TW201715659A - Electronic components module, integrated circuit encapsulated component and lead frame for the same - Google Patents
Electronic components module, integrated circuit encapsulated component and lead frame for the same Download PDFInfo
- Publication number
- TW201715659A TW201715659A TW104134613A TW104134613A TW201715659A TW 201715659 A TW201715659 A TW 201715659A TW 104134613 A TW104134613 A TW 104134613A TW 104134613 A TW104134613 A TW 104134613A TW 201715659 A TW201715659 A TW 201715659A
- Authority
- TW
- Taiwan
- Prior art keywords
- wafer holder
- integrated circuit
- circuit package
- pad
- groove
- Prior art date
Links
Abstract
Description
本發明為一種電子元件模組、積體電路封裝元件及其導線架,尤其與導線架之技術領域相關。The invention relates to an electronic component module, an integrated circuit package component and a lead frame thereof, in particular to the technical field of the lead frame.
請參閱圖10及圖11所示,現有技術之積體電路封裝元件40具有設於封裝體41底面之晶片承座42及接腳接墊43,接腳接墊43設於晶片承座42之四周,接腳接墊43與晶片承座42之底面位於同一平面上。Referring to FIG. 10 and FIG. 11 , the integrated circuit package component 40 of the prior art has a wafer holder 42 and a pin pad 43 disposed on the bottom surface of the package body 41 . The pin pad 43 is disposed on the wafer holder 42 . Around the circumference, the pin pads 43 are on the same plane as the bottom surface of the wafer holder 42.
請參閱圖12及圖13所示,現有技術之積體電路封裝元件40係透過焊錫50與電路板60相固定且形成電連接,然而,就現有技術的結構而言,焊錫過程中將容易產生以下問題: 1. 如圖12所示,焊錫製程中若錫膏分佈不均勻,則容易導致兩邊高度不一致,形成所謂「翹翹板效應」,而使得兩側接腳接墊43與焊錫50接觸的面積不均勻,故使得積體電路封裝元件40與電路板60之間的連接效果不佳。 2. 如圖13所示,由於錫膏中的助焊劑容易揮發而產生氣泡51,因氣泡51具有一定體積,故會佔據固定空間,而使得積體電路封裝元件40產生氣泡51之一側相對於電路板60的高度會墊高,進而產生前述「翹翹板效應」。Referring to FIG. 12 and FIG. 13, the prior art integrated circuit package component 40 is fixed to the circuit board 60 through the solder 50 and is electrically connected. However, in the prior art structure, the soldering process is likely to occur. The following problems: 1. As shown in Fig. 12, if the solder paste is unevenly distributed in the soldering process, the heights of the two sides are inconsistent, forming a so-called "warp board effect", and the two-side pad pads 43 are in contact with the solder 50. The area is not uniform, so that the connection between the integrated circuit package component 40 and the circuit board 60 is not good. 2. As shown in FIG. 13, since the flux in the solder paste is easily volatilized to generate the bubble 51, since the bubble 51 has a certain volume, it occupies a fixed space, so that the integrated circuit package member 40 generates one side of the bubble 51. The height of the circuit board 60 is raised, and the aforementioned "warp board effect" is generated.
有鑑於此,本發明係針對積體電路封裝元件於結合電路板時,所產生之氣泡及焊錫分佈不均的問題加以改進。In view of the above, the present invention is directed to the problem of uneven distribution of bubbles and solder generated when integrated circuit package components are bonded to a circuit board.
為達到上述之發明目的,本發明係創作一種積體電路封裝元件之導線架,其具有一晶片承座及複數個接腳接墊,所述接腳接墊呈間隔設置並排列於該晶片承座之至少兩相對周緣,該晶片承座之底面設有一凹槽。In order to achieve the above object, the present invention is to create a lead frame for an integrated circuit package component, which has a wafer holder and a plurality of pin pads, and the pin pads are spaced apart and arranged on the wafer carrier. At least two opposite edges of the seat, a recess is formed on the bottom surface of the wafer holder.
