TW202005209A - Connecting device and method of manufacturing same - Google Patents

Connecting device and method of manufacturing same Download PDF

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Publication number
TW202005209A
TW202005209A TW108117869A TW108117869A TW202005209A TW 202005209 A TW202005209 A TW 202005209A TW 108117869 A TW108117869 A TW 108117869A TW 108117869 A TW108117869 A TW 108117869A TW 202005209 A TW202005209 A TW 202005209A
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Taiwan
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block
optical
circuit board
connector
connection device
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TW108117869A
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Chinese (zh)
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TWI693760B (en
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竹谷敏永
中原基
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日商日本麥克隆尼股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/07Non contact-making probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Mechanical Coupling Of Light Guides (AREA)
  • Optical Couplings Of Light Guides (AREA)

Abstract

This invention provides a connecting device capable of connecting an electrical connector for transmitting electrical signals and an optical connector for transmitting optical signals to an optical component and a manufacturing method thereof. The connecting device of the present invention is used for inspection of a semiconductor element having an electrical signal terminal for transmitting electrical signals and an optical signal terminal for transmitting optical signals. The connecting device comprises an optical connector 100 that is optically connected to an optical signal terminal, and an electrical connector 200 that is electrically connected to the electrical signal terminal.

Description

連接裝置及其製造方法 Connecting device and its manufacturing method

本發明係關於一種使用於被檢查體之特性之檢查的連接裝置。 The present invention relates to a connecting device for inspection of characteristics of an object to be inspected.

使用矽光子(Silicon Photonics)技術,將具有傳遞電性號之電氣電路與傳遞光信號之光電路的半導體元件(以下稱「光元件(device)」)形成於矽基板等。為了在晶圓狀態下檢查光元件的特性,光纖等被用來作為連接光元件與檢查裝置的光連接器(optical connector)來使用。 Using silicon photonics (Silicon Photonics) technology, a semiconductor device (hereinafter referred to as a "device") having an electrical circuit that transmits electrical signals and an optical circuit that transmits optical signals is formed on a silicon substrate, etc. In order to check the characteristics of the optical element in the wafer state, optical fibers and the like are used as optical connectors that connect the optical element and the inspection device.

例如,已揭示一種使保持於探針本體之光纖的前端接近以取得檢查對象之光元件之特性的方法(參照專利文獻1)。 For example, a method has been disclosed in which the tip of the optical fiber held in the probe body is approached to obtain the characteristics of the optical element to be inspected (refer to Patent Document 1).

[先前技術文獻] [Prior Technical Literature] [專利文獻] [Patent Literature]

專利文獻1:美國專利申請公開第2006/0008226A1號說明書 Patent Document 1: US Patent Application Publication No. 2006/0008226A1

在光元件的檢查中,係以使用將傳遞電信號的電連接器連接於光元件並且將傳遞光信號的光連接器連接於光元件的連接裝置,來連接光元件與檢查裝置之方式為有效。然而,此種連接裝置的開發並未獲得進展。 In the inspection of optical elements, it is effective to connect the optical element and the inspection device by using a connecting device that connects an electrical connector that transmits electrical signals to the optical element and an optical connector that transmits optical signals to the optical element . However, no progress has been made in the development of such connection devices.

本發明之目的為提供一種可將傳遞電信號的電連接器與傳遞光信號的光連接器雙方連接於光元件的連接裝置及其製造方法。 An object of the present invention is to provide a connection device and a manufacturing method thereof that can connect both an electrical connector transmitting electrical signals and an optical connector transmitting optical signals to optical elements.

依據本發明的一態樣,係提供一種連接裝置,該連接裝置係使用於具有傳遞電信號之電信號端子與傳遞光信號之光信號端子之半導體元件的檢查,該連接裝置係具備:光連接器,係與光信號端子光學性連接;及電連接器,係與電信號端子電性連接。 According to one aspect of the present invention, there is provided a connection device for inspection of a semiconductor device having an electrical signal terminal transmitting an electrical signal and an optical signal terminal transmitting an optical signal. The connection device includes: optical connection The connector is optically connected to the optical signal terminal; and the electrical connector is electrically connected to the electrical signal terminal.

依據本發明之另一態樣,係提供一種連接裝置的製造方法,該連接裝置係使用於具有傳遞電信號之電信號端子與傳遞光信號之光信號端子之半導體元件的檢查上,該連接裝置的製造方法係包含下列步驟:在使與光信號端子光學性連接之光連接器的光學性連接端部露出於塊體(block)之主面的狀態下,將光連接器固定於塊體的步驟;以塊體的主面成為露出之狀態之方式將塊體安裝於電路基板的步驟;及參照光學性連接端部的位置資訊,以電連接器的電性連接端部配置於預定的位置之方式,將電連接器設置於電路基板的步驟。 According to another aspect of the present invention, there is provided a method of manufacturing a connection device for inspection of a semiconductor device having an electrical signal terminal for transmitting electrical signals and an optical signal terminal for transmitting optical signals. The manufacturing method includes the following steps: fixing the optical connector to the block in a state where the optical connection end of the optical connector optically connected to the optical signal terminal is exposed on the main surface of the block Steps of mounting the block on the circuit board in such a way that the main surface of the block is exposed; and referring to the position information of the optical connection end, the electrical connection end of the electrical connector is arranged at a predetermined position The step of providing the electrical connector on the circuit board.

依據本發明,可提供一種可將傳遞電信號的電連接器與傳遞光信號的光連接器雙方連接於光元件的連接裝置及其製造方法。 According to the present invention, it is possible to provide a connection device capable of connecting both an electrical connector transmitting an electrical signal and an optical connector transmitting an optical signal to an optical element, and a manufacturing method thereof.

10‧‧‧塊體 10‧‧‧ block

11‧‧‧空洞 11‧‧‧Empty

12‧‧‧嵌入孔 12‧‧‧Embedded hole

15‧‧‧毛細管 15‧‧‧Capillary

16‧‧‧固定用柱材 16‧‧‧Fixed column

20‧‧‧電路基板 20‧‧‧ circuit board

21‧‧‧接合墊 21‧‧‧joint pad

22‧‧‧對準標記 22‧‧‧Alignment mark

23‧‧‧連接端子 23‧‧‧Connecting terminal

30‧‧‧補強件 30‧‧‧Reinforcement

40‧‧‧位置調整機構 40‧‧‧Position adjustment mechanism

41‧‧‧拉簧 41‧‧‧tension spring

42‧‧‧按壓彈簧 42‧‧‧Press spring

51‧‧‧第一螺栓 51‧‧‧First bolt

52‧‧‧第二螺栓 52‧‧‧Second bolt

60‧‧‧導板 60‧‧‧Guide plate

70‧‧‧導銷 70‧‧‧Guide pin

100‧‧‧光連接器 100‧‧‧Optical connector

101‧‧‧光學性連接端部 101‧‧‧Optical connection end

150‧‧‧貫通孔 150‧‧‧Through hole

151‧‧‧溝 151‧‧‧Ditch

152‧‧‧基準孔 152‧‧‧Datum hole

200‧‧‧電連接器 200‧‧‧Electrical connector

201‧‧‧電性連接端部 201‧‧‧Electrical connection end

300‧‧‧開口部 300‧‧‧Opening

A‧‧‧區域 A‧‧‧Region

F1‧‧‧拉動力 F1‧‧‧pull power

F2‧‧‧按壓力 F2‧‧‧Pressing force

NA‧‧‧開口數 NA‧‧‧Number of openings

第1圖係顯示本發明之實施型態之連接裝置之構成的示意圖。 FIG. 1 is a schematic diagram showing the structure of a connection device according to an embodiment of the present invention.

