TW201942231A - Curable resin composition, dry film, cured object, layered structure, and electronic component - Google Patents

Curable resin composition, dry film, cured object, layered structure, and electronic component Download PDF

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TW201942231A
TW201942231A TW108103255A TW108103255A TW201942231A TW 201942231 A TW201942231 A TW 201942231A TW 108103255 A TW108103255 A TW 108103255A TW 108103255 A TW108103255 A TW 108103255A TW 201942231 A TW201942231 A TW 201942231A
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resin
resin composition
compound
hydrated oxide
film
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田千穂
岡田和也
嶋田沙和子
工藤知哉
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日商太陽油墨製造股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/18Layered products comprising a layer of synthetic resin characterised by the use of special additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J7/00Chemical treatment or coating of shaped articles made of macromolecular substances
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
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    • C08K3/34Silicon-containing compounds
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K9/00Use of pretreated ingredients
    • C08K9/02Ingredients treated with inorganic substances
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L101/00Compositions of unspecified macromolecular compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/14Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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    • H01ELECTRIC ELEMENTS
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    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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Abstract

Provided are: a curable resin composition capable of giving a cured object which has excellent adhesion to roughening-free substrates or low-profile substrates, while retaining physical properties including low CTE; a dry film including a resin layer obtained from the composition; a cured object obtained by curing a resin layer which is either the composition or the dry film; a layered structure including a cured resin layer comprising the cured object; and an electronic component including the cured object. The curable resin composition is characterized by comprising a curable resin and surface-treated silica particles having a positive zeta potential.

Description

硬化性樹脂組成物、乾膜、硬化物、層合構造體,及電子零件Curable resin composition, dry film, cured product, laminated structure, and electronic component

本發明係關於硬化性樹脂組成物、乾膜、硬化物、層合構造體,及電子零件。The present invention relates to a curable resin composition, a dry film, a cured product, a laminated structure, and an electronic component.

一般而言,於印刷配線板等之電子零件中,就耐熱性或電絕緣性之觀點,作為層間絕緣材料用或防焊劑材料用或密封材用,係廣為使用以含羧基之樹脂或環氧樹脂等之硬化性樹脂為主成分,且進一步含有填充劑等之添加成分的樹脂組成物。
又,形成防焊劑材料等之樹脂絕緣層的基板表面,通常係藉由導體層之形成步驟(銅箔之粗面轉印或鍍銅前之化學處理)而粗面化,提高防焊劑材料對基板之密合性。
由如此之作為經粗面化之基板的絕緣材料使用之以往的樹脂組成物所構成之硬化物中,係有於高頻區域通訊時,無法避免電訊號之延遲或損失的問題。
近年來,由於如此之傳輸損失的問題,基板表面係有成為無粗化或低粗化面之傾向(所謂的低輪廓基板),作為基板材料,係使用含有活性酯之低極性的絕緣材料等之低介電損失材。
Generally speaking, in electronic components such as printed wiring boards, from the viewpoint of heat resistance or electrical insulation, it is widely used as an interlayer insulating material, a solder resist material, or a sealing material. A resin composition containing a curable resin such as an oxygen resin as a main component and further an additive component such as a filler.
In addition, the surface of the substrate on which the resin insulating layer of the solder resist material is formed is generally roughened by the formation step of the conductor layer (coarse transfer of copper foil or chemical treatment before copper plating) to improve the solder resist material alignment. Adhesiveness of the substrate.
The hardened body composed of the conventional resin composition used as the insulating material of the roughened substrate as described above has a problem of delay or loss of electric signals when communicating in a high frequency region.
In recent years, due to such a problem of transmission loss, the substrate surface tends to have no roughening or low-roughening surface (so-called low-profile substrate). As the substrate material, a low-polarity insulating material containing an active ester is used. Low dielectric loss material.

另一方面,對應於伴隨電子零件之輕薄短小化的印刷配線板之高密度化,半導體封裝之小型化或多引腳化係受到實用化,量產化係有進展,最近,係廣為採用使用封裝基板之BGA(球柵陣列封裝)、CSP(晶片尺寸封裝)、WLP(晶圓等級封裝)等,來取代稱為QFP(四面扁平封裝)或SOP(小輪廓封裝)的半導體封裝。
又,伴隨智慧型手機市場的擴大,在要求作為相機功能之高精細、高感度化的數位相機領域中,對於高速/高感度化之要求,係有使用CMOS影像感測器,於其係使用無法粗面化之矽晶圓或玻璃基板,而非印刷配線板。
於該等封裝基板或玻璃基板上,一般而言係形成有絕緣被膜,對絕緣被膜係要求更高的信賴性(HAST耐性、PCT耐性、耐熱性、低翹曲性、熱尺寸安定性等)。
作為賦予高的信賴性之方法,例如一般進行藉由對組成物中填充無機填充劑,來提高熱物性。該無機填充劑中尤特別以二氧化矽,由於可容易地賦予表面處理,且熱膨脹係數(CTE)低,故廣為使用於提高絕緣材料之特性(參照專利文獻1)。
[先前技術文獻]
[專利文獻]
On the other hand, in response to the increase in density of printed wiring boards accompanying the thinner, lighter and shorter electronic components, the miniaturization or multi-pin semiconductor packaging systems have been put into practical use, and mass production has progressed. Recently, they have been widely adopted. BGA (ball grid array package), CSP (wafer-scale package), WLP (wafer-level package), etc. are used to replace the semiconductor package called QFP (Quad Flat Package) or SOP (Small Outline Package).
In addition, with the expansion of the smartphone market, in the field of digital cameras that require high-definition and high-sensitivity as a camera function, the requirements for high-speed / high-sensitivity require the use of CMOS image sensors, which are used in this system. Silicon wafers or glass substrates that cannot be roughened, not printed wiring boards.
In general, an insulating coating is formed on such a package substrate or glass substrate, and higher reliability is required for the insulating coating system (HAST resistance, PCT resistance, heat resistance, low warpage resistance, thermal dimensional stability, etc.) .
As a method for imparting high reliability, for example, it is generally performed to improve the thermophysical properties by filling an inorganic filler into the composition. Among these inorganic fillers, silicon dioxide is particularly used, and since it can be easily given a surface treatment and has a low coefficient of thermal expansion (CTE), it is widely used to improve the characteristics of insulating materials (see Patent Document 1).
[Prior technical literature]
[Patent Literature]

[專利文獻1]日本特開2012-83467號公報(申請專利範圍)[Patent Document 1] Japanese Patent Application Publication No. 2012-83467 (Scope of Patent Application)

[發明所欲解決之課題][Problems to be Solved by the Invention]

但是,填充無機填充劑時,樹脂成分之比例變少,因此難以得到密合性。此處,係將無機填充劑之表面以矽烷偶合劑等處理,提高於硬化性樹脂中之分散性,來提高密合性,但如此之經表面處理的無機填充劑中,由於硬化收縮大,因此難以得到特別是與無粗化之基板或低輪廓基板之密合性。近年來,由於樹脂絕緣層之物性提高,故有填充無機填充劑的傾向,因此係變得難以得到與無粗化之基板或低輪廓基板之密合性。
因而本發明之目的,為提供可得到在維持低CTE等之物性的同時,與無粗化之基板或低輪廓基板之密合性優良的硬化物之硬化性樹脂組成物、具有由該組成物所得到之樹脂層的乾膜、該組成物或該乾膜之樹脂層之硬化物、具有由該硬化物所構成的樹脂硬化層之層合構造體,及具有該硬化物之電子零件。

[用以解決課題之手段]
However, when the inorganic filler is filled, the proportion of the resin component is reduced, and therefore it is difficult to obtain adhesion. Here, the surface of the inorganic filler is treated with a silane coupling agent or the like to improve the dispersibility in the hardening resin to improve the adhesion. However, the surface-treated inorganic filler has a large shrinkage due to hardening. Therefore, it is difficult to obtain adhesion particularly to a substrate without roughening or a low-profile substrate. In recent years, since the physical properties of the resin insulating layer have been improved, it tends to be filled with an inorganic filler, and it has become difficult to obtain adhesion to a substrate without roughening or a low-profile substrate.
Therefore, an object of the present invention is to provide a hardenable resin composition which can obtain a hardened product having excellent adhesion to a substrate without roughening or a low-profile substrate while maintaining physical properties such as low CTE, and the like. The obtained dry film of the resin layer, the composition or the hardened material of the resin layer of the dry film, the laminated structure having the resin hardened layer composed of the hardened material, and the electronic component having the hardened material.

[Means to solve the problem]

本發明者等人欲實現上述目的,著眼於作為無機填充劑使用的二氧化矽之表面處理而進行深入探討。其結果,發明者等人發現,如上述之與無粗化之基板或低輪廓基板之密合性降低的問題係起因於電荷者,藉由將二氧化矽粒子以成為正電荷的方式進行表面處理,可解決上述課題,而完成本發明。In order to achieve the above object, the inventors of the present invention conducted in-depth studies focusing on the surface treatment of silicon dioxide used as an inorganic filler. As a result, the inventors have found that the problem of the decrease in adhesion to a substrate without roughening or a low-profile substrate as described above is caused by a charge, and the surface of the silicon dioxide particles is made to become positively charged. Processing can solve the above problems and complete the present invention.

亦即,本發明之硬化性樹脂組成物,其特徵為含有仄他電位為正的表面處理二氧化矽粒子,與硬化性樹脂。That is, the curable resin composition of the present invention is characterized in that it contains surface-treated silica particles having a positive potential, and a curable resin.

本發明之硬化性樹脂組成物,前述表面處理二氧化矽粒子,較佳為經鋯之水合氧化物、鋅之水合氧化物、鈦之水合氧化物及鋁之水合氧化物中的至少任1種被覆處理之二氧化矽粒子。In the curable resin composition of the present invention, the surface-treated silica particles are preferably at least any one of zirconium hydrated oxide, zinc hydrated oxide, titanium hydrated oxide, and aluminum hydrated oxide. Covered silica particles.

本發明之乾膜,其特徵為具有將前述硬化性樹脂組成物塗佈於薄膜並乾燥而得到之樹脂層。The dry film of the present invention is characterized by having a resin layer obtained by applying the curable resin composition to a film and drying the film.

本發明之硬化物,其特徵為將前述硬化性樹脂組成物,或前述乾膜之樹脂層硬化而得到。The cured product of the present invention is obtained by curing the resin layer of the curable resin composition or the dry film.

本發明之層合構造體,其係含有樹脂硬化層(A),與鄰接於前述樹脂硬化層(A)之樹脂硬化層(B)或基板(C)的構造體,其特徵為前述樹脂硬化層(A),為如請求項4之硬化物,前述樹脂硬化層(B)或基板(C)之仄他電位非為正。The laminated structure of the present invention is a structure comprising a resin hardened layer (A) and a resin hardened layer (B) or a substrate (C) adjacent to the resin hardened layer (A), wherein the resin is hardened. The layer (A) is a hardened product as claimed in claim 4, and the other potential of the resin hardened layer (B) or the substrate (C) is not positive.

本發明之電子零件,其特徵為具有前述硬化物或前述層合構造體。

[發明之效果]
The electronic component of the present invention is characterized by having the hardened material or the laminated structure.

[Effect of the invention]

依照本發明,可提供可得到在維持低CTE等之物性的同時,與無粗化之基板或低輪廓基板之密合性優良的硬化物之硬化性樹脂組成物、具有由該組成物所得到之樹脂層的乾膜、該組成物或該乾膜之樹脂層之硬化物、具有由該硬化物所構成的樹脂硬化層之層合構造體,及具有該硬化物之電子零件。According to the present invention, it is possible to provide a hardenable resin composition capable of obtaining a hardened product having excellent adhesion to a substrate without roughening or a low-profile substrate while maintaining physical properties such as low CTE, and having the obtained composition. A dry film of a resin layer, the composition or a hardened product of the resin layer of the dry film, a laminated structure having a hardened resin layer composed of the hardened material, and an electronic component having the hardened material.

本發明之硬化性樹脂組成物,其特徵為含有仄他電位為正的表面處理二氧化矽粒子,與硬化性樹脂。The curable resin composition of the present invention is characterized in that it contains surface-treated silica particles having a positive potential, and a curable resin.

一般而言,如上述之半導體封裝的各構成材料(低極性之層間絕緣材料或密封材等)或矽晶圓或玻璃基板晶圓之表面係仄他電位為負的情況多,可認為靜電斥力係密合性降低的其一原因。本發明中,藉由以二氧化矽粒子成為正電荷的方式進行表面處理,即使於該等基板上不塗佈接著促進劑(AP:Adhesion Promoter),亦可得到與由低極性材料(Low Df材料)所構成的低輪廓基板或無粗化之基板的良好密合。再者,表面處理二氧化矽粒子之濕潤性,推測係硬化性樹脂組成物中之有機成分容易被覆於帶正電荷的二氧化矽粒子,分散性提高所致之效果。此可認為係庫侖力所致者,但推測硬化性樹脂組成物中含有容易成為鹼性之成分,例如胺系硬化觸媒或鹼性添加劑等時亦有效果。Generally speaking, as the constituent materials of the above-mentioned semiconductor packages (such as low-polar interlayer insulation materials or sealing materials) or the surface of silicon wafers or glass substrate wafers, the other potentials are often negative, and electrostatic repulsion can be considered. One reason for the decrease in adhesion. In the present invention, by performing surface treatment such that the silicon dioxide particles become positively charged, even if an adhesion promoter (AP: Adhesion Promoter) is not coated on these substrates, a low-polarity material (Low Df) can be obtained. Material) Good adhesion to low-profile substrates or substrates without roughening. In addition, the wettability of the surface-treated silica particles is presumed to be an effect due to the organic component in the curable resin composition being easily coated with the positively-charged silica particles and the dispersibility being improved. This is considered to be caused by Coulomb's force, but it is estimated that the curable resin composition is also effective when it contains a component that easily becomes alkaline, such as an amine-based curing catalyst or an alkaline additive.

特別是含有胺系化合物時,與仄他電位為正的表面處理二氧化矽粒子之庫侖力產生作用,提高表面處理二氧化矽粒子對硬化性樹脂組成物之分散性,與無粗化之基板或低輪廓基板的密合性提高。又,即使密合對象之構成材料,為由含有胺系化合物之材料所構成的情況時,亦可得到與密合對象物之密合性優良的硬化物。In particular, when amine-based compounds are contained, the coulomb force of the surface-treated silicon dioxide particles with a positive sundial potential acts to improve the dispersibility of the surface-treated silicon dioxide particles to the hardening resin composition and the substrate without roughening. Or, the adhesion of the low-profile substrate is improved. Further, even when the constituent material to be adhered is composed of a material containing an amine compound, a hardened material having excellent adhesion to the adherend can be obtained.

前述密合性之課題,在填充劑量多時特別顯著,但依照本發明,即使二氧化矽粒子之填充量多時,例如於組成物之固體成分總量中為30質量%以上,與無粗化之基板或低輪廓基板之密合性亦優良。
再者,本發明之硬化性樹脂組成物,不僅於硬化物之狀態與無粗化之基板或低輪廓基板之密合性優良,即使於如乾膜之樹脂層般的乾燥膜或液狀油墨之狀態,與無粗化之基板或低輪廓基板之密合性亦優良。
The above-mentioned problem of adhesiveness is particularly significant when the filling amount is large, but according to the present invention, even when the filling amount of the silicon dioxide particles is large, for example, the total solid content of the composition is 30% by mass or more, and The adhesiveness of a chemically-formed substrate or a low-profile substrate is also excellent.
In addition, the curable resin composition of the present invention is not only excellent in adhesion between a hardened state and a substrate without roughening or a low-profile substrate, but also a dry film or liquid ink such as a resin layer of a dry film. This state is also excellent in adhesion to a substrate without roughening or a low-profile substrate.

以下,說明本發明之硬化性樹脂組成物之各成分。再者,本說明書中,(甲基)丙烯酸酯,係指總稱丙烯酸酯、甲基丙烯酸酯及該等之混合物的用語,對於其他類似之表述亦相同。Hereinafter, each component of the curable resin composition of this invention is demonstrated. In addition, in this specification, (meth) acrylic acid ester means the general term of an acrylic acid ester, a methacrylic acid ester, and these mixtures, and it is the same also about other similar expressions.

[二氧化矽粒子]
本發明之硬化性樹脂組成物,含有仄他電位為正的表面處理二氧化矽粒子。仄他電位係有正、0、負,本說明書中,仄他電位之正/負,係指以大塚電子製之ELSZ-2000ZS測定時為正/負。表面處理二氧化矽粒子之仄他電位,只要係0.1mV以上即可,較佳為1mV以上。上限值並無特別限定,例如為60mV。
[Silicon dioxide particles]
The curable resin composition of the present invention contains surface-treated silicon dioxide particles having a positive potential. Sunda potentials are positive, zero, and negative. In this specification, the positive / negative of the sundat potential refers to the positive / negative when measured by ELSZ-2000ZS made by Otsuka Electronics. The other potential of the surface-treated silicon dioxide particles may be 0.1 mV or more, and preferably 1 mV or more. The upper limit value is not particularly limited, and is, for example, 60 mV.

欲表面處理之二氧化矽粒子(亦即,表面處理前之二氧化矽粒子)並無特別限定,只要使用可作為無機填充劑使用的公知慣用之二氧化矽粒子即可。欲表面處理之二氧化矽粒子的形狀,可列舉球狀二氧化矽、不定形二氧化矽、結晶性二氧化矽等,較佳為球狀二氧化矽。又,欲表面處理之二氧化矽粒子,可列舉熔融二氧化矽、經溶膠凝膠法合成之二氧化矽等。又,二氧化矽粒子較佳為α射線量之產生量少的合成二氧化矽。The silicon dioxide particles to be surface-treated (that is, the silicon dioxide particles before the surface treatment) are not particularly limited, as long as the well-known and commonly used silicon dioxide particles that can be used as an inorganic filler are used. The shape of the silica particles to be surface-treated includes spherical silica, amorphous silica, crystalline silica, and the like, and spherical silica is preferred. Further, the silica particles to be surface-treated include fused silica and silica synthesized by a sol-gel method. The silicon dioxide particles are preferably synthetic silicon dioxide having a small amount of α-ray generation.

只要仄他電位成為正,則表面處理可使用各種金屬化合物,並無特殊限定,較佳為經鋯之水合氧化物、鋅之水合氧化物、鈦之水合氧化物及鋁之水合氧化物中的至少任1種被覆處理之二氧化矽粒子。又,感光性樹脂組成物的情況時,可藉由以如此之金屬的水合氧化物被覆,而高感度化。推測其係成為觸媒而促進感光。As long as the sundala potential becomes positive, various metal compounds can be used for the surface treatment, and there is no particular limitation. Preferable examples are zirconium hydrated oxide, zinc hydrated oxide, titanium hydrated oxide, and aluminum hydrated oxide. At least one kind of coated silica particles. In the case of a photosensitive resin composition, it is possible to increase the sensitivity by coating with a hydrated oxide of such a metal. It is presumed to act as a catalyst to promote photosensitivity.

以鋯之水合氧化物被覆二氧化矽粒子之方法,例如可藉由對二氧化矽粒子之水漿體添加氧氯化鋯等之水溶性鋯化合物之水溶液後,以鹼或酸中和,於二氧化矽粒子之表面使鋯之水合氧化物沈積。水漿體中之二氧化矽粒子的量並無特殊限制,通常係以30~300g/l為適當。鹼係使用氫氧化鈉、氫氧化鉀、氨等,所添加之量係為上述水溶性鋯化合物可形成鋯之水合氧化物之量,pH較佳為7±0.5。The method of coating the silica particles with a hydrated oxide of zirconium can be performed by adding an aqueous solution of a water-soluble zirconium compound such as zirconium oxychloride to the aqueous slurry of the silica particles, and then neutralizing it with an alkali or acid. The surface of the silicon dioxide particles deposits a hydrated oxide of zirconium. The amount of silicon dioxide particles in the aqueous slurry is not particularly limited, and generally 30 to 300 g / l is appropriate. The alkali system uses sodium hydroxide, potassium hydroxide, ammonia, etc., and the added amount is the amount of the hydrated oxide that can form zirconium by the water-soluble zirconium compound, and the pH is preferably 7 ± 0.5.

以鋅之水合氧化物被覆二氧化矽粒子之方法,例如可藉由對二氧化矽粒子之水漿體添加硫酸鋅等之水溶性鋅化合物之水溶液後,以鹼或酸中和,於二氧化矽粒子之表面使鋅之水合氧化物沈積。水漿體中之二氧化矽粒子的量並無特殊限制,通常係以30~300g/l為適當。鹼係氫氧化鈉、氫氧化鉀、氨,所添加之量係為上述水溶性鋅化合物可形成鋅之水合氧化物之量,pH較佳為7±0.5。A method for coating silica particles with a hydrated oxide of zinc, for example, by adding an aqueous solution of a water-soluble zinc compound such as zinc sulfate to an aqueous slurry of silica particles, and then neutralizing it with an alkali or an acid, The surface of the silicon particles deposits hydrated oxides of zinc. The amount of silicon dioxide particles in the aqueous slurry is not particularly limited, and generally 30 to 300 g / l is appropriate. Alkali-based sodium hydroxide, potassium hydroxide, and ammonia are added in an amount that is the amount of the hydrated oxide of zinc that the water-soluble zinc compound can form, and the pH is preferably 7 ± 0.5.

以鈦之水合氧化物被覆二氧化矽粒子之方法,例如可藉由對二氧化矽粒子之水漿體添加硫酸氧鈦等之水溶性鈦之水溶液後,以鹼或酸中和,於二氧化矽粒子之表面使鈦之水合氧化物沈積。水漿體中之二氧化矽粒子的量並無特殊限制,通常係以30~300g/l為適當。酸係使用鹽酸、硝酸等,所添加之量係為上述水溶性鈦化合物可形成鈦之水合氧化物之量,pH較佳為7±0.5。A method for coating silica particles with a hydrated oxide of titanium, for example, by adding an aqueous solution of a water-soluble titanium such as titanyl sulfate to an aqueous slurry of silica particles, and then neutralizing it with an alkali or an acid, The surface of the silicon particles deposits hydrated oxides of titanium. The amount of silicon dioxide particles in the aqueous slurry is not particularly limited, and generally 30 to 300 g / l is appropriate. For the acid system, hydrochloric acid, nitric acid, and the like are used, and the amount added is the amount of the hydrated oxide of titanium that can be formed by the water-soluble titanium compound, and the pH is preferably 7 ± 0.5.

以鋁之水合氧化物被覆二氧化矽粒子之方法,例如可藉由對二氧化矽粒子之水漿體添加鋁酸鈉等之水溶性鋁化合物之水溶液後,以鹼或酸中和,於二氧化矽粒子之表面使鋁之水合氧化物沈積。水漿體中之二氧化矽粒子的量並無特殊限制,通常係以30~300g/l為適當。鹼係使用氫氧化鈉、氫氧化鉀、氨;酸係使用鹽酸、硝酸等,所添加之量係為上述水溶性鋁化合物可形成鋁之水合氧化物之量,pH較佳為7±0.5。The method of coating silica particles with a hydrated oxide of aluminum can be performed by adding an aqueous solution of a water-soluble aluminum compound such as sodium aluminate to an aqueous slurry of silica particles, and then neutralizing the mixture with alkali or acid. The surface of the silicon oxide particles deposits a hydrated oxide of aluminum. The amount of silicon dioxide particles in the aqueous slurry is not particularly limited, and generally 30 to 300 g / l is appropriate. Sodium hydroxide, potassium hydroxide, ammonia is used as the alkali; hydrochloric acid, nitric acid, etc. are used as the acid; the added amount is the amount of the hydrated oxide of aluminum that the water-soluble aluminum compound can form, and the pH is preferably 7 ± 0.5.

