TW201805623A - Method for manufacturing test strip and method for detecting the concentration of phosphoric acid applying the redox potential to retrieve a current signal of the test strip to confirm the concentration in a mixed solution - Google Patents

Method for manufacturing test strip and method for detecting the concentration of phosphoric acid applying the redox potential to retrieve a current signal of the test strip to confirm the concentration in a mixed solution Download PDF

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TW201805623A
TW201805623A TW105125149A TW105125149A TW201805623A TW 201805623 A TW201805623 A TW 201805623A TW 105125149 A TW105125149 A TW 105125149A TW 105125149 A TW105125149 A TW 105125149A TW 201805623 A TW201805623 A TW 201805623A
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phosphoric acid
concentration
layer
substrate
test strip
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TW105125149A
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TWI589868B (en
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王文志
顧秉宸
戴宇涵
林晏竹
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瑞霸生技股份有限公司
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Abstract

A method for manufacturing a test strip and a method for detecting the concentration of phosphoric acid are as follows. First, a copper electrode is formed on a first region of a substrate, a first nickel layer is formed on the copper electrode, and then using a method of electroless nickel immersion gold to form a first gold layer on the first nickel layer, finally an insulating layer is formed on a second region of the substrate, and the test strip is finally formed. Furthermore, the redox potential of phosphoric acid is obtained and the reference and comparison data of the concentration of phosphoric acid is established, a mixed solution blended with phosphoric acid is titrated to the test strip, and applying the redox potential to retrieve a current signal, followed by comparing the current signal with the reference and comparison data of the concentration of phosphoric acid to confirm the concentration of phosphoric acid in the mixed solution; therefore, based on the electrochemical method, it can quickly and accurately measure the concentration of phosphoric acid.

Description

檢測試片的製作方法及其檢測磷酸濃度的方法Method for producing test strip and method for detecting phosphoric acid concentration

本發明為有關一種檢測方法,尤指一種檢測試片的製作方法及其檢測磷酸濃度的方法。The invention relates to a detection method, in particular to a method for producing a test strip and a method for detecting the concentration of phosphoric acid.

為了製造出均勻且一致的奈米孔洞,陽極處理為一種常見的使用方法,其為將鋁金屬當作陽極,並透過電化學的蝕刻模式在鋁金屬的表面蝕刻出奈米結構,而所生成的奈米結構的均勻度與品質則跟反應過程中所使用的酸液濃度有很大的關係,因此,如何檢知磷酸的濃度即為一重要的課題。In order to produce uniform and consistent nano-holes, anodization is a common method of use. It uses aluminum alloy as the anode and etches the nano-structure on the surface of aluminum metal through an electrochemical etching mode. The uniformity and quality of the nano-structures have a great relationship with the concentration of the acid used in the reaction. Therefore, how to detect the concentration of phosphoric acid is an important issue.

目前的檢測方式有利用離子選擇電極來進行檢測,如美國專利第US 6540894號之「Phosphate ion selective electrode and manufacturing method thereof」,其為利用微溶於水的金屬鹽做為一感測膜,而可測定低濃度的磷酸根離子;此外,亦可以利用分光光度儀或液相層析質譜儀來進行檢測,分光光度儀為利用吸光度與磷酸根的濃度成正比的關係,來定量磷酸鹽,而液相層析質譜儀則是透過不同的管柱分離雜質後,再對分離後的液體利用光譜量測,透過不同的波峰訊號,對磷酸特徵波形進行濃度分析。Current detection methods include detection using an ion-selective electrode, such as "Phosphate ion selective electrode and manufacturing method thereof" in US Patent No. 6540894, which uses a metal salt that is slightly soluble in water as a sensing film, and Low concentration of phosphate ions can be measured. In addition, it can also be detected by spectrophotometer or liquid chromatography mass spectrometer. The spectrophotometer uses the proportional relationship between absorbance and phosphate concentration to quantify phosphate, and The liquid chromatography mass spectrometer is used to separate impurities through different columns, and then use spectral measurement on the separated liquid to analyze the concentration of the characteristic waveform of phosphoric acid through different peak signals.

