TW201317380A - Target assembly and manufacturing method thereof - Google Patents

Target assembly and manufacturing method thereof Download PDF

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TW201317380A
TW201317380A TW101137640A TW101137640A TW201317380A TW 201317380 A TW201317380 A TW 201317380A TW 101137640 A TW101137640 A TW 101137640A TW 101137640 A TW101137640 A TW 101137640A TW 201317380 A TW201317380 A TW 201317380A
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powder
target
alloy
substrate
cuga
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TW101137640A
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Chinese (zh)
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TWI548764B (en
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Nobuhiro Harada
Hiroshi Matsumoto
Junichi Nitta
Yutaka Kadowaki
Yasuhiko Akamatsu
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Ulvac Inc
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F1/00Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
    • B22F1/09Mixtures of metallic powders
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C1/00Making non-ferrous alloys
    • C22C1/02Making non-ferrous alloys by melting
    • C22C1/03Making non-ferrous alloys by melting using master alloys
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C24/00Coating starting from inorganic powder
    • C23C24/02Coating starting from inorganic powder by application of pressure only
    • C23C24/04Impact or kinetic deposition of particles

Abstract

The present invention provides a target assembly and a manufacturing method thereof, in which an alloy target or a compound target can be stably manufactured by cold spray method. A method for manufacturing a target assembly relating to one embodiment of the present invention comprises manufacturing a mixture powder comprising a first powder consisting of a metal element, and a second powder consisting of an alloy or a compound containing the aforesaid metal element as an essential component; and then forming a target layer comprising the alloy or the compound of the metal element by using the mixture powder as a raw material, onto a substrate surface by cold spray method. Thereby, it is possible to stably manufacture the alloy target or the compound target by cold spray method.

Description

靶材組件及其製造方法 Target assembly and method of manufacturing same

本發明係關於具有藉由冷噴塗法所形成之靶材層的靶材組件及其製造方法。 The present invention relates to a target assembly having a target layer formed by a cold spray method and a method of manufacturing the same.

傳統上,Cu-Ga、Cu-Ga-In等Cu-Ga系靶材係使用於例如薄膜太陽電池的光吸收層之濺鍍成膜。做為此種合金靶材之製造方法,下述專利文獻1中提案將CuGa合金的熔融液藉由噴射成形法製作成Cu-Ga合金預製物,再將該預製物藉由熱等靜壓(HIP)法燒結為Cu-Ga合金濺鍍靶材。 Conventionally, a Cu-Ga-based target such as Cu-Ga or Cu-Ga-In is used for sputtering deposition of a light absorbing layer of, for example, a thin film solar cell. As a method of producing such an alloy target, Patent Document 1 below proposes that a melt of a CuGa alloy is formed into a Cu-Ga alloy preform by a spray molding method, and the preform is further subjected to hot isostatic pressing (HIP). The method is sintered to a Cu-Ga alloy sputtering target.

此外,亦已知使用熔射法之靶材的製造方法,例如下述專利文獻2中記載:以高溫、高速將Ti粉末與TiO2粉末噴塗於原料管上,來形成由Ti與TiO2之混合物所構成之靶材之方法。此外,在下述專利文獻3記載:以金屬粉末為原料,藉由冷噴塗法於基體上形成由金屬堆積膜所構成之靶材層之方法。 Further, a method of producing a target using a spray method is also known. For example, Patent Document 2 below discloses that Ti powder and TiO 2 powder are sprayed on a raw material tube at a high temperature and a high speed to form Ti and TiO 2 . A method of forming a target of a mixture. Further, Patent Document 3 listed below discloses a method of forming a target layer composed of a metal deposited film on a substrate by a cold spray method using a metal powder as a raw material.

〔先前技術文獻〕 [Previous Technical Literature]

[專利文獻] [Patent Literature]

專利文獻1 日本特開2010-265544號公報 Patent Document 1 Japanese Patent Laid-Open Publication No. 2010-265544

專利文獻2 日本特開2003-239067號公報 Patent Document 2 Japanese Patent Laid-Open Publication No. 2003-239067

專利文獻3 WO2008/081585號說明書 Patent Document 3 WO2008/081585

專利文獻1所記載之方法因係組合噴射成形法與熱等靜壓法來製作靶材,故步驟數多,讓生產性、生產成本增加變成問題。而如專利文獻2所記載之熔射法,無法避免 會伴隨著原料之熔解而增加氧濃度,難以製作高密度之靶材。而專利文獻3所記載之方法,因無法安定的堆積比金屬粉末還硬的合金粉末或者化合物粉末,而有難以製作合金靶材或者化合物靶材之問題。 In the method described in Patent Document 1, since the target is produced by a combination of an injection molding method and a hot isostatic pressing method, the number of steps is large, and productivity and production cost increase become a problem. However, the spray method described in Patent Document 2 cannot be avoided. The oxygen concentration is increased along with the melting of the raw material, making it difficult to produce a high-density target. Further, in the method described in Patent Document 3, since it is impossible to stably deposit an alloy powder or a compound powder which is harder than the metal powder, it is difficult to produce an alloy target or a compound target.

