TW201624796A - A substrate structure for electronic device and production method thereof - Google Patents

A substrate structure for electronic device and production method thereof Download PDF

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TW201624796A
TW201624796A TW103144722A TW103144722A TW201624796A TW 201624796 A TW201624796 A TW 201624796A TW 103144722 A TW103144722 A TW 103144722A TW 103144722 A TW103144722 A TW 103144722A TW 201624796 A TW201624796 A TW 201624796A
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release layer
flexible substrate
adhesion
substrate
degree
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TW103144722A
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TWI536633B (en
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黃月娟
呂奇明
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財團法人工業技術研究院
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Priority to CN201410815467.1A priority patent/CN105789245A/en
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Abstract

The present disclosure provides a substrate structure for an electronic device, which comprises a supporting carrier; a release layer having has a first micro-structure, and a first degree of adhesion between the release layer and the supporting carrier; and a flexible substrate set on the supporting carrier and the release layer, wherein a second degree of adhesion is provided between the flexible substrate and the release layer, and the first degree of adhesion is greater than the second degree of adhesion, a second micro-structure relative to the first micro-structure is provided on the surface of the flexible substrate contacting with the surface of the release layer. The present disclosure further provides a method for preparing the substrate structure.

Description

一種用於電子元件之基板結構及其製法 Substrate structure for electronic components and method of manufacturing same

本揭露係有關於一種用於電子元件之基板結構及其製法,更詳而言,係關於一種可保護微結構之基板結構及其製法。 The present disclosure relates to a substrate structure for an electronic component and a method of fabricating the same, and more particularly to a substrate structure capable of protecting a microstructure and a method of fabricating the same.

軟性電子主要分為軟性元件、軟性顯示、軟性感測與軟性能源,軟性電子由於輕薄可撓曲已成為新世代新穎電子產品的發展趨勢。軟性電子的應用仍主要集中在顯示器、照明與太陽光電三大產業為主,其中,應用有機發光二極體(OLED)之照明光源已被視為下世代之新照明光源。但OLED照明若要能應用於產業時,效率再提高的問題亟需解決,目前除了可由發光材料來改善之外,仍會侷限於光取出的結果,根據Snell’s法則計算,現在所能利用到的發光實際上只有約20%左右,若經由改善基板模態(Substrate Modes)的外部取光(External Light Out-coupling)技術和針對其它模態(Waveguide and Surface Plasmon Modes)的內部取光(Internal Light Out-coupling)技術,則OLED的發光將渴望獲得非常大的改善空間。 Soft electronics are mainly divided into soft components, soft displays, soft sensing and soft energy. Soft electronics have become the development trend of new generations of novel electronic products due to their thinness and flexibility. The application of soft electronics is still mainly concentrated in the three major industries of display, illumination and solar photovoltaic. Among them, the illumination source using organic light-emitting diode (OLED) has been regarded as the new illumination source of the next generation. However, if OLED lighting can be applied to the industry, the problem of improved efficiency needs to be solved. In addition to being improved by luminescent materials, it is still limited to the result of light extraction. According to Snell's rule, it can be used now. The luminescence is actually only about 20%, if the external light extraction (Subternal Light Out-coupling) technology and the other modes (Waveguide and Surface Plasmon Modes) are internal light extraction (Internal Light) Out-coupling technology, OLED lighting will be eager to get a lot of room for improvement.

因此,光取出效率的改善,實已成為目前亟欲解決的課題。 Therefore, the improvement of the light extraction efficiency has become a problem that is currently being solved.

本揭露提供一種用於電子元件之基板結構的製法,係包括:於支撐載體上形成一具有相對之第一表面及第二表面之離型層,該離型層具有第一面積且該離型層以該第二表面接觸形成於該支撐載體上;於該離型層之第一表面形成第一微結構,並固化該離型層,使該離型層對該支撐載體之間具有第一密著度;於該支撐載體及該離型層上形成軟性基板,且該軟性基板以第二面積覆蓋該支撐載體及該離型層,其中,該第二面積大於該第一面積,且與該離型層之第一表面接觸之該軟性基板表面具有相對於該第一微結構之第二微結構;以及固化該軟性基板,使該軟性基板對該離型層之間具有第二密著度,其中,該第一密著度大於該第二密著度。 The present disclosure provides a method for fabricating a substrate structure for an electronic component, comprising: forming a release layer having a first surface and a second surface opposite to the support carrier, the release layer having a first area and the release layer Forming a second surface contact on the support carrier; forming a first microstructure on the first surface of the release layer, and curing the release layer such that the release layer has a first between the support carriers Forming a soft substrate on the support carrier and the release layer, and the flexible substrate covers the support carrier and the release layer with a second area, wherein the second area is larger than the first area, and The surface of the flexible substrate contacting the first surface of the release layer has a second microstructure relative to the first microstructure; and curing the flexible substrate such that the flexible substrate has a second adhesion between the release layers Degree, wherein the first degree of adhesion is greater than the second degree of adhesion.

根據前述之製法,本揭露復提供用於電子元件之基板結構,係包括支撐載體;離型層,係具有相對之第一表面及第二表面,該離型層具有第一面積且該離型層係以該第二表面接觸設置於該支撐載體上,其中,該第一表面具有第一微結構,且該離型層對該支撐載體之間具有第一密著度;以及軟性基板,係設置於該離型層的第一表面上,且該軟性基板以面積大於該第一面積之第二面積覆蓋該支撐載體及該離型層,其中,該軟性基板對該離型層之間具有第二密著度,且該第一密著度大於該第二密著度,而與該 離型層之第一表面接觸之該軟性基板表面具有相對於該第一微結構之第二微結構。 According to the foregoing method, the present disclosure provides a substrate structure for an electronic component, comprising a support carrier; the release layer has a first surface and a second surface, the release layer has a first area and the release layer The layer is disposed on the support carrier with the second surface contact, wherein the first surface has a first microstructure, and the release layer has a first degree of adhesion between the support carriers; and a flexible substrate Provided on the first surface of the release layer, and the flexible substrate covers the support carrier and the release layer with a second area having an area larger than the first area, wherein the flexible substrate has between the release layers a second degree of adhesion, and the first degree of adhesion is greater than the second degree of adhesion, and The flexible substrate surface in contact with the first surface of the release layer has a second microstructure relative to the first microstructure.

本揭露之用於電子元件之基板結構具有微結構的圖案,不須再額外貼附外取光薄膜,由簡易的結構及製程方法即可解決取光的問題,再者,藉由該軟性基板與該支撐載體的密著度,在進行後續元件製程中不會脫落,爾後,利用該軟性基板與該離型層易於離型的特性,於後續電子元件完成後,沿該離型層具有第一面積的邊界切割軟性基板,便可輕易地將該軟性基板與該離型層分離,並且藉由該支撐載體支撐軟性基板,使軟性基板易於進行後續元件製程。 The substrate structure for electronic components of the present disclosure has a microstructured pattern, and the external light-removing film is not required to be additionally attached, and the problem of light extraction can be solved by a simple structure and a manufacturing method, and further, the flexible substrate is used. The adhesion to the support carrier does not fall off during the subsequent component process, and then the flexible substrate and the release layer are easily separated, and after the subsequent electronic component is completed, the release layer has the same The flexible substrate can be easily separated from the release layer by the boundary of one area, and the flexible substrate can be supported by the support carrier to facilitate the subsequent component process.