然而,離子選擇電極與分光光度儀對磷酸並沒有量測專一性,容易受到其他酸的影響,而產生雜訊,造成濃度的誤判,而液相層析質譜儀則需要較長的處理時間,不利於產業利用,因此,如何快速且精準的量測出磷酸的濃度,實為相關業者所欲解決的問題。However, ion-selective electrodes and spectrophotometers have no measurement specificity for phosphoric acid, and are easily affected by other acids, which can generate noise and cause misjudgment of concentration. Liquid chromatography mass spectrometers require longer processing times. It is not conducive to industrial use. Therefore, how to quickly and accurately measure the concentration of phosphoric acid is a problem that related industry wants to solve.

本發明的主要目的,在於解決無法快速且精準的量測出磷酸的濃度的問題。The main purpose of the present invention is to solve the problem that the concentration of phosphoric acid cannot be measured quickly and accurately.

為達上述目的,本發明提供一種檢測試片的製作方法,包含有以下步驟: S1:於一基板之一第一區域上形成一銅電極,該銅電極包含有一工作電極、一參考電極以及一輔助電極,該工作電極包含有一第一工作端以及一遠離該第一工作端的第一讀取端; S2:形成一第一鎳層於該第一工作端遠離該基板之一側; S3:利用化鎳浸金的方式而形成一第一金層於該第一鎳層遠離該基板之一側;以及 S4:於該基板之一相鄰於該第一區域的第二區域上形成一絕緣層,該絕緣層覆蓋住該第一金層遠離該第一鎳層之一側的周圍。To achieve the above object, the present invention provides a method for manufacturing a test strip, including the following steps: S1: forming a copper electrode on a first region of a substrate, the copper electrode including a working electrode, a reference electrode, and a Auxiliary electrode, the working electrode includes a first working end and a first reading end far from the first working end; S2: forming a first nickel layer on one side of the first working end away from the substrate; S3: using Forming a first gold layer on the side of the first nickel layer away from the substrate by immersing nickel into gold; and S4: forming an insulating layer on a second region of one of the substrates adjacent to the first region The insulating layer covers the periphery of the first gold layer away from one side of the first nickel layer.

除此之外,本發明更提供一種利用檢測試片來檢測磷酸濃度的檢測方法,其包含有以下步驟: Q1:利用循環伏安法取得磷酸的一氧化還原電位,並根據不同已知濃度的磷酸水溶液建立一磷酸濃度參考比對資料; Q2:取得一未知濃度並混合有該磷酸的一混合水溶液,滴定該混合水溶液至該檢測試片上; Q3:施加該氧化還原電位至該檢測試片,以取得該混合水溶液的電流訊號;以及 Q4:比對該電流訊號與該磷酸濃度參考比對資料,以確認該磷酸於該混合水溶液中的濃度。In addition, the present invention further provides a detection method for detecting the concentration of phosphoric acid by using a test strip, which includes the following steps: Q1: Obtain the redox potential of phosphoric acid by cyclic voltammetry, and according to different known concentrations of Phosphoric acid aqueous solution establishes reference information of phosphoric acid concentration; Q2: Obtain a mixed aqueous solution of unknown concentration mixed with the phosphoric acid, titrate the mixed aqueous solution onto the test strip; Q3: apply the redox potential to the test strip, To obtain the current signal of the mixed aqueous solution; and Q4: compare the current signal with the reference concentration data of the phosphoric acid concentration to confirm the concentration of the phosphoric acid in the mixed aqueous solution.

綜上所述,本發明具有以下特點:In summary, the present invention has the following characteristics:

一、 藉由將該混合水溶液滴至該檢測試片上,再施加該氧化還原電位,而得到該電流訊號後,即可比對得知磷酸的濃度,而具有快速且精準的優點。First, by dropping the mixed aqueous solution on the test strip, and then applying the redox potential to obtain the current signal, the concentration of phosphoric acid can be compared and obtained, which has the advantage of being fast and accurate.

二、 藉由將該絕緣層覆蓋住該第一金層遠離該第一鎳層之一側的周圍,可以防止該第一鎳層、該銅電極的露出,而影響量測的精準度。2. By covering the periphery of the first gold layer away from one side of the first nickel layer with the insulating layer, it is possible to prevent the first nickel layer and the copper electrode from being exposed, thereby affecting the measurement accuracy.

三、 該檢測試片為低成本拋棄式電極,且不需要使用該昂貴的儀器,如分光光度儀或液相層析質譜儀等,而可以降低成本。3. The test strip is a low-cost disposable electrode, and does not require the use of expensive instruments, such as a spectrophotometer or a liquid chromatography mass spectrometer, which can reduce costs.

