TW201425221A - Method for producing polycrystalline silicon - Google Patents

Method for producing polycrystalline silicon Download PDF

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TW201425221A
TW201425221A TW102128296A TW102128296A TW201425221A TW 201425221 A TW201425221 A TW 201425221A TW 102128296 A TW102128296 A TW 102128296A TW 102128296 A TW102128296 A TW 102128296A TW 201425221 A TW201425221 A TW 201425221A
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hydrogen
conversion reaction
gas
compound
adsorbent
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Takuya Majima
Satoru Wakamatsu
Manabu Sakida
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Tokuyama Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/02636Selective deposition, e.g. simultaneous growth of mono- and non-monocrystalline semiconductor materials
    • H01L21/02653Vapour-liquid-solid growth
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B33/00Silicon; Compounds thereof
    • C01B33/02Silicon
    • C01B33/021Preparation
    • C01B33/027Preparation by decomposition or reduction of gaseous or vaporised silicon compounds other than silica or silica-containing material
    • C01B33/03Preparation by decomposition or reduction of gaseous or vaporised silicon compounds other than silica or silica-containing material by decomposition of silicon halides or halosilanes or reduction thereof with hydrogen as the only reducing agent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02524Group 14 semiconducting materials
    • H01L21/02532Silicon, silicon germanium, germanium
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02587Structure
    • H01L21/0259Microstructure
    • H01L21/02595Microstructure polycrystalline

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  • Crystallography & Structural Chemistry (AREA)
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Abstract

A method for producing polycrystalline silicon, which comprises: a silicon deposition step wherein silicon is produced by a reaction between a chlorosilane compound and hydrogen; a conversion reaction step wherein the exhaust gas discharged during the silicon deposition step is brought into contact with activated carbon, so that hydrogen chloride in the exhaust gas is removed; a separation step wherein hydrogen in a post-conversion-reaction gas obtained in the conversion reaction step is separated; and a circulation step wherein the hydrogen obtained in the separation step is supplied to the silicon deposition step. This method for producing polycrystalline silicon is characterized by satisfying the condition (1) and/or condition (2) described below. (1) The post-conversion-reaction gas obtained in the conversion reaction step is brought into contact with an adsorbent that contains a Lewis acidic compound before the separation step. (2) The hydrogen obtained in the separation step is brought into contact with an adsorbent that contains a Lewis acidic compound before being supplied to the silicon deposition step.

Description

多晶矽之製造方法 Polycrystalline germanium manufacturing method

本發明係關於一種多晶矽之製造方法。詳而言之,係關於一種多晶矽之製造方法,其含有:由矽析出步驟所排出之排出氣體除去氯化氫,將回收之氫循環再利用於上述矽析出步驟的步驟,其可容易且有效果地除去來自氯化氫除去觸媒之活性碳的含磷原子之雜質。 The present invention relates to a method of producing polycrystalline germanium. More specifically, the present invention relates to a method for producing a polycrystalline silicon, comprising: removing hydrogen chloride from an exhaust gas discharged from a deuterium precipitation step, and recycling the recovered hydrogen to the step of the above-described decanting step, which can be easily and effectively The phosphorus-containing impurity from the activated carbon of the hydrogen chloride-removing catalyst is removed.

作為半導體、太陽能發電用晶圓等之原料使用之多晶矽之製造方法,自以往即已知有氣液沉積法、西門子法等。該等方法,皆係藉由使氯矽烷化合物(特別是三氯矽烷)及氫接觸於設置於反應器內之高溫的基材表面,使矽析出於上述基材表面的技術。藉由該等技術,有可得純度非常高之多晶矽的優點。然而,相反的,於反應器所排出之排出氣體中含有二氯矽烷、氫、氯化氫等,特別是氯化氫的廢棄處理成為問題。於廢棄氯化氫時,藉由吸附法會由排出氣體將氯化氫分離,故必須以鹼中和。用於該分離處理及中和處理之設備及運轉所需要的成本非常高。因此,為了以上述技術工業生產高純度之多晶矽,排出氣體 中之氯化氫的處理成本為很大的問題。 As a method for producing polycrystalline silicon used as a raw material for a semiconductor or a solar power generation wafer, a gas-liquid deposition method, a Siemens method, or the like has been known. These methods are techniques for decanting the surface of the substrate by contacting a chlorodecane compound (especially trichloromethane) and hydrogen with a surface of a substrate having a high temperature set in the reactor. With these techniques, there is an advantage that polycrystalline germanium of very high purity can be obtained. On the contrary, in the exhaust gas discharged from the reactor, dichlorosilane, hydrogen, hydrogen chloride or the like is contained, and in particular, disposal of hydrogen chloride is a problem. When hydrogen chloride is discarded, hydrogen chloride is separated from the exhaust gas by the adsorption method, so it is necessary to neutralize it with a base. The cost of equipment and operation for this separation process and neutralization process is very high. Therefore, in order to industrially produce high-purity polycrystalline silicon by the above-mentioned technology, the exhaust gas is exhausted. The processing cost of hydrogen chloride in the process is a big problem.

為了解決該問題,本發明人等,提出下述技術:將排出氣體中之氯化氫,於活性碳觸媒的存在下,供給至與共存於同排出氣體中之二氯矽烷的轉化反應,藉此來除去(日本專利第3853894號公報)。若藉由該技術,可有效率地除去排出氣體中之氯化氫,並且,藉由氯化氫與二氯矽烷之轉化反應所再生之三氯矽烷,可作為矽之原料循環再利用,再者,活性碳觸媒的壽命亦長。因此於當業界,該技術被認為是非常優異之技術,而廣泛地利用於工業上。 In order to solve this problem, the inventors of the present invention have proposed a technique of supplying hydrogen chloride in an exhaust gas to a conversion reaction with dichlorosilane coexisting in the same exhaust gas in the presence of an activated carbon catalyst. To remove (Japanese Patent No. 3853894). According to this technique, the hydrogen chloride in the exhaust gas can be efficiently removed, and the trichlorosilane which is regenerated by the conversion reaction of hydrogen chloride and dichlorosilane can be recycled as a raw material of the crucible, and further, activated carbon The life of the catalyst is also long. Therefore, in the industry, this technology is considered to be a very excellent technology and is widely used in industry.

然而,如上所述,於反應器所排出之排出氣體中,除二氯矽烷及氯化氫之外,亦含有氫。排出氣體中之氫的含有比例為多,故於工業上可將該氫循環再利用。 However, as described above, in the exhaust gas discharged from the reactor, hydrogen is contained in addition to dichlorosilane and hydrogen chloride. Since the proportion of hydrogen in the exhaust gas is large, the hydrogen can be recycled industrially.

於工業製造多晶矽時,上述排出氣體中之氯化氫的除去、與排出氣體中之氫的循環再利用係併用。具體而言,係將由將排出氣體供至上述轉化反應所得之處理結束之氣體所回收之氫,作為用以製造多晶矽之原料氣體的一部分供給至反應器。此時,來自轉化反應觸媒之活性碳的含磷原子之雜質(磷雜質)會混入回收氫中,而產生使所製造之矽中之磷濃度上升的狀況,是其問題。矽中之磷濃度若高,會損及電氣特性,故不佳。當將多晶矽例如使用於太陽能電池時,容許之磷濃度,大致為未滿200ppb-wt。 In the case of industrial production of polycrystalline germanium, the removal of hydrogen chloride in the above-mentioned exhaust gas and the recycling of hydrogen in the exhaust gas are used in combination. Specifically, hydrogen recovered from a gas obtained by supplying the exhaust gas to the treatment obtained by the above-described conversion reaction is supplied to the reactor as a part of the raw material gas for producing polycrystalline germanium. At this time, the phosphorus atom-containing impurity (phosphorus impurity) derived from the activated carbon of the conversion reaction catalyst is mixed into the recovered hydrogen to cause a situation in which the phosphorus concentration in the produced crucible is increased, which is a problem. If the concentration of phosphorus in the sputum is high, it will damage the electrical characteristics, so it is not good. When polycrystalline germanium is used, for example, in a solar cell, the allowable phosphorus concentration is approximately less than 200 ppb-wt.

當然,矽中之磷濃度上升的問題,藉由將磷含量低之活性碳作為轉化反應觸媒使用可改善。然而,一般作為工 業用觸媒所使用之活性碳,係來自椰子殼、石炭等,通常係含有200ppm-wt左右的磷原子。有藉由將活性碳以酸洗淨,以減低活性碳中之磷濃度的技術。該技術,除於設備及運轉方面有成本上的問題之外,藉由酸洗淨亦只能盡可能將活性碳中之磷濃度減低至50ppm-wt左右。因此,矽中之磷濃度的問題,必須藉由減低活性碳中之磷濃度以外的方法來改善。 Of course, the problem of an increase in the phosphorus concentration in the sputum can be improved by using activated carbon having a low phosphorus content as a conversion reaction catalyst. However, generally as a worker The activated carbon used in industrial catalysts is derived from coconut shells, charcoal, etc., and usually contains about 200 ppm-wt of phosphorus atoms. There is a technique of reducing the concentration of phosphorus in activated carbon by washing activated carbon with acid. This technology, in addition to cost problems in equipment and operation, can only reduce the phosphorus concentration in the activated carbon to about 50 ppm-wt by acid washing. Therefore, the problem of the phosphorus concentration in the sputum must be improved by a method other than reducing the concentration of phosphorus in the activated carbon.

