TW202016942A - Electronic device having power quality detection module and method threof - Google Patents

Abstract

The invention provides an electronic device having power quality detection module. The electronic device includes a power module, a storage module, and a power quality detection module. The power module receives an external power source. The power module converts the external power source to a first internal voltage. The power quality detection module is electrically connected to the power module and the storage module. The storage module is electrically connected to the power module through the power quality detection module to receive the first internal voltage. The power quality detecting module determines a quality parameter according to a waveform of the first internal voltage and determines whether to send a first alarm signal according to the quality parameter.

Description

Electronic equipment with power supply quality detection module and related methods

The invention relates to a power supply quality detection system, and particularly to a power supply detection module provided between a storage module and a power supply module.

Storage modules require stable voltages as the basis for operation, especially solid-state storage devices and memory cards. In the power environment, if the AC voltage fluctuates too much, or/and the design of the power module is not good, it may not be possible to provide a stable voltage to the storage module. If the voltage provided to the storage module is too high or too low, the storage module may malfunction, read or write errors, or even cause damage to the storage module.

Therefore, how to provide a power quality detection circuit, module and method for detecting power quality to prevent the above problems has become an important issue in the industry.

In view of this, an embodiment of the present invention provides a power supply quality detection system, including: a power supply module that receives an external power supply, and the power supply module converts the external power supply into a first internal voltage; a storage module; And a power supply quality detection module, which is electrically connected to the power supply module and the storage module, and the storage module is electrically connected to the power supply module through the power supply quality detection module to receive the first An internal voltage; wherein, the power quality detection module determines a quality parameter according to the waveform of the first internal voltage to determine whether to send a warning signal.

In view of this, an embodiment of the present invention provides a power supply quality detection method using a storage module. The method includes: receiving an external power supply, and converting the external power supply into a first internal voltage by a power supply module ; And determining the waveform of the first internal voltage from a plurality of waveform types to generate a detection result; the storage module according to the detection result from a programming mode determined from the plurality of programming modes for access The data of the storage module.

In summary, the present invention uses the power quality detection system to detect the first internal voltage transmitted to the storage module to determine the voltage quality of the first internal voltage, effectively determine the working environment of the storage module, and when the voltage is unstable , Can effectively find the problem, and quickly provide solutions.

In order to make the above features and advantages of the present invention more comprehensible, preferred embodiments are described below in conjunction with the accompanying drawings, which are described in detail below.

In the following, various exemplary embodiments will be described more fully with reference to the accompanying drawings, in which some exemplary embodiments are shown. However, the inventive concept may be embodied in many different forms and should not be interpreted as being limited to the exemplary embodiments set forth herein. Rather, providing these exemplary embodiments will make the invention detailed and complete, and will fully convey the scope of the inventive concept to those skilled in the art. In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity. Similar numbers always indicate similar components.

It should be understood that although the terms first, second, third, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used to distinguish one element from another. Therefore, the first element discussed below may be referred to as the second element without departing from the teachings of the inventive concept. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

The following will describe the power quality detection module and the power quality detection system with at least one embodiment and drawings, however, the following embodiments are not intended to limit the disclosure. In the following description, if there is a special mark for an electronic component with more than two end points, the foot mark is used as its foot description. If there is no special mark, the electronic components at the two ends of the horizontal position are set to the left end point Is the first end, and the right end is the second end. If the electronic components are arranged vertically at both ends, the upper end is the first end, and the lower end is the second end.

[Examples of the power quality detection system and power quality detection module of the present invention]

Please refer to FIGS. 1 and 2. FIG. 1 is a schematic diagram of a power quality detection system according to an embodiment of the present invention. 2 is another schematic diagram of a power quality detection system according to an embodiment of the invention. The implementation of the power quality detection system 1 may include electronic devices including storage modules, such as solid state storage devices (SSD), memory cards (Memory Card), computer systems, tablets, smart phones, etc.

In this embodiment, the power quality detection system 1 includes a power module 11, a motherboard module 12, a processor 13, a storage module 14, and a power quality detection module 15.