進一步而言,本發明係創作一種積體電路封裝元件,係包括: 一封裝體; 一晶片承座,係設於該封裝體之底面中,該晶片承座之底面設有至少一凹槽; 複數個接腳接墊,係設於該封裝體之底面的至少二相對周緣,且呈間隔設置,各接腳接墊之底面露出於該封裝體外。Further, the present invention is an integrated circuit package component, comprising: a package; a wafer holder disposed in a bottom surface of the package, the bottom surface of the wafer holder is provided with at least one groove; The plurality of pin pads are disposed on at least two opposite peripheral edges of the bottom surface of the package, and are disposed at intervals, and a bottom surface of each of the pin pads is exposed outside the package.
再進一步而言,本發明係創作一種電子元件模組,係包括: 一電路板,其一表面上具有至少一焊墊組,各焊墊組包含有一中心焊墊及複數個接腳焊墊,所述接腳焊墊呈間隔設置並排列於該中心焊墊之至少兩相對周緣; 至少一前述之積體電路封裝單元,其設於該電路板上,且各積體電路封裝元件對應於其中一焊墊組,該晶片承座對應於該焊墊組之中心焊墊,各接腳接墊對應於該焊墊組之其中一接腳焊墊,該晶片承座設於該封裝體之底面中,相對應的接腳接墊與接腳焊墊之間塗佈有第一焊錫,相對應的晶片承座與中心焊墊之間塗佈有第二焊錫,所述第二焊錫容置於該晶片承座之凹槽中。Still further, the present invention is directed to an electronic component module comprising: a circuit board having at least one pad group on a surface thereof, each pad group including a center pad and a plurality of pin pads; The pin pads are spaced apart and arranged on at least two opposite edges of the center pad; at least one of the foregoing integrated circuit package units is disposed on the circuit board, and each integrated circuit package component corresponds to the middle a pad set corresponding to a center pad of the pad set, each pin pad corresponding to one of the pad pads of the pad set, the wafer holder being disposed on a bottom surface of the package body a first solder is applied between the corresponding pin pad and the pin pad, and a second solder is coated between the corresponding wafer socket and the center pad, and the second solder is placed The wafer holder is in the recess.
本發明的優點在於,藉由晶片承座底面之凹槽的設置,則在焊錫製程中,凹槽提供了額外的空間來容納錫膏,故積體電路封裝單元與電路板之結合面之間,係以均為平面的接腳焊墊與接腳接墊之間來構成焊錫時的承力點,則可有效平均晶片承座周圍的承力以維持兩側高度相同,而能維持接腳接墊與焊錫間的接觸面積,以避免連接效果不佳。再者,晶片承座底面之凹槽提供了氣泡容納的空間,故焊錫製程中所產生的氣泡將不影響整體焊錫的高度,進而使得整體焊錫高度均勻。The invention has the advantages that, by the arrangement of the grooves on the bottom surface of the wafer holder, in the soldering process, the groove provides additional space for accommodating the solder paste, so that between the integrated circuit package unit and the board The bearing point between the solder pads and the pin pads is used to form the bearing point of the solder, so that the bearing force around the wafer socket can be effectively averaged to maintain the same height on both sides, and the pins can be maintained. The contact area between the pads and the solder to avoid poor connection. Moreover, the groove on the bottom surface of the wafer holder provides a space for the bubble to be accommodated, so that the bubble generated in the soldering process will not affect the height of the overall solder, thereby making the overall solder height uniform.
以下配合圖式及本發明之實施例,進一步闡述本發明為達成預定發明目的所採取的技術手段。The technical means adopted by the present invention for achieving the intended purpose of the invention are further explained below in conjunction with the drawings and the embodiments of the present invention.