10‧‧‧支撐載體 10‧‧‧Support carrier

11‧‧‧離型層 11‧‧‧ release layer

11a‧‧‧第一表面 11a‧‧‧ first surface

11b‧‧‧第二表面 11b‧‧‧ second surface

11c‧‧‧第一微結構 11c‧‧‧First microstructure

12c‧‧‧第二微結構 12c‧‧‧Second microstructure

12‧‧‧軟性基板 12‧‧‧Soft substrate

20‧‧‧模具 20‧‧‧Mold

30‧‧‧電子元件 30‧‧‧Electronic components

A1‧‧‧第一面積 A1‧‧‧ first area

A2‧‧‧第二面積 A2‧‧‧ second area

C,C’‧‧‧端點 C, C’‧‧‧ endpoint

第1圖係顯示離型層形成微結構之示意圖;第2圖係顯示基板結構之示意圖;第3圖係顯示具有電子元件之基板結構示意圖;以及第4圖係顯示具有電子元件之軟性基板與該離型層分離之示意圖。 1 is a schematic view showing a microstructure of a release layer; FIG. 2 is a schematic view showing a structure of a substrate; FIG. 3 is a schematic view showing a structure of a substrate having electronic components; and FIG. 4 is a view showing a flexible substrate having electronic components and Schematic diagram of the release layer separation.

以下藉由特定的具體實施例說明本揭露之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本揭露之其他優點及功效。 The embodiments of the present disclosure are described below by way of specific embodiments, and those skilled in the art can readily appreciate the other advantages and functions of the present disclosure.

本揭露提供一種用於電子元件之基板結構的製法,如第1圖所示,於支撐載體10上形成具有相對之第一表面11a及第二表面11b之離型層11,該離型層11具有第一面 積A1且該離型層以該第二表面11b接觸形成於該支撐載體10上,其中,該支撐載體10係可為任何質地堅硬足以於其上施做其它製程之材質,以供形成離型層11和軟性基板12。一般而言,支撐載體10之外型可為層狀或板體,舉例而言,支撐載體10係可為選自玻璃、石英、矽晶圓及金屬片所組成群組之至少一者的板體。 The present disclosure provides a method for fabricating a substrate structure for an electronic component. As shown in FIG. 1, a release layer 11 having a first surface 11a and a second surface 11b opposite to each other is formed on a support carrier 10, and the release layer 11 is formed on the support carrier 10. With the first side The product A1 is formed on the support carrier 10 by contacting the second surface 11b, wherein the support carrier 10 can be any material that is hard enough to be applied to other processes for forming a release pattern. Layer 11 and flexible substrate 12. In general, the support carrier 10 may be in the form of a layer or a plate. For example, the support carrier 10 may be a plate selected from the group consisting of glass, quartz, germanium wafers, and metal sheets. body.

而該離型層11係可為熱固性聚合物,通常,可將該熱固性聚合物溶解於溶劑中,以例如塗佈的方式施於該支撐載體10上,並於該乾燥後得到離型層11。此外,並未限制離型層11的材質,在非限制性的實例中,離型層11係選自聚矽氧烷(polysiloxane)、聚矽氧烷混成材料(polysiloxane hybridize materials)、環烯共聚物(cyclic olefin copolymers,COC)、聚甲基丙烯酸甲酯(poly(methyl methacrylate),PMMA)及聚亞醯胺(polyimide,PI)所組成群組之至少一者。 The release layer 11 can be a thermosetting polymer. Generally, the thermosetting polymer can be dissolved in a solvent, applied to the support carrier 10, for example, by coating, and the release layer 11 is obtained after the drying. . Further, the material of the release layer 11 is not limited. In a non-limiting example, the release layer 11 is selected from the group consisting of polysiloxane, polysiloxane hybridize materials, and cycloolefin copolymerization. At least one of a group consisting of cyclic olefin copolymers (COC), poly(methyl methacrylate) (PMMA), and polyimine (PI).

本揭露之用於電子元件之基板結構係具有微結構,且該微結構係形成於軟性基板表面上,而該微結構之製作係透過離型層轉移。以下即說明其製作方法。 The substrate structure for electronic components of the present disclosure has a microstructure, and the microstructure is formed on the surface of the flexible substrate, and the fabrication of the microstructure is transferred through the release layer. The following describes how to make it.

如第1圖所示,於固化該離型層11前,以模具20壓印該離型層11之第一表面11a,以形成第一微結構11c。本文所述之固化,係指離型層11完全固化或硬化,是以,製作離型層11之第一表面11a的第一微結構11c時,可直接使模具20壓印該經施塗之溶於溶劑中的熱固性聚合物,半固化或固化該離型層11後,將模具20取下。 As shown in Fig. 1, before the release layer 11 is cured, the first surface 11a of the release layer 11 is embossed with a mold 20 to form a first microstructure 11c. The curing described herein means that the release layer 11 is completely cured or hardened, so that when the first microstructure 11c of the first surface 11a of the release layer 11 is formed, the mold 20 can be directly imprinted with the applied After the thermosetting polymer dissolved in the solvent, the mold 20 is semi-cured or cured, the mold 20 is removed.

接著,固化該離型層11,而該固化係指加熱處理或UV照射,在非限制性的實例中,該加熱處理係以溫度150℃加熱2小時,或該UV照射係1000mJ/cm2的光照射120秒。經固化後使得該離型層11對該支撐載體10之間具有第一密著度。例如,該第一密著度為1B至5B。於另一實施例中,如第2圖所示,於該支撐載體10及該離型層11上塗佈另一熱固性聚合物,以製作軟性基板12。如同前述製作離型層11的方法,該塗佈並無特別限制。該塗佈的實例包括刮刀塗佈或滾輪塗佈等,所塗佈的軟性基板12之材質亦無特別限制,主要選自熱固性且為透明材質,俾利用熱固性的特性與離型層易於分離,而透明材質則適用於光學元件,舉例而言,軟性基板係選自聚亞醯胺、聚碳酸酯(polycarbonate,PC)、聚醚碸(polyethersulfone,PES)、聚原冰烯(polynorbornene,PNB)、聚酯(polyester)、聚醚醚酮(polyetheretherketone,PEEK)及聚醚醯亞胺(polyetherimide,PEI)所組成群組之至少一者。 Next, the release layer 11 is cured, and the curing refers to heat treatment or UV irradiation. In a non-limiting example, the heat treatment is performed at a temperature of 150 ° C for 2 hours, or the UV irradiation is 1000 mJ/cm 2 . Light was irradiated for 120 seconds. After being cured, the release layer 11 has a first degree of adhesion between the support carriers 10. For example, the first degree of adhesion is 1B to 5B. In another embodiment, as shown in FIG. 2, another thermosetting polymer is coated on the support carrier 10 and the release layer 11 to form the flexible substrate 12. As the aforementioned method of producing the release layer 11, the coating is not particularly limited. Examples of the coating include blade coating or roller coating, and the material of the applied flexible substrate 12 is also not particularly limited, and is mainly selected from thermosetting and transparent materials, and the thermosetting property is easily separated from the release layer by using a thermosetting property. The transparent material is suitable for optical components. For example, the flexible substrate is selected from the group consisting of polyamidos, polycarbonate (PC), polyethersulfone (PES), polynorbornene (PNB). At least one of a group consisting of polyester, polyetheretherketone (PEEK), and polyetherimide (PEI).

