TW201910940A - Method and device for illuminating digital full image by structured light - Google Patents

Method and device for illuminating digital full image by structured light Download PDF

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TW201910940A
TW201910940A TW106126787A TW106126787A TW201910940A TW 201910940 A TW201910940 A TW 201910940A TW 106126787 A TW106126787 A TW 106126787A TW 106126787 A TW106126787 A TW 106126787A TW 201910940 A TW201910940 A TW 201910940A
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structured light
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digital hologram
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TWI655522B (en
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鄭超仁
賴信吉
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國立臺灣師範大學
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    • G03H1/00Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
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    • G03H2001/005Adaptation of holography to specific applications in microscopy, e.g. digital holographic microscope [DHM]
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    • G03H1/00Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04Processes or apparatus for producing holograms
    • G03H1/0443Digital holography, i.e. recording holograms with digital recording means
    • G03H2001/0454Arrangement for recovering hologram complex amplitude
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Abstract

A method of structured illumination digital holography includes: (a) providing a structured illumination generating unit and binarization random number encoding unit to generate a coded structured illumination pattern; (b) sampling at least two patterns with phase shift which synthesized as a single structured illumination pattern to be encoded; (c) forming a single digital hologram, and wavefront reconstructing the single digital hologram; (d) performing a compressive sensing approach to recover the object wave with at least two phase shift patterns; and (e) reconstructing the separation of overlap spectrum, to obtain an image covering bandpass spectrum with different high frequency and low frequency.

Description

結構光照明數位全像之方法與裝置    Method and device for structured light illumination digital hologram   

本發明係關於數位全像顯微技術,特別係一種結合結構光物體光波與參考光波以干涉與波前記錄,而重建待測物體之顯微與斷層影像資訊之結構光照明數位全像之方法與裝置。 The invention relates to digital holographic microscopy technology, in particular to a method of combining structured light object light waves and reference light waves for interference and wavefront recording to reconstruct the microscopic and tomographic information of the object to be measured. With device.

數位全像顯微術係近幾年被廣泛研究用於定量相位成像的技術之一。其可實現數值對焦的物體重建方式,並且具備次波長等級的定量化相位分析能力。然而,卻也受到光學繞射極限的影響以致於光源波長和有限孔徑大小將限制其空間解析度而無法突破兩點之間具二分之一波長的分辨率極限。因此,合成孔徑的數位全像顯微術被提出用於提升光學系統的空間解析度,其方法包括:放置繞射光柵以轉折物體的高頻資訊、機械式移動影像感測器以擷取廣視野的繞射資訊、以及使用角度多工等方式來擷取物體的各個角度高頻資訊以達到空間解析度提升。 The Department of Digital Holography Microscopy has been widely studied as one of the techniques for quantitative phase imaging in recent years. It can realize the object reconstruction method of numerical focusing, and has the quantitative phase analysis capability of sub-wavelength level. However, it is also affected by the optical diffraction limit, so that the wavelength of the light source and the limited aperture size will limit its spatial resolution and cannot break the resolution limit of half wavelength between two points. Therefore, synthetic holographic digital holography microscopy has been proposed to improve the spatial resolution of optical systems. Methods include: placing diffraction gratings to turn high-frequency information of objects, and mechanically moving image sensors to capture wide The diffraction information of the field of view, and the use of angle multiplexing to capture high-frequency information from various angles of the object to achieve spatial resolution improvement.

目前,在合成孔徑的技術範疇上所能實現的橫向解析度可達90奈米(nm),其係配合複數振幅反摺積的方法來完成次微米的物體波前重建。在上述方法中,使用機械式振鏡來旋轉光束的入射角度以對物體進行掃瞄係合成孔徑的主要方法之一。然而,這樣的機械式掃瞄將引發額外擾動與無法精準地調整入射角度等問題,這將限制合成孔徑的位移頻譜精確度及影響相位靈敏度。 At present, the horizontal resolution that can be achieved in the technical field of synthetic aperture can reach 90 nanometers (nm), which is combined with the complex amplitude deconvolution method to complete the wavefront reconstruction of sub-micron objects. In the above method, the use of a mechanical galvanometer to rotate the angle of incidence of the light beam to scan the object is one of the main methods of synthetic aperture. However, such mechanical scanning will cause additional disturbances and the inability to accurately adjust the angle of incidence. This will limit the accuracy of the displacement spectrum of the synthetic aperture and affect the phase sensitivity.

因此,結構光照明的數位全像顯微術被提出於實現無機械式掃瞄的合成孔徑方法,其可使用繞射光柵將入射光分成零階(0th)與正負一階(±1st)的繞射項,並放置針孔濾波片來移除負一階(-1st)繞射項,接著對零階(0th)繞射項濾波 而成為低頻平面參考光波輸出後,再與正一階(+1st)繞射項帶有物體的繞射光波干涉而形成全像片。此外,也有使用液晶空間光調制器來取代繞射光柵的結構光方式,其係透過拍攝一系列的全像圖紋並使用相位回復演算法以重建物體的波前資訊。 Therefore, digital holography microscopy of structured light illumination is proposed to realize a synthetic aperture method without mechanical scanning, which can use a diffraction grating to divide the incident light into zero order (0 th ) and positive and negative first order (± 1 st ), And place a pinhole filter to remove the negative first-order (-1 st ) diffraction term, and then filter the zero-order (0 th ) diffraction term to become the low-frequency plane reference light wave output, and then The positive first-order (+1 st ) diffraction term interferes with the diffracted light waves of the object to form a hologram. In addition, there is a structured light method that uses a liquid crystal spatial light modulator to replace the diffraction grating. It uses a series of holographic patterns and uses a phase recovery algorithm to reconstruct the wavefront information of the object.

然而,上述的結構光數位全像顯微系統皆需要複雜的光學架構來避免各別頻帶的串音干擾,且受限於偵測已知結構光的投影條紋來進行位移頻譜修正,而無法針對物體的散射頻譜進行合成頻譜拓展,這將使得量測系統敏感於環境擾動以致相位靈敏度降低,且記錄程序複雜而無法實現空間解析度增強等問題。 However, the above-mentioned structured light digital holographic microscope systems all require complex optical architectures to avoid crosstalk interference in different frequency bands, and are limited to detect projection stripes of known structured light to perform displacement spectrum correction, which cannot be targeted. The scattering spectrum of the object is expanded by the synthetic spectrum, which will make the measurement system sensitive to environmental disturbances and reduce the phase sensitivity, and the recording process is complicated and the spatial resolution cannot be enhanced.

此外,受限於物體光波之帶通頻譜的頻譜重疊現象,需要透過拍攝至少二張的相位移圖紋以分離其頻譜重疊,而解決頻譜重疊問題並重建出不同的高頻與低頻的帶通頻譜。然而,這樣的時間多工方式將使得相位靈敏度易受到外界環境干擾而影響了重建影像之訊雜比。 In addition, due to the spectral overlap phenomenon of the bandpass spectrum of the object light wave, at least two phase shift patterns need to be taken to separate the spectral overlap, and the spectral overlap problem is solved and different high-frequency and low-frequency bandpasses are reconstructed Spectrum. However, such time multiplexing will make the phase sensitivity vulnerable to interference from the external environment and affect the signal-to-noise ratio of the reconstructed image.

鑒於上述習知技術之缺點,實在有必要發展一種新穎的結構光照明數位全像技術來解決與克服該些問題。 In view of the shortcomings of the above-mentioned conventional technologies, it is really necessary to develop a novel structured lighting digital holography technology to solve and overcome these problems.

本發明所提出結構光照明之數位全像方法與裝置,毋需使用複雜的光學架構來避免頻帶串音干擾,即可實現超解析的物體波前重建,具即時線上操作潛力。 The digital holography method and device of structured light illumination provided by the present invention can realize super-resolution object wavefront reconstruction without using complex optical architecture to avoid frequency band crosstalk interference, and have real-time online operation potential.

本發明係使用結構光照射待測物體以致產生Moiré條紋來作成數位全像記錄方式。並運用已知空間頻率結構光,以及待測物體所散射Moiré條紋之間的摺積(convolution)與相關(correlation)特性來完成影像重建與解析度提升。 The present invention uses structured light to illuminate the object to be measured so as to generate Moiré stripes to create a digital holographic recording method. It also uses the structured light of known spatial frequency and the convolution and correlation characteristics of the Moiré fringes scattered by the object under test to complete the image reconstruction and resolution improvement.

本發明提供一種結構光照明數位全像之方法,包括:(a)提供一 結構光產生單元與二值化亂數編碼單元,以產生編碼的結構光圖紋;(b)藉由該結構光圖紋之至少二張的二值化亂數編碼圖案,以取樣至少二張具相位移圖紋,並合成為單一張帶有編碼的結構光圖紋;(c)將該結構光圖紋照明於一物體,以形成單一張帶有編碼的結構物體光波而與參考光波干涉以產生單一張數位全像片,接著再進行該單一張數位全像之波前重建;(d)二值化亂數解碼該單一張數位全像片之圖案,以取出對應的原具相位移圖紋的物體光波,並藉由一影像處理方法以復原至少二張具相位移圖紋的物體光波;以及(e)將該至少二張具相位移圖紋的物體光波進行重疊頻譜分離之重建方法,以獲得具有不同的高頻與低頻帶通頻譜涵蓋範圍之影像。 The invention provides a method for illuminating a digital hologram of structured light, including: (a) providing a structured light generating unit and a binary random number coding unit to generate coded structured light patterns; (b) by the structured light At least two binarized random coding patterns of the pattern, to sample at least two patterns with phase shift, and synthesize into a single structured light pattern with coding; (c) Illuminate the structured light pattern For an object, to form a single structural object light wave with coding and interfere with the reference light wave to produce a single digital hologram, and then perform wavefront reconstruction of the single digital hologram; (d) Binary chaos Digitally decode the pattern of the single digital hologram to extract the corresponding object light waves with phase shift patterns, and restore at least two object light waves with phase shift patterns by an image processing method; and (e ) A reconstruction method of performing overlapping spectral separation on the at least two object light waves with phase shift patterns to obtain images with different high-frequency and low-band pass spectrum coverage areas.

其中結構光產生單元與二值化亂數編碼單元包括空間光調制器、數位微鏡裝置、繞射光柵。其中單一張帶有編碼的結構光圖紋包括成像或非成像的繞射光波。 The structured light generating unit and the binary random number coding unit include a spatial light modulator, a digital micromirror device, and a diffraction grating. The single structured light pattern with coding includes imaging or non-imaging diffraction light waves.