In this embodiment, the power module 11 receives an external voltage AC. The power module converts the external power supply AC to a first internal voltage IV1.

The power quality detection module 15 is electrically connected to the power module 11 and the storage module 14. The storage module 14 is electrically connected to the power module 11 to receive the first internal voltage IV1.

The motherboard module 12 is electrically connected to the power module 11. The processor 13 is disposed on the motherboard module 12, and the processor 13 is electrically connected to the power module 11, the motherboard module 12, and the storage module 14.

In this embodiment, the power module 11, the motherboard module 12, the processor 13, and the storage module 14 constitute a computer system (not shown), which is disposed in a casing (not shown).

In this embodiment, the computer system (not shown) further includes an operating system that operates through the power module 11, the motherboard module 12, the processor 13, the storage module 14, and other components.

In this embodiment, the storage module 14 may be disposed on the motherboard module 12. For example, the storage module 14 is directly installed on the main board module 12 through a Peripheral Component Interconnect Express (PCIe). The storage module 14 and the main board module 12 can also be set independently. For example, the storage module 14 is electrically connected to the motherboard module 12 through a transmission line and a serial high-tech configuration interface (Serial Advanced Technology Attachment, SATA).

As shown in FIG. 2, the power quality detection system 1 ′ of FIG. 2 includes a power module 11 ′, a motherboard module 12 ′, a processor 13 ′, a storage module 14 ′, and a power quality detection module 15'. The difference between the power quality detection system 1 of FIG. 1 and the power quality detection system 1'of FIG. 2 is that the storage module 14 of FIG. 1 is not provided on the motherboard module 12, and the storage module 14' of FIG. 2 is provided on the motherboard Module 12'.

In this embodiment, the storage module 14 is a solid-state disk (SSD).

In this embodiment, the power quality detection module 15 determines whether to send a first warning signal according to a quality parameter of the first internal voltage IV1. In this embodiment, a large change in the external voltage AC or a poor design of the power module 11 will cause a large voltage change in the first internal voltage IV1 (for example, a change in voltage level). Therefore, in this embodiment, the voltage change of the first internal voltage IV1 can reach the level of several volts.

The quality parameter of the first internal voltage IV1 is based on a first number of times that the first internal voltage IV1 is greater than a first high voltage threshold HT1 within a predetermined time T, and the first internal voltage IV1 is less than a first within a predetermined time T A second number of times the low voltage threshold LT1, or a first number of times the first internal voltage IV1 is greater than a first high voltage threshold HT1 within a predetermined time T and a first internal voltage IV1 less than a first number within a predetermined time T A low-voltage threshold LT1 is determined by the second combination of times.

That is, when the first number of times that the first internal voltage IV1 is greater than the first high voltage threshold value HT1 within a predetermined time T is greater than a first predetermined number of times, it means that the quality parameter of the first internal voltage IV1 fails, so the power supply quality The detection module 15 sends a first warning signal.

When the second number of times that the first internal voltage IV1 is less than the first low voltage threshold LT1 within the predetermined time T is greater than the second predetermined number of times, it means that the quality parameter of the first internal voltage IV1 fails, and the power quality detection module 15 The first warning signal will also be sent.

Furthermore, the first number of times when the first internal voltage IV1 is greater than the first high voltage threshold HT1 within a predetermined time T is greater than a third predetermined number of times, and the first internal voltage IV1 is less than the first low voltage within the predetermined time T When the second number of times of the threshold value LT1 is greater than a fourth predetermined number of times, the power quality detection module 15 sends the first warning signal.

In this embodiment, the first high voltage threshold value HT1 and the first low voltage threshold value LT1 are determined according to the voltage value that will cause the storage module 14 to operate incorrectly, read and write errors, malfunctions, or hardware damage. There is no limitation in the present invention.

In this embodiment, the first predetermined number of times, the second predetermined number of times, the third predetermined number of times, and the fourth predetermined number of times may be designed and adjusted according to actual needs, and are not limited in the present invention. In addition, the length of the predetermined time T can also be adjusted and designed according to actual needs, which is not limited in the present invention.

