TW201928617A - Touch array substrate - Google Patents

Touch array substrate Download PDF

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Publication number
TW201928617A
TW201928617A TW106144475A TW106144475A TW201928617A TW 201928617 A TW201928617 A TW 201928617A TW 106144475 A TW106144475 A TW 106144475A TW 106144475 A TW106144475 A TW 106144475A TW 201928617 A TW201928617 A TW 201928617A
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Taiwan
Prior art keywords
touch electrode
touch
repair structure
electrically connected
array substrate
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TW106144475A
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Chinese (zh)
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TWI639107B (en
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陳志明
孫偉哲
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友達光電股份有限公司
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Priority to TW106144475A priority Critical patent/TWI639107B/en
Priority to CN201810115964.9A priority patent/CN108227999B/en
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Publication of TW201928617A publication Critical patent/TW201928617A/en

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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0412Digitisers structurally integrated in a display
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/124Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
    • H01L27/1244Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits for preventing breakage, peeling or short circuiting

Abstract

A touch array substrate includes a substrate, switching devices, pixel electrodes, a first touch electrode, a second touch electrode, a first touch electrode strip, a second touch electrode strip, and a repair structure. The switching devices are disposed on the substrate. The pixel electrodes are correspondingly electrically connected with the switching devices. The first touch electrode and the second touch electrode are overlapping with the pixel electrodes. An edge of the first touch electrode adjacent to the second touch electrode has a first protrusion. At least one of the first touch electrode strip and the second touch electrode strip is correspondingly electrically connected with the first touch electrode or the second touch electrode. The repair structure is disposed between the first touch electrode and the second touch electrode. The repair structure is overlapping with the first protrusion.

Description

觸控陣列基板Touch array substrate

本發明是有關於一種觸控陣列基板,且特別是有關於一種具有修復結構的觸控陣列基板。The present invention relates to a touch array substrate, and more particularly, to a touch array substrate having a repair structure.

觸控型電子裝置通常同時具有顯示功能與觸控功能,讓使用者可以利用觸碰的方式直接控制顯示面板所顯示出來的圖示。一般而言,觸控型電子裝置包含了以陣列的方式排列之多個觸控電極以及多條觸控電極導線。觸控電極導線連接該些觸控電極,並負責將訊號傳遞至該些觸控電極。A touch-type electronic device usually has both a display function and a touch function, so that a user can directly control the icons displayed on the display panel in a touch manner. Generally speaking, a touch-type electronic device includes a plurality of touch electrodes and a plurality of touch electrode wires arranged in an array. The touch electrode wires are connected to the touch electrodes and are responsible for transmitting signals to the touch electrodes.

在現有技術中,為了讓顯示面板的厚度更薄,目前開發了許多將觸控電極導線與觸控電極設置在顯示面板內(In cell)的技術。然而,若觸控電極和觸控電極導線是設置在顯示面板內,很難在不影響顯示品質的前提下,維修故障的觸控電極導線或故障的觸控電極。若因為觸控電極導線或觸控電極故障就換掉整個顯示面板,又需要付出過高的成本。因此,目前亟需一種新的觸控裝置的修補技術。In the prior art, in order to make the thickness of the display panel thinner, many technologies for disposing the touch electrode wires and the touch electrodes in the display panel (In cell) have been developed. However, if the touch electrodes and the touch electrode wires are disposed in the display panel, it is difficult to repair the faulty touch electrode wires or the faulty touch electrodes without affecting the display quality. If the entire display panel is replaced due to the failure of the touch electrode lead or the touch electrode, it will also require excessive costs. Therefore, there is an urgent need for a new repair technology for touch devices.

本發明提供一種觸控陣列基板,可以提升成功修復觸控電極的機率。The invention provides a touch array substrate, which can increase the probability of successfully repairing touch electrodes.

本發明的一種觸控陣列基板包括基板、多個開關元件、多個畫素電極、第一觸控電極、第二觸控電極、第一觸控電極導線、第二觸控電極導線以及修補結構。多個開關元件位於基板上。多個畫素電極分別電性連接至對應的開關元件。第一觸控電極與第二觸控電極於垂直基板的方向上分別重疊於部分畫素電極。第一觸控電極鄰近於第二觸控電極的邊緣具有第一凸出部。第一觸控電極導線與第二觸控電極導線於垂直基板的方向上分別重疊於第一觸控電極與第二觸控電極。第一觸控電極導線與第二觸控電極導線中的至少一個與對應的第一觸控電極或第二觸控電極電性連接。修補結構於基板上的垂直投影位於第一觸控電極與第二觸控電極於基板上的垂直投影之間。修補結構與第一觸控電極及第二觸控電極分別部分重疊。A touch array substrate of the present invention includes a substrate, a plurality of switching elements, a plurality of pixel electrodes, a first touch electrode, a second touch electrode, a first touch electrode wire, a second touch electrode wire, and a repair structure. . A plurality of switching elements are located on the substrate. The plurality of pixel electrodes are electrically connected to the corresponding switching elements, respectively. The first touch electrode and the second touch electrode are respectively overlapped with a part of the pixel electrode in a direction perpendicular to the substrate. An edge of the first touch electrode adjacent to the second touch electrode has a first protruding portion. The first touch electrode lead and the second touch electrode lead overlap the first touch electrode and the second touch electrode in a direction perpendicular to the substrate, respectively. At least one of the first touch electrode lead and the second touch electrode lead is electrically connected to the corresponding first touch electrode or the second touch electrode. The vertical projection of the repair structure on the substrate is located between the vertical projection of the first touch electrode and the second touch electrode on the substrate. The repair structure partially overlaps the first touch electrode and the second touch electrode, respectively.

本發明至少一實施例中,即使觸控電極導線與觸控電極在連接處斷開導致觸控電極故障,仍然可以用重疊於觸控電極的修補結構來修復故障的觸控電極,因此可以提升成功修復觸控電極的機率。In at least one embodiment of the present invention, even if the touch electrode wire and the touch electrode are disconnected at the connection point and cause the touch electrode to fail, the repair structure overlapping the touch electrode can still be used to repair the faulty touch electrode. Probability of successful repair of touch electrodes.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above features and advantages of the present invention more comprehensible, embodiments are hereinafter described in detail with reference to the accompanying drawings.

圖1A是依照本發明的一實施例的一種觸控陣列基板1的上視示意圖。圖1B是沿著圖1A線AA’、BB’以及CC’的剖面示意圖。FIG. 1A is a schematic top view of a touch array substrate 1 according to an embodiment of the present invention. FIG. 1B is a schematic cross-sectional view taken along line AA ', BB', and CC 'of FIG. 1A.

請參考圖1A與圖1B,觸控陣列基板1,包括基板SB、多個開關元件T、多個畫素電極PE、第一觸控電極100、第二觸控電極200、第一觸控電極導線120、第二觸控電極導線220以及修補結構300。Please refer to FIGS. 1A and 1B. The touch array substrate 1 includes a substrate SB, a plurality of switching elements T, a plurality of pixel electrodes PE, a first touch electrode 100, a second touch electrode 200, and a first touch electrode. The conductive line 120, the second touch electrode conductive line 220, and the repair structure 300.

多個開關元件T位於基板SB上。在本實施例中,觸控陣列基板1還包括分別與多個開關元件T電性連接的多條掃描線SL以及多條資料線DL,其中掃描線SL沿著方向D2延伸而資料線DL沿著方向D1延伸,方向D1與方向D2彼此交錯。開關元件T例如是底部閘極型薄膜電晶體,其包括閘極G、通道M、源極S以及汲極D。閘極G與掃描線SL電性連接。通道M位於閘極G的上方,且與閘極G間隔有絕緣層GI。源極S以及汲極D分別位於通道M上方的兩側,且源極S與資料線DL電性連接。根據另一實施例,主動元件也可以其他種類之薄膜電晶體,例如頂部閘極型薄膜電晶體、雙閘極型薄膜電晶體。A plurality of switching elements T are located on the substrate SB. In this embodiment, the touch array substrate 1 further includes a plurality of scan lines SL and a plurality of data lines DL respectively electrically connected to the plurality of switching elements T, wherein the scan lines SL extend along the direction D2 and the data lines DL extend along Extending in the direction D1, the directions D1 and D2 intersect each other. The switching element T is, for example, a bottom-gate thin film transistor, which includes a gate G, a channel M, a source S, and a drain D. The gate electrode G is electrically connected to the scan line SL. The channel M is located above the gate G and is separated from the gate G by an insulating layer GI. The source S and the drain D are respectively located on two sides above the channel M, and the source S is electrically connected to the data line DL. According to another embodiment, the active device may also be other types of thin film transistors, such as a top gate thin film transistor and a double gate thin film transistor.

絕緣層P1覆蓋開關元件T。第一觸控電極100與第二觸控電極200位於絕緣層P1上且彼此相鄰但未電性連接。第一觸控電極導線120與第二觸控電極導線220於垂直基板SB的方向D3上分別重疊於第一觸控電極100與第二觸控電極200。在本實施例中,第一觸控電極導線120位於基板SB與第一觸控電極100之間,且第二觸控電極導線220位於基板SB與第二觸控電極200之間。在本實施例中,資料線DL、第一觸控電極導線120、第二觸控電極導線220、源極S、汲極D屬於同一膜層,且資料線DL、第一觸控電極導線120及第二觸控電極導線220係彼此平行設置。資料線DL、第一觸控電極導線120、第二觸控電極導線220、源極S、汲極D例如是藉由同一道圖案化製程所定義出來的。The insulating layer P1 covers the switching element T. The first touch electrode 100 and the second touch electrode 200 are located on the insulating layer P1 and are adjacent to each other but not electrically connected. The first touch electrode lead 120 and the second touch electrode lead 220 overlap the first touch electrode 100 and the second touch electrode 200 in the direction D3 of the vertical substrate SB, respectively. In this embodiment, the first touch electrode lead 120 is located between the substrate SB and the first touch electrode 100, and the second touch electrode lead 220 is located between the substrate SB and the second touch electrode 200. In this embodiment, the data line DL, the first touch electrode lead 120, the second touch electrode lead 220, the source S, and the drain D belong to the same film layer, and the data line DL and the first touch electrode lead 120 The second touch electrode lead 220 is disposed parallel to each other. The data line DL, the first touch electrode lead 120, the second touch electrode lead 220, the source S, and the drain D are defined by, for example, the same patterning process.

