TW202012103A - Flexible module for polishing, loading and unloading component - Google Patents
Flexible module for polishing, loading and unloading component Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
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Abstract
Description
本發明屬磨削或拋光裝置技術領域,具體涉及一種半導體積體電路晶片製造過程中使用的化學機械平坦化設備的一種可撓性的拋光裝卸部件模組。The invention belongs to the technical field of grinding or polishing devices, and in particular relates to a flexible polishing assembly module of a chemical mechanical planarization device used in the manufacturing process of semiconductor integrated circuit wafers.
目前,積體電路工業作為現代訊息社會的基石,在各行各業中都發揮著越來越非常重要的作用。隨著半導體技術的飛速發展,積體電路特徵尺寸不斷趨於微細化。半導體製程是一項複雜的製作流程,先進的 IC 所需要的製作程序達一千個以上的步驟,因此半導體薄膜表面的高平坦化對元件的高性能、低成本、高成品率有著重要的影響。At present, the integrated circuit industry, as the cornerstone of the modern information society, is playing an increasingly important role in all walks of life. With the rapid development of semiconductor technology, the feature size of integrated circuits has continued to become finer. The semiconductor manufacturing process is a complex manufacturing process. Advanced ICs require more than one thousand steps. Therefore, the high flatness of the semiconductor film surface has an important impact on the high performance, low cost, and high yield of the device. .
化學機械平坦化 (CMP) 設備是積體電路製造領域的七大關鍵設備之一。其原理是利用拋光液化學蝕刻和拋光墊機械摩擦的綜合平衡作用,對晶圓表面材料進行精細去除。在積體電路製造中,CMP首先被用於晶片製造前道製程的平坦化、元件隔離、元件構造,其次在晶片製造後道製程的金屬互連也需使用。同時,CMP在積體電路3D封裝TSV製程中也是關鍵的製程手段。正是因為具有相對多樣且關鍵的應用,CMP已經成為積體電路製造中的標準製程和核心裝備。Chemical mechanical planarization (CMP) equipment is one of the seven key equipment in the field of integrated circuit manufacturing. The principle is to use the comprehensive balance of chemical etching of the polishing liquid and mechanical friction of the polishing pad to finely remove the material on the wafer surface. In integrated circuit manufacturing, CMP is first used for planarization, device isolation, and device structure in the wafer manufacturing pre-process, and secondly, metal interconnection in the post-wafer manufacturing process is also used. At the same time, CMP is also a key process means in the integrated circuit 3D packaging TSV process. Because of its relatively diverse and critical applications, CMP has become the standard process and core equipment in integrated circuit manufacturing.
目前,化學機械拋光技術已經發展成集在線量測、在線終點檢測、清洗等技術於一體的化學機械拋光技術是積體電路向微細化、多層化、薄型化、平坦化製程發展的產物。同時也是晶圓由200mm向300mm乃至更大直徑過渡、提高生產率、降低製造成本、基板全域平坦化所必需的製程技術。At present, the chemical mechanical polishing technology has developed into a combination of online measurement, online end point detection, cleaning and other technologies. The chemical mechanical polishing technology is the product of the development of integrated circuits to the process of miniaturization, multilayering, thinning and flattening. At the same time, it is also a necessary process technology for the transition of wafers from 200mm to 300mm or even larger diameters, improving productivity, reducing manufacturing costs, and flattening the entire substrate.