有鑒於以上情事,本發明之目的係提供能藉由冷噴塗法來安定製造合金靶材或者化合物靶材之靶材組件及其製造方法。 In view of the above, it is an object of the present invention to provide a target assembly capable of stably producing an alloy target or a compound target by a cold spray method and a method of manufacturing the same.

為了達成上述目的,本發明的形態之一的靶材組件之製造方法係包括:製作由金屬元素所構成之第1粉末、與由以上述金屬元素為主成分之合金或化合物所構成之第2粉末的混合粉末。 In order to achieve the above object, a method for producing a target assembly according to one aspect of the present invention includes: producing a first powder composed of a metal element and a second powder composed of an alloy or a compound containing the metal element as a main component; A mixed powder of powder.

以上述混合粉末為原料,藉由冷噴塗法於基體表面上形成由前述金屬元素之合金或化合物所構成之靶材層。 A target layer composed of an alloy or a compound of the foregoing metal element is formed on the surface of the substrate by a cold spray method using the above mixed powder as a raw material.

本發明的形態之一的靶材組件係具備基體與靶材層。 A target assembly according to one aspect of the present invention includes a substrate and a target layer.

上述靶材層係形成於上述基體之表面,在CuGa粒子與上述CuGa粒子間夾有Cu粒子。 The target layer is formed on the surface of the substrate, and Cu particles are interposed between the CuGa particles and the CuGa particles.

〔實施發明之形態〕 [Formation of the Invention]

本發明的實施形態之一的靶材組件之製造方法係包括:製作由金屬元素所構成之第1粉末、與由以上述金屬元素為主成分之合金或化合物所構成之第2粉末的混合粉末。 A method of producing a target assembly according to an embodiment of the present invention includes: producing a mixed powder of a first powder composed of a metal element and a second powder composed of an alloy or a compound containing the metal element as a main component; .

以上述混合粉末為原料,藉由冷噴塗法於基體表面上形成由前述金屬元素之合金或化合物所構成之靶材層。 A target layer composed of an alloy or a compound of the foregoing metal element is formed on the surface of the substrate by a cold spray method using the above mixed powder as a raw material.

上述第1粉末係以能適用冷噴塗法之軟質性金屬的粉 末所構成。另一方面,上述第2粉末,一般而言,因係比此等純金屬還硬,在僅以該第2粉末用冷噴塗法來成膜時會有很多困難。因此,上述製造方法中,將上述第1粉末與第2粉末之混合粉末用做為原料,藉由在基體表面與第2粉末之間,以及在第2粉末彼此之間都夾有第1粉末,可以形成合金材料或者化合物材料的堆積膜。因此,能藉由冷噴塗法安定的製造合金靶材或者化合物靶材。 The first powder is a powder of a soft metal which can be applied by a cold spray method. The end is composed. On the other hand, the second powder is generally harder than these pure metals, and there are many difficulties in forming the film by the cold spray method only for the second powder. Therefore, in the above production method, the mixed powder of the first powder and the second powder is used as a raw material, and the first powder is interposed between the surface of the substrate and the second powder, and between the second powder. It is possible to form a deposited film of an alloy material or a compound material. Therefore, the alloy target or the compound target can be produced by the cold spray method.

構成第1粉末之金屬元素能採用例如Cu(銅)、Al(鋁)、In(銦)、Sn(錫)、Ti(鈦)、Ni(鎳)、Co(鈷)、Cr(鉻)、Ta(鉭)、Mo(鉬)等可適用於冷噴塗法之各種軟質性金屬。構成第2粉末之合金或者化合物均未特別限定,化合物可舉出氧化物、氮化物、硼化物、矽化物、碳化物等。 The metal element constituting the first powder can be, for example, Cu (copper), Al (aluminum), In (indium), Sn (tin), Ti (titanium), Ni (nickel), Co (cobalt), or Cr (chromium). Ta (钽), Mo (molybdenum), etc. can be applied to various soft metals of the cold spray method. The alloy or the compound constituting the second powder is not particularly limited, and examples of the compound include oxides, nitrides, borides, tellurides, and carbides.

在實施形態之一中,第1粉末係使用Cu粉末,第2粉末係使用CuGa(銅-鎵合金)粉末。在此情形,能得到例如使用於薄膜太陽電池之光吸收層的成膜之CuGa系靶材層。 In one embodiment, Cu powder is used for the first powder, and CuGa (copper-gallium alloy) powder is used for the second powder. In this case, for example, a CuGa-based target layer formed on the light absorbing layer of the thin film solar cell can be obtained.

在形成上述CuGa系靶材層時,第1粉末對上述混合粉末之的混合比率可設為20原子%以上50原子%以下。因此,能安定的形成具有95%以上之相對密度、且含有30原子%以上60原子%以下的Ga之CuGa合金靶材層。 When the CuGa-based target layer is formed, the mixing ratio of the first powder to the mixed powder may be 20 atom% or more and 50 atom% or less. Therefore, a CuGa alloy target layer having a relative density of 95% or more and containing 30 atom% or more and 60 atom% or less of Ga can be stably formed.

