥、第二氦氣調壓閥為10~20psi,在此狀態下連接的混合管路的管內壓力也會保持在10~20psi;步驟三:調整前述的氨氣質量流量計的供應參數為0.1L/min、氦氣質量流量計的供應參數為0.9L/min;藉此,氨氣與氦氣透過10~20psi的壓力狀態下充分混合形成供該感應耦合電漿質譜儀使用的反應氣體。 Through the above-mentioned equipment, the reaction gas deployment method of the present invention is as follows: Step 1: Open the aforementioned ammonia supply end and helium supply end, so that ammonia and helium flow into the ammonia pipeline and the Helium gas pipeline; Step 2: Adjust the aforementioned first ammonia gas pressure regulating valve, second ammonia gas pressure regulating valve, first helium gas pressure regulating valve, and second helium gas pressure regulating valve to 10-20 psi, and connect in this state The internal pressure of the mixing pipeline will also be maintained at 10~20psi; Step 3: Adjust the supply parameter of the aforementioned ammonia mass flowmeter to 0.1L/min, and the supply parameter of the helium mass flowmeter to 0.9L/min; Thereby, ammonia gas and helium gas are thoroughly mixed under a pressure state of 10-20 psi to form a reaction gas for the inductively coupled plasma mass spectrometer.

在本發明反應氣體供應設備的實施方式中,前述的氨氣管路與前述的混合管路、前述的氦氣管路與前述的混合管路之間,更分別設置有一防止氣體回流的單向閥。 In the embodiment of the reaction gas supply device of the present invention, a check valve is provided between the aforementioned ammonia gas pipeline and the aforementioned mixing pipeline, and between the aforementioned helium gas pipeline and the aforementioned mixing pipeline to prevent gas backflow.

在本發明反應氣體供應設備的實施方式中,氨氣若滲入水汽會變成氨水(NH4OH),氨水是強鹼的化合物,其物理性及化學性對人體及管線有腐蝕性的危害,因此本發明的該氨氣管路、該混合管路及該輸出端上接設一加熱模組進行加熱,前述的加熱模組係於管路上纏繞多個金屬加熱帶,並且該加熱模組將該些金屬加熱帶到升溫至攝氏70~80℃左右的範圍預防管路混入水汽形成氨水的情況發生。 In the embodiment of the reactive gas supply device of the present invention, if ammonia gas penetrates into water vapor, it will become ammonia water (NH4OH). Ammonia water is a strong alkali compound, and its physical and chemical properties are corrosive to the human body and pipelines. Therefore, the present invention A heating module is connected to the ammonia pipeline, the mixing pipeline, and the output end for heating. The heating module is wound with a plurality of metal heating tapes on the pipeline, and the heating module adds the metals In the tropical zone, the temperature rises to about 70~80℃ to prevent the occurrence of ammonia water mixed with water vapor in the pipeline.

在本發明反應氣體供應設備的實施方式中,該混合管路更連接到一氣體儲存單元,藉由該氣體儲存單元能儲存大量的反應氣體,如此一來需要大量的反應氣體時能由該氣體儲存單元供應反應氣體增加檢測的便利性。 In the embodiment of the reaction gas supply device of the present invention, the mixing pipeline is further connected to a gas storage unit, by which a large amount of reaction gas can be stored, so that when a large amount of reaction gas is required, the gas The storage unit supplies reactive gas to increase the convenience of detection.

透過本發明的設備及技術手段可以理解到:1.本發明確實能提供感應耦合電漿質譜儀檢驗時正確的氣體比例;檢驗單位無須向氣體供應廠商訂製特殊規格的反應氣體,可降低檢驗單位的檢驗成本;2.防止以純 氨氣作為反應氣體造成感應耦合電漿質譜儀設備損壞的問題。 Through the equipment and technical means of the present invention, it can be understood that: 1. The present invention can indeed provide the correct gas ratio for the inductively coupled plasma mass spectrometer inspection; the inspection unit does not need to order special specifications of reaction gas from the gas supplier, which can reduce the inspection Unit inspection cost; 2. Prevent the use of pure Ammonia is used as a reaction gas to cause damage to the inductively coupled plasma mass spectrometer.