在一些實施例中,第一觸控電極100可以重疊於多條觸控電極導線,例如包括多條第一觸控電極導線120。在一些實施例中,第二觸控電極200可以重疊於多條觸控電極導線,例如包括多條第二觸控電極導線220。在本實施例中,第一觸控電極100穿過絕緣層P1中的開口H1而與至少一第一觸控電極導線120電性連接,且第二觸控電極200穿過絕緣層P1中的開口H2而與至少一第二觸控電極導線220電性連接。In some embodiments, the first touch electrode 100 may be overlapped with a plurality of touch electrode wires, such as including a plurality of first touch electrode wires 120. In some embodiments, the second touch electrode 200 may be overlapped with a plurality of touch electrode wires, such as including a plurality of second touch electrode wires 220. In this embodiment, the first touch electrode 100 is electrically connected to at least one first touch electrode lead 120 through the opening H1 in the insulation layer P1, and the second touch electrode 200 is passed through the insulation layer P1. The opening H2 is electrically connected to at least one second touch electrode lead 220.

在一些實施例中,第一觸控電極導線120與第二觸控電極導線220可以將驅動元件DR(繪示於圖5)所發出的訊號分別傳遞給第一觸控電極100與第二觸控電極200。第一觸控電極導線120與第二觸控電極導線220例如可以用來傳遞共用電壓訊號與觸控訊號,並於不同時序時切換為共用電壓訊號與觸控訊號。因此,第一觸控電極100與第二觸控電極200可以具有共用電極的功能與觸控電極的功能。In some embodiments, the first touch electrode lead 120 and the second touch electrode lead 220 can transmit signals from the driving element DR (shown in FIG. 5) to the first touch electrode 100 and the second touch electrode, respectively.控 Guests200. The first touch electrode lead 120 and the second touch electrode lead 220 may be used, for example, to transmit a common voltage signal and a touch signal, and switch to a common voltage signal and a touch signal at different timings. Therefore, the first touch electrode 100 and the second touch electrode 200 may have a function of a common electrode and a function of a touch electrode.

在一些實施例中,第一觸控電極100與第二觸控電極200上包括多個開口O2,開口O2例如可以重疊於掃描線SL、資料線DL、第一觸控電極導線120、第二觸控電極導線220及/或開關元件T,以減少第一觸控電極100與第二觸控電極200所產生的寄生電容。In some embodiments, the first touch electrode 100 and the second touch electrode 200 include a plurality of openings O2. The openings O2 may overlap the scan lines SL, the data lines DL, the first touch electrode wires 120, the second The touch electrode lead 220 and / or the switching element T are used to reduce the parasitic capacitance generated by the first touch electrode 100 and the second touch electrode 200.

在本實施例中,第一觸控電極100的邊緣100a具有第一凸出部110,鄰近於第二觸控電極200。在本實施例中,第一凸出部110是朝向第二觸控電極200的邊緣200a凸出,且第一凸出部110例如是大致上沿著方向D2延伸,但本發明不以此為限。在一些實施例中,第一凸出部110大致上沿著方向D1延伸,依據兩觸控電極所相鄰的方向而定。在本實施例中,第二觸控電極200的邊緣200a在對應第一凸出部110的位置具有凹槽U。In this embodiment, the edge 100 a of the first touch electrode 100 has a first protruding portion 110 adjacent to the second touch electrode 200. In this embodiment, the first protruding portion 110 protrudes toward the edge 200a of the second touch electrode 200, and the first protruding portion 110 extends, for example, substantially along the direction D2. limit. In some embodiments, the first protruding portion 110 extends substantially along the direction D1, depending on the direction in which the two touch electrodes are adjacent to each other. In this embodiment, the edge 200 a of the second touch electrode 200 has a groove U at a position corresponding to the first protruding portion 110.

絕緣層P2覆蓋絕緣層P1、第一觸控電極100及第二觸控電極200。多個畫素電極PE位於絕緣層P2上,且分別電性連接至對應的開關元件T。在本實施例中,開口O貫穿絕緣層P1與絕緣層P2,畫素電極PE穿過開口O並電性連接至開關元件T的汲極D。The insulating layer P2 covers the insulating layer P1, the first touch electrode 100, and the second touch electrode 200. The plurality of pixel electrodes PE are located on the insulating layer P2 and are electrically connected to the corresponding switching elements T, respectively. In this embodiment, the opening O penetrates the insulating layer P1 and the insulating layer P2, and the pixel electrode PE passes through the opening O and is electrically connected to the drain electrode D of the switching element T.

第一觸控電極100與第二觸控電極200於垂直基板SB的方向D3上分別重疊於畫素電極PE。在本實施例中,至少部分第一觸控電極100與至少部分第二觸控電極200位於該些畫素電極PE與基板SB之間,因此,第一觸控電極100與第二觸控電極200上包括多個對應於開口O的開口O’,且開口O’大於開口O,使該些畫素電極PE可以穿過第一觸控電極100與第二觸控電極200並且避免彼此電性接觸,但本發明不以此為限。在一些實施例中,畫素電極PE位於第一觸控電極100與基板SB之間或第二觸控電極200與基板SB之間,因此不需要在第一觸控電極100和第二觸控電極200設置開口O’。The first touch electrodes 100 and the second touch electrodes 200 overlap the pixel electrodes PE in the direction D3 of the vertical substrate SB, respectively. In this embodiment, at least part of the first touch electrode 100 and at least part of the second touch electrode 200 are located between the pixel electrodes PE and the substrate SB. Therefore, the first touch electrode 100 and the second touch electrode 200 includes a plurality of openings O ′ corresponding to the opening O, and the opening O ′ is larger than the opening O, so that the pixel electrodes PE can pass through the first touch electrode 100 and the second touch electrode 200 and avoid mutual electrical Contact, but the invention is not limited to this. In some embodiments, the pixel electrode PE is located between the first touch electrode 100 and the substrate SB or between the second touch electrode 200 and the substrate SB, so there is no need to touch the first touch electrode 100 and the second touch The electrode 200 is provided with an opening O ′.

在本實施例中,畫素電極PE具有多個狹縫O1,但本發明不以此為限。在一些實施例中,第一觸控電極100和第二觸控電極200具有狹縫。In this embodiment, the pixel electrode PE has a plurality of slits O1, but the invention is not limited thereto. In some embodiments, the first touch electrode 100 and the second touch electrode 200 have a slit.

在本實施例中,修補結構300位於絕緣層GI上,修補結構300於基板SB上的垂直投影位於第一觸控電極100與第二觸控電極200於基板SB上的垂直投影之間。修補結構300例如包含第一部份310、第二部分320及連接於第一部分310與第二部分320之間的直線段330,其中第一部分310於垂直基板SB的方向D3上與第一觸控電極100重疊,且第二部分320於垂直基板SB方向D3上與第二觸控電極200重疊,但本發明不以此為限。在一些實施例中,修補結構300例如只包含第一部份310與第二部分320而不具有直線段。在本實施例中,資料線DL、第一觸控電極導線120、第二觸控電極導線220以及修補結構300屬於同一膜層。第二觸控電極200穿過絕緣層P1中的開口H3電性連接修補結構300之第二部分320。在本實施例中,第二觸控電極200將修補結構300電性連接至第二觸控電極導線220。In this embodiment, the repair structure 300 is located on the insulating layer GI, and the vertical projection of the repair structure 300 on the substrate SB is located between the vertical projection of the first touch electrode 100 and the second touch electrode 200 on the substrate SB. The repair structure 300 includes, for example, a first portion 310, a second portion 320, and a straight line segment 330 connected between the first portion 310 and the second portion 320. The first portion 310 is in contact with the first touch in the direction D3 of the vertical substrate SB. The electrode 100 overlaps, and the second portion 320 overlaps the second touch electrode 200 in the vertical substrate SB direction D3, but the invention is not limited thereto. In some embodiments, the repair structure 300 includes, for example, only the first portion 310 and the second portion 320 without a straight line segment. In this embodiment, the data line DL, the first touch electrode lead 120, the second touch electrode lead 220, and the repair structure 300 belong to the same film layer. The second touch electrode 200 is electrically connected to the second portion 320 of the repair structure 300 through the opening H3 in the insulating layer P1. In this embodiment, the second touch electrode 200 electrically connects the repair structure 300 to the second touch electrode wire 220.

修補結構300之第一部分310於垂直基板SB的方向D3上重疊於第一凸出部110。修補結構300與第一凸出部110在熔接區WR中重疊。The first portion 310 of the repair structure 300 overlaps the first protruding portion 110 in the direction D3 of the vertical substrate SB. The repair structure 300 and the first protruding portion 110 overlap in the welding region WR.

第一觸控電極導線120與第二觸控電極導線220中的至少一個與對應的第一觸控電極100或第二觸控電極200電性連接。在一些實施例中,若第一觸控電極100與第二觸控電極200皆未出現故障,第一觸控電極導線120與第二觸控電極導線220分別與對應的第一觸控電極100與第二觸控電極200電性連接,第一觸控電極100與修補結構300電性分離。At least one of the first touch electrode lead 120 and the second touch electrode lead 220 is electrically connected to the corresponding first touch electrode 100 or the second touch electrode 200. In some embodiments, if neither the first touch electrode 100 nor the second touch electrode 200 is faulty, the first touch electrode lead 120 and the second touch electrode lead 220 are respectively corresponding to the corresponding first touch electrode 100 The first touch electrode 100 and the repair structure 300 are electrically connected to the second touch electrode 200.

在一些實施例中,當第一觸控電極導線120斷路時,例如是第一觸控電極導線120斷掉或第一觸控電極100與第一觸控電極導線120未於開口H1處連接,因此,無法提供適當的觸控訊號至第一觸控電極100。此時可以利用雷射或其他類似的手段,使第一觸控電極100電性連接至修補結構300。故障的第一觸控電極100透過修補結構300以及第二觸控電極200而電性連接至第二觸控電極導線220,使第二觸控電極導線220代替斷路的第一觸控電極導線120傳送訊號至故障的第一觸控電極100。In some embodiments, when the first touch electrode lead 120 is disconnected, for example, the first touch electrode lead 120 is broken or the first touch electrode 100 and the first touch electrode lead 120 are not connected at the opening H1. Therefore, an appropriate touch signal cannot be provided to the first touch electrode 100. At this time, the first touch electrode 100 can be electrically connected to the repair structure 300 by using laser or other similar means. The faulty first touch electrode 100 is electrically connected to the second touch electrode wire 220 through the repair structure 300 and the second touch electrode 200, so that the second touch electrode wire 220 replaces the disconnected first touch electrode wire 120. Send a signal to the faulty first touch electrode 100.