其中步驟(c)之中,該單一張數位全像片之形式包括同軸式、離軸式、共軸式和共光程。波前重建方法包括時間濾波法、空間濾波法以及相位檢復法。其中該步驟(d)之中,影像處理方法包括壓縮感測法、反摺積法或內插法。其中步驟(e)之中,該不同的高頻與低頻帶通頻譜包括二維與三維的傅立葉頻譜資訊。 In step (c), the form of the single digital hologram includes coaxial, off-axis, coaxial and common optical path. The wavefront reconstruction methods include temporal filtering method, spatial filtering method, and phase checking method. In this step (d), the image processing method includes a compression sensing method, a deconvolution method or an interpolation method. In step (e), the different high-frequency and low-band pass spectrums include two-dimensional and three-dimensional Fourier spectrum information.

本發明提供一種結構光照明數位全像之裝置,包括:一發射光源;一光擴束器,用以發射光源所發出光形成一擴束光;至少一分光鏡,用以使該發出光分成至少兩個光源、或結合至少兩個光源;一結構光產生單元,用以使該發出光形成一具任意空間頻率以及各個方向的結構光圖紋;一二值化亂數編碼單元,用以使該發出光形成一具任意空間頻率以及各個方向的二值化亂數編碼圖案;一照明物鏡組,用以放大或縮小該結構光,以利於照射至待測物體以形成物體光;一接收物鏡組,用以放大或縮小該結構光,以利於該物體光形成為成像或非成像的繞射光波;一參考光,用以與物體光干涉以形成結構光數位全像片;以及一光偵測器陣列,用以記錄該物體光與該參考光干涉後所形成之該結構光數位全像片。 The invention provides a device for illuminating a digital hologram with structured light, including: an emitting light source; an optical beam expander for emitting light emitted by the light source to form an expanded beam; at least one beam splitter for dividing the emitted light At least two light sources, or a combination of at least two light sources; a structured light generating unit for forming the structured light pattern with arbitrary spatial frequency and various directions; a binary random number coding unit for The emitted light is formed into a binary random number coding pattern with arbitrary spatial frequency and various directions; an illumination objective lens group is used to enlarge or reduce the structured light to facilitate irradiation to the object to be measured to form the object light; a receiving Objective lens group to enlarge or reduce the structured light to facilitate the formation of the object light as an imaging or non-imaging diffracted light wave; a reference light to interfere with the object light to form a structured light digital hologram; and a light The detector array is used to record the structured light digital hologram formed after the object light interferes with the reference light.

其中該數位全像片之形式包括同軸式、離軸式、共軸式或共光程式。 The form of the digital hologram includes coaxial, off-axis, coaxial, or common light programs.

上述結構光照明數位全像之裝置更包括複數個面鏡,用以改變發射光源之光路徑;與一光學中繼物鏡組,用以調制該物體光波的高頻或低頻,以利於各種光學多工程序;二值化亂數編碼圖案可以為振幅或相位的形式,而結構光可以為振幅或相位的形式。 The above structured light illuminating digital holographic device further includes a plurality of mirrors to change the light path of the emitting light source; and an optical relay objective lens group to modulate the high or low frequency of the light wave of the object to facilitate various optical Engineering procedures; the binary random number coding pattern can be in the form of amplitude or phase, while the structured light can be in the form of amplitude or phase.

一種結構光照明數位全像之裝置,包括:一發射光源;一光擴束器,用以該發射光源所發出光形成一擴束光;至少一分光鏡,用以使該發出光分成至少兩個光源、或結合至少兩個光源;複數個面鏡,用以改變該發射光源之光路徑;一結構光產生單元,用以使該發出光形成一具任意空間頻率以及各個方向的結構光圖紋;二值化亂數編碼單元,用以使該發出光形成一具任意空間頻率以及各個方向的二值化亂數編碼圖案;一照明物鏡組,用以放大或縮小該結構光,以利於照射至待測物體以形成物體光;一接收物鏡組,用以放大或縮小該結構光,以利於該物體光形成為成像或非成像的繞射光波;以及一光偵測器陣列,用以記錄該物體光與該參考光干涉後所形成之該結構光數位全像片。 A device for illuminating digital hologram with structured light, including: an emitting light source; an optical beam expander for forming an expanded beam of light emitted by the emitting light source; at least one beam splitter for dividing the emitted light into at least two Light sources, or a combination of at least two light sources; a plurality of mirrors to change the light path of the emitting light source; a structured light generating unit to form a structured light pattern with arbitrary spatial frequency and various directions for the emitted light Grain; Binary random number coding unit, used to make the emitted light form a binary random number coding pattern with arbitrary spatial frequency and various directions; an illumination objective lens group, used to enlarge or reduce the structured light, in order to facilitate Illuminate the object to be measured to form object light; a receiving objective lens group to enlarge or reduce the structured light to facilitate the formation of the object light as an imaging or non-imaging diffracted light wave; and a light detector array to Record the structured light digital hologram after the object light interferes with the reference light.

在一觀點之中,上述結構光照明數位全像之裝置更包括一光柵,用以產生不同繞射階之該物體光波資訊;以及一光學中繼系統,用以調制該物體光波,以利於該不同繞射階之光學多工。 In one point of view, the device for illuminating digital holograms further includes a grating to generate light wave information of the object at different diffraction orders; and an optical relay system to modulate the light wave of the object to facilitate the Optical multiplexing with different diffraction orders.

在另一觀點之中,上述結構光照明數位全像之裝置更包括一第二光學中繼系統、一濾波器遮罩以及一光柵,其中該光柵配置於該接收物鏡組與該第二光學中繼系統之間,而該濾波器遮罩配置於該第二光學中繼系統之兩組透鏡之間。 In another aspect, the above structured light illuminating digital hologram device further includes a second optical relay system, a filter cover and a grating, wherein the grating is disposed in the receiving objective lens group and the second optics Between the two systems, and the filter mask is disposed between the two sets of lenses in the second optical relay system.

在又一觀點之中,上述結構光照明數位全像之裝置更包括一第二光學中繼系統以及一光柵,其中該光柵配置於該第二光學中繼系統之一側邊, 而該濾波器遮罩嵌入於該光柵之中。 In yet another aspect, the above structured light illuminating digital holographic device further includes a second optical relay system and a grating, wherein the grating is disposed on a side of the second optical relay system, and the filter The mask is embedded in the grating.

此些優點及其他優點從以下較佳實施例之敘述及申請專利範圍將使讀者得以清楚了解本發明。 These advantages and other advantages will enable the reader to clearly understand the present invention from the description of the following preferred embodiments and the scope of patent application.

100‧‧‧發射光源 100‧‧‧Emitting light source

101‧‧‧空間濾波器(spatial filter,SF) 101‧‧‧spatial filter (SF)

102、103、104、118、140‧‧‧分光鏡(beam splitter) 102, 103, 104, 118, 140 ‧‧‧ beam splitter

105、121‧‧‧空間光調制器(spatial light modulator,SLM) 105、121‧‧‧Spatial light modulator (SLM)

TL1‧‧‧照明物鏡組 TL1‧‧‧Illumination objective lens group

TL2‧‧‧接收物鏡組 TL2‧‧‧Receive objective lens group

TL3‧‧‧光學中繼系統 TL3‧‧‧Optical Relay System

106‧‧‧光偵測器陣列 106‧‧‧Light detector array

107、108、116、125‧‧‧線性偏振片(polarizer) 107, 108, 116, 125‧‧‧‧Linear polarizer

109、110、124‧‧‧反射面鏡(mirror) 109, 110, 124 ‧‧‧mirror

111‧‧‧光擴束器 111‧‧‧ Optical Beam Expander

112、115、117、123、126、135、136、160‧‧‧透鏡 112, 115, 117, 123, 126, 135, 136, 160 ‧‧‧ lens

113、114‧‧‧顯微物鏡(microscope objective lens) 113, 114‧‧‧microscope objective lens (microscope objective lens)

119、122‧‧‧光學遮罩 119, 122‧‧‧ optical mask

120‧‧‧入射光 120‧‧‧incident light

130、306‧‧‧參考光 130, 306‧‧‧ Reference light

131‧‧‧光柵 131‧‧‧ grating

132‧‧‧濾波器遮罩(filter mask) 132‧‧‧filter mask

133‧‧‧第一過濾區 133‧‧‧First filter area

134‧‧‧第二過濾區 134‧‧‧Second filter area

150、304‧‧‧待測物體 150、304‧‧‧Object to be measured

200、201、202、203、204‧‧‧步驟 200, 201, 202, 203, 204 ‧‧‧ steps

300‧‧‧照射光源 300‧‧‧Irradiation light source

301‧‧‧光學系統 301‧‧‧Optical system

302‧‧‧至少二張已知空間頻率結構的圖案 302‧‧‧At least two patterns with known spatial frequency structure

303‧‧‧至少二張已知二值化亂數編碼圖案 303‧‧‧ At least two known binary random number coding patterns

305‧‧‧菲涅耳繞射 305‧‧‧ Fresnel diffraction

307‧‧‧單張結構光數位全像片 307‧‧‧Single structured light digital hologram

308‧‧‧波前重建演算法 308‧‧‧Wavefront reconstruction algorithm

309‧‧‧取出至少二張已知二值化亂數編碼圖案 309‧‧‧ Take out at least two known binary random number coding patterns

310‧‧‧壓縮感測 310‧‧‧Compression sensing

311‧‧‧回復至少二張具相位移圖紋的物體光波 311‧‧‧Reply at least two objects with phase shift pattern light waves

312‧‧‧重疊頻譜分離重建方法 312‧‧‧ Overlapped spectrum separation and reconstruction method

313‧‧‧傅立葉轉換 313‧‧‧ Fourier transform

314‧‧‧頻譜疊合 314‧‧‧ spectrum overlap

315‧‧‧反傅立葉轉換 315‧‧‧Inverse Fourier Transform

316‧‧‧具有高空間解析度的波前重建影像 316‧‧‧ Wavefront reconstruction image with high spatial resolution

317‧‧‧振幅影像 317‧‧‧ amplitude image

318‧‧‧相位影像 318‧‧‧phase image

如下所述之對本發明的詳細描述與實施例之示意圖,應使本發明更被充分地理解;然而,應可理解此僅限於作為理解本發明應用之參考,而非限制本發明於一特定實施例之中。 The detailed description of the present invention and the schematic diagrams of the embodiments as described below should make the present invention more fully understood; however, it should be understood that this is only a reference for understanding the application of the present invention and does not limit the present invention to a specific implementation Cases.