1‧‧‧氨氣供應端 1‧‧‧Ammonia supply side

11‧‧‧純化器 11‧‧‧Purifier

12‧‧‧濾水器 12‧‧‧Water filter

2‧‧‧氦氣供應端 2‧‧‧Helium supply side

21‧‧‧濾水器 21‧‧‧Water Filter

3‧‧‧反應氣體供應設備 3‧‧‧Reactive gas supply equipment

31‧‧‧輸出端 31‧‧‧Output

32‧‧‧機身 32‧‧‧body

33‧‧‧氨氣管路 33‧‧‧Ammonia pipeline

331‧‧‧第一氨氣調壓閥 331‧‧‧First Ammonia Pressure Regulator

332‧‧‧氨氣質量流量計 332‧‧‧Ammonia Mass Flowmeter

333‧‧‧第二氨氣調壓閥 333‧‧‧Second Ammonia Pressure Regulator

334‧‧‧單向閥 334‧‧‧One-way valve

335‧‧‧氨氣壓力計 335‧‧‧Ammonia Pressure Gauge

34‧‧‧氦氣管路 34‧‧‧Helium pipeline

341‧‧‧第一氦氣調壓閥 341‧‧‧The first helium pressure regulator

342‧‧‧氦氣質量流量計 342‧‧‧Helium mass flow meter

343‧‧‧第二氦氣調壓閥 343‧‧‧The second helium pressure regulator

344‧‧‧單向閥 344‧‧‧One-way valve

345‧‧‧氦氣壓力計 345‧‧‧Helium Pressure Gauge

35‧‧‧混合管路 35‧‧‧Mixed pipeline

36‧‧‧加熱模組 36‧‧‧Heating Module

37‧‧‧金屬加熱帶 37‧‧‧Metal heating belt

38‧‧‧氣體儲存單元 38‧‧‧Gas storage unit

4‧‧‧感應耦合電漿質譜儀 4‧‧‧Inductively coupled plasma mass spectrometer

第1圖係本發明之反應氣體供應設備結構示意圖;第2圖係管路纏繞金屬加熱帶的示意圖;第3圖係本發明包含有一氣體儲存單元的結構示意圖;第4圖係本發明應用於配置反應氣體的方法流程圖;第5圖係本發明另一實施方式結構示意圖。 Fig. 1 is a schematic diagram of the structure of the reactive gas supply equipment of the present invention; Fig. 2 is a schematic diagram of the pipe wrapped with a metal heating tape; Fig. 3 is a schematic diagram of the structure of the present invention including a gas storage unit; Fig. 4 is the application of the present invention The flow chart of the method for configuring the reactant gas; Figure 5 is a schematic structural diagram of another embodiment of the present invention.

為使貴 審查委員能對本發明之特徵與其特點有更進一步之了解與認同,茲列舉以下較佳之實施例並配合圖式說明如下:請參閱第1至3圖,本發明之感應耦合電漿質譜儀之反應氣體供應設備包含有:一氨氣供應端1、一氦氣供應端2及一反應氣體供應設備3所構成;前述的氨氣供應端1其可提供氨氣,其中氨氣的純度需要接近100%能產生較佳的分析數據並降低環境雜質;如第1、3圖所示,該氨氣供應端1設有一純化器11其可過濾氨氣內的雜質。 In order to enable your reviewer to have a further understanding and recognition of the features and characteristics of the present invention, the following preferred embodiments are listed and illustrated as follows: Please refer to Figures 1 to 3, the inductively coupled plasma mass spectrometer of the present invention The reaction gas supply equipment of the instrument includes: an ammonia gas supply port 1, a helium gas supply port 2 and a reaction gas supply device 3; the aforementioned ammonia gas supply port 1 can provide ammonia gas, wherein the purity of the ammonia gas It needs to be close to 100% to produce better analytical data and reduce environmental impurities; as shown in Figures 1 and 3, the ammonia supply end 1 is provided with a purifier 11 that can filter impurities in the ammonia gas.