上述中,「ppb-wt」係表示重量基準之10億分之1的單位,「ppm-wt」係表示重量基準之100萬分之1的單位(於本說明書以下相同)。 In the above, "ppb-wt" means a unit of 1 part per billion by weight, and "ppm-wt" means a unit of 1 part per million by weight (the same applies to the following description).

因此,本發明之目的在於提供一種多晶矽之製造方法,其係包含:排出氣體中之氯化氫的除去步驟、將由排出氣體所回收之氫循環再利用於矽析出步驟的步驟,而其可容易且有效率地除去來自活性碳觸媒之磷雜質。 Accordingly, an object of the present invention is to provide a method for producing polycrystalline silicon, which comprises the steps of removing hydrogen chloride in an exhaust gas, and recycling the hydrogen recovered by the exhaust gas to a step of decanting, which is easy and Phosphorus impurities from the activated carbon catalyst are efficiently removed.

本發明人等,為了解決上述課題而努力研究。本發明人等,首先追查,來自活性碳之磷雜質,於氯矽烷化合物、氯化氫及氫的共存下,具有容易成為PCl3、PH3等之形態的化學傾向。接著,著眼於該等之化合物,由於於磷原子上具有孤立電子對,故作為路易斯鹼而作動。因此發現,使供至轉化反應後之氣體或由該氣體所分離之氫與路易斯酸性化合物接觸的結果,可有效率地除去磷雜質,因而完成本發明。 The inventors of the present invention have diligently studied in order to solve the above problems. The inventors of the present invention first traced that the phosphorus impurity derived from activated carbon has a chemical tendency to easily form a form such as PCl 3 or PH 3 in the coexistence of a chlorodecane compound, hydrogen chloride, and hydrogen. Next, attention is paid to these compounds, and since they have an isolated electron pair on the phosphorus atom, they act as a Lewis base. Therefore, it has been found that the phosphorus gas is efficiently removed as a result of bringing the gas supplied to the conversion reaction or the hydrogen separated from the gas into contact with the Lewis acidic compound, and thus the present invention has been completed.

亦即,本發明係關於上述多晶矽之製造方法,其係包含:藉由氯矽烷化合物與氫之反應而生成矽的矽析出步驟、使由前述矽析出步驟所排出之排出氣體與活性碳接觸以除去該排出氣體中之氯化氫的轉化反應步驟、分離由前述轉化反應步驟所得之轉化反應後氣體中之氫的分離步驟、及將前述分離步驟所得之氫供給至前述矽析出步驟的循環步驟之多晶矽之製造方法;其特徵係至少滿足下述條件(1)及(2)中之至少一者,(1)於分離步驟前,使由轉化反應步驟所得之轉化反應後氣體,與含有路易斯酸性化合物之吸附材接觸、及(2)於供給至矽析出步驟前,使分離步驟所得之氫,與含有路易斯酸性化合物之吸附材接觸。 That is, the present invention relates to a method for producing a polycrystalline silicon, which comprises a step of forming a ruthenium by reacting a chlorodecane compound with hydrogen, and contacting the exhaust gas discharged from the hydrazine precipitation step with activated carbon. a conversion reaction step of removing hydrogen chloride in the exhaust gas, a separation step of separating hydrogen in the gas after the conversion reaction obtained by the above-mentioned conversion reaction step, and a polycrystal having a hydrogen obtained by the separation step supplied to the cycle of the decantation step a manufacturing method; characterized in that at least one of the following conditions (1) and (2) is satisfied, (1) the gas after the conversion reaction obtained by the conversion reaction step, and the Lewis-containing acidic compound are supplied before the separation step The adsorbent is contacted and (2) the hydrogen obtained in the separation step is brought into contact with the adsorbent containing the Lewis acidic compound before being supplied to the ruthenium precipitation step.

本發明所使用之多晶矽之製造方法,係含有下述各步驟:藉由氯矽烷化合物與氫之反應而生成矽的矽析出步驟、使由前述矽析出步驟所排出之排出氣體與活性碳接觸以除去該排出氣體中之氯化氫的轉化反應步驟、分離由前述轉化反應步驟所得之轉化反應後氣體中之 氫的分離步驟、及將前述分離步驟所得之氫供給至前述矽析出步驟的循環步驟。 The method for producing a polycrystalline silicon used in the present invention comprises the steps of: forming a ruthenium by a reaction of a chlorodecane compound with hydrogen, and contacting the exhaust gas discharged from the hydrazine precipitation step with activated carbon; a conversion reaction step of removing hydrogen chloride in the exhaust gas, and separating the gas after the conversion reaction obtained by the foregoing conversion reaction step The hydrogen separation step and the hydrogen obtained by the separation step are supplied to the circulation step of the above-described decantation step.

<矽析出步驟> <矽 precipitation step>

矽析出步驟,係藉由氯矽烷化合物與氫之反應而生成矽以使其析出的步驟,具體而言,可舉例如西門子法(鐘罩法)、氣液沉積法(VLD法=Vapor to Liquid Deposition法)等。 The hydrazine precipitation step is a step of forming hydrazine by a reaction of a chlorodecane compound with hydrogen, and specifically, for example, a Siemens method (bell cover method) or a gas-liquid deposition method (VLD method = Vapor to Liquid) Deposition method) and so on.

上述西門子法,係將設置於反應器(鐘罩)內之矽芯線加熱至矽析出溫度以上的高溫(例如600~1200℃),使其與含有氯矽烷化合物及氫的原料氣體接觸,而使矽於上述矽芯線之表面析出的批次方法。 In the above-mentioned Siemens method, the core wire provided in the reactor (bell jar) is heated to a high temperature (for example, 600 to 1200 ° C) higher than the enthalpy precipitation temperature, and is brought into contact with a raw material gas containing a chlorosilane compound and hydrogen, thereby A batch method in which the surface of the above-mentioned core wire is precipitated.

上述氣液沉積法,係將設置於反應器內之基材加熱至矽析出溫度以上的高溫(例如600℃以上),於該基材上流通、接觸含有氯矽烷化合物及氫的原料氣體,以使矽於上述基材表面析出後,使上述基材維持於矽之熔點以上的高溫(例如1450~1700℃),而使該析出之矽熔融落下以回收的逐次方法;或者,將設置於反應器內之基材加熱至矽之熔點以上的高溫(例如1450~1700℃),於該基材上流通、接觸含有氯矽烷化合物及氫的原料氣體,以使矽於上述基材表面析出、同時熔融落下的連續方法。 In the gas-liquid deposition method, the substrate provided in the reactor is heated to a high temperature (for example, 600 ° C or higher) at a temperature equal to or higher than the precipitation temperature, and a raw material gas containing a chlorosilane compound and hydrogen is passed through the substrate. After the surface of the substrate is precipitated, the substrate is maintained at a high temperature (for example, 1450 to 1700 ° C) which is higher than the melting point of the crucible, and the precipitated crucible is melted and dropped to recover the successive method; or, it is set in the reaction. The substrate in the device is heated to a high temperature (for example, 1450 to 1700 ° C) above the melting point of the crucible, and a raw material gas containing a chlorodecane compound and hydrogen is passed through the substrate to precipitate the crucible on the surface of the substrate. A continuous process of melting down.

於上述原料氣體所含之氯矽烷化合物,可舉例如三氯矽烷、二氯矽烷等,特別以三氯矽烷為佳。上述原料氣體 中所含之氫的濃度,係相對於矽烷化合物為過剩量,例如相對於氯矽烷化合物1莫耳可為5莫耳以上。 The chlorodecane compound contained in the above-mentioned source gas may, for example, be chlorosilane or methylene chloride, and particularly preferably chlorosilane. The above raw material gas The concentration of hydrogen contained in the mixture is an excess amount with respect to the decane compound, and may be, for example, 5 mol or more per mol of the chlorodecane compound.

<轉化反應步驟> <Conversion reaction step>

於轉化反應步驟,係使由前述矽析出步驟所排出之排出氣體與活性碳接觸以除去該排出氣體中之氯化氫。 In the conversion reaction step, the exhaust gas discharged from the above-described decanting step is contacted with activated carbon to remove hydrogen chloride in the exhaust gas.