請參閱圖1及圖2所示,本發明之積體電路封裝元件10係由導線架上設置晶片並封裝後所構成,積體電路封裝元件10包含有一封裝體11、一晶片承座12及複數個接腳接墊13。Referring to FIG. 1 and FIG. 2, the integrated circuit package component 10 of the present invention is formed by arranging a wafer on a lead frame and packaged. The integrated circuit package component 10 includes a package body 11, a wafer holder 12, and A plurality of pin pads 13 are provided.
前述之晶片承座12設於該封裝體11之底面,該晶片承座12之底面露出於該封裝體11外,且該晶片承座12之底面設有至少一凹槽121。在所屬技術領域中,常見之導線架的厚度為150µm至250µm,凹槽121之深度不大於導線架之厚度,意即凹槽121之深度小於150µm,凹槽121之深度將與錫膏量有關,在一實施例中,凹槽121之深度為20µm至150µm,在另一實施例中,凹槽121之深度為20µm至50µm。The wafer holder 12 is disposed on the bottom surface of the package body 11. The bottom surface of the wafer holder 12 is exposed outside the package body 11. The bottom surface of the wafer holder 12 is provided with at least one recess 121. In the technical field, the thickness of the common lead frame is 150 μm to 250 μm, and the depth of the groove 121 is not greater than the thickness of the lead frame, that is, the depth of the groove 121 is less than 150 μm, and the depth of the groove 121 will be related to the amount of solder paste. In one embodiment, the depth of the groove 121 is 20 μm to 150 μm, and in another embodiment, the depth of the groove 121 is 20 μm to 50 μm.
該晶片承座12可具有單一凹槽121(如圖1所示),或如圖3至5所示具有複數個凹槽121,所述複數個凹槽121可呈對稱排列或矩陣排列。於圖3所示之實施例中,凹槽121呈2*2矩陣排列;於圖4所示之實施例中,凹槽121呈3*3矩陣排列;於圖5所示之實施例中,凹槽121呈3*2矩陣排列。前述之凹槽121排列方式僅為例示,並非用以限制本發明之保護範圍。The wafer holder 12 can have a single recess 121 (shown in FIG. 1) or a plurality of recesses 121 as shown in FIGS. 3 through 5, and the plurality of recesses 121 can be arranged in a symmetrical or matrix arrangement. In the embodiment shown in FIG. 3, the grooves 121 are arranged in a 2*2 matrix; in the embodiment shown in FIG. 4, the grooves 121 are arranged in a 3*3 matrix; in the embodiment shown in FIG. The grooves 121 are arranged in a 3*2 matrix. The foregoing arrangement of the grooves 121 is merely exemplary and is not intended to limit the scope of the present invention.
前述之接腳接墊13設於該封裝體11之底面的周緣處,所述接腳接墊13呈間隔設置並排列於該晶片承座12之周緣,在一實施例中(如圖1所示),接腳接墊13設於該封裝體11之四邊周緣;在另一實施例中(如圖6所示),接腳接墊13設於該封裝體11之二相對側周緣。The pin pads 13 are disposed at the periphery of the bottom surface of the package body 11. The pin pads 13 are spaced apart and arranged on the periphery of the wafer holder 12, in an embodiment (as shown in FIG. 1). The pin pads 13 are disposed on the periphery of the four sides of the package body 11; in another embodiment (as shown in FIG. 6), the pin pads 13 are disposed on opposite sides of the package body 11.
請參閱圖7所示,本發明之電子元件模組包含有至少一前述之積體電路封裝元件10及一電路板20,該積體電路封裝元件10設於該電路板20之頂面上。Referring to FIG. 7 , the electronic component module of the present invention comprises at least one of the foregoing integrated circuit package components 10 and a circuit board 20 , and the integrated circuit package component 10 is disposed on a top surface of the circuit board 20 .