用於形成上述靶材層之基體可為平板狀亦可為圓筒狀。在基體為圓筒狀時,靶材層係形成於基體的外周側表面。形成方法未特別限制,例如可藉由邊讓基體繞著其軸心旋轉,邊讓噴嘴在基體之軸方向移動,來在基體表面形成靶材層。 The substrate for forming the target layer may have a flat shape or a cylindrical shape. When the base body has a cylindrical shape, the target layer is formed on the outer peripheral side surface of the base body. The forming method is not particularly limited. For example, the target layer can be formed on the surface of the substrate by rotating the substrate about the axis of the substrate while moving the nozzle in the axial direction of the substrate.

以下邊參照圖式邊說明本發明之實施形態。 Embodiments of the present invention will be described below with reference to the drawings.

[靶材組件] [Target component]

圖1為顯示本發明的實施形態之一之靶材組件的結構之示意截面圖。本實施形態之靶材組件10係具有做為背管之基體11與靶材層12。 Fig. 1 is a schematic cross-sectional view showing the structure of a target assembly according to an embodiment of the present invention. The target assembly 10 of the present embodiment has a base 11 and a target layer 12 as a back tube.

基體11係以Cu、Al、Ti、SUS(不銹鋼)等金屬材料構成。在圖1中基體11為具有X軸方向軸心之圓筒狀。基體11的內部形成有讓冷卻水循環之流路。此外,為了在基體11的外周側表面形成固定磁場,在基體11的內部配置有未圖示的磁性元件。 The base 11 is made of a metal material such as Cu, Al, Ti, or SUS (stainless steel). In Fig. 1, the base 11 has a cylindrical shape having an axis in the X-axis direction. The inside of the base 11 is formed with a flow path for circulating cooling water. Further, in order to form a fixed magnetic field on the outer peripheral side surface of the base 11, a magnetic element (not shown) is disposed inside the base 11.

靶材層12係以被覆基體11之表面的方式,形成於基體11的外周側表面上。靶材層12的厚度未特別限制,為例如3mm~20mm。 The target layer 12 is formed on the outer peripheral side surface of the base 11 so as to cover the surface of the base 11. The thickness of the target layer 12 is not particularly limited and is, for example, 3 mm to 20 mm.

圖2為顯示靶材層之內部構造的示意圖。本實施形態之靶材層12係以Cu粒子(G1)與CuGa粒子(G2)之混合層構成。Cu粒子(G1)夾在CuGa粒子(G2)與基體11的表面之間,以及夾在CuGa粒子(G2)彼此之間,將此等空間相互結合。因此,能構成具有超過90%之相對密度的特定厚度之靶材層12。 2 is a schematic view showing the internal structure of a target layer. The target layer 12 of the present embodiment is composed of a mixed layer of Cu particles (G1) and CuGa particles (G2). The Cu particles (G1) are sandwiched between the CuGa particles (G2) and the surface of the substrate 11, and sandwiched between the CuGa particles (G2), and these spaces are bonded to each other. Therefore, the target layer 12 having a specific thickness of more than 90% of the relative density can be constructed.

靶材層12的Ga含量未特別限制,可依例如用途或規格來適當設定。本實施形態中,靶材層12之Ga含量係30原子%以上60原子%以下,構成例如能使用於薄膜太陽電池的光吸收層之成膜的CuGa系合金靶材。 The Ga content of the target layer 12 is not particularly limited and may be appropriately set depending on, for example, the use or specifications. In the present embodiment, the Ga content of the target layer 12 is 30 atom% or more and 60 atom% or less, and a CuGa-based alloy target which can be used for forming a light absorbing layer of a thin film solar cell can be formed.

靶材層12係以Cu粉末與CuGa粉末之混合粉末為原料,藉由冷噴塗法形成於基體11的外周側表面。以下說明靶材組件10之製造方法。 The target layer 12 is formed on the outer peripheral side surface of the base 11 by a cold spray method using a mixed powder of Cu powder and CuGa powder as a raw material. A method of manufacturing the target assembly 10 will be described below.

[靶材組件之製造方法] [Method of Manufacturing Target Assembly]

圖3係說明本實施形態之靶材組件之製造方法的步驟 流程圖。本實施形態係具有純Cu粉末之調整步驟(ST1)、CuGa合金粉末之調整步驟(ST2)、混合步驟(ST3)、及冷噴塗步驟(ST4)。 Figure 3 is a view showing the steps of the method of manufacturing the target assembly of the embodiment. flow chart. This embodiment has an adjustment step (ST1) of pure Cu powder, an adjustment step (ST2) of CuGa alloy powder, a mixing step (ST3), and a cold spraying step (ST4).

首先,調整純Cu粉末與CuGa合金粉末(ST1、ST2)。 First, pure Cu powder and CuGa alloy powder (ST1, ST2) were adjusted.

純Cu粉末的純度未特別限制,例如為99.99%以上。CuGa合金粉末能使用Ga含量為例如36原子%以上73原子%以下者。Ga含量可依要製作之靶材層12的Ga含量等來適當設定。 The purity of the pure Cu powder is not particularly limited and is, for example, 99.99% or more. As the CuGa alloy powder, a Ga content of, for example, 36 atom% or more and 73 atom% or less can be used. The Ga content can be appropriately set depending on the Ga content of the target layer 12 to be produced and the like.

