TW201718904A - Metal mask material and metal mask capable of improving accuracy of the etching process and accurately detecting its own defect - Google Patents

Metal mask material and metal mask capable of improving accuracy of the etching process and accurately detecting its own defect Download PDF

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TW201718904A
TW201718904A TW105131996A TW105131996A TW201718904A TW 201718904 A TW201718904 A TW 201718904A TW 105131996 A TW105131996 A TW 105131996A TW 105131996 A TW105131996 A TW 105131996A TW 201718904 A TW201718904 A TW 201718904A
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metal mask
rolling
mask material
defect
metal
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TWI621719B (en
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Yuko Kondo
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Jx Nippon Mining & Metals Corp
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • C23C14/044Coating on selected surface areas, e.g. using masks using masks using masks to redistribute rather than totally prevent coating, e.g. producing thickness gradient
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C38/00Ferrous alloys, e.g. steel alloys
    • C22C38/10Ferrous alloys, e.g. steel alloys containing cobalt
    • C22C38/105Ferrous alloys, e.g. steel alloys containing cobalt containing Co and Ni
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/0021Reactive sputtering or evaporation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/166Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Metal Rolling (AREA)
  • Electroluminescent Light Sources (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

The present invention provides a metal mask material and a metal mask capable of improving accuracy of the etching process and accurately detecting its own defect. The present invention relates to a metal mask material which is constituted by a rolled plate of Fe-Ni based alloy, wherein the rolled plate of Fe-Ni based alloy contains 30~45 mass% of Ni and Co, 0~6 mass% of Co, balance of Fe and inevitable impurities. The thickness t of the metal mask material exceeds 0.08 mm. The arithmetic mean roughness Ra measured in accordance with JIS-B0601 in the directions parallel to the rolling and perpendicular to the rolling is 0.01~0.20[mu]m, and the 60 degree glossiness G60 measured in accordance with JIS-Z8741 in the directions parallel to the rolling and perpendicular to the rolling is 200~600.

Description

金屬遮罩材料及金屬遮罩 Metal mask material and metal mask

本發明係關於一種於有機EL顯示器之製造等中所使用之金屬遮罩材料及金屬遮罩。 The present invention relates to a metal mask material and a metal mask used in the manufacture of an organic EL display or the like.

與平板顯示器之中目前主流之液晶顯示器相比較,有機EL顯示器具有如下特徵:由於構造簡單故而可使製品更薄,動作快速之影像之顯示流暢,進而視野角較廣等。該有機EL顯示器於移動終端等小型機器中已量產化,作為下一代顯示器之主力,正推展大型顯示器中之實用化。 Compared with the current mainstream liquid crystal display among flat panel displays, the organic EL display has the following features: the structure is simple, the product can be made thinner, the display of the fast moving image is smooth, and the viewing angle is wider. The organic EL display has been mass-produced in a small-sized device such as a mobile terminal, and is being used as a main force of a next-generation display, and is being put into practical use in a large-sized display.

作為製作有機EL顯示器之EL(發光)層之方法,大致劃分而有蒸鍍法及印刷法。蒸鍍法係使於真空中經加熱、蒸發之EL物質以較薄之層之形式附著於基板之表面的方法。又,印刷法係藉由印刷於基板之表面製作EL層之方法。蒸鍍法中,進而有發出RGB(紅綠藍)之3色光之類型及使EL層發出白色光之類型。 As a method of producing an EL (light-emitting) layer of an organic EL display, a vapor deposition method and a printing method are roughly classified. The vapor deposition method is a method in which an EL material heated and evaporated in a vacuum is attached to the surface of a substrate in the form of a thin layer. Further, the printing method is a method of producing an EL layer by printing on the surface of a substrate. In the vapor deposition method, there are a type in which three colors of RGB (red, green, and blue) are emitted, and a type in which the EL layer emits white light.

於蒸鍍法中,具有為了於基板之特定位置以特定之圖案製作EL層,而於蒸鍍源與基板之間設置金屬遮罩之彩色圖案化步驟。金屬遮罩係由具有與EL層之圖案相對應之開口部的金屬製之板或箔所構成。自蒸鍍源蒸發而脫離至真空中之EL物質到達至金屬遮罩,通過金屬遮罩之開口部之EL物 質附著於基板而成為具有特定圖案之EL層。 In the vapor deposition method, there is a color patterning step of forming a EL layer in a specific pattern for a specific position of a substrate, and providing a metal mask between the vapor deposition source and the substrate. The metal mask is composed of a metal plate or foil having an opening corresponding to the pattern of the EL layer. The EL material that has evaporated from the evaporation source and is released into the vacuum reaches the metal mask, and passes through the EL of the opening of the metal mask. The material adheres to the substrate to form an EL layer having a specific pattern.

然而,於彩色圖案化步驟中,存在「因來自蒸鍍源之輻射熱,進而溫度較高之有機材料附著於金屬遮罩表面,而導致金屬遮罩之溫度上升至100℃左右為止」之情形,為了保持基板上之成形位置之精度,金屬遮罩必須使用具有與基板為相同程度以下之熱膨脹之材料。尤其,發出RGB之3色光之類型的EL層之圖案係必須針對RGB之3色逐一形成,故而抑制因金屬遮罩之膨脹所致之成形位置之偏移較為重要。 However, in the color patterning step, there is a case where the organic material having a high temperature adheres to the surface of the metal mask due to the radiant heat from the vapor deposition source, and the temperature of the metal mask rises to about 100 ° C. In order to maintain the accuracy of the forming position on the substrate, the metal mask must use a material having thermal expansion of the same level or less as the substrate. In particular, the pattern of the EL layer of the type of RGB three-color light must be formed one by one for the three colors of RGB, so that it is important to suppress the shift of the forming position due to the expansion of the metal mask.