於排出氣體中,至少含有氯矽烷化合物、氫及氯化氫。該氯矽烷化合物,係由原料氣體中所含有之氯矽烷化合物之熱分解生成物、及未反應之氯矽烷化合物所構成,例如含有四氯矽烷、三氯矽烷、二氯矽烷、單氯矽烷、六氯二矽烷、五氯二矽烷等中之1種以上。氫,係由原料氣體中所含有之氯矽烷化合物之熱分解所產生之氫及未反應之氫所構成。氯化氫係由矽之吸出反應的附生成物。排出氣體中之氯化氫濃度,例如為0.1~6莫耳%、特別是0.2~3莫耳%。 The exhaust gas contains at least a chlorodecane compound, hydrogen, and hydrogen chloride. The chlorodecane compound is composed of a thermally decomposed product of a chlorodecane compound contained in a material gas and an unreacted chlorodecane compound, and contains, for example, tetrachlorosilane, trichlorodecane, dichloromethane, monochlorodecane, One or more of hexachlorodioxane and pentachlorodioxane. Hydrogen is composed of hydrogen generated by thermal decomposition of a chlorodecane compound contained in a material gas and unreacted hydrogen. Hydrogen chloride is a product derived from the aspiration reaction of hydrazine. The concentration of hydrogen chloride in the exhaust gas is, for example, 0.1 to 6 mol%, particularly 0.2 to 3 mol%.

本發明之轉化反應步驟中,係將排出氣體中之氯化氫,藉由與同排出氣體中所含之氯矽烷化合物之間的轉化反應來除去。以下,舉轉化反應之例。 In the conversion reaction step of the present invention, hydrogen chloride in the exhaust gas is removed by a conversion reaction with a chlorodecane compound contained in the same exhaust gas. Hereinafter, an example of a conversion reaction will be mentioned.

氯矽烷化合物為二氯矽烷時之主反應:HCl+SiH2Cl2 → SiHCl3+H2 The main reaction when the chlorodecane compound is methylene chloride: HCl + SiH 2 Cl 2 → SiHCl 3 + H 2

氯矽烷化合物為六氯二矽烷時之主反應:HCl+SiCl6 → SiHCl3+SiCl4 The main reaction when the chlorodecane compound is hexachlorodioxane: HCl + SiCl 6 → SiHCl 3 + SiCl 4

氯矽烷化合物為五氯二矽烷時之主反應:HCl+SiHCl5 → 2SiHCl3 The main reaction when the chlorodecane compound is pentachlorodioxane: HCl + SiHCl 5 → 2SiHCl 3

轉化反應,亦可於排出氣體追加氯矽烷化合物來進行。該追加之氯矽烷化合物,其使用之目的在於提高排出氣體中所含之氯化氫的除去效率。因此,只要可與氯化氫反應之氯矽烷化合物即可,可無特別限制的使用。追加之氯矽烷化合物,例如可使用三氯矽烷、二氯矽烷、單氯矽烷等。氯矽烷化合物之追加量,係追加後之氯矽烷化合物之合計量,相對於排出氣體中所含之氯化氫1莫耳,以1莫耳以上為佳、較佳為1.2莫耳以上的量。追加後之氯矽烷化合物的合計量,由將循環氣體之容積維持於適當範圍的觀點,相對於排出氣體中所含之氯化氫1莫耳,以1.5莫耳以下為佳。 The conversion reaction can also be carried out by adding a chlorodecane compound to the exhaust gas. The additional chlorodecane compound is used for the purpose of improving the removal efficiency of hydrogen chloride contained in the exhaust gas. Therefore, it is not particularly limited as long as it can be reacted with hydrogen chloride. As the additional chloromethane compound, for example, trichlorodecane, dichloromethane, monochlorodecane or the like can be used. The total amount of the chloromethane compound is a total amount of the chloromethane compound after the addition, and is preferably 1 mol or more, preferably 1.2 mol or more, based on 1 mol of hydrogen chloride contained in the exhaust gas. The total amount of the added chlorodecane compound is preferably 1.5 m or less from 1 mol of hydrogen chloride contained in the exhaust gas from the viewpoint of maintaining the volume of the circulating gas in an appropriate range.

如上述之轉化反應,係藉由活性碳催化。轉化反應觸媒之活性碳,較佳為具有細孔分布特性的活性碳。具體而言,由有效率地進行轉化反應的觀點,較佳為使用以水蒸氣吸附法所得之細孔分布曲線中具有最大波峰之細孔半徑(R)為1.2×10-9~4.0×10-9的活性碳。由提高氣體之接觸效率以有效率地進行添加反應的觀點,活性碳之比表面積,較佳為500m2/g以上。活性碳之比表面積,更佳為600~1000m2/g。上述比表面積,係以氮作為吸附質藉由BET法所測定之值(於本說明書以下相同)。 The above conversion reaction is catalyzed by activated carbon. The activated carbon of the conversion reaction catalyst is preferably activated carbon having a pore distribution property. Specifically, from the viewpoint of efficiently performing the conversion reaction, it is preferred to use a pore radius (R) having a maximum peak in the pore distribution curve obtained by the steam adsorption method to be 1.2 × 10 -9 to 4.0 × 10 -9 activated carbon. The specific surface area of the activated carbon is preferably 500 m 2 /g or more from the viewpoint of improving the contact efficiency of the gas to efficiently carry out the addition reaction. The specific surface area of the activated carbon is more preferably 600 to 1000 m 2 /g. The above specific surface area is a value measured by a BET method using nitrogen as an adsorbate (the same applies hereinafter).

活性碳之形狀並無特別限制,例如以具有粒狀、蜂巢狀、纖維狀等之形狀為佳。活性碳之大小,由操作容易度的觀點,較佳為,球換算徑為1~5mm。 The shape of the activated carbon is not particularly limited, and for example, it is preferably a shape having a granular shape, a honeycomb shape, or a fibrous shape. The size of the activated carbon is preferably from 1 to 5 mm in terms of ease of handling.

本發明中之轉化反應步驟所使用之活性碳,係以含有 磷為前提。因此,作為轉化反應觸媒之活性碳,可為來自椰子殼、石炭等者。現今工業上所使用之活性碳,係含有200ppm-wt左右之磷原子,所得之多晶矽中之磷含量通常係提高至不損及矽之電氣特性的程度。因此,本發明,為了除去氯化氫,使用活性碳進行之工業上之矽析出方法大致皆可適用。 The activated carbon used in the conversion reaction step in the present invention is contained Phosphorus is a prerequisite. Therefore, the activated carbon as a conversion reaction catalyst may be derived from coconut shell, charcoal or the like. The activated carbon used in the industry today contains about 200 ppm-wt of phosphorus atoms, and the phosphorus content of the resulting polycrystalline germanium is generally increased to such an extent that the electrical properties of the crucible are not impaired. Therefore, in the present invention, in order to remove hydrogen chloride, an industrial antimony precipitation method using activated carbon is generally applicable.

活性碳,一般而言係容易吸附空氣中的水分。若將吸附有水分的活性碳供至轉化反應步驟,則該水分會與排出氣體中之氯矽烷化合物反應而於活性碳上生成矽酸化合物。若於活性碳上生成矽酸化合物,則會產生配管的阻塞、污染等之不良情況,故不佳。因此,活性碳,較佳為除去吸附水分後供給至轉化反應。水分之除去方法,可舉例如減壓及加熱中之至少一者。該減壓處理,可藉由以絕對壓力例如1×104Pa以下、較佳為1×103Pa以下的減壓度下保持一定時間來進行。加熱處理,例如可於80~130℃下保持一定時間來進行。該加熱處理,較佳為於惰性氣體的流通下或減壓下進行。所使用之惰性氣體,可舉例如氮、氦、氬等。於減壓下進行時之減壓度,係與上述減壓處理中之減壓度相同。 Activated carbon is generally easy to adsorb moisture in the air. When the activated carbon adsorbed with water is supplied to the conversion reaction step, the water reacts with the chlorodecane compound in the exhaust gas to form a ruthenium compound on the activated carbon. When a phthalic acid compound is formed on the activated carbon, problems such as clogging and contamination of the piping may occur, which is not preferable. Therefore, the activated carbon is preferably supplied to the conversion reaction after removing the adsorbed water. The method of removing moisture may, for example, be at least one of pressure reduction and heating. This pressure reduction treatment can be carried out by maintaining the pressure under an absolute pressure of, for example, 1 × 10 4 Pa or less, preferably 1 × 10 3 Pa or less. The heat treatment can be carried out, for example, at 80 to 130 ° C for a certain period of time. This heat treatment is preferably carried out under a flow of an inert gas or under reduced pressure. Examples of the inert gas to be used include nitrogen, helium, argon, and the like. The degree of pressure reduction when it is carried out under reduced pressure is the same as the degree of pressure reduction in the above-described pressure reduction treatment.

減壓處理、與加熱處理,較佳為進行至活性碳中之水分充分被除去為止。水分是否充分被除去,可藉環境氣氛之露點測定來確認。水分之除去,較佳為進行至環境氣氛之露點為-30℃以下為止、更佳為-40℃以下為止。 The pressure reduction treatment and the heat treatment are preferably carried out until the water in the activated carbon is sufficiently removed. Whether the moisture is sufficiently removed can be confirmed by measuring the dew point of the ambient atmosphere. The removal of moisture is preferably carried out until the dew point of the ambient atmosphere is -30 ° C or lower, more preferably -40 ° C or lower.