所形成之軟性基板12以第二面積A2覆蓋該支撐載體10及該離型層11,其中,該第二面積A2大於該第一面積A1,且與該離型層11之第一表面11a接觸之該軟性基板12表面具有相對於該第一微結構11c之第二微結構12c。該第二微結構12c係包括複數凸部,其係半球狀、角錐狀、桶狀或不規則凹凸狀,其中,該凸部之尺寸為1nm至1mm。 The formed flexible substrate 12 covers the support carrier 10 and the release layer 11 with a second area A2, wherein the second area A2 is larger than the first area A1 and is in contact with the first surface 11a of the release layer 11. The surface of the flexible substrate 12 has a second microstructure 12c opposite to the first microstructure 11c. The second microstructure 12c includes a plurality of convex portions, which are hemispherical, pyramidal, barrel-shaped or irregularly concave and convex, wherein the convex portion has a size of 1 nm to 1 mm.

經塗佈完成後,固化該軟性基板12,其中,該固化之目的在於硬化該軟性基板12,於一非限制性的實例中,係 於溫度80℃及150℃中各加熱1小時或於溫度220℃加熱3小時,使得該軟性基板12固化,並對該離型層11之間具有第二密著度,例如,該第二密著度為0B至1B,其中,該第一密著度大於該第二密著度。 After the coating is completed, the flexible substrate 12 is cured, wherein the purpose of the curing is to harden the flexible substrate 12, in a non-limiting example, The flexible substrate 12 is cured by heating at a temperature of 80 ° C and 150 ° C for 1 hour or at a temperature of 220 ° C for 3 hours, and has a second degree of adhesion between the release layers 11 , for example, the second density. The degree of importance is 0B to 1B, wherein the first degree of adhesion is greater than the second degree of adhesion.

根據前述之製法,可提供一種用於電子元件之基板結構,係包括:支撐載體10;離型層11;以及軟性基板12。 According to the foregoing method, a substrate structure for an electronic component can be provided, including: a support carrier 10; a release layer 11; and a flexible substrate 12.

該支撐載體10係可為任何質地堅硬足以於其上施做其它製程之材質,以供離型層11和軟性基板12設置於上。一般而言,支撐載體10之外型可為層狀或板體,舉例而言,支撐載體10係可為選自玻璃、石英、矽晶圓及金屬片所組成群組之至少一者的板體。 The support carrier 10 can be any material that is hard enough to be applied to other processes for the release layer 11 and the flexible substrate 12 to be disposed thereon. In general, the support carrier 10 may be in the form of a layer or a plate. For example, the support carrier 10 may be a plate selected from the group consisting of glass, quartz, germanium wafers, and metal sheets. body.

該離型層11具有第一面積且該離型層11係具有相對之第一表面11a及第二表面11b,該離型層11係以該第二表面11b接觸設置於該支撐載體10上,其中,該第一表面11a具有第一微結構11c,且該離型層11對該支撐載體10之間具有第一密著度,例如,該第一密著度為1B至5B。此外,該離型層係熱固性聚合物。於一具體實施例中,該離型層係選自聚矽氧烷、聚矽氧烷混成材料、環烯共聚物、聚甲基丙烯酸甲酯及聚亞醯胺所組成群組之至少一者。 The release layer 11 has a first area and the release layer 11 has a first surface 11a and a second surface 11b opposite to each other. The release layer 11 is disposed on the support carrier 10 by contacting the second surface 11b. Wherein, the first surface 11a has a first microstructure 11c, and the release layer 11 has a first degree of adhesion between the support carriers 10, for example, the first degree of adhesion is 1B to 5B. Further, the release layer is a thermosetting polymer. In one embodiment, the release layer is selected from the group consisting of polyoxyalkylene, polyoxyalkylene blending materials, cycloolefin copolymers, polymethyl methacrylate, and polyamidamine. .

該軟性基板12係設置於該支撐載體10及該離型層11的第一表面上,且該軟性基板12以面積大於該第一面積A1之第二面積A2覆蓋該支撐載體10及該離型層11,其中,該軟性基板12對該離型層11之間具有第二密著度,例如,0B至1B,且該第一密著度大於該第二密著度,而 與該離型層11之第一表面11a接觸之該軟性基板12表面具有相對於該第一微結構11c之第二微結構12c。該第二微結構12c係包括複數凸部,其係半球狀、角錐狀、桶狀或不規則凹凸狀,其中,該凸部之尺寸為1nm至1mm。此外,該軟性基板係熱固性聚合物。於一具體實施例中,該軟性基板係選自聚亞醯胺、聚碳酸酯、聚醚碸、聚原冰烯、聚酯、聚醚醚酮及聚醚醯亞胺所組成群組之至少一者。 The flexible substrate 12 is disposed on the first surface of the support carrier 10 and the release layer 11, and the flexible substrate 12 covers the support carrier 10 and the release type with a second area A2 having an area larger than the first area A1. a layer 11, wherein the flexible substrate 12 has a second degree of adhesion between the release layers 11, for example, 0B to 1B, and the first degree of adhesion is greater than the second degree of adhesion, and The surface of the flexible substrate 12 in contact with the first surface 11a of the release layer 11 has a second microstructure 12c opposite to the first microstructure 11c. The second microstructure 12c includes a plurality of convex portions, which are hemispherical, pyramidal, barrel-shaped or irregularly concave and convex, wherein the convex portion has a size of 1 nm to 1 mm. Further, the flexible substrate is a thermosetting polymer. In one embodiment, the flexible substrate is selected from the group consisting of polyamidoamine, polycarbonate, polyether oxime, polypyrene, polyester, polyetheretherketone, and polyetherimine. One.

