TW201623687A - Reduction-type electroless gold plating solution and electroless gold plating method using said plating solution - Google Patents

Reduction-type electroless gold plating solution and electroless gold plating method using said plating solution Download PDF

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TW201623687A
TW201623687A TW104127451A TW104127451A TW201623687A TW 201623687 A TW201623687 A TW 201623687A TW 104127451 A TW104127451 A TW 104127451A TW 104127451 A TW104127451 A TW 104127451A TW 201623687 A TW201623687 A TW 201623687A
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gold plating
electroless
film
electroless gold
plating solution
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TWI567234B (en
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Tomohito Kato
Hideto Watanabe
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Kojima Chemicals Co Ltd
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/31Coating with metals
    • C23C18/42Coating with noble metals
    • C23C18/44Coating with noble metals using reducing agents
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1646Characteristics of the product obtained
    • C23C18/165Multilayered product
    • C23C18/1651Two or more layers only obtained by electroless plating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/31Coating with metals
    • C23C18/32Coating with nickel, cobalt or mixtures thereof with phosphorus or boron
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1635Composition of the substrate
    • C23C18/1637Composition of the substrate metallic substrate

Abstract

The purpose of the present invention is to provide an electroless gold plating solution which does not contain harmful substances and is capable of achieving good wire bonding performance, while suppressing corrosion of a base metal. In order to achieve this purpose, an electroless plating solution that contains a water-soluble gold compound, citric acid or a citrate, ethylenediaminetetraacetic acid or an ethylenediaminetetraacetate, hexamethylenetetramine and a chain polyamine containing three or more amino groups and an alkyl group having three or more carbon atoms is employed as a reduction-type electroless gold plating solution which is used for the purpose of forming an electroless gold plating film on the surface of an object to be plated by means of electroless plating.

Description

還元型無電解鍍金液以及使用該鍍金液之無電解鍍金方法 Reductive electroless gold plating solution and electroless gold plating method using the same

本件申請案之發明係關於一種無電解鍍金液、使用該無電解鍍金液之無電解鍍金方法以及藉由該無電解鍍金方法而進行電鍍處理之電鍍製品。更加具體地說,關於一種可以在被鍍物之表面來進行直接電鍍處理之還元型無電解鍍金技術。 The invention of the present application relates to an electroless gold plating solution, an electroless gold plating method using the electroless gold plating solution, and an electroplated product which is subjected to electroplating treatment by the electroless gold plating method. More specifically, it relates to a regenerative electroless gold plating technique which can perform direct electroplating treatment on the surface of a substrate to be plated.

在近年來,提高電子機器對於高機能化或多機能化之要求,另一方面,在使用於這些電子機器之印刷電路板,還要求更加之輕薄短小化。為了應付該輕薄短小化,因此,進行電路圖案之微細化,隨著該電路圖案之微細化而要求高度之構裝技術。一般在印刷電路板之領域,作為接合構裝零件或端子零件之技術係確立使用銲錫或引線接合(wire-bonding)之技術。 In recent years, there has been a demand for high-performance or multi-functions of electronic devices. On the other hand, printed circuit boards used in these electronic devices have been required to be thinner and lighter. In order to cope with the reduction in size and thickness, the circuit pattern is miniaturized, and a high degree of mounting technology is required as the circuit pattern is miniaturized. Generally, in the field of printed circuit boards, techniques for bonding components or terminal parts have established techniques for using solder or wire-bonding.

由於確保使用這些銲錫或引線接合(wire-bonding)之接合之連接可靠性之目的,因此,施行電鍍處理,來作成為印刷電路板上之電路之構裝部分和端子部分之配線銲墊之表面處理。作為電鍍處理係進行於藉由低電阻之銅等之金屬而形成之電路圖案之上,依序地進行鍍鎳、鍍鈀和 鍍金之技術。鍍鎳皮膜係防止由於銲錫而造成之銅電路之浸蝕,鍍鈀皮膜係用以防止構成鍍鎳皮膜之鎳來擴散至鍍金皮膜。接著,鍍金皮膜係為了實現低電阻並且得到良好之銲錫之潤濕特性而形成。 Since the purpose of ensuring the connection reliability of the solder or wire-bonding bonding is ensured, the plating process is performed to form the surface of the wiring portion of the circuit portion and the terminal portion of the circuit on the printed circuit board. deal with. As a plating process, nickel plating, palladium plating, and the like are sequentially performed on a circuit pattern formed by a metal such as low-resistance copper. Gold-plated technology. The nickel-plated film prevents the copper circuit from being etched by the solder, and the palladium-plated film prevents the nickel constituting the nickel-plated film from diffusing to the gold-plated film. Next, the gold plating film is formed in order to achieve low resistance and obtain good solder wettability.

作為前述之電鍍技術之先前技術係例如以下所示之專利文獻1~專利文獻3。專利文獻1所記載之無電解鍍金方法係在鎳上藉由含有還元劑之無電解鍍金液而形成鍍金膜之方法,作為無電解鍍金之觸媒係在鎳上,形成置換鍍金膜。 The prior art of the plating technique described above is, for example, Patent Document 1 to Patent Document 3 shown below. The electroless gold plating method described in Patent Document 1 is a method of forming a gold plating film on an electroless gold plating solution containing a reductant on nickel, and forming a gold plating film on the nickel as a catalyst for electroless gold plating.

此外,專利文獻2所記載之無電解鍍金方法係在電子零件之被鍍面上,透過觸媒而形成無電解鍍鎳皮膜,在該無電解鍍鎳皮膜上,形成無電解鍍鈀皮膜,並且,還在該無電解鍍鈀皮膜上,形成無電解鍍金皮膜之電鍍皮膜層積體之形成無電解鍍金皮膜之方法,藉由使用無電解鍍金浴之第1無電解鍍金,該無電解鍍金浴係含有水溶性金化合物、配位劑、甲醛及/或甲醛亞硫酸氫鹽附加物和特定之胺化合物,而形成無電解鍍金皮膜。 Further, in the electroless gold plating method described in Patent Document 2, an electroless nickel plating film is formed on a surface to be plated of an electronic component through a catalyst, and an electroless nickel plating film is formed on the electroless nickel plating film, and Further, on the electroless palladium plating film, a method of forming an electroless gold plating film of an electroless gold plating film plating layer is formed, and the electroless gold plating bath is used by using the first electroless gold plating of the electroless gold plating bath. It comprises a water-soluble gold compound, a complexing agent, formaldehyde and/or formaldehyde bisulfite addenda and a specific amine compound to form an electroless gold plating film.

此外,專利文獻3所記載之鈀皮膜用還元析出型無電解鍍金液係可以在鈀皮膜上呈直接地形成鍍金皮膜之無電解鍍金液,由含有水溶性金化合物、還元劑和配位劑之水溶液而組成,作為還元劑係含有由甲醛亞硫酸氫類、雕白粉和肼類而組成之群組來選出之至少一種之化合物。 Further, the non-electrolytic gold plating liquid for a palladium film described in Patent Document 3 can form an electroless gold plating solution directly forming a gold plating film on a palladium film, and contains a water-soluble gold compound, a reductant, and a complexing agent. It is composed of an aqueous solution, and the reductant contains at least one compound selected from the group consisting of formaldehyde hydrogen sulfite, white powder, and hydrazine.

【先前技術文獻】 [Previous Technical Literature] 【專利文獻】 [Patent Literature]

【專利文獻1】日本特開平05-222541號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 05-222541

【專利文獻2】日本特開2008-266668號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2008-266668

【專利文獻3】日本特開2008-174774號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2008-174774

但是,在該專利文獻1之無電解鍍金方法,置換鍍金皮膜係利用成為基底之鎳和電鍍浴中之金離子之間之氧化還元電位差而析出金來形成,因此,由於金溶解基底鎳而腐蝕基底鎳,結果,有鎳擴散於鍍金皮膜之問題發生。在鎳擴散於該鍍金皮膜之時,有降低引線接合(wire-bonding)之金-金接合強度之問題發生。為了防止該意外,因此,在專利文獻1,藉由在置換鍍金皮膜上,形成無電解鍍金皮膜,增加金之膜厚,而抑制引線接合(wire-bonding)性之降低。但是,該技術係必須形成置換鍍金皮膜,因此,有所謂導致成本之高漲同時生產性變差之問題發生。 However, in the electroless gold plating method of Patent Document 1, the gold plating film is formed by depositing gold by the oxidation potential difference between the nickel as the base and the gold ions in the plating bath, and therefore, the gold is corroded by the dissolution of the base nickel. The base nickel, as a result, has a problem that nickel diffuses into the gold plating film. When nickel is diffused into the gold plating film, there is a problem that the gold-gold bonding strength of wire-bonding is lowered. In order to prevent this accident, in Patent Document 1, an electroless gold plating film is formed on the gold plating film, and the thickness of the gold film is increased to suppress a decrease in wire-bonding property. However, this technique has to form a replacement gold plating film, and therefore, there is a problem that the cost is high and the productivity is deteriorated.

此外,在使用記載於前述專利文獻2之無電解鍍金方法或者是記載於專利文獻3之鈀皮膜用還元析出型無電解鍍金液之狀態下,可以抑制成為基底金屬之鎳之腐蝕,但是,在無電解鍍金浴,包含強毒性之甲醛或甲醛亞硫酸氫鹽附加物,因此,不容易確保電鍍處理作業之安全性。 In addition, in the state of the electroless gold plating method described in the above-mentioned Patent Document 2 or the non-electrolytic gold plating liquid for the palladium film described in Patent Document 3, it is possible to suppress corrosion of nickel which is a base metal, but The electroless gold plating bath contains a highly toxic formaldehyde or formaldehyde bisulfite add-on, so it is not easy to ensure the safety of the plating process.

於是,在市場,可以抑制基底金屬之腐蝕而實現良好之引線接合(wire-bonding)性同時無包含有害物質之無電解鍍金液之要求係變高。 Therefore, in the market, it is possible to suppress corrosion of the base metal and achieve good wire-bonding property without requiring an electroless gold plating solution containing a harmful substance.

為了解決前述之課題,因此,本案發明人等係全心地進行研究,結果以致於提供以下所示之無電解鍍金液、無電解鍍金方法以及電鍍製品。 In order to solve the above problems, the inventors of the present invention conducted research with all of their efforts, and as a result, provided the electroless gold plating liquid, the electroless gold plating method, and the electroplated product shown below.

本件發明之還元型無電解鍍金液,係使用在對於被鍍物表面之無電解鍍金皮膜之形成的還元型無電解鍍金液,其特徵為:包含水溶性金化合物、檸檬酸或檸檬酸鹽、伸乙基二胺四乙酸或伸乙基二胺四乙酸鹽、六亞甲基四胺、以及含有碳數3以上之烷基和3個以上之胺基之鏈狀聚胺。 The regenerative electroless gold plating solution of the present invention is a regenerative electroless gold plating solution which is formed on an electroless gold plating film on the surface of a substrate to be coated, and is characterized in that it contains a water-soluble gold compound, citric acid or citrate. Ethyldiaminetetraacetic acid or ethyldiaminetetraacetate, hexamethylenetetramine, and a chain polyamine having an alkyl group having 3 or more carbon atoms and 3 or more amine groups.

