TW201342459A - Chemical mixer - Google Patents

Chemical mixer Download PDF

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Publication number
TW201342459A
TW201342459A TW101147728A TW101147728A TW201342459A TW 201342459 A TW201342459 A TW 201342459A TW 101147728 A TW101147728 A TW 101147728A TW 101147728 A TW101147728 A TW 101147728A TW 201342459 A TW201342459 A TW 201342459A
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Taiwan
Prior art keywords
sulfuric acid
hydrogen peroxide
substrate
supplied
mixed
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TW101147728A
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Chinese (zh)
Inventor
Yasuyuki Koyama
Takayoshi Adachi
Akira Takahashi
Hirofumi SHOMORI
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J E T Co Ltd
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F23/00Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
    • B01F23/40Mixing liquids with liquids; Emulsifying
    • B01F23/49Mixing systems, i.e. flow charts or diagrams
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F35/00Accessories for mixers; Auxiliary operations or auxiliary devices; Parts or details of general application
    • B01F35/80Forming a predetermined ratio of the substances to be mixed
    • B01F35/88Forming a predetermined ratio of the substances to be mixed by feeding the materials batchwise
    • B01F35/882Forming a predetermined ratio of the substances to be mixed by feeding the materials batchwise using measuring chambers, e.g. volumetric pumps, for feeding the substances
    • B01F35/8821Forming a predetermined ratio of the substances to be mixed by feeding the materials batchwise using measuring chambers, e.g. volumetric pumps, for feeding the substances involving controlling
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01FMIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
    • B01F35/00Accessories for mixers; Auxiliary operations or auxiliary devices; Parts or details of general application
    • B01F35/80Forming a predetermined ratio of the substances to be mixed
    • B01F35/88Forming a predetermined ratio of the substances to be mixed by feeding the materials batchwise
    • B01F35/883Forming a predetermined ratio of the substances to be mixed by feeding the materials batchwise using flow rate controls for feeding the substances
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Fluid Mechanics (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Accessories For Mixers (AREA)
  • Detergent Compositions (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

The present invention proposes a chemical mixer that can supply a chemical mixture to a substrate treating device without degradation over time, and can suppress variations in a mixing ratio for sulfuric acid and hydrogen peroxide and produce a chemical mixture that maintains a constant mixing ratio when producing a chemical mixture. In a chemical mixer (10), a sulfuric acid flow rate is stabilized by pressure feeding the sulfuric acid by a pressure feeding means (35), and also a hydrogen peroxide flow rate is stabilized by injecting the hydrogen peroxide with a supply rate lower than that of the sulfuric acid using a metering pump (38) in a fixed small amount. The mixture is produced from the sulfuric acid and hydrogen peroxide in an interflow part (105), and the chemical mixture is supplied to a substrate treating device (1) as is, directly after production. Thus, the chemical mixture can be supplied to the substrate treating device (1) without degradation over time, and variations in the mixing ratio for the sulfuric acid and hydrogen peroxide can be suppressed when producing the chemical mixture, allowing for production of a chemical mixture in which a fixed mixing ratio is maintained.

Description

藥液混合裝置 Liquid mixing device

本發明係關於一種藥液混合裝置,非常適用於混合硫酸(H2SO4)與過氧化氫(H2O2),生成用於去除半導體基板(以下單稱「基板」)表面之光阻劑之混合藥液。 The invention relates to a chemical liquid mixing device, which is very suitable for mixing sulfuric acid (H 2 SO 4 ) and hydrogen peroxide (H 2 O 2 ) to form a photoresist for removing the surface of a semiconductor substrate (hereinafter referred to as “substrate”). a mixture of agents.

先前,去除基板表面上之光阻劑,洗淨基板之洗淨方法,有混合硫酸與過氧化氫以生成混合藥液,使用此混合藥液以去除基板表面上之光阻劑之藥液處理法係眾所周知(例如參照專利文獻1)。在此,混合藥液係藉混合硫酸與過氧化氫時產生之反應熱,生成過硫酸(H2SO5,也稱做Peroxoacid),而且,藉被加熱到約180℃~200℃,能促進生成過硫酸。在藥液處理法中,係供給在充分生成過硫酸之狀態之混合藥液到基板表面,使附著在基板表面上之光阻劑藉混合藥液中之過硫酸而溶解,進行基板表面之洗淨。 Previously, the photoresist on the surface of the substrate is removed, and the substrate is cleaned by mixing sulfuric acid with hydrogen peroxide to form a mixed solution, and the mixed solution is used to remove the photoresist from the substrate surface. The law is well known (for example, refer to Patent Document 1). Here, the mixed chemical liquid is produced by mixing the reaction heat generated by the combination of sulfuric acid and hydrogen peroxide to form persulfuric acid (H 2 SO 5 , also called Peroxoacid), and can be promoted by heating to about 180 ° C to 200 ° C. Persulfuric acid is produced. In the chemical solution processing method, a mixed chemical solution in a state in which persulfuric acid is sufficiently formed is supplied to the surface of the substrate, and the photoresist adhered to the surface of the substrate is dissolved by persulfuric acid in the mixed chemical solution to wash the surface of the substrate. net.

在此,被生成在混合藥液中之過硫酸,眾所周知其生命週期非常短,自生成後不久即開始分解,隨著時間經過而逐漸減少。因此,在例如使混合過氧化氫與硫酸以生成之混合藥液,事先儲存在藥液儲存槽,使用此混合藥液以去除基板表面之光阻劑之藥液處理法中(以下,稱做「藥液儲存方式」),在藥液儲存槽內,混合藥液係逐漸長時間劣化而過硫酸減少。 在此,在藥液儲存方式中,必須隨時添加過氧化氫與硫酸到混合藥液,總是在混合藥液中生成新的過硫酸。結果,在此藥液儲存方式中,有需要大量過氧化氫與硫酸之問題。 Here, the persulfuric acid which is formed in the mixed chemical liquid is known to have a very short life cycle, and starts to decompose soon after the formation, and gradually decreases as time passes. Therefore, for example, a mixed chemical solution in which hydrogen peroxide and sulfuric acid are mixed is stored in a chemical solution storage tank in advance, and the mixed chemical solution is used to remove the photoresist on the surface of the substrate (hereinafter, referred to as In the "medical solution storage method", in the chemical solution storage tank, the mixed chemical liquid is gradually deteriorated for a long time and the persulfuric acid is reduced. Here, in the chemical liquid storage method, it is necessary to add hydrogen peroxide and sulfuric acid to the mixed chemical solution at any time, and always generate new persulfuric acid in the mixed chemical liquid. As a result, there is a problem that a large amount of hydrogen peroxide and sulfuric acid are required in this liquid storage method.

在此,為解決這種問題點,有考慮在去除基板表 面之光阻劑前,生成混合藥液,在混合藥液長時間劣化前,使用混合藥液去除基板表面之光阻劑之藥液處理法。在此種藥液處理法中,只要以必要最低限度之使用量生成混合藥液即可,與上述藥液儲存方式相比較,可大幅減少混合藥液之使用量。 Here, in order to solve this problem, it is considered to remove the substrate table. Before the photoresist is formed, a mixed chemical solution is generated, and the mixed solution is used to remove the photoresist from the substrate surface before the mixed solution is degraded for a long time. In such a chemical solution processing method, the mixed chemical solution can be produced at a minimum required usage amount, and the amount of the mixed chemical solution can be greatly reduced as compared with the above-described chemical liquid storage method.

在此,第4圖係表示在生成混合藥液後不久,使 用此混合藥液去除基板表面之光阻劑之基板洗淨裝置101。實際上,此基板洗淨裝置101係具有:基板處理裝置102,供給混合藥液到基板表面,以去除該基板表面之光阻劑;以及藥液混合裝置100,在即將以基板處理裝置102去除光阻劑時,混合過氧化氫與硫酸以生成混合藥液,供給此混合藥液到基板處理裝置102。 Here, Fig. 4 shows that shortly after the formation of the mixed drug solution, The substrate cleaning device 101 for removing the photoresist on the surface of the substrate is prepared by using the mixed chemical solution. Actually, the substrate cleaning apparatus 101 has a substrate processing apparatus 102 that supplies a mixed chemical liquid to the surface of the substrate to remove the photoresist on the surface of the substrate, and a chemical liquid mixing apparatus 100 that is to be removed by the substrate processing apparatus 102. In the case of the photoresist, hydrogen peroxide and sulfuric acid are mixed to form a mixed chemical solution, and the mixed chemical solution is supplied to the substrate processing apparatus 102.

在此,藥液混合裝置100具有過氧化氫儲存槽 103、硫酸儲存槽104及混合藥液生成部108,具有在混合藥液生成部108連接有基板處理裝置102之構成。又,混合藥液生成部108具有:過氧化氫供給管111a,使過氧化氫儲存槽103之過氧化氫供給至合流部105;硫酸供給管111b,使硫酸儲存槽104之硫酸供給至合流部105;合流部105,過氧化氫供給管111a與硫酸供給管111b合流;以及混合藥液供給管111c,使在合流部105生成之混合藥液供給至基板處理裝置102。 Here, the chemical liquid mixing device 100 has a hydrogen peroxide storage tank 103. The sulfuric acid storage tank 104 and the mixed chemical solution generating unit 108 have a configuration in which the substrate processing apparatus 102 is connected to the mixed chemical solution generating unit 108. Further, the mixed chemical solution generating unit 108 includes a hydrogen peroxide supply pipe 111a, supplies hydrogen peroxide of the hydrogen peroxide storage tank 103 to the merging portion 105, and a sulfuric acid supply pipe 111b for supplying sulfuric acid of the sulfuric acid storage tank 104 to the merging portion. 105; the merging portion 105, the hydrogen peroxide supply pipe 111a merges with the sulfuric acid supply pipe 111b, and the mixed chemical liquid supply pipe 111c, and supplies the mixed chemical liquid generated in the merging portion 105 to the substrate processing apparatus 102.

實際上,在過氧化氫供給管111a,於過氧化氫儲 存槽103與合流部105之間設有伸縮囊幫浦106a,在伸縮囊幫浦106a與合流部105之間設有閥體113a。又,在此過氧化氫供給管111a,於伸縮囊幫浦106a與閥體113a之間,設有與過氧化氫儲存槽103相連接之循環用配管114a。藉此,過氧化氫供給管111a可形成循環路徑110a,循環路徑110a係在閥體113a被關閉之狀態下,當驅動伸縮囊幫浦106a時,藉伸縮囊幫浦106a,自過氧化氫儲存槽103被吐出之過氧化氫,經由循環用配管114a再度回到過氧化氫儲存槽103。 In fact, in the hydrogen peroxide supply pipe 111a, in the hydrogen peroxide storage A bellows 106a is provided between the reservoir 103 and the merging portion 105, and a valve body 113a is provided between the bellows pump 106a and the merging portion 105. Further, in the hydrogen peroxide supply pipe 111a, a circulation pipe 114a connected to the hydrogen peroxide storage tank 103 is provided between the bellows pump 106a and the valve body 113a. Thereby, the hydrogen peroxide supply pipe 111a can form a circulation path 110a, and the circulation path 110a is in a state where the valve body 113a is closed, and when the bellows pump 106a is driven, the telescopic bag pump 106a is stored from the hydrogen peroxide. The hydrogen peroxide discharged from the tank 103 is returned to the hydrogen peroxide storage tank 103 via the circulation pipe 114a.

另外,於硫酸供給管111b也在硫酸儲存槽104與 合流部105之間設有伸縮囊幫浦106b,在伸縮囊幫浦106b與合流部105之間設有閥體113b。又,在此硫酸供給管111b,於伸縮囊幫浦106b與閥體113b之間,設有與硫酸儲存槽104相連接之循環用配管114a。藉此,硫酸供給管111b可形成循環路徑110b,循環路徑110b係在閥體113b被關閉之狀態下,當驅動伸縮囊幫浦106b時,藉伸縮囊幫浦106b,自硫酸儲存槽104被吐出之硫酸,經由循環用配管114b再度回到硫酸儲存槽104。 In addition, the sulfuric acid supply pipe 111b is also in the sulfuric acid storage tank 104 A bellows 106b is provided between the merging portions 105, and a valve body 113b is provided between the bellows pump 106b and the merging portion 105. Further, in the sulfuric acid supply pipe 111b, a circulation pipe 114a connected to the sulfuric acid storage tank 104 is provided between the bellows pump 106b and the valve body 113b. Thereby, the sulfuric acid supply pipe 111b can form a circulation path 110b which is discharged from the sulfuric acid storage tank 104 by the bellows pump 106b when the bellows pump 106b is driven in a state where the valve body 113b is closed. The sulfuric acid is returned to the sulfuric acid storage tank 104 via the circulation pipe 114b.