有關本發明的詳細說明及技術內容,現就配合圖式說明如下:The detailed description and technical contents of the present invention are described below with reference to the drawings:

請參閱「圖1」至「圖3F」所示,檢測試片的製作方法,為進一步清楚說明,「圖3A」至「圖3F」為利用「圖2」中之A-A剖面來進行說明,而製作方法包含有以下步驟:Please refer to "Figure 1" to "Figure 3F" for the method of making test strips. For a clearer explanation, "Figure 3A" to "Figure 3F" are explained using the AA section in "Figure 2", and The production method includes the following steps:

步驟S1:如「圖3A」所示,先於一基板10之一第一區域11上形成一銅電極20,該銅電極20包含有一工作電極21、一參考電極22以及一輔助電極23,且該工作電極21包含有一第一工作端211以及一遠離該第一工作端211的第一讀取端212。而形成該銅電極20的方法可以為利用網版印刷的方式,或是先形成一銅層於該基板10上,而後再進行蝕刻以形成該銅電極20,但不以此為限。於本實施例中,更包含有以下步驟:Step S1: As shown in FIG. 3A, a copper electrode 20 is formed on a first region 11 of a substrate 10, and the copper electrode 20 includes a working electrode 21, a reference electrode 22, and an auxiliary electrode 23, and The working electrode 21 includes a first working end 211 and a first reading end 212 far from the first working end 211. The method for forming the copper electrode 20 may be screen printing, or a copper layer may be formed on the substrate 10 and then etched to form the copper electrode 20, but not limited thereto. In this embodiment, the following steps are further included:

步驟S1A:先於該基板10的該第一區域11形成該銅電極20。Step S1A: forming the copper electrode 20 before the first region 11 of the substrate 10.

步驟S1B:如「圖3B」所示,再於該基板10的一第二區域12形成一隔離層60,並使該隔離層60接觸於該銅電極20,且該第二區域12為相鄰於該第一區域11,本實施例中,該隔離層60所形成的厚度較該銅電極20厚,但該隔離層60亦可以薄於該銅電極20。Step S1B: As shown in FIG. 3B, an isolation layer 60 is formed on a second region 12 of the substrate 10, and the isolation layer 60 contacts the copper electrode 20, and the second region 12 is adjacent In the first region 11, in this embodiment, the thickness formed by the isolation layer 60 is thicker than the copper electrode 20, but the isolation layer 60 may be thinner than the copper electrode 20.

步驟S2:如「圖3C」所示,形成一第一鎳層31於該第一工作端211遠離該基板10之一側,而形成該第一鎳層31的方式可以為化學鍍(Electroless plating)等方式。本實施例中,更包含有以下步驟:Step S2: As shown in FIG. 3C, a first nickel layer 31 is formed on one side of the first working end 211 away from the substrate 10. The method for forming the first nickel layer 31 may be electroless plating (Electroless plating). ) And so on. In this embodiment, the following steps are further included:

步驟S2A:形成該第一鎳層31於該第一工作端211遠離該基板10之一側。Step S2A: forming the first nickel layer 31 on one side of the first working end 211 away from the substrate 10.

步驟S2B:形成一第二鎳層32於該參考電極22之一第二工作端221遠離該基板10之一側,且該參考電極22還包含有一遠離該第二工作端221的第二讀取端222。Step S2B: forming a second nickel layer 32 on one side of the second working end 221 of the reference electrode 22 away from one side of the substrate 10, and the reference electrode 22 further includes a second readout far from the second working end 221端 222.

步驟S2C:形成一第三鎳層33於該輔助電極23之一第三工作端231遠離該基板10之一側。其中,該第一鎳層31、該第二鎳層32、該第三鎳層33可以為同時形成,且該輔助電極23還包含有一遠離該第三工作端231的第三讀取端232,而由於該第一讀取端212、該第二讀取端222與該第三讀取端232不須與檢測液接觸,因此可不必於其上形成鎳層。Step S2C: forming a third nickel layer 33 on one side of the third working end 231 of the auxiliary electrode 23 away from the substrate 10. Wherein, the first nickel layer 31, the second nickel layer 32, and the third nickel layer 33 may be formed at the same time, and the auxiliary electrode 23 further includes a third reading end 232 far from the third working end 231, Since the first reading end 212, the second reading end 222, and the third reading end 232 do not need to be in contact with the detection liquid, it is not necessary to form a nickel layer thereon.