關於金屬遮罩之厚度,於發出RGB之3色光之類型中主要使用0.02~0.08mm之箔,於使EL層發出白色光之類型中主要使用0.08~0.25mm之板。 Regarding the thickness of the metal mask, a foil of 0.02 to 0.08 mm is mainly used for the type of light emitting RGB, and a plate of 0.08 to 0.25 mm is mainly used for the type of white light emitted from the EL layer.

然而,若金屬遮罩之圖案化變得微細,則存在被遮罩之開口部夾持之遮罩部分變細而強度降低,撓曲而開口部形狀變形之虞。 However, when the pattern of the metal mask is made fine, the portion of the mask that is sandwiched by the opening of the mask is thinned, the strength is lowered, and the shape of the opening is deformed by the deflection.

因此,作為同時實現金屬遮罩之強度與開孔部之形狀精度之方法,揭示有:局部地設置補強金屬線,防止厚度較薄之金屬遮罩彎曲之技術(專利文獻1);或一面使開孔形成層變薄,一面將其與另外的支持層接合而製作1片金屬遮罩之技術(專利文獻2、3)。又,揭示有控制表面粗糙度,提高蝕刻加工精度之技術(專利文獻4)。 Therefore, as a method of simultaneously realizing the strength of the metal mask and the shape accuracy of the opening portion, there is disclosed a technique in which a reinforcing metal wire is partially provided to prevent bending of a metal mask having a small thickness (Patent Document 1); A technique in which one opening of a metal forming mask is formed by bonding the opening forming layer to another supporting layer (Patent Documents 2 and 3). Further, a technique for controlling surface roughness and improving etching processing accuracy has been disclosed (Patent Document 4).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開平10-50478號公報 [Patent Document 1] Japanese Patent Laid-Open No. Hei 10-50478

[專利文獻2]日本專利第4126648號公報 [Patent Document 2] Japanese Patent No. 4126648

[專利文獻3]日本特開2004-039628號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2004-039628

[專利文獻4]日本特開2010-214447號公報 [Patent Document 4] Japanese Patent Laid-Open Publication No. 2010-214447

然而,於專利文獻1中所揭示之技術之情形時,由於在補強金屬線之背陰處之部分未附著有機材料,故而產生與陰影效應類似之現象,形成於基板上之有機材料之形狀精度變差。又,於專利文獻2、3中所揭示之技術之情形時,為了製造1片金屬遮罩而需要2片金屬箔,進而必須將該等金屬箔精度良好地接合,故而金屬遮罩之成形步驟變得複雜,導致製造成本之上升。 However, in the case of the technique disclosed in Patent Document 1, since the organic material is not attached to the portion of the back side of the reinforcing metal wire, a phenomenon similar to the shadow effect is generated, and the shape accuracy of the organic material formed on the substrate is changed. difference. Further, in the case of the techniques disclosed in Patent Documents 2 and 3, in order to manufacture one metal mask, two metal foils are required, and it is necessary to bond the metal foils with high precision, so the metal mask forming step It becomes complicated and leads to an increase in manufacturing costs.

另一方面,於由金屬遮罩材料藉由蝕刻等方法而製造金屬遮罩之步驟中,藉由目視或CCD照相機等監視金屬遮罩材料之表面之缺陷之有無,將有缺陷之金屬遮罩材料自步驟中去除。 On the other hand, in the step of manufacturing a metal mask by a metal mask material by etching or the like, the defective metal mask is observed by visually observing the presence or absence of a defect of the surface of the metal mask material by a CCD camera or the like. The material is removed from the step.

又,於金屬遮罩之開口部以外之部位,未到達至基板上而被遮蔽之蒸鍍物質堆積,但經洗淨後作為金屬遮罩而反覆使用。關於如此般反覆使用之金屬遮罩之表面之缺陷之有無,亦藉由目視或CCD照相機等監視,將有缺陷之金屬遮罩自步驟中去除。 Further, the vapor deposition material that has not been reached on the substrate and is shielded from the portion other than the opening of the metal mask is deposited, but is washed and used as a metal mask. Regarding the presence or absence of defects in the surface of the metal mask thus used repeatedly, the defective metal mask is removed from the step by visual inspection or monitoring by a CCD camera or the like.

作為金屬遮罩之缺陷,可列舉附著於表面之異物、局部之變色及光澤不良,藉由利用CCD照相機等將表面放大拍攝所得之圖像,來檢查該等缺陷中藉由目視無法確認之微小者。缺陷中,與金屬遮罩材料色調不同之異物及局部之變色可容易地檢測出。又,相較於色調不同之異物或局部之變色,與金屬遮罩材料色調相同之異物、例如金屬片變得難以被檢 測出。進而,局部之光澤不良係輪廓不清晰,且色調與金屬遮罩材料相同,故而變得進而難以於CCD照相機圖像上識別。 Examples of the defects of the metal mask include foreign matter adhering to the surface, partial discoloration, and poor glossiness. The image obtained by magnifying the surface by a CCD camera or the like is used to check the microscopic defects that cannot be confirmed by visual observation. By. Among the defects, foreign matter and partial discoloration different from the color of the metal mask material can be easily detected. Moreover, foreign matter such as a metal sheet having the same color tone as the metal mask material becomes difficult to be inspected compared to a foreign matter having a different color tone or partial discoloration. found out. Further, the partial gloss defect is unclear, and the color tone is the same as that of the metal mask material, so that it is further difficult to recognize on the CCD camera image.

因此,若金屬遮罩材料之表面之凹凸及花樣醒目,則上述局部之光澤不良等輕微且微弱之缺陷於目視檢查中難以被檢測出,進而存在即便為CCD照相機圖像亦無法檢測出之虞,關於該方面,專利文獻4記載之技術中,藉由使表面粗糙度適度變粗,而提高蝕刻加工精度,但由於表面之凹凸,於利用CCD照相機圖像精度良好地檢測上述之局部之光澤不良之方面並不充分。 Therefore, if the unevenness and the pattern of the surface of the metal mask material are conspicuous, the slight and weak defects such as the partial gloss failure described above are difficult to be detected in the visual inspection, and there is a possibility that the image cannot be detected even if it is a CCD camera image. In this technique, in the technique described in Patent Document 4, the surface roughness is appropriately increased to improve the etching precision. However, due to the unevenness of the surface, the partial gloss is accurately detected by the CCD camera image. The aspect of badness is not sufficient.