藥液混合裝置100當自此狀態,過氧化氫供給管 111a及硫酸供給管111b的各閥體113a,113b打開時,利用由各伸縮囊幫浦106a,106b的伸縮囊部之伸縮動作所做之壓力位移,可分別供給過氧化氫及硫酸至合流部105。藉此,合流部105係混合過氧化氫及硫酸以生成混合藥液,透過混合過氧化氫與硫酸之混合藥液供給管111c,可供給到基板處理裝置102。而且,在被連接到基板處理裝置102之混合藥液供給管 111c,設有混合藥液壓送機構118,使自藥液混合裝置100供給之混合藥液,例如以氮氣等惰性氣體壓送,使得可確實供給混合藥液至基板處理裝置102。 The chemical liquid mixing device 100 is in this state, the hydrogen peroxide supply pipe When the valve bodies 113a and 113b of the 111a and the sulfuric acid supply pipe 111b are opened, hydrogen peroxide and sulfuric acid can be supplied to the confluence unit by pressure displacement by the expansion and contraction operation of the bellows portions of the bellows pumps 106a and 106b, respectively. 105. Thereby, the merging portion 105 is mixed with hydrogen peroxide and sulfuric acid to form a mixed chemical solution, and is supplied to the substrate processing apparatus 102 by mixing the mixed chemical solution supply tube 111c of hydrogen peroxide and sulfuric acid. Moreover, the mixed chemical supply pipe connected to the substrate processing apparatus 102 111c, a mixed medicine hydraulic pressure feeding mechanism 118 is provided, and the mixed chemical liquid supplied from the chemical liquid mixing device 100 is pressure-fed, for example, with an inert gas such as nitrogen gas, so that the mixed chemical liquid can be surely supplied to the substrate processing apparatus 102.

在此,被供給到基板處理裝置102之混合藥液, 生成過硫酸之最佳混合比率,最好例如被設定成過氧化氫與硫酸為1:4~8。在此,於此藥液混合裝置100中,可使混合藥液之混合比率之調整,藉調整各伸縮囊幫浦106a,106b之吐出流量來進行。實際上,係使藥液混合裝置100中之各伸縮囊幫浦106a,106b之吐出流量,分別個別設定成混合藥液之混合比率為最佳值(例如過氧化氫與硫酸為1:4)。接著,藉分別設於過氧化氫供給管111a與硫酸供給管111b上之流量計(未圖示),實際量測生成混合藥液時之過氧化氫流量與硫酸流量之各流量變動。結果,在此藥液混合裝置100中,獲得第5圖所示之結果。 Here, the mixed chemical supplied to the substrate processing apparatus 102, The optimum mixing ratio for the formation of persulfuric acid is preferably set to, for example, hydrogen peroxide and sulfuric acid of 1:4 to 8. Here, in the chemical liquid mixing device 100, the mixing ratio of the mixed chemical liquid can be adjusted by adjusting the discharge flow rate of each of the bellows pumps 106a and 106b. Actually, the discharge flow rates of the respective bellows pumps 106a and 106b in the chemical liquid mixing device 100 are individually set to the optimum mixing ratio of the mixed chemical liquid (for example, hydrogen peroxide and sulfuric acid are 1:4). . Next, the flow rate (not shown) provided in the hydrogen peroxide supply pipe 111a and the sulfuric acid supply pipe 111b is actually measured to vary the flow rates of the hydrogen peroxide flow rate and the sulfuric acid flow rate when the mixed chemical liquid is generated. As a result, in the liquid chemical mixing device 100, the results shown in Fig. 5 were obtained.

在此藥液混合裝置100中,在合流部105之伸縮 囊幫浦106a,106b所做之壓力變動為很小之0.02Mpa,大大影響過氧化氫及硫酸之供給,如第5圖所示,因為伸縮囊幫浦106a,106b之脈動等其他種種原因,在過氧化氫流量與硫酸流量分別不規則地產生較大之流量變動,成為與期望之混合比率不同者。如此一來,在上述構成之藥液混合裝置100中,當混合過氧化氫與硫酸時,混合藥液中之過氧化氫與硫酸之混合比率係經常變動,所以,有很難使維持一定混合比率之混合藥液,穩定供給到基板處理裝置102之問題。 In this chemical liquid mixing device 100, the expansion and contraction portion 105 is stretched and contracted. The pressure change of the capsule pumps 106a, 106b is very small 0.02Mpa, which greatly affects the supply of hydrogen peroxide and sulfuric acid, as shown in Fig. 5, because of the various reasons such as the pulsation of the bellows pump 106a, 106b, etc. A large flow rate fluctuation occurs irregularly between the hydrogen peroxide flow rate and the sulfuric acid flow rate, and is different from the desired mixing ratio. As described above, in the chemical-solution mixing device 100 having the above configuration, when hydrogen peroxide and sulfuric acid are mixed, the mixing ratio of hydrogen peroxide to sulfuric acid in the mixed chemical solution frequently fluctuates, so that it is difficult to maintain a certain mixing. The ratio of the mixed chemical solution is stably supplied to the substrate processing apparatus 102.

因此,這種流量變動係當事先生成混合藥液以預 先儲存在藥液儲存槽時,只要藉藥液儲存槽調整混合藥液之混合比率即可,所以,即使混合過氧化氫與硫酸後不久之混合比率有一些變動,也不造成較大問題。但是,當生成混合藥液後不久,照原樣供給此混合藥液到基板表面以去除光阻劑時,當混合藥液中之過氧化氫與硫酸之混合比率沒有被調整到期望值時,有在混合藥液中未充分生成過硫酸之虞,產生很難去除基板表面之光阻劑之重大問題。 Therefore, this flow rate change is when the mixed liquid is generated in advance. When storing in the drug solution storage tank, it is only necessary to adjust the mixing ratio of the mixed drug solution by the drug solution storage tank. Therefore, even if the mixing ratio of hydrogen peroxide and sulfuric acid is mixed, there is some variation, and no major problem is caused. However, when the mixed solution is supplied as it is to the surface of the substrate to remove the photoresist, when the mixing ratio of hydrogen peroxide to sulfuric acid in the mixed solution is not adjusted to a desired value, there is The excessive formation of persulfate in the mixed chemical solution causes a major problem that it is difficult to remove the photoresist on the surface of the substrate.

在此,為解決因為這種伸縮囊幫浦106a,106b之 脈動所產生之混合藥液之混合比率不穩定之變動,如與第4圖相對應部分賦予相同編號之第6圖所示,也考慮包括不使用伸縮囊幫浦之藥液混合裝置120之基板洗淨裝置121。此藥液混合裝置120係具有取代在供給過氧化氫與硫酸時,成為產生脈動之原因之伸縮囊幫浦,使無脈動之壓送機構127a,127b分別設於過氧化氫儲存槽103及硫酸儲存槽104之構成。在此情形下,在藥液混合裝置120中,係自各壓送機構127a,127b,供給氮氣等惰性氣體到過氧化氫儲存槽103內及硫酸儲存槽104內。 Here, to solve this because of the bellows pump 106a, 106b The variation of the mixing ratio of the mixed chemical solution generated by the pulsation is unstable, as shown in Fig. 6 which is given the same number in the corresponding portion of Fig. 4, and the substrate including the chemical liquid mixing device 120 which does not use the bellows pump is also considered. The cleaning device 121. The chemical liquid mixing device 120 has a bellows pump which is a cause of pulsation when hydrogen peroxide and sulfuric acid are supplied, and the pulsation-free pressure feeding mechanisms 127a and 127b are respectively provided in the hydrogen peroxide storage tank 103 and sulfuric acid. The composition of the storage tank 104. In this case, in the chemical liquid mixing device 120, an inert gas such as nitrogen gas is supplied from the respective pressure feeding mechanisms 127a, 127b to the hydrogen peroxide storage tank 103 and the sulfuric acid storage tank 104.

藉此,過氧化氫儲存槽103內之過氧化氫,係被 來自壓送機構127a之惰性氣體加壓,可被供給到過氧化氫供給管124a。又,硫酸儲存槽104之硫酸,也被來自壓送機構127b之惰性氣體加壓,可被供給到硫酸供給管124b。藥液混合裝置120係藉分別設於過氧化氫供給管124a及硫酸供給管124b上之閥體126a,126b被打開,可使以壓送機構127a,127b之惰性氣體加壓之過氧化氫及硫酸,分別被供給到合流部 105。而且,在藥液混合裝置120中,在以合流部105生成之混合藥液生成後不久,可透過混合藥液供給管111c供給到基板處理裝置102。 Thereby, the hydrogen peroxide in the hydrogen peroxide storage tank 103 is The inert gas from the pressure feed mechanism 127a is pressurized and can be supplied to the hydrogen peroxide supply pipe 124a. Further, the sulfuric acid in the sulfuric acid storage tank 104 is also pressurized by the inert gas from the pressure feed mechanism 127b, and can be supplied to the sulfuric acid supply pipe 124b. The chemical liquid mixing device 120 is opened by the valve bodies 126a, 126b respectively provided on the hydrogen peroxide supply pipe 124a and the sulfuric acid supply pipe 124b, and the hydrogen peroxide pressurized by the inert gas of the pressure feeding mechanisms 127a, 127b can be used. Sulfuric acid, which is supplied to the junction 105. In addition, the chemical solution mixing device 120 can be supplied to the substrate processing apparatus 102 through the mixed chemical supply pipe 111c shortly after the mixed chemical solution generated by the merging portion 105 is generated.

【先前技術文獻】 [Previous Technical Literature] 【專利文獻】 [Patent Literature]

【專利文獻1】日本特開2008-41794號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2008-41794

在此,關於此藥液混合裝置120,也在過氧化氫供給管124a及硫酸供給管124b分別設置流量計(未圖示),調查過氧化氫流量與硫酸流量之各流量變動。具體說來,在個別設定各壓送機構127a,127b之惰性氣體之供給量,使得混合藥液之混合比率為最佳值後,使實際上生成混合藥液後之過氧化氫流量與硫酸流量之各流量變動,以各流量計測量。結果,在此藥液混合裝置120中,得到第7圖所示之結果。 Here, in the chemical-solution mixing device 120, a flow meter (not shown) is provided in each of the hydrogen peroxide supply pipe 124a and the sulfuric acid supply pipe 124b, and the flow rate fluctuations of the hydrogen peroxide flow rate and the sulfuric acid flow rate are investigated. Specifically, the supply amount of the inert gas of each of the pressure feeding mechanisms 127a and 127b is set individually so that the mixing ratio of the mixed chemical liquid is an optimum value, and the hydrogen peroxide flow rate and the sulfuric acid flow rate after actually generating the mixed chemical liquid are actually generated. Each flow rate is varied and measured by each flow meter. As a result, in the liquid chemical mixing device 120, the results shown in Fig. 7 were obtained.

由第7圖之結果,在生成混合藥液時,流量變大,關於黏性比較高之硫酸,自開放閥體126a且經過既定時間後,與上述前者之藥液混合裝置100(第3圖)相比較下,可維持無脈動且穩定之硫酸流量。但是,關於流量較少且黏性較低之過氧化氫,即使自開放閥體126b且經過既定時間後,在過氧化氫流量產生不規則之紊亂,很難維持穩定之過氧化氫流量。 As a result of the seventh drawing, when the mixed chemical solution is generated, the flow rate is increased, and the sulfuric acid having a relatively high viscosity is separated from the former chemical liquid mixing device 100 after the valve body 126a is opened for a predetermined period of time (Fig. 3). In comparison, a pulsation-free and stable flow of sulfuric acid can be maintained. However, with regard to hydrogen peroxide having a small flow rate and low viscosity, even if the valve body 126b is opened and a predetermined period of time elapses, an irregular disorder occurs in the flow rate of the hydrogen peroxide, and it is difficult to maintain a stable flow rate of hydrogen peroxide.

如此一來,在過氧化氫與硫酸產生不同結果之原因,係推測其原因為過氧化氫與硫酸相比較下,其含在混合藥液中之量少很多。亦即,為供給少量之過氧化氫到合流部105,必須減少由壓送機構127a之惰性氣體所做之加壓,在惰性氣 體加壓減少之部分,過氧化氫供給管124a內之壓力狀態等很容易受影響,結果,即使以惰性氣體加壓,過氧化氫流量也變得不穩定。如此一來,在前者及後者之任一者之藥液混合裝置100,120中,在生成混合藥液後不久,混合藥液中之硫酸與過氧化氫之混合比率變得不規則變動,有很難維持混合藥液之混合比率為一定之問題。 As a result, the reason why hydrogen peroxide and sulfuric acid produce different results is presumed to be that the amount of hydrogen peroxide contained in the mixed chemical solution is much lower than that of sulfuric acid. That is, in order to supply a small amount of hydrogen peroxide to the merging portion 105, it is necessary to reduce the pressure by the inert gas of the pressure feeding mechanism 127a, in the inert gas. The portion of the body pressure reduction is easily affected by the pressure state or the like in the hydrogen peroxide supply pipe 124a. As a result, even if pressurized with an inert gas, the flow rate of hydrogen peroxide becomes unstable. In the liquid chemical mixing device 100, 120 of the former and the latter, the mixing ratio of sulfuric acid and hydrogen peroxide in the mixed chemical solution changes irregularly shortly after the mixed chemical solution is generated. It is difficult to maintain the mixing ratio of the mixed liquid to be a certain problem.