以前述金屬之被覆,亦即,以鋁之水合氧化物、鋯之水合氧化物、鋅之水合氧化物及鈦之水合氧化物中的至少任1種之被覆,相對於二氧化矽粒子100質量份而言,較佳將金屬之水合氧化物較佳為以1~40質量份、更佳為以3~20質量份被覆。藉由以1質量份以上進行被覆,於硬化性樹脂中之二氧化矽粒子之分散性優良,於HAST處理前後密合性不易降低。Coating with the foregoing metal, that is, coating with at least any one of aluminum hydrated oxide, zirconium hydrated oxide, zinc hydrated oxide, and titanium hydrated oxide, with respect to 100 mass of silicon dioxide particles In terms of parts, the hydrated oxide of the metal is preferably coated with 1 to 40 parts by mass, more preferably 3 to 20 parts by mass. By coating with 1 part by mass or more, the dispersibility of the silica particles in the curable resin is excellent, and the adhesion is not easily reduced before and after the HAST treatment.

由於進一步HAST處理後之密合性亦優良,故前述表面處理二氧化矽粒子,較佳為經金屬之水合氧化物被覆處理之二氧化矽粒子。又,若為經金屬之水合氧化物被覆處理之二氧化矽粒子,則與硬化性樹脂中之樹脂的親和性提高,分散性成為良好,可減低粗粒或凝集,特別是即使使用精細圖型之電路基板時,絕緣信賴性亦優良。Since the adhesion after further HAST treatment is also excellent, the aforementioned surface-treated silica particles are preferably silica particles treated with a metal hydrated oxide coating. In addition, if it is a silica particle coated with a metal hydrated oxide, the affinity with the resin in the hardening resin is improved, the dispersibility becomes good, and coarse particles or agglomeration can be reduced, especially if a fine pattern is used. In the case of circuit boards, the insulation reliability is also excellent.

又,二氧化矽量多時,與無錨定效應的無粗化或低粗化面之基板(所謂低輪廓基板)或由低極性之材料所構成的基板之密合性變差,進而會產生HAST處理後密合性容易降低的問題,但本發明中,藉由填充經矽之水合氧化物及金屬之水合氧化物被覆處理的二氧化矽粒子,作為前述表面處理二氧化矽粒子,即使為如上述之基板,亦可得到HAST處理後密合性亦優良的硬化物。In addition, when the amount of silicon dioxide is large, the adhesion with a substrate having no roughening or low-roughening surface without anchoring effect (so-called low-profile substrate) or a substrate made of a low-polarity material is deteriorated, and further, There is a problem that the adhesiveness is easily reduced after HAST treatment. However, in the present invention, as the aforementioned surface-treated silicon dioxide particles, silicon dioxide particles coated with a hydrated oxide of silicon and a hydrated oxide of a metal are filled as the aforementioned surface-treated silicon dioxide particles. For the substrate as described above, a cured product having excellent adhesion after HAST treatment can also be obtained.

前述表面處理二氧化矽粒子,較佳為至少經金屬之水合氧化物被覆處理之二氧化矽粒子。又,前述表面處理二氧化矽粒子,較佳為依序具有由矽之水合氧化物所構成之被覆層,與由鋯等之金屬之水合氧化物所構成之被覆層。藉由如此地進行被覆,可得到於硬化性樹脂中之二氧化矽粒子的分散性優良,HAST處理後密合性不易降低之硬化物。The surface-treated silica particles are preferably silica particles coated with at least a metal hydrated oxide. The surface-treated silicon dioxide particles preferably have a coating layer composed of a hydrated oxide of silicon and a coating layer composed of a hydrated oxide of a metal such as zirconium in this order. By coating in this manner, a hardened product having excellent dispersibility of the silica particles in the curable resin and having a hardly reduced adhesiveness after HAST treatment can be obtained.

以矽之水合氧化物被覆二氧化矽粒子之方法,例如可藉由對二氧化矽之水漿體添加矽酸鹼水溶液,於二氧化矽之表面生成矽酸,接著藉由對漿體添加無機酸,將矽酸分解為矽之水合氧化物,於二氧化矽粒子之表面使矽之水合氧化物沈積。水漿體中之二氧化矽粒子的量並無特殊限制,通常係以70~150g/l為適當。接著,如上述之對水漿體添加的矽酸鹼,具體而言係使用矽酸鈉、矽酸鉀等,其濃度,通常以二氧化矽換算係l0~200g/l。無機酸可使用鹽酸、硝酸、硫酸等。A method of coating silicon dioxide particles with a hydrated oxide of silicon, for example, by adding an aqueous solution of a silicic acid alkali to an aqueous slurry of silicon dioxide to generate silicic acid on the surface of the silicon dioxide, and then adding an inorganic substance to the slurry Acid, which decomposes silicic acid into hydrated oxides of silicon, and deposits hydrated oxides of silicon on the surface of silicon dioxide particles. The amount of silica particles in the water slurry is not particularly limited, and generally 70 to 150 g / l is appropriate. Next, as described above, the alkali silicate added to the aqueous slurry is specifically sodium silicate, potassium silicate, etc., and its concentration is usually 10 to 200 g / l in terms of silicon dioxide conversion. Examples of the inorganic acid include hydrochloric acid, nitric acid, and sulfuric acid.

以矽之水合氧化物的被覆,相對於二氧化矽粒子100質量份而言,較佳將矽之水合氧化物以較佳為60~99質量份、更佳為80~99質量份進行被覆。For coating with a hydrated oxide of silicon, it is preferable to cover the hydrated oxide of silicon with 60 to 99 parts by mass, more preferably 80 to 99 parts by mass, relative to 100 parts by mass of the silicon dioxide particles.

又,前述具有金屬水合氧化物之表面處理二氧化矽粒子,亦可於表面具有硬化性反應基。填充劑於表面具有硬化性反應基時,可使填充劑與硬化性樹脂之鍵結堅固,但填充劑經高填充時,填充劑粒子之比表面積多,另一方面樹脂含量變少,因此容易產生與樹脂之緊密性不充分的部分,特別是於HAST(高溫高濕)環境下成為吸濕要因,硬化性反應基的部分進行水解之可能性增高。因此,HAST後之密合性不良,容易產生剝離。如此的濕潤性不良,當填充劑之粒徑小時,填充劑之比表面積大,被覆之樹脂量必需多,故特別顯著。但是,本發明中,即使前述表面處理二氧化矽粒子於表面具有硬化性反應基,於HAST環境下亦確認到無水解所致的密合性降低。亦即HAST處理後亦可維持與硬化性樹脂之濕潤性,因此可得到密合性不易降低之優良效果,進一步地,亦可改善硬化性反應基所得硬化物之物性,例如低CTE化。The surface-treated silicon dioxide particles having a metal hydrated oxide may have a hardening reactive group on the surface. When the filler has a hardening reactive group on the surface, the bond between the filler and the hardening resin can be strengthened, but when the filler is highly filled, the specific surface area of the filler particles is large, and on the other hand, the resin content is reduced, so it is easy A part having insufficient tightness with the resin is generated, and in particular, it becomes a cause of moisture absorption in a HAST (high temperature and high humidity) environment, and the part of the hardening reactive group is likely to be hydrolyzed. Therefore, the adhesion after HAST is poor, and peeling is likely to occur. Such a wettability is notable. When the particle diameter of the filler is small, the specific surface area of the filler is large, and the amount of resin to be coated must be large, which is particularly significant. However, in the present invention, even if the surface-treated silica particles have a hardenable reactive group on the surface, it is confirmed that the adhesion is not reduced by hydrolysis in a HAST environment. That is, the wettability with the curable resin can be maintained after the HAST treatment, so that an excellent effect that the adhesion is not easily reduced can be obtained, and further, the physical properties of the cured product obtained by the curable reactive group can be improved, such as low CTE.

此處,硬化性反應基,只要係與摻合於硬化性樹脂組成物的成分(例如硬化性樹脂或鹼可溶性樹脂)進行硬化反應之基,則無特殊限定,可為光硬化性反應基亦可為熱硬化性反應基。光硬化性反應基可列舉甲基丙烯醯基、丙烯醯基、乙烯基、苯乙烯基等,熱硬化性反應基可列舉環氧基、胺基、羥基、羧基、異氰酸酯基、亞胺基、氧雜環丁烷基、巰基、甲氧基甲基、甲氧基乙基、乙氧基甲基、乙氧基乙基、噁唑啉基等。對前述表面處理二氧化矽粒子之表面導入硬化性反應基的方法並無特殊限定,只要使用公知慣用之方法導入即可,只要以具有硬化性反應基之表面處理劑,例如,具有硬化性反應基作為有機基之偶合劑等來處理前述表面處理二氧化矽粒子之表面即可。偶合劑可使用矽烷偶合劑、鈦偶合劑、鋯偶合劑、鋁偶合劑等。其中尤以矽烷偶合劑為佳。藉由以矽烷偶合劑進行處理,搖變性降低,因此流動性提高,對微細間距之電路圖型的埋入性提高。Here, the curable reactive group is not particularly limited as long as it is a group that undergoes a curing reaction with a component (for example, a curable resin or an alkali-soluble resin) incorporated in the curable resin composition, and may be a photocurable reactive group. It may be a thermosetting reactive group. Examples of the photocurable reactive group include methacrylfluorenyl, acrylfluorenyl, vinyl, and styryl groups. Examples of the thermosetting reactive group include epoxy groups, amino groups, hydroxyl groups, carboxyl groups, isocyanate groups, imine groups, and the like. Oxetane, mercapto, methoxymethyl, methoxyethyl, ethoxymethyl, ethoxyethyl, oxazoline and the like. The method for introducing a hardening reactive group on the surface of the aforementioned surface-treated silica particles is not particularly limited, and it may be introduced using a known and commonly used method, as long as a surface treating agent having a hardening reactive group, for example, a hardening reaction As the coupling agent or the like of the organic group, it is sufficient to treat the surface of the aforementioned surface-treated silica particles. As the coupling agent, a silane coupling agent, a titanium coupling agent, a zirconium coupling agent, an aluminum coupling agent, or the like can be used. Among them, silane coupling agents are particularly preferred. By processing with a silane coupling agent, the shake property is reduced, so the fluidity is improved, and the embedding property to the fine-pitch circuit pattern is improved.

前述表面處理二氧化矽粒子於表面所具有的硬化性反應基,本發明之硬化性樹脂組成物含有光硬化性樹脂時,較佳為光硬化性反應基,含有熱硬化性樹脂時,較佳為熱硬化性反應基。When the surface-treated silicon dioxide particles have a curable reactive group on the surface, when the curable resin composition of the present invention contains a photo-curable resin, a photo-curable reactive group is preferred, and when a thermo-curable resin is contained, it is preferred. It is a thermosetting reactive group.

前述表面處理二氧化矽粒子之平均粒子徑,例如較佳為2μm以下。又,較佳為小於曝光波長、更佳為0.4μm以下。又,就抑制暈光之觀點,較佳為0.25μm以上。此處,本說明書中,二氧化矽粒子之平均粒子徑,不僅為一次粒子之粒徑,係亦包含二次粒子(凝集體)之粒徑的平均粒子徑(D50),其係藉由雷射繞射法所測定之D50之值。又,前述表面處理二氧化矽粒子之最大粒子徑(藉由雷射繞射法所測定之D100),較佳為5μm以下、更佳為2μm以下。雷射繞射法之測定裝置,可列舉日機裝公司製之Microtrac MT3300EXII。藉由為5μm以下,具有微細間距之電路圖型的基板上之絕緣信賴性、小直徑圖型之形成性(解像性)、對具有微細間距之電路圖型的基板之埋入性優良。The average particle diameter of the surface-treated silica particles is preferably, for example, 2 μm or less. The wavelength is preferably smaller than the exposure wavelength, and more preferably 0.4 μm or less. From the viewpoint of suppressing halation, it is preferably 0.25 μm or more. Here, in this specification, the average particle diameter of the silicon dioxide particles is not only the particle diameter of the primary particles, but also the average particle diameter (D50) of the particle diameter of the secondary particles (agglomerates), which is determined by lightning. D50 value measured by diffraction method. The maximum particle diameter of the surface-treated silica particles (D100 measured by the laser diffraction method) is preferably 5 μm or less, and more preferably 2 μm or less. As a measuring device for the laser diffraction method, Microtrac MT3300EXII manufactured by Nikkiso Co., Ltd. can be cited. When the thickness is 5 μm or less, the insulation reliability on a substrate having a fine-pitch circuit pattern, the formability (resolution) of a small-diameter pattern, and the embedding property on a substrate having a fine-pitch circuit pattern are excellent.

前述表面處理二氧化矽粒子亦可調整平均粒子徑,例如較佳以珠磨機或噴射磨機進行預備分散。又,前述表面處理二氧化矽粒子,較佳以漿體狀態摻合,藉由以漿體狀態摻合,容易高分散化,防止凝集,操作變得容易。The average particle diameter of the surface-treated silica particles may also be adjusted. For example, a bead mill or a jet mill is preferably used for preliminary dispersion. In addition, the surface-treated silica particles are preferably blended in a slurry state. By blending in a slurry state, it is easy to highly disperse, prevent aggregation, and facilitate handling.

前述表面處理二氧化矽粒子,可1種單獨或組合2種以上使用。前述表面處理二氧化矽粒子之摻合量,於組成物之固體成分總量中,較佳為10質量%以上、更佳為20質量%以上、又更佳為30質量%以上。如上所述,本發明中,即使二氧化矽量多,與低極性之絕緣材料或晶圓的密合性與分散性亦優良,故能夠以硬化物之物性提高,例如低CTE化、耐翹曲性、耐熱性為目的,來將二氧化矽高填充。The surface-treated silica particles may be used singly or in combination of two or more kinds. The blending amount of the surface-treated silica particles is preferably 10% by mass or more, more preferably 20% by mass or more, and even more preferably 30% by mass or more of the total solid content of the composition. As described above, in the present invention, even if the amount of silicon dioxide is large, the adhesiveness and dispersibility with low-polarity insulating materials or wafers are also excellent. Therefore, the physical properties of the hardened material can be improved, such as low CTE and resistance to warpage. For the purpose of flexibility and heat resistance, silicon dioxide is highly filled.

[硬化性樹脂]
本發明之硬化性樹脂組成物,含有硬化性樹脂。本發明中所用的硬化性樹脂,為熱硬化性樹脂或光硬化性樹脂,亦可為此等之混合物。硬化性樹脂之摻合量,例如,於組成物之固體成分總量中,為1~50質量%。
[Curable resin]
The curable resin composition of the present invention contains a curable resin. The curable resin used in the present invention is a thermosetting resin or a photocurable resin, and a mixture thereof may also be used. The blending amount of the curable resin is, for example, 1 to 50% by mass based on the total solid content of the composition.

(熱硬化性樹脂)
本發明之硬化性樹脂組成物,含有熱硬化性樹脂時,硬化物之耐熱性提高,又,與基底之密合性提高。熱硬化性樹脂,可使用異氰酸酯化合物、封端異氰酸酯化合物、胺基樹脂、苯并噁嗪樹脂、碳二亞胺樹脂、環碳酸酯化合物、環氧化合物、多官能氧雜環丁烷化合物、環硫樹脂等之公知慣用之熱硬化性樹脂。此等之中尤以環氧化合物、多官能氧雜環丁烷化合物、分子內具有2個以上之硫醚基的化合物亦即環硫樹脂為佳;更佳為環氧化合物。熱硬化性樹脂,可1種單獨或組合2種以上使用。
(Thermosetting resin)
When the curable resin composition of the present invention contains a thermosetting resin, the heat resistance of the cured product is improved, and the adhesion to the substrate is improved. The thermosetting resin can be an isocyanate compound, a blocked isocyanate compound, an amine resin, a benzoxazine resin, a carbodiimide resin, a cyclic carbonate compound, an epoxy compound, a polyfunctional oxetane compound, a ring Known and commonly used thermosetting resins such as sulfur resins. Among these, epoxy compounds, polyfunctional oxetane compounds, and compounds having two or more thioether groups in the molecule, that is, episulfide resins are preferred; epoxy compounds are more preferred. The thermosetting resin can be used singly or in combination of two or more kinds.

上述環氧化合物,為具有環氧基之化合物,以往公知者均可使用。可列舉分子中具有複數個環氧基之多官能環氧化合物等。再者,亦可為氫化之環氧化合物。The above-mentioned epoxy compound is a compound having an epoxy group, and any of conventionally known ones can be used. Examples thereof include polyfunctional epoxy compounds having a plurality of epoxy groups in a molecule. Furthermore, it may be a hydrogenated epoxy compound.

多官能環氧化合物,可列舉環氧化植物油;雙酚A型環氧樹脂;氫醌型環氧樹脂;雙酚型環氧樹脂;硫醚型環氧樹脂;溴化環氧樹脂;酚醛清漆型環氧樹脂;聯苯酚酚醛清漆型環氧樹脂;雙酚F型環氧樹脂;氫化雙酚A型環氧樹脂;縮水甘油胺型環氧樹脂;乙內醯脲型環氧樹脂;脂環式環氧樹脂;三羥基苯基甲烷型環氧樹脂;聯二甲苯酚型或聯苯酚型環氧樹脂或該等之混合物;雙酚S型環氧樹脂;雙酚A酚醛清漆型環氧樹脂;四苯酚基乙烷型環氧樹脂;雜環式環氧樹脂;鄰苯二甲酸二縮水甘油酯樹脂;四縮水甘油基二甲苯醯基乙烷樹脂;含萘基之環氧樹脂;具有二環戊二烯骨架之環氧樹脂;甲基丙烯酸縮水甘油酯共聚合系環氧樹脂;環己基馬來醯亞胺與甲基丙烯酸縮水甘油酯之共聚合環氧樹脂;環氧基改質之聚丁二烯橡膠衍生物;CTBN改質環氧樹脂等,但不限於此等。此等之環氧樹脂,可1種單獨或組合2種以上使用。此等之中尤特別以酚醛清漆型環氧樹脂、雙酚型環氧樹脂、聯二甲苯酚型環氧樹脂、聯苯酚型環氧樹脂、聯苯酚酚醛清漆型環氧樹脂、萘型環氧樹脂或該等之混合物為佳。Multifunctional epoxy compounds include epoxidized vegetable oils; bisphenol A epoxy resin; hydroquinone epoxy resin; bisphenol epoxy resin; thioether epoxy resin; brominated epoxy resin; novolac type Epoxy resin; biphenol novolac epoxy resin; bisphenol F epoxy resin; hydrogenated bisphenol A epoxy resin; glycidylamine epoxy resin; hydantoin type epoxy resin; alicyclic Epoxy resin; trihydroxyphenylmethane type epoxy resin; bixylenol type or biphenol type epoxy resin or a mixture thereof; bisphenol S type epoxy resin; bisphenol A novolac type epoxy resin; Tetraphenol-based ethane type epoxy resin; heterocyclic epoxy resin; diglycidyl phthalate resin; tetraglycidyl xylyl fluorenyl ethane resin; naphthyl-containing epoxy resin; bicyclic Epoxy resin with pentadiene skeleton; glycidyl methacrylate copolymerized epoxy resin; copolymerized epoxy resin of cyclohexylmaleimide and glycidyl methacrylate; epoxy modified polymer Butadiene rubber derivatives; CTBN modified epoxy resin, etc., but Limited to these. These epoxy resins can be used alone or in combination of two or more. Among these, novolac-type epoxy resin, bisphenol-type epoxy resin, bixylenol-type epoxy resin, biphenol-type epoxy resin, biphenol novolac-type epoxy resin, and naphthalene-type epoxy resin are particularly used. Resin or a mixture of these is preferred.

多官能氧雜環丁烷化合物,例如可列舉雙[(3-甲基-3-氧雜環丁烷基甲氧基)甲基]醚、雙[(3-乙基-3-氧雜環丁烷基甲氧基)甲基]醚、1,4-雙[(3-甲基-3-氧雜環丁烷基甲氧基)甲基]苯、1,4-雙[(3-乙基-3-氧雜環丁烷基甲氧基)甲基]苯、丙烯酸(3-甲基-3-氧雜環丁烷基)甲酯、丙烯酸(3-乙基-3-氧雜環丁烷基)甲酯、甲基丙烯酸(3-甲基-3-氧雜環丁烷基)甲酯、甲基丙烯酸(3-乙基-3-氧雜環丁烷基)甲酯或該等之寡聚物或共聚物等之多官能氧雜環丁烷類,此外可列舉氧雜環丁醇與酚醛清漆樹脂、聚(p-羥基苯乙烯)、cardo型雙酚類、杯芳烴類、間苯二酚杯芳烴類,或倍半矽氧烷等之具有羥基之樹脂的醚化物等。其他亦可列舉具有氧雜環丁烷環之不飽和單體與(甲基)丙烯酸烷酯的共聚物等。Examples of the polyfunctional oxetane compound include bis [(3-methyl-3-oxetanylmethoxy) methyl] ether and bis [(3-ethyl-3-oxetan Butylmethoxy) methyl] ether, 1,4-bis [(3-methyl-3-oxetanylmethoxy) methyl] benzene, 1,4-bis [(3- Ethyl-3-oxetanylmethoxy) methyl] benzene, (3-methyl-3-oxetanyl) acrylate, methyl (3-ethyl-3-oxetan) Cyclobutane) methyl ester, (3-methyl-3-oxetanyl) methacrylate, (3-ethyl-3-oxetanyl) methacrylate, or Polyfunctional oxetanes such as these oligomers and copolymers include oxetanol and novolac resins, poly (p-hydroxystyrene), cardo-type bisphenols, and calixarene Type, resorcinol calixarene, or etherification of resins having hydroxyl groups such as silsesquioxane. Other examples include copolymers of unsaturated monomers having an oxetane ring and alkyl (meth) acrylates.

分子中具有複數個環狀硫醚基之化合物,可列舉雙酚A型環硫樹脂等。又,亦可使用利用同樣的合成方法,將酚醛清漆型環氧樹脂之環氧基的氧原子取代為硫原子的環硫樹脂等。Examples of the compound having a plurality of cyclic sulfide groups in the molecule include a bisphenol A type episulfide resin. In addition, an episulfide resin or the like in which an oxygen atom of an epoxy group of a novolac epoxy resin is replaced with a sulfur atom by a similar synthetic method can also be used.

三聚氰胺衍生物、苯并胍胺衍生物等之胺基樹脂,可列舉羥甲基三聚氰胺化合物、羥甲基苯并胍胺化合物、羥甲基乙炔脲化合物及羥甲基脲化合物等。Examples of the amine-based resin such as a melamine derivative and a benzoguanamine derivative include a methylolmelamine compound, a methylolbenzoguanamine compound, a methylolacetylene urea compound, and a methylolurea compound.