一個典型的化學機械平坦化設備通常包括多個拋光單元以及清洗、晶圓運輸、乾燥等輔助裝置。拋光單元通常包括工作台、拋光盤、拋光頭、拋光臂、修整器、拋光液臂等,拋光盤、拋光頭、拋光臂、修整器、拋光液臂按照製程加工位置佈置在工作台上。實際的晶圓加工過程中發現,拋光單元與清洗、晶圓運輸等模組的空間佈置對於化學機械平坦化設備整體的拋光產出有極大的影響。晶圓在拋光單元與外部以及在拋光單元之間的傳輸通常依靠裝卸台或起類似作用的裝置來實現。關於裝卸台與拋光單元的空間佈局,有的採用裝卸台與三個拋光單元為正方形佈局的形式。由於一個裝卸台需要給三個拋光單元提供裝卸服務,因此這種技術佈局的缺點是製程過程複雜。另有採用將四個拋光單元並排排列,晶圓傳輸由位於平坦化設備端部的裝卸區和沿拋光單元排列方向設置的兩個線性運輸機構完成,線性運輸機構的另一側為清洗區。上述每一個線性運輸機構為兩個拋光單元提供服務,並為每個拋光單元設置兩個傳輸工位,拋光單元的拋光頭可以從其中一個傳輸工位裝卸晶圓。但這種佈局的缺點是每個拋光單元雖然設置兩個傳輸工位,但拋光過程中拋光單元只從其中一個直接裝卸晶圓,因此從晶圓傳輸效率的角度分析還有需要改進的餘地。A typical chemical mechanical planarization device usually includes multiple polishing units and auxiliary devices such as cleaning, wafer transportation, and drying. The polishing unit usually includes a worktable, a polishing disk, a polishing head, a polishing arm, a dresser, a polishing liquid arm, etc. The polishing disk, polishing head, polishing arm, dresser, and polishing liquid arm are arranged on the worktable according to the processing position of the process. In the actual wafer processing process, it was found that the spatial arrangement of the polishing unit and cleaning, wafer transportation and other modules has a great impact on the overall polishing output of the chemical mechanical planarization equipment. The transfer of wafers between the polishing unit and the outside and between the polishing units usually depends on the loading and unloading table or similar devices. Regarding the spatial layout of the loading and unloading table and polishing unit, some adopt the form of a square layout of the loading and unloading table and three polishing units. Since one loading and unloading station needs to provide loading and unloading services to three polishing units, the disadvantage of this technical layout is the complicated process. In addition, the four polishing units are arranged side by side. The wafer transfer is completed by the loading and unloading area at the end of the flattening device and the two linear transport mechanisms arranged along the direction of the polishing unit arrangement. The other side of the linear transport mechanism is the cleaning area. Each of the above linear transport mechanisms provides services for two polishing units, and two transfer stations are provided for each polishing unit, and the polishing head of the polishing unit can load and unload wafers from one of the transfer stations. However, the disadvantage of this layout is that although each polishing unit is provided with two transfer stations, the polishing unit only directly loads and unloads wafers from one of the polishing processes, so there is room for improvement from the perspective of wafer transfer efficiency.
本發明目的在於針對現有化學機械平坦化設備中存在的晶圓傳輸效率低、傳輸機構結構複雜的問題提出一種化學機械平坦化設備用的可撓性的拋光裝卸部件模組,可以簡化了設備結構,提高設備的製造效率,縮小設備的占地空間。The purpose of the present invention is to provide a flexible polishing assembly module for chemical mechanical planarization equipment in view of the problems of low wafer transfer efficiency and complicated transmission mechanism structure in the existing chemical mechanical planarization equipment, which can simplify the equipment structure To improve the manufacturing efficiency of equipment and reduce the space occupied by equipment.
為實現上述目的,本發明採用的技術方案為一種可撓性的拋光裝卸部件模組,包含一個裝卸模組和兩個拋光模組,裝卸模組居中,兩個拋光模組位於其兩側,所述裝卸模組在與裝卸模組和兩個拋光模組排列方向相垂直的方向上有兩個裝卸台模組,兩個裝卸台模組的兩個裝卸位置分別對應所述兩個拋光模組。In order to achieve the above object, the technical solution adopted by the present invention is a flexible polishing loading and unloading component module, including a loading and unloading module and two polishing modules, the loading and unloading module is centered, and the two polishing modules are located on both sides thereof. The loading and unloading module has two loading and unloading table modules in a direction perpendicular to the arrangement direction of the loading and unloading module and the two polishing modules, and the two loading and unloading positions of the two loading and unloading table modules respectively correspond to the two polishing molds group.