本件發明之還元型無電解鍍金液係最好是pH值7.0~pH值9.0。 The regenerative electroless gold plating solution of the present invention preferably has a pH of 7.0 to a pH of 9.0.

在本件發明之還元型無電解鍍金液,前述之鏈狀聚胺係最好是3,3’-二胺基-N-甲基二丙胺或者是N,N’-雙(3-胺丙基)伸乙基二胺。 In the reductive electroless gold plating solution of the present invention, the above-mentioned chain polyamine is preferably 3,3'-diamino-N-methyldipropylamine or N,N'-bis(3-aminopropyl). ) Ethyl diamine.

本件發明之還元型無電解鍍金液係還更加最好是包含鉈化合物,來作為析出促進劑。 It is more preferable that the reductive electroless gold plating liquid system of the present invention contains a ruthenium compound as a precipitation promoter.

本件發明之無電解鍍金方法,其特徵為:使用前述之還元型無電解鍍金液,在被鍍物之表面,形成無電解鍍金皮膜。 The electroless gold plating method of the present invention is characterized in that an electroless gold plating film is formed on the surface of the object to be plated by using the above-mentioned reductive electroless gold plating solution.

在本件發明之無電解鍍金方法,前述之被鍍物表面係最好是存在銅、鈀、金或鎳之任何一種。 In the electroless gold plating method of the present invention, it is preferable that the surface of the object to be plated is any one of copper, palladium, gold or nickel.

此外,在本件發明之無電解鍍金方法,前述之被鍍物表面係最好是具備形成於無電解鍍鎳皮膜表面之無電解鍍鈀皮膜。 Further, in the electroless gold plating method of the present invention, it is preferable that the surface of the object to be plated is provided with an electroless palladium film formed on the surface of the electroless nickel plating film.

本件發明之電鍍製品,其特徵為:藉由前述之無 電解鍍金方法而進行無電解鍍金處理。 The electroplated article of the invention is characterized in that: Electroless gold plating is performed to perform electroless gold plating.

本件發明之還元型無電解鍍金液,係藉由包含:水溶性金化合物、檸檬酸或檸檬酸鹽、伸乙基二胺四乙酸或伸乙基二胺四乙酸鹽、六亞甲基四胺、以及含有碳數3以上之烷基和3個以上之胺基之鏈狀聚胺,而容易在被鍍物之表面,加厚鍍金皮膜。 The regenerative electroless gold plating solution of the present invention comprises: a water-soluble gold compound, citric acid or citrate, ethylenediaminetetraacetic acid or ethyldiaminetetraacetate, hexamethylenetetramine And a chain polyamine containing an alkyl group having 3 or more carbon atoms and 3 or more amine groups, and it is easy to thicken the gold plating film on the surface of the object to be plated.

此外,即使是在使用本發明之還元型無電解鍍金液而形成設置於電連接部位之鍍鎳皮膜/鍍鈀皮膜/鍍金皮膜之狀態下,也對於該鍍鈀皮膜之膜厚,無造成影響,可以在鍍鈀皮膜之表面,迅速地形成鍍金皮膜。此外,如果是藉由本件發明之還元型無電解鍍金液的話,則即使是在形成於無電解鍍鎳皮膜表面之無電解鍍鈀皮膜之表面來形成無電解鍍金皮膜之狀態下,也可以比起形成置換鍍金皮膜之狀態,還更加顯著地抑制鎳之溶出,可以防止鎳擴散至鍍金皮膜之擴散。於是,如果是藉由本件發明之還元型無電解鍍金液的話,則可以提供一種能夠實現高度之引線接合(wire-bonding)之接合可靠性之鍍金皮膜。 Further, even in the state in which the nickel-plated film/palladium-plated film/gold-plated film provided on the electrical connection portion is formed by using the reductive electroless gold plating solution of the present invention, the film thickness of the palladium plating film is not affected. A gold-plated film can be formed rapidly on the surface of the palladium-plated film. Further, according to the regenerative electroless gold plating solution of the present invention, even in the state in which the electroless gold plating film is formed on the surface of the electroless palladium film formed on the surface of the electroless nickel plating film, it is possible to In the state in which the gold plating film is formed, the dissolution of nickel is more remarkably suppressed, and diffusion of nickel to the gold plating film can be prevented. Therefore, according to the regenerative electroless gold plating solution of the present invention, it is possible to provide a gold plating film capable of achieving a high degree of wire-bonding bonding reliability.

此外,本發明之還元型無電解鍍金液係比起習知之無電解鍍金液,還更加提高溶液之安定性,無包含強毒性之甲醛或甲醛亞硫酸氫鹽附加物,因此,容易確保電鍍處理作業之安全性。 In addition, the reductive electroless gold plating liquid of the present invention further improves the stability of the solution compared to the conventional electroless gold plating liquid, and does not contain formaldehyde or formaldehyde bisulfite addition which is highly toxic, so that it is easy to ensure electroplating treatment. The safety of the work.

此外,本發明之還元型無電解鍍金液係金析出反應,僅發生於可以成為觸媒核之金、鈀、鎳、銅等之表面,無 發生於無觸媒核之部分,因此,選擇析出性係變得良好。於是,可以避免鍍金皮膜形成於無需要金析出之部分,有益於可以節省原料之方面。 Further, the gold-removing reaction of the reductive electroless gold plating liquid of the present invention occurs only on the surface of gold, palladium, nickel, copper or the like which can become a catalyst core, and It occurs in the part without the catalyst core, so the selection of the precipitation system becomes good. Therefore, it is possible to prevent the gold plating film from being formed in a portion where no gold is required to be deposited, which is advantageous in terms of saving raw materials.

圖1係顯示實施用試料群組1A之還元型無電解鍍金皮膜之電鍍時間和電鍍膜厚之間之關係之圖形。 Fig. 1 is a graph showing the relationship between the plating time and the plating film thickness of the reductive electroless gold plating film of the sample group 1A for execution.

圖2係顯示實施例2之還元型無電解鍍金皮膜之電鍍時間和電鍍膜厚之間之關係之圖形。 Fig. 2 is a graph showing the relationship between the plating time and the plating film thickness of the reductive electroless gold plating film of Example 2.

圖3係顯示在使用實施例1和比較例1之無電解鍍金液之狀態下之基底鍍鈀皮膜之膜厚和鍍金皮膜之析出速度之間之關係之圖形。 Fig. 3 is a graph showing the relationship between the film thickness of the underlying palladium plating film and the deposition rate of the gold plating film in the state in which the electroless gold plating solution of Example 1 and Comparative Example 1 was used.

圖4係實施用試料1A-2之還元型無電解鍍金皮膜之電子顯微鏡相片(×10000以及×30000)。 Fig. 4 is an electron micrograph (x 10000 and × 30000) of the reductive electroless gold plating film of the sample 1A-2.

圖5係實施用試料2-2及比較例2之還元型無電解鍍金皮膜之電子顯微鏡相片(×30000)。 Fig. 5 is an electron micrograph (x30000) of the reductive electroless gold plating film of the sample 2-2 and the comparative example 2.

圖6係在由實施用試料1A-2之電鍍皮膜來剝離還元型無電解鍍金皮膜和無電解鍍鈀皮膜之後之鍍鎳皮膜表面之電子顯微鏡相片(×5000)。 Fig. 6 is an electron micrograph (x5000) of the surface of the nickel-plated film after the rectifying type electroless gold plating film and the electroless palladium plating film were peeled off from the plating film of the sample 1A-2 for execution.

圖7係在由實施用試料2-2及比較例2之電鍍皮膜來剝離還元型無電解鍍金皮膜之後之鍍鎳皮膜表面之電子顯微鏡相片(×3000)。 Fig. 7 is an electron micrograph (x3000) of the surface of the nickel-plated film after the rectifying type electroless gold plating film was peeled off from the plating film of the sample for the execution of the sample 2-2 and the comparative example 2.

圖8係實施用試料1A-6之還元型無電解鍍金皮膜之剖面觀察相片(×30000)。 Fig. 8 is a cross-sectional observation photograph (x30000) of the reductive electroless gold plating film of the sample 1A-6.

圖9係藉由相同於實施用試料1A-6之同樣條件而形成電鍍皮膜之電鍍製品之端部和中央部之電子顯微鏡相片(×500)。 Fig. 9 is an electron micrograph (x500) of the end portion and the center portion of an electroplated article in which an electroplated film was formed under the same conditions as those for carrying out the sample 1A-6.

圖10係顯示在使用實施例1和比較例1之無電解鍍金液之狀態下之鎳溶出於鍍金液中之鎳溶出量之關係之圖。 Fig. 10 is a graph showing the relationship between the amount of nickel dissolved in the gold plating solution in the state in which the electroless gold plating solution of Example 1 and Comparative Example 1 was used.

圖11係顯示實施例2和比較例2之無電解鍍金皮膜之膜厚偏差之圖。 Fig. 11 is a graph showing the film thickness deviation of the electroless gold plating film of Example 2 and Comparative Example 2.

圖12係顯示實施例2和比較例2之無電解鍍金皮膜之引線接合(wire-bonding)特性之圖。 Fig. 12 is a graph showing the wire-bonding characteristics of the electroless gold plating film of Example 2 and Comparative Example 2.

在以下,就本件發明之還元型無電解鍍金液、使用該電鍍液之無電解鍍金方法以及藉由該方法而處理之電鍍製品之實施形態,分別進行說明。 Hereinafter, embodiments of the regenerative electroless gold plating solution of the present invention, the electroless gold plating method using the plating solution, and the electroplated product processed by the method will be separately described.

1.本發明之還元型無電解鍍金液 1. The reductive electroless gold plating solution of the present invention

本發明之還元型無電解鍍金液係使用在對於被鍍物表面之無電解鍍金皮膜之形成,其特徵為含有:「水溶性金化合物」、「檸檬酸或檸檬酸鹽」、「伸乙基二胺四乙酸或伸乙基二胺四乙酸鹽」、「六亞甲基四胺」、以及「含有碳數3以上之烷基和3個以上之胺基之鏈狀聚胺」。在以下,就各成分而分別進行敘述。 The regenerative electroless gold plating liquid of the present invention is formed by forming an electroless gold plating film on the surface of the object to be plated, and is characterized by: "water-soluble gold compound", "citric acid or citrate", and "ethylidene" Diaminetetraacetic acid or ethyldiaminetetraacetate, "hexamethylenetetramine", and "chain polyamine having an alkyl group having 3 or more carbon atoms and 3 or more amine groups". Hereinafter, each component will be described separately.