第2圖係顯示本發明之實施型態之連接裝置之位置調整機構之例的示意立體圖。 FIG. 2 is a schematic perspective view showing an example of the position adjustment mechanism of the connection device of the embodiment of the present invention.

第3圖係用以說明本發明之實施型態之連接裝置之製造方法的示意圖(其一)。 FIG. 3 is a schematic diagram (No. 1) for explaining the manufacturing method of the connection device of the embodiment of the present invention.

第4圖係用以說明本發明之實施型態之連接裝置之製造方法的示意圖(其二)。 FIG. 4 is a schematic diagram (No. 2) for explaining the manufacturing method of the connection device of the embodiment of the present invention.

第5圖係顯示本發明之實施型態之連接裝置之光連接器與電連接器之配置之例的示意俯視圖。 FIG. 5 is a schematic plan view showing an example of the arrangement of optical connectors and electrical connectors of a connection device according to an embodiment of the present invention.

第6圖係顯示本發明之實施型態之連接裝置之補強件(stiffener)之構造之例的示意立體圖。 FIG. 6 is a schematic perspective view showing an example of the structure of a stiffener of a connecting device according to an embodiment of the present invention.

第7圖係顯示本發明之實施型態之連接裝置之構成的立體圖。 FIG. 7 is a perspective view showing the configuration of the connection device of the embodiment of the present invention.

第8圖係顯示本發明之實施型態之連接裝置之塊體與毛細管(capillary)固定之構成例的示意立體圖。 FIG. 8 is a schematic perspective view showing a configuration example of a block and a capillary of a connecting device according to an embodiment of the present invention.

第9圖係顯示第8圖之區域A的俯視圖。 FIG. 9 is a plan view showing the area A of FIG. 8.

第10圖係顯示第8圖所示之構成例之固定用柱材之形狀的立體圖。 Fig. 10 is a perspective view showing the shape of the fixing column material in the configuration example shown in Fig. 8.

第11圖係顯示第8圖所示之構成例之塊體之形狀的俯視圖。 FIG. 11 is a plan view showing the shape of the block of the configuration example shown in FIG. 8.

第12圖係為顯示第8圖所示之構成例之毛細管之形狀之與厚度方向垂直的剖面圖。 FIG. 12 is a cross-sectional view showing the shape of the capillary shown in FIG. 8 perpendicular to the thickness direction.

接著參照圖式來說明本發明的實施型態。在以下之圖式的記載中,對於相同或類似的部分係賦予了相同或類似的符號。然而,圖式僅係示意性者,應注意各部之厚度的比率等與實際情形有所不同。此外,在圖式相互間當然亦包含有彼此之尺寸的關係或比率不同的部分。以下所示的實施型態,係例示用以將本發明之技術思想予以具體化的裝置或方法,本發明之實施型態,並未將構成零件的材質、形狀、構造、配置等限定於下述各者。 Next, an embodiment of the present invention will be described with reference to the drawings. In the description of the following drawings, the same or similar symbols are given to the same or similar parts. However, the drawings are only schematics, and it should be noted that the thickness ratio of each part is different from the actual situation. In addition, of course, the drawings also include parts having different dimensional relationships or ratios. The embodiments shown below are examples of devices or methods for embodying the technical idea of the present invention. The embodiments of the present invention do not limit the materials, shapes, structures, arrangements, etc. of the constituent parts to the following Describe each.

第1圖所示之本發明之實施型態之連接裝置,係使用在具有傳遞電信號之電信號端子與傳遞光信號之光信號端子之光元件的檢查上。以光元件而言,雖未特別限定,但可假設矽光子(Silicon Photonics)晶片、VCSEL(Vertical-Cavity Surface-Emitting Laser,垂直腔面發射雷射)等。第1圖所示之連接裝置係具備:光連接器100,係與光元件之光信號端子光學性連接;及電連接器200,係與光元件之電信號端子電性連接。光連接器100與電連接器200係以使其接近1個光元件之光信號端子與電信號端子之距離所對應之位置之方式配置。當光連接器100與光信號端子光學性連接時,在光信號端子與光連接器100之間傳遞光信號。通常,光信號端子與光連接器100,係在彼此接近之非接觸的狀態下光學性連接。光連接器100與光信號端子連接的時間點,及電連接器200與電信號 端子連接的時間點,係可同時亦可有產生時間差。總之,只要光連接器100與電連接器200雙方可同時與光元件連接即可。 The connection device according to the embodiment of the present invention shown in FIG. 1 is used for inspection of optical elements having electrical signal terminals for transmitting electrical signals and optical signal terminals for transmitting optical signals. In terms of optical devices, although not particularly limited, silicon photonics (Silicon Photonics) chips, VCSEL (Vertical-Cavity Surface-Emitting Laser, vertical cavity surface emitting laser), etc. can be assumed. The connection device shown in FIG. 1 includes: an optical connector 100 that is optically connected to the optical signal terminal of the optical element; and an electrical connector 200 that is electrically connected to the electrical signal terminal of the optical element. The optical connector 100 and the electrical connector 200 are arranged so as to be close to the position corresponding to the distance between the optical signal terminal and the electrical signal terminal of one optical element. When the optical connector 100 and the optical signal terminal are optically connected, an optical signal is transmitted between the optical signal terminal and the optical connector 100. Generally, the optical signal terminal and the optical connector 100 are optically connected in a non-contact state close to each other. The time at which the optical connector 100 is connected to the optical signal terminal and the time at which the electrical connector 200 is connected to the electrical signal terminal may have a time difference at the same time. In short, as long as both the optical connector 100 and the electrical connector 200 can be connected to the optical element at the same time.

連接裝置係作為將檢查裝置與檢查對象之光元件連接之探針卡而發揮作用。檢查對象的光元件係省略了圖示,但係在將形成有光信號端子與電信號端子(以下統稱為「信號端子」)的表面,以於第1圖中朝向下方的狀態與連接裝置相對向地配置。在測量光元件時,將光連接器100的光學性連接端部101與光元件的光信號端子光學性連接,而電連接器200的電性連接端部201與光元件的電信號端子電性連接。藉此,例如,從電連接器200的電性連接端部201輸入電信號於光元件,並且將從光元件所輸出的光信號輸入於光連接器100的光學性連接端部101,且藉由未圖示之測試器(tester)等的測量裝置而偵測光信號。 The connection device functions as a probe card that connects the inspection device and the optical element to be inspected. The optical element to be inspected is not shown, but it is on the surface on which the optical signal terminal and the electrical signal terminal (hereinafter collectively referred to as "signal terminal") are formed, facing the connection device in the downward direction in FIG. 1 To the ground configuration. When measuring an optical element, the optical connection end 101 of the optical connector 100 is optically connected to the optical signal terminal of the optical element, and the electrical connection end 201 of the electrical connector 200 is electrically connected to the electrical signal terminal of the optical element connection. Thereby, for example, an electrical signal is input from the electrical connection end 201 of the electrical connector 200 to the optical element, and the optical signal output from the optical element is input to the optical connection end 101 of the optical connector 100, and The optical signal is detected by a measuring device such as a tester (not shown).