在此,本發明係考慮以上之點而研發出者,其目 的在於提案一種不使混合藥液長時間劣化地,可供給到基板處理裝置,同時在生成混合藥液時,抑制硫酸與過氧化氫之混合比率之變動,可生成維持一定混合比率之混合藥液之藥液混合裝置。 Here, the present invention has been developed in consideration of the above points, the purpose of which is It is proposed to supply a substrate processing apparatus without deteriorating the mixed chemical solution for a long period of time, and to suppress a change in the mixing ratio of sulfuric acid and hydrogen peroxide when the mixed chemical liquid is generated, thereby generating a mixed drug that maintains a certain mixing ratio. Liquid chemical mixing device.

為解決上述課題,本發明之專利申請範圍第1項, 係一種藥液混合裝置,混合硫酸與過氧化氫以生成混合藥液,供給前述混合藥液到使用前述混合藥液以去除基板之光阻劑之基板處理裝置,其特徵在於包括:壓送機構,以惰性氣體加壓前述硫酸,壓送該硫酸到合流部;定量幫浦,使比前述硫酸還要少之前述過氧化氫為一定微量,往前述合流部射出;以及混合藥液供給機構,使前述過氧化氫與前述硫酸藉前述合流部被混合而生成之前述混合藥液,供給到前述基板處理裝置。 In order to solve the above problems, the patent application scope of the present invention is the first item, The invention relates to a substrate processing device which mixes sulfuric acid and hydrogen peroxide to form a mixed chemical solution, and supplies the mixed liquid to the photoresist for removing the substrate, which is characterized in that: the pressure feeding mechanism is included Pressurizing the sulfuric acid with an inert gas, and pumping the sulfuric acid to the confluent portion; and quantifying the pump so that the hydrogen peroxide is less than a certain amount of the sulfuric acid, and is emitted to the confluent portion; and the mixed liquid supply mechanism is The mixed chemical solution obtained by mixing the hydrogen peroxide and the sulfuric acid by the merging portion is supplied to the substrate processing apparatus.

當依據本發明之專利申請範圍第1項時,以壓送機構壓送硫酸,藉此,穩定化硫酸流量,藉以定量幫浦射出一定微量之過氧化氫,穩定化過氧化氫之流量,以合流部自硫酸與過氧化氫生成混合藥液,使生成後不久之混合藥液照原樣供 給到基板處理裝置,藉此,可混合藥液不長時間劣化地供給到基板處理裝置,同時在生成混合藥液時,抑制過氧化氫與硫酸之混合比率之變動,可生成維持在一定混合比率之混合藥液。 According to the first item of the patent application scope of the present invention, the sulfuric acid is pressure-fed by the pressure feeding mechanism, thereby stabilizing the flow rate of the sulfuric acid, thereby quantifying the pump to emit a certain amount of hydrogen peroxide and stabilizing the flow rate of the hydrogen peroxide. The merging unit generates a mixed liquid solution from sulfuric acid and hydrogen peroxide, so that the mixed liquid solution is supplied as it is after the generation. When the substrate processing apparatus is supplied, the mixed chemical solution can be supplied to the substrate processing apparatus without deterioration for a long period of time, and when the mixed chemical liquid is generated, the fluctuation ratio of the hydrogen peroxide to the sulfuric acid can be suppressed, and the mixture can be maintained and maintained. A mixture of ratios.

1‧‧‧基板處理裝置 1‧‧‧Substrate processing unit

10‧‧‧藥液混合裝置 10‧‧‧Drug and liquid mixing device

25a‧‧‧循環路徑 25a‧‧‧Circular path

25b‧‧‧輔助循環路徑 25b‧‧‧Auxiliary circulation path

26‧‧‧管內加熱器(加熱機構) 26‧‧‧In-tube heater (heating mechanism)

28c‧‧‧混合藥液供給管(混合藥液供給機構) 28c‧‧‧ Mixed liquid supply pipe (mixed liquid supply mechanism)

31a‧‧‧上游側閥(路徑切換機構) 31a‧‧‧Upstream side valve (path switching mechanism)

31b‧‧‧下游側閥(路徑切換機構) 31b‧‧‧ downstream side valve (path switching mechanism)

32a‧‧‧硫酸供給閥(路徑切換機構) 32a‧‧‧sulfuric acid supply valve (path switching mechanism)

32b‧‧‧輔助循環側閥(路徑切換機構) 32b‧‧‧Auxiliary circulation side valve (path switching mechanism)

33‧‧‧定量儲存管(定量儲存機構) 33‧‧‧Quantitative storage tubes (quantitative storage mechanism)

35‧‧‧壓送機構 35‧‧‧pressure feeding mechanism

38‧‧‧定量幫浦 38‧‧‧Quantitative pump

105‧‧‧合流部 105‧‧‧Confluence Department

第1圖係表示連接在本發明藥液混合裝置上之基板處理裝置全體構成之示意圖。 Fig. 1 is a schematic view showing the overall configuration of a substrate processing apparatus connected to the chemical-solution mixing apparatus of the present invention.

第2圖係表示包括本發明藥液混合裝置之基板洗淨裝置全體構成之示意圖。 Fig. 2 is a view showing the overall configuration of a substrate cleaning apparatus including the chemical liquid mixing device of the present invention.

第3圖係表示本發明藥液混合裝置之硫酸流量之曲線圖。 Fig. 3 is a graph showing the flow rate of sulfuric acid of the chemical liquid mixing device of the present invention.

第4圖係表示具有使用伸縮囊幫浦之先前藥液混合裝置之基板洗淨裝置全體構成之示意圖。 Fig. 4 is a view showing the overall configuration of a substrate cleaning apparatus having a prior chemical liquid mixing device using a bellows pump.

第5圖係表示第4圖所示藥液混合裝置之過氧化氫流量與硫酸流量之曲線圖。 Fig. 5 is a graph showing the flow rate of hydrogen peroxide and the flow rate of sulfuric acid in the chemical liquid mixing device shown in Fig. 4.

第6圖係表示具有使用壓送機構之先前藥液混合裝置之基板洗淨裝置全體構成之示意圖。 Fig. 6 is a view showing the overall configuration of a substrate cleaning apparatus having a prior chemical liquid mixing device using a pressure feeding mechanism.

第7圖係表示第6圖所示藥液混合裝置之過氧化氫流量與硫酸流量之曲線圖。 Fig. 7 is a graph showing the flow rate of hydrogen peroxide and the flow rate of sulfuric acid in the chemical liquid mixing device shown in Fig. 6.

以下,依據圖面詳述本發明之實施形態。 Hereinafter, embodiments of the present invention will be described in detail based on the drawings.

(1)被使用於本發明藥液混合裝置之基板處理裝置之概要 (1) Outline of a substrate processing apparatus used in the chemical liquid mixing device of the present invention

第1圖中之1係表示使用以下述本發明藥液混合裝置生成之混合藥液之基板處理裝置。在此,首先說明使用少量混合藥 液可去除基板表面3a光阻劑之基板處理裝置1之構成,接著,說明本發明之藥液混合裝置。實際上,此基板處理裝置1係包括為有底圓筒形且上表面具有開口1a之外殼1d,由板狀構件所構成之旋轉台2具有水平設於外殼1d內之構成,可藉此旋轉台2保持基板3。在旋轉台2處,保持基板3之複數夾持構件4係形成於另一邊之表面,自外殼1d底面1b延伸且成為旋轉軸之圓筒構件5係連結在另一邊之表面。 In the first drawing, reference is made to a substrate processing apparatus using a mixed chemical solution produced by the following chemical mixing device of the present invention. Here, first explain the use of a small amount of mixed drugs The configuration of the substrate processing apparatus 1 for removing the substrate surface 3a photoresist can be described. Next, the chemical liquid mixing device of the present invention will be described. Actually, the substrate processing apparatus 1 includes a casing 1d having a bottomed cylindrical shape and having an opening 1a on its upper surface, and the rotary table 2 composed of a plate-like member has a structure horizontally disposed in the casing 1d, thereby being rotatable The stage 2 holds the substrate 3. At the turntable 2, the plurality of holding members 4 holding the substrate 3 are formed on the other surface, and the cylindrical member 5 extending from the bottom surface 1b of the casing 1d and serving as a rotating shaft is coupled to the other surface.

複數個夾持構件4係沿著旋轉台2外周間隔設 置,自外周夾入基板3,保持離開旋轉台2既定距離,可使基板3相對於旋轉台2大概保持平行。在此實施形態中,夾持構件4係由銷狀所構成,自尖端間隔既定距離形成有階梯部4a,基板3抵接在此階梯部4a,藉此,可確實使基板3在既定之高度位置上水平定位。而且,此階梯部4a係形成使得自旋轉台2至基板3之高度成為最佳位置。在此,當保持基板3在夾持構件4時,係定位基板3使得最終形成有電路之表面,且為形成電路而形成有光阻劑之處理面(基板表面3a)相向旋轉台2。 A plurality of clamping members 4 are arranged along the outer circumference of the rotary table 2 The substrate 3 is sandwiched from the outer periphery and kept away from the turntable 2 by a predetermined distance, so that the substrate 3 can be kept substantially parallel with respect to the turntable 2. In this embodiment, the sandwiching member 4 is formed of a pin shape, and the step portion 4a is formed at a predetermined distance from the tip end, and the substrate 3 abuts against the step portion 4a, whereby the substrate 3 can be surely set to a predetermined height. Position horizontally. Further, the step portion 4a is formed such that the height from the turntable 2 to the substrate 3 becomes an optimum position. Here, when the substrate 3 is held by the holding member 4, the substrate 3 is positioned such that the surface of the circuit is finally formed, and the processing surface (substrate surface 3a) on which the photoresist is formed to form the circuit faces the rotating table 2.

又,基板處理裝置1藉保持基板3在旋轉台2,使 基板表面3a朝向外殼1d,同時可保持基板3在外殼1d的開口1a附近。藉此,基板處理裝置1在開口1a周緣與基板3外周之相向部間,可形成小間隙。另外,連結在旋轉台2另一邊之表面上之圓筒構件5,係旋轉自如地被設於外殼1d底面1b之軸承5a支撐。又,圓筒構件5係電動馬達M的旋轉驅動力可透過皮帶7與皮帶輪6被傳遞。藉此,圓筒構件5藉電動馬達M之驅動,在被軸承5a支撐之狀態下旋轉,使得可旋轉設於 另一端之旋轉台2。 Further, the substrate processing apparatus 1 holds the substrate 3 on the turntable 2 so that the substrate processing apparatus 1 The substrate surface 3a faces the outer casing 1d while maintaining the substrate 3 in the vicinity of the opening 1a of the outer casing 1d. Thereby, the substrate processing apparatus 1 can form a small gap between the peripheral edge of the opening 1a and the opposing portion of the outer periphery of the substrate 3. Further, the cylindrical member 5 coupled to the other surface of the turntable 2 is rotatably supported by a bearing 5a provided on the bottom surface 1b of the casing 1d. Further, the cylindrical member 5 is driven by the rotational driving force of the electric motor M through the belt 7 and the pulley 6. Thereby, the cylindrical member 5 is driven by the electric motor M to be rotated while being supported by the bearing 5a, so that the rotatably The other end of the rotary table 2.