第一圖顯示根據本發明之一實施例之一結構光數位全像之裝置之一示意圖;第二圖顯示根據本發明之另一實施例之一結構光數位全像之裝置之一示意圖;第三圖顯示根據本發明之又一實施例之一結構光數位全像之裝置之一示意圖;第三圖A顯示根據本發明之又一實施例之一結構光數位全像之裝置之一示意圖;第三圖B顯示根據本發明之再一實施例之一結構光數位全像之裝置之一示意圖;第四圖顯示根據本發明之一結構光照明數位全像之方法流程圖;第五圖顯示根據本發明之一實施例之結構光照明數位全像之詳細方法流程圖; 第六圖顯示根據本發明之二張二值化亂數編碼圖案之示意圖;第七圖顯示根據本發明之二張具相位移圖紋之示意圖;第八圖顯示根據本發明之二張相位移圖紋經二值化亂數編碼圖案取樣之後的結構光圖紋之示意圖;第九圖A顯示根據本發明之待測物體的影像資訊之示意圖;第九圖B顯示根據本發明之單一張帶有編碼結構的物體光波之示意圖;第十圖A至第十圖B顯示相位移編碼分別為0°以及120°之經二值化亂數解碼圖案所取出對應的原具相位移圖紋的物體光波之示意圖;第十一圖A至第十一圖B顯示相位移編碼分別為0°以及120°之經過壓縮感測演算法以復原的二張具相位移圖紋的物體光波之示意圖;第十二圖A至第十二圖B分別顯示頻譜相對應的繞射階為正一階(+1st)、負一階(-1st)之帶通頻譜之示意圖;第十三圖A至第十三圖B分別顯示頻譜相對應的繞射階為正一階(+1st)、負一階(-1st)之重建振幅影像;第十四圖A顯示透過二維傅立葉轉換合成方式以合成二維高空間解析度的波前成像之二維合成頻譜涵蓋範圍;第十四圖B顯示透過二維傅立葉轉換合成方式以合成二維高空間解析度的波前成像之合成振幅重建影像; 第十四圖C顯示透過二維傅立葉轉換合成方式以合成二維高空間解析度的波前成像之合成相位重建影像;第十五圖顯示模擬三維物件經過三維傅立葉頻譜合成方式;第十六圖A顯示三維合成頻譜在x-y空間上的涵蓋範圍;第十六圖B顯示三維合成頻譜在y-z空間上的涵蓋範圍;第十六圖C顯示三維合成頻譜在x-y空間的折射率之斷層重建影像;第十六圖D顯示三維合成頻譜在y-z空間的折射率之斷層重建影像。 The first figure shows a schematic diagram of a structured light digital hologram device according to an embodiment of the present invention; the second figure shows a schematic view of a structured light digital hologram device according to another embodiment of the present invention; FIG. 3 shows a schematic diagram of a structured light digital holography device according to yet another embodiment of the invention; FIG. 3 shows a schematic view of a structured light digital hologram device according to still another embodiment of the invention; The third diagram B shows a schematic diagram of a structured light digital hologram device according to yet another embodiment of the invention; the fourth diagram shows a flow chart of a structured light digital hologram method according to the invention; the fifth diagram shows A detailed flowchart of a digital hologram of structured light illumination according to an embodiment of the present invention; Figure 6 shows a schematic diagram of two binary random number coding patterns according to the present invention; Figure 7 shows two images according to the present invention A schematic diagram with a phase shift pattern; the eighth figure shows a schematic diagram of the structured light pattern after the two phase shift patterns according to the present invention are sampled by the binarized random code pattern; the ninth figure A shows The schematic diagram of the image information of the object to be measured according to the present invention; the ninth figure B shows a schematic diagram of a single object light wave with a coding structure according to the present invention; the tenth figures A to B show the phase shift codes are 0 ° And a schematic diagram of the light wave of the object with the phase shift pattern corresponding to the 120 ° binary random decoding pattern; Figures 11 to 11 show that the phase shift codes are 0 ° and 120 ° respectively A schematic diagram of two light waves of an object with a phase shift pattern restored by a compression sensing algorithm; Figures 12 to 12 show that the diffraction order corresponding to the spectrum is a positive first order (+1 st ), negative first-order (-1 st ) schematic diagram of the band-pass spectrum; Figures 13 to 13 show that the corresponding diffraction order of the spectrum is positive first order (+1 st ), negative one -Level (-1 st ) reconstructed amplitude image; Figure 14 shows the range of the 2D synthetic spectrum covered by the two-dimensional Fourier transform synthesis method to synthesize 2D high spatial resolution wavefront imaging; Figure 14 shows B The two-dimensional Fourier transform synthesis method is used to synthesize the two-dimensional high spatial resolution wavefront component Synthesized amplitude reconstructed image; Figure 14 shows the two-dimensional Fourier transform synthesis method to synthesize two-dimensional high-spatial-resolution wavefront imaging synthetic phase reconstructed image; Figure 15 shows the simulated three-dimensional object through three-dimensional Fourier spectrum synthesis Method; Figure 16 shows the coverage of the three-dimensional synthesis spectrum in xy space; Figure 16 shows the coverage of the three-dimensional synthesis spectrum in yz space; Figure 16 shows the refraction of the three-dimensional synthesis spectrum in xy space Tomographic reconstruction of the rate; Figure 16 D shows the tomographic reconstruction of the refractive index of the three-dimensional synthetic spectrum in the yz space.

此處本發明將針對發明具體實施例及其觀點加以詳細描述,此類描述為解釋本發明之結構或步驟流程,其係供以說明之用而非用以限制本發明之申請專利範圍。因此,除說明書中之具體實施例與較佳實施例外,本發明亦可廣泛施行於其他不同的實施例中。 Herein, the present invention will be described in detail with respect to specific embodiments of the invention and their viewpoints. Such descriptions are used to explain the structure or steps of the present invention, which are provided for illustrative purposes rather than to limit the scope of the patent application of the present invention. Therefore, in addition to the specific embodiments and preferred embodiments in the specification, the present invention can be widely implemented in other different embodiments.

本發明使用結構光照射待測物體以產生Moiré條紋來作成數位全像記錄方式,並運用已知空間頻率結構光,以及待測物體所散射Moiré條紋之間的摺積(convolution)與相關(correlation)特性來完成影像重建與解析度提升。 The invention uses structured light to irradiate the object to be tested to generate Moiré fringes to create a digital holographic recording method, and uses structured light of known spatial frequency and the convolution and correlation between the Moiré fringes scattered by the object to be tested ) Features to complete image reconstruction and resolution enhancement.

本發明所提裝置包含:至少一組結構光用於照射待測物體以產生Moiré條紋;至少一組參考光;至少一個數位全像波前存取單元。 The device provided by the present invention includes: at least one set of structured light for illuminating the object to be measured to generate Moiré stripes; at least one set of reference light; at least one digital holographic wavefront access unit.

本發明所提方法係利用各別頻帶所得的較低空間頻率Moiré條紋數位全像的重建影像與已知較高空間頻率結構光來進行反摺積(de-convolution)與互相關(mutual correlation)運算以完成位移頻譜修正和頻譜疊合作用,以實現 頻譜拓展的超解析度重建影像。實施例中運用已知空間頻率結構光的相位移與旋轉角度來進行多次曝光,並配合奇異值分解(singular value decomposition,SVD)與擬反矩陣(pseudo-inverse matrix)運算來分離結構光照明所產生的各別頻帶串音干擾。接著,再運用相關特性將該待測物體與較低空間頻率Moiré條紋數位全像之重建影像進行互相關運算以實現均向性的合成頻譜拓展。 The method proposed in the present invention utilizes the reconstructed image of the lower spatial frequency Moiré fringe digital hologram obtained from each frequency band and the known higher spatial frequency structured light to perform de-convolution and mutual correlation. The operation is to complete the displacement spectrum correction and spectrum overlapping, to realize the super-resolution reconstruction image of spectrum expansion. In the embodiment, the phase shift and rotation angle of structured light with known spatial frequency are used for multiple exposures, and combined with singular value decomposition (SVD) and pseudo-inverse matrix (pseudo-inverse matrix) operations to separate structured light illumination The cross-talk interference in each frequency band. Then, the correlation characteristics are used to perform cross-correlation operation between the object to be measured and the reconstructed image of the Moiré fringe digital hologram at a lower spatial frequency to achieve the extension of the isotropic synthesized spectrum.

本發明之實施例中指出一種擷取待測物體所散射較低空間頻率的Moiré條紋物體光與平面/球面參考光干涉而形成的數位全像,並運用相位移與角度旋轉已知空間頻率結構光之多次曝光來實現頻帶串音干擾的分離。 The embodiment of the present invention points out a digital hologram formed by capturing the light of the Moiré fringe object scattered by the object to be measured at a lower spatial frequency and interfering with the plane / spherical reference light, and using the phase shift and angle to rotate the known spatial frequency structure Multiple exposures of light to achieve separation of crosstalk in the frequency band.

本發明為了滿足上述技術問題及需求,其提供一種結構光照明數位全像之方法與裝置。此全像影像經過電腦進行數值重建後可獲得複數影像,其中包含振幅與相位資訊,且不受限制於光偵測器陣列的像素與畫素大小。 In order to meet the above technical problems and needs, the present invention provides a method and device for structured light illumination digital holography. This holographic image can be reconstructed by a computer to obtain a complex image, which includes amplitude and phase information, and is not limited to the pixel and pixel size of the photodetector array.

本發明提出使用空間光調制器來產生單一張帶有編碼的結構光圖紋,並使用壓縮感測(compressive sensing)演算法來復原至少二張具相位移圖紋的物體光波。透過重疊頻譜分離地重建方式,以獲得具有不同的高頻與低頻帶通頻譜涵蓋範圍的影像。這將使得提出的結構光照明數位全像之方法與裝置免除於拍攝多張相位移圖紋的時間多工限制,而可更進一步地實現單次曝光的高空間解析度波前重建方式。 The present invention proposes to use a spatial light modulator to generate a single structured light pattern with coding, and to use a compressive sensing algorithm to recover at least two object light waves with phase shift patterns. Separate reconstruction methods by overlapping the spectrum to obtain images with different high-frequency and low-band pass spectrum coverage. This will make the proposed method and device for illuminating digital holograms of structured light free from the time multiplexing limitation of shooting multiple phase shift patterns, and can further achieve the high spatial resolution wavefront reconstruction method for single exposure.

第一圖顯示根據本發明之一實施例之一結構光數位全像之裝置。在本實施例之中,該結構光圖紋將作用於物體光波以產生不同的高頻與低頻帶通頻譜。該等物體光波之帶通頻譜可用於合成頻譜以達到拓展頻譜涵蓋範圍,以及實現重建影像之空間解析度提升之目的。 The first figure shows a structured light digital holographic device according to an embodiment of the invention. In this embodiment, the structured light pattern will act on the object light wave to generate different high-frequency and low-band pass spectrums. The bandpass spectrum of the light waves of these objects can be used to synthesize the spectrum to expand the coverage of the spectrum and to improve the spatial resolution of the reconstructed image.