(1)水溶性金化合物 (1) Water-soluble gold compounds

使用於本發明之還元型無電解鍍金液之水溶性金化合物係可溶解於電鍍液,如果是得到規定之濃度的話,則可以使用氰系金鹽、非氰系金鹽之任何一種之水溶性金化合物。作為具體之氰系金鹽之水溶性金化合物係可以例舉氰系金 鉀、氰系金鈉、氰系金銨等。此外,作為具體之非氰系金鹽之水溶性金化合物係可以例舉氯化金酸鹽、亞硫酸金鹽、硫代硫酸金鹽等。即使是在這些當中,也特別最好是氰化金鉀。此外,水溶性金化合物係可以單獨一種或者是組合2種以上而使用。此外,水溶性金化合物係並非限定於這裡例舉之金化合物。 The water-soluble gold compound used in the reductive electroless gold plating solution of the present invention can be dissolved in the plating solution, and if the concentration is specified, the water solubility of any of the cyanide-based gold salt and the non-cyanide-based gold salt can be used. Gold compound. The water-soluble gold compound as a specific cyanide gold salt may be exemplified by a cyanide gold. Potassium, cyanide gold sodium, cyanide gold ammonium, and the like. Further, as the water-soluble gold compound of the specific non-cyanide gold salt, a chlorinated gold salt, a gold sulfite salt, a gold thiosulfate salt or the like can be exemplified. Even among these, it is particularly preferable to use potassium gold cyanide. Further, the water-soluble gold compound may be used singly or in combination of two or more. Further, the water-soluble gold compound is not limited to the gold compound exemplified herein.

本發明之還元型無電解鍍金液中之水溶性金化合物之濃度係最好是0.0025莫耳/L~0.0075莫耳/L。因為在水溶性金化合物之濃度未滿0.0025莫耳/L,鍍金皮膜之析出速度變慢,不容易得到要求之膜厚之鍍金皮膜之緣故。因為在水溶性金化合物之濃度超過0.0075莫耳/L之時,恐怕會降低電鍍液之安定性,並且,也不利於經濟上之緣故。 The concentration of the water-soluble gold compound in the reductive electroless gold plating solution of the present invention is preferably from 0.0025 mol/L to 0.0075 mol/L. Since the concentration of the water-soluble gold compound is less than 0.0025 mol/L, the deposition rate of the gold plating film is slow, and it is not easy to obtain a gold plating film having a desired film thickness. Since the concentration of the water-soluble gold compound exceeds 0.0075 mol/L, the stability of the plating solution may be lowered, and it is also disadvantageous for economic reasons.

(2)檸檬酸或檸檬酸鹽 (2) Citric acid or citrate

本發明之還元型無電解鍍金液係含有檸檬酸或檸檬酸鹽。這些檸檬酸或檸檬酸鹽係使用作為可以和金離子來形成配位化合物之配位劑。本發明之還元型無電解鍍金液中之檸檬酸或檸檬酸鹽之濃度係最好是0.05莫耳/L~0.15莫耳/L。因為在使用作為配位劑之這些檸檬酸或檸檬酸鹽之濃度未滿0.05莫耳/L,在電鍍液中,析出金,惡化溶液安定性之緣故,因為在超過0.15莫耳/L之狀態下,呈過剩地進行配位化合物之形成,降低金之析出速度,不容易得到要求之膜厚之鍍金皮膜之緣故。 The reductive electroless gold plating solution of the present invention contains citric acid or citrate. These citric acid or citrate are used as a complexing agent which can form a coordination compound with gold ions. The concentration of citric acid or citrate in the reductive electroless gold plating solution of the present invention is preferably from 0.05 mol/L to 0.15 mol/L. Since the concentration of these citric acid or citrate as a complexing agent is less than 0.05 mol/L, gold is precipitated in the plating solution, which deteriorates the stability of the solution because it is in a state exceeding 0.15 m/L. Next, the formation of a coordination compound is excessively performed to lower the rate of precipitation of gold, and it is not easy to obtain a gold plating film having a desired film thickness.

(3)伸乙基二胺四乙酸(EDTA)或伸乙基二胺四乙酸鹽 (3) Ethyldiaminetetraacetic acid (EDTA) or ethyldiaminetetraacetate

本發明之還元型無電解鍍金液係含有伸乙基二胺四乙酸(EDTA)或伸乙基二胺四乙酸鹽。該伸乙基二胺四乙 酸或伸乙基二胺四乙酸鹽係組合於前述之檸檬酸或檸檬酸鹽而使用之配位劑。本發明之還元型無電解鍍金液中之伸乙基二胺四乙酸或伸乙基二胺四乙酸鹽之濃度係最好是0.03莫耳/L~0.1莫耳/L。因為使用作為配位劑之伸乙基二胺四乙酸或伸乙基二胺四乙酸鹽之濃度未滿0.03莫耳/L,在電鍍液中,析出金,惡化溶液安定性之緣故,以及因為在超過0.1莫耳/L之狀態下,呈過剩地進行配位化合物之形成,降低金之析出速度,不容易得到要求之膜厚之鍍金皮膜之緣故。 The reductive electroless gold plating solution of the present invention contains exoethyldiaminetetraacetic acid (EDTA) or ethylidene diamine tetraacetate. Ethyldiamine tetraethylene The acid or exoethyldiaminetetraacetate is a complexing agent used in combination with the aforementioned citric acid or citrate. The concentration of the extended ethylenediaminetetraacetic acid or the ethylidenediamine tetraacetate in the reductive electroless gold plating solution of the present invention is preferably 0.03 mol/L to 0.1 mol/L. Because the concentration of ethyldiaminetetraacetic acid or ethyldiaminetetraacetate as a complexing agent is less than 0.03 mol/L, gold is precipitated in the plating solution, which deteriorates the stability of the solution, and because In the state of more than 0.1 mol/L, the formation of a coordination compound is excessively performed, the rate of precipitation of gold is lowered, and a gold plating film having a desired film thickness is not easily obtained.

(4)六亞甲基四胺 (4) hexamethylenetetramine

本發明之還元型無電解鍍金液係含有六亞甲基四胺。該六亞甲基四胺係還元電鍍液中之金離子,使用作為在被鍍物之表面來析出金之還元劑。 The reductive electroless gold plating solution of the present invention contains hexamethylenetetramine. The gold ion in the hexamethylenetetramine-based plating solution is used as a reductant for depositing gold on the surface of the object to be plated.

本發明之還元型無電解鍍金液中之六亞甲基四胺之濃度係最好是0.003莫耳/L~0.009莫耳/L。因為在六亞甲基四胺之濃度未滿0.003莫耳/L,鍍金皮膜之析出速度變慢,不容易得到要求之膜厚之鍍金皮膜,在超過0.009莫耳/L之時,急速地進行還元反應,有異常析出電鍍液中之金鹽之狀態發生,惡化溶液安定性,也不利於經濟上之緣故。 The concentration of hexamethylenetetramine in the reductive electroless gold plating solution of the present invention is preferably from 0.003 mol/L to 0.009 mol/L. Since the concentration of hexamethylenetetramine is less than 0.003 mol/L, the deposition rate of the gold plating film becomes slow, and the gold plating film of the desired film thickness is not easily obtained, and when it exceeds 0.009 m/L, it is rapidly performed. The reversion reaction has an abnormal precipitation of the state of the gold salt in the plating solution, which deteriorates the stability of the solution, and is also disadvantageous for economic reasons.

(5)鏈狀聚胺 (5) Chain polyamine

此外,本發明之還元型無電解鍍金液係含有包含碳數3以上之烷基和3個以上之胺基之鏈狀聚胺。該鏈狀聚胺係作用成為用以補助電鍍液中之金離子之還元之還元補助劑之胺化合物。作為該鏈狀聚胺係可以具體地使用3,3’-二胺基-N-甲基二丙胺、N,N’-雙(3-胺丙基)伸乙基二胺等。因 為由得到之電鍍皮膜性能或經濟性來看的話,則變得特別好之緣故。 Further, the reductive electroless gold plating solution of the present invention contains a chain polyamine containing an alkyl group having 3 or more carbon atoms and 3 or more amine groups. The chain polyamine acts as an amine compound for supplementing the reductant of the gold ion in the plating solution. As the chain polyamine system, 3,3'-diamino-N-methyldipropylamine, N,N'-bis(3-aminopropyl)ethylidene diamine or the like can be specifically used. because In view of the performance or economy of the obtained plating film, it becomes particularly good.

本發明之還元型無電解鍍金液中之該鏈狀聚胺之濃度係最好是0.02莫耳/L~0.06莫耳/L。可以藉由鏈狀聚胺之濃度成為0.02莫耳/L~0.06莫耳/L之範圍,而無影響到基底金屬皮膜之膜厚,維持高析出速度。此外,可以提高鍍金皮膜之周圍附著性,可以增厚鍍金皮膜而成為0.2μm以上。此外,還能夠顯著地提高溶液安定性。 The concentration of the chain polyamine in the reductive electroless gold plating solution of the present invention is preferably 0.02 mol/L to 0.06 mol/L. The concentration of the chain polyamine can be in the range of 0.02 mol/L to 0.06 mol/L without affecting the film thickness of the base metal film and maintaining a high deposition rate. Further, the adhesion around the gold plating film can be improved, and the gold plating film can be thickened to 0.2 μm or more. In addition, the stability of the solution can be remarkably improved.

(6)其他成分 (6) Other ingredients

在本發明之還元型無電解鍍金液,除了前述之水溶性金化合物、檸檬酸或檸檬酸鹽、伸乙基二胺四乙酸或伸乙基二胺四乙酸鹽、六亞甲基四胺、以及含有碳數3以上之烷基和3個以上之胺基之鏈狀聚胺以外,還可以含有析出促進劑。作為使用於此之析出促進劑係列舉鉈化合物或鉛化合物。由得到之鍍金皮膜之厚膜化之觀點來看的話,則最好是使用鉈化合物。 In the reductive electroless gold plating solution of the present invention, in addition to the aforementioned water-soluble gold compound, citric acid or citrate, ethylenediaminetetraacetic acid or ethyldiaminetetraacetate, hexamethylenetetramine, Further, a chain-like polyamine having an alkyl group having 3 or more carbon atoms and three or more amine groups may further contain a precipitation accelerator. As a series of precipitation promoters used herein, a ruthenium compound or a lead compound is used. From the viewpoint of thick film formation of the obtained gold plating film, it is preferable to use a ruthenium compound.

作為本發明之還元型無電解鍍金液中之析出促進劑之鉈化合物之濃度係最好是1mg/L~10mg/L。在作為析出促進劑之鉈化合物之濃度未滿1mg/L,不容易進行鍍金皮膜之厚膜化。此外,在作為析出促進劑之鉈化合物之濃度超過10mg/L之時,無法達到這個以上之厚膜化,不利於經濟上。 The concentration of the ruthenium compound as the precipitation promoter in the reductive electroless gold plating solution of the present invention is preferably from 1 mg/L to 10 mg/L. When the concentration of the ruthenium compound as the precipitation promoter is less than 1 mg/L, it is not easy to form a thick film of the gold plating film. Further, when the concentration of the ruthenium compound as the precipitation promoter exceeds 10 mg/L, the above thick film formation cannot be achieved, which is disadvantageous in terms of economy.

本發明之還元型無電解鍍金液係除了前述之必要成分以外,還可以含有pH值調整劑、氧化防止劑、界面活性劑、光澤劑等之添加劑。 The reductive electroless gold plating liquid of the present invention may further contain an additive such as a pH adjuster, an oxidation preventive agent, a surfactant, or a gloss agent in addition to the above-mentioned essential components.