在一些實施例中,當第二觸控電極導線220斷路時,例如是第二觸控電極導線220斷掉或第二觸控電極200與第二觸控電極導線220未於開口H2處連接,因此,無法提供適當的觸控訊號至第二觸控電極200。此時可以利用雷射或其他類似的手段,使第一觸控電極100電性連接至修補結構300。故障的第二觸控電極200透過修補結構300以及第一觸控電極100而電性連接至第一觸控電極導線120,使第一觸控電極導線120代替斷路的第二觸控電極導線220傳送訊號至第二觸控電極200。In some embodiments, when the second touch electrode lead 220 is disconnected, for example, the second touch electrode lead 220 is broken or the second touch electrode 200 and the second touch electrode lead 220 are not connected at the opening H2, Therefore, a proper touch signal cannot be provided to the second touch electrode 200. At this time, the first touch electrode 100 can be electrically connected to the repair structure 300 by using laser or other similar means. The faulty second touch electrode 200 is electrically connected to the first touch electrode lead 120 through the repair structure 300 and the first touch electrode 100, so that the first touch electrode lead 120 replaces the disconnected second touch electrode lead 220. Send a signal to the second touch electrode 200.

在一些實施例中,前述的雷射還可以熔化部分的修補結構300,使修補結構300與第一觸控電極100能更佳的電性連接在一起。In some embodiments, the aforementioned laser can also melt a part of the repair structure 300 so that the repair structure 300 and the first touch electrode 100 can be better electrically connected together.

基於上述,即使第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,或第二觸控電極導線220與第二觸控電極200在連接處斷開導致第二觸控電極200故障,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或第二觸控電極200,因此,可以提升成功修復觸控陣列基板1的機率。Based on the above, even if the first touch electrode lead 120 and the first touch electrode 100 are disconnected at the connection, the first touch electrode 100 fails, or the second touch electrode lead 220 and the second touch electrode 200 are at the connection. The failure of the second touch electrode 200 caused by the disconnection can still be repaired by the repair structure 300 overlapping the first touch electrode 100. Therefore, the successful repair can be improved. The probability of the touch array substrate 1.

圖2是依照本發明的一實施例的一種觸控陣列基板2的上視示意圖。在此必須說明的是,圖2的實施例沿用圖1A、圖1B的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 2 is a schematic top view of a touch array substrate 2 according to an embodiment of the present invention. It must be noted here that the embodiment of FIG. 2 inherits the component numbers and parts of the embodiments of FIGS. 1A and 1B, in which the same or similar reference numerals are used to indicate the same or similar components, and the same technical content is omitted. Instructions. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖2,在本實施例中,觸控陣列基板2的第一觸控電極導線120斷路,例如是在缺陷區DF出現斷線。利用雷射或其他類似的手段形成熔接點W,使第一觸控電極100的第一凸出部110與修補結構300熔接,使第一觸控電極100的第一凸出部110與修補結構300電性連接。第一觸控電極100透過修補結構300以及第二觸控電極200而電性連接至第二觸控電極導線220,使第二觸控電極導線220代替斷路的第一觸控電極導線120傳送訊號至第一觸控電極100。Please refer to FIG. 2. In this embodiment, the first touch electrode lead 120 of the touch array substrate 2 is disconnected, for example, a disconnection occurs in the defect area DF. The welding point W is formed by laser or other similar means, so that the first protruding portion 110 of the first touch electrode 100 and the repair structure 300 are welded, so that the first protruding portion 110 of the first touch electrode 100 and the repair structure are fused. 300 electrical connections. The first touch electrode 100 is electrically connected to the second touch electrode lead 220 through the repair structure 300 and the second touch electrode 200, so that the second touch electrode lead 220 transmits a signal instead of the disconnected first touch electrode lead 120. To the first touch electrode 100.

在本實施例中,是由於第一觸控電極導線120斷線導致第一觸控電極導線120斷路,但本發明不以此為限。在一些實施例中,第一觸控電極導線120與第一觸控電極100在連接處斷開造成第一觸控電極導線120斷路,並導致第一觸控電極100故障,依然可以用本實施例形成熔接點W的方式來修復故障的第一觸控電極100。In this embodiment, the first touch electrode lead 120 is disconnected due to the disconnection of the first touch electrode lead 120, but the present invention is not limited thereto. In some embodiments, the disconnection of the first touch electrode lead 120 and the first touch electrode 100 at the connection causes the first touch electrode lead 120 to be disconnected and causes the first touch electrode 100 to fail, which can still be implemented using this implementation. The method of forming the welding point W is used to repair the faulty first touch electrode 100.

在本實施例中,形成熔接點W是為了修復故障的第一觸控電極100,但本發明不以此為限。在一些實施例中,第一觸控電極100正常運作,第二觸控電極導線220斷路導致第二觸控電極200故障,可以用本實施例形成熔接點W的方式來修復故障的第二觸控電極200。In this embodiment, the welding point W is formed to repair the faulty first touch electrode 100, but the invention is not limited thereto. In some embodiments, the first touch electrode 100 is operating normally, and the second touch electrode wire 220 is disconnected, which causes the second touch electrode 200 to malfunction. The faulty second contact can be repaired by forming a welding point W in this embodiment.控 Guests200.

圖3A是依照本發明的一實施例的一種觸控陣列基板3的上視示意圖。圖3B是沿著圖3A線AA’、BB’以及CC’的剖面示意圖。在此必須說明的是,圖3A、圖3B的實施例沿用圖1A、圖1B的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 3A is a schematic top view of a touch array substrate 3 according to an embodiment of the present invention. FIG. 3B is a schematic cross-sectional view taken along line AA ', BB', and CC 'of FIG. 3A. It must be explained here that the embodiments of FIG. 3A and FIG. 3B inherit the component numbers and parts of the embodiments of FIG. 1A and FIG. 1B, in which the same or similar reference numerals are used to indicate the same or similar components, and the same Description of technical content. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖3A與圖3B,第一觸控電極100與第二觸控電極200的開口O’露出開關元件T,能減少第一觸控電極100與開關元件T之間的寄生電容以及第二觸控電極200與開關元件T之間的寄生電容。在本實施例中,開口O’露出開關元件T,且其中一個畫素電極PE穿過開口O’而與其中一個開關元件T電性連接。Please refer to FIGS. 3A and 3B. The opening O ′ of the first touch electrode 100 and the second touch electrode 200 exposes the switching element T, which can reduce the parasitic capacitance between the first touch electrode 100 and the switching element T and the second Parasitic capacitance between the touch electrode 200 and the switching element T. In this embodiment, the opening O 'exposes the switching element T, and one of the pixel electrodes PE passes through the opening O' and is electrically connected to one of the switching elements T.

在本實施例中,掃描線SL、資料線DL以及修補結構300屬於不同膜層。修補結構300、第一觸控電極導線120以及第二觸控電極導線220屬於同一膜層,修補結構300、第一觸控電極導線120以及第二觸控電極導線220例如是藉由同一道圖案化製程所定義出來的。在本實施例中,修補結構300、第一觸控電極導線120以及第二觸控電極導線220位於絕緣層P1上,絕緣層P3覆蓋修補結構300、第一觸控電極導線120以及第二觸控電極導線220,且絕緣層P3位於絕緣層P1與絕緣層P2之間。第一觸控電極100穿過絕緣層P3中的開口H1而電性連接至第一觸控電極導線120。第二觸控電極200穿過絕緣層P3中的開口H2而電性連接至第二觸控電極導線220。第二觸控電極200穿過絕緣層P3中的開口H3而電性連接至修補結構300。在本實施例中,於垂直基板SB的方向D3上,資料線DL被修補結構300、第一觸控電極導線120以及第二觸控電極導線220所覆蓋,但本發明不以此為限。在其他實施例中,資料線DL可以不被修補結構300、第一觸控電極導線120以及第二觸控電極導線220所覆蓋。In this embodiment, the scan lines SL, the data lines DL, and the repair structure 300 belong to different film layers. The repair structure 300, the first touch electrode wire 120, and the second touch electrode wire 220 belong to the same film layer. The repair structure 300, the first touch electrode wire 120, and the second touch electrode wire 220, for example, use the same pattern. Defined by the chemical process. In this embodiment, the repair structure 300, the first touch electrode lead 120, and the second touch electrode lead 220 are located on the insulating layer P1, and the insulation layer P3 covers the repair structure 300, the first touch electrode lead 120, and the second touch The control electrode lead 220, and the insulating layer P3 is located between the insulating layer P1 and the insulating layer P2. The first touch electrode 100 is electrically connected to the first touch electrode lead 120 through the opening H1 in the insulating layer P3. The second touch electrode 200 is electrically connected to the second touch electrode wire 220 through the opening H2 in the insulating layer P3. The second touch electrode 200 is electrically connected to the repair structure 300 through the opening H3 in the insulating layer P3. In this embodiment, in the direction D3 of the vertical substrate SB, the data line DL is covered by the repair structure 300, the first touch electrode lead 120 and the second touch electrode lead 220, but the present invention is not limited thereto. In other embodiments, the data line DL may not be covered by the repair structure 300, the first touch electrode lead 120 and the second touch electrode lead 220.

在本實施例中,第一觸控電極100與第二觸控電極200皆未出現故障,故第一觸控電極100與修補結構300電性分離。In this embodiment, neither the first touch electrode 100 nor the second touch electrode 200 is faulty, so the first touch electrode 100 and the repair structure 300 are electrically separated.

在一些實施例中,當第一觸控電極導線120斷路導致第一觸控電極100故障時,可以利用雷射或其他類似的手段,使第一觸控電極100電性連接至修補結構300。故障的第一觸控電極100透過修補結構300以及第二觸控電極200而電性連接至第二觸控電極導線220,使第二觸控電極導線220代替斷路的第一觸控電極導線120傳送訊號至故障的第一觸控電極100。In some embodiments, when the first touch electrode wire 120 is disconnected and the first touch electrode 100 is faulty, the first touch electrode 100 may be electrically connected to the repair structure 300 by using a laser or other similar means. The faulty first touch electrode 100 is electrically connected to the second touch electrode wire 220 through the repair structure 300 and the second touch electrode 200, so that the second touch electrode wire 220 replaces the disconnected first touch electrode wire 120. Send a signal to the faulty first touch electrode 100.

在一些實施例中,當第二觸控電極導線220斷路導致第二觸控電極200故障時,可以利用雷射或其他類似的手段,使第一觸控電極100電性連接至修補結構300。故障的第二觸控電極200透過修補結構300以及第一觸控電極100而電性連接至第一觸控電極導線120,使第一觸控電極導線120代替斷路的第二觸控電極導線220傳送訊號至故障的第二觸控電極200。In some embodiments, when the second touch electrode wire 220 is disconnected and the second touch electrode 200 is faulty, the first touch electrode 100 may be electrically connected to the repair structure 300 by using laser or other similar means. The faulty second touch electrode 200 is electrically connected to the first touch electrode lead 120 through the repair structure 300 and the first touch electrode 100, so that the first touch electrode lead 120 replaces the disconnected second touch electrode lead 220. Send a signal to the faulty second touch electrode 200.