本發明提出使用至少二張二值化亂數編碼以取樣該至少二張的相位移圖紋。在一實施例之中,該結構光圖紋係使用相位差為π的二階相位光柵來作為結構光產生單元的輸入圖紋,而該圖紋的表示式如下: The present invention proposes to use at least two binary random number codes to sample the at least two phase shift patterns. In one embodiment, the structured light pattern uses a second-order phase grating with a phase difference of π as the input pattern of the structured light generating unit, and the expression of the pattern is as follows:

其中,光柵週期為Λ=2w,照明物鏡組的脈衝響應函數(point spread function)為h TL (y)。而結構光圖紋的傅立葉轉換可表示為不同繞射階的組合如下: Among them, the grating period is Λ = 2 w , and the impulse response function (point spread function) of the illumination objective lens group is h TL ( y ). The Fourier transform of the structured light pattern can be expressed as a combination of different diffraction orders as follows:

結構光圖紋之各個繞射階數為m,且可在±1st的繞射階時達到最大的繞射效率輸出,照明物鏡組的同調傳遞函數為(v)。本結構光圖紋將光柵週期的空間頻率將設為同調傳遞函數的最大可接收角度,藉以截止各個高階繞射項所產生的雜訊干擾。而二值化亂數編碼圖案係透過光學中繼物鏡組以調制結構的物體光波,分別進行±1st繞射階的空間多工以形成帶有編碼的結構光圖紋物體光波。其中,亂數編碼單元將產生二值化的相位編碼圖紋,並作用於-1st繞射階的物體光波以形成編碼的物體光波,其可表示如下: Each diffraction order of the structured light pattern is m , and the maximum diffraction efficiency output can be achieved at the diffraction order of ± 1 st . The coherent transfer function of the illumination objective lens group is ( v ). In this structured light pattern, the spatial frequency of the grating period is set to the maximum receivable angle of the coherent transfer function, so as to cut off the noise interference generated by each high-order diffraction term. The binary random number coding pattern is to modulate the structured object light wave through the optical relay objective lens group, and perform spatial multiplexing of ± 1 st diffraction order to form the structured light pattern object light wave with coding. The random number encoding unit will generate a binary phase encoding pattern, and act on the -1st diffraction order object light wave to form the encoded object light wave, which can be expressed as follows:

其中,二值化的相位編碼圖紋為exp[iΦ n (x,y)],光柵週期所繞射的角度為sin θ m ,而物體o d (x,y)將置於離焦平面上以作用於進行壓縮感測演算法,其表示式如下: Among them, the binary phase encoding pattern is exp [ i Φ n ( x , y )], the angle diffracted by the grating period is sin θ m , and the object o d ( x , y ) will be placed in the defocus plane The above is used to perform the compression sensing algorithm, and its expression is as follows:

其中的繞射距離為z R ,原始物體為o(ξ,η)。將上述編碼物體光波與+1st的物體光波干涉作用形成編碼的結構光物體光波,接著與離軸參考光波進行干涉而形成數位全像片,經波前重建後所獲得帶有編碼的結構光物體光波如下: The diffraction distance is z R and the original object is o ( ξ , η ). Interference between the above-mentioned coded object light wave and the +1 st object light wave to form a coded structured light object light wave, then interferes with the off-axis reference light wave to form a digital hologram, and the coded structured light is obtained after wavefront reconstruction Object light waves are as follows:

其中,該離軸參考光的入射夾角為sin θ x' 與sin θ y' ,經數值參考光修正後可獲得照明物鏡組和接收物鏡組的同調傳遞函數與編碼物體光波的重建資訊如下式: Among them, the incident angle of the off-axis reference light is sin θ x ' and sin θ y' . After the numerical reference light is corrected, the coherent transfer function of the illumination objective lens group and the receiving objective lens group and the reconstruction information of the encoded object light wave can be obtained as follows:

其中,照明物鏡組的同調傳遞函數為(f SI ,0)、接收物鏡組的同調傳遞函數為(u,v),以及編碼物體光波的頻譜涵蓋範圍分別為(u-f SI ,v)和(u,v-f SI )。然而,上述帶有二值化相位圖案的編碼結構可配合壓縮感測演算法與以回復二張具相位移圖紋的物體光波,並可透過奇異值分解(singular value decomposition,SVD)與擬反矩陣(pseudo-inverse matrix)運算來獲得±1st繞射階的物體光波如下: Among them, the coherent transfer function of the illumination objective lens group is ( f SI , 0), the coherent transfer function of the receiving objective lens group is ( u , v ), and the spectrum coverage of the light waves of the encoded object are respectively ( u - f SI , v ) and ( u , v - f SI ). However, the encoding structure with the binary phase pattern can be combined with the compression sensing algorithm and the light wave to restore two objects with phase shift patterns, and can be through singular value decomposition (SVD) and pseudo-inverse A matrix (pseudo-inverse matrix) operation to obtain ± 1 st diffraction order object light waves is as follows:

其中,(u,v)與(u,v)是經過壓縮感測演算法所回覆的兩張相位移圖紋的物體光波,exp(iΦ1)與exp(iΦ1)則是經二值化相位圖紋編碼所產生的已知相位移,因此,該等帶通頻譜將使用頻譜重疊分離重建方式,以獲得不同的高頻與低頻帶通頻譜,其在頻譜空間的合成疊加將可用於提升頻譜涵蓋範圍,並表示為: among them, ( u , v ) and ( u , v ) are the object light waves of two phase shift patterns returned by the compression sensing algorithm, and exp ( i Φ 1 ) and exp ( i Φ 1 ) are generated by the binary phase pattern encoding Known phase shift, therefore, the bandpass spectrum will use spectral overlap separation and reconstruction method to obtain different high-frequency and low-band pass spectrum, and its synthetic superposition in the spectrum space will be used to enhance the spectrum coverage and express for:

經由上述步驟所獲得頻譜涵蓋範圍拓展之合成頻譜,將可用於獲得高空間解析度的顯微與斷層的物體重建影像。 The synthesized spectrum with extended spectrum coverage obtained through the above steps can be used to obtain high spatial resolution microscopic and tomographic object reconstruction images.

參閱第一圖,其為本發明之一實施例之結構光照明數位全像之裝置。本發明係用於處理單張相關於待測物體之數位全像重建影像,且該等數位全像是由第一圖之一光學系統所產生。此光學系統包含一發射光源100、一空間濾波器(spatial filter,SF)101、三個分光鏡(beam splitter)102、104與118、二個液晶空間光調制器(spatial light modulator,SLM)105與121、一照明物鏡組TL1、一接收物鏡組TL2、一光偵測器陣列106(例如:感光耦合元件(Charge-coupled Device;CCD)、互補式金屬氧化物半導體(Complementary Metal-Oxide-Semiconductor;CMOS)等影像感測器、光感測器(Photodetector))、四個線性偏振片(polarizer)107、108、116與125、三個反射面鏡(mirror)109、110與124、與一光擴束器111。舉例而言,照明物鏡組TL1包括一個具有焦距為200毫米(mm)的透鏡112及一個具有數值孔徑(numerical aperture,NA)為0.25的顯微物鏡(microscope objective lens)113與114。透鏡112之前後焦距可以相等,也可以實質上相等但有些微差異。顯微物鏡113之前後焦距可以相等,也可以實質上相等但有些微差異。接收物鏡組TL2包括一個具有數值孔徑(NA)為0.25的顯微物鏡114及一個具有焦距為200毫米(mm)的透鏡115。顯微物鏡114之前後焦距可以相等,也可以實質上相等但有些微差異。透鏡115之前後焦距可以相等,也可以實質上相等但有些微差異。參考光130可以為平面波分布,也可以為球面波分布。舉一實施例而言,照明物鏡組TL1為光學影像縮小系統(Telescopic Imaging System),而接收物鏡組TL2為一光學中繼系統。 Refer to the first figure, which is a structured light illuminating digital hologram device according to an embodiment of the present invention. The invention is used to process a single digital holographic reconstruction image related to the object to be measured, and the digital holograms are generated by an optical system in the first image. The optical system includes an emission light source 100, a spatial filter (SF) 101, three beam splitters 102, 104 and 118, and two liquid crystal spatial light modulators (SLM) 105 121, an illuminating objective lens group TL1, a receiving objective lens group TL2, a photodetector array 106 (for example: Charge-coupled Device (CCD), Complementary Metal-Oxide-Semiconductor ; CMOS) and other image sensors, photodetectors (Photodetector)), four linear polarizers (polarizers) 107, 108, 116 and 125, three mirrors (mirror) 109, 110 and 124, and one Optical beam expander 111. For example, the illumination objective lens group TL1 includes a lens 112 having a focal length of 200 millimeters (mm) and a microscope objective lens 113 and 114 having a numerical aperture (NA) of 0.25. The front and back focal lengths of the lens 112 may be equal, or may be substantially equal but slightly different. The front and back focal lengths of the micro objective lens 113 may be equal, or may be substantially equal but slightly different. The receiving objective lens group TL2 includes a micro objective lens 114 having a numerical aperture (NA) of 0.25 and a lens 115 having a focal length of 200 millimeters (mm). The front and back focal lengths of the microscope objective 114 may be equal, or may be substantially equal but slightly different. The front and back focal lengths of the lens 115 may be equal, or may be substantially equal but slightly different. The reference light 130 may be a plane wave distribution or a spherical wave distribution. In an embodiment, the illumination objective lens group TL1 is an optical imaging reduction system (Telescopic Imaging System), and the receiving objective lens group TL2 is an optical relay system.