純Cu粉末及CuGa合金粉末的形狀未特別限定,但就藉由冷噴塗法來堆積靶材層12來說,以成膜效率的點來看,較佳係球狀或者接近球狀形狀的粉末。因此,粉末的製造方法適合使用霧化法、旋轉電極法、真空噴霧驟冷法等。 The shape of the pure Cu powder and the CuGa alloy powder is not particularly limited. However, in order to deposit the target layer 12 by the cold spray method, it is preferably a spherical or nearly spherical powder from the viewpoint of film formation efficiency. . Therefore, the method for producing the powder is preferably an atomization method, a rotary electrode method, a vacuum spray quenching method, or the like.

純Cu粉末及CuGa合金粉末的粒徑未特別限定,但就形成高密度之靶材層12來說,粒徑係越小越好。本實施形態中,純Cu粉末的粒徑為例如10μm以下,CuGa合金粉末的粒徑為例如200~300μm以下。 The particle diameter of the pure Cu powder and the CuGa alloy powder is not particularly limited, but the formation of the high-density target layer 12 is preferably as small as possible. In the present embodiment, the particle diameter of the pure Cu powder is, for example, 10 μm or less, and the particle diameter of the CuGa alloy powder is, for example, 200 to 300 μm or less.

接下來,製作純Cu粉末與CuGa合金粉末之混合粉末(ST3)。 Next, a mixed powder of pure Cu powder and CuGa alloy powder (ST3) was produced.

於混合純Cu粉末與CuGa合金粉末時,可使用各種混合機。混合粉末中的純Cu粉末之混合比未特別限制,但讓混合粉末中的純Cu粉末之混合比為15原子%以上50原子%以下,能安定的形成具有97%以上之相對密度的靶材層12。而CuGa合金粉末的Ga組成比,係對應此純Cu粉末的調配比與要形成之靶材層12中的Ga組成比等來設定。 When mixing pure Cu powder and CuGa alloy powder, various mixers can be used. The mixing ratio of the pure Cu powder in the mixed powder is not particularly limited, but the mixing ratio of the pure Cu powder in the mixed powder is 15 atom% or more and 50 atom% or less, and the target having a relative density of 97% or more can be stably formed. Layer 12. The Ga composition ratio of the CuGa alloy powder is set in accordance with the mixing ratio of the pure Cu powder and the Ga composition ratio in the target layer 12 to be formed.

接下來,把上述混合粉末做為原料,藉由冷噴塗法在 基體11的外周側表面形成靶材層12(ST4)。 Next, the above mixed powder is used as a raw material by cold spray method. The outer peripheral side surface of the base 11 forms the target layer 12 (ST4).

冷噴塗法係以超音速流讓維持著固相狀態之原料粉末與惰性氣體一起衝擊基材來形成皮膜之成膜方法。由於不使原料粉末熔融或氣體化地衝擊基材,而能把因熱使材料特性劣化與皮膜之氧化抑制在最小限度。因此與將原料熔融或氣體化後再成膜之熔射法在原理上是不同之成膜技術。 The cold spray method is a film formation method in which a raw material powder that maintains a solid phase state is impacted with a substrate by a supersonic flow to form a film. Since the raw material powder is not melted or gasified to impact the substrate, deterioration of material properties and oxidation of the film by heat can be minimized. Therefore, the sputtering method which forms a film after melting or gasifying the raw material is different in principle from the film forming technique.

圖4為說明本實施形態之靶材層12之形成方法的示意圖。於成膜時使用噴嘴20。噴嘴20係連接著加壓惰性氣體之氣體源21、把原料粉末供給至噴嘴20之粉末供給源22等。噴嘴20係配置成面向以特定速度繞著軸心11a旋轉之基體11的表面,將原料粉末與惰性氣體一起以高速噴出,把原料粉末堆積在基體11的表面。 Fig. 4 is a schematic view showing a method of forming the target layer 12 of the embodiment. The nozzle 20 is used for film formation. The nozzle 20 is connected to a gas source 21 that pressurizes an inert gas, a powder supply source 22 that supplies raw material powder to the nozzle 20, and the like. The nozzle 20 is disposed so as to face the surface of the base 11 that rotates around the axis 11a at a specific speed, and discharges the raw material powder together with the inert gas at a high speed to deposit the raw material powder on the surface of the base 11.

一般來說,Cu等軟質性金屬若以超音速衝擊基材表面,粉末本身藉由塑性變形而能形成皮膜。相對於此,CuGa合金因比純Cu還硬,即使以超音速衝擊基體表面,亦多是無塑性變形地於基體表面彈回。因此,在僅使用CuGa合金粉末來做為原料粉末時皮膜難以形成,即便形成了皮膜,因附著性低也容易造成剝離,故不易得到所期望之膜厚的合金皮膜。 In general, if a soft metal such as Cu strikes the surface of the substrate at a supersonic speed, the powder itself can be formed into a film by plastic deformation. On the other hand, the CuGa alloy is harder than pure Cu, and even if it hits the surface of the substrate at supersonic speed, it is mostly bounced back on the surface of the substrate without plastic deformation. Therefore, when only a CuGa alloy powder is used as a raw material powder, it is difficult to form a film, and even if a film is formed, since peeling is likely to occur due to low adhesion, it is difficult to obtain an alloy film having a desired film thickness.