前述之電路板20之頂面上具有至少一焊墊組,一焊墊組對應一積體電路封裝元件10,各焊墊組包含有一中心焊墊21及複數個接腳焊墊22,該中心焊墊21對應於該晶片承座12,各接腳焊墊22對應於前述積體電路封裝元件10的其中一接腳接墊13。The top surface of the circuit board 20 has at least one pad group, and one pad group corresponds to an integrated circuit package component 10. Each pad group includes a center pad 21 and a plurality of pin pads 22, the center The pad 21 corresponds to the wafer holder 12, and each of the pin pads 22 corresponds to one of the pin pads 13 of the integrated circuit package component 10.
請參閱圖8所示,該積體電路封裝元件10與該電路板20透過焊錫製程加以結合,其中相對應的接腳接墊13與接腳焊墊22之間、以及相對應的晶片承座12以及中心焊墊21之間,均塗佈有焊錫30,且晶片承座12與中心焊墊21之間的焊錫30係容置於晶片承座12之凹槽121中。Referring to FIG. 8, the integrated circuit package component 10 and the circuit board 20 are bonded through a soldering process, wherein the corresponding pin pads 13 and the pad pads 22, and corresponding wafer holders are provided. Solder 30 is applied between 12 and center pad 21, and solder 30 between wafer holder 12 and center pad 21 is received in recess 121 of wafer holder 12.
基於前述的結構,本發明的優點在於: 1. 在焊錫製程中,即便位於晶片承座12以及中心焊墊21之間的焊錫30產生分佈不均的問題,由於凹槽121提供填充焊錫30額外的空間,故能讓接腳接墊13與接腳焊墊22之間的焊錫30作為支承點,使得晶片承座12之周圍相對於電路板20的高度維持一致,進而避免一側高於其餘側的現象,故使得各側之焊錫30與接腳接墊13、接腳焊墊22的接觸面積均達到足夠維持穩定結合的面積大小,以提高製程良率。 2. 請參閱圖9所示,縱然於焊錫製程中產生氣泡31,由於凹槽121的設置,而使得氣泡31可躲入凹槽121所形成的額外空間之中,故不對整體焊錫30厚度造成影響,因此同樣達到維持晶片承座12之周圍高度一致之功效,進而使得各側之焊錫30與接腳接墊13、接腳焊墊22的接觸面積均達到足夠維持穩定結合的面積大小,同時使得整體焊錫30之表面更為平整,以提高製程良率。 3. 凹槽121之內壁面提供了額外的接觸表面,故焊錫30與晶片承座12之間的接觸面積增加,進而提升積體電路封裝元件10與電路板20之間的結合強度。Based on the foregoing structure, the advantages of the present invention are as follows: 1. In the soldering process, even if the solder 30 located between the wafer holder 12 and the center pad 21 is unevenly distributed, since the groove 121 provides the filler solder 30 additionally Space, so that the solder 30 between the pin pad 13 and the pin pad 22 can be used as a support point, so that the height of the periphery of the wafer holder 12 relative to the circuit board 20 is maintained, thereby avoiding one side higher than the rest. The side phenomenon is such that the contact area between the solder 30 on each side and the pin pad 13 and the pin pad 22 is sufficient to maintain a stable combined area to improve the process yield. 2. Referring to FIG. 9, even though the bubble 31 is generated in the soldering process, the bubble 31 can be hidden in the extra space formed by the groove 121 due to the arrangement of the groove 121, so the thickness of the overall solder 30 is not caused. Therefore, the effect of maintaining the uniform height of the periphery of the wafer holder 12 is also achieved, so that the contact area of the solder 30 on each side with the pin pad 13 and the pin pad 22 is sufficient to maintain a stable combined area. The surface of the overall solder 30 is made flater to improve the process yield. 3. The inner wall surface of the recess 121 provides an additional contact surface, so that the contact area between the solder 30 and the wafer holder 12 is increased, thereby enhancing the bonding strength between the integrated circuit package component 10 and the circuit board 20.