步驟S3:如「圖3D」所示,利用化鎳浸金的方式而形成一第一金層41於該第一鎳層31遠離該基板10之一側,化鎳浸金為浸入低濃度的金溶液中,透過該第一鎳層31丟出電子的同時,將金沉積在該第一鎳層31之上,而可形成該第一金層41。本實施例中,更包含有以下步驟:Step S3: As shown in FIG. 3D, a first gold layer 41 is formed on the side of the first nickel layer 31 away from the substrate 10 by immersing the nickel with gold. In the gold solution, while the electrons are lost through the first nickel layer 31, gold is deposited on the first nickel layer 31 to form the first gold layer 41. In this embodiment, the following steps are further included:

步驟S3A:形成該第一金層41於該第一鎳層31遠離該基板10之一側。Step S3A: forming the first gold layer 41 on one side of the first nickel layer 31 away from the substrate 10.

步驟S3B:形成一第二金層42於該第二鎳層32端遠離該基板10之一側。Step S3B: A second gold layer 42 is formed at one end of the second nickel layer 32 away from one side of the substrate 10.

步驟S3C:形成一第三金層43於該第三鎳層33端遠離該基板10之一側。而該第一金層41、該第二金層42、該第三金層43可以同時形成。於此步驟後,更包含有以下步驟:Step S3C: A third gold layer 43 is formed at one end of the third nickel layer 33 away from one side of the substrate 10. The first gold layer 41, the second gold layer 42, and the third gold layer 43 may be formed at the same time. After this step, the following steps are included:

步驟P1:如「圖3E」所示,於該第二金層42遠離該基板10之一側形成一第二導電層72,該第二導電層72的材質可以為銀、氯化銀或其組合。該第二導電層72可以為利用網版印刷的方式來形成。Step P1: As shown in FIG. 3E, a second conductive layer 72 is formed on one side of the second gold layer 42 away from the substrate 10. The material of the second conductive layer 72 may be silver, silver chloride, or the like. combination. The second conductive layer 72 may be formed by screen printing.

步驟P2:於該第三金層43遠離該基板10之一側形成一第三導電層73,該第三導電層73的材質為碳、白金或其組合。該第三導電層73可以為利用網版印刷的方式來形成。Step P2: A third conductive layer 73 is formed on one side of the third gold layer 43 away from the substrate 10, and the material of the third conductive layer 73 is carbon, platinum, or a combination thereof. The third conductive layer 73 can be formed by screen printing.

步驟S4:如「圖3F」所示,於該基板10之一相鄰於該第一區域11的第二區域12上形成一絕緣層50,且該絕緣層50由該第二區域12往上延伸,並覆蓋住該第一金層41遠離該第一鎳層31之一側的周圍,如此一來,可以防止該第一鎳層31、該銅電極20的露出,而影響量測的精準度。本實施例中,該絕緣層50是形成於該隔離層60之上,且該絕緣層50與該隔離層60的材質可以為相同的,只要不會與其他材料產生反應皆可。但如「圖4」所示,於其他實施例中亦可以不形成該隔離層60,而直接形成該絕緣層50,使該絕緣層50與該銅電極20、該第一鎳層31以及該第一金層41的外圍接觸,並同樣覆蓋住該第一金層41遠離該第一鎳層31之一側的周圍。Step S4: As shown in FIG. 3F, an insulating layer 50 is formed on a second region 12 of one of the substrates 10 adjacent to the first region 11, and the insulating layer 50 is upward from the second region 12. It extends and covers the periphery of the first gold layer 41 away from one side of the first nickel layer 31. In this way, the first nickel layer 31 and the copper electrode 20 can be prevented from being exposed, which affects the accuracy of the measurement degree. In this embodiment, the insulation layer 50 is formed on the isolation layer 60, and the materials of the insulation layer 50 and the isolation layer 60 may be the same, as long as they do not react with other materials. However, as shown in FIG. 4, in other embodiments, the insulation layer 50 may be formed without forming the isolation layer 60, so that the insulation layer 50 and the copper electrode 20, the first nickel layer 31 and the The periphery of the first gold layer 41 is in contact with and covers the periphery of the first gold layer 41 away from one side of the first nickel layer 31.