發射光源100包括垂直共振腔面射型雷射(Vertical-Cavity Surface-Emitting Laser;VCSEL)、半導體雷射(Semiconductor laser)、固態雷射(Solid-state laser)、氣態雷射(Gas laser)、液體雷射(Dye laser)、光纖雷射(Fiber laser)或發光二極體(LED)。發射光源100之光源形式包括線光源、平面光源或球面光源。發射光源100之光源特性包括同調光源、低同調光源或非同調光源。舉例而言,發射光源100為二極體泵激固態(diode-pumped solid-state,DPSS)雷射源。在一例子之中,此二極體泵激固態雷射源產生一個具有波長為532奈米(nm)的雷射光。本裝置之光學系統之光路經包含:該雷射光先通過空間濾波器101,之後再通過光擴束器(例如透鏡)111以產生一完全擴束光(例如一準直平面波),該雷射光再經過面鏡109反射之後入射至分光鏡102而分別輸出兩道光束。其中一道光束120先通過線性偏振片107以改變入射光的偏振態,再穿透過分光鏡102以入射至液晶空間光調制器105,以產生結構光圖紋。入射光120另外由分光鏡102反射至線性偏振片108以實現相位調制模式的輸出方式。接著,由照明物鏡組TL1(112&113)輸出結構光圖紋而照明於一待測物體150之上,並形成編碼結構物體光波。其中,該結構光圖紋係透過至少二張的具相位移的圖紋而合成為單一張帶有編碼之結構光圖紋。亦即該單一張具相位移的結構光圖紋照 明於待測物體150之上,以形成結構物體光波(Object Wave),該物體將置於菲涅耳區間(Fresnel region)。然後,物體光波再經由接收物鏡組TL2(114&115)以進行顯微成像。接著,通過透鏡117進行結構物體光波的光學傅立葉轉換形成正一階(+1st)與負一階(-1st)的繞射光波,該光波通過分光鏡118分為穿透與反射兩道光束,反射光束將通過空間光學遮罩(y方向光學遮攔)119,光學遮罩119將消除負一階(-1st)的繞射光波(用於阻擋+1階繞射項,而讓-1階繞射項通過),穿透光束將通過空間光學遮罩(x方向光學遮攔)122,光學遮罩122將消除正一階(+1st)的繞射光波(用於阻擋+1階繞射項,而讓-1階繞射項通過);黑色的點表示光學遮攔,用於阻擋光線通過;白色的圓圈則表示讓剩餘的光線通過。而正一階(+1st)的繞射光波將通過透鏡160並成像至二值化亂數編碼圖案產生單元121,以取樣結構物體光波。而起偏板116與檢偏板125係用於調制二值化亂數編碼產生單元121的光學特性。同樣的,該穿透光束將通過光學遮罩以將正一階(+1st)的繞射光波消除,而負一階(-1st)的繞射光波通過透鏡123並成像至124面鏡上。上述經二值化亂數編碼產生單元調制後的正一階(+1st)的繞射光波,以及負一階(-1st)的繞射光波將沿原路徑反射,並由分光鏡118結合形成編碼的結構物體光波,並由透鏡126成像至影像感測器106上。另一道平面參考光波130經過面鏡110反射之後入射至分光鏡104,然後將同時入射至影像感測器106。參考光波與正向入射的物體光波維持離軸角度,以進行離軸式(off-axis)的數位全像記錄,並確保當結構光圖紋照明至物體150所形成之物體光波能與該參考光波維持在可消除直流項(dc term)與共軛項(conjugate term)之離軸記錄架構。 The emission light source 100 includes a vertical resonant cavity surface-emitting laser (Vertical-Cavity Surface-Emitting Laser; VCSEL), a semiconductor laser (Semiconductor laser), a solid-state laser (Solid-state laser), a gas laser (Gas laser), Liquid laser (Dye laser), fiber laser (Fiber laser) or light emitting diode (LED). The light source form of the emission light source 100 includes a linear light source, a planar light source or a spherical light source. The light source characteristics of the emission light source 100 include coherent light sources, low coherent light sources, or non-coherent light sources. For example, the emission light source 100 is a diode-pumped solid-state (DPSS) laser source. In one example, this diode-pumped solid-state laser source generates a laser light with a wavelength of 532 nanometers (nm). The optical path of the optical system of the device includes: the laser light first passes through the spatial filter 101, and then passes through an optical beam expander (such as a lens) 111 to generate a completely expanded beam (such as a collimated plane wave), the laser light After being reflected by the mirror 109, it enters the beam splitter 102 and outputs two beams respectively. One of the light beams 120 first passes through the linear polarizer 107 to change the polarization state of the incident light, and then passes through the dichroic mirror 102 to enter the liquid crystal spatial light modulator 105 to generate a structured light pattern. The incident light 120 is additionally reflected by the beam splitter 102 to the linear polarizer 108 to realize the output mode of the phase modulation mode. Next, the structured light pattern is output from the illumination objective lens group TL1 (112 & 113) to be illuminated on an object to be measured 150, and a coded structured object light wave is formed. Wherein, the structured light pattern is synthesized into a single structured light pattern with coding through at least two patterns with phase shift. That is, the single piece of structured light pattern with phase shift is illuminated on the object to be measured 150 to form an object wave of the structured object, and the object will be placed in the Fresnel region. Then, the object light wave passes through the receiving objective lens group TL2 (114 & 115) for micro imaging. Next, the optical Fourier transform of the light wave of the structured object through the lens 117 forms a diffracted light wave of positive first order (+ 1st) and negative first order (-1st). The reflected beam will pass through the spatial optical mask ( y- direction optical block) 119, and the optical mask 119 will eliminate the negative first-order (-1st) diffracted light waves (used to block the + 1st-order diffraction term and let the -1st-order diffraction Ray item passes), the penetrating beam will pass through the spatial optical mask (optical block in the x direction) 122, and the optical mask 122 will eliminate the positive first order (+ 1st) diffracted light wave (used to block the +1 order diffracted term, Let the -1 order diffraction item pass); the black dots represent the optical block, used to block the light through; the white circle represents the remaining light through. The positive first-order (+ 1st) diffracted light wave will pass through the lens 160 and be imaged into the binary random code pattern generating unit 121 to sample the structure object light wave. The polarizing plate 116 and the analyzer 125 are used to modulate the optical characteristics of the binarized random code generating unit 121. Similarly, the transmitted light beam will pass through the optical mask to eliminate the positive first-order (+ 1st) diffracted light waves, while the negative first-order (-1st) diffracted light waves pass through the lens 123 and are imaged onto the 124 mirror. The positive first-order (+ 1st) diffracted light wave and the negative first-order (-1st) diffracted light wave modulated by the above-described binarized random number coding generating unit will be reflected along the original path and formed by the beam splitter 118 The encoded structural object light wave is imaged by the lens 126 onto the image sensor 106. Another plane reference light wave 130 is reflected by the mirror 110 and then enters the dichroic mirror 104, and then enters the image sensor 106 at the same time. The reference light wave and the normally incident object light wave maintain an off-axis angle for off-axis digital holographic recording, and ensure that the object light wave formed when the structured light pattern is illuminated to the object 150 can meet the reference The light wave is maintained in an off-axis recording architecture that eliminates DC terms and conjugate terms.

上述結構光可以為振幅或相位的光波形式,而二值化亂數編碼可以為振幅或相位的光波形式。數位全像片可以為同軸式、離軸式、共軸式或共光程式,而該參考光可以為平面、球面或任意的光波形式。結構光照明數位全像之裝置更包括一載物平臺(未圖示),用以放置待測物體150,其且具調整x-y-z軸的位移機制。 The above structured light may be in the form of light waves of amplitude or phase, and the binary random number coding may be in the form of light waves of amplitude or phase. The digital hologram can be coaxial, off-axis, coaxial or co-optical, and the reference light can be flat, spherical or any light wave form. The structured lighting digital holography device further includes an object loading platform (not shown) for placing the object to be measured 150, and has a displacement mechanism for adjusting the xyz axis.

一些實施例適用於處理至少一個相關於一解析度標準可消除直流項與共軛項之離軸記錄架構。如第一圖所示,該三個反射面鏡109、110與124僅用於改變雷射光的光路徑。上述透鏡111可以為其他可產生擴束波前之元件 (平面與球面波)。上述透鏡112、115可以為其他可產生平面、球面與具任意的曲面波前之元件。 Some embodiments are suitable for processing at least one off-axis recording architecture related to a resolution criterion that can eliminate DC terms and conjugate terms. As shown in the first figure, the three reflecting mirrors 109, 110 and 124 are only used to change the optical path of the laser light. The lens 111 can be other elements (planar and spherical waves) that can generate a beam-expanded wavefront. The above-mentioned lenses 112 and 115 may be other elements that can generate a flat, spherical and arbitrary curved wavefront.

值得一提的是:在上述第一圖之實施例中,藉由光學系統採用一種改良式的馬赫-曾德爾(Mach-Zehnder)干涉儀來實現一種以單一張帶有編碼之結構光圖紋照明於物體,且與離軸參考光波干涉所作成之數位全像記錄方式。此結構光圖紋以及待測物體條紋之間的摺積作用將可用於突破光學繞射極限的限制。在其它實施例中,該等條紋影像之數位全像也能透過,例如以繞射光學元件、結合空間多工與角度多工,以及空間光調制器、數位微鏡裝置等其它結構光照明技術產生同軸(on-axis)、離軸(off-axis)、共軸(in-line)或共光程(common-path)架構下的穿透/反射式之數位全像記錄。 It is worth mentioning that: in the embodiment of the first picture above, an improved Mach-Zehnder interferometer is adopted by the optical system to realize a single structured light pattern with coding Digital holographic recording method that illuminates objects and interferes with off-axis reference light waves. The convolution between the structured light pattern and the stripes of the object to be measured will be used to break through the limit of the optical diffraction limit. In other embodiments, the digital holograms of the fringe images can also be transmitted, such as diffractive optical elements, combining spatial multiplexing and angular multiplexing, and other structured light illumination technologies such as spatial light modulators, digital micromirror devices, etc. Generate on-axis, off-axis, in-line, or common-path digital transmission through the reflection / reflection type holographic recording.

參閱第二圖,其為本發明之另一實施例之結構光照明數位全像之裝置。本發明係用於處理單張相關於待測物體之數位全像重建影像,且該等數位全像是由第二圖之一光學系統所產生。此光學系統包含一發射光源100、一空間濾波器101、三個分光鏡102、103與104、一個液晶空間光調制器105、一照明物鏡組TL1、一接收物鏡組TL2、一光偵測器陣列106、二個線性偏振片107與108、二個反射面鏡109與110、與一光擴束器111。光學系統之光路經以及各元件之作用可以參考第一圖的敘述。而在另一實施例之中,如第三圖所示,光學系統省略分光鏡102與104,其餘元件與第二圖相同。 Refer to the second figure, which is a structured light illuminating digital hologram device according to another embodiment of the present invention. The invention is used to process a single digital holographic reconstruction image related to the object to be measured, and the digital holograms are generated by an optical system in the second figure. The optical system includes an emitting light source 100, a spatial filter 101, three beam splitters 102, 103 and 104, a liquid crystal spatial light modulator 105, an illumination objective lens group TL1, a receiving objective lens group TL2, and a light detector The array 106, two linear polarizers 107 and 108, two reflecting mirrors 109 and 110, and an optical beam expander 111. The optical path of the optical system and the function of each element can refer to the description in the first figure. In another embodiment, as shown in the third figure, the optical system omits the dichroic mirrors 102 and 104, and the remaining components are the same as those in the second figure.

