TW201330057A - Apparatus for sublimating solid state precursors - Google Patents

Apparatus for sublimating solid state precursors Download PDF

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Publication number
TW201330057A
TW201330057A TW101136924A TW101136924A TW201330057A TW 201330057 A TW201330057 A TW 201330057A TW 101136924 A TW101136924 A TW 101136924A TW 101136924 A TW101136924 A TW 101136924A TW 201330057 A TW201330057 A TW 201330057A
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Taiwan
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container
disk
disposed
wall
gas
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TW101136924A
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Chinese (zh)
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David K Carlson
Errol Antonio C Sanchez
Satheesh Kuppurao
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Applied Materials Inc
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Publication of TW201330057A publication Critical patent/TW201330057A/en

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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B23/00Single-crystal growth by condensing evaporated or sublimed materials
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/448Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
    • C23C16/4481Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material
    • C23C16/4483Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by evaporation using carrier gas in contact with the source material using a porous body
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/448Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
    • C23C16/4488Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by in situ generation of reactive gas by chemical or electrochemical reaction

Abstract

In some embodiments, an apparatus for sublimating solid state precursors may include a container having a body, lid, and removable bottom, wherein the removable bottom is sealable to the body to seal the container when coupled to the body; a tray insertable into the container from a bottom of the container, the tray comprising: a gas permeable base to support a solid state precursor, the gas permeable base having a through hole disposed proximate the center of the gas permeable base; an outer ring disposed around an outer edge of the base and extending upwardly from the base, the outer ring configured to interface with the lid of the container; and an inner ring disposed within the through hole, the inner ring configured to interface with the lid of the container; an inlet disposed through the lid of the container; and an outlet disposed through the lid of the container.

Description

用於昇華固態前驅物的設備Equipment for sublimating solid state precursors

本發明的實施例大體上關於半導體處理。 Embodiments of the invention relate generally to semiconductor processing.

本案發明人已經觀察到的是傳統上使用的用於沉積製程(例如,磊晶生長或原子層沉積製程)的前驅物系統(例如,氣體、液體蒸氣、液體/惰性氣體載體、固體蒸發、固體昇華、反應性載體等)係提供對於目前半導體處理要求不足夠純度的前驅物。又,傳統上使用的預先製備的前驅物是不穩定的且會隨著時間而分解、凝結或改變狀態。 The inventors of the present invention have observed precursor systems that have been conventionally used for deposition processes (eg, epitaxial growth or atomic layer deposition processes) (eg, gases, liquid vapors, liquid/inert gas carriers, solids evaporation, solids). Sublimation, reactive carriers, etc.) provide precursors that are not sufficiently pure for current semiconductor processing requirements. Again, previously prepared precursors that are conventionally used are unstable and will decompose, coagulate or change state over time.

所以,本案發明人已經提供用以輸送前驅物的改良設備,該等前驅物相較於傳統上產生的前驅物具有改善的純度。 Therefore, the inventors of the present invention have provided improved apparatus for transporting precursors which have improved purity compared to conventionally produced precursors.

在此提供用以昇華固態前驅物的設備。在一些實施例中,一種用以昇華固態前驅物的設備可包括:一容器,該容器具有一主體、一蓋與一可移除底部,其中該可移除底部 可密封到該主體以在該可移除底部耦接到該主體時能密封該容器;一盤,該盤可從該容器的一底部插入到該容器內一其中該盤可包括:一氣體可滲透基底,該氣體可滲透基底用以支撐一固態前驅物,該氣體可滲透基底具有一穿孔,該穿孔設置成靠近該氣體可滲透基底的中央;一外環,該外環係環繞該基底的一外緣而設置且從該基底向上延伸,該外環設以和該容器的該蓋形成界面;及一內環,該內環設置在該穿孔內,該內環設以和該容器的該蓋形成界面一一入口,該入口設置成通過該容器的該蓋,該入口設以經由該盤的該內環提供一氣體到該盤下方的一區域;及一出口,該出口設置成通過該容器的該蓋,以容許氣體形式的該固態前驅物能流出該容器。 Equipment for sublimating solid precursors is provided herein. In some embodiments, an apparatus for sublimating a solid precursor can include: a container having a body, a cover, and a removable bottom, wherein the removable bottom Sealable to the body to seal the container when the removable bottom is coupled to the body; a tray insertable from a bottom of the container into the container, wherein the tray can include: a gas Permeating a substrate, the gas permeable substrate for supporting a solid precursor, the gas permeable substrate having a perforation disposed adjacent the center of the gas permeable substrate; and an outer ring surrounding the substrate An outer edge is disposed and extends upwardly from the base, the outer ring is configured to form an interface with the cover of the container; and an inner ring is disposed in the through hole, the inner ring being disposed with the container The lid forms an interface one-to-one inlet, the inlet being disposed through the lid of the container, the inlet being provided to provide a gas to an area under the tray via the inner ring of the tray; and an outlet configured to pass the outlet The lid of the container is capable of allowing the solid precursor in the form of a gas to flow out of the container.

在一些實施例中,一種用以昇華固態前驅物的設備可包括:一容器,該容器具有一主體、一蓋與一可移除底部,該可移除底部可密封到該主體以在該可移除底部耦接到該主體時能密封該容器;一第一盤,該第一盤可從該容器的一底部插入到該容器內,該第一盤包含一氣體可滲透基底、一內壁與一外壁,其中該氣體可滲透基底用以支撐一固態前驅物且具有被形成通過該基底的一中央開口,該內壁係環繞該基底的該中央開口而設置,該外壁係環繞該基底的一外緣而設置,其中該內壁與該外壁和該容器的該蓋形成界面以在該第一盤與該蓋之間提供一氣密密封;一入口,該入口設置成通過該容器的該蓋且耦接到一輸入通道以提供一氣體到該第一盤下方的一區域,其中該輸入通道通過該基底的該中央開口 且至少部分地由該第一盤的該內壁來界定;及一出口,該出口設置成通過該容器的該蓋且位在大體上該第一盤的該內壁與該外壁之間的該第一盤的一區域上方的一區域中,以容許氣體形式的該固態前驅物能流出該容器。 In some embodiments, an apparatus for sublimating a solid precursor can include: a container having a body, a cover and a removable bottom, the removable bottom being sealable to the body to be The container is sealed when the bottom portion is coupled to the body; a first tray is insertable into the container from a bottom of the container, the first tray comprising a gas permeable substrate and an inner wall And an outer wall, wherein the gas permeable substrate is for supporting a solid precursor and has a central opening formed through the substrate, the inner wall being disposed around the central opening of the substrate, the outer wall surrounding the substrate An outer edge, wherein the inner wall forms an interface with the outer wall and the lid of the container to provide a hermetic seal between the first tray and the lid; an inlet disposed through the lid of the container And coupled to an input channel to provide a gas to an area below the first disk, wherein the input channel passes through the central opening of the substrate And at least partially defined by the inner wall of the first disk; and an outlet disposed through the cover of the container and located generally between the inner wall of the first disk and the outer wall In a region above an area of the first disk, the solid precursor in the form of a permissible gas can flow out of the container.

以下描述本發明的其他與進一步的實施例。 Other and further embodiments of the invention are described below.

100‧‧‧製程腔室 100‧‧‧Processing chamber

101‧‧‧基材 101‧‧‧Substrate

102‧‧‧上部 102‧‧‧ upper

104‧‧‧下部 104‧‧‧ lower

106‧‧‧蓋 106‧‧‧ Cover

108‧‧‧夾持環 108‧‧‧ clamping ring

110‧‧‧腔室主體 110‧‧‧ chamber body

112‧‧‧底板 112‧‧‧floor

114‧‧‧吸入埠 114‧‧‧Inhalation test

116‧‧‧內襯 116‧‧‧ lining

117‧‧‧氣體源 117‧‧‧ gas source

118‧‧‧排放埠 118‧‧‧Emissions埠

119‧‧‧真空泵 119‧‧‧vacuum pump

120‧‧‧圍體 120‧‧‧ enclosure

121‧‧‧底板組件 121‧‧‧Bottom plate assembly

122‧‧‧預熱環 122‧‧‧Preheating ring

123‧‧‧真空系統 123‧‧‧vacuum system

124‧‧‧基材支撐件 124‧‧‧Substrate support

126‧‧‧基材升降桿 126‧‧‧Substrate lifting rod

127‧‧‧墊片 127‧‧‧shims

128‧‧‧上部 128‧‧‧ upper

130‧‧‧支援系統 130‧‧‧Support system

132‧‧‧下圓頂 132‧‧‧ Lower Dome

134‧‧‧支撐托架 134‧‧‧Support bracket

136‧‧‧上加熱燈 136‧‧‧Upheating lamp

138‧‧‧上加熱燈 138‧‧‧Upheating lamp

140‧‧‧控制器 140‧‧‧ Controller

142‧‧‧中央處理單元(CPU) 142‧‧‧Central Processing Unit (CPU)