使用時,將檢測液滴至該第一工作端211、該第二工作端221與該第三工作端231,並連接一檢測儀器(圖未示)至該第一讀取端212、該第二讀取端222與該第三讀取端232,即可進行量測。When in use, drop the detection liquid to the first working end 211, the second working end 221 and the third working end 231, and connect a detection instrument (not shown) to the first reading end 212, the first The two reading ends 222 and the third reading end 232 can perform measurement.

續搭配參閱「圖5」至「圖7」所示,為利用前述方法所製作而成的檢測試片來量測磷酸的濃度,其包含有以下步驟:Continued with reference to "Figure 5" to "Figure 7", in order to measure the concentration of phosphoric acid using the test strip made by the aforementioned method, it includes the following steps:

步驟Q1:利用循環伏安法取得磷酸的一氧化還原電位,並根據不同已知濃度的磷酸水溶液建立一磷酸濃度參考比對資料。於本實施例中,更包含有以下步驟:Step Q1: Obtain the redox potential of phosphoric acid by using cyclic voltammetry, and establish reference information of monophosphoric acid concentration according to different known concentrations of phosphoric acid aqueous solution. In this embodiment, the following steps are further included:

步驟Q1A:利用循環伏安法(cyclic voltammetry,簡稱CV)取得該磷酸的該氧化還原電位。Step Q1A: Use a cyclic voltammetry (CV) to obtain the redox potential of the phosphoric acid.

步驟Q1B:調配出不同已知濃度的該些磷酸水溶液,並利用計時安培法(chronoamperometry)施加該氧化還原電位給該些磷酸水溶液,而得到一根據該些磷酸水溶液之濃度而有不同電流變化的磷酸電流響應資料,而磷酸電流響應資料如「圖6」所示,線段A、線段B、線段C、線段D、線段E的濃度分別為0.003%wt、0.03%wt、0.15%wt、0.3%wt、0.9%wt。Step Q1B: formulate the phosphoric acid aqueous solutions of different known concentrations, and apply the redox potential to the phosphoric acid aqueous solutions using a chronoamperometry to obtain a solution having different currents according to the concentrations of the phosphoric acid aqueous solutions. Phosphoric acid current response data, and the phosphoric acid current response data is shown in "Figure 6". The concentrations of line A, line B, line C, line D, and line E are 0.003% wt, 0.03% wt, 0.15% wt, and 0.3%, respectively. wt, 0.9% wt.

步驟Q1C:根據該磷酸電流響應資料而建立該磷酸濃度參考比對資料。請搭配參閱「圖6」所示,於適當時間作為參考線,舉例來說為2.5秒,而取得不同濃度的該些磷酸水溶液的對應電流,並進一步的製作成電流對濃度的比對資料,而可形成如「圖7」所示之該磷酸濃度參考比對資料,而於其中,其線性相關係數(R2 )為0.9767,因此,具有很高的準確依據。Step Q1C: Establish the phosphoric acid concentration reference comparison data according to the phosphoric acid current response data. Please refer to "Figure 6", and use the appropriate time as a reference line, for example, 2.5 seconds, and obtain the corresponding currents of the phosphoric acid aqueous solutions with different concentrations, and further prepare current comparison data of concentration. The reference comparison data of the phosphoric acid concentration as shown in FIG. 7 can be formed, and the linear correlation coefficient (R 2 ) is 0.9767. Therefore, it has a very accurate basis.

步驟Q2:取得一混合有該磷酸的一混合水溶液,其濃度未知,並將該混合水溶液滴定至該檢測試片上。Step Q2: Obtain a mixed aqueous solution mixed with the phosphoric acid, the concentration of which is unknown, and titrate the mixed aqueous solution onto the test strip.

步驟Q3:施加該氧化還原電位至該檢測試片,以取得該混合水溶液的電流訊號,而磷酸由循環伏安法所測定出之的該氧化還原電位為0.15伏特。此外,當施加0.14伏特或0.16伏特時,其線性相關係數(R2 )分別為0.2651與0.3014,故可得知施加0.15伏特時,對檢測磷酸溶液有很好的專一性。Step Q3: Apply the redox potential to the test strip to obtain a current signal of the mixed aqueous solution, and the redox potential of phosphoric acid measured by cyclic voltammetry is 0.15 volts. In addition, when 0.14 volts or 0.16 volts are applied, the linear correlation coefficients (R 2 ) are 0.2651 and 0.3014, respectively. Therefore, it can be known that when 0.15 volts are applied, it has good specificity for detecting a phosphoric acid solution.