基於上述,即使第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,或第二觸控電極導線220與第二觸控電極200在連接處斷開導致第二觸控電極200故障,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或故障的第二觸控電極200,因此,可以提升成功修復觸控陣列基板3的機率。Based on the above, even if the first touch electrode lead 120 and the first touch electrode 100 are disconnected at the connection, the first touch electrode 100 fails, or the second touch electrode lead 220 and the second touch electrode 200 are at the connection. The disconnection results in the failure of the second touch electrode 200, and the repair structure 300 overlapping the first touch electrode 100 can still be used to repair the failed first touch electrode 100 or the failed second touch electrode 200. Therefore, the repair can be improved. The probability of successfully repairing the touch array substrate 3.

圖4是依照本發明的一實施例的一種觸控陣列基板4的上視示意圖。在此必須說明的是,圖4的實施例沿用圖3A、圖3B的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 4 is a schematic top view of a touch array substrate 4 according to an embodiment of the present invention. It must be noted here that the embodiment of FIG. 4 follows the component numbers and parts of the embodiments of FIGS. 3A and 3B, in which the same or similar reference numerals are used to indicate the same or similar components, and the same technical content is omitted. Instructions. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖4,掃描線SL、資料線DL以及修補結構300屬於不同膜層。在本實施例中,修補結構300、第一觸控電極導線120以及第二觸控電極導線220屬於同一膜層。修補結構300、第一觸控電極導線120以及第二觸控電極導線220例如是藉由同一道圖案化製程所定義出來的。Please refer to FIG. 4, the scan lines SL, the data lines DL, and the repair structure 300 belong to different film layers. In this embodiment, the repair structure 300, the first touch electrode lead 120 and the second touch electrode lead 220 belong to the same film layer. The repair structure 300, the first touch electrode lead 120, and the second touch electrode lead 220 are defined, for example, by a same patterning process.

在本實施例中,觸控陣列基板4的第一觸控電極導線120斷路,例如是在缺陷區DF出現斷線,導致第一觸控電極100故障。In this embodiment, the first touch electrode lead 120 of the touch array substrate 4 is disconnected, for example, a disconnection occurs in the defect area DF, which causes the first touch electrode 100 to fail.

利用雷射或其他類似的手段形成熔接點W,使故障的第一觸控電極100的第一凸出部110與修補結構300熔接,使第一觸控電極100的第一凸出部110與修補結構300電性連接。故障的第一觸控電極100透過修補結構300以及第二觸控電極200而電性連接至第二觸控電極導線220,使第二觸控電極導線220代替斷路的第一觸控電極導線120傳送訊號至故障的第一觸控電極100。The welding point W is formed by laser or other similar means, so that the first protruding portion 110 of the faulty first touch electrode 100 and the repair structure 300 are welded, so that the first protruding portion 110 of the first touch electrode 100 and The repair structure 300 is electrically connected. The faulty first touch electrode 100 is electrically connected to the second touch electrode wire 220 through the repair structure 300 and the second touch electrode 200, so that the second touch electrode wire 220 replaces the disconnected first touch electrode wire 120. Send a signal to the faulty first touch electrode 100.

圖5A是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。圖5B是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。圖5C是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。在此必須說明的是,圖5A、圖5B、圖5C的實施例沿用圖1A、圖1B的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。5A is a schematic top view of a touch array substrate according to an embodiment of the present invention. 5B is a schematic top view of a touch array substrate according to an embodiment of the present invention. 5C is a schematic top view of a touch array substrate according to an embodiment of the present invention. It must be explained here that the embodiments of FIG. 5A, FIG. 5B, and FIG. 5C inherit the component numbers and parts of the embodiments of FIG. 1A and FIG. Explanation of the same technical content is omitted. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖5A,觸控陣列基板包括多個觸控電極E(包括前述的第一觸控電極100與第二觸控電極200)、多條觸控電極導線R(包括前述的第一觸控電極導線120與第二觸控電極導線220)以及驅動元件DR。觸控電極導線R可以將驅動元件DR所發出的訊號分別傳遞給對應的觸控電極E。驅動元件DR例如可以產生共用電壓訊號與觸控訊號。Please refer to FIG. 5A, the touch array substrate includes a plurality of touch electrodes E (including the aforementioned first touch electrodes 100 and second touch electrodes 200), a plurality of touch electrode wires R (including the aforementioned first touch The electrode lead 120 and the second touch electrode lead 220) and the driving element DR. The touch electrode wires R can respectively transmit signals sent from the driving elements DR to the corresponding touch electrodes E. The driving element DR can generate a common voltage signal and a touch signal, for example.

請參考圖5B,圖5B之實施例與圖5A之實施例的不同之處在於:圖5B之實施例的觸控電極導線R除了從驅動元件DR延伸至與其電性連接的觸控電極E之外,還會繼續延伸並超過與其電性連接的觸控電極E,藉此降低不同觸控電極導線R之間的長度差異,改善觸控陣列基板透光度不均勻或顏色不均勻的問題。Please refer to FIG. 5B. The embodiment of FIG. 5B is different from the embodiment of FIG. 5A in that the touch electrode wire R of the embodiment of FIG. 5B extends from the driving element DR to the touch electrode E electrically connected to it. In addition, it will continue to extend beyond the touch electrodes E electrically connected to it, thereby reducing the difference in length between different touch electrode wires R, and improving the problem of uneven light transmittance or uneven color of the touch array substrate.

圖5C例如是圖5A之觸控陣列基板的一種實施態樣,為了方便說明,圖5C取了圖5A中之其中一個觸控電極E和相鄰於該觸控電極E上下左右的其他觸控電極E做為說明。觸控陣列基板5包括第一觸控電極100、第二觸控電極200、第一觸控電極導線120以及第二觸控電極導線220。第一觸控電極導線120與第二觸控電極導線220可以將驅動元件DR所發出的訊號分別傳遞給第一觸控電極100與第二觸控電極200。驅動元件DR例如可以產生共用電壓訊號與觸控訊號。在本實施例中,第一觸控電極100例如是重疊於一條第一觸控電極導線120以及至少一條第二觸控電極導線220,但本發明不以此為限。第一觸控電極100與第二觸控電極200都可以重疊於多條第一觸控電極導線120以及多條第二觸控電極導線220。FIG. 5C is, for example, an embodiment of the touch array substrate of FIG. 5A. For the convenience of explanation, FIG. 5C shows one of the touch electrodes E in FIG. 5A and other touches adjacent to the touch electrode E above and below. Electrode E is used for illustration. The touch array substrate 5 includes a first touch electrode 100, a second touch electrode 200, a first touch electrode lead 120, and a second touch electrode lead 220. The first touch electrode lead 120 and the second touch electrode lead 220 can transmit signals from the driving element DR to the first touch electrode 100 and the second touch electrode 200, respectively. The driving element DR can generate a common voltage signal and a touch signal, for example. In this embodiment, the first touch electrode 100 is, for example, overlapped with a first touch electrode wire 120 and at least one second touch electrode wire 220, but the present invention is not limited thereto. Both the first touch electrode 100 and the second touch electrode 200 may overlap the plurality of first touch electrode wires 120 and the plurality of second touch electrode wires 220.

在資料線(繪示於圖1A)的延伸方向D1上,第一觸控電極100位於與其相鄰的兩個第二觸控電極200A/200B之間,兩個修補結構300A/300B於基板SB上的垂直投影分別位於第一觸控電極100於基板SB上的垂直投影與兩個第二觸控電極200A/200B於基板SB上的垂直投影之間。修補結構300A/300B分別透過開口H5與開口H6而與第一觸控電極100電性連接。修補結構300A/300B分別重疊於第二觸控電極200A/200B的第二凸出部210A/210B。In the extension direction D1 of the data line (shown in FIG. 1A), the first touch electrode 100 is located between two adjacent second touch electrodes 200A / 200B, and two repair structures 300A / 300B are on the substrate SB The vertical projections are located between the vertical projections of the first touch electrodes 100 on the substrate SB and the vertical projections of the two second touch electrodes 200A / 200B on the substrate SB. The repair structure 300A / 300B is electrically connected to the first touch electrode 100 through the opening H5 and the opening H6, respectively. The repair structures 300A / 300B overlap the second protruding portions 210A / 210B of the second touch electrodes 200A / 200B, respectively.

在掃描線(繪示於圖1A)的延伸方向D2上,第一觸控電極100位於與其相鄰的另外兩個第二觸控電極200C/200D之間,另外兩個修補結構300C/300D於基板SB上的垂直投影分別位於第一觸控電極100於基板SB上的垂直投影與另外兩個第二觸控電極200C/200D於基板SB上的垂直投影之間。修補結構300C/300D分別透過開口H3與開口H4電性連接至第二觸控電極200C/200D。修補結構300C/300D分別重疊於第一觸控電極100的第一凸出部110C/110D。In the extending direction D2 of the scanning line (shown in FIG. 1A), the first touch electrode 100 is located between the other two second touch electrodes 200C / 200D adjacent to it, and the other two repair structures 300C / 300D are The vertical projections on the substrate SB are respectively located between the vertical projections of the first touch electrode 100 on the substrate SB and the vertical projections of the other two second touch electrodes 200C / 200D on the substrate SB. The repair structure 300C / 300D is electrically connected to the second touch electrode 200C / 200D through the opening H3 and the opening H4, respectively. The repair structures 300C / 300D overlap the first protrusions 110C / 110D of the first touch electrode 100, respectively.

基於上述,即使第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,或第二觸控電極導線220與第二觸控電極200在連接處斷開導致第二觸控電極200故障,又或是第一觸控電極導線120斷線,或是第二觸控電極導線220斷線,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或第二觸控電極200,因此,可以提升成功修復觸控陣列基板5的機率。Based on the above, even if the first touch electrode lead 120 and the first touch electrode 100 are disconnected at the connection, the first touch electrode 100 fails, or the second touch electrode lead 220 and the second touch electrode 200 are at the connection. The disconnection causes the second touch electrode 200 to fail, or the first touch electrode wire 120 is disconnected, or the second touch electrode wire 220 is disconnected. The repair structure overlapping the first touch electrode 100 can still be used. 300 to repair the faulty first touch electrode 100 or the second touch electrode 200. Therefore, the probability of successfully repairing the touch array substrate 5 can be improved.

圖6是依照本發明的一實施例的一種觸控陣列基板6的上視示意圖。在此必須說明的是,圖6的實施例沿用圖5的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 6 is a schematic top view of a touch array substrate 6 according to an embodiment of the present invention. It must be noted here that the embodiment of FIG. 6 follows the component numbers and parts of the embodiment of FIG. 5, wherein the same or similar reference numerals are used to represent the same or similar components, and the description of the same technical content is omitted. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖6,觸控陣列基板6包括多個第一觸控電極100、多個第二觸控電極200、多條第一觸控電極導線120以及多條第二觸控電極導線220。Please refer to FIG. 6, the touch array substrate 6 includes a plurality of first touch electrodes 100, a plurality of second touch electrodes 200, a plurality of first touch electrode wires 120 and a plurality of second touch electrode wires 220.