在光連接器100中,較佳為使用光纖等。例如,從光元件的光信號端子,將光信號射入至配置於光信號端子之附近之光纖的端面。然而,不限定於光纖,亦可將具有光波導的光學零件使用於光連接器100。光纖等光波導係均以具有與光元件同等的折射率之方式形成。例如,為了使之與矽光子元件對應,探針卡(probe card)側的光連接器亦以配合矽之折射率的材料來形成。 In the optical connector 100, an optical fiber or the like is preferably used. For example, the optical signal is injected from the optical signal terminal of the optical element to the end surface of the optical fiber disposed near the optical signal terminal. However, it is not limited to the optical fiber, and an optical component having an optical waveguide may be used for the optical connector 100. Optical waveguide systems such as optical fibers are formed so as to have the same refractive index as the optical element. For example, in order to correspond to the silicon photonic element, the optical connector on the probe card side is also formed of a material matching the refractive index of silicon.

電連接器200較佳為使用由導電性材料所構成的探針等。例如,將懸臂(cantilever)型的探針使用於電連接器200。然而,可使用於電連接器200之探針的型態,不限定於懸臂式,可使用任意型態的探針。 The electrical connector 200 preferably uses a probe made of a conductive material or the like. For example, a cantilever type probe is used for the electrical connector 200. However, the type of probe used in the electrical connector 200 is not limited to the cantilever type, and any type of probe can be used.

如第1圖所示,連接裝置係具備:塊體10,係在使光連接器100的光學性連接端部101露出於主面(第一主面)的狀態下固定光連接 器100;及電路基板20,係安裝有塊體10。在電路基板20中,形成有與電連接器200電性連接的電氣電路。電路基板20較佳為使用印刷基板(PCB基板)等。電連接器200係與設於電路基板20的接合墊21電性連接,且設置於電路基板20。 As shown in FIG. 1, the connection device includes: a block 10 that fixes the optical connector 100 in a state where the optical connection end 101 of the optical connector 100 is exposed on the main surface (first main surface); and The circuit board 20 is mounted with the block 10. On the circuit board 20, an electrical circuit electrically connected to the electrical connector 200 is formed. The circuit board 20 is preferably a printed board (PCB board) or the like. The electrical connector 200 is electrically connected to the bonding pad 21 provided on the circuit board 20 and is provided on the circuit board 20.

接合墊21係經由形成於電路基板20之未圖示的電氣電路,而與配置於電路基板20的連接端子23連接。連接端子23係配置在與電路基板20之供電連接器200設置之主面相反側的主面上。連接端子23係與檢查裝置電性連接。 The bonding pad 21 is connected to the connection terminal 23 arranged on the circuit board 20 via an electric circuit (not shown) formed on the circuit board 20. The connection terminal 23 is arranged on the main surface opposite to the main surface on which the power supply connector 200 of the circuit board 20 is provided. The connection terminal 23 is electrically connected to the inspection device.

此外,以光波導與光學性連接端部101進行光耦合之光連接器100的另一方的端部,係與檢查裝置連接。光連接器100係例如經由光連接器(connector)等的零件而連接於檢查裝置。此時,可配合檢查裝置的規格,將光信號轉換為電信號,亦可將光信號直接輸入於檢查裝置。 In addition, the other end of the optical connector 100 optically coupled with the optical connection end 101 is connected to the inspection device. The optical connector 100 is connected to the inspection apparatus via components such as an optical connector. At this time, the optical signal can be converted into an electrical signal according to the specifications of the inspection device, or the optical signal can be directly input to the inspection device.

光連接器100與電連接器200係以預定的位置精確度設置於連接裝置,以於檢查時正確地連接於檢查對象之光元件的信號端子。亦即,光連接器100的光學性連接端部101與電連接器200的電性連接端部201之相對的位置關係位於預定的範圍,在將連接裝置與光元件進行對位時,光連接器100與電連接器200與光元件的信號端子正確地連接。在此,所謂「正確地連接」係指以能獲得預定的測量精確度之方式,光連接器100及電連接器200與檢查對象之光元件的信號端子連接。 The optical connector 100 and the electrical connector 200 are provided on the connection device with a predetermined position accuracy so as to be correctly connected to the signal terminal of the optical element to be inspected during inspection. That is, the relative positional relationship between the optical connection end 101 of the optical connector 100 and the electrical connection end 201 of the electrical connector 200 is within a predetermined range, and when the connection device is aligned with the optical element, the optical connection The connector 100 and the electrical connector 200 are correctly connected to the signal terminal of the optical element. Here, "correctly connected" means that the optical connector 100 and the electrical connector 200 are connected to the signal terminal of the optical element to be inspected in such a way that predetermined measurement accuracy can be obtained.

關於電連接器200與光連接器100的位置,在與光元件的信號端子連接而獲得預定之測量精確度的位置(以下稱為「最佳位置」)上具有容許範圍。最佳位置的容許範圍係指若電連接器200或光連接器100 位於該範圍,就能以所期望的精確度或強度取得信號的範圍。此容許範圍係依據檢查所要求的精確度或連接器之性能等而適當設定。例如,當使用光纖於光連接器100時,光連接器100之位置的容許範圍依據光纖的開口數NA等而設定。 Regarding the positions of the electrical connector 200 and the optical connector 100, there is an allowable range at a position (hereinafter referred to as "optimum position") where a predetermined measurement accuracy is obtained by connecting to the signal terminal of the optical element. The allowable range of the optimal position refers to the range where the signal can be obtained with the desired accuracy or strength if the electrical connector 200 or the optical connector 100 is located in the range. The allowable range is appropriately set according to the accuracy required for inspection or the performance of the connector. For example, when an optical fiber is used for the optical connector 100, the allowable range of the position of the optical connector 100 is set according to the number of openings NA of the optical fiber and the like.

光連接器100之最佳位置的容許範圍,較電連接器200之最佳位置的容許範圍更窄。在第1圖所示之連接裝置的製造中,如後所述,係在進行了容許範圍較小之光連接器100的對位之後,依據該光連接器100的位置,而進行電連接器200的對位。 The allowable range of the optimal position of the optical connector 100 is narrower than that of the electrical connector 200. In the manufacture of the connection device shown in FIG. 1, as described later, after the alignment of the optical connector 100 with a smaller allowable range is performed, the electrical connector is made according to the position of the optical connector 100 Counterpoint of 200.