而在另一實施例之中,如第三圖A所示,光學系統省略分光鏡102與104,且在此光學系統新增一組光學中繼系統(光學影像縮小系統)TL3、一光柵(Grating)131以及一個濾波器遮罩(filter mask)132。光柵131配置於TL2(接收物鏡組)與TL3之間,而濾波器遮罩132配置於光學影像縮小系統TL3之二透鏡135與136之間。此濾波器遮罩132包含第一過濾區133與第二過濾區134,其中第一過濾區133可以讓物體光通過,而第二過濾區134可以讓參考光通過。 In another embodiment, as shown in FIG. 3A, the optical system omits the beam splitters 102 and 104, and a set of optical relay systems (optical image reduction systems) TL3 and a grating are added to the optical system. Grating) 131 and a filter mask 132. The grating 131 is disposed between TL2 (receiving objective lens group) and TL3, and the filter mask 132 is disposed between the two lenses 135 and 136 of the optical image reduction system TL3. The filter mask 132 includes a first filter area 133 and a second filter area 134, wherein the first filter area 133 can pass object light, and the second filter area 134 can pass reference light.

而在另一實施例之中,如第三圖B所示,光學系統省略分光鏡102與104,且在此光學系統新增一組光學中繼系統(光學影像縮小系統)TL3、一 光柵(例如,閃耀光柵(Blazed grating))131。TL3包括透鏡135、透鏡136與一分光鏡140。透鏡135配置於分光鏡140之左側,而透鏡136配置於分光鏡140之上側。分光鏡140配置於透鏡135與光柵131之間。光柵配置於光學中繼系統TL3之一側邊,而濾波器遮罩嵌入光柵131之中。濾波器遮罩包含第一過濾區133與第二過濾區134,其中第一過濾區133係針對光波聚焦後的外圍分佈,以外圍的光柵來調制形成物體光,而第二過濾區134則係針對光波聚焦後的中心分部,以中心的光柵來調制形成參考光。 In another embodiment, as shown in FIG. 3B, the optical system omits the beam splitters 102 and 104, and a new optical relay system (optical image reduction system) TL3 and a grating are added to the optical system. For example, Blazed grating 131. TL3 includes a lens 135, a lens 136, and a beam splitter 140. The lens 135 is disposed on the left side of the dichroic mirror 140, and the lens 136 is disposed on the upper side of the dichroic mirror 140. The dichroic mirror 140 is disposed between the lens 135 and the grating 131. The grating is disposed on one side of the optical relay system TL3, and the filter mask is embedded in the grating 131. The filter mask includes a first filter area 133 and a second filter area 134, wherein the first filter area 133 is for the peripheral distribution after the light wave is focused, and the peripheral grating is used to modulate the object light, and the second filter area 134 is for For the central part after the light wave is focused, the grating in the center is modulated to form the reference light.

第四圖顯示根據本發明之一結構光照明數位全像之方法流程圖。本發明之結構光照明數位全像之方法包含步驟200~204。首先,進行步驟200,產生結構光圖紋與二值化亂數編碼圖案。在此步驟200之中,係提供一結構光產生單元與亂數編碼單元,以產生結構光圖紋用以照明於一待測物體,並形成編碼結構物體光波(二值化亂數編碼圖案)。亂數編碼單元例如為二值化亂數編碼圖案。其中結構光產生單元與二值化亂數編碼單元包括空間光調制器、數位微鏡裝置、繞射光柵等光電調制元件,以將發射光源所發出光形成一具二值化亂數編碼圖案、任意空間頻率以及方向的結構光圖紋。在本實施例中,使用相位模式的液晶空間光調制器,以將發射光源所發出光形成具相位移圖紋,以及二值化亂數編碼圖案;並可任意調整該等圖紋的空間頻率及方向照明於物體,以形成編碼結構物體光波。 The fourth figure shows a flow chart of a method for illuminating a digital hologram with structured light according to the present invention. The method of structured light illumination digital holography of the present invention includes steps 200-204. First, proceed to step 200 to generate structured light patterns and binary random number coding patterns. In this step 200, a structured light generating unit and a random number coding unit are provided to generate a structured light pattern for illuminating an object to be measured and form a coded structured object light wave (binarized random number coding pattern) . The random number coding unit is, for example, a binary random number coding pattern. Among them, the structured light generating unit and the binary random number coding unit include a spatial light modulator, a digital micromirror device, a diffraction grating and other photoelectric modulation elements to form a binary random number coding pattern from the light emitted by the emitting light source, Structured light pattern at any spatial frequency and direction. In this embodiment, a liquid crystal spatial light modulator in phase mode is used to form a pattern with a phase shift and a binarized random coding pattern from the light emitted by the emitting light source; the spatial frequency of the patterns can be adjusted arbitrarily And the direction is illuminated to the object to form a coded structure object light wave.

接下來,於步驟201之中,藉由該至少二張的二值化亂數編碼圖案,以取樣至少二張具相位移圖紋,並合成為單一張帶有編碼的結構光圖紋照明於物體。在本實施例中,使用二值化亂數編碼單元以產生二張二值化亂數編碼圖案,而該二值化亂數編碼圖案的取樣點彼此不重複,如第四圖所示。第六圖至第八圖顯示結構光圖紋之編碼方式,其中第六圖包括二張二值化亂數編碼圖案。接著,使用結構光產生單元以輸出二張具相位移圖紋。而該相位移圖紋如第七圖所示,其中從左至右分別為相位移0°與120°之相位移圖紋。第七圖顯示二張具相位移圖紋。並且經二值化亂數編碼圖案取樣為第八圖之編碼結構光圖紋,該編碼結構光圖紋可以合成為單一張帶有二張相位移編碼之結構光圖紋,且該帶有編碼之結構光圖紋可以為成像或非成像的繞射光波。第八圖顯示 二張相位移圖紋經二值化亂數編碼圖案取樣之後的結構光圖紋。 Next, in step 201, at least two pieces of phase-shifted patterns are sampled by the at least two binarized random coding patterns, and synthesized into a single structured light pattern with coding for illumination at object. In this embodiment, a binary random number coding unit is used to generate two binary random number coding patterns, and the sampling points of the binary random number coding pattern do not overlap each other, as shown in the fourth figure. The sixth to eighth figures show the encoding method of structured light patterns, wherein the sixth figure includes two binary random number coding patterns. Then, the structured light generating unit is used to output two phase shift patterns. The phase shift pattern is shown in the seventh figure, where from left to right are phase shift patterns of 0 ° and 120 ° phase shift. The seventh figure shows two patterns with phase shift. And the binary random number coding pattern is sampled as the coded structured light pattern of the eighth image, the coded structured light pattern can be synthesized into a single structured light pattern with two phase shift codes, and the coded The structured light pattern can be imaging or non-imaging diffracted light waves. The eighth figure shows the structured light pattern after two phase shift patterns are sampled by the binarized random code pattern.

然後,於步驟202之中,將該等單一張帶有二張相位移編碼之結構光圖紋照明於一待測物體,以形成編碼結構物體光波,再與參考光波干涉以產生單一張結構光數位全像片,然後再進行波前重建。單一張數位全像片之形式包括同軸式、離軸式、共軸式和共光程。波前重建方法包括時間濾波(temporal filtering)、空間濾波以及相位檢復(phase retrieval)等方法。在本實施例中,將相位移編碼的結構光圖紋透過照明物鏡組TL1縮小成像於如第九圖A的待測物體上,並由接收物鏡組TL2放大成像該編碼結構物體光波於中間影像平面;接著傳播至菲涅耳繞射區域以形成如第九圖B的編碼結構物體光波,並與離軸參考光波干涉以進行空間濾波(spatial filtering)的波前重建。第九圖A至第九圖B顯示單一張帶有編碼結構物體光波的編碼方式,其中第九圖A中包含待測物體的影像資訊,而第九圖B則包含單一張帶有編碼結構的物體光波。 Then, in step 202, illuminate the single structured light pattern with two phase shift codes on an object to be measured to form a coded structured object light wave, and then interfere with the reference light wave to generate a single structured light Digital hologram and then wavefront reconstruction. The form of a single digital hologram includes coaxial, off-axis, coaxial and co-optical path. Wavefront reconstruction methods include temporal filtering, spatial filtering, and phase retrieval. In this embodiment, the phase-shift-encoded structured light pattern is reduced and imaged on the object to be measured as shown in the ninth figure A through the illumination objective lens group TL1, and the coded structured object light wave is enlarged and imaged in the intermediate image by the receiving objective lens group TL2 Plane; then propagate to the Fresnel diffraction area to form the encoded structural object light wave as shown in Figure 9B, and interfere with the off-axis reference light wave for spatial filtering (spatial filtering) wavefront reconstruction. The ninth picture A to the ninth picture B show a single light wave encoding method with an encoding structure object, wherein the ninth picture A contains the image information of the object to be measured, and the ninth picture B contains a single picture with the encoding structure Object light waves.

光波繞射例如為菲涅耳繞射(Fresnel diffraction)或夫朗和斐繞射(Fraunhofer diffraction)。在本實施例中,繞射資訊成像至物體的中間影像平面,並繞射一段距離至菲涅耳區域以產生低頻繞射條紋資訊,以解決光偵測器陣列的實際像素尺寸受限問題。 The light wave diffraction is, for example, Fresnel diffraction or Fraunhofer diffraction. In this embodiment, the diffraction information is imaged to the intermediate image plane of the object, and diffracted a distance to the Fresnel region to generate low-frequency diffraction fringe information, so as to solve the problem of the actual pixel size limitation of the photodetector array.

接下來,於步驟203之中,二值化亂數解碼波前重建的編碼結構物體光波(單一張數位全像)之圖案,以取出對應的原具相位移圖紋的物體光波,並利用一影像處理方法以復原至少二張具相位移圖紋的物體光波。在一實施例中,影像處理方法包括:壓縮感測法(compressive sensing)、反摺積法(de-convolution)或內插法(interpolation)。經波前重建的編碼結構物體光波,將使用二值化亂數解碼圖案以取出對應的原具相位移圖紋的物體光波,如第十圖A至第十圖B所示。第十圖A至第十圖B所示係為經二值化亂數解碼圖案所取出對應的原具相位移圖紋的物體光波,其相位移編碼分別為0°以及120°的具相位移圖紋的物體光波。相位移圖紋之物體光波將經過壓縮感測演算以回復為如第十一圖A至第十一圖B所示之二張具相位移圖紋的物體光波,其相位移編碼分別為0°以及120°的具相位移圖紋的物體光波重建影像。 Next, in step 203, the binarized random number decoded wavefront reconstructed pattern of the structured object light wave (single digital hologram) to extract the corresponding object light wave with the phase shift pattern and use a Image processing method to recover at least two object light waves with phase shift patterns. In one embodiment, the image processing method includes: compressive sensing, de-convolution, or interpolation. The wavefront-reconstructed coded object light wave will use the binary random decoding pattern to extract the corresponding object light wave with the original phase shift pattern, as shown in Figures 10 to 10B. The tenth picture A to tenth picture B are the light waves of the object with the phase shift pattern extracted by the binary random decoding pattern. The phase shift codes are 0 ° and 120 ° with the phase shift. Patterned object light waves. The object light wave of the phase shift pattern will be compressed and calculated to return to the two object light waves with phase shift pattern as shown in Figure 11 to Figure 11 B. The phase shift codes are 0 ° And the 120 ° phase shift pattern of the object light wave reconstruction image.

