TW201903216A - Aluminum laminate and method for producing same - Google Patents

Aluminum laminate and method for producing same Download PDF

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TW201903216A
TW201903216A TW107118632A TW107118632A TW201903216A TW 201903216 A TW201903216 A TW 201903216A TW 107118632 A TW107118632 A TW 107118632A TW 107118632 A TW107118632 A TW 107118632A TW 201903216 A TW201903216 A TW 201903216A
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aluminum
less
anodized film
thickness
aluminum substrate
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TW107118632A
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TWI741186B (en
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新宮享
大八木光成
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日商東洋鋁股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00Electrolytic coating by surface reaction, i.e. forming conversion layers
    • C25D11/02Anodisation
    • C25D11/04Anodisation of aluminium or alloys based thereon
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00Electrolytic coating by surface reaction, i.e. forming conversion layers
    • C25D11/02Anodisation
    • C25D11/04Anodisation of aluminium or alloys based thereon
    • C25D11/16Pretreatment, e.g. desmutting

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Laminated Bodies (AREA)
  • Metal Rolling (AREA)

Abstract

An aluminum laminate (10) comprises an aluminum substrate (1) having a first surface (1A); and an anodic oxide film (2) that is formed in contact with the first surface (1A) and has a second surface (2A), which is in a position that is separated from the first surface (1A) in a direction that intersects the first surface (1A). A surface layer that includes the first surface (1A) of the aluminum substrate (1) includes aluminum having a purity of 99.9 mass% or more, and 0.001 to 0.052 mass% of iron. The surface roughness Ra of the second surface (2A) of the anodic oxide film (2) is 20 nm or less. The mean width of profile elements RSm of the second surface (2A) of the anodic oxide film (2) is less than 30 [mu]m. The thickness of the anodic oxide film (2) in a direction that intersects the anodic oxide film is 9 to 26 [mu]m.

Description

鋁積層體及其製造方法Aluminum laminated body and manufacturing method thereof

本發明係關於一種鋁積層體及其製造方法。The invention relates to an aluminum laminate and a method for manufacturing the same.

鋁之表面通常形成有自然氧化皮膜。然而,自然氧化膜容易因濕氣或水分而腐蝕。因此,通常於在包含濕氣或水分等會使鋁腐蝕之腐蝕環境下所使用之鋁板之表面形成陽極氧化皮膜,以保護該表面免受腐蝕,。陽極氧化皮膜之厚度越厚,則陽極氧化皮膜之耐蝕性作用越高。A natural oxide film is usually formed on the surface of aluminum. However, the natural oxide film is easily corroded by moisture or moisture. Therefore, an anodic oxide film is usually formed on the surface of an aluminum plate used in a corrosive environment that contains aluminum, such as moisture or moisture, to protect the surface from corrosion. The thicker the thickness of the anodized film, the higher the corrosion resistance of the anodized film.

另一方面,鋁板可用作照明之反射板或設計性建築材料用面板。於此種用途中,要求具有較高之光澤度及較高之全反射率之鋁板。On the other hand, aluminum plates can be used as reflective plates for lighting or as panels for design building materials. In such applications, an aluminum plate having higher gloss and higher total reflectance is required.

然而,先前認為,越增加陽極氧化皮膜之厚度,則鋁板之光澤度與全反射率越降低。However, it was previously thought that the greater the thickness of the anodized film, the lower the gloss and total reflectance of the aluminum plate.

於日本專利特開2008-174764號公報(專利文獻1)中,揭示有具備厚度為100 nm以上且500 nm以下之障壁型陽極氧化皮膜之鋁材。於上述專利文獻1中,記載有若厚度超過500 nm,則陽極氧化皮膜對可見光線之吸收之影響增大而正反射性較差,因此必須將障壁型陽極氧化皮膜之厚度設為500 nm以下。 [先前技術文獻] [專利文獻]Japanese Patent Laid-Open No. 2008-174764 (Patent Document 1) discloses an aluminum material including a barrier-type anodized film having a thickness of 100 nm to 500 nm. In the above-mentioned Patent Document 1, it is described that if the thickness exceeds 500 nm, the influence of the anodic oxide film on absorption of visible light increases and the specular reflection is poor. Therefore, the thickness of the barrier-type anodic oxide film must be 500 nm or less. [Prior Art Literature] [Patent Literature]

[專利文獻1]日本專利特開2008-174764號公報[Patent Document 1] Japanese Patent Laid-Open No. 2008-174764

[發明所欲解決之問題][Problems to be solved by the invention]

專利文獻1中記載之厚度為500 nm以下之障壁型陽極氧化皮膜無法充分防止例如於廚房周圍、室外之包含大量濕氣或水分之腐蝕環境下所使用之鋁板之腐蝕。The barrier-type anodic oxide film having a thickness of 500 nm or less described in Patent Document 1 cannot sufficiently prevent corrosion of an aluminum plate used in a corrosive environment containing a large amount of moisture or moisture around a kitchen or outdoors.

又,近年來,伴隨設計之多樣化,對建築材料用面板用鋁板要求較高之圖像清晰度。然而,上述專利文獻1中未考慮到圖像清晰度。Moreover, in recent years, with the diversification of designs, an aluminum plate for a panel for a building material is required to have high image definition. However, the above-mentioned Patent Document 1 does not consider image sharpness.

因此,本發明之目的在於提供一種具有較高之光澤度、較高之全反射率及較高之圖像清晰度,並且具有較高之耐蝕性的鋁積層體。 [解決問題之技術手段]Therefore, an object of the present invention is to provide an aluminum laminate having higher gloss, higher total reflectance, higher image sharpness, and higher corrosion resistance. [Technical means to solve the problem]

本發明者等人為了解決上述課題,經過反覆努力研究,結果發現極端增大陽極氧化皮膜之厚度,可獲得一種不僅具有較高之耐蝕性及表面硬度,且具有較高之光澤度、較高之全反射率及較高之圖像清晰度的鋁積層體。In order to solve the above-mentioned problems, the inventors and the like have made repeated efforts and found that the thickness of the anodic oxide film is extremely increased, and a kind of not only having higher corrosion resistance and surface hardness, but also having higher gloss and higher gloss can be obtained. Aluminum laminate with high total reflectance and high image sharpness.

即,本實施形態之鋁積層體具有以下之特徵。本實施形態之鋁積層體具備:鋁基材,其具有第1面;及陽極氧化皮膜,其接於第1面而形成,且具有於與第1面交叉之方向上位於遠離第1面之位置之第2面。鋁基材之包含第1面之表層含有純度99.9質量%以上之鋁、及0.001質量%以上且0.052質量%以下之鐵。陽極氧化皮膜之第2面之表面粗糙度Ra為20 nm以下。陽極氧化皮膜之第2面之平均凹凸間距離RSm未達30 μm。陽極氧化皮膜之交叉方向之厚度為9 μm以上且26 μm以下。That is, the aluminum laminated body of this embodiment has the following characteristics. The aluminum laminate according to this embodiment includes: an aluminum substrate having a first surface; and an anodized film formed by being connected to the first surface and having a distance from the first surface in a direction intersecting the first surface. The second side of the position. The surface layer including the first surface of the aluminum substrate contains aluminum having a purity of 99.9% by mass or more and iron of 0.001% by mass or more and 0.052% by mass or less. The surface roughness Ra of the second surface of the anodized film is 20 nm or less. The average inter-convex distance RSm of the second surface of the anodized film was less than 30 μm. The thickness of the anodized film in the crossing direction is 9 μm or more and 26 μm or less.

先前,已知伴隨陽極氧化皮膜之厚度增加,具備其之鋁積層體之正反射率降低。此時之正反射率並非隨著膜厚增加單調降低,而是顯示一面反覆出現降低傾向與上升傾向一面緩緩降低之傾向。於上述專利文獻1之圖1中,若將陽極氧化皮膜之厚度自0 nm緩緩增加至550 nm左右,則鋁積層體之正反射率顯示一面週期性地反覆減小與增大一面緩緩降低之傾向。於上述專利文獻1中,基於該傾向,得到如下結論:陽極氧化皮膜之厚度較佳為150 nm±30 nm或300 nm±20 nm。認為出現上述傾向之原因在於鋁基材之第1面上之反射光與陽極氧化皮膜之第2面上之反射光發生干涉。Conventionally, it has been known that as the thickness of the anodic oxide film increases, the positive reflectance of the aluminum laminate provided with it decreases. At this time, the regular reflectance does not decrease monotonically with the increase of the film thickness, but shows a tendency to gradually decrease while repeatedly decreasing and increasing the tendency. In FIG. 1 of the aforementioned Patent Document 1, if the thickness of the anodic oxide film is gradually increased from 0 nm to about 550 nm, the regular reflectance of the aluminum laminate gradually decreases and increases gradually while periodically Declining tendency. In the aforementioned Patent Document 1, based on this tendency, it was concluded that the thickness of the anodized film is preferably 150 nm ± 30 nm or 300 nm ± 20 nm. It is considered that the above-mentioned tendency occurs because the reflected light on the first surface of the aluminum substrate interferes with the reflected light on the second surface of the anodic oxide film.

針對此種情況,本發明者等人確認:與具備厚度為150 nm以上且300 nm以下左右之陽極氧化皮膜之鋁積層體相比,具備厚度為9 μm以上且26 μm以下之陽極氧化皮膜之本實施形態之鋁積層體具有較高之可見光全反射率(詳細內容參照下述實施例)。又,確認與具備厚度為600 nm以上且未達9 μm之陽極氧化皮膜之鋁積層體相比,鋁積層體不僅具有同等程度以上之較高之光澤度、可見光全反射率及圖像清晰度,且亦具有較高之耐蝕性(詳細內容參照下述實施例)。即,本發明者等人確認:於9 μm以上且26 μm以下之相對廣泛之陽極氧化皮膜之厚度數值範圍內,可實現較高之光澤度、較高之可見光全反射率及較高之圖像清晰度。In view of this situation, the present inventors have confirmed that, compared with an aluminum laminate having an anodic oxide film having a thickness of 150 nm to 300 nm, the inventor has an anodic oxide film having a thickness of 9 μm to 26 μm. The aluminum laminate of this embodiment has a high total visible light reflectance (for details, refer to the following examples). In addition, it was confirmed that aluminum laminates not only have higher gloss, total visible light reflectance, and image clarity than the aluminum laminates having an anodized film having a thickness of 600 nm or more and less than 9 μm. , And also has high corrosion resistance (for details, refer to the following examples). That is, the inventors have confirmed that within a relatively wide range of thickness values of the anodized film from 9 μm to 26 μm, higher gloss, higher total visible light reflectance, and higher maps can be achieved. Like sharpness.