拋光模組包含固定平台,拋光墊,拋光頭,拋光轉軸,拋光轉軸可帶動拋光頭旋轉至裝卸模組對應的裝卸位置。The polishing module includes a fixed platform, a polishing pad, a polishing head, a polishing rotating shaft, and the polishing rotating shaft can drive the polishing head to rotate to a loading and unloading position corresponding to the loading and unloading module.
裝卸模組包含固定架、水槽、第一裝卸台模組、第二裝卸台模組、第一裝卸台固定塊、第二裝卸台固定塊、第一隔離罩、第二隔離罩,所述第一裝卸台模組對應第一裝卸位置,第二裝卸台模組對應第二裝卸位置,水槽和第一裝卸台固定塊、第二裝卸台固定塊固定安裝在固定架上,兩個隔離罩分別固定在各自的裝卸台固定台上,使裝卸台模組下部與液體隔離,第一裝卸台模組和第二裝卸台模組分別固定在第一裝卸台固定塊和第二裝卸台固定塊上,對應第一裝卸位置和第二裝卸位置。The loading and unloading module includes a fixing frame, a water tank, a first loading and unloading platform module, a second loading and unloading platform module, a first loading and unloading platform fixing block, a second loading and unloading platform fixing block, a first isolation cover, a second isolation cover, the first A loading and unloading platform module corresponds to the first loading and unloading position, a second loading and unloading platform module corresponds to the second loading and unloading position, the sink and the first loading and unloading table fixing block, and the second loading and unloading table fixing block are fixedly installed on the fixing frame, and the two isolation covers are respectively It is fixed on the fixed platform of the respective loading and unloading platform to isolate the lower part of the loading and unloading platform module from the liquid. The first loading and unloading platform module and the second loading and unloading platform module are respectively fixed on the first loading and unloading platform fixing block and the second loading and unloading platform fixing block , Corresponding to the first loading and unloading position and the second loading and unloading position.
裝卸模組的兩個裝卸位置上分別設置有第一噴嘴模組和第二噴嘴模組,二者都固定在固定架上。The two nozzle positions of the loading and unloading module are respectively provided with a first nozzle module and a second nozzle module, both of which are fixed on a fixing frame.
較佳地,上述第一噴嘴模組和第二噴嘴模組分別設置在第一裝卸位置和第二裝卸位置的邊緣。Preferably, the first nozzle module and the second nozzle module are respectively disposed at the edges of the first loading and unloading position and the second loading and unloading position.
裝卸台模組可在垂直方向上上升和下降,與拋光頭完成晶圓移轉。The loading and unloading table module can be raised and lowered in the vertical direction to complete the wafer transfer with the polishing head.
本發明還進一步提出一種利用上述拋光裝卸部件模組進行晶圓傳輸的方法,包含以下步驟:The present invention further provides a method for wafer transfer using the above-mentioned polishing assembly module, which includes the following steps:
S1:第一裝卸台模組在第一裝卸位置等待第一拋光頭將完成第一階段拋光的晶圓由第一拋光頭轉軸旋轉至第一裝卸位置;S1: The first loading and unloading platform module waits for the first polishing head to rotate the wafer that has been polished in the first stage from the rotating shaft of the first polishing head to the first loading and unloading position at the first loading and unloading position;
S2:拋光好的晶圓由第一拋光頭轉軸旋轉至第一裝卸位置時,第一裝卸台模組上升,裝載好已經完成第一階段拋光的晶圓;S2: When the polished wafer rotates from the first polishing head rotating shaft to the first loading and unloading position, the first loading and unloading table module rises, and the wafers that have completed the first stage of polishing are loaded;