步驟Q4:比對該電流訊號與該磷酸濃度參考比對資料,以確認該磷酸於該混合水溶液中的濃度。並搭配參閱「圖7」所示,若該電流訊號為20 μA,則可測定出磷酸的濃度為0.22%wt。如此一來,利用此種方式可以快速且準確的測量出磷酸的濃度(結果訊號RSD=1.5%以下)。Step Q4: Compare the current signal with the reference data of the phosphoric acid concentration to confirm the concentration of the phosphoric acid in the mixed aqueous solution. And with reference to "Figure 7", if the current signal is 20 μA, the concentration of phosphoric acid can be determined to be 0.22% wt. In this way, using this method can quickly and accurately measure the concentration of phosphoric acid (result signal RSD = 1.5% or less).

綜上所述,本發明具有以下特點:In summary, the present invention has the following characteristics:

一、 藉由將該混合水溶液滴定至該檢測試片上,並施加該氧化還原電位而得到的該電流訊號,便可快速且準確的測量出磷酸的濃度。First, by titrating the mixed aqueous solution onto the test strip and applying the current signal obtained by applying the redox potential, the concentration of phosphoric acid can be measured quickly and accurately.

二、 藉由將該絕緣層覆蓋住該第一金層遠離該第一鎳層之一側的周圍,可以防止該第一鎳層、該銅電極的露出,而影響量測的精準度。2. By covering the periphery of the first gold layer away from one side of the first nickel layer with the insulating layer, it is possible to prevent the first nickel layer and the copper electrode from being exposed, thereby affecting the measurement accuracy.

三、 本檢測試片為低成本拋棄式電極,且不需要使用該昂貴的儀器,如分光光度儀或液相層析質譜儀等,而可以降低成本。3. The test strip is a low-cost disposable electrode and does not require the use of expensive instruments such as a spectrophotometer or a liquid chromatography mass spectrometer, which can reduce costs.

因此本發明極具進步性及符合申請發明專利的要件,爰依法提出申請,祈 鈞局早日賜准專利,實感德便。Therefore, the present invention is highly progressive and meets the requirements for applying for an invention patent. The application was submitted in accordance with the law.

以上已將本發明做一詳細說明,惟以上所述者,僅爲本發明的一較佳實施例而已,當不能限定本發明實施的範圍。即凡依本發明申請範圍所作的均等變化與修飾等,皆應仍屬本發明的專利涵蓋範圍內。The present invention has been described in detail above, but the above is only a preferred embodiment of the present invention, and the scope of implementation of the present invention cannot be limited. That is, all equivalent changes and modifications made in accordance with the scope of the application of the present invention should still fall within the scope of the patent of the present invention.

10‧‧‧基板
11‧‧‧第一區域
12‧‧‧第二區域
20‧‧‧銅電極
21‧‧‧工作電極
211‧‧‧第一工作端
212‧‧‧第一讀取端
22‧‧‧參考電極
221‧‧‧第二工作端
222‧‧‧第二讀取端
23‧‧‧輔助電極
231‧‧‧第三工作端
232‧‧‧第三讀取端
31‧‧‧第一鎳層
32‧‧‧第二鎳層
33‧‧‧第三鎳層
41‧‧‧第一金層
42‧‧‧第二金層
43‧‧‧第三金層
50‧‧‧絕緣層
60‧‧‧隔離層
72‧‧‧第二導電層
73‧‧‧第三導電層
S1~S4、S1A~S1C、S2A~S2C、S3A~S3C、P1、P2、Q1~Q4、Q1A~Q1C‧‧‧步驟
A~E‧‧‧線段
10‧‧‧ substrate
11‧‧‧ first zone
12‧‧‧ second zone
20‧‧‧ Copper electrode
21‧‧‧Working electrode
211‧‧‧First client
212‧‧‧first read end
22‧‧‧Reference electrode
221‧‧‧Second working end
222‧‧‧Second reading terminal
23‧‧‧Auxiliary electrode
231‧‧‧ third terminal
232‧‧‧Third reading terminal
31‧‧‧The first nickel layer
32‧‧‧second nickel layer
33‧‧‧ Third nickel layer
41‧‧‧The first gold layer
42‧‧‧Second Golden Layer
43‧‧‧ Third Golden Layer
50‧‧‧ Insulation
60‧‧‧Isolation
72‧‧‧ second conductive layer
73‧‧‧ third conductive layer
S1 ~ S4, S1A ~ S1C, S2A ~ S2C, S3A ~ S3C, P1, P2, Q1 ~ Q4, Q1A ~ Q1C‧‧‧Steps
A ~ E‧‧‧Segments

