TW201522998A - Testing device using standalone control module for testing and method thereof - Google Patents

Abstract

A testing device using a standalone control module for testing and a method thereof are provided. By configuring a control module on the testing device for replacing a main controller, generating a control command corresponding with a test command by the control module after the control module receives the test command transmitted from the main controller, transmitting the control command from the control module to a programmable logic device (PLD) corresponding with the control command, and controlling general-purpose I/O ports comprised in the PLD to test a target based on the control command by the PLD, the testing device and relating method can decreasing test time, and can achieve the effect of letting main controller do other jobs during testing.

Description

Test device and method for testing using independent control module

A test device and method thereof, in particular, a test device and method for testing using an independent control module.

In the production process of electronic products, it is usually necessary to test the connectivity of the output pins of electronic products.

One method currently used for testing is to use a dedicated test device. At each test, the host control unit sets a predetermined test result on the test device, and then the master control device controls the test device for the electronic product (test target). The connectivity of the input and output pins is tested until all test items are completed.

However, the above method will completely occupy the main control terminal, and the main control terminal cannot perform other test work. Therefore, the above method is only suitable for testing the pin connectivity of a small number of devices that are input and output to the foot. Once the number of input and output pins of the electronic product is large, the time taken by the main control terminal will also increase, thus increasing The time of the test.

In addition, in the above method, each test needs to set a predetermined result on the test device, but in fact, the speed of setting the predetermined result is very slow, and once the number of output pins of the electronic product increases, it indicates that the test needs to be performed. The project will also increase, so it will also increase the test time.

In summary, it can be seen that in the prior art, there has been a problem that the test time of an electronic product having a large input and output position is too long, and therefore it is necessary to propose an improved technical means to solve the problem.

In view of the prior art, there is a test time for electronic products with a large output. The problem is that the test device and the method for testing using the independent control module are disclosed in the present invention. The test device for testing using the independent control module disclosed in the present invention includes at least: a control module. Receiving a test command transmitted by the host, and generating a corresponding control command according to the test command, and sequentially transmitting the control command; a Programmable Logic Device (PLD), each of the programmable logic components includes multiple A general purpose input/output (General Purpose I/O, GPIO) port is used to control the general purpose input/output port according to a control command transmitted by the control module, thereby testing the test target.

The method for testing by using the independent control module disclosed in the present invention comprises the following steps: the main control terminal transmits a test command to the test device, the test device includes a control module and a programmable logic component; and the control module generates a phase according to the test command. Corresponding to the control command, and sequentially transmitting the control command to the corresponding programmable logic component; the programmable logic component controls the included general purpose input/output according to the received control command, thereby testing the test target.

The system and method disclosed in the present invention are as above, and the difference from the prior art is that the present invention sets a control module that replaces the main control terminal on the test device, and after receiving the test command transmitted by the control terminal, the control module receives the test command transmitted by the control terminal. A corresponding control command can be generated and transmitted to the corresponding programmable logic element, and the programmable logic element receiving the control command can test the test target according to the control input command to control the test target, thereby solving the previous The technical problems, and can achieve the technical effect of allowing the main control to perform other work while testing the test target.

100‧‧‧Testing device

110‧‧‧Programmable logic components

116‧‧‧ register

116a‧‧‧ register

116b‧‧‧ register

118‧‧‧Common Input and Output埠

118a‧‧‧General I/O埠

118b‧‧‧General I/O埠

130‧‧‧Control Module

200‧‧‧Master

400‧‧‧ test target

Step 310‧‧‧ The host transmits a test command to the test device, and the test device includes a control module and a programmable logic component

Step 320‧‧‧ The control module generates a corresponding control command according to the test command

Step 330‧‧‧ The control module sequentially transmits control commands to the corresponding programmable logic components

Step 350‧‧‧ The programmable logic component controls the test target by controlling the included general input/output according to the received control command

Step 370‧‧‧ Control module produces test results

Step 390‧‧‧ The control module receives the collection instruction transmitted by the host and transmits the test result to the host

Figure 1 is a schematic diagram of components of the present invention for testing using an independent control module.

Figure 2 is a schematic diagram of the programmable logic elements of the present invention.

Figure 3 is a flow chart of a method for testing using an independent control module according to the present invention.

The features and embodiments of the present invention will be described in detail below with reference to the drawings and embodiments, which are sufficient to enable those skilled in the art to fully understand the technical means to which the present invention solves the technical problems, and The achievable effects of the present invention.

The present invention provides a test device including an independently operable control module. When the test device receives the test command transmitted by the control terminal, the control module can execute a test flow corresponding to the received test command, and The test flow controls the General Purpose I/O (GPIO) port included in the test set to test the test target.