此外,在圓筒構件5處,處理液管8與輸水管9 係沿著中空部之縱向並列配置,處理液管8係供給做為光阻劑剝離用處理液之混合藥液到外殼1d內,輸水管9係供給做為洗淨液之純水到外殼1d內。處理液管8係一端連接有下述藥液混合裝置10的混合藥液供給管,另一端之尖端開口係配置使得相向於被夾持構件4夾持之基板3的中心部分。藉此,處理液管8係使來自藥液混合裝置10之混合藥液自尖端開口釋出,可使該混合藥液朝向基板表面3a的中心部分供給。另外,在輸水管9之一端連接有洗淨液供給機構11。輸水管9係另一端之尖端開口被配置,使得相向於被夾持構件4夾持之基板3中心部分,使來自洗淨液供給機構11之純水自尖端開口釋出,可使該純水朝向基板表面3a的中心部分供給。 Further, at the cylindrical member 5, the treatment liquid pipe 8 and the water delivery pipe 9 The processing liquid pipe 8 is supplied to the outer casing 1d as a mixed chemical liquid for the photoresist stripping treatment liquid, and the water supply pipe 9 supplies the pure water as the cleaning liquid to the outer casing 1d. Inside. The processing liquid pipe 8 is connected to a mixed chemical supply pipe of the following chemical liquid mixing device 10 at one end, and the tip end opening of the other end is disposed so as to face the central portion of the substrate 3 sandwiched by the sandwiching member 4. Thereby, the processing liquid pipe 8 releases the mixed chemical liquid from the chemical liquid mixing device 10 from the tip opening, and the mixed chemical liquid can be supplied toward the central portion of the substrate surface 3a. Further, a cleaning liquid supply mechanism 11 is connected to one end of the water delivery pipe 9. The tip opening of the other end of the water delivery pipe 9 is disposed such that the central portion of the substrate 3 held by the holding member 4 causes the pure water from the cleaning liquid supply mechanism 11 to be released from the tip opening, so that the pure water can be made It is supplied toward the central portion of the substrate surface 3a.

又,外殼1d係使連接在吸引機構12之排出口1c 包括於底面1b上,外殼1d內藉吸引機構12被吸引,藉此,自開口1a與基板3間之間隙吸入外部氣體,以形成自上方往下方流動之氣流,藉此氣流可使外殼1d內之混合藥液或蒸汽,自下方之排出口1c往外部排出。又,在外殼1d的開口1a上方,設有做為基板加熱機構之紅外線燈13。此紅外線燈13係藉支撐機構15被支撐而可自開口1a退後,藉被定位在開口1a上方,在外殼1d內,可自開口1a朝向被保持在旋轉台2上之基板3的內面直接照射紅外線,可加熱該基板3。而且,在開口1a之上方設有供給純水之上部輸水管16,藉自上部輸水管16供給之純水,可洗淨基板3的內面。 Further, the outer casing 1d is connected to the discharge port 1c of the suction mechanism 12 Included in the bottom surface 1b, the outer casing 1d is attracted by the suction mechanism 12, whereby the outside air is sucked from the gap between the opening 1a and the substrate 3 to form a gas flow flowing from the upper side to the lower side, whereby the air flow can be made inside the outer casing 1d. The mixed chemical or steam is discharged to the outside from the lower discharge port 1c. Further, an infrared lamp 13 as a substrate heating mechanism is provided above the opening 1a of the outer casing 1d. The infrared lamp 13 is supported by the support mechanism 15 and can be retracted from the opening 1a, and positioned above the opening 1a, in the outer casing 1d, from the opening 1a toward the inner surface of the substrate 3 held on the rotary table 2. The substrate 3 can be heated by directly irradiating infrared rays. Further, a supply pipe 16 for supplying the pure water upper portion is provided above the opening 1a, and the inner surface of the substrate 3 can be washed by the pure water supplied from the upper water pipe 16.

在以上之構成中,於此基板處理裝置1中,藥液 處理時,首先驅動電動馬達M以旋轉保持基板3之旋轉台2,以吸引機構12吸引外殼1d內之氣體,藉此,自開口1a吸入外部氣體到外殼1d內,形成來自上方之外部氣體流至下方排出口1c之氣流。在此狀態下,於基板處理裝置1處,係使供給自藥液混合裝置10之混合藥液,自處理液管8的尖端開口往基板表面3a的中心部分供給。藉此,混合藥液係藉基板3之旋轉,一邊往圓周方向側做放射性擴大,一邊往外周均勻地流動。又,在此時,使紅外線燈13配置於開口1a上方,藉該紅外線燈13自內面側加熱基板3到約130℃~300℃。藉此,接觸到基板表面3a之混合藥液,係藉基板3之熱而成為最佳溫度,促進過硫酸之生成,以該過硫酸可更加去除基板表面3a之光阻劑。 In the above configuration, in the substrate processing apparatus 1, the liquid medicine At the time of the treatment, the electric motor M is first driven to rotate the holding table 2 of the substrate 3, and the suction mechanism 12 sucks the gas in the casing 1d, whereby the outside air is sucked into the casing 1d from the opening 1a to form an external gas flow from above. The air flow to the lower discharge port 1c. In this state, the mixed chemical liquid supplied from the chemical liquid mixing device 10 is supplied from the tip end opening of the processing liquid pipe 8 to the central portion of the substrate surface 3a at the substrate processing apparatus 1. By the rotation of the substrate 3, the mixed chemical solution is uniformly expanded toward the outer circumference while being radioactively expanded toward the circumferential direction. At this time, the infrared lamp 13 is placed above the opening 1a, and the substrate 3 is heated from the inner surface side by the infrared lamp 13 to about 130 ° C to 300 ° C. Thereby, the mixed chemical solution contacting the substrate surface 3a is optimally heated by the heat of the substrate 3, and the formation of persulfuric acid is promoted, and the photoresist of the substrate surface 3a can be further removed by the persulfuric acid.

因此,假設當不以紅外線燈13加熱基板3,單獨 使混合藥液供給到基板3時,當混合藥液接觸到較低溫之基板3時,該混合藥液之熱被基板3吸收,結果,混合藥液之溫度會降低,不促進過硫酸之生成。因此,在此情形下,必須供給大量之加熱至高溫之混合藥液至基板3,防止混合藥液之溫度降低。 Therefore, it is assumed that when the substrate 3 is not heated by the infrared lamp 13, it is separate When the mixed chemical solution is supplied to the substrate 3, when the mixed chemical solution contacts the lower temperature substrate 3, the heat of the mixed chemical solution is absorbed by the substrate 3, and as a result, the temperature of the mixed chemical solution is lowered, and the generation of persulfuric acid is not promoted. . Therefore, in this case, it is necessary to supply a large amount of the mixed chemical solution heated to a high temperature to the substrate 3 to prevent the temperature of the mixed chemical solution from being lowered.

相對於此,在此基板處理裝置1中,係以紅外線 燈13事先加熱基板3,使基板3本身也成為高溫,所以,混合藥液不會因為接觸基板3而溫度降低,相對於基板3而言無須大量供給混合藥液,以例如50(ml/min)左右之少量混合藥液,就能高效去除基板3之光阻劑。如此一來,在基板處理裝置1 中,可減少混合藥液之使用量,結果,也可以減少在即將以基板處理裝置1去除光阻劑時,以藥液混合裝置10生成之混合藥液之生成量。 On the other hand, in the substrate processing apparatus 1, infrared rays are used. The lamp 13 heats the substrate 3 in advance, so that the substrate 3 itself is also heated to a high temperature. Therefore, the temperature of the mixed chemical solution does not decrease due to contact with the substrate 3, and it is not necessary to supply a large amount of mixed chemical solution to the substrate 3, for example, 50 (ml/min). The photoresist of the substrate 3 can be efficiently removed by mixing a small amount of the left and right liquid. In this way, in the substrate processing apparatus 1 In this case, the amount of the mixed chemical solution used can be reduced, and as a result, the amount of the mixed chemical solution generated by the chemical liquid mixing device 10 when the photoresist is removed by the substrate processing apparatus 1 can be reduced.

因此,在此基板處理裝置1中,自接觸到被加熱 至高溫之基板3之混合藥液而產生蒸汽之物件,藉自開口1a被取入之外部氣體上方往下方流動之氣流,蒸汽被導引至排出口1c以排出到外殼1d外部。而且,在基板處理裝置1中,可防止混合藥液或蒸汽自開口1a洩漏到外殼1d外部,又,在外殼1d內壁也變得很難附著混合藥液或蒸汽,可減少外殼1d內部之洗淨作業次數。而且,在此基板處理裝置1中,於外殼1d上方的開口1a與外殼1d下方的處理液管8的尖端開口之間設置基板3,使該基板3發揮做為開口1a之蓋體之功能,可藉基板3防止混合藥液或蒸汽自開口1a排出,另外,無須設置覆蓋開口1a之天花板面或蓋體,結果,可節省這些天花板面或蓋體之洗淨作業或乾燥作業。 Therefore, in the substrate processing apparatus 1, self-contact is heated The object which generates the steam to the mixed liquid of the substrate 3 at a high temperature is guided by the airflow flowing downward from the outside air taken in by the opening 1a, and the steam is guided to the discharge port 1c to be discharged to the outside of the casing 1d. Further, in the substrate processing apparatus 1, it is possible to prevent the mixed chemical liquid or vapor from leaking from the opening 1a to the outside of the outer casing 1d, and it is also difficult to adhere the mixed chemical liquid or steam to the inner wall of the outer casing 1d, and the inside of the outer casing 1d can be reduced. The number of washing operations. Further, in the substrate processing apparatus 1, the substrate 3 is provided between the opening 1a above the casing 1d and the tip opening of the processing liquid pipe 8 below the casing 1d, and the substrate 3 functions as a lid of the opening 1a. The mixed chemical solution or steam can be prevented from being discharged from the opening 1a by the substrate 3, and the ceiling surface or the lid covering the opening 1a need not be provided, and as a result, the cleaning operation or the drying operation of the ceiling surface or the lid can be saved.

(2)本發明藥液混合裝置之構成 (2) The composition of the chemical liquid mixing device of the present invention

接著,說明生成混合藥液,以使生成後不久之混合藥液供給到基板處理裝置1之本發明藥液混合裝置10。在此,於第2圖中,21係表示基板洗淨裝置,此基板洗淨裝置21由複數個基板處理裝置1及複數個藥液混合裝置10所構成,相對於一個基板處理裝置1而言,可設置一個藥液混合裝置10。因此,在第2圖中,僅著眼於一個基板處理裝置1及對應此基板處理裝置1設置之一個藥液混合裝置10,關於其他之基板處理裝置及藥液混合裝置,因為全部具有相同構成,所以其說明予以省略。 Next, a liquid chemical mixing device 10 of the present invention in which the mixed chemical liquid is generated so as to be supplied to the substrate processing apparatus 1 shortly after the production will be described. Here, in FIG. 2, reference numeral 21 denotes a substrate cleaning apparatus 21 which is composed of a plurality of substrate processing apparatuses 1 and a plurality of chemical liquid mixing apparatuses 10, and is provided for one substrate processing apparatus 1 A liquid chemical mixing device 10 can be provided. Therefore, in the second drawing, only one substrate processing apparatus 1 and one chemical liquid mixing apparatus 10 provided corresponding to the substrate processing apparatus 1 are focused, and since the other substrate processing apparatuses and the chemical liquid mixing apparatuses all have the same configuration, Therefore, the description is omitted.

實際上,此基板洗淨裝置21係具有儲存硫酸之一 個硫酸儲存槽104,構成使得以複數個藥液混合裝置10共有此硫酸儲存槽104。各藥液混合裝置10設有:過氧化氫供給管28a,供給過氧化氫到合流部105;硫酸供給管28b,供給硫酸到合流部105;合流部105,過氧化氫供給管28a及硫酸供給管28b合流;以及混合藥液供給管28c,使在合流部105生成之混合藥液供給到基板處理裝置1的處理液管8(第1圖)。 In fact, the substrate cleaning device 21 has one of the stored sulfuric acid. The sulfuric acid storage tanks 104 are configured such that the sulfuric acid storage tanks 104 are shared by a plurality of chemical liquid mixing devices 10. Each of the chemical liquid mixing devices 10 is provided with a hydrogen peroxide supply pipe 28a, supplying hydrogen peroxide to the merging portion 105, a sulfuric acid supply pipe 28b, supplying sulfuric acid to the merging portion 105, a merging portion 105, a hydrogen peroxide supply pipe 28a, and a sulfuric acid supply. The tube 28b is merged; and the mixed chemical supply tube 28c is supplied to the processing liquid tube 8 of the substrate processing apparatus 1 (Fig. 1).