因此,在本實施形態中係使用純Cu粉末與CuGa合金粉末的混合粉末做為原料粉末,在基體11表面與CuGa合金粉末間、及CuGa合金粉末彼此間都夾有純Cu粉末,以形成CuGa系合金材料的堆積膜。藉此能以冷噴塗法安定的製造CuGa系合金靶材。 Therefore, in the present embodiment, a mixed powder of pure Cu powder and CuGa alloy powder is used as a raw material powder, and pure Cu powder is interposed between the surface of the substrate 11 and the CuGa alloy powder, and between the CuGa alloy powders to form CuGa. A deposited film of an alloy material. Thereby, the CuGa-based alloy target can be produced by the cold spray method.

從噴嘴20出來的原料粉末之噴射速度只要是能讓純 Cu粉末附著於基體11表面之充分速度(臨界速度)即無特別限制,可設為例如500m/s以上。 The ejection speed of the raw material powder coming out from the nozzle 20 can be pure The sufficient speed (critical velocity) at which the Cu powder adheres to the surface of the substrate 11 is not particularly limited, and may be, for example, 500 m/s or more.

氣體源21所使用之惰性氣體亦未特別限制,可使用例如N2(氮氣)、He(氦氣)、Ar(氬氣)等。氣體壓力及氣體流量能依氣體種類與噴射速度等來適當設定,例如可將氣體壓力設為約0.65MPa、氣體流量設為15L/min。 The inert gas used in the gas source 21 is also not particularly limited, and for example, N 2 (nitrogen), He (helium), Ar (argon), or the like can be used. The gas pressure and the gas flow rate can be appropriately set depending on the type of gas, the injection speed, and the like. For example, the gas pressure can be set to about 0.65 MPa, and the gas flow rate can be set to 15 L/min.

原料粉末亦可於噴嘴20的內部被加熱至適當溫度。藉此能提高對基體11表面之附著強度,並形成相對密度高的靶材層12。加熱溫度只要比原料粉末(純Cu粉末及CuGa合金粉末)的熔點低即可,可設定於例如500℃。 The raw material powder may also be heated to a suitable temperature inside the nozzle 20. Thereby, the adhesion strength to the surface of the substrate 11 can be improved, and the target layer 12 having a relatively high density can be formed. The heating temperature may be set to be lower than the melting point of the raw material powder (pure Cu powder and CuGa alloy powder), and may be set, for example, at 500 °C.

為了得到目標厚度之靶材層12,亦可讓噴嘴20在基體11的軸心方向來回移動(掃描)。基體11表面與噴嘴20之距離亦未特別限制,能設定於例如7mm以上12mm以下。 In order to obtain the target layer 12 of the target thickness, the nozzle 20 can also be moved back and forth (scanned) in the axial direction of the substrate 11. The distance between the surface of the base 11 and the nozzle 20 is also not particularly limited, and can be set, for example, to 7 mm or more and 12 mm or less.

如上述般進行,能製造圖1所示之靶材組件10。而在以上的實施形態中,雖使用圓筒狀的背管做為基體11,但亦可採用平板狀的金屬製基體來加以取代。藉由於此金屬製基體如上述般形成靶材層,而得以製造具備背板之靶材組件。 As described above, the target assembly 10 shown in Fig. 1 can be manufactured. On the other hand, in the above embodiment, a cylindrical back pipe is used as the base 11, but a flat metal base may be used instead. By forming the target layer as described above, the metal substrate can be used to manufacture a target assembly having a backing plate.

〔實施例〕 [Examples]

以下說明本發明之實施例,但本發明並非限定於此。 The embodiments of the present invention are described below, but the present invention is not limited thereto.

(比較例1) (Comparative Example 1)

使用以霧化法製作之平均粒徑100μm的Cu-30at%Ga合金粉末做為原料粉末,藉由冷噴塗法於直徑4英吋之鋁合金(A5052)製的圓板狀基體的表面形成Cu-30at%Ga合金靶材層。 Cu-30at%Ga alloy powder having an average particle diameter of 100 μm produced by atomization was used as a raw material powder, and Cu was formed on the surface of a disk-shaped substrate made of a 4 inch diameter aluminum alloy (A5052) by a cold spray method. -30 at% Ga alloy target layer.

原料粉末的噴出氣體係使用N2(壓力0.65MPa、流量 15L/min),原料粉末的加熱溫度設為500℃、掃描速度設為20mm/sec、掃描次數設為20次、基體與噴嘴之間的距離設為7mm。 N 2 (pressure 0.65 MPa, flow rate 15 L/min) of the raw material powder was used, the heating temperature of the raw material powder was 500 ° C, the scanning speed was 20 mm/sec, the number of scans was 20, and the substrate and the nozzle were used. The distance is set to 7mm.