在本實施例中,觸控陣列基板6的第一觸控電極導線120斷路,例如是在缺陷區DF出現斷線,導致第一觸控電極100故障。利用雷射或其他類似的手段形成熔接點W,使故障的第一觸控電極100之第一凸出部110C與修補結構300C熔接,使第一觸控電極100的第一凸出部110與修補結構300C電性連接。故障的第一觸控電極100透過修補結構300C而電性連接至第二觸控電極200C,並藉由第二觸控電極200C而被修復。In this embodiment, the first touch electrode wire 120 of the touch array substrate 6 is disconnected, for example, a disconnection occurs in the defect area DF, which causes the first touch electrode 100 to fail. The welding point W is formed by laser or other similar means, so that the first protruding portion 110C of the faulty first touch electrode 100 and the repair structure 300C are welded, so that the first protruding portion 110 of the first touch electrode 100 and The repair structure 300C is electrically connected. The faulty first touch electrode 100 is electrically connected to the second touch electrode 200C through the repair structure 300C, and is repaired by the second touch electrode 200C.

在本實施例中,是由於第一觸控電極導線120於缺陷區DF斷線導致第一觸控電極100斷路,但本發明不以此為限。在一些實施例中,第一觸控電極導線120與第一觸控電極100在連接處(例如於開口H1處)斷開造成第一觸控電極導線120斷路,並導致第一觸控電極100故障,依然可以用本實施例形成熔接點W的方式來修復故障的第一觸控電極100。In this embodiment, the first touch electrode 100 is disconnected due to the first touch electrode wire 120 being disconnected in the defect area DF, but the present invention is not limited thereto. In some embodiments, the disconnection of the first touch electrode lead 120 and the first touch electrode 100 at the connection (for example, at the opening H1) causes the first touch electrode lead 120 to be disconnected, and causes the first touch electrode 100 to be disconnected. In the case of a fault, the faulty first touch electrode 100 can still be repaired by forming the welding point W in this embodiment.

在本實施例中,熔接點W形成於第一凸出部110C,但本發明不以此為限。在一些實施例中,熔接點W形成於第一凸出部110D,第一觸控電極100透過修補結構300D而電性連接至第二觸控電極200D。在一些實施例中,熔接點W形成於第二凸出部210A,第一觸控電極100透過修補結構300A而電性連接至第二觸控電極200A。在一些實施例中,熔接點W形成於第二凸出部210B,第一觸控電極100透過修補結構300B而電性連接至第二觸控電極200B。In this embodiment, the welding point W is formed at the first protruding portion 110C, but the invention is not limited thereto. In some embodiments, the welding point W is formed on the first protruding portion 110D, and the first touch electrode 100 is electrically connected to the second touch electrode 200D through the repair structure 300D. In some embodiments, the welding point W is formed at the second protruding portion 210A, and the first touch electrode 100 is electrically connected to the second touch electrode 200A through the repair structure 300A. In some embodiments, the welding point W is formed at the second protruding portion 210B, and the first touch electrode 100 is electrically connected to the second touch electrode 200B through the repair structure 300B.

在本實施例的觸控陣列基板6中,當第一觸控電極100故障時,可以利用修補結構300A/300B/300C/300D電性連接故障的第一觸控電極100與第二觸控電極200A/200B/200C/200D中之其中一個,以修復故障之第一觸控電極100。In the touch array substrate 6 of this embodiment, when the first touch electrode 100 fails, the repair structure 300A / 300B / 300C / 300D can be used to electrically connect the failed first touch electrode 100 and the second touch electrode. One of 200A / 200B / 200C / 200D to repair the faulty first touch electrode 100.

基於上述,即使第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,或第二觸控電極導線220與第二觸控電極200在連接處斷開導致第二觸控電極200故障,又或是第一觸控電極導線120斷線,或是第二觸控電極導線220斷線,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或第二觸控電極200,因此,可以提升成功修復觸控陣列基板6的機率。Based on the above, even if the first touch electrode lead 120 and the first touch electrode 100 are disconnected at the connection, the first touch electrode 100 fails, or the second touch electrode lead 220 and the second touch electrode 200 are at the connection. The disconnection causes the second touch electrode 200 to fail, or the first touch electrode wire 120 is disconnected, or the second touch electrode wire 220 is disconnected. The repair structure overlapping the first touch electrode 100 can still be used. 300 to repair the faulty first touch electrode 100 or the second touch electrode 200. Therefore, the probability of successfully repairing the touch array substrate 6 can be increased.

圖7A是依照本發明的一實施例的一種觸控陣列基板7的上視示意圖。圖7B是沿著圖7A線AA’、BB’以及CC’的剖面示意圖。在此必須說明的是,圖7A、圖7B的實施例沿用圖1A、圖1B的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 7A is a schematic top view of a touch array substrate 7 according to an embodiment of the present invention. FIG. 7B is a schematic cross-sectional view taken along lines AA ', BB', and CC 'of FIG. 7A. It must be explained here that the embodiments of FIG. 7A and FIG. 7B follow the component numbers and parts of the embodiments of FIG. 1A and FIG. 1B, in which the same or similar reference numerals are used to indicate the same or similar components, and the same Description of technical content. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖7A與圖7B,修補結構300位於絕緣層P2上,且與畫素電極PE屬於同一膜層。修補結構300例如與畫素電極PE是在同一道圖案化製程中所定義出來的。第二觸控電極200的邊緣200a包括第二凸出部210,鄰近第一觸控電極100。在本實施例中,第二凸出部210沿著方向D1延伸,但本發明不以此為限。在其他實施例中,第二凸出部210沿著方向D2延伸。修補結構300於垂直基板SB的方向D3上重疊於第一凸出部110以及第二凸出部120。Please refer to FIGS. 7A and 7B. The repair structure 300 is located on the insulating layer P2 and belongs to the same film layer as the pixel electrode PE. The repair structure 300 is defined in the same patterning process as the pixel electrode PE, for example. An edge 200 a of the second touch electrode 200 includes a second protruding portion 210 adjacent to the first touch electrode 100. In this embodiment, the second protruding portion 210 extends along the direction D1, but the invention is not limited thereto. In other embodiments, the second protrusion 210 extends along the direction D2. The repairing structure 300 overlaps the first protruding portion 110 and the second protruding portion 120 in the direction D3 of the vertical substrate SB.

在本實施例中,第一觸控電極100與第一觸控電極導線120電性連接,第二觸控電極200與第二觸控電極導線220電性連接。第一觸控電極100與第二觸控電極200皆未發生故障。在本實施例中,第一觸控電極100及第二觸控電極200皆未發生故障,故修補結構300為浮置電極。In this embodiment, the first touch electrode 100 is electrically connected to the first touch electrode lead 120, and the second touch electrode 200 is electrically connected to the second touch electrode lead 220. Neither the first touch electrode 100 nor the second touch electrode 200 failed. In this embodiment, neither the first touch electrode 100 nor the second touch electrode 200 is faulty, so the repair structure 300 is a floating electrode.

基於上述,當第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,或第二觸控電極導線220與第二觸控電極200在連接處斷開導致第二觸控電極200故障,又或是第一觸控電極導線120斷線,或是第二觸控電極導線220斷線,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或第二觸控電極200,因此,可以提升成功修復觸控陣列基板7的機率。Based on the above, when the first touch electrode lead 120 and the first touch electrode 100 are disconnected at the connection, the first touch electrode 100 fails, or the second touch electrode lead 220 and the second touch electrode 200 are at the connection. The disconnection causes the second touch electrode 200 to fail, or the first touch electrode wire 120 is disconnected, or the second touch electrode wire 220 is disconnected. The repair structure overlapping the first touch electrode 100 can still be used. 300 to repair the faulty first touch electrode 100 or the second touch electrode 200, so the probability of successfully repairing the touch array substrate 7 can be increased.

圖8是依照本發明的一實施例的一種觸控陣列基板8的上視示意圖。在此必須說明的是,圖8的實施例沿用圖7A、圖7B的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 8 is a schematic top view of a touch array substrate 8 according to an embodiment of the present invention. It must be noted here that the embodiment of FIG. 8 inherits the component numbers and parts of the embodiments of FIGS. 7A and 7B, in which the same or similar reference numerals are used to indicate the same or similar components, and the same technical content is omitted. Instructions. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

在本實施例中,觸控陣列基板8的第一觸控電極導線120斷路,例如是在缺陷區DF出現斷線,導致第一觸控電極100故障。利用雷射或其他類似的手段形成熔接點W,使第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210以及修補結構300熔接,使第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210與修補結構300電性連接。第一觸控電極100透過修補結構300與第二觸控電極200而電性連接至第二觸控電極導線220。第二觸控電極導線220代替斷路的第一觸控電極導線120傳送訊號至故障的第一觸控電極100。In this embodiment, the first touch electrode lead 120 of the touch array substrate 8 is disconnected, for example, a disconnection occurs in the defect area DF, which causes the first touch electrode 100 to fail. The welding point W is formed by laser or other similar means, so that the first protruding portion 110 of the first touch electrode 100, the second protruding portion 210 of the second touch electrode 200, and the repair structure 300 are welded, so that the first The first protruding portion 110 of the touch electrode 100 and the second protruding portion 210 of the second touch electrode 200 are electrically connected to the repair structure 300. The first touch electrode 100 is electrically connected to the second touch electrode wire 220 through the repair structure 300 and the second touch electrode 200. The second touch electrode lead 220 replaces the disconnected first touch electrode lead 120 to transmit a signal to the faulty first touch electrode 100.

在本實施例中,是由於第一觸控電極導線120斷線導致第一觸控電極100斷路,但本發明不以此為限。在一些實施例中,第一觸控電極導線120與第一觸控電極100在連接處斷開(例如於開口H1的位置)造成第一觸控電極導線120斷路,並導致第一觸控電極100故障,依然可以用形成熔接點W的方式來修復故障的第一觸控電極100。In this embodiment, the first touch electrode 100 is disconnected due to the disconnection of the first touch electrode lead 120, but the present invention is not limited thereto. In some embodiments, the disconnection of the first touch electrode lead 120 and the first touch electrode 100 at the connection (for example, at the position of the opening H1) causes the first touch electrode lead 120 to be disconnected and causes the first touch electrode If the fault 100 occurs, the faulty first touch electrode 100 can still be repaired by forming the welding point W.