144‧‧‧記憶體 144‧‧‧ memory

146‧‧‧支援電路 146‧‧‧Support circuit

152‧‧‧下加熱燈 152‧‧‧Under heat lamp

154‧‧‧下加熱燈 154‧‧‧Under heat lamp

156‧‧‧上高溫計 156‧‧‧Upper pyrometer

158‧‧‧下高溫計 158‧‧‧ under the pyrometer

160‧‧‧基材升降組件 160‧‧‧Substrate lifting assembly

161‧‧‧升降銷模組 161‧‧‧ Lifting pin module

162‧‧‧第一開口 162‧‧‧ first opening

164‧‧‧基材支撐組件 164‧‧‧Substrate support assembly

166‧‧‧支撐銷 166‧‧‧Support pin

180‧‧‧設備 180‧‧‧ Equipment

202‧‧‧殼 202‧‧‧ shell

204‧‧‧內襯 204‧‧‧ lining

206‧‧‧主體 206‧‧‧ Subject

208‧‧‧盤 208‧‧‧

210‧‧‧容器 210‧‧‧ Container

212‧‧‧氣體岐管 212‧‧‧ gas tube

213‧‧‧區域 213‧‧‧Area

215‧‧‧最底部盤 215‧‧‧ bottom plate

216‧‧‧底部 216‧‧‧ bottom

218‧‧‧密封物 218‧‧‧ Seals

219‧‧‧外緣 219‧‧‧ outer edge

220、221、223、225、227‧‧‧壓力監控器 220, 221, 223, 225, 227‧ ‧ pressure monitors

222‧‧‧外環(外壁) 222‧‧‧outer ring (outer wall)

224‧‧‧溫度控制單元 224‧‧‧ Temperature Control Unit

226‧‧‧蓋 226‧‧‧ Cover

228‧‧‧底部 228‧‧‧ bottom

230‧‧‧入口 230‧‧‧ entrance

231‧‧‧底部 231‧‧‧ bottom

232‧‧‧出口 232‧‧‧Export

234‧‧‧外表面 234‧‧‧ outer surface

236‧‧‧頂部 236‧‧‧ top

240‧‧‧內環(或內壁) 240‧‧‧ Inner ring (or inner wall)

241‧‧‧環室 241‧‧‧Circle Room

242‧‧‧氣體可滲透基底 242‧‧‧ Gas permeable substrate

243‧‧‧穿孔 243‧‧‧Perforation

245‧‧‧覆蓋塊 245‧‧‧Overlay block

246‧‧‧溫度控制機構 246‧‧‧ Temperature Control Mechanism

247‧‧‧壓力計 247‧‧‧ pressure gauge

248‧‧‧溫度控制機構 248‧‧‧ Temperature Control Mechanism

249‧‧‧壓力計 249‧‧‧ pressure gauge

302‧‧‧基底部分 302‧‧‧base part

304‧‧‧向外延伸片 304‧‧‧Outward extension

306‧‧‧基底部分 306‧‧‧ base part

308‧‧‧向外延伸片 308‧‧‧Outward extension

310‧‧‧凹穴 310‧‧‧ recess

312‧‧‧凹穴 312‧‧ ‧ pocket

可藉由參考本發明的示意性實施例來暸解本發明的實施例,本發明的實施例簡短地在上文概述過且在下文更詳細地論述,其中該等示意性實施例在附圖中圖示。但是應注意的是,附圖僅圖示本發明的典型實施例,且因此附圖不應被視為會對本發明範疇構成限制,因為本發明可允許其他等效實施例。 Embodiments of the invention may be understood by reference to the exemplary embodiments of the invention, which are briefly described above and discussed in more detail below, wherein the exemplary embodiments are illustrated in the drawings Illustration. It is to be understood, however, that the appended claims

第1圖圖示根據本發明的一些實施例的製程腔室,該製程腔室適用於與昇華固態前驅物的設備併同使用。 Figure 1 illustrates a process chamber suitable for use with equipment for sublimating solid state precursors in accordance with some embodiments of the present invention.

第2圖圖示根據本發明的一些實施例用以昇華固態前驅物的設備。 Figure 2 illustrates an apparatus for sublimating a solid state precursor in accordance with some embodiments of the present invention.

第3圖圖示根據本發明的一些實施例用在用以昇華固態前驅物的設備中的盤。 Figure 3 illustrates a disk for use in an apparatus for sublimating solid state precursors in accordance with some embodiments of the present invention.

為促進了解,在可能時使用相同的元件符號來表示該等圖式共用的相同元件。圖式未依比例繪製且為了清晰起見可被簡化。可設想出的是一個實施例的元件與特徵可有利地併入到其他實施例而不需特別詳述。 To promote understanding, the same element symbols are used where possible to indicate the same elements that are common to the drawings. The drawings are not drawn to scale and may be simplified for clarity. It is contemplated that elements and features of one embodiment may be beneficially incorporated into other embodiments without particular detail.

在此提供用以昇華固態前驅物的設備。在一些實施例中,本發明設備可有利地提供容易裝設到設備且從設備移除的一或更多個固態前驅物支撐盤,藉此提供相較於傳統前驅物昇華系統更容易與更有效率的用以提供固態前驅物到固態前驅物昇華系統的機構。本發明設備可更有利地提供使用點(a point of use)前驅物產生,藉此降低前驅物凝結、改變狀態或和散佈系統反應的風險。本發明設備可更有利地提供在設備內的壓力梯度以促進更均勻的固態前驅物的昇華,藉此提供改善的製程一致性與材料應用性。儘管不欲構成範疇的限制,本案發明人已經觀察到的是本發明設備可用以提供用於磊晶與原子層沉積製程的前驅物。 Equipment for sublimating solid precursors is provided herein. In some embodiments, the apparatus of the present invention may advantageously provide one or more solid precursor support trays that are easily attached to and removed from the apparatus, thereby providing easier and more conventional switching sublimation systems than conventional apparatus. An efficient mechanism for providing solid precursors to solid state precursor sublimation systems. The apparatus of the present invention may more advantageously provide a point of use for precursor generation, thereby reducing the risk of precursor condensation, changing state, or dispersing system reactions. The apparatus of the present invention may more advantageously provide a pressure gradient within the apparatus to promote sublimation of a more uniform solid precursor, thereby providing improved process consistency and material applicability. While not wishing to be bound by a scope, the inventors have observed that the apparatus of the present invention can be used to provide precursors for epitaxial and atomic layer deposition processes.

第1圖圖示根據本發明的一些實施例的製程腔室100的示意側視圖,該製程腔室100適用於與昇華固態前驅物的設備併同使用。在一些實施例中,製程腔室100可以市售製程腔室,諸如可從美國加州聖大克勞拉市的應用材料公司取得的EPI®反應器,或已經被變更以和在此所述的前驅物輸送設備併同使用的適於執行磊晶矽沉積製程的任何適當的半導體製程腔室。然而,亦可使用其他製程腔室。 1 illustrates a schematic side view of a process chamber 100 suitable for use with equipment for sublimating solid state precursors, in accordance with some embodiments of the present invention. In some embodiments, the process chamber 100 can be a commercially available process chamber, such as an EPI® reactor available from Applied Materials, Inc. of Santa Clara, Calif., or has been modified and described herein. The precursor transport apparatus is used in conjunction with any suitable semiconductor processing chamber suitable for performing an epitaxial germanium deposition process. However, other process chambers can also be used.

製程腔室100可大體上包含腔室主體110、支援系統130與控制器140。用以昇華固態前驅物的設備180可經由例如製程氣體吸入埠或入口114耦接到製程腔室100。用以昇華固態前驅物的設備180可大體上用以昇華所需要用在期望應用的任何相容類型的固態前驅物,例如以下所述的示範性 固態前驅物。 The process chamber 100 can generally include a chamber body 110, a support system 130, and a controller 140. Apparatus 180 for sublimating the solid state precursor may be coupled to process chamber 100 via, for example, a process gas suction port or inlet 114. Apparatus 180 for sublimating solid state precursors can generally be used to sublimate any compatible type of solid precursor required for use in a desired application, such as the exemplary embodiments described below. Solid precursor.