Hereinafter, the operation of the present invention will be described with reference to the components of the test apparatus of the present invention which is tested using the independent control module in the "Fig. 1". As shown in FIG. 1, the test apparatus 100 of the present invention includes a Programmable Logic Device (PLD) 110 and a control module 130.

The programmable logic component 110 includes a plurality of general purpose input and output ports. The programmable logic component 110 is responsible for receiving control commands transmitted by the control module 130 and controlling one or more general purpose input and output ports in accordance with the received control commands. In general, the programmable logic component 110 controls one or more general purpose input and output outputs a test signal to a corresponding input pin on the test target 400 according to the received control command, and/or controls One or more general purpose input and output ports receive a response signal on the corresponding input pin position on the test target 400.

It is worth mentioning that, since the programmable logic component 110 includes a large number of general-purpose input ports, it is particularly suitable for testing the signal of the input and output pins of the test target 400 having a large number of input and output pins. Since the signal switching speed of the general-purpose input and output port is fast, it is also suitable for testing the test target whose signal input speed of the input pin (pin) is fast.

In addition, the programmable logic component 110 can also include a register 116 as shown in FIG. 2, and the register 116 can provide a programmable logic component 110 to control the general-purpose input/output terminal 118 to output a test signal to the test target. 400, for example, the programmable logic component 110 can set the register 116a to be high (High) or low (Low), thus, and set The general-purpose input/output port 118a connected to the register 116a outputs a high-potential or low-potential test signal to the corresponding input pin of the test target 400; the programmable logic element 110 can also pass through the register 116 and the general-purpose input/output port. 118 obtains a response signal on the output pin corresponding to the general-purpose input/output port 118 on the test target 400, for example, after the general-purpose input/output port 118b obtains the response signal on the specific output pin of the test target 400, temporarily storing The high-potential or low-potential response signal obtained by the general-purpose input/output 埠118b is set to a high level or a low level, and the programmable logic element 110 can obtain a high response signal by the potential of the register 116b. Or low potential.

The control module 130 is responsible for receiving the test command transmitted by the host 200. The master 200 transmits different test commands to the test device 100 according to different test requirements (for example, testing different test targets, testing different parts of the same test target), so that the control module 130 receives different tests. Commands perform different test procedures.

The control module 130 is also responsible for generating a control command corresponding to the received test command. The control command generated by the control module 130 may have only one or more control commands, and the present invention is not particularly limited. . Since the test flow performed by the control module 130 varies with the received test command, the control commands generated by the control module 130 for testing may also vary with the test command. .

Control module 130 is also responsible for sequentially transmitting the generated control commands to one or more programmable logic elements 110 corresponding to the control commands. The control module 130 can transmit a control command to the corresponding programmable logic component 110 according to the test flow, so that some or all of the programmable logic components 110 on the testing device 100 execute the control command in a certain order, thereby testing the target. 400 tests for connectivity of the input and output pins.

It is worth mentioning that in the prior art, during the test of the test target 400 by the main control terminal, the main control end is continuously occupied until the test of the test target 400 is completed, but in the present invention, The control module 130 replaces the use of the control terminal in the prior art. That is to say, the control terminal 200 only needs to transmit a test command to the control module 130 when the test target 400 is started to be tested, and the control module 130 performs the control module 130. The complete test process, at the same time, when the control module 130 performs the test, the host 200 can perform other functions, for example, testing other test items, etc., so that for the host 200, it is simultaneously Test target The 400 input and output pins and other test items are tested, which can significantly reduce the total time of the test. However, when the control module 130 performs the test, other functions performed by the main control terminal 200 are not limited to the above.

In some embodiments, the control module 130 can read the response signals obtained by the programmable logic elements 110 on the test device 100, and compare the response signals and the read signals from the programmable logic elements 110. Receiving the predetermined data corresponding to the control command (even, the control module 130 may first convert the read response signal from the analog signal to the digital data, and then compare with the predetermined data, but the present invention does not This is limited to, and after comparing the respective response signals, corresponding test results are generated, for example, the response signal is completely consistent with the predetermined data, or one or more of the response signals does not match the predetermined information, etc., but the present invention The test results are not limited to this. Any data that can be understood that the response signal is not identical to the predetermined information can be used as the test data provided in the present invention. The predetermined data used by the control module 130 to be compared with the response signal may be included in the received control command, or may be stored in the test device 100 in advance. After receiving the control command, the control module 130 may receive the control command. The corresponding predetermined data is read according to the control command.

The control module 130 may also transmit the generated test result to the host 200 after receiving the collection instruction transmitted by the host 200. The control module 130 can actively transmit the notification signal to the control terminal 200 after the completion of the test, that is, after reading all the response signals that need to be compared, so that the control terminal 200 transmits the collection instruction to the control module 130. The control module 130 can also passively wait for the host terminal 200 to poll (Polling), that is, wait for receiving the inquiry message transmitted by the host terminal 200, and send the confirmation after receiving the inquiry message transmitted by the host terminal 200. The message is sent to the control terminal, so that the host terminal 200 transmits a collection instruction to the control module 130.