在本實施例中,形成熔接點W是為了修復故障的第一觸控電極100,但本發明不以此為限。在一些實施例中,第一觸控電極100正常運作,第二觸控電極導線220斷路導致第二電極200故障,依然可以用本實施例形成熔接點W的方式來修復故障的第二電極200。In this embodiment, the welding point W is formed to repair the faulty first touch electrode 100, but the invention is not limited thereto. In some embodiments, the first touch electrode 100 is operating normally, and the second touch electrode wire 220 is disconnected to cause the second electrode 200 to malfunction. The faulty second electrode 200 can still be repaired by forming a welding point W in this embodiment. .

在本實施例中,形成一個熔接點W使第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210以及修補結構300熔接,使第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210與修補結構300電性連接,但本發明不以此為限。在一些實施例中,分別在第一凸出部110與第二凸出部210處形成熔接點W,換句話說,可以形成兩個以上的熔接點以使第一凸出部110、第二觸控電極200的第二凸出部210以及修補結構300熔接,使第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210與修補結構300電性連接。In this embodiment, a welding point W is formed to weld the first protruding portion 110 of the first touch electrode 100, the second protruding portion 210 of the second touch electrode 200, and the repair structure 300 to make the first touch The first protruding portion 110 of the electrode 100 and the second protruding portion 210 of the second touch electrode 200 are electrically connected to the repair structure 300, but the invention is not limited thereto. In some embodiments, welding points W are formed at the first protruding portion 110 and the second protruding portion 210, respectively. In other words, more than two welding points may be formed to make the first protruding portion 110, the second The second protruding portion 210 of the touch electrode 200 and the repair structure 300 are welded, so that the first protruding portion 110 of the first touch electrode 100, the second protruding portion 210 of the second touch electrode 200, and the repair structure 300 are electrically connected. Sexual connection.

基於上述,即使第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,或第二觸控電極導線220與第二觸控電極200在連接處斷開導致第二觸控電極200故障,又或是第一觸控電極導線120斷線,或是第二觸控電極導線220斷線,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或第二觸控電極200,因此,可以提升成功修復觸控陣列基板8的機率。Based on the above, even if the first touch electrode lead 120 and the first touch electrode 100 are disconnected at the connection, the first touch electrode 100 fails, or the second touch electrode lead 220 and the second touch electrode 200 are at the connection. The disconnection causes the second touch electrode 200 to fail, or the first touch electrode wire 120 is disconnected, or the second touch electrode wire 220 is disconnected. The repair structure overlapping the first touch electrode 100 can still be used. 300 to repair the faulty first touch electrode 100 or the second touch electrode 200. Therefore, the probability of successfully repairing the touch array substrate 8 can be improved.

圖9A是依照本發明的一實施例的一種觸控陣列基板9的上視示意圖。圖9B是沿著圖9A線AA’、BB’以及CC’的剖面示意圖。在此必須說明的是,圖9A、圖9B的實施例沿用圖7A、圖7B的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 9A is a schematic top view of a touch array substrate 9 according to an embodiment of the present invention. FIG. 9B is a schematic cross-sectional view taken along lines AA ', BB', and CC 'of FIG. 9A. It must be explained here that the embodiments of FIG. 9A and FIG. 9B inherit the component numbers and parts of the embodiments of FIG. 7A and FIG. Description of technical content. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖9A與圖9B,修補結構300位於絕緣層GI上,且資料線DL、第一觸控電極導線120、第二觸控電極導線220、源極S、汲極D以及修補結構300屬於同一膜層,也可以說資料線DL、第一觸控電極導線120、第二觸控電極導線220、源極S、汲極D以及修補結構300是在同一道圖案化製程中所定義出來的。Please refer to FIGS. 9A and 9B. The repair structure 300 is located on the insulating layer GI, and the data line DL, the first touch electrode lead 120, the second touch electrode lead 220, the source S, the drain D, and the repair structure 300 belong to For the same film layer, it can be said that the data line DL, the first touch electrode lead 120, the second touch electrode lead 220, the source S, the drain D, and the repair structure 300 are defined in the same patterning process. .

在本實施例中,第一觸控電極100與第一觸控電極導線120電性連接,第二觸控電極200與第二觸控電極導線220電性連接。第一觸控電極100與第二觸控電極200皆未發生故障。未故障的第一觸控電極100及/或第二觸控電極200所對應之修補結構300為浮置電極。In this embodiment, the first touch electrode 100 is electrically connected to the first touch electrode lead 120, and the second touch electrode 200 is electrically connected to the second touch electrode lead 220. Neither the first touch electrode 100 nor the second touch electrode 200 failed. The repair structure 300 corresponding to the first touch electrode 100 and / or the second touch electrode 200 that is not faulty is a floating electrode.

圖10是依照本發明的一實施例的一種觸控陣列基板10的上視示意圖。在此必須說明的是,圖10的實施例沿用圖9A、圖9B的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 10 is a schematic top view of a touch array substrate 10 according to an embodiment of the present invention. It must be noted here that the embodiment of FIG. 10 follows the component numbers and parts of the embodiments of FIGS. 9A and 9B, in which the same or similar reference numerals are used to indicate the same or similar components, and the same technical content is omitted. Instructions. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

在本實施例中,觸控陣列基板10的第一觸控電極導線120斷路,例如是在缺陷區DF出現斷線,導致第一觸控電極100故障。In this embodiment, the first touch electrode wire 120 of the touch array substrate 10 is disconnected, for example, a disconnection occurs in the defect area DF, which causes the first touch electrode 100 to fail.

利用雷射或其他類似的手段形成熔接點W,使故障的第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210以及修補結構300熔接,使第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210與修補結構300電性連接。故障的第一觸控電極100透過修補結構300與第二觸控電極200而電性連接至第二觸控電極導線220,使第二觸控電極導線220代替斷路的第一觸控電極導線120傳送訊號至故障的第一觸控電極100。The welding point W is formed by laser or other similar means, so that the first protruding portion 110 of the faulty first touch electrode 100, the second protruding portion 210 of the second touch electrode 200, and the repair structure 300 are welded, so that The first protruding portion 110 of the first touch electrode 100 and the second protruding portion 210 of the second touch electrode 200 are electrically connected to the repair structure 300. The faulty first touch electrode 100 is electrically connected to the second touch electrode wire 220 through the repair structure 300 and the second touch electrode 200, so that the second touch electrode wire 220 replaces the disconnected first touch electrode wire 120. Send a signal to the faulty first touch electrode 100.

在本實施例中,是由於第一觸控電極導線120斷線導致第一觸控電極導線120斷路,但本發明不以此為限。在一些實施例中,第一觸控電極導線120與第一觸控電極100在連接處(例如是開口H1的位置)斷開造成第一觸控電極導線120斷路,並導致第一觸控電極100故障,依然可以用本實施例形成熔接點W的方式來修復故障的第一觸控電極100。In this embodiment, the first touch electrode lead 120 is disconnected due to the disconnection of the first touch electrode lead 120, but the present invention is not limited thereto. In some embodiments, the disconnection of the first touch electrode lead 120 and the first touch electrode 100 at the connection (for example, the position of the opening H1) causes the first touch electrode lead 120 to be disconnected and causes the first touch electrode If the fault occurs at 100, the faulty first touch electrode 100 can still be repaired by forming the welding point W in this embodiment.

在本實施例中,形成熔接點W是為了修復故障的第一觸控電極100,但本發明不以此為限。在一些實施例中,第一觸控電極100正常運作,第二觸控電極導線220斷路導致第二電極200故障,依然可以用本實施例形成熔接點W的方式來修復故障的第二電極200。In this embodiment, the welding point W is formed to repair the faulty first touch electrode 100, but the invention is not limited thereto. In some embodiments, the first touch electrode 100 is operating normally, and the second touch electrode wire 220 is disconnected to cause the second electrode 200 to malfunction. The faulty second electrode 200 can still be repaired by forming a welding point W in this embodiment. .

在本實施例中,形成一個熔接點W使第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210以及修補結構300熔接,使第一觸控電極100的第一凸出部110、第二觸控電極200的第二凸出部210與修補結構300電性連接,但本發明不以此為限。在一些實施例中,分別在第一凸出部110與第二凸出部210形成熔接點W,換句話說,可以形成兩個以上的熔接點以使第一凸出部110、第二觸控電極200的第二凸出部210以及修補結構300熔接。In this embodiment, a welding point W is formed to weld the first protruding portion 110 of the first touch electrode 100, the second protruding portion 210 of the second touch electrode 200, and the repair structure 300 to make the first touch The first protruding portion 110 of the electrode 100 and the second protruding portion 210 of the second touch electrode 200 are electrically connected to the repair structure 300, but the invention is not limited thereto. In some embodiments, welding points W are formed on the first protruding portion 110 and the second protruding portion 210, respectively. In other words, two or more welding points may be formed to make the first protruding portion 110 and the second touching portion The second protruding portion 210 of the control electrode 200 and the repair structure 300 are welded.

基於上述,即使第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,或第二觸控電極導線220與第二觸控電極200在連接處斷開導致第二觸控電極200故障,又或是第一觸控電極導線120斷線,或是第二觸控電極導線220斷線,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或第二觸控電極200,因此,可以提升成功修復觸控陣列基板10的機率。Based on the above, even if the first touch electrode lead 120 and the first touch electrode 100 are disconnected at the connection, the first touch electrode 100 fails, or the second touch electrode lead 220 and the second touch electrode 200 are at the connection. The disconnection causes the second touch electrode 200 to fail, or the first touch electrode wire 120 is disconnected, or the second touch electrode wire 220 is disconnected. The repair structure overlapping the first touch electrode 100 can still be used. 300 to repair the faulty first touch electrode 100 or the second touch electrode 200. Therefore, the probability of successfully repairing the touch array substrate 10 can be increased.

圖11是依照本發明的一實施例的一種觸控陣列基板11的上視示意圖。在此必須說明的是,圖11的實施例沿用圖10的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 11 is a schematic top view of a touch array substrate 11 according to an embodiment of the present invention. It must be noted here that the embodiment of FIG. 11 inherits the component numbers and parts of the embodiment of FIG. 10, wherein the same or similar reference numerals are used to represent the same or similar components, and the description of the same technical content is omitted. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖11,圖11例如是圖5A之觸控陣列基板的另外一種實施態樣,且圖11取了圖5A中之其中一個觸控電極10和相鄰於該觸控電極10上下左右的其他觸控電極做為說明。在方向D1上,第一觸控電極100位於與其相鄰的兩個第二觸控電極200A/200B之間,兩個修補結構300A/300B於基板SB上的垂直投影分別位於第一觸控電極100於基板SB上的垂直投影與兩個第二觸控電極200A/200B於基板SB上的垂直投影之間。修補結構300A/300B分別重疊於第一觸控電極100的第一凸出部110A/110B,且修補結構300A/300B分別重疊於第二觸控電極200A/200B的第二凸出部210A/210B。Please refer to FIG. 11, which is another example of the touch array substrate of FIG. 5A, and FIG. 11 illustrates one of the touch electrodes 10 in FIG. 5A and the upper and lower sides of the touch electrode 10 adjacent to the touch electrode 10. Other touch electrodes are used as illustrations. In the direction D1, the first touch electrode 100 is located between two adjacent second touch electrodes 200A / 200B, and the vertical projections of the two repair structures 300A / 300B on the substrate SB are located on the first touch electrode, respectively. Between the vertical projection of 100 on the substrate SB and the vertical projection of the two second touch electrodes 200A / 200B on the substrate SB. The repair structures 300A / 300B overlap the first protrusions 110A / 110B of the first touch electrode 100, and the repair structures 300A / 300B overlap the second protrusions 210A / 210B of the second touch electrode 200A / 200B. .