轉化反應之反應溫度、反應時間、反應壓力等,可視 排出氣體中之氯化氫及氯矽烷化合物的濃度加以適當地設定。具體而言為以下所述。 Reaction temperature, reaction time, reaction pressure, etc. of the conversion reaction, visible The concentration of hydrogen chloride and chlorodecane compound in the exhaust gas is appropriately set. Specifically, it is as follows.

反應溫度:較佳為60~250℃、更佳為100~200℃ Reaction temperature: preferably 60 to 250 ° C, more preferably 100 to 200 ° C

反應時間(滯留時間):較佳為0.5~30秒鐘、更佳為5~15秒鐘 Reaction time (residence time): preferably 0.5 to 30 seconds, more preferably 5 to 15 seconds

除去氯化氫之際之活性碳與氯化氫的接觸時間(反應時間),較佳為,以成為上述範圍的方式,相對地調整接觸床之徑、活性碳之使用量及氣體之流速。 The contact time (reaction time) of the activated carbon and hydrogen chloride in the removal of hydrogen chloride is preferably such that the diameter of the contact bed, the amount of activated carbon used, and the flow rate of the gas are relatively adjusted so as to have the above range.

藉由如上述之轉化反應,可有效率地除去排出氣體中之氯化氫。轉化反應後之排出氣體中之氯化氫濃度,較佳可為0.1莫耳%以下。 Hydrogen chloride in the exhaust gas can be efficiently removed by the above-described conversion reaction. The concentration of hydrogen chloride in the exhaust gas after the conversion reaction is preferably 0.1 mol% or less.

該轉化反應為發熱反應。因此,供至轉化反應之排出氣體係於高溫中與活性碳接觸。因此,會於轉化反應後氣體混入活性碳中之磷雜質。本發明之方法中,轉化反應後之氣體所含有之磷雜質,可舉例如PCl3、PH3等,可含有該等中之1種以上。轉化反應後氣體中該等之磷雜質之濃度,換算成磷原子,大約為200~2000ppb-wt。 This transformation reaction is an exothermic reaction. Therefore, the vent gas system supplied to the conversion reaction is contacted with the activated carbon at a high temperature. Therefore, the phosphorus impurities in the activated carbon are mixed into the gas after the conversion reaction. In the method of the present invention, the phosphorus impurities contained in the gas after the conversion reaction may be, for example, PCl 3 or PH 3 , and may contain one or more of these. The concentration of the phosphorus impurities in the gas after the conversion reaction is converted into a phosphorus atom and is approximately 200 to 2000 ppb-wt.

<分離步驟> <Separation step>

分離步驟中,由上述轉化反應步驟所得之轉化反應後氣體,分離氫。於轉化反應後氣體,至少含有氫及氯矽烷化合物。於該氯矽烷化合物,含有原料氣體中所含有之氯矽烷化合物之熱分解生成物、未反應之氯矽烷化合物及轉化反應中所生成之氯矽烷化合物(及磷雜質)。具體而 言,包含例如四氯矽烷、三氯矽烷、二氯矽烷、單氯矽烷、六氯二矽烷、五氯二矽烷等。 In the separation step, the gas after the conversion reaction obtained by the above conversion reaction step separates hydrogen. The gas after the conversion reaction contains at least hydrogen and a chlorodecane compound. The chlorodecane compound contains a thermal decomposition product of a chlorosilane compound contained in a raw material gas, an unreacted chlorodecane compound, and a chloromethane compound (and a phosphorus impurity) formed in the conversion reaction. Specifically In other words, it includes, for example, tetrachlorosilane, trichlorodecane, dichlorodecane, monochlorodecane, hexachlorodioxane, pentachlorodioxane, and the like.

因此,該分離步驟,實質而言,係由轉化反應後氣體將氫與氯矽烷化合物分離的步驟。 Therefore, the separation step, in essence, is a step of separating hydrogen from the chlorodecane compound by the gas after the conversion reaction.

由轉化反應後氣體將氫與氯矽烷化合物分離時,可無限制地使用周知之手段。可舉例如下述方法:將轉化反應後氣體冷卻以將氯矽烷化合物濃縮液化,藉此將該等與氫分離。冷卻,係以使轉化反應後氣體到達較佳為-10℃以下、更佳為-40℃~-20℃之溫度的方式進行。 When the hydrogen is separated from the chlorosilane compound by the gas after the conversion reaction, a well-known means can be used without limitation. For example, a method in which the gas after the conversion reaction is cooled to liquefy the chlorodecane compound, thereby separating the hydrogen from the hydrogen. The cooling is carried out so that the gas after the conversion reaction reaches a temperature of preferably -10 ° C or lower, more preferably -40 ° C to -20 ° C.

<循環步驟> <loop step>

於循環步驟中,將上述分離步驟所得之氫循環再利用,供給至上述矽析出步驟。於將分離之氫供給至矽析出步驟時,可舉例如藉壓縮機進行循環之手段等。該壓縮機,可舉例如渦輪壓縮機、容積壓縮機等。 In the recycling step, the hydrogen obtained in the above separation step is recycled and supplied to the above-described decanting step. When the separated hydrogen is supplied to the hydrazine precipitation step, for example, a means of circulating by a compressor or the like can be mentioned. The compressor may, for example, be a turbo compressor or a volume compressor.

此時,由上述分離步驟所得之氯矽烷化合物,亦可視需要精製後,供給至上述矽析出步驟。由分離步驟所得之氯矽烷化合物之精製方法,可舉例如蒸餾等。當將氯矽烷化合物循環再利用於矽析出步驟時,氯矽烷化合物,較佳為,經由與氫之循環線路不同的線路供給至矽析出步驟。 At this time, the chlorodecane compound obtained by the above separation step may be purified as necessary, and then supplied to the above-described hydrazine precipitation step. The method for purifying the chlorodecane compound obtained in the separation step may, for example, be distillation. When the chlorodecane compound is recycled to the hydrazine precipitation step, the chlorodecane compound is preferably supplied to the hydrazine precipitation step via a line different from the hydrogen circulation line.

<含有路易斯酸性化合物之吸附材> <Adsorbent material containing Lewis acidic compound>

本發明之方法,係含有如上述之各步驟之多晶矽之製造方法,其特徵係,滿足下述條件(1)及(2)中之至少一 者。 The method of the present invention is a method for producing a polycrystalline silicon containing the steps described above, characterized in that at least one of the following conditions (1) and (2) is satisfied By.

(1)於分離步驟前,使由轉化反應步驟所得之轉化反應後氣體,與含有路易斯酸性化合物之吸附材接觸、及(2)於供給至矽析出步驟前,使分離步驟所得之氫,與含有路易斯酸性化合物之吸附材接觸。 (1) before the separation step, contacting the gas after the conversion reaction obtained by the conversion reaction step with the adsorption material containing the Lewis acidic compound, and (2) supplying the hydrogen obtained in the separation step before the supply to the ruthenium precipitation step, The adsorbent material containing the Lewis acidic compound is contacted.

藉由滿足上述條件,可有效率地除去轉化反應後氣體所含有之來自活性碳之磷雜質,藉此可盡可能地減少所得之多晶矽中之矽原子含量。 By satisfying the above conditions, the phosphorus impurities derived from the activated carbon contained in the gas after the conversion reaction can be efficiently removed, whereby the content of germanium atoms in the obtained polycrystalline germanium can be reduced as much as possible.

本發明中所使用之吸附材,含有路易斯酸性化合物。 The adsorbent used in the present invention contains a Lewis acidic compound.

上述路易斯酸性化合物,可舉例如AlCl3、Al2(SO4)3、CuSO4、NiSO4等,可使用由該等所選擇之1種以上。該等之中,由磷雜質之除去效果極高的觀點考量以使用CuSO4為佳。 The Lewis acidic compound may, for example, be AlCl 3 , Al 2 (SO 4 ) 3 , CuSO 4 or NiSO 4 , and one or more selected from the above may be used. Among these, it is preferable to use CuSO 4 from the viewpoint that the effect of removing phosphorus impurities is extremely high.

如上述之路易斯酸性化合物,可直接以該狀態使用,亦可以添附於(impregnate)基材的狀態使用。藉由將路易斯酸性化合物以添附於基材的狀態使用,可提高路易斯酸性化合物之有效表面積,藉此磷雜質之除去效率會變得極高,故較佳。 The Lewis acidic compound as described above may be used as it is in this state, or may be used in a state of being impregnated with a substrate. By using a Lewis acidic compound in a state of being attached to a substrate, the effective surface area of the Lewis acidic compound can be increased, whereby the removal efficiency of the phosphorus impurity is extremely high, which is preferable.

上述基材,可舉例如矽膠、沸石、氧化鋁等。上述沸石,可使用天然沸石及合成沸石(例如,分子篩等)之任一者。 Examples of the substrate include silicone, zeolite, and alumina. As the above zeolite, any of natural zeolite and synthetic zeolite (for example, molecular sieve or the like) can be used.

基材之比表面積,以50m2/g以上為佳、80~1000m2/g以上為更佳、特佳為100~500m2/g。 The specific surface area of the substrate is preferably 50 m 2 /g or more, more preferably 80 to 1000 m 2 /g or more, and particularly preferably 100 to 500 m 2 /g.