在硫酸供給管28b連接有硫酸儲存槽104,在硫酸 儲存槽104與合流部105之間,自硫酸儲存槽104依序設有管內加熱器26、循環幫浦27、上游側閥體31a及硫酸供給閥體32a。又,在此硫酸供給閥體32a與硫酸儲存槽104之間,設有藉循環幫浦27使自硫酸儲存槽104吐出之硫酸,再度回到硫酸儲存槽104之循環路徑25a及輔助循環路徑25b之兩系統之路徑。實際上,硫酸供給管28b藉硫酸供給閥體32a被關閉,往合流部105之供給路徑被遮斷,自硫酸儲存槽104吐出之硫酸,不被供給到合流部105,使得持續循環在循環路徑25a或輔助循環路徑25b中之一者。 A sulfuric acid storage tank 104 is connected to the sulfuric acid supply pipe 28b in the sulfuric acid Between the storage tank 104 and the merging portion 105, the in-pipe heater 26, the circulation pump 27, the upstream side valve body 31a, and the sulfuric acid supply valve body 32a are sequentially provided from the sulfuric acid storage tank 104. Further, between the sulfuric acid supply valve body 32a and the sulfuric acid storage tank 104, sulfuric acid discharged from the sulfuric acid storage tank 104 by the circulation pump 27 is provided, and the circulation path 25a and the auxiliary circulation path 25b of the sulfuric acid storage tank 104 are returned again. The path of the two systems. Actually, the sulfuric acid supply pipe 28b is closed by the sulfuric acid supply valve body 32a, the supply path to the merging portion 105 is blocked, and the sulfuric acid discharged from the sulfuric acid storage tank 104 is not supplied to the merging portion 105, so that the circulation is continued in the circulation path. One of 25a or the auxiliary circulation path 25b.

在此情形下,於硫酸供給管28b處,在上游側閥體31a與硫酸供給閥體32a之間,設有延伸至硫酸儲存槽104之循環用配管30a,藉此循環用配管30a,可形成循環路徑25a。循環路徑25a係自硫酸儲存槽104吐出之硫酸藉循環幫浦27,在通過管內加熱器26、循環幫浦27及上游側閥體31a之後,通過循環用配管30a,透過定量儲存管33及下游側閥體31b,再度回到硫酸儲存槽104。又,硫酸供給管28b係在循環幫浦 27與上游側閥體31a之間,具有連通下游側閥體31b與硫酸儲存槽104間之輔助循環用配管30b,同時在此輔助循環用配管30b具有輔助循環側閥體32b,藉該輔助循環用配管30b可形成輔助循環路徑25b。 In this case, a circulation pipe 30a extending to the sulfuric acid storage tank 104 is provided between the upstream side valve body 31a and the sulfuric acid supply valve body 32a in the sulfuric acid supply pipe 28b, whereby the circulation pipe 30a can be formed. Loop path 25a. The circulation path 25a is a sulfuric acid discharged from the sulfuric acid storage tank 104 by the circulation pump 27, passes through the in-pipe heater 26, the circulation pump 27, and the upstream side valve body 31a, passes through the circulation pipe 30a, passes through the quantitative storage pipe 33, and The downstream side valve body 31b is returned to the sulfuric acid storage tank 104 again. Moreover, the sulfuric acid supply pipe 28b is attached to the circulation pump The auxiliary circulation pipe 30b is provided between the upstream side valve body 31b and the sulfuric acid storage tank 104, and the auxiliary circulation pipe 30b has the auxiliary circulation side valve body 32b. The auxiliary circulation path 25b can be formed by the piping 30b.

在此,首先剛開始時,硫酸供給管28b係硫酸供 給閥體32a及輔助循環側閥體32b被關閉,同時被配置循環路徑25a上之上游側閥體31a及下游側閥體31b被打開,藉此,可形成循環路徑25a。藉此,在硫酸供給管28b中,自硫酸儲存槽104吐出之硫酸藉循環幫浦27,流過依序透過管內加熱器26、循環幫浦27、上游側閥體31a、定量儲存管33及下游側閥體31b,再度回到硫酸儲存槽104之循環路徑25a。此時,在循環路徑25a中,使以管內加熱器26預熱至約60℃之新鮮的硫酸,總是持續供給到定量儲存管33。 Here, at the beginning, the sulfuric acid supply pipe 28b is supplied with sulfuric acid. The valve body 32a and the auxiliary circulation side valve body 32b are closed, and the upstream side valve body 31a and the downstream side valve body 31b which are disposed in the circulation path 25a are opened, whereby the circulation path 25a can be formed. Thereby, in the sulfuric acid supply pipe 28b, the sulfuric acid discharged from the sulfuric acid storage tank 104 flows through the in-line heater 26, the circulation pump 27, the upstream side valve body 31a, and the quantitative storage pipe 33 by the circulation pump 27. The downstream side valve body 31b is returned to the circulation path 25a of the sulfuric acid storage tank 104 again. At this time, in the circulation path 25a, fresh sulfuric acid preheated to the inner heater 26 to about 60 ° C is continuously supplied to the quantitative storage tube 33.

在此,定量儲存管33係具有內徑比硫酸供給管 28b還要大之圓筒狀管本體,以基板處理裝置1去除設於外殼1d內之基板3之光阻劑之必要流量(在此為25ml)之硫酸,可儲存在管本體內。具體說來,定量儲存管33的管本體係形成例如縱長315mm且內徑22mm,自儲存有硫酸之中空部之上部至下部之橫剖面積(與管本體之縱向直交之剖面積)係大概相同,當自上部往下部施加壓力時,壓力係沿著管本體內之縱向均勻地施加。 Here, the quantitative storage tube 33 has an inner diameter ratio of a sulfuric acid supply tube The large-sized cylindrical tube body of 28b, and the necessary flow rate (here, 25 ml) of the photoresist of the substrate 3 provided in the outer casing 1d by the substrate processing apparatus 1 can be stored in the tube body. Specifically, the tube system of the quantitative storage tube 33 is formed, for example, by a length of 315 mm and an inner diameter of 22 mm, and the cross-sectional area from the upper portion to the lower portion of the hollow portion in which sulfuric acid is stored (the cross-sectional area orthogonal to the longitudinal direction of the tube body) is approximately Similarly, when pressure is applied from the upper portion to the lower portion, the pressure system is uniformly applied in the longitudinal direction of the tube body.

又,在定量儲存管33與下游側閥體31b之間,設 有自定量儲存管33的上部側供給氮氣等惰性氣體到定量儲存管33內之壓送機構35。此壓送機構35藉由惰性氣體所做之加 壓,使儲存在定量儲存管33內之硫酸,透過合流部105可壓送至混合藥液供給管28c。實際上,硫酸供給管28b當硫酸循環在循環路徑25a時,當關閉上游側閥體31a及下游側閥體31b時,循環路徑25a被遮斷,被供給到定量儲存管33內之硫酸被隔離,可使該硫酸暫時儲存在定量儲存管33。 Further, between the quantitative storage tube 33 and the downstream side valve body 31b, A pressure feed mechanism 35 for supplying an inert gas such as nitrogen gas into the quantitative storage tube 33 from the upper side of the quantitative storage tube 33 is provided. The pressure feed mechanism 35 is made by inert gas The pressure is such that the sulfuric acid stored in the quantitative storage tube 33 can be pressure-fed to the mixed chemical supply pipe 28c through the merging portion 105. Actually, when the sulfuric acid supply pipe 28b is circulated in the circulation path 25a, when the upstream side valve body 31a and the downstream side valve body 31b are closed, the circulation path 25a is blocked, and the sulfuric acid supplied into the quantitative storage pipe 33 is isolated. The sulfuric acid can be temporarily stored in the quantitative storage tube 33.

此時,在硫酸供給管28b中,設於輔助循環路徑 25b之輔助循環側閥體32b被打開,藉循環幫浦27自硫酸儲存槽104吐出之硫酸,係流過經由管內加熱器26、循環幫浦27及輔助循環用配管30b,再度回到硫酸儲存槽104之輔助循環路徑25b。如此一來,在硫酸供給管28b中,即使使硫酸暫時儲存在定量儲存管33時,流過硫酸之路徑係自循環路徑25a往輔助循環路徑25b切換,可使以管內加熱器26預熱之新鮮的硫酸,總是持續循環在輔助循環路徑25b內。藉此,之後,當硫酸流過之路徑自輔助循環路徑25b再度切換到循環路徑25a時,被預熱之新鮮的硫酸係照原樣被供給到定量儲存管33,可使事先被調整到生成混合藥液之最佳溫度之硫酸,再度迅速地儲存在定量儲存管33。 At this time, in the sulfuric acid supply pipe 28b, it is provided in the auxiliary circulation path. The auxiliary circulation side valve body 32b of 25b is opened, and the sulfuric acid discharged from the sulfuric acid storage tank 104 by the circulation pump 27 flows through the in-tube heater 26, the circulation pump 27, and the auxiliary circulation piping 30b, and returns to the sulfuric acid again. The auxiliary circulation path 25b of the storage tank 104. In this way, in the sulfuric acid supply pipe 28b, even if sulfuric acid is temporarily stored in the quantitative storage pipe 33, the path through which the sulfuric acid flows is switched from the circulation path 25a to the auxiliary circulation path 25b, and the in-pipe heater 26 can be preheated. The fresh sulfuric acid is always continuously circulated in the auxiliary circulation path 25b. Thereby, after the path through which the sulfuric acid flows is again switched from the auxiliary circulation path 25b to the circulation path 25a, the preheated fresh sulfuric acid is supplied to the quantitative storage tube 33 as it is, so that it can be adjusted to generate the mixture in advance. The sulfuric acid at the optimum temperature of the chemical solution is again stored in the quantitative storage tube 33.

而且,此硫酸供給管28b當以基板處理裝置1開 始去除基板3的光阻劑時,惰性氣體係自壓送機構35被供給到定量儲存管33內,同時硫酸供給閥體32a打開,藉供給自壓送機構35之惰性氣體所做之加壓,可使定量儲存管33內之硫酸壓送至合流部105。此時,在定量儲存管33中,儲存在管本體內之全部硫酸不會被吐出,硫酸可僅殘留些許在管本體內。藉此,硫酸供給管28b可僅使儲存在定量儲存管33內之 硫酸供給到合流部105,使得可防止被供給到定量儲存管33之惰性氣體,照原樣被供給至合流部105。 Moreover, the sulfuric acid supply pipe 28b is opened by the substrate processing apparatus 1. When the photoresist of the substrate 3 is removed, the inert gas system is supplied from the pressure feed mechanism 35 to the quantitative storage tube 33, and the sulfuric acid supply valve body 32a is opened, and the pressure is supplied by the inert gas supplied from the pressure feed mechanism 35. The sulfuric acid in the quantitative storage tube 33 can be sent to the merging portion 105. At this time, in the quantitative storage tube 33, all of the sulfuric acid stored in the tube body is not discharged, and sulfuric acid may remain only in the tube body. Thereby, the sulfuric acid supply pipe 28b can be stored only in the quantitative storage pipe 33. The sulfuric acid is supplied to the merging portion 105 so that the inert gas supplied to the quantitative storage tube 33 can be prevented from being supplied to the merging portion 105 as it is.

之後,硫酸供給管28b係硫酸供給閥體32a及輔 助循環側閥體32b再度被關閉,同時上游側閥體31a及下游側閥體31b被打開,硫酸流過之路徑自輔助循環路徑25b切換到循環路徑25a,硫酸儲存槽104之硫酸再度開始循環在循環路徑25a。而且,在此硫酸供給管28b中,當以基板處理裝置1開始去除基板3之光阻劑時,使暫時儲存在定量儲存管33之硫酸,藉惰性氣體壓送而供給至合流部105,之後,當結束以該基板處理裝置1去除基板3之光阻劑時,可再度供給儲存硫酸到定量儲存管33。如此一來,在硫酸供給管28b中,配合基板處理裝置1之光阻劑去除動作,藉定量儲存管33而硫酸之儲存及壓送動作被重複。 Thereafter, the sulfuric acid supply pipe 28b is a sulfuric acid supply valve body 32a and auxiliary The circulation side valve body 32b is closed again, and the upstream side valve body 31a and the downstream side valve body 31b are opened, the path through which the sulfuric acid flows is switched from the auxiliary circulation path 25b to the circulation path 25a, and the sulfuric acid in the sulfuric acid storage tank 104 starts to circulate again. In the circulation path 25a. Further, in the sulfuric acid supply pipe 28b, when the substrate processing apparatus 1 starts to remove the photoresist of the substrate 3, the sulfuric acid temporarily stored in the quantitative storage tube 33 is supplied by the inert gas to the merging portion 105, and then When the photoresist of the substrate 3 is removed by the substrate processing apparatus 1, the stored sulfuric acid can be supplied again to the quantitative storage tube 33. As a result, in the sulfuric acid supply pipe 28b, the photoresist removal operation of the substrate processing apparatus 1 is performed, and the storage and pressure transfer operation of sulfuric acid is repeated by the quantitative storage tube 33.