腔室主體110大體上包括上部102、下部104與圍體120。真空系統123可耦接到腔室主體110,以促進腔室主體110內能維持在期望壓力。在一些實施例中,真空系統123可包含節流閥(未圖示)與真空泵119,真空泵119用以對腔室主體110抽氣。在一些實施例中,可藉由調整節流閥及/或真空泵119來調節腔室主體110內的壓力。上部102設置在下部104上,並且上部102包括蓋106、夾持環108、內襯116、底板112、一或更多個上加熱燈136和一或更多個下加熱燈152與上高溫計156。在一些實施例中,蓋106具有似圓頂的形狀因子,然而亦可設想出具有其他形狀因子的蓋(例如,平坦或反曲面的蓋)。下部104耦接到製程氣體吸入埠114與排放埠118,並且下部104包含底板組件121、下圓頂132、基材支撐件124、預熱環122、基材升降組件、基材支撐組件164、一或更多個上加熱燈138和一或更多個下加熱燈154與下高溫計158。儘管詞語“環”用以描述製程腔室100的特定構件(諸如預熱環122),可設想出的是該等構件的形狀不需要是圓形的且可包括任何形狀(包括但不限於矩形、多邊形、橢圓形與諸如此類者)。 The chamber body 110 generally includes an upper portion 102, a lower portion 104, and a surrounding body 120. Vacuum system 123 can be coupled to chamber body 110 to promote maintenance of the desired pressure within chamber body 110. In some embodiments, the vacuum system 123 can include a throttle valve (not shown) and a vacuum pump 119 for pumping the chamber body 110. In some embodiments, the pressure within the chamber body 110 can be adjusted by adjusting the throttle and/or vacuum pump 119. Upper portion 102 is disposed on lower portion 104, and upper portion 102 includes cover 106, clamping ring 108, inner liner 116, bottom plate 112, one or more upper heat lamps 136, and one or more lower heat lamps 152 and upper pyrometer 156. In some embodiments, the cover 106 has a dome-like form factor, however a cover having other form factors (eg, a flat or inverted cover) is also contemplated. The lower portion 104 is coupled to the process gas suction port 114 and the discharge port 118, and the lower portion 104 includes a bottom plate assembly 121, a lower dome 132, a substrate support 124, a preheat ring 122, a substrate lifting assembly, a substrate support assembly 164, One or more upper heater lamps 138 and one or more lower heater lamps 154 and lower pyrometer 158. Although the term "ring" is used to describe a particular component of process chamber 100, such as preheat ring 122, it is contemplated that the shape of the members need not be circular and may include any shape (including but not limited to rectangular , polygons, ellipses, and the like).

在處理期間,基材101設置在基材支撐件124上。燈136、138、152與154是紅外線(IR)輻射源(例如熱)且在運作時產生遍佈基材101的預定的溫度分佈。蓋106、夾持環108與下圓頂132是由石英形成,然而亦可使用其他紅外線透射且製程相容的材料來形成該等構件。 The substrate 101 is disposed on the substrate support 124 during processing. Lamps 136, 138, 152, and 154 are sources of infrared (IR) radiation (e.g., heat) and produce a predetermined temperature distribution throughout substrate 101 during operation. The cover 106, the clamping ring 108 and the lower dome 132 are formed of quartz, although other infrared transmissive and process compatible materials may be used to form the members.

基材支撐組件164大體上包括支撐托架134,支撐托架134具有耦接到基材支撐件124的複數個支撐銷166。基材升降組件160包含基材升降桿126與複數個升降銷模組161,該等升降銷模組161選擇性地安置在基材升降桿126的各自墊片127上。在一個實施例中,升降銷模組161包含升降銷128的可選上部,該上部可移動地設置成過基材支撐件124中的第一開口162。在運作時,基材升降桿126被移動而嚙合升降銷128。當被嚙合時,升降銷128可將基材101上升到高於基材支撐件124或將基材101下降到基材支撐件124上。 The substrate support assembly 164 generally includes a support bracket 134 having a plurality of support pins 166 coupled to the substrate support 124. The substrate lifting assembly 160 includes a substrate lifting bar 126 and a plurality of lifting pin modules 161 that are selectively disposed on respective pads 127 of the substrate lifting bar 126. In one embodiment, the lift pin module 161 includes an optional upper portion of the lift pin 128 that is movably disposed past the first opening 162 in the substrate support 124. In operation, the substrate lifter 126 is moved to engage the lift pins 128. When engaged, the lift pins 128 can raise the substrate 101 above the substrate support 124 or lower the substrate 101 onto the substrate support 124.

支援系統130包括用以執行且監控製程腔室100中的預定製程(例如,生長磊晶膜)的構件。該等構件大體上包括各種子系統(例如,氣體面板、氣體散佈導管、真空和排放子系統與諸如此類者)以及製程腔室100的裝置(例如,功率供應器、製程控制設施與諸如此類者)。該等構件對於熟習此技藝的人士而言是所熟知的且為了清晰起見從圖式省略。 Support system 130 includes components for performing and monitoring a predetermined process (eg, growing an epitaxial film) in process chamber 100. Such components generally include various subsystems (eg, gas panels, gas distribution conduits, vacuum and exhaust subsystems, and the like) and devices of the process chamber 100 (eg, power supplies, process control facilities, and the like). Such components are well known to those skilled in the art and are omitted from the drawings for clarity.

控制器140可被提供且耦接到製程腔室100,以控制製程腔室100的構件。控制器140可以是用以控制基材製程腔室的運作的任何適當的控制器。控制器140大體上包含中央處理單元(CPU)142、記憶體144與支援電路146,並且控制器140直接地耦接到且控制製程腔室100和支援系統130(如第1圖所示),或替代地經由和製程腔室及/或支援系統相關的電腦(或控制器)耦接到且控制製程腔室100和支援系統130。 A controller 140 can be provided and coupled to the process chamber 100 to control components of the process chamber 100. Controller 140 can be any suitable controller for controlling the operation of the substrate processing chamber. The controller 140 generally includes a central processing unit (CPU) 142, a memory 144 and a support circuit 146, and the controller 140 is directly coupled to and controls the process chamber 100 and the support system 130 (as shown in FIG. 1). Alternatively, the process chamber 100 and the support system 130 are coupled to and controlled via a computer (or controller) associated with the process chamber and/or support system.

CPU 142可以是用在工業設備的任何形式的通用目的電腦處理器。支援電路146耦接到CPU 142且可包含快取、時脈電路、輸入/輸出子系統、功率供應器與諸如此類者。軟體常式(諸如以下參照第2圖的在此所揭示的用以處理基材的方法)可被儲存在控制器140的記憶體144中。當軟體常式被CPU 142執行時,軟體常式將CPU 142轉變成特殊用途電腦(控制器)140。軟體常式亦可被位在控制器140遠處的第二控制器(未圖示)儲存及/或執行。替代地或組合地,在一些實施例(例如製程腔室100是多腔室處理系統的一部分)中,多腔室處理系統的各個製程腔室可具有其本身的控制器以用於控制本文所揭示的可被執行在此特定製程腔室中的本發明方法的諸部分。在該等實施例中,個別控制器能以類似於控制器140的方式來設置且可耦接到控制器140以將製程腔室100的運作予以同步化。 The CPU 142 can be any form of general purpose computer processor used in industrial equipment. Support circuitry 146 is coupled to CPU 142 and may include cache, clock circuitry, input/output subsystems, power supplies, and the like. A software routine (such as the method disclosed herein below for processing a substrate as disclosed in FIG. 2) may be stored in the memory 144 of the controller 140. When the software routine is executed by the CPU 142, the software routine converts the CPU 142 into a special purpose computer (controller) 140. The software routine can also be stored and/or executed by a second controller (not shown) located remotely from the controller 140. Alternatively or in combination, in some embodiments (eg, process chamber 100 is part of a multi-chamber processing system), each process chamber of the multi-chamber processing system may have its own controller for controlling the text herein Portions of the inventive method that can be performed in this particular processing chamber are disclosed. In such embodiments, individual controllers can be arranged in a manner similar to controller 140 and can be coupled to controller 140 to synchronize the operation of process chamber 100.