在第1圖所示之連接裝置中,係將在使光連接器100貫通的狀態下固定該光連接器100的毛細管15嵌入於塊體10,藉此將光連接器100固定於塊體10。換言之,以所需的位置精確度形成貫通孔於毛細管15,且將插入於此貫通孔的光連接器100予以固定。藉此,即能以預定的位置精確度將光連接器100設置於塊體10。 In the connection device shown in FIG. 1, the capillary 15 that fixes the optical connector 100 in a state where the optical connector 100 is penetrated is embedded in the block body 10, thereby fixing the optical connector 100 to the block body 10 . In other words, the through hole is formed in the capillary 15 with the required position accuracy, and the optical connector 100 inserted into the through hole is fixed. With this, the optical connector 100 can be installed on the block 10 with a predetermined position accuracy.

形成於毛細管15之貫通孔的數量係任意。例如,當一個光元件所具有的光信號端子為4個時,依每一光元件準備形成有4個貫通孔的毛細管15。或者,亦可當1個光元件所具有的光信號端子為一個時,準備依4個光元件形成有4個貫通孔的毛細管15。 The number of through holes formed in the capillary 15 is arbitrary. For example, when there are four optical signal terminals included in one optical element, a capillary 15 formed with four through holes is prepared for each optical element. Alternatively, when one optical element has one optical signal terminal, a capillary 15 having four through holes formed on four optical elements may be prepared.

另外,若能以所需的位置精確度將光連接器100配置於塊體10,則亦可不使用毛細管15。例如,將塊體10分割為2個部分,且於所分割之部分之對接面分別形成用以配置光連接器100的V字形溝。V字形溝係在對接面形成有開口部,且以在將分割後之部分予以重疊時開口部會一致之方式形成。在光連接器100配置於V字形溝的狀態下將2個部分重疊,藉 此可將光連接器100固定於塊體10的內部。V字形溝的加工較形成貫通孔更容易,而且可提高尺寸精確度。另外,亦可僅在所分割之塊體10之一方的部分形成V字形溝。 In addition, if the optical connector 100 can be arranged on the block body 10 with the required position accuracy, the capillary 15 may not be used. For example, the block 10 is divided into two parts, and V-shaped grooves for arranging the optical connector 100 are formed on the butted surfaces of the divided parts. The V-shaped groove is formed with openings on the butting surface, and is formed in such a manner that the openings will coincide when the divided portions are overlapped. In a state where the optical connector 100 is arranged in a V-shaped groove, the two parts are overlapped, whereby the optical connector 100 can be fixed inside the block body 10. The processing of V-shaped grooves is easier than the formation of through-holes, and the dimensional accuracy can be improved. In addition, a V-shaped groove may be formed only in one part of the divided block 10.

在電路基板20中,係固定有剛性較電路基板20更高的補強件30。補強件30係確保連接裝置之機械性強度以使電路基板20不會撓曲,並且被作為用以將連接裝置之構成零件的各者予以固定的支撐體來使用。 The circuit board 20 is fixed with a reinforcement 30 having a higher rigidity than the circuit board 20. The reinforcing member 30 ensures the mechanical strength of the connection device so that the circuit board 20 does not flex, and is used as a support for fixing each of the component parts of the connection device.

此外,在塊體10的第一主面,配置有供光連接器100貫通的導板(guide plate)60。在設於導板60的貫通孔,插入有固定於補強件30的導銷(guide pin)70。藉此,劃定導板60的位置。在導板60中係設有開口區域,俾可目視形成於電路基板20的對準標記(alignment mark)22。藉由將導板60配置於塊體10的第一主面,即可易於確認在將塊體10設置於電路基板20時所使用之對準標記22的位置。 In addition, a guide plate 60 through which the optical connector 100 penetrates is arranged on the first main surface of the block 10. A guide pin 70 fixed to the reinforcement 30 is inserted into the through hole provided in the guide plate 60. With this, the position of the guide plate 60 is defined. An opening area is provided in the guide plate 60 so that the alignment mark 22 formed on the circuit board 20 can be visually observed. By arranging the guide plate 60 on the first main surface of the block 10, the position of the alignment mark 22 used when the block 10 is placed on the circuit board 20 can be easily confirmed.

在第1圖所示之連接裝置中,塊體10係以可沿著與第一主面垂直之方向(以下稱「厚度方向」)移動之方式安裝於電路基板20。換言之,塊體10未固定於電路基板20。再者,在導板60與電路基板20之間,係設有間隙。因此,塊體10係可相對於補強件30及被固定於補強件30的電路基板20,朝厚度方向移動。此外,藉由在導板60與電路基板20之間設置間隙,即可當電路基板20的表面不平坦時,抑制其會對於導板60造成影響。 In the connection device shown in FIG. 1, the block 10 is mounted on the circuit board 20 so as to be movable in a direction perpendicular to the first main surface (hereinafter referred to as “thickness direction”). In other words, the block 10 is not fixed to the circuit board 20. Furthermore, a gap is provided between the guide plate 60 and the circuit board 20. Therefore, the block 10 can move in the thickness direction with respect to the reinforcement 30 and the circuit board 20 fixed to the reinforcement 30. In addition, by providing a gap between the guide plate 60 and the circuit board 20, it is possible to suppress the influence on the guide plate 60 when the surface of the circuit board 20 is not flat.

第1圖所示之連接裝置,係具備調整塊體10相對於電路基板20之相對位置的位置調整機構40。此位置調整機構40係構成為包括:板 狀的拉簧41,係朝向厚度方向的一方拉動塊體10;及板狀的按壓彈簧42,係朝與拉簧41之拉動方向的相反方向按壓塊體10。再者,藉由源自拉簧41的拉動力F1與按壓彈簧42的按壓力F2的平衡,規定塊體10之厚度方向的位置。為了使塊體10在預定的位置穩定,預先設定了拉簧41與按壓彈簧42的彈力。 The connection device shown in FIG. 1 includes a position adjustment mechanism 40 that adjusts the relative position of the block body 10 with respect to the circuit board 20. The position adjustment mechanism 40 is configured to include: a plate-shaped tension spring 41 that pulls the block body 10 toward one side in the thickness direction; and a plate-shaped pressing spring 42 that presses the block in a direction opposite to the pulling direction of the tension spring 41体10。 10. Furthermore, the position of the block 10 in the thickness direction is defined by the balance of the pulling force F1 derived from the pulling spring 41 and the pressing force F2 of the pressing spring 42. In order to stabilize the block body 10 at a predetermined position, the elastic forces of the tension spring 41 and the pressing spring 42 are set in advance.

如第1圖所示,拉簧41的中央部被固定於相對向於第一主面之塊體10的第二主面,拉簧41的兩端被按壓於補強件30而彈性地接觸。更具體而言,如第2圖所示,第一螺栓(bolt)51貫通拉簧41的中央部而固定於塊體10的第二主面。 As shown in FIG. 1, the central portion of the tension spring 41 is fixed to the second main surface of the block 10 opposed to the first main surface, and both ends of the tension spring 41 are pressed against the reinforcement 30 to elastically contact. More specifically, as shown in FIG. 2, the first bolt 51 penetrates the central portion of the tension spring 41 and is fixed to the second main surface of the block body 10.

另一方面,如第2圖所示,按壓彈簧42之一方的端部藉由第二螺栓52而固定於補強件30,另一方之端部被按壓於塊體10的第二主面而彈性地接觸。拉簧41及按壓彈簧42係經由補強件30而固定於電路基板20。 On the other hand, as shown in FIG. 2, one end of the pressing spring 42 is fixed to the reinforcing member 30 by the second bolt 52, and the other end is pressed against the second main surface of the block 10 to be elastic Ground contact. The tension spring 41 and the pressing spring 42 are fixed to the circuit board 20 via the reinforcement 30.