又,如第3圖所示,於該離型層11覆蓋該支撐載體10的第一面積A1之兩端點C及C’、或該C及C’之內側可作為切除點,以切割該軟性基板12,使該軟性基板12與該離型層11分離。然而,在分離該軟性基板12與該離型層11之前,因該軟性基板12以面積大於該第一面積A1之第二面積A2覆蓋該支撐載體10及該離型層11,故該用於電子元件之基板結構可提供良好的固著性,以於該軟性基板12上製作電子元件30,例如OLED。 Further, as shown in FIG. 3, the release layer 11 covers the two ends C and C' of the first area A1 of the support carrier 10, or the inside of the C and C' can be used as a cut-off point to cut the The flexible substrate 12 separates the flexible substrate 12 from the release layer 11. However, before the flexible substrate 12 and the release layer 11 are separated, the flexible substrate 12 covers the support carrier 10 and the release layer 11 with a second area A2 having an area larger than the first area A1. The substrate structure of the electronic component can provide good adhesion to form an electronic component 30, such as an OLED, on the flexible substrate 12.

如第4圖所示,於該軟性基板12上進一步完成後續電子元件30的製程後,切除該軟性基板12,以使該軟性基板12與該離型層11分離。 As shown in FIG. 4, after the subsequent process of the electronic component 30 is further completed on the flexible substrate 12, the flexible substrate 12 is cut away to separate the flexible substrate 12 from the release layer 11.

實施例 Example 離型層之製備 Preparation of release layer 製備例1 離型層1之製備 Preparation Example 1 Preparation of Release Layer 1

在室溫下,將0.5克的聚二甲基矽氧烷(polydimethylsiloxane,PDMS)主劑A與0.05克的PDMS硬化劑B倒入燒杯中,攪拌均勻並除泡後,將準備之PDMS 材料倒在10×10平方公分玻璃載體上,使用具有半球凹凸結構的模具壓印在PDMS材料上,將多餘的材料清除,然後於溫度150℃加熱2小時。等冷卻後將模具移開,便可以形成具有微結構圖案的離型層1。 At room temperature, 0.5 g of polydimethylsiloxane (PDMS) main agent A and 0.05 g of PDMS hardener B were poured into a beaker, stirred well and defoamed, and PDMS prepared. The material was poured onto a 10 x 10 cm square glass carrier, imprinted on the PDMS material using a mold having a hemispherical relief structure, the excess material was removed, and then heated at a temperature of 150 ° C for 2 hours. After the mold is removed by cooling, the release layer 1 having a microstructure pattern can be formed.

製備例2 離型層2之製備 Preparation Example 2 Preparation of Release Layer 2

在黃光室下,將0.5克的聚矽氧烷混成材料(Ormostamp®,購於Micro resist technology GmbH(華錦光電科技股份有限公司代理))倒在10×10平方公分玻璃載體上,使用具有半球凹凸結構的模具壓印聚矽氧烷混成材料上,將多餘的材料清除,然後使用1000mJ/cm2的UV光照射120秒。等完全固化後將模具移開,便可以形成具有微結構圖案的離型層2。 Under the yellow light chamber, 0.5 g of polyoxymethane mixed material (Ormostamp®, purchased from Micro resist technology GmbH) was poured onto a 10×10 cm 2 glass carrier. The mold of the hemispherical concave-convex structure was imprinted on the polyoxane-mixed material, and the excess material was removed, and then irradiated with 1000 mJ/cm 2 of UV light for 120 seconds. After the mold is completely removed after the complete curing, the release layer 2 having a microstructure pattern can be formed.

軟性基板之聚亞醯胺溶液之製備 Preparation of Polyimine Solution for Flexible Substrate 合成例1 聚亞醯胺(PI-1)溶液之製備 Synthesis Example 1 Preparation of Polyiminide (PI-1) Solution

將82.7克的單體A(2,2-雙[4-(4-胺基苯氧基)苯基]丙烷(2,2-bis[4-(4-aminophenoxy)phenyl]propane))以及50克的單體B(聯環[2,2,2]辛-7-烯基-2,3,5,6-四羧酸二酐(bicyclo[2,2,2]oct-7-ene-2,3,5,6-tetracarboxylic dianhydride))與530.8克的間-甲酚(m-cresol)加入2L玻璃反應槽內。在220℃下經電動攪拌反應4小時,以形成固含量為20%的聚亞醯胺溶液。將此聚亞醯胺溶液以甲醇進行再沈澱。於烘乾後,得到絲狀聚亞醯胺。再加入二甲基乙醯胺(dimethyl acetamide)進行溶解,以配製成固含量15%的聚亞醯胺(PI-1)溶液。該聚亞醯胺(PI-1)之b值(黃度值)為2.37、重均分子 量為25024mol/g且黏度為13225 cp。 82.7 g of monomer A (2,2-bis[4-(4-aminophenoxy)phenyl]propane) and 50 a monomer of B (bicyclo[2,2,2]oct-7-alkenyl-2,3,5,6-tetracarboxylic dianhydride (bicyclo[2,2,2]oct-7-ene- 2,3,5,6-tetracarboxylic dianhydride)) was added to a 2 L glass reaction tank with 530.8 g of m-cresol. The reaction was carried out by electric stirring at 220 ° C for 4 hours to form a polyamine reaction solution having a solid content of 20%. This polyamine reaction solution was reprecipitated with methanol. After drying, a filamentous polyamidamine is obtained. Further, it was dissolved by adding dimethyl acetamide to prepare a polyamine (PI-1) solution having a solid content of 15%. The polybendamine (PI-1) has a b value (yellowness value) of 2.37, a weight average molecule The amount was 25024 mol/g and the viscosity was 13225 cp.

合成例2 聚亞醯胺(PI-2)溶液之製備 Synthesis Example 2 Preparation of Polyiminide (PI-2) Solution

將28.2克的單體A、32.1克的單體C(4,4-二胺基二苯基醚(4,4-diaminodiphenyl ether))以及50克的單體D(苯四甲酸二酐(pyromellitic dianhydride))以與441.4克的間-甲酚加入2L玻璃反應槽內,相同於合成例1之製備方法,得到絲狀聚亞醯胺。再加入二甲基乙醯胺進行溶解,以配製成固含量15%的聚亞醯胺(PI-2)溶液。該聚亞醯胺共聚物(PI-2)之b值為1.95、重均分子量為18572mol/g且黏度為10955 cp。 28.2 grams of monomer A, 32.1 grams of monomer C (4,4-diaminodiphenyl ether) and 50 grams of monomer D (pyromellitic) The dianhydride)) was added to a 2 L glass reaction tank with 441.4 g of m-cresol, and the same procedure as in the synthesis example 1 was carried out to obtain a filamentous polyamidamine. Further, dimethylacetamide was added to dissolve to prepare a polyamine (PI-2) solution having a solid content of 15%. The polyamidamine copolymer (PI-2) had a b value of 1.95, a weight average molecular weight of 18572 mol/g, and a viscosity of 10955 cp.