In this embodiment, the warning signal provided by the power quality detection module 15 is provided to the processor 13 or an operating system (not shown) running on the processor 13 of the computer system (not shown). The processor 13 or the operating system (not shown) will record according to the warning signal or remind the user that the current power quality is poor.

In this embodiment, when the first internal voltage IV1 is greater than a second high voltage threshold HT2, the power quality detection module 15 sends a second warning signal. Similarly, when the first internal voltage IV1 is lower than a second low voltage threshold LT2, the power quality detection module 15 sends a second warning signal.

In this embodiment, the second warning signal is to remind the processor 13 or the operating system (not shown). In addition, the second high voltage threshold HT2 is greater than the first high voltage threshold HT1. The second low voltage threshold LT2 is smaller than the first low voltage threshold LT1.

In this embodiment, the second high voltage threshold HT2 and the second low voltage threshold LT2 are determined according to the voltage that the storage module 14 may damage. That is, as long as the first internal voltage IV1 exceeds the second high voltage threshold HT2 or is lower than the second low voltage threshold LT2, the storage module 14 will be damaged or inoperative.

Please refer to FIGS. 1 and 2. The storage module 14 in FIG. 1 is not disposed on the motherboard module 12. The storage module 14 in FIG. 2 is disposed on the motherboard module 12.

Please refer to FIGS. 3, 4 and 5. FIG. 3 is a schematic diagram of the first internal voltage detected by the power quality detection module of the embodiment of the present invention. 4 is another schematic diagram of the first internal voltage detected by the power quality detection module of the embodiment of the present invention. 5 is another schematic diagram of the first internal voltage detected by the power quality detection module of the embodiment of the present invention.

Please refer to FIG. 3, the voltage curves of the first internal voltage IV1 in FIG. 3 are all greater than the first low voltage threshold LT1, so the storage module 14 receiving the first internal voltage IV1 in FIG. 3 can operate. However, since the peak value of the first internal voltage IV1 will be greater than the first high voltage threshold HT1, the storage module 14 may be damaged.

In this embodiment, the power quality detection module 15 detects whether the number of times the first internal voltage IV1 is greater than the first high voltage threshold HT1 within the predetermined time T is greater than the first predetermined number of times. In this embodiment, the first predetermined number of times is set to 5 times. However, in FIG. 3, the number of times that the first internal voltage IV1 is greater than the first high voltage threshold HT1 is 4 times. Therefore, the power quality detection module 15 does not The first warning signal will be sent.

Please refer to FIG. 4. The voltage curve of the first internal voltage IV1 in FIG. 4 is less than the first high voltage threshold HT1. Therefore, the storage module 14 that receives the first internal voltage IV1 in FIG. High and damaged. However, since the minimum value of the first internal voltage IV1 will be less than the first low voltage threshold LT1, it may cause a malfunction of the storage module 14 or a read/write error.

In this embodiment, the power quality detection module 15 detects whether the number of times the first internal voltage IV1 is less than the first low voltage threshold LT1 within a predetermined time T is greater than the second predetermined number of times. In this embodiment, the second predetermined number of times is 2 times. In FIG. 4, the number of times that the first internal voltage IV1 is less than the first low voltage threshold HT1 within the predetermined time T is 4 times. Therefore, the power quality detection module 15 sends a first warning signal.

Please refer to FIG. 5. The voltage curve of the first internal voltage IV1 in FIG. 5 is between the second high voltage threshold HT2 and the second low voltage threshold LT2. However, the portion of the first internal voltage IV1 in FIG. 5 will be greater than the first high voltage threshold HT1, and the portion of the first internal voltage IV1 will be less than the first low voltage threshold LT1. Therefore, the storage module 14 receiving the first internal voltage IV1 in FIG. 5 may have a chance of being damaged due to an excessively high voltage, or may have a malfunction or read/write error due to an excessively low voltage.