成膜的結果,雖然得到厚度0.05~0.15mm之CuGa合金系皮膜,但容易剝離而難以測定相對密度。 As a result of the film formation, although a CuGa alloy-based film having a thickness of 0.05 to 0.15 mm was obtained, it was easy to peel off and it was difficult to measure the relative density.

(比較例2) (Comparative Example 2)

使用以霧化法製作之平均粒徑100μm的Cu-30at%Ga合金粉末做為原料粉末,藉由冷噴塗法於直徑4英吋之銅製的圓板狀基體的表面形成Cu-30at%Ga合金靶材層。 A Cu-30at%Ga alloy powder having an average particle diameter of 100 μm produced by an atomization method was used as a raw material powder, and a Cu-30at%Ga alloy was formed on the surface of a disk-shaped substrate made of copper having a diameter of 4 inches by cold spraying. Target layer.

原料粉末的噴出氣體係使用N2(壓力0.65MPa、流量15L/min),原料粉末的加熱溫度設為500℃、掃描速度設為20mm/sec、掃描次數設為20次、基體與噴嘴之間的距離設為7mm。 N 2 (pressure 0.65 MPa, flow rate 15 L/min) of the raw material powder was used, the heating temperature of the raw material powder was 500 ° C, the scanning speed was 20 mm/sec, the number of scans was 20, and the substrate and the nozzle were used. The distance is set to 7mm.

成膜的結果,雖然得到厚度0.05~0.15mm之CuGa合金系皮膜,但容易剝離而難以測定相對密度。 As a result of the film formation, although a CuGa alloy-based film having a thickness of 0.05 to 0.15 mm was obtained, it was easy to peel off and it was difficult to measure the relative density.

(實施例1) (Example 1)

製作以霧化法製作之平均粒徑100μm的Cu-40at%Ga合金粉末、與以霧化法製作之平均粒徑8μm的純Cu粉末之混合粉末。CuGa合金粉末與純Cu粉末的調配莫耳比設為68:32。使用此混合粉末做為原料粉末,藉由冷噴塗法於直徑4英吋的鋁合金(A5052)製圓板狀基體的表面形成Cu-30at%Ga合金靶材層。 A mixed powder of a Cu-40at%Ga alloy powder having an average particle diameter of 100 μm produced by an atomization method and a pure Cu powder having an average particle diameter of 8 μm produced by an atomization method was prepared. The blending molar ratio of the CuGa alloy powder to the pure Cu powder was set to 68:32. Using this mixed powder as a raw material powder, a Cu-30at%Ga alloy target layer was formed on the surface of a disk-shaped substrate made of a 4 inch diameter aluminum alloy (A5052) by a cold spray method.

原料粉末的噴出氣體係使用N2(壓力0.65MPa、流量15L/min),原料粉末的加熱溫度設為500℃、掃描速度設為20mm/sec、掃描次數設為20次、基體與噴嘴之間的距離設為7mm。 N 2 (pressure 0.65 MPa, flow rate 15 L/min) of the raw material powder was used, the heating temperature of the raw material powder was 500 ° C, the scanning speed was 20 mm/sec, the number of scans was 20, and the substrate and the nozzle were used. The distance is set to 7mm.

成膜的結果,基體上之靶材層的厚度係5.0~5.5mm。相對密度之測定,係經由計算堆積層的表觀密度與理論密度的比而求得。於本實施例,靶材層之相對密度係98.1%。 As a result of the film formation, the thickness of the target layer on the substrate is 5.0 to 5.5 mm. The determination of the relative density is obtained by calculating the ratio of the apparent density of the deposited layer to the theoretical density. In this example, the relative density of the target layer was 98.1%.

(實施例2) (Example 2)

除了將CuGa合金粉末之組成比變更為把Cu-37.5at%Ga、CuGa合金粉末與純Cu粉末之調配莫耳比設為80:20,並將基體之材料改為銅製品以外,以與實施例1相同之條件,藉由冷噴塗法於基體上形成Cu-30at%Ga合金靶材層。成膜的結果,基體上之靶材層的厚度係4.5~5.0mm,相對密度係97.0%。 In addition to changing the composition ratio of the CuGa alloy powder to a molar ratio of Cu-37.5 at% Ga, CuGa alloy powder and pure Cu powder to 80:20, and changing the material of the substrate to a copper product, Under the same conditions as in Example 1, a Cu-30at%Ga alloy target layer was formed on the substrate by cold spraying. As a result of the film formation, the thickness of the target layer on the substrate was 4.5 to 5.0 mm, and the relative density was 97.0%.

(實施例3) (Example 3)

除了將CuGa合金粉末之組成比變更為把Cu-36at%Ga、CuGa合金粉末與純Cu粉末之調配莫耳比設為85:15,並將基體之材料改為銅製品以外,以與實施例1相同之條件,藉由冷噴塗法於基體上形成Cu-30at%Ga合金靶材層。成膜的結果,基體上之靶材層的厚度係0.5~1.0mm,相對密度係92.0%。 In addition to changing the composition ratio of the CuGa alloy powder to a ratio of the molar ratio of Cu-36 at% Ga, CuGa alloy powder to pure Cu powder to 85:15, and changing the material of the substrate to a copper product, Under the same conditions, a Cu-30at%Ga alloy target layer was formed on the substrate by cold spraying. As a result of the film formation, the thickness of the target layer on the substrate was 0.5 to 1.0 mm, and the relative density was 92.0%.