In addition, in order to prevent the test device 100 from simultaneously testing the input and output pins of the test target 400, the control module 130 and the programmable logic device 110 pass through the serial peripheral interface (SPI). The connection can easily connect the control module 130 to the plurality of programmable logic elements 110. Therefore, the input of the test device 100 for testing the output of the test target 400 can be easily expanded. The number of output defects. At the same time, the data transmission speed (16M) of the serial peripheral interface has faster data than the data transmission speed (100K) used in the conventional testing process. The transmission speed, therefore, when testing a large number of input and output pins of the test target 400, the control module 130 can obtain all the response signals in a shorter time. However, the connection between the control module 130 and the programmable logic component 110 is not limited to the use of the serial peripheral interface.

Next, an operational system and method of the present invention will be described with reference to an embodiment. Referring to FIG. 3, a flow chart of a method for testing using an independent control module according to the present invention will be described. In this embodiment, it is assumed that the control module 130 is a Micro Control Unit (MCU), and the programmable logic component 110 is a Complex Programmable Logic Device (CPLD), but the present invention does not Limited.

First, the host 200 can transmit a test command to the test device 100 (step 310), and then the host 200 can perform tests for other items. In this embodiment, it is assumed that the control terminal 200 and the test device 100 are connected through an Inter-Integrated Circuit (IIC), and the test command is included in the data segment of the internal integrated circuit packet.

The control module 130 of the testing device 100 can unpack the internal integrated circuit packet after the testing device 100 receives the internal integrated circuit packet transmitted by the host 200, thereby obtaining the test command included in the internal integrated circuit packet, and can generate and The control command corresponding to the received test command (step 320). In this embodiment, it is assumed that the control module 130 determines the test flow corresponding to the test command according to the test command, and generates a control command that can complete the determined test flow according to the determined test flow.

After the control module 130 of the testing device 100 generates the control command, the control module 130 can sequentially transmit the generated control command to the programmable logic component 110 corresponding to the control command to be transmitted (step 330). In this embodiment, it is assumed that the control module 130 and the programmable logic component 110 are connected through the serial peripheral interface, and the control module 130 transmits a control command to the programmable logic component 110 using the serial peripheral interface protocol.

After the programmable logic component 110 of the test apparatus 100 receives the control command transmitted by the control module 130 of the test apparatus 100, the included general-purpose input/output 118 can be controlled according to the received control command, thereby testing the test target 400. A test is performed (step 350). Thus, through the present invention, the host 200 can complete the test of the test target 400 through the test device 100 including the control module 130 that can be independently tested, and is not occupied when the test of the test target 400 is performed.

In this embodiment, it is assumed that the control module 130 generates three sets of control commands, wherein the first set of control commands causes a certain programmable logic component 110 that receives the control command to control a certain universal input and output included. 118 outputs the test signal to the corresponding input pin of the test target 400, and all other general-purpose input/output 埠118 will obtain the response signal of all the input and output pins of the test target 400; another set of control commands will be received A programmable logic component 110 of the control command controls a plurality of specific general-purpose input/output ports 118 included to output a test signal, and all other general-purpose input/output ports 118 also acquire all the output pins of the test target 400. Responding to the signal; the last set of control commands causes the plurality of programmable logic elements 110 that receive the control commands to control one or more of the general-purpose input and output ports 118 included therein to output test signals, and the same, and all other general The input/output 埠118 will obtain a response signal from all the input pins of the test target 400.

Then, the control module 130 of the test apparatus 100 can transmit the read command of the read data to each programmable logic component 110 by using the serial peripheral interface protocol. Each programmable logic component 110 also uses the read command after receiving the read command. The serial interface protocol transmits the response signals obtained by the general-purpose input/output ports 118 back to the control module 130. After receiving the response signals returned by all the general-purpose input/output ports 118, the control module 130 can The received response signal is compared with the predetermined data corresponding to the generated control command, and the test result is generated after the comparison (step 370). In this embodiment, since the control module 130 generates three sets of control commands, the control module 130 also transmits a read command to each programmable logic component 110 after each transfer of the control command, and compares each The response signal returned by the programmable logic component 110 and the predetermined data corresponding to the transmitted control command, wherein when all the response signals are the same as the predetermined data, the control module 130 can generate a test result indicating that there is no error. If any of the response signals are different from the predetermined data, the control module 130 can record the identification data of the general input/output port that obtains the response signal different from the predetermined data, and even record the potential of the test signal and the response signal.