因此,本發明之課題在於提供一種提高蝕刻加工精度,並且可精度良好地檢測自身之缺陷之金屬遮罩材料及金屬遮罩。 Therefore, an object of the present invention is to provide a metal mask material and a metal mask which can improve the accuracy of etching processing and can accurately detect defects of themselves.

本發明人們反覆銳意研究,結果發現,藉由將60度光澤度G60控制於特定之範圍內,可提高蝕刻加工精度,並且具備可精度良好地檢測自身之缺陷的適度之表面凹凸。 As a result of intensive research, the present inventors have found that by controlling the 60-degree gloss G60 within a specific range, it is possible to improve the etching processing accuracy and to provide appropriate surface unevenness capable of accurately detecting defects of itself.

即,本發明之金屬遮罩材料係由Fe-Ni系合金之軋壓板所構成,該Fe-Ni系合金之軋壓板含有合計30~45質量%之Ni與Co、0~6質量%之Co,且剩餘部分係由Fe及不可避免之雜質所構成,上述金屬遮罩材料之厚度t超過0.08mm,於軋壓平行方向及軋壓直角方向上依據JIS-B0601所測定之算術平均粗糙度Ra為0.01~0.20μm,且於軋壓平行方向及軋壓直角方向上依據JIS-Z8741所測定之60度光澤度G60為200~600。 That is, the metal mask material of the present invention is composed of a rolled plate of an Fe-Ni alloy, and the rolled plate of the Fe-Ni alloy contains a total of 30 to 45 mass% of Ni and Co, and 0 to 6 mass% of Co. And the remaining portion is composed of Fe and unavoidable impurities, and the thickness t of the metal mask material exceeds 0.08 mm, and the arithmetic mean roughness Ra measured according to JIS-B0601 in the direction parallel to the rolling and the direction perpendicular to the rolling direction It is 0.01 to 0.20 μm, and the 60-degree gloss G60 measured in accordance with JIS-Z8741 in the direction parallel to the rolling and the direction perpendicular to the rolling is 200 to 600.

又,本發明之金屬遮罩係使用上述金屬遮罩材料而成。 Further, the metal mask of the present invention is formed using the above-described metal mask material.

根據本發明,可提供一種提高蝕刻加工精度,並且可精度良好地檢測自身之缺陷之金屬遮罩材料及金屬遮罩。 According to the present invention, it is possible to provide a metal mask material and a metal mask which can improve the etching processing accuracy and can accurately detect defects of itself.

G‧‧‧晶粒 G‧‧‧ grain

RD‧‧‧軋壓方向 RD‧‧‧ rolling direction

圖1係表示精軋後之晶粒分斷所致之花樣之光學顯微鏡像的圖。 Fig. 1 is a view showing an optical microscope image of a pattern caused by grain division after finish rolling.

以下,對本發明之實施形態之金屬遮罩材料進行說明。再者,只要未特別說明,則「%」係表示「質量%」。 Hereinafter, a metal mask material according to an embodiment of the present invention will be described. In addition, unless otherwise indicated, "%" means "mass%".

(合金成分) (alloy composition)

有機EL之基板係使用玻璃,必須以設置於基板上之金屬遮罩之熱膨脹係數成為玻璃之熱膨脹係數10×10-6/℃以下之方式調整合金成分。熱膨脹係數可藉由在Fe中添加特定濃度之Ni及/或Co而調整,形成將Ni與Co設為合計30~45%、且將Co設為0~6%之Fe-Ni系合金。若Ni與Co之合計濃度及Co之濃度自該範圍偏離,則金屬遮罩之熱膨脹係數變得大於玻璃之熱膨脹係數,故而不適。較佳為將Ni與Co設為合計34~38%,且將Co設為0~6%。 In the substrate of the organic EL, glass is used, and the alloy composition must be adjusted so that the thermal expansion coefficient of the metal mask provided on the substrate is 10×10 -6 /° C. or less. The thermal expansion coefficient can be adjusted by adding a specific concentration of Ni and/or Co to Fe to form an Fe-Ni-based alloy in which Ni and Co are 30 to 45% in total and Co is set to 0 to 6%. If the total concentration of Ni and Co and the concentration of Co deviate from the range, the thermal expansion coefficient of the metal mask becomes larger than the thermal expansion coefficient of the glass, which is uncomfortable. Preferably, Ni and Co are set to be 34 to 38% in total, and Co is set to 0 to 6%.

(厚度) (thickness)

本發明之金屬遮罩材料之厚度超過0.08mm,較佳為0.08~0.25mm,更佳為0.10~0.20mm。若金屬遮罩材料之厚度為0.08mm以下,則存在如下情形:因有機材料之堆積而金屬遮罩變得容易產生應變或變形,由此形成 於基板上之有機材料之位置精度較差。若金屬遮罩材料之厚度超過0.25mm,則存在明顯產生如下之所謂陰影效應之情形:於遠離蒸鍍源之位置有機材料之入射角變淺而開孔部壁成為陰影,將有機材料之圖案形狀成形為與開孔部不同之形狀,變得難以保持形狀精度。 The thickness of the metal mask material of the present invention exceeds 0.08 mm, preferably 0.08 to 0.25 mm, more preferably 0.10 to 0.20 mm. If the thickness of the metal mask material is 0.08 mm or less, there is a case where the metal mask is easily strained or deformed due to the accumulation of the organic material, thereby forming The positional accuracy of the organic material on the substrate is poor. If the thickness of the metal mask material exceeds 0.25 mm, there is a case where a so-called shadow effect is apparently generated: the incident angle of the organic material becomes shallower at a position away from the vapor deposition source, and the wall of the opening portion becomes a shadow, and the pattern of the organic material is The shape is shaped differently from the opening portion, and it becomes difficult to maintain the shape accuracy.