氣體源117可耦接到用以昇華固態前驅物的設備180,以提供一或更多種氣體而促進固態前驅物的昇華及/或昇華的前驅物的輸送(如以下所述)。例如,在一些實施例中,氣體源117可提供反應性氣體,諸如氫(H2)、氯化氫(HCl)、氯(Cl2)、溴(Br)、氧(O2)、甲烷(CH4)或諸如此類者。替代地或組合地,在一些實施例中,氣體源可提供惰性氣體或載體氣體,例如氦(He)、氬(Ar)、氙(Xe)或諸如此類者。 A gas source 117 can be coupled to the apparatus 180 for sublimating the solid precursor to provide one or more gases to facilitate sublimation of the solid precursor and/or delivery of the sublimated precursor (as described below). For example, in some embodiments, gas source 117 can provide a reactive gas such as hydrogen (H 2 ), hydrogen chloride (HCl), chlorine (Cl 2 ), bromine (Br), oxygen (O 2 ), methane (CH 4 ) ) or the like. Alternatively or in combination, in some embodiments, the gas source may provide an inert gas or carrier gas, such as helium (He), argon (Ar), xenon (Xe), or the like.

參照第2圖,用以昇華固態前驅物的設備180大體上可包含容器210、一或更多個盤208(圖中顯示四個盤)、入口230與出口232。 Referring to FIG. 2, apparatus 180 for sublimating solid state precursors can generally include a container 210, one or more trays 208 (four trays are shown), an inlet 230 and an outlet 232.

容器210大體上包含主體206、蓋226與可移除底部228,底部228設以在底部228耦接到主體206時能密封容器210。在一些實施例中,蓋226可包括入口230與出口232,其中入口230用以提供氣體到容器210,出口232用以容許氣體形式的固態前驅物能流出容器210。在一些實施例中,入口230與出口232的各者可包括或可耦接到溫度控制機構246、248(例如,加熱器),以控制流經入口230與出口232的各者的氣體的溫度。在一些實施例中,壓力計(例如,247、249)可耦接到入口230與出口232的各者,以容許容器210內的壓力能被監控。藉由監控容器210內的壓力,容器210內的前驅物的量亦可被監控。容器210可由不會和待昇華的前驅物(例如,以下所討論的前驅物)反應的任何材料製成。例如,在一些實施例中,容器210可由石英或不銹鋼製成。 The container 210 generally includes a body 206, a lid 226 and a removable bottom 228 that is configured to seal the container 210 when the bottom 228 is coupled to the body 206. In some embodiments, the cover 226 can include an inlet 230 for providing gas to the container 210 and an outlet 232 for allowing a solid precursor in gaseous form to flow out of the container 210. In some embodiments, each of inlet 230 and outlet 232 can include or can be coupled to temperature control mechanisms 246, 248 (eg, heaters) to control the temperature of the gas flowing through each of inlet 230 and outlet 232. . In some embodiments, a pressure gauge (eg, 247, 249) can be coupled to each of inlet 230 and outlet 232 to allow pressure within vessel 210 to be monitored. By monitoring the pressure within the container 210, the amount of precursor within the container 210 can also be monitored. Container 210 may be made of any material that does not react with the precursor to be sublimed (e.g., the precursors discussed below). For example, in some embodiments, the container 210 can be made of quartz or stainless steel.

該一或更多個盤208可從容器210的底部231插入到容器210內。藉由以此方式來設置該一或更多個盤,本案發明人已經觀察到的是該一或更多個盤208可容易地且迅速地被提供到用以昇華固態前驅物的設備180與從設備180被移除,藉此提供相較於傳統前驅物昇華系統更容易且更有效率的用以提供固態前驅物到固態前驅物昇華系統180的機構。 The one or more discs 208 can be inserted into the container 210 from the bottom 231 of the container 210. By arranging the one or more discs in this manner, the inventors have observed that the one or more discs 208 can be easily and quickly provided to the device 180 for sublimating the solid precursor. The device 180 is removed, thereby providing a mechanism for providing solid precursors to the solid precursor sublimation system 180 that is easier and more efficient than conventional precursor sublimation systems.

儘管圖中顯示四個盤208,可提供所需要用來執行期望昇華製程的任何數量的盤208。例如,在一些實施例中,可提供少於四個(諸如一個、兩個或三個)盤208。替代地,在一些實施例中,可提供超過四個盤208。 Although four disks 208 are shown in the figures, any number of disks 208 needed to perform the desired sublimation process can be provided. For example, in some embodiments, fewer than four (such as one, two, or three) disks 208 may be provided. Alternatively, in some embodiments, more than four disks 208 may be provided.

各個盤208大體上包含具有穿孔243的氣體可滲透 基底242、環繞氣體可滲透基底242的外緣219而設置的外環222(或外壁)與設置在穿孔243內的內環240(或內壁)。外環222與內環240可由不會和所使用待昇華的特定前驅物(例如,以下所討論的前驅物)反應的任何材料製成。例如,在一些實施例中,外環222與內環240可由石英或不銹鋼製成。在一些實施例中,外環222與內環240可和容器210的蓋226形成界面,以在盤208與蓋226之間提供氣密密封,而促進氣體(例如,昇華的前驅物)朝向出口232的流動。替代地或組合地,在一些實施例(例如用以昇華固態前驅物的設備180包含複數個彼此堆疊其上在容器210內的盤208(例如,如第2圖所示))中,外環222與內環240的各者可和直接設置在盤208上的另一盤的外環222與內環240形成界面。例如,在一些實施例(諸如,如第3圖所示)中,外環222與內環240可各包含基底部分(例如,基底部分302、306),該基底部分具有從相應的基底部分突出的向外延伸片304、308。向外延伸片304、308可設以和被形成在另一盤的基底部分的底部中的相應凹穴(例如,凹穴310、312)形成界面,該另一盤係設置以當該等盤208彼此堆疊其上時促進該等盤208之間的氣密密封。 Each disk 208 generally includes a gas permeable with perforations 243 The substrate 242, an outer ring 222 (or outer wall) disposed around the outer edge 219 of the gas permeable substrate 242, and an inner ring 240 (or inner wall) disposed within the perforations 243. Outer ring 222 and inner ring 240 may be made of any material that does not react with the particular precursor used to sublimate (e.g., the precursors discussed below). For example, in some embodiments, outer ring 222 and inner ring 240 can be made of quartz or stainless steel. In some embodiments, outer ring 222 and inner ring 240 may interface with cover 226 of container 210 to provide a hermetic seal between disk 208 and cover 226, while promoting gas (eg, sublimated precursor) toward the outlet The flow of 232. Alternatively or in combination, in some embodiments (eg, device 180 for sublimating solid state precursors includes a plurality of disks 208 stacked on one another in container 210 (eg, as shown in FIG. 2), outer ring Each of the 222 and inner ring 240 can form an interface with the outer ring 222 of the other disk disposed directly on the disk 208 and the inner ring 240. For example, in some embodiments (such as shown in FIG. 3), outer ring 222 and inner ring 240 can each comprise a base portion (eg, base portion 302, 306) having a protrusion from a respective base portion Outwardly extending sheets 304, 308. The outwardly extending sheets 304, 308 can be configured to form an interface with respective pockets (e.g., pockets 310, 312) formed in the bottom portion of the base portion of the other tray, the other tray being configured to serve the trays The hermetic sealing between the disks 208 is facilitated when 208 are stacked on one another.

本案發明人已經觀察到的是,由於不佳的熱耦合,被外部熱源加熱的傳統前驅物安瓿通常呈現緩慢的溫度響應時間。因此且返回參照第2圖,在一些實施例中,溫度控制單元224可設置在由內環240所形成的環室241內,以促進控制容器210內及/或設置在容器210內的各個盤208內的溫 度。藉由控制來自容器內(亦即,在環室241內,如此圖所示)的溫度,本案發明人已經觀察到的是可相較於傳統上加熱前驅物安瓿的方法改善溫度響應時間,藉此相較於彼等傳統方法提供改善的溫度控制。 The inventors of the present invention have observed that conventional precursor ampoules heated by external heat sources typically exhibit slow temperature response times due to poor thermal coupling. Thus, and referring back to FIG. 2, in some embodiments, temperature control unit 224 can be disposed within annular chamber 241 formed by inner ring 240 to facilitate control of various trays within container 210 and/or disposed within container 210. Temperature within 208 degree. By controlling the temperature from within the container (i.e., within the ring chamber 241, as shown), the inventors have observed that the temperature response time can be improved compared to conventional methods of heating precursor ampoules. This provides improved temperature control compared to their conventional methods.

溫度控制單元224可包含適於控制容器210內的溫度的任何機構。例如,在一些實施例中,溫度控制單元224可包含主動溫度控制系統,例如加熱器(諸如電阻式加熱器)。替代地或組合地,在一些實施例中,溫度控制單元224可包含被動溫度控制系統,例如一系列導管,該系列導管設以容許溫度控制流體能流經溫度控制單元224。 Temperature control unit 224 can include any mechanism suitable for controlling the temperature within container 210. For example, in some embodiments, temperature control unit 224 can include an active temperature control system, such as a heater (such as a resistive heater). Alternatively or in combination, in some embodiments, temperature control unit 224 can include a passive temperature control system, such as a series of conduits that are configured to allow temperature control fluid to flow through temperature control unit 224.