另外,流過過氧化氫之過氧化氫供給管28a,係被 連接到設於每一藥液混合裝置10上之過氧化氫儲存槽36,在過氧化氫儲存槽36與合流部105之間具有定量幫浦38,可使儲存在過氧化氫儲存槽36之過氧化氫,藉定量幫浦38供給至合流部105。實際上,定量幫浦38可在一射出中,使一定微量之過氧化氫往合流部105射出,使其在一定時間以高速重複射出複數次,藉此,可使以基板處理裝置1在去除基板3之光阻劑時,必要之一定量過氧化氫往合流部105供給。 In addition, the hydrogen peroxide supply pipe 28a flowing through the hydrogen peroxide is detached. The hydrogen peroxide storage tank 36 is connected to each of the chemical liquid mixing devices 10, and has a quantitative pump 38 between the hydrogen peroxide storage tank 36 and the merging portion 105, so that it can be stored in the hydrogen peroxide storage tank 36. Hydrogen peroxide is supplied to the merging portion 105 by the metering pump 38. In fact, the quantitative pump 38 can emit a certain amount of hydrogen peroxide to the merging portion 105 in one shot, and repeatedly emit the plurality of times at a high speed for a certain period of time, whereby the substrate processing apparatus 1 can be removed. In the case of the photoresist of the substrate 3, one of the necessary amounts of hydrogen peroxide is supplied to the merging portion 105.

在此,定量幫浦38係在一次射出被吐出之一次射 出吐出量非常微量,以較高壓力使此微量之過氧化氫全部瞬間高速往過氧化氫供給管28a射出,可使瞬間一次射出吐出量總 是維持穩定。又,定量幫浦38係使這種一次射出在既定週期間歇地重複,一次射出與一次射出間之瞬間非常短,所以,當觀察被供給到合流部105之連續性過氧化氫流量時,在過氧化氫流量未產生不規則的紊亂,成為規則性的過氧化氫流量,可使穩定之過氧化氫流量總是供給到合流部105。 Here, the quantitative pump 38 is fired once at a single shot. The amount of discharge is very small, and the trace amount of hydrogen peroxide is instantaneously emitted to the hydrogen peroxide supply pipe 28a at a high pressure, so that the total amount of discharge can be instantaneously injected. It is to maintain stability. Further, the quantitative pump 38 system repeats such a single shot intermittently in a predetermined cycle, and the moment between one shot and one shot is extremely short. Therefore, when observing the continuous flow of hydrogen peroxide supplied to the merging portion 105, The hydrogen peroxide flow does not cause irregular disturbances, and becomes a regular flow of hydrogen peroxide, so that a stable flow of hydrogen peroxide can always be supplied to the junction portion 105.

實際上,在此實施形態下,定量幫浦38有使用例 如電磁驅動型隔膜式定量幫浦,一射出吐出量係被調整到在一射出0.7秒之吐出量為0.8ml,行程數因為混合比率與流量係65~240spm,吐出壓力為0.2Mpa。因此,電磁驅動型隔膜式定量幫浦係施加電壓在電磁管,利用產生在電磁管之驅動力以驅動柱塞,可使設於該柱塞尖端之隔膜,在幫浦室內以一定距離往復。藉此,在電磁驅動型隔膜式定量幫浦中,對應隔膜之往復運動,而自過氧化氫儲存槽36吸入過氧化氫,使吸入份量之過氧化氫照原樣吐出到合流部105,可實現在過氧化氫流量無不規則之紊亂且穩定之過氧化氫流量。 In fact, in this embodiment, the quantitative pump 38 has a use case. For example, the electromagnetically driven diaphragm type quantitative pump is adjusted to have a discharge amount of 0.8 ml at a time of 0.7 seconds, and the stroke number is 0.2 MPa because the mixing ratio and the flow rate are 65 to 240 spm. Therefore, the electromagnetically driven diaphragm type quantitative pump system applies a voltage to the electromagnetic tube, and the driving force generated in the electromagnetic tube is used to drive the plunger, so that the diaphragm provided at the tip end of the plunger can reciprocate at a certain distance in the pump chamber. Thereby, in the electromagnetically driven diaphragm type quantitative pump, hydrogen peroxide is sucked from the hydrogen peroxide storage tank 36 in response to the reciprocating movement of the diaphragm, and the inhaled amount of hydrogen peroxide is discharged as it is to the merging portion 105, thereby realizing There is no irregular and stable flow of hydrogen peroxide in the flow of hydrogen peroxide.

因此,在此實施形態下,定量幫浦38係配置於合 流部105附近,藉此,一射出之吐出量較少,可使此少量之過氧化氫確實到達合流部105。 Therefore, in this embodiment, the quantitative pump 38 system is arranged in the joint In the vicinity of the flow portion 105, the amount of discharge of one shot is small, and the small amount of hydrogen peroxide can surely reach the merging portion 105.

如此一來,在合流部105處,無不規則之紊亂且 穩定之過氧化氫流量之過氧化氫,係自過氧化氫供給管28a被供給,同時無不規則之紊亂且穩定之硫酸流量之硫酸,係自硫酸供給管28b被供給,可混合這些過氧化氫與硫酸以生成混合藥液。 In this way, at the merging portion 105, there is no disorder and The hydrogen peroxide having a stable flow rate of hydrogen peroxide is supplied from the hydrogen peroxide supply pipe 28a, and the sulfuric acid having no irregular disorder and stable sulfuric acid flow rate is supplied from the sulfuric acid supply pipe 28b, and these peroxidations can be mixed. Hydrogen and sulfuric acid to form a mixed chemical solution.

在此,在合流部105中,事先調整過之過氧化氫 流量係自過氧化氫供給管28a被穩定供給,而且事先調整過之硫酸流量係自硫酸供給管28b被穩定供給,所以,過氧化氫與硫酸之混合比率也無紊亂,與先前物件相比較下,可生成混合比率被維持在一定值之混合藥液。而且,此合流部105係藉設於混合藥液供給管28c之閥體39被打開,透過該混合藥液供給管28c,可供給混合藥液到基板處理裝置1側。 Here, in the merging portion 105, the hydrogen peroxide is adjusted in advance. The flow rate is stably supplied from the hydrogen peroxide supply pipe 28a, and the previously adjusted sulfuric acid flow rate is stably supplied from the sulfuric acid supply pipe 28b, so that the mixing ratio of hydrogen peroxide and sulfuric acid is not disordered, compared with the previous object. A mixed chemical solution in which the mixing ratio is maintained at a certain value can be generated. Further, the merging portion 105 is opened by the valve body 39 of the mixed chemical supply pipe 28c, and is supplied through the mixed chemical supply pipe 28c to supply the mixed chemical to the substrate processing apparatus 1 side.

因此,自本發明藥液混合裝置10被供給到基板處 理裝置102之混合藥液,係生成過硫酸之最佳混合比率,最好係例如過氧化氫與硫酸設定為1:4~8,藥液混合裝置10係分別調整壓送機構35及定量幫浦38,使得例如過氧化氫與硫酸之混合比率成為1:4,使如此調整之混合比率之混合藥液,以流量50~100(ml/nin)在約30秒之間,可供給到基板處理裝置1。 Therefore, the liquid chemical mixing device 10 of the present invention is supplied to the substrate The mixed chemical solution of the device 102 is an optimal mixing ratio of persulfuric acid. Preferably, for example, hydrogen peroxide and sulfuric acid are set to 1:4 to 8, and the chemical liquid mixing device 10 adjusts the pressure feeding mechanism 35 and the quantitative aid separately. Pu 38, for example, the mixing ratio of hydrogen peroxide to sulfuric acid is 1:4, so that the mixed ratio of the thus adjusted mixing ratio can be supplied to the substrate at a flow rate of 50 to 100 (ml/nin) for about 30 seconds. Processing device 1.

在混合藥液供給管28c處,具有分歧部及混合藥 液壓送機構118,被供給自合流部105之混合藥液,係可藉被供給自混合藥液壓送機構118之氮氣等惰性氣體,被壓送至分歧部。在此,分歧部之一邊具有與基板處理裝置1相連接之基板處理裝置連接管43a,在另一邊具有被連接到混合藥液回收部(未圖示)之回收部連接管43b。在此情形下,當混合藥液自合流部105開始供給時,設於基板處理裝置連接管43a之閥體42a被關閉,設於回收部連接管43b之閥體42b被打開。藉此,被供給自合流部105之混合藥液,不被供給到基板處理裝置1,可透過回收部連接管43b供給到混合藥液回收部。 At the mixed chemical supply pipe 28c, there is a branching portion and a mixed drug The hydraulic feed mechanism 118 is supplied with the mixed chemical solution from the merging portion 105, and is supplied to the branching portion by an inert gas such as nitrogen gas supplied from the mixed drug hydraulic pressure transmitting mechanism 118. Here, one of the branch portions has a substrate processing apparatus connection tube 43a connected to the substrate processing apparatus 1, and on the other side, a collection unit connection tube 43b connected to the mixed chemical solution recovery unit (not shown). In this case, when the mixed chemical solution is supplied from the merging portion 105, the valve body 42a provided in the substrate processing apparatus connecting pipe 43a is closed, and the valve body 42b provided in the collecting portion connecting pipe 43b is opened. Thereby, the mixed chemical liquid supplied from the merging portion 105 is not supplied to the substrate processing apparatus 1, and can be supplied to the mixed chemical liquid collecting unit through the collecting portion connecting pipe 43b.

在此,開始自硫酸供給管28b供給到合流部105 時之硫酸,如第3圖所示,瞬間大幅變動,自開始生成混合藥液開始,當經過既定時間(在第3圖之曲線中係約50秒,以下稱做「供給穩定時間」)後,成為無不規則的紊亂且穩定之硫酸流量。因此,以合流部105開始混合過氧化氫與硫酸時之初期之混合藥液,係對應硫酸流量之變動而混合比率變動。在此,於混合藥液供給管28c中,係關閉基板處理裝置連接管43a的閥體42a,同時打開回收部連接管43b的閥體42b,可使混合比率變動後之初期之混合藥液,流到回收部連接管43b以僅供給到混合藥液回收部。 Here, the supply from the sulfuric acid supply pipe 28b to the merging portion 105 is started. As shown in Fig. 3, the sulfuric acid at the time is greatly changed from the beginning to the start of the generation of the mixed chemical solution, and after a predetermined period of time (about 50 seconds in the graph of Fig. 3, hereinafter referred to as "supply stabilization time") , becomes a disorderly and stable sulfuric acid flow without irregularities. Therefore, the mixed chemical liquid at the initial stage when the mixing unit 105 starts mixing hydrogen peroxide and sulfuric acid changes the mixing ratio in accordance with the fluctuation of the sulfuric acid flow rate. Here, in the mixed chemical supply pipe 28c, the valve body 42a of the substrate processing apparatus connection pipe 43a is closed, and the valve body 42b of the collection part connection pipe 43b is opened, and the mixed chemical liquid of the initial stage after the mixing ratio is changed can be made. It flows to the collection part connection pipe 43b to supply only to the mixed chemical solution collection part.

之後,混合藥液供給管28c係當自以合流部105 開始生成混合藥液後,經過事先設定之供給穩定時間後,基板處理裝置連接管43a的閥體42a打開,回收部連接管43b的閥體42b被關閉。藉此,混合藥液供給管28c係來自硫酸供給管28b之硫酸流量很穩定,可使以合流部105生成之混合藥液之混合比率也很穩定之混合藥液,透過基板處理裝置連接管43a供給到基板處理裝置1。而且,在基板處理裝置1中,被選定之生成過硫酸之最佳混合比率之混合藥液係自藥液混合裝置10被供給,可使用該混合藥液確實去除基板3之光阻劑。 Thereafter, the mixed chemical supply pipe 28c is a self-contained portion 105 After the start of the production of the mixed chemical solution, the valve body 42a of the substrate processing apparatus connection tube 43a is opened after the supply stabilization time set in advance, and the valve body 42b of the recovery unit connection tube 43b is closed. Thereby, the mixed chemical solution supply pipe 28c is a mixed chemical solution in which the flow rate of sulfuric acid from the sulfuric acid supply pipe 28b is stable, and the mixing ratio of the mixed chemical liquid generated by the joining unit 105 is also stabilized, and is transmitted through the substrate processing apparatus connecting pipe 43a. It is supplied to the substrate processing apparatus 1. Further, in the substrate processing apparatus 1, the mixed chemical solution selected to produce the optimum mixing ratio of persulfuric acid is supplied from the chemical liquid mixing device 10, and the photoresist of the substrate 3 can be surely removed using the mixed chemical solution.