作為pH值調整劑係並無特別限制,列舉氫氧化鉀、氫氧化鈉、氨水溶液、硫酸、磷酸等。本發明之還元型無電解鍍金液係最好是藉由使用pH值調整劑而維持於pH值7.0~pH值9.0。因為在還元型無電解鍍金液之pH值低於7.0之時,容易分解電鍍液,在pH值高於9.0之時,電鍍液呈過度地安定而減緩電鍍之析出速度,在鍍金皮膜之厚膜化,需要很多之時間之緣故。此外,也可以藉由調整pH值之條件,成為7.0~9.0,而進行以微弱於鹼之材料來構成之被鍍物之電鍍處理。此外,作為氧化防止劑、界面活性劑、光澤劑等之添加劑係可以使用習知者。 The pH adjusting agent is not particularly limited, and examples thereof include potassium hydroxide, sodium hydroxide, an aqueous ammonia solution, sulfuric acid, and phosphoric acid. The reductive electroless gold plating solution of the present invention is preferably maintained at a pH of 7.0 to a pH of 9.0 by using a pH adjusting agent. Because the pH of the non-electroless gold plating solution is lower than 7.0, the plating solution is easily decomposed. When the pH is higher than 9.0, the plating solution is excessively stabilized to slow the deposition rate of the plating, and the thick film of the gold plating film It takes a lot of time. Further, it is also possible to carry out a plating treatment of a material to be plated which is made of a material which is weaker than an alkali, by adjusting the pH value to 7.0 to 9.0. Further, as an additive such as an oxidation preventive agent, a surfactant, a gloss agent or the like, a conventional one can be used.

(7)電鍍條件 (7) Plating conditions

使用本發明之還元型無電解鍍金液之鍍金條件係並無特別限定,但是,液溫係最好是40℃~90℃,特別最好是75℃~85℃。電鍍時間係也並無特別限定,但是,最好是1分~2小時,特別最好是2分~1小時。 The gold plating conditions using the reductive electroless gold plating solution of the present invention are not particularly limited, but the liquid temperature is preferably 40 ° C to 90 ° C, particularly preferably 75 ° C to 85 ° C. The plating time is also not particularly limited, but it is preferably 1 minute to 2 hours, particularly preferably 2 minutes to 1 hour.

本發明之還元型無電解鍍金液係正如前面之敘述,藉由以水溶性金化合物、檸檬酸或檸檬酸鹽、伸乙基二胺四乙酸或伸乙基二胺四乙酸鹽、六亞甲基四胺、以及含有碳數3以上之烷基和3個以上之胺基之鏈狀聚胺,來作為必要成分,藉由無電解電鍍法,而容易在被鍍物之表面,增加附著鍍金皮膜之厚度。 The reductive electroless gold plating liquid of the present invention is as described above by using a water-soluble gold compound, citric acid or citrate, ethylenediaminetetraacetic acid or ethyldiaminetetraacetate, and hexamethylene A tetraamine and a chain polyamine having an alkyl group having 3 or more carbon atoms and 3 or more amine groups are used as an essential component, and an electroless plating method is applied to easily increase adhesion gold plating on the surface of the object to be plated. The thickness of the film.

此外,即使是在形成設置於電連接部位之鍍鎳皮膜/鍍鈀皮膜/鍍金皮膜之狀態下,也可以藉由使用本發明之還元型無電解鍍金液,而無受到鍍鈀皮膜之膜厚之影響,在鍍 鈀皮膜之表面,呈迅速地形成鍍金皮膜。此外,即使是在形成於無電解鍍鎳皮膜表面之無電解鍍鈀皮膜之表面來形成無電解鍍金皮膜之狀態下,也可以藉由使用本件發明之還元型無電解鍍金液,而比起形成置換型鍍金皮膜之狀態,還更加顯著地抑制鎳之溶出,可以防止鎳擴散至鍍金皮膜之擴散。於是,如果是藉由本件發明之還元型無電解鍍金液的話,則能夠提供可以實現高度之引線接合(wire-bonding)之接合可靠性之鍍金皮膜。 Further, even in the state in which the nickel plating film/palladium plating film/gold plating film provided on the electrical connection portion is formed, the film thickness of the palladium plating film can be obtained by using the reductive electroless gold plating solution of the present invention. Influence, plating The surface of the palladium film rapidly forms a gold-plated film. Further, even in the state in which an electroless gold plating film is formed on the surface of the electroless palladium film formed on the surface of the electroless nickel plating film, it is possible to form by using the regenerative electroless gold plating solution of the present invention. The state of the replacement type gold plating film further suppresses the elution of nickel more significantly, and prevents the diffusion of nickel to the diffusion of the gold plating film. Therefore, according to the regenerative electroless gold plating solution of the present invention, it is possible to provide a gold plating film which can achieve a high degree of wire-bonding bonding reliability.

此外,本發明之還元型無電解鍍金液係比起習知之無電解鍍金液,溶液之安定性比較高。例如在補給電鍍液同時進行連續電鍍之狀態下,作為電鍍液之老朽化之指標係使用金屬週期超過(MTO。以建浴時之電鍍液中之金呈全部析出之狀態,來作為1週期。)。在習知之還元型無電解鍍金液之狀態下,MTO為2.0~3.0週期,相對地,本發明之還元型無電解鍍金液係可以實現MTO為5.0週期以上。 Further, the reductive electroless gold plating liquid of the present invention has a higher stability of the solution than the conventional electroless gold plating liquid. For example, in the state in which the plating solution is continuously electroplated, as the indicator of the deterioration of the plating solution, the metal period is exceeded (MTO), and the gold in the plating solution at the time of the bath is completely precipitated as one cycle. ). In the state of the conventional regenerative electroless gold plating solution, the MTO is 2.0 to 3.0 cycles, and the reductive electroless gold plating liquid of the present invention can achieve an MTO of 5.0 cycles or more.

此外,本發明之還元型無電解鍍金液係無包含習知之還元型無電解鍍金液之所包含之強毒性之甲醛或甲醛亞硫酸氫鹽附加物,因此,容易確保電鍍處理作業之安全性。 Further, the reductive electroless gold plating liquid of the present invention does not contain the highly toxic formaldehyde or formaldehyde bisulfite addition contained in the conventional rectifying electroless gold plating liquid, and therefore, it is easy to ensure the safety of the plating treatment work.

此外,本發明之還元型無電解鍍金液係金析出反應,僅發生於可以成為觸媒核之金、鈀、鎳、銅等之表面,無發生於無觸媒核之部分,因此,選擇析出性係變得良好。於是,可以避免鍍金皮膜形成於無需要金析出之部分之形成,有益於可以節省原料之方面。 Further, the gold-removing reaction of the reductive electroless gold plating liquid of the present invention occurs only on the surface of gold, palladium, nickel, copper, or the like which can serve as a catalyst core, and does not occur in the portion having no catalyst core, so that precipitation is selected. The sex system has become good. Therefore, it is possible to prevent the formation of the gold plating film on the portion where no gold is required to be deposited, which is advantageous in that the raw material can be saved.

2.無電解鍍金方法 2. Electroless gold plating method

接著,就本發明之無電解鍍金方法而進行說明。在本發明之無電解鍍金方法,使用前述之任何一種之還元型無電解鍍金液,在被鍍物之表面,進行無電解鍍金處理,形成鍍金皮膜。在該無電解鍍金方法,相同於通常之還元型無電解電鍍之處理方法,藉由被鍍物來浸漬於無電解鍍金液中之方法,而進行電鍍處理。 Next, the electroless gold plating method of the present invention will be described. In the electroless gold plating method of the present invention, an electroless gold plating treatment is performed on the surface of the object to be plated using any of the above-described reductive electroless gold plating solutions to form a gold plating film. In the electroless gold plating method, similar to the usual refraction type electroless plating treatment method, a plating treatment is performed by immersing the object to be deposited in an electroless gold plating solution.

在本發明之無電解鍍金方法,成為處理對象之被鍍物之表面係最好是存在銅、鈀、金、鎳之任何一種。如果是在被鍍物之表面來存在銅、鈀、金、鎳之任何一種的話,則其存在形態係可以是任何一種狀態。特別更加最好是使用藉由銅而構成被鍍物本身者或者是在被鍍物之表面具有由銅、鈀、金、鎳或含有這些金屬之合金而組成之皮膜之任何一種者。例如作為含有這些金屬之合金係可以列舉金鈷。金、鈀、鎳、銅或含有這些金屬之合金係成為本發明之無電解鍍金之基底金屬,這些金屬或合金係對於包含在前述之還元型無電解鍍金液之作為還元劑之六亞甲基四胺,發揮觸媒活性作用。作為形成於被鍍物表面之皮膜係特別最好是使用無電解鍍鈀皮膜、置換鍍金皮膜或鍍銅皮膜。例如在印刷電路板之電路之構裝部分或端子部分之表面來施行無電解鍍鎳之狀態下,最好是在該無電解鍍鎳皮膜之表面,形成無電解鍍鈀皮膜。因為如果是在鍍鎳皮膜之表面來形成鍍鈀皮膜的話,則特別有效於可以防止鍍鎳皮膜來擴散至鍍金皮膜之擴散之方面之緣故。 In the electroless gold plating method of the present invention, it is preferable that any of copper, palladium, gold, and nickel is present on the surface of the object to be treated. If any of copper, palladium, gold, and nickel is present on the surface of the object to be plated, the form of existence may be in any state. It is particularly preferable to use any one of the object to be plated by copper or a film composed of copper, palladium, gold, nickel or an alloy containing these metals on the surface of the object to be plated. For example, as an alloy containing these metals, gold cobalt is mentioned. Gold, palladium, nickel, copper or an alloy containing these metals is the base metal of the electroless gold plating of the present invention, and the metal or alloy is a hexamethylene group as a reductant contained in the above-mentioned reductive electroless gold plating solution. Tetraamine acts as a catalyst. As the film formed on the surface of the object to be plated, it is particularly preferable to use an electroless palladium film, a replacement gold plating film or a copper plating film. For example, in the state where electroless nickel plating is performed on the surface of the circuit portion of the printed circuit board or the terminal portion, it is preferable to form an electroless palladium film on the surface of the electroless nickel plating film. If the palladium plating film is formed on the surface of the nickel plating film, it is particularly effective in preventing the diffusion of the nickel plating film to the diffusion of the gold plating film.