(算術平均粗糙度Ra) (arithmetic mean roughness Ra)

對本發明之金屬遮罩材料之表面於軋壓平行方向及軋壓直角方向上依據JIS-B0601所測定之算術平均粗糙度Ra為0.01~0.20μm,較佳為0.01~0.08μm。若使Ra未達0.01μm而過度降低表面粗糙度,則表面平滑,故而於藉由蝕刻而由金屬遮罩材料製造金屬遮罩之流水線之材料引導輥(通箔輥、通板輥)上發生滑動而容易產生傷痕。又,若使Ra超過0.20μm而使表面粗糙度過度變粗,則輪廓不清晰,且變得難以於CCD照相機圖像上識別色調與金屬遮罩材料相同之局部之光澤不良。 The arithmetic mean roughness Ra measured in accordance with JIS-B0601 in the direction parallel to the rolling direction and the direction perpendicular to the rolling direction of the metal mask material of the present invention is 0.01 to 0.20 μm, preferably 0.01 to 0.08 μm. If Ra is less than 0.01 μm and the surface roughness is excessively lowered, the surface is smooth, so that a material guiding roller (through foil roll, through-roller) which is formed by etching a metal mask from a metal mask material is formed. Sliding is prone to scars. Further, when the Ra exceeds 0.20 μm and the surface roughness is excessively thick, the outline is unclear, and it becomes difficult to recognize the partial gloss defect of the same color tone and the metal mask material on the CCD camera image.

又,對本發明之金屬遮罩材料之表面於軋壓平行方向及軋壓直角方向上依據JIS-B0601所測定之最大高度Ry較佳為0.1~2.0μm。 Further, the maximum height Ry of the surface of the metal masking material of the present invention measured in the direction parallel to the rolling direction and the direction perpendicular to the rolling direction is preferably 0.1 to 2.0 μm in accordance with JIS-B0601.

(60度光澤度G60) (60 degree gloss G60)

於本發明之金屬遮罩材料之表面之軋壓平行方向及軋壓直角方向上依據JIS-Z8741所測定之60度光澤度G60為200~600,較佳為400~600。若金屬遮罩材料之G60未達200,則表面之凹凸及花樣醒目,輪廓不清晰,且變得難以於CCD照相機圖像上檢測色調與金屬遮罩材料相同之局部之光澤不良。若金屬遮罩材料之G60超過600,則表面變得過於平滑,故而因表面控制因素(例如軋壓輥之形狀或表面粗糙度、軋壓油之黏度、形成於軋壓輥表面與金屬遮罩材料表面之間的油膜之厚度、及軋壓前之金屬遮罩材料 之表面粗糙度)之不均之影響而G60大幅度地變化,變得難以確保表面之均勻性而容易產生外觀上之品質不良(例如條紋或不均)。 The 60-degree gloss G60 measured in accordance with JIS-Z8741 in the direction parallel to the rolling direction and the direction perpendicular to the rolling direction of the metal mask material of the present invention is 200 to 600, preferably 400 to 600. If the G60 of the metal mask material is less than 200, the unevenness and pattern of the surface are conspicuous, the outline is unclear, and it becomes difficult to detect the partial gloss defect of the same color tone and the metal mask material on the CCD camera image. If the G60 of the metal mask material exceeds 600, the surface becomes too smooth, so due to surface control factors (such as the shape or surface roughness of the roll, the viscosity of the rolled oil, the surface formed on the roll and the metal mask) The thickness of the oil film between the surfaces of the material, and the metal mask material before rolling The influence of the unevenness of the surface roughness) greatly changes the G60, and it becomes difficult to ensure uniformity of the surface, and it is easy to cause poor quality (for example, streaks or unevenness).

(金屬遮罩材料之製造方法) (Manufacturing method of metal mask material)

本發明之金屬遮罩材料例如可如以下般製造,但並非意指限定於以下所示之方法。 The metal mask material of the present invention can be produced, for example, as follows, but is not intended to be limited to the method shown below.

首先,利用熔解爐將原料熔解,獲得上述Fe-Ni系合金組成之熔液。此時,若熔液之氧濃度較高,則存在氧化物等結晶物之生成量增加而成為蝕刻不良之原因之情形,故而利用一般之脫酸方法,例如,在添加碳並藉由真空感應熔解等提高熔液之清潔度之後鑄造為錠。然後,進行熱軋、氧化層之研磨去除之後,反覆進行冷軋與退火而精加工為特定之厚度。冷軋與退火例如可依序進行中間再結晶退火、中間冷軋、最終再結晶退火、精加工冷軋、弛力退火之步驟。 First, the raw material is melted by a melting furnace to obtain a melt composed of the above Fe-Ni-based alloy. In this case, when the oxygen concentration of the melt is high, there is a case where the amount of formation of crystals such as oxide increases, which causes a problem of etching failure. Therefore, a general deacidification method is used, for example, carbon is added and vacuum induction is performed. After melting, etc., the cleanliness of the melt is increased and then cast into an ingot. Then, after hot rolling and polishing of the oxide layer, it is subjected to cold rolling and annealing to be finished to a specific thickness. Cold rolling and annealing may be carried out, for example, in the steps of intermediate recrystallization annealing, intermediate cold rolling, final recrystallization annealing, finishing cold rolling, and relaxation annealing.