另外,例如使第二螺栓52螺合於補強件30,且調整螺釘的緊固方式,藉此亦可微調整塊體10之厚度方向的位置。如此,拉簧41與按壓彈簧42的組合,係作為使塊體10相對於補強件30及電路基板20相對地移動的位置調整機構而發揮作用。 In addition, for example, by screwing the second bolt 52 to the reinforcement 30 and adjusting the tightening method of the screw, the position of the block 10 in the thickness direction can also be finely adjusted. In this way, the combination of the tension spring 41 and the pressing spring 42 functions as a position adjustment mechanism that relatively moves the block 10 relative to the reinforcement 30 and the circuit board 20.

以下說明第1圖所示之連接裝置的製造方法。以下例示性說明將光纖使用於光連接器100,且將懸臂型探針使用於電連接器200的情形。 The method of manufacturing the connection device shown in FIG. 1 will be described below. The following exemplarily describes a case where an optical fiber is used for the optical connector 100 and a cantilever-type probe is used for the electrical connector 200.

首先,準備已針對端部進行過終端處理的光纖作為光連接器100。所謂「終端處理」係指作為光學性連接端部101之端部的透鏡加工或研磨、包覆層剝除加工或將光連接器裝設於另一方之端部的處理等。 First, as the optical connector 100, an optical fiber that has been subjected to terminal treatment for the end portion is prepared. The term “end processing” refers to the processing or polishing of the lens as the end of the optical connection end 101, the process of removing the coating layer, or the process of attaching the optical connector to the other end.

再者,如第3圖所示,以光學性連接端部101露出於塊體10之第一主面之方式,將光連接器100設置於塊體10。例如,將貫通光連接器100的毛細管15固定於塊體10。此時,以光學性連接端部101以預定的高度從塊體10的第一主面露出之方式調整光連接器100的突出量,確認光連接器100已被設置於預定的位置,而固定毛細管15。 Furthermore, as shown in FIG. 3, the optical connector 100 is provided on the block 10 so that the optical connection end 101 is exposed on the first main surface of the block 10. For example, the capillary 15 penetrating the optical connector 100 is fixed to the block 10. At this time, the amount of protrusion of the optical connector 100 is adjusted so that the optical connection end 101 is exposed from the first main surface of the block 10 at a predetermined height, and it is confirmed that the optical connector 100 has been set at a predetermined position and fixed Capillary 15.

接著,將導板60安裝於塊體10的第一主面。再者,將塊體10安裝於電路基板20之預定的位置。例如,在形成於電路基板20之預定之位置的空洞,插入塊體10。此時,以形成於電路基板20的對準標記22作為記號進行對位,同時將塊體10安裝於電路基板20。將設有使對準標記22露出之開口區域的導板60配置於塊體10,藉此即可易於進行塊體10與電路基板20的對位。 Next, the guide plate 60 is attached to the first main surface of the block 10. Furthermore, the block 10 is mounted at a predetermined position on the circuit board 20. For example, the block 10 is inserted into a cavity formed at a predetermined position on the circuit board 20. At this time, the alignment mark 22 formed on the circuit board 20 is used as a mark, and the block 10 is mounted on the circuit board 20 at the same time. By arranging the guide plate 60 provided with the opening area where the alignment mark 22 is exposed to the block 10, the block 10 and the circuit board 20 can be easily aligned.

再者,將補強件30固定於電路基板20。此時,如第4圖所示,藉由固定於補強件30的導銷70而設定導板60的位置。 Furthermore, the reinforcement 30 is fixed to the circuit board 20. At this time, as shown in FIG. 4, the position of the guide plate 60 is set by the guide pin 70 fixed to the reinforcement 30.

接著,如第2圖所示,將拉簧41與按壓彈簧42安裝於塊體10與補強件30。再者,固定拉簧41與按壓彈簧42的位置。此時,不僅進行厚度方向之位置的調整,亦進行與厚度方向垂直之平行之方向的調整。位置之調整的基準係電路基板20的主面。 Next, as shown in FIG. 2, the tension spring 41 and the pressing spring 42 are attached to the block body 10 and the reinforcement 30. Furthermore, the positions of the tension spring 41 and the pressing spring 42 are fixed. At this time, not only the position adjustment in the thickness direction but also the direction parallel to the thickness direction is adjusted. The reference for position adjustment is the main surface of the circuit board 20.

接著,將電連接器200設置於電路基板20。此時,如以下之方式參照光連接器100的位置資訊,進行電連接器200的定位。 Next, the electrical connector 200 is provided on the circuit board 20. At this time, the electrical connector 200 is positioned by referring to the position information of the optical connector 100 as follows.

首先,解析光連接器100的位置資訊,針對光學性連接端部101的位置,檢測出從預先設定的設定位置偏離的量(以下簡稱「偏離量」)。再者,參照光學性連接端部101之位置的偏離量,算出電連接器200之電性連接端部201的最佳位置。 First, the position information of the optical connector 100 is analyzed, and the amount of deviation from the preset setting position (hereinafter referred to as "the amount of deviation") is detected for the position of the optical connection end 101. Furthermore, with reference to the amount of deviation of the position of the optical connection end 101, the optimal position of the electrical connection end 201 of the electrical connector 200 is calculated.

例如,比較關於光連接器100之光學性連接端部101之預定的設定座標,與實際上設置於塊體10之光連接器100之光學性連接端部101的座標,而檢測出光學性連接端部101之位置的偏離量。再者,以關於電性連接端部201之從預定之設定座標之位置偏離的量,會與光學性連接端部101之位置之偏離量相同之方式,決定電性連接端部201之位置的座標。 For example, the predetermined set coordinates of the optical connection end 101 of the optical connector 100 are compared with the coordinates of the optical connection end 101 actually provided on the optical connector 100 of the block 10, and the optical connection is detected The amount of deviation of the position of the end 101. Furthermore, the amount of deviation of the position of the electrical connection end 201 from the predetermined set coordinate will be determined in the same manner as the amount of deviation of the position of the optical connection end 101, coordinate.

此時,亦能以統計方式處理偏離量,而決定電連接器200之電性連接端部201的位置。例如,作成偏離量之參差不齊的柱狀圖(histogram),算出偏離量之平均值或參差不齊(偏差)等。再者,以相對於光連接器100之光學性連接端部101成為預定之相對位置之方式,算出電連接器200之電性連接端部201的位置。 At this time, the deviation amount can also be statistically processed to determine the position of the electrical connection end 201 of the electrical connector 200. For example, a histogram of unevenness of deviations is created, and the average value of deviations or unevenness (deviations) are calculated. Furthermore, the position of the electrical connection end 201 of the electrical connector 200 is calculated so that the optical connection end 101 of the optical connector 100 becomes a predetermined relative position.

之後,以電性連接端部201配置於所算出之位置之方式,將電連接器200接合於電路基板20的接合墊21。藉由以上方式,完成第1圖所示的連接裝置。 After that, the electrical connector 200 is bonded to the bonding pad 21 of the circuit board 20 so that the electrical connection end 201 is arranged at the calculated position. In the above manner, the connection device shown in FIG. 1 is completed.