(3)動作及效果 (3) Actions and effects

在以上之構成中,於藥液混合裝置10中,以由壓送機構35所做之惰性氣體加壓儲存在定量儲存管33之硫酸,壓送該硫酸到合流部105,使供給量比此硫酸還要少之過氧化氫,藉定量幫浦38以一定微量間歇地往合流部105射出,過氧化氫與硫酸藉合流部105被混合,而生成混合藥液。又,在藥液混 合裝置10中,使以合流部105生成後不久之混合藥液,透過混合藥液供給管28c照原樣供給到基板處理裝置。 In the above configuration, in the chemical liquid mixing device 10, the sulfuric acid stored in the quantitative storage tube 33 is pressurized by the inert gas by the pressure feeding mechanism 35, and the sulfuric acid is pressure-fed to the confluent portion 105 so that the supply amount is larger than this. Hydrogen peroxide is further reduced in sulfuric acid, and the amount of the pump 38 is intermittently discharged to the merging portion 105 in a certain amount, and the hydrogen peroxide and the sulfuric acid are mixed by the combining portion 105 to form a mixed chemical solution. Also, in the liquid mixture In the joining device 10, the mixed chemical liquid which is generated shortly after the merging portion 105 is generated is supplied to the substrate processing apparatus through the mixed chemical liquid supply pipe 28c as it is.

如此一來,在藥液混合裝置10中,使生成後不久 之混合藥液不暫時儲存,直接供給到基板處理裝置1,所以,可使用在基板處理裝置1不長時間劣化之混合藥液,去除基板之光阻劑。又,在此藥液混合裝置10中,當藉壓送機構壓送硫酸開始,使硫酸往合流部105供給時,可維持無脈動且穩定之硫酸流量。而且,在此藥液混合裝置中,係使往合流部105之供給量很少之過氧化氫以定量幫浦33供給,藉此,可穩定射出在一射出中之一定微量之過氧化氫流量,同時使一射出在高速間歇性地重複,藉此,在被連續供給到合流部105之過氧化氫無不規則之紊亂,可使穩定之過氧化氫流量供給到合流部105。 In this way, in the chemical liquid mixing device 10, shortly after the generation Since the mixed chemical solution is not temporarily stored and directly supplied to the substrate processing apparatus 1, the mixed chemical liquid which is not deteriorated in the substrate processing apparatus 1 for a long period of time can be used, and the photoresist of the substrate can be removed. Further, in the chemical-solution mixing device 10, when the sulfuric acid is pressure-fed by the pressure-feeding mechanism and the sulfuric acid is supplied to the merging portion 105, the pulsation-free and stable sulfuric acid flow rate can be maintained. Further, in the chemical liquid mixing device, hydrogen peroxide having a small supply amount to the merging portion 105 is supplied to the quantitative pump 33, whereby a certain amount of hydrogen peroxide flow in an injection can be stably emitted. At the same time, one shot is intermittently repeated at a high speed, whereby the hydrogen peroxide continuously supplied to the merging portion 105 is disordered, and a stable hydrogen peroxide flow rate can be supplied to the merging portion 105.

又,在此藥液混合裝置10中,係設置使自硫酸儲 存槽104吐出之硫酸再度回到硫酸儲存槽104之循環路徑25a,藉設於此循環路徑25a之管內加熱器26,使循環在循環路徑25a之硫酸總是被預熱。如此一來,在藥液混合裝置10中,事先預熱硫酸直到即將供給到基板處理裝置,藉此,在基板處理裝置1即將去除光阻劑時,可使混合藥液之溫度簡單且迅速地上升至促進過硫酸生成之必要高溫領域。結果,在此藥液混合裝置10中,與以基板處理裝置1自常溫加熱混合藥液到高溫領域之情形相比較下,可藉基板處理裝置1短時間加熱混合藥液至高溫領域,僅以此部分即可迅速去除基板3之光阻劑。 Moreover, in the liquid chemical mixing device 10, it is set to store sulfuric acid The sulfuric acid discharged from the storage tank 104 is returned to the circulation path 25a of the sulfuric acid storage tank 104, and the in-pipe heater 26 of the circulation path 25a is supplied, so that the sulfuric acid circulating in the circulation path 25a is always preheated. In this way, in the chemical liquid mixing device 10, the sulfuric acid is preheated in advance until it is immediately supplied to the substrate processing apparatus, whereby when the substrate processing apparatus 1 is to remove the photoresist, the temperature of the mixed chemical solution can be simply and quickly Rise to the necessary high temperature areas that promote the formation of persulfuric acid. As a result, in the liquid chemical mixing device 10, compared with the case where the substrate processing apparatus 1 heats and mixes the chemical liquid to the high temperature field at a normal temperature, the substrate processing apparatus 1 can heat the mixed chemical liquid to the high temperature field for a short time, only This part can quickly remove the photoresist of the substrate 3.

而且,在此藥液混合裝置10中,在硫酸儲存槽104 之外,使以基板處理裝置1去除基板3的光阻劑時,一次使用 之使用量之硫酸,暫時儲存在定量儲存管33,藉來自壓送機構35之惰性氣體加壓定量儲存管33內之硫酸,使得供給硫酸到合流部105。藉此,在藥液混合裝置10中,與對於儲存有使用於下一次去除光阻劑之動作之硫酸,或者,也使用於其他藥液混合裝置之硫酸全部之大容量硫酸儲存槽104全體施加壓力相比較下,只要僅對於使用於去除光阻劑一次之動作之必要最低限度之硫酸加壓即可,所以,可藉較小之加壓,穩定壓送硫酸至合流部105。 Moreover, in the chemical liquid mixing device 10, in the sulfuric acid storage tank 104 In addition, when the substrate processing apparatus 1 removes the photoresist of the substrate 3, it is used once. The used amount of sulfuric acid is temporarily stored in the quantitative storage tube 33, and the sulfuric acid in the quantitative storage tube 33 is pressurized by the inert gas from the pressure feeding mechanism 35 to supply sulfuric acid to the merging portion 105. Thereby, the chemical liquid mixing device 10 is applied to the entire large-capacity sulfuric acid storage tank 104 for storing sulfuric acid used for the next removal of the photoresist or for all the sulfuric acid used in the other chemical mixing device. In the comparison of the pressures, it is only necessary to pressurize the sulfuric acid which is the minimum necessary for the action of removing the photoresist once, so that the sulfuric acid can be stably pressure-fed to the merging portion 105 by a small pressurization.

又,在藥液混合裝置10中,係對於容量較小之定 量儲存管33供給惰性氣體,使儲存在定量儲存管33內之硫酸,藉惰性氣體很順暢地壓送至合流部105,藉此,不受到自定量幫浦38被供給到合流部105之過氧化氫所做之供給壓力之影響,在合流部105中,可維持穩定之硫酸流量。 Moreover, in the chemical liquid mixing device 10, it is fixed for a small capacity. The volume storage tube 33 supplies an inert gas so that the sulfuric acid stored in the quantitative storage tube 33 is smoothly fed to the merging portion 105 by the inert gas, whereby the self-quantitative pump 38 is not supplied to the merging portion 105. The influence of the supply pressure by the hydrogen peroxide maintains a stable sulfuric acid flow rate in the merging portion 105.

而且,在此藥液混合裝置10中,係對應基板處理 裝置1而個別設置定量儲存管33,所以,可設置定量儲存管33在該基板處理裝置1附近,而且,與供給惰性氣體到遠離基板處理裝置1設置之硫酸儲存槽104,以壓送硫酸之情形相比較下,可持續降低惰性氣體之供給壓力,使定量儲存管33內之硫酸確實到達合流部105及混合藥液供給管28c。 Moreover, in the liquid chemical mixing device 10, the corresponding substrate processing The quantitative storage tube 33 is separately provided in the apparatus 1. Therefore, the quantitative storage tube 33 can be disposed in the vicinity of the substrate processing apparatus 1, and the inert gas can be supplied to the sulfuric acid storage tank 104 provided away from the substrate processing apparatus 1 to pressurize the sulfuric acid. In contrast, the supply pressure of the inert gas is continuously lowered, and the sulfuric acid in the quantitative storage tube 33 is surely reached to the merging portion 105 and the mixed chemical supply pipe 28c.

而且,在此藥液混合裝置10中,在設有定量儲存 管33之循環路徑25a之外,設有使硫酸再度回到硫酸儲存槽104之輔助循環路徑25b,使得藉開閉控制做為路徑切換機構之上游側閥體31a、下游側閥體31b、硫酸供給閥體32a及輔助循環側閥體32b,供給自硫酸儲存槽104之硫酸,到循環路 徑25a及輔助循環路徑25b中之一者。又,在此藥液混合裝置10中,藉開閉控制這些上游側閥體31a、下游側閥體31b、硫酸供給閥體32a及輔助循環側閥體32b,以控制硫酸之供給路徑,藉此,暫時儲存硫酸到定量儲存管33,同時在儲存硫酸到定量儲存管33後,也能一邊以輔助循環路徑25b預熱硫酸一邊循環。藉此,在藥液混合裝置10中,自輔助循環路徑25b再度切換到循環路徑25a,當儲存硫酸在定量儲存管33時,可使以管內加熱器26預熱過之新鮮的硫酸,再度迅速地儲存在定量儲存管33。 Moreover, in this chemical liquid mixing device 10, quantitative storage is provided. In addition to the circulation path 25a of the pipe 33, an auxiliary circulation path 25b for returning the sulfuric acid to the sulfuric acid storage tank 104 is provided, so that the upstream side valve body 31a, the downstream side valve body 31b, and the sulfuric acid supply are used as the path switching mechanism by the opening and closing control. The valve body 32a and the auxiliary circulation side valve body 32b are supplied with sulfuric acid from the sulfuric acid storage tank 104 to the circulation path. One of the diameter 25a and the auxiliary circulation path 25b. In the chemical-solution mixing device 10, the upstream side valve body 31a, the downstream side valve body 31b, the sulfuric acid supply valve body 32a, and the auxiliary circulation side valve body 32b are controlled by opening and closing to control the supply route of sulfuric acid. The sulfuric acid is temporarily stored in the quantitative storage tube 33, and after the sulfuric acid is stored in the quantitative storage tube 33, it can be circulated while preheating the sulfuric acid with the auxiliary circulation path 25b. Thereby, in the chemical liquid mixing device 10, the circulation path 25a is again switched from the auxiliary circulation path 25b, and when the sulfuric acid is stored in the quantitative storage tube 33, the fresh sulfuric acid preheated by the tube heater 26 can be re-heated again. It is quickly stored in the quantitative storage tube 33.

依據以上之構成,在此藥液混合裝置10中,藉以 壓送機構35壓送硫酸,穩定化硫酸流量,同時使供給量比硫酸還要少之過氧化氫,藉定量幫浦38在一定微量以高速射出(高速射出),藉此,穩定化過氧化氫流量,藉合流部105自硫酸與過氧化氫生成混合藥液,使生成後不久之混合藥液照原樣供給到基板處理裝置1,藉此,不使混合藥液長時間劣化地,可供給到基板處理裝置1,同時當生成混合藥液時,可抑制硫酸與過氧化氫之混合比率變動,可生成維持一定混合比率之混合藥液。 According to the above configuration, in the liquid chemical mixing device 10, The pressure feeding mechanism 35 pressurizes the sulfuric acid to stabilize the flow rate of the sulfuric acid, and at the same time, the hydrogen peroxide is supplied in a smaller amount than the sulfuric acid, and the quantitative pump 38 is injected at a high speed (high-speed injection) in a certain amount, thereby stabilizing the peroxidation. In the hydrogen flow rate, the mixed liquid chemical is generated from the sulfuric acid and the hydrogen peroxide by the merging portion 105, and the mixed chemical liquid is supplied to the substrate processing apparatus 1 as it is, so that the mixed chemical liquid can be supplied without being deteriorated for a long period of time. When the mixed chemical solution is generated in the substrate processing apparatus 1, the mixing ratio of sulfuric acid and hydrogen peroxide can be suppressed from changing, and a mixed chemical solution which maintains a certain mixing ratio can be produced.

(4)其他之實施形態 (4) Other implementation forms

而且,本發明並不侷限於本實施形態,在本發明要旨之範圍內,可實施種種變形,例如加熱機構也可以使用管內加熱器26以外之其他加熱機構。又,當供給硫酸到合流部105時,未必一定要暫時儲存硫酸在定量儲存管33,也可以例如設置壓送機構在硫酸儲存槽104,直接壓送硫酸自該硫酸儲存槽104往 合流部105。 Further, the present invention is not limited to the embodiment, and various modifications can be made within the scope of the gist of the invention. For example, a heating mechanism other than the in-pipe heater 26 may be used as the heating means. Further, when sulfuric acid is supplied to the merging portion 105, it is not always necessary to temporarily store the sulfuric acid in the quantitative storage tube 33. For example, a pressure feeding mechanism may be provided in the sulfuric acid storage tank 104, and sulfuric acid may be directly fed from the sulfuric acid storage tank 104. Confluence unit 105.