合成例3 二氧化矽/聚亞醯胺混成材料(PI-3)溶液之製備 Synthesis Example 3 Preparation of a cerium oxide/polyimine mixture material (PI-3) solution

將51.5克的單體E(4,4'-雙(3-胺基苯氧基)二苯基碸(4,4'-bis(3-aminophenoxy)diphenyl sulfone))、43.8克的單體F(4,4-雙(4-胺基苯氧基)二苯基(4,4-bis(4-aminophenoxy)biphenyl))、單體50克的G(1,2,3,4-環戊基四羧酸二酐(1,2,3,4-cyclopentanetetracarboxylic dianhydride))與581.1克的間-甲酚加入2L玻璃反應槽內,相同於合成例1之製備方法,得到絲狀聚亞醯胺。再加入二甲基乙醯胺進行溶解,配製成固含量15%的聚亞醯胺溶液,並以二氧化矽/聚亞醯胺的重量比20:80加入15%的SiO2分散液,形成二氧化矽/聚亞醯胺混成材料(PI-3)溶液。該二氧化矽/聚亞醯胺混成材料溶液之b值為2.12、重均分子量為10938mol/g且黏度為5840 cp。 51.5 g of monomer E (4,4'-bis(3-aminophenoxy)diphenyl sulfone), 43.8 g of monomer F (4,4-bis(4-aminophenoxy)biphenyl), 50 g of monomer G (1,2,3,4-cyclopentane) a linear polytheneamine was obtained by adding 581.1 g of m-cresol to a 2 L glass reaction tank in the same manner as in the preparation method of Synthesis Example 1. . Further, dimethylacetamide was added to dissolve, and a polyamine solvent solution having a solid content of 15% was prepared, and a 15% SiO2 dispersion was added at a weight ratio of cerium oxide/polyiminamide of 20:80 to form a dispersion of 15% SiO2. A cerium oxide/polyimine mixture material (PI-3) solution. The ceria/polyimine mixed material solution had a b value of 2.12, a weight average molecular weight of 10938 mol/g, and a viscosity of 5840 cp.

密著度測試 Tightness test

在軟性基板上用百格刀以垂直正交劃過,將塗層等分成100小格,每格大小約為1公厘x1公厘。再以3M tape #600膠帶黏貼百格刀分割之區域,撕去3M膠帶,其中,100%小方塊完全被撕起為0B、20%小方塊無法被撕起為1B、以及100%小方塊無法被撕起為5B。 The coating was equally divided into 100 cells on a flexible substrate by using a hundred-square knife in a vertical orthogonal direction, and each size was about 1 mm x 1 mm. Then use 3M tape #600 tape to stick the area of the 100-gauge knife and tear off the 3M tape. Among them, 100% small squares are completely torn to 0B, 20% small squares cannot be torn to 1B, and 100% small squares cannot be Torn up to 5B.

比較例1 不鏽鋼板上形成聚亞醯胺(PI-1)基板 Comparative Example 1 Polyimide (PI-1) substrate formed on a stainless steel plate

將不鏽鋼板上塗佈合成例1之PI-1溶液,經固化以形成PI-1基板。接著,進行不鏽鋼板與PI-1基板的密著度測試,結果如表1所示。 The PI-1 solution of Synthesis Example 1 was coated on a stainless steel plate and cured to form a PI-1 substrate. Next, the adhesion test of the stainless steel plate and the PI-1 substrate was carried out, and the results are shown in Table 1.

比較例2 不鏽鋼板上形成二氧化矽/聚亞醯胺混成(PI-3)基板 Comparative Example 2 Formation of a cerium oxide/polyimine mixture (PI-3) substrate on a stainless steel plate

將不鏽鋼板上塗佈合成例3之PI-3溶液,經固化以形成PI-3基板。接著,進行不鏽鋼板與與PI-3基板的密著度測試,結果如表1所示。 The stainless steel plate was coated with the PI-3 solution of Synthesis Example 3, and cured to form a PI-3 substrate. Next, the adhesion test of the stainless steel plate and the PI-3 substrate was carried out, and the results are shown in Table 1.

實施例1 離型層1上形成PI-1基板 Example 1 Forming a PI-1 Substrate on Release Layer 1

於製備例1之離型層1上塗佈合成例1之PI-1溶液,隨後進行固化形成PI-1基板。接著,進行離型層1與PI-1基板的密著度測試,結果如表1所示。 The PI-1 solution of Synthesis Example 1 was coated on the release layer 1 of Preparation Example 1, followed by curing to form a PI-1 substrate. Next, the adhesion test of the release layer 1 and the PI-1 substrate was carried out, and the results are shown in Table 1.

實施例2 離型層2上形成PI-1基板 Example 2 Forming a PI-1 substrate on the release layer 2

於製備例2之離型層2上塗佈合成例1之PI-1,隨後進行固化形成PI-1基板。接著,進行離型層2與PI-1基板的密著度測試,結果如表1所示。 The PI-1 of Synthesis Example 1 was coated on the release layer 2 of Preparation Example 2, followed by curing to form a PI-1 substrate. Next, the adhesion test of the release layer 2 and the PI-1 substrate was carried out, and the results are shown in Table 1.

實施例3 離型層1上形成PI-3混成基板 Embodiment 3 Forming a PI-3 mixed substrate on the release layer 1

於製備例1之離型層1上塗佈合成例3之PI-3,隨後 進行固化形成PI-3混成基板。接著,進行離型層1與PI-3混成基板的密著度測試,結果如表1所示。 The PI-3 of Synthesis Example 3 was coated on the release layer 1 of Preparation Example 1, followed by The curing was carried out to form a PI-3 mixed substrate. Next, the adhesion test of the release layer 1 and the PI-3 mixed substrate was carried out, and the results are shown in Table 1.

實施例4 離型層2上形成PI-3混成基板 Example 4 Formation of PI-3 Mixed Substrate on Release Layer 2

於製備例2之離型層2上塗佈合成例3之PI-3,隨後進行固化形成PI-3混成基板。接著,進行離型層2與PI-3混成基板的密著度測試,結果如表1所示。 The PI-3 of Synthesis Example 3 was coated on the release layer 2 of Preparation Example 2, followed by curing to form a PI-3 mixed substrate. Next, the adhesion test of the release layer 2 and the PI-3 mixed substrate was carried out, and the results are shown in Table 1.

由表1可知,比較例1至2為傳統軟性基板的製法,在不包含離型層的情況下,其密著度大於1B,造成軟性基板製備完成後,難以輕易地從載體上取下,相較於實施例1至4之測試結果,具有離型層1及2的基板結構皆能輕易地完全撕起軟性基板,不會造成軟性基板的破損。 It can be seen from Table 1 that Comparative Examples 1 to 2 are a method for manufacturing a conventional flexible substrate, and in the case where the release layer is not contained, the adhesion is greater than 1 B, which makes it difficult to easily remove the carrier after the preparation of the flexible substrate is completed. Compared with the test results of Examples 1 to 4, the substrate structure having the release layers 1 and 2 can easily completely tear the flexible substrate without causing damage to the flexible substrate.