在方向D2上,第一觸控電極100位於與其相鄰的另外兩個第二觸控電極200C/200D之間,另外兩個修補結構300C/300D於基板SB上的垂直投影分別位於第一觸控電極100於基板SB上的垂直投影與另外兩個第二觸控電極200C/200D於基板SB上的垂直投影之間。修補結構300C/300D分別重疊於第一觸控電極100的第一凸出部110C/110D,且修補結構300C/300D分別重疊於第二觸控電極200C/200D的第二凸出部210C/210D。In the direction D2, the first touch electrode 100 is located between the other two second touch electrodes 200C / 200D adjacent to it, and the vertical projections of the other two repair structures 300C / 300D on the substrate SB are located on the first touch, respectively. The vertical projection of the control electrode 100 on the substrate SB and the vertical projection of the other two second touch electrodes 200C / 200D on the substrate SB. The repair structure 300C / 300D overlaps the first protrusion 110C / 110D of the first touch electrode 100, and the repair structure 300C / 300D overlaps the second protrusion 210C / 210D of the second touch electrode 200C / 200D. .

基於上述,即使第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,或第二觸控電極導線220與第二觸控電極200在連接處斷開導致第二觸控電極200故障,又或是第一觸控電極導線120斷線,或是第二觸控電極導線220斷線,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或第二觸控電極200,因此可以提升成功修復的機率。Based on the above, even if the first touch electrode lead 120 and the first touch electrode 100 are disconnected at the connection, the first touch electrode 100 fails, or the second touch electrode lead 220 and the second touch electrode 200 are at the connection. The disconnection causes the second touch electrode 200 to fail, or the first touch electrode wire 120 is disconnected, or the second touch electrode wire 220 is disconnected. The repair structure overlapping the first touch electrode 100 can still be used. 300 to repair the faulty first touch electrode 100 or the second touch electrode 200, so the probability of successful repair can be increased.

圖12是依照本發明的一實施例的一種觸控陣列基板12的上視示意圖。在此必須說明的是,圖12的實施例沿用圖11的實施例的元件標號與部分內容,其中採用相同或近似的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,在此不贅述。FIG. 12 is a schematic top view of a touch array substrate 12 according to an embodiment of the present invention. It must be noted here that the embodiment of FIG. 12 inherits the component numbers and parts of the embodiment of FIG. 11, in which the same or similar reference numerals are used to represent the same or similar components, and the description of the same technical content is omitted. For the description of the omitted parts, reference may be made to the foregoing embodiments, and details are not described herein.

請參考圖12,觸控陣列基板12的第一觸控電極導線120斷路,例如是在缺陷區DF出現斷線,導致第一觸控電極100故障。Referring to FIG. 12, the first touch electrode wire 120 of the touch array substrate 12 is disconnected, for example, a disconnection occurs in the defect area DF, which causes the first touch electrode 100 to fail.

利用雷射或其他類似的手段形成熔接點W,使第一凸出部110C、第二凸出部210C與修補結構300C熔接,使第一凸出部110C、第二凸出部210C與修補結構300C電性連接。第一觸控電極100透過修補結構300C而電性連接至第二觸控電極200C,使第一觸控電極100能藉由第二觸控電極200C而被修復。A laser or other similar means is used to form the welding point W, so that the first protruding portion 110C and the second protruding portion 210C are welded to the repair structure 300C, and the first protruding portion 110C, the second protruding portion 210C and the repair structure are welded 300C electrical connection. The first touch electrode 100 is electrically connected to the second touch electrode 200C through the repair structure 300C, so that the first touch electrode 100 can be repaired by the second touch electrode 200C.

在本實施例中,是由於第一觸控電極導線120斷線導致第一觸控電極導線120斷路,但本發明不以此為限。在一些實施例中,第一觸控電極導線120與第一觸控電極100在連接處斷開造成第一觸控電極導線120斷路,並導致第一觸控電極100故障,依然可以用本實施例形成熔接點W的方式來修復故障的第一觸控電極100。In this embodiment, the first touch electrode lead 120 is disconnected due to the disconnection of the first touch electrode lead 120, but the present invention is not limited thereto. In some embodiments, the disconnection of the first touch electrode lead 120 and the first touch electrode 100 at the connection causes the first touch electrode lead 120 to be disconnected and causes the first touch electrode 100 to fail, which can still be implemented using this implementation. The method of forming the welding point W is used to repair the faulty first touch electrode 100.

在本實施例中,熔接點W形成於第一凸出部110C與第二凸出部210C,但本發明不以此為限。在一些實施例中,熔接點W形成於第一凸出部110D與第二凸出部210D,第一觸控電極100透過修補結構300D而電性連接至第二觸控電極200D。在一些實施例中,熔接點W形成於第一凸出部110A與第二凸出部210A,第一觸控電極100透過修補結構300A而電性連接至第二觸控電極200A。在一些實施例中,熔接點W形成於第一凸出部110B與第二凸出部210B,第一觸控電極100透過修補結構300B而電性連接至第二觸控電極200B。In this embodiment, the welding point W is formed at the first protruding portion 110C and the second protruding portion 210C, but the present invention is not limited thereto. In some embodiments, the welding point W is formed on the first protruding portion 110D and the second protruding portion 210D, and the first touch electrode 100 is electrically connected to the second touch electrode 200D through the repair structure 300D. In some embodiments, the welding point W is formed at the first protruding portion 110A and the second protruding portion 210A, and the first touch electrode 100 is electrically connected to the second touch electrode 200A through the repair structure 300A. In some embodiments, the welding point W is formed on the first protruding portion 110B and the second protruding portion 210B, and the first touch electrode 100 is electrically connected to the second touch electrode 200B through the repair structure 300B.

基於上述,即使第一觸控電極導線120與第一觸控電極100在連接處斷開導致第一觸控電極100故障,仍然可以用重疊於第一觸控電極100的修補結構300來修復故障的第一觸控電極100或第二觸控電極200,因此,可以提升成功修復觸控陣列基板12的機率。Based on the above, even if the first touch electrode wire 120 and the first touch electrode 100 are disconnected at the connection, which causes the first touch electrode 100 to fail, the repair structure 300 overlapping the first touch electrode 100 can still be used to repair the failure The first touch electrode 100 or the second touch electrode 200 can increase the probability of successfully repairing the touch array substrate 12.

在本發明至少一實施例的觸控陣列基板中,第一觸控電極相鄰於四個第二觸控電極,當第一觸控電極故障時,可以利用修補結構電性連接故障的第一觸控電極與相鄰的其中一個第二觸控電極,以修復故障之該第一觸控電極。In the touch array substrate of at least one embodiment of the present invention, the first touch electrode is adjacent to the four second touch electrodes. When the first touch electrode is faulty, the repaired structure can be used to electrically connect the faulty first The touch electrode and one of the adjacent second touch electrodes are used to repair the faulty first touch electrode.

在本發明至少一實施例的觸控陣列基板中,即使觸控電極導線與觸控電極在連接處斷開導致觸控電極故障,仍然可以用重疊於觸控電極的修補結構來修復故障的觸控電極,因此可以提升成功修復觸控電極的機率。In the touch array substrate of at least one embodiment of the present invention, even if the touch electrode wire and the touch electrode are disconnected at the connection point, which causes the touch electrode to fail, the repair structure overlapping the touch electrode can still be used to repair the faulty touch. Control electrodes, which can increase the chance of successfully repairing the touch electrodes.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed as above with the examples, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some modifications and retouching without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be determined by the scope of the attached patent application.

1、2、3、4、5、6、7、8、9、10、11、12‧‧‧觸控陣列基板1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12‧‧‧ touch array substrate

100‧‧‧第一觸控電極100‧‧‧first touch electrode

100a、200a‧‧‧邊緣100a, 200a‧‧‧Edge

110、110A、110B、110C、110D‧‧‧第一凸出部110, 110A, 110B, 110C, 110D ‧‧‧ first protrusion

120‧‧‧第一觸控電極導線120‧‧‧ the first touch electrode lead

200、200A、200B、200C、200D‧‧‧第二觸控電極200, 200A, 200B, 200C, 200D‧‧‧Second touch electrode

210、210A、210B、210C、210D‧‧‧第二凸出部210, 210A, 210B, 210C, 210D ‧‧‧ second protrusion

220‧‧‧第二觸控電極導線220‧‧‧Second touch electrode wire

300、300A、300B、300C、300D‧‧‧修補結構300, 300A, 300B, 300C, 300D

310‧‧‧第一部分310‧‧‧ Part I

320‧‧‧第二部分320‧‧‧ Part Two

330‧‧‧直線段330‧‧‧Straight segment

D‧‧‧汲極D‧‧‧ Drain

D1、D2、D3‧‧‧方向D1, D2, D3 ‧‧‧ direction

DF‧‧‧缺陷區DF‧‧‧ Defective area

DL‧‧‧資料線DL‧‧‧Data Line

DR‧‧‧驅動元件DR‧‧‧Drive element

E‧‧‧觸控電極E‧‧‧Touch electrode

G‧‧‧閘極G‧‧‧Gate

GI‧‧‧絕緣層GI‧‧‧Insulation

H1、H2、H3、H4、H5、H6、H7、O、O’、O2‧‧‧開口H1, H2, H3, H4, H5, H6, H7, O, O ', O2 ‧‧‧ opening