(實施例4) (Example 4)

除了將CuGa合金粉末的組成比變更為把Cu-73at%Ga、CuGa合金粉末與純Cu粉末之調配莫耳比設為70:30,並將基體之材料改為銅製品以外,以與實施例1相同之條件,藉由冷噴塗法於基體上形成Cu-50at%Ga合金靶材層。成膜的結果,基體上之靶材層的厚度係5.0~5.5mm,相對密度係99.0%。 In addition to changing the composition ratio of the CuGa alloy powder to a ratio of the molar ratio of Cu-73 at% Ga, CuGa alloy powder to pure Cu powder to 70:30, and changing the material of the substrate to a copper product, Under the same conditions, a Cu-50at%Ga alloy target layer was formed on the substrate by cold spraying. As a result of the film formation, the thickness of the target layer on the substrate was 5.0 to 5.5 mm, and the relative density was 99.0%.

(實施例5) (Example 5)

除了將基體形狀改為直徑4英吋的圓筒狀以外,以與 實施例1相同之條件,藉由冷噴塗法於基體上形成Cu-30at%Ga合金靶材層。成膜的結果,基體上之靶材層的厚度係5.0~5.5mm,相對密度係98.1%。 In addition to changing the shape of the base to a cylindrical shape of 4 inches in diameter, Under the same conditions as in Example 1, a Cu-30at%Ga alloy target layer was formed on the substrate by cold spraying. As a result of the film formation, the thickness of the target layer on the substrate was 5.0 to 5.5 mm, and the relative density was 98.1%.

(實施例6) (Example 6)

除了將CuGa合金粉末的組成比變更為把Cu-60at%Ga、CuGa合金粉末與純Cu粉末之調配莫耳比設為50:50,並將基體之材料改為不銹鋼(SUS304)製以外,以與實施例1相同之條件,藉由冷噴塗法於基體上形成Cu-30at%Ga合金靶材層。成膜的結果,基體上之靶材層的厚度係3.5~4.0mm,相對密度係97.3%。 In addition to changing the composition ratio of the CuGa alloy powder to a ratio of the molar ratio of Cu-60 at% Ga, CuGa alloy powder to pure Cu powder to 50:50, and changing the material of the substrate to stainless steel (SUS304), Under the same conditions as in Example 1, a Cu-30at%Ga alloy target layer was formed on the substrate by a cold spray method. As a result of the film formation, the thickness of the target layer on the substrate was 3.5 to 4.0 mm, and the relative density was 97.3%.

(實施例7) (Example 7)

除了將CuGa合金粉末的組成比變更為把Cu-60at%Ga、CuGa合金粉末與純Cu粉末之調配莫耳比設為50:50,並將基體之材料改為銅製品,以及將基體與噴嘴間的距離設為12mm以外,以與實施例1相同之條件,藉由冷噴塗法於基體上形成Cu-30at%Ga合金靶材層。成膜的結果,基體上之靶材層的厚度係3.0~3.5mm,相對密度係95.1%。 In addition to changing the composition ratio of the CuGa alloy powder to a ratio of Cu-60 at% Ga, CuGa alloy powder and pure Cu powder to a molar ratio of 50:50, and changing the material of the substrate to a copper product, and the substrate and the nozzle A Cu-30at%Ga alloy target layer was formed on the substrate by a cold spray method under the same conditions as in Example 1 except that the distance between the two was set to 12 mm. As a result of the film formation, the thickness of the target layer on the substrate was 3.0 to 3.5 mm, and the relative density was 95.1%.

比較例1、2及實施例1~7之條件及結果彙整於表1顯示。 The conditions and results of Comparative Examples 1, 2 and Examples 1 to 7 are shown in Table 1.

如表1所示,於僅以CuGa合金粉末為原料之比較例1、2中無法形成靶材層。相對於此,於以CuGa合金粉末與純Cu粉末之混合粉末為原料的實施例1~7中,則確認能形成適當的靶材層。 As shown in Table 1, in the comparative examples 1 and 2 which used only the CuGa alloy powder as a raw material, the target layer could not be formed. On the other hand, in Examples 1 to 7 in which a mixed powder of a CuGa alloy powder and a pure Cu powder was used as a raw material, it was confirmed that an appropriate target layer can be formed.

又,於純Cu粉末與CuGa合金粉末之混合粉末中的純Cu粉末之混合比率為20~50at%之實施例1、2、4~7中,可得到具有95%以上之相對密度的Cu-30~60at%Ga合金系靶材。藉此能異常放電少地安定的濺鍍成膜。 Further, in Examples 1, 2, and 4 to 7 in which the mixing ratio of the pure Cu powder in the mixed powder of the pure Cu powder and the CuGa alloy powder is 20 to 50 at%, Cu- having a relative density of 95% or more can be obtained. 30~60at%Ga alloy target. Thereby, it is possible to form a film by sputtering which is less stable and unstable.