前述的氦氣供應端2,其提供氦氣,其中氦氣的純度需要接近100%能產生較佳的分析數據並降低環境雜質。 The aforementioned helium gas supply terminal 2 provides helium gas, where the purity of the helium gas needs to be close to 100% to produce better analysis data and reduce environmental impurities.

前述的反應氣體供應設備3,其分別與該氨氣供應端1、該氦氣供應端2相連接,並且該反應氣體供應設備3設有一輸出端31其與該感應耦合電漿質譜儀4連接;如第1、3圖所示,該反應氣體供應設備3設有一機 身32,後述的設備大多安裝於機身3中,該反應氣體供應設備3包含有一氨氣管路33及一氦氣管路34;前述的氨氣管路33上依序包含有一第一氨氣調壓閥331、一氨氣質量流量計332及一第二氨氣調壓閥333;前述的氦氣管路34上依序包含有一第一氦氣調壓閥341、一氦氣質量流量計342及一第二氦氣調壓閥343。 The aforementioned reactive gas supply device 3 is respectively connected to the ammonia gas supply port 1 and the helium gas supply port 2, and the reactive gas supply device 3 is provided with an output port 31 which is connected to the inductively coupled plasma mass spectrometer 4 ; As shown in Figures 1 and 3, the reactive gas supply device 3 is equipped with a machine Body 32, most of the equipment described later is installed in the fuselage 3. The reactive gas supply equipment 3 includes an ammonia pipe 33 and a helium pipe 34; the aforementioned ammonia pipe 33 sequentially includes a first ammonia pressure regulator Valve 331, an ammonia mass flow meter 332, and a second ammonia pressure regulating valve 333; the aforementioned helium pipeline 34 includes a first helium pressure regulating valve 341, a helium mass flow meter 342, and a The second helium pressure regulating valve 343.

請繼續參閱第1、3圖所示,該氨氣管路33相對該氨氣供應端1一側、該氦氣管路34相對該氦氣供應端2一側上拉一混合管路35,該混合管路35與該氨氣管路33、該氦氣管路34連接;該混合管路35與該輸出端31相接將反應氣體供應給該感應耦合電漿質譜儀4。 Please continue to refer to Figures 1 and 3, the ammonia gas pipeline 33 is opposite to the ammonia gas supply end 1 side, and the helium gas pipeline 34 is opposite to the helium gas supply end 2 side. The pipeline 35 is connected with the ammonia pipeline 33 and the helium pipeline 34; the mixing pipeline 35 is connected with the output end 31 to supply reaction gas to the inductively coupled plasma mass spectrometer 4.

又,前述的氨氣管路33與前述的混合管路35、該氦氣管路34與前述的混合管路35之間,分別設置有一防止氣體回流的單向閥334、344;此外,該氨氣管路33、該混合管路35及該輸出端31上接設一加熱模組36進行加熱,前述的加熱模組36係於前述的氨氣管路33、混合管路35、輸出端31上纏繞多個金屬加熱帶37,並且該加熱模組36將該些金屬加熱帶37到升溫至攝氏70~80℃左右的範圍預防管路混入水汽形成氨水的情況發生。 In addition, between the aforementioned ammonia pipe 33 and the aforementioned mixing pipe 35, and between the helium pipe 34 and the aforementioned mixing pipe 35, one-way valves 334 and 344 are respectively provided to prevent gas backflow; in addition, the ammonia pipe A heating module 36 is connected to the circuit 33, the mixing pipe 35 and the output end 31 for heating. The aforementioned heating module 36 is connected to the aforementioned ammonia pipe 33, the mixing pipe 35, and the output end 31. There are two metal heating belts 37, and the heating module 36 raises the temperature of the metal heating belts 37 to a range of about 70-80°C to prevent the pipeline from mixing with water vapor to form ammonia.