基材,較佳為,分級成1~5mm左右之粒度範圍後供 以添付處理。 The substrate, preferably, is classified into a particle size range of about 1 to 5 mm. Pay by credit.

於基材添附路易斯酸性化合物之方法,可使用周知之手段。例如,可使用下述方法:將路易斯酸性化合物之溶解於適當之溶劑調製成溶液,將基材含浸於該溶液後、或將該溶液散步於基材後,進行加熱以除去溶劑。上述溶液之溶劑,可舉例如水。 A method of adding a Lewis acidic compound to a substrate can be carried out by a known means. For example, a method in which a Lewis acidic compound is dissolved in a suitable solvent to prepare a solution, a substrate is impregnated into the solution, or the solution is allowed to stand on a substrate, and then heated to remove the solvent. The solvent of the above solution may, for example, be water.

當對基材之路易斯酸性化合物之添附係以含浸法時,上述溶液中之路易斯酸性化合物濃度,可視所欲之添附量適當地加以調整。例如,欲使添附量為5wt%時,上述溶液中之路易斯酸性化合物濃度以10~20wt%為佳。於含浸時所使用之溶液的量,較佳為,於含浸容器中基材能完全以溶液淹沒的量。含浸溫度,只要於室溫下進行即可,不需要特別地加熱或冷卻。含浸時間,以6~36小時為佳。含浸後之基材,以適當之方法、例如過濾由溶液分離之後,較佳為以溶劑洗淨後,進行加熱以除去溶劑。此處所使用之溶劑,較佳為與路易斯酸性化合物溶液之溶劑相同的種類。加熱溫度,較佳為130以上。加熱,較佳為於惰性氣體的流通下進行。此處所使用之惰性氣體,可舉例如氮、氦、氬等。該加熱,較佳為進行至溶劑被充分除去為止。溶劑之除去,較佳為,進行至使加熱後之添附基材於惰性氣體中時之露點至-30℃以下為止,該值更佳為-40℃以下為止。 When the addition of the Lewis acidic compound to the substrate is carried out by an impregnation method, the concentration of the Lewis acidic compound in the above solution can be appropriately adjusted depending on the desired amount of addition. For example, when the amount of addition is 5 wt%, the concentration of the Lewis acidic compound in the above solution is preferably 10 to 20% by weight. The amount of the solution used in the impregnation is preferably such that the substrate can be completely flooded with the solution in the impregnation vessel. The impregnation temperature is as long as it is carried out at room temperature, and does not require special heating or cooling. The impregnation time is preferably 6 to 36 hours. After the impregnated substrate is separated from the solution by a suitable method, for example, filtration, it is preferably washed with a solvent and then heated to remove the solvent. The solvent used herein is preferably the same type as the solvent of the Lewis acidic compound solution. The heating temperature is preferably 130 or more. Heating is preferably carried out under the circulation of an inert gas. The inert gas used herein may, for example, be nitrogen, helium or argon. This heating is preferably carried out until the solvent is sufficiently removed. The removal of the solvent is preferably carried out until the dew point of the substrate after heating in an inert gas is -30 ° C or lower, and the value is more preferably -40 ° C or lower.

對基材之路易斯酸性化合物之添附量,可視欲除去之磷雜質之濃度來適當地設定,相對於基材之重量,可使例 如為1~20重量%、較佳為3~15重量%。該添附量,可藉例如元素分析、螢光X射線分析等來測定。添附量,例如,可藉由改變所使用之路易斯酸性化合物溶液之濃度、含浸時或散布時之基材溫度等來控制。適當之添附條件,藉由所屬技術領域者以一些預備實驗可容易地獲知。 The amount of the Lewis acidic compound to be added to the substrate can be appropriately set depending on the concentration of the phosphorus impurity to be removed, and the weight can be made with respect to the weight of the substrate. It is 1 to 20% by weight, preferably 3 to 15% by weight. The amount of the addition can be measured by, for example, elemental analysis, fluorescent X-ray analysis, or the like. The amount of addition can be controlled, for example, by changing the concentration of the Lewis acidic compound solution used, the substrate temperature at the time of impregnation or the dispersion, and the like. Appropriate addition conditions are readily known by those skilled in the art with some preliminary experiments.

如以上於基材上添附路易斯酸性化合物所調製之吸附材,較佳為分級成1~5mm左右之粒徑範圍後供以使用。 The adsorbent material prepared by adding a Lewis acidic compound to the substrate is preferably used in a particle size range of about 1 to 5 mm.

如上述之吸附材中之基材,容易吸收空氣中的水分。因此,當將吸附材供給至與分離步驟前之轉化反應後氣體的接觸時,以事先將所吸附之水分除去為佳。該處理,係為了防止於分離步驟前之轉化反應後氣體所含之氯矽烷化合物與吸附水分反應生成矽氧化物,而導致吸附材表面之被覆所致之吸附活性之降低、配管的阻塞、污染等的不良情形所進行者。 The substrate in the adsorbent material as described above easily absorbs moisture in the air. Therefore, when the adsorbent material is supplied to the gas after the conversion reaction before the separation step, it is preferred to remove the adsorbed moisture in advance. This treatment is to prevent the chlorodecane compound contained in the gas after the conversion reaction before the separation step from reacting with the adsorbed water to form a cerium oxide, thereby causing a decrease in the adsorption activity due to the coating of the surface of the adsorbent, blocking of the pipe, and contamination. Those who are in a bad situation.

另一方面,當將於基材上添附路易斯酸性化合物所調製之吸附材,供給與至分離步驟後之氫接觸時,於接觸之時間點無生成矽氧化物之虞。然而,脫離之吸附水分有與處理後之氫一同搬運之反應器之虞。由於反應器中存在有氯矽烷化合物,故仍然有矽氧化物之生成之虞。因此,於該情況下,亦以於事前進行水分除去處理為佳。 On the other hand, when an adsorbent prepared by adding a Lewis acidic compound to the substrate is supplied and supplied with hydrogen after the separation step, no ruthenium oxide is formed at the time of contact. However, the detached adsorbed water has a reactor that is transported together with the treated hydrogen. Since the chloromethane compound is present in the reactor, there is still a enthalpy of formation of cerium oxide. Therefore, in this case, it is preferable to carry out the moisture removal treatment in advance.

水分之除去方法,可舉例如減壓及加熱中之至少一者。該減壓處理之方法及程度,係與上述之活性碳之水分的除去方法及程度相同。 The method of removing moisture may, for example, be at least one of pressure reduction and heating. The method and extent of the reduced pressure treatment are the same as the method and extent of removal of the moisture of the activated carbon described above.

本發明中較佳可使用之基材,係含有矽原子及鋁原子 中之至少一者。使用如此之基材所調製之吸附材的表面,有殘存M-OH(M為矽或鋁)基的情形。 The substrate which can be preferably used in the present invention contains a ruthenium atom and an aluminum atom. At least one of them. When the surface of the adsorbent material prepared by such a substrate is used, there is a case where M-OH (M is a ruthenium or aluminum) group remains.

若將具有表面M-OH基之吸附材供給至與分離步驟前之轉化反應後氣體的接觸,則該M-OH基會與氯矽烷化合物劇烈地反應,而發出超過反應容器之耐熱性的熱,而會損害反應容器。當M為矽原子時,發熱的傾向更顯著。為了避免如此之事態,較佳為,於將吸附材供給至與分離步驟前之轉化反應後氣體的接觸之前,進行吸附材表面之M-OH基的失活處理。 If the adsorbent having a surface M-OH group is supplied to the gas after the conversion reaction before the separation step, the M-OH group will react violently with the chlorosilane compound to emit heat exceeding the heat resistance of the reaction vessel. , which will damage the reaction vessel. When M is a deuterium atom, the tendency to heat is more pronounced. In order to avoid such a situation, it is preferred to perform the deactivation treatment of the M-OH group on the surface of the adsorbent before supplying the adsorbent to the gas after the conversion reaction before the separation step.

於使吸附材表面之M-OH基失活時,可藉由使吸附材與適當之M-OH鍵失活劑接觸的方法。該接觸,可於液相進行、亦可於氣相進行。然而,由於操作簡單、與不需要後處理等理由,以於氣相進行為佳。 When the M-OH group on the surface of the adsorbent is deactivated, it can be brought into contact with an appropriate M-OH bond deactivator by the adsorbent. The contacting can be carried out in the liquid phase or in the gas phase. However, it is preferable to carry out in the vapor phase for reasons such as simple operation and no post-treatment.