(中間再結晶退火) (intermediate recrystallization annealing)

較佳為進行結晶粒度編號GSNO.(於JIS G 0551「鋼-結晶粒度之顯微鏡試驗方法」中規定之編號)成為9.0~11.0之再結晶退火。藉由增大結晶粒度編號GSNO.,可獲得於最終再結晶退火中(200)配向之金屬組織。於最終再結晶退火中(200)配向之金屬組織於精加工冷軋中難以產生晶粒之分斷花樣,而可使60度光澤度G60確實地為200以上。若結晶粒度編號GSNO.較小,即若晶粒較大,則存在無法獲得於最終再結晶退火中(200)充分配向之金屬組織之情形,故而將結晶粒度編號GSNO.之下限設為9.0。另一方面,若結晶粒度編號GSNO.過大,即若晶粒過小,則變得於未再結晶部分散地生成於再結晶組織中,成為於最終再結晶退火中產生不均勻之 再結晶組織之原因,故而將結晶粒度編號GSNO.之上限設為11.0。 It is preferable to carry out recrystallization annealing of 9.0 to 11.0 in the crystal grain size number GSNO. (the number specified in JIS G 0551 "Microscope test method for steel-crystal grain size"). The metal structure aligned in the final recrystallization annealing (200) can be obtained by increasing the crystal grain size number GSNO. In the final recrystallization annealing, the (200) aligned metal structure is difficult to produce a crystal grain breaking pattern in the finish cold rolling, and the 60 degree gloss G60 is surely 200 or more. When the crystal grain size number GSNO. is small, that is, if the crystal grain size is large, there is a case where the metal structure which is sufficiently aligned in the final recrystallization annealing (200) cannot be obtained. Therefore, the lower limit of the crystal grain size number GSNO. is 9.0. On the other hand, if the crystal grain size number GSNO. is too large, that is, if the crystal grains are too small, the unrecrystallized portion is dispersed in the recrystallized structure, resulting in unevenness in the final recrystallization annealing. The reason for recrystallizing the structure was such that the upper limit of the crystal grain size number GSNO. was set to 11.0.

此處,若提高中間再結晶退火之溫度或延長時間,則GSNO.變小,若降低溫度或縮短時間,則GSNO.變大。 Here, when the temperature or the extension time of the intermediate recrystallization annealing is increased, GSNO. becomes small, and when the temperature is lowered or the time is shortened, GSNO. becomes large.

(中間冷軋) (intermediate cold rolling)

較佳為進行將由下式所定義之加工度設為85%以上之冷軋。 It is preferable to carry out cold rolling in which the degree of work defined by the following formula is 85% or more.

加工度={(軋壓前之板厚-軋壓後之板厚)/(軋壓前之板厚)}×100(%) Processing degree = {(thickness before rolling; thickness after rolling) / (thickness before rolling)} × 100 (%)

藉由提高加工度,可獲得於最終再結晶退火中(200)配向之金屬組織,如上所述,60度光澤度G60變高。若加工度較小,則存在無法獲得於最終再結晶退火中(200)充分配向之金屬組織之情形,故而將加工度之下限設為85%。另一方面,即便加工度過高,最終再結晶退火中之(200)之配向度亦不進一步增加,又,硬度變高而生產性降低,故而將加工度之上限設為90%。 By increasing the degree of processing, a metal structure (200) aligned in the final recrystallization annealing can be obtained, and as described above, the 60 degree gloss G60 becomes high. When the degree of processing is small, there is a case where a metal structure which is sufficiently aligned in the final recrystallization annealing (200) cannot be obtained, so the lower limit of the degree of work is set to 85%. On the other hand, even if the degree of processing is too high, the degree of orientation of (200) in the final recrystallization annealing is not further increased, and the hardness is increased and the productivity is lowered. Therefore, the upper limit of the degree of processing is set to 90%.

(最終再結晶退火) (final recrystallization annealing)

若於最終再結晶退火中亦進行結晶粒度編號GSNO.成為9.0~11.0之再結晶退火,則由於與中間再結晶退火之情形相同之理由,可使60度光澤度G60確實地為200以上。 When the recrystallization annealing of the crystal grain size number GSNO. is 9.0 to 11.0 in the final recrystallization annealing, the 60-degree gloss G60 can be surely 200 or more for the same reason as in the case of the intermediate recrystallization annealing.

(精加工冷軋) (finishing cold rolling)

金屬遮罩材料之表面性狀(算術平均粗糙度Ra及60度光澤度G60)係視精加工冷軋中生成之表面凹凸而變化。於精加工冷軋中,將軋壓輥紋轉印至材料上而產生表面凹凸。又,亦藉由向精加工冷軋中之軋壓輥與材料之間流入軋壓油而生成油坑,來產生表面凹凸。即,於軋壓輥與材料之間存在油膜,於油膜局部較厚之部分,軋壓輥與材料之接觸變得不充分,未 轉印軋壓輥紋而呈坑狀之凹凸,其成為油坑。作為軋壓油局部變厚之原因,可列舉軋壓輥表面之凹凸及材料之加工性之不均。尤其,若表面變得平滑則不均之影響之敏感性提高,變得容易產生油膜之厚度之不均。 The surface properties (arithmetic mean roughness Ra and 60 degree gloss G60) of the metal mask material vary depending on the surface unevenness generated in the finish cold rolling. In the finishing cold rolling, the rolling roll is transferred onto the material to cause surface irregularities. Further, surface irregularities are generated by injecting oil into the rolling oil between the rolling rolls and the material in the finish cold rolling. That is, there is an oil film between the rolling roll and the material, and in the thick portion of the oil film, the contact between the rolling roll and the material becomes insufficient, and The transfer roll is rolled to form a pit-like irregularity, which becomes an oil sump. The reason why the rolling oil is partially thickened is the unevenness of the surface of the rolling roll and the unevenness of the workability of the material. In particular, when the surface is smooth, the sensitivity of the influence of the unevenness is increased, and the thickness of the oil film is likely to be uneven.

進而,於精加工冷軋中晶粒分斷而產生花樣,大幅度地影響60度光澤度G60。 Further, in the finish cold rolling, crystal grains are broken and a pattern is generated, which greatly affects the 60 degree gloss G60.