氣體源117經由入口230提供該一或更多種氣體(例如,以上所討論的一或更多種氣體)到環室241,並流動到該一或更多個盤208的最底部盤(例如,盤215)下方的區域213。例如,在一些實施例中,輸入通道可通過盤的基底的中央開口。輸入通道可至少部分地由盤208的內壁或內環來界定,以提供該一或更多種氣體到盤下方的區域。在一些實施例中,氣體岐管212可設置在區域213內而位在最底部盤215下方且耦接到環室,以提供均勻的氣體分佈到該一或更多個盤208。氣體岐管212可由不會和氣體源所提供的氣體反應的任何材料(諸如石英或不銹鋼)製成。 Gas source 117 provides the one or more gases (eg, one or more gases discussed above) to ring chamber 241 via inlet 230 and to the bottommost disk of the one or more disks 208 (eg, The area 213 below the disk 215). For example, in some embodiments, the input channel can pass through a central opening of the base of the disk. The input channel can be at least partially defined by an inner wall or inner ring of the disk 208 to provide the one or more gases to the area below the disk. In some embodiments, a gas manifold 212 can be disposed within region 213 below the bottommost disk 215 and coupled to the annulus to provide a uniform gas distribution to the one or more disks 208. The gas manifold 212 can be made of any material that does not react with the gas provided by the gas source, such as quartz or stainless steel.

氣體可滲透基底242支撐固態前驅物且容許昇華的固態前驅物能通過。氣體可滲透基底242可包含適於容許氣體(例如,昇華的前驅物)能流經氣體可滲透基底242的任何材料。例如,在一些實施例中,氣體可滲透基底242可包含塊 料(frit),例如石英塊料或不銹鋼塊料。在該等實施例中,塊料可包含適於容許昇華的前驅物流經塊料並同時實質上避免更大顆粒的固態前驅物流經氣體可滲透基底242的任何細孔尺寸。例如,在一些實施例中,塊料可包含約25至約150微米或在一些實施例中為約100微米的細孔尺寸。 The gas permeable substrate 242 supports the solid precursor and allows the sublimated solid precursor to pass. The gas permeable substrate 242 can comprise any material suitable for allowing a gas (eg, a sublimated precursor) to flow through the gas permeable substrate 242. For example, in some embodiments, the gas permeable substrate 242 can comprise a block Frit, such as quartz block or stainless steel block. In such embodiments, the block may comprise any pore size suitable for allowing the sublimated precursor stream to pass through the block while substantially avoiding the larger particle solid precursor stream passing through the gas permeable substrate 242. For example, in some embodiments, the block may comprise a pore size of from about 25 to about 150 microns or, in some embodiments, about 100 microns.

在一些實施例中,藉由改變各個盤208的氣體可滲透基底242的細孔尺寸,可控制各個盤208內的壓力,藉此容許各個盤208內的固態前驅物的昇華速率能被控制。例如,當盤208的氣體可滲透基底242的細孔尺寸減小時,盤內的壓力會增加且盤內的前驅物的反應速率會降低。 In some embodiments, by varying the pore size of the gas permeable substrate 242 of each disk 208, the pressure within each disk 208 can be controlled, thereby allowing the rate of sublimation of the solid precursor within each disk 208 to be controlled. For example, as the pore size of the gas permeable substrate 242 of the disk 208 decreases, the pressure within the disk increases and the rate of reaction of the precursor within the disk decreases.

本案發明人已經觀察到的是在使用多個平台(例如,擱架)的傳統前驅物昇華系統中,第一平台中的固態前驅物以比後面平台更高的速率從第一平台被消耗。由於此固態前驅物消耗速率與固態前驅物填料隨著時間改變的不同性,在較後面平台中的固態前驅物需要被衝擊以為了安放材料且回復昇華速率,因而使得製程沒有效率。因此,本案發明人已經觀察到的是藉由建立橫越盤208的壓力梯度(例如,藉由改變各個盤208的氣體可滲透基底242的細孔尺寸),其中該等盤208的最下方盤具有最高的壓力且該等盤208的最上方盤具有最低的壓力,各個盤208中的固態前驅物的消耗速率可以更均勻,藉此提供更一致的橫越所有的盤的昇華速率且容許在再填充與更換盤208之前最大的固態前驅物利用率,因而改善昇華製程的製程一致性且增加昇華製程的效率。 The inventors of the present invention have observed that in a conventional precursor sublimation system using multiple platforms (e.g., shelves), the solid precursor in the first platform is consumed from the first platform at a higher rate than the later platform. Due to the difference in the rate of consumption of this solid precursor with the change in solid precursor filler over time, the solid precursor in the later stage needs to be impacted in order to place the material and restore the sublimation rate, thus rendering the process inefficient. Accordingly, the inventors of the present invention have observed that by establishing a pressure gradient across the disk 208 (e.g., by varying the pore size of the gas permeable substrate 242 of each disk 208), wherein the lowermost disk of the disk 208 With the highest pressure and the lowest disc of the disc 208 having the lowest pressure, the rate of consumption of the solid precursor in each disc 208 can be more uniform, thereby providing a more consistent sublimation rate across all of the discs and allowing The maximum solid precursor utilization rate before refilling and replacing the disk 208 improves the process consistency of the sublimation process and increases the efficiency of the sublimation process.

在一些實施例中,覆蓋塊(圖中在元件符號245處以 虛線圖示)可設置在氣體可滲透基底242上。覆蓋塊245可由和以上所討論的氣體可滲透基底242相同的材料製成,或在一些實施例中可由和以上所討論的氣體可滲透基底242不同的材料製成。此外,覆蓋塊245可包含適於容許昇華的前驅物流經覆蓋塊245的任何細孔尺寸(例如,在以上涉及氣體可滲透基底242所討論的細孔尺寸範圍內)。當存在時,固態前驅物可設置在氣體可滲透基底242與覆蓋塊245之間,藉此容許盤208在使用前能被“預裝填”或被裝載有前驅物。在一些實施例中,預填充的盤可氣密地被密封住,以減少前驅物對容器210外面的大氣的暴露,藉此增加前驅物的穩定性且減少前驅物的分解。在該等實施例中,在盤的使用之前,可破壞氣密密封(例如,可拆開盤)。 In some embodiments, the overlay block (at the symbol 245 in the figure) The dashed line illustration can be disposed on the gas permeable substrate 242. The cover block 245 can be made of the same material as the gas permeable substrate 242 discussed above, or in some embodiments can be made of a different material than the gas permeable substrate 242 discussed above. In addition, the cover block 245 can include any pore size suitable for permitting sublimation of the precursor stream through the cover block 245 (eg, within the pore size range discussed above with respect to the gas permeable substrate 242). When present, a solid precursor can be disposed between the gas permeable substrate 242 and the cover block 245, thereby allowing the disk 208 to be "prefilled" or loaded with a precursor prior to use. In some embodiments, the pre-filled disk can be hermetically sealed to reduce exposure of the precursor to the atmosphere outside of the container 210, thereby increasing the stability of the precursor and reducing decomposition of the precursor. In such embodiments, the hermetic seal (e.g., the detachable disc) may be destroyed prior to use of the disc.

在一些實施例中,壓力監控器(壓力監控器220、221、223、225、227)可耦接到該一或更多個盤208的各者,以監控平台間壓力(在該一或更多個盤208的各者內的壓力)。藉由監控在該一或更多個盤208的各者處的壓力,可監控設置在該一或更多個盤208的各者上的前驅物的量。 In some embodiments, a pressure monitor (pressure monitor 220, 221, 223, 225, 227) can be coupled to each of the one or more disks 208 to monitor inter-platform pressure (at the one or more The pressure within each of the plurality of disks 208). The amount of precursor disposed on each of the one or more disks 208 can be monitored by monitoring the pressure at each of the one or more disks 208.