含有電子元件之基板的電流效率測試 Current efficiency test for substrates containing electronic components

將下列實例之含有電子元件的基板經由Keithley 238設備進行電壓及電流測試 The following examples of electronic component-containing substrates were tested for voltage and current via Keithley 238 equipment.

比較例3 單純以玻璃作為基板 Comparative Example 3 simply using glass as a substrate

取TFT等級玻璃基板(厚度0.7mm),依序蒸鍍200nm之ITO、50nm之N,N'-雙(萘-1-基)-N,N'-雙(苯基)聯苯-4,4'-二胺(N,N'-Bis(naphthalen-1-yl)-N,N'-bis(phenyl)benzidine,NPB)、10nm之CBP:Irppy3(3%)、10nm之2,9-二甲基-4,7-二苯基-1,10-鄰二氮雜菲(2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline,BCP)、35nm之Alq3、0.5nm之LiF與120nm之鋁於玻璃基板之平滑表面上,即形成綠光OLED。隨後,進行電流效率測試,並將結果紀錄於表2。 A TFT grade glass substrate (thickness: 0.7 mm) was taken, and 200 nm of ITO and 50 nm of N,N'-bis(naphthalen-1-yl)-N,N'-bis(phenyl)biphenyl-4 were sequentially deposited. 4'-Diamine (N,N'-Bis(naphthalen-1-yl)-N,N'-bis(phenyl)benzidine, NPB), 10 nm CBP: Irppy3 (3%), 10 nm 2,9- Dimethyl-4,7-diphenyl-1,10-phenanthroline (BCP), 35 nm Alq 3 , 0.5 nm The LiF and 120 nm of aluminum are on the smooth surface of the glass substrate, that is, a green OLED is formed. Subsequently, a current efficiency test was performed and the results are reported in Table 2.

比較例4 單純以PI-1作為基板 Comparative Example 4 PI-1 alone as a substrate

取PI-1塗佈於平滑玻璃板上,經固化以形成PI-1基板(厚度30μm),並分離玻璃基板與PI-1基板,並於分離後的PI-1基板上依序蒸鍍200nm之ITO、50nm之NPB、10nm之CBP:Irppy3(3%)、10nm之BCP、35nm之Alq3、0.5nm之LiF與120nm之鋁於PI-1基板之平滑表面上,即形成綠光OLED,隨後,進行電流效率測試,並將結果紀錄於表2。 PI-1 was coated on a smooth glass plate, cured to form a PI-1 substrate (thickness 30 μm), and the glass substrate and the PI-1 substrate were separated, and 200 nm was sequentially evaporated on the separated PI-1 substrate. ITO, 50 nm NPB, 10 nm CBP: Irppy 3 (3%), 10 nm BCP, 35 nm Alq 3 , 0.5 nm LiF and 120 nm aluminum on the smooth surface of the PI-1 substrate, ie, a green OLED is formed. Subsequently, a current efficiency test was performed and the results are reported in Table 2.

比較例5 單純以PEN作為基板 Comparative Example 5 PEN alone as a substrate

取市售PEN基板(TEONEX Q65FA PEN購於帝人杜邦薄膜公司(DuPont Teijin),厚度0.1mm),依序蒸鍍200nm之ITO、50nm之NPB、10nm之CBP:Irppy3(3%)、10nm之BCP、35nm之Alq3、0.5nm之LiF與120nm之鋁於PEN基板之平滑表面上,即形成綠光OLED,隨後,進行電流效率測試,並將結果紀錄於表2。 A commercially available PEN substrate (TEONEX Q65FA PEN was purchased from DuPont Teijin, thickness 0.1 mm), and 200 nm of ITO, 50 nm of NPB, 10 nm of CBP: Irppy 3 (3%), and 10 nm of BCP were sequentially deposited. A 35 nm Alq 3 , a 0.5 nm LiF and a 120 nm aluminum were formed on the smooth surface of the PEN substrate to form a green OLED. Subsequently, a current efficiency test was performed, and the results are reported in Table 2.

比較例6 外貼含有取光膜之PEN基板 Comparative Example 6 PEN substrate with a light-receiving film attached

取市售PEN基板,外貼一具有半球凹凸結構的取光膜 (Microlens Film,半球高度介於20至30μm,購於迎輝科技股份有限公司(EFUN Technology Corporation)),再依序蒸鍍200nm之ITO、50nm之NPB、10nm之CBP:Irppy3(3%)、10nm之BCP、35nm之Alq3、0.5nm之LiF與120nm之鋁於PEN基板之平滑表面上,即形成綠光OLED隨後,進行電流效率測試,並將結果紀錄於表2。 A PEN substrate is commercially available, and a light-receiving film having a hemispherical concave-convex structure (Microlens Film, a hemisphere height of 20 to 30 μm, purchased from EFUN Technology Corporation) is attached, and then 200 nm is sequentially evaporated. ITO, 50 nm NPB, 10 nm CBP: Irppy 3 (3%), 10 nm BCP, 35 nm Alq 3 , 0.5 nm LiF and 120 nm aluminum on the smooth surface of the PEN substrate, ie, forming a green OLED followed by Current efficiency tests were performed and the results are reported in Table 2.

實施例5 離型層上形成具有不規則凹凸結構的PI-1基板 Embodiment 5 Forming a PI-1 substrate having an irregular uneven structure on a release layer

依製備例1之方式製備離型層,僅將具有半球凹凸的壓印模具改為磨砂玻璃。接著,將PI-1溶液塗佈於離型層上,經固化形成具有不規則凹凸結構的下表面與平滑上表面之軟性基板,其中,不規則凹凸結構的最高點與最低點之高低差為小於3μm,而該軟性基板的厚度為110μm。隨後,於PI-1基板上依序蒸鍍200nm之ITO、50nm之NPB、10nm之CBP:Irppy3(3%)、10nm之BCP、35nm之Alq3、0.5nm之LiF與120nm之鋁,即形成綠光OLED,離型取下軟性OLED,最後,進行電流效率測試,並將結果紀錄於表2。 The release layer was prepared in the same manner as in Preparation Example 1, and only the imprint mold having hemispherical irregularities was changed to frosted glass. Next, the PI-1 solution is coated on the release layer and cured to form a soft substrate having a lower surface and a smooth upper surface having an irregular concavo-convex structure, wherein the difference between the highest point and the lowest point of the irregular concavo-convex structure is It is less than 3 μm, and the thickness of the flexible substrate is 110 μm. Subsequently, 200 nm of ITO, 50 nm of NPB, 10 nm of CBP: Irppy 3 (3%), 10 nm of BCP, 35 nm of Alq 3 , 0.5 nm of LiF and 120 nm of aluminum were sequentially deposited on the PI-1 substrate. The green OLED was removed from the soft OLED. Finally, the current efficiency test was performed and the results are reported in Table 2.