可摻合聚異氰酸酯化合物作為異氰酸酯化合物。聚異氰酸酯化合物,可列舉4,4’-二苯基甲烷二異氰酸酯、2,4-甲苯二異氰酸酯、2,6-甲苯二異氰酸酯、萘-1,5-二異氰酸酯、o-伸二甲苯二異氰酸酯、m-伸二甲苯二異氰酸酯及2,4-甲苯異氰酸酯二聚物等之芳香族聚異氰酸酯;四亞甲基二異氰酸酯、六亞甲基二異氰酸酯、亞甲基二異氰酸酯、三甲基六亞甲基二異氰酸酯、4,4-亞甲基雙(環己基異氰酸酯)及異佛酮二異氰酸酯等之脂肪族聚異氰酸酯;雙環庚烷三異氰酸酯等之脂環式聚異氰酸酯;以及先前所列舉的異氰酸酯化合物之加合體、縮二脲體及異三聚氰酸酯體等。A polyisocyanate compound may be blended as the isocyanate compound. Examples of the polyisocyanate compound include 4,4'-diphenylmethane diisocyanate, 2,4-toluene diisocyanate, 2,6-toluene diisocyanate, naphthalene-1,5-diisocyanate, o-xylene diisocyanate, Aromatic polyisocyanates such as m-xylene diisocyanate and 2,4-toluene isocyanate dimer; tetramethylene diisocyanate, hexamethylene diisocyanate, methylene diisocyanate, trimethylhexamethylene Aliphatic polyisocyanates such as diisocyanate, 4,4-methylenebis (cyclohexyl isocyanate) and isophorone diisocyanate; alicyclic polyisocyanates such as dicycloheptane triisocyanate; and the isocyanate compounds listed previously Adducts, biurets and isocyanurates.

封端異氰酸酯化合物,可使用異氰酸酯化合物與異氰酸酯封端劑之加成反應生成物。可與異氰酸酯封端劑反應之異氰酸酯化合物,例如可列舉上述之聚異氰酸酯化合物等。異氰酸酯封端劑,例如可列舉酚系封端劑;內醯胺系封端劑;活性亞甲基系封端劑;醇系封端劑;肟系封端劑;硫醇系封端劑;酸醯胺系封端劑;醯亞胺系封端劑;胺系封端劑;咪唑系封端劑;亞胺系封端劑等。As the blocked isocyanate compound, an addition reaction product of an isocyanate compound and an isocyanate blocking agent can be used. Examples of the isocyanate compound capable of reacting with the isocyanate blocking agent include the aforementioned polyisocyanate compounds. Examples of isocyanate blocking agents include phenol-based blocking agents; lactam-based blocking agents; active methylene-based blocking agents; alcohol-based blocking agents; oxime-based blocking agents; thiol-based blocking agents; Acid amine-based end-capping agent; fluorene imine-based end-capping agent; amine-based end-capping agent; imidazole-based end-capping agent; imine-based end-capping agent, etc.

(光硬化性樹脂)
光硬化性樹脂,只要係藉由活性能量線照射硬化而顯示電絕緣性的樹脂即可,較佳使用分子中具有1個以上之乙烯性不飽和基的化合物。具有乙烯性不飽和基的化合物,可使用公知慣用之感光性單體的光聚合性寡聚物、光聚合性乙烯基單體等,亦可為自由基聚合性之單體或陽離子聚合性之單體。又,光硬化性樹脂,可使用如後述之具有乙烯性不飽和基的含羧基之樹脂等之聚合物。光硬化性樹脂,可1種單獨或組合2種以上使用。
(Photocurable resin)
The photocurable resin may be a resin that exhibits electrical insulation properties by being hardened by irradiation with active energy rays, and a compound having one or more ethylenically unsaturated groups in the molecule is preferably used. As the compound having an ethylenically unsaturated group, a photopolymerizable oligomer, a photopolymerizable vinyl monomer, and the like, which are known and commonly used photosensitive monomers, may be used, and a radical polymerizable monomer or a cationic polymerizable monomer. As the photocurable resin, a polymer such as a carboxyl group-containing resin having an ethylenically unsaturated group as described later can be used. The photocurable resin can be used alone or in combination of two or more.

前述感光性單體,可使用分子中具有1個以上之(甲基)丙烯醯基的於室溫為液體、固體或半固體之感光性(甲基)丙烯酸酯化合物。於室溫為液狀之感光性(甲基)丙烯酸酯化合物,以提高組成物之光反應性為目的,此外,亦扮演將組成物調整為適於各種塗佈方法的黏度,或幫助對鹼水溶液之溶解性的角色。As the photosensitive monomer, a photosensitive (meth) acrylate compound having one or more (meth) acrylfluorenyl groups in a molecule and which is liquid, solid, or semi-solid at room temperature can be used. The photosensitive (meth) acrylate compound is a liquid at room temperature for the purpose of improving the photoreactivity of the composition. In addition, it also plays a role in adjusting the composition to a viscosity suitable for various coating methods, or to help alkali The role of solubility in aqueous solutions.

光聚合性寡聚物,可列舉不飽和聚酯系寡聚物、(甲基)丙烯酸酯系寡聚物等。(甲基)丙烯酸酯系寡聚物,可列舉酚酚醛清漆(甲基)丙烯酸環氧酯、甲酚酚醛清漆(甲基)丙烯酸環氧酯、雙酚型(甲基)丙烯酸環氧酯等之(甲基)丙烯酸環氧酯;胺基甲酸酯(甲基)丙烯酸酯、環氧基胺基甲酸酯(甲基)丙烯酸酯、聚酯(甲基)丙烯酸酯、聚醚(甲基)丙烯酸酯、聚丁二烯改質(甲基)丙烯酸酯等。Examples of the photopolymerizable oligomer include unsaturated polyester-based oligomers and (meth) acrylate-based oligomers. (Meth) acrylate-based oligomers include phenol novolak (meth) acrylate epoxy ester, cresol novolak (meth) acrylate epoxy ester, bisphenol type (meth) acrylate epoxy ester, and the like (Meth) acrylic epoxy esters; urethane (meth) acrylates, epoxy urethane (meth) acrylates, polyester (meth) acrylates, polyethers (methyl ether) Group) acrylate, polybutadiene modified (meth) acrylate, and the like.

光聚合性乙烯基單體,可列舉公知慣用者,例如苯乙烯、氯苯乙烯、α-甲基苯乙烯等之苯乙烯衍生物;乙酸乙烯酯、丁酸乙烯酯或苯甲酸乙烯酯等之乙烯酯類;乙烯基異丁基醚、乙烯基-n-丁基醚、乙烯基-t-丁基醚、乙烯基-n-戊基醚、乙烯基異戊基醚、乙烯基-n-十八烷基醚、乙烯基環己基醚、乙二醇單丁基乙烯基醚、三乙二醇單甲基乙烯基醚等之乙烯基醚類;丙烯醯胺、甲基丙烯醯胺、N-羥基甲基丙烯醯胺、N-羥基甲基甲基丙烯醯胺、N-甲氧基甲基丙烯醯胺、N-乙氧基甲基丙烯醯胺、N-丁氧基甲基丙烯醯胺等之(甲基)丙烯醯胺類;異三聚氰酸三烯丙酯、鄰苯二甲酸二烯丙酯、間苯二甲酸二烯丙酯等之烯丙基化合物;(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸月桂酯、(甲基)丙烯酸四氫呋喃甲酯、(甲基)丙烯酸異莰酯、(甲基)丙烯酸苯酯、(甲基)丙烯酸苯氧基乙酯等之(甲基)丙烯酸之酯類;(甲基)丙烯酸羥基乙酯、(甲基)丙烯酸羥基丙酯、季戊四醇三(甲基)丙烯酸酯等之(甲基)丙烯酸羥基烷酯類;(甲基)丙烯酸甲氧基乙酯、(甲基)丙烯酸乙氧基乙酯等之烷氧基烷二醇單(甲基)丙烯酸酯類;乙二醇二(甲基)丙烯酸酯、丁二醇二(甲基)丙烯酸酯類、新戊二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯等之伸烷基多元醇聚(甲基)丙烯酸酯、;二乙二醇二(甲基)丙烯酸酯、三乙二醇二(甲基)丙烯酸酯、乙氧基化三羥甲基丙烷三丙烯酸酯、丙氧基化三羥甲基丙烷三(甲基)丙烯酸酯等之聚氧烷二醇聚(甲基)丙烯酸酯類;羥基三甲基乙酸新戊二醇酯二(甲基)丙烯酸酯等之聚(甲基)丙烯酸酯類;參[(甲基)丙烯醯氧基乙基]異三聚氰酸酯等之異三聚氰酸酯型聚(甲基)丙烯酸酯類等。Examples of the photopolymerizable vinyl monomer include styrene derivatives such as styrene, chlorostyrene, and α-methylstyrene; vinyl acetate, vinyl butyrate, and vinyl benzoate. Vinyl esters; vinyl isobutyl ether, vinyl-n-butyl ether, vinyl-t-butyl ether, vinyl-n-pentyl ether, vinyl isoamyl ether, vinyl-n- Octyl alkyl ether, vinyl cyclohexyl ether, ethylene glycol monobutyl vinyl ether, triethylene glycol monomethyl vinyl ether and other vinyl ethers; acrylamide, methacrylamide, N -Hydroxymethacrylamide, N-Hydroxymethacrylamide, N-methoxymethacrylamide, N-ethoxymethacrylamine, N-butoxymethacrylamine (Meth) acrylamides such as amines; allyl compounds such as triallyl isocyanate, diallyl phthalate, diallyl isophthalate, and the like; (meth) 2-ethylhexyl acrylate, lauryl (meth) acrylate, tetrahydrofuran methyl (meth) acrylate, isoamyl (meth) acrylate, phenyl (meth) acrylate, phenoxy (meth) acrylate B (Meth) acrylic acid esters; hydroxyethyl (meth) acrylate, hydroxypropyl (meth) acrylate, pentaerythritol tri (meth) acrylate, etc .; Alkoxyalkanediol mono (meth) acrylates, such as methoxyethyl methacrylate, ethoxyethyl (meth) acrylate; ethylene glycol di (meth) acrylate, succinic acid Alcohol di (meth) acrylates, neopentyl glycol di (meth) acrylate, 1,6-hexanediol di (meth) acrylate, trimethylolpropane tri (meth) acrylate, Pentaerythritol tetra (meth) acrylate, dipentaerythritol hexa (meth) acrylate and other alkylene polyols poly (meth) acrylate, diethylene glycol di (meth) acrylate, triethylene glycol Polyoxyalkylene glycol poly (meth) acrylic acid such as di (meth) acrylate, ethoxylated trimethylolpropane triacrylate, propoxylated trimethylolpropane tri (meth) acrylate, etc. Esters; poly (meth) acrylates such as hydroxytrimethylacetate neopentyl glycol di (meth) acrylate, etc .; see [(meth) acrylic ethoxyethyl] isotricyanate Wait for Cyanurate poly (meth) acrylates.

(鹼可溶性樹脂)
本發明之硬化性樹脂組成物,亦可含有鹼可溶性樹脂。鹼可溶性樹脂,例如可列舉具有2個以上酚性羥基之化合物、含羧基之樹脂、具有酚性羥基及羧基之化合物、具有2個以上硫醇基之化合物。其中尤其鹼可溶性樹脂若為含羧基之樹脂或酚樹脂時,與基底之密合性提高,故較佳。特別是由於顯像性優良,故鹼可溶性樹脂更佳為含羧基之樹脂。含羧基之樹脂,亦可為具有乙烯性不飽和基之含羧基之感光性樹脂、亦可為不具有乙烯性不飽和基之含羧基之樹脂。鹼可溶性樹脂,可1種單獨或組合2種以上使用。
(Alkali soluble resin)
The curable resin composition of the present invention may contain an alkali-soluble resin. Examples of the alkali-soluble resin include compounds having two or more phenolic hydroxyl groups, resins containing carboxyl groups, compounds having phenolic hydroxyl groups and carboxyl groups, and compounds having two or more thiol groups. Among them, if the alkali-soluble resin is a carboxyl group-containing resin or a phenol resin, the adhesion to the substrate is improved, so it is preferable. In particular, since the developability is excellent, the alkali-soluble resin is more preferably a carboxyl group-containing resin. The carboxyl group-containing resin may be a carboxyl group-containing photosensitive resin having an ethylenically unsaturated group or a carboxyl group-containing resin having no ethylenically unsaturated group. Alkali-soluble resins can be used alone or in combination of two or more.

含羧基之樹脂之具體例子,可列舉如以下所列舉的化合物(寡聚物及聚合物均可)。Specific examples of the carboxyl group-containing resin include the following compounds (both oligomers and polymers).

(1)藉由(甲基)丙烯酸等之不飽和羧酸,與苯乙烯、α-甲基苯乙烯、低級(甲基)丙烯酸烷酯、異丁烯等之含不飽和基之化合物的共聚合所得到之含羧基之樹脂。(1) Copolymerization sites of unsaturated carboxylic acids such as (meth) acrylic acid, and unsaturated group-containing compounds such as styrene, α-methylstyrene, lower alkyl (meth) acrylates, and isobutylene The obtained carboxyl group-containing resin.

(2)藉由脂肪族二異氰酸酯、分支脂肪族二異氰酸酯、脂環式二異氰酸酯、芳香族二異氰酸酯等之二異氰酸酯,與二羥甲基丙酸、二羥甲基丁酸等之含羧基之二元醇化合物及聚碳酸酯系多元醇、聚醚系多元醇、聚酯系多元醇、聚烯烴系多元醇、丙烯酸系多元醇、雙酚A系環氧烷加成體二醇、具有酚性羥基及醇性羥基之化合物等之二醇化合物的加成聚合反應所得到之含羧基之胺基甲酸酯樹脂。(2) By using diisocyanates such as aliphatic diisocyanates, branched aliphatic diisocyanates, alicyclic diisocyanates, aromatic diisocyanates, and carboxyl-containing groups such as dimethylolpropionic acid and dimethylolbutanoic acid Glycol compounds and polycarbonate polyols, polyether polyols, polyester polyols, polyolefin polyols, acrylic polyols, bisphenol A alkylene oxide adduct diols, and phenols Carboxyl group-containing urethane resin obtained by addition polymerization reaction of a diol compound such as a polar hydroxyl group and an alcoholic hydroxyl compound.

(3)對藉由脂肪族二異氰酸酯、分支脂肪族二異氰酸酯、脂環式二異氰酸酯、芳香族二異氰酸酯等之二異氰酸酯化合物,與聚碳酸酯系多元醇、聚醚系多元醇、聚酯系多元醇、聚烯烴系多元醇、丙烯酸系多元醇、雙酚A系環氧烷加成體二醇、具有酚性羥基及醇性羥基之化合物等之二醇化合物之加成聚合反應所得到之胺基甲酸酯樹脂的末端使酸酐反應而成之末端含羧基之胺基甲酸酯樹脂。(3) For diisocyanate compounds such as aliphatic diisocyanates, branched aliphatic diisocyanates, alicyclic diisocyanates, aromatic diisocyanates, etc., with polycarbonate-based polyols, polyether-based polyols, and polyester-based Polyol, polyolefin polyol, acrylic polyol, bisphenol A alkylene oxide adduct diol, diol compound obtained by addition polymerization reaction of phenolic hydroxyl group and alcoholic hydroxyl compound, etc. A urethane resin containing a carboxyl group at the end of a urethane resin by reacting an acid anhydride with the terminal.

(4)藉由二異氰酸酯,與雙酚A型環氧樹脂、氫化雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、聯二甲苯酚型環氧樹脂、聯苯酚型環氧樹脂等之2官能環氧樹脂之(甲基)丙烯酸酯或其部分酸酐改質物、含羧基之二元醇化合物及二醇化合物之加成聚合反應所得到之含羧基之胺基甲酸酯樹脂。(4) Diisocyanate with bisphenol A epoxy resin, hydrogenated bisphenol A epoxy resin, bisphenol F epoxy resin, bisphenol S epoxy resin, bixylenol epoxy resin (Meth) acrylates of bifunctional epoxy resins such as biphenol type epoxy resins or modified anhydrides thereof, carboxyl-containing compounds obtained by addition polymerization of carboxyl-containing glycol compounds and glycol compounds Urethane resin.

(5)於上述(2)或(4)之樹脂的合成中,添加(甲基)丙烯酸羥基烷酯等之分子中具有1個羥基與1個以上之(甲基)丙烯醯基的化合物,經末端(甲基)丙烯醯化之含羧基之胺基甲酸酯樹脂。(5) adding a compound having one hydroxyl group and one or more (meth) acrylfluorenyl groups in a molecule such as hydroxyalkyl (meth) acrylate in the synthesis of the resin of (2) or (4) above, Carboxyl-containing urethane resins that are terminally (meth) acrylicated.

(6)於上述(2)或(4)之樹脂的合成中,添加異佛酮二異氰酸酯與季戊四醇三丙烯酸酯之等莫耳反應物等分子中具有1個異氰酸酯基與1個以上之(甲基)丙烯醯基的化合物,經末端(甲基)丙烯醯化之含羧基之胺基甲酸酯樹脂。(6) In the synthesis of the resin of (2) or (4) above, molecules such as isophorone diisocyanate and pentaerythritol triacrylate are added to the molecule such as a mole reactant and have one isocyanate group and one or more (a (Meth) acrylic acid-based compound, a carboxyl group-containing urethane resin having terminal (meth) acrylic acid.

(7)使(甲基)丙烯酸與多官能環氧樹脂反應,對側鏈所存在的羥基加成鄰苯二甲酸酐、四氫鄰苯二甲酸酐、六氫鄰苯二甲酸酐等之2元酸酐而得的含羧基之樹脂。(7) Reaction of (meth) acrylic acid with a polyfunctional epoxy resin, and addition of phthalic anhydride, tetrahydrophthalic anhydride, hexahydrophthalic anhydride, etc. to the hydroxyl groups present in the side chains Carboxyl-containing resin obtained from an acid anhydride.

(8)使(甲基)丙烯酸與將2官能環氧樹脂之羥基進一步以表氯醇環氧化而得的多官能環氧樹脂反應,對所生成之羥基加成2元酸酐而得的含羧基之樹脂。(8) A carboxyl group obtained by reacting (meth) acrylic acid with a polyfunctional epoxy resin obtained by further epoxidizing a hydroxyl group of a bifunctional epoxy resin with epichlorohydrin, and adding a dibasic acid anhydride to the generated hydroxyl group The resin.

(9)使二羧酸與多官能氧雜環丁烷樹脂反應,對所生成之1級羥基加成2元酸酐而得的含羧基之聚酯樹脂。(9) A carboxyl group-containing polyester resin obtained by reacting a dicarboxylic acid with a polyfunctional oxetane resin and adding a dibasic acid anhydride to the generated primary hydroxyl group.

(10)對使1分子中具有複數個酚性羥基之化合物與環氧乙烷、環氧丙烷等之環氧烷反應而得到之反應生成物,使含不飽和基之單羧酸進行反應,再對所得到之反應生成物使多元酸酐進行反應而得到的含羧基之樹脂。(10) A reaction product obtained by reacting a compound having a plurality of phenolic hydroxyl groups in one molecule with an alkylene oxide such as ethylene oxide or propylene oxide, and reacting a monocarboxylic acid containing an unsaturated group, A carboxyl group-containing resin obtained by reacting the obtained reaction product with a polybasic acid anhydride.

(11)對使1分子中具有複數個酚性羥基之化合物與碳酸伸乙酯、碳酸伸丙酯等之環狀碳酸酯化合物反應而得到之反應生成物,使含不飽和基之單羧酸進行反應,再對所得到之反應生成物,使多元酸酐進行反應而得到之含羧基之樹脂。(11) A reaction product obtained by reacting a compound having a plurality of phenolic hydroxyl groups in one molecule with a cyclic carbonate compound such as ethylene carbonate, propylene carbonate, etc., and using an unsaturated monocarboxylic acid A reaction is carried out, and the obtained reaction product is further reacted with a polybasic acid anhydride to obtain a carboxyl group-containing resin.

(12)使p-羥基苯乙醇等之1分子中具有至少1個醇性羥基與1個酚性羥基之化合物,及(甲基)丙烯酸等之含不飽和基之單羧酸與1分子中具有複數個環氧基之環氧化合物反應,對所得到之反應生成物之醇性羥基,使馬來酸酐、四氫鄰苯二甲酸酐、偏苯三甲酸酐、苯均四酸酐、己二酸酐等之多元酸酐進行反應而得到之含羧基之樹脂。(12) A compound having at least one alcoholic hydroxyl group and one phenolic hydroxyl group in one molecule of p-hydroxyphenylethanol and the like, and an unsaturated monocarboxylic acid containing an unsaturated group such as (meth) acrylic acid and one molecule An epoxy compound having a plurality of epoxy groups is reacted, and maleic anhydride, tetrahydrophthalic anhydride, trimellitic anhydride, pyromellitic anhydride, and adipic anhydride are made to the alcoholic hydroxyl group of the obtained reaction product. A carboxyl group-containing resin obtained by reacting a polybasic acid anhydride such as polycarboxylic acid.

(13)對上述(1)~(12)等記載的含羧基之樹脂,進一步加成(甲基)丙烯酸縮水甘油酯、(甲基)丙烯酸α-甲基縮水甘油酯等之分子中具有1個環氧基與1個以上之(甲基)丙烯醯基的化合物而成之含羧基之樹脂。(13) To the carboxyl group-containing resin described in the above (1) to (12) and the like, (glycidyl (meth) acrylate, α-methylglycidyl (meth) acrylate, etc.) are added in a molecule having 1 A carboxyl group-containing resin composed of a compound of one epoxy group and one or more (meth) acrylfluorenyl groups.

又,亦可適合地使用具有醯胺醯亞胺構造及醯亞胺構造之至少任一種的鹼可溶性樹脂。Further, an alkali-soluble resin having at least one of a sulfonium sulfonium imine structure and a sulfonium imine structure can also be suitably used.

鹼可溶性樹脂,亦可適合地使用具有下述式(1)或(2)

表示之至少一方的構造與鹼可溶性官能基之醯胺醯亞胺樹脂。藉由包含具有直接鍵結於環己烷環或苯環之醯亞胺鍵的樹脂,可得到強韌性及耐熱性優良的硬化物。特別是具有(1)表示之構造的醯胺醯亞胺樹脂,由於光之透過性優良,故可提高解像性。前述醯胺醯亞胺樹脂,較佳為具有透明性,例如,於前述醯胺醯亞胺樹脂之乾燥塗膜25μm,波長365nm之光的透過率較佳為70%以上。
An alkali-soluble resin can also be suitably used, which has the following formula (1) or (2)

Resin and imine resins having at least one of the structures and alkali-soluble functional groups shown. By containing a resin having a sulfonium imine bond directly bonded to a cyclohexane ring or a benzene ring, a hardened product having excellent toughness and heat resistance can be obtained. In particular, the amidamine and imine resin having a structure represented by (1) is excellent in light transmittance, so that the resolution can be improved. It is preferable that the amidamine imine resin has transparency. For example, the dry coating film of the amidamide imine resin is 25 μm, and the transmittance of light having a wavelength of 365 nm is preferably 70% or more.

前述醯胺醯亞胺樹脂中,式(1)及(2)之構造的含量,較佳為10~70質量%。藉由使用該樹脂,可得到溶劑溶解性優良,且耐熱性、拉伸強度或伸度等之物性及尺寸安定性優良的硬化物。較佳為10~60質量%、更佳為20~50質量%。The content of the structures of the formulas (1) and (2) in the amidamine and imine resin is preferably 10 to 70% by mass. By using this resin, a hardened product having excellent solvent solubility and excellent physical properties and dimensional stability such as heat resistance, tensile strength, and elongation can be obtained. It is preferably 10 to 60% by mass, and more preferably 20 to 50% by mass.