圖1表示精加工冷軋後之晶粒分斷所致之花樣之光學顯微鏡像。晶粒分斷之花樣沿著軋壓方向RD而斷斷續續地分佈為一行,各個花樣如圖1之箭頭所指所示般為沿著與軋壓方向RD交叉之方向延伸之條紋狀。再者,於圖1中,沿著軋壓方向RD而產生2個(2行)清晰之花樣。 Fig. 1 shows an optical microscope image of a pattern caused by grain breakage after finishing cold rolling. The pattern of the grain division is intermittently distributed in a row along the rolling direction RD, and each pattern has a stripe shape extending in a direction crossing the rolling direction RD as indicated by an arrow in FIG. Further, in Fig. 1, two (2 lines) clear patterns are generated along the rolling direction RD.

此處,圖1之符號G表示於冷軋中沿著軋壓方向RD被延伸之橢圓狀之1個晶粒。可知分斷花樣係於該晶粒G之內部產生。 Here, the symbol G in Fig. 1 indicates an elliptical one crystal grain which is extended in the rolling direction RD in cold rolling. It can be seen that the breaking pattern is generated inside the crystal grain G.

再者,於圖1中,使光學顯微鏡像之焦點對準晶粒分斷花樣,故而焦點位置與晶粒分斷花樣大不相同之油坑或軋壓輥紋之轉印等之表面凹凸未映現於圖1中。 Furthermore, in Fig. 1, the focus of the optical microscope image is aligned with the grain-dividing pattern, so that the surface unevenness of the oil pit or the rolling roller pattern, which is different in focus position from the crystal grain breaking pattern, is not The picture is shown in Figure 1.

就生產性之觀點而言,板之冷軋係以高加工度進行,故而晶粒被較長地延伸而容易分斷。該經分斷之晶粒如圖1般於表面上成為花樣而呈現,致使60度光澤度G60降低。 From the viewpoint of productivity, the cold rolling of the sheet is performed at a high degree of work, so that the crystal grains are extended long and are easily broken. The divided grains are rendered as a pattern on the surface as shown in Fig. 1, resulting in a decrease in the 60 degree gloss G60.

此處,晶粒之分斷之產生容易度受晶粒之配向之影響,視晶粒之配向而分斷容易度不同。其係由於結晶之變形能力視結晶方位而不同。而且,本發明之金屬遮罩材料之合金系之主要之繞射峰為(200)面、(220)面、(311)面及(111)面,但(200)面係晶粒最難分斷。因此,如上所述,藉由於中間再結晶退火及最終再結晶退火中於(200)面配向,而變得於精加工冷軋 中難以產生晶粒之分斷,可使60度光澤度G60為200以上。 Here, the ease of occurrence of the division of the crystal grains is affected by the alignment of the crystal grains, and the ease of separation depends on the alignment of the crystal grains. Its ability to deform due to crystallization differs depending on the crystal orientation. Moreover, the main diffraction peaks of the alloy of the metal mask material of the present invention are (200) plane, (220) plane, (311) plane and (111) plane, but the (200) plane grain is the most difficult to divide. Broken. Therefore, as described above, it becomes refined by cold rolling in the intermediate recrystallization annealing and the final recrystallization annealing in the (200) plane alignment. It is difficult to produce grain breakage, and the 60 degree gloss G60 can be made 200 or more.

較佳為將精加工冷軋之加工度設為70%以上。加工度越高,則藉由壓縮加工之效果而於精加工冷軋中所產生之晶粒之分斷花樣越是變小,60度光澤度G60越是變高。另一方面,即便加工度過高,由壓縮加工所致之使晶粒之分斷花樣微弱化之效果亦飽和,又,硬度變高而生產性降低,故而將加工度之上限設為90%。 It is preferable to set the degree of finishing cold rolling to 70% or more. The higher the degree of processing, the smaller the breaking pattern of the crystal grains generated in the finish cold rolling by the effect of the compression processing, and the higher the 60-degree gloss G60. On the other hand, even if the degree of processing is too high, the effect of weakening the pattern of the crystal grains due to the compression processing is saturated, and the hardness is increased and the productivity is lowered. Therefore, the upper limit of the degree of processing is set to 90%. .

此處,藉由使用儘量小徑之軋壓輥進行冷軋,軋壓油之捲入變少而軋壓材之表面變得平滑。即,使用小徑之軋壓輥之情況下可抑制油坑之產生,進而可減小晶粒之分斷花樣。又,與軋壓輥徑同樣地,藉由將軋壓速度設為低速,軋壓油之捲入變少而軋壓材之表面變得平滑。即,將軋壓速度設為低速之情況下可抑制油坑之產生,進而可減小晶粒分斷花樣。 Here, by cold rolling using a rolling roll having as small a diameter as possible, the rolling of the rolling oil is reduced, and the surface of the rolled material is smoothed. That is, in the case of using a small-diameter rolling roll, the generation of the oil crater can be suppressed, and the division pattern of the crystal grains can be reduced. Further, similarly to the diameter of the rolling roll, by setting the rolling speed to a low speed, the rolling of the rolling oil is reduced, and the surface of the rolled material is smoothed. That is, when the rolling speed is set to a low speed, the generation of the oil crater can be suppressed, and the crystal grain division pattern can be reduced.

再者,冷軋之軋壓輥之輥徑與軋壓速度係根據所製造之金屬遮罩材料之厚度或寬度而變化,只要於可控制Ra與G60之範圍內適當設定軋壓輥之輥徑與軋壓速度即可,亦可將軋壓速度設為60m/分鐘以下。 Furthermore, the roll diameter and the rolling speed of the cold rolling roll are varied depending on the thickness or width of the metal mask material to be produced, and the roll diameter of the roll is appropriately set within the range of controllable Ra and G60. The rolling speed may be set, and the rolling speed may be set to 60 m/min or less.