最後,於步驟204之中,將該至少二張具相位移圖紋的物體光波進行重疊頻譜分離之重建方法,以獲得具有不同的高頻與低頻帶通頻譜涵蓋範圍之影像。在本實施例中,如第十二圖A至第十三圖B所示,其顯示經由重疊頻譜分離重建方法所獲得具有不同的高頻與低頻帶通頻譜涵蓋範圍之影像,其中第十二圖A至第十二圖B分別顯示頻譜相對應的繞射階為正一階(+1st)、負一階(-1st)之帶通頻譜,以及第十三圖A至第十三圖B分別顯示頻譜相對應的繞射階為正一階(+1st)、負一階(-1st)之重建振幅影像。該等帶通頻譜可透過二維傅立葉轉換合成方式以合成二維高空間解析度的波前成像,如第十四圖A至第十四圖B所示。其中第十四圖A為二維合成頻譜涵蓋範圍,第十四圖B為合成振幅重建影像,第十四圖C為合成相位重建影像。在另一實施例之中,使用三維傅立葉轉換以實現斷層造影。第十五圖所示,其係模擬三維物件經過三維傅立葉頻譜合成方式,以獲得第十六圖C至第十六圖D之三維合成頻譜所對應之斷層重建影像。第十六圖A顯示三維合成頻譜在x-y空間上的涵蓋範圍,而第十六圖B顯示三維合成頻譜在y-z空間上的涵蓋範圍。第十六圖C顯示三維合成頻譜在x-y空間的折射率之斷層重建影像,而第十六圖D顯示三維合成頻譜在y-z空間的折射率之斷層重建影像。 Finally, in step 204, a reconstruction method of performing overlapping spectrum separation on the at least two object light waves with phase shift patterns to obtain images with different high-frequency and low-band pass spectrum coverage areas. In this embodiment, as shown in the twelfth image A to the thirteenth image B, it displays images with different high-frequency and low-band pass spectrum coverage areas obtained through the overlapping spectrum separation and reconstruction method, of which the twelfth Figures A to Twelfth Figure B show the corresponding band-pass spectra of the positive first-order (+1 st ) and negative first-order (-1 st ) diffraction orders corresponding to the spectrum, and Figures 13 to 13 Figure B shows the reconstructed amplitude images with the corresponding diffraction order of the spectrum as positive first order (+1 st ) and negative first order (-1 st ), respectively. These band-pass spectra can be synthesized by two-dimensional Fourier transform synthesis to synthesize two-dimensional high-resolution wavefront imaging, as shown in Figure 14 to Figure 14B. Among them, the fourteenth picture A is the coverage area of the two-dimensional synthesized spectrum, the fourteenth picture B is the synthesized amplitude reconstructed image, and the fourteenth picture C is the synthesized phase reconstructed image. In another embodiment, three-dimensional Fourier transform is used to achieve tomography. As shown in Figure 15, it is a simulation of a three-dimensional object undergoing three-dimensional Fourier spectrum synthesis to obtain a tomographic reconstruction image corresponding to the three-dimensional synthesized spectrum of Figures 16 to 16 D. Figure 16 shows the coverage of the three-dimensional synthetic spectrum in xy space, and Figure 16 shows the coverage of the three-dimensional synthetic spectrum in yz space. Figure 16 shows the tomographic reconstruction of the refractive index of the three-dimensional synthetic spectrum in the xy space, and Figure 16 shows the tomographic reconstruction of the refractive index of the three-dimensional synthetic spectrum in the yz space.

如上所述第六圖至第十六圖D主要係藉由一電腦模擬如第一~第三圖之結構光照明數位全像裝置所產生之數位全像。藉由結構光照明數位全像方法以獲得具有不同的高頻與低頻帶通頻譜涵蓋範圍之合成頻譜及其高空間解析度重建影像。在本發明之電腦模擬之中,提供了結構光數位全像的頻譜涵蓋範圍以及其結構光投影條紋在空間解析度的性能表現。在一實施例之中,模擬光源的中心波長為532奈米(nm)、像素大小為△x=0.26微米(μm)、取樣數量為1538×1538。所採用測試樣本分別包含數個不同空間頻率的亮暗條紋,主要係包括自5.4、3.6至1.8微米(μm)的微米線對,以用於比較經過結構光照射之後,其合成頻譜所作用的高空間解析度振幅與相位影像。因此,模擬中設定該接收物鏡組的數值孔徑NA為0.12,當以結構光的零階(0th)繞射項入射待測物體時所能達到的理想解析度為3.4微米(μm),如第十三圖A所示。接著,經過結構光的正負一階(±1st)繞射項入射待測物體,其空間解析度可提升至1.7微米(μm),如第十四 圖B所示。 As described above, the sixth to sixteenth figures D are mainly digital holograms generated by a computer simulation of the structured light illumination digital hologram device as shown in the first to third figures. The structured light is used to illuminate the digital hologram method to obtain a synthesized spectrum with different high-frequency and low-band pass spectrum coverage and its high spatial resolution reconstructed image. In the computer simulation of the present invention, the spectrum coverage of structured light digital holography and the performance of structured light projection fringes in spatial resolution are provided. In another preferred embodiment, the center wavelength of 532 nm for analog light source (nm), the pixel size of micrometers △ x = 0.26 ([mu] m), the number of samples is 1538 × 1538. The test samples used contain several bright and dark stripes with different spatial frequencies, mainly including pairs of micrometers from 5.4, 3.6 to 1.8 micrometers (μm) to compare the effect of the combined spectrum after irradiation with structured light High spatial resolution amplitude and phase images. Therefore, the numerical aperture NA of the receiving objective lens group is set to 0.12 in the simulation, and the ideal resolution that can be achieved when the object to be measured is incident with the zeroth order (0 th ) diffraction term of structured light is 3.4 micrometers (μm), such as Figure 13 is shown in Figure A. Then, the positive and negative first-order (± 1 st ) diffraction terms of the structured light enter the object to be measured, and its spatial resolution can be increased to 1.7 micrometers (μm), as shown in FIG. 14B.

第五圖顯示根據本發明之一實施例之一結構光照明數位全像之詳細的方法流程圖。照射光源300產生一入射光以入射至一光學系統301,經過一分光鏡而分別輸出兩道光束(I1、I2)。其中一道光束(I1)首先產生至少二張已知空間頻率結構的圖案302,而另一道光束(I2)則作為一參考波306。接下來,利用二值化亂數編碼單元以產生至少二張已知二值化亂數編碼圖案303。然後,單一張帶有編碼之結構光圖紋照明於待測物體304之上,以形成編碼結構物體光波。之後,編碼結構物體光波進行菲涅耳繞射305以傳播至菲涅耳區間。菲涅耳繞射305之編碼結構物體光波與參考光波306將同時達至光學系統301之影像感測器,以進行數位全像記錄,而產生單張結構光數位全像片307。接下來,針對單張結構光數位全像片以執行一波前重建演算法308,其中包含各階繞射項。然後,取出至少二張已知二值化亂數編碼圖案309以進行後續的壓縮感測310。壓縮感測方法之後,回復至少二張具相位移圖紋的物體光波311。之後,將針對該至少二張具相位移圖紋的物體光波以進行重疊頻譜分離重建方法312。接下來,進行二維或三維傅立葉轉換313方法,以利於實現超解析與斷層造影。然後,進行頻譜疊合314步驟,以合成頻譜在空間上的涵蓋範圍。之後,進行反傅立葉轉換315方法,以形成具有高空間解析度的波前重建影像316。波前重建影像包括振幅影像317與相位影像318。 The fifth figure shows a detailed flowchart of a method for illuminating a digital hologram with structured light according to an embodiment of the invention. The illumination light source 300 generates an incident light to be incident on an optical system 301, and outputs two light beams (I 1 , I 2 ) respectively through a beam splitter. One beam (I 1 ) first generates at least two patterns 302 with known spatial frequency structures, and the other beam (I 2 ) serves as a reference wave 306. Next, the binary random number coding unit is used to generate at least two known binary random number coding patterns 303. Then, a single structured light pattern with coding is illuminated on the object to be measured 304 to form a coded structured object light wave. After that, the structured object light wave is subjected to Fresnel diffraction 305 to propagate to the Fresnel zone. The encoded structured object light wave of Fresnel diffraction 305 and the reference light wave 306 will reach the image sensor of the optical system 301 at the same time for digital holographic recording, and a single structured light digital hologram 307 is generated. Next, a wavefront reconstruction algorithm 308 is executed for a single structured light digital hologram, which includes diffraction orders of various orders. Then, at least two known binary random number coding patterns 309 are taken out for subsequent compression sensing 310. After compressing the sensing method, at least two object light waves 311 with phase shift patterns are restored. Afterwards, an overlapping spectrum separation and reconstruction method 312 is performed on the at least two object light waves with phase shift patterns. Next, the two-dimensional or three-dimensional Fourier transform 313 method is performed to facilitate super-resolution and tomography. Then, step 314 of spectrum overlapping is performed to synthesize the spatial coverage of the spectrum. Afterwards, an inverse Fourier transform 315 method is performed to form a wavefront reconstructed image 316 with high spatial resolution. The wavefront reconstructed image includes an amplitude image 317 and a phase image 318.

綜上所述,藉由本發明之結構光照明數位全像之方法與裝置,將物體光波與結構光圖紋之間的摺積特性來完成拓展頻譜涵蓋範圍,並進行二維以及三維的傅立葉頻譜合成,可以實現待測樣本的顯微與斷層之空間超解析度的波前重建,故確實能達成本發明之目的。 In summary, by using the method and device for illuminating digital hologram of structured light of the present invention, the convolution characteristic between the object light wave and the structured light pattern is used to complete the extended spectrum coverage, and the two-dimensional and three-dimensional Fourier spectrum The synthesis can realize the wavefront reconstruction of the super-resolution of the microscopic and fault space of the sample to be tested, so it can indeed achieve the purpose of the invention.