In this embodiment, the power quality detection module 15 detects whether the number of times the first internal voltage IV1 is greater than the first high voltage threshold HT1 within a predetermined time T is greater than a third predetermined number of times, and the first internal voltage IV1 is within a predetermined Whether the number of times of LT1 less than the first low voltage threshold in time T is greater than the fourth predetermined number of times. In this embodiment, the third predetermined number of times and the fourth predetermined number of times are respectively one.

In FIG. 5, the number of times that the first internal voltage IV1 is greater than the first high voltage threshold value HT1 and less than the first low voltage threshold value LT1 within the predetermined time T is 2 times and 1 time, respectively. Therefore, the power quality detection module 15 The first warning signal will be sent.

Please refer to FIG. 6, which is a schematic diagram of a power quality detection module according to an embodiment of the present invention.

In this embodiment, the power quality detection module 15 includes an analog-to-digital conversion unit 151, a judgment and counting unit 152, and a warning unit 153.

The analog-to-digital conversion unit 151 is used to convert the first internal voltage IV1 from an analog form to a digital form. The judging and counting unit 152 is electrically connected to the analog digital counting unit 151 and used to judge the voltage level of the first internal voltage IV1 and the number of calculations to determine the quality parameter of the first internal voltage IV1 and generate a judgment result according to the quality parameter.

That is, the judgment counting unit 152 performs a voltage judgment on the digital first internal voltage IV1 whether it is greater than the first high voltage threshold HT1 or lower than the first low voltage threshold LT1 to determine the first internal voltage IV1 Quality parameters.

In this embodiment, the warning unit 153 is electrically connected to the judgment counting unit 152, and determines whether to send a first warning signal or a second warning according to the judgment result of the quality parameter of the first internal voltage IV1 by the judgment technical unit 152 Signal.

In one embodiment, the storage module 14 is implemented by a plurality of NAND memory elements. In one embodiment, the storage module 14 is implemented by a quad-level cell (QLC) NAND memory device. In this embodiment, the storage blocks in the storage module 14 can use one-bit-per-cell (1bpc) programming mode, two-bit-per-cell per-cell, 2bpc) programming mode, three-bit-per-cell (3bpc) programming mode, or four-bit-per-cell (4bpc) programming mode to program data . Therefore, when the power quality detection module 15 determines that the quality of the voltage IV1 is not good (for example, sending the first warning signal or the second warning signal), the programming mode of the storage module 14 may be adjusted so that it is not easy to perform an erroneous write operation. For example, the control circuit in the SSD selects one of multiple programming modes according to the quality control signal or the warning signal to program the programmed data into the first storage block of the storage module 14. Through the above method, the reliability of the data in the storage module 14 can be improved.

In addition, the power quality detection module 15 can detect changes in voltage waveform (for example, changes in frequency) in addition to changes in voltage level. In one embodiment, the power quality detection module 15 can record the waveform patterns of the internal voltage IV1. For example, the controller in the storage device 14 may determine that the waveform types in FIGS. 3 and 4 are the same (because, basically, the frequency is fixed, only the voltage level is different); and determine that the waveform in FIG. 2 is FIG. 3 (Or Figure 4) and Figure 5 waveforms are different (because the frequency of the waveform in Figure 3 is fixed, and the frequency of the waveform in Figure 5 is dynamic), so Figure 5 and Figure 3 are different types of waveforms (waveforms patterns). Because the frequency (50, 60 Hz) of the external power supply AC is fixed, when the controller in the storage device 14 finds that the waveform of the internal voltage IV1 appears in a different waveform type (for example, the frequency of the waveform is dynamic), the storage device 14 The middle controller may determine that the components in the power module 11 may be defective, and generate another warning signal.

[Possible effects of the embodiment]

In summary, the present invention uses the power quality detection system to detect the first internal voltage transmitted to the storage module to determine the voltage quality of the first internal voltage, effectively determine the working environment of the storage module, and when the voltage is unstable , Can effectively find the problem, and quickly provide solutions.

The above are only examples of the present invention, and they are not intended to limit the patent scope of the present invention.