第5圖係顯示光連接器100之光學性連接端部101與電連接器200之電性連接端部201的位置之例。在第5圖所示之例中,係以與4個光連接器100之光學性連接端部101的各者成對之方式,配置有4個電連接 器200的電性連接端部201。藉此,即可針對例如以一個電信號端子與一個光信號端子成對具有之光元件,連續地或同時檢查4個光元件。 FIG. 5 shows an example of the positions of the optical connection end 101 of the optical connector 100 and the electrical connection end 201 of the electrical connector 200. In the example shown in FIG. 5, the electrical connection ends 201 of the four electrical connectors 200 are arranged in pairs with each of the optical connection ends 101 of the four optical connectors 100. In this way, for example, for an optical element having a pair of one electrical signal terminal and one optical signal terminal, four optical elements can be inspected continuously or simultaneously.

如此,即可對應形成有複數個光元件之晶圓的檢查,同時針對二個以上的光元件提供具有連接於信號端子的光連接器100與電連接器200的連接裝置。或者,可使用具有四個光連接器100與四個電連接器200來檢查具有四個光信號端子與四個電信號端子的光元件。藉此,即可總括性地擷取複數個光元件的光信號進行測量,因此可提升檢查的效率,且可縮短檢查時間。 In this way, corresponding to the inspection of the wafer on which a plurality of optical elements are formed, a connection device having the optical connector 100 and the electrical connector 200 connected to the signal terminals is provided for two or more optical elements. Alternatively, an optical element having four optical signal terminals and four electrical signal terminals may be inspected using four optical connectors 100 and four electrical connectors 200. In this way, the optical signals of a plurality of optical elements can be collectively captured for measurement, so the inspection efficiency can be improved and the inspection time can be shortened.

如上所述參照光連接器100的位置資訊而將電連接器200設置於電路基板20,藉此即可將光學性連接端部101與電性連接端部201之相對的位置關係控制在所期望之位置精確度的範圍。藉此,即可將光連接器100與電連接器200同時以高精確度連接於光元件的信號端子。結果,即可進行光元件之正確的測量。 As described above, the electrical connector 200 is provided on the circuit board 20 with reference to the position information of the optical connector 100, whereby the relative positional relationship between the optical connection end 101 and the electrical connection end 201 can be controlled to a desired The range of location accuracy. In this way, the optical connector 100 and the electrical connector 200 can be simultaneously connected to the signal terminal of the optical element with high accuracy. As a result, accurate measurement of the optical element can be performed.

另外,接合墊21與對準標記22,較佳為在形成電路基板20時以相同的製程步驟同時形成。藉此,即可依據製程步驟之製造的精確度而提高接合墊21與對準標記22之相對之位置的精確度。結果,在使用對準標記22進行對位時,即可針對接合墊21亦高精確度地進行對位。 In addition, the bonding pad 21 and the alignment mark 22 are preferably formed at the same time in the same process steps when the circuit board 20 is formed. Thereby, the accuracy of the relative position of the bonding pad 21 and the alignment mark 22 can be improved according to the manufacturing accuracy of the manufacturing steps. As a result, when the alignment mark 22 is used for alignment, the bonding pad 21 can also be aligned with high accuracy.

為了獲得連接裝置的機械性強度,補強件30係以具有一定程度之厚度之方式形成。另一方面,當增厚塊體10時,將難以配置光連接器100。因此,例如第6圖所示,在補強件30形成要配置塊體10的凹部。在第6圖中,係顯示在形成於補強件30的一個凹部的內部形成有分別配置塊體10的四個開口部300之例。第7圖係顯示將分別配置有導板60的四個 塊體10,配置於固定於補強件30之電路基板20之例。在第7圖中,係省略了光連接器100或電連接器200,配置於電路基板20之上面之連接端子23等零件的圖示。 In order to obtain the mechanical strength of the connection device, the reinforcing member 30 is formed to have a certain thickness. On the other hand, when the block 10 is thickened, it will be difficult to configure the optical connector 100. Therefore, for example, as shown in FIG. 6, the reinforcement 30 is formed with a concave portion where the block 10 is to be arranged. In FIG. 6, an example is shown in which four openings 300 in which the blocks 10 are arranged are formed inside one recess formed in the reinforcement 30. FIG. 7 shows an example in which four blocks 10 with guide plates 60 are arranged on a circuit board 20 fixed to a reinforcement 30, respectively. In FIG. 7, the optical connector 100 or the electrical connector 200 is omitted, and the connection terminal 23 and the like disposed on the upper surface of the circuit board 20 are shown.

補強件30之各者之凹部的尺寸或配置於其內部之塊體10的個數,係可依據補強件30所要求之機械性強度或塊體10的尺寸而任意設定。藉由將複數個塊體10固定於補強件30,即可同時檢查複數個光元件,或檢查大面積的光元件。 The size of the concave portion of each of the reinforcing members 30 or the number of blocks 10 arranged inside can be arbitrarily set according to the mechanical strength required by the reinforcing members 30 or the size of the blocks 10. By fixing the plurality of blocks 10 to the reinforcing member 30, it is possible to inspect the plurality of optical elements at the same time, or inspect the optical elements of a large area.

此外,毛細管15係例如第8圖至第9圖所示,藉由插入於塊體10與毛細管15之間的固定用柱材16而被壓抵於塊體10而固定。第9圖係第8圖之區域A的俯視圖。如第10圖所示,固定用柱材16係圓柱狀,將要嵌入固定用柱材16的嵌入孔形成於塊體10。嵌入孔係與供毛細管15嵌入的空洞平行地朝塊體10的厚度方向延伸。亦即,如第11圖所示,將供毛細管15嵌入之空洞11的周圍,於塊體10形成與空洞11平行延伸的嵌入孔12。嵌入孔12係沿著空洞11的長度方向連續地形成,而嵌入於空洞11的毛細管15會與嵌入於嵌入孔12之固定用柱材16的側面接觸。 In addition, the capillary 15 is, for example, as shown in FIGS. 8 to 9, and is fixed by being pressed against the block 10 by the fixing column 16 interposed between the block 10 and the capillary 15. FIG. 9 is a plan view of the area A of FIG. 8. As shown in FIG. 10, the fixing column 16 is cylindrical, and an insertion hole into which the fixing column 16 is to be inserted is formed in the block 10. The insertion hole extends in the thickness direction of the block 10 parallel to the cavity into which the capillary 15 is inserted. That is, as shown in FIG. 11, an insertion hole 12 extending parallel to the cavity 11 is formed in the block 10 around the cavity 11 into which the capillary 15 is inserted. The insertion hole 12 is continuously formed along the longitudinal direction of the cavity 11, and the capillary 15 inserted into the cavity 11 comes into contact with the side surface of the fixing column 16 inserted into the insertion hole 12.