透過上述的設備,檢驗單位可向氣體供應廠商購買氨氣鋼瓶、氦氣鋼瓶當作本發明的氨氣供應端1、氦氣供應端2;將氨氣管路33與氨氣供應端1連接、氦氣管路34與氦氣供應端2連接即可透過前述的反應氣體供應設備3混合形成提供該感應耦合電漿質譜儀4之反應氣體。 Through the above equipment, the inspection unit can purchase ammonia cylinders and helium cylinders from the gas supplier as the ammonia supply port 1 and helium supply port 2 of the present invention; connect the ammonia gas pipeline 33 to the ammonia supply port 1. The helium gas pipeline 34 is connected to the helium gas supply end 2 and can be mixed through the aforementioned reaction gas supply device 3 to form the reaction gas for the inductively coupled plasma mass spectrometer 4.

如第3圖所示,其結構基本上與第1圖的結構相同,差異在於:混合管路35更連接到一氣體儲存單元38,藉由該氣體儲存單元38能儲存大量的反應氣體,如此一來需要大量的反應氣體時能由該氣體儲存單元 38供應反應氣體增加檢測的便利性。 As shown in Figure 3, the structure is basically the same as that in Figure 1, except that the mixing pipe 35 is further connected to a gas storage unit 38, which can store a large amount of reaction gas. When a large amount of reaction gas is needed, the gas storage unit 38 Supply of reactive gas increases the convenience of detection.

如第4圖所示,透過上述的設備,本發明更包含有一反應氣體的調配方式為:步驟一:將前述的氨氣供應端1與氦氣供應端2開啟,使氨氣與氦氣流入該氨氣管路33及該氦氣管路34;步驟二:調整前述第一氨氣調壓閥331、第二氨氣調壓閥333、第一氦氣調壓閥341、第二氦氣調壓閥343為10~20psi,在此狀態下連接的混合管路35的管內壓力也會保持在10~20psi;其中,為了方便操作人員調整壓力,該氨氣供應端1與該氨氣管路33之間設有一氨氣壓力計335、該氦氣供應端2與該氦氣供應管路34之間設有一氦氣壓力計345,藉由該氨氣壓力計335、該氦氣壓力計345快速調整該氨氣管路33、該氦氣管路34於10~20psi。 As shown in Figure 4, through the above-mentioned equipment, the present invention further includes a reaction gas preparation method as follows: Step 1: Open the aforementioned ammonia supply port 1 and helium supply port 2 to allow ammonia and helium to flow in The ammonia gas pipeline 33 and the helium gas pipeline 34; Step 2: Adjust the aforementioned first ammonia pressure regulating valve 331, second ammonia pressure regulating valve 333, first helium pressure regulating valve 341, and second helium pressure regulating valve The valve 343 is 10-20 psi. In this state, the internal pressure of the mixing pipeline 35 connected will also be maintained at 10-20 psi; among them, in order to facilitate the operator to adjust the pressure, the ammonia supply port 1 and the ammonia pipeline 33 An ammonia gas pressure gauge 335 is provided between the helium gas supply end 2 and the helium gas supply pipe 34, and a helium gas pressure gauge 345 is installed between the helium gas supply end 2 and the helium gas supply pipe 34. Adjust the ammonia gas pipeline 33 and the helium gas pipeline 34 to 10-20 psi.

步驟三:調整前述的氨氣質量流量計332的供應參數為0.1L/min、前述的氦氣質量流量計342的供應參數為0.9L/min;藉此,氨氣與氦氣透過10~20psi的壓力狀態下充分混合形成供該感應耦合電漿質譜儀4使用的反應氣體。 Step 3: Adjust the supply parameter of the aforementioned ammonia mass flow meter 332 to 0.1L/min, and the aforementioned supply parameter of helium mass flow meter 342 to 0.9L/min; thereby, the ammonia and helium can pass through 10-20 psi The reaction gas is fully mixed to form the reaction gas for the inductively coupled plasma mass spectrometer 4 under the pressure state.