實施例6 離型層1上形成PI-1基板 Embodiment 6 Forming a PI-1 substrate on the release layer 1

取製備例1之離型層1,將PI-1溶液塗佈於離型層1上,經固化形成具有半球凹凸結構的軟性基板,其上表面為平滑表面,其下表面之凹凸結構為具有半球狀的規則結構,半球高度介於20μm至30μm之間,直徑介於50μm至60μm之間,而該軟性基板的厚度為120μm。接著,於PI-1基板上依序蒸鍍200nm之ITO、50nm之NPB、10nm 之CBP:Irppy3(3%)、10nm之BCP、35nm之Alq3、0.5nm之LiF與120nm之鋁,即形成綠光OLED,離型取下軟性OLED,隨後,進行電流效率測試,並將結果紀錄於表2。 Taking the release layer 1 of Preparation Example 1, the PI-1 solution was coated on the release layer 1, and cured to form a flexible substrate having a hemispherical concave-convex structure, the upper surface of which was a smooth surface, and the concave and convex structure of the lower surface thereof was A hemispherical regular structure having a hemisphere height of between 20 μm and 30 μm, a diameter of between 50 μm and 60 μm, and a thickness of the flexible substrate of 120 μm. Next, 200 nm of ITO, 50 nm of NPB, 10 nm of CBP: Irppy 3 (3%), 10 nm of BCP, 35 nm of Alq 3 , 0.5 nm of LiF and 120 nm of aluminum were sequentially deposited on the PI-1 substrate. The green OLED was removed from the soft OLED, and then the current efficiency test was performed, and the results are reported in Table 2.

實施例7 離型層上形成具有不規則凹凸結構的PI-2基板 Example 7 Forming a PI-2 Substrate with Irregular Concavo-convex Structure on a Release Layer

相同於實施例5之製備方法,僅將PI-1溶液置換成PI-2溶液。離型取下軟性OLED,隨後,進行電流效率測試,並將結果紀錄於表2。 In the same manner as in the production method of Example 5, only the PI-1 solution was replaced with the PI-2 solution. The soft OLED was removed from the release, and then a current efficiency test was performed, and the results are reported in Table 2.

實施例8 離型層1上形成PI-2基板 Example 8 Forming a PI-2 Substrate on Release Layer 1

相同於實施例6之製備方法,僅將PI-1溶液置換成PI-2溶液。離型取下軟性OLED,隨後,進行電流效率測試,並將結果紀錄於表2。 In the same manner as in the production method of Example 6, only the PI-1 solution was replaced with the PI-2 solution. The soft OLED was removed from the release, and then a current efficiency test was performed, and the results are reported in Table 2.

實施例9 離型層上形成具有不規則凹凸結構的PI-3混成基板 Example 9 Forming a PI-3 hybrid substrate having an irregular concavo-convex structure on a release layer

相同於實施例5之製備方法,僅將離型層置換成製備例2之離型層2且將具有半球凹凸的壓印模具改為磨砂玻璃、以及PI-1溶液置換成PI-3溶液。離型取下軟性OLED,隨後,進行電流效率測試,並將結果紀錄於表2。 In the same manner as in the production method of Example 5, only the release layer was replaced with the release layer 2 of Preparation Example 2, and the imprint mold having hemispherical irregularities was changed to frosted glass, and the PI-1 solution was replaced with the PI-3 solution. The soft OLED was removed from the release, and then a current efficiency test was performed, and the results are reported in Table 2.

實施例10 離型層2上形成PI-3混成基板 Example 10 Formation of PI-3 Mixed Substrate on Release Layer 2

相同於實施例6之製備方法,僅將離型層1置換成製備例2之離型層2、以及PI-1溶液置換成PI-3溶液。離型取下軟性OLED,隨後,進行電流效率測試,並將結果紀錄於表2。 In the same manner as in the production method of Example 6, only the release layer 1 was replaced with the release layer 2 of Preparation Example 2, and the PI-1 solution was replaced with a PI-3 solution. The soft OLED was removed from the release, and then a current efficiency test was performed, and the results are reported in Table 2.

由表2可知,以比較例3之玻璃基板之電流效率為基準,未含有微結構的比較例4至5,其電流效率皆明顯低於具有微結構的實施例5至10,另外具有相同半球微結構的基板中,多層貼合的比較例6其電流效率亦明顯低於實施例6、8與10,顯示出本揭露不須再額外貼附外取光薄膜,由簡易的結構及製程方法即可得到高的光取出效率。 As can be seen from Table 2, in Comparative Examples 4 to 5 which did not contain the microstructure based on the current efficiency of the glass substrate of Comparative Example 3, the current efficiencies were significantly lower than those of Examples 5 to 10 having microstructures, and the same hemisphere was additionally obtained. In the microstructured substrate, the multilayered composite comparative example 6 has a current efficiency which is also significantly lower than that of the examples 6, 8, and 10, which shows that the present invention does not require additional attaching of the light-extracting film, and the simple structure and process method are provided. A high light extraction efficiency can be obtained.

10‧‧‧支撐載體 10‧‧‧Support carrier

11‧‧‧離型層 11‧‧‧ release layer

11a‧‧‧第一表面 11a‧‧‧ first surface

11b‧‧‧第二表面 11b‧‧‧ second surface

11c‧‧‧第一微結構 11c‧‧‧First microstructure

12c‧‧‧第二微結構 12c‧‧‧Second microstructure

12‧‧‧軟性基板 12‧‧‧Soft substrate

A1‧‧‧第一面積 A1‧‧‧ first area

A2‧‧‧第二面積 A2‧‧‧ second area

Claims (22)