再者,油坑與晶粒分斷花樣係分別因不同之因素而產生,故而較佳為設定一面確認油坑及晶粒分斷花樣之產生狀況,一面可抑制兩者之製造條件。 Further, since the oil pit and the crystal grain breaking pattern are respectively caused by different factors, it is preferable to confirm the production condition of the oil pit and the crystal grain breaking pattern while setting the conditions, and the manufacturing conditions of both can be suppressed.

(弛力退火) (slow annealing)

進而,較佳為最後以200~400℃進行弛力退火。弛力退火之時間例如可設為1~24小時。 Further, it is preferred to carry out the relaxation annealing at 200 to 400 ° C at the end. The relaxation annealing time can be, for example, 1 to 24 hours.

【實施例】 [Examples]

以下,示出本發明之實施例,但該等係為了更好地理解本發 明而提供,並不意圖限定本發明。 Hereinafter, embodiments of the present invention are shown, but these are for better understanding of the present invention. It is intended to be illustrative, and is not intended to limit the invention.

(1)金屬遮罩材料之製造 (1) Manufacture of metal mask materials

藉由真空感應熔解將於Fe中添加有36質量%之Ni而成之原料熔化,鑄造厚度50mm之錠。將其熱軋至8mm為止,將表面之氧化膜研磨去除之後,反覆進行冷軋與退火而形成冷軋材,然後,以表1所示之條件依序進行中間再結晶退火、中間冷軋、最終再結晶退火、精加工冷軋之步驟,精加工為表1之實施例1~8、比較例1~4之製品厚度之金屬遮罩材料。進而,以300℃進行弛力退火12小時。又,製造於Fe中添加有31質量%之Ni及5質量%之Co之組成者作為實施例9。實施例9之製造步驟與其他實施例相同。 The raw material obtained by adding 36% by mass of Ni to Fe was melted by vacuum induction melting, and an ingot having a thickness of 50 mm was cast. After hot rolling to 8 mm, the oxide film on the surface was polished and removed, and then cold rolling and annealing were repeated to form a cold rolled material, and then intermediate recrystallization annealing and intermediate cold rolling were sequentially performed under the conditions shown in Table 1. The steps of final recrystallization annealing, finishing cold rolling, and finishing were the metal mask materials of the product thicknesses of Examples 1 to 8 and Comparative Examples 1 to 4 of Table 1. Further, relaxation annealing was performed at 300 ° C for 12 hours. Further, as a composition of Example 9, a composition in which 31% by mass of Ni and 5% by mass of Co were added to Fe was produced. The manufacturing steps of Example 9 were the same as in the other examples.

再者,將中間再結晶退火中之結晶粒度編號GSNO.設為10.0。又,以製品表面之算術平均粗糙度Ra成為0.07~0.08(0.065~0.084)之方式,對每個實施例調整軋壓輥之表面粗糙度。 Further, the crystal grain size number GSNO. in the intermediate recrystallization annealing was set to 10.0. Further, the surface roughness of the rolling rolls was adjusted for each of the examples so that the arithmetic mean roughness Ra of the surface of the product was 0.07 to 0.08 (0.065 to 0.084).

對於弛力退火後之各實施例及比較例之金屬遮罩材料,進行以下之評價。 The following evaluations were performed on the metal mask materials of the respective examples and comparative examples after the relaxation annealing.

(1)算術平均粗糙度Ra (1) Arithmetic mean roughness Ra

如上所述進行測定。測定係使用接觸式表面粗糙度計(小阪研究所製造之SE-3400),求出以n≧3進行測定之平均值。 The measurement was carried out as described above. For the measurement, a contact surface roughness meter (SE-3400 manufactured by Kosaka Research Institute) was used, and the average value measured by n≧3 was determined.

(2)60度光澤度G60 (2) 60 degree gloss G60

如上所述進行測定。測定係使用日本電色工業股份有限公司製造之HANDI型光澤度計PG-1,求出以n≧3進行測定之平均值。 The measurement was carried out as described above. The measurement was performed using a HANDI type gloss meter PG-1 manufactured by Nippon Denshoku Industries Co., Ltd., and the average value measured by n≧3 was obtained.

(3)表面缺陷之誤測定之有無 (3) Whether the surface defects are incorrectly measured

針對各實施例及比較例之各金屬遮罩材,故意製成5個階段之表面缺陷,利用CCD照相機測定表面缺陷。 For each of the metal mask materials of the respective examples and comparative examples, surface defects of five stages were intentionally made, and surface defects were measured by a CCD camera.

具體而言,於各金屬遮罩材之表面貼附50mm×50mm之耐酸膠帶,於其中央設置10mm×10mm之開口部而使表面局部地露出。於該露出部上塗佈下述5種濃度之蝕刻液而形成表面凹凸,製成表面缺陷。關於該露出部,與周圍相比而藉由目視可確認模糊之狀態,故而將其視為成為基準之表面缺陷。 Specifically, an acid-resistant tape of 50 mm × 50 mm was attached to the surface of each metal mask, and an opening of 10 mm × 10 mm was provided in the center thereof to partially expose the surface. The following five kinds of etching liquids were applied to the exposed portions to form surface irregularities to form surface defects. Regarding the exposed portion, the state of blurring can be confirmed by visual observation as compared with the surroundings, and this is regarded as a surface defect serving as a reference.