3.電鍍製品 3. Electroplating products

接著,就本發明之電鍍製品而進行說明。本發明 之電鍍製品,其特徵為:在被鍍物之表面,使用前述之任何一種之無電解鍍金液,藉由前述之無電解鍍金方法,而在被鍍物之表面,進行無電解鍍金處理。即使是在其中,也最好是使用pH值7.0~9.0之還元型無電解鍍金液,在被鍍物之表面,施行無電解鍍金處理。此外,如果是在被鍍物之表面來存在銅、鈀、金、鎳之任何一種的話,則其存在形態係可以是任何一種狀態。特別更加最好是使用藉由銅而構成被鍍物本身者或者是在被鍍物之表面具有由銅、鈀、金、鎳或含有這些金屬之合金而組成之皮膜之任何一種者。即使是在其中,也作為形成於被鍍物表面之皮膜係最好是使用無電解鍍鈀皮膜、置換鍍金皮膜或鍍銅皮膜。特別是作為在表面來具備無電解鍍鈀皮膜之被鍍物係最好是形成無電解鍍鎳皮膜,來作為該無電解鍍鈀皮膜之下層。因為使用前述之還元型無電解鍍金液之電鍍處理係特別適合使用在電連接部位之電鍍皮膜之形成之緣故。 Next, the electroplated product of the present invention will be described. this invention The electroplated product is characterized in that an electroless gold plating treatment is performed on the surface of the object to be plated by using the electroless gold plating solution of any one of the above-mentioned electroless gold plating methods on the surface of the object to be plated. Even in this case, it is preferable to use an electroless gold plating solution having a pH of 7.0 to 9.0 to perform an electroless gold plating treatment on the surface of the object to be plated. Further, if any one of copper, palladium, gold, and nickel is present on the surface of the object to be plated, the form of its existence may be in any state. It is particularly preferable to use any one of the object to be plated by copper or a film composed of copper, palladium, gold, nickel or an alloy containing these metals on the surface of the object to be plated. Even in the case, it is preferable to use an electroless palladium film, a replacement gold plating film or a copper plating film as the film formed on the surface of the object to be plated. In particular, it is preferable to form an electroless nickel plating film as a substrate to be plated with an electroless palladium film on the surface as the underlayer of the electroless palladium film. Since the plating treatment using the above-described reductive electroless gold plating solution is particularly suitable for the formation of an electroplated film at an electrical connection portion.

以上說明之本發明之實施形態係本發明之某一形態,當然可以在無脫離本發明之意旨之範圍內,適度地進行變更。 The embodiment of the present invention described above is an embodiment of the present invention, and it is a matter of course that the present invention can be appropriately modified without departing from the scope of the invention.

在以下,列舉:使用本件發明之還元型無電解鍍金液而製作之鍍金皮膜之實施例1和實施例2、使用置換型無電解鍍金液而製作之鍍金皮膜之比較例1、以及使用習知之還元型無電解電鍍液而製作之鍍金皮膜之比較例2,更加具體地說明本發明。但是,本發明係並非限定於以下說明之實施例,為了提醒而事先說明。 In the following, the first example and the second embodiment of the gold-plated film produced by using the regenerative electroless gold plating solution of the present invention, and the comparative example 1 of the gold-plated film produced by using the replacement electroless gold plating solution are listed, and the conventional example is used. The present invention will be more specifically described in Comparative Example 2 of a gold-plated film produced by a regenerative electroless plating solution. However, the present invention is not limited to the embodiments described below, and will be described in advance for reminding.

【實施例1】 [Example 1]

在實施例1,使用適用本件發明之還元型無電解鍍金液,以銅板作為基板,在該基板上,形成由無電解鍍鎳皮膜/無電解鍍鈀皮膜/無電解鍍金皮膜而組成之電鍍皮膜。 In the first embodiment, a re-type electroless gold plating solution to which the present invention is applied is used, and a copper plate is used as a substrate, and an electroplated film composed of an electroless nickel plating film/electroless palladium plating film/electroless gold plating film is formed on the substrate. .

還元型無電解鍍金液之調整:在以下,顯示使用於本實施例之還元型無電解鍍金液之組成。一併顯示電鍍條件(pH值、液溫)和組成。 Adjustment of the regenerative electroless gold plating liquid: In the following, the composition of the reductive electroless gold plating liquid used in the present embodiment is shown. The plating conditions (pH, liquid temperature) and composition are also shown.

電鍍皮膜之製作:作為實施例1之附加電鍍皮膜之試料係由實施用試料群組1A~實施用試料群組1D而組成。這些實施用試料群組1A~實施用試料群組1D係藉由無電解鍍鈀皮膜之膜厚之不同而分別。 Preparation of Electroplated Film: The sample to be used as the additional plating film of Example 1 was composed of the sample group 1A for execution and the sample group 1D for execution. The sample group 1A for the implementation of the sample group 1A for the execution is different from the film thickness of the electroless palladium film.

實施用試料群組1A係由實施用試料1A-1~實施用試料1A-6而組成,各實施用試料係在銅板之表面來形成5μm膜厚之無電解鍍鎳皮膜之後,在該無電解鍍鎳皮膜之表面,形成0.1μm膜厚之無電解鍍鈀皮膜。然後,使用前述之還元型無電解鍍金液,配合各電鍍時間之條件而在無電解鍍鈀皮膜之表面,形成還元型無電解鍍金皮膜。具體地說,實施用試 料1A-1~實施用試料1A-6係還元型無電解鍍金皮膜形成時之電鍍時間之條件,成為10分鐘、20分鐘、30分鐘、40分鐘、50分鐘、60分鐘而得到附加鍍金皮膜之試料。 The sample group 1A for execution is composed of the sample 1A-1 for execution and the sample 1A-6 for execution, and each sample for application is formed on the surface of a copper plate to form an electroless nickel plating film having a film thickness of 5 μm, and then the electroless nickel plating film is used. The surface of the nickel plating film was formed to form an electroless palladium film having a film thickness of 0.1 μm. Then, a reductive electroless gold plating film is formed on the surface of the electroless palladium film by using the above-described reductive electroless gold plating solution in accordance with the conditions of each plating time. Specifically, the implementation test The conditions of the plating time in the formation of the sample 1A-6-return type electroless gold plating film are 10 minutes, 20 minutes, 30 minutes, 40 minutes, 50 minutes, and 60 minutes, and an additional gold plating film is obtained. Sample.

實施用試料群組1B係由實施用試料1B-1~實施用試料1B-6而組成,除了無電解鍍鈀皮膜之膜厚為0.2μm以外,其餘係相同於實施用試料群組1A而進行製作。此外,各實施用試料1B-1~實施用試料1B-6係相同於實施用試料1A-1~實施用試料1A-6而使得在還元型無電解鍍金皮膜形成時之電鍍時間之條件呈不同。 The sample group 1B for the reaction is composed of the sample 1B-1 for the execution of the sample 1B-6, and the film thickness of the electroless palladium film is 0.2 μm, which is the same as the sample group 1A for the execution. Production. In addition, each of the sample 1B-1 to the sample 1B-6 for execution is the same as the sample 1A-1 to the sample 1A-6 for execution, so that the conditions of the plating time when the reductive electroless gold plating film is formed are different. .

實施用試料群組1C係由實施用試料1C-1~實施用試料1C-6而組成,除了無電解鍍鈀皮膜之膜厚為0.4μm以外,其餘係相同於實施用試料群組1A而進行製作。此外,各實施用試料1C-1~實施用試料1C-6係相同於實施用試料1A-1~實施用試料1A-6而使得在還元型無電解鍍金皮膜形成時之電鍍時間之條件呈不同。 The sample group 1C for the reaction was composed of the sample 1C-1 for the execution of the sample 1C-6, and the film thickness of the electroless palladium film was 0.4 μm, which was the same as the sample group 1A for the execution. Production. In addition, each of the sample 1C-1 to the sample for execution 1C-6 is the same as the sample 1A-1 for execution 1A-6, and the conditions for the plating time when the non-electroless gold plating film is formed are different. .

實施用試料群組1D係由實施用試料1D-1~實施用試料1D-6而組成,除了無電解鍍鈀皮膜之膜厚為0.6μm以外,其餘係相同於實施用試料群組1A而進行製作。此外,各實施用試料1D-1~實施用試料1D-6係相同於實施用試料1A-1~實施用試料1A-6而使得在還元型無電解鍍金皮膜形成時之電鍍時間之條件呈不同。 The sample group 1D for the reaction is composed of the sample 1D-1 for the execution of the sample 1D-6, and the film thickness of the electroless palladium film is 0.6 μm, which is the same as the sample group 1A for the execution. Production. In addition, each of the sample 1D-1 to the sample 1D-6 for execution is the same as the sample 1A-1 to the sample 1A-6 for execution, so that the conditions of the plating time when the reductive electroless gold plating film is formed are different. .

【實施例2】 [Example 2]

在實施例2,使用相同於實施例1之還元型無電解鍍金液,以銅板作為基板,在該基板上,形成由無電解鍍鎳皮 膜/置換型無電解鍍金皮膜/還元型無電解鍍金皮膜而組成之電鍍皮膜。作為實施例2之附加電鍍皮膜之試料係由實施用試料2-1~實施用試料2-6而組成。各實施用試料2-1~實施用試料2-6係在銅板之表面來形成5μm膜厚之無電解鍍鎳皮膜之後,在該無電解鍍鎳皮膜之表面,形成0.07μm膜厚之置換型無電解鍍金皮膜。然後,使用前述之還元型無電解鍍金液,配合各電鍍時間之條件而在置換型無電解鍍金皮膜之表面,形成還元型無電解鍍金皮膜。此外,各實施用試料2-1~實施用試料2-6係相同於實施用試料1A-1~實施用試料1A-6而使得在還元型無電解鍍金皮膜形成時之電鍍時間之條件呈不同。 In Example 2, the reductive electroless gold plating solution similar to that of Example 1 was used, and a copper plate was used as a substrate on which an electroless nickel plating film was formed. Electroplated film composed of a film/displacement type electroless gold plating film/return type electroless gold plating film. The sample of the additional plating film of Example 2 was composed of the sample for the execution of the sample 2-1 to the sample for the execution of the sample 2-6. Each of the sample for analysis 2-1 to the sample for application 2-6 was formed on the surface of a copper plate to form an electroless nickel plating film having a thickness of 5 μm, and then a substitution type of a film thickness of 0.07 μm was formed on the surface of the electroless nickel plating film. Electroless gold plating film. Then, using the above-described reductive electroless gold plating solution, a regenerative electroless gold plating film is formed on the surface of the replacement electroless gold plating film in accordance with the conditions of each plating time. In addition, each of the sample for the execution of the sample 2-1 to the sample for the application 2-6 is the same as the sample for the execution of the sample 1A-1 to the sample for the application 1A-6, so that the conditions of the plating time at the time of forming the regenerative electroless gold plating film are different. .

【比較例】 [Comparative example] [比較例1] [Comparative Example 1]

在比較例1,使用置換型無電解鍍金液,相同於實施例1,以銅板作為基板,在該基板上,形成由無電解鍍鎳皮膜/無電解鍍鈀皮膜/無電解鍍金皮膜而組成之電鍍皮膜。 In Comparative Example 1, a replacement electroless gold plating solution was used, and in the same manner as in Example 1, a copper plate was used as a substrate, and an electroless nickel plating film/electroless palladium plating film/electroless gold plating film was formed on the substrate. Electroplated film.