第12圖係顯示與毛細管15之厚度方向垂直的剖面圖。在毛細管15中,係形成供光學性連接端部101貫通的貫通孔150,並且在側面朝厚度方向形成有與固定用柱材16嵌合的溝151。在將毛細管15嵌入於空洞11之後,將固定用柱材16嵌入於嵌入孔12,藉此使毛細管15固定於塊體10。在上述中,係顯示藉由三個固定用柱材16而將毛細管15固定於塊體10之例。 FIG. 12 is a cross-sectional view perpendicular to the thickness direction of the capillary 15. In the capillary tube 15, a through hole 150 is formed through which the optical connection end 101 penetrates, and a groove 151 fitted into the fixing column 16 is formed on the side surface in the thickness direction. After the capillary 15 is inserted into the cavity 11, the fixing column 16 is inserted into the insertion hole 12, thereby fixing the capillary 15 to the block 10. In the above, the example in which the capillary 15 is fixed to the block 10 by three fixing pillars 16 is shown.

毛細管15與塊體10的對位,係例如以下列方式進行。在預先設計成使塊體10的外形與形成於毛細管15的基準孔152控制於預定精確度的輔助具上設置毛細管15與塊體10。此時,在安裝於輔助具的基準銷上插入基準孔152而設置毛細管15。之後,以光連接器100的位置與塊體10的外形落在設計上之容許範圍之方式,使毛細管15旋轉進行調整。當完成調整塊體10的外形與光連接器100的位置,就插入固定用柱材16而固定毛細管15。之後,從輔助具拆除固定有毛細管15的塊體10。 The alignment of the capillary 15 and the block 10 is performed in the following manner, for example. The capillary 15 and the block 10 are provided on an auxiliary tool designed in advance to control the outer shape of the block 10 and the reference hole 152 formed in the capillary 15 to a predetermined accuracy. At this time, the reference hole 152 is inserted into the reference pin attached to the auxiliary tool to provide the capillary 15. After that, the capillary 15 is rotated and adjusted in such a manner that the position of the optical connector 100 and the outer shape of the block 10 fall within the design allowable range. When the outer shape of the block 10 and the position of the optical connector 100 are adjusted, the fixing column 16 is inserted to fix the capillary 15. After that, the block body 10 to which the capillary 15 is fixed is removed from the auxiliary tool.

(其他實施型態) (Other implementations)

如上所述,本發明雖依據實施型態記載,但不應理解為構成該揭示之一部分的論述及圖式係限定本發明者。本發明所屬技術領域中具有通常知識者應可明瞭從該揭示可進行各種替代實施型態、實施例及運用技術。亦即,本發明當然亦包含在此未記載之各種實施型態等。 As described above, although the present invention is described based on the implementation type, it should not be construed that the discussion and drawings constituting a part of this disclosure limit the present inventor. Those with ordinary knowledge in the technical field to which the present invention belongs should understand that various alternative implementation types, embodiments, and application techniques can be made from the disclosure. That is, the present invention naturally includes various embodiments and the like not described herein.

10‧‧‧塊體 10‧‧‧ block

15‧‧‧毛細管 15‧‧‧Capillary

20‧‧‧電路基板 20‧‧‧ circuit board

21‧‧‧接合墊 21‧‧‧joint pad

22‧‧‧對準標記 22‧‧‧Alignment mark

23‧‧‧連接端子 23‧‧‧Connecting terminal

30‧‧‧補強件 30‧‧‧Reinforcement

40‧‧‧位置調整機構 40‧‧‧Position adjustment mechanism

41‧‧‧拉簧 41‧‧‧tension spring

42‧‧‧按壓彈簧 42‧‧‧Press spring

51‧‧‧第一螺栓 51‧‧‧First bolt

60‧‧‧導板 60‧‧‧Guide plate

70‧‧‧導銷 70‧‧‧Guide pin

100‧‧‧光連接器 100‧‧‧Optical connector

101‧‧‧光學性連接端部 101‧‧‧Optical connection end

200‧‧‧電連接器 200‧‧‧Electrical connector

201‧‧‧電性連接端部 201‧‧‧Electrical connection end

Claims (17)