S3:然後第一拋光頭轉回到第一拋光墊上方,機械手開始取走第一裝卸台模組上的已經完成第一階段拋光的晶圓放到第二裝卸位置上的第二裝卸台模組,第一拋光頭轉回到第一裝卸位置開始清洗第一拋光頭;S3: Then the first polishing head is turned back above the first polishing pad, and the manipulator starts to remove the wafers on the first loading and unloading station module that have been polished in the first stage and put them on the second loading and unloading station in the second loading and unloading position Module, the first polishing head turns back to the first loading and unloading position to start cleaning the first polishing head;
S4:清洗完畢後,第一拋光頭轉回第一拋光墊上。第二拋光頭轉回到第二裝卸位置,第二裝卸台模組上升,第二拋光頭取走完成第一階段拋光的晶圓,第二拋光頭轉回第二拋光墊上進行拋光,與此同時,機械手將未拋光的晶圓放置在第一裝卸位置的第一裝卸台模組上;S4: After cleaning, the first polishing head is turned back to the first polishing pad. The second polishing head returns to the second loading and unloading position, the second loading and unloading table module rises, the second polishing head removes the wafer that has been polished in the first stage, and the second polishing head returns to the second polishing pad for polishing, at the same time , The manipulator places the unpolished wafer on the first loading and unloading station module in the first loading and unloading position;
S5:第一拋光頭旋轉至第一裝卸位置取走待拋光的晶圓然後開始拋光,當第二拋光頭拋光完成後,第二拋光頭旋轉至第二裝卸位置將完成第二階段拋光的晶圓放置在第二裝卸台模組上,第二拋光頭旋轉回第二拋光墊,機械手取走拋光好的晶圓;S5: The first polishing head rotates to the first loading and unloading position to remove the wafer to be polished and then starts to polish. After the second polishing head is polished, the second polishing head rotates to the second loading and unloading position to complete the second stage of polishing The circle is placed on the module of the second loading and unloading table, the second polishing head rotates back to the second polishing pad, and the robot removes the polished wafer;
S6:第二拋光頭旋轉回第二裝卸位置開始清洗第二拋光頭,清洗完畢的第二拋光頭轉回第二拋光墊上,第一裝卸台模組在第一裝卸位置等待第一拋光頭將完成第一階段拋光的晶圓由第一拋光頭轉軸旋轉至第一裝卸位置;S6: The second polishing head rotates back to the second loading and unloading position to start cleaning the second polishing head, the cleaned second polishing head is turned back to the second polishing pad, and the first loading and unloading station module waits for the first polishing head to be in the first loading and unloading position The wafer completed the first stage of polishing is rotated to the first loading and unloading position by the first polishing head rotating shaft;
S7:重複步驟2至6,直至全部晶圓拋光完畢。S7: Repeat
與現有化學機械平坦化設備技術相比,本發明具有以下有益技術效果:Compared with the existing chemical mechanical planarization equipment technology, the present invention has the following beneficial technical effects:
1、本發明藉由將裝卸部分和拋光部分進行模組化,拼接成一個拋光裝卸整體模組,這種佈局簡化了設備結構,提高了設備的製造效率,並且縮小設備的占地空間。1. The present invention assembles the loading and unloading part and the polishing part into a polishing and loading and unloading integral module. This layout simplifies the structure of the equipment, improves the manufacturing efficiency of the equipment, and reduces the space occupied by the equipment.
2、藉由兩個拋光頭對應兩個裝卸台模組進行晶圓的傳遞節省了晶圓傳輸時間,同時顯著提高了機械平坦化的整體效率。2. The wafer transfer time by two polishing heads corresponding to two loading and unloading station modules saves wafer transfer time and significantly improves the overall efficiency of mechanical planarization.
3、拋光裝卸整體模組可以根據需要進行自由擴展,可以由三個以及更多的該模組進行拼接,進一步提高晶圓製造的可撓性,提高了製造效率,縮小了設備的空間,並增加了整個設備的產量。3. The overall module for polishing, loading and unloading can be freely expanded as needed, and three or more of the modules can be spliced to further improve the flexibility of wafer manufacturing, improve the manufacturing efficiency, and reduce the space of the equipment. Increased the output of the entire equipment.
下面結合圖式對本發明作進一步詳細的說明。The present invention will be further described in detail below with reference to the drawings.