本發明者等人認為:不同於上述因干涉而產生之正反射率一面反覆增減一面緩緩減小之傾向,此次所發現之上述傾向係藉由與干涉作用不同之作用而實現。The present inventors and others believe that, unlike the above-mentioned tendency that the regular reflectance caused by interference gradually decreases and decreases gradually, the above-mentioned tendency discovered this time is realized by a different action from the interference action.

於上述鋁積層體中,陽極氧化皮膜為硫酸陽極氧化皮膜。 於上述鋁積層體中,鋁基材及陽極氧化皮膜之交叉方向之厚度的合計值為60 μm以上且1000 μm以下。In the aluminum laminate, the anodized film is a sulfuric acid anodized film. In the above-mentioned aluminum laminate, the total thickness of the aluminum substrate and the anodized film in the crossing direction is 60 μm or more and 1000 μm or less.

上述鋁積層體之製造方法包括如下步驟:準備第1面之表面粗糙度Ra為15 nm以下之鋁基材;及於鋁基材之第1面上,使用包含硫酸之電解液,形成交叉方向之厚度為9 μm以上且26 μm以下之陽極氧化皮膜。 [發明之效果]The manufacturing method of the above aluminum laminate includes the following steps: preparing an aluminum substrate having a surface roughness Ra of 15 nm or less on the first surface; and forming an intersecting direction on the first surface of the aluminum substrate using an electrolyte containing sulfuric acid The thickness of the anodized film is 9 μm or more and 26 μm or less. [Effect of the invention]

根據本發明,可提供一種具備較高之光澤度、較高之全反射率及較高之圖像清晰度,並且具有較高之耐蝕性的鋁積層體。According to the present invention, an aluminum laminate having higher gloss, higher total reflectance, higher image sharpness, and higher corrosion resistance can be provided.

以下,參照圖式對本發明之實施形態進行說明。再者,於以下之圖式中,對相同部分或與之相當的部分標註同一參照編號,不重複其說明。 [鋁積層體之構成] 如圖1所示,本實施形態之鋁積層體10具備鋁基材1及陽極氧化皮膜2。Hereinafter, embodiments of the present invention will be described with reference to the drawings. Moreover, in the following drawings, the same reference numerals are given to the same parts or equivalent parts, and the description is not repeated. [Configuration of Aluminum Laminate] As shown in FIG. 1, the aluminum laminate 10 of this embodiment includes an aluminum substrate 1 and an anodized film 2.

鋁基材1具有第1面1A、及位於與第1面1A之相反側之第3面1B。構成鋁基材1之材料包含鋁(Al)。鋁基材1例如為鋁箔。The aluminum base material 1 includes a first surface 1A and a third surface 1B located on the side opposite to the first surface 1A. The material constituting the aluminum substrate 1 includes aluminum (Al). The aluminum substrate 1 is, for example, an aluminum foil.

鋁基材1之包含第1面1A之表層之鋁純度為99.9質量%以上。The aluminum purity of the surface layer including the first surface 1A of the aluminum base material 1 is 99.9% by mass or more.

鋁基材1之包含第1面1A之表層包含0.001質量%以上且0.052質量%以下之鐵(Fe)。若鐵之含量未達0.001質量%,則鋁基材1之強度降低。另一方面,由於鐵在鋁中之固溶度較小,故而於鋁之鑄造時,FeAl3 等金屬間化合物容易晶出。該等晶出物與鋁生坯相比,可見光區域之反射率較低,會導致製成鋁基材時之光澤度及可見光反射率降低。又,若存在FeAl3 等金屬間化合物,則陽極氧化皮膜變得不均勻,不僅陽極氧化皮膜之透明性明顯變差而反射率降低,且陽極氧化皮膜之硬度亦降低。因此,必須將鐵之含量設為0.052質量%以下。The surface layer including the first surface 1A of the aluminum substrate 1 contains iron (Fe) in an amount of 0.001% by mass or more and 0.052% by mass or less. When the content of iron is less than 0.001% by mass, the strength of the aluminum substrate 1 is reduced. On the other hand, due to the low solid solubility of iron in aluminum, intermetallic compounds such as FeAl 3 are easily crystallized during the casting of aluminum. Compared with the aluminum green body, these crystals have lower reflectance in the visible light region, which results in lower gloss and visible light reflectance when made into an aluminum substrate. In addition, if an intermetallic compound such as FeAl 3 is present, the anodized film becomes non-uniform, and not only the transparency of the anodized film is significantly deteriorated and the reflectance is reduced, but also the hardness of the anodized film is decreased. Therefore, the content of iron must be 0.052% by mass or less.

鋁基材1之包含第1面1A之表層亦可包含例如0.001%質量%以上且0.09質量%以下之矽(Si)。矽於鋁中之固溶度較大而不易形成晶出物,因此只要為不會生成晶出物之程度之含量,則不會降低可見光區域之反射率。又,與不固溶有矽之鋁基材1之機械強度相比,固溶有0.001%質量%以上之矽之鋁基材1之機械強度因固溶強化而提高。因此,例如固溶有0.001%質量%以上之矽之鋁基材1不僅可維持與不固溶有矽之鋁基材1同等程度之機械強度,且亦可容易地軋製成厚度更薄之箔。另一方面,於鋁基材1包含多於0.09質量%之矽之情形時,若增加陽極氧化皮膜2之厚度,則陽極氧化皮膜2之透明性降低而反射率降低。進而,陽極氧化皮膜2之第2面2A之硬度亦降低。因此,必須將矽之含量設為0.09質量%以下。The surface layer including the first surface 1A of the aluminum base material 1 may also include, for example, silicon (Si) in an amount of 0.001% by mass or more and 0.09% by mass or less. The solid solubility of silicon in aluminum is large and it is difficult to form crystals. Therefore, as long as the content of silicon does not generate crystals, the reflectance in the visible light region will not be reduced. In addition, compared with the mechanical strength of the aluminum substrate 1 in which silicon is not solid-dissolved, the mechanical strength of the aluminum substrate 1 in which silicon is solid-dissolved in an amount of 0.001% by mass or more is enhanced by solid solution strengthening. Therefore, for example, the aluminum base material 1 with solid solution of 0.001% by mass or more of silicon can not only maintain the same mechanical strength as the aluminum base material 1 without solid solution of silicon, but can also be easily rolled into a thinner thickness Foil. On the other hand, when the aluminum substrate 1 contains more than 0.09% by mass of silicon, if the thickness of the anodized film 2 is increased, the transparency of the anodized film 2 decreases and the reflectance decreases. Further, the hardness of the second surface 2A of the anodized film 2 also decreases. Therefore, the content of silicon must be 0.09% by mass or less.

鋁基材1之包含第1面1A之表層中之除Al、Fe及Si以外之剩餘部分包含雜質。該雜質例如為不可避免之雜質,但除不可避免雜質以外,亦可包含不會對光澤度、可見光之全反射率、圖像清晰度及耐蝕性產生較大影響之微量雜質。上述雜質例如包含選自由銅(Cu)、錳(Mn)、鎂(Mg)、鋅(Zn)、鈦(Ti)、釩(V)、鎳(Ni)、鉻(Cr)、鋯(Zr)、硼(B)、鎵(Ga)及鉍(Bi)等所組成之群中之至少一種元素。各雜質元素各自之含量為0.01質量%以下。The rest of the surface layer of the aluminum substrate 1 including the first surface 1A other than Al, Fe, and Si contains impurities. The impurities are, for example, unavoidable impurities, but in addition to the unavoidable impurities, trace impurities that do not significantly affect gloss, total reflectance of visible light, image sharpness, and corrosion resistance may be included. The impurities include, for example, a material selected from the group consisting of copper (Cu), manganese (Mn), magnesium (Mg), zinc (Zn), titanium (Ti), vanadium (V), nickel (Ni), chromium (Cr), and zirconium (Zr). At least one element from the group consisting of boron (B), gallium (Ga), and bismuth (Bi). The content of each impurity element is 0.01% by mass or less.

鋁基材1之包含第1面1A之上述表層係於與第1面1A交叉之方向(深度方向)上距離第1面1A達5 μm之區域。較佳為第1面1A之表面粗糙度Ra為15 nm以下。更佳為第1面1A之表面粗糙度Ra為10 nm以下。作為使鋁基材1之第1面1A具有如此較小之表面粗糙度Ra之方法,有物理研磨、電解研磨、化學研磨等研磨加工,或使用表面為鏡面狀態之軋製輥之冷軋等。發明者發現,於電解研磨及化學研磨為濕式法,且第1面1A之研磨前之表面粗糙度Ra高達29 nm以上之情形時,即便將該第1面研磨至表面粗糙度Ra成為15 nm以下,其平均凹凸間距離RSm亦成為30 μm以上。於該情形時,形成於該第1面上之陽極氧化皮膜之第2面之平均凹凸間距離RSm亦會成為30 μm以上,該第2面不具有較高之圖像清晰度。較佳為藉由物理研磨或冷軋而使第1面1A之表面粗糙度Ra成為15 nm以下。根據此種方法,即便於研磨前之第1面1A之表面粗糙度Ra為29 nm以上之情形時,亦可藉由該方法而獲得平均凹凸間距離RSm與表面粗糙度Ra均被抑制為較小之研磨面。例如於藉由物理研磨或冷軋而使鋁基材1之第1面1A之表面粗糙度Ra成為10 nm以下之情形時,第1面1A之平均凹凸間距離RSm可成為20 μm以下。因此,形成於該第1面1A上之陽極氧化皮膜2之第2面2A之平均凹凸間距離RSm可成為未達30 μm,故第2面2A可具有較高之圖像清晰度。The above-mentioned surface layer including the first surface 1A of the aluminum base material 1 is in a region (a depth direction) intersecting the first surface 1A from the first surface 1A by 5 μm. The surface roughness Ra of the first surface 1A is preferably 15 nm or less. More preferably, the surface roughness Ra of the first surface 1A is 10 nm or less. As a method for making the first surface 1A of the aluminum base material 1 have such a small surface roughness Ra, there are grinding processes such as physical grinding, electrolytic grinding, and chemical grinding, or cold rolling using a roll having a mirror surface. . The inventors have found that when the electrolytic polishing and chemical polishing are wet methods, and the surface roughness Ra before the first surface 1A is as high as 29 nm or more, the first surface is polished to a surface roughness Ra of 15 Below nm, the average inter-convex distance RSm also becomes 30 μm or more. In this case, the average inter-convex distance RSm of the second surface of the anodized film formed on the first surface will also be 30 μm or more, and the second surface does not have high image definition. The surface roughness Ra of the first surface 1A is preferably 15 nm or less by physical polishing or cold rolling. According to this method, even when the surface roughness Ra of the first surface 1A before polishing is 29 nm or more, the average inter-convex distance RSm and the surface roughness Ra can be suppressed by this method. Small abrasive surface. For example, when the surface roughness Ra of the first surface 1A of the aluminum substrate 1 is 10 nm or less by physical polishing or cold rolling, the average inter-convex distance RSm of the first surface 1A may be 20 μm or less. Therefore, the average inter-convex distance RSm of the second surface 2A of the anodized film 2 formed on the first surface 1A can be less than 30 μm, so the second surface 2A can have high image definition.