置換型無電解鍍金液之調整:在以下,顯示使用於比較例1之置換型無電解鍍金液之組成。一併顯示電鍍條件(pH值、液溫)和組成。 Adjustment of Displacement Type Electroless Gold Plating Solution: The composition of the substitution type electroless gold plating solution used in Comparative Example 1 is shown below. The plating conditions (pH, liquid temperature) and composition are also shown.

液溫 80℃ Liquid temperature 80 ° C

電鍍皮膜之製作:作為比較例1之附加電鍍皮膜之試料係由比較用試料群組1A~比較用試料群組1D而組成。這些比較用試料群組1A~比較用試料群組1D係藉由無電解鍍鈀皮膜之膜厚之不同而分別。 Preparation of Electroplated Film: The sample of the additional plating film of Comparative Example 1 was composed of the comparative sample group 1A to the comparative sample group 1D. The comparative sample group 1A to the comparative sample group 1D were respectively different in film thickness of the electroless palladium film.

比較用試料群組1A係由比較用試料1A-1~比較用試料1A-6而組成,各比較用試料係在銅板之表面來形成5μm膜厚之無電解鍍鎳皮膜之後,在該無電解鍍鎳皮膜之表面,形成0.1μm膜厚之無電解鍍鈀皮膜。然後,使用前述之置換型無電解鍍金液,配合各電鍍時間之條件而在無電解鍍鈀皮膜之表面,形成置換型無電解鍍金皮膜。具體地說,比較用試料1A-1~比較用試料1A-6係置換型無電解鍍金皮膜形成時之電鍍時間之條件,成為10分鐘、20分鐘、30分鐘、40分鐘、50分鐘、60分鐘而得到附加鍍金皮膜之試料。 The comparative sample group 1A was composed of the comparative sample 1A-1 to the comparative sample 1A-6, and each comparative sample was formed on the surface of the copper plate to form an electroless nickel plating film having a film thickness of 5 μm, and then the electroless nickel plating film was used. The surface of the nickel plating film was formed to form an electroless palladium film having a film thickness of 0.1 μm. Then, a replacement electroless gold plating film was formed on the surface of the electroless palladium plating film by using the above-described replacement type electroless gold plating solution in accordance with the conditions of each plating time. Specifically, the conditions of the plating time at the time of forming the comparative sample 1A-1 to the comparative sample 1A-6-based replacement type electroless gold plating film are 10 minutes, 20 minutes, 30 minutes, 40 minutes, 50 minutes, 60 minutes. A sample of an additional gold-plated film was obtained.

比較用試料群組1B係由比較用試料1B-1~比較用試料1B-6而組成,除了無電解鍍鈀皮膜之膜厚為0.2μm以外,其餘係相同於比較用試料群組1A而進行製作。此外,各比較用試料1B-1~比較用試料1B-6係相同於比較用試料1A-1~比較用試料1A-6而使得在置換型無電解鍍金皮膜形成時之電鍍時間之條件呈不同。 The sample group 1B for comparison was composed of the sample for comparison 1B-1 to the sample for comparison 1B-6, and the film thickness of the electroless palladium film was 0.2 μm, which was the same as that of the sample group 1A for comparison. Production. In addition, each of the comparative sample 1B-1 to the comparative sample 1B-6 is the same as the comparative sample 1A-1 to the comparative sample 1A-6, so that the conditions of the plating time at the time of formation of the replacement type electroless gold plating film are different. .

比較用試料群組1C係由比較用試料1C-1~比較用試料1C-6而組成,除了無電解鍍鈀皮膜之膜厚為0.4μm以外,其餘係相同於比較用試料群組1A而進行製作。此外,各比較用試料1C-1~比較用試料1C-6係相同於比較用試料 1A-1~比較用試料1A-6而使得在置換型無電解鍍金皮膜形成時之電鍍時間之條件呈不同。 The comparative sample group 1C was composed of the comparative sample 1C-1 to the comparative sample 1C-6, and the sample was the same as the comparative sample group 1A except that the film thickness of the electroless palladium film was 0.4 μm. Production. In addition, each comparative sample 1C-1 to comparative sample 1C-6 is the same as the comparative sample. 1A-1 to Comparative Sample 1A-6, the conditions of the plating time at the time of formation of the replacement type electroless gold plating film were different.

比較用試料群組1D係由比較用試料1D-1~比較用試料1D-6而組成,除了無電解鍍鈀皮膜之膜厚為0.6μm以外,其餘係相同於比較用試料群組1A而進行製作。此外,各比較用試料1D-1~比較用試料1D-6係相同於比較用試料1A-1~比較用試料1A-6而使得在置換型無電解鍍金皮膜形成時之電鍍時間之條件呈不同。 The comparative sample group 1D was composed of the comparative sample 1D-1 to the comparative sample 1D-6, and the sample was the same as the comparative sample group 1A except that the film thickness of the electroless palladium film was 0.6 μm. Production. In addition, each of the comparative sample 1D-1 to the comparative sample 1D-6 is the same as the comparative sample 1A-1 to the comparative sample 1A-6, so that the conditions of the plating time at the time of formation of the replacement type electroless gold plating film are different. .

[比較例2] [Comparative Example 2]

在比較例2,使用習知之還元型無電解鍍金液,相同於實施例2,以銅板作為基板,在該基板上,形成由無電解鍍鎳皮膜/置換型無電解鍍金皮膜/習知之還元型無電解鍍金皮膜而組成之電鍍皮膜。 In Comparative Example 2, a conventional reductive electroless gold plating solution was used, and in the same manner as in Example 2, a copper plate was used as a substrate, and an electroless nickel plating film/displacement type electroless gold plating film was formed on the substrate. Electroplated film composed of electroless gold plating film.

習知之還元型無電解鍍金液之調整:在以下,顯示使用於比較例2之還元型無電解鍍金液之組成。一併顯示電鍍條件(pH值、液溫)和組成。 Adjustment of the conventional non-electroless gold plating solution: The composition of the reductive electroless gold plating solution used in Comparative Example 2 is shown below. The plating conditions (pH, liquid temperature) and composition are also shown.

電鍍皮膜之製作:比較例2係在銅板之表面來形 成5μm膜厚之無電解鍍鎳皮膜之後,在該無電解鍍鎳皮膜之表面,形成0.05μm膜厚之置換型無電解鍍金皮膜。然後,使用前述之還元型無電解鍍金液,在置換型無電解鍍金皮膜之表面,形成0.20μm膜厚之還元型無電解鍍金皮膜。 Production of electroplated film: Comparative Example 2 is formed on the surface of a copper plate After forming an electroless nickel plating film having a film thickness of 5 μm, a substitution-type electroless gold plating film having a film thickness of 0.05 μm was formed on the surface of the electroless nickel plating film. Then, using the above-described reductive electroless gold plating solution, a rectifying type electroless gold plating film having a film thickness of 0.20 μm was formed on the surface of the replacement electroless gold plating film.

[評價] [Evaluation]

接著,就使用本件發明之還元型無電解鍍金液而製作之鍍金皮膜之實施例1及實施例2而言,關於析出速度和表面形態等而進行評價。在以下,配合需要而以實施例1和實施例2以及使用置換型無電解鍍金液而製作之鍍金皮膜之比較例1和使用習知之還元型無電解鍍金液而製作之鍍金皮膜之比較例2,來作為對比,具體地進行敘述。 Next, Examples 1 and 2 of the gold plating film produced by using the reductive electroless gold plating solution of the present invention were evaluated for the deposition rate, the surface morphology, and the like. In the following, Comparative Example 1 of Example 1 and Example 2, and a gold-plated film produced by using a replacement electroless gold plating solution, and a gold-plated film produced by using a conventional reductive electroless gold plating solution were used as needed. , as a comparison, specifically described.

析出速度:在使用本發明之還元型無電解鍍金液之實施例1之中,在圖1,顯示實施用試料群組1A(實施用試料1A-1~實施用試料1A-6)之鍍金皮膜之電鍍時間和電鍍膜厚之關係。同樣地,在圖2,顯示使用本發明之還元型無電解鍍金液之實施例2(實施用試料2-1~實施用試料2-6)之鍍金皮膜之電鍍時間和電鍍膜厚之關係。此外,在圖2,顯示電鍍處理時間為20分鐘而得到之實施用試料2-2之鍍金皮膜之電子顯微鏡相片(×10,000)。 In the first embodiment of the present invention, the gold-plated film of the sample group 1A for execution (sample 1A-1 for execution) and sample 1A-6 for execution is shown in Fig. 1 . The relationship between the plating time and the thickness of the plating film. Similarly, Fig. 2 shows the relationship between the plating time and the plating thickness of the gold plating film of Example 2 (the sample for the execution of the sample 2-1 to the sample for the execution 2-6) using the reductive electroless gold plating solution of the present invention. Further, in Fig. 2, an electron micrograph (x 10,000) of the gold plating film of the sample for execution 2-2 obtained by the plating treatment time of 20 minutes was shown.

可以由圖1而確認:使用前述之還元型無電解鍍金液而形成於無電解鍍鈀皮膜表面之鍍金皮膜係對於形成之鍍金皮膜之厚度,無造成影響,以0.15μm/30分之速度,呈安定地形成鍍金皮膜。 It can be confirmed from Fig. 1 that the gold plating film formed on the surface of the electroless palladium coating film using the above-described reductive electroless gold plating solution has no influence on the thickness of the formed gold plating film, and is at a rate of 0.15 μm/30 minutes. A gold-plated film is formed in a stable manner.

可以由圖2而確認:使用前述之還元型無電解鍍 金液而形成於置換型無電解鍍金皮膜表面之還元型無電解鍍金皮膜係對於形成之鍍金皮膜之厚度,無造成影響,以0.17μm/30分之速度,呈安定地形成鍍金皮膜。 Can be confirmed by Figure 2: using the aforementioned regenerative electroless plating The rectifying type electroless gold plating film formed on the surface of the replacement electroless gold plating film by the gold liquid has no influence on the thickness of the formed gold plating film, and forms a gold plating film at a rate of 0.17 μm/30 minutes.

無電解鍍鈀皮膜之厚度對於鍍金皮膜之析出速度而造成之影響:接著,以實施例1和比較例1,作為對比,就無電解鍍鈀皮膜之厚度對於鍍金皮膜之析出速度而造成之影響,來進行敘述。在圖3,顯示使用還元型無電解鍍金液而在無電解鍍鈀皮膜之表面來形成鍍金皮膜之實施用試料群組1A(實施用試料1A-1~實施用試料1A-6)~實施用試料群組1D(實施用試料1D-1~實施用試料1D-6)之無電解鍍鈀皮膜之膜厚和鍍金皮膜之析出速度之關係。一併在圖3,顯示使用置換型無電解鍍金液而在無電解鍍鈀皮膜之表面來形成鍍金皮膜之比較用試料群組1A(比較用試料1A-1~比較用試料1A-6)~比較用試料群組1D(比較用試料1D-1~比較用試料1D-6)之無電解鍍鈀皮膜之膜厚和鍍金皮膜之析出速度之關係。 Effect of the thickness of the electroless palladium coating on the deposition rate of the gold plating film: Next, in the case of Example 1 and Comparative Example 1, the effect of the thickness of the electroless palladium film on the deposition rate of the gold plating film is affected. , to describe. FIG. 3 shows a sample group 1A for execution of a gold-plated film on the surface of an electroless palladium-plated film using a regenerative electroless gold plating solution (sample 1A-1 for execution - sample 1A-6 for execution) The relationship between the film thickness of the electroless palladium coating film and the deposition rate of the gold plating film in the sample group 1D (the sample for the implementation 1D-1 to the sample for the application 1D-6). In Fig. 3, a comparative sample group 1A (comparative sample 1A-1 to comparative sample 1A-6) in which a gold plating film is formed on the surface of an electroless palladium plating film using a replacement type electroless gold plating solution is shown. The relationship between the film thickness of the electroless palladium plating film and the deposition rate of the gold plating film of the sample group 1D for comparison (comparative sample 1D-1 to comparative sample 1D-6).