圖1,為本發明第一實施例的流程示意圖。 圖2,為本發明第一實施例的立體結構示意圖。 圖3A~3F,為本發明第一實施例的製作流程示意圖。 圖4,為本發明第二實施例的剖面示意圖。 圖5,為本發明第三實施例的流程示意圖。 圖6,為本發明第三實施例的電流響應資料數據示意圖。 圖7,為本發明第三實施例的濃度參考比對資料數據示意圖。FIG. 1 is a schematic flowchart of a first embodiment of the present invention. FIG. 2 is a schematic view of the three-dimensional structure of the first embodiment of the present invention. 3A to 3F are schematic diagrams of a manufacturing process according to the first embodiment of the present invention. FIG. 4 is a schematic cross-sectional view of a second embodiment of the present invention. FIG. 5 is a schematic flowchart of a third embodiment of the present invention. FIG. 6 is a schematic diagram of current response data according to a third embodiment of the present invention. FIG. 7 is a schematic diagram of concentration reference comparison data according to a third embodiment of the present invention.

Q1~Q4、Q1A~Q1C‧‧‧步驟 Q1 ~ Q4, Q1A ~ Q1C‧‧‧steps

Claims (8)

一種檢測試片的製作方法,包含有以下步驟: S1:於一基板之一第一區域上形成一銅電極,該銅電極包含有一工作電極、一參考電極以及一輔助電極,該工作電極包含有一第一工作端以及一遠離該第一工作端的第一讀取端; S2:形成一第一鎳層於該第一工作端遠離該基板之一側; S3:利用化鎳浸金的方式而形成一第一金層於該第一鎳層遠離該基板之一側;以及 S4:於該基板之一相鄰於該第一區域的第二區域上形成一絕緣層,該絕緣層覆蓋住該第一金層遠離該第一鎳層之一側的周圍。A method for manufacturing a test strip includes the following steps: S1: A copper electrode is formed on a first region of a substrate. The copper electrode includes a working electrode, a reference electrode, and an auxiliary electrode. The working electrode includes a working electrode. A first working end and a first reading end far from the first working end; S2: forming a first nickel layer on a side of the first working end away from the substrate; S3: formed by immersing nickel into gold A first gold layer on one side of the first nickel layer away from the substrate; and S4: forming an insulating layer on a second region of one of the substrates adjacent to the first region, the insulating layer covering the first layer A gold layer is far from the periphery of one side of the first nickel layer. 如申請專利範圍第1項所述之檢測試片的製作方法,其中於步驟S1中,更包含有以下步驟: S1A:於該基板的該第一區域形成該銅電極;以及 S1B:於該基板的一第二區域形成一隔離層,該隔離層接觸於該銅電極。The method for manufacturing a test strip as described in item 1 of the patent application scope, wherein in step S1, the method further includes the following steps: S1A: forming the copper electrode on the first region of the substrate; and S1B: on the substrate An isolation layer is formed in a second region of the substrate, and the isolation layer is in contact with the copper electrode. 如申請專利範圍第1項所述之檢測試片的製作方法,其中於步驟S2中,更包含有以下步驟: S2A:形成該第一鎳層於該第一工作端遠離該基板之一側; S2B:形成一第二鎳層於該參考電極之一第二工作端遠離該基板之一側;以及 S2C:形成一第三鎳層於該輔助電極之一第三工作端遠離該基板之一側。The method for manufacturing a test strip as described in item 1 of the scope of patent application, wherein step S2 further includes the following steps: S2A: forming the first nickel layer on a side of the first working end away from the substrate; S2B: forming a second nickel layer on one side of the reference electrode away from one side of the substrate; and S2C: forming a third nickel layer on one side of the auxiliary electrode away from one side of the substrate . 如申請專利範圍第3項所述之檢測試片的製作方法,其中於步驟S3中,更包含有以下步驟: S3A:形成該第一金層於該第一鎳層遠離該基板之一側; S3B:形成一第二金層於該第二鎳層端遠離該基板之一側;以及 S3C:形成一第三金層於該第三鎳層端遠離該基板之一側。