在一些實施例中,殼202可環繞容器210的外表面234而設置。殼202大體上包含主體206、底部216與可選的頂部(圖中在元件符號236處以虛線圖示)。在一些實施例中,密封物218可設置在底部216與主體206之間及/或在頂部236與主體206之間,以提供殼202的構件之間的真空密封。密封物218可以是任何類型的密封物,例如由例如抗高溫聚合物(諸如聚四氟乙烯(PTFE))製成的O-環。 In some embodiments, the shell 202 can be disposed around the outer surface 234 of the container 210. The housing 202 generally includes a body 206, a bottom 216, and an optional top (illustrated in phantom at symbol 236 in the figure). In some embodiments, the seal 218 can be disposed between the bottom 216 and the body 206 and/or between the top 236 and the body 206 to provide a vacuum seal between the components of the shell 202. Seal 218 can be any type of seal, such as an O-ring made of, for example, a high temperature resistant polymer such as polytetrafluoroethylene (PTFE).

當存在時,殼202可藉由在使用期間增加或降低到或從容器210的熱傳速率而促進提升的對於容器溫度的控制。例如,在一些實施例中,殼202可包含絕緣材料,以減少從容器210的熱損失,因此容許容器210能被維持在較高的溫度且同時不需要額外的加熱。替代地或組合地,殼202可提供容器210的主動加熱或冷卻。例如,在一些實施例中,殼202可包括一或更多個導管,該一或更多個導管設置在殼內且設以容許熱傳流體能流經殼202。替代地或組合地,在一些實施例中,殼202可包含一或更多個內嵌加熱器(諸如電阻式加熱器或諸如此類者)。在一些實施例中,外部熱源(諸如IR燈)可設置在殼202的外面以提供熱能給殼202。在一些實施例中,內襯204可設置在殼202與容器210之間。內襯204可由適於提供期望量的熱傳的任何材料(例如石英)製成。 When present, the shell 202 can promote elevated control of the temperature of the container by increasing or decreasing the rate of heat transfer to or from the container 210 during use. For example, in some embodiments, the shell 202 can comprise an insulating material to reduce heat loss from the container 210, thus allowing the container 210 to be maintained at a higher temperature without the need for additional heating. Alternatively or in combination, the shell 202 can provide active heating or cooling of the container 210. For example, in some embodiments, the shell 202 can include one or more conduits disposed within the housing and configured to allow heat transfer fluid to flow through the shell 202. Alternatively or in combination, in some embodiments, the shell 202 can include one or more inline heaters (such as resistive heaters or the like). In some embodiments, an external heat source, such as an IR lamp, can be disposed outside of the shell 202 to provide thermal energy to the shell 202. In some embodiments, the liner 204 can be disposed between the shell 202 and the container 210. The liner 204 can be made of any material (e.g., quartz) suitable for providing a desired amount of heat transfer.

在用以昇華固態前驅物的設備180的準備時,該一或更多個盤208先被裝載有固態前驅物(諸如粉末狀、丸狀或燒結的固態前驅物)。該等盤208接著被堆疊在底板228上且被連扣在一起(例如,經由匹配如上所述的片304、308與凹穴310、312的特徵)。該等盤208與底板228可接著被安裝到容器210的主體206內。容器210可接著可選地被惰性氣體(例如,氦(He)、氬(Ar)、氙(Xe)或諸如此類者)淨化與加壓。當被加壓時,可利用嗅聞程序來決定是否容器210為氣密的。容器內的壓力降接著被記錄在容器310內,以提供基準壓力而之後決定固態前驅物的消耗。用以昇華固態前驅物的設備180接著被安裝到處理系統中(例如,如上所述耦接到製程腔室 100)。製程參數(例如,所需要用於昇華的製程氣體、壓力與溫度,或諸如此類者)接著被決定且進入到控制器(例如,如上所述的控制器140)。昇華製程的起初製程狀況可開始。 Upon preparation of the apparatus 180 for sublimating the solid precursor, the one or more discs 208 are first loaded with a solid precursor (such as a powdered, pelletized or sintered solid precursor). The disks 208 are then stacked on the bottom plate 228 and snapped together (e.g., via matching the features of the sheets 304, 308 and the pockets 310, 312 as described above). The tray 208 and bottom plate 228 can then be mounted into the body 206 of the container 210. The vessel 210 can then optionally be purged and pressurized with an inert gas such as helium (He), argon (Ar), xenon (Xe), or the like. When pressurized, an odorizing program can be utilized to determine if the container 210 is airtight. The pressure drop within the vessel is then recorded in vessel 310 to provide a baseline pressure followed by a determination of the consumption of solid precursor. Apparatus 180 for sublimating the solid state precursor is then installed into the processing system (eg, coupled to the process chamber as described above) 100). Process parameters (eg, process gases, pressures and temperatures required for sublimation, or the like) are then determined and entered into a controller (eg, controller 140 as described above). The initial process conditions of the sublimation process can begin.

在用以昇華固態前驅物的設備180的運作時,氣體源117提供的一或更多種製程氣體被提供到由該一或更多個盤208的內環240所形成的環室241。該一或更多種製程氣體在環室241中向下流動到該一或更多個盤208的最底部盤(例如,盤215)下方的區域213且被散佈到最底部盤。氣體岐管212提供該一或更多種氣體的均勻分佈到底部盤。該一或更多種製程氣體接著通過氣體可滲透基底242且在容器中向上通過該一或更多個盤208的各者而和昇華的前驅物反應或承載昇華的前驅物(其中昇華可藉由在各個盤208處的和該一或更多種製程氣體的一或更多個反應、溫度或壓力來控制)。昇華的前驅物接著流動到出口232且被提供到製程腔室100。 At operation of the apparatus 180 for sublimating the solid precursor, one or more process gases provided by the gas source 117 are provided to the annulus 241 formed by the inner ring 240 of the one or more discs 208. The one or more process gases flow down the ring chamber 241 to a region 213 below the bottommost disk (eg, disk 215) of the one or more disks 208 and are spread to the bottommost disk. Gas manifold 212 provides a uniform distribution of the one or more gases to the bottom tray. The one or more process gases then pass through the gas permeable substrate 242 and pass up through the one or more disks 208 in the vessel to react with the sublimated precursor or carry the sublimated precursor (where the sublimation can be borrowed Controlled by one or more reactions, temperatures or pressures at the various disks 208 and the one or more process gases). The sublimated precursor then flows to the outlet 232 and is provided to the process chamber 100.

在如上所述的用以昇華固態前驅物的設備180的示範性應用中,在一些實施例中,用以昇華固態前驅物的設備180可用以提供錫(Sn)前驅物到製程腔室。本案發明人已經觀察到的是錫(Sn)在特定沉積製程中(諸如在鍺(Ge)系磊晶或原子層沉積(ALD)製程中)可被用作為應力物(stressor)。然而,超高純度的前驅物不是可輕易取得的。又,預先製備的錫的氫化物(例如,錫烷(SnH4))是不穩定的,並且有機錫化合物含有不容許的大量的碳。因此,在一些實施例中,用以昇華固態前驅物的設備180可被用作為使用點(point of use)前驅物源以提供錫(Sn)前驅物,包括高純度的前驅物。例如,在該等實 施例中,固態錫(Sn)前驅物可被提供到盤208,並且包含氯化氫氣體(HCl)、氯(Cl2)、重氫(D)或氫(H2)的一或更多者的製程氣體可被提供到容器210。接著,可根據以下方程式產生錫前驅物:(1)Sn(s)+2HCl(G) → SnCl2+H2(G) In an exemplary application of apparatus 180 for sublimating solid state precursors as described above, in some embodiments, apparatus 180 for sublimating solid state precursors can be used to provide tin (Sn) precursors to the process chamber. The inventors of the present invention have observed that tin (Sn) can be used as a stressor in a particular deposition process, such as in a germanium (Ge) epitaxial or atomic layer deposition (ALD) process. However, ultra-high purity precursors are not readily available. Further, the previously prepared tin hydride (for example, stannous (SnH 4 )) is unstable, and the organotin compound contains a large amount of carbon which is not allowed. Thus, in some embodiments, apparatus 180 for sublimating solid state precursors can be used as a point of use precursor source to provide tin (Sn) precursors, including high purity precursors. For example, in such embodiments, a solid tin (Sn) precursor can be provided to disk 208 and include one of hydrogen chloride gas (HCl), chlorine (Cl 2 ), heavy hydrogen (D), or hydrogen (H 2 ). Process gases of more or more may be provided to the vessel 210. Next, a tin precursor can be generated according to the following equation: (1) Sn(s) + 2HCl(G) → SnCl 2 + H 2 (G)

(2)Sn(s)+2Cl2(G) → SnCl4(G) (2) Sn(s)+2Cl 2 (G) → SnCl 4 (G)

(3)Sn(s)+2H2(G) → SnH4(G) (3) Sn(s)+2H 2 (G) → SnH 4 (G)