一種用於電子元件之基板結構的製法,係包括:於支撐載體上形成一具有相對之第一表面及第二表面之離型層,該離型層具有第一面積且該離型層以該第二表面接觸形成於該支撐載體上;於該離型層之第一表面形成第一微結構,並固化該離型層,使該離型層對該支撐載體之間具有第一密著度;於該支撐載體及該離型層上設置軟性基板,且該軟性基板以第二面積覆蓋該支撐載體及該離型層,其中,該第二面積大於該第一面積,且與該離型層之第一表面接觸之該軟性基板表面具有相對於該第一微結構之第二微結構;以及固化該軟性基板,使該軟性基板對該離型層之間具有第二密著度,其中,該第一密著度大於該第二密著度。 A method for fabricating a substrate structure for an electronic component, comprising: forming a release layer having a first surface and a second surface opposite to the support carrier, the release layer having a first area and the release layer Forming a second surface contact on the support carrier; forming a first microstructure on the first surface of the release layer, and curing the release layer such that the release layer has a first adhesion between the support carriers Providing a flexible substrate on the support carrier and the release layer, and the flexible substrate covers the support carrier and the release layer with a second area, wherein the second area is larger than the first area, and the release type The surface of the flexible substrate contacting the first surface of the layer has a second microstructure relative to the first microstructure; and curing the flexible substrate such that the flexible substrate has a second degree of adhesion between the release layers, wherein The first degree of adhesion is greater than the second degree of adhesion. 如申請專利範圍第1項所述之製法,其中,該支撐載體係選自玻璃、石英、矽晶圓及金屬片所組成群組之至少一者。 The method of claim 1, wherein the support carrier is at least one selected from the group consisting of glass, quartz, germanium wafers, and metal sheets. 如申請專利範圍第1項所述之製法,其中,該離型層係熱固性聚合物。 The method of claim 1, wherein the release layer is a thermosetting polymer. 如申請專利範圍第1項所述之製法,其中,該離型層係選自聚矽氧烷、聚矽氧烷混成材料、環烯共聚物、聚甲基丙烯酸甲酯及聚亞醯胺所組成群組之至少一 者。 The method of claim 1, wherein the release layer is selected from the group consisting of polysiloxanes, polyoxyalkylene blends, cycloolefin copolymers, polymethyl methacrylates, and polyamidones. At least one of the group By. 如申請專利範圍第1項所述之製法,係於固化該離型層前,以模具壓印該離型層之第一表面,以形成第一微結構。 The method of claim 1, wherein the first surface of the release layer is embossed with a mold to form a first microstructure before curing the release layer. 如申請專利範圍第1項所述之製法,其中,該第二微結構係包括複數凸部,其係半球狀、角錐狀、桶狀或不規則凹凸狀。 The method of claim 1, wherein the second microstructure comprises a plurality of protrusions, which are hemispherical, pyramidal, barrel or irregular. 如申請專利範圍第6項所述之製法,其中,且該凸部之尺寸為1nm至1mm。 The method of claim 6, wherein the protrusion has a size of 1 nm to 1 mm. 如申請專利範圍第1項所述之製法,其中,該固化方式係加熱處理或UV照射。 The method of claim 1, wherein the curing method is heat treatment or UV irradiation. 如申請專利範圍第1項所述之製法,其中,該第一密著度為1B至5B。 The method of claim 1, wherein the first degree of adhesion is 1B to 5B. 如申請專利範圍第1項所述之製法,其中,該軟性基板係熱固性聚合物。 The method of claim 1, wherein the flexible substrate is a thermosetting polymer. 如申請專利範圍第1項所述之製法,其中,該軟性基板係選自聚亞醯胺、聚碳酸酯、聚醚碸、聚原冰烯、聚酯、聚醚醚酮及聚醚醯亞胺所組成群組之至少一者。 The method of claim 1, wherein the flexible substrate is selected from the group consisting of polyamidoamine, polycarbonate, polyether oxime, poly raw ene oxide, polyester, polyetheretherketone, and polyether oxime. At least one of the groups consisting of amines. 如申請專利範圍第1項所述之製法,其中,該第二密著度為0B至1B。 The method of claim 1, wherein the second degree of adhesion is 0B to 1B. 一種用於電子元件之基板結構,係包括:支撐載體;離型層,具有第一面積且該離型層係具有相對之第一表面及第二表面,該離型層係以該第二表面接觸 設置於該支撐載體上,其中,該第一表面具有第一微結構,且該離型層對該支撐載體之間具有第一密著度;以及軟性基板,係設置於該離型層的第一表面上,且該軟性基板以面積大於該第一面積之第二面積覆蓋該支撐載體及該離型層,其中,該軟性基板對該離型層之間具有第二密著度,且該第一密著度大於該第二密著度,而與該離型層之第一表面接觸之該軟性基板表面具有相對於該第一微結構之第二微結構。 A substrate structure for an electronic component, comprising: a support carrier; a release layer having a first area and the release layer having an opposite first surface and a second surface, the release layer being the second surface contact Provided on the support carrier, wherein the first surface has a first microstructure, and the release layer has a first degree of adhesion between the support carriers; and the flexible substrate is disposed on the release layer On a surface, the flexible substrate covers the support carrier and the release layer with a second area having an area larger than the first area, wherein the flexible substrate has a second degree of adhesion between the release layers, and the The first degree of adhesion is greater than the second degree of adhesion, and the surface of the flexible substrate in contact with the first surface of the release layer has a second microstructure relative to the first microstructure. 如申請專利範圍第13項所述之基板結構,其中,該支撐載體係選自玻璃、石英、矽晶圓及金屬片所組成群組之至少一者。 The substrate structure of claim 13, wherein the support carrier is at least one selected from the group consisting of glass, quartz, germanium wafers, and metal sheets. 如申請專利範圍第13項所述之基板結構,其中,該離型層係熱固性聚合物。 The substrate structure of claim 13, wherein the release layer is a thermosetting polymer. 如申請專利範圍第13項所述之基板結構,其中,該離型層係選自聚矽氧烷、聚矽氧烷混成材料、環烯共聚物、聚甲基丙烯酸甲酯及聚亞醯胺所組成群組之至少一者。 The substrate structure according to claim 13, wherein the release layer is selected from the group consisting of polysiloxanes, polyoxyalkylene mixtures, cycloolefin copolymers, polymethyl methacrylates, and polyamines. At least one of the group consisting of. 如申請專利範圍第13項所述之基板結構,其中,該第一密著度為1B至5B。 The substrate structure of claim 13, wherein the first degree of adhesion is 1B to 5B. 如申請專利範圍第13項所述之基板結構,其中,該軟性基板係熱固性聚合物。 The substrate structure according to claim 13, wherein the flexible substrate is a thermosetting polymer. 如申請專利範圍第13項所述之基板結構,其中,該軟性基板係選自聚亞醯胺、聚碳酸酯、聚醚碸、聚原冰 烯、聚酯、聚醚醚酮及聚醚醯亞胺所組成群組之至少一者。 The substrate structure according to claim 13, wherein the flexible substrate is selected from the group consisting of polyamidos, polycarbonate, polyether oxime, poly raw ice. At least one of the group consisting of a olefin, a polyester, a polyetheretherketone, and a polyetherimine. 如申請專利範圍第13項所述之基板結構,其中,該第二微結構係包括複數凸部,其係半球狀、角錐狀、桶狀或不規則凹凸狀。 The substrate structure of claim 13, wherein the second microstructure comprises a plurality of protrusions, which are hemispherical, pyramidal, barrel or irregular. 如申請專利範圍第13項所述之基板結構,其中,該凸部之尺寸為1nm至1mm。 The substrate structure of claim 13, wherein the protrusion has a size of 1 nm to 1 mm. 如申請專利範圍第13項所述之基板結構,其中,該第二密著度為0B至1B。 The substrate structure of claim 13, wherein the second degree of adhesion is 0B to 1B.
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