The method for manufacturing a test strip as described in item 3 of the patent application scope, further comprising the following steps in step S3: S3A: forming the first gold layer on a side of the first nickel layer away from the substrate; S3B: forming a second gold layer on the side of the second nickel layer away from one side of the substrate; and S3C: forming a third gold layer on the side of the third nickel layer away from one side of the substrate. 如申請專利範圍第4項所述之檢測試片的製作方法,其中於步驟S3之後,更包含有以下步驟: P1:於該第二金層遠離該基板之一側形成一第二導電層,該第二導電層的材質選自於由銀及氯化銀所組成之群組;以及 P2:於該第三金層遠離該基板之一側形成一第三導電層,該第三導電層的材質選自於由碳及白金所組成之群組。The method for manufacturing a test strip as described in item 4 of the scope of patent application, further comprising the following steps after step S3: P1: forming a second conductive layer on a side of the second gold layer away from the substrate, The material of the second conductive layer is selected from the group consisting of silver and silver chloride; and P2: a third conductive layer is formed on one side of the third gold layer away from the substrate. The material is selected from the group consisting of carbon and platinum. 一種利用如申請專利範圍第1項的檢測試片來檢測磷酸濃度的方法,其包含有以下步驟: Q1:利用循環伏安法取得一磷酸的一氧化還原電位,並根據不同已知濃度的磷酸水溶液建立一磷酸濃度參考比對資料; Q2:取得一未知濃度並混合有該磷酸的一混合水溶液,滴定該混合水溶液至該檢測試片上; Q3:施加該氧化還原電位至該檢測試片,以取得該混合水溶液的電流訊號;以及 Q4:比對該電流訊號與該磷酸濃度參考比對資料,以確認該磷酸於該混合水溶液中的濃度。A method for detecting the concentration of phosphoric acid by using a test strip such as the first item in the scope of patent application, which includes the following steps: Q1: Use a cyclic voltammetry to obtain the redox potential of monophosphoric acid, and according to different known concentrations of phosphoric acid A reference solution for the concentration of phosphoric acid was established in the aqueous solution. Q2: Obtain a mixed aqueous solution of unknown concentration mixed with the phosphoric acid, and titrate the mixed aqueous solution onto the test strip; Q3: Apply the redox potential to the test strip, Obtaining the current signal of the mixed aqueous solution; and Q4: comparing the current signal with reference information of the phosphoric acid concentration to confirm the concentration of the phosphoric acid in the mixed aqueous solution. 如申請專利範圍第6項所述之檢測磷酸濃度的方法,其中於步驟Q1中,更包含有以下步驟: Q1A:取得該磷酸的該氧化還原電位; Q1B:調配出不同已知濃度的該些磷酸水溶液,並利用計時安培法施加該氧化還原電位給該些磷酸水溶液,而得到一根據該些磷酸水溶液之濃度而有不同電流變化的磷酸電流響應資料;以及 Q1C:根據該磷酸電流響應資料而建立該磷酸濃度參考比對資料。The method for detecting the concentration of phosphoric acid as described in item 6 of the scope of patent application, wherein in step Q1, the method further includes the following steps: Q1A: obtaining the redox potential of the phosphoric acid; Q1B: formulating the different known concentrations of these Phosphoric acid aqueous solution, and applying the oxidation-reduction potential to the phosphoric acid aqueous solutions by using chronoamperometry to obtain phosphoric acid current response data having different current changes according to the concentration of the phosphoric acid aqueous solutions; and Q1C: according to the phosphoric acid current response data, Establish a reference comparison of the phosphoric acid concentration. 如申請專利範圍第6項所述之檢測磷酸濃度的方法,其中於步驟Q1中,該氧化還原電位為0.15伏特。The method for detecting the concentration of phosphoric acid as described in item 6 of the patent application scope, wherein in step Q1, the redox potential is 0.15 volts.
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