因此,本發明反應氣體的調配方式使得反應氣體恰好符合感應耦合電漿質譜儀4進行檢驗時反應氣體正確的比例,由於本發明所提供的反應氣體能夠降低氨氣的使用量,不容易造成感應耦合電漿質譜儀4設備的腐蝕、損壞問題,並且可降低環境雜質使檢測物能正確判讀出所包含的元素、元素含量甚至是元素的濃度。 Therefore, the reaction gas preparation method of the present invention makes the reaction gas exactly match the correct ratio of the reaction gas when the inductively coupled plasma mass spectrometer 4 performs the test. Since the reaction gas provided by the present invention can reduce the amount of ammonia used, it is not easy to cause induction. The coupling plasma mass spectrometer 4 equipment has corrosion and damage problems, and can reduce environmental impurities so that the detected substance can correctly determine the elements contained, the element content and even the element concentration.

如第5圖所示,係本發明之反應氣體供應設備3的第二實施方 式,在本實施方式中,特點在於在氨氣供應端1與氦氣供應端2上加裝一濾水器,其可防止前述的氨氣管路33或氦氣管路34受到水氣而結冰,換言之即是前述的氨氣管路33或氦氣管路34無須額外設置加熱模組36與金屬加熱帶37,而本實施方式的具體實施方式為:設置一氨氣供應端1與一氦氣供應端2,前述的氨氣供應端1與前述的氦氣供應端2連接到一反應氣體供應設備3,其中,該氨氣供應端1設有一濾水器12、該氦氣供應端同樣設有一濾水器21,所述的濾水器12、21係用於濾除氨氣、氦氣的水氣,防止管線結冰;該反應氣體供應設備3基本上與第1至3圖所提供的結構相同,具有一氨氣管路33、一氦氣管路34,該氨氣管路33上依序包含有一第一氨氣調壓閥331、一氨氣質量流量計332及一第二氨氣調壓閥333;前述的氦氣管路34上依序包含有一第一氦氣調壓閥341、一氦氣質量流量計342及一第二氦氣調壓閥343;該氨氣管路33相對該氨氣供應端1一側、該氦氣管路34相對該氦氣供應端2一側上拉一混合管路35,該混合管路35與該氨氣管路33、該氦氣管路34連接;該混合管路35與該輸出端31相接將反應氣體供應給該感應耦合電漿質譜儀4。而在本實施方式的原理與第1至3圖相同,故不重複贅述。 As shown in Figure 5, it is the second embodiment of the reactive gas supply device 3 of the present invention In this embodiment, the feature is that a water filter is added to the ammonia supply end 1 and the helium supply end 2, which can prevent the aforementioned ammonia pipe 33 or helium pipe 34 from being frozen by water. In other words, the aforementioned ammonia gas pipeline 33 or helium gas pipeline 34 does not need to be additionally provided with a heating module 36 and a metal heating belt 37, and the specific implementation of this embodiment is to provide an ammonia gas supply port 1 and a helium gas supply Terminal 2, the aforementioned ammonia supply terminal 1 and the aforementioned helium supply terminal 2 are connected to a reactive gas supply device 3, wherein the ammonia supply terminal 1 is provided with a water filter 12, and the helium supply terminal is also provided with a Water filter 21. The water filters 12 and 21 are used to filter ammonia and helium to prevent icing of the pipeline; the reactive gas supply device 3 is basically the same as that provided in Figures 1 to 3 The structure is the same, it has an ammonia gas pipeline 33 and a helium gas pipeline 34. The ammonia gas pipeline 33 sequentially includes a first ammonia gas pressure regulating valve 331, an ammonia gas mass flow meter 332, and a second ammonia gas pressure regulating valve. Valve 333; the aforementioned helium gas pipeline 34 includes a first helium pressure regulating valve 341, a helium mass flow meter 342 and a second helium pressure regulating valve 343 in sequence; the ammonia gas pipeline 33 is opposite to the ammonia gas A mixing pipe 35 is pulled up on the side of the supply end 1 and the helium gas pipeline 34 opposite to the helium supply end 2, and the mixing pipeline 35 is connected to the ammonia pipeline 33 and the helium pipeline 34; the mixing pipe The circuit 35 is connected to the output terminal 31 to supply reaction gas to the inductively coupled plasma mass spectrometer 4. However, the principle of this embodiment is the same as that of Figs. 1 to 3, so it will not be repeated.