於表面M-OH基之失活所使用之失活劑,只要可使該鍵失活者即可,可無特別限制地使用。然而,當考量失活劑若殘存於吸附材上而有混入步驟內的可能性,較佳為使用存在於步驟內之種類作為失活劑。如此之失活劑,例如以氯矽烷化合物為佳。上述氯矽烷化合物之具體例,可舉例如二氯矽烷、三氯矽烷、四氯矽烷等。該等之中,藉由使用對M-OH鍵反應性最低之四氯矽烷,可使M-OH鍵之失活穩定地進行,故較佳。 The deactivating agent used for the deactivation of the surface M-OH group can be used without any particular limitation as long as the bond can be inactivated. However, when it is considered that there is a possibility that the deactivating agent remains in the mixing step if it remains on the adsorbent, it is preferred to use the species present in the step as a deactivating agent. Such a deactivating agent is preferably a chlorodecane compound. Specific examples of the above chlorodecane compound include dichlorosilane, trichlorodecane, tetrachlorosilane, and the like. Among these, the deactivation of the M-OH bond can be stably carried out by using tetrachlorosilane having the lowest reactivity with the M-OH bond, which is preferable.

當於氣相進行表面M-OH基之失活處理時,可藉由使吸附材與上述之氯矽烷化合物與惰性氣體之混合氣體接觸的方法。該混合氣體中之氯矽烷化合物的濃度,較佳為 0.5vol%以下、更佳為0.1~0.3vol%。與氯矽烷化合物混合之惰性氣體,可舉例如氮、氦、氬等。 When the surface M-OH group is deactivated in the vapor phase, it can be brought into contact with a mixed gas of the above-mentioned chlorodecane compound and an inert gas. The concentration of the chlorodecane compound in the mixed gas is preferably 0.5 vol% or less, more preferably 0.1 to 0.3 vol%. The inert gas to be mixed with the chlorosilane compound may, for example, be nitrogen, helium or argon.

使吸附材與失活劑於氣相接觸之際的條件,可依據表面M-OH基之濃度、吸附材之使用量、所使用之失活劑之種類及濃度等來適當地加以設定,無法一概地決定。然而,一般條件可如以下所揭示之值。 The conditions for bringing the adsorbent and the deactivator into contact with the gas phase can be appropriately set depending on the concentration of the surface M-OH group, the amount of the adsorbent used, the type and concentration of the deactivator used, and the like. Make a general decision. However, the general conditions can be as disclosed below.

失活劑接觸時之溫度:較佳為20~100℃、更佳為40~80℃。 The temperature at which the deactivating agent is in contact: preferably 20 to 100 ° C, more preferably 40 to 80 ° C.

失活劑接觸時間(滯留時間):較佳為30~120秒 Inactivation agent contact time (residence time): preferably 30 to 120 seconds

使用氯矽烷化合物作為失活劑時,該氯矽烷化合物與表面M-OH基之反應為發熱反應。因此,藉由監控吸附材附近之溫度變化,可明白失活反應的結束。 When a chlorodecane compound is used as the deactivating agent, the reaction of the chlorodecane compound with the surface M-OH group is an exothermic reaction. Therefore, the end of the deactivation reaction can be understood by monitoring the temperature change in the vicinity of the adsorbent.

<與吸附材之接觸> <Contact with adsorbent material>

本發明,係含有矽析出步驟、轉化反應步驟、分離步驟及循環步驟之多晶矽之製造方法,其特徵係,滿足下述條件(1)及(2)中之至少一者:(1)於分離步驟前,使由轉化反應步驟所得之轉化反應後氣體,與含有路易斯酸性化合物之吸附材接觸、及(2)於供給至矽析出步驟前,使分離步驟所得之氫,與含有路易斯酸性化合物之吸附材接觸。 The present invention relates to a method for producing a polycrystalline germanium comprising a deuterium precipitation step, a conversion reaction step, a separation step and a recycle step, characterized in that at least one of the following conditions (1) and (2) is satisfied: (1) separation Before the step, the gas obtained by the conversion reaction step is brought into contact with the adsorbent material containing the Lewis acidic compound, and (2) the hydrogen obtained in the separation step and the Lewis acid-containing compound are supplied before the step of supplying to the ruthenium precipitation step. Adsorbed material is in contact.

如上述,於轉化反應後之氣體混入有來自活性碳之磷雜質。本發明人等,確認該磷雜質於分離步驟後之氫中亦含有。另一方面,於分離步驟後之氯矽烷化合物中,不含 有該磷雜質、或是即使含有但即為微量。 As described above, the gas after the conversion reaction is mixed with phosphorus impurities derived from activated carbon. The inventors of the present invention confirmed that the phosphorus impurity is also contained in the hydrogen after the separation step. On the other hand, in the chlorodecane compound after the separation step, it does not contain There is such a phosphorus impurity, or even if it is contained, it is a trace amount.

因此,當由於矽析出步驟所循環再利用之再生氣體除去磷雜質時,只要可滿足上述條件(1)及(2)中之至少一者即可。 Therefore, when the phosphorus impurities are removed by the regeneration gas recycled by the decantation step, at least one of the above conditions (1) and (2) may be satisfied.

於上述條件(1)及(2)中之接觸條件,並無特別限制。 The contact conditions in the above conditions (1) and (2) are not particularly limited.

接觸之形態,可例示如下述方法:例如於以固定床、流動床等適當形式具有吸附材之吸附反應容器中,於條件(1)、與條件(2)之情況下分別流通轉化反應後氣體、與由分離步驟所得之氫,藉此進行吸附材與氣體之接觸。 The form of the contact may be, for example, a method in which an adsorption reaction vessel having an adsorbent material in a suitable form such as a fixed bed or a fluidized bed is used, and the gas after the conversion reaction is separately flowed under the conditions (1) and (2). And the hydrogen obtained by the separation step, thereby contacting the adsorbent material with the gas.

接觸時之溫度並無特別限制。然而,較佳為構成接觸反應層之材料的耐熱溫度以下,再者,當使用將路易斯酸化合物添附於基材所成之吸附材時,較佳為該基材之耐熱溫度以下。另一方面,於條件(1)之情況下,由於係使用於發熱反應之轉化反應步驟所得之轉化反應後氣體,故若將接觸溫度設定地過低則所必須之冷卻的程度變得過大,使得熱能量的損失變得無意義。由以上的觀點考量,接觸溫度,以-40~200℃為佳、50~200℃為更佳、特佳為80~150℃。 The temperature at the time of contact is not particularly limited. However, it is preferable that the heat-resistant temperature of the material constituting the contact reaction layer is not more than the heat-resistant temperature of the substrate, and when the Lewis acid compound is applied to the adsorbent material formed on the substrate, it is preferably at least the heat-resistant temperature of the substrate. On the other hand, in the case of the condition (1), since the gas after the conversion reaction obtained by the conversion reaction step of the exothermic reaction is used, if the contact temperature is set too low, the degree of cooling necessary is too large. The loss of thermal energy becomes meaningless. From the above point of view, the contact temperature is preferably -40 to 200 ° C, more preferably 50 to 200 ° C, and particularly preferably 80 to 150 ° C.

接觸時間(滯留時間),以1秒以上為佳。由於即使接觸時間愈長所得之效果亦不會減低,故接觸時間之上限並無限制。然而,考量工業上之便利性,則以30秒鐘以下為佳。更佳之接觸時間為5~15秒鐘。 The contact time (residence time) is preferably 1 second or longer. Since the effect of the longer contact time is not reduced, the upper limit of the contact time is not limited. However, considering industrial convenience, it is preferably 30 seconds or less. A better contact time is 5 to 15 seconds.

接觸時之壓力並無特別限制。接觸壓力,例如可為200~2000kPa。 The pressure at the time of contact is not particularly limited. The contact pressure can be, for example, 200 to 2000 kPa.

本發明中,較佳為,僅滿足上述條件(1)、不滿足條件(2)。其之理由在於,若進行轉化反應後氣體與吸附材之接觸,則轉化反應後氣體所含之氯矽烷化合物吸附於吸附材,會損及該吸附材之壽命。 In the present invention, it is preferable that only the above condition (1) is satisfied and the condition (2) is not satisfied. The reason for this is that if the gas is brought into contact with the adsorbent after the conversion reaction, the chlorodecane compound contained in the gas after the conversion reaction is adsorbed to the adsorbent, and the life of the adsorbent is impaired.

用以於工業上有利地進行本發明之方法的條件係如上述。然而,本發明之效果,確認不易受到吸附材與氣體接觸之際之溫度及壓力變化的影響。該傾向,為本發明所顯示之非常有利的特徵之一。亦即,由於不易受到接觸時之溫度及壓力的影響,故接觸反應之反應條件不需特別地控制,可將吸附材與氣體之接觸位置設定於任意位置。接觸位置,例如,當於上述條件(1)的情況下,可設定於轉化反應步驟與分離步驟之間的任意位置;於上述條件(2)之情況下,可設定於分離步驟之後將所得之氫供給至矽析出步驟之循環步驟中的任意位置。 The conditions for industrially advantageous carrying out the process of the present invention are as described above. However, the effects of the present invention have been confirmed to be less susceptible to changes in temperature and pressure at the time of contact of the adsorbent with the gas. This tendency is one of the very advantageous features shown by the present invention. That is, since the temperature and pressure at the time of contact are not easily affected, the reaction conditions of the contact reaction need not be specifically controlled, and the contact position of the adsorbent with the gas can be set to an arbitrary position. The contact position, for example, in the case of the above condition (1), can be set to any position between the conversion reaction step and the separation step; in the case of the above condition (2), it can be set after the separation step. Hydrogen is supplied to any of the cyclic steps of the decantation step.