而且,在上述實施形態中,雖然敘述過配置定量 儲存管33在循環路徑25a之情形,但是,本發明並不侷限於此,也可以配置定量儲存管33在循環路徑25a及輔助循環路徑25b以外之硫酸供給管28b之種種位置,又,也可以適用未設有循環路徑25a及輔助循環路徑25b之硫酸供給管28b。 Further, in the above embodiment, the configuration is described The storage tube 33 is in the circulation path 25a. However, the present invention is not limited thereto, and various positions of the sulfuric acid supply tube 28b of the quantitative storage tube 33 other than the circulation path 25a and the auxiliary circulation path 25b may be disposed. A sulfuric acid supply pipe 28b which is not provided with the circulation path 25a and the auxiliary circulation path 25b is applied.

而且,在上述實施形態中,雖然敘述過連接藥液 混合裝置10到單晶圓處理式之基板處理裝置1,使以此基板處理裝置1去除一片基板之光阻劑時必要之混合藥液,以藥液混合裝置10生成之情形,但是,本發明並不侷限於此,也可以適用藥液混合裝置10在複數個基板一次去除光阻劑之基板處理裝置上,也可以使以此基板處理裝置去除複數個基板之光阻劑一次所使用之混合藥液,以藥液混合裝置10生成。 Further, in the above embodiment, the connection liquid medicine has been described. The mixing device 10 to the single-wafer processing type substrate processing apparatus 1 and the mixed liquid chemical necessary for removing the photoresist of one substrate by the substrate processing apparatus 1 are generated by the chemical liquid mixing device 10, but the present invention The present invention is not limited thereto, and the chemical liquid mixing device 10 may be applied to a substrate processing apparatus in which a plurality of substrates are once removed from a photoresist, or a mixture in which the substrate processing apparatus removes a plurality of substrates may be used. The chemical solution is produced by the chemical liquid mixing device 10.

而且,在上述實施形態中,使比硫酸還要少之過 氧化氫為一定微量而往合流部射出之定量幫浦,雖然敘述過適用當壓送硫酸自定量儲存管33往合流部105時,使比硫酸還要少之過氧化氫為一定微量且間歇地往合流部射出之定量幫浦38,但是,本發明並不侷限於此,也可以適用當供給硫酸自定量儲存管33往合流部105時,不間歇地射出過氧化氫,使一定微量之過氧化氫僅一次往合流部射出之定量幫浦,在此情形下,只要係以可實現過氧化氫流量不變動且穩定之過氧化氫流量之供給壓力,而且,不影響定量儲存管33中之壓送之供給壓力,可射出過氧化氫到合流部105之定量幫浦即可。 Moreover, in the above embodiment, it is made less than sulfuric acid. The quantitative pump that emits a small amount of hydrogen oxide to the merging portion, although it is described that when the sulfuric acid is supplied from the quantitative storage tube 33 to the merging portion 105, the hydrogen peroxide is less than sulfuric acid and is intermittently and intermittently The quantitative pump 38 is emitted to the merging portion. However, the present invention is not limited thereto, and when the sulfuric acid is supplied from the quantitative storage tube 33 to the merging portion 105, the hydrogen peroxide is not intermittently emitted, so that a certain amount of The quantitative pump for the hydrogen peroxide to be emitted to the confluence portion only once, in this case, as long as the supply pressure of the hydrogen peroxide flow rate which is stable and the hydrogen peroxide flow rate is not changed, and does not affect the quantitative storage tube 33 The supply pressure of the pressure feed can be used to emit hydrogen peroxide to the quantitative pump of the merging portion 105.

在此情形下,如上述實施例之定量幫浦38,使一 定微量之過氧化氫連續射出到合流部105之定量幫浦,也可以適用例如電磁驅動型活塞式定量幫浦,或注射幫浦、旋轉容積式一軸偏心螺紋幫浦等其他種種之定量幫浦。而且,在此,注射幫浦係具有使注射器藉馬達之驅動力,以既定速度押出,藉此,使一定微量之過氧化氫連續往合流部105射出之構成者。又,旋轉容積式一軸偏心螺紋幫浦,係具有一條公螺紋之轉子在兩條母螺紋之定子中,一邊偏心運動一邊旋轉之一軸形構造,內接在定子以旋轉轉子,使充滿這些定子與轉子間之間隙之過氧化氫往軸向送出,藉此,使一定微量之過氧化氫連續往合流部105射出之構成者。 In this case, the quantitative pump 38 as in the above embodiment makes one A certain amount of hydrogen peroxide is continuously injected into the quantitative pump of the merging portion 105, and for example, an electromagnetically driven piston type quantitative pump, or an injection pump, a rotary volume type one-axis eccentric thread pump, and the like can be applied. . Further, here, the injection pump has a driving force that causes the syringe to be ejected at a predetermined speed by the driving force of the motor, whereby a certain amount of hydrogen peroxide is continuously emitted to the merging portion 105. Further, the rotary volume type one-axis eccentric threaded pump is a rotor having a male thread in a stator of two female threads, and rotates one of the shaft-shaped structures while being eccentrically moved, and is connected to the stator to rotate the rotor to fill the stators and The hydrogen peroxide in the gap between the rotors is sent out in the axial direction, whereby a certain amount of hydrogen peroxide is continuously emitted to the merging portion 105.

1‧‧‧基板處理裝置 1‧‧‧Substrate processing unit

10‧‧‧藥液混合裝置 10‧‧‧Drug and liquid mixing device

21‧‧‧基板洗淨裝置 21‧‧‧Substrate cleaning device

25a‧‧‧循環路徑 25a‧‧‧Circular path

25b‧‧‧輔助循環路徑 25b‧‧‧Auxiliary circulation path

26‧‧‧管內加熱器 26‧‧‧In-tube heater

27‧‧‧循環幫浦 27‧‧‧Circular pump

28a‧‧‧過氧化氫供給管 28a‧‧‧Hydrogen peroxide supply pipe

28b‧‧‧硫酸供給管 28b‧‧‧ sulfuric acid supply pipe

28c‧‧‧混合藥液供給管 28c‧‧‧mixed liquid supply tube

30a‧‧‧循環用配管 30a‧‧‧Circulation piping

30b‧‧‧輔助循環用配管 30b‧‧‧Assisted circulation piping

31a‧‧‧上游側閥體 31a‧‧‧Upstream side valve body

31b‧‧‧下游側閥體 31b‧‧‧ downstream side valve body

32a‧‧‧硫酸供給閥體 32a‧‧‧Sulphuric acid supply valve body

32b‧‧‧輔助循環側閥體 32b‧‧‧Auxiliary circulation side valve body

33‧‧‧定量儲存管 33‧‧‧Quantum storage tube

35‧‧‧壓送機構 35‧‧‧pressure feeding mechanism

36‧‧‧過氧化氫儲存槽 36‧‧‧ Hydrogen peroxide storage tank

38‧‧‧定量幫浦 38‧‧‧Quantitative pump

39‧‧‧閥體 39‧‧‧ valve body

42a‧‧‧閥體 42a‧‧‧ body

42b‧‧‧閥體 42b‧‧‧ valve body

43a‧‧‧基板處理裝置連接管 43a‧‧‧Substrate processing device connection tube

43b‧‧‧回收部連接管 43b‧‧‧Recycling section connecting pipe

104‧‧‧硫酸儲存槽 104‧‧‧ sulfuric acid storage tank

105‧‧‧合流部 105‧‧‧Confluence Department

118‧‧‧混合藥液壓送機構 118‧‧‧Mixed drug hydraulic feeding mechanism

Claims (5)

一種藥液混合裝置,混合硫酸與過氧化氫以生成混合藥液,供給前述混合藥液到使用前述混合藥液以去除基板之光阻劑之基板處理裝置,其特徵在於包括:壓送機構,以惰性氣體加壓前述硫酸,壓送該硫酸到合流部;定量幫浦,使比前述硫酸還要少之前述過氧化氫為一定微小量,往前述合流部射出;以及混合藥液供給機構,使前述過氧化氫與前述硫酸藉前述合流部被混合而生成之前述混合藥液,供給到前述基板處理裝置。 A liquid chemical mixing device which mixes sulfuric acid and hydrogen peroxide to form a mixed chemical liquid, and supplies the mixed chemical liquid to a substrate processing apparatus using the mixed chemical liquid to remove a photoresist of a substrate, characterized in that it comprises: a pressure feeding mechanism, Pressurizing the sulfuric acid with an inert gas, and pressurizing the sulfuric acid to the confluent portion; and quantifying the pump to make the hydrogen peroxide smaller than the sulfuric acid a certain amount, and ejecting the confluent portion; and mixing the chemical supply mechanism, The mixed chemical solution obtained by mixing the hydrogen peroxide and the sulfuric acid by the merging portion is supplied to the substrate processing apparatus. 如申請專利範圍第1項所述之藥液混合裝置,其中,前述定量幫浦使前述一定微量之過氧化氫,連續往前述合流部射出。 The chemical-solution mixing device according to the first aspect of the invention, wherein the quantitative pump discharges a predetermined amount of hydrogen peroxide continuously to the merging portion. 如申請專利範圍第1或2項所述之藥液混合裝置,其中,其包括:循環路徑,使自硫酸儲存槽吐出之前述硫酸,再次回到前述硫酸儲存槽;以及加熱機構,設於前述循環路徑,在供給到前述基板處理裝置前,事先預熱前述硫酸。 The chemical liquid mixing device according to claim 1 or 2, further comprising: a circulation path for returning the sulfuric acid discharged from the sulfuric acid storage tank to the sulfuric acid storage tank; and a heating mechanism provided in the foregoing The circulation path is preheated in advance of the sulfuric acid before being supplied to the substrate processing apparatus. 如申請專利範圍第3項所述之藥液混合裝置,其中,其具有定量儲存機構,前述定量儲存機構係與前述硫酸儲存槽 不同,儲存藉前述基板處理裝置去除前述基板之光阻劑之使用一次之使用量之硫酸,藉來自前述壓送機構之惰性氣體,加壓前述定量儲存機構之前述硫酸,以供給該硫酸到前述合流部。 The chemical liquid mixing device according to claim 3, wherein the quantitative liquid storage mechanism has a quantitative storage mechanism and the sulfuric acid storage tank Differently, the sulfuric acid used for removing the photoresist of the substrate by the substrate processing device is stored, and the sulfuric acid of the quantitative storage mechanism is pressurized by the inert gas from the pressure feeding mechanism to supply the sulfuric acid to the foregoing Confluence department. 如申請專利範圍第4項所述之藥液混合裝置,其中,包括:輔助循環路徑,與前述循環路徑不同,以前述加熱機構被加熱之硫酸,再次回到前述硫酸儲存槽;以及路徑切換機構,使自前述硫酸儲存槽被供給之前述硫酸,流過前述循環路徑及前述輔助循環路徑中之任一者,在前述循環路徑配置有前述定量儲存機構,前述路徑切換機構系藉控制前述硫酸之供給路徑,儲存前述硫酸在前述定量儲存機構,同時在儲存硫酸於該定量儲存機構之狀態下,藉前述輔助循環路徑迴圈硫酸。 The chemical liquid mixing device according to claim 4, further comprising: an auxiliary circulation path, which is different from the circulation path, and returns to the sulfuric acid storage tank by the sulfuric acid heated by the heating mechanism; and the path switching mechanism And flowing the sulfuric acid supplied from the sulfuric acid storage tank to any one of the circulation path and the auxiliary circulation path, wherein the quantitative storage mechanism is disposed in the circulation path, and the path switching mechanism controls the sulfuric acid The supply path stores the sulfuric acid in the quantitative storage mechanism, and at the same time, in the state in which the sulfuric acid is stored in the quantitative storage mechanism, the sulfuric acid is looped through the auxiliary circulation path.
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TWI567855B (en) * 2014-09-02 2017-01-21 杰宜斯科技有限公司 Substrate liquid processing apparatus and substrate liquid processing method
TWI760466B (en) * 2017-04-03 2022-04-11 日商荏原製作所股份有限公司 Liquid supply apparatus and liquid supply method

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JP7007928B2 (en) * 2017-03-30 2022-01-25 東京エレクトロン株式会社 Weighing device, substrate liquid processing device, weighing method, substrate liquid processing method and storage medium
JP6993151B2 (en) * 2017-09-22 2022-01-13 株式会社Screenホールディングス Board processing method and board processing equipment
CN111686600A (en) * 2020-07-22 2020-09-22 湖南广盛源医药科技有限公司 A configuration device for antiseptic solution production

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US9142424B2 (en) * 2010-06-07 2015-09-22 Kurita Water Industries Ltd. Cleaning system and cleaning method

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TWI567855B (en) * 2014-09-02 2017-01-21 杰宜斯科技有限公司 Substrate liquid processing apparatus and substrate liquid processing method
TWI760466B (en) * 2017-04-03 2022-04-11 日商荏原製作所股份有限公司 Liquid supply apparatus and liquid supply method

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