由圖3而得知:使用比較用試料群組1A~比較用試料群組1D之置換型無電解鍍金液而形成之鍍金皮膜係隨著成為基底金屬之鍍鈀皮膜變厚而降低鍍金皮膜之析出速度。相對於此,可以確認:使用實施用試料群組1A~實施用試料群組1D之還元型無電解鍍金液而形成之鍍金皮膜係無關於成為基底金屬之鍍鈀皮膜之厚度,以安定之速度而形成鍍金皮膜。 As is apparent from Fig. 3, the gold plating film formed by using the replacement type electroless gold plating solution of the comparative sample group 1A to the comparative sample group 1D is thicker than the palladium plating film which becomes the base metal, and the gold plating film is lowered. The speed of precipitation. On the other hand, it was confirmed that the gold plating film formed by using the reductive electroless gold plating solution of the sample group 1A for performing the sample group 1A to the sample group 1D for execution does not have a thickness of the palladium plating film to be the base metal, and is stable at a constant rate. A gold-plated film is formed.

鍍金皮膜之表面形態:接著,觀察使用本發明之還元型無電解鍍金液而形成於無電解鍍鈀皮膜表面之鍍金皮 膜之表面形態。在圖4,顯示在實施例1之中之以0.1μm之膜厚而形成還元型無電解鍍金皮膜之實施用試料1A-2之鍍金皮膜表面之電子顯微鏡相片(×10000以及×30000)。此外,觀察使用本發明之還元型無電解鍍金液而形成於置換型無電解鍍金皮膜表面之還元型無電解鍍金皮膜之表面形態。在圖5,顯示在實施例2之中之以0.13μm之膜厚而形成還元型無電解鍍金皮膜之實施用試料2-2之鍍金皮膜表面之電子顯微鏡相片(×30000)。作為比較係觀察使用習知之還元型無電解鍍金液而形成於置換型無電解鍍金皮膜表面之還元型無電解鍍金皮膜之表面形態。在圖5,顯示以0.13μm之膜厚而形成還元型無電解鍍金皮膜之比較例2之鍍金皮膜表面之電子顯微鏡相片(×30000)。 Surface morphology of the gold-plated film: Next, observation of the gold-plated skin formed on the surface of the electroless palladium film using the reductive electroless gold plating solution of the present invention The surface morphology of the membrane. In Fig. 4, an electron micrograph (x 10000 and × 30000) of the surface of the gold plating film of the sample 1A-2 for performing the rectifying type electroless gold plating film in the film thickness of 0.1 μm in Example 1 is shown. Further, the surface form of the reductive electroless gold plating film formed on the surface of the replacement electroless gold plating film using the reductive electroless gold plating solution of the present invention was observed. In Fig. 5, an electron micrograph (x30000) of the surface of the gold plating film of the sample 2-2 for performing the rectifying type electroless gold plating film in the film thickness of 0.13 μm in Example 2 is shown. As a comparative example, the surface form of the reductive electroless gold plating film formed on the surface of the replacement electroless gold plating film using a conventional regenerative electroless gold plating solution was observed. Fig. 5 shows an electron micrograph (x30000) of the surface of the gold-plated film of Comparative Example 2 in which a reductive electroless gold plating film was formed with a film thickness of 0.13 μm.

可以由圖4和圖5而確認:不僅是本件發明之還元型無電解鍍金液,也使用習知之還元型無電解鍍金液,呈緻密地形成無電解鍍金皮膜。 It can be confirmed from Fig. 4 and Fig. 5 that not only the regenerative electroless gold plating solution of the present invention but also the conventional regenerative electroless gold plating solution is used to form an electroless gold plating film densely.

無電解鍍金皮膜剝離後之表面形態:此外,觀察由圖4及圖5所示之各電鍍皮膜來剝離無電解鍍金皮膜或者是剝離無電解鍍金皮膜和無電解鍍鈀皮膜後之鍍鎳皮膜之表面形態。在圖6,顯示由圖4之狀態而剝離無電解鍍金皮膜和無電解鍍鈀皮膜後之鍍鎳皮膜表面之電子顯微鏡相片(×5000)。在圖7,顯示由圖5之狀態而剝離無電解鍍金皮膜後之鍍鎳皮膜表面之電子顯微鏡相片(×3000)。 Surface morphology after peeling of the electroless gold plating film: In addition, observing the electroless gold plating film or the nickel plating film after peeling off the electroless gold plating film and the electroless palladium film by the plating films shown in FIG. 4 and FIG. Surface morphology. Fig. 6 shows an electron micrograph (x5000) of the surface of the nickel-plated film after the electroless gold plating film and the electroless palladium plating film were peeled off from the state of Fig. 4. Fig. 7 shows an electron micrograph (x3000) of the surface of the nickel-plated film after the electroless gold plating film was peeled off from the state of Fig. 5.

由圖6及圖7而明確地顯示:使用還元型無電解鍍金液而形成之實施例及比較例係皆無確認鍍鎳皮膜之局部 腐蝕。 6 and 7, it is clearly shown that the examples and comparative examples formed using the regenerative electroless gold plating solution are not confirmed to be part of the nickel plating film. corrosion.

電鍍皮膜之剖面形態:接著,觀察使用本發明之還元型無電解鍍金液而在無電解鍍鈀皮膜之表面來形成鍍金皮膜之實施例1之無電解鍍鎳皮膜/無電解鍍鈀皮膜/無電解鍍金皮膜之層構造之電鍍皮膜之剖面。在圖8,顯示以0.3μm之膜厚而形成還元型無電解鍍金皮膜之實施用試料1A-6之電鍍皮膜之剖面觀察相片(×30000)。可以由圖8而確認:使用前述之還元型無電解鍍金液而形成之無電解鍍金皮膜係呈均一地形成於鍍鈀皮膜之表面。 Cross-sectional morphology of the electroplated film: Next, an electroless nickel plating film/electroless palladium film of Example 1 in which a gold plating film was formed on the surface of the electroless palladium film using the reductive electroless gold plating solution of the present invention was observed/none. A section of an electroplated film of a layer structure of an electrolytic gold plating film. Fig. 8 shows a cross-sectional observation photograph (x30000) of the plating film of the sample 1A-6 for performing the rectifying type electroless gold plating film with a film thickness of 0.3 μm. It can be confirmed from Fig. 8 that the electroless gold plating film formed using the above-described reductive electroless gold plating solution is uniformly formed on the surface of the palladium plating film.

鍍金皮膜之選擇析出性:接著,在圖9,顯示在使用本發明之還元型無電解鍍金液而在無電解鍍鈀皮膜之表面來形成鍍金皮膜之實施例1之中之藉由相同於實施用試料1A-6之同樣條件而形成電鍍皮膜之電鍍製品之端部和中央部之各個之電子顯微鏡相片(×500)。可以由圖9而確認:在電鍍製品之端部和中央部,同樣呈均一地形成無電解鍍金皮膜。於是,也由圖9之相片而可以說是本件發明之還元型無電解鍍金液係無電解鍍金皮膜之選擇析出性呈良好。 Selective precipitation of gold-plated film: Next, in Fig. 9, the same is shown in Example 1 in which the gold-plated film is formed on the surface of the electroless palladium film by using the reductive electroless gold plating solution of the present invention. An electron micrograph (x500) of each of the end portion and the central portion of the electroplated product of the electroplated film was formed under the same conditions as those of the sample 1A-6. It can be confirmed from Fig. 9 that an electroless gold plating film is uniformly formed in the end portion and the central portion of the electroplated product. Therefore, it can be said from the photograph of Fig. 9 that the selective precipitation property of the re-electroless gold plating liquid-based electroless gold plating film of the present invention is good.

鍍金液中之鎳溶出之影響:接著,就使用本發明之還元型無電解鍍金液而在無電解鍍鈀皮膜之表面來形成鍍金皮膜之實施例1而言,就無電解鎳之溶出對於還元型無電解鍍金液之影響而進行檢討。具體地說,使用ICP,測定在金1g析出於無電解鍍鈀皮膜之表面之狀態下之基底鎳對於無電解鍍金液之溶出量。作為比較係即使是關於使用置換型無電解鍍金液之比較例1而言,也相同於實施例1而進行測定。在圖10, 顯示:使用還元型無電解鍍金液之實施例1之無電解鎳之溶出量和使用置換型無電解鍍金液之比較例1之基底鎳之溶出量。在圖10,皆顯示在使用ICP而測定在析出金1g之狀態下之Ni對於鍍金液之溶出量之際之值。 Effect of Nickel Dissolution in Gold Plating Solution: Next, in the case of Example 1 in which a gold plating film is formed on the surface of an electroless palladium coating film using the reductive electroless gold plating solution of the present invention, dissolution of electroless nickel is performed for re Review the effect of the type of electroless gold plating solution. Specifically, the amount of elution of the base nickel to the electroless gold plating solution in the state where 1 g of gold was deposited on the surface of the electroless palladium film was measured by ICP. The comparative system was measured in the same manner as in the first embodiment except for Comparative Example 1 using a replacement electroless gold plating solution. In Figure 10, The elution amount of the electroless nickel of Example 1 using the regenerative electroless gold plating solution and the elution amount of the base nickel of Comparative Example 1 using the replacement electroless gold plating solution were shown. In Fig. 10, the values of the elution amount of Ni for the gold plating solution in the state where 1 g of gold is precipitated are measured using ICP.

由圖10而得知:使用置換型無電解鍍金液而析出每1g之鍍金皮膜之比較例1係在置換型無電解鍍金液,溶出162ppm之使用作為基底金屬之Ni。相對於此,使用本件申請案之還元型無電解鍍金液而析出每1g之鍍金皮膜之實施例1係在還元型無電解鍍金液,僅溶出0.2ppm之使用作為基底金屬之Ni。 As is apparent from Fig. 10, Comparative Example 1 in which a gold plating film per gram of gold was deposited by using a substitution type electroless gold plating solution was used as a base metal Ni in a replacement type electroless gold plating solution. On the other hand, Example 1 in which the gold-plated film per gram was deposited using the reductive electroless gold plating solution of the present application was used in the regenerative electroless gold plating solution, and only 0.2 ppm of Ni was used as the base metal.