1. 1’: Power quality inspection system 11, 11’: Power module 12; 12’: motherboard module 13, 13’: processor 14, 14’: Storage module 15, 15’: Power quality detection module IV1: First internal voltage AC: external voltage HT1: the first high voltage threshold HT2: second highest voltage threshold LT1: the first low voltage threshold LT2: second low voltage threshold 151: Analog digital conversion unit 152: Judgment and counting unit 153: Warning unit T: scheduled time

FIG. 1 is a schematic diagram of a power quality detection system according to an embodiment of the invention. 2 is another schematic diagram of a power quality detection system according to an embodiment of the invention. 3 is a schematic diagram of the first internal voltage detected by the power quality detection module of the embodiment of the present invention. 4 is another schematic diagram of the first internal voltage detected by the power quality detection module of the embodiment of the present invention. 5 is another schematic diagram of the first internal voltage detected by the power quality detection module of the embodiment of the present invention. 6 is a schematic diagram of a power quality detection module according to an embodiment of the invention.

1: Power quality inspection system

11: Power module

12: Motherboard module

13: processor

14: Storage module

15: Power quality detection module

IV1: First internal voltage

AC: external voltage

Claims (11)

A power quality detection system, including: A power module that receives an external power source, and the power module converts the external power source into a first internal voltage; A storage module; and A power quality detection module, electrically connected to the power module and the storage module, and the storage module is electrically connected to the power module through the power quality detection module to receive the first Internal voltage Wherein, the power quality detection module determines a quality parameter according to the waveform of the first internal voltage to determine whether to send a warning signal. A power supply quality detection system according to item 1 of the patent application scope, wherein the quality parameter of the first internal voltage is based on a first parameter of the first internal voltage greater than a first high voltage threshold value within a predetermined time A number of times, a second number of times that the first internal voltage is less than a first low voltage threshold within the predetermined time, or a combination of the first number of times and the second number of times. A power supply quality detection system according to item 2 of the patent application scope, wherein, when the first internal voltage is greater than the first high voltage threshold within the predetermined time, the first number of times is greater than a first predetermined number of times Or/and when the second number of times that the first internal voltage is less than the first low voltage threshold within the predetermined time is greater than a second predetermined number of times, the power quality detection module sends a first Warning signal. A power supply quality detection system as claimed in item 1 of the patent scope, wherein, when the first internal voltage is greater than a second high voltage threshold or/and when the first internal voltage is less than a second low voltage threshold, The power quality detection module sends a second warning signal. A power quality detection system as claimed in item 1 of the patent scope, wherein the power quality detection module determines the waveform type of the first internal voltage from a plurality of waveform types to generate a detection result to indicate the power supply The status of the module. A power supply quality detection system as claimed in item 1 of the patent scope, wherein the detection result indicates whether the frequency of the first internal voltage has changed. A power supply quality detection system as claimed in item 1 of the patent scope, wherein the power supply quality detection module detects the waveform of the first internal voltage to generate the detection result, and the storage module is based on the detection result from a plurality of A programming mode decided in the programming mode for programming. For example, in the power supply quality inspection system of claim 7, the plurality of programming modes includes a one-bit programming mode per cell and a multi-bit programming mode per cell. For example, the power supply quality detection system according to item 1 of the patent scope, wherein the power quality detection module includes: An analog-to-digital converter (ADC) is used to convert the analog form of the first internal voltage to a digital form; A determination and counting unit is coupled to the analog-to-digital converter to determine a voltage level of the first internal voltage and the quality parameter, and generate the detection result according to the quality parameter. For example, the power supply quality detection system of the first item in the scope of patent application includes: A motherboard module, electrically connected to the power module; and A processor, disposed on the motherboard module, electrically connected to the motherboard module, the power module, and the stored module; Wherein, the first warning signal is provided to the processor. A power quality detection method, which uses a storage module, the method includes: Receive an external power supply; Converting the external power supply into a first internal voltage by a power supply module; Determining the waveform type of the first internal voltage from a plurality of waveform types to generate a detection result; and The storage module accesses the data of the storage module from a programming mode determined from a plurality of programming modes according to the detection result.

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