上述表層以外之鋁基材1之其他部分之組成並無特別限制,鋁基材1亦可例如以披覆材料之形式構成。The composition of other parts of the aluminum base material 1 other than the above-mentioned surface layer is not particularly limited, and the aluminum base material 1 may also be constituted, for example, in the form of a covering material.

陽極氧化皮膜2係接於第1面1A而形成。陽極氧化皮膜2具有:接於第1面1A之面、及於與第1面1A交叉之方向上位於遠離第1面1A之位置之第2面2A。陽極氧化皮膜2係藉由對鋁基材1之第1面1A進行陽極氧化處理而形成。陽極氧化處理只要為公知之陽極氧化處理方法即可,例如使用包含硫酸、硼酸、草酸及磷酸中之至少任一種之電解液之陽極氧化處理。陽極氧化皮膜2較佳為藉由使用包含硫酸之電解液之陽極氧化處理而形成。即,陽極氧化皮膜2較佳為硫酸陽極氧化皮膜。陽極氧化皮膜2較佳為透明。The anodized film 2 is formed by being connected to the first surface 1A. The anodic oxide film 2 includes a surface connected to the first surface 1A and a second surface 2A located away from the first surface 1A in a direction intersecting the first surface 1A. The anodized film 2 is formed by anodizing the first surface 1A of the aluminum substrate 1. The anodizing treatment may be any known anodizing method, and for example, anodizing treatment using an electrolytic solution containing at least any one of sulfuric acid, boric acid, oxalic acid, and phosphoric acid. The anodized film 2 is preferably formed by anodizing treatment using an electrolytic solution containing sulfuric acid. That is, the anodized film 2 is preferably a sulfuric acid anodized film. The anodized film 2 is preferably transparent.

陽極氧化皮膜2之上述交叉方向之厚度為9 μm以上且26 μm以下。陽極氧化皮膜2之上述交叉方向之厚度係於陽極氧化皮膜2中同第1面1A接觸之面與第2面2A之間之距離。於陽極氧化皮膜之上述交叉方向之厚度小於9 μm之情形時,入射至陽極氧化皮膜之第2面之光於鋁基材之第1面上之反射光會與該入射光於第2面上之反射光發生干涉。於該情形時,於陽極氧化皮膜之第2面上產生干涉色或白色渾濁,鋁積層體無法實現較高之光澤度、較高之可見光全反射率或較高之圖像清晰度。又,於陽極氧化皮膜2之上述交叉方向之厚度小於9 μm之情形時,無法滿足可於室外使用之鋁積層體10所要求之耐蝕性,又,第2面2A之表面硬度亦降低。The thickness of the anodized film 2 in the above-mentioned crossing direction is 9 μm or more and 26 μm or less. The thickness in the above-mentioned crossing direction of the anodized film 2 is the distance between the surface in contact with the first surface 1A and the second surface 2A in the anodized film 2. When the thickness of the anodized film in the above-mentioned cross direction is less than 9 μm, the reflected light of the light incident on the second surface of the anodized film on the first surface of the aluminum substrate and the incident light on the second surface The reflected light interferes. In this case, an interference color or white turbidity is generated on the second surface of the anodized film, and the aluminum laminate cannot achieve higher gloss, higher total reflectance of visible light, or higher image sharpness. When the thickness of the anodized film 2 in the above-mentioned cross direction is less than 9 μm, the corrosion resistance required for the aluminum laminate 10 that can be used outdoors can not be satisfied, and the surface hardness of the second surface 2A is also reduced.

另一方面,於陽極氧化皮膜2之上述交叉方向之厚度大於26 μm之情形時,於陽極氧化處理中陽極氧化皮膜之溶解亦會增進,故而陽極氧化皮膜2之膜質降低,第2面2A之表面硬度降低。On the other hand, when the thickness of the anodized film 2 in the above-mentioned cross direction is greater than 26 μm, the dissolution of the anodized film during the anodizing treatment will also be improved, so the film quality of the anodized film 2 is reduced, and the second surface 2A Reduced surface hardness.

因此,藉由陽極氧化皮膜2之上述交叉方向之厚度為9 μm以上且26 μm以下,該第2面2A不僅具有較高之光澤度、較高之可見光全反射率及較高之圖像清晰度,且亦具有較高之表面硬度。Therefore, since the thickness in the above-mentioned cross direction of the anodized film 2 is 9 μm or more and 26 μm or less, the second surface 2A has not only higher gloss, higher total reflectance of visible light, and higher image clarity. Degree, and also has a high surface hardness.

較佳為陽極氧化皮膜2之上述交叉方向之厚度為12 μm以上且20 μm以下。具備此種陽極氧化皮膜2之鋁積層體10不僅生產性提高,並且於第2面2A具有較高之光澤度、較高之全反射率及較高之圖像清晰度,且具有較高之耐蝕性。The thickness of the anodized film 2 in the above-mentioned crossing direction is preferably 12 μm or more and 20 μm or less. The aluminum laminate 10 provided with such an anodic oxide film 2 not only improves productivity, but also has higher gloss, higher total reflectance and higher image sharpness on the second surface 2A, and has a higher Corrosion resistance.

陽極氧化皮膜2之第2面2A之表面粗糙度Ra為20 nm以下。入射至鋁積層體10之光之一部分於陽極氧化皮膜2之第2面2A上反射,剩餘部分於第2面2A上折射後到達鋁基材1之第1面1A。於陽極氧化皮膜2之第2面2A之表面粗糙度Ra超過20 nm之情形時,於第2面2A上反射之光或於第2面2A上折射之光會發生擴散,導致第2面2A之光澤度及全反射率降低。若陽極氧化皮膜2之第2面2A之表面粗糙度Ra為20 nm以下,則可抑制於第2面2A上反射之光或於第2面2A上折射之光發生擴散,而使第2面2A具有較高之光澤度及較高之全反射率。再者,陽極氧化皮膜2之第2面2A之表面粗糙度Ra係將JIS B0601(2001年版)及ISO4287(1997年版)中所定義之算術平均粗糙度Ra以可應用於面之方式進行三維擴展所算出之值。The surface roughness Ra of the second surface 2A of the anodized film 2 is 20 nm or less. Part of the light incident on the aluminum laminate 10 is reflected on the second surface 2A of the anodized film 2, and the remaining part is refracted on the second surface 2A and reaches the first surface 1A of the aluminum substrate 1. When the surface roughness Ra of the second surface 2A of the anodized film 2 exceeds 20 nm, the light reflected on the second surface 2A or the light refracted on the second surface 2A may diffuse, resulting in the second surface 2A. Reduced gloss and total reflectance. If the surface roughness Ra of the second surface 2A of the anodized film 2 is 20 nm or less, the light reflected on the second surface 2A or the light refracted on the second surface 2A can be prevented from diffusing and the second surface can be diffused. 2A has higher gloss and higher total reflectance. In addition, the surface roughness Ra of the second surface 2A of the anodized film 2 is a three-dimensional expansion of the arithmetic average roughness Ra defined in JIS B0601 (2001 version) and ISO4287 (1997 version) so that it can be applied to surfaces. Calculated value.

陽極氧化皮膜2之第2面2A之平均凹凸間距離RSm未達30 μm。於第2面2A內相互正交之任意兩個方向上之平均凹凸間距離RSm未達30 μm。例如於經由軋製步驟製造鋁基材1之情形時,鋁基材1之軋製方向(RD方向)與同其正交之方向(TD方向)上之第2面2A之平均凹凸間距離RSm未達30 μm。於陽極氧化皮膜2之第2面2A之平均凹凸間距離RSm為30 μm以上之情形時,第2面2A之圖像清晰度降低。若陽極氧化皮膜2之第2面2A之平均凹凸間距離RSm未達30 μm,則該第2面2A具有較高之圖像清晰度。再者,平均凹凸間距離係基於JIS標準JIS B0601(2001年版)之規定。The average inter-convex distance RSm of the second surface 2A of the anodic oxide film 2 was less than 30 μm. The average inter-convex distance RSm in any two directions orthogonal to each other in the second surface 2A is less than 30 μm. For example, when the aluminum base material 1 is manufactured through a rolling step, the average roughness distance RSm of the second surface 2A in the rolling direction (RD direction) of the aluminum base material 1 and the direction orthogonal to it (TD direction) is RSm. Less than 30 μm. When the average unevenness distance RSm of the second surface 2A of the anodized film 2 is 30 μm or more, the sharpness of the image on the second surface 2A decreases. If the average inter-convex distance RSm of the second surface 2A of the anodized film 2 is less than 30 μm, the second surface 2A has a higher image definition. In addition, the average distance between irregularities is based on the JIS standard JIS B0601 (2001 edition).