具有式(1)表示之構造的醯胺醯亞胺樹脂,特別以具有式(3A)或(3B)

(式(3A)及(3B)中,各自地,R為1價有機基,較佳為H、CF3 或CH3 ,X為直接鍵結或2價有機基,較佳為直接鍵結、CH2 或C(CH3 )2 等之伸烷基)表示之構造的樹脂,由於拉伸強度或伸度等之物性及尺寸安定性優良,故較佳。就溶解性或機械物性之觀點,前述醯胺醯亞胺樹脂,可適合使用具有10~100質量%式(3A)及(3B)之構造的樹脂。更佳為20~80質量%。
The amidoamine imine resin having a structure represented by the formula (1) is particularly one having the formula (3A) or (3B)

(In the formulae (3A) and (3B), R is a monovalent organic group, preferably H, CF 3 or CH 3 , and X is a direct bond or a divalent organic group, preferably a direct bond, Resins having a structure represented by an alkylene group such as CH 2 or C (CH 3 ) 2 are preferred because of excellent physical properties and dimensional stability such as tensile strength and elongation. From the standpoint of solubility or mechanical properties, the aforementioned amidoamine imine resin can be suitably used as a resin having a structure of the formulae (3A) and (3B). More preferably, it is 20 to 80% by mass.

前述醯胺醯亞胺樹脂,就溶解性或機械物性之觀點,較佳可使用含有5~100莫耳%式(3A)及(3B)之構造的醯胺醯亞胺樹脂。更佳為5~98莫耳%、又更佳為10~98莫耳%、特佳為20~80莫耳%。It is preferable that the amidamidine imine resin contains a structure having 5 to 100 mole% of the structures of the formulae (3A) and (3B) as the amidoimine resin. More preferably, it is 5 to 98 mole%, more preferably, it is 10 to 98 mole%, and particularly preferably, it is 20 to 80 mole%.

又,具有式(2)表示之構造的醯胺醯亞胺樹脂,特別以具有式(4A)或(4B)

(式(4A)及(4B)中,各自地,R為1價有機基,較佳為H、CF3 或CH3 ,X為直接鍵結或2價有機基,較佳為直接鍵結、CH2 或C(CH3 )2 等之伸烷基)表示之構造的樹脂,由於可得到拉伸強度或伸度等之機械物性優良的硬化物,故較佳。就溶解性或機械物性之觀點,前述醯胺醯亞胺樹脂,可適合使用具有10~100質量%式(4A)及(4B)之構造的樹脂。更佳為20~80質量%。
In addition, the amidamine and imine resin having a structure represented by the formula (2) is particularly preferably a compound having the formula (4A) or (4B)

(In the formulae (4A) and (4B), R is a monovalent organic group, preferably H, CF 3 or CH 3 , and X is a direct bond or a divalent organic group, preferably a direct bond, A resin having a structure represented by an alkylene group such as CH 2 or C (CH 3 ) 2 is preferred because a hardened product having excellent mechanical properties such as tensile strength and elongation can be obtained. From the standpoint of solubility or mechanical properties, the aforementioned amidoamine imine resin can be suitably used as a resin having a structure of formulae (4A) and (4B) in an amount of 10 to 100% by mass. More preferably, it is 20 to 80% by mass.

前述醯胺醯亞胺樹脂,就展現良好之機械物性的理由,較佳亦可使用含有2~95莫耳%式(4A)及(4B)之構造的醯胺醯亞胺樹脂。更佳為10~80莫耳%。For the reason that the amidamine imine resin exhibits good mechanical properties, it is also preferable to use amidamide imine resin having a structure of 2 to 95 mole% of formulae (4A) and (4B). More preferably, it is 10 to 80 mol%.

前述醯胺醯亞胺樹脂,可藉由公知方法得到。具有(1)之構造的醯胺醯亞胺樹脂,例如可使用具有聯苯骨架之二異氰酸酯化合物與環己烷多羧酸酐而得到。The amidamine and imine resin can be obtained by a known method. The amidamine and imine resin having the structure of (1) can be obtained using, for example, a diisocyanate compound having a biphenyl skeleton and a cyclohexane polycarboxylic anhydride.

具有聯苯骨架之二異氰酸酯化合物,可列舉4,4’-二異氰酸酯-3,3’-二甲基-1,1’-聯苯、4,4’-二異氰酸酯-3,3’-二乙基-1,1’-聯苯、4,4’-二異氰酸酯-2,2’-二甲基-1,1’-聯苯、4,4’-二異氰酸酯-2,2’-二乙基-1,1’-聯苯、4,4’-二異氰酸酯-3,3’-二-三氟甲基-1,1’-聯苯、4,4’-二異氰酸酯-2,2’-二-三氟甲基-1,1’-聯苯等。其他,亦可使用二苯基甲烷二異氰酸酯等之芳香族聚異氰酸酯化合物等。Examples of the diisocyanate compound having a biphenyl skeleton include 4,4'-diisocyanate-3,3'-dimethyl-1,1'-biphenyl, 4,4'-diisocyanate-3,3'-di Ethyl-1,1'-biphenyl, 4,4'-diisocyanate-2,2'-dimethyl-1,1'-biphenyl, 4,4'-diisocyanate-2,2'-di Ethyl-1,1'-biphenyl, 4,4'-diisocyanate-3,3'-di-trifluoromethyl-1,1'-biphenyl, 4,4'-diisocyanate-2,2 '-Di-trifluoromethyl-1,1'-biphenyl and the like. Alternatively, an aromatic polyisocyanate compound such as diphenylmethane diisocyanate can be used.

環己烷多羧酸酐,可列舉環己烷三羧酸酐、環己烷四羧酸酐等。Examples of the cyclohexane polycarboxylic anhydride include cyclohexane tricarboxylic anhydride and cyclohexane tetracarboxylic anhydride.

又,具有(2)之構造的醯胺醯亞胺樹脂,例如可使用上述具有聯苯骨架之二異氰酸酯化合物,與具有2個酸酐基之多羧酸酐而得到。Moreover, the fluorene amine imine resin which has a structure of (2) can be obtained using the said diisocyanate compound which has the biphenyl skeleton, and the polycarboxylic acid anhydride which has two acid anhydride groups, for example.

具有2個酸酐基之多羧酸酐,可列舉苯均四酸二酐、二苯甲酮-3,3’,4,4’-四羧酸二酐、二苯基醚-3,3’,4,4’-四羧酸二酐、苯-1,2,3,4-四羧酸二酐、聯苯-3,3’,4,4’-四羧酸二酐、聯苯-2,2’,3,3’-四羧酸二酐、雙(2,3-二羧基苯基)甲烷二酐、雙(3,4-二羧基苯基)甲烷二酐、1,1-雙(2,3-二羧基苯基)乙烷二酐、1,1-雙(3,4-二羧基苯基)乙烷二酐、2,2-雙(2,3-二羧基苯基)丙烷二酐、2,3-雙(3,4-二羧基苯基)丙烷二酐、雙(3,4-二羧基苯基)碸二酐、雙(3,4-二羧基苯基)醚二酐、乙二醇雙脫水偏苯三甲酸酯等之烷二醇雙脫水偏苯三甲酸酯等。Polycarboxylic anhydrides having two acid anhydride groups include pyromellitic dianhydride, benzophenone-3,3 ', 4,4'-tetracarboxylic dianhydride, and diphenyl ether-3,3', 4,4'-tetracarboxylic dianhydride, benzene-1,2,3,4-tetracarboxylic dianhydride, biphenyl-3,3 ', 4,4'-tetracarboxylic dianhydride, biphenyl-2 , 2 ', 3,3'-tetracarboxylic dianhydride, bis (2,3-dicarboxyphenyl) methane dianhydride, bis (3,4-dicarboxyphenyl) methane dianhydride, 1,1-bis (2,3-dicarboxyphenyl) ethane dianhydride, 1,1-bis (3,4-dicarboxyphenyl) ethane dianhydride, 2,2-bis (2,3-dicarboxyphenyl) Propane dianhydride, 2,3-bis (3,4-dicarboxyphenyl) propane dianhydride, bis (3,4-dicarboxyphenyl) fluorene dianhydride, bis (3,4-dicarboxyphenyl) ether Alkanediol dianhydride trimellitate, such as dianhydride, ethylene glycol dianhydrotrimellitate, and the like.

前述醯胺醯亞胺樹脂,於上述式(1)、(2)之構造以外,進一步具有鹼可溶性之官能基。藉由具有鹼可溶性之官能基,成為可鹼顯像之樹脂組成物。作為鹼可溶性之官能基,為含有羧基、酚系羥基、磺基等者,較佳為含有羧基者。The amidoamine imine resin further has an alkali-soluble functional group in addition to the structures of the formulae (1) and (2). By having an alkali-soluble functional group, it becomes an alkali-developing resin composition. As the alkali-soluble functional group, those containing a carboxyl group, a phenolic hydroxyl group, a sulfo group, and the like are preferred, and those containing a carboxyl group are preferred.

再者,前述醯胺醯亞胺樹脂之具體例子,可列舉DIC公司製Unidic V-8000系列、NIPPON高度紙工業公司製SOXR-U。In addition, specific examples of the amidamine imine resin include Unidic V-8000 series manufactured by DIC Corporation, and SOXR-U manufactured by NIPPON Advanced Paper Industries Co., Ltd.

具有酚性羥基之化合物,例如可列舉具有聯苯骨架或伸苯骨架或其兩方之骨架的化合物,或使用酚、鄰甲酚、對甲酚、間甲酚、2,3-二甲酚、2,4-二甲酚、2,5-二甲酚、2,6-二甲酚、3,4-二甲酚、3,5-二甲酚、兒茶酚、間苯二酚、氫醌、甲基氫醌、2,6-二甲基氫醌、三甲基氫醌、五倍子酚、間苯三酚等所合成之具有各種骨架之酚樹脂。Examples of the compound having a phenolic hydroxyl group include a compound having a biphenyl skeleton, an phenylene skeleton, or a skeleton of both of them, or a phenol, o-cresol, p-cresol, m-cresol, and 2,3-xylenol. , 2,4-xylenol, 2,5-xylenol, 2,6-xylenol, 3,4-xylenol, 3,5-xylenol, catechol, resorcinol, Hydroquinone, methylhydroquinone, 2,6-dimethylhydroquinone, trimethylhydroquinone, gallophenol, resorcinol and other phenol resins with various skeletons.

又,具有酚性羥基之化合物,例如可列舉酚酚醛清漆樹脂、烷基酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、二環戊二烯型酚樹脂、Xylok型酚樹脂、萜烯改質酚樹脂、聚乙烯基酚類、雙酚F、雙酚S型酚樹脂、聚-p-羥基苯乙烯、萘酚與醛類之縮合物、二羥基萘與醛類之縮合物等之公知慣用的酚樹脂。Examples of the compound having a phenolic hydroxyl group include phenol novolac resin, alkylphenol novolac resin, bisphenol A novolac resin, dicyclopentadiene type phenol resin, Xylok type phenol resin, and terpene modified phenol. Resins, polyvinyl phenols, bisphenol F, bisphenol S-type phenol resins, poly-p-hydroxystyrene, naphthol and aldehyde condensates, dihydroxynaphthalene and aldehydes, etc. Phenol resin.

酚樹脂之市售品,例如可列舉HF1H60(明和化成公司製)、Phenolite TD-2090、Phenolite TD-2131(大日本印刷公司製)、Besmol CZ-256-A(DIC公司製)、Shonol BRG-555、Shonol BRG-556(昭和電工公司製)、CGR-951(丸善石油公司製)、聚乙烯基酚之CST70、CST90、S-1P、S-2P(丸善石油公司製)。Examples of commercially available phenol resins include HF1H60 (manufactured by Meiwa Chemical Co., Ltd.), Phenolite TD-2090, Phenolite TD-2131 (manufactured by Dainippon Printing Co., Ltd.), Besmol CZ-256-A (manufactured by DIC Corporation), Shonol BRG- 555, Shonol BRG-556 (manufactured by Showa Denko Corporation), CGR-951 (manufactured by Maruzen Oil Co., Ltd.), CST70, CST90, S-1P, S-2P (manufactured by Maruzen Oil Co., Ltd.) of polyvinyl phenol.

鹼可溶性樹脂之酸價,係以40~200mgKOH/g之範圍為適當,更佳為45~120mgKOH/g之範圍。鹼可溶性樹脂之酸價為40mgKOH/g以上時,鹼顯像變得容易,另一方面,為200mgKOH/g以下時正常的硬化物圖型之描繪變得容易,故較佳。The acid value of the alkali-soluble resin is suitably in the range of 40 to 200 mgKOH / g, and more preferably in the range of 45 to 120 mgKOH / g. When the acid value of the alkali-soluble resin is 40 mgKOH / g or more, alkali development becomes easy. On the other hand, when the acid value of the alkali-soluble resin is 200 mgKOH / g or less, the drawing of a normal hardened product pattern becomes easy, so it is preferable.

鹼可溶性樹脂之重量平均分子量,雖依樹脂骨架而異,但以1,500~150,000、進而1,500~100,000之範圍為佳。重量平均分子量為1,500以上時,不黏著(tack-free)性能良好,曝光後之塗膜的耐濕性良好,可抑制顯像時之膜減少,抑制解像度之降低。另一方面,重量平均分子量為150,000以下時,顯像性良好,儲存安定性亦優良。Although the weight-average molecular weight of the alkali-soluble resin varies depending on the resin skeleton, it is preferably in the range of 1,500 to 150,000, and further 1,500 to 100,000. When the weight-average molecular weight is 1,500 or more, the tack-free performance is good, the moisture resistance of the coating film after exposure is good, the film reduction during development can be suppressed, and the decrease in resolution can be suppressed. On the other hand, when the weight average molecular weight is 150,000 or less, the developability is good and the storage stability is also excellent.

鹼可溶性樹脂之摻合量,例如於組成物之固體成分總量中,為5~50質量%。The blending amount of the alkali-soluble resin is, for example, 5 to 50% by mass based on the total solid content of the composition.

(光反應起始劑)
本發明之硬化性樹脂組成物,可含有光反應起始劑。光反應起始劑,只要係可藉由光照射而使組成物硬化者即可,較佳為藉由光照射而產生自由基之光聚合起始劑及藉由光照射而產生鹼之光鹼產生劑中的任1種。再者,光反應起始劑,當然亦可為藉由光照射而產生自由基與鹼兩方的化合物。光照射係指照射波長350~450nm之範圍的紫外線。
(Photoreaction initiator)
The curable resin composition of the present invention may contain a photoreaction initiator. The photoreaction initiator may be any one that can harden the composition by light irradiation, and is preferably a photopolymerization initiator that generates radicals by light irradiation and a photobase that generates alkali by light irradiation. Any one of the generating agents. In addition, the photoreaction initiator may of course be a compound that generates both a radical and a base upon irradiation with light. Light irradiation means irradiation of ultraviolet rays in a wavelength range of 350 to 450 nm.

光聚合起始劑,例如可列舉雙-(2,6-二氯苯甲醯基)苯基膦氧化物、雙-(2,6-二氯苯甲醯基)-2,5-二甲基苯基膦氧化物、雙-(2,6-二氯苯甲醯基)-4-丙基苯基膦氧化物、雙-(2,6-二氯苯甲醯基)-1-萘基膦氧化物、雙-(2,6-二甲氧基苯甲醯基)苯基膦氧化物、雙-(2,6-二甲氧基苯甲醯基)-2,4,4-三甲基戊基膦氧化物、雙-(2,6-二甲氧基苯甲醯基)-2,5-二甲基苯基膦氧化物、雙-(2,4,6-三甲基苯甲醯基)-苯基膦氧化物等之雙醯基膦氧化物類;2,6-二甲氧基苯甲醯基二苯基膦氧化物、2,6-二氯苯甲醯基二苯基膦氧化物、2,4,6-三甲基苯甲醯基苯基次磷酸甲酯、2-甲基苯甲醯基二苯基膦氧化物、三甲基乙醯基苯基次磷酸異丙酯、2,4,6-三甲基苯甲醯基二苯基膦氧化物)等之單醯基膦氧化物類;1-羥基-環己基苯基酮、1-[4-(2-羥基乙氧基)-苯基]-2-羥基-2-甲基-1-丙烷-1-酮、2-羥基-1-{4-[4-(2-羥基-2-甲基-丙醯基)-苯甲基]苯基}-2-甲基-丙烷-1-酮、2-羥基-2-甲基-1-苯基丙烷-1-酮等之羥基苯乙酮類;苯偶姻、二苯基乙二酮、苯偶姻甲基醚、苯偶姻乙基醚、苯偶姻n-丙基醚、苯偶姻異丙基醚、苯偶姻n-丁基醚等之苯偶姻類;苯偶姻烷基醚類;二苯甲酮、p-甲基二苯甲酮、米其勒酮、甲基二苯甲酮、4,4’-二氯二苯甲酮、4,4’-雙二乙基胺基二苯甲酮等之二苯甲酮類;苯乙酮、2,2-二甲氧基-2-苯基苯乙酮、2,2-二乙氧基-2-苯基苯乙酮、1,1-二氯苯乙酮、1-羥基環己基苯基酮、2-甲基-1-[4-(甲硫基)苯基]-2-嗎啉基-1-丙酮、2-苯甲基-2-二甲基胺基-1-(4-嗎啉基苯基)-丁酮-1、2-(二甲基胺基)-2-[(4-甲基苯基)甲基)-1-[4-(4-嗎啉基)苯基]-1-丁酮、N,N-二甲基胺基苯乙酮等之苯乙酮類;噻噸酮、2-乙基噻噸酮、2-異丙基噻噸酮、2,4-二甲基噻噸酮、2,4-二乙基噻噸酮、2-氯噻噸酮、2,4-二異丙基噻噸酮等之噻噸酮類;蒽醌、氯蒽醌、2-甲基蒽醌、2-乙基蒽醌、2-tert-丁基蒽醌、1-氯蒽醌、2-戊基蒽醌、2-胺基蒽醌等之蒽醌類;苯乙酮二甲基縮酮、苯甲基二甲基縮酮等之縮酮類;苯甲酸乙基-4-二甲基胺酯、苯甲酸2-(二甲基胺基)乙酯、p-二甲基苯甲酸乙酯等之苯甲酸酯類;1,2-辛二酮,1-[4-(苯硫基)-,2-(O-苯甲醯基肟)]、乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)等之肟酯類;雙(η5-2,4-環戊二烯-1-基)-雙(2,6-二氟-3-(1H-吡咯-1-基)苯基)鈦、雙(環戊二烯基)-雙[2,6-二氟-3-(2-(1-吡咯-1-基)乙基)苯基]鈦等之二茂鈦類;苯基二硫醚2-硝基茀、丁偶姻、大茴香偶姻乙基醚、偶氮二異丁腈、四甲基秋蘭姆二硫醚等。光聚合起始劑,可1種單獨使用、亦可組合2種以上使用。Examples of the photopolymerization initiator include bis- (2,6-dichlorobenzyl) phenylphosphine oxide and bis- (2,6-dichlorobenzyl) -2,5-dimethyl Phenylphenylphosphine oxide, bis- (2,6-dichlorobenzyl) -4-propylphenylphosphine oxide, bis- (2,6-dichlorobenzyl) -1-naphthalene Phosphine oxide, bis- (2,6-dimethoxybenzyl) phenylphosphine oxide, bis- (2,6-dimethoxybenzyl) -2,4,4- Trimethylpentylphosphine oxide, bis- (2,6-dimethoxybenzyl) -2,5-dimethylphenylphosphine oxide, bis- (2,4,6-trimethyl Dibenzylphosphine) -bisphosphonylphosphine oxides such as phenylphosphine oxide; 2,6-dimethoxybenzyldiphenylphosphine oxide, 2,6-dichlorobenzidine Diphenylphosphine oxide, methyl 2,4,6-trimethylbenzylidenephenyl hypophosphite, 2-methylbenzylidene diphenylphosphine oxide, trimethylacetamidobenzene Isopropyl hypophosphite, 2,4,6-trimethylbenzylidene diphenylphosphine oxide) and other monofluorenylphosphine oxides; 1-hydroxy-cyclohexylphenyl ketone, 1- [ 4- (2-hydroxyethoxy) -phenyl] -2-hydroxy-2-methyl-1-propane-1-one, 2-hydroxy-1- {4- [4- (2-hydroxy-2 -Methyl-propanone ) -Benzyl] phenyl} -2-methyl-propane-1-one, 2-hydroxy-2-methyl-1-phenylpropane-1-one, and other hydroxyacetophenones; benzoin Benzene, diphenylethylenedione, benzoin methyl ether, benzoin ethyl ether, benzoin n-propyl ether, benzoin isopropyl ether, benzoin n-butyl ether, etc. Marriage; benzoin alkyl ethers; benzophenone, p-methylbenzophenone, Michelin, methylbenzophenone, 4,4'-dichlorobenzophenone, 4,4'-bisdiethylaminobenzophenones and other benzophenones; acetophenone, 2,2-dimethoxy-2-phenylacetophenone, 2,2-diethyl Oxy-2-phenylacetophenone, 1,1-dichloroacetophenone, 1-hydroxycyclohexylphenylketone, 2-methyl-1- [4- (methylthio) phenyl] -2 -Morpholinyl-1-acetone, 2-benzyl-2-dimethylamino-1- (4-morpholinylphenyl) -butanone-1, 2- (dimethylamino)- 2-[(4-methylphenyl) methyl) -1- [4- (4-morpholinyl) phenyl] -1-butanone, N, N-dimethylaminoacetophenone, etc. Acetophenones; thioxanthone, 2-ethylthioxanthone, 2-isopropylthioxanthone, 2,4-dimethylthioxanthone, 2,4-diethylthioxanthone, 2- Chlorothioxanthone, 2,4-diisopropylthioxanthone, etc. Thiothanone; anthraquinone, chloroanthraquinone, 2-methylanthraquinone, 2-ethylanthraquinone, 2-tert-butylanthraquinone, 1-chloroanthraquinone, 2-pentylanthraquinone, 2- Anthraquinones such as amino anthraquinone; ketals such as acetophenone dimethyl ketal, benzyl dimethyl ketal; ethyl-4-dimethylamine benzoate, 2-benzoic acid 2- (Dimethylamino) ethyl esters, benzoates such as ethyl p-dimethylbenzoate; 1,2-octanedione, 1- [4- (phenylthio)-, 2- (O -Benzylidene oxime)], ethyl ketone, 1- [9-ethyl-6- (2-methylbenzylidene) -9H-carbazol-3-yl]-, 1- (O-ethyl Oxime esters such as fluorenyl oxime); bis (η5-2,4-cyclopentadien-1-yl) -bis (2,6-difluoro-3- (1H-pyrrole-1-yl) phenyl ) Titanocenes such as titanium, bis (cyclopentadienyl) -bis [2,6-difluoro-3- (2- (1-pyrrole-1-yl) ethyl) phenyl] titanium; benzene Dinitrosulfide 2-nitroamidine, butyrin, anisyl ethyl ether, azobisisobutyronitrile, tetramethylthiuram disulfide and the like. The photopolymerization initiator may be used singly or in combination of two or more kinds.

光鹼產生劑,為藉由紫外線或可見光等之光照射而分子構造會變化,或藉由分子開裂,而生成可作為熱硬化反應之觸媒而發揮功能的1種以上之鹼性物質的化合物。鹼性物質例如可列舉2級胺、3級胺。A photobase generator is a compound that changes one or more basic structures by irradiating light such as ultraviolet rays or visible light, or cracks the molecules to form one or more basic substances that can function as a catalyst for a thermosetting reaction. . Examples of the basic substance include a secondary amine and a tertiary amine.