由該評價試驗之結果而可以說是:本件申請案之還元型無電解鍍金液係比起形成置換鍍金皮膜之狀態,還可以更加顯著地抑制透過鍍鈀皮膜之基底鎳之溶出,可以防止鎳擴散至鍍金皮膜之擴散。 From the result of the evaluation test, it can be said that the reductive electroless gold plating liquid of the present application can suppress the dissolution of the base nickel which has passed through the palladium plating film more remarkably than the state in which the gold plating film is formed, and the nickel can be prevented. Diffusion to the diffusion of the gold plating film.

鍍金皮膜之膜厚之偏差:接著,就在置換型無電解鍍金皮膜之表面來使用還元型無電解鍍金液而形成之鍍金皮膜之膜厚之偏差,來進行檢討。在此,作為使用本件發明之還元型無電解鍍金液之實施例係就實施例2之實施用試料2-2而測定還元型無電解鍍金皮膜之膜厚。作為比較係就使用習知之還元型無電解鍍金液之比較例2而測定還元型無電解鍍金皮膜之膜厚。就各個而言,顯示在20部位來進行膜厚之測定之結果而整理於表1。此外,在圖11,將顯示偏差狀態之圖,予以表示。 Deviation in film thickness of the gold plating film: Next, the film thickness of the gold plating film formed by using the rectifying type electroless gold plating film on the surface of the replacement electroless gold plating film was examined. Here, as an example of using the regenerative electroless gold plating solution of the present invention, the film thickness of the regenerative electroless gold plating film was measured in the sample 2-2 for the second embodiment. As a comparative example, the film thickness of the reductive electroless gold plating film was measured using Comparative Example 2 of a conventional reductive electroless gold plating solution. Each of the results of the measurement of the film thickness at 20 points was shown in Table 1. In addition, in Fig. 11, a diagram showing the state of the deviation will be shown.

使用本件發明之還元型無電解鍍金液之實施用試料2-2之無電解鍍金皮膜之膜厚之平均值係0.199μm,最大值和最小值之差異呈顯著地變小成為0.01μm,標準偏差呈顯著地變小成為0.004。相對於此,使用習知之還元型無電解鍍金液之比較例2之無電解鍍金皮膜之膜厚之平均值係0.206μm,最大值和最小值之差異為0.036μm,標準偏差為0.013。於是,得知比起使用習知之還元型無電解鍍金液之狀態,藉由使用本件發明之還元型無電解鍍金液,而使得到之無電解鍍金皮膜之膜厚,涵蓋整體,以相當高之水準,來縮小偏差,變得均一。由該結果而得知:可以藉由使用本件發明之還元型無電解鍍金液,而對於被鍍對象面之整體,呈更加均一地進行電鍍處理,可以達到品質之提升。此外,能夠以要求之膜厚,呈均一地形成無電解鍍金皮膜,因此,可以抑制超過要求膜厚之無電解鍍金皮膜之形成,能夠大幅度地減低多餘金之帶出。 The average thickness of the electroless gold plating film of the sample 2-2 for the implementation of the regenerative electroless gold plating solution of the present invention is 0.199 μm, and the difference between the maximum value and the minimum value is remarkably small to 0.01 μm. It became significantly smaller and became 0.004. On the other hand, the average value of the film thickness of the electroless gold plating film of Comparative Example 2 using the conventional regenerative electroless gold plating solution was 0.206 μm, and the difference between the maximum value and the minimum value was 0.036 μm, and the standard deviation was 0.013. Therefore, it is known that the film thickness of the electroless gold plating film is covered by the use of the regenerative electroless gold plating liquid of the present invention, which is relatively high, by using the regenerative electroless gold plating liquid of the prior art. Level, to narrow the deviation and become uniform. From this result, it is understood that the use of the regenerative electroless gold plating solution of the present invention can achieve a more uniform plating treatment on the entire surface to be plated, thereby achieving an improvement in quality. Further, since the electroless gold plating film can be uniformly formed with a desired film thickness, formation of an electroless gold plating film exceeding a required film thickness can be suppressed, and the excess gold can be greatly reduced.

鍍金皮膜之引線接合(wire-bonding)特性:接著,就使用本件發明之還元型無電解鍍金液而形成之鍍金皮膜之 引線接合(wire-bonding)特性,來進行檢討。在此,作為使用本件發明之還元型無電解鍍金液之實施例係就實施例2之實施用試料2-2而測定還元型無電解鍍金皮膜之引線接合(wire-bonding)之強度。作為比較係就使用習知之還元型無電解鍍金液之比較例2而測定還元型無電解鍍金皮膜之引線接合(wire-bonding)之強度。具體地說,對於實施用試料2-2和比較例2之還元型無電解電鍍皮膜,藉由引線接合裝置而接合線直徑25μm之金線,藉由拉引測試器而拉引線,測定引線接合(wire-bonding)之強度。分別測定20個部位,求出引線接合(wire-bonding)強度之最大值、最小值和平均值。將測定之結果,顯示於圖12。 Wire-bonding characteristics of a gold-plated film: Next, a gold-plated film formed by using the regenerative electroless gold plating solution of the present invention Wire-bonding characteristics are used for review. Here, as an example of using the regenerative electroless gold plating solution of the present invention, the strength of the wire-bonding of the regenerative electroless gold plating film was measured in the sample 2-2 for the second embodiment. As a comparative example, the strength of wire-bonding of the regenerative electroless gold plating film was measured using Comparative Example 2 of a conventional regenerative electroless gold plating solution. Specifically, in the reflow type electroless plating film of the sample 2-2 and the comparative example 2, a gold wire having a wire diameter of 25 μm was bonded by a wire bonding apparatus, and the wire was pulled by a pull tester to measure wire bonding. (wire-bonding) strength. Twenty sites were measured, and the maximum, minimum, and average values of the wire-bonding strength were determined. The results of the measurement are shown in Fig. 12.

使用本件發明之還元型無電解電鍍液之實施例2(實施用試料2-2)之無電解鍍金皮膜之引線接合(wire-bonding)強度之最大值係6.0gf,最小值為4.8gf,平均值為5.3gf。接著,使用習知之還元型無電解電鍍液之比較例2之無電解鍍金皮膜之引線接合(wire-bonding)強度之最大值係6.0gf,最小值為4.8gf,平均值為5.3gf。由這些結果而得知:使用本件發明之還元型無電解電鍍液而得到之無電解鍍金皮膜係幾乎無不同於使用習知之還元型無電解電鍍液之狀態,得到良好之引線接合(wire-bonding)強度。於是,如果是藉由本件發明之還元型無電解鍍金液的話,則可以說是能夠提供可以實現高度之引線接合(wire-bonding)之接合可靠性之鍍金皮膜。 The maximum value of the wire-bonding strength of the electroless gold plating film of Example 2 (Example 2-2 for the implementation) using the regenerative electroless plating solution of the present invention is 6.0 gf, and the minimum value is 4.8 gf, and the average value is 4.8 gf. The value is 5.3 gf. Next, the maximum value of the wire-bonding strength of the electroless gold plating film of Comparative Example 2 using the conventional regenerative electroless plating solution was 6.0 gf, the minimum value was 4.8 gf, and the average value was 5.3 gf. From these results, it was found that the electroless gold plating film obtained by using the reductive electroless plating solution of the present invention has almost no difference from the state of using the conventional regenerative electroless plating solution, and good wire bonding is obtained. )strength. Therefore, according to the regenerative electroless gold plating solution of the present invention, it can be said that a gold plating film capable of achieving a high degree of wire-bonding bonding reliability can be provided.

【產業上的可利用性】 [Industrial availability]

本件發明之還元型無電解鍍金液係可以顯著地抑制鎳或鈀等之基底金屬之溶出,在該基底金屬之表面,以高析出速度,來加厚附著鍍金皮膜。於是,如果是藉由本件發明的話,則可以提供高度之接合可靠性之引線接合(wire-bonding)之鍍金皮膜。 The reductive electroless gold plating liquid of the present invention can remarkably suppress the elution of a base metal such as nickel or palladium, and thicken the adhesion gold plating film on the surface of the base metal at a high deposition rate. Thus, if it is invented by the present invention, it is possible to provide a wire-bonding gold plating film having a high bonding reliability.

Claims (8)

一種還元型無電解鍍金液,係使用在對於被鍍物表面之無電解鍍金皮膜之形成的還元型無電解鍍金液,其特徵為:包含水溶性金化合物、檸檬酸或檸檬酸鹽、伸乙基二胺四乙酸或伸乙基二胺四乙酸鹽、六亞甲基四胺、以及含有碳數3以上之烷基和3個以上之胺基之鏈狀聚胺。 A regenerative electroless gold plating solution is a regenerative electroless gold plating solution formed on an electroless gold plating film on a surface of a substrate to be coated, which is characterized by comprising a water-soluble gold compound, citric acid or citrate, and A bis-diaminetetraacetic acid or an ethylenediamine tetraacetate, a hexamethylenetetramine, and a chain polyamine having an alkyl group having 3 or more carbon atoms and 3 or more amine groups. 如申請專利範圍第1項之還元型無電解鍍金液,其中,成為pH值7.0~pH值9.0。 For example, the regenerative electroless gold plating solution of the first aspect of the patent application has a pH of 7.0 to a pH of 9.0. 如申請專利範圍第1或2項之還元型無電解鍍金液,其中,前述之鏈狀聚胺係3,3’-二胺基-N-甲基二丙胺或者是N,N’-雙(3-胺丙基)伸乙基二胺。 The regenerative electroless gold plating solution according to claim 1 or 2, wherein the aforementioned chain polyamine is 3,3'-diamino-N-methyldipropylamine or N,N'-double ( 3-Aminopropyl) Ethyldiamine. 如申請專利範圍第1至3項中任一項之還元型無電解鍍金液,其中,包含鉈化合物,來作為析出促進劑。 The regenerative electroless gold plating solution according to any one of claims 1 to 3, which contains a ruthenium compound as a precipitation promoter. 一種無電解鍍金方法,其特徵為:使用如申請專利範圍第1至4項中任一項所述之還元型無電解鍍金液,在被鍍物之表面,形成無電解鍍金皮膜。 An electroless gold plating method, characterized in that an electroless gold plating film is formed on the surface of the object to be plated by using a reductive electroless gold plating solution according to any one of claims 1 to 4. 如申請專利範圍第5項之無電解鍍金方法,其中,前述之被鍍物表面係銅、鈀、金或鎳之任何一種。 An electroless gold plating method according to claim 5, wherein the surface of the object to be plated is any one of copper, palladium, gold or nickel. 如申請專利範圍第6項之無電解鍍金方法,其中,前述之被鍍物表面係具備形成於無電解鍍鎳皮膜表面之無電解鍍鈀皮膜。 The electroless gold plating method according to claim 6, wherein the surface of the object to be plated includes an electroless palladium film formed on the surface of the electroless nickel plating film. 一種電鍍製品,其特徵為:藉由如申請專利範圍第5至7項中任一項所述之無電解鍍金方法而進行無電解鍍金處 理。 An electroplated article characterized by electroless gold plating by an electroless gold plating method according to any one of claims 5 to 7. Reason.
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