為了將陽極氧化皮膜2之第2面2A之表面粗糙度Ra及平均凹凸間距離RSm設為上述數值範圍,較佳為減小鋁基材1之第1面1A之表面粗糙度Ra。如上所述,鋁基材1之第1面1A之表面粗糙度Ra較佳為15 nm以下。In order to set the surface roughness Ra and the average inter-convex distance RSm of the second surface 2A of the anodized film 2 to the above-mentioned numerical ranges, it is preferable to reduce the surface roughness Ra of the first surface 1A of the aluminum substrate 1. As described above, the surface roughness Ra of the first surface 1A of the aluminum substrate 1 is preferably 15 nm or less.

鋁基材1及陽極氧化皮膜2之上述交叉方向之厚度的合計值較佳為60 μm以上且1000 μm以下。若該合計值未達60 μm,則陽極氧化皮膜之厚度大於鋁基材之厚度。因此,鋁積層體變脆,容易產生破裂等不良情況。另一方面,若上述合計值超過1000 μm,則鋁積層體之重量增大,故而欠佳。鋁基材1及陽極氧化皮膜2之上述交叉方向之厚度的合計值更佳為100 μm以上且800 μm以下。為了獲得鋁基材1及陽極氧化皮膜2之上述交叉方向之厚度的合計值為上述數值範圍內之鋁積層體10,只要對藉由根據通常之製造方法之鑄造及軋製所獲得之鋁基材1實施陽極氧化處理即可。The total thickness of the aluminum substrate 1 and the anodic oxide film 2 in the above-mentioned crossing direction is preferably 60 μm or more and 1000 μm or less. If the total value is less than 60 μm, the thickness of the anodized film is larger than the thickness of the aluminum substrate. Therefore, the aluminum laminate becomes brittle and easily causes defects such as cracking. On the other hand, if the total value exceeds 1000 μm, the weight of the aluminum laminate is increased, which is not preferable. The total thickness of the aluminum substrate 1 and the anodic oxide film 2 in the intersecting direction is more preferably 100 μm or more and 800 μm or less. In order to obtain the total thickness of the aluminum substrate 1 and the anodized film 2 in the above-mentioned intersecting directions, the aluminum laminate 10 is within the above-mentioned numerical range, as long as the aluminum substrate obtained by casting and rolling according to a general manufacturing method is used. The material 1 may be anodized.

<鋁積層體之製造方法> 其次,對本實施形態之鋁積層體之製造方法之一例進行說明。如圖2所示,本實施形態之鋁積層體之製造方法包括如下步驟:準備鑄塊(S10);對鑄塊進行均質化處理(S20);將鑄塊進行熱軋(S30);將藉由熱軋所獲得之熱軋材進行冷軋(S40);將藉由冷軋所獲得之冷軋材進行作為最終加工之冷軋(以下稱為最終加工冷軋)而形成鋁基材(S50);及形成陽極氧化皮膜(S60)。<The manufacturing method of an aluminum laminated body> Next, an example of the manufacturing method of the aluminum laminated body of this embodiment is demonstrated. As shown in FIG. 2, the method for manufacturing an aluminum laminate according to this embodiment includes the following steps: preparing an ingot (S10); homogenizing the ingot (S20); hot rolling the ingot (S30); Cold rolling is performed from the hot-rolled material obtained by hot rolling (S40); the cold-rolled material obtained by the cold rolling is subjected to cold rolling as a final process (hereinafter referred to as final cold rolling) to form an aluminum substrate (S50) ); And forming an anodized film (S60).

首先,準備鑄塊(步驟(S10))。具體而言,製備特定組成之鋁之熔液,藉由使鋁之熔液凝固而鑄造(例如半連續鑄造)鑄塊。熔液中之Fe、Mn、Si等金屬元素之含量係以鋁基材1之上述表層中之鋁純度成為99.9質量%以上之方式控制。熔液中之Fe之含量係以鋁基材1之上述表層中之Fe之含量成為0.001質量%以上且0.052質量%以下之方式控制。熔液中之Si之含量較佳為以鋁基材1之上述表層中之Si之含量成為0.001%質量%以上且0.09質量%以下之方式控制。First, an ingot is prepared (step (S10)). Specifically, a molten aluminum having a specific composition is prepared, and the molten aluminum is solidified to cast (for example, semi-continuous casting) ingots. The content of metal elements such as Fe, Mn, and Si in the melt is controlled so that the purity of aluminum in the surface layer of the aluminum substrate 1 becomes 99.9% by mass or more. The content of Fe in the melt is controlled so that the content of Fe in the above-mentioned surface layer of the aluminum substrate 1 becomes 0.001% by mass or more and 0.052% by mass or less. The content of Si in the melt is preferably controlled so that the content of Si in the above-mentioned surface layer of the aluminum substrate 1 becomes 0.001% by mass or more and 0.09% by mass or less.

繼而,對所獲得之鑄塊進行均質化熱處理(步驟(S20))。均質化熱處理只要處於通常之操作條件之範圍內即可,例如於將加熱溫度設為400℃以上且630℃以下,將加熱時間設為1小時以上且20小時以下之條件下進行。Then, the obtained ingot is subjected to a homogenization heat treatment (step (S20)). The homogenization heat treatment may be performed within a range of normal operating conditions, and for example, the heating temperature is set to 400 ° C or higher and 630 ° C or lower, and the heating time is set to 1 hour to 20 hours.

繼而,將鑄塊進行熱軋(步驟(S30))。藉由本步驟,可獲得具有特定厚度W1之熱軋材。熱軋可進行一次或進行複數次。再者,於藉由連續鑄造製造薄板之鋁鑄塊之情形時,該薄板狀之鑄塊亦可不經由本步驟而直接冷軋。Then, the ingot is hot-rolled (step (S30)). Through this step, a hot-rolled material having a specific thickness W1 can be obtained. Hot rolling can be performed once or multiple times. Furthermore, in the case of manufacturing an aluminum ingot of a thin plate by continuous casting, the thin plate-shaped ingot may be directly cold-rolled without going through this step.

繼而,將藉由熱軋所獲得之熱軋材進行冷軋(步驟(S40))。藉由本步驟,可獲得具有特定厚度W2之冷軋材(最終加工冷軋步驟(S50)中之被軋材)。於本步驟中,冷軋例如係間隔有中間退火步驟而進行複數次。例如,首先對熱軋材實施第1冷軋步驟(S40A)而形成小於熱軋材之厚度W1且大於冷軋材之厚度W2之輥軋材。繼而,對所獲得之輥軋材實施中間退火步驟(S40B)。中間退火只要處於通常之操作條件之範圍內即可,例如於將退火溫度設為50℃以上且500℃以下,將退火時間設為1秒以上且20小時以下之條件下進行。繼而,對退火後之輥軋材實施第2冷軋步驟(S40C)而形成厚度W2之冷軋材。Next, the hot-rolled material obtained by hot rolling is cold-rolled (step (S40)). Through this step, a cold-rolled material having a specific thickness W2 (the material to be rolled in the final cold-rolling step (S50)) can be obtained. In this step, the cold rolling is performed a plurality of times, for example, by an intermediate annealing step. For example, first, the first cold rolling step (S40A) is performed on the hot-rolled material to form a rolled material that is smaller than the thickness W1 of the hot-rolled material and larger than the thickness W2 of the cold-rolled material. Then, the obtained rolled material is subjected to an intermediate annealing step (S40B). The intermediate annealing may be performed within a range of normal operating conditions. For example, the annealing is performed under conditions that the annealing temperature is 50 ° C or higher and 500 ° C or lower, and the annealing time is 1 second or longer and 20 hours or shorter. Then, a second cold rolling step (S40C) is performed on the annealed rolled material to form a cold rolled material having a thickness W2.

繼而,將冷軋材進行最終加工冷軋(步驟(S50))。於本步驟中,使用軋製輥將被軋材進行最終加工冷軋。軋製輥具有與被軋材接觸而進行軋製之輥面。較佳為隔著被軋材所配置之一對軋製輥中之至少一個軋製輥之輥面之表面粗糙度Ra為50 nm以下。若使用表面粗糙度大於50 nm之軋製輥將被軋材進行軋製,則所獲得之鋁基材之第1面之表面粗糙度Ra成為20 nm以上。本步驟中所使用之軋製輥之表面粗糙度Ra較佳為儘可能較小,更佳為40 nm以下。以此方式準備鋁基材1。Then, the cold-rolled material is subjected to final cold-processing (step (S50)). In this step, the material to be rolled is cold-rolled by final processing using rolling rolls. The rolling roll has a roll surface that is rolled in contact with the material to be rolled. It is preferable that the surface roughness Ra of the roll surface of at least one of the pair of rolling rolls disposed across the rolled material is 50 nm or less. When the material to be rolled is rolled using a roll having a surface roughness greater than 50 nm, the surface roughness Ra of the first surface of the obtained aluminum substrate becomes 20 nm or more. The surface roughness Ra of the rolling roll used in this step is preferably as small as possible, and more preferably 40 nm or less. In this way, the aluminum substrate 1 is prepared.

繼而,於所獲得之鋁基材1之第1面1A上形成陽極氧化皮膜2(步驟(S60))。本步驟(S60)可藉由通常公知之陽極氧化處理方法實施。陽極氧化處理係藉由如下方法進行:例如將選自由硫酸浴、硼酸浴、草酸浴及磷酸浴所組成之群中之至少一種作為電解液,於其中浸漬鋁基材1作為陽極,將浸漬於該電解液中之另一電極作為陰極,使該等之間通電。陽極氧化處理方法之各條件係以陽極氧化皮膜2之厚度成為9 μm以上且26 μm以下,第2面2A之表面粗糙度Ra成為20 nm以下,第2面2A之平均凹凸間距離RSm成為未達30 μm之方式適當選擇。較佳為將硫酸浴用作電解液。以此方式可獲得圖1所示之本實施形態之鋁積層體10。Then, an anodized film 2 is formed on the first surface 1A of the obtained aluminum base material 1 (step (S60)). This step (S60) can be performed by a commonly known anodizing method. The anodizing treatment is performed by, for example, using at least one selected from the group consisting of a sulfuric acid bath, a boric acid bath, an oxalic acid bath, and a phosphoric acid bath as an electrolytic solution, immersing an aluminum substrate 1 as an anode therein, and immersing it in The other electrode in the electrolyte serves as a cathode, which energizes between these. Each condition of the anodizing method is such that the thickness of the anodized film 2 is 9 μm or more and 26 μm or less, the surface roughness Ra of the second surface 2A is 20 nm or less, and the average roughness distance RSm of the second surface 2A is not changed. The method up to 30 μm is appropriately selected. A sulfuric acid bath is preferably used as the electrolytic solution. In this way, the aluminum laminate 10 according to this embodiment shown in FIG. 1 can be obtained.