(4)Sn(s)+2D(G) → SnD4(G) (4) Sn(s)+2D(G) → SnD 4 (G)

在如上所述的用以昇華固態前驅物的設備180的另一示範性應用中,在一些實施例中,用以昇華固態前驅物的設備180可被利用以提供一系列的用於多步驟反應的轉換。在該等實施例中,用以昇華固態前驅物的設備180的各個盤208可用以執行多步驟反應的一個步驟,或在一些實施例中,用以昇華固態前驅物的單一設備180可用以執行多步驟反應的一個步驟。示範性多步驟反應可包括產生前驅物的第一步驟、轉換前驅物的第二步驟與純化前驅物的第三步驟。例如,在一些實施例中,用以昇華固態前驅物的設備180可用以使用鋰鋁水合物(LiAlH4)而產生錫前驅物(例如,SnH4)。 In another exemplary application of apparatus 180 for sublimating solid state precursors as described above, in some embodiments, apparatus 180 for sublimating solid state precursors can be utilized to provide a series of steps for multi-step reactions. Conversion. In such embodiments, the various disks 208 of the device 180 for sublimating the solid precursor may be used to perform one step of the multi-step reaction, or in some embodiments, a single device 180 for sublimating the solid precursor may be used to perform A step in a multi-step reaction. An exemplary multi-step reaction can include a first step of producing a precursor, a second step of converting the precursor, and a third step of purifying the precursor. For example, in some embodiments, the device 180 for sublimation of solid precursor used to lithium aluminum hydrate (LiAlH 4) to produce a tin precursor (e.g., SnH 4).

在該等實施例中,固態錫(Sn)前驅物可被提供到該一或更多個盤208的第一盤,鋰鋁水合物(LiAlH4)可被提供到該一或更多個盤208的第二盤,並且第三盤可作為冷盤以捕獲不希望的固體。接著,可根據以下方程式/步驟產生錫前驅物:(1)Sn(s)+2Cl2(g) → SnCl4(G) In such embodiments, the solid tin (Sn) precursor may be provided to the one or more first disk plate 208, lithium aluminum hydrate (LiAlH 4) may be provided to the one or more disks The second disk of 208, and the third disk can serve as a cold disk to capture undesirable solids. Next, a tin precursor can be produced according to the following equation/step: (1) Sn(s)+2Cl 2 (g) → SnCl 4 (G)

(2)SnCl4(G)+LiAlH4(s) → SnH4(G)+LiCl(S)+AlCl3(s) (2) SnCl 4 (G) + LiAlH 4 (s) → SnH 4 (G) + LiCl (S) + AlCl 3 (s)

(3)固體AlCl3(s)被捕獲在最頂部盤中 (3) Solid AlCl 3 (s) is captured in the topmost plate

因此,在此已經提供用以昇華固態前驅物的設備。在一些實施例中,本發明設備可有利地提供容易裝設到設備且從設備移除的一或更多個固態前驅物支撐盤,藉此提供相較於傳統前驅物昇華系統更容易與更有效率的用以提供固態前驅物到固態前驅物昇華系統的機構。本發明設備可更有利地提供使用點(a point of use)前驅物產生,藉此降低前驅物凝結、改變狀態或和散佈系統反應的風險。本發明設備可更有利地提供在設備內的壓力梯度以促進更均勻的固態前驅物的昇華,藉此提供改善的製程一致性與材料應用性。 Accordingly, apparatus for sublimating solid state precursors has been provided herein. In some embodiments, the apparatus of the present invention may advantageously provide one or more solid precursor support trays that are easily attached to and removed from the apparatus, thereby providing easier and more conventional switching sublimation systems than conventional apparatus. An efficient mechanism for providing solid precursors to solid state precursor sublimation systems. The apparatus of the present invention may more advantageously provide a point of use for precursor generation, thereby reducing the risk of precursor condensation, changing state, or dispersing system reactions. The apparatus of the present invention may more advantageously provide a pressure gradient within the apparatus to promote sublimation of a more uniform solid precursor, thereby providing improved process consistency and material applicability.

儘管上述說明針對本發明的實施例,但可在不悖離本發明的基本範疇下設想出本發明的其他與進一步的實施例。 While the above description is directed to embodiments of the present invention, other and further embodiments of the invention may be devised without departing from the scope of the invention.

100‧‧‧製程腔室 100‧‧‧Processing chamber

117‧‧‧氣體源 117‧‧‧ gas source

180‧‧‧設備 180‧‧‧ Equipment

202‧‧‧殼 202‧‧‧ shell

204‧‧‧內襯 204‧‧‧ lining

206‧‧‧主體 206‧‧‧ Subject

208‧‧‧盤 208‧‧‧

210‧‧‧容器 210‧‧‧ Container

212‧‧‧氣體岐管 212‧‧‧ gas tube

213‧‧‧區域 213‧‧‧Area

215‧‧‧最底部盤 215‧‧‧ bottom plate

216‧‧‧底部 216‧‧‧ bottom

218‧‧‧密封物 218‧‧‧ Seals

219‧‧‧外緣 219‧‧‧ outer edge

220、221、223、225、227‧‧‧壓力監控器 220, 221, 223, 225, 227‧ ‧ pressure monitors

222‧‧‧外環(外壁) 222‧‧‧outer ring (outer wall)

224‧‧‧溫度控制單元 224‧‧‧ Temperature Control Unit

226‧‧‧蓋 226‧‧‧ Cover

228‧‧‧底部 228‧‧‧ bottom

230‧‧‧入口 230‧‧‧ entrance

231‧‧‧底部 231‧‧‧ bottom

232‧‧‧出口 232‧‧‧Export

234‧‧‧外表面 234‧‧‧ outer surface

236‧‧‧頂部 236‧‧‧ top

240‧‧‧內環(或內壁) 240‧‧‧ Inner ring (or inner wall)

241‧‧‧環室 241‧‧‧Circle Room

242‧‧‧氣體可滲透基底 242‧‧‧ Gas permeable substrate

243‧‧‧穿孔 243‧‧‧Perforation

245‧‧‧覆蓋塊 245‧‧‧Overlay block

246‧‧‧溫度控制機構 246‧‧‧ Temperature Control Mechanism

247‧‧‧壓力計 247‧‧‧ pressure gauge

248‧‧‧溫度控制機構 248‧‧‧ Temperature Control Mechanism

249‧‧‧壓力計 249‧‧‧ pressure gauge

Claims (20)