本發明之結構光照明數位全像之方法與裝置至少可以應用於底下幾個領域: The method and device for digital holography of structured light illumination of the present invention can be applied to at least the following fields:

(1)光學元件:透明玻璃基板瑕疵檢測、微透鏡陣列的高度檢測、積體電路的膠合平整度檢測、光電元件的瑕疵、油汙、刮痕、裂紋檢測、以及矽基板的孔洞檢測。 (1) Optical components: detection of defects on transparent glass substrates, detection of the height of microlens arrays, detection of glue flatness of integrated circuits, detection of defects of photoelectric components, oil stains, scratches, cracks, and detection of holes on silicon substrates.

(2)積體電路與半導體組件:元件線寬、線高、球徑、三維表面形貌、階高標準片、製程疊對、斷差高度、斜率、體積、表面積、振動模態。 (2) Integrated circuits and semiconductor components: component line width, line height, ball diameter, three-dimensional surface morphology, step height standard film, process stacking, break height, slope, volume, surface area, vibration mode.

(3)微光學元件:表面瑕疵檢測、表面粗糙度、表面輪廓、薄膜厚度與平整度、曲率半徑、波前量測、像差分析、折射率分佈可用於檢測光纖內部折射率分布。 (3) Micro-optical components: surface flaw detection, surface roughness, surface profile, film thickness and flatness, radius of curvature, wavefront measurement, aberration analysis, refractive index distribution can be used to detect the refractive index distribution inside the fiber.

(4)生醫細胞影像:細胞生物學、神經細胞觀測、細胞體積、細胞形態、生物感測器、生物晶片、活體生物細胞檢測與分析、藥物開發與篩檢。 (4) Biomedical cell imaging: cell biology, nerve cell observation, cell volume, cell morphology, biosensors, biochips, living biological cell detection and analysis, drug development and screening.

(5)手機與面板:三維表面形貌、應力與形變、手機鏡頭、瑕疵檢測、油漬、指紋、裂痕、點膠、錫膏、塗布、平整度、粗糙度、拋光。 (5) Mobile phones and panels: 3D surface topography, stress and deformation, mobile phone lenses, defect detection, oil stains, fingerprints, cracks, dispensing, solder paste, coating, flatness, roughness, polishing.

除描述於此之外,可藉由敘述於本發明中之實施例及實施方式所達成之不同改良方式,皆應涵蓋於本發明之範疇中。因此,揭露於此之圖式及範例皆用以說明而非用以限制本發明,本發明之保護範疇僅應以列於其後之申請專利範圍為主。 In addition to what is described here, different improvements that can be achieved by the embodiments and implementations described in the present invention should be included in the scope of the present invention. Therefore, the drawings and examples disclosed herein are used to illustrate rather than limit the present invention, and the scope of protection of the present invention should only be based on the scope of the subsequent patent applications.

Claims (10)

一種結構光照明數位全像之方法,包括:(a)提供一結構光產生單元與二值化亂數編碼單元,以產生結構光圖紋;(b)藉由該結構光圖紋之至少二張的二值化亂數編碼圖案,以取樣至少二張具相位移圖紋,並合成為單一張帶有編碼的結構光圖紋;(c)將該單一張帶有編碼的結構光圖紋照明於一物體,以形成編碼結構物體光波而與參考光波干涉以產生單一張數位全像片,接著再進行該單一張數位全像之波前重建;(d)二值化亂數解碼該單一張數位全像片之圖案,以取出對應的原具相位移圖紋的物體光波,並藉由一影像處理方法以復原至少二張具相位移圖紋的物體光波;以及(e)將該至少二張具相位移圖紋的物體光波進行重疊頻譜分離之重建方法,以獲得具有不同的高頻與低頻帶通頻譜涵蓋範圍之影像。     A method for illuminating a digital hologram of structured light, comprising: (a) providing a structured light generating unit and a binary random number coding unit to generate structured light patterns; (b) by at least two of the structured light patterns Zhang's binarized random number coding pattern, to sample at least two patterns with phase shift and synthesize into a single structured light pattern with code; (c) The single structured light pattern with code Illuminate an object to form a coded structure object light wave and interfere with the reference light wave to generate a single digital hologram, and then perform wavefront reconstruction of the single digital hologram; (d) Binary random decoding to the single A digital hologram pattern to extract the corresponding object light waves with phase shift patterns, and to recover at least two object light waves with phase shift patterns by an image processing method; and (e) the at least Two reconstruction methods of object light waves with phase shift patterns for overlapping spectrum separation to obtain images with different high-frequency and low-band pass spectrum coverage areas.     如請求項1所述之結構光照明數位全像之方法,其中該步驟(d)之中,該影像處理方法包括壓縮感測法、反摺積法或內插法。     The method for illuminating a digital hologram of structured light as described in claim 1, wherein in the step (d), the image processing method includes a compression sensing method, a deconvolution product method or an interpolation method.     如請求項1所述之結構光照明數位全像之方法,其中該步驟(e)之中,該不同的高頻與低頻帶通頻譜包括二維與三維的傅立葉頻譜資訊。     The method of structured light illumination digital holography as described in claim 1, wherein in step (e), the different high-frequency and low-band pass spectrums include two-dimensional and three-dimensional Fourier spectrum information.     一種結構光照明數位全像之裝置,包括:一發射光源;一光擴束器,用以該發射光源所發出光形成一擴束光;至少一分光鏡,用以使該發出光分成至少兩個光源、或結合至少兩個光源;一結構光產生單元,用以使該發出光形成一具任意空間頻率以及各個方向的結構光圖紋;二值化亂數編碼單元,用以使該發出光形成一具任意空間頻率以及各個方向的二值化亂數編碼圖案;一照明物鏡組,用以放大或縮小該結構光,以利於照射至待測物體以形成物體光; 一接收物鏡組,用以放大或縮小該結構光,以利於該物體光形成為成像或非成像的繞射光波;一參考光,用以與物體光干涉以形成結構光數位全像片;以及一光偵測器陣列,用以記錄該物體光與該參考光干涉後所形成之該結構光數位全像片。     A device for illuminating digital hologram with structured light, including: an emitting light source; an optical beam expander for forming an expanded beam of light emitted by the emitting light source; at least one beam splitter for dividing the emitted light into at least two Light sources, or a combination of at least two light sources; a structured light generating unit for forming the emitted light into a structured light pattern with any spatial frequency and various directions; a binary random number coding unit for making the emitted light The light forms a binary random number coding pattern with arbitrary spatial frequency and various directions; an illumination objective lens group is used to enlarge or reduce the structured light to facilitate irradiation to the object to be measured to form object light; a receiving objective lens group, Used to enlarge or reduce the structured light to facilitate the formation of the object light as an imaging or non-imaging diffracted light wave; a reference light to interfere with the object light to form a structured light digital hologram; and a light detector The array is used to record the structured light digital hologram formed by the interference between the object light and the reference light.     如請求項4所述之結構光照明數位全像之裝置,其中該數位全像片之形式包括同軸式、離軸式、共軸式或共光程式。     The device for illuminating a digital hologram of structured light as described in claim 4, wherein the form of the digital hologram includes coaxial type, off-axis type, coaxial type or common light program.     如請求項4所述之結構光照明數位全像之裝置,更包括複數個面鏡,用以改變該發射光源之光路徑;與一光學中繼物鏡組,用以調制該物體光波的高頻或低頻,以利於各種光學多工程序;該二值化亂數編碼圖案可以為振幅或相位的形式,該結構光可以為振幅或相位的形式。     The device for illuminating digital holograms as described in claim 4 further includes a plurality of face mirrors to change the light path of the emitting light source; and an optical relay objective lens group to modulate the high frequency of the object light wave Or low frequency to facilitate various optical multiplexing procedures; the binary random number coding pattern may be in the form of amplitude or phase, and the structured light may be in the form of amplitude or phase.     一種結構光照明數位全像之裝置,包括:一發射光源;一光擴束器,用以該發射光源所發出光形成一擴束光;至少一分光鏡,用以使該發出光分成至少兩個光源、或結合至少兩個光源;複數個面鏡,用以改變該發射光源之光路徑;一結構光產生單元,用以使該發出光形成一具任意空間頻率以及各個方向的結構光圖紋;二值化亂數編碼單元,用以使該發出光形成一具任意空間頻率以及各個方向的二值化亂數編碼圖案;一照明物鏡組,用以放大或縮小該結構光,以利於照射至待測物體以形成物體光;一接收物鏡組,用以放大或縮小該結構光,以利於該物體光形成為成像或非成像的繞射光波;以及一光偵測器陣列,用以記錄該物體光與該參考光干涉後所形成之該結構光數位全像片。     A device for illuminating digital hologram with structured light, including: an emitting light source; an optical beam expander for forming an expanded beam of light emitted by the emitting light source; at least one beam splitter for dividing the emitted light into at least two Light sources, or a combination of at least two light sources; a plurality of mirrors to change the light path of the emitting light source; a structured light generating unit to form a structured light pattern with arbitrary spatial frequency and various directions for the emitted light Grain; Binary random number coding unit, used to make the emitted light form a binary random number coding pattern with arbitrary spatial frequency and various directions; an illumination objective lens group, used to enlarge or reduce the structured light, in order to facilitate Illuminate the object to be measured to form object light; a receiving objective lens group to enlarge or reduce the structured light to facilitate the formation of the object light as an imaging or non-imaging diffracted light wave; and a light detector array to Record the structured light digital hologram after the object light interferes with the reference light.     如請求項7所述之結構光照明數位全像之裝置,更包括一光柵,用以產生不同繞射階之該物體光波資訊;以及一光學中繼系統,用以調制該物體光波,以利於該不同繞射階之光學多工。     The device for illuminating digital holograms of structured light as described in claim 7 further includes a grating to generate light wave information of the object at different diffraction orders; and an optical relay system to modulate the light wave of the object to facilitate The optical multiplexing of the different diffraction orders.     如請求項8所述之結構光照明數位全像之裝置,更包括一第二光學中繼系統、一濾波器遮罩以及一光柵,其中該光柵配置於該接收物鏡組與該第二光學中繼系統之間,而該濾波器遮罩配置於該第二光學中繼系統之兩組透鏡之間。     The structured light illuminating digital holographic device as described in claim 8 further includes a second optical relay system, a filter cover and a grating, wherein the grating is disposed in the receiving objective lens group and the second optics Between the two systems, and the filter mask is disposed between the two sets of lenses in the second optical relay system.     如請求項8所述之結構光照明數位全像之裝置,更包括一第二光學中繼系統以及一光柵,其中該光柵配置於該第二光學中繼系統之一側邊,而該濾波器遮罩嵌入於該光柵之中。     The structured light illuminating digital holographic device as described in claim 8 further includes a second optical relay system and a grating, wherein the grating is disposed on one side of the second optical relay system, and the filter The mask is embedded in the grating.    
TW106126787A 2017-08-08 2017-08-08 Method and device for illuminating digital full image by structured light TWI655522B (en)

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