<變化例> 鋁基材1之包含第1面1A之表層亦可不含Si。如上所述,Si有助於提高鋁基材1之機械強度,但於藉由厚度等其他參數而能夠確保所要求之機械強度之情形時,鋁基材1亦可不含有Si。於該情形時,鋁基材1之包含第1面1A之表層中之構成Al及Fe以外之剩餘部分之上述雜質之含量之合計只要為0.10質量%以下即可。<Modifications> The surface layer including the first surface 1A of the aluminum base material 1 may not contain Si. As described above, Si contributes to improving the mechanical strength of the aluminum substrate 1. However, when the required mechanical strength can be secured by other parameters such as thickness, the aluminum substrate 1 may not contain Si. In this case, the total content of the above-mentioned impurities constituting the remainder other than Al and Fe in the surface layer of the aluminum substrate 1 including the first surface 1A may be 0.10% by mass or less.

如圖3所示,鋁積層體11亦可進而具備以接於鋁基材1之上述第3面1B之方式所設置之第2陽極氧化皮膜3。第2陽極氧化皮膜3具有於上述交叉方向上位於遠離第3面1B之位置之第4面3B。即,鋁積層體11具備:鋁基材1、以及以夾持鋁基材1之方式所設置之陽極氧化皮膜2及第2陽極氧化皮膜3。As shown in FIG. 3, the aluminum laminate 11 may further include a second anodic oxide film 3 provided so as to be in contact with the third surface 1B of the aluminum substrate 1. The second anodized film 3 has a fourth surface 3B located at a position away from the third surface 1B in the crossing direction. That is, the aluminum laminate 11 includes an aluminum substrate 1 and an anodized film 2 and a second anodized film 3 which are provided so as to sandwich the aluminum substrate 1.

於鋁積層體11中,鋁基材1之包含第3面1B之表層係與包含第1面1A之表層同樣地,鋁純度為99.9質量%以上,包含0.001質量%以上且0.052質量%以下之鐵。此種鋁基材1可藉由與上述鋁積層體10之製造方法之上述步驟(S10)~(S50)相同之方法而準備。In the aluminum laminate 11, the surface layer including the third surface 1B of the aluminum substrate 1 is the same as the surface layer including the first surface 1A. The aluminum purity is 99.9% by mass or more, and includes 0.001% by mass or more and 0.052% by mass or less. iron. Such an aluminum base material 1 can be prepared by the same method as the above-mentioned steps (S10) to (S50) of the method for manufacturing the aluminum laminate 10 described above.

於鋁積層體11中,第2陽極氧化皮膜3係與上述陽極氧化皮膜2同樣地,上述交叉方向之厚度為9 μm以上且26 μm以下,第4面3B之表面粗糙度Ra為20 nm以下,第4面3B之平均之凸間距離RSm未達30 μm。此種第2陽極氧化皮膜3可藉由與上述鋁積層體10之製造方法之上述步驟(S60)相同之方法而形成。關於此種鋁積層體11,陽極氧化皮膜2之第2面2A及第2陽極氧化皮膜3之第4面3B具有較高之光澤度、較高之全反射率及較高之圖像清晰度。In the aluminum laminate 11, the second anodic oxide film 3 is the same as the anodic oxide film 2 described above, and the thickness in the cross direction is 9 μm or more and 26 μm or less, and the surface roughness Ra of the fourth surface 3B is 20 nm or less. The average inter-convex distance RSm of the fourth surface 3B is less than 30 μm. Such a second anodic oxide film 3 can be formed by the same method as the above-mentioned step (S60) of the method for manufacturing the aluminum laminate 10 described above. With regard to such an aluminum laminate 11, the second surface 2A of the anodized film 2 and the fourth surface 3B of the second anodized film 3 have higher gloss, higher total reflectance, and higher image clarity. .

於上述鋁積層體11中,鋁基材1之包含第3面1B之表層之組成亦可與包含第1面1A之表層之組成不同,但較佳為相同。鋁基材1例如可如披覆材料般,包含第1面1A之表層及包含第3面1B之表層之各組成、與夾持於該等間之中間層之組成不同。In the aluminum laminate 11 described above, the composition of the surface layer including the third surface 1B of the aluminum substrate 1 may be different from the composition of the surface layer including the first surface 1A, but it is preferably the same. For example, the aluminum base material 1 may have a composition including a surface layer including a first surface 1A and a surface layer including a third surface 1B like a coating material, and a composition of the intermediate layer sandwiched therebetween.

如圖4所示,於上述鋁積層體之製造方法中,亦可於上述步驟(S50)之後且上述步驟(S60)之前,實施對藉由最終加工冷軋所獲得之鋁基材進行研磨加工之步驟(S70)。於本步驟(S70)中,對於上述鋁基材中應成為第1面1A之表面進行研磨加工,而形成具有第1面1A之鋁基材1。於上述鋁積層體11之製造方法中,對於應成為第1面1A之表面及應成為第3面1B之表面進行研磨加工,而形成具有第1面1A及第3面1B之鋁基材1。研磨加工方法可自物理研磨、電解研磨及化學研磨等中選擇,但並不限定於此。較佳為於本步驟(S70)中實施物理研磨。As shown in FIG. 4, in the method for manufacturing the aluminum laminate, after the step (S50) and before the step (S60), the aluminum base material obtained by the final cold rolling can be ground. Step (S70). In this step (S70), the surface of the aluminum substrate to be the first surface 1A is polished to form the aluminum substrate 1 having the first surface 1A. In the manufacturing method of the aluminum laminate 11 described above, the surface to be the first surface 1A and the surface to be the third surface 1B are polished to form the aluminum substrate 1 having the first surface 1A and the third surface 1B. . The polishing processing method may be selected from physical polishing, electrolytic polishing, chemical polishing, and the like, but is not limited thereto. Preferably, physical polishing is performed in this step (S70).

於上述鋁積層體之製造方法中,亦可於上述步驟(S50)之後且上述步驟(S60)之前,實施將藉由最終加工冷軋所獲得之鋁基材成形為特定形狀之步驟。或亦可於上述步驟(S60)之後,實施將藉由步驟(S60)所獲得之上述鋁積層體10、11進行成型之步驟。又,亦可於上述步驟(S60)之後,實施於鋁積層體10之至少一個面上,例如於鋁基材1之第3面1B上形成皮膜之步驟。構成該皮膜之材料為選自由樹脂、金屬及陶瓷等所組成之群中之至少一種。上述皮膜例如為接著層,亦可於形成上述皮膜之步驟之後,實施經由該皮膜而使鋁積層體10、11接著於其他構件或壁等之步驟。 [實施例]In the method for manufacturing an aluminum laminate, the step of shaping the aluminum substrate obtained by the final processing cold rolling into a specific shape may be performed after the step (S50) and before the step (S60). Alternatively, after the step (S60), the step of forming the aluminum laminates 10 and 11 obtained in the step (S60) may be performed. In addition, after the step (S60), a step of forming a film on at least one surface of the aluminum laminate 10, for example, on the third surface 1B of the aluminum substrate 1 may be performed. The material constituting the film is at least one selected from the group consisting of resin, metal, ceramic, and the like. The coating film is, for example, an adhesive layer. After the step of forming the coating film, a step of bonding the aluminum laminates 10 and 11 to other members or walls through the coating film may be performed. [Example]

如下說明般製作本實施形態之實施例與比較例之反射構件之試樣,評價該等之光澤度、全反射率、圖像清晰度及耐蝕性。Samples of the reflecting members of the examples and comparative examples of this embodiment are prepared as described below, and these glossiness, total reflectance, image clarity, and corrosion resistance are evaluated.

首先,使用表1及表2所示之鋁純度及Fe之含量不同之鋁,根據以下所示之製造步驟,製作實施例及比較例之鋁基材。First, using aluminum having different aluminum purity and Fe content as shown in Tables 1 and 2, the aluminum substrates of Examples and Comparative Examples were produced according to the production steps shown below.

[表1] [Table 1]

[表2] [Table 2]

將藉由DC鑄造所獲得之鋁之鑄塊於加熱爐中進行均質化熱處理。其後,進行熱軋直至厚度成為約6.5 mm。對所獲得之熱軋材進行複數次冷軋直至厚度成為特定值。複數次冷軋係間隔有中間退火而實施,製作表1及表2所示之厚度之鋁基材。The ingot of aluminum obtained by DC casting is subjected to a homogenization heat treatment in a heating furnace. Thereafter, hot rolling was performed until the thickness became approximately 6.5 mm. The obtained hot-rolled material was cold-rolled several times until the thickness became a specific value. A plurality of cold-rolling systems were carried out with intermediate annealing at intervals, and aluminum substrates having the thicknesses shown in Tables 1 and 2 were produced.

此處,針對實施例1~10、13及比較例1~11,於最終加工冷軋中使用表面粗糙度Ra為40 nm之軋製輥進行軋製。針對實施例11、12及比較例12、13,於最終加工冷軋中使用表面粗糙度Ra為50 nm之軋製輥進行軋製。針對比較例14~21,於最終加工冷軋中使用表面粗糙度Ra為100 nm之軋製輥進行軋製。針對比較例22~25,於最終加工冷軋中使用表面粗糙度Ra為150 nm之軋製輥進行軋製。Here, for Examples 1 to 10 and 13 and Comparative Examples 1 to 11, rolling was performed using a roll having a surface roughness Ra of 40 nm in the final processing cold rolling. For Examples 11 and 12 and Comparative Examples 12 and 13, rolling was performed using a rolling roll having a surface roughness Ra of 50 nm in the final processing cold rolling. For Comparative Examples 14 to 21, rolling was performed using a roll having a surface roughness Ra of 100 nm in the final working cold rolling. For Comparative Examples 22 to 25, rolling was performed using a rolling roll having a surface roughness Ra of 150 nm in the final working cold rolling.