實施例 Example <吸附劑之調製例> <Preparation Example of Adsorbent> 調製例1 Modulation example 1

於容量500mL之容器中,裝填比表面積250m2/g、平均粒徑3mm之粒狀矽膠100g。於其,加入將硫酸銅5水合物溶解於離子交換水所得之濃度20重量%之CuSO4水溶液100mL,於25℃下浸漬24小時。將浸漬後之矽膠過濾回收,以離子交換水洗淨後,於氮環境氣氛下,於130℃下加熱24小時,藉此製得吸附材(10wt% CuSO4添附 矽膠)。 In a container having a capacity of 500 mL, 100 g of a granular tantalum having a specific surface area of 250 m 2 /g and an average particle diameter of 3 mm was charged. 100 mL of a 20 wt% CuSO 4 aqueous solution obtained by dissolving copper sulfate 5 hydrate in ion-exchanged water was added thereto, and immersed at 25 ° C for 24 hours. The impregnated silica gel was collected by filtration, washed with ion-exchanged water, and heated at 130 ° C for 24 hours under a nitrogen atmosphere to obtain an adsorbent (10 wt% CuSO 4 -added silicone).

調製例2 Modulation example 2

於上述調製例1中,使用取代CuSO4水溶液將硫酸鎳6水合物溶解於離子交換水所得之濃度20重量%之NiSO4水溶液100mL,除此之外,與調製例1同樣地製得吸附材(10wt% NiSO4添附矽膠)。 In the above-mentioned preparation example 1, an absorbent material was obtained in the same manner as in Preparation Example 1 except that 100 mL of a 20% by weight aqueous solution of NiSO 4 obtained by dissolving nickel sulfate hexahydrate in an ion-exchanged water in an aqueous solution of CuSO 4 was used. (10wt% NiSO 4 is added with silicone).

調製例3 Modulation example 3

於上述調製例1中,使用取代CuSO4水溶液將硫酸鋁16水合物溶解於離子交換水所得之濃度20重量%之Al2(SO4)3水溶液100mL,除此之外,與調製例1同樣地製得吸附材(10wt% Al2(SO4)3添附矽膠)。 In the above-mentioned preparation example 1, the same procedure as in Preparation Example 1 was carried out, except that 100 mL of an Al 2 (SO 4 ) 3 aqueous solution having a concentration of 20% by weight of the aluminum sulfate 16 hydrate obtained by dissolving the aluminum sulfate 16 hydrate in the aqueous solution of the CuSO 4 was used. An adsorbent (10 wt% Al 2 (SO 4 ) 3 was added to the silicone) was prepared.

調製例4 Modulation example 4

於上述調製例1中,取代粒狀矽膠而使用比表面積180m2/g、平均粒徑3mm之粒狀活性氧化鋁100g,除此之外,與調製例1同樣地製得吸附材(10wt% CuSO4添附氧化鋁)。 In the above-mentioned preparation example 1, an absorbent material (10 wt%) was obtained in the same manner as in Preparation Example 1 except that 100 g of granular activated alumina having a specific surface area of 180 m 2 /g and an average particle diameter of 3 mm was used instead of the granular tannin. CuSO 4 is added with alumina).

調製例5 Modulation example 5

於上述調製例1中,取代粒狀矽膠而使用比表面積180m2/g、平均粒徑3mm之粒狀沸石100g,除此之外,與調製例1同樣地製得吸附材(10wt% CuSO4添附沸石)。 In the above-mentioned preparation example 1, an adsorbent (10 wt% CuSO 4 ) was obtained in the same manner as in Preparation Example 1 except that 100 g of a granular zeolite having a specific surface area of 180 m 2 /g and an average particle diameter of 3 mm was used instead of the granular tannin. Add zeolite).

調製例6 Modulation example 6

於上述調製例1中,除使CuSO4水溶液的濃度為5重量%以外,與調製例1同樣地製得吸附材(3wt% CuSO4添附矽膠)。 In the above-mentioned preparation example 1, an adsorbent (3 wt% CuSO 4-added tannin) was obtained in the same manner as in Preparation Example 1 except that the concentration of the CuSO 4 aqueous solution was 5% by weight.

調製例7 Modulation example 7

於上述調製例1中,除使CuSO4水溶液的濃度為30重量%以外,與調製例1同樣地製得吸附材(15wt% CuSO4添附矽膠)。 In the above-mentioned preparation example 1, an adsorption material (15 wt% CuSO 4-added silicone) was obtained in the same manner as in Preparation Example 1 except that the concentration of the CuSO 4 aqueous solution was 30% by weight.

<一般之實驗方法> <General Experimental Methods>

以下之實施例,係使用含有既定量之氯化氫及二氯矽烷之氫作為由矽析出步驟所排出之排出氣體的模式氣體來進行。 In the following examples, hydrogen containing a predetermined amount of hydrogen chloride and methylene chloride was used as a mode gas for the exhaust gas discharged from the ruthenium precipitation step.

使上述之模式氣體於轉化反應觸媒上流通以進行轉化反應。將由該轉化反應步驟所得之轉化反應後氣體所分離之氫,藉由流通於既定之吸附材上而與該吸附材接觸。接著以於與吸附材接觸處理後之氫混合三氯矽烷的氣體作為原料,以西門子法進行矽析出步驟,並測定所得之多晶矽中之磷濃度。 The above-mentioned mode gas is circulated on the conversion reaction catalyst to carry out a conversion reaction. The hydrogen separated by the gas after the conversion reaction obtained by the conversion reaction step is brought into contact with the adsorbent by circulating on a predetermined adsorbent. Next, a gas obtained by mixing trichloromethane with hydrogen after contact with the adsorbent was used as a raw material, and a decantation step was carried out by a Siemens method, and the concentration of phosphorus in the obtained polycrystalline germanium was measured.

詳細實驗方法係如以下所述。 The detailed experimental method is as follows.

(1)轉化反應步驟 (1) Conversion reaction step

使用比表面積為1300m2/g、以水蒸氣吸附法所得之細 孔分布曲線中顯示最大峰值之細孔半徑(R)為1.2×10-9m、平均粒徑為3mm之粒狀活性碳作為轉化反應觸媒。該活性碳係來自椰子殼者,其之磷原子含量為200ppm-wt。 Using a granular activated carbon having a specific pore diameter (R) of 1.2 × 10 -9 m and an average particle diameter of 3 mm, which has a specific surface area of 1,300 m 2 /g and a pore distribution curve obtained by a water vapor adsorption method, Conversion reaction catalyst. The activated carbon is derived from a coconut shell having a phosphorus atom content of 200 ppm-wt.

於內徑27mm、長度100mm之圓筒狀不鏽鋼容器充填上述活性碳10g,於容器內插入熱電偶。該熱電偶,係用以測定活性碳充填層之溫度者。 A cylindrical stainless steel container having an inner diameter of 27 mm and a length of 100 mm was filled with 10 g of the above activated carbon, and a thermocouple was inserted into the container. The thermocouple is used to determine the temperature of the activated carbon filling layer.

首先,進行吸附於活性碳之水分的除去。將活性碳層加熱至150℃,以壓力2kPaG、以0.05NL/min的流速流通乾燥氮10小時,以除去吸附水分。接著,將容器內以氫取代,同時將活性碳層溫度冷卻至30℃後,供給至轉化反應。 First, the removal of moisture adsorbed to the activated carbon is performed. The activated carbon layer was heated to 150 ° C, and the dried nitrogen was flowed at a pressure of 2 kPa G at a flow rate of 0.05 NL / min for 10 hours to remove adsorbed moisture. Next, the inside of the vessel was replaced with hydrogen, and while the temperature of the activated carbon layer was cooled to 30 ° C, it was supplied to the conversion reaction.

轉化反應,係以含有氯化氫及二氯矽烷各1.5莫耳%之氫作為模式氣體來進行。使該模式氣體,以壓力1kPaG、以流速320NmL/min流通於溫度30℃之活性碳層。此時,活性碳層之溫度約上升至60℃。其係考量為於活性碳之吸附熱及轉化反應之反應熱所致。 The conversion reaction was carried out using hydrogen gas containing 1.5 mol% each of hydrogen chloride and dichlorosilane as a mode gas. This mode gas was passed through an activated carbon layer at a temperature of 30 ° C at a flow rate of 320 NmL/min at a pressure of 1 kPaG. At this time, the temperature of the activated carbon layer rises to about 60 °C. The consideration is due to the heat of adsorption of activated carbon and the heat of reaction of the conversion reaction.

(2)分離步驟 (2) Separation step

將由上述轉化反應所排出之氣體,於溫度-40℃之條件下冷卻後,將氣相回收以分離氫。所得氫中之磷原子濃度為2000ppb-wt。 The gas discharged from the above conversion reaction is cooled at a temperature of -40 ° C, and then the gas phase is recovered to separate hydrogen. The phosphorus atom concentration in the obtained hydrogen was 2000 ppb-wt.