本發明拋光裝卸整體模組的結構主要由1個裝卸模組和2個拋光模組組成。本發明拋光裝卸整體模組的佈局如第1圖所示,拋光裝卸整體模組包含由第一裝卸位置1,第一拋光頭轉軸2,第一拋光頭3,第一拋光墊4,第一固定平台5,第二裝卸位置6,第二拋光頭轉軸7,第二拋光頭8,第二拋光墊9,第二固定平台10組成。拋光墊,拋光轉軸及其他部件組成固定在固定平台上,拋光頭固定在拋光轉軸上。拋光轉軸帶動拋光頭旋轉至裝卸位置,完成動作後,旋轉至拋光墊上方進行拋光。第一裝卸位置1對應第一拋光頭3,第二裝卸位置6對應第二拋光頭8。The structure of the polishing assembly module of the present invention is mainly composed of one assembly module and two polishing modules. The layout of the overall polishing assembly module of the present invention is shown in FIG. 1. The overall polishing assembly module includes a first loading and
第一裝卸位置1,第二裝卸位置6,水槽11,第一隔離罩12,第一噴嘴模組13,第二裝卸台固定塊14,第二裝卸台模組15,第二噴嘴模組16,第二隔離罩17,第一裝卸台模組18,第一裝卸台固定塊19,固定架20組成。其中第一裝卸台模組18對應第一裝卸位置1,第二裝卸台模組15對應第二裝卸位6。水槽11和第一裝卸台固定塊19,第二裝卸台固定塊14固定在固定架20上。隔離罩固定在裝卸固定台上使裝卸台下部與液體隔離。裝卸台模組固定在裝卸台固定塊上,在裝卸位置邊緣對應有噴嘴模組。噴嘴模組都固定在固定架20上。First loading and
現對利用本發明進行晶圓傳輸的過程給予詳細說明:The process of wafer transfer using the present invention is now described in detail:
開始時,第一裝卸台模組18在第一裝卸位置1等待第一拋光頭3將完成第一階段拋光的晶圓由第一拋光頭轉軸2旋轉至第一裝卸位置1。At the beginning, the first loading and unloading
隨後,拋光好的晶圓由第一拋光頭轉軸2旋轉至第一裝卸位置1時,第一裝卸台模組18上升,裝載好已經拋光的晶圓。Subsequently, when the polished wafer rotates from the first polishing
然後第一拋光頭3轉回到第一拋光墊4上方,機械手開始取走第一裝卸台模組18上的已經完成第一階段拋光的晶圓,放到第二裝卸位置6上的第二裝卸台模組15,第一拋光頭3轉回到第一裝卸位置1開始清洗第一拋光頭3。Then, the first polishing head 3 is turned back above the
清洗完畢後,第一拋光頭3轉回第一拋光墊4上。第二拋光頭8轉回到第二裝卸位置6,第二裝卸台模組15上升,第二拋光頭8取走完成第一階段拋光的晶圓,與此同時,機械手將未拋光的晶圓放置在第一裝卸位置1的第一裝卸台模組18上,藉由兩個拋光頭對應兩個裝卸台模組進行晶圓的傳遞節省了晶圓傳輸時間,提高了效率。After cleaning, the first polishing head 3 is turned back onto the
隨後,第二拋光頭8轉回到第二拋光墊9上方開始拋光,第一拋光頭3旋轉至第一裝卸位置1取走未拋光的晶圓然後開始拋光。當第二拋光頭8拋光完成後,旋轉至第二裝卸位置6,將完成第二階段拋光的晶圓放置在第二裝卸台模組15上,第二拋光頭8旋轉回第二拋光墊9。機械手取走拋光好的晶圓,第二拋光頭8旋轉回第二裝卸位置6開始清洗第二拋光頭8,清洗完畢的第二拋光頭8轉回第二拋光墊9上。第一裝卸台模組18在第一裝卸位置1等待第一拋光頭3上的晶圓開始循環。Subsequently, the
本發明的晶圓裝載部件模組的優點:藉由將裝卸部分和拋光部分進行模組化,可以拼接成第1圖所示佈局。此佈局簡化了設備結構,提高設備的製造效率,縮小設備的占地空間。並且可以根據需要進行自由擴展,可以由3個以及更多的第1圖所示佈局的模組進行拼接,進一步提高晶圓製造的可撓性,提高設備的製造效率,縮小設備的空間,增加產量。The advantages of the wafer loading component module of the present invention: by modularizing the loading and unloading part and the polishing part, the layout shown in FIG. 1 can be spliced. This layout simplifies the device structure, improves the manufacturing efficiency of the device, and reduces the footprint of the device. And it can be freely expanded as needed, and can be spliced by three or more modules as shown in Figure 1, which further improves the flexibility of wafer manufacturing, improves the manufacturing efficiency of the equipment, reduces the space of the equipment, and increases Yield.