進而,針對實施例9、10及比較例10、11、18~21,對藉由最終加工冷軋所獲得之鋁基材之應成為第1面之面(經軋製輥軋製之面),進行電解研磨。電解研磨係藉由在包含60體積%之磷酸與20體積%硫酸之浴溫度70℃之水溶液中,將上述鋁基材於電流密度2000 A/m2 之條件下浸漬20分鐘而進行。Furthermore, for Examples 9, 10 and Comparative Examples 10, 11, 18 to 21, the surface to be the first surface of the aluminum base material obtained by the final cold rolling (the surface rolled by the roll) For electrolytic polishing. The electrolytic polishing was performed by immersing the above-mentioned aluminum substrate at a current density of 2000 A / m 2 for 20 minutes in an aqueous solution containing a bath temperature of 70 ° C. of phosphoric acid and 20 vol% of sulfuric acid.

再者,針對各試樣,於將加熱溫度設為400℃以上且630℃以下,將加熱時間設為1小時以上且20小時以下之條件下進行均質化熱處理。針對各試樣,於例如將退火溫度設為50℃以上且500℃以下,將退火時間設為1秒以上且20小時以下之條件下進行中間退火。In addition, for each sample, the homogenization heat treatment was performed under the conditions that the heating temperature was 400 ° C. to 630 ° C. and the heating time was 1 hour to 20 hours. For each sample, the intermediate annealing is performed under conditions such that the annealing temperature is 50 ° C. to 500 ° C. and the annealing time is 1 second to 20 hours.

針對所獲得之鋁基材,測定第1面之表面粗糙度Ra及平均凹凸間距離RSm。將測定結果示於表3及表4。再者,各鋁基材之第1面之表面粗糙度Ra及平均凹凸間距離RSm之測定方法係採用與下述鋁積層體之第2面之表面粗糙度Ra及平均凹凸間距離RSm之測定方法相同之方法。With respect to the obtained aluminum substrate, the surface roughness Ra and the average distance between irregularities RSm of the first surface were measured. The measurement results are shown in Tables 3 and 4. In addition, the measurement method of the surface roughness Ra and the average distance between irregularities of the first surface of each aluminum substrate is measured by measuring the surface roughness Ra and the average distance between irregularities of the second surface of the aluminum laminate described below. The same method.

[表3] [table 3]

[表4] [Table 4]

如表3所示,使用表面粗糙度Ra為50 nm以下之軋製輥進行冷軋之各實施例之鋁基材之第1面之表面粗糙度Ra為15 nm以下,平均凹凸間距離RSm未達30 μm。各比較例之鋁基材之第1面之表面粗糙度Ra如表4所示。如表4所示,使用表面粗糙度Ra為100 nm之軋製輥進行冷軋,其後實施電解研磨之比較例18~21之第1面之表面粗糙度Ra均為15 nm以下,但各第1面之平均凹凸間距離RSm為30 μm以上,尤其於相對於軋製方向垂直之方向(TD)上超過60 μm。As shown in Table 3, the surface roughness Ra of the first surface of the aluminum substrate of each example in which cold rolling was performed using a roll having a surface roughness Ra of 50 nm or less was 15 nm or less. Up to 30 μm. Table 4 shows the surface roughness Ra of the first surface of the aluminum substrate of each comparative example. As shown in Table 4, the surface roughness Ra of the first surface of Comparative Examples 18 to 21 in which cold rolling was performed using a roll having a surface roughness Ra of 100 nm and electrolytic polishing was performed was 15 nm or less. The average inter-concave-convex distance RSm of the first surface is 30 μm or more, and particularly exceeds 60 μm in a direction (TD) perpendicular to the rolling direction.

針對以如上方式所獲得之鋁基材進行陽極氧化處理。電解液係使用包含15體積%之硫酸之浴溫度21℃之水溶液。將各試樣浸漬於該電解液中作為陽極,於其與陰極之間使電流密度130 mA/m2 之電流流動特定時間,而進行陽極氧化處理。各試樣之陽極氧化處理時間係設為可獲得特定厚度之陽極氧化被覆層之時間。即,對各試樣之陽極氧化處理條件除陽極氧化處理時間以外設為相同。The aluminum substrate obtained in the above manner was subjected to anodizing treatment. The electrolytic solution was an aqueous solution containing a bath temperature of 21 ° C. containing 15% by volume of sulfuric acid. Each sample was immersed in the electrolytic solution as an anode, and a current with a current density of 130 mA / m 2 was allowed to flow between the anode and the cathode for a specific time to perform an anodizing treatment. The anodic oxidation treatment time of each sample is set to the time to obtain an anodized coating layer of a specific thickness. That is, the anodizing conditions for each sample are the same except for the anodizing time.

進而,對所有試樣以相同條件進行封孔處理。封孔處理係藉由將形成有陽極氧化皮膜之各試樣於包含濃度5 g/L之乙酸鎳與濃度5 g/L之硼酸之浴溫度90℃之水溶液中浸漬20分鐘,繼而於溫度98℃之純水中浸漬20分鐘而進行。Furthermore, the sealing treatment was performed on all samples under the same conditions. Sealing treatment is performed by immersing each sample formed with an anodized film in an aqueous solution at a bath temperature of 90 ° C. containing nickel acetate at a concentration of 5 g / L and boric acid at a concentration of 5 g / L, and then at a temperature of 98. It was immersed in pure water at 20 ° C for 20 minutes.

根據以下之評價方法,評價以此方式所製作之各試樣。 <評價方法> 所獲得之陽極氧化皮膜之厚度係使用Fischer Instruments製造之渦電流式膜厚計ISOSCOPE FMP10,利用FTA3.3H探針進行測定。又,所獲得之鋁積層體之厚度係利用Mitutoyo股份有限公司製造之數位式測微計MDC-MX IP65進行測定。Each sample produced in this manner was evaluated according to the following evaluation method. <Evaluation method> The thickness of the anodized film obtained was measured using an eddy current film thickness meter ISOSCOPE FMP10 manufactured by Fischer Instruments and measured with an FTA3.3H probe. The thickness of the obtained aluminum laminate was measured using a digital micrometer MDC-MX IP65 manufactured by Mitutoyo Co., Ltd.

利用原子力顯微鏡之表面凹凸之觀察係使用Hitachi High-Tech Science股份有限公司製造之掃描型探針顯微鏡AFM5000II,以動態力模式(Dynamic Force Mode)方式(非接觸)針對80 μm×80 μm之矩形視野下之表面形狀進行。針對所獲得之觀察結果,藉由利用最小平方近似法求出曲面並進行擬合之三次曲面自動斜率修正而修正試樣之斜率,測定表面粗糙度Ra。表面粗糙度Ra係將JIS B0601(2001年版)及ISO4287(1997年版)中所定義之算術平均粗糙度Ra以可應用於所觀察之整個表面之方式進行三維擴展所算出之值。The observation of the surface asperity using an atomic force microscope was performed using a scanning probe microscope AFM5000II manufactured by Hitachi High-Tech Science Co., Ltd., using a dynamic force mode (non-contact) for a rectangular field of view of 80 μm × 80 μm The lower surface shape is performed. With respect to the obtained observation results, the slope of the sample was corrected by calculating the slope of the sample by using the least square approximation method to obtain a curved surface and performing a cubic curved surface automatic slope correction to determine the surface roughness Ra. The surface roughness Ra is a value calculated by three-dimensionally expanding the arithmetic average roughness Ra defined in JIS B0601 (2001 version) and ISO4287 (1997 version) so as to be applicable to the entire surface being observed.

平均凹凸間距離RSm係使用東京精密股份有限公司製造之SURFCOM 1400D,測定JIS B0601(2001年版)及ISO4287(1997年版)中所定義之算術平均凹凸間距離RSm。測定類別為粗糙度測定,形狀去除為最小平方直線法,評價長度為4 mm,截止類別為2RC相位非補償,截止波長λc係於本測定中所獲得之Ra未達0.1 μm之情形時設為0.25 mm,於0.1 μm以上之情形時設為0.8 mm進行測定。測定係於軋製方向(RD)與相對於軋製方向垂直之方向(TD)兩個方向上進行測定,評價各個方向之值。The average bump-to-bump distance RSm was measured using SURFCOM 1400D manufactured by Tokyo Precision Co., Ltd., and the arithmetic mean bump-to-bump distance RSm defined in JIS B0601 (2001 version) and ISO4287 (1997 version) was measured. The measurement category is roughness measurement, the shape removal is the least square straight line method, the evaluation length is 4 mm, the cut-off category is 2RC phase non-compensation, and the cut-off wavelength λc is set when the Ra obtained in this measurement does not reach 0.1 μm. 0.25 mm is measured at 0.1 mm in the case of 0.1 μm or more. The measurement was performed in two directions of a rolling direction (RD) and a direction perpendicular to the rolling direction (TD), and the values in each direction were evaluated.

光澤度之測定係使用日本電色工業股份有限公司製造之Gloss meter VG7000,以光入射角60°測定光澤度。光澤度之測定係於軋製方向(RD)與相對於軋製方向垂直之方向(TD)兩個方向上進行測定,評價各個方向之值。光澤度越高,則越可獲得金屬光澤感。The gloss was measured using a Gloss meter VG7000 manufactured by Nippon Denshoku Industries Co., Ltd., and the gloss was measured at a light incident angle of 60 °. The gloss was measured in two directions: the rolling direction (RD) and the direction perpendicular to the rolling direction (TD), and the values in each direction were evaluated. The higher the gloss, the more metallic luster can be obtained.

全反射率之測定係使用日本分光股份有限公司製造之紫外可見分光光度計V570,以Labsphere公司製造之積分球用標準白板Spectralon作為參考,測定波長區域250 nm~2000 nm之範圍內之積分球方式下之全反射率。由所獲得之全反射率測定值,求出波長區域400 nm~800 nm之可見光之平均值。全反射率之測定係於軋製方向(RD)與相對於軋製方向垂直之方向(TD)兩個方向上進行測定,採用該等之平均值來評價全反射率。The total reflectance was measured using an ultraviolet-visible spectrophotometer V570 manufactured by JASCO Corporation, using a standard whiteboard Spectralon for integrating spheres manufactured by Labsphere as a reference, and measuring the integrating sphere method in the wavelength range of 250 nm to 2000 nm. Lower total reflectance. From the obtained total reflectance measurement values, an average value of visible light in a wavelength range of 400 nm to 800 nm was obtained. The total reflectance is measured in two directions: the rolling direction (RD) and the direction perpendicular to the rolling direction (TD). The average of these values is used to evaluate the total reflectance.