以上所述僅是本發明的實施例而已,並非對本發明做任何形式上的限制,雖然本發明已以實施例揭露如上,然而並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明技術方案的範圍內,當可利用上述揭示的技術內容作出些許更動或修飾為等同變化的等效實施例,但凡是未脫離本發明技術方案的內容,依據本發明的技術實質對以上實施例所作的任何簡單修改、等同變化與修飾,均仍屬於本發明技術方案的範圍內。The above is only the embodiment of the present invention, and is not intended to limit the scope of the present invention. The present invention has been disclosed by the embodiments, but is not intended to limit the invention, and any one of ordinary skill in the art, In the scope of the technical solutions of the present invention, equivalent modifications may be made to the equivalents of the embodiments of the present invention without departing from the technical scope of the present invention. Any simple modifications, equivalent changes and modifications made to the above embodiments are still within the scope of the technical solutions of the present invention.
10‧‧‧積體電路封裝元件
11‧‧‧封裝體
12‧‧‧晶片承座
121‧‧‧凹槽
13‧‧‧接腳接墊
20‧‧‧電路板
21‧‧‧中心焊墊
22‧‧‧接腳焊墊
30‧‧‧焊錫
31‧‧‧氣泡
40‧‧‧積體電路封裝元件
41‧‧‧封裝體
42‧‧‧晶片承座
43‧‧‧接腳接墊
50‧‧‧焊錫
51‧‧‧氣泡
60‧‧‧電路板10‧‧‧Integrated circuit package components
11‧‧‧Package
12‧‧‧ wafer holder
121‧‧‧ Groove
13‧‧‧Pushing pads
20‧‧‧ boards
21‧‧‧Center pad
22‧‧‧foot pads
30‧‧‧ Solder
31‧‧‧ bubbles
40‧‧‧Integrated circuit package components
41‧‧‧Package
42‧‧‧ wafer holder
43‧‧‧Pushing pads
50‧‧‧ Solder
51‧‧‧ bubbles
60‧‧‧ boards
圖1為本發明之積體電路封裝元件的第一實施例之底視圖。 圖2為本發明之積體電路封裝元件的第一實施例之側視剖面圖。 圖3為本發明之積體電路封裝元件的第二實施例之底視圖。 圖4為本發明之積體電路封裝元件的第三實施例之底視圖。 圖5為本發明之積體電路封裝元件的第四實施例之底視圖。 圖6為本發明之積體電路封裝元件的第五實施例之底視圖。 圖7為本發明之電子元件模組之元件分解的側視剖面圖。 圖8為本發明之電子元件模組之側視剖面圖。 圖9為本發明之電子元件模組之另一實施狀態的側視剖面圖。 圖10為現有技術之積體電路封裝元件的底視圖。 圖11為現有技術之積體電路封裝元件的側視剖面圖。 圖12為現有技術之電子元件模組之一實施狀態的側視剖面圖。 圖13為現有技術之電子元件模組之另一實施狀態的側視剖面圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a bottom plan view showing a first embodiment of an integrated circuit package component of the present invention. Figure 2 is a side cross-sectional view showing a first embodiment of the integrated circuit package component of the present invention. Figure 3 is a bottom plan view showing a second embodiment of the integrated circuit package component of the present invention. Figure 4 is a bottom plan view showing a third embodiment of the integrated circuit package component of the present invention. Figure 5 is a bottom plan view showing a fourth embodiment of the integrated circuit package component of the present invention. Figure 6 is a bottom plan view showing a fifth embodiment of the integrated circuit package component of the present invention. Figure 7 is a side elevational cross-sectional view showing the components of the electronic component module of the present invention. Figure 8 is a side cross-sectional view of the electronic component module of the present invention. Figure 9 is a side cross-sectional view showing another embodiment of the electronic component module of the present invention. Figure 10 is a bottom plan view of a prior art integrated circuit package component. Figure 11 is a side cross-sectional view showing a prior art integrated circuit package component. Figure 12 is a side cross-sectional view showing an embodiment of an electronic component module of the prior art. Figure 13 is a side cross-sectional view showing another embodiment of the prior art electronic component module.