M‧‧‧通道M‧‧‧channel

O1‧‧‧狹縫O1‧‧‧ slit

P1、P2、P3‧‧‧絕緣層P1, P2, P3 ‧‧‧ insulation layer

PE‧‧‧畫素電極PE‧‧‧Pixel electrode

R‧‧‧觸控電極導線R‧‧‧Touch electrode lead

S‧‧‧源極S‧‧‧Source

SB‧‧‧基板SB‧‧‧ substrate

SL‧‧‧掃描線SL‧‧‧scan line

T‧‧‧開關元件T‧‧‧switching element

U‧‧‧凹槽U‧‧‧ groove

W‧‧‧熔接點W‧‧‧ Welding point

WR‧‧‧熔接區WR‧‧‧ Welding area

圖1A是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖1B是沿著圖1A線AA’、BB’以及CC’的剖面示意圖。 圖2是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖3A是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖3B是沿著圖3A線AA’、BB’以及CC’的剖面示意圖。 圖4是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖5A是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖5B是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖5C是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖6是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖7A是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖7B是沿著圖7A線AA’、BB’以及CC’的剖面示意圖。 圖8是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖9A是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖9B是沿著圖9A線AA’、BB’以及CC’的剖面示意圖。 圖10是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖11是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。 圖12是依照本發明的一實施例的一種觸控陣列基板的上視示意圖。FIG. 1A is a schematic top view of a touch array substrate according to an embodiment of the present invention. FIG. 1B is a schematic cross-sectional view taken along line AA ', BB', and CC 'of FIG. 1A. FIG. 2 is a schematic top view of a touch array substrate according to an embodiment of the present invention. 3A is a schematic top view of a touch array substrate according to an embodiment of the present invention. FIG. 3B is a schematic cross-sectional view taken along line AA ', BB', and CC 'of FIG. 3A. FIG. 4 is a schematic top view of a touch array substrate according to an embodiment of the present invention. 5A is a schematic top view of a touch array substrate according to an embodiment of the present invention. 5B is a schematic top view of a touch array substrate according to an embodiment of the present invention. 5C is a schematic top view of a touch array substrate according to an embodiment of the present invention. FIG. 6 is a schematic top view of a touch array substrate according to an embodiment of the present invention. FIG. 7A is a schematic top view of a touch array substrate according to an embodiment of the present invention. FIG. 7B is a schematic cross-sectional view taken along lines AA ', BB', and CC 'of FIG. 7A. FIG. 8 is a schematic top view of a touch array substrate according to an embodiment of the present invention. FIG. 9A is a schematic top view of a touch array substrate according to an embodiment of the invention. FIG. 9B is a schematic cross-sectional view taken along lines AA ', BB', and CC 'of FIG. 9A. FIG. 10 is a schematic top view of a touch array substrate according to an embodiment of the present invention. FIG. 11 is a schematic top view of a touch array substrate according to an embodiment of the present invention. FIG. 12 is a schematic top view of a touch array substrate according to an embodiment of the present invention.

Claims (16)

一種觸控陣列基板,包括: 一基板; 多個開關元件,位於該基板上; 多個畫素電極,分別電性連接至對應的該開關元件; 一第一觸控電極與一第二觸控電極,於垂直該基板的方向上分別重疊於部分該些畫素電極,該第一觸控電極鄰近於該第二觸控電極的一邊緣具有一第一凸出部; 一第一觸控電極導線與一第二觸控電極導線,於垂直該基板的方向上分別重疊於該第一觸控電極與該第二觸控電極,其中該第一觸控電極導線與該第二觸控電極導線中的至少一個與對應的該第一觸控電極或該第二觸控電極電性連接;以及 一修補結構,該修補結構於該基板上的垂直投影位於該第一觸控電極與該第二觸控電極於該基板上的垂直投影之間,且該修補結構與該第一觸控電極及該第二觸控電極分別部分重疊。A touch array substrate includes: a substrate; a plurality of switching elements located on the substrate; a plurality of pixel electrodes respectively electrically connected to corresponding switching elements; a first touch electrode and a second touch The electrodes are respectively overlapped with some of the pixel electrodes in a direction perpendicular to the substrate, and the first touch electrode has a first protruding portion adjacent to an edge of the second touch electrode; a first touch electrode A wire and a second touch electrode wire overlap the first touch electrode and the second touch electrode respectively in a direction perpendicular to the substrate, wherein the first touch electrode wire and the second touch electrode wire At least one of them is electrically connected to the corresponding first touch electrode or the second touch electrode; and a repair structure, the vertical projection of the repair structure on the substrate is located between the first touch electrode and the second The touch electrode is vertically projected on the substrate, and the repair structure partially overlaps the first touch electrode and the second touch electrode, respectively. 如申請專利範圍第1項所述的觸控陣列基板,其中該第二觸控電極電性連接該修補結構與該第二觸控電極導線。The touch array substrate according to item 1 of the application, wherein the second touch electrode is electrically connected to the repair structure and the second touch electrode wire. 如申請專利範圍第1項所述的觸控陣列基板,更包括: 多條掃描線與多條資料線,分別與該些開關元件電性連接,其中該些資料線、該第一觸控電極導線、該第二觸控電極導線以及該修補結構屬於同一膜層。The touch array substrate according to item 1 of the patent application scope further includes: a plurality of scanning lines and a plurality of data lines, which are electrically connected to the switching elements, respectively, wherein the data lines and the first touch electrode The wires, the second touch electrode wires, and the repair structure belong to the same film layer. 如申請專利範圍第3項所述的觸控陣列基板,其中該第一觸控電極與該第一觸控電極導線電性連接,且該第一觸控電極與該修補結構電性分離。The touch array substrate according to item 3 of the scope of patent application, wherein the first touch electrode is electrically connected to the first touch electrode wire, and the first touch electrode is electrically separated from the repair structure. 如申請專利範圍第2項所述的觸控陣列基板,其中該第一觸控電極的該第一凸出部與該修補結構電性連接。The touch array substrate according to item 2 of the scope of patent application, wherein the first protruding portion of the first touch electrode is electrically connected to the repair structure. 如申請專利範圍第2項所述的觸控陣列基板,更包括: 多條掃描線與多條資料線,分別與該些開關元件電性連接,其中該些掃描線、該些資料線以及該修補結構屬於不同膜層。The touch array substrate according to item 2 of the scope of patent application, further comprising: a plurality of scan lines and a plurality of data lines, which are electrically connected to the switching elements, respectively, wherein the scan lines, the data lines, and the The repair structure belongs to different film layers. 如申請專利範圍第6項所述的觸控陣列基板,其中該第一觸控電極與該第一觸控電極導線電性連接,且該第一觸控電極與該修補結構電性分離。The touch array substrate according to item 6 of the application, wherein the first touch electrode is electrically connected to the first touch electrode wire, and the first touch electrode is electrically separated from the repair structure. 如申請專利範圍第6項所述的觸控陣列基板,其中該第一觸控電極的該第一凸出部與該修補結構電性連接,且該修補結構電性連接該第二觸控電極。The touch array substrate according to item 6 of the scope of patent application, wherein the first protruding portion of the first touch electrode is electrically connected to the repair structure, and the repair structure is electrically connected to the second touch electrode. . 如申請專利範圍第1項所述的觸控陣列基板,其中該第二觸控電極鄰近該第一觸控電極的一邊緣包括一第二凸出部,該修補結構於垂直該基板的方向上重疊於該第一凸出部以及該第二凸出部。The touch array substrate according to item 1 of the application, wherein an edge of the second touch electrode adjacent to the first touch electrode includes a second protrusion, and the repair structure is in a direction perpendicular to the substrate. Overlapping on the first protrusion and the second protrusion. 如申請專利範圍第9項所述的觸控陣列基板,其中該修補結構與該些畫素電極屬於同一膜層。The touch array substrate according to item 9 of the scope of patent application, wherein the repair structure and the pixel electrodes belong to the same film layer. 如申請專利範圍第10項所述的觸控陣列基板,其中該第一觸控電極與該第一觸控電極導線電性連接,該第二觸控電極與該第二觸控電極導線電性連接,且該修補結構為浮置電極。The touch array substrate according to item 10 of the application, wherein the first touch electrode is electrically connected to the first touch electrode wire, and the second touch electrode and the second touch electrode wire are electrically connected. Connected, and the repair structure is a floating electrode. 如申請專利範圍第10項所述的觸控陣列基板,其中該第一凸出部以及該第二凸出部皆與該修補結構電性連接。According to the touch array substrate of claim 10, wherein the first protruding portion and the second protruding portion are electrically connected to the repair structure. 如申請專利範圍第9項所述的觸控陣列基板,更包括: 多條掃描線與多條資料線,分別與該些開關元件電性連接,其中該些資料線、該第一觸控電極導線、該第二觸控電極導線以及該修補結構屬於同一膜層。The touch array substrate according to item 9 of the scope of patent application, further comprising: a plurality of scanning lines and a plurality of data lines, which are electrically connected to the switching elements, respectively, wherein the data lines and the first touch electrode The wires, the second touch electrode wires, and the repair structure belong to the same film layer. 如申請專利範圍第13項所述的觸控陣列基板,其中該第一觸控電極與該第一觸控電極導線電性連接,該第二觸控電極與該第二觸控電極導線電性連接,且該修補結構為浮置電極。The touch array substrate according to item 13 of the application, wherein the first touch electrode is electrically connected to the first touch electrode wire, and the second touch electrode is electrically connected to the second touch electrode wire. Connected, and the repair structure is a floating electrode. 如申請專利範圍第13項所述的觸控陣列基板,其中該第一凸出部以及該第二凸出部皆與該修補結構電性連接。The touch array substrate according to item 13 of the scope of the patent application, wherein the first protruding portion and the second protruding portion are electrically connected to the repair structure. 如申請專利範圍第1項所述的觸控陣列基板,更包括: 多條掃描線與多條資料線,分別與該些開關元件電性連接,其中: 在該些資料線的延伸方向上,該第一觸控電極位於與其相鄰的兩個第二觸控電極之間,兩個修補結構於該基板上的垂直投影分別位於該第一觸控電極於該基板上的垂直投影與該兩個第二觸控電極於該基板上的垂直投影之間;且 在該些掃描線的延伸方向上,該第一觸控電極位於與其相鄰的另外兩個第二觸控電極之間,另外兩個修補結構於該基板上的垂直投影分別位於該第一觸控電極於該基板上的垂直投影與該另外兩個第二觸控電極於該基板上的垂直投影之間。The touch array substrate according to item 1 of the patent application scope further includes: a plurality of scanning lines and a plurality of data lines, which are electrically connected to the switching elements, respectively, wherein: in the extending direction of the data lines, The first touch electrode is located between two adjacent second touch electrodes, and the vertical projections of the two repair structures on the substrate are respectively located on the vertical projection of the first touch electrode on the substrate and the two Two second touch electrodes are vertically projected on the substrate; and in the extending direction of the scanning lines, the first touch electrodes are located between two adjacent second touch electrodes, and The vertical projections of the two repair structures on the substrate are respectively located between the vertical projection of the first touch electrode on the substrate and the vertical projections of the other two second touch electrodes on the substrate.
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