In addition, the control module 130 of the testing device 100 may also receive the collection instruction transmitted by the host 200 after completing the test of the test target 400, and transmit the generated test result back to the main control terminal 200 (step 390). The main control terminal 200 can provide the test result generated by the control module 130 to the tester for reference. In this embodiment, it is assumed that the master 200 will In the polling manner, after each interval, the internal integrated circuit packet is used to query whether the control module 130 completes the test. When the control module 130 completes the test, the internal integrated circuit packet can also be used to transmit the acknowledgement signal to the control terminal 200. After receiving the confirmation signal transmitted by the control module 130, the master terminal 200 can use the internal integrated circuit packet to transmit the collection command to the control module 130. Thus, the control module 130 will use the internal integrated circuit packet to test. The result is passed back to the master 200.

In summary, it can be seen that the difference between the present invention and the prior art is that a control module is provided on the test device instead of the master terminal, and the control module can generate a corresponding test command after receiving the test command transmitted by the master terminal. The control command is transmitted to the corresponding programmable logic component, and the programmable logic component receiving the control command can control the test target by using the general input/output port included in the control command, thereby The technical means can solve the problem that the testing time of the electronic products with the input and output positions of the prior art is too long, thereby achieving the technical effect that the main control end can perform other work while testing the test target.

Furthermore, the method for testing by using the independent control module of the present invention can be implemented in a combination of hardware, software or hardware and software, or can be implemented in a centralized manner in a computer system or spread over several different components by different components. Even the decentralized way of implementing computer systems.

While the embodiments of the present invention have been described above, the above description is not intended to limit the scope of the invention. Any modification of the form and details of the practice of the present invention, which is a matter of ordinary skill in the art to which the present invention pertains, is a patent protection of the present invention. range. The scope of the invention is to be determined by the scope of the appended claims.

Step 310‧‧‧ The host transmits a test command to the test device, and the test device includes a control module and a programmable logic component

Step 320‧‧‧ The control module generates a corresponding control command according to the test command

Step 330‧‧‧ The control module sequentially transmits control commands to the corresponding programmable logic components

Step 350‧‧‧ The programmable logic component controls the test target by controlling the included general input/output according to the received control command

Step 370‧‧‧ Control module produces test results

Step 390‧‧‧ The control module receives the collection instruction transmitted by the host and transmits the test result to the host

Claims (10)

A test device for testing with an independent control module for connecting to a host and connecting to a test target, the test device comprising at least: a control module for receiving one of the commands transmitted by the master Testing the command, and generating corresponding control commands according to the test command, and sequentially transmitting the control commands; and at least one Programmable Logic Device (PLD), each of the programmable logic components A general purpose input/output (General Purpose I/O, GPIO) port is configured to control at least one of the general purpose input and output ports according to at least one of the control commands transmitted by the control module, thereby testing the test target. A test device for testing using an independent control module as described in claim 1, wherein each of the programmable logic elements further includes a register for providing control of each of the programmable logic elements. A general purpose input and output port. The test device for testing using an independent control module according to claim 1, wherein each of the programmable logic elements controls at least one of the universal input and output outputs according to one of the received control commands. Testing the signal to the test target and/or controlling at least one of the universal input/output/receiving one of the response signals generated by the test target. A test device for testing using an independent control module as described in claim 3, wherein the control module is further configured to read the response signals and compare the response signals and the received control The command corresponds to one of the predetermined materials to generate a corresponding one of the test results. The test device for testing using an independent control module according to claim 4, wherein the control module is further configured to transmit the test result to the one after receiving the collection instruction sent by the main control terminal. The main control terminal. The test device for testing using an independent control module according to claim 5, wherein the control module is further configured to output a notification signal to notify the host to transmit the collection instruction. A method for testing using an independent control module, the method comprising at least the following steps: a host transmits a test command to a test device, the test device includes a control module and at least one programmable logic component; And generating, by the group, the corresponding at least one control command according to the test command, and sequentially transmitting each of the control commands to the corresponding at least one programmable logic element; and each of the programmable logic elements is controlled according to at least one of the received The command controls at least one general input/output port included to test a test target. The method for testing by using an independent control module according to claim 7, wherein each of the programmable logic elements includes at least one universal input/output according to the received control command. The programmable logic component controls at least one of the general purpose input and output outputs a test signal to the test target according to the received control command, and/or controls at least one of the universal input and output outputs to receive the test target. The steps of the signal. The method of testing using an independent control module as described in claim 8 wherein the method controls the at least one general input/output included in the programmable logic element according to the received control command. Thereafter, the method further includes: reading the response signals, and comparing each of the response signals and one of the predetermined data corresponding to the received control command to generate a corresponding one of the test results. The method for testing by using an independent control module according to claim 9 , wherein the method further comprises: after receiving the collection instruction sent by the control terminal, transmitting the test result to the The steps of the main control terminal.