10‧‧‧積體電路封裝元件 10‧‧‧Integrated circuit package components
11‧‧‧封裝體 11‧‧‧Package
12‧‧‧晶片承座 12‧‧‧ wafer holder
121‧‧‧凹槽 121‧‧‧ Groove
13‧‧‧接腳接墊 13‧‧‧Pushing pads
Claims (18)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW104134613A TW201715659A (en) | 2015-10-22 | 2015-10-22 | Electronic components module, integrated circuit encapsulated component and lead frame for the same |
CN201510770256.5A CN106611754A (en) | 2015-10-22 | 2015-11-12 | Electronic element module, integrated circuit packaging element and lead frame thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW104134613A TW201715659A (en) | 2015-10-22 | 2015-10-22 | Electronic components module, integrated circuit encapsulated component and lead frame for the same |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201715659A true TW201715659A (en) | 2017-05-01 |
Family
ID=58614584
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104134613A TW201715659A (en) | 2015-10-22 | 2015-10-22 | Electronic components module, integrated circuit encapsulated component and lead frame for the same |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN106611754A (en) |
TW (1) | TW201715659A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108615715A (en) * | 2018-07-11 | 2018-10-02 | 日月光半导体(昆山)有限公司 | Semiconductor package and lead frame strip used by same |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8330270B1 (en) * | 1998-06-10 | 2012-12-11 | Utac Hong Kong Limited | Integrated circuit package having a plurality of spaced apart pad portions |
US6777788B1 (en) * | 2002-09-10 | 2004-08-17 | National Semiconductor Corporation | Method and structure for applying thick solder layer onto die attach pad |
JP2006318996A (en) * | 2005-05-10 | 2006-11-24 | Matsushita Electric Ind Co Ltd | Lead frame and resin sealed semiconductor device |
US8133759B2 (en) * | 2009-04-28 | 2012-03-13 | Macronix International Co., Ltd. | Leadframe |
-
2015
- 2015-10-22 TW TW104134613A patent/TW201715659A/en unknown
- 2015-11-12 CN CN201510770256.5A patent/CN106611754A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
CN106611754A (en) | 2017-05-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109411487B (en) | Stacked sensor package structure | |
JP2014515187A5 (en) | ||
JP2007184385A5 (en) | ||
TWI514635B (en) | Led light bar and manufacturing method of the same | |
TW201511214A (en) | Semiconductor device | |
JP5290215B2 (en) | Semiconductor device, semiconductor package, interposer, and manufacturing method of interposer | |
TWI446844B (en) | Printed circuit board and method for manufacturing a rinted circuit board | |
JP2020522117A5 (en) | ||
JP2008235823A (en) | Multiple chip semiconductor device | |
TWI469310B (en) | Flip-chip stacked package structure and its package methodfabrication method of a photonic crystal structure | |
TW201715659A (en) | Electronic components module, integrated circuit encapsulated component and lead frame for the same | |
TWI529876B (en) | Package on package structure and manufacturing method thereof | |
TWI555101B (en) | Package structure and method of manufacture | |
KR20110137059A (en) | Stacked semiconductor package | |
TWI321352B (en) | Land grid array package | |
TWI435667B (en) | Print circuit board assembly | |
TWI505422B (en) | Window bga package for dispersing stress from chip corners | |
CN105374805A (en) | Multi-chip packaging structure | |
TW201426926A (en) | Projection laser chip package structure | |
CN210053645U (en) | PCB circuit board | |
CN110856338B (en) | Circuit board assembly and electronic equipment | |
JP2014027145A (en) | Semiconductor device | |
US20200402901A1 (en) | Semiconductor device and mounting structure thereof | |
JP2006140196A (en) | Semiconductor apparatus | |
TWM589365U (en) | Structure of substrate |