綜上所述,本發明構成結構均未曾見於諸書刊或公開使用,符合發明專利申請要件,懇請 鈞局明鑑,早日准予專利,至為感禱。 To sum up, the structure of the present invention has not been seen in books and periodicals or used publicly, and it meets the requirements of an invention patent application. I sincerely ask Jun Bureau to approve the patent as soon as possible.

需陳明者,以上所述乃是本發明之具體實施立即所運用之技術原理,若依本發明之構想所作之改變,其所產生之功能仍未超出說明書及圖式所涵蓋之精神時,均應在本發明之範圍內,合予陳明。 If it needs to be clarified, the above is the technical principle immediately used in the implementation of the present invention. If the changes made according to the concept of the present invention, the functions produced by it still do not exceed the spirit covered by the specification and drawings, All should be within the scope of the present invention and should be disclosed.

1‧‧‧氨氣供應端 1‧‧‧Ammonia supply side

11‧‧‧純化器 11‧‧‧Purifier

2‧‧‧氦氣供應端 2‧‧‧Helium supply side

3‧‧‧反應氣體供應設備 3‧‧‧Reactive gas supply equipment

31‧‧‧輸出端 31‧‧‧Output

32‧‧‧機身 32‧‧‧body

33‧‧‧氨氣管路 33‧‧‧Ammonia pipeline

331‧‧‧第一氨氣調壓閥 331‧‧‧First Ammonia Pressure Regulator

332‧‧‧氨氣質量流量計 332‧‧‧Ammonia Mass Flowmeter

333‧‧‧第二氨氣調壓閥 333‧‧‧Second Ammonia Pressure Regulator

334‧‧‧單向閥 334‧‧‧One-way valve

335‧‧‧氨氣壓力計 335‧‧‧Ammonia Pressure Gauge

34‧‧‧氦氣管路 34‧‧‧Helium pipeline

341‧‧‧第一氦氣調壓閥 341‧‧‧The first helium pressure regulator

342‧‧‧氦氣質量流量計 342‧‧‧Helium mass flow meter

343‧‧‧第二氦氣調壓閥 343‧‧‧The second helium pressure regulator

344‧‧‧單向閥 344‧‧‧One-way valve

345‧‧‧氦氣壓力計 345‧‧‧Helium Pressure Gauge

35‧‧‧混合管路 35‧‧‧Mixed pipeline

36‧‧‧加熱模組 36‧‧‧Heating Module

37‧‧‧金屬加熱帶 37‧‧‧Metal heating belt

4‧‧‧感應耦合電漿質譜儀 4‧‧‧Inductively coupled plasma mass spectrometer

Claims (8)