光鹼產生劑,例如可列舉α-胺基苯乙酮化合物、肟酯化合物,或醯氧基亞胺基化合物、N-甲醯化芳香族胺基化合物、N-醯化芳香族胺基化合物、胺基甲酸硝基苯甲酯化合物、胺基甲酸烷氧基苯甲酯化合物等。其中尤以肟酯化合物、α-胺基苯乙酮化合物為佳;更佳為肟酯化合物;又更佳為乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)。α-胺基苯乙酮化合物,特別以具有2個以上之氮原子者為佳。光鹼產生劑可1種單獨使用、亦可組合2種以上使用。此外,光鹼產生劑可列舉4級銨鹽等。Examples of the photobase generator include an α-aminoacetophenone compound, an oxime ester compound, or an oxoimino compound, an N-formylated aromatic amine compound, and an N-formated aromatic amine compound. , Nitrobenzyl aminoformate compounds, alkoxybenzylaminoformate compounds, and the like. Among them, oxime ester compounds and α-aminoacetophenone compounds are preferred; oxime ester compounds are more preferred; and ethyl ketone is even more preferred, 1- [9-ethyl-6- (2-methylbenzidine). ) -9H-carbazol-3-yl]-, 1- (O-acetamidooxime). The α-aminoacetophenone compound is particularly preferably one having two or more nitrogen atoms. The photobase generator may be used singly or in combination of two or more kinds. Examples of the photobase generator include quaternary ammonium salts and the like.

作為其他光鹼產生劑,亦可使用WPBG-018 (商品名:9-anthrylmethyl N,N’-diethylcarbamate)、WPBG-027(商品名:(E)-1-[3-(2-hydroxyphenyl)-2-propenoyl] piperidine)、WPBG-082(商品名:guanidinium2-(3-benzoylphenyl)propionate)、WPBG-140(商品名:1-(anthraquinon-2-yl)ethyl imidazolecarboxylate)等。As other photobase generators, WPBG-018 (trade name: 9-anthrylmethyl N, N'-diethylcarbamate), WPBG-027 (trade name: (E) -1- [3- (2-hydroxyphenyl)- 2-propenoyl] piperidine), WPBG-082 (trade name: guanidinium2- (3-benzoylphenyl) propionate), WPBG-140 (trade name: 1- (anthraquinon-2-yl) ethyl imidazole carboxylate), and the like.

進一步地,前述光聚合起始劑之一部分的物質亦作為光鹼產生劑而發揮功能。亦作為光鹼產生劑而發揮功能的光聚合起始劑,較佳為肟酯系光聚合起始劑、α-胺基苯乙酮系光聚合起始劑。Furthermore, a part of the photopolymerization initiator also functions as a photobase generator. The photopolymerization initiator that functions also as a photobase generator is preferably an oxime ester-based photopolymerization initiator and an α-aminoacetophenone-based photopolymerization initiator.

光反應起始劑之摻合量,例如於組成物之固體成分總量中,為0.01~30質量%。The blending amount of the photoreaction initiator is, for example, 0.01 to 30% by mass of the total solid content of the composition.

(硬化促進劑)
本發明之硬化促進劑,可含有硬化促進劑。硬化促進劑例如可列舉咪唑、2-甲基咪唑、2-乙基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、4-苯基咪唑、1-氰基乙基-2-苯基咪唑、1-(2-氰基乙基)-2-乙基-4-甲基咪唑等之咪唑衍生物;二氰二胺、苯甲基二甲胺、4-(二甲基胺基)-N,N-二甲基苯甲胺、4-甲氧基-N,N-二甲基苯甲胺、4-甲基-N,N-二甲基苯甲胺、4-二甲基胺基吡啶等之胺化合物;己二酸二醯肼、癸二酸二醯肼等之肼化合物;三苯基膦等之磷化合物等。又,亦可使用胍胺、乙醯胍胺、苯并胍胺、三聚氰胺、2,4-二胺基-6-甲基丙烯醯氧基乙基-S-三嗪、2-乙烯基-2,4-二胺基-S-三嗪、2-乙烯基-4,6-二胺基-S-三嗪/異三聚氰酸加成物、2,4-二胺基-6-甲基丙烯醯氧基乙基-S-三嗪/異三聚氰酸加成物等之S-三嗪衍生物。又,亦可使用金屬系硬化促進劑,可列舉鈷、銅、鋅、鐵、鎳、錳、錫等之金屬的有機金屬錯合物或有機金屬鹽。有機金屬錯合物之具體例子,可列舉乙醯丙酮鈷(II)、乙醯丙酮鈷(III)等之有機鈷錯合物;乙醯丙酮銅(II)等之有機銅錯合物、乙醯丙酮鋅(II)等之有機鋅錯合物、乙醯丙酮鐵(III)等之有機鐵錯合物、乙醯丙酮鎳(II)等之有機鎳錯合物、乙醯丙酮錳(II)等之有機錳錯合物等。有機金屬鹽可列舉辛酸鋅、辛酸錫、環烷酸鋅、環烷酸鈷、硬脂酸錫、硬脂酸鋅等。就硬化促進劑而言,較佳為與硬化促進劑合併使用亦作為此等密合性賦予劑而發揮功能的化合物。硬化促進劑,可1種單獨或組合2種以上使用。
(Hardening accelerator)
The hardening accelerator of the present invention may contain a hardening accelerator. Examples of the hardening accelerator include imidazole, 2-methylimidazole, 2-ethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 4-phenylimidazole, and 1-cyanoethyl- Imidazole derivatives such as 2-phenylimidazole, 1- (2-cyanoethyl) -2-ethyl-4-methylimidazole; dicyandiamine, benzyldimethylamine, 4- (dimethylformamide) Amino) -N, N-dimethylbenzylamine, 4-methoxy-N, N-dimethylbenzylamine, 4-methyl-N, N-dimethylbenzylamine, 4 -Amine compounds such as dimethylaminopyridine; hydrazine compounds such as dihydrazine adipate, dihydrazine sebacate; phosphorus compounds such as triphenylphosphine. In addition, guanamine, acetoguanamine, benzoguanamine, melamine, 2,4-diamino-6-methacryloxyethyl-S-triazine, and 2-vinyl-2 can also be used. 2,4-diamino-S-triazine, 2-vinyl-4,6-diamino-S-triazine / isotricyanic acid adduct, 2,4-diamino-6-formaldehyde S-triazine derivatives such as propylene ethoxyethyl-S-triazine / isocyanuric acid adduct. A metal-based hardening accelerator may also be used, and examples thereof include organometallic complexes or organometallic salts of metals such as cobalt, copper, zinc, iron, nickel, manganese, and tin. Specific examples of the organometallic complex include organic cobalt complexes such as cobalt (II) acetoacetone, cobalt (III) acetoacetone, etc .; organic copper complexes of copper (II) acetoacetate, etc. Organic zinc complexes such as osmium zinc acetone (II), organic iron complexes such as ethyl acetone iron (III), organic nickel complexes such as ethyl acetonide nickel (II), and manganese (II) ) And the like. Examples of the organic metal salt include zinc octoate, tin octoate, zinc naphthenate, cobalt naphthenate, tin stearate, and zinc stearate. The hardening accelerator is preferably a compound that functions in combination with a hardening accelerator and also functions as such an adhesion-imparting agent. A hardening accelerator can be used individually by 1 type or in combination of 2 or more types.

硬化促進劑之摻合量,例如於組成物之固體成分總量中,為0.01~30質量%。The blending amount of the hardening accelerator is, for example, 0.01 to 30% by mass of the total solid content of the composition.

(硬化劑)
本發明之硬化性樹脂組成物,可含有硬化劑。硬化劑可列舉具有酚性羥基之化合物、多羧酸及其酸酐、具有氰酸酯基之化合物、具有活性酯基之化合物、具有馬來醯亞胺基之化合物、脂環式烯烴聚合物等。硬化劑可1種單獨或組合2種以上使用。
(hardener)
The curable resin composition of the present invention may contain a curing agent. Examples of the curing agent include compounds having a phenolic hydroxyl group, polycarboxylic acids and their anhydrides, compounds having a cyanate group, compounds having an active ester group, compounds having a maleimide group, and alicyclic olefin polymers. . A hardening agent can be used individually by 1 type or in combination of 2 or more types.

前述具有酚性羥基之化合物,可使用酚酚醛清漆樹脂、烷基酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、二環戊二烯型酚樹脂、Xylok型酚樹脂、萜烯改質酚樹脂、甲酚/萘酚樹脂、聚乙烯基酚類、酚/萘酚樹脂、含α-萘酚骨架之酚樹脂、含三嗪骨架之甲酚酚醛清漆樹脂、聯苯芳烷基型酚樹脂、Xylock型酚酚醛清漆樹脂等之以往公知者。
前述具有酚性羥基之化合物之中,尤以羥基當量100g/eq.以上者為佳。羥基當量100g/eq.以上的具有酚性羥基之化合物,例如可列舉二環戊二烯骨架酚酚醛清漆樹脂(GDP系列、群榮化學公司製)、Xylock型酚酚醛清漆樹脂(MEH-7800、明和化成公司製)、聯苯芳烷基型酚醛清漆樹脂(MEH-7851、明和化成公司製)、萘酚芳烷基型硬化劑(SN系列、新日鐵住金公司製)、含三嗪骨架之甲酚酚醛清漆樹脂(LA-3018-50P、DIC公司製)、含三嗪骨架之酚酚醛清漆樹脂(LA-705N、DIC公司製)等。
As the compound having a phenolic hydroxyl group, phenol novolac resin, alkylphenol novolac resin, bisphenol A novolac resin, dicyclopentadiene type phenol resin, Xylok type phenol resin, terpene modified phenol resin, Cresol / naphthol resin, polyvinyl phenols, phenol / naphthol resin, phenol resin with α-naphthol skeleton, cresol novolac resin with triazine skeleton, biphenylaralkyl type phenol resin, Xylock A conventionally known phenol novolac resin and the like.
Among the compounds having a phenolic hydroxyl group, a hydroxyl equivalent of 100 g / eq. Or more is preferred. Examples of compounds having a phenolic hydroxyl group with a hydroxyl equivalent of 100 g / eq. Or more include, for example, dicyclopentadiene skeleton phenol novolac resin (GDP series, manufactured by Qunei Chemical Co., Ltd.), and Xylock type novolac resin (MEH-7800, (Made by Meiwa Kasei Co., Ltd.), biphenyl aralkyl type novolac resin (MEH-87851, manufactured by Meiwa Kasei Co., Ltd.), naphthol aralkyl type hardener (SN series, manufactured by Nippon Steel & Sumikin Co., Ltd.), triazine skeleton Cresol novolac resin (LA-3018-50P, manufactured by DIC Corporation), triazine skeleton-containing phenol novolac resin (LA-705N, manufactured by DIC Corporation), and the like.

前述具有氰酸酯基之化合物,較佳為一分子中具有2個以上之氰酸酯基(-OCN)的化合物。具有氰酸酯基之化合物,係以往公知者均可使用。具有氰酸酯基之化合物,例如可列舉酚酚醛清漆型氰酸酯樹脂、烷基酚酚醛清漆型氰酸酯樹脂、二環戊二烯型氰酸酯樹脂、雙酚A型氰酸酯樹脂、雙酚F型氰酸酯樹脂、雙酚S型氰酸酯樹脂。又,亦可為一部分經三嗪化之預聚物。The compound having a cyanate group is preferably a compound having two or more cyanate groups (-OCN) in one molecule. Any compound having a cyanate ester group can be used. Examples of the compound having a cyanate group include a phenol novolac type cyanate resin, an alkyl novolac type cyanate resin, a dicyclopentadiene type cyanate resin, and a bisphenol A type cyanate resin. , Bisphenol F-type cyanate resin, bisphenol S-type cyanate resin. In addition, it may be a triazinated prepolymer.

市售之具有氰酸酯基之化合物,可列舉酚酚醛清漆型多官能氰酸酯樹脂(Lonza Japan公司製、PT30S)、雙酚A二氰酸酯之一部分或全部經三嗪化而成為三聚體的預聚物(Lonza Japan公司製、BA230S75)、含二環戊二烯構造之氰酸酯樹脂(Lonza Japan公司製、DT-4000、DT-7000)等。Commercially available compounds having a cyanate group include phenol novolac-type polyfunctional cyanate resin (Lonza Japan Co., PT30S), and some or all of the bisphenol A dicyanates are triazinated to form three Polymer prepolymer (Lonza Japan, BA230S75), dicyclopentadiene-containing cyanate resin (Lonza Japan, DT-4000, DT-7000) and the like.

前述具有活性酯基之化合物,較佳為一分子中具有2個以上的活性酯基之化合物。具有活性酯基之化合物,一般而言,可藉由羧酸化合物與羥基化合物之縮合反應而得到。其中尤以使用酚化合物或萘酚化合物作為羥基化合物而得到的具有活性酯基之化合物為佳。酚化合物或萘酚化合物,可列舉氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、o-甲酚、m-甲酚、p-甲酚、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三醇、二環戊二烯基二酚、酚酚醛清漆等。又,具有活性酯基之化合物,亦可為萘二醇烷基/苯甲酸型。The compound having an active ester group is preferably a compound having two or more active ester groups in one molecule. The compound having an active ester group is generally obtained by a condensation reaction between a carboxylic acid compound and a hydroxy compound. Among them, a compound having an active ester group obtained by using a phenol compound or a naphthol compound as a hydroxy compound is particularly preferable. Examples of the phenol compound or naphthol compound include hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenolphthalein, methylated bisphenol A, methylated bisphenol F, and methylated bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2 , 6-Dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, resorcinol, pyroglycerol, dicyclopentadienyl diphenol, phenol novolac, etc. . The compound having an active ester group may be a naphthalene glycol alkyl / benzoic acid type.

市售之具有活性酯基之化合物,可列舉環戊二烯型之二酚化合物,例如HPC8000-65T(DIC公司製)、HPC8100-65T(DIC公司製)、HPC8150-65T(DIC公司製)。Examples of commercially available compounds having an active ester group include cyclopentadiene-type diphenol compounds such as HPC8000-65T (manufactured by DIC), HPC8100-65T (manufactured by DIC), and HPC8150-65T (manufactured by DIC).

前述具有馬來醯亞胺基之化合物,為具有馬來醯亞胺骨架之化合物,係以往公知者均可使用。具有馬來醯亞胺基之化合物,較佳具有2個以上之馬來醯亞胺骨架;更佳為N,N’-1,3-伸苯基二馬來醯亞胺、N,N’-1,4-伸苯基二馬來醯亞胺、N,N’-4,4-二苯基甲烷雙馬來醯亞胺、1,2-雙(馬來醯亞胺)乙烷、1,6-雙馬來醯亞胺己烷、1,6-雙馬來醯亞胺-(2,2,4-三甲基)己烷、2,2’-雙-[4-(4-馬來醯亞胺苯氧基)苯基]丙烷、3,3’-二甲基-5,5’-二乙基-4,4’-二苯基甲烷雙馬來醯亞胺、4-甲基-1,3-伸苯基雙馬來醯亞胺、雙(3-乙基-5-甲基-4-馬來醯亞胺苯基)甲烷、雙酚A二苯基醚雙馬來醯亞胺、聚苯基甲烷馬來醯亞胺,及此等之寡聚物,以及具有馬來醯亞胺骨架之二胺縮合物中的至少任1種。前述寡聚物,為藉由使上述具有馬來醯亞胺基之化合物中的單體之具有馬來醯亞胺基之化合物縮合所得到的寡聚物。The compound having a maleimidine imine group is a compound having a maleimide imine skeleton, and any of the conventionally known ones can be used. A compound having a maleimidine imine group, preferably having two or more maleimide imine skeletons; more preferably N, N'-1,3-phenylene dimaleimide, N, N ' -1,4-phenylene dimaleimide, N, N'-4,4-diphenylmethane bismaleimide, 1,2-bis (maleimide) ethane, 1,6-bismaleimide hexane, 1,6-bismaleimide- (2,2,4-trimethyl) hexane, 2,2'-bis- [4- (4 -Maleimide phenoxy) phenyl] propane, 3,3'-dimethyl-5,5'-diethyl-4,4'-diphenylmethane bismaleimide, 4 -Methyl-1,3-phenylenebismaleimide, bis (3-ethyl-5-methyl-4-maleimidephenyl) methane, bisphenol A diphenyl ether bis At least one of maleimide, polyphenylmethanemaleimide, and oligomers thereof, and a diamine condensate having a maleimide skeleton. The oligomer is an oligomer obtained by condensing a compound having a maleimide group among monomers in the compound having a maleimide group.

市售之具有馬來醯亞胺基之化合物,可列舉BMI-1000(4,4’-二苯基甲烷雙馬來醯亞胺、大和化成工業公司製)、BMI-2300(苯基甲烷雙馬來醯亞胺、大和化成工業公司製)、BMI-3000(m-伸苯基雙馬來醯亞胺、大和化成工業公司製)、BMI-5100(3,3’-二甲基-5,5’-二甲基-4,4’-二苯基甲烷雙馬來醯亞胺、大和化成工業公司製)、BMI-7000(4-甲基-1,3,-伸苯基雙馬來醯亞胺、大和化成工業公司製)、BMI-TMH((1,6-雙馬來醯亞胺-2,2,4-三甲基)己烷、大和化成工業公司製)、MIR-3000(聯苯芳烷基型馬來醯亞胺、日本化藥公司製)等。Commercially available compounds having a maleimidine group include BMI-1000 (4,4'-diphenylmethanebismaleimide, manufactured by Daiwa Chemical Industry Co., Ltd.), and BMI-2300 (phenylmethanebisimide Maleimide, manufactured by Yamato Chemical Industry Co., Ltd.), BMI-3000 (m-phenylene bismaleimide, manufactured by Daiwa Chemical Industry Co., Ltd.), BMI-5100 (3,3'-dimethyl-5 , 5'-dimethyl-4,4'-diphenylmethane bismaleimide, manufactured by Daiwa Chemical Industry Co., Ltd.), BMI-7000 (4-methyl-1,3, -phenylene bismaline Laimide, manufactured by Daiwa Chemical Industry Co., Ltd., BMI-TMH ((1,6-bismaleimide-2,2,4-trimethyl) hexane, manufactured by Daiwa Chemical Industry Co., Ltd.), MIR- 3000 (biphenylaralkyl maleimide, manufactured by Nippon Kayaku Co., Ltd.) and the like.

硬化劑之摻合量,例如於組成物之固體成分總量中,為0.01~30質量%。The blending amount of the hardener is, for example, 0.01 to 30% by mass of the total solid content of the composition.

(熱可塑性樹脂)
本發明之硬化性樹脂組成物,為了提高所得硬化膜之機械強度,可進一步含有熱可塑性樹脂。熱可塑性樹脂,較佳為對溶劑可溶。對溶劑可溶時,乾膜化後柔軟性提高,可抑制龜裂產生或落粉。熱可塑性樹脂,可列舉熱可塑性聚羥基聚醚樹脂,或表氯醇與各種2官能酚化合物的縮合物之苯氧基樹脂或將其骨架所存在之羥基醚部的羥基使用各種酸酐或酸氯化物酯化而得的苯氧基樹脂、聚乙烯基縮醛樹脂、聚醯胺樹脂、聚醯胺醯亞胺樹脂、嵌段共聚物、橡膠粒子等。熱可塑性樹脂可1種單獨或組合2種以上使用。
(Thermoplastic resin)
In order to improve the mechanical strength of the obtained cured film, the curable resin composition of the present invention may further contain a thermoplastic resin. The thermoplastic resin is preferably soluble in a solvent. When soluble in a solvent, the softness of the film after drying is improved, and the occurrence of cracks or powder falling can be suppressed. Examples of the thermoplastic resin include thermoplastic polyhydroxy polyether resins, phenoxy resins which are condensates of epichlorohydrin and various bifunctional phenol compounds, or various acid anhydrides or acid chlorides for the hydroxyl groups of the hydroxy ether portion in the skeleton. Phenoxy resin, polyvinyl acetal resin, polyamide resin, polyamidamine resin, block copolymer, rubber particles, etc., obtained by esterification of a compound. The thermoplastic resin may be used singly or in combination of two or more kinds.

熱可塑性樹脂之摻合量,例如於組成物之固體成分總量中,為0.01~10質量%。The blending amount of the thermoplastic resin is, for example, 0.01 to 10% by mass based on the total solid content of the composition.

(著色劑)
本發明之硬化性樹脂組成物中,亦可含有著色劑。著色劑可使用紅、藍、綠、黃、黑、白等之公知著色劑,可為顏料、染料、色素之任意者。惟就減低環境負荷以及對人體之影響的觀點,較佳不含有鹵素。著色劑,可1種單獨或組合2種以上使用。
(Colorant)
The curable resin composition of the present invention may contain a colorant. As the colorant, known colorants such as red, blue, green, yellow, black, white, and the like can be used, and any of pigments, dyes, and pigments can be used. However, from the viewpoint of reducing the environmental load and the influence on the human body, it is preferable not to contain halogen. The colorant can be used alone or in combination of two or more kinds.

著色劑之摻合量,例如於組成物之固體成分總量中,為0.01~10質量%。The blending amount of the colorant is, for example, 0.01 to 10% by mass based on the total solid content of the composition.

(有機溶劑)
本發明之硬化性樹脂組成物中,以組成物之調製,或對基板或載體薄膜塗佈時的黏度調整等為目的,可含有有機溶劑。有機溶劑可使用甲基乙基酮、環己酮等之酮類;甲苯、二甲苯、四甲苯等之芳香族烴類;賽珞蘇、甲基賽珞蘇、丁基賽珞蘇、卡必醇、甲基卡必醇、丁基卡必醇、丙二醇單甲基醚、二丙二醇單甲基醚、二丙二醇二乙基醚、二乙二醇單甲基醚乙酸酯、三丙二醇單甲基醚等之二醇醚類;乙酸乙酯、乙酸丁酯、乳酸丁酯、賽珞蘇乙酸酯、丁基賽珞蘇乙酸酯、卡必醇乙酸酯、丁基卡必醇乙酸酯、丙二醇單甲基醚乙酸酯、二丙二醇單甲基醚乙酸酯、碳酸伸丙酯等之酯類;辛烷、癸烷等之脂肪族烴類;石油醚、石油腦、溶劑石油腦等之石油系溶劑等公知慣用的有機溶劑。此等之有機溶劑可單獨,或組合二種以上使用。
(Organic solvents)
The curable resin composition of the present invention may contain an organic solvent for the purpose of preparing the composition or adjusting the viscosity when coating the substrate or the carrier film. As the organic solvent, ketones such as methyl ethyl ketone and cyclohexanone; aromatic hydrocarbons such as toluene, xylene, and tetramethylbenzene; cyperidine, methyl cyperidine, butyl cyperazole, and carbitur Alcohol, methylcarbitol, butylcarbitol, propylene glycol monomethyl ether, dipropylene glycol monomethyl ether, dipropylene glycol diethyl ether, diethylene glycol monomethyl ether acetate, tripropylene glycol monomethyl ether Glycol ethers such as ethyl ether; ethyl acetate, butyl acetate, butyl lactate, cyperidine acetate, butyl cyperidine acetate, carbitol acetate, butylcarbitol ethyl Esters of acetic acid, propylene glycol monomethyl ether acetate, dipropylene glycol monomethyl ether acetate, propylene carbonate, etc .; aliphatic hydrocarbons such as octane, decane; petroleum ether, petroleum naphtha, solvents Well-known and commonly used organic solvents such as petroleum solvents such as petroleum naphtha. These organic solvents may be used alone or in combination of two or more.