以上雖說明了本發明之實施形態,但本發明不單單限定於上述實施形態而已,當然可在不脫離本發明之要旨的範圍內添加各種變更。 The embodiments of the present invention have been described above, but the present invention is not limited to the above-described embodiments, and various modifications may be added without departing from the spirit and scope of the invention.

例如在以上之實施形態中,雖說明使用純Cu粉末與CuGa合金粉末來形成CuGa合金系濺鍍層的例子,但不限於此。本發明亦能適用於形成例如TiMo合金系濺鍍層。在此情形,能以純Ti粉末與TiMo合金粉末之混合粉末做為噴塗原料。除此之外,能使用Al、In、Sn、Ni、Co、Cr、Ta、Mo等純金屬粉末,與此等的合金粉末或者化合物粉末,來形成該合金系的濺鍍層。 For example, in the above embodiment, an example in which a pure Cu powder and a CuGa alloy powder are used to form a CuGa alloy-based sputtering layer will be described, but the invention is not limited thereto. The present invention is also applicable to the formation of, for example, a TiMo alloy-based sputter layer. In this case, a mixed powder of pure Ti powder and TiMo alloy powder can be used as a spray material. In addition to this, a pure metal powder such as Al, In, Sn, Ni, Co, Cr, Ta, or Mo, or an alloy powder or a compound powder can be used to form a sputtering layer of the alloy.

10‧‧‧靶材組件 10‧‧‧ Target components

11‧‧‧基體 11‧‧‧ base

11a‧‧‧軸心 11a‧‧‧Axis

12‧‧‧靶材層 12‧‧‧ Target layer

20‧‧‧噴嘴 20‧‧‧ nozzle

21‧‧‧氣體源 21‧‧‧ gas source

22‧‧‧粉末供給源 22‧‧‧ powder supply source

G1‧‧‧Cu粒子 G1‧‧‧Cu particles

G2‧‧‧CuGa粒子 G2‧‧‧CuGa particles

圖1為顯示本發明實施形態之一的靶材組件之結構之示意截面圖。 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic cross-sectional view showing the structure of a target assembly according to an embodiment of the present invention.

圖2為顯示靶材層之內部構造的示意圖。 2 is a schematic view showing the internal structure of a target layer.

圖3為說明本實施形態之靶材組件的製造方法之步驟流程圖。 Fig. 3 is a flow chart showing the steps of a method of manufacturing the target assembly of the embodiment.

圖4為說明本實施形態之靶材層的形成方法之示意圖。 Fig. 4 is a schematic view showing a method of forming a target layer of the embodiment.

Claims (7)

一種靶材組件之製造方法,其係包括:製作由金屬元素所構成之第1粉末、與由以前述金屬元素為主成分之合金或化合物所構成之第2粉末的混合粉末;以前述混合粉末為原料,藉由冷噴塗法於基體表面形成由前述金屬元素之合金或化合物所構成的靶材層。 A method for producing a target assembly, comprising: preparing a mixed powder of a first powder composed of a metal element and a second powder composed of an alloy or a compound containing the metal element as a main component; As a raw material, a target layer composed of an alloy or a compound of the foregoing metal element is formed on the surface of the substrate by a cold spray method. 如申請專利範圍第1項之靶材組件之製造方法,其中前述第1粉末係Cu粉末,而前述第2粉末係CuGa粉末。 The method of producing a target module according to the first aspect of the invention, wherein the first powder is a Cu powder, and the second powder is a CuGa powder. 如申請專利範圍第2項之靶材組件之製造方法,其中前述第1粉末對前述混合粉末之混合比率係20原子%以上50原子%以下。 The method of producing a target assembly according to the second aspect of the invention, wherein the mixing ratio of the first powder to the mixed powder is 20 atom% or more and 50 atom% or less. 如申請專利範圍第1項之靶材組件之製造方法,其中前述基體係圓筒狀,而前述靶材層係形成於前述基體的外周側表面。 The method of manufacturing a target assembly according to the first aspect of the invention, wherein the base system is cylindrical, and the target layer is formed on an outer peripheral side surface of the base. 一種靶材組件,其係具備:基體;形成於前述基體之表面,且具有夾在CuGa粒子與前述CuGa粒子間的Cu粒子之靶材層。 A target assembly comprising: a substrate; a target layer formed on the surface of the substrate and having Cu particles interposed between the CuGa particles and the CuGa particles. 如申請專利範圍第5項之靶材組件,其中前述靶材層係以含有30原子%以上60原子%以下之Ga的CuGa合金所形成,且具有97%以上的相對密度。 The target assembly of claim 5, wherein the target layer is formed of a CuGa alloy containing 30 atom% or more and 60 atom% or less of Ga, and has a relative density of 97% or more. 如申請專利範圍第5項之靶材組件,其中前述基體係金屬製的圓筒體。 The target assembly of claim 5, wherein the base system is a metal cylinder.
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