一種感應耦合電漿質譜儀之反應氣體供應設備,包含有:一氨氣供應端其可提供氨氣;一氦氣供應端,其提供氦氣;其特徵在於:一反應氣體供應設備,其分別與該氨氣供應端、該氦氣供應端相連接,並且該反應氣體供應設備設有一輸出端其與一感應耦合電漿質譜儀連接,該反應氣體供應設備包含有一氨氣管路及一氦氣管路;前述的氨氣管路上更包含有一第一氨氣調壓閥、一氨氣質量流量計及一第二氨氣調壓閥;前述的氦氣管路上更包含有一第一氦氣調壓閥、一氦氣質量流量計及一第二氦氣調壓閥;該氨氣管路相對該氨氣供應端一側、該氦氣管路相對該氦氣供應端一側上拉一混合管路,該混合管路與該氨氣管路、該氦氣管路連接;該混合管路與該輸出端相接將反應氣體供應給該感應耦合電漿質譜儀。 A reactive gas supply device for an inductively coupled plasma mass spectrometer, comprising: an ammonia gas supply end which can provide ammonia gas; a helium gas supply end which provides helium gas; and is characterized in that: a reactive gas supply device, which is respectively Connected to the ammonia supply end and the helium supply end, and the reaction gas supply device is provided with an output end connected to an inductively coupled plasma mass spectrometer. The reaction gas supply device includes an ammonia pipe and a helium pipe The aforementioned ammonia gas pipeline further includes a first ammonia gas pressure regulating valve, an ammonia gas mass flow meter and a second ammonia gas pressure regulating valve; the aforementioned helium gas pipeline further comprises a first helium gas pressure regulating valve, A helium mass flow meter and a second helium pressure regulating valve; the ammonia gas pipeline is opposite to the ammonia gas supply end side, and the helium gas pipeline is opposite to the helium gas supply end side. The pipeline is connected with the ammonia pipeline and the helium pipeline; the mixing pipeline is connected with the output end to supply reaction gas to the inductively coupled plasma mass spectrometer. 以申請專利範圍第1項所述感應耦合電漿質譜儀之反應氣體供應設備產生反應氣體的調配方式為:步驟一:將前述的氨氣供應端與氦氣供應端開啟,使氨氣與氦氣流入該氨氣管路及該氦氣管路;步驟二:調整前述第一氨氣調壓閥、第二氨氣調壓閥、第一氦氣調壓閥、第二氦氣調壓閥為10~20psi,在此狀態下連接的混合管路的管內壓力也會保持在10~20psi;步驟三:調整前述的氨氣質量流量計的供應參數為0.1L/min、氦氣質量流量計的供應參數為0.9L/min;藉此,氨氣與氦氣透過10~20psi的壓力狀態 下充分混合形成供該感應耦合電漿質譜儀使用的反應氣體。 The method of preparing the reaction gas generated by the reaction gas supply equipment of the inductively coupled plasma mass spectrometer described in the first item of the scope of patent application is: Step 1: Turn on the aforementioned ammonia gas supply port and helium gas supply port, so that the ammonia gas and helium gas Flow into the ammonia gas pipeline and the helium gas pipeline; Step 2: Adjust the aforementioned first ammonia gas pressure regulating valve, second ammonia gas pressure regulating valve, first helium gas pressure regulating valve, and second helium gas pressure regulating valve to 10 ~20psi. In this state, the internal pressure of the connected mixing pipeline will also be maintained at 10~20psi; Step 3: Adjust the supply parameters of the aforementioned ammonia mass flowmeter to 0.1L/min, and the helium mass flowmeter The supply parameter is 0.9L/min; by this, ammonia and helium can pass through the pressure state of 10~20psi Mix thoroughly to form a reaction gas for the inductively coupled plasma mass spectrometer. 依據申請專利範圍第1項所述感應耦合電漿質譜儀之反應氣體供應設備其中,前述的氨氣管路與前述的混合管路、前述的氦氣管路與前述的混合管路之間,更分別設置有一防止氣體回流的單向閥。 According to the reactive gas supply equipment of the inductively coupled plasma mass spectrometer according to the first item of the patent application, the ammonia gas pipeline and the mixing pipeline, the helium gas pipeline and the mixing pipeline are more separate A one-way valve to prevent gas backflow is provided. 