(其他任意成分)
進一步地,本發明之硬化性樹脂組成物中,亦可摻合電子材料之領域中公知慣用的其他添加劑。其他添加劑可列舉熱聚合抑制劑、紫外線吸收劑、矽烷偶合劑、可塑劑、難燃劑、抗靜電劑、抗老化劑、抗氧化劑、抗菌・防黴劑、消泡劑、調平劑、增黏劑、密合性賦予劑、搖變性賦予劑、光起始助劑、增感劑、有機填充劑、彈性體、脫模劑、表面處理劑、分散劑、分散助劑、表面改質劑、安定劑、螢光體等。
(Other optional ingredients)
Further, the curable resin composition of the present invention may be blended with other additives commonly used in the field of electronic materials. Other additives include thermal polymerization inhibitors, ultraviolet absorbers, silane coupling agents, plasticizers, flame retardants, antistatic agents, anti-aging agents, antioxidants, antibacterial and antifungal agents, defoamers, leveling agents, and additives. Adhesives, adhesion-imparting agents, shake modifiers, light-starting aids, sensitizers, organic fillers, elastomers, mold release agents, surface treatment agents, dispersants, dispersion aids, surface modifiers , Stabilizers, phosphors, etc.

又,本發明之硬化性樹脂組成物,在不損及本發明之效果的範圍,亦可含有前述表面處理二氧化矽粒子以外之公知慣用的無機填充劑。如此之無機填充劑,例如可列舉前述表面處理二氧化矽粒子以外之二氧化矽、Neuburg矽土、氫氧化鋁、玻璃粉末、滑石、黏土、碳酸鎂、碳酸鈣、天然雲母、合成雲母、氫氧化鋁、硫酸鋇、鈦酸鋇、氧化鐵、非纖維狀玻璃、水滑石、礦物綿、矽酸鋁、矽酸鈣、鋅華等之無機填充劑。The curable resin composition of the present invention may contain a well-known and commonly used inorganic filler other than the surface-treated silica particles as long as the effect of the present invention is not impaired. Examples of such inorganic fillers include silicon dioxide other than the surface-treated silica particles, Neuburg silica, aluminum hydroxide, glass powder, talc, clay, magnesium carbonate, calcium carbonate, natural mica, synthetic mica, and hydrogen. Inorganic fillers such as alumina, barium sulfate, barium titanate, iron oxide, non-fibrous glass, hydrotalcite, mineral wool, aluminum silicate, calcium silicate, zinc bloom, etc.

本發明之硬化性樹脂組成物並無特殊限定,例如可為熱硬化性樹脂組成物、光硬化性樹脂組成物、光硬化性熱硬化性樹脂組成物、感光性熱硬化性樹脂組成物之任意者。又,可為鹼顯像型、可為負型亦可為正型。具體例子可列舉熱硬化性樹脂組成物、光硬化性熱硬化性樹脂組成物、含有光聚合起始劑之光硬化性熱硬化性樹脂組成物、含有光鹼產生劑之光硬化性熱硬化性樹脂組成物、負型光硬化性熱硬化性樹脂組成物及正型感光性熱硬化性樹脂組成物、鹼顯像型光硬化性熱硬化性樹脂組成物、溶劑顯像型光硬化性熱硬化性樹脂組成物、膨潤剝離型熱硬化性樹脂組成物、溶解剝離型熱硬化性樹脂組成物等,但不限定於此等。The curable resin composition of the present invention is not particularly limited, and may be any of a thermosetting resin composition, a photocurable resin composition, a photocurable thermosetting resin composition, and a photosensitive thermosetting resin composition. By. Moreover, it may be an alkali imaging type, a negative type, or a positive type. Specific examples include a thermosetting resin composition, a photocurable thermosetting resin composition, a photocurable thermosetting resin composition containing a photopolymerization initiator, and a photocurable thermosetting resin containing a photobase generator. Resin composition, negative photocurable thermosetting resin composition, positive photosensitive thermosetting resin composition, alkali developing photocurable thermosetting resin composition, solvent developing photocuring thermosetting A flexible resin composition, a swelling and peeling type thermosetting resin composition, a dissolution and peeling type thermosetting resin composition, and the like are not limited thereto.

本發明之硬化性樹脂組成物所含有的任意成分,只要配合硬化性或用途,來選擇公知慣用之成分即可。The arbitrary components contained in the curable resin composition of the present invention may be selected from known and commonly used components in accordance with the curability and application.

例如,本發明之硬化性樹脂組成物為(不含光聚合起始劑之)熱硬化性樹脂組成物時,係含有熱硬化性樹脂。又,較佳為含有硬化促進劑。較佳為含有硬化劑。熱硬化性樹脂之摻合量,於組成物之固體成分總量中,較佳為1~50質量%。硬化促進劑之摻合量,於組成物之固體成分總量中,較佳為0.01~30質量%。硬化劑之摻合量,於組成物之固體成分總量中,較佳為0.01~30質量%。For example, when the curable resin composition of the present invention is a thermosetting resin composition (without a photopolymerization initiator), it contains a thermosetting resin. Moreover, it is preferable to contain a hardening accelerator. It is preferable to contain a hardening | curing agent. The blending amount of the thermosetting resin is preferably 1 to 50% by mass of the total solid content of the composition. The blending amount of the hardening accelerator is preferably 0.01 to 30% by mass of the total solid content of the composition. The blending amount of the hardener is preferably 0.01 to 30% by mass of the total solid content of the composition.

又,本發明之硬化性樹脂組成物,為光硬化性熱硬化性樹脂組成物時,係含有光硬化性樹脂、熱硬化性樹脂與光反應起始劑。為鹼顯像型時,光硬化性樹脂可為鹼可溶性樹脂,亦可進一步含有鹼可溶性樹脂。又,較佳為含有硬化促進劑。鹼可溶性樹脂之摻合量,於組成物之固體成分總量中,較佳為5~50質量%。熱硬化性樹脂之摻合量,於組成物之固體成分總量中,較佳為1~50質量%。光硬化性樹脂(光硬化性之鹼可溶性樹脂除外)之摻合量,於組成物之固體成分總量中,較佳為1~50質量%。光反應起始劑之摻合量,於組成物之固體成分總量中,較佳為0.01~30質量%。硬化促進劑之摻合量,於組成物之固體成分總量中,較佳為0.01~30質量%。Moreover, when the curable resin composition of this invention is a photocurable thermosetting resin composition, it contains a photocurable resin, a thermosetting resin, and a photoreaction initiator. In the case of an alkali developing type, the photocurable resin may be an alkali-soluble resin, or may further contain an alkali-soluble resin. Moreover, it is preferable to contain a hardening accelerator. The blending amount of the alkali-soluble resin is preferably 5 to 50% by mass of the total solid content of the composition. The blending amount of the thermosetting resin is preferably 1 to 50% by mass of the total solid content of the composition. The blending amount of the photocurable resin (except for the photocurable alkali-soluble resin) is preferably 1 to 50% by mass of the total solid content of the composition. The blending amount of the photoreaction initiator is preferably 0.01 to 30% by mass of the total solid content of the composition. The blending amount of the hardening accelerator is preferably 0.01 to 30% by mass of the total solid content of the composition.

本發明之硬化性樹脂組成物,可經乾膜化使用亦可作為液狀使用。作為液狀使用時,可為1液性亦可為2液性以上。The curable resin composition of the present invention can be used as a dry film or as a liquid. When it is used as a liquid, it may be one liquid or two liquid or more.

本發明之乾膜,具有藉由於載體薄膜上,塗佈本發明之硬化性樹脂組成物並乾燥而得到之樹脂層。形成乾膜時,首先將本發明之硬化性樹脂組成物以上述有機溶劑稀釋而調整為適當黏度後,藉由缺角輪塗佈器、刮刀塗佈器、唇口塗佈器、棒式塗佈器、擠壓式塗佈器、逆輥塗佈器、轉送輥塗佈器、凹版塗佈器、噴霧塗佈器等,於載體薄膜上塗佈為均勻厚度。之後,藉由將經塗佈之組成物,通常於40~130℃之溫度乾燥1~30分鐘,可形成樹脂層。塗佈膜厚並無特殊限制,一般而言以乾燥後之膜厚計,係於3~150μm、較佳為5~60μm之範圍適當選擇。The dry film of the present invention has a resin layer obtained by coating and curing the curable resin composition of the present invention on a carrier film. When forming a dry film, the curable resin composition of the present invention is first diluted with the above-mentioned organic solvent and adjusted to an appropriate viscosity, and then is cut off by a notch wheel applicator, a doctor blade applicator, a lip applicator, and a bar coater. A carrier, a squeeze coater, a reverse roll coater, a transfer roll coater, a gravure coater, a spray coater, etc. are applied to the carrier film to a uniform thickness. Thereafter, the coated composition is dried at a temperature of 40 to 130 ° C. for 1 to 30 minutes to form a resin layer. The coating film thickness is not particularly limited. Generally speaking, it is appropriately selected in a range of 3 to 150 μm, preferably 5 to 60 μm, based on the film thickness after drying.

作為載體薄膜,可使用塑膠膜,例如可使用聚對苯二甲酸乙二酯(PET)等之聚酯薄膜、聚醯亞胺薄膜、聚醯胺醯亞胺薄膜、聚丙烯薄膜、聚苯乙烯薄膜等。載體薄膜之厚度並無特殊限制,一般而言係於10~150μm之範圍適當選擇。更佳為15~130μm之範圍。As the carrier film, a plastic film can be used. For example, polyester film such as polyethylene terephthalate (PET), polyimide film, polyimide film, polypropylene film, polystyrene can be used. Film, etc. The thickness of the carrier film is not particularly limited, and is generally appropriately selected in a range of 10 to 150 μm. A more preferable range is 15 to 130 μm.

於載體薄膜上形成由本發明之硬化性樹脂組成物所構成的樹脂層後,較佳為以防止灰塵附著於樹脂層表面等為目的,進一步於樹脂層表面層合可剝離之覆蓋膜。可剝離之覆蓋膜,例如可使用聚乙烯薄膜或聚四氟乙烯薄膜、聚丙烯薄膜、經表面處理之紙等。作為覆蓋膜,只要係剝離覆蓋膜時,較樹脂層與載體薄膜之接著力更小者即可。After forming a resin layer composed of the curable resin composition of the present invention on a carrier film, it is preferable to further laminate a peelable cover film on the surface of the resin layer for the purpose of preventing dust from adhering to the surface of the resin layer. The peelable cover film can be, for example, a polyethylene film or a polytetrafluoroethylene film, a polypropylene film, or a surface-treated paper. As the cover film, as long as the cover film is peeled off, the adhesive force between the resin layer and the carrier film is smaller.

再者,本發明中,亦可為藉由於上述覆蓋膜上塗佈本發明之硬化性樹脂組成物並乾燥,形成樹脂層,且於其表面層合載體薄膜者。亦即,本發明中製造乾膜時塗佈本發明之硬化性樹脂組成物的薄膜,係載體薄膜及覆蓋膜均可使用。In addition, in the present invention, the hardening resin composition of the present invention is coated on the cover film and dried to form a resin layer, and a carrier film is laminated on the surface. That is, in the present invention, when the dry film is produced, the thin film, the carrier film, and the cover film that are applied to the curable resin composition of the present invention can be used.

使用本發明之硬化性樹脂組成物的印刷配線板之製造方法,只要使用以往公知之方法即可。以鹼顯像型之光硬化性熱硬化性樹脂組成物為例時,例如,將本發明之硬化性樹脂組成物,使用上述有機溶劑調整為適於塗佈方法的黏度,藉由浸漬塗佈法、流動塗佈法、輥塗佈法、棒塗佈法、網版印刷法、淋幕塗佈法等之方法塗佈於基材上後,藉由於60~100℃之溫度將組成物中所含有的有機溶劑揮發乾燥(臨時乾燥),形成不黏性的樹脂層。又,乾膜的情況時,係藉由疊合機等以樹脂層與基材接觸的方式貼合於基材上後,藉由將載體薄膜剝離,於基材上形成樹脂層。As the method for producing a printed wiring board using the curable resin composition of the present invention, a conventionally known method may be used. When an alkali-developed photocurable thermosetting resin composition is used as an example, for example, the curable resin composition of the present invention is adjusted to a viscosity suitable for a coating method using the above-mentioned organic solvent, and is applied by dipping. Method, flow coating method, roll coating method, bar coating method, screen printing method, curtain coating method, etc. After coating on the substrate, the composition is applied at a temperature of 60 to 100 ° C. The contained organic solvent is evaporated and dried (temporarily dried) to form a non-sticky resin layer. In the case of a dry film, a resin layer is formed on the substrate after the carrier film is peeled off after being bonded to the substrate by a laminator or the like so that the resin layer is in contact with the substrate.

上述基板,可列舉預先以銅等形成有電路之印刷配線板或可撓印刷配線板,此外可列舉利用使用了紙酚、紙環氧樹脂、玻璃布環氧樹脂、玻璃聚醯亞胺、玻璃布/不纖布環氧樹脂、玻璃布/紙環氧樹脂、合成纖維環氧樹脂、氟樹脂/聚乙烯/聚苯醚、聚苯醚/氰酸酯等的高頻電路用覆銅層合板等之材質者,且係全部等級(FR-4等)之覆銅層合板,其他可列舉金屬基板、聚醯亞胺薄膜、PET薄膜、聚萘二甲酸乙二酯(PEN)薄膜、玻璃基板、陶瓷基板、晶圓板等。對電路亦可實施前處理,例如能夠以四國化成公司製之GliCAP、MEC公司製之New Organic AP(Adhesion promoter)、Atotech Japan公司製之Nova Bond等實施前處理,來提高防焊劑等與硬化被膜的密合性等,或者以防鏽劑實施前處理。Examples of the substrate include a printed wiring board or a flexible printed wiring board in which a circuit is formed with copper or the like in advance. In addition, the use of paper phenol, paper epoxy resin, glass cloth epoxy resin, glass polyimide, and glass is used. Cloth / non-fiber cloth epoxy resin, glass cloth / paper epoxy resin, synthetic fiber epoxy resin, fluororesin / polyethylene / polyphenylene ether, polyphenylene ether / cyanate, etc. And other materials, and all grades (FR-4, etc.) copper-clad laminates, others include metal substrates, polyimide films, PET films, polyethylene naphthalate (PEN) films, glass substrates , Ceramic substrate, wafer board, etc. Pre-processing can also be performed on the circuit. For example, GliCAP manufactured by Shikoku Kasei Corporation, New Organic AP (Adhesion promoter) manufactured by MEC Corporation, Nova Bond manufactured by Atotech Japan Corporation, etc. can be used to improve solder resist and curing Adhesiveness of the film, etc., or pretreatment with a rust inhibitor.

塗佈本發明之硬化性樹脂組成物後所進行的揮發乾燥,可使用熱風循環式乾燥爐、IR爐、加熱板、對流烘箱等(使用具備以蒸氣之空氣加熱方式的熱源者,使乾燥機內之熱風逆流接觸之方法及由噴嘴對支持體吹送的方式)來進行。The volatilizing drying performed after the application of the curable resin composition of the present invention can be performed using a hot-air circulation type drying furnace, an IR furnace, a heating plate, a convection oven, etc. The method of contacting the hot air in the counter current and the method of blowing the support from the nozzle) is performed.

於印刷配線板上形成樹脂層後,通過形成有特定圖型之光罩選擇性地以活性能量線曝光,將未曝光部以稀鹼水溶液(例如0.3~3質量%碳酸鈉水溶液)顯像,形成硬化物之圖型。進一步地對硬化物照射活性能量線後加熱硬化(例如100~220℃),或加熱硬化後照射活性能量線,或僅以加熱硬化進行最終修整硬化(正式硬化),藉以形成密合性、硬度等之各特性優良的硬化膜。After the resin layer is formed on the printed wiring board, a mask with a specific pattern is formed to selectively expose it with active energy rays, and the unexposed portion is developed with a dilute aqueous alkali solution (for example, 0.3 to 3% by mass sodium carbonate aqueous solution). Form a pattern of hardened objects. Further, the hardened object is irradiated with active energy rays and then heat-cured (for example, 100 to 220 ° C.), or heat-cured and irradiated with active energy rays, or is subjected to final trimming and hardening (formal hardening) only by heating and hardening to form adhesion and hardness A cured film with excellent properties.

上述活性能量線照射所用的曝光機,只要係搭載高壓水銀燈、超高壓水銀燈、金屬鹵化物燈、水銀短弧燈等,且於350~450nm之範圍照射紫外線之裝置即可,進而亦可使用作為與基板非接觸之無遮罩曝光而使用了投影透鏡的投影曝光機或直接描繪裝置(例如藉由來自電腦之CAD數據而直接以雷射描繪影像之雷射直接成像裝置)。直描機之燈光源或雷射光源,可為最大波長350~450nm之範圍者。用於形成影像之曝光量雖依膜厚等而異,一般而言可為10~1000mJ/cm2 、較佳為20~800 mJ/cm2 之範圍內。The exposure machine used for the above active energy ray irradiation may be a device equipped with a high-pressure mercury lamp, an ultra-high-pressure mercury lamp, a metal halide lamp, a mercury short-arc lamp, and the like, and irradiates ultraviolet rays in the range of 350 to 450 nm. A projection exposure machine using a projection lens or a direct drawing device (for example, a laser direct imaging device that draws an image directly with a laser by using CAD data from a computer) without masking exposure without contacting the substrate. The light source or laser light source of the direct scan machine can be a maximum wavelength of 350 ~ 450nm. Although the exposure amount used to form an image varies depending on the film thickness and the like, it can generally be in the range of 10 to 1000 mJ / cm 2 , preferably 20 to 800 mJ / cm 2 .

上述顯像方法,能夠以浸漬法、淋洗法、噴霧法、毛刷法等進行,顯像液可使用氫氧化鉀、氫氧化鈉、碳酸鈉、碳酸鉀、磷酸鈉、矽酸鈉、氨、胺類等之鹼水溶液。The above-mentioned development method can be performed by a dipping method, a rinsing method, a spray method, a brush method, or the like, and the developing solution can be potassium hydroxide, sodium hydroxide, sodium carbonate, potassium carbonate, sodium phosphate, sodium silicate, ammonia , Amines and other alkaline aqueous solutions.

本發明之硬化性樹脂組成物,適合使用於在電子零件形成硬化膜,特別是在印刷配線板上形成硬化膜,更適合使用於形成永久被膜,又更適合使用於形成防焊劑、層間絕緣層、包覆層、密封材。例如,本發明之硬化性樹脂組成物,亦可為鹼顯像型,且用以形成層間絕緣層者。又,適合形成要求高度信賴性的印刷配線板,例如封裝基板、特別是FC-BGA用之永久被膜(特別是防焊劑)。又,本發明之硬化性樹脂組成物,亦可適合使用於即使電路表面之粗度小亦具備配線圖型的印刷配線板,例如高頻用之印刷配線板。例如,即使表面粗度Ra為0.05μm以下、特別是0.03μm以下,亦可適合地使用。又,亦可適合地使用於在低極性之基材,例如含有活性酯之基材上形成硬化膜的情況。再者,亦適合使用於在無粗化的晶圓或玻璃基板上形成硬化膜。The curable resin composition of the present invention is suitable for forming a hardened film on an electronic part, especially a hardened film on a printed wiring board. It is more suitable for forming a permanent film, and is more suitable for forming a solder resist and an interlayer insulating layer. , Coating, sealing material. For example, the curable resin composition of the present invention may be an alkali developing type and used to form an interlayer insulating layer. Moreover, it is suitable for forming a printed wiring board which requires high reliability, such as a package substrate, especially a permanent film (especially a solder resist) for FC-BGA. The curable resin composition of the present invention can also be suitably used for a printed wiring board having a wiring pattern even if the thickness of the circuit surface is small, such as a high-frequency printed wiring board. For example, even if the surface roughness Ra is 0.05 μm or less, particularly 0.03 μm or less, it can be suitably used. Moreover, it can be used suitably also when forming a hardened film on a base material with low polarity, for example, a base material containing an active ester. Furthermore, it is also suitable for forming a cured film on a wafer or a glass substrate without roughening.

本發明之層合構造體,為含有樹脂硬化層(A),與鄰接於前述樹脂硬化層(A)之樹脂硬化層(B)或基板(C)的構造體,其特徵為前述樹脂硬化層(A),為本發明之硬化性樹脂組成物或本發明之乾膜之樹脂層之硬化物,且前述樹脂硬化層(B)或基板(C)之仄他電位非為正。The laminated structure of the present invention is a structure comprising a resin hardened layer (A) and a resin hardened layer (B) or a substrate (C) adjacent to the resin hardened layer (A), which is characterized by the resin hardened layer (A) is the hardened resin composition of the present invention or the hardened resin layer of the dry film of the present invention, and the other potential of the resin hardened layer (B) or the substrate (C) is not positive.

如上所述,本發明中,藉由以二氧化矽粒子之仄他電位成為正的方式進行表面處理,可抑制密合性之降低,因此可製造層間之密合性優良的層合構造體。As described above, in the present invention, by performing surface treatment such that the other potential of the silicon dioxide particles becomes positive, a decrease in adhesion can be suppressed, and thus a laminated structure having excellent adhesion between layers can be produced.

本發明之硬化性樹脂組成物,可適合使用作為用以形成半導體封裝構成材料之組成物。The curable resin composition of the present invention can be suitably used as a composition for forming a semiconductor package constituent material.

本發明之層合構造體中之樹脂硬化層(A)、(B)及基板(C)的厚度並無特殊限定。The thicknesses of the resin hardened layers (A), (B) and the substrate (C) in the laminated structure of the present invention are not particularly limited.

樹脂硬化層(A)及樹脂硬化層(B)之組合並無特殊限定,例如可列舉如於圖1中示意性顯示的層合構造體中所包含之防焊劑13與層間絕緣材11、防焊劑13與底部填充劑16、防焊劑13與密封材17之組合。上述組合中樹脂硬化層(A)及(B)係何者皆可,但較佳為樹脂硬化層(A)為防焊劑。此處,藉由對層間絕緣材11、防焊劑13、底部填充劑16、密封材17之任一者填充仄他電位為正的表面處理二氧化矽粒子,與鄰接於此等之樹脂硬化層的密合性成為良好。The combination of the resin hardened layer (A) and the resin hardened layer (B) is not particularly limited, and examples thereof include the solder resist 13 and the interlayer insulating material 11 and A combination of the flux 13 and the underfill 16, and the solder resist 13 and the sealing material 17. Any of the resin hardened layers (A) and (B) may be used in the above combination, but the resin hardened layer (A) is preferably a solder resist. Here, any one of the interlayer insulating material 11, the solder resist 13, the underfill material 16, and the sealing material 17 is filled with surface-treated silica particles having a positive potential, and a resin hardened layer adjacent thereto. The adhesion becomes good.

又,樹脂硬化層(A)及基板(C)之組合並無特殊限定,例如,可列舉如於圖1中示意性顯示的層合構造體中所包含之防焊劑(A)13與層間絕緣材(C)11、防焊劑(A)13與半導體晶圓(C)15、底部填充劑(A)16與半導體晶圓(C)15、密封材(A)17與半導體晶圓(C)15之組合。The combination of the resin hardened layer (A) and the substrate (C) is not particularly limited, and examples thereof include the solder resist (A) 13 and the interlayer insulation included in the laminated structure shown schematically in FIG. 1. Material (C) 11, solder resist (A) 13 and semiconductor wafer (C) 15, underfill (A) 16 and semiconductor wafer (C) 15, sealing material (A) 17 and semiconductor wafer (C) 15 combinations.