於圖像清晰度之評價中,使用RHOPOINT INSTRUMENTS製造之多合一光澤計IQ3,採用依據ASTM D5767之DOI(Distinctness of Image,圖像清晰度)值來評價圖像清晰度。測定係於軋製方向(RD)與相對於軋製方向垂直之方向(TD)兩個方向上進行測定,評價各個方向之值。In the evaluation of image sharpness, the all-in-one gloss meter IQ3 manufactured by RHOPOINT INSTRUMENTS was used, and the DOI (Distinctness of Image) value according to ASTM D5767 was used to evaluate the image sharpness. The measurement was performed in two directions of a rolling direction (RD) and a direction perpendicular to the rolling direction (TD), and the values in each direction were evaluated.

表面硬度係藉由維氏硬度進行評價。測定所獲得之各實施例及比較例之相對於陽極氧化皮膜之第2面交叉之方向(深度方向)之維氏硬度。維氏硬度係以表面之損傷難易度作為指標,使用島津製作所製造之維氏硬度計HMV-1,進行使金剛石壓頭以壓力490 mN下壓5秒後之維氏硬度測定試驗。The surface hardness was evaluated by Vickers hardness. The Vickers hardness of each of the obtained Examples and Comparative Examples with respect to the direction (depth direction) where the second surface intersected with respect to the anodized film was measured. The Vickers hardness is a Vickers hardness measurement test using a Vickers hardness tester HMV-1 manufactured by Shimadzu Corporation with a diamond indenter at a pressure of 490 mN for 5 seconds.

耐蝕性係進行CASS試驗,根據以下之內容進行評價。CASS試驗係於JIS H8681-2(1999年版)中記載之試驗條件下實施,試驗時間係以JIS H8601(1999年版)之第6.2.2節中記載之用途例作為參考,設為假定室外使用之32小時。評價係使用JIS H8681-2(1999年版)中記載之基準,如JIS H8601(1999年版)第6.3節中之記載,將額定數值9以上設為合格(表7、8中為A),將額定數值未達9設為不合格(表7、8中為F)。The corrosion resistance was evaluated by the CASS test according to the following. The CASS test is carried out under the test conditions described in JIS H8681-2 (1999 version). The test time is based on the application examples described in § 6.2.2 of JIS H8601 (1999 version). 32 hours. The evaluation is based on the standards described in JIS H8681-2 (1999 version). As described in JIS H8601 (1999 version), Section 6.3, a rating of 9 or more is considered acceptable (A in Tables 7 and 8). If the value is less than 9, it is regarded as unacceptable (F in Tables 7 and 8).

<評價結果> 將藉由上述評價方法之評價結果示於表5~表8。<Evaluation results> Table 5 to Table 8 show the evaluation results by the above evaluation method.

[表5] [table 5]

[表6] [TABLE 6]

[表7] [TABLE 7]

[表8] [TABLE 8]

實施例1~13係鋁純度為99.9質量%以上且包含0.001質量%以上且0.052質量%以下之鐵之鋁基材,厚度為9 μm以上且26 μm以下,第2面之表面粗糙度Ra為20 nm以下,第2面之RD方向及TD方向之平均凹凸間距離RSm未達30 μm。進而,實施例1~13之鋁基材及陽極氧化皮膜之厚度的合計值為60 μm以上且1000 μm以下。此種實施例1~13於RD方向及TD方向上之光澤度為63%以上,可見光全反射率為83%以上,於RD方向及TD方向上之DOI值為80以上,具有較高之光澤度、較高之全反射率及較高之圖像清晰度。進而,實施例1~13之維氏硬度為300 HV以上,於CASS試驗中合格,具有較高之耐蝕性。又,於實施例1~13中,未確認到伴隨陽極氧化被膜之厚度於9 μm以上且26 μm以下之範圍內增加,光澤度、可見光全反射率及圖像清晰度降低之傾向。Examples 1 to 13 are aluminum substrates having an aluminum purity of 99.9% by mass or more and containing 0.001% by mass or more and 0.052% by mass or less of iron. The thickness is 9 μm or more and 26 μm or less. The surface roughness Ra of the second surface is Below 20 nm, the average distance RSm between the RD direction and the TD direction on the second surface is less than 30 μm. Furthermore, the total thickness of the aluminum substrate and the anodized film of Examples 1 to 13 was 60 μm or more and 1000 μm or less. Such Examples 1 to 13 have a gloss of 63% or more in the RD direction and the TD direction, a total reflectance of visible light of 83% or more, and a DOI value of 80 or more in the RD direction and the TD direction, which has high gloss. Degree, higher total reflectance, and higher image sharpness. Furthermore, the Vickers hardness of Examples 1 to 13 is 300 HV or more, which is acceptable in the CASS test and has high corrosion resistance. Further, in Examples 1 to 13, it was not confirmed that the thickness of the anodized film increased in a range of 9 μm or more and 26 μm or less, and the gloss, total reflectance of visible light, and image sharpness tended to decrease.

相對於此,比較例1~11之最終加工冷軋之條件與實施例1~10相同,但鋁之化學組成、鋁基材之厚度、電解研磨之有無及陽極氧化皮膜之厚度之至少任一者不同。On the other hand, the conditions for final cold rolling of Comparative Examples 1 to 11 are the same as those of Examples 1 to 10, but at least any one of the chemical composition of aluminum, the thickness of the aluminum substrate, the presence or absence of electrolytic polishing, and the thickness of the anodized film Different.

鋁基材之鋁純度為99.9質量%以上、但鋁基材之Fe之含量大於0.052質量%之比較例1之光澤度未達63%,不具有較高之光澤度。認為其原因在於:比較例1之鋁基材之第1面晶出大量包含Fe之金屬間化合物,導致鋁基材之光澤度降低。Comparative example 1 in which the aluminum substrate had an aluminum purity of 99.9% by mass or more, but the Fe content of the aluminum substrate was greater than 0.052% by mass did not reach 63%, and did not have a high gloss. The reason for this is considered to be that the first surface of the aluminum substrate of Comparative Example 1 crystallized a large amount of intermetallic compounds containing Fe, resulting in a decrease in the gloss of the aluminum substrate.

鋁基材之鋁純度低於99.9質量%、且鋁基材之Fe之含量大於0.052質量%之比較例2~4之光澤度未達63%,可見光全反射率未達83%,不具有較高之光澤度及較高之全反射率。進而,陽極氧化皮膜之厚度為9 μm以上且26 μm以下之比較例4於RD方向及TD方向之DOI值為80以下,不具有較高之圖像清晰度。認為其原因在於:比較例2~4之鋁基材之第1面晶出大量包含Fe之金屬間化合物,導致鋁基材之光澤度及全反射率降低,並且陽極氧化皮膜之透明性明顯降低。進而,陽極氧化皮膜之厚度未達9 μm之比較例2及3之陽極氧化皮膜之維氏硬度為290 HV以下,於CASS試驗中不合格,不具有較高之耐蝕性。認為其原因在於:鋁基材上存在之上述晶出物導致陽極氧化皮膜之膜質變得不均勻,此外,未形成足夠厚之陽極氧化皮膜。Comparative Examples 2 to 4 in which the aluminum purity of the aluminum substrate was less than 99.9% by mass and the Fe content of the aluminum substrate was greater than 0.052% by mass did not reach 63%, and the total reflectance of visible light did not reach 83%. High gloss and high total reflectance. Further, in Comparative Example 4 in which the thickness of the anodic oxide film was 9 μm or more and 26 μm or less, the DOI values in the RD direction and the TD direction were 80 or less, which did not have high image sharpness. The reason is believed to be that the first surface of the aluminum substrates of Comparative Examples 2 to 4 crystallized a large amount of intermetallic compounds containing Fe, which caused the gloss and total reflectance of the aluminum substrate to decrease, and the transparency of the anodized film was significantly reduced. . Furthermore, the Vickers hardness of the anodic oxide films of Comparative Examples 2 and 3 of which the thickness of the anodic oxide film was less than 9 μm was 290 HV or less, which failed the CASS test and did not have high corrosion resistance. The reason is considered to be that the above-mentioned crystals on the aluminum substrate cause the film quality of the anodic oxide film to become non-uniform, and that the anodic oxide film is not sufficiently thick.

設為與實施例6~8相比僅陽極氧化皮膜之厚度不同,該厚度未達9 μm之比較例5~8之維氏硬度為290 HV以下,於CASS試驗中不合格,不具有較高之耐蝕性。進而,陽極氧化皮膜之厚度為0.5 μm以下之比較例5及6之可見光全反射率未達83%,不具有較高之可見光全反射率。認為其原因在於:入射至陽極氧化皮膜之第2面之光於鋁基材之第1面之反射光、與該入射光於第2面之反射光發生干涉。Compared with Examples 6 to 8, only the thickness of the anodized film is different, and the Vickers hardness of Comparative Examples 5 to 8 whose thickness is less than 9 μm is 290 HV or less, which failed the CASS test and did not have a high level. Corrosion resistance. Furthermore, in Comparative Examples 5 and 6 in which the thickness of the anodic oxide film was 0.5 μm or less, the total reflectance of visible light did not reach 83%, and the total reflectance of visible light was not high. The reason is considered to be that the light incident on the second surface of the anodic oxide film reflects the light on the first surface of the aluminum substrate and the reflected light of the incident light on the second surface interferes.

設為與實施例6~8相比僅陽極氧化皮膜之厚度不同,該厚度超過26 μm之比較例9之維氏硬度為290 HV以下,表面硬度較低,不具有充分高之耐蝕性(耐擦傷性)。Compared with Examples 6 to 8, only the thickness of the anodized film is different. The thickness of the comparative example 9 having a thickness exceeding 26 μm is Vickers hardness of 290 HV or less, the surface hardness is low, and it does not have sufficiently high corrosion resistance (resistant to Abrasion).

設為與實施例9、10相比僅陽極氧化皮膜之厚度不同,該厚度未達9 μm之比較例10、11之維氏硬度為290 HV以下,於CASS試驗中不合格,不具有較高之耐蝕性。Compared with Examples 9 and 10, only the thickness of the anodized film is different, and the Vickers hardness of Comparative Examples 10 and 11 whose thickness is less than 9 μm is 290 HV or less, which failed the CASS test and did not have a high Corrosion resistance.