(3)氫與吸附材之接觸步驟 (3) Step of contacting hydrogen with adsorbent

於內徑27mm、長度100mm之圓筒狀不鏽鋼製容器充填既定之吸附材10g,於容器內插入熱電偶。 A cylindrical stainless steel container having an inner diameter of 27 mm and a length of 100 mm was filled with a predetermined adsorbent material of 10 g, and a thermocouple was inserted into the container.

首先,除去吸附於吸附材的水分後,進行表面M-OH 鍵的失活處理。 First, after removing the moisture adsorbed on the adsorbent, the surface M-OH is performed. Inactivation of the key.

將吸附材層加熱至150℃,以0.05L/min之流速流通乾燥氮10小時,除去吸附水分。接著,以壓力10kPaG、以50NmL/min之流速流通含有0.5vol%之四氯矽烷的氮5小時。之後,供給至與氫的接觸。 The adsorbent layer was heated to 150 ° C, and the dried nitrogen was flowed at a flow rate of 0.05 L/min for 10 hours to remove adsorbed moisture. Next, nitrogen containing 0.5 vol% of tetrachloromethane was flowed at a flow rate of 10 kPaG at a flow rate of 10 kPaG for 5 hours. Thereafter, it is supplied to contact with hydrogen.

將上述處理後之吸附材層的溫度設定於既定溫度之後,以壓力1kPaG、以既定之流速流通上述分離步驟所得之氫,進行氫與吸附材的接觸反應。 After the temperature of the adsorbent layer after the treatment is set to a predetermined temperature, the hydrogen obtained in the separation step is passed at a predetermined flow rate at a pressure of 1 kPa G to carry out a contact reaction between hydrogen and the adsorbent.

(4)矽析出步驟 (4) Steps of precipitation

於上述接觸步驟所得之氫混合三氯矽烷,作成氫:三氯矽烷=10:1(體積比)的混合氣體。將該混合氣體供給至加熱至1200℃之直徑8mm、長度100mm的矽管,藉此使多晶矽析出於矽管的表面。 The hydrogen obtained in the above contacting step was mixed with trichloromethane to prepare a mixed gas of hydrogen: trichlorodecane = 10:1 (volume ratio). This mixed gas was supplied to a crucible tube having a diameter of 8 mm and a length of 100 mm heated to 1200 ° C, whereby the polycrystal was decanted out of the surface of the manifold.

以元素分析測定所得之多晶矽中之磷原子濃度。 The concentration of phosphorus atoms in the obtained polycrystalline germanium was determined by elemental analysis.

參考例1(空白試驗) Reference Example 1 (blank test)

除使用不含磷雜質之氫作為原料氫之外,與上述「(4)矽析出步驟」同樣地進行操作,製得多晶矽。 The polycrystalline silicon was produced in the same manner as in the above "(4) hydrazine precipitation step, except that hydrogen containing no phosphorus impurities was used as the raw material hydrogen.

將所得之多晶矽中之磷原子濃度示於表1。 The phosphorus atom concentration in the obtained polycrystalline germanium is shown in Table 1.

比較例1(不使用吸附材時) Comparative Example 1 (when no adsorbent material is used)

於上述「(3)氫與吸附材之接觸步驟」中,不使用吸附材使容器為空容器,將該空容器之溫度設定為80℃來進行接觸步驟,除此之外,與上述<一般之實驗方法>同 樣地進行操作,製得多晶矽。 In the above "(3) Contact step of hydrogen and adsorbent material", the container is made into an empty container without using an adsorbent, and the temperature of the empty container is set to 80 ° C to carry out the contacting step, and Experimental method > same The sample is operated to make a crystal.

將所得之多晶矽中之磷原子濃度示於表1。 The phosphorus atom concentration in the obtained polycrystalline germanium is shown in Table 1.

實施例1~10及比較例2及3 Examples 1 to 10 and Comparative Examples 2 and 3

使上述「(3)氫與吸附材之接觸步驟」中之吸附材之種類、吸附材層之溫度及氫流速如表1之記載所述,依據上述<一般之實驗方法>進行各步驟,分別製得多晶矽。 The type of the adsorbent in the step (3) the step of contacting the hydrogen with the adsorbent, the temperature of the adsorbent layer, and the hydrogen flow rate are as described in Table 1, and the respective steps are carried out in accordance with the above-mentioned <general experimental method>. It is much more crystalline.

將所得之多晶矽中之磷原子濃度,分別示於表1。 The phosphorus atom concentration in the obtained polycrystalline germanium is shown in Table 1, respectively.

比較例2及3所使用之矽膠及活性氧化鋁,分別如以下所述。 The silicone and activated alumina used in Comparative Examples 2 and 3 are as follows.

矽膠(比較例2):比表面積250m2/g、平均粒徑3mm之粒狀矽膠。 Silicone (Comparative Example 2): Granular silicone having a specific surface area of 250 m 2 /g and an average particle diameter of 3 mm.

活性氧化鋁(比較例3):比表面積180m2/g、平均粒徑3mm之粒狀活性氧化鋁。 Activated alumina (Comparative Example 3): Granular activated alumina having a specific surface area of 180 m 2 /g and an average particle diameter of 3 mm.

藉由本發明,利用氯矽烷化合物與氫之反應所進行的多晶矽之製造方法,當併用排出氣體中之氯化氫的除去與排出氣體中之氫的循環再利用時,可容易、且有效地除去循環氣體中所含有之來自活性碳觸媒之磷雜質。因此,上述本發明之方法所得之多晶矽,係可盡可能減低磷原子含量者,而能適用於太陽能電池、半導體等之用途。 According to the present invention, in the method for producing polycrystalline silicon by the reaction of a chlorodecane compound and hydrogen, the combined use of the removal of hydrogen chloride in the exhaust gas and the recycling of hydrogen in the exhaust gas can easily and efficiently remove the circulating gas. Contains phosphorus impurities from activated carbon catalysts. Therefore, the polycrystalline silicon obtained by the above method of the present invention can be used for solar cells, semiconductors, etc., by reducing the phosphorus atom content as much as possible.

Claims (5)

一種多晶矽之製造方法,其係包含:藉由氯矽烷化合物與氫之反應而生成矽的矽析出步驟、使由前述矽析出步驟所排出之排出氣體與活性碳接觸以除去該排出氣體中之氯化氫的轉化反應步驟、分離由前述轉化反應步驟所得之轉化反應後氣體中之氫的分離步驟、及將前述分離步驟所得之氫供給至前述矽析出步驟的循環步驟之多晶矽之製造方法;其特徵係滿足下述條件(1)及(2)中之至少一者,(1)於分離步驟前,使由轉化反應步驟所得之轉化反應後氣體,與含有路易斯酸性化合物之吸附材接觸、及(2)於供給至矽析出步驟前,使分離步驟所得之氫,與含有路易斯酸性化合物之吸附材接觸。 A method for producing polycrystalline germanium, comprising: a step of forming a ruthenium by reacting a chlorodecane compound with hydrogen; and contacting the exhaust gas discharged from the mashing step with activated carbon to remove hydrogen chloride in the exhaust gas a conversion reaction step, a separation step of separating hydrogen in the gas after the conversion reaction obtained by the above-mentioned conversion reaction step, and a method for producing polycrystalline silicon obtained by supplying the hydrogen obtained in the separation step to the cycle of the above-described decantation step; Satisfying at least one of the following conditions (1) and (2), (1) contacting the gas after the conversion reaction obtained by the conversion reaction step with the adsorption material containing the Lewis acidic compound before the separation step, and (2) Before the supply to the deuterium precipitation step, the hydrogen obtained in the separation step is brought into contact with the adsorption material containing the Lewis acidic compound. 如申請專利範圍第1項之多晶矽之製造方法,其中,前述路易斯酸化合物,係選自CuSO4、NiSO4及Al2(SO4)3所構成群中之至少1種。 The method for producing a polycrystalline silicon according to the first aspect of the invention, wherein the Lewis acid compound is at least one selected from the group consisting of CuSO 4 , NiSO 4 and Al 2 (SO 4 ) 3 . 如申請專利範圍第1或2項之多晶矽之製造方法,其中,前述吸附材,係於基材添加路易斯酸化合物所得之吸附材。 The method for producing a polycrystalline silicon according to claim 1 or 2, wherein the adsorbing material is an adsorbent obtained by adding a Lewis acid compound to a substrate. 如申請專利範圍第3項之多晶矽之製造方法,其中,前述基材,係選自氧化矽凝膠、分子篩、沸石及氧化鋁所構成群中之至少1種。 The method for producing a polycrystalline silicon according to the third aspect of the invention, wherein the substrate is at least one selected from the group consisting of cerium oxide gel, molecular sieve, zeolite, and alumina. 如申請專利範圍第4項之多晶矽之製造方法,其中,將前述吸附材,供給至以氯矽烷化合物處理後之使用。 The method for producing a polycrystalline silicon according to the fourth aspect of the invention, wherein the adsorbing material is supplied to a treatment with a chlorodecane compound.
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