蝕刻液係設為將47波美之氯化鐵(III)水溶液直接使用及以水分別稀釋至2倍、4倍、8倍、16倍之合計5種,利用鑷子支持滲入有蝕刻液之脫脂棉,利用脫脂棉摩擦露出部15秒而進行蝕刻。蝕刻後,利用滲入有水之布擦拭蝕刻液並剝離耐酸膠帶,結束作業。再者,對於不將氯化鐵(III)水溶液稀釋而用於蝕刻者而言,露出部之金屬光澤完全喪失而呈白色,隨著稀釋率變高而露出部之模糊變弱。又,於稀釋率為32倍之情形時,露出部之模糊係藉由目視無法確認,故而視為未形成表面缺陷,使用稀釋率至16倍為止者。因此,於利用上述5種蝕刻液進行之蝕刻中,形成藉由目視可確認之表面缺陷,若不受金屬遮罩材料之表面凹凸之影響,則原本應由CCD作為表面缺陷而檢測出。 The etchant system is used by directly using the aqueous solution of 47 Bomei iron(III) chloride and diluting it to 2 times, 4 times, 8 times, and 16 times with water, and supporting the absorbent cotton impregnated with the etching liquid by using tweezers. Etching was performed by rubbing the exposed portion of the absorbent cotton for 15 seconds. After the etching, the etching liquid was wiped by a cloth impregnated with water, and the acid-resistant tape was peeled off to complete the work. Further, in the case where the iron chloride (III) aqueous solution is not diluted and used for etching, the metallic luster of the exposed portion is completely lost and white, and as the dilution ratio is increased, the blur of the exposed portion is weakened. Further, when the dilution ratio was 32 times, the blurring of the exposed portion was not confirmed by visual observation, and therefore, it was considered that no surface defect was formed, and the dilution ratio was 16 times. Therefore, in the etching by the above five etching liquids, surface defects which can be confirmed by visual observation are formed, and if it is not affected by the surface unevenness of the metal masking material, it is originally detected by the CCD as a surface defect.

其次,關於上述5種表面缺陷,藉由CCD照相機拍攝256灰階(±128)之像素資料。此處,將遮斷反射光之狀態設為最暗之反射並將其設定為亮度-128,將於金屬遮罩材之表面中來自常規部(露出部之周圍之部位)之反射設定為±0。而且,將控制於亮度±20之範圍之反射定義為常規部中之正常之反射,將偏離亮度±20之範圍之反射定義為表面缺陷之異常之反射,並 於露出部確認是否可檢測出該異常之反射。 Next, regarding the above five kinds of surface defects, 256 gray scale (±128) pixel data was taken by a CCD camera. Here, the state in which the reflected light is blocked is set to the darkest reflection and set to a brightness of -128, and the reflection from the regular portion (the portion around the exposed portion) in the surface of the metal mask is set to ± 0. Moreover, the reflection controlled in the range of luminance ± 20 is defined as the normal reflection in the normal portion, and the reflection in the range deviating from the luminance ± 20 is defined as the abnormal reflection of the surface defect, and It is confirmed at the exposed portion whether or not the abnormal reflection can be detected.

關於各實施例及比較例之金屬遮罩材,將上述5種表面缺陷可全部檢測出之情形判定為「無表面缺陷之誤測定」,將無法檢測出5種中之1種以上之表面缺陷之情形判定為「有表面缺陷之誤測定」。 In the case of the metal mask of each of the examples and the comparative examples, the above-mentioned five types of surface defects were all detected as "no erroneous measurement of surface defects", and one or more of the five types of surface defects could not be detected. The case was judged as "false measurement of surface defects".

根據表1明確,於Ra為0.01~0.20μm、G60為200~600之各實施例之情形時,未產生表面缺陷之誤測定。 As is clear from Table 1, in the case of each of Examples in which Ra was 0.01 to 0.20 μm and G60 was 200 to 600, no erroneous measurement of surface defects occurred.

另一方面,於精加工冷軋之加工度未達70%之比較例1、及精加工冷軋之軋壓速度超過60m/分鐘之比較例2之情形時,G60未達200,產生表面缺陷之誤測定。 On the other hand, in the case of Comparative Example 1 in which the degree of processing of finishing cold rolling is less than 70%, and the case of Comparative Example 2 in which the rolling speed of finishing cold rolling exceeds 60 m/min, the G60 is less than 200, and surface defects are generated. Mistaken determination.

於以最終再結晶退火之結晶粒徑(GSNo.)未達9.0之條件進行最終再結晶退火之比較例3之情形時、及使中間冷軋之加工度未達85%之比較例4之情形時,G60亦未達200,產生表面缺陷之誤測定。 In the case of Comparative Example 3 in which the final recrystallization annealing was carried out under the condition that the crystal grain size (GSNo.) of the final recrystallization annealing was less than 9.0, and the case of Comparative Example 4 in which the degree of processing of the intermediate cold rolling was less than 85%. At the same time, the G60 did not reach 200, causing an erroneous measurement of surface defects.

G‧‧‧晶粒 G‧‧‧ grain

RD‧‧‧軋壓方向 RD‧‧‧ rolling direction

Claims (2)

一種金屬遮罩材料,其係由Fe-Ni系合金之軋壓板所構成,該Fe-Ni系合金之軋壓板含有合計30~45質量%之Ni與Co、0~6質量%之Co,且剩餘部分係由Fe及不可避免之雜質所構成;該金屬遮罩材料其厚度t超過0.08mm,於軋壓平行方向及軋壓直角方向上依據JIS-B0601所測定之算術平均粗糙度Ra為0.01~0.20μm,且於軋壓平行方向及軋壓直角方向上依據JIS-Z8741所測定之60度光澤度G60為200~600。 A metal mask material comprising a rolled plate of an Fe-Ni alloy, the rolled plate of the Fe-Ni alloy containing a total of 30 to 45 mass% of Ni and Co, and 0 to 6 mass% of Co, and The remaining portion is composed of Fe and unavoidable impurities; the thickness of the metal mask material exceeds 0.08 mm, and the arithmetic mean roughness Ra measured according to JIS-B0601 in the direction parallel to the rolling direction and the direction perpendicular to the rolling direction is 0.01. ~0.20 μm, and the 60-degree gloss G60 measured according to JIS-Z8741 in the direction parallel to the rolling and the direction perpendicular to the rolling is 200 to 600. 一種金屬遮罩,其使用有申請專利範圍第1項之金屬遮罩材料。 A metal mask using the metal mask material of claim 1 of the patent application.
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