樹脂硬化層(B)及基板(C)之表面,只要係仄他電位非為正者即可,0或負者即可。

[實施例]
The surfaces of the resin hardened layer (B) and the substrate (C) need only be those in which the other potential is not positive, and 0 or negative.

[Example]

以下使用實施例以更詳細說明本發明,但本發明不限定於下述實施例。再者,以下有記載為「份」及「%」者,只要無特別指明,均為質量基準。The following examples are used to explain the present invention in more detail, but the present invention is not limited to the following examples. In addition, the following are recorded as "part" and "%", unless otherwise specified, they are all based on quality.

[鹼可溶性樹脂之合成]
(鹼可溶性樹脂A-1之合成)
於具備冷卻管、攪拌機之燒瓶中,給入雙酚A 456份、水228份、37%福馬林649份,保持40℃以下之溫度,添加25%氫氧化鈉水溶液228份。添加結束後於50℃反應10小時。反應結束後冷卻至40℃,一邊保持40℃以下一邊以37.5%磷酸水溶液中和至pH4。之後靜置而將水層分離。分離後添加甲基異丁基酮300份均勻溶解後,以蒸餾水500份洗淨3次,於50℃以下之溫度且減壓下,去除水、溶劑等。將所得之聚羥甲基化合物溶解於甲醇550份,得到聚羥甲基化合物之甲醇溶液1230份。
將所得聚羥甲基化合物之甲醇溶液的一部分於真空乾燥機中室溫下乾燥後,固體成分為55.2%。
於具備冷卻管、攪拌機之燒瓶中,給入所得之聚羥甲基化合物之甲醇溶液500份、2,6-二甲酚440份,於50℃均勻溶解。均勻溶解後於50℃以下之溫度,減壓下去除甲醇。之後添加草酸8份,於100℃反應10小時。反應結束後於180℃、50mmHg之減壓下將餾出成分去除,得到酚醛清漆樹脂A 550份。
於具備溫度計、氮導入裝置兼環氧烷導入裝置及攪拌裝置之熱壓釜中,給入酚醛清漆樹脂A 130份、50%氫氧化鈉水溶液2.6份、甲苯/甲基異丁基酮(質量比=2/1)100份,一邊攪拌一邊將系統內以氮取代,接著加熱昇溫,於150℃、8kg/cm2 將環氧丙烷60份慢慢導入進行反應。反應係持續約4小時至表壓力成為0.0kg/cm2 後,冷卻至室溫。對該反應溶液添加混合3.3份之36%鹽酸水溶液,將氫氧化鈉中和。將該中和反應生成物以甲苯稀釋,水洗3次,以蒸發器脫溶劑,得到羥基價189g/eq.之酚醛清漆樹脂A的環氧丙烷加成物。此係每1當量酚性羥基平均加成1莫耳環氧丙烷者。
將所得之酚醛清漆樹脂A的環氧丙烷加成物189份、丙烯酸36份、p-甲苯磺酸3.0份、氫醌單甲基醚0.1份、甲苯140份給入具備攪拌機、溫度計、空氣吹入管之反應器,一邊吹入空氣一邊攪拌,昇溫至115℃,一邊將反應所生成之水與甲苯作為共沸混合物而餾去,並且進一步反應4小時後,冷卻至室溫。將所得之反應溶液使用5%NaCl水溶液進行水洗,以減壓餾去而去除甲苯後,添加二乙二醇單乙基醚乙酸酯,得到固體成分67%之丙烯酸酯樹脂溶液。
接著,於附有攪拌器及回流冷卻器之4口燒瓶,給入所得之丙烯酸酯樹脂溶液322份、氫醌單甲基醚0.1份、三苯基膦0.3份,將該混合物加熱至110℃,添加四氫鄰苯二甲酸酐60份,反應4小時,冷卻後取出。如此所得之感光性的含羧基之樹脂溶液,為固體成分70%、固體成分酸價81mgKOH/g。以下,將該含羧基之感光性樹脂的溶液稱為樹脂溶液A-1。
[Synthesis of alkali-soluble resin]
(Synthesis of alkali-soluble resin A-1)
In a flask equipped with a cooling tube and a stirrer, 456 parts of bisphenol A, 228 parts of water, and 649 parts of 37% formalin were kept, and the temperature was kept below 40 ° C, and 228 parts of a 25% sodium hydroxide aqueous solution was added. After the addition was completed, the reaction was carried out at 50 ° C for 10 hours. After the completion of the reaction, it was cooled to 40 ° C, and neutralized to a pH of 4 with a 37.5% phosphoric acid aqueous solution while maintaining the temperature below 40 ° C. Then, it stood still and separated the water layer. After the separation, 300 parts of methyl isobutyl ketone was added to dissolve uniformly, and then washed three times with 500 parts of distilled water, and the water and the solvent were removed under a reduced pressure at a temperature of 50 ° C or lower. The obtained polymethylol compound was dissolved in 550 parts of methanol to obtain 1,230 parts of a polymethylol compound in methanol solution.
A part of the methanol solution of the obtained polymethylol compound was dried in a vacuum dryer at room temperature, and the solid content was 55.2%.
In a flask equipped with a cooling tube and a stirrer, 500 parts of the methanol solution of the obtained polymethylol compound and 440 parts of 2,6-xylenol were fed, and uniformly dissolved at 50 ° C. After homogeneous dissolution, at a temperature below 50 ° C, methanol was removed under reduced pressure. Then, 8 parts of oxalic acid was added, and it was made to react at 100 degreeC for 10 hours. After the reaction was completed, the distillate component was removed under a reduced pressure of 180 ° C. and 50 mmHg to obtain 550 parts of novolac resin A.
In a autoclave equipped with a thermometer, a nitrogen introduction device, an alkylene oxide introduction device, and a stirring device, 130 parts of novolac resin A, 2.6 parts of 50% sodium hydroxide aqueous solution, and toluene / methyl isobutyl ketone (mass Ratio = 2/1) 100 parts, while replacing the inside of the system with nitrogen while stirring, and then heating up the temperature, 60 parts of propylene oxide was slowly introduced at 150 ° C and 8 kg / cm 2 to react. The reaction system continued for about 4 hours until the gauge pressure became 0.0 kg / cm 2 , and then cooled to room temperature. To this reaction solution, 3.3 parts of a 36% aqueous hydrochloric acid solution was added and mixed to neutralize sodium hydroxide. This neutralization reaction product was diluted with toluene, washed three times with water, and desolvated with an evaporator to obtain a propylene oxide adduct of novolak resin A having a hydroxyl value of 189 g / eq. This is an average addition of 1 mole of propylene oxide per phenolic hydroxyl group.
189 parts of propylene oxide adduct of the obtained novolak resin A, 36 parts of acrylic acid, 3.0 parts of p-toluenesulfonic acid, 0.1 parts of hydroquinone monomethyl ether, and 140 parts of toluene were fed to a mixer, a thermometer, and an air blower. The reactor that was introduced into the tube was stirred while blowing air, and heated to 115 ° C. The water and toluene produced by the reaction were distilled off as an azeotrope, and after reacting for 4 hours, it was cooled to room temperature. The obtained reaction solution was washed with a 5% NaCl aqueous solution and distilled off under reduced pressure to remove toluene, and then diethylene glycol monoethyl ether acetate was added to obtain an acrylic resin solution having a solid content of 67%.
Next, in a 4-neck flask equipped with a stirrer and a reflux cooler, 322 parts of the obtained acrylate resin solution, 0.1 part of hydroquinone monomethyl ether, and 0.3 part of triphenylphosphine were fed, and the mixture was heated to 110 ° C. Then, 60 parts of tetrahydrophthalic anhydride was added, the reaction was performed for 4 hours, and the mixture was taken out after cooling. The photosensitive carboxyl group-containing resin solution thus obtained had a solid content of 70% and a solid content acid value of 81 mgKOH / g. Hereinafter, this carboxyl group-containing photosensitive resin solution is referred to as a resin solution A-1.

[二氧化矽粒子之表面處理]
(實施例1所摻合的二氧化矽粒子:經鋁之水合氧化物被覆處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g之水漿體昇溫至70℃後,將20%鋁酸鈉(NaAlO2 )水溶液,對於二氧化矽粒子,以氧化鋁(Al2 O3 )換算添加2~3%。之後,添加20%氫氧化鈉水溶液,將pH調整為7,熟成30分鐘。之後,將漿體以壓濾機過濾水洗,真空乾燥,得到經鋁之水合氧化物被覆處理之二氧化矽粒子的固體物。
[Surface treatment of silicon dioxide particles]
(Silica dioxide particles blended in Example 1: silica particles coated with aluminum hydrated oxide)
After 50 g of an aqueous slurry of spherical silica particles (SFP-20M manufactured by Denka Corporation, average particle size: 0.4 μm) was heated to 70 ° C., a 20% sodium aluminate (NaAlO 2 ) aqueous solution was used for the silica particles. , Add 2 ~ 3% in the conversion of alumina (Al 2 O 3 ). Thereafter, a 20% sodium hydroxide aqueous solution was added to adjust the pH to 7, and the mixture was aged for 30 minutes. After that, the slurry was filtered and washed with a filter press, and dried under vacuum to obtain a solid substance of silica particles coated with aluminum hydrated oxide.

(實施例2所摻合的二氧化矽粒子:經鋯之水合氧化物被覆處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g之水漿體昇溫至70℃後,將100g/l氧氯化鋯等之水溶性鋯化合物之水溶液,對於二氧化矽粒子,以氧化鋯(ZrO2 )換算添加2~3%。之後,添加20%氫氧化鈉水溶液,將pH調整為7,熟成30分鐘。之後,將漿體以壓濾機過濾水洗,真空乾燥,得到經氧化鋯之水合氧化物被覆之二氧化矽粒子的固體物。
(Silica dioxide particles blended in Example 2: Silica particles coated with zirconium hydrated oxide)
After 50 g of an aqueous slurry of spherical silica particles (SFP-20M manufactured by Denka Corporation, average particle size: 0.4 μm) is heated to 70 ° C., an aqueous solution of a water-soluble zirconium compound such as zirconyl oxychloride is 100 g / 1 For silica particles, add 2 to 3% in terms of zirconia (ZrO 2 ). Thereafter, a 20% sodium hydroxide aqueous solution was added to adjust the pH to 7, and the mixture was aged for 30 minutes. After that, the slurry was filtered and washed with a filter press, and dried under vacuum to obtain a solid substance of silica particles coated with hydrated oxide of zirconia.

(實施例3所摻合的二氧化矽粒子:經鋅之水合氧化物被覆處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g之水漿體昇溫至70℃後,將硫酸鋅之水溶液,對於二氧化矽粒子,以ZnO換算添加2~3%。之後,添加20%氫氧化鈉水溶液,將pH調整為7,熟成30分鐘。之後,將漿體以壓濾機過濾水洗,真空乾燥,得到經鋅之水合氧化物被覆之二氧化矽粒子的固體物。
(Silica dioxide particles blended in Example 3: silica particles treated with zinc oxide hydrated oxide coating)
After heating 50 g of spherical silica particles (SFP-20M manufactured by Denka Corporation, average particle size: 0.4 μm) to 70 ° C., an aqueous solution of zinc sulfate was added to the silica particles in ZnO conversion to 2 ~ 3%. Thereafter, a 20% sodium hydroxide aqueous solution was added to adjust the pH to 7, and the mixture was aged for 30 minutes. After that, the slurry was filtered and washed with a filter press, and dried under vacuum to obtain a solid substance of silica particles coated with zinc hydrated oxide.

(實施例4所摻合的二氧化矽粒子:經鈦之水合氧化物被覆處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g之水漿體昇溫至70℃後,將100g/l硫酸氧鈦水溶液,對於二氧化矽粒子,以TiO2 換算添加2~3%。之後,添加20%氫氧化鈉水溶液,將pH調整為7,熟成30分鐘。之後,將漿體以壓濾機過濾水洗,真空乾燥,得到經鈦之水合氧化物被覆之二氧化矽粒子的固體物。
(Silica dioxide particles blended in Example 4: silica particles coated with titanium hydrated oxide)
A 50 g aqueous slurry of spherical silica particles (SFP-20M manufactured by Denka, average particle size: 0.4 μm) was heated to 70 ° C., and then a 100 g / l titanyl sulfate aqueous solution was used for the silica particles by TiO 2 conversions add 2 ~ 3%. Thereafter, a 20% sodium hydroxide aqueous solution was added to adjust the pH to 7, and the mixture was aged for 30 minutes. After that, the slurry was filtered and washed with a filter press, and dried under vacuum to obtain a solid substance of silica particles coated with titanium hydrated oxide.

(實施例5所摻合的二氧化矽粒子:經矽之水合氧化物被覆處理之後經鋁之水合氧化物被覆處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g之水漿體昇溫至70℃後,將10%矽酸鈉水溶液,對於二氧化矽粒子,以二氧化矽粒子換算添加1%。對該漿體添加鹽酸,使pH成為4,熟成30分鐘,進一步藉由鹽酸將pH維持為5±1,並且將20%鋁酸鈉(NaAlO2 )水溶液,對於二氧化矽粒子,以氧化鋁(Al2 O3 )換算添加5%。之後,添加20%氫氧化鈉水溶液,將pH調整為7,熟成30分鐘。之後,將漿體以壓濾機過濾水洗,真空乾燥,得到經矽之水合氧化物及鋁之水合氧化物被覆處理之二氧化矽粒子的固體物。
(Silicon dioxide particles blended in Example 5: silicon dioxide particles treated with aluminum hydrated oxide coating treatment after silicon hydrated oxide coating treatment)
50 g of an aqueous slurry of spherical silica particles (SFP-20M manufactured by Denka, average particle size: 0.4 μm) was heated to 70 ° C., and then a 10% sodium silicate aqueous solution was used to dissolve the silica particles in the form of dioxide. Add 1% in silicon particle conversion. Hydrochloric acid was added to the slurry, the pH was adjusted to 4, and the mixture was aged for 30 minutes. The pH was further maintained at 5 ± 1 by hydrochloric acid, and a 20% sodium aluminate (NaAlO 2 ) aqueous solution was used. (Al 2 O 3 ) converted and added 5%. Thereafter, a 20% sodium hydroxide aqueous solution was added to adjust the pH to 7, and the mixture was aged for 30 minutes. After that, the slurry was filtered and washed with a filter press, and vacuum dried to obtain a solid substance of silicon dioxide particles coated with a hydrated oxide of silicon and a hydrated oxide of aluminum.

(實施例6所摻合的二氧化矽粒子:經矽之水合氧化物被覆處理之後經鋯之水合氧化物被覆處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g之水漿體昇溫至70℃後,將10%矽酸鈉水溶液,對於二氧化矽粒子,以二氧化矽粒子換算添加1%。對該漿體添加鹽酸,使pH成為4,熟成30分鐘,進一步藉由鹽酸將pH維持為5±1,並且昇溫至40℃後,將100g/l氧氯化鋯水溶液,對於二氧化矽粒子,以ZrO2 換算添加5%。之後,添加20%氫氧化鈉水溶液,將pH調整為7,熟成30分鐘。之後,將漿體以壓濾機過濾水洗,真空乾燥,得到經矽之水合氧化物及鋁之水合氧化物被覆處理之二氧化矽粒子的固體物。
(Silicon dioxide particles blended in Example 6: silicon dioxide particles treated with a hydrated oxide coating of zirconium after being coated with a hydrated oxide of silicon)
50 g of an aqueous slurry of spherical silica particles (SFP-20M manufactured by Denka, average particle size: 0.4 μm) was heated to 70 ° C., and then a 10% sodium silicate aqueous solution was used to dissolve the silica particles in the form of dioxide. Add 1% in silicon particle conversion. Hydrochloric acid was added to the slurry to adjust the pH to 4 and the mixture was aged for 30 minutes. The pH was further maintained at 5 ± 1 by hydrochloric acid, and the temperature was raised to 40 ° C. Then, a 100 g / l zirconyl oxychloride aqueous solution was added to the silica particles. Add 5% in ZrO 2 conversion. Thereafter, a 20% sodium hydroxide aqueous solution was added to adjust the pH to 7, and the mixture was aged for 30 minutes. After that, the slurry was filtered and washed with a filter press, and vacuum dried to obtain a solid substance of silicon dioxide particles coated with a hydrated oxide of silicon and a hydrated oxide of aluminum.

(實施例7所摻合的二氧化矽粒子:經矽之水合氧化物被覆處理之後經鋅之水合氧化物被覆處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g之水漿體昇溫至70℃後,將10%矽酸鈉水溶液,對於二氧化矽粒子,以二氧化矽粒子換算添加1%。對該漿體添加鹽酸,使pH成為4,熟成30分鐘,進一步藉由鹽酸將pH維持為5±1,並且昇溫至45℃後,將硫酸鋅之水溶液,對於二氧化矽粒子,以ZnO換算添加5質量%。之後,添加20%氫氧化鈉水溶液,將pH調整為7,熟成30分鐘。之後,將漿體以壓濾機過濾水洗,真空乾燥,得到經矽之水合氧化物及鋅之水合氧化物被覆處理之二氧化矽粒子的固體物。
(Silica dioxide particles blended in Example 7: silicon dioxide particles treated with zinc oxide coating after being treated with silicon hydrated oxide)
50 g of an aqueous slurry of spherical silica particles (SFP-20M manufactured by Denka, average particle size: 0.4 μm) was heated to 70 ° C., and then a 10% sodium silicate aqueous solution was used to dissolve the silica particles in the form of dioxide. Add 1% in silicon particle conversion. Hydrochloric acid was added to the slurry, the pH was adjusted to 4, and the mixture was aged for 30 minutes. The pH was further maintained at 5 ± 1 by hydrochloric acid, and the temperature was raised to 45 ° C. Then, an aqueous solution of zinc sulfate was converted to ZnO for silicon dioxide particles Add 5 mass%. Thereafter, a 20% sodium hydroxide aqueous solution was added to adjust the pH to 7, and the mixture was aged for 30 minutes. After that, the slurry was filtered and washed with a filter press, and vacuum dried to obtain a solid substance of silicon dioxide particles coated with a hydrated oxide of silicon and a hydrated oxide of zinc.

(實施例8所摻合的二氧化矽粒子:經矽之水合氧化物被覆處理之後經鈦之水合氧化物被覆處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g之水漿體昇溫至70℃後,將10%矽酸鈉水溶液,對於二氧化矽粒子,以二氧化矽粒子換算添加1%。對該漿體添加鹽酸,使pH成為4,熟成30分鐘,進一步藉由鹽酸將pH維持為5±1,並且昇溫至40℃後,將100g/l硫酸氧鈦水溶液,對於二氧化矽粒子,以TiO2 換算添加5%。之後,添加20%氫氧化鈉水溶液,將pH調整為7,熟成30分鐘。之後,將漿體以壓濾機過濾水洗,真空乾燥,得到經矽之水合氧化物及鈦之水合氧化物被覆處理之二氧化矽粒子的固體物。
(Silicon dioxide particles blended in Example 8: Silicon dioxide particles treated with a hydrated oxide coating of silicon after being coated with a hydrated oxide of silicon)
50 g of an aqueous slurry of spherical silica particles (SFP-20M manufactured by Denka, average particle size: 0.4 μm) was heated to 70 ° C., and then a 10% sodium silicate aqueous solution was used for the silica particles, and Add 1% in silicon particle conversion. Hydrochloric acid was added to the slurry to bring the pH to 4, and the mixture was aged for 30 minutes. The pH was further maintained at 5 ± 1 by hydrochloric acid, and the temperature was raised to 40 ° C. Then, a 100 g / l titanyl sulfate aqueous solution was added to the silica particles. Add 5% in terms of TiO 2 . Thereafter, a 20% sodium hydroxide aqueous solution was added to adjust the pH to 7, and the mixture was aged for 30 minutes. After that, the slurry was filtered and washed with a filter press, and vacuum dried to obtain a solid substance of silicon dioxide particles coated with a hydrated oxide of silicon and a hydrated oxide of titanium.

(實施例9、11所摻合的二氧化矽粒子:經鋁之水合氧化物被覆,且經甲基丙烯醯基矽烷表面處理之二氧化矽粒子)
將上述所得之鋁之水合氧化物被覆之二氧化矽粒子50g、作為溶劑之PMA 48g,與具有甲基丙烯醯基之矽烷偶合劑(信越化學工業公司製KBM-503)1g均勻分散,藉由過濾、水洗、真空乾燥,得到經甲基丙烯醯基矽烷表面處理之二氧化矽粒子的固體物。
(Silica dioxide particles blended in Examples 9 and 11: silica particles coated with a hydrated oxide of aluminum and surface-treated with methacrylfluorenylsilane)
50 g of the aluminum oxide-coated silicon dioxide particles and 48 g of PMA as a solvent, and 1 g of a silane coupling agent (KBM-503 manufactured by Shin-Etsu Chemical Industry Co., Ltd.) having a methacryl group were uniformly dispersed. Filtration, washing with water, and vacuum drying, to obtain a solid material of silica particles treated with methacrylfluorenylsilane.

(實施例12所摻合的二氧化矽粒子:經鋁之水合氧化物被覆,且經胺基矽烷表面處理之二氧化矽粒子)
將上述所得之鋁之水合氧化物被覆之二氧化矽粒子50g、作為溶劑之PMA 48g,與具有苯基胺基之矽烷偶合劑(信越化學工業公司製KBM-573)1g均勻分散,藉由過濾、水洗、真空乾燥,得到經苯基胺基矽烷表面處理之二氧化矽粒子的固體物。
(Silica dioxide particles blended in Example 12: silica particles coated with aluminum hydrated oxide and surface treated with amine silane)
50 g of the aluminum oxide-coated silica particles and 48 g of PMA as a solvent, and 1 g of a silane coupling agent having a phenylamino group (KBM-573 manufactured by Shin-Etsu Chemical Industry Co., Ltd.) were uniformly dispersed, and filtered. , Washing with water, and drying under vacuum to obtain a solid substance of silica particles treated with phenylaminosilane surface.

(實施例10所摻合的二氧化矽粒子:經矽之水合氧化物被覆處理之後經鋁之水合氧化物被覆,且經甲基丙烯醯基矽烷表面處理之二氧化矽粒子)
將上述所得之經矽之水合氧化物被覆處理之後經鋁之水合氧化物被覆處理之二氧化矽粒子50g、作為溶劑之PMA 48g,與具有甲基丙烯醯基之矽烷偶合劑(信越化學工業公司製KBM-503)1g均勻分散,藉由過濾、水洗、真空乾燥,得到經甲基丙烯醯基矽烷表面處理之二氧化矽粒子的固體物。
(Silicon dioxide particles blended in Example 10: Silicon dioxide particles coated with a hydrated oxide of silicon and then coated with a hydrated oxide of aluminum and surface-treated with methacrylfluorenylsilane)
50 g of the silica particles coated with the hydrated oxide of silicon after being coated with the aluminum, and 48 g of PMA as a solvent, and a silane coupling agent having a methacryl group (Shin-Etsu Chemical Industry Co., Ltd.) KBM-503) (1 g) was uniformly dispersed, and filtered, washed with water, and dried under vacuum to obtain a solid material of silicon dioxide particles surface-treated with methacrylfluorenylsilane.