設為與實施例11、12相比僅陽極氧化皮膜之厚度不同,該厚度未達9 μm之比較例12、13於TD方向之光澤度未達63%,可見光全反射率未達83%,不具有較高之光澤度及較高之可見光全反射率。認為其原因在於:入射至陽極氧化皮膜之第2面之光於鋁基材之第1面之反射光、與該入射光於第2面之反射光發生干涉。進而,比較例12、13之維氏硬度為290 HV以下,於CASS試驗中不合格,不具有較高之耐蝕性。Compared with Examples 11 and 12, only the thickness of the anodized film is different, and the gloss in the TD direction of Comparative Examples 12 and 13 whose thickness is less than 9 μm is less than 63%, and the total reflectance of visible light is less than 83%. Does not have high gloss and high visible light total reflectance. The reason is considered to be that the light incident on the second surface of the anodic oxide film reflects the light on the first surface of the aluminum substrate and the reflected light of the incident light on the second surface interferes. Furthermore, the Vickers hardness of Comparative Examples 12 and 13 was 290 HV or less, which failed the CASS test and did not have high corrosion resistance.

比較例14~17之陽極氧化皮膜之第2面之表面粗糙度Ra超過20 nm,第2面於RD方向及TD方向之平均凹凸間距離RSm為30 μm以上。該比較例14~17於RD方向及TD方向之光澤度未達63%,可見光全反射率未達83%,不具有較高之光澤度及較高之可見光全反射率。進而,於比較例14~17中,確認到陽極氧化皮膜之厚度越增大則TD方向之DOI值越降低之傾向。陽極氧化皮膜之厚度為7.2 μm以上之比較例15~17於TD方向之DOI值為80以下,不具有較高之圖像清晰度。The surface roughness Ra of the second surface of the anodic oxide film of Comparative Examples 14 to 17 exceeded 20 nm, and the average distance between irregularities of the second surface in the RD direction and the TD direction, RSm, was 30 μm or more. In Comparative Examples 14 to 17, the gloss in the RD direction and the TD direction did not reach 63%, and the total reflectance of visible light did not reach 83%. It did not have high gloss and high total reflectance of visible light. Furthermore, in Comparative Examples 14 to 17, it was confirmed that as the thickness of the anodic oxide film becomes larger, the DOI value in the TD direction tends to decrease. In Comparative Examples 15 to 17 in which the thickness of the anodized film was 7.2 μm or more, the DOI value in the TD direction was 80 or less, which did not have high image sharpness.

比較例18~21之陽極氧化皮膜之第2面之表面粗糙度Ra為20 nm以下,但第2面於RD方向及TD方向之平均凹凸間距離RSm為30 μm以上,尤其是第2面於TD方向之平均凹凸間距離RSm大於TD方向之平均凹凸間距離RSm,為57 μm以上。該比較例18~21於TD方向之DOI值未達80,不具有較高之圖像清晰度。進而,於比較例18~21中,確認到陽極氧化皮膜之厚度越減小則維氏硬度越降低之傾向。陽極氧化皮膜之厚度未達9 μm之比較例18、19之維氏硬度為290 HV以下,於CASS試驗中不合格,不具有較高之耐蝕性。The surface roughness Ra of the second surface of the anodic oxide film of Comparative Examples 18 to 21 is 20 nm or less, but the average distance between irregularities of the second surface in the RD direction and the TD direction is RSm is 30 μm or more, especially the second surface is at The average inter-convex distance RSm in the TD direction is larger than the average inter-convex distance RSm in the TD direction, and is 57 μm or more. In Comparative Examples 18 to 21, the DOI value in the TD direction did not reach 80, and did not have high image sharpness. Furthermore, in Comparative Examples 18 to 21, it was confirmed that the smaller the thickness of the anodic oxide film, the lower the Vickers hardness tends to be. The Vickers hardness of Comparative Examples 18 and 19 in which the thickness of the anodized film was less than 9 μm was 290 HV or less, which failed the CASS test and did not have high corrosion resistance.

比較例22~25之陽極氧化皮膜之第2面之表面粗糙度Ra超過74 nm,第2面於RD方向及TD方向之平均凹凸間距離RSm為30 μm以上。尤其是比較例22~25之第2面於TD方向之平均凹凸間距離RSm為300 μm以上。該比較例22~25於RD方向及TD方向之光澤度未達63%,可見光全反射率未達83%,TD方向之DOI值為80以下,不具有較高之光澤度及較高之可見光全反射率及較高之圖像清晰度。The surface roughness Ra of the second surface of the anodic oxide film of Comparative Examples 22 to 25 exceeded 74 nm, and the average distance between irregularities of the second surface in the RD direction and the TD direction RSm was 30 μm or more. In particular, the average inter-convex distance RSm of the second surface of Comparative Examples 22 to 25 in the TD direction was 300 μm or more. In Comparative Examples 22 to 25, the gloss in the RD direction and the TD direction did not reach 63%, the total reflectance of visible light did not reach 83%, and the DOI value in the TD direction was 80 or less. It did not have high gloss and high visible light. Total reflectivity and high image sharpness.

根據以上之結果,確認藉由本實施形態,可提供一種具有較高之光澤度、較高之全反射率及較高之圖像清晰度,並且具有較高之耐蝕性之鋁積層體。本實施形態之鋁積層體尤其適於在廚房周圍或室外等包含大量濕氣或水分之腐蝕環境下所使用之照明之反射板或建築材料用面板。Based on the above results, it was confirmed that the present embodiment can provide an aluminum laminate having higher gloss, higher total reflectance, higher image sharpness, and higher corrosion resistance. The aluminum laminate according to this embodiment is particularly suitable for a lighting reflector or a panel for building materials used in a corrosive environment containing a large amount of moisture or moisture, such as around a kitchen or outdoors.

本次所揭示之實施形態與實施例應認為是於所有方面均為例示且非限制性。本發明之範圍並非以上之實施形態與實施例,包括申請專利範圍所揭示之與申請專利範圍具有均等含義以及範圍內之所有修正及變化在內。The embodiments and examples disclosed this time should be considered as illustrative in all points and not restrictive. The scope of the present invention is not the above-mentioned implementation forms and examples, and includes all the amendments and changes within the scope which are disclosed in the scope of patent application and have the same meaning as the scope of patent application.

1‧‧‧鋁基材1‧‧‧ aluminum substrate

1A‧‧‧第1面1A‧‧‧Part 1

1B‧‧‧第3面1B‧‧‧3rd

2‧‧‧第1塗層2‧‧‧ the first coating

2A‧‧‧第2面2A‧‧‧The second side

3‧‧‧第2塗層3‧‧‧ 2nd coating

3B‧‧‧第4面3B‧‧‧Fourth side

4‧‧‧基板4‧‧‧ substrate

10‧‧‧反射構件10‧‧‧Reflecting member

11‧‧‧反射構件11‧‧‧Reflective member

圖1係表示本實施形態之反射構件之概略剖視圖。 圖2係表示本實施形態之反射構件之製造方法之流程圖。 圖3係表示本實施形態之反射構件之變化例之概略剖視圖。 圖4係表示本實施形態之反射構件之製造方法之變化例之流程圖。FIG. 1 is a schematic cross-sectional view showing a reflecting member according to this embodiment. FIG. 2 is a flowchart showing a method for manufacturing a reflecting member according to the present embodiment. FIG. 3 is a schematic cross-sectional view showing a modified example of the reflecting member of the present embodiment. FIG. 4 is a flowchart showing a modified example of the method for manufacturing a reflective member according to this embodiment.

Claims (4)

一種鋁積層體,其具備:鋁基材,其具有第1面;及 陽極氧化皮膜,其接於上述第1面而形成,且具有於與上述第1面交叉之方向上位於遠離上述第1面之位置之第2面;並且 上述鋁基材之包含上述第1面之表層含有純度99.9質量%以上之鋁、及0.001質量%以上且0.052質量%以下之鐵, 上述陽極氧化皮膜之上述第2面之表面粗糙度Ra為20 nm以下, 上述陽極氧化皮膜之上述第2面之平均凹凸間距離RSm未達30 μm, 上述陽極氧化皮膜之上述交叉方向之厚度為9 μm以上且26 μm以下。An aluminum laminate comprising: an aluminum base material having a first surface; and an anodized film formed on the first surface in contact with the first surface and located away from the first surface in a direction crossing the first surface. The second surface of the surface of the aluminum substrate; and the surface layer of the aluminum substrate including the first surface contains aluminum having a purity of 99.9% by mass or more and iron of 0.001% by mass or more and 0.052% by mass or less. The surface roughness Ra of the two surfaces is 20 nm or less, the average inter-convex distance RSm of the second surface of the anodized film is less than 30 μm, and the thickness of the anodized film in the cross direction is 9 μm to 26 μm. . 如請求項1之鋁積層體,其中上述陽極氧化皮膜為硫酸陽極氧化皮膜。The aluminum laminate according to claim 1, wherein the anodized film is a sulfuric acid anodized film. 如請求項1或2之鋁積層體,其中上述鋁基材及上述陽極氧化皮膜之上述交叉方向之厚度的合計值為60 μm以上且1000 μm以下。For example, the aluminum laminate of claim 1 or 2, wherein the total thickness of the aluminum substrate and the anodized film in the cross direction is 60 μm or more and 1000 μm or less. 一種鋁積層體之製造方法,其係製造如請求項1或2之鋁積層體之方法,包括如下步驟: 準備上述第1面之表面粗糙度Ra為15 nm以下之上述鋁基材;及 於上述鋁基材之上述第1面上,使用包含硫酸之電解液,形成上述交叉方向之厚度為9 μm以上且26 μm以下之陽極氧化皮膜。An aluminum laminated body manufacturing method, which is a method for manufacturing an aluminum laminated body as claimed in claim 1 or 2, comprising the steps of: preparing the above-mentioned aluminum substrate having a surface roughness Ra of 15 nm or less on the first surface; and On the first surface of the aluminum substrate, an anodic oxide film having a thickness of 9 μm or more and 26 μm or less in the crossing direction is formed using an electrolytic solution containing sulfuric acid.
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