一種用以昇華固態前驅物的設備,包含:一容器,該容器具有一主體、一蓋與一可移除底部,其中該可移除底部可密封到該主體以在該可移除底部耦接到該主體時能密封該容器;一盤,該盤可從該容器的一底部插入到該容器內,該盤包含:一氣體可滲透基底,該氣體可滲透基底用以支撐一固態前驅物,該氣體可滲透基底具有一穿孔,該穿孔設置成靠近該氣體可滲透基底的中央;一外環,該外環係環繞該基底的一外緣而設置且從該基底向上延伸,該外環設以和該容器的該蓋形成界面;及一內環,該內環設置在該穿孔內,該內環設以和該容器的該蓋形成界面;一入口,該入口設置成通過該容器的該蓋,該入口設以經由該盤的該內環提供一氣體到該盤下方的一區域;及一出口,該出口設置成通過該容器的該蓋,以容許氣體形式的該固態前驅物能流出該容器。 An apparatus for sublimating a solid state precursor, comprising: a container having a body, a cover and a removable bottom, wherein the removable bottom is sealable to the body to be coupled at the removable bottom The container can be sealed to the body; a tray can be inserted into the container from a bottom of the container, the tray comprising: a gas permeable substrate for supporting a solid precursor, The gas permeable substrate has a perforation disposed adjacent the center of the gas permeable substrate; an outer ring disposed around an outer edge of the substrate and extending upwardly from the substrate, the outer ring Forming an interface with the lid of the container; and an inner ring disposed within the perforation, the inner ring being configured to form an interface with the lid of the container; an inlet disposed to pass the container a cover, the inlet being provided with a gas passing through the inner ring of the disk to an area below the disk; and an outlet disposed through the cover of the container to allow the solid precursor in the form of gas to flow out The capacity . 如請求項1所述之設備,其中該盤包含複數個彼此堆疊其上的盤,及其中該複數個盤的各個盤的外環設以和直接設置在該盤上的另一盤的外環或和該容器的該蓋形 成界面,並且該複數個盤的各個盤的內環設以和直接設置在該盤上的另一盤的內環或和該容器的該蓋形成界面,及其中該盤下方的該區域是位在該複數個盤的一最底部盤下方的一區域。 The device of claim 1, wherein the disk comprises a plurality of disks stacked on each other, and an outer ring of each of the plurality of disks and an outer ring of another disk directly disposed on the disk Or with the lid of the container Forming an interface, and an inner ring of each of the plurality of disks is disposed to form an interface with an inner ring of another disk disposed directly on the disk or with the cover of the container, and wherein the area under the disk is a bit An area below a bottommost tray of the plurality of disks. 如請求項2所述之設備,其中該外環與該內環的各者包含一向外延伸片,該向外延伸片設以和被形成在直接設置在該盤上的另一盤的外環與內環的各者中或被形成在該容器的該蓋中的一凹穴形成界面。 The device of claim 2, wherein each of the outer ring and the inner ring includes an outwardly extending piece, and the outwardly extending piece is formed with an outer ring formed on another disk disposed directly on the disk. An interface is formed with each of the inner rings or a pocket formed in the lid of the container. 如請求項1至3中任一項所述之設備,更包含:一溫度控制單元,該溫度控制單元設置成通過該盤的該內環以控制該容器內的一溫度。 The apparatus of any one of claims 1 to 3, further comprising: a temperature control unit configured to pass the inner ring of the disk to control a temperature within the container. 如請求項4所述之設備,其中該溫度控制單元包含一加熱器或複數個導管的至少一者,該等導管設以容許一熱傳流體在該溫度控制單元內流動。 The apparatus of claim 4, wherein the temperature control unit comprises at least one of a heater or a plurality of conduits configured to allow a heat transfer fluid to flow within the temperature control unit. 如請求項1至3中任一項所述之設備,其中該容器由不銹鋼、一鎳鉻合金或石英製成。 The apparatus of any one of claims 1 to 3, wherein the container is made of stainless steel, a nichrome or quartz. 如請求項1至3中任一項所述之設備,更包含一殼,該殼係環繞該容器而設置。 The apparatus of any one of claims 1 to 3, further comprising a casing disposed around the container. 如請求項7所述之設備,其中該殼可包含一絕緣材料、一加熱器或複數個設以容許一熱傳流體在該殼內流動的導管的至少一者,以藉由在使用期間增加或減少來自該容器的一熱傳而控制該容器的一溫度。 The apparatus of claim 7, wherein the shell comprises an insulating material, a heater or a plurality of conduits configured to allow a heat transfer fluid to flow within the shell to be increased during use Or reducing a heat transfer from the container to control a temperature of the container. 如請求項7所述之設備,更包含一內襯,該內襯設置在該殼與該容器的一外表面之間。 The apparatus of claim 7 further comprising an inner liner disposed between the outer casing and an outer surface of the container. 如請求項9所述之設備,其中該內襯由石英製成。 The apparatus of claim 9, wherein the inner liner is made of quartz. 如請求項1至3中任一項所述之設備,其中該氣體可滲透基底包含一直徑為約25至150微米的細孔。 The apparatus of any one of claims 1 to 3, wherein the gas permeable substrate comprises pores having a diameter of from about 25 to 150 microns. 如請求項11所述之設備,其中該氣體可滲透基底包含一石英塊料或不銹鋼塊料。 The apparatus of claim 11, wherein the gas permeable substrate comprises a quartz block or a stainless steel block. 如請求項1至3中任一項所述之設備,其中該內環與該外環由不銹鋼或石英製成。 The apparatus of any one of claims 1 to 3, wherein the inner ring and the outer ring are made of stainless steel or quartz. 如請求項1至3中任一項所述之設備,更包含一壓力監控器,該壓力監控器耦接到各個盤以監控各個盤內的一氣體壓力。 The apparatus of any one of claims 1 to 3, further comprising a pressure monitor coupled to each of the disks to monitor a gas pressure within each of the disks. 如請求項1至3中任一項所述之設備,更包含一壓力監 控器,該壓力監控器耦接到該入口與該出口以監控該容器內的一壓力。 The device of any one of claims 1 to 3, further comprising a pressure monitor A controller that is coupled to the inlet and the outlet to monitor a pressure within the vessel. 如請求項1至3中任一項所述之設備,更包含一加熱器,該加熱器耦接到該入口與該出口以控制該入口與該出口內的一溫度。 The apparatus of any one of claims 1 to 3, further comprising a heater coupled to the inlet and the outlet to control a temperature in the inlet and the outlet. 如請求項1至3中任一項所述之設備,更包含一氣體岐管,該氣體岐管設置在該底部下方且耦接到該氣體導管的一末端,該氣體岐管設以接收該氣體與甚至散佈靠近該容器的該底部處的該氣體。 The apparatus of any one of claims 1 to 3, further comprising a gas manifold disposed below the bottom and coupled to an end of the gas conduit, the gas manifold being configured to receive the gas manifold The gas is even spread around the gas at the bottom of the vessel. 一種用以昇華固態前驅物的設備,包含:一容器,該容器具有一主體、一蓋與一可移除底部,該可移除底部可密封到該主體以在該可移除底部耦接到該主體時能密封該容器;一第一盤,該第一盤可從該容器的一底部插入到該容器內,該第一盤包含一氣體可滲透基底、一內壁與一外壁,其中該氣體可滲透基底用以支撐一固態前驅物且具有被形成通過該基底的一中央開口,該內壁係環繞該基底的該中央開口而設置,該外壁係環繞該基底的一外緣而設置,其中該內壁與該外壁和該容器的該蓋形成界面以在該第一盤與該蓋之間提供一氣密密封;一入口,該入口設置成通過該容器的該蓋且耦接到 一輸入通道以提供一氣體到該第一盤下方的一區域,其中該輸入通道通過該基底的該中央開口且至少部分地由該第一盤的該內壁來界定;及一出口,該出口設置成通過該容器的該蓋且位在大體上該第一盤的該內壁與該外壁之間的該第一盤的一區域上方的一區域中,以容許一氣體形式的該固態前驅物能流出該容器。 An apparatus for sublimating a solid precursor comprising: a container having a body, a cover and a removable bottom sealable to the body for coupling to the removable bottom The main body can seal the container; the first tray can be inserted into the container from a bottom of the container, the first tray comprises a gas permeable substrate, an inner wall and an outer wall, wherein the a gas permeable substrate for supporting a solid precursor and having a central opening formed through the substrate, the inner wall being disposed about the central opening of the substrate, the outer wall being disposed around an outer edge of the substrate, Wherein the inner wall forms an interface with the outer wall and the lid of the container to provide a hermetic seal between the first disc and the lid; an inlet disposed through the lid of the container and coupled to the lid An input channel to provide a gas to an area below the first disk, wherein the input channel passes through the central opening of the substrate and is at least partially defined by the inner wall of the first disk; and an outlet, the outlet Providing the cover through the container and positioned in a region generally above an area of the first disk between the inner wall and the outer wall of the first disk to permit the solid precursor in a gaseous form Can flow out of the container. 如請求項18所述之設備,更包含:至少一第二盤,該第二盤設置在該第一盤下方且具有一氣體可滲透基底、一內壁與一外壁,其中該第二盤的該氣體可滲透基底用以支撐一固態前驅物且具有被形成通過該第二盤的該基底的一中央開口,該第二盤的該內壁係環繞該第二盤的該基底的該中央開口而設置,該第二盤的該外壁係環繞該第二盤的該基底的一外緣而設置,其中該第二盤的該內壁與該外壁和該第一盤的該內壁與該外壁形成界面以在該第一盤與該第二盤之間提供一氣密密封,及其中該輸入通道更通過該第二盤的該基底的該中央開口,以致該氣體所被提供處的該第一盤下方的區域位在該第二盤下方。 The device of claim 18, further comprising: at least one second disk disposed under the first disk and having a gas permeable substrate, an inner wall and an outer wall, wherein the second disk The gas permeable substrate supports a solid precursor and has a central opening formed through the substrate of the second disk, the inner wall of the second disk surrounding the central opening of the substrate of the second disk Providing that the outer wall of the second disk is disposed around an outer edge of the base of the second disk, wherein the inner wall of the second disk and the outer wall and the inner wall and the outer wall of the first disk Forming an interface to provide a hermetic seal between the first disk and the second disk, and wherein the input channel passes through the central opening of the substrate of the second disk such that the first portion of the gas is provided The area below the disc is below the second disc. 如請求項18至19中任一項所述之設備,更包含:一溫度控制單元,該溫度控制單元設置在該容器內以控制該容器內的一溫度。 The apparatus of any one of claims 18 to 19, further comprising: a temperature control unit disposed in the container to control a temperature within the container.
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