一種連接裝置,其係使用於具有傳遞電信號之電信號端子與傳遞光信號之光信號端子之半導體元件的檢查,該連接裝置係具備:光連接器,係與前述光信號端子光學性連接;及電連接器,係與前述電信號端子電性連接。 A connection device used for inspection of a semiconductor element having an electric signal terminal transmitting an electric signal and an optical signal terminal transmitting an optical signal. The connecting device includes: an optical connector, which is optically connected to the aforementioned optical signal terminal; And the electrical connector is electrically connected to the aforementioned electrical signal terminal. 如申請專利範圍第1項所述之連接裝置,係在形成有複數個前述半導體元件的基板中,具備同時針對二個以上前述半導體元件分別連接於前述電信號端子與前述光信號端子的前述光連接器與前述電連接器。 The connection device as described in item 1 of the patent application scope is provided on the substrate on which a plurality of the semiconductor elements are formed, and includes the light for simultaneously connecting the two or more semiconductor elements to the electrical signal terminal and the optical signal terminal Connector and the aforementioned electrical connector. 如申請專利範圍第1項或第2項所述之連接裝置,係具備:塊體,係在使與前述光連接器之前述光信號端子光學性連接的光學性連接端部露出於主面的狀態下固定前述光連接器;及電路基板,係供前述塊體插入,且形成有與前述電連接器電性連接的電氣電路;前述電連接器係設置於前述電路基板。 The connection device as described in item 1 or 2 of the patent application scope includes a block body on which the optical connection end portion optically connected to the optical signal terminal of the optical connector is exposed on the main surface The optical connector is fixed in a state; and the circuit board is inserted into the block, and an electrical circuit electrically connected to the electrical connector is formed; the electrical connector is provided on the circuit board. 如申請專利範圍第3項所述之連接裝置,更具備在使前述光連接器貫通的狀態下固定前述光連接器的毛細管;前述毛細管係嵌入於前述塊體。 The connection device as described in item 3 of the patent application scope further includes a capillary for fixing the optical connector in a state where the optical connector is penetrated; the capillary is embedded in the block. 如申請專利範圍第4項所述之連接裝置,更具備固定用柱材,該固定用柱材係插入於嵌入孔,且以側面接觸前述毛細管來將前述毛細管壓抵於前述塊體而固定,該嵌入孔係與供前述毛細管嵌入之前述塊體之空洞平行地延伸而形成於前述空洞的周圍。 The connection device as described in item 4 of the patent application scope further includes a fixing post which is inserted into the insertion hole and contacts the capillary with the side to press the capillary against the block to fix it, The insertion hole extends parallel to the cavity of the block into which the capillary is inserted and is formed around the cavity. 如申請專利範圍第3項至第5項中任一項所述之連接裝置,其中,前述塊體係以可沿著與前述主面垂直之厚度方向移動之方式安裝於前述電路基板; 更具備位置調整機構,該位置調整機構係調整前述塊體相對於前述電路基板之相對的位置。 The connection device according to any one of claims 3 to 5, wherein the block system is mounted on the circuit board so as to be movable along the thickness direction perpendicular to the main surface; An adjustment mechanism for adjusting the position of the block relative to the circuit board. 如申請專利範圍第6項所述之連接裝置,其中,前述位置調整機構係具備:板狀的拉簧,係朝向前述厚度方向的一方拉動前述塊體;及板狀的按壓彈簧,係朝與前述拉簧之拉動方向的相反方向按壓前述塊體;藉由源自前述拉簧的拉動力與前述按壓彈簧的按壓力的平衡,而規定前述塊體之前述厚度方向的位置。 The connection device according to item 6 of the patent application scope, wherein the position adjustment mechanism includes: a plate-shaped tension spring that pulls the block toward one of the thickness directions; and a plate-shaped pressing spring that faces the The direction opposite to the pulling direction of the tension spring presses the block; the position of the thickness direction of the block is defined by the balance of the pulling force from the tension spring and the pressing force of the pressure spring. 如申請專利範圍第7項所述之連接裝置,更具備固定於前述電路基板,且剛性較前述電路基板更高的補強件;固定於前述塊體的前述拉簧係彈性地接觸前述補強件;固定於前述補強件的前述按壓彈簧係彈性地接觸前述塊體。 The connection device according to item 7 of the patent application scope further includes a reinforcement member fixed to the circuit board and having a higher rigidity than the circuit board; the tension spring fixed to the block body elastically contacts the reinforcement member; The pressing spring fixed to the reinforcing member elastically contacts the block. 如申請專利範圍第8項所述之連接裝置,更具備配置於前述塊體的前述主面,且供前述光連接器貫通的導板;在設於前述導板的貫通孔,插入有固定於前述補強件的導銷。 The connection device as described in item 8 of the patent application scope further includes a guide plate arranged on the main surface of the block and through which the optical connector penetrates; a through hole provided in the guide plate is inserted and fixed to The guide pin of the aforementioned reinforcement. 一種連接裝置的製造方法,該連接裝置係使用於具有傳遞電信號之電信號端子與傳遞光信號之光信號端子之半導體元件的檢查上;該連接裝置的製造方法係包含下列步驟:在使與前述光信號端子光學性連接之光連接器的光學性連接端部露出於塊體之主面的狀態下,將前述光連接器固定於前述塊體的步驟;以前述塊體的前述主面成為露出之狀態之方式將前述塊體安裝於電路基板的步驟;及 參照前述光學性連接端部的位置資訊,以電連接器的電性連接端部配置於預定的位置之方式,將前述電連接器設置於前述電路基板的步驟。 A manufacturing method of a connecting device, the connecting device is used for inspection of a semiconductor element having an electric signal terminal transmitting an electric signal and an optical signal terminal transmitting an optical signal; the manufacturing method of the connecting device includes the following steps: The step of fixing the optical connector to the block in a state where the optical connection end of the optical connector optically connected to the optical signal terminal is exposed on the main surface of the block; the main surface of the block becomes The step of mounting the block on the circuit board in an exposed state; and referring to the position information of the optical connection end, and electrically connecting the electric connection end of the electrical connector at a predetermined position The step of installing the device on the circuit board. 如申請專利範圍第10項所述之連接裝置的製造方法,其中,將前述電連接器設置於前述電路基板的步驟係包含下列階段:針對前述光學性連接端部的位置,檢測出從設定位置偏離之量的階段;參照前述偏離量,而算出前述電性連接端部之位置的階段;及以在參照前述偏離量所算出之位置配置前述電性連接端部之方式,將前述電連接器設置於前述電路基板的階段。 The method for manufacturing a connection device as described in item 10 of the patent application range, wherein the step of installing the electrical connector on the circuit board includes the following stages: detecting the position from the set position for the position of the optical connection end The stage of the amount of deviation; the stage of calculating the position of the electrical connection end with reference to the amount of deviation; and the electrical connector in such a manner that the electrical connection end is arranged at the position calculated with reference to the deviation It is provided at the stage of the aforementioned circuit board. 如申請專利範圍第11項所述之連接裝置的製造方法,係以統計方式處理前述偏離量而算出前述電性連接端部的位置。 The method for manufacturing a connection device as described in item 11 of the patent application process is to statistically process the deviation and calculate the position of the end of the electrical connection. 如申請專利範圍第10項至第12項中任一項所述之連接裝置的製造方法,其中,將在使前述光連接器貫通的狀態下固定前述光連接器的毛細管固定於前述塊體,藉此將前述光連接器固定於前述塊體。 The method for manufacturing a connection device according to any one of claims 10 to 12, wherein the capillary that fixes the optical connector in a state where the optical connector is penetrated is fixed to the block, Thereby, the optical connector is fixed to the block. 如申請專利範圍第13項所述之連接裝置的製造方法,將固定用柱材插入於嵌入孔,使前述固定用柱材的側面接觸前述毛細管,來將前述毛細管壓抵於前述塊體而固定,該嵌入孔係與供前述毛細管嵌入之前述塊體之空洞平行地延伸而形成於前述空洞的周圍。 According to the method of manufacturing a connection device described in item 13 of the patent application scope, a fixing column is inserted into an insertion hole, the side of the fixing column contacts the capillary, and the capillary is pressed against the block and fixed The insertion hole extends parallel to the cavity of the block into which the capillary is inserted and is formed around the cavity. 如申請專利範圍第10項至第14項中任一項所述之連接裝置的製造方法,更包含下列步驟:將前述塊體以可沿著與前述主面垂直之厚度方向移動之方式安裝於前述電路基板;將調整前述塊體相對於前述電路基板之相對的位置之位置調整機構固定於前述電路基板。 The method of manufacturing a connection device as described in any of items 10 to 14 of the patent application scope further includes the following steps: the block is installed in a manner that is movable along a thickness direction perpendicular to the main surface The circuit board; a position adjusting mechanism that adjusts the relative position of the block relative to the circuit board is fixed to the circuit board. 如申請專利範圍第15項所述之連接裝置的製造方法,將前述位置調整機構藉由板狀的拉簧及板狀的按壓彈簧而構成,前述板狀的拉簧係朝向前述厚度方向的一方拉動前述塊體,前述板狀的按壓彈簧係朝與前述拉簧之拉動方向的相反方向按壓前述塊體;藉由源自前述拉簧的拉動力與前述按壓彈簧的按壓力的平衡,而規定前述塊體之前述厚度方向的位置。 According to the method of manufacturing a connection device described in Item 15 of the patent application range, the position adjustment mechanism is constituted by a plate-shaped tension spring and a plate-shaped pressing spring, the plate-shaped tension spring is directed toward one side in the thickness direction Pulling the block, the plate-shaped pressing spring presses the block in a direction opposite to the pulling direction of the pulling spring; it is prescribed by the balance of the pulling force from the pulling spring and the pressing force of the pressing spring The position in the thickness direction of the block. 如申請專利範圍第16項所述之連接裝置的製造方法,更包含將剛性較前述電路基板更高的補強件固定於前述電路基板的步驟;使固定於前述塊體的前述拉簧彈性地接觸前述補強件;使固定於前述補強件的前述按壓彈簧彈性地接觸前述塊體。 The method of manufacturing a connection device as described in item 16 of the patent application scope further includes the steps of fixing a reinforcing member having a higher rigidity than the circuit board to the circuit board; and elastically contacting the tension spring fixed to the block The reinforcing member; the pressing spring fixed to the reinforcing member elastically contacts the block body.
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