依據申請專利範圍第1項所述感應耦合電漿質譜儀之反應氣體供應設備,其中,該氨氣管路、該混合管路及該輸出端上接設一加熱模組進行加熱,前述的加熱模組係於管路上纏繞多個金屬加熱帶。 According to the reactive gas supply equipment of the inductively coupled plasma mass spectrometer described in the first item of the scope of patent application, a heating module is connected to the ammonia gas pipeline, the mixing pipeline, and the output end for heating. The group is wound with multiple metal heating tapes on the pipeline. 依據申請專利範圍第4項所述感應耦合電漿質譜儀之反應氣體供應設備,其中,該加熱模組將該些金屬加熱帶到升溫至攝氏70~80℃左右的範圍預防管路混入水汽形成氨水的情況發生。 According to the reactive gas supply equipment of the inductively coupled plasma mass spectrometer described in item 4 of the scope of patent application, the heating module heats the metals to a temperature range of about 70~80℃ to prevent the pipeline from being mixed with water vapor. Ammonia situation occurs. 依據申請專利範圍第1項所述感應耦合電漿質譜儀之反應氣體供應設備,其中,該混合管路更連接到一氣體儲存單元。 According to the reactive gas supply device of the inductively coupled plasma mass spectrometer according to the first item of the patent application, the mixing pipeline is further connected to a gas storage unit. 依據申請專利範圍第項所述感應耦合電漿質譜儀之反應氣體供應設備,其中,該氨氣供應端與該氨氣管路之間設有一氨氣壓力表、該氦氣供應端與該氦氣供應管路之間設有一氦氣壓力表,藉由該氨氣壓力表、該氦氣壓力表快速調整該氨氣管路、該氦氣管路之管路壓力。 According to the reactive gas supply device of the inductively coupled plasma mass spectrometer described in the scope of the patent application, an ammonia gas pressure gauge is arranged between the ammonia gas supply end and the ammonia gas pipeline, the helium gas supply end and the helium gas A helium pressure gauge is arranged between the supply pipelines, and the pipeline pressures of the ammonia pipeline and the helium pipeline are quickly adjusted by the ammonia pressure gauge and the helium pressure gauge. 一種感應耦合電漿質譜儀之反應氣體供應設備,包含有:一氨氣供應端其可提供氨氣,該氨氣供應端設有一濾水器;一氦氣供應端,其提供氦氣,該氦氣供應端同樣設有一濾水器;其特徵在於:前述的氨氣管路上更包含有一第一氨氣調壓閥、一氨氣質量流量計及一第二氨氣調壓閥;前述的氦氣管路上更包含有一第一氦氣調壓閥、一氦氣質量流量計及一 第二氦氣調壓閥;該氨氣管路相對該氨氣供應端一側、該氦氣管路相對該氦氣供應端一側上拉一混合管路,該混合管路與該氨氣管路、該氦氣管路連接;該混合管路與該輸出端相接將反應氣體供應給一感應耦合電漿質譜儀。 A reactive gas supply device for an inductively coupled plasma mass spectrometer, comprising: an ammonia gas supply end which can supply ammonia gas, the ammonia gas supply end is provided with a water filter; a helium gas supply end which supplies helium gas, the The helium gas supply end is also provided with a water filter; it is characterized in that: the aforementioned ammonia gas pipeline further includes a first ammonia gas pressure regulating valve, an ammonia gas mass flow meter, and a second ammonia gas pressure regulating valve; The gas pipeline further includes a first helium pressure regulating valve, a helium mass flow meter and a The second helium pressure regulating valve; the ammonia gas pipeline is opposite to the ammonia gas supply end side, the helium gas pipeline is opposite to the helium gas supply end side, pull up a mixing pipeline, the mixing pipeline and the ammonia gas pipeline, The helium gas pipeline is connected; the mixing pipeline is connected with the output end to supply reaction gas to an inductively coupled plasma mass spectrometer.
TW108108479A 2018-12-12 2019-03-13 The reaction gas supply equipment of an inductive coupled plasma mass spectrometer comprises an ammonia supply end and a helium supply end and a reaction gas supply equipment TW202022341A (en)

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