以上具體實施方式的描述並不用以限制本發明,凡在本發明的精神和原則之內所作的任何修改、等同替換、改進等,均應包含在本發明的保護範圍之內。The description of the above specific embodiments is not intended to limit the present invention, and any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
1:第一裝卸位置2:第一拋光頭轉軸3:第一拋光頭4:第一拋光墊5:第一固定平台6:第二裝卸位置7:第二拋光頭轉軸8:第二拋光頭9:第二拋光墊10:第二固定平台11:水槽12:第一隔離罩13:第一噴嘴模組14:第二裝卸台固定塊15:第二裝卸台模組16:第二噴嘴模組17:第二隔離罩18:第一裝卸台模組19:第一裝卸台固定塊20:固定架1: First loading and unloading position 2: First polishing head rotating shaft 3: First polishing head 4: First polishing pad 5: First fixed platform 6: Second loading and unloading position 7: Second polishing head rotating shaft 8: Second polishing head 9: Second polishing pad 10: Second fixed platform 11: Water tank 12: First isolation cover 13: First nozzle module 14: Second loading and unloading table fixing block 15: Second loading and unloading table module 16: Second nozzle mold Group 17: Second isolation cover 18: First loading and unloading table module 19: First loading and unloading table fixing block 20: Fixing frame
第1圖為本發明拋光裝卸整體模組的立體效果圖;Figure 1 is a perspective view of the overall module of the present invention for polishing, loading and unloading;
第2圖為第1圖所示模組中的裝卸模組的結構示意圖;Figure 2 is a schematic structural view of the loading and unloading module in the module shown in Figure 1;
1:第一裝卸位置 1: The first loading and unloading position
6:第二裝卸位置 6: Second loading and unloading position
11:水槽 11: sink
12:第一隔離罩 12: The first isolation cover
13:第一噴嘴模組 13: The first nozzle module
14:第二裝卸台固定塊 14: fixed block of the second loading and unloading platform
15:第二裝卸台模組 15: Second loading and unloading platform module
16:第二噴嘴模組 16: Second nozzle module
17:第二隔離罩 17: Second isolator
18:第一裝卸台模組 18: The first loading and unloading platform module
19:第一裝卸台固定塊 19: Fixing block of the first loading and unloading platform
20:固定架 20: fixed frame
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CN201811158614.7 | 2018-09-30 |
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CN110103119A (en) * | 2018-09-20 | 2019-08-09 | 杭州众硅电子科技有限公司 | A kind of polishing handling parts module |
CN113732936B (en) * | 2021-05-08 | 2022-07-15 | 清华大学 | Polishing temperature control device, chemical mechanical polishing system and method |
CN113910099A (en) * | 2021-09-07 | 2022-01-11 | 杭州众硅电子科技有限公司 | Wafer polishing system |
CN216781428U (en) * | 2021-09-07 | 2022-06-21 | 杭州众硅电子科技有限公司 | Wafer polishing system |
CN114425742B (en) * | 2021-12-29 | 2023-03-24 | 华海清科股份有限公司 | Distributed cleaning device |
CN115338705A (en) * | 2022-06-30 | 2022-11-15 | 杭州众硅电子科技有限公司 | Continuous wafer polishing system |
CN115338718B (en) * | 2022-10-18 | 2023-03-24 | 杭州众硅电子科技有限公司 | Wafer polishing system |
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US20160074988A1 (en) * | 2014-09-11 | 2016-03-17 | Ebara Corporation | Processing module, processing apparatus, and processing method |
US10293454B2 (en) * | 2015-06-11 | 2019-05-21 | Toshiba Memory Corporation | Polishing head, polishing apparatus and polishing method |
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