(比較例5所摻合的二氧化矽粒子:經胺基矽烷表面處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g、作為溶劑之PMA 48g,與具有苯基胺基之矽烷偶合劑(信越化學工業公司製KBM-573)1g均勻分散,藉由過濾、水洗、真空乾燥,得到經苯基胺基矽烷表面處理之二氧化矽粒子的固體物。
(Silicon dioxide particles blended in Comparative Example 5: silicon dioxide particles surface-treated with amine silane)
50 g of spherical silica particles (SFP-20M manufactured by Denka Corporation, average particle size: 0.4 μm), 48 g of PMA as a solvent, and a silane coupling agent having a phenylamino group (KBM-573 manufactured by Shin-Etsu Chemical Industry Co., Ltd.) 1 g was uniformly dispersed, and filtered, washed with water, and dried under vacuum to obtain a solid substance of silicon dioxide particles surface-treated with phenylaminosilane.

(比較例2、4所摻合的二氧化矽粒子:經甲基丙烯醯基矽烷表面處理之二氧化矽粒子)
將球狀二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm)50g、作為溶劑之PMA(丙二醇單甲基醚乙酸酯)48g,與具有甲基丙烯醯基之矽烷偶合劑(信越化學工業公司製KBM-503)1g均勻分散,藉由過濾、水洗、真空乾燥,得到經甲基丙烯醯基矽烷表面處理之二氧化矽粒子的固體物。
(Silica dioxide particles blended in Comparative Examples 2 and 4: Silica dioxide particles surface-treated with methacrylfluorenylsilane)
50 g of spherical silica particles (SFP-20M, manufactured by Denka Corporation, average particle size: 0.4 μm), 48 g of PMA (propylene glycol monomethyl ether acetate) as a solvent, and a silyl couple having a methacryl group 1 g of the mixture (KBM-503 manufactured by Shin-Etsu Chemical Industry Co., Ltd.) was uniformly dispersed, and filtered, washed with water, and dried under vacuum to obtain a solid material of silicon dioxide particles surface-treated with methacrylfluorenylsilane.

[仄他電位之測定]
以大塚電子製之ELSZ-2000ZS,測定二氧化矽粒子(Denka公司製SFP-20M、平均粒徑:0.4μm),及上述所製作的表面處理二氧化矽粒子之仄他電位。
具體而言,係將各粒子以PMA(丙二醇單甲基醚乙酸酯)調整為濃度0.1wt%,以超音波浴分散1分鐘。測定係使用Flow Cell,施加300V之施加電壓,測定20℃之仄他電位。再者,電位係藉由Huckel之計算式算出。
(Huckel之計算式)
ζ=6πηU/ε
ζ:仄他電位
U:電移動度
η:溶劑之黏度
[Determination of Sunda Potential]
The ELSZ-2000ZS manufactured by Otsuka Electronics was used to measure silicon dioxide particles (SFP-20M manufactured by Denka Corporation, average particle diameter: 0.4 μm), and the other potential of the surface-treated silicon dioxide particles prepared as described above.
Specifically, each particle was adjusted with a PMA (propylene glycol monomethyl ether acetate) to a concentration of 0.1% by weight, and dispersed in an ultrasonic bath for 1 minute. For the measurement, a flow cell was used, an applied voltage of 300 V was applied, and the other potential at 20 ° C was measured. In addition, the potential was calculated by the calculation formula of Huckel.
(Huckel's formula)
ζ = 6πηU / ε
ζ: Sunda potential
U: electric mobility η: solvent viscosity

[實施例1~12、比較例1~5]
將下述表1、2所示之各種成分以表1、2所示之比例(質量份)摻合,藉由珠磨機以有機溶劑稀釋至可分散之黏度,以攪拌機預備混合後,以珠磨機混練,使硬化性樹脂組成物分散。將所得之分散液通過孔徑10μm之過濾器,得到硬化性樹脂組成物。
[Examples 1 to 12, Comparative Examples 1 to 5]
The various components shown in Tables 1 and 2 below were blended in the proportions (parts by mass) shown in Tables 1 and 2, and diluted with a bead mill with an organic solvent to a dispersible viscosity. The bead mill is kneaded to disperse the curable resin composition. The obtained dispersion was passed through a filter having a pore size of 10 μm to obtain a curable resin composition.

<乾膜之製作>
對如上述般得到的硬化性樹脂組成物添加甲基乙基酮300g來稀釋,以攪拌機攪拌15分鐘而得到塗覆液。將塗覆液塗佈於算術表面粗度Ra 150nm之厚度38μm之聚對苯二甲酸乙二酯薄膜(載體薄膜、Unitika公司製Emblet PTH-25)上,通常於80~100℃(實施例1~11及比較例1~4係於80℃15分鐘,實施例12及比較例5係於100℃15分鐘)之溫度乾燥15分鐘,形成厚度40μm之樹脂層。接著,於樹脂層上,貼合厚度18μm之聚丙烯薄膜(覆蓋膜、Futamura公司製OPP-FOA),來製作乾膜。
< Production of dry film >
To the curable resin composition obtained as described above, 300 g of methyl ethyl ketone was added and diluted, and the mixture was stirred for 15 minutes with a stirrer to obtain a coating solution. The coating solution was coated on a polyethylene terephthalate film (carrier film, Emblet PTH-25 manufactured by Unitika) with a surface roughness of Ra 150 nm and a thickness of 38 μm, usually at 80 to 100 ° C. (Example 1 ~ 11 and Comparative Examples 1 to 4 were dried at a temperature of 80 ° C for 15 minutes, and Example 12 and Comparative Example 5 were dried at a temperature of 100 ° C for 15 minutes) to form a resin layer having a thickness of 40 µm. Next, a polypropylene film (overlay film, OPP-FOA manufactured by Futamura Co., Ltd.) with a thickness of 18 μm was laminated on the resin layer to produce a dry film.

<硬化膜之製作>
自如上述般所得到之乾膜剝離聚丙烯薄膜,於GTS-MP箔(Furukawa Circuit Foil公司製)之銅箔的光澤面側,貼合乾膜之樹脂層,接著,使用真空疊合機(名機製作所製 MVLP-500)以加壓度:0.8MPa、70~100℃(實施例1~11及比較例1~4係70℃,實施例12及比較例5係100℃)、1分鐘、真空度:133.3Pa之條件,加熱疊合,使銅箔與樹脂層密合。
接著,實施例1~11及比較例1~4,係使用搭載有高壓水銀燈(短弧燈)之曝光裝置,自乾膜上曝光(曝光量:400~600mJ/cm2 )後,自乾膜剝離聚對苯二甲酸乙二酯薄膜,使樹脂層露出。之後,使用1重量%Na2 CO3 水溶液,以30℃、噴霧壓2kg/cm2 之條件進行60秒顯像,形成具有3mm寬之阻劑圖型的樹脂層。接著,以具備高壓水銀燈之UV輸送帶爐以1J/cm2 之曝光量對樹脂層照射後,於160℃加熱60分鐘,使樹脂層完全硬化,製作硬化膜。實施例12及比較例5,係將乾膜疊合後,剝離PET薄膜,於190℃、60分鐘使其完全硬化。
< Production of hardened film >
From the dry film release polypropylene film obtained as described above, the resin layer of the dry film was bonded to the glossy side of the copper foil of GTS-MP foil (manufactured by Furukawa Circuit Foil), and then a vacuum laminator (named MVLP-500 manufactured by Seisakusho Co., Ltd.) With a pressure of 0.8 MPa, 70 to 100 ° C (Examples 1 to 11 and Comparative Examples 1 to 4 are at 70 ° C, Example 12 and Comparative Example 5 are at 100 ° C), 1 minute, Vacuum degree: Under the condition of 133.3Pa, heat and overlap to make the copper foil and resin layer tightly adhere.
Next, Examples 1 to 11 and Comparative Examples 1 to 4 are self-drying films after exposure on a dry film using an exposure device equipped with a high-pressure mercury lamp (short arc lamp) (exposure amount: 400 to 600 mJ / cm 2 ). The polyethylene terephthalate film was peeled to expose the resin layer. Thereafter, development was performed for 60 seconds using a 1% by weight Na 2 CO 3 aqueous solution at 30 ° C. and a spray pressure of 2 kg / cm 2 to form a resin layer having a resist pattern having a width of 3 mm. Next, the resin layer was irradiated with a UV conveyor furnace equipped with a high-pressure mercury lamp at an exposure amount of 1 J / cm 2 , and then heated at 160 ° C. for 60 minutes to completely harden the resin layer to produce a cured film. In Example 12 and Comparative Example 5, after the dry film was laminated, the PET film was peeled off and cured completely at 190 ° C for 60 minutes.

<CTE(α1)之測定>
將如上述般所得到之硬化膜自銅箔剝離,以得到測定尺寸(3mm×16mm之尺寸)的方式,將樣品設置於TA Instruments公司製TMA-Q400EM,來測定CTE。測定條件係為試驗荷重5g,重複2次將樣品自室溫以10℃/分鐘的昇溫速度昇溫,得到第2次之Tg以下的線膨脹係數(CTE(α1))。CTE(α1)係低者較能抑制應力產生,故較佳為40ppm以下。
<Measurement of CTE (α1)>
The cured film obtained as described above was peeled from the copper foil to obtain a measurement size (size of 3 mm × 16 mm), and a sample was set on TMA-Q400EM manufactured by TA Instruments to measure CTE. The measurement conditions were a test load of 5 g, and the sample was heated twice from room temperature at a temperature increase rate of 10 ° C./minute to obtain a second linear expansion coefficient (CTE (α1)) of Tg or less. The lower CTE (α1) is more able to suppress the generation of stress, so it is preferably 40 ppm or less.

<α射線量之測定>
基於JEDEC89A標準規格(2006),測定實施例1~12及比較例1~5之各硬化性樹脂組成物的α射線量。
〇:未達0.02c/h/cm2
×:0.02c/h/cm2 以上
< Measurement of alpha ray quantity >
Based on the JEDEC89A standard specification (2006), the amount of alpha rays of each curable resin composition of Examples 1 to 12 and Comparative Examples 1 to 5 was measured.
〇: less than 0.02 c / h / cm 2
×: 0.02c / h / cm 2 or more

<與晶圓玻璃基板之密合性之評估>
於作為玻璃基板之AN100玻璃(旭硝子公司製、仄他電位:負)上,以與上述<硬化膜之製作>相同的條件製作硬化膜。基於JIS K5400,藉由橫切機製作切口到達層間材之1mm見方之棋盤格100個(10×10),於其上使賽璐玢帶完全密合,拉離後確認100個中有幾個密合。
〇:100/100
△:70/100以上且未達100/100
×:未達70/100
< Evaluation of adhesion to wafer glass substrate >
A cured film was produced on AN100 glass (manufactured by Asahi Glass Co., Ltd., Sunda Potential: negative) as a glass substrate under the same conditions as in the above-mentioned "Production of cured film". Based on JIS K5400, a cross-cutting machine was used to make 100 square (1 × 10) square checkers of 1 mm square to the interlayer material. The celluloid bands were completely tightly sealed on it, and several of the 100 were confirmed after pulling away. adaptation.
〇: 100/100
△: Above 70/100 and less than 100/100
×: less than 70/100

<對低極性絕緣材之密合性之評估>
於10GHz之介電正切為約0.004的低傳輸損失層間材(使用味之素公司ABF GL102之電路基板、仄他電位:負)上,以與上述<硬化膜之製作>相同的條件製作硬化膜。基於JIS K5400,藉由橫切機製作切口到達層間材之1mm見方之棋盤格100個(10×10),於其上使賽璐玢帶完全密合,拉離後確認100個中有幾個密合。
〇:100/100
△:70/100以上且未達100/100
×:未達70/100
< Evaluation of Adhesion of Low Polarity Insulating Materials >
A hardened film was produced on a low-transmission loss interlayer material (dielectric tangent of Ajinomoto ABF GL102 circuit board, solar potential: negative) of 10 GHz with a dielectric tangent of about 0.004, under the same conditions as in the above-mentioned "Production of hardened film" . Based on JIS K5400, a cross-cutting machine was used to make 100 square (1 × 10) square checkers of 1 mm square to the interlayer material. The celluloid bands were completely tightly sealed on it, and several of the 100 were confirmed after pulling away. adaptation.
〇: 100/100
△: Above 70/100 and less than 100/100
×: less than 70/100

<EMC之密合性(與鑄模材料之密合性)之評估>
於無電漿處理的硬化被膜上,使用鑄模材料(Panasonic製UV8710U),進行圓形模(直徑2.523mm、高度3.00mm)的鑄模壓合成形,藉由於175℃加熱4小時,使鑄模材料硬化。之後,對設置於硬化被膜表面之鑄模材料賦予剪力,測定硬化被膜與鑄模材料之剝離強度。

<剝離強度測定裝置>
NIDEC-SHIMPO公司製、剪力速度:20mm/min

<評估基準>
〇:150N以上
△:100N以上且未達150N
×:未達100N
< Evaluation of EMC adhesion (adhesion to mold material) >
A circular mold (2.523 mm in diameter and 3.00 mm in height) was compression-molded on a non-plasma-treated hardened film using a mold material (UV8710U manufactured by Panasonic), and the mold material was hardened by heating at 175 ° C for 4 hours. Thereafter, a shearing force was applied to the mold material provided on the surface of the cured film, and the peeling strength between the cured film and the mold material was measured.

<Peel strength measuring device>
Made by NIDEC-SHIMPO company, shear speed: 20mm / min

< Evaluation criteria >
〇: 150N or more △: 100N or more and less than 150N
×: Less than 100N

<感度之評估>
自如上述般所得到之乾膜剝離聚乙烯薄膜,於經CZ8101B粗化之覆銅基板表面側,貼合乾膜之樹脂層,接著,實施例1~11、比較例1~4,係使用真空疊合機(名機製作所製 MVLP-500)以加壓度:0.8MPa、70℃、1分鐘、真空度:133.3Pa之條件加熱疊合,使銅箔與樹脂層密合。
接著,使用投影曝光機,透過梯型板(Stuffer41段)曝光(曝光量:100mJ/cm2 )後,自乾膜剝離聚對苯二甲酸乙二酯薄膜,使樹脂層露出。之後,使用1重量%Na2 CO3 水溶液,以30℃、噴霧壓2kg/cm2 之條件進行60秒顯像,確認梯型板之殘存感度。
< Evaluation of sensitivity >
The polyethylene film was peeled from the dry film obtained as described above, and the resin layer of the dry film was bonded to the surface side of the copper-clad substrate roughened by CZ8101B. Then, Examples 1 to 11 and Comparative Examples 1 to 4 were vacuumed. The laminating machine (MVLP-500 manufactured by Meiki Seisakusho) was heated and laminated under the conditions of pressure: 0.8 MPa, 70 ° C, 1 minute, and vacuum: 133.3 Pa, so that the copper foil and the resin layer were closely adhered.
Next, after using a projection exposure machine to expose through a ladder plate (Stuffer 41 stage) (exposure amount: 100 mJ / cm 2 ), the polyethylene terephthalate film was peeled from the dry film to expose the resin layer. Thereafter, development was performed for 60 seconds using a 1% by weight aqueous Na 2 CO 3 solution at 30 ° C. and a spray pressure of 2 kg / cm 2 to confirm the residual sensitivity of the ladder plate.

*1:上述所合成的含羧基之樹脂A-1
*2:DIC公司製EMG-1015:具有醯胺醯亞胺構造之含羧基之樹脂A-2
*3:日本化藥公司製NC-6000
*4:DIC公司製HP7200
*5:新日鐵住金化學公司製ESN-475V(萘酚型環氧樹脂)
*6:三菱化學公司製jER828(雙酚A型環氧樹脂)
*7:IGM Resins公司製OmniradTPO(2,4,6-三甲基苯甲醯基-二苯基-膦氧化物)
*8:BASF Japan公司製Irgacure OXE02(乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-1-(o-乙醯基肟)
*9:新中村化學工業公司製A-DCP(三環癸烷二甲醇二丙烯酸酯)
*10:日本化藥公司製MIR-3000、具有馬來醯亞胺基之化合物
*11:二氰二胺
*12:三聚氰胺
*13:和光純藥工業公司製環烷酸鋅(II)礦油精
*14:三菱Materials電子化成公司製13M-T(鈦黑)
*15:上述所調製的經鋁之水合氧化物被覆之二氧化矽粒子
*16:上述所調製的經鋯之水合氧化物被覆之二氧化矽粒子
*17:上述所調製的經鋅之水合氧化物被覆之二氧化矽粒子
*18:上述所調製的經鈦之水合氧化物被覆之二氧化矽粒子
*19:上述所調製的經矽之水合氧化物被覆之後經鋁之水合氧化物被覆之二氧化矽粒子
*20:上述所調製的經矽之水合氧化物被覆之後經鋯之水合氧化物被覆之二氧化矽粒子
*21:上述所調製的經矽之水合氧化物被覆之後經鋅之水合氧化物被覆之二氧化矽粒子
*22:上述所調製的經矽之水合氧化物被覆之後經鈦之水合氧化物被覆之二氧化矽粒子
*23:上述所調製的經鋁之水合氧化物被覆,且經甲基丙烯醯基矽烷表面處理之二氧化矽粒子
*24:上述所調製的經鋁之水合氧化物被覆,且經胺基矽烷表面處理之二氧化矽粒子
*25:上述所調製的經矽之水合氧化物被覆之後經鋁之水合氧化物被覆,且經甲基丙烯醯基矽烷表面處理之二氧化矽粒子
*26:上述所調製的經胺基矽烷表面處理之二氧化矽粒子
*27:上述所調製的經甲基丙烯醯基矽烷表面處理之二氧化矽粒子
*28:Denka公司製SFP-20M、平均粒徑:400nm(二氧化矽)
* 1: Carboxyl-containing resin A-1 synthesized above
* 2: EMG-1015 manufactured by DIC Corporation: Carboxyl-containing resin A-2 with amidamine and imine structure
* 3: NC-6000 manufactured by Nippon Kayaku Co., Ltd.
* 4: DIC Corporation HP7200
* 5: ESN-475V (naphthol-type epoxy resin) manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.
* 6: jER828 (bisphenol A type epoxy resin) manufactured by Mitsubishi Chemical Corporation
* 7: Omnirad TPO (2,4,6-trimethylbenzyl-diphenyl-phosphine oxide) manufactured by IGM Resins
* 8: Irgacure OXE02 (ethyl ketone, 1- [9-ethyl-6- (2-methylbenzylidene) -9H-carbazol-3-yl) -1- (o-ethyl Fluorenyl oxime)
* 9: A-DCP (tricyclodecane dimethanol diacrylate) manufactured by Shin Nakamura Chemical Industry Co., Ltd.
* 10: MIR-3000 manufactured by Nippon Kayaku Co., Ltd., a compound having a maleimidine group
* 11: Dicyandiamine
* 12: Melamine
* 13: Zinc (II) naphthenate refined by Wako Pure Chemical Industries, Ltd.
* 14: 13M-T (titanium black) manufactured by Mitsubishi Materials Electrochemical Corporation
* 15: Aluminium hydrated oxide-coated silica particles prepared as described above
* 16: Zirconium hydrated oxide-coated silica particles prepared as described above
* 17: The zinc oxide-coated silicon dioxide particles prepared as described above
* 18: Titanium oxide-coated silica particles prepared as described above
* 19: The silicon dioxide particles coated with the hydrated oxide of silicon and coated with the hydrated oxide of aluminum prepared as described above.
* 20: Silicon dioxide particles coated with hydrated oxide of silicon and coated with hydrated oxide of zirconium, prepared as described above.
* 21: The silicon dioxide particles coated with the hydrated oxide of silicon and coated with the hydrated oxide of zinc prepared as described above.
* 22: The silicon dioxide particles coated with the hydrated oxide of silicon and coated with the hydrated oxide of titanium prepared as described above.
* 23: Silicon dioxide particles coated with aluminum hydrated oxide and surface-treated with methacrylfluorenylsilane prepared as above.
* 24: Silica dioxide particles coated with aluminum hydrated oxide and surface treated with aminosilane
* 25: Silicon dioxide particles prepared by coating with the hydrated oxide of silicon and coated with the hydrated oxide of aluminum and surface-treated with methacryl fluorinated silane.
* 26: Aminosilane surface-treated silica particles prepared as described above
* 27: Silica dioxide particles prepared by methacrylfluorenylsilane surface treatment prepared as above
* 28: SFP-20M manufactured by Denka, average particle size: 400 nm (silicon dioxide)

由上述表中所示結果,可知本發明之實施例1~12之硬化性樹脂組成物,可形成在維持低CTE等之物性的同時,與無粗化之基板或低輪廓基板等之密合性優良的硬化物。From the results shown in the above table, it can be seen that the curable resin compositions of Examples 1 to 12 of the present invention can be formed in close contact with a substrate without roughening or a low-profile substrate while maintaining physical properties such as low CTE. Good hardened material.

10‧‧‧層合構造體10‧‧‧ laminated structure

11‧‧‧層間絕緣材(封裝基板) 11‧‧‧Interlayer insulation material (package substrate)

12a、12b‧‧‧導體層 12a, 12b‧‧‧Conductor layer

13a、13b‧‧‧防焊劑 13a, 13b ‧‧‧solder resist

14‧‧‧焊料 14‧‧‧Solder

15‧‧‧半導體晶圓 15‧‧‧Semiconductor wafer

16‧‧‧底部填充劑 16‧‧‧ Underfill

17‧‧‧密封材 17‧‧‧sealing material

[圖1] 示意性顯示本發明之層合構造體的一實施態樣之概略截面圖。[Fig. 1] A schematic cross-sectional view schematically showing an embodiment of a laminated structure according to the present invention.

Claims (7)

一種硬化性樹脂組成物,其特徵為含有仄他電位為正的表面處理二氧化矽粒子,與硬化性樹脂。A hardening resin composition, which is characterized by containing surface-treated silicon dioxide particles with a positive hypotene potential and a hardening resin. 如請求項1之硬化性樹脂組成物,其中前述表面處理二氧化矽粒子,為經鋯之水合氧化物、鋅之水合氧化物、鈦之水合氧化物及鋁之水合氧化物中的至少任1種被覆處理之二氧化矽粒子。The curable resin composition according to claim 1, wherein the surface-treated silica particles are at least any one of zirconium hydrated oxide, zinc hydrated oxide, titanium hydrated oxide, and aluminum hydrated oxide. A coated silica particle. 一種乾膜,其特徵為具有將如請求項1之硬化性樹脂組成物塗佈於薄膜並乾燥而得到之樹脂層。A dry film comprising a resin layer obtained by coating a film with a curable resin composition as claimed in claim 1 and drying the film. 一種硬化物,其特徵為將如請求項1或2之硬化性樹脂組成物,或如請求項3之乾膜之樹脂層硬化而得到。A cured product, which is obtained by curing a curable resin composition as claimed in claim 1 or 2 or a resin layer of a dried film as claimed in claim 3. 一種層合構造體,其係含有樹脂硬化層(A),與鄰接於前述樹脂硬化層(A)之樹脂硬化層(B)或基板(C)的構造體,其特徵為 前述樹脂硬化層(A)為如請求項4之硬化物, 前述樹脂硬化層(B)或基板(C)之仄他電位非為正。A laminated structure comprising a resin hardened layer (A) and a resin hardened layer (B) or a substrate (C) adjacent to the resin hardened layer (A). The aforementioned resin hardened layer (A) is a hardened product as claimed in claim 4, The other potential of the resin hardened layer (B) or the substrate (C) is not positive. 一種電子零件,其特徵為具有如請求項4之硬化物。An electronic part characterized by having a hardened body as claimed in claim 4. 一種電子零件,其特徵為具有如請求項5之層合構造體。An electronic part characterized by having a laminated structure as claimed in claim 5.
TW108103255A 2018-03-30 2019-01-29 Curable resin composition, dry film, cured object, layered